ZA200208982B - Inspection method and device for detecting defect. - Google Patents

Inspection method and device for detecting defect.

Info

Publication number
ZA200208982B
ZA200208982B ZA200208982A ZA200208982A ZA200208982B ZA 200208982 B ZA200208982 B ZA 200208982B ZA 200208982 A ZA200208982 A ZA 200208982A ZA 200208982 A ZA200208982 A ZA 200208982A ZA 200208982 B ZA200208982 B ZA 200208982B
Authority
ZA
South Africa
Prior art keywords
inspection method
detecting defect
defect
detecting
inspection
Prior art date
Application number
ZA200208982A
Inventor
Akio Enomoto
Kouichi Miyashita
Original Assignee
Ngk Insulators Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ngk Insulators Ltd filed Critical Ngk Insulators Ltd
Publication of ZA200208982B publication Critical patent/ZA200208982B/en

Links

ZA200208982A 2001-03-30 2002-11-05 Inspection method and device for detecting defect. ZA200208982B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001101182 2001-03-30

Publications (1)

Publication Number Publication Date
ZA200208982B true ZA200208982B (en) 2003-11-05

Family

ID=32588005

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA200208982A ZA200208982B (en) 2001-03-30 2002-11-05 Inspection method and device for detecting defect.

Country Status (1)

Country Link
ZA (1) ZA200208982B (en)

Similar Documents

Publication Publication Date Title
IL152526A0 (en) Method and apparatus for inspecting defects
IL151929A0 (en) Defect inspection apparatus and defect inspection method
EP1462789A4 (en) Method and device for inspecting tire
AU2001269717A1 (en) Apparatus and method for detecting pipeline defects
MXPA01012030A (en) Method and apparatus for localized digital radiographic inspection.
GB0110223D0 (en) Method and apparatus for leak detection and location
ZA200205963B (en) Apparatus and method for inspecting non-round containers.
GB0104166D0 (en) Method and apparatus for determining track condition
EP1414005A4 (en) Inspecting method, semiconductor device, and display
EP1630862A4 (en) Sample inspection device and method, and device manufacturing method using the sample inspection device and method
AU4277501A (en) Apparatus for detecting defect
EP1477765A4 (en) Method of detecting object of detection and device therefor, and method of inspecting object of inspection and device therefor
EP1316341A4 (en) Device and method for inspecting playing card and playing card used therefor
EP1324022A4 (en) Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface
EP1295670A3 (en) Nondestructive inspection method
IL162156A0 (en) Method for detecting defects
GB2379742B (en) Method and apparatus for testing banknotes
MXPA03006448A (en) Apparatus and method for inspecting articles.
EP1365250A4 (en) Contact probe, method of manufacturing the contact probe, and device and method for inspection
TWI316379B (en) Method and apparatus for detecting circuit pattern, and method and apparatus for inspecting circuit pattern
EP1677098A4 (en) Surface defect inspecting method and device
SG111257A1 (en) Inspection method and apparatus for determining incipient mechanical failure
EP1555524A4 (en) Vessel inspection method and vessel inspection device
AU2003258782A8 (en) Device and method for inspecting an ionising beam
EP1312916A4 (en) Non-destructive inspection device