ZA202210708B - Transmission electron microscope method for measuring low-angle grain boundary orientation difference - Google Patents
Transmission electron microscope method for measuring low-angle grain boundary orientation differenceInfo
- Publication number
- ZA202210708B ZA202210708B ZA2022/10708A ZA202210708A ZA202210708B ZA 202210708 B ZA202210708 B ZA 202210708B ZA 2022/10708 A ZA2022/10708 A ZA 2022/10708A ZA 202210708 A ZA202210708 A ZA 202210708A ZA 202210708 B ZA202210708 B ZA 202210708B
- Authority
- ZA
- South Africa
- Prior art keywords
- electron microscope
- transmission electron
- grain boundary
- orientation difference
- angle grain
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20058—Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20016—Goniometers
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210238815.8A CN114609166A (en) | 2022-03-11 | 2022-03-11 | Transmission electron microscope method for measuring small-angle grain boundary position difference |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ZA202210708B true ZA202210708B (en) | 2023-02-22 |
Family
ID=81863934
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ZA2022/10708A ZA202210708B (en) | 2022-03-11 | 2022-09-28 | Transmission electron microscope method for measuring low-angle grain boundary orientation difference |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN114609166A (en) |
| ZA (1) | ZA202210708B (en) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102718236B (en) * | 2012-05-10 | 2014-08-27 | 华东理工大学 | Activated alumina with vane possessing oriented staging structure and preparation method |
| CN106802306B (en) * | 2017-03-13 | 2019-02-22 | 燕山大学 | The method of quick precise measurement low angle boundary misorientation under transmission electron microscope |
| CN107894433B (en) * | 2017-10-10 | 2021-02-19 | 首钢集团有限公司 | Method for quantitatively characterizing main phase structure grain size of complex phase material |
| WO2021007726A1 (en) * | 2019-07-12 | 2021-01-21 | 中央民族大学 | Method for reconstructing bravais lattice of crystal by using electron diffraction pattern |
| CN113740366B (en) * | 2020-05-27 | 2023-11-28 | 中国兵器工业第五九研究所 | Method and device for nondestructively detecting crystal orientation difference and grain boundary defect in monocrystal or directional crystal |
-
2022
- 2022-03-11 CN CN202210238815.8A patent/CN114609166A/en active Pending
- 2022-09-28 ZA ZA2022/10708A patent/ZA202210708B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| CN114609166A (en) | 2022-06-10 |
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