ZA756245B - Non-contact dimensional measurement technique - Google Patents

Non-contact dimensional measurement technique

Info

Publication number
ZA756245B
ZA756245B ZA00756245A ZA756245A ZA756245B ZA 756245 B ZA756245 B ZA 756245B ZA 00756245 A ZA00756245 A ZA 00756245A ZA 756245 A ZA756245 A ZA 756245A ZA 756245 B ZA756245 B ZA 756245B
Authority
ZA
South Africa
Prior art keywords
dimensional measurement
measurement technique
contact dimensional
contact
technique
Prior art date
Application number
ZA00756245A
Other languages
English (en)
Inventor
M Dreyfus
Original Assignee
Suisse Horlogerie
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suisse Horlogerie filed Critical Suisse Horlogerie
Publication of ZA756245B publication Critical patent/ZA756245B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Facsimile Scanning Arrangements (AREA)
ZA00756245A 1974-10-31 1975-10-01 Non-contact dimensional measurement technique ZA756245B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/519,766 US3941484A (en) 1974-10-31 1974-10-31 Non-contact dimensional measurement technique

Publications (1)

Publication Number Publication Date
ZA756245B true ZA756245B (en) 1976-09-29

Family

ID=24069697

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA00756245A ZA756245B (en) 1974-10-31 1975-10-01 Non-contact dimensional measurement technique

Country Status (20)

Country Link
US (1) US3941484A (hu)
JP (1) JPS5185745A (hu)
AT (1) AT370517B (hu)
BE (1) BE835030A (hu)
CH (1) CH591676A5 (hu)
CS (1) CS185240B2 (hu)
DD (1) DD121176A5 (hu)
DE (1) DE2548833A1 (hu)
DK (1) DK437675A (hu)
FR (1) FR2289883A1 (hu)
GB (1) GB1518287A (hu)
HU (1) HU174977B (hu)
IE (1) IE41868B1 (hu)
IL (1) IL48231A (hu)
IT (1) IT1042962B (hu)
NL (1) NL7512706A (hu)
NO (1) NO753655L (hu)
PL (1) PL101707B1 (hu)
SE (1) SE413942B (hu)
ZA (1) ZA756245B (hu)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2916862C2 (de) * 1979-04-26 1984-12-20 Robert Bosch Gmbh, 7000 Stuttgart Einrichtung zum Prüfen der richtigen Lage und/oder Maße eines sich bewegenden Teils
DE2927410A1 (de) * 1979-07-06 1981-01-08 Siemens Ag Anordnung zur ueberwachung des laengsprofils von geschliffenen zylinderbolzen
DE2927409A1 (de) * 1979-07-06 1981-02-05 Siemens Ag Geraet zum vermessen von formkoerperumrissen
US4490617A (en) * 1979-11-26 1984-12-25 European Electronic Systems Limited Optical width measuring system using two cameras
GB2065299B (en) * 1979-12-13 1983-11-30 Philips Electronic Associated Object measuring arrangement
DE3337468A1 (de) * 1983-10-14 1985-04-25 Optische Werke G. Rodenstock, 8000 München Verfahren und vorrichtung zur pruefung der oberflaeche von bauteilen
FR2555338B1 (fr) * 1983-11-18 1986-04-18 Union Carbide France Appareil destine a identifier et indiquer la reference d'une pile electrique dans une marque donnee de piles
CH666547A5 (de) * 1984-12-20 1988-07-29 Fischer Ag Georg Optisch-elektronisches messverfahren, eine dafuer erforderliche einrichtung und deren verwendung.
US4825394A (en) * 1985-05-07 1989-04-25 General Dynamics Corporation Vision metrology system
US4827125A (en) * 1987-04-29 1989-05-02 The United States Of America As Represented By The Secretary Of The Department Of Health And Human Services Confocal scanning laser microscope having no moving parts
US6055329A (en) * 1994-06-09 2000-04-25 Sherikon, Inc. High speed opto-electronic gage and method for gaging
US6111601A (en) * 1995-12-11 2000-08-29 Adachi; Yoshi Non-contacting laser gauge for qualifying screw fasteners and the like
US6606403B2 (en) * 2000-05-04 2003-08-12 Daniel Freifeld Repetitive inspection system with intelligent tools
US8035094B2 (en) 2002-06-17 2011-10-11 Quest Metrology, LLC Methods for measuring at least one physical characteristic of a component
US7745805B2 (en) 2002-06-17 2010-06-29 Johnson Thread-View Systems Product inspection system and a method for implementing same that incorporates a correction factor
US8410466B2 (en) * 2002-06-17 2013-04-02 Quest Metrology Group, Llc Non-contact component inspection system
AU2003243617A1 (en) * 2002-06-17 2003-12-31 Stanley P. Johnson An inspection system and method
GB2415499A (en) * 2004-06-23 2005-12-28 Canon Res Ct Europ Ltd Apparatus and method for object shape detection
US10094785B2 (en) 2011-05-17 2018-10-09 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US9697596B2 (en) 2011-05-17 2017-07-04 Gii Acquisition, Llc Method and system for optically inspecting parts
US10088431B2 (en) 2011-05-17 2018-10-02 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US9194691B2 (en) * 2013-03-13 2015-11-24 U.S. Department Of Energy High-speed volume measurement system and method
ITBS20130179A1 (it) * 2013-11-29 2015-05-30 Claudio Sedazzari Apparecchio per la visione artificiale
DE102014000311A1 (de) 2014-01-10 2015-07-16 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Messeinrichtung und Messverfahren zur Messung einer Messgröße mittels einer Beugungsmessung
CN109906354A (zh) 2016-09-01 2019-06-18 海克斯康测量技术有限公司 用于坐标测量机的一致性测试人工制品
DE102018006653A1 (de) * 2018-08-22 2020-02-27 Blum-Novotest Gmbh Werkzeugkontrolle in einer Werkstückbearbeitugnsmaschine

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH384874A (de) * 1960-10-19 1965-02-26 Fischer & Co E Verfahren zur tastlosen Ermittlung einer Dimension eines Körpers und Vorrichtung zur Durchführung des Verfahrens
US3518007A (en) * 1965-05-17 1970-06-30 Nippon Electric Co Measuring device utilizing the diffraction of light
US3743428A (en) * 1971-08-04 1973-07-03 Du Pont Device for optically measuring a dimension of an object
US3854822A (en) * 1973-06-27 1974-12-17 Vsi Corp Electro-optical scanning system for dimensional gauging of parts

Also Published As

Publication number Publication date
DK437675A (da) 1976-05-01
ATA799475A (de) 1982-08-15
IL48231A (en) 1978-04-30
HU174977B (hu) 1980-04-28
JPS5185745A (hu) 1976-07-27
DD121176A5 (hu) 1976-07-12
NO753655L (hu) 1976-05-03
PL101707B1 (pl) 1979-01-31
US3941484A (en) 1976-03-02
IL48231A0 (en) 1975-12-31
IE41868B1 (en) 1980-04-09
DE2548833A1 (de) 1976-05-06
FR2289883A1 (fr) 1976-05-28
AT370517B (de) 1983-04-11
NL7512706A (nl) 1976-05-04
BE835030A (fr) 1976-02-16
IT1042962B (it) 1980-01-30
CH591676A5 (hu) 1977-09-30
CS185240B2 (en) 1978-09-15
SE413942B (sv) 1980-06-30
IE41868L (en) 1976-04-30
GB1518287A (en) 1978-07-19
SE7512109L (sv) 1976-05-03
FR2289883B1 (hu) 1980-04-30

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