WO2024166292A1 - ウエハ載置台 - Google Patents
ウエハ載置台 Download PDFInfo
- Publication number
- WO2024166292A1 WO2024166292A1 PCT/JP2023/004362 JP2023004362W WO2024166292A1 WO 2024166292 A1 WO2024166292 A1 WO 2024166292A1 JP 2023004362 W JP2023004362 W JP 2023004362W WO 2024166292 A1 WO2024166292 A1 WO 2024166292A1
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- WIPO (PCT)
- Prior art keywords
- plug
- gas
- conductive plate
- insulating
- insulating film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N13/00—Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0432—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/72—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using electrostatic chucks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7616—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating, a hardness or a material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2007—Holding mechanisms
Definitions
- the present invention relates to a wafer mounting table.
- a wafer mounting table that includes a ceramic plate having a wafer mounting surface on the upper surface thereof, and a base plate that is joined to the lower surface of the ceramic plate and has a gas introduction passage.
- a wafer mounting table is provided with an insulating first porous portion disposed in a through hole of the ceramic plate, and an insulating second porous portion that is fitted in a recess provided on the ceramic plate side of the base plate so as to face the first porous portion. Gas supplied to the gas introduction passage passes through the second and first porous portions and flows into the space between the wafer mounting surface and the wafer, and is used to cool the object.
- the second porous portion has a ceramic porous body and a ceramic insulating film formed by thermal spraying on the side surface of the ceramic porous body.
- the ceramic insulating film is in contact with the inner peripheral surface of the recess of the base plate. It is described that the presence of such a second porous portion enables high insulation to be achieved.
- the present invention was made to solve these problems, and its main purpose is to suppress discharges around the sides of insulating gas-passing plugs.
- the present invention takes the following measures to achieve the above-mentioned main objective.
- the wafer mounting table of the present invention comprises: a ceramic plate having a wafer mounting surface on an upper surface thereof, a vertically extending hole formed therethrough, and a built-in electrode; a conductive plate bonded to a lower surface of the ceramic plate and having a gas supply passage; a plug chamber formed as a recess extending from an upper surface of the conductive plate toward a lower surface of the conductive plate and communicating with the fine hole and the gas supply passage; an insulating gas-permeable plug disposed in the plug chamber and allowing gas to pass therethrough; a dense insulating film that allows ventilation of a gas outlet portion of an upper surface of the insulating gas passing plug, the gas outlet portion being a flow path of gas to the pore, and that is disposed across the upper surface of the conductive plate and the upper surface of the insulating gas passing plug to cover a boundary portion between the upper surface of the conductive plate and the upper surface of the insulating gas passing plug; It is equipped with the following:
- a dense insulating film is disposed across the upper surface of the conductive plate and the upper surface of the insulating gas permeable plug, covering the boundary between the upper surface of the conductive plate and the upper surface of the insulating gas permeable plug.
- the presence of such a dense insulating film makes it possible to suppress discharges from occurring in the vertical path along the side of the insulating gas permeable plug from the boundary between the upper surface of the conductive plate and the upper surface of the insulating gas permeable plug.
- the dense insulating film allows ventilation at the gas outlet portion of the insulating gas permeable plug, making it possible for gas to flow from the gas supply passage to the pores via the insulating gas permeable plug.
- a convex portion is formed on the upper surface of the insulating gas passing plug, the upper surface of which becomes the gas outlet portion, and the upper surface of the dense insulating film and the upper surface of the convex portion may be located on the same plane.
- the dense insulating film may be a thermal spray film or an aerosol deposition film. In this way, the dense insulating film can be produced relatively easily.
- the above-mentioned wafer mounting table may include an elastic member disposed between the lower surface of the insulating gas passing plug and the bottom surface of the plug chamber.
- the presence of the elastic member can prevent the insulating gas passing plug from being pushed upward when the wafer mounting table is heated during use and the conductive plate is warped into an upwardly convex shape. This can prevent cracks from occurring in the dense insulating film.
- a gap may be provided between the lower surface of the insulating gas passing plug and the bottom surface of the plug chamber by the elastic member.
- the elastic member may be a heat-resistant resin. In this way, the elastic member can be produced relatively easily.
- the insulating gas passing plug may be a porous body.
- FIG. FIG. 2 is an enlarged view of part A in FIG. 3 is a cross-sectional view taken along the line B-B of FIG. 2 .
- 5A to 5C are diagrams showing the manufacturing process of the wafer mounting table 10.
- FIG. 3 is an enlarged view of a wafer mounting table 910 according to a comparative example, the view corresponding to FIG. 2 .
- 3 is an enlarged view of the wafer mounting table 110 corresponding to FIG. 2 .
- FIG. 1 is a vertical cross-sectional view of the wafer mounting table 10
- FIG. 2 is an enlarged view of part A in FIG. 1
- FIG. 3 is a cross-sectional view taken along the line B-B in FIG. 2 (a cross-sectional view taken when the front view (overall view) of the wafer mounting table 10 is cut along the line B-B in FIG. 2).
- "upper” and “lower” do not represent absolute positional relationships, but rather relative positional relationships. Therefore, depending on the orientation of the wafer mounting table 10, "upper” and “lower” can become “lower” and “upper”, “left” and “right”, or "front” and "rear”.
- the wafer mounting table 10 includes a ceramic plate 20, a conductive plate 30, and an insulating gas-permeable plug 40. As shown in FIG. 2, the wafer mounting table 10 also includes a dense insulating film 50 and a bonding sheet 60.
- the ceramic plate 20 is a ceramic circular plate (e.g., 300 mm in diameter, 5 mm in thickness) made of alumina sintered body or aluminum nitride sintered body.
- the upper surface of the ceramic plate 20 is a wafer mounting surface 21 on which the wafer W is placed.
- the ceramic plate 20 has an electrode 22 built in.
- the electrode 22 is a flat mesh electrode used as an electrostatic electrode, and is connected to an external DC power source via a power supply member (not shown).
- a low-pass filter may be disposed midway through the power supply member.
- the power supply member is electrically insulated from the conductive plate 30.
- the ceramic plate 20 has pores 26.
- the pores 26 penetrate the ceramic plate 20 in the vertical direction, and serve as gas passages from the lower surface of the ceramic plate 20 to the wafer mounting surface 21.
- the ceramic plate 20 has a number of pores 26.
- the conductive plate 30 is a disk with good thermal conductivity (a disk with the same diameter as or larger than the ceramic plate 20).
- the conductive plate 30 has a gas supply passage 31 and a plug chamber 32.
- the plug chamber 32 opens on the upper surface of the conductive plate 30 (the surface on the ceramic plate 20 side) and is configured as a recess provided from the upper surface to the lower surface.
- the internal space of the plug chamber 32 is, for example, cylindrical.
- the gas supply passage 31 is a gas passage from the plug chamber 32 to the lower surface of the conductive plate 30.
- the gas supply passage 31 is configured as a through hole that penetrates in the vertical direction from the bottom surface of the plug chamber 32 of the conductive plate 30 to the lower surface of the conductive plate 30.
- a refrigerant flow path (not shown) is formed inside the conductive plate 30.
- the refrigerant flowing through the refrigerant flow path is preferably a liquid and is preferably electrically insulating.
- An example of an electrically insulating liquid is a fluorine-based inert liquid.
- the refrigerant flow path is formed in a single stroke from one end (inlet) to the other end (outlet) across the entire conductive plate 30 in a plan view.
- a supply port and a recovery port of an external refrigerant device (not shown) are connected to one end and the other end of the refrigerant flow path, respectively.
- the conductive plate 30 is connected to a radio frequency (RF) power source and is also used as an RF electrode.
- RF radio frequency
- the material of the conductive plate 30 may be, for example, a metal material or a composite material of metal and ceramic.
- the metal material may be Al, Ti, Mo, or an alloy thereof.
- the composite material of metal and ceramic may be a metal matrix composite material (MMC) or a ceramic matrix composite material (CMC). Specific examples of such composite materials include a material containing Si, SiC, and Ti (also called SiSiCTi), a material in which a SiC porous body is impregnated with Al and/or Si, and a composite material of Al2O3 and TiC. It is preferable to select a material of the conductive plate 30 having a thermal expansion coefficient close to that of the material of the ceramic plate 20.
- the insulating gas passing plug 40 is an insulating member through which gas can pass, and is disposed in the plug chamber 32.
- the insulating gas passing plug 40 is a porous body.
- the insulating gas passing plug 40 communicates with the gas supply passage 31 and the pores 26, thereby allowing the gas in the gas supply passage 31 to reach the wafer mounting surface 21.
- the insulating gas passing plugs 40 are provided on the conductive plate 30 in the same number as the pores 26, the gas supply passages 31, and the plug chamber 32, and they correspond one-to-one to each other.
- the insulating gas passing plug 40 has a cylindrical main body 41 and a cylindrical convex portion 42 that is provided in the center of the upper surface of the main body 41 and has a smaller diameter than the main body 41.
- the upper surface of the convex portion 42 is located directly below the pores 26, and serves as an outlet for gas from the insulating gas passing plug 40 to the pores 26. More specifically, the portion of the upper surface of the protrusion 42 that is not in contact with the bonding sheet 60 (the circular region shown by the dotted line in FIG. 3) is the gas outlet portion 44.
- the insulating gas passing plug 40 may have the side (outer surface) of the main body 41 bonded to the inner surface of the plug chamber 32, or the male threaded portion on the side of the insulating gas passing plug 40 may be screwed into the female threaded portion on the inner surface of the plug chamber 32.
- the upper surface of the insulating gas passing plug 40, excluding the protrusion 42, is located on the same plane as the upper surface of the conductive plate 30.
- the insulating gas-permeable plug 40 may be a porous bulk body obtained by sintering ceramic powder. Examples of ceramic that may be used include alumina and aluminum nitride.
- the porosity of the insulating gas-permeable plug 40 is preferably 30% or more, and the average pore diameter is preferably 15 ⁇ m or more.
- the porosity of the insulating gas-permeable plug 40 may be 70% or less.
- An elastic member 48 is disposed between the lower surface of the insulating gas passing plug 40 and the bottom surface of the plug chamber 32 of the conductive plate 30.
- the elastic member 48 has a ring-like shape centered on the position of the opening of the gas supply passage 31 when viewed from above.
- the elastic member 48 is in contact with only a part of the lower surface of the insulating gas passing plug 40 and a part of the bottom surface of the plug chamber 32, so that a gap S exists between the lower surface of the insulating gas passing plug 40 and the bottom surface of the plug chamber 32 of the conductive plate 30.
- the vertical height of the gap S may be, for example, 0.1 mm or more and 1 mm or less.
- the elastic member 48 is disposed at a position other than the opening of the gas supply passage 31 on the bottom surface of the plug chamber 32 so as not to impede the passage of gas from the gas supply passage 31 to the insulating gas passing plug 40.
- a heat-resistant resin can be used as the elastic member 48.
- heat-resistant resins include fluorine-based resins such as Teflon (Teflon is a registered trademark), acrylic resins, and polyimide resins. These are preferred because they have the heat resistance of 200°C or higher required for the wafer mounting table 10 and are less likely to generate gas even when used in a vacuum.
- the dense insulating film 50 is a dense insulating film that covers the upper surfaces of the conductive plate 30 and the insulating gas passing plug 40. More specifically, the dense insulating film 50 is disposed across the upper surface of the conductive plate 30 and the upper surface of the body part 41 of the insulating gas passing plug 40. As a result, the dense insulating film 50 covers the boundary part (see the dashed line in FIG. 3) between the upper surface of the conductive plate 30 and the upper surface of the body part 41 of the insulating gas passing plug 40. In addition, the dense insulating film 50 does not cover the upper surface of the convex part 42, and therefore does not cover the gas outlet part 44, which is a part of the convex part 42.
- the dense insulating film 50 allows ventilation of the gas outlet part 44.
- the thickness of the dense insulating film 50 is equal to the height of the convex part 42, and therefore the upper surface of the dense insulating film 50 and the upper surface of the convex part 42 are located on the same plane.
- being located on the same plane includes being located on approximately the same plane, and also includes cases where there is a height difference that is unavoidable during manufacturing, or where there are fine irregularities on the upper surface of the dense insulating film 50 and/or the upper surface of the protrusion 42.
- the dense insulating film 50 covers the entire upper surface of the conductive plate 30 (the bonding surface with the ceramic plate 20) and the upper surface of the main body 41 of the insulating gas passing plug 40.
- the dense insulating film 50 is in contact with the side surface of the protrusion 42 and covers the entire side surface of the protrusion 42.
- the dense insulating film 50 is, for example, a sprayed film or an aerosol deposition film (AD film).
- the sprayed film may be made of the same material as the insulating gas passing plug 40.
- the sprayed film may also be made of alumina.
- the sprayed film may be made of the same material as the ceramic material contained in the conductive plate 30.
- the AD film is a film formed by the AD method (including the plasma AD method). The AD method can form a film of ceramic particles by the impact solidification phenomenon, so there is no need to sinter the ceramic particles at high temperatures.
- the dense insulating film 50 is an AD film, the same material as the sprayed film described above can be used.
- dense means dense enough that gas cannot pass through.
- the dense insulating film 50 may have a porosity of less than 3%, and preferably has a porosity of less than 1%.
- the porosity is defined as the area ratio of pores observed in an image when a representative cross section is observed at a magnification of 50 times using a scanning electron microscope (SEM).
- the bonding sheet 60 is an insulating adhesive layer disposed between the lower surface of the ceramic plate 20 and the upper surface of the dense insulating film 50, and is, for example, a resin sheet.
- the conductive plate 30 is bonded to the lower surface of the ceramic plate 20 via the bonding sheet 60 and the dense insulating film 50.
- the bonding sheet 60 has a through hole with a diameter equal to or slightly larger than the opening diameter of the fine hole 26 at a position directly below the fine hole 26.
- the gas outlet portion 44 and the fine hole 26 are connected through the space inside the through hole, and this space is called the fine hole side space 27.
- the part of the upper surface of the protrusion 42 of the insulating gas passing plug 40 that is exposed to the fine hole side space 27 is the gas outlet portion 44.
- the part of the upper surface of the protrusion 42 other than the gas outlet portion 44 is bonded to the lower surface of the bonding sheet 60.
- the wafer W is placed on the wafer mounting surface 21 with the wafer mounting table 10 installed in a chamber (not shown).
- the chamber is then depressurized by a vacuum pump to adjust the pressure inside the chamber to a predetermined degree of vacuum, and a DC voltage is applied to the electrode 22 of the ceramic plate 20 to generate an electrostatic adsorption force, and the wafer W is adsorbed and fixed to the wafer mounting surface 21.
- the chamber is made into a reactive gas atmosphere with a predetermined pressure (for example, several tens to several hundreds of Pa), and in this state, an RF voltage is applied between an upper electrode (not shown) provided on the ceiling part of the chamber and the conductive plate 30 of the wafer mounting table 10 to generate plasma.
- a coolant is circulated through the coolant flow path of the conductive plate 30.
- a backside gas is introduced into the gas supply passage 31 from a gas cylinder (not shown).
- a thermally conductive gas for example, He gas, etc.
- the backside gas introduced into the gas supply passage 31 passes through the gap S of the plug chamber 32, the insulating gas passage plug 40, the pore side space 27, and the pore 26 in this order and is supplied to the back surface of the wafer W.
- the presence of this backside gas ensures efficient thermal conduction between the wafer W and the ceramic plate 20.
- FIG. 4 is a manufacturing process diagram of the wafer mounting table 10.
- the ceramic plate 20 and the conductive plate 30 before being joined together, and the insulating gas passing plug 40 before being placed in the plug chamber 32 are prepared (FIG. 4A).
- the ceramic plate 20 is obtained, for example, by making a ceramic powder compact incorporating the electrode 22 and hot press firing the compact.
- pores 26 are formed in the ceramic plate 20, and a gas supply passage 31, a plug chamber 32, and a refrigerant flow path are formed in the conductive plate 30.
- the plug chamber 32 may be formed when the conductive plate 30 is molded, or the plug chamber 32 may be formed by processing the conductive plate 30 after it is made.
- multiple MMC disk members may first be manufactured, grooves and holes may be formed in these MMC disk members by machining, and then the multiple MMC disk members may be joined together using a metal bonding material, so that the grooves and holes ultimately become the gas supply passages 31, plug chambers 32, and refrigerant flow paths.
- an elastic member 48 is attached to the lower surface of the insulating gas passing plug 40 (FIG. 4B), and then the insulating gas passing plug 40 is attached to the conductive plate 30 (FIG. 4C).
- the insulating gas passing plug 40 may be attached, for example, by applying an adhesive to at least one of the inner circumferential surface of the plug chamber 32 and the outer circumferential surface of the insulating gas passing plug 40, and then inserting the insulating gas passing plug 40 from above the plug chamber 32 to adhesively fix the outer circumferential surface of the insulating gas passing plug 40 to the inner circumferential surface of the plug chamber 32.
- a dense insulating film 70 is formed on the upper surfaces of the conductive plate 30 and the insulating gas passing plug 40 by thermal spraying or AD method using the material of the dense insulating film 50 (FIG. 4D).
- the dense insulating film 70 is formed to be thicker than the dense insulating film 50 and is formed so as to cover the entire upper surfaces of the conductive plate 30 and the insulating gas passing plug 40, including the upper surfaces of the protrusions 42.
- the upper surface of the dense insulating film 70 is ground to reduce the thickness of the dense insulating film 70, and the upper surface of the protrusion 42 is exposed (FIG. 4E). This causes the dense insulating film 70 to become the dense insulating film 50.
- the ceramic plate 20 and the conductive plate 30 with the dense insulating film 50 attached thereto are bonded to each other via the bonding sheet 60 to obtain the wafer mounting table 10 (FIG. 4F).
- the dense insulating film 50 is disposed across the upper surface of the conductive plate 30 and the upper surface of the body part 41 of the insulating gas permeable plug 40, thereby covering the boundary between the upper surface of the conductive plate 30 and the upper surface of the insulating gas permeable plug 40.
- the presence of such a dense insulating film 50 can suppress discharge from the boundary between the upper surface of the conductive plate 30 and the upper surface of the insulating gas permeable plug 40 in the vertical path along the side of the insulating gas permeable plug 40.
- the dense insulating film 50 allows ventilation of the gas outlet part 44 of the insulating gas permeable plug 40, gas can flow from the gas supply passage 31 to the pores 26 via the insulating gas permeable plug 40 even if the dense insulating film 50 is present.
- FIG. 5 is an enlarged view of the comparative form wafer mounting table 910 corresponding to FIG. 2. Note that the same components as those in the wafer mounting table 10 will be described using the same reference numerals.
- a cylindrical insulating gas passing plug 940 without a protrusion 42 is disposed in the plug chamber 32.
- the wafer mounting table 910 has a dense insulating film 951 provided on the outer peripheral surface of the insulating gas passing plug 940 and a dense insulating film 952 that covers the upper surface of the conductive plate 30.
- the side surface (outer peripheral surface) of the insulating gas passing plug 940 is in contact with the dense insulating film 951 and the dense insulating film 952, so that the contact surface between the insulating gas passing plug 940 and the dense insulating film 951 and the dense insulating film 952 is along the vertical direction.
- discharge is likely to occur in the portion between the insulating gas passing plug 940 and the dense insulating film 951 and the dense insulating film 952, i.e., around the side surface of the insulating gas passing plug 940.
- discharge may occur along a discharge path R1 (see dotted line) from the side surface of the insulating gas passing plug 940 to the wafer W via the upper surface of the insulating gas passing plug 940 and the inner peripheral surface of the fine hole 26.
- the dense insulating film 951 on the side surface of the insulating gas passing plug 940 and the dense insulating film 952 on the upper surface of the conductive plate 30 are formed separately, so that discharge is likely to occur at the interface between the dense insulating film 951 and the dense insulating film 952.
- discharge may occur along a discharge path R2 (see dotted line) from the interface between the dense insulating film 951 and the dense insulating film 952 to the wafer W via the side surface, upper surface, and inner peripheral surface of the fine hole 26 of the insulating gas passing plug 940.
- the dense insulating film 50 is disposed on the upper surface, not the side surface, of the insulating gas passing plug 40, and the contact surface between the dense insulating film 50 and the insulating gas passing plug 40 is along the left-right direction, so that the area between the dense insulating film 50 and the insulating gas passing plug 40 is unlikely to become a discharge path.
- the dense insulating film 50 is formed across the upper surface of the conductive plate 30 and the upper surface of the insulating gas permeable plug 40, there is no interface between the part of the dense insulating film 50 that covers the upper surface of the conductive plate 30 and the part that covers the upper surface of the insulating gas permeable plug 40.
- the boundary between the conductive plate 30 and the insulating gas permeable plug 40 is unlikely to become a discharge path.
- the presence of the dense insulating film 50 can suppress discharge from occurring in the vertical path along the side of the insulating gas permeable plug 40 from the boundary between the upper surface of the conductive plate 30 and the upper surface of the insulating gas permeable plug 40.
- the upper surface of the insulating gas permeable plug 140 is in direct contact with the bonding sheet 60.
- the insulating gas permeable plug 140 is a porous body, the upper surface of the insulating gas permeable plug 140 has unevenness due to open pores, which may reduce the adhesion between the insulating gas permeable plug 140 and the bonding sheet 60.
- the dense insulating film 50 exists between the insulating gas permeable plug 40 and the bonding sheet 60, so it is easy to increase the adhesion between the insulating gas permeable plug 40, the dense insulating film 50, and the bonding sheet 60.
- the insulating gas permeable plug 40 is a porous body and the dense insulating film 50 is formed on the upper surface of the insulating gas permeable plug 40 by thermal spraying or the AD method, the constituent particles of the dense insulating film 50 enter the unevenness on the upper surface of the insulating gas permeable plug 40, so that the adhesion between the insulating gas permeable plug 40 and the dense insulating film 50 is increased.
- the dense insulating film 50 is dense, the adhesion between the dense insulating film 50 and the bonding sheet 60 is greater than the adhesion between the porous insulating gas passing plug 940 and the bonding sheet 60.
- a convex portion 42 whose upper surface becomes the gas outlet portion 44 is formed on the upper surface of the body portion 41 of the insulating gas passing plug 40, and the upper surface of the dense insulating film 50 and the upper surface of the convex portion 42 are located on the same plane.
- the dense insulating film 70 so as to cover the entire upper surface of the conductive plate 30 and the upper surface of the insulating gas passing plug 40, and then grinding the dense insulating film 70 until the upper surface of the convex portion 42 is exposed, it is relatively easy to form the dense insulating film 50 that allows ventilation of the gas outlet portion 44.
- the upper surface of the dense insulating film 50 and the upper surface of the convex portion 42 are located on the same plane, gaps other than the gas flow path are unlikely to occur when the conductive plate 30 and the ceramic plate 20 are joined after the dense insulating film 50 is formed, so that discharge can be further suppressed.
- the dense insulating film 50 is a thermal spray film or an aerosol deposition film, the dense insulating film 50 can be produced relatively easily.
- the wafer mounting table 10 is provided with an elastic member 48 disposed between the lower surface of the insulating gas passing plug 40 and the bottom surface of the plug chamber 32.
- the presence of this elastic member 48 can prevent the insulating gas passing plug 40 from being pushed upward when the wafer mounting table 10 is heated during use and the conductive plate 30 is warped into an upwardly convex shape.
- the elastic member 48 acts as a buffer material and can prevent the insulating gas passing plug 40 from being pushed upward, thereby preventing cracks from occurring in the dense insulating film 50.
- the elastic member 48 is made of heat-resistant resin, it is relatively easy to manufacture the elastic member.
- the insulating gas passing plug 40 has a convex portion 42, but this is not limited thereto.
- FIG. 6 is an enlarged view corresponding to FIG. 2 of the wafer placing table 110, which is another example of the wafer placing table 10.
- the wafer placing table 110 has a cylindrical insulating gas passing plug 140 that does not have a convex portion 42, instead of the insulating gas passing plug 40.
- the dense insulating film 150 has an opening formed directly above the gas outlet portion 44 to allow ventilation of the gas outlet portion 44, which is a part of the upper surface of the insulating gas passing plug 140, and does not cover the gas outlet portion 44.
- the dense insulating film 150 covers the entire upper surface of the insulating gas passing plug 140 other than the above.
- the dense insulating film 150 is disposed across the upper surface of the conductive plate 30 and the upper surface of the insulating gas passing plug 140, thereby covering the boundary between the upper surface of the conductive plate 30 and the upper surface of the insulating gas passing plug 140.
- the presence of the dense insulating film 150 can suppress discharge from the boundary between the upper surface of the conductive plate 30 and the upper surface of the insulating gas passing plug 140 along the vertical path along the side of the insulating gas passing plug 140.
- the insulating gas passing plug 140 does not have the convex portion 42, when forming the dense insulating film 150, it is necessary to form an opening so that the dense insulating film 150 does not cover the gas outlet portion 44.
- the dense insulating film 150 when forming the dense insulating film 150, it is necessary to mask a part of the upper surface of the insulating gas passing plug 140, or to form the dense insulating film 150 and then open a hole in the dense insulating film 150 so that the gas outlet portion 44 is exposed. Therefore, the dense insulating film 50 is preferable because it can be manufactured relatively easily compared to the dense insulating film 150.
- the convex portion 42 does not exist, but instead an opening is provided in the dense insulating film 150 so as not to cover the gas outlet portion 44. Therefore, compared to the pore-side space 27 in FIG. 2, the pore-side space 127 in FIG. 5 is larger by the thickness of the dense insulating film 150.
- an insulating gas passing plug 40 having a convex portion 42 as shown in FIG. 2.
- the convex portion 42 exists and the dense insulating film 50 covers the entire side surface of the convex portion 42, so that the pore-side space 27 is only the through-hole portion of the bonding sheet 60, and the pore-side space 27 can be made small.
- the elastic member 48 causes a gap S between the bottom surface of the insulating gas passing plug 40 and the bottom surface of the plug chamber 32 of the conductive plate 30, but this is not limited to the above.
- the elastic member 48 may be in contact with the entire bottom surface of the insulating gas passing plug 40 except for the portion directly above the gas supply passage 31, and no gap other than the gas flow path may exist between the bottom surface of the insulating gas passing plug 40 and the bottom surface of the plug chamber 32. Even in this case, the presence of the elastic member 48 can prevent the insulating gas passing plug 40 from being pushed up.
- the shape of the elastic member 48 is not limited to a ring shape, and may be a rod shape, etc.
- the elastic member 48 may be in a shape that is easily deformed, such as a shape having a hollow portion or a wavy shape.
- the wafer mounting table 10 may not include the elastic member 48.
- the bottom surface of the insulating gas passing plug 40 may be in contact with the bottom surface of the plug chamber 32.
- a plurality of elastic members 48 may be disposed on the bottom surface of one insulating gas passing plug 40.
- a gap may exist between the outer peripheral surface of the insulating gas passing plug 40 and the inner peripheral surface of the plug chamber 32. Due to the presence of the dense insulating film 50, even if a gap exists between the outer peripheral surface of the insulating gas passing plug 40 and the inner peripheral surface of the plug chamber 32, discharge is unlikely to occur.
- the insulating gas passing plug 40 is a porous body, but it is not limited to a porous body and may be any body that allows gas to pass through.
- the insulating gas passing plug 40 may be made of finely crushed insulating ceramics solidified with an inorganic adhesive to have breathability, or may be glass fiber or heat-resistant Teflon resin sponge (Teflon is a registered trademark).
- the insulating gas passing plug 40 may be a dense plug having an internal gas flow path. The internal gas flow path may be a straight through hole along the vertical direction, or a passage that passes through the upper and lower sides of the dense plug while bending.
- Examples of the passage that passes through the upper and lower sides of the dense plug while bending include a spiral passage and a zigzag passage.
- the diameter of the flow path cross section of the internal gas flow path is preferably 0.1 mm or more and 1 mm or less.
- One dense plug may have multiple internal gas flow paths.
- the porosity of the dense part of the dense plug is preferably less than 0.1%.
- ceramics such as alumina or aluminum nitride can be used, as in the insulating gas passing plug 40 described above as a porous body.
- the dense plug may be manufactured, for example, by firing a molded body formed using a 3D printer, or by firing a molded body formed by mold casting. Details of the dense plug having an internal gas flow path that runs through while bending, and the mold casting process are disclosed, for example, in Japanese Patent No. 7149914.
- the gas supply passage 31 is a through hole that penetrates the conductive plate 30 in the vertical direction, but is not limited to this.
- the gas supply passage 31 does not need to extend in the vertical direction, and may be bent along the way.
- the gas supply passage 31 may have one or more first gas passages that open to the underside of the conductive plate 30 and are fewer in number than the plug chambers 32, and a plurality of second gas passages that branch off and extend from the first gas passages and correspond one-to-one to the plug chambers 32.
- the ceramic plate 20 and the conductive plate 30 are joined with an insulating bonding sheet 60, but a conductive bonding layer such as a metal bonding layer may be used instead of the bonding sheet 60.
- the ceramic plate 20 has an electrostatic electrode built in as the electrode 22, but instead of or in addition to this, a heater electrode (resistance heating element) may be built in. In this case, a heater power supply is connected to the heater electrode.
- the ceramic plate 20 may have one layer of electrodes built in, or two or more layers spaced apart.
- lift pin holes may be provided that penetrate the wafer mounting table 10.
- the lift pin holes are holes for inserting lift pins that raise and lower the wafer W relative to the wafer mounting surface 21.
- the lift pin holes are provided in three locations.
- the present invention can be used, for example, in devices for processing wafers.
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Abstract
Description
上面にウエハ載置面を有し、上下方向に貫通する細孔が設けられ、電極を内蔵するセラミックプレートと、
前記セラミックプレートの下面に接合され、ガス供給通路が設けられた導電性プレートと、
前記導電性プレートの上面から前記導電性プレートの下面に向かって設けられた凹部として構成され、前記細孔及び前記ガス供給通路と連通するプラグ室と、
前記プラグ室に配置され、内部をガスが通過可能な絶縁性ガス通過プラグと、
前記絶縁性ガス通過プラグの上面のうち前記細孔へのガスの流路となるガス出口部分の通気を許容し、且つ、前記導電性プレートの前記上面と前記絶縁性ガス通過プラグの前記上面とにまたがって配設されることで前記導電性プレートの前記上面と前記絶縁性ガス通過プラグの前記上面との境界部分を被覆する緻密絶縁膜と、
を備えたものである。
Claims (6)
- 上面にウエハ載置面を有し、上下方向に貫通する細孔が設けられ、電極を内蔵するセラミックプレートと、
前記セラミックプレートの下面に接合され、ガス供給通路が設けられた導電性プレートと、
前記導電性プレートの上面から前記導電性プレートの下面に向かって設けられた凹部として構成され、前記細孔及び前記ガス供給通路と連通するプラグ室と、
前記プラグ室に配置され、内部をガスが通過可能な絶縁性ガス通過プラグと、
前記絶縁性ガス通過プラグの上面のうち前記細孔へのガスの流路となるガス出口部分の通気を許容し、且つ、前記導電性プレートの前記上面と前記絶縁性ガス通過プラグの前記上面とにまたがって配設されることで前記導電性プレートの前記上面と前記絶縁性ガス通過プラグの前記上面との境界部分を被覆する緻密絶縁膜と、
を備えたウエハ載置台。 - 前記絶縁性ガス通過プラグの前記上面には、上面が前記ガス出口部分となる凸部が形成されており、
前記緻密絶縁膜の上面と前記凸部の上面とは、同一平面上に位置している、
請求項1に記載のウエハ載置台。 - 前記緻密絶縁膜は、溶射膜又はエアロゾルデポジション膜である、
請求項1又は2に記載のウエハ載置台。 - 請求項1又は2に記載のウエハ載置台であって、
前記絶縁性ガス通過プラグの下面と前記プラグ室の底面との間に配置された弾性部材、
を備えたウエハ載置台。 - 前記弾性部材は、耐熱樹脂である、
請求項4に記載のウエハ載置台。 - 前記絶縁性ガス通過プラグは、多孔質体である、
請求項1又は2に記載のウエハ載置台。
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023547377A JP7573117B1 (ja) | 2023-02-09 | 2023-02-09 | ウエハ載置台 |
| KR1020237026758A KR102713025B1 (ko) | 2023-02-09 | 2023-02-09 | 웨이퍼 적재대 |
| PCT/JP2023/004362 WO2024166292A1 (ja) | 2023-02-09 | 2023-02-09 | ウエハ載置台 |
| CN202380010009.8A CN120642045A (zh) | 2023-02-09 | 2023-02-09 | 晶片载放台 |
| US18/366,085 US12354851B2 (en) | 2023-02-09 | 2023-08-07 | Wafer placement table |
| TW112143408A TW202433656A (zh) | 2023-02-09 | 2023-11-10 | 晶圓載置台 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/004362 WO2024166292A1 (ja) | 2023-02-09 | 2023-02-09 | ウエハ載置台 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US18/366,085 Continuation US12354851B2 (en) | 2023-02-09 | 2023-08-07 | Wafer placement table |
Publications (1)
| Publication Number | Publication Date |
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| WO2024166292A1 true WO2024166292A1 (ja) | 2024-08-15 |
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ID=92216191
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| PCT/JP2023/004362 Ceased WO2024166292A1 (ja) | 2023-02-09 | 2023-02-09 | ウエハ載置台 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US12354851B2 (ja) |
| JP (1) | JP7573117B1 (ja) |
| KR (1) | KR102713025B1 (ja) |
| CN (1) | CN120642045A (ja) |
| TW (1) | TW202433656A (ja) |
| WO (1) | WO2024166292A1 (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7774113B1 (ja) | 2024-10-28 | 2025-11-20 | 日本特殊陶業株式会社 | 保持装置 |
| WO2026155203A1 (ja) * | 2025-01-17 | 2026-07-23 | 京セラ株式会社 | 試料保持具 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20240249965A1 (en) * | 2023-01-19 | 2024-07-25 | Applied Materials, Inc. | Substrate support carrier having multiple ceramic discs |
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| JP7569342B2 (ja) * | 2022-01-21 | 2024-10-17 | 日本碍子株式会社 | 半導体製造装置用部材 |
-
2023
- 2023-02-09 JP JP2023547377A patent/JP7573117B1/ja active Active
- 2023-02-09 CN CN202380010009.8A patent/CN120642045A/zh active Pending
- 2023-02-09 WO PCT/JP2023/004362 patent/WO2024166292A1/ja not_active Ceased
- 2023-02-09 KR KR1020237026758A patent/KR102713025B1/ko active Active
- 2023-08-07 US US18/366,085 patent/US12354851B2/en active Active
- 2023-11-10 TW TW112143408A patent/TW202433656A/zh unknown
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| US10741425B2 (en) * | 2017-02-22 | 2020-08-11 | Lam Research Corporation | Helium plug design to reduce arcing |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN120642045A (zh) | 2025-09-12 |
| US20240274413A1 (en) | 2024-08-15 |
| JPWO2024166292A1 (ja) | 2024-08-15 |
| JP7573117B1 (ja) | 2024-10-24 |
| KR20240125840A (ko) | 2024-08-20 |
| TW202433656A (zh) | 2024-08-16 |
| KR102713025B1 (ko) | 2024-10-07 |
| US12354851B2 (en) | 2025-07-08 |
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