AU2002214372A1 - Thin film resonator and method for manufacturing the same - Google Patents
Thin film resonator and method for manufacturing the sameInfo
- Publication number
- AU2002214372A1 AU2002214372A1 AU2002214372A AU1437202A AU2002214372A1 AU 2002214372 A1 AU2002214372 A1 AU 2002214372A1 AU 2002214372 A AU2002214372 A AU 2002214372A AU 1437202 A AU1437202 A AU 1437202A AU 2002214372 A1 AU2002214372 A1 AU 2002214372A1
- Authority
- AU
- Australia
- Prior art keywords
- manufacturing
- same
- thin film
- film resonator
- resonator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 239000010409 thin film Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
- H03H9/02133—Means for compensation or elimination of undesirable effects of stress
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/0538—Constructional combinations of supports or holders with electromechanical or other electronic elements
- H03H9/0542—Constructional combinations of supports or holders with electromechanical or other electronic elements consisting of a lateral arrangement
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H2003/027—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks the resonators or networks being of the microelectro-mechanical [MEMS] type
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/24—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive
- H03H9/2405—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive of microelectro-mechanical resonators
- H03H2009/241—Bulk-mode MEMS resonators
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2000-0067032A KR100473871B1 (en) | 2000-11-13 | 2000-11-13 | Thin film resonator |
KR0067032 | 2000-11-13 | ||
PCT/KR2001/001894 WO2002039537A1 (en) | 2000-11-13 | 2001-11-07 | Thin film resonator and method for manufacturing the same |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2002214372A1 true AU2002214372A1 (en) | 2002-05-21 |
Family
ID=19698538
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002214372A Abandoned AU2002214372A1 (en) | 2000-11-13 | 2001-11-07 | Thin film resonator and method for manufacturing the same |
Country Status (6)
Country | Link |
---|---|
US (2) | US6762471B2 (en) |
JP (1) | JP3867231B2 (en) |
KR (1) | KR100473871B1 (en) |
CN (1) | CN1249826C (en) |
AU (1) | AU2002214372A1 (en) |
WO (1) | WO2002039537A1 (en) |
Families Citing this family (84)
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TWI242883B (en) * | 2001-06-28 | 2005-11-01 | Winbond Electronics Corp | Manufacturing process of high-frequency thin-film bulk acoustic wave filter and apparatus thereof |
JP2003017964A (en) * | 2001-07-04 | 2003-01-17 | Hitachi Ltd | Manufacturing method for acoustic wave element |
JP3944372B2 (en) * | 2001-09-21 | 2007-07-11 | 株式会社東芝 | Piezoelectric thin film vibrator and frequency variable resonator using the same |
JP2003110016A (en) | 2001-09-28 | 2003-04-11 | Kobe Steel Ltd | Method of forming aerial metal wiring on semiconductor substrate |
TW540173B (en) * | 2002-05-03 | 2003-07-01 | Asia Pacific Microsystems Inc | Bulk acoustic device having integrated fine-tuning and trimming devices |
KR100506729B1 (en) * | 2002-05-21 | 2005-08-08 | 삼성전기주식회사 | Film bulk acoustic resonator and method for fabrication thereof |
US7045381B1 (en) | 2002-06-28 | 2006-05-16 | Silicon Light Machines Corporation | Conductive etch stop for etching a sacrificial layer |
US6777258B1 (en) * | 2002-06-28 | 2004-08-17 | Silicon Light Machines, Inc. | Conductive etch stop for etching a sacrificial layer |
US6894360B2 (en) * | 2002-07-30 | 2005-05-17 | Agilent Technologies, Inc. | Electrostatic discharge protection of thin-film resonators |
US7312674B2 (en) | 2002-08-06 | 2007-12-25 | The Charles Stark Draper Laboratory, Inc. | Resonator system with a plurality of individual mechanically coupled resonators and method of making same |
KR100517841B1 (en) | 2003-02-22 | 2005-09-30 | 주식회사 엠에스솔루션 | FBAR band pass filter, Duplexer having the FBAR band pass filter and Methods for manufacturing the same |
US7005236B2 (en) * | 2003-04-23 | 2006-02-28 | Taiwan Semiconductor Manufacturing Company | Maintaining photoresist planarity at hole edges |
KR100485702B1 (en) * | 2003-05-29 | 2005-04-28 | 삼성전자주식회사 | Film bulk acoustic resonator having support structure and method thereof |
KR100558439B1 (en) * | 2003-09-15 | 2006-03-10 | 삼성전기주식회사 | FBAR of Wafer Level Pakage and manufacturing method thereof |
US7057477B2 (en) * | 2003-12-24 | 2006-06-06 | Intel Corporation | Integration of FBAR filter(s) and on-chip inductors |
US20050148065A1 (en) * | 2003-12-30 | 2005-07-07 | Intel Corporation | Biosensor utilizing a resonator having a functionalized surface |
US7038559B2 (en) * | 2004-02-23 | 2006-05-02 | Ruby Richard C | Vertically separated acoustic filters and resonators |
JP2005311568A (en) * | 2004-04-20 | 2005-11-04 | Sony Corp | Filter device and transceiver |
JP2005311567A (en) * | 2004-04-20 | 2005-11-04 | Sony Corp | Filter device and transceiver |
JP4149416B2 (en) * | 2004-05-31 | 2008-09-10 | 富士通メディアデバイス株式会社 | Piezoelectric thin film resonator, filter, and manufacturing method thereof |
JP2006135529A (en) * | 2004-11-04 | 2006-05-25 | Japan Radio Co Ltd | Manufacturing method of thin-film resonator |
US8981876B2 (en) | 2004-11-15 | 2015-03-17 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Piezoelectric resonator structures and electrical filters having frame elements |
US7791434B2 (en) * | 2004-12-22 | 2010-09-07 | Avago Technologies Wireless Ip (Singapore) Pte. Ltd. | Acoustic resonator performance enhancement using selective metal etch and having a trench in the piezoelectric |
US7172921B2 (en) * | 2005-01-03 | 2007-02-06 | Miradia Inc. | Method and structure for forming an integrated spatial light modulator |
US8207004B2 (en) | 2005-01-03 | 2012-06-26 | Miradia Inc. | Method and structure for forming a gyroscope and accelerometer |
KR100692593B1 (en) * | 2005-01-24 | 2007-03-13 | 삼성전자주식회사 | Manufacturing method of mems structure |
US20060274476A1 (en) * | 2005-04-13 | 2006-12-07 | Andrew Cervin-Lawry | Low loss thin film capacitor and methods of manufacturing the same |
JP5002815B2 (en) * | 2005-06-04 | 2012-08-15 | 国立大学法人豊橋技術科学大学 | Integrated device and manufacturing method thereof |
US20070063777A1 (en) * | 2005-08-26 | 2007-03-22 | Mircea Capanu | Electrostrictive devices |
US20070093229A1 (en) * | 2005-10-20 | 2007-04-26 | Takehiko Yamakawa | Complex RF device and method for manufacturing the same |
US7732241B2 (en) * | 2005-11-30 | 2010-06-08 | Semiconductor Energy Labortory Co., Ltd. | Microstructure and manufacturing method thereof and microelectromechanical system |
JP4707574B2 (en) * | 2006-02-02 | 2011-06-22 | 太陽誘電株式会社 | Piezoelectric thin film resonator, filter and manufacturing method thereof |
DE102006047761A1 (en) * | 2006-10-06 | 2008-04-10 | Infineon Technologies Ag | Semiconductor component and method for its production |
KR100856391B1 (en) * | 2006-12-06 | 2008-09-04 | 한국전자통신연구원 | Method for manufacturing floating structure of microelectromechanical systme |
KR100779016B1 (en) * | 2006-12-15 | 2007-11-22 | 동부일렉트로닉스 주식회사 | Semiconductor device and fabricating method thereof |
US8562770B2 (en) | 2008-05-21 | 2013-10-22 | Manufacturing Resources International, Inc. | Frame seal methods for LCD |
US8089195B2 (en) * | 2007-12-17 | 2012-01-03 | Resonance Semiconductor Corporation | Integrated acoustic bandgap devices for energy confinement and methods of fabricating same |
US8278802B1 (en) * | 2008-04-24 | 2012-10-02 | Rf Micro Devices, Inc. | Planarized sacrificial layer for MEMS fabrication |
US9573346B2 (en) | 2008-05-21 | 2017-02-21 | Manufacturing Resources International, Inc. | Photoinitiated optical adhesive and method for using same |
US9154107B2 (en) | 2009-05-28 | 2015-10-06 | Northrop Grumman Systems Corporation | Lateral over-moded bulk acoustic resonators |
US8248185B2 (en) * | 2009-06-24 | 2012-08-21 | Avago Technologies Wireless Ip (Singapore) Pte. Ltd. | Acoustic resonator structure comprising a bridge |
US9673778B2 (en) | 2009-06-24 | 2017-06-06 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Solid mount bulk acoustic wave resonator structure comprising a bridge |
US9520856B2 (en) | 2009-06-24 | 2016-12-13 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator structure having an electrode with a cantilevered portion |
US8902023B2 (en) * | 2009-06-24 | 2014-12-02 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator structure having an electrode with a cantilevered portion |
US9450561B2 (en) | 2009-11-25 | 2016-09-20 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Bulk acoustic wave (BAW) resonator structure having an electrode with a cantilevered portion and a piezoelectric layer with varying amounts of dopant |
US9243316B2 (en) | 2010-01-22 | 2016-01-26 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Method of fabricating piezoelectric material with selected c-axis orientation |
US8796904B2 (en) | 2011-10-31 | 2014-08-05 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Bulk acoustic resonator comprising piezoelectric layer and inverse piezoelectric layer |
US9197185B2 (en) | 2010-04-29 | 2015-11-24 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Resonator device including electrodes with buried temperature compensating layers |
US9479139B2 (en) | 2010-04-29 | 2016-10-25 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Resonator device including electrode with buried temperature compensating layer |
JP5187597B2 (en) * | 2010-07-05 | 2013-04-24 | 株式会社村田製作所 | Elastic wave element |
US8962443B2 (en) | 2011-01-31 | 2015-02-24 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Semiconductor device having an airbridge and method of fabricating the same |
US9083302B2 (en) | 2011-02-28 | 2015-07-14 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Stacked bulk acoustic resonator comprising a bridge and an acoustic reflector along a perimeter of the resonator |
US9148117B2 (en) | 2011-02-28 | 2015-09-29 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Coupled resonator filter comprising a bridge and frame elements |
US9136818B2 (en) | 2011-02-28 | 2015-09-15 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Stacked acoustic resonator comprising a bridge |
US9203374B2 (en) | 2011-02-28 | 2015-12-01 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Film bulk acoustic resonator comprising a bridge |
US9425764B2 (en) | 2012-10-25 | 2016-08-23 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Accoustic resonator having composite electrodes with integrated lateral features |
US9048812B2 (en) | 2011-02-28 | 2015-06-02 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Bulk acoustic wave resonator comprising bridge formed within piezoelectric layer |
US9099983B2 (en) | 2011-02-28 | 2015-08-04 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Bulk acoustic wave resonator device comprising a bridge in an acoustic reflector |
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US9444426B2 (en) | 2012-10-25 | 2016-09-13 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Accoustic resonator having integrated lateral feature and temperature compensation feature |
US8575820B2 (en) | 2011-03-29 | 2013-11-05 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Stacked bulk acoustic resonator |
US8704428B2 (en) | 2011-04-20 | 2014-04-22 | Qualcomm Mems Technologies, Inc. | Widening resonator bandwidth using mechanical loading |
US8350445B1 (en) | 2011-06-16 | 2013-01-08 | Avago Technologies Wireless Ip (Singapore) Pte. Ltd. | Bulk acoustic resonator comprising non-piezoelectric layer and bridge |
US8922302B2 (en) * | 2011-08-24 | 2014-12-30 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator formed on a pedestal |
US9105751B2 (en) | 2011-11-11 | 2015-08-11 | International Business Machines Corporation | Integrated semiconductor devices with single crystalline beam, methods of manufacture and design structure |
US9154103B2 (en) | 2012-01-30 | 2015-10-06 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Temperature controlled acoustic resonator |
US9667220B2 (en) | 2012-01-30 | 2017-05-30 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Temperature controlled acoustic resonator comprising heater and sense resistors |
US9608592B2 (en) | 2014-01-21 | 2017-03-28 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Film bulk acoustic wave resonator (FBAR) having stress-relief |
US9667218B2 (en) | 2012-01-30 | 2017-05-30 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Temperature controlled acoustic resonator comprising feedback circuit |
DE102012215774A1 (en) * | 2012-09-06 | 2014-03-06 | Robert Bosch Gmbh | Piezoelectric actuator |
KR20170122539A (en) * | 2016-04-27 | 2017-11-06 | 삼성전기주식회사 | Bulk acoustic wave resonator and method for manufacturing the same |
US11558031B2 (en) | 2017-03-08 | 2023-01-17 | Samsung Electro-Mechanics Co., Ltd. | Film bulk acoustic resonator and method of manufacturing the same |
KR102369436B1 (en) * | 2017-04-19 | 2022-03-03 | 삼성전기주식회사 | Bulk acoustic wave resonator |
KR101942734B1 (en) | 2017-05-18 | 2019-01-28 | 삼성전기 주식회사 | Bulk-acoustic wave resonator |
JP6909059B2 (en) * | 2017-06-07 | 2021-07-28 | 太陽誘電株式会社 | Piezoelectric thin film resonators, filters and multiplexers |
CN108363950A (en) * | 2018-01-08 | 2018-08-03 | 杭州士兰微电子股份有限公司 | Ultrasonic fingerprint sensor and its manufacturing method |
CN110166014B (en) * | 2018-02-11 | 2020-09-08 | 诺思(天津)微系统有限责任公司 | Bulk acoustic wave resonator and method for manufacturing the same |
CN111342799B (en) * | 2018-12-18 | 2023-12-15 | 天津大学 | Bulk acoustic resonator with enlarged release channel, filter, electronic device |
CN111384907B (en) * | 2018-12-29 | 2023-07-18 | 开元通信技术(厦门)有限公司 | Bulk acoustic wave resonator, manufacturing method thereof, filter and duplexer |
CN110661067B (en) * | 2019-09-12 | 2021-02-26 | 天津大学 | Band-pass filter of dielectric integrated suspension line based on 5G double-frequency |
CN112260659B (en) * | 2020-10-26 | 2022-02-01 | 武汉大学 | high-Q-value film bulk acoustic resonator and preparation method thereof |
CN113566982B (en) * | 2021-07-12 | 2022-05-24 | 北京北方高业科技有限公司 | Infrared detector with microbridge structure |
CN113852357B (en) * | 2021-11-26 | 2022-02-18 | 深圳新声半导体有限公司 | Film bulk acoustic resonator structure and manufacturing method thereof |
CN114157259B (en) * | 2022-02-10 | 2022-05-20 | 深圳新声半导体有限公司 | Manufacturing method based on bandwidth-enhanced FBAR filter |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60189307A (en) * | 1984-03-09 | 1985-09-26 | Toshiba Corp | Piezoelectric thin film resonator and its manufacture |
JPH0316311A (en) * | 1989-03-30 | 1991-01-24 | Canon Inc | Surface acoustic wave element and manufacture thereof |
US5449953A (en) * | 1990-09-14 | 1995-09-12 | Westinghouse Electric Corporation | Monolithic microwave integrated circuit on high resistivity silicon |
JPH06326540A (en) * | 1993-05-17 | 1994-11-25 | Murata Mfg Co Ltd | Production of piezo-electric element |
SE506303C2 (en) * | 1995-06-13 | 1997-12-01 | Ericsson Telefon Ab L M | Device and method of tunable devices |
US5696423A (en) * | 1995-06-29 | 1997-12-09 | Motorola, Inc. | Temperature compenated resonator and method |
JP3331967B2 (en) * | 1998-06-02 | 2002-10-07 | 松下電器産業株式会社 | Millimeter wave module |
JP2000307376A (en) * | 1999-04-16 | 2000-11-02 | Takaya Watanabe | Crystal vibrator |
JP3468163B2 (en) * | 1999-07-05 | 2003-11-17 | 株式会社村田製作所 | Support structure for piezoelectric resonator, electronic component, ladder filter, and communication device |
KR20010026587A (en) * | 1999-09-07 | 2001-04-06 | 구자홍 | micromachined tunable filter and production method |
US6441539B1 (en) * | 1999-11-11 | 2002-08-27 | Murata Manufacturing Co., Ltd. | Piezoelectric resonator |
KR100379440B1 (en) * | 2000-02-16 | 2003-04-10 | 엘지전자 주식회사 | method for fabricating of microwave resonator |
US6355498B1 (en) * | 2000-08-11 | 2002-03-12 | Agere Systems Guartian Corp. | Thin film resonators fabricated on membranes created by front side releasing |
US6710681B2 (en) * | 2001-07-13 | 2004-03-23 | Agilent Technologies, Inc. | Thin film bulk acoustic resonator (FBAR) and inductor on a monolithic substrate and method of fabricating the same |
-
2000
- 2000-11-13 KR KR10-2000-0067032A patent/KR100473871B1/en active IP Right Grant
-
2001
- 2001-11-07 CN CNB018036600A patent/CN1249826C/en not_active Expired - Lifetime
- 2001-11-07 JP JP2002541750A patent/JP3867231B2/en not_active Expired - Lifetime
- 2001-11-07 WO PCT/KR2001/001894 patent/WO2002039537A1/en active Application Filing
- 2001-11-07 US US10/169,500 patent/US6762471B2/en not_active Expired - Lifetime
- 2001-11-07 AU AU2002214372A patent/AU2002214372A1/en not_active Abandoned
-
2003
- 2003-08-08 US US10/636,584 patent/US6849475B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP3867231B2 (en) | 2007-01-10 |
US6849475B2 (en) | 2005-02-01 |
CN1395752A (en) | 2003-02-05 |
CN1249826C (en) | 2006-04-05 |
US20040026755A1 (en) | 2004-02-12 |
US6762471B2 (en) | 2004-07-13 |
KR20020037070A (en) | 2002-05-18 |
WO2002039537A1 (en) | 2002-05-16 |
US20030030118A1 (en) | 2003-02-13 |
JP2004514313A (en) | 2004-05-13 |
KR100473871B1 (en) | 2005-03-08 |
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