ZA87982B - An in situ particle size measuring device - Google Patents
An in situ particle size measuring deviceInfo
- Publication number
- ZA87982B ZA87982B ZA87982A ZA87982A ZA87982B ZA 87982 B ZA87982 B ZA 87982B ZA 87982 A ZA87982 A ZA 87982A ZA 87982 A ZA87982 A ZA 87982A ZA 87982 B ZA87982 B ZA 87982B
- Authority
- ZA
- South Africa
- Prior art keywords
- particle size
- measuring device
- size measuring
- situ particle
- situ
- Prior art date
Links
- 238000011065 in-situ storage Methods 0.000 title 1
- 239000002245 particle Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/0042—Investigating dispersion of solids
- G01N2015/0046—Investigating dispersion of solids in gas, e.g. smoke
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
- G01N2021/151—Gas blown
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4707—Forward scatter; Low angle scatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
- G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
- G01N2021/4719—Multiangle measurement using a optical fibre array
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/08—Optical fibres; light guides
Landscapes
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US82848086A | 1986-02-12 | 1986-02-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ZA87982B true ZA87982B (en) | 1988-05-25 |
Family
ID=25251928
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ZA87982A ZA87982B (en) | 1986-02-12 | 1987-02-11 | An in situ particle size measuring device |
Country Status (12)
| Country | Link |
|---|---|
| EP (1) | EP0256120B1 (OSRAM) |
| JP (1) | JPS63500402A (OSRAM) |
| KR (1) | KR900005240B1 (OSRAM) |
| CN (1) | CN1003470B (OSRAM) |
| AU (1) | AU589758B2 (OSRAM) |
| BR (1) | BR8705761A (OSRAM) |
| CA (1) | CA1292628C (OSRAM) |
| DE (1) | DE3763257D1 (OSRAM) |
| ES (1) | ES2004219A6 (OSRAM) |
| IN (1) | IN167553B (OSRAM) |
| WO (1) | WO1987005108A1 (OSRAM) |
| ZA (1) | ZA87982B (OSRAM) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10110066C1 (de) * | 2001-03-02 | 2002-06-20 | Parsum Ges Fuer Partikel Stroe | Meßsonde zur in-line-Bestimmung der Größe von bewegten Partikeln in transparenten Medien |
| GB2396023A (en) * | 2002-10-05 | 2004-06-09 | Oxford Lasers Ltd | Imaging system with purging device to prevent adhesion of particles |
| DE10344924A1 (de) * | 2003-09-25 | 2005-05-04 | Constantin Odefey | Verfahren und Vorrichtung zum Nachweis sehr geringer Partikelmengen |
| WO2010040257A1 (zh) * | 2008-10-09 | 2010-04-15 | 西门子公司 | 原位粒子测量装置 |
| JP5662742B2 (ja) * | 2010-08-27 | 2015-02-04 | アイステーシス株式会社 | 粒径計測装置及び粒径計測方法 |
| PL3308136T3 (pl) * | 2015-06-12 | 2022-04-11 | Koninklijke Philips N.V. | Czujnik optyczny cząstek i sposób wykrywania |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2122034A5 (OSRAM) * | 1971-01-15 | 1972-08-25 | Cilas | |
| US3819270A (en) * | 1972-10-02 | 1974-06-25 | Block Engineering | Blood cell analyzer |
| US3960449A (en) * | 1975-06-05 | 1976-06-01 | The Board Of Trustees Of Leland Stanford Junior University | Measurement of angular dependence of scattered light in a flowing stream |
| US4595291A (en) * | 1982-10-15 | 1986-06-17 | Tokyo Shibaura Denki Kabushiki Kaisha | Particle diameter measuring device |
| US4545677A (en) * | 1984-03-05 | 1985-10-08 | Becton, Dickinson And Company | Prismatic beam expander for light beam shaping in a flow cytometry apparatus |
| JPS61270639A (ja) * | 1985-05-25 | 1986-11-29 | Japan Spectroscopic Co | フロ−サイトメ−タ |
-
1987
- 1987-01-26 CA CA000528126A patent/CA1292628C/en not_active Expired - Fee Related
- 1987-01-30 IN IN96/CAL/87A patent/IN167553B/en unknown
- 1987-02-02 AU AU71290/87A patent/AU589758B2/en not_active Ceased
- 1987-02-02 EP EP87901878A patent/EP0256120B1/en not_active Expired - Lifetime
- 1987-02-02 KR KR1019870700917A patent/KR900005240B1/ko not_active Expired
- 1987-02-02 WO PCT/US1987/000308 patent/WO1987005108A1/en not_active Ceased
- 1987-02-02 DE DE8787901878T patent/DE3763257D1/de not_active Expired - Fee Related
- 1987-02-02 BR BR8705761A patent/BR8705761A/pt not_active IP Right Cessation
- 1987-02-02 JP JP62501775A patent/JPS63500402A/ja active Granted
- 1987-02-11 ZA ZA87982A patent/ZA87982B/xx unknown
- 1987-02-12 CN CN87100685.5A patent/CN1003470B/zh not_active Expired
- 1987-02-12 ES ES8700355A patent/ES2004219A6/es not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| BR8705761A (pt) | 1988-02-09 |
| DE3763257D1 (de) | 1990-07-19 |
| EP0256120A1 (en) | 1988-02-24 |
| AU589758B2 (en) | 1989-10-19 |
| CN1003470B (zh) | 1989-03-01 |
| JPH0434096B2 (OSRAM) | 1992-06-04 |
| AU7129087A (en) | 1987-09-09 |
| ES2004219A6 (es) | 1988-12-16 |
| KR900005240B1 (ko) | 1990-07-21 |
| CA1292628C (en) | 1991-12-03 |
| JPS63500402A (ja) | 1988-02-12 |
| IN167553B (OSRAM) | 1990-11-17 |
| KR880700929A (ko) | 1988-04-13 |
| EP0256120B1 (en) | 1990-06-13 |
| WO1987005108A1 (en) | 1987-08-27 |
| CN87100685A (zh) | 1987-08-26 |
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