CA1326774C - Method and apparatus for active vision image enhancement - Google Patents
Method and apparatus for active vision image enhancementInfo
- Publication number
- CA1326774C CA1326774C CA000604384A CA604384A CA1326774C CA 1326774 C CA1326774 C CA 1326774C CA 000604384 A CA000604384 A CA 000604384A CA 604384 A CA604384 A CA 604384A CA 1326774 C CA1326774 C CA 1326774C
- Authority
- CA
- Canada
- Prior art keywords
- optical
- wavelength
- light
- scattered
- optical filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K9/00—Arc welding or cutting
- B23K9/12—Automatic feeding or moving of electrodes or work for spot or seam welding or cutting
- B23K9/127—Means for tracking lines during arc welding or cutting
- B23K9/1272—Geometry oriented, e.g. beam optical trading
- B23K9/1274—Using non-contact, optical means, e.g. laser means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Geometry (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Abstract of the Disclosure A method and apparatus for optically inspecting the geometry of a surface in an environment which is subject to the presence of external light noise perturba-tions. A beam of monochromatic light having a predeter-mined wavelength and a structured light pattern is projected onto the surface to thereby scatter the struc-tured light beam and produce a scattered light beam which is thereafter separated into first and second scattered beam portions. The first scattered beam portion is passed through a first optical filter having a narrow bandwidth and a central wavelength corresponding substantially to the wavelength of the projected light, thereby providing a first optical output signal representative of the surface geometry and of external light noise perturbation. The second scattered beam portion is passed through a second optical filter having a narrow wavelength bandwidth and a central wavelength which is closely spaced from the prede-termined wavelength of the projected light by a wavelength offset such as to reject the projected light wavelength, thereby providing a second optical output signal represen-tative of substantially the same external light noise perturbation as that passing through the first optical filter. The first and second optical output signals are detected and converted into first and second electrical signals, respectively. The second electrical signal is then subtracted from the first electrical signal to provide a substantially noise-free electrical output signal representative of the surface geometry. The inven-tion is particularly useful for active vision robot welding and enables arc light noise-free images to be obtained in real time.
Description
. ~ 32~77 :' The present invention relates to a method and apparatus for active vision image enhancement. More parti-cularly, the invention is directed to a double spectral image sensing method and apparatus for active vision robot welding and surface inspection.
,;.
Visual inspection systems are required for quality control and process monitoring in a wide variety . .
.~:
of industrial applications. Increasing demand is develop~
ping for noncontact, nondestructive, nonperturbating, ~ 10 fast, reliable and moderate-cost inspection systems for `;`~ use in harsh environmental conditions, such as in the presence of external light noise perturbations, high temperature, smoke, dust and water vapor. For many appli-. ,.
cations, active vision offers significant advantages over ~` other techniques since it facilitates adaptive behavior using relatively simple image analysis.
The ability of any active vision system to reject foreign light source perturbation is crucial and is a definite cause of problem for applications such as in ; ~0 robot arc welding where the arc light is very intense and ~: constitutes a strong perturbation for active vision of . ~ r:~
seam welding. Many systems are known which are capable of extirpating useful signals in such harsh conditions. These systems are gener~lly based on the projection of a struc-. ~;
tured light beam on the joint to be welded, using laser ~`~ diodes or the like. When viewed at an angle, the projected ~; light takes the shape of the seam and thus provides an : ,~
~ image of the seam profile. Simple algorithms are then used : ;.
~- to extract the information needed to synchronize the robot ... .
~ 30 movements and -the displacements of the torch from these ::., ,, -- 1 --.
:` ~32~77~
.;
images. Real time operation is mandatory and the simpler .:
the algorithms are/ the lesser computer power will be ~,~ required, resulting in lower cost and more efficient systems. It is very important to submit high quality, noise-free images to the image processor to avoid slow and costly computer discriminating techniques.
Currently available active vision systems generally use a video camera and an optical fil-ter which is placed in front of the camera and which has a central wavelength corresponding to the wavelength of the mono-chromatic li~ht projected on the surface to be inspected.
Because foreign light noise is generally spread over a broad spectrum, it is possible to reject most of the foreign light noise by selecting an optical filter having a narrow band to thereby increase the visibility of the projected light over the background light noise and to ~` thus facilitate image processing. But for light noise ~ emitters such as a welding torch, there is still enough ,~ light noise intensity within the band of the optical ~: 20 filter to disturb considerably the quality of the image.
~ Narrow band optical filters, however, have a i limited efficiency in rejecting foreign light noise since it is not practically possible to reduce the bandwidth of such filters under about 2-10 nanometers depending on the .:
~ optical design. A narrow band optical filter such as an `~ interference filter is temperature dependent and thus the reduction of its bandwid-th will require greater temperatu-re stability. Moreover, the effective bandwidth and central wavelength of an interference filter is dependent ;`;
~ 2 -132677~
,i.
., upon the angle of incidence of -the light. The effect becomes increasingly disturbing as the bandwidth of the Eilter is reduced.
On the other hand, the use of a powerEull projected light source such as a powerfull laser will contribute to increasing the predominance of the desired signal over noise and thus improving the quality of the image. However, the intensity of the projected light will rapidly become unsafe for eyes when used in an area where human operators are standing by. Also, the cost of such a powerfull laser will be prohibitive.
It is therefore an object of the present inven-tion to overcome the above drawbacks and to provide a method and apparatus enabling active vision image enhance-,:
~` ment.
i~
According to one aspect of the invention, there is thus provided a method of optically inspecting the :.~ geometry of a surface in an environment which is subject . ~,.
~ to the presence of external light noise perturbations. The :
method of the invention comprises the steps of:
~` a) projecting a beam of monochromatic light having a predetermined wavelength and a structured light pattern onto the surface -to be inspected, to thereby scatter the structured light beam and produce a scattered light beam;
. b) separating the scattered light beam into ~5 ~ first and second scattered beam portions;
c) passing the first scattered beam portion through a first optical filter having a narrow bandwid-th , ~ 30 and a central wavelength corresponding substantially to ~:, `: ~ 3 ~
,, ' the wavelength of the projected light, thereby providing a first optical output signal representative of the surface geometry and of external light noise perturbation;
d) passing the second scattered beam portion through a second optical filter having a narrow bandwidth and a central wavelength which is closely spaced from the wavelength of the projected light by a wavelen~th offset such as to reject the projected light wavelength, thereby providing a second optical output signal representative of substantially the same external light noise perturbation as that passing through the first optical fil-ter;
e) detecting the first and second optical output signals and converting same into first and second .; electrical signals, respectively; and `~ f) sub-tracting the second electrical signal from the first electrical signal -to provide a substantial-.~}. ly noise-free electrical output signal representative of the surface geometry.
. The present invention also provides, in another aspect thereof, an apparatus for carrying out a method as ~X defined above. The apparatus of the invention comprises ., structured monochromatic light source means for generating ~, a beam of monochromatic light having a predetermined wave-~, length with a structured light pattern and projecting same . onto the surface to be inspected, to thereby scatter the ~ x.
structured light beam and produce a scattered light beam, and beam splitting means for separating the scattered . light beam in-to first and second scattered beam portions travelling along respective optical paths. A first optical filter having a narrow bandwidth and a central wavelength !~ ~ 3 2 ~ 7 7 ,.
corresponding substantially to the wavelength of the projected light is arranged in the optical path of the first scattered beam portion -to provide a first optical output signal representative of the surEace geometry and : of external light noise perturbation. A second optlcal filter having a narrow bandwidth and a central wavelength which is closely spaced from the wavelength of the projected light by a wavelength offset such as to reject the projected light wavelength, is arranged in the optical . 10 path of the second scattered beam portion to provide a ~`. second optical output signal representative of substan-:.: tially the same external light noise perturbation as that .~, . passing through the first optical filter. First and second : detector means are provided for detecting the first and ,: ~
`~ second optical output signals and converting same into ;~ first and second electrical signals, respectively. A sub-tracting circuit is connected to the first and second ...~.-~ detector means for subtracting the second electrical -~:. signal from the first electrical signal to provide a sub-~ 20 stantially noise-free electrical output signal representa-:............. tive of the surface geometry.
.~ Applicant has found quite unexpectedly that by ~ using two narrow band optical filters arranged in the `~ respective optical paths of the scattered bea~ portions ~ produced by a beam splitter, one optical filter having a .i . central wavelength corresponding substantially to the :~ wavelength of the projected light and the other optical ~; filter having a central wavelength closely spaced from the wavelength of the projected :Light by a wavelength offset ~` 30 such as to reject the projected light wavelength, and by ' : _ 5 _ ', `', -` 13~77~
subtracting the signals derived from these optical filter.s, it is possible to obtain a substantially noise-free output signal representative of the geometry of the surface undergoing inspection.
According to a preferred embodiment of the invention, the fixst and second optical filters have sub-stantially the same bandwidth such that the quantity of light noise passing through each filter is substantially the same. Slight differences in the bandwidths of the otpical filters can be compensated for by means of two separate amplifiers connected between the detectors and the subtracting circuit, which amplifiers serve to adjust the relative sensitivity of the detectors and to properly balance the amplitude of the electrical signals from the ~. .
~; detectors. Preferably, the second optical filter has a central wavelength closely spaced from the wavelength of the projected light by a wavelength offset which is sub-stantially equal to the bandwidth of both optical filters.
The optical filters preferably used comprise ~ 20 interference filters having a bandwid-th ranging from about :,.~'.
' 2 to about 10 nanometers.
The method and apparatus according to the . .:
invention are particularly useful for active vision robot welding and enable arc light noise-free images to be , obtained in real time.
Further features and advantages of the inven-`~ tion will become more readily apparent from the following ~, ~` description of preferred embodiments with reference to the accompanying drawings, in which:
~!~
, ~ - 6 -~.i ., ~L~2~774 Figure 1 schematically illustrates an active vision system according to the prior art, as used for real-time arc-welding process control and seam tracking;
Figure 2 is a schematic diagram of an apparatus ....
~` according to a preferred embodiment of the invention;
,: Figure 3 is a graph illustrating the spectral characteristics of an interference filter used to elimi-nate the light noise generated by a typical electric arc;
Figure 4 is a graph illustrating the spectral 0 characteristics of two in-terference filters used in ~; accordance with the invention to eliminate the light noise "
generated by an electric arc; and Figures 5A, 5B and 5C are photographs showing respectively the images typically detected by the two i~ detectors of the apparatus illustrated in Figure 2, when , . .
~ used for active vision robot welding, and the image after s " .
.~ noise cancellation (subtraction).
; Referring first to Fig. 1, there is illustrated ~; a typical active vision system according to the prior art, 20for real-time arc-welding process control and seam track-~; ing. As shown, a welding torch 10 is positioned above two .. . .
workpiece members 12 and 12~ to be joined and is adapted :
to perform root pass welding of the open butt joint 14 defined between the two workpiece members 12,12'. The ,^ ~
welding torch 10 is operative to discharge an electric arc `~ 16, thereby forming a weldpool 18 penetrating the joint.
'~ In order to provide precise seam profile measurement, a ` monochromatic light source 20 such as a laser diode, optically coupled to an optical projection unit 22 by 30means of a glass fiber optical waveguide 24, is used to ':
` - 7 -.:
1~2~7~
project a laser line 26 onto the surface of the workpiece members 12,12'; although -the structured light pattern 26 illustrated is a line, such a light pattern may also be a simple dot, a mechanically scanned dot or a more sophis-ticated pattern. A video camera 28 such as a CCD (Charged Coupled Device) camera is positioned to view the light scattered by the surface, the scattered light being represented in the form of a scattered laser beam 30. An interference filter 32 placed in front of the camera 28 is used for light noise rejection. Such a system, however, has limited application since the electric arc 16 generated by the welding torch lO still provides enough ,. .
light noise intensity with the band of the filter 32 to ; disturb considerably the quality of the image viewed by ;~; the camera 28.
Figure 2 schema-ticzlly illustrates how effi-cient light noise rejection can be achieved in accordance .~ with the invention. To this end, the scattered laser beam i 30 is passed through a focussing lens 34 and directed onto `' 20 a 50% - 50% beam splitter 36 which separates the scattered - beam 30 into two scattered beam portions 30a and 30b. The beam portion 30a is reflected by a back-reflective mirror 38 and directed through an optical interference filter 40 ' and onto a CCD detector 42. Similarly, the beam portion 30b is directed through an optical interference filter 44 . and onto a CCD detector 46. The interference filters 40 and 44 have substantially the same bandwidth which typically ranges from about 2 to about lO nanometers.
However, the filter 40 has a central wavelength corre-::, ~ 30 sponding substantially to the wavelength of the laser ,.
~ - 8 -132~77~
,i . .
diode 20, whereas the filter 44 has a central wavelength which is closely spaced from the wavelength of the laser diode by a wavelength offset such as to reject the laser wavelength. Thus, the filtered beam portion 30'a defines an optical output signal representative of the seam profile and of light noise perturbation, whereas the filtered beam portion 30'b defines an optical ou-tput .....
signal representative of substantially the same light noise perturbation as that passing through the filter 40.
The optical output signals 30'a and 30'b are converted by , the detectors 42 and 46 into corresponding electrical ,i signals 48 and 50 which are fed to an analog subtractor 52 which is operative to subtract the signal 50 from the ~ r ~ signal 48 and to thereby provide a substantially noise-0,.:
~ free electrical output signal 54 representative of the ~,~x ~;~ seam profile. The ou-tput signal 54 is then fed to an image ....
.` processor (not shown).
;
'~ Since the sensitivities of the detectors 42 and ;~ 46 are generally not exactly the same and also because the ; 20 interference filters 40 and 44 generally show different ; transmissivity values, two separate amplifiers 56 and 58 ~, are used to balance the amplitude of the signals 48 and 50.
The mirror 38 which is arranged in the optical ~, ;~ path of the beam portion 30a is used to provide a `,~ reflected beam por-tion having the same spatial dis-tribu-..
tion as the beam portion 30b. However, when use is made of linear CCD-detectors 42 and 46, such a mirror can be eliminated.
'.' ., _ g _ '`.
'.,`
~ L32~7~4 r Figure 3 illustrates the spectrum 60 of the light emitted by a typical electric arc as well as the ~, spectrum 62 of a spat-ter, that is, a molten metal particle. Also shown is the spectral response 64 of a typical interference filter centered on the spectral line 66 of a laser diode.
Figure 4 is a graph similar to Figure 3 with '- the exception that the spectral response 68 of an addi-i tional interference filter is shown and that the scalling ,il.
~ 10 has been increased to show details in the spectral range "'f -,: of the wavelength of the laser line 66. The spectral responses 64 and 68 are typically those of the interferen-. ce filters 40 and 44, respec-tively. As may be seen, the ;~ spectral response 68 of the second filter 44 has a central `~ wavelength (i.e. about 820 nanometers) which is closely .~.::
, spaced from the wavelength (i.e. about 830 nanometers) of the laser line 66 by a wavelength offset of about 10 nano-;~ meters such as to reject the laser wavelength. The spectral responses 64 and 68 also exhibit substantially f the same bandwidth. Thus t the light noise passing through each filter is substantially the same in terms of both ~"
quantity and signal content.
~;~ Figure 5A illustrates the image as typically detected by the de-tector 42; shown in this image are the arc light noise 70, the light noise 72 emitted by a spatter and the scattered laser light 74 representative of ~: the seam profile. Figure SB illustrates the image as typically de-tected by the detector 46; shown in this image ~`~ are the arc light noise 70 and the spatter light noise 72.
Figure 5C illustrates the image derived from the electri-:
~ `
: ~ -- 1 0 132~77 r cal output slgnal 54 following subtraction of the electri-cal signal 50 from the electrical signal 48. As may be r':
iri seen from Fig. 5C, the image is substantially noise-free.
,, :' r ,:
~'~
. ,~ , .
,;.;
~;`
~' : ~:
. ,~ .
:., ~:
: r' ~r~
:,~
''i' ,.,~
~r'' r . ~.
, ~ .
.~-`
~.
., :`
. 11 ~
. . .
~.
,;.
Visual inspection systems are required for quality control and process monitoring in a wide variety . .
.~:
of industrial applications. Increasing demand is develop~
ping for noncontact, nondestructive, nonperturbating, ~ 10 fast, reliable and moderate-cost inspection systems for `;`~ use in harsh environmental conditions, such as in the presence of external light noise perturbations, high temperature, smoke, dust and water vapor. For many appli-. ,.
cations, active vision offers significant advantages over ~` other techniques since it facilitates adaptive behavior using relatively simple image analysis.
The ability of any active vision system to reject foreign light source perturbation is crucial and is a definite cause of problem for applications such as in ; ~0 robot arc welding where the arc light is very intense and ~: constitutes a strong perturbation for active vision of . ~ r:~
seam welding. Many systems are known which are capable of extirpating useful signals in such harsh conditions. These systems are gener~lly based on the projection of a struc-. ~;
tured light beam on the joint to be welded, using laser ~`~ diodes or the like. When viewed at an angle, the projected ~; light takes the shape of the seam and thus provides an : ,~
~ image of the seam profile. Simple algorithms are then used : ;.
~- to extract the information needed to synchronize the robot ... .
~ 30 movements and -the displacements of the torch from these ::., ,, -- 1 --.
:` ~32~77~
.;
images. Real time operation is mandatory and the simpler .:
the algorithms are/ the lesser computer power will be ~,~ required, resulting in lower cost and more efficient systems. It is very important to submit high quality, noise-free images to the image processor to avoid slow and costly computer discriminating techniques.
Currently available active vision systems generally use a video camera and an optical fil-ter which is placed in front of the camera and which has a central wavelength corresponding to the wavelength of the mono-chromatic li~ht projected on the surface to be inspected.
Because foreign light noise is generally spread over a broad spectrum, it is possible to reject most of the foreign light noise by selecting an optical filter having a narrow band to thereby increase the visibility of the projected light over the background light noise and to ~` thus facilitate image processing. But for light noise ~ emitters such as a welding torch, there is still enough ,~ light noise intensity within the band of the optical ~: 20 filter to disturb considerably the quality of the image.
~ Narrow band optical filters, however, have a i limited efficiency in rejecting foreign light noise since it is not practically possible to reduce the bandwidth of such filters under about 2-10 nanometers depending on the .:
~ optical design. A narrow band optical filter such as an `~ interference filter is temperature dependent and thus the reduction of its bandwid-th will require greater temperatu-re stability. Moreover, the effective bandwidth and central wavelength of an interference filter is dependent ;`;
~ 2 -132677~
,i.
., upon the angle of incidence of -the light. The effect becomes increasingly disturbing as the bandwidth of the Eilter is reduced.
On the other hand, the use of a powerEull projected light source such as a powerfull laser will contribute to increasing the predominance of the desired signal over noise and thus improving the quality of the image. However, the intensity of the projected light will rapidly become unsafe for eyes when used in an area where human operators are standing by. Also, the cost of such a powerfull laser will be prohibitive.
It is therefore an object of the present inven-tion to overcome the above drawbacks and to provide a method and apparatus enabling active vision image enhance-,:
~` ment.
i~
According to one aspect of the invention, there is thus provided a method of optically inspecting the :.~ geometry of a surface in an environment which is subject . ~,.
~ to the presence of external light noise perturbations. The :
method of the invention comprises the steps of:
~` a) projecting a beam of monochromatic light having a predetermined wavelength and a structured light pattern onto the surface -to be inspected, to thereby scatter the structured light beam and produce a scattered light beam;
. b) separating the scattered light beam into ~5 ~ first and second scattered beam portions;
c) passing the first scattered beam portion through a first optical filter having a narrow bandwid-th , ~ 30 and a central wavelength corresponding substantially to ~:, `: ~ 3 ~
,, ' the wavelength of the projected light, thereby providing a first optical output signal representative of the surface geometry and of external light noise perturbation;
d) passing the second scattered beam portion through a second optical filter having a narrow bandwidth and a central wavelength which is closely spaced from the wavelength of the projected light by a wavelen~th offset such as to reject the projected light wavelength, thereby providing a second optical output signal representative of substantially the same external light noise perturbation as that passing through the first optical fil-ter;
e) detecting the first and second optical output signals and converting same into first and second .; electrical signals, respectively; and `~ f) sub-tracting the second electrical signal from the first electrical signal -to provide a substantial-.~}. ly noise-free electrical output signal representative of the surface geometry.
. The present invention also provides, in another aspect thereof, an apparatus for carrying out a method as ~X defined above. The apparatus of the invention comprises ., structured monochromatic light source means for generating ~, a beam of monochromatic light having a predetermined wave-~, length with a structured light pattern and projecting same . onto the surface to be inspected, to thereby scatter the ~ x.
structured light beam and produce a scattered light beam, and beam splitting means for separating the scattered . light beam in-to first and second scattered beam portions travelling along respective optical paths. A first optical filter having a narrow bandwidth and a central wavelength !~ ~ 3 2 ~ 7 7 ,.
corresponding substantially to the wavelength of the projected light is arranged in the optical path of the first scattered beam portion -to provide a first optical output signal representative of the surEace geometry and : of external light noise perturbation. A second optlcal filter having a narrow bandwidth and a central wavelength which is closely spaced from the wavelength of the projected light by a wavelength offset such as to reject the projected light wavelength, is arranged in the optical . 10 path of the second scattered beam portion to provide a ~`. second optical output signal representative of substan-:.: tially the same external light noise perturbation as that .~, . passing through the first optical filter. First and second : detector means are provided for detecting the first and ,: ~
`~ second optical output signals and converting same into ;~ first and second electrical signals, respectively. A sub-tracting circuit is connected to the first and second ...~.-~ detector means for subtracting the second electrical -~:. signal from the first electrical signal to provide a sub-~ 20 stantially noise-free electrical output signal representa-:............. tive of the surface geometry.
.~ Applicant has found quite unexpectedly that by ~ using two narrow band optical filters arranged in the `~ respective optical paths of the scattered bea~ portions ~ produced by a beam splitter, one optical filter having a .i . central wavelength corresponding substantially to the :~ wavelength of the projected light and the other optical ~; filter having a central wavelength closely spaced from the wavelength of the projected :Light by a wavelength offset ~` 30 such as to reject the projected light wavelength, and by ' : _ 5 _ ', `', -` 13~77~
subtracting the signals derived from these optical filter.s, it is possible to obtain a substantially noise-free output signal representative of the geometry of the surface undergoing inspection.
According to a preferred embodiment of the invention, the fixst and second optical filters have sub-stantially the same bandwidth such that the quantity of light noise passing through each filter is substantially the same. Slight differences in the bandwidths of the otpical filters can be compensated for by means of two separate amplifiers connected between the detectors and the subtracting circuit, which amplifiers serve to adjust the relative sensitivity of the detectors and to properly balance the amplitude of the electrical signals from the ~. .
~; detectors. Preferably, the second optical filter has a central wavelength closely spaced from the wavelength of the projected light by a wavelength offset which is sub-stantially equal to the bandwidth of both optical filters.
The optical filters preferably used comprise ~ 20 interference filters having a bandwid-th ranging from about :,.~'.
' 2 to about 10 nanometers.
The method and apparatus according to the . .:
invention are particularly useful for active vision robot welding and enable arc light noise-free images to be , obtained in real time.
Further features and advantages of the inven-`~ tion will become more readily apparent from the following ~, ~` description of preferred embodiments with reference to the accompanying drawings, in which:
~!~
, ~ - 6 -~.i ., ~L~2~774 Figure 1 schematically illustrates an active vision system according to the prior art, as used for real-time arc-welding process control and seam tracking;
Figure 2 is a schematic diagram of an apparatus ....
~` according to a preferred embodiment of the invention;
,: Figure 3 is a graph illustrating the spectral characteristics of an interference filter used to elimi-nate the light noise generated by a typical electric arc;
Figure 4 is a graph illustrating the spectral 0 characteristics of two in-terference filters used in ~; accordance with the invention to eliminate the light noise "
generated by an electric arc; and Figures 5A, 5B and 5C are photographs showing respectively the images typically detected by the two i~ detectors of the apparatus illustrated in Figure 2, when , . .
~ used for active vision robot welding, and the image after s " .
.~ noise cancellation (subtraction).
; Referring first to Fig. 1, there is illustrated ~; a typical active vision system according to the prior art, 20for real-time arc-welding process control and seam track-~; ing. As shown, a welding torch 10 is positioned above two .. . .
workpiece members 12 and 12~ to be joined and is adapted :
to perform root pass welding of the open butt joint 14 defined between the two workpiece members 12,12'. The ,^ ~
welding torch 10 is operative to discharge an electric arc `~ 16, thereby forming a weldpool 18 penetrating the joint.
'~ In order to provide precise seam profile measurement, a ` monochromatic light source 20 such as a laser diode, optically coupled to an optical projection unit 22 by 30means of a glass fiber optical waveguide 24, is used to ':
` - 7 -.:
1~2~7~
project a laser line 26 onto the surface of the workpiece members 12,12'; although -the structured light pattern 26 illustrated is a line, such a light pattern may also be a simple dot, a mechanically scanned dot or a more sophis-ticated pattern. A video camera 28 such as a CCD (Charged Coupled Device) camera is positioned to view the light scattered by the surface, the scattered light being represented in the form of a scattered laser beam 30. An interference filter 32 placed in front of the camera 28 is used for light noise rejection. Such a system, however, has limited application since the electric arc 16 generated by the welding torch lO still provides enough ,. .
light noise intensity with the band of the filter 32 to ; disturb considerably the quality of the image viewed by ;~; the camera 28.
Figure 2 schema-ticzlly illustrates how effi-cient light noise rejection can be achieved in accordance .~ with the invention. To this end, the scattered laser beam i 30 is passed through a focussing lens 34 and directed onto `' 20 a 50% - 50% beam splitter 36 which separates the scattered - beam 30 into two scattered beam portions 30a and 30b. The beam portion 30a is reflected by a back-reflective mirror 38 and directed through an optical interference filter 40 ' and onto a CCD detector 42. Similarly, the beam portion 30b is directed through an optical interference filter 44 . and onto a CCD detector 46. The interference filters 40 and 44 have substantially the same bandwidth which typically ranges from about 2 to about lO nanometers.
However, the filter 40 has a central wavelength corre-::, ~ 30 sponding substantially to the wavelength of the laser ,.
~ - 8 -132~77~
,i . .
diode 20, whereas the filter 44 has a central wavelength which is closely spaced from the wavelength of the laser diode by a wavelength offset such as to reject the laser wavelength. Thus, the filtered beam portion 30'a defines an optical output signal representative of the seam profile and of light noise perturbation, whereas the filtered beam portion 30'b defines an optical ou-tput .....
signal representative of substantially the same light noise perturbation as that passing through the filter 40.
The optical output signals 30'a and 30'b are converted by , the detectors 42 and 46 into corresponding electrical ,i signals 48 and 50 which are fed to an analog subtractor 52 which is operative to subtract the signal 50 from the ~ r ~ signal 48 and to thereby provide a substantially noise-0,.:
~ free electrical output signal 54 representative of the ~,~x ~;~ seam profile. The ou-tput signal 54 is then fed to an image ....
.` processor (not shown).
;
'~ Since the sensitivities of the detectors 42 and ;~ 46 are generally not exactly the same and also because the ; 20 interference filters 40 and 44 generally show different ; transmissivity values, two separate amplifiers 56 and 58 ~, are used to balance the amplitude of the signals 48 and 50.
The mirror 38 which is arranged in the optical ~, ;~ path of the beam portion 30a is used to provide a `,~ reflected beam por-tion having the same spatial dis-tribu-..
tion as the beam portion 30b. However, when use is made of linear CCD-detectors 42 and 46, such a mirror can be eliminated.
'.' ., _ g _ '`.
'.,`
~ L32~7~4 r Figure 3 illustrates the spectrum 60 of the light emitted by a typical electric arc as well as the ~, spectrum 62 of a spat-ter, that is, a molten metal particle. Also shown is the spectral response 64 of a typical interference filter centered on the spectral line 66 of a laser diode.
Figure 4 is a graph similar to Figure 3 with '- the exception that the spectral response 68 of an addi-i tional interference filter is shown and that the scalling ,il.
~ 10 has been increased to show details in the spectral range "'f -,: of the wavelength of the laser line 66. The spectral responses 64 and 68 are typically those of the interferen-. ce filters 40 and 44, respec-tively. As may be seen, the ;~ spectral response 68 of the second filter 44 has a central `~ wavelength (i.e. about 820 nanometers) which is closely .~.::
, spaced from the wavelength (i.e. about 830 nanometers) of the laser line 66 by a wavelength offset of about 10 nano-;~ meters such as to reject the laser wavelength. The spectral responses 64 and 68 also exhibit substantially f the same bandwidth. Thus t the light noise passing through each filter is substantially the same in terms of both ~"
quantity and signal content.
~;~ Figure 5A illustrates the image as typically detected by the de-tector 42; shown in this image are the arc light noise 70, the light noise 72 emitted by a spatter and the scattered laser light 74 representative of ~: the seam profile. Figure SB illustrates the image as typically de-tected by the detector 46; shown in this image ~`~ are the arc light noise 70 and the spatter light noise 72.
Figure 5C illustrates the image derived from the electri-:
~ `
: ~ -- 1 0 132~77 r cal output slgnal 54 following subtraction of the electri-cal signal 50 from the electrical signal 48. As may be r':
iri seen from Fig. 5C, the image is substantially noise-free.
,, :' r ,:
~'~
. ,~ , .
,;.;
~;`
~' : ~:
. ,~ .
:., ~:
: r' ~r~
:,~
''i' ,.,~
~r'' r . ~.
, ~ .
.~-`
~.
., :`
. 11 ~
. . .
~.
Claims (20)
1. A method of optically inspecting the geometry of a surface in an environment which is subject to the presence of external light noise perturbations, which comprises the steps of:
a) projecting a beam of monochromatic light having a predetermined wavelength and a structured light pattern onto said surface to thereby scatter the struc-tured light beam and produce a scattered light beam;
b) separating said scattered light beam into first and second scattered beam portions;
c) passing said first scattered beam portion through a first optical filter having a narrow bandwidth and a central wavelength corresponding substantially to said predetermined wavelength, thereby providing a first optical output signal representative of the surface geometry and of external light noise perturbation;
d) passing said second scattered beam portion through a second optical filter having a narrow bandwidth and a central wavelength which is closely spaced from said predetermined wavelength by a wavelength offset such as to reject said predetermined wavelength, thereby providing a second optical output signal representative of substan-tially the same external light noise perturbation as that passing through said first optical filter;
e) detecting said first and second optical output signals and converting same into first and second electrical signals, respectively; and f) subtracting said second electrical signal from said first electrical signal to provide a substan-tially noise-free electrical output signal representative of said surface geometry.
a) projecting a beam of monochromatic light having a predetermined wavelength and a structured light pattern onto said surface to thereby scatter the struc-tured light beam and produce a scattered light beam;
b) separating said scattered light beam into first and second scattered beam portions;
c) passing said first scattered beam portion through a first optical filter having a narrow bandwidth and a central wavelength corresponding substantially to said predetermined wavelength, thereby providing a first optical output signal representative of the surface geometry and of external light noise perturbation;
d) passing said second scattered beam portion through a second optical filter having a narrow bandwidth and a central wavelength which is closely spaced from said predetermined wavelength by a wavelength offset such as to reject said predetermined wavelength, thereby providing a second optical output signal representative of substan-tially the same external light noise perturbation as that passing through said first optical filter;
e) detecting said first and second optical output signals and converting same into first and second electrical signals, respectively; and f) subtracting said second electrical signal from said first electrical signal to provide a substan-tially noise-free electrical output signal representative of said surface geometry.
2. A method as claimed in claim 1, wherein step (a) is carried out by means of a laser diode optically coupled to an optical projection unit for projecting a structured laser beam onto said surface.
3. A method as claimed in claim 1, wherein step (b) is carried out by means of a 50% - 50% beam splitter.
4. A method as claimed in claim 1, wherein said first and second optical filters comprise interference filters having a bandwidth ranging from about 2 to about 10 nanometers.
5. A method as claimed in claim 1, wherein said first and second optical filters have substantially the same bandwidth.
6. A method as claimed in claim 5, wherein said second optical filter has a central wavelength closely spaced from said predetermined wavelength by a wavelength offset which is substantially equal to the bandwidth of both said filters.
7. A method as claimed in claim 1, wherein step (e) is carried out by means of two separate CCD-type detectors.
8. A method as claimed in claim 7, wherein said first and second scattered beam portions are focussed through said first and second optical filters and onto said detectors.
9. A method as claimed in claim 7, wherein said first scattered beam portion is directed onto a mirror to produce a reflected beam portion which is thereafter directed through said first optical filter and onto one of said detectors.
10. A method as claimed in claim 7, wherein step (e) is carried out by means of an analog subtracting circuit connected to said detectors.
11. An apparatus for optically inspecting the geometry of a surface in an environment which is subject to the presence of external light noise perturbations, which comprises:
- structured monochromatic light source means for generating a beam of monochromatic light having a predetermined wavelength with a structured light pattern and projecting same onto said surface to thereby scatter the structured light beam and produce a scattered light beam;
- beam splitting means for separating said scattered light beam into first and second scattered beam portions travelling along respective optical paths;
- a first optical filter having a narrow band-width and a central wavelength corresponding substantially to said predetermined wavelength, said first optical filter being arranged in the optical path of said first scattered beam portion to provide a first optical output signal representative of the surface geometry and of external light noise perturbation;
- a second optical filter having a narrow band-width and a central wavelength which is closely spaced from said predetermined wavelength by a wavelength offset such as to reject said predetermined wavelength, said second optical filter being arranged in the optical path of said second scattered beam portion to provide a second optical. output signal representative of substantially the same external light noise perturbation as that passing through said first optical filter;
- first and second detector means for detecting said first and second optical output signals and convert-ing same into first and second electrical signals, respec-tively; and - a subtracting circuit connected to said first and second detector means for subtracting said second electrical signal from said first electrical signal to provide a substantially noise-free electrical output signal representative of said surface geometry.
- structured monochromatic light source means for generating a beam of monochromatic light having a predetermined wavelength with a structured light pattern and projecting same onto said surface to thereby scatter the structured light beam and produce a scattered light beam;
- beam splitting means for separating said scattered light beam into first and second scattered beam portions travelling along respective optical paths;
- a first optical filter having a narrow band-width and a central wavelength corresponding substantially to said predetermined wavelength, said first optical filter being arranged in the optical path of said first scattered beam portion to provide a first optical output signal representative of the surface geometry and of external light noise perturbation;
- a second optical filter having a narrow band-width and a central wavelength which is closely spaced from said predetermined wavelength by a wavelength offset such as to reject said predetermined wavelength, said second optical filter being arranged in the optical path of said second scattered beam portion to provide a second optical. output signal representative of substantially the same external light noise perturbation as that passing through said first optical filter;
- first and second detector means for detecting said first and second optical output signals and convert-ing same into first and second electrical signals, respec-tively; and - a subtracting circuit connected to said first and second detector means for subtracting said second electrical signal from said first electrical signal to provide a substantially noise-free electrical output signal representative of said surface geometry.
12. An apparatus as claimed in claim 11, wherein said structured monochromatic light source means comprises a laser diode optically coupled to an optical projection unit for projecting a structured laser beam onto said surface.
13. An apparatus as claimed in claim 11, wherein said beam splitting means comprises a 50% - 50% beam splitter.
14. An apparatus as claimed in claim 11, wherein said first and second optical filters comprise interferen-ce filters having a bandwidth ranging from about 2 to about 10 nanometers.
15. An apparatus as claimed in claim 11, wherein said first and second optical filters have substantially the same bandwidth.
16. An apparatus as claimed in claim 15, wherein said second optical filter has a central wavelength closely spaced from said predetermined wavelength by a wavelength offset which is substantially equal to the bandwidth of both said filters.
17. An apparatus as claimed in claim 11, further including optical lens means for focussing said first and second scattered beam portions through said first and second optical filters and onto said first and second detector means.
18. An apparatus as claimed in claim 11, further including a mirror arranged in the optical path of said first scattered beam portion between said beam splitting means and said first optical filter for producing a reflected beam portion directed through said first optical filter and onto said first detector means.
19. An apparatus as claimed in claim 11, wherein said first and second detector means each comprise a CCD-type detector.
20. An apparatus as claimed in claim 11, wherein said subtracting circuit comprises an analog subtracting circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA000604384A CA1326774C (en) | 1989-06-29 | 1989-06-29 | Method and apparatus for active vision image enhancement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA000604384A CA1326774C (en) | 1989-06-29 | 1989-06-29 | Method and apparatus for active vision image enhancement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1326774C true CA1326774C (en) | 1994-02-08 |
Family
ID=4140281
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000604384A Expired - Fee Related CA1326774C (en) | 1989-06-29 | 1989-06-29 | Method and apparatus for active vision image enhancement |
Country Status (1)
| Country | Link |
|---|---|
| CA (1) | CA1326774C (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108225216A (en) * | 2016-12-14 | 2018-06-29 | 中国科学院深圳先进技术研究院 | Structured-light system scaling method and device, structured-light system and mobile equipment |
-
1989
- 1989-06-29 CA CA000604384A patent/CA1326774C/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108225216A (en) * | 2016-12-14 | 2018-06-29 | 中国科学院深圳先进技术研究院 | Structured-light system scaling method and device, structured-light system and mobile equipment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4933541A (en) | Method and apparatus for active vision image enhancement with wavelength matching | |
| US6621047B2 (en) | Method and sensor device for monitoring a laser machining operation to be performed on a work piece as well as laser machining head with a sensor device of the kind | |
| US6084205A (en) | Method for enhanced control of welding processes | |
| CA1250765A (en) | Welding position detecting apparatus | |
| JP3227650B2 (en) | Laser welding machine and laser welding condition monitoring method | |
| JPS58212873A (en) | Infrared sensor for arc welding | |
| JPH02503112A (en) | Method and apparatus for determining surface topography information | |
| CN115335183A (en) | Method for analyzing a welded connection during laser welding of workpieces | |
| CN117729983A (en) | Method for monitoring a laser welding process and related laser welding system | |
| JPH0249194B2 (en) | ||
| CA1326774C (en) | Method and apparatus for active vision image enhancement | |
| JP2000225481A (en) | Measuring unit for laser beam welding state | |
| CA2323803A1 (en) | Structured multi-spot detecting technique for adaptive control of laser beam processing | |
| JPH0423724B2 (en) | ||
| US20220347789A1 (en) | Laser processing monitoring method and laser processing monitoring device | |
| JP2000061672A (en) | Laser welding state detecting method | |
| JPH07119712B2 (en) | Cover defect detection apparatus and method | |
| Li et al. | Machine vision analysis of welding region and its application to seam tracking in arc welding | |
| Tönshoff et al. | Process and quality control for automotive laser welding applications | |
| JP3136556B2 (en) | Laser welding machine | |
| JPH05281130A (en) | Foreign-matter inspection apparatus | |
| JP3355546B2 (en) | Laser welding defect detection device and defect detection method | |
| JP2024075995A (en) | Laser Processing Equipment | |
| JP2001219287A (en) | Monitoring method of laser beam welding | |
| JPS6350109B2 (en) |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKLA | Lapsed |