YU166581A - Circuit for testing logic circuits - Google Patents

Circuit for testing logic circuits

Info

Publication number
YU166581A
YU166581A YU166581A YU166581A YU166581A YU 166581 A YU166581 A YU 166581A YU 166581 A YU166581 A YU 166581A YU 166581 A YU166581 A YU 166581A YU 166581 A YU166581 A YU 166581A
Authority
YU
Yugoslavia
Prior art keywords
circuit
logic circuits
testing logic
testing
circuits
Prior art date
Application number
YU166581A
Other versions
YU42412B (en
Inventor
Gantar Janez
Janez Gantar
Original Assignee
Janez Gantar
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Janez Gantar filed Critical Janez Gantar
Priority to YU166581A priority Critical patent/YU42412B/en
Publication of YU166581A publication Critical patent/YU166581A/en
Publication of YU42412B publication Critical patent/YU42412B/en

Links

YU166581A 1981-07-06 1981-07-06 Circuit for testing logic circuits YU42412B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
YU166581A YU42412B (en) 1981-07-06 1981-07-06 Circuit for testing logic circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
YU166581A YU42412B (en) 1981-07-06 1981-07-06 Circuit for testing logic circuits

Publications (2)

Publication Number Publication Date
YU166581A true YU166581A (en) 1983-06-30
YU42412B YU42412B (en) 1988-08-31

Family

ID=25555094

Family Applications (1)

Application Number Title Priority Date Filing Date
YU166581A YU42412B (en) 1981-07-06 1981-07-06 Circuit for testing logic circuits

Country Status (1)

Country Link
YU (1) YU42412B (en)

Also Published As

Publication number Publication date
YU42412B (en) 1988-08-31

Similar Documents

Publication Publication Date Title
EP0182388A3 (en) Logic circuit test probe
DE3474596D1 (en) Apparatus for testing integrated circuits
GB2062879B (en) Test circuit for mos integrated circuits
IE822970L (en) Logic circuits
EP0101896A3 (en) Mos logic circuit
DE3368770D1 (en) Testing digital electronic circuits
GB2121632B (en) Signal comparing circuits
DE3367472D1 (en) Logic circuit
IE823101L (en) Test circuit
DE3276990D1 (en) Josephson-junction logic circuit
GB2065971B (en) Matched circuit elements for integrated circuits
DE3274040D1 (en) An integrated logic circuit
GB2082864B (en) Clocked logic circuit
JPS57207430A (en) Logic circuit
GB2069152B (en) Integrated circuit testing
GB2082863B (en) Clocked logic circuit
GB8401153D0 (en) Thick-film circuits
DE3273934D1 (en) Transistor-transistor logic circuits
GB2149130B (en) Testing electronic circuits
YU42412B (en) Circuit for testing logic circuits
GB2125591B (en) Checking sequent logic circuits
HK50087A (en) Line circuit testing
GB2112972B (en) Logic circuit
DE3479780D1 (en) Circuit for dc testing of logic circuits
GB8325241D0 (en) Evaluation circuits