WO2024118372A1 - Borosilicate glass with modified surface layer - Google Patents
Borosilicate glass with modified surface layer Download PDFInfo
- Publication number
- WO2024118372A1 WO2024118372A1 PCT/US2023/080485 US2023080485W WO2024118372A1 WO 2024118372 A1 WO2024118372 A1 WO 2024118372A1 US 2023080485 W US2023080485 W US 2023080485W WO 2024118372 A1 WO2024118372 A1 WO 2024118372A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- alkali
- glass substrate
- surface layer
- boron
- mol
- Prior art date
Links
- 239000002344 surface layer Substances 0.000 title claims abstract description 125
- 239000005388 borosilicate glass Substances 0.000 title description 6
- 239000011521 glass Substances 0.000 claims abstract description 183
- 239000003513 alkali Substances 0.000 claims abstract description 171
- 239000000758 substrate Substances 0.000 claims abstract description 135
- 239000000203 mixture Substances 0.000 claims abstract description 81
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 46
- 238000000034 method Methods 0.000 claims abstract description 32
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 26
- 229910011255 B2O3 Inorganic materials 0.000 claims abstract description 25
- 229910052681 coesite Inorganic materials 0.000 claims abstract description 24
- 229910052906 cristobalite Inorganic materials 0.000 claims abstract description 24
- 229910052682 stishovite Inorganic materials 0.000 claims abstract description 24
- 229910052905 tridymite Inorganic materials 0.000 claims abstract description 24
- 230000009477 glass transition Effects 0.000 claims abstract description 3
- 229910052796 boron Inorganic materials 0.000 claims description 55
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 51
- 239000010410 layer Substances 0.000 claims description 19
- KKCBUQHMOMHUOY-UHFFFAOYSA-N Na2O Inorganic materials [O-2].[Na+].[Na+] KKCBUQHMOMHUOY-UHFFFAOYSA-N 0.000 claims description 18
- 229910052710 silicon Inorganic materials 0.000 claims description 16
- 239000010703 silicon Substances 0.000 claims description 15
- NOTVAPJNGZMVSD-UHFFFAOYSA-N potassium monoxide Inorganic materials [K]O[K] NOTVAPJNGZMVSD-UHFFFAOYSA-N 0.000 claims description 8
- 235000012239 silicon dioxide Nutrition 0.000 claims description 8
- FUJCRWPEOMXPAD-UHFFFAOYSA-N Li2O Inorganic materials [Li+].[Li+].[O-2] FUJCRWPEOMXPAD-UHFFFAOYSA-N 0.000 claims description 6
- XUCJHNOBJLKZNU-UHFFFAOYSA-M dilithium;hydroxide Chemical compound [Li+].[Li+].[OH-] XUCJHNOBJLKZNU-UHFFFAOYSA-M 0.000 claims description 6
- 239000007789 gas Substances 0.000 claims description 5
- KOPBYBDAPCDYFK-UHFFFAOYSA-N Cs2O Inorganic materials [O-2].[Cs+].[Cs+] KOPBYBDAPCDYFK-UHFFFAOYSA-N 0.000 claims description 4
- 229910000272 alkali metal oxide Inorganic materials 0.000 claims description 4
- AKUNKIJLSDQFLS-UHFFFAOYSA-M dicesium;hydroxide Chemical compound [OH-].[Cs+].[Cs+] AKUNKIJLSDQFLS-UHFFFAOYSA-M 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 claims description 4
- 229910001953 rubidium(I) oxide Inorganic materials 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 3
- 239000006064 precursor glass Substances 0.000 description 30
- 238000011282 treatment Methods 0.000 description 15
- 239000001257 hydrogen Substances 0.000 description 13
- 229910052739 hydrogen Inorganic materials 0.000 description 13
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 12
- 239000011734 sodium Substances 0.000 description 10
- 229910052782 aluminium Inorganic materials 0.000 description 9
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 8
- 229910052708 sodium Inorganic materials 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 6
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 5
- 238000004458 analytical method Methods 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 5
- 239000007772 electrode material Substances 0.000 description 5
- 239000003607 modifier Substances 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000002419 bulk glass Substances 0.000 description 4
- 229910052593 corundum Inorganic materials 0.000 description 4
- 238000004090 dissolution Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 229910052760 oxygen Inorganic materials 0.000 description 4
- 239000002243 precursor Substances 0.000 description 4
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 4
- 229910001845 yogo sapphire Inorganic materials 0.000 description 4
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 3
- 230000009471 action Effects 0.000 description 3
- 230000002547 anomalous effect Effects 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 229910002804 graphite Inorganic materials 0.000 description 3
- 239000010439 graphite Substances 0.000 description 3
- 238000002354 inductively-coupled plasma atomic emission spectroscopy Methods 0.000 description 3
- 238000005342 ion exchange Methods 0.000 description 3
- 238000012900 molecular simulation Methods 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 239000006132 parent glass Substances 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 239000002585 base Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000013590 bulk material Substances 0.000 description 2
- 229910052791 calcium Inorganic materials 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000001747 exhibiting effect Effects 0.000 description 2
- 239000006025 fining agent Substances 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 238000007373 indentation Methods 0.000 description 2
- 230000000977 initiatory effect Effects 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 238000002386 leaching Methods 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000005191 phase separation Methods 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 239000006058 strengthened glass Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000006124 Pilkington process Methods 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910010037 TiAlN Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 239000005407 aluminoborosilicate glass Substances 0.000 description 1
- 239000005354 aluminosilicate glass Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000003280 down draw process Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 238000000329 molecular dynamics simulation Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- 230000009022 nonlinear effect Effects 0.000 description 1
- 239000000075 oxide glass Substances 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000037361 pathway Effects 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 150000004760 silicates Chemical class 0.000 description 1
- 238000003283 slot draw process Methods 0.000 description 1
- 150000003385 sodium Chemical class 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C23/00—Other surface treatment of glass not in the form of fibres or filaments
- C03C23/009—Poling glass
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C23/00—Other surface treatment of glass not in the form of fibres or filaments
- C03C23/007—Other surface treatment of glass not in the form of fibres or filaments by thermal treatment
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C23/00—Other surface treatment of glass not in the form of fibres or filaments
- C03C23/008—Other surface treatment of glass not in the form of fibres or filaments comprising a lixiviation step
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/076—Glass compositions containing silica with 40% to 90% silica, by weight
- C03C3/089—Glass compositions containing silica with 40% to 90% silica, by weight containing boron
Definitions
- Glasses formed or treated using known surface treatment often include surface layers that are at least partially crystallized or include crystallized portions, or may exhibit phase separation (i.e., a nonhomogeneous composition).
- the resulting surface layer includes hydrogen, which may be present in the form of H + , H 3 O + , H 2 O or combinations thereof.
- Thermal poling has been utilized to modify the properties of glass. Thermal poling generally involves the application of voltage to a glass.
- thermal poling includes the formation of depletion layers that inhibit alkali migration in photovoltaic glasses, the formation of interfacial barrier layers between display (or alkali-free) glass and silicon, and the formation of surface texture or selective-area ion exchange with patterned electrodes.
- Thermal poling has also been used to induce second-order nonlinear properties, especially second-order nonlinear optical properties, for the purpose of creating optical switches and devices. Poling methods are also closely analogous to so-called anodic bonding, which is applied to bond alkali-containing or alkali-free glasses to other materials, especially semiconductors.
- the instant disclosure provides glass substrates having a variety of compositions in the borosilicate and aluminoborosilicate families and a surface layer with a modified composition and atomic structure.
- the surface layer has a reduced concentration of alkali, while the bulk of the glass substrate includes alkali.
- the surface layer includes an atomic structure with substantially all boron in the 3-coordinated state whereas the bulk has an atomic structure with most of the boron in the 4-coordinated state.
- the composition and atomic structure of the surface layer enable various surface properties and performance attributes of the glass substrate.
- the surface layer can be used to improve the corrosion resistance, diffusion barrier, hardness, elastic modulus, fatigue resistance and damage resistance (e.g., anomalous deformation) of the glass substrate.
- a glass substrate comprises: an alkali-containing bulk; and an alkali-depleted surface layer, wherein the alkali-depleted surface layer is amorphous and comprises a substantially homogenous composition, and wherein the alkali-containing bulk and the alkali-depleted surface layer comprise B2O3 and SiO2.
- the glass substrate of aspect (1) is provided, wherein the alkali-depleted surface layer comprises about 0.5 atomic% alkali or less.
- the glass substrate of aspect (1) or aspect (2) is provided, wherein the alkali-depleted surface layer comprises an atomic structure comprising boron substantially in a 3-coordinated state.
- the glass substrate of aspect (3) is provided, wherein greater than about 60% by fraction of a total amount of boron in the alkali-depleted surface layer is in a 3-coordinated state.
- the glass substrate of aspect (3) is provided, wherein greater than about 70% by fraction of a total amount of boron in the alkali-depleted surface layer is in a 3-coordinated state.
- the glass substrate of aspect (3) is provided, wherein greater than about 75% by fraction of a total amount of boron in the alkali-depleted surface layer is in a 3-coordinated state.
- the glass substrate of any one of aspects (1)-(6) is provided, wherein the alkali-containing bulk comprises an atomic structure comprising boron in a 3- coordinated state and boron in a 4-coordinated state.
- the glass substrate of aspect (7) is provided, wherein greater than about 51% by fraction of a total amount of boron in the alkali-containing bulk is in a 4- coordinated state.
- the glass substrate of any one of aspects (1)-(8) is provided, wherein the alkali-depleted surface layer is substantially free of non-bridging oxygens.
- the glass substrate of aspect (9) is provided, wherein the alkali-containing bulk comprises non-bridging oxygens and bridging oxygens.
- the glass substrate of aspect (10) is provided, wherein the alkali-containing bulk is substantially free of non-bridging oxygens.
- the glass substrate of any one of aspects (1)-(11) is provided, wherein the alkali-containing bulk comprises an alkali-metal oxide selected from Li 2 O, Na 2 O, K 2 O, Rb 2 O and Cs 2 O.
- the glass substrate of aspect (12) is provided, wherein the alkali-containing bulk comprises at least 1 mol% Na2O, K2O, or Li2O.
- the glass substrate of aspect (12) is provided, wherein the alkali-containing bulk comprises at least 1mol% Na2O.
- the glass substrate of any one of aspects (1)-(14) is provided, wherein the alkali-depleted surface layer comprises B 2 O 3 in the range from about 10 mol% to about 90 mol%.
- the glass substrate of any one of aspects (1)-(15) is provided, wherein the alkali-depleted surface layer comprises a binary B 2 O 3 -SiO 2 composition.
- the glass substrate of any one of aspects (1)-(16) is provided, wherein atomic% silicon is greater than atomic% boron.
- a glass substrate is provided.
- the glass substrate comprises: a substrate thickness; an alkali-containing bulk having a bulk refractive index; and an alkali-depleted surface layer comprising a layer thickness in a range of from about 10 nm to about 3000 nm, wherein the alkali-depleted surface layer comprises a layer refractive index that is less than the bulk refractive index, wherein the alkali-containing bulk and the alkali- depleted surface layer comprise B2O3 and SiO2.
- the glass substrate of aspect (18) is provided, wherein atomic% silicon is greater than atomic% boron.
- a method of forming a glass substrate with a modified surface layer is provided.
- the method comprises: providing a glass substrate comprising a concentration of alkali, a glass transition temperature (Tg) and a surface layer, the glass substrate comprising B 2 O 3 and SiO 2 ; and reducing the concentration of alkali in the surface layer, wherein the surface layer with reduced concentration of alkali comprises a substantially homogenous composition.
- Tg glass transition temperature
- the method of aspect (20) is provided, wherein atomic% silicon is greater than atomic% boron.
- the method of aspect (20) or aspect (21) is provided, wherein reducing the concentration of alkali in the surface layer comprising contacting a surface of the glass substrate with an electrode; and subjecting the glass substrate to thermal poling.
- the method of aspect (22) is provided, wherein the electrode comprises an anode in contact with an anodic surface of the glass substrate and a cathode in contact with the cathodic surface of the glass substrate, and wherein thermal poling comprises applying voltage to the glass substrate such that the anode is positively biased relative to the glass substrate to induce alkali depletion at the anodic surface of the glass.
- thermal poling comprises heating the glass substrate and electrode to a temperature below Tg prior to applying voltage to the glass substrate.
- the method of aspect (22) is provided, wherein thermal poling comprises applying voltage in the range from about 100 volts to about 10,000 volts to the glass substrate for a duration in the range from about 1 minute to about 6 hours.
- the method of aspect (22) is provided, wherein the glass substrate is subjected to thermal poling under vacuum, in an inert gas environment, or a permeable gas environment.
- FIGS.3-7 show secondary-ion-mass-spectrometry (SIMS) depth profiles for certain elements through alkali-depleted surface layers of select glasses of Example 1 after thermal poling;
- FIG. 8 is a bar chart summarizing results of near-edge X-ray absorption fine- structure (NEXAFS) spectroscopy for select glasses of Example 1 after thermal poling;
- FIG. 9 is a group of line charts reporting molecularly simulated change in coordination state of boron after thermal poling different alkali and alkaline-earth borosilicate precursor glasses; and [0039]
- FIG.10 is a group of line charts reporting molecularly simulated change in Young’s modulus after thermal poling the different alkali and alkaline-earth borosilicate precursor glasses of FIG.9.
- DETAILED DESCRIPTION [0040]
- the term “and/or,” when used in a list of two or more items, means that any one of the listed items can be employed by itself, or any combination of two or more of the listed items can be employed.
- the composition can contain A alone; B alone; C alone; A and B in combination; A and C in combination; B and C in combination; or A, B, and C in combination.
- substantially is intended to denote that two values are equal or approximately equal. In some embodiments, “substantially” may denote values within about 10% of each other, such as within about 5% of each other, or within about 2% of each other.
- the terms “the,” “a,” or “an,” mean “at least one,” and should not be limited to “only one” unless explicitly indicated to the contrary. Thus, for example, reference to “a component” includes embodiments having two or more such components unless the context clearly indicates otherwise.
- the terms “atom%,” “atomic%,” or “atomic-%” refer to a glass composition in terms of molar percentage proportions of individual elements, such as O, Si, Al, B, Na, Ca, etc.
- oxide glasses may also be described in terms of proportions of component oxides, each with some assumed oxygen stoichiometry, such as SiO 2 , Al 2 O 3 , B 2 O 3 , Na 2 O , CaO, etc.
- the terms “mole%,” or “molar-%” describe a glass composition in terms of molar percentage proportions of component oxides.
- the terms “wt%” or “weight-%” describe a glass composition in terms of mass percentage proportions of component oxides.
- a first aspect of this disclosure pertains to a glass substrate 100 including an alkali-containing bulk 120 (interchangeably referred to as “bulk”) and an alkali- depleted surface layer 140.
- the alkali-containing bulk may include one or more alkali-metal oxides selected from Li 2 O, Na 2 O, K 2 O, Rb 2 O and Cs 2 O.
- the alkali-depleted surface layer may be substantially alkali-free or alkali free.
- the alkali-depleted surface layer can comprise about 0.5 atomic% alkali or less.
- the alkali-depleted surface layer may be described as a borosilicate (i.e., atomic% silicon > atomic% boron) surface layer or a boroaluminosilicate surface layer (i.e., atomic% silicon > [atomic% boron + atomic% aluminum]).
- the alkali-depleted surface layer exhibits a composition and atomic structure that differs from the bulk, while exhibiting homogeneity in terms of composition and/or atomic structure within and throughout the surface layer.
- the alkali-depleted surface layer is integral to the glass substrate and is not a coating or an addition to the bulk.
- the glass substrate may have a substrate thickness t in a range of from about 0.1 mm to about 3.0 mm, from about 0.3 mm to about 3 mm, from about 0.4 mm to about 3 mm, from about 0.5 mm to about 3 mm, from about 0.55 mm to about 3 mm, from about 0.7 mm to about 3 mm, from about 1 mm to about 3 mm, from about 0.1 mm to about 2 mm, from about 0.1 mm to about 1.5 mm, from about 0.1 mm to about 1 mm, from about 0.1 mm to about 0.7 mm, from about 0.1 mm to about 0.55 mm, from about 0.1 mm to about 0.5 mm, from about 0.1 mm to about 0.4 mm, from about 0.3 mm to about 0.7 mm, or from about 0.3 mm to about 0.55 mm, and also comprising all sub-ranges and sub-values between these range endpoints.
- the alkali-depleted surface layer may have a layer thickness in a range of from about 10 nm to about 3000 nm, from about 10 nm to about 2000 nm, from about 10 nm to about 1000 nm, from about 10 nm to about 900 nm, from about 10 nm to about 800 nm, from about 10 nm to about 700 nm, from about 10 nm to about 600 nm, from about 10 nm to about 500 nm, from about 50 nm to about 1000 nm, from about 100 nm to about 1000 nm, from about 200 nm to about 1000 nm, from about 250 nm to about 1000 nm, from about 300 nm to about 1000 nm, from about 400 nm to about 1000 nm, from about 500 nm to about 1000 nm, from about 500 nm to about 1500 nm, from about 500 nm to about 2000, from about 500 nm
- the alkali-depleted surface layer has a substantially homogenous composition.
- the composition of the alkali-depleted surface layer is substantially the same along the layer thickness of the surface layer. In embodiments, the composition of the alkali-depleted surface layer is substantially the same along its entire volume.
- the phrase “homogenous composition” refers to a composition that is not phase separated and/or does not include portions with a composition differing from other portions.
- the alkali-depleted surface layer may be substantially free of crystallites and/or is substantially amorphous. For example, the alkali-depleted surface layer can include less than about 1 volume% crystallites.
- the alkali-depleted surface layer is substantially free of hydrogen.
- Such hydrogen may be present in the form of H + , H3O + , H2O or combinations thereof.
- the alkali-depleted surface layer includes about 0.1 atomic% hydrogen or less (e.g., about 0.08 atomic% hydrogen or less, about 0.06 atomic% hydrogen or less, about 0.05 atomic% hydrogen or less, about 0.04 atomic% hydrogen or less, about 0.02 atomic% hydrogen or less, or about 0.01 atomic% hydrogen or less).
- glass substrates that are treated by leaching or other wet chemical treatments typically have surface layers that include hydrogen.
- the alkali-depleted surface layer may have hydrogen injected into its composition under certain thermal poling conditions.
- the alkali-depleted surface layer may include hydrogen in amount greater than that indicated in the paragraph immediately above.
- the alkali-containing bulk and the alkali-depleted surface layer comprise B 2 O 3 and SiO 2 .
- the alkali-containing bulk and the alkali-depleted surface layer each have an atomic structure that comprises boron in one or more coordination states.
- the alkali-depleted surface layer includes boron in the 3- coordinated state (interchangeably referred to as trigonal B[3] units or simply B[3]) and boron in the 4-coordinated state (interchangeably referred to as tetrahedral B[4] units or simply B[4]).
- substantially all the boron in the alkali-depleted surface layer is in the 3- coordinated state.
- most of the boron in the alkali-depleted surface layer is in the 3-coordinated state.
- the alkali-containing bulk includes boron in the 3-coordinated state and boron in the 4-coordinated state.
- a majority i.e., an amount greater than half of the total of the boron in the alkali-containing bulk is in the 4-coordinated state.
- the alkali-depleted surface layer is substantially free of non- bridging oxygens, while, in some embodiments, the alkali-containing bulk comprises non- bridging oxygens and bridging oxygens.
- an alkali-depleted surface layer may also be present or formed when the alkali-containing bulk is substantially free of non-bridging oxygens.
- the alkali-depleted surface layer comprises B 2 O 3 in a range of from about 1 mol% to about 90 mol%.
- the amount of B 2 O 3 may be in the range from about 1 mol% to about 80 mol%, from about 1 mol% to about 70 mol%, from about 1 mol% to about 60 mol%, from about 1 mol% to about 50 mol%, from about 5 mol% to about 90 mol%, from about 10 mol% to about 90 mol%, from about 20 mol% to about 90 mol%, from about 30 mol% to about 90 mol%, from about 1 mol% to about 55 mol%, 5 mol% to about 45 mol%, or from about 3 mol% to about 35 mol%.
- the alkali-depleted surface layer comprises a binary B2O3-SiO2 composition, though other non-alkali components may be included.
- the glass substrate, prior to thermal poling treatment, as will be described herein, and the alkali-containing bulk may include a variety of glass compositions. Such glass compositions used in the glass substrate prior to thermal poling treatment and present in the alkali-containing bulk after thermal poling treatment may be referred to herein as a “precursor” glass or glass composition.
- the precursor compositions may range from simple alkali or alkaline-earth silicates, borosilicates, or boroaluminosilicates, to more complex multicomponent glasses able to form an altered surface layer by the process of thermal poling.
- the alkali-containing bulk may show signs of nanoscale phase-separation but, when these glasses were subjected to thermal poling, the layers included a single-phase.
- the precursor glass composition is configured to form a homogeneous glass (i.e., not phase-separated, not devitrified).
- the precursor glass composition comprises some alkali.
- the precursor glass composition comprises greater than or equal to 1 mol% alkali- metal oxide selected from Li 2 O, Na 2 O, K 2 O, Rb 2 O, and Cs 2 O.
- the precursor glass composition comprises greater than or equal to 1 mol% Na 2 O.
- the precursor glass composition can comprise greater than or equal to 1, 1.5, 2, 3, 4, 5, 6, 7, 8, 9, or 10 mol% Na2O.
- the precursor glass composition comprises some boron.
- the precursor glass composition comprises greater than or equal to 1 mol% B 2 O 3 .
- the precursor glass composition can comprise greater than or equal to 1, 1.5, 2, 3, 4, 5, 6, 7, 8, 9, 10, 15, or 20 mol% B 2 O 3 .
- the precursor glass composition is a simple sodium borosilicate that comprises Na2O, B2O3, and SiO2.
- the precursor glass composition comprises from about 8.5 mol% to about 43 mol% Na 2 O, from about 9 mol% to about 87 mol% B 2 O 3 , and from about 9.5 mol% to about 88 mol% SiO 2 .
- the precursor glass composition comprises from about 9.5 mol% to about 39 mol% Na 2 O, from about 10 mol% to about 79.5 mol% B 2 O 3 , and from about 10.5 mol% to about 80 mol% SiO 2 .
- the precursor glass composition comprises from about 8.7 mol% to about 21.5 mol% Na2O, from about 9 mol% to about 33 mol% B2O3, and from about 54 mol% to about 88 mol% SiO2.
- the precursor glass composition comprises from about 9.5 mol% to about 19.5 mol% Na2O, from about 10 mol% to about 30 mol% B2O3, and from about 60 mol% to about 80 mol% SiO2.
- the precursor glass composition is an alkali-containing borosilicate, an alkali-containing boroaluminosilicate, or a combination thereof.
- the amount of silicon is greater than the amount of amount of boron alone, the amount of aluminum alone, or the combined amounts of boron and aluminum (e.g., atomic% silicon > [atomic% aluminum + atomic% boron]).
- the amount of alkali may be limited such that there is no invert glass with more alkali than network-former.
- the precursor glass composition comprises from about 46 mol% to about 80 mol% SiO2, from about 0 mol% to about 17 mol% Na2O, from about 8 mol% to about 25 mol% Al2O3, from about 2 mol% to about 15 mol% B2O3, from about 0 mol% to about 8 mol% MgO, from about 0 mol% to about 5 mol% K2O, from about 0 mol% to about 11 mol% CaO, and from about 0.05 mol% to about 0.5 mol% SnO2.
- the precursor glass composition comprises from about 57 mol% to about 67 mol% SiO2, from about 1 mol% to about 14 mol% Na2O, from about 11 mol% to about 21 mol% Al2O3, from about 3 mol% to about 10 mol% B2O3, from about 0 mol% to about 5 mol% MgO, from about 0 mol% to about 3 mol% K2O, from about 0 mol% to about 8 mol% CaO, and from about 0.05 mol% to about 0.25 mol% SnO2.
- the precursor glass composition may be substantially free of aluminum.
- the precursor glass composition and/or the glass substrate after thermal poling treatment may include less than about 1 mol%, or less than about 0.1 mol% Al2O3 or aluminum in any state.
- the alkali-containing bulk may include an amount of Na 2 O that is about equal to the amount of B 2 O 3 present in the bulk.
- Fining agents may be included in the precursor glass compositions described herein such as SnO2 and other known fining agents.
- the glass substrate after thermal poling treatment exhibits a refractive index in the range from about 1.45 to about 1.55, with the alkali-depleted surface layer exhibiting a lower refractive index than the alkali-containing bulk.
- the glass substrate may exhibit an average strain-to-failure at a surface on one or more opposing major surface that is 0.5% or greater, 0.6% or greater, 0.7% or greater, 0.8% or greater, 0.9% or greater, 1% or greater, 1.1% or greater, 1.2% or greater, 1.3% or greater, 1.4% or greater 1.5% or greater or even 2% or greater, as measured using ball- on-ring testing using at least 5, at least 10, at least 15, or at least 20 samples.
- the glass substrate may exhibit an average strain-to-failure at its surface on one or more opposing major surface of about 1.2%, about 1.4%, about 1.6%, about 1.8%, about 2.2%, about 2.4%, about 2.6%, about 2.8%, or about 3% or greater.
- the glass substrates described herein may exhibit an elastic modulus (or Young’s modulus) in a range of from about 30 GPa to about 120 GPa.
- the elastic modulus of the glass substrate may be in a range of from about 30 GPa to about 110 GPa, from about 30 GPa to about 100 GPa, from about 30 GPa to about 90 GPa, from about 30 GPa to about 80 GPa, from about 30 GPa to about 70 GPa, from about 40 GPa to about 120 GPa, from about 50 GPa to about 120 GPa, from about 60 GPa to about 120 GPa, or from about 70 GPa to about 120 GPa, and all ranges and sub-ranges therebetween.
- the glass substrate may be strengthened or non-strengthened.
- thermal poling may be performed on strengthened glass substrates such that the alkali-depleted surface layer is formed on top of a compressive stress layer in the strengthened glass substrate.
- the glass substrate may be substantially planar or sheet-like, although other embodiments may utilize a curved or otherwise shaped or sculpted substrate.
- the glass substrate may be substantially optically clear, transparent, and free from light scattering.
- the glass substrate may exhibit an average total transmittance over the optical wavelength regime of about 85% or greater, about 86% or greater, about 87% or greater, about 88% or greater, about 89% or greater, about 90% or greater, about 91% or greater or about 92% or greater.
- the physical thickness of the glass substrate may vary along one or more of its dimensions for aesthetic and/or functional reasons. For example, the edges of the glass substrate may be thicker as compared to more central regions of the glass substrate. The length, width, and physical thickness dimensions of the glass substrate may also vary according to the application or use.
- the glass substrate may be provided using various forming methods, which can include float glass processes and down-draw processes such as fusion draw and slot draw.
- the resulting glass substrates including the alkali-containing bulk and alkali- depleted surface layer described herein exhibit improved corrosion resistance, improved diffusion barrier properties, higher hardness and/or elastic-modulus values, greater fatigue resistance, and/or improved damage resistance (via so-called anomalous deformation).
- the glass network has a near-maximal degree of connectivity, which favors high hardness and/or modulus.
- the absence of mobile alkali or other network-modifiers means there are very limited pathways for ionic hopping conduction, translating to inhibited diffusion (aka diffusion barrier) properties.
- the alkali-depleted surface layer comprises a layer refractive index that is less than a bulk refractive index of the alkali-containing bulk.
- the alkali- depleted surface layer may have a refractive index that is in the range from about 1.45 to about 1.55 at a wavelength of about 550 nm. This result is of generally sufficient index contrast and thickness to produce a visible anti-reflection effect in the thermally poled glasses.
- the boron structural units are modified from tetrahedral B[4] units to trigonal B[3] units in the alkali-depleted surface layer.
- Trigonal B[3] units may correspond to lower glass density compared to their B[4] counterparts. This in turn, may further increase the refractive index contrast between poled and bulk material for borosilicates compared to aluminosilicate glasses.
- the glass substrate having an alkali-containing bulk and an alkali- depleted surface layer may exhibit increased elastic modulus as compared to the alkali- containing bulk (or the glass substrate before the alkali-depleted surface layer is formed).
- the glass substrate may have an elastic modulus that is about 10% greater than the elastic modulus of the alkali-containing bulk (or the glass substrate before the alkali-depleted surface layer is formed).
- the glass substrate exhibits an elastic modulus of about 90 GPa.
- the hardness of the glass substrates described herein is also greater than the hardness of the alkali-containing bulk.
- the hardness of the glass substrate may be about 10% or even 20% greater than the hardness of the alkali-containing bulk (or the glass substrate before the alkali-depleted surface layer is formed).
- the hardness of the alkali-containing bulk may be about 6 GPa, while the glass substrate exhibits a hardness of about 7 GPa, at indentation depths from about 0 nm to about 200 nm. Unless otherwise specified, the hardness values described herein refer to Vickers hardness.
- the alkali-depleted surface layers also block ion diffusion either into the glass substrate or from the alkali-containing bulk to the alkali-depleted surface layer .
- the glass substrates described herein may exhibit an increased chemical durability in terms of resistance to dissolution in acid, water, or base.
- a second aspect of this disclosure pertains to a method of forming a glass substrate with a modified surface layer.
- the method includes providing a glass substrate comprising a concentration of alkali and a surface layer and reducing the concentration of alkali in the surface layer.
- the resulting surface layer with reduced concentration of alkali comprises a substantially homogenous composition.
- reducing the concentration of alkali in the surface layer includes contacting a surface of the glass substrate with an electrode and subjecting the glass substrate to thermal poling.
- the surface of the glass substrate Prior to thermal poling treatment, the surface of the glass substrate (and thus the surface layer) may be cleaned or treated to remove typical contamination that may accumulate after forming, storage and shipping. Alternatively, the glass substrate may be subjected to treatment immediately after forming to eliminate the accumulation of contamination.
- the electrode used in thermal poling may include an anode in contact with an anodic surface of the glass substrate and a cathode in contact with a cathodic surface of the glass substrate. The anodic surface is subjected to positive direct current (DC) bias while the cathodic surface is subject to negative DC bias.
- the electrode material is substantially more conductive than the glass at the poling temperature to provide for field uniformity over the modified surface area.
- anodic electrode material be relatively oxidation resistant to minimize the formation of an interfacial oxide compound that could cause sticking of the glass to the template.
- exemplary anodic electrode materials include noble metals (e.g., Au, Pt, Pd, etc.) or oxidation-resistant, conductive films (e.g., TiN and TiAlN).
- the cathodic electrode material may also be conductive to likewise provide for field uniformity over the modified area.
- Exemplary materials for the cathodic electrode material include materials that can accept alkali ions from the glass, such as graphite.
- a physical cathodic electrode may not always be necessary to be brought into contact, due to surface discharge.
- the electrode(s) are separate components that are brought into contact with the glass, and thus can be separated after processing without complex removal steps. Electrodes can generally comprise a bulk material, or take the form of a thin film, for example, a conductive thin film or coating that is deposited on the glass to serve as an electrode. [0094] In embodiments, the electrode can generally cover all or only part of the surface and may be intermittent or patterned as desired. Patterning can be achieved by any of a variety of methods, such as lithographic techniques, mechanical machining, or otherwise. [0095] The curvature and/or flatness of the glass and the electrode should be ideally matched to provide for reasonably intimate contact at the interface over the affected area.
- Thermal poling may include applying voltage to the glass substrate such that the anode is positively-biased relative to the glass substrate to induce alkali depletion at the anodic surface of the glass.
- the voltage may be DC voltage or DC-biased AC voltage.
- the method may include heating the glass substrate and electrode (i.e., the stack including an anode/glass/cathode) to a temperature below Tg prior to applying voltage to the glass substrate.
- the glass substrate and electrode may be heated to a process temperature in the range from about 25 °C to about Tg, or from about 100 °C to about 300 °C. In embodiments, equilibrium at the desired process temperature may be useful in thermal poling to ensure temperature uniformity.
- the thermal poling treatment includes applying voltage in the range from about 100 volts to about 10,000 volts (e.g., from about 100 volts to about 1000 volts) to the glass substrate for a duration in the range from about 1 minute to about 6 hours (e.g., from about 5 minutes to about 60 minutes or from about 15 minutes to about 30 minutes). It should be appreciated that thermal poling treatment times and voltages may vary depending on glass composition.
- the glass substrate is subjected to thermal poling under vacuum in an inert gas environment (e.g., dry N2) or a permeable gas environment (e.g., He).
- an inert gas environment e.g., dry N2
- a permeable gas environment e.g., He
- the voltage may be applied in either one or more discrete steps to achieve a maximum desired value, or ramped (or increased) in a controlled/current-limited manner up to the process voltage.
- Various approaches have the advantage of potentially circumventing thermal dielectric breakdown with the passage of too much current through the glass, especially with low-resistivity glasses, allowing for higher final poling voltages and possibly thicker surface layers.
- an “instant-on” strategy for applying voltage may also be tolerated under some conditions and could be desired for convenience.
- the glass substrate may be cooled to a temperature in the range from about 25 °C to about 80 °C for subsequent handling.
- the voltage may be removed prior to cooling or after cooling.
- an apparatus suitable for performing poling treatments can include any system that can simultaneously maintain heat and voltage to the glass/electrode stack in a controlled manner while avoiding practical problems such as leakage current paths or arcing.
- the apparatus also provides control of the process atmosphere (e.g., under vacuum, in an inert gas environment such as dry N2, or permeable gas environment), which can minimize atmosphere effects and/or occluded gas at the interface.
- process atmosphere e.g., under vacuum, in an inert gas environment such as dry N2, or permeable gas environment
- an example apparatus suitable for performing thermal poling treatments is disclosed in U.S. Provisional Patent Application Serial No. 63/193,334, filed on March 21, 2022, the disclosure of which is incorporated herein by reference in its entirety.
- EXAMPLE 1 A series of sodium borosilicate glasses were melted, and the compositions verified by inductively coupled plasma optical emission spectrometry (ICP-OES). Bulk composition results are given in Table 1. Table 1 includes the results as measured by ICP-OES (left) and the mapping target values (right) used in the ternary diagrams of FIG.2A and FIG.2B. [0105] Table 1: Bulk composition information for Examples 1-10. [0106] A ternary diagram summarizing the precursor glass compositions and the corresponding experimental strategy is shown in FIG. 2A.
- Model glasses in the Na2O-B2O3- SiO 2 system represent “precursor” or bulk glass compositions, upon which depleted surface layers were synthesized by thermal poling on the positively-biased surface of the glass. After thermal poling, the corresponding compositional effect is to create an alkali-depleted surface layer, wherein the modifier species is driven out of the surface layer.
- the network-former-only compositions that were generated in the alkali-depleted surface layer are projected onto the B 2 O 3 -SiO 2 binary edge of the diagram, as shown in FIG.2B.
- the bulk glass or the alkali-containing bulk glass has the same composition, structure and features as the precursor glass before being subjected to thermal poling.
- compositions as shown in Table 1 allows for more definitive determination of structure, while still maintaining relevance with commercial and other useful compositions.
- the compositions were also selected to provide examples where alkali-depleted surface layers are synthesized with final compositions overlapping one another but formed from precursor glasses of different initial compositions and structure from one another (i.e., to demonstrate that alkali-depleted surface layers having the same compositions can be formed from various precursor glasses). In this way, the role of precursor glass composition could also be probed, with varied concentrations and types of alkali-charge- balanced species in the structure.
- Glass sheets were formed from the precursor glass compositions shown in Table 1 and polished into planar coupons having dimensions from about 25 to 50 mm square.
- the coupons have a thickness of about 1.0 mm.
- a bulk high-purity platinum (Pt) monolith was obtained and polished to an optical finish. This element was placed in contact with the surface of each glass sheet for use as the positively-biased electrode.
- a section of graphite foil e.g., graphite foil supplied by Graftech International, under the trademark Grafoil®
- the electrode sizes were controlled such that they did not cover the entire surface of the glass on either side, to reduce or eliminate leakage currents.
- each such stack was introduced into a vacuum furnace and a dry nitrogen atmosphere was created and heated to a temperature between about 200 °C and 300 °C. After equilibrating at a temperature in this range for about 15 minutes, a voltage of about +300V was applied to the platinum electrode, with current limited to 1 mA maximum. An initial increase in current was observed, followed by a slow decay as the alkali-depleted surface layer formed. The voltage was applied for a period of about 15 minutes, after which the heater was shut off and the stack of electrodes and glass sheet was allowed to cool under voltage. When the temperature of the stack was less than about 100 °C, the voltage was removed, the chamber was vented, and the stack was manually separated.
- FIGS. 3-7 The results of these analyses for Examples 4-8 of Table 1 are summarized in FIGS. 3-7, respectively.
- SIMS elemental depth profiles are presented as concentrations of the elements noted in the corresponding legends on the positively biased surface as a function of depth (nm).
- X-ray photoelectron spectroscopy (XPS) analyses were performed to evaluate and quantify the composition of the alkali-depleted surface layer to corroborate the SIMS findings. The results are given in Table 2 and are reported as the average of three measurement points per sample. [0115] Table 2. XPS data for the surface composition of the positively-biased surface of select Examples.
- NEFS Near-edge X-ray absorption fine-structure
- TEY partial-electron-yield
- FIG. 8 summarizes the results from the B K-edge NEXAFS analysis, comparing poled anode-side surfaces versus air-fracture surfaces (representing bulk glass structure) for Examples 4-7 after thermal poling.
- FIG.9 illustrates fraction of boron 3-coorindated (black) and 4-coordinated (red) in the series of alkali and alkaline-earth borosilicate compositions shown in Table 3. As shown in FIG. 9, after thermal poling, there is an observable change in coordination number of boron from a 4-coordinated to 3-coordinated state.
- FIG. 9 illustrates fraction of boron 3-coorindated (black) and 4-coordinated (red) in the series of alkali and alkaline-earth borosilicate compositions shown in Table 3.
- FIG. 10 depicts Young’s modulus of sodium borosilicates varying in composition as-melted ternary, as-melted binary, and binary obtained through thermal poling. As shown, the Young’s modulus of the alkali-depleted surface layer is generally lower than the bulk.
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Thermal Sciences (AREA)
- Glass Compositions (AREA)
Abstract
A glass substrate includes an alkali-containing bulk and an alkali-depleted surface layer. The alkali-depleted surface layer is amorphous and comprises a substantially homogenous composition. The alkali-containing bulk and the alkali-depleted surface layer comprise B2O3 and SiO2. A method for forming a glass substrate with a modified surface layer includes providing a glass substrate with a concentration of alkali, a glass transition temperature (Tg), and a surface layer. The glass substrate further comprises B2O3 and SiO2. The method further includes reducing the concentration of alkali in the surface layer such that the surface layer with reduced concentration of alkali comprises a substantially homogenous composition.
Description
BOROSILICATE GLASS WITH MODIFIED SURFACE LAYER CROSS-REFERENCE TO RELATED APPLICATIONS [0001] This application claims the benefit of priority under 35 U.S.C. § 119 of U.S. Provisional Application No. 63/428,767 filed November 30, 2022, the content of which is incorporated herein by reference in its entirety. FIELD [0002] The disclosure relates to glass substrates with a modified surface layer and, more particularly, to glass substrates with an alkali-containing bulk and an alkali-depleted surface layer. BACKGROUND [0003] Glasses formed or treated using known surface treatment (e.g., including melt- prepared glasses) often include surface layers that are at least partially crystallized or include crystallized portions, or may exhibit phase separation (i.e., a nonhomogeneous composition). In other known methods used to modify surface layers (e.g., leaching or wet chemical treatments), the resulting surface layer includes hydrogen, which may be present in the form of H+, H3O+, H2O or combinations thereof. [0004] Thermal poling has been utilized to modify the properties of glass. Thermal poling generally involves the application of voltage to a glass. Known uses of thermal poling include the formation of depletion layers that inhibit alkali migration in photovoltaic glasses, the formation of interfacial barrier layers between display (or alkali-free) glass and silicon, and the formation of surface texture or selective-area ion exchange with patterned electrodes. [0005] Thermal poling has also been used to induce second-order nonlinear properties, especially second-order nonlinear optical properties, for the purpose of creating optical switches and devices. Poling methods are also closely analogous to so-called anodic bonding, which is applied to bond alkali-containing or alkali-free glasses to other materials, especially semiconductors. [0006] The instant disclosure provides glass substrates having a variety of compositions in the borosilicate and aluminoborosilicate families and a surface layer with a modified
composition and atomic structure. In embodiments, the surface layer has a reduced concentration of alkali, while the bulk of the glass substrate includes alkali. The surface layer includes an atomic structure with substantially all boron in the 3-coordinated state whereas the bulk has an atomic structure with most of the boron in the 4-coordinated state. The composition and atomic structure of the surface layer enable various surface properties and performance attributes of the glass substrate. For example, the surface layer can be used to improve the corrosion resistance, diffusion barrier, hardness, elastic modulus, fatigue resistance and damage resistance (e.g., anomalous deformation) of the glass substrate. SUMMARY [0007] According to aspect (1), a glass substrate is provided. The glass substrate comprises: an alkali-containing bulk; and an alkali-depleted surface layer, wherein the alkali-depleted surface layer is amorphous and comprises a substantially homogenous composition, and wherein the alkali-containing bulk and the alkali-depleted surface layer comprise B2O3 and SiO2. [0008] According to aspect (2), the glass substrate of aspect (1) is provided, wherein the alkali-depleted surface layer comprises about 0.5 atomic% alkali or less. [0009] According to aspect (3), the glass substrate of aspect (1) or aspect (2) is provided, wherein the alkali-depleted surface layer comprises an atomic structure comprising boron substantially in a 3-coordinated state. [0010] According to aspect (4), the glass substrate of aspect (3) is provided, wherein greater than about 60% by fraction of a total amount of boron in the alkali-depleted surface layer is in a 3-coordinated state. [0011] According to aspect (5), the glass substrate of aspect (3) is provided, wherein greater than about 70% by fraction of a total amount of boron in the alkali-depleted surface layer is in a 3-coordinated state. [0012] According to aspect (6), the glass substrate of aspect (3) is provided, wherein greater than about 75% by fraction of a total amount of boron in the alkali-depleted surface layer is in a 3-coordinated state.
[0013] According to aspect (7), the glass substrate of any one of aspects (1)-(6) is provided, wherein the alkali-containing bulk comprises an atomic structure comprising boron in a 3- coordinated state and boron in a 4-coordinated state. [0014] According to aspect (8), the glass substrate of aspect (7) is provided, wherein greater than about 51% by fraction of a total amount of boron in the alkali-containing bulk is in a 4- coordinated state. [0015] According to aspect (9), the glass substrate of any one of aspects (1)-(8) is provided, wherein the alkali-depleted surface layer is substantially free of non-bridging oxygens. [0016] According to aspect (10), the glass substrate of aspect (9) is provided, wherein the alkali-containing bulk comprises non-bridging oxygens and bridging oxygens. [0017] According to aspect (11), the glass substrate of aspect (10) is provided, wherein the alkali-containing bulk is substantially free of non-bridging oxygens. [0018] According to aspect (12), the glass substrate of any one of aspects (1)-(11) is provided, wherein the alkali-containing bulk comprises an alkali-metal oxide selected from Li2O, Na2O, K2O, Rb2O and Cs2O. [0019] According to aspect (13), the glass substrate of aspect (12) is provided, wherein the alkali-containing bulk comprises at least 1 mol% Na2O, K2O, or Li2O. [0020] According to aspect (14), the glass substrate of aspect (12) is provided, wherein the alkali-containing bulk comprises at least 1mol% Na2O. [0021] According to aspect (15), the glass substrate of any one of aspects (1)-(14) is provided, wherein the alkali-depleted surface layer comprises B2O3 in the range from about 10 mol% to about 90 mol%. [0022] According to aspect (16), the glass substrate of any one of aspects (1)-(15) is provided, wherein the alkali-depleted surface layer comprises a binary B2O3-SiO2 composition. [0023] According to aspect (17), the glass substrate of any one of aspects (1)-(16) is provided, wherein atomic% silicon is greater than atomic% boron. [0024] According to aspect (18), a glass substrate is provided. The glass substrate comprises: a substrate thickness; an alkali-containing bulk having a bulk refractive index; and an alkali-depleted surface layer comprising a layer thickness in a range of from about 10 nm to about 3000 nm, wherein the alkali-depleted surface layer comprises a layer refractive index
that is less than the bulk refractive index, wherein the alkali-containing bulk and the alkali- depleted surface layer comprise B2O3 and SiO2. [0025] According to aspect (19), the glass substrate of aspect (18) is provided, wherein atomic% silicon is greater than atomic% boron. [0026] According to aspect (20), a method of forming a glass substrate with a modified surface layer is provided. The method comprises: providing a glass substrate comprising a concentration of alkali, a glass transition temperature (Tg) and a surface layer, the glass substrate comprising B2O3 and SiO2; and reducing the concentration of alkali in the surface layer, wherein the surface layer with reduced concentration of alkali comprises a substantially homogenous composition. [0027] According to aspect (21), the method of aspect (20) is provided, wherein atomic% silicon is greater than atomic% boron. [0028] According to aspect (22), the method of aspect (20) or aspect (21) is provided, wherein reducing the concentration of alkali in the surface layer comprising contacting a surface of the glass substrate with an electrode; and subjecting the glass substrate to thermal poling. [0029] According to aspect (23), the method of aspect (22) is provided, wherein the electrode comprises an anode in contact with an anodic surface of the glass substrate and a cathode in contact with the cathodic surface of the glass substrate, and wherein thermal poling comprises applying voltage to the glass substrate such that the anode is positively biased relative to the glass substrate to induce alkali depletion at the anodic surface of the glass. [0030] According to aspect (24), the method of aspect (22) is provided, wherein thermal poling comprises heating the glass substrate and electrode to a temperature below Tg prior to applying voltage to the glass substrate. [0031] According to aspect (25), the method of aspect (22) is provided, wherein thermal poling comprises applying voltage in the range from about 100 volts to about 10,000 volts to the glass substrate for a duration in the range from about 1 minute to about 6 hours. [0032] According to aspect (26), the method of aspect (22) is provided, wherein the glass substrate is subjected to thermal poling under vacuum, in an inert gas environment, or a permeable gas environment.
BRIEF DESCRIPTION OF THE DRAWINGS [0033] FIG.1 is a side view of a glass substrate according to embodiments; [0034] FIG.2A is a ternary diagram of precursor glasses of Example 1; [0035] FIG. 2B shows the ternary diagram of FIG. 2A with network-former-only compositions formed by thermal poling the precursor glasses of the Example 1 projected onto the B2O3-SiO2 binary edge of the diagram; [0036] FIGS.3-7 show secondary-ion-mass-spectrometry (SIMS) depth profiles for certain elements through alkali-depleted surface layers of select glasses of Example 1 after thermal poling; [0037] FIG. 8 is a bar chart summarizing results of near-edge X-ray absorption fine- structure (NEXAFS) spectroscopy for select glasses of Example 1 after thermal poling; [0038] FIG. 9 is a group of line charts reporting molecularly simulated change in coordination state of boron after thermal poling different alkali and alkaline-earth borosilicate precursor glasses; and [0039] FIG.10 is a group of line charts reporting molecularly simulated change in Young’s modulus after thermal poling the different alkali and alkaline-earth borosilicate precursor glasses of FIG.9. DETAILED DESCRIPTION [0040] For the purposes of promoting an understanding of the principles of the disclosure, reference will now be made to the embodiments illustrated in the drawings and described in the following written specification. It is understood that no limitation to the scope of the disclosure is thereby intended. It is further understood that the present disclosure includes any alterations and modifications to the illustrated embodiments and includes further applications of the principles disclosed herein as would normally occur to one skilled in the art to which this disclosure pertains [0041] As used herein, the term “and/or,” when used in a list of two or more items, means that any one of the listed items can be employed by itself, or any combination of two or more of the listed items can be employed. For example, if a composition is described as containing components A, B, and/or C, the composition can contain A alone; B alone; C alone; A and B
in combination; A and C in combination; B and C in combination; or A, B, and C in combination. [0042] In this document, relational terms, such as first and second, top and bottom, and the like, are used solely to distinguish one entity or action from another entity or action, without necessarily requiring or implying any actual such relationship or order between such entities or actions. [0043] As used herein, the term “about” means that amounts, sizes, formulations, parameters, and other quantities and characteristics are not and need not be exact, but may be approximate and/or larger or smaller, as desired, reflecting tolerances, conversion factors, rounding off, measurement error and the like, and other factors known to those of skill in the art. When the term “about” is used in describing a value or an end-point of a range, the disclosure should be understood to include the specific value or end-point referred to. Whether or not a numerical value or end-point of a range in the specification recites “about,” the numerical value or end-point of a range is intended to include two embodiments: one modified by “about,” and one not modified by “about.” It will be further understood that the end-points of each of the ranges are significant both in relation to the other end-point, and independently of the other end-point. [0044] The terms “substantial,” “substantially,” and variations thereof as used herein, unless defined elsewhere in association with specific terms or phrases, are intended to note that a described feature is equal or approximately equal to a value or description. For example, a “substantially planar” surface is intended to denote a surface that is planar or approximately planar. Moreover, “substantially” is intended to denote that two values are equal or approximately equal. In some embodiments, “substantially” may denote values within about 10% of each other, such as within about 5% of each other, or within about 2% of each other. [0045] Directional terms as used herein—for example up, down, right, left, front, back, top, bottom, above, below, and the like—are made only with reference to the figures as drawn and are not intended to imply absolute orientation. [0046] As used herein the terms "the," "a," or "an," mean "at least one," and should not be limited to "only one" unless explicitly indicated to the contrary. Thus, for example, reference to "a component" includes embodiments having two or more such components unless the context clearly indicates otherwise.
[0047] As used herein, the terms “atom%,” “atomic%,” or “atomic-%” refer to a glass composition in terms of molar percentage proportions of individual elements, such as O, Si, Al, B, Na, Ca, etc. By convention, oxide glasses may also be described in terms of proportions of component oxides, each with some assumed oxygen stoichiometry, such as SiO2, Al2O3, B2O3, Na2O, CaO, etc. As used herein, the terms
“mole%,” or “molar-%” describe a glass composition in terms of molar percentage proportions of component oxides. The terms “wt%” or “weight-%” describe a glass composition in terms of mass percentage proportions of component oxides. Elements may be interchangeably referred to by their name or symbol (e.g., carbon or C, oxygen or O, etc.). [0048] As shown in FIG.1, a first aspect of this disclosure pertains to a glass substrate 100 including an alkali-containing bulk 120 (interchangeably referred to as “bulk”) and an alkali- depleted surface layer 140. The alkali-containing bulk may include one or more alkali-metal oxides selected from Li2O, Na2O, K2O, Rb2O and Cs2O. In embodiments, the alkali-depleted surface layer may be substantially alkali-free or alkali free. For example, the alkali-depleted surface layer can comprise about 0.5 atomic% alkali or less. The alkali-depleted surface layer may be described as a borosilicate (i.e., atomic% silicon > atomic% boron) surface layer or a boroaluminosilicate surface layer (i.e., atomic% silicon > [atomic% boron + atomic% aluminum]). The alkali-depleted surface layer exhibits a composition and atomic structure that differs from the bulk, while exhibiting homogeneity in terms of composition and/or atomic structure within and throughout the surface layer. The alkali-depleted surface layer is integral to the glass substrate and is not a coating or an addition to the bulk. [0049] In embodiments, the glass substrate may have a substrate thickness t in a range of from about 0.1 mm to about 3.0 mm, from about 0.3 mm to about 3 mm, from about 0.4 mm to about 3 mm, from about 0.5 mm to about 3 mm, from about 0.55 mm to about 3 mm, from about 0.7 mm to about 3 mm, from about 1 mm to about 3 mm, from about 0.1 mm to about 2 mm, from about 0.1 mm to about 1.5 mm, from about 0.1 mm to about 1 mm, from about 0.1 mm to about 0.7 mm, from about 0.1 mm to about 0.55 mm, from about 0.1 mm to about 0.5 mm, from about 0.1 mm to about 0.4 mm, from about 0.3 mm to about 0.7 mm, or from about 0.3 mm to about 0.55 mm, and also comprising all sub-ranges and sub-values between these range endpoints. [0050] In embodiments, the alkali-depleted surface layer may have a layer thickness in a range of from about 10 nm to about 3000 nm, from about 10 nm to about 2000 nm, from about 10 nm to about 1000 nm, from about 10 nm to about 900 nm, from about 10 nm to about 800
nm, from about 10 nm to about 700 nm, from about 10 nm to about 600 nm, from about 10 nm to about 500 nm, from about 50 nm to about 1000 nm, from about 100 nm to about 1000 nm, from about 200 nm to about 1000 nm, from about 250 nm to about 1000 nm, from about 300 nm to about 1000 nm, from about 400 nm to about 1000 nm, from about 500 nm to about 1000 nm, from about 500 nm to about 1500 nm, from about 500 nm to about 2000, from about 500 nm to about 2500 nm, or from about 500 nm to about 3000 nm. [0051] In embodiments, the alkali-depleted surface layer has a substantially homogenous composition. In embodiments, the composition of the alkali-depleted surface layer is substantially the same along the layer thickness of the surface layer. In embodiments, the composition of the alkali-depleted surface layer is substantially the same along its entire volume. As used herein, the phrase “homogenous composition” refers to a composition that is not phase separated and/or does not include portions with a composition differing from other portions. [0052] In embodiments, the alkali-depleted surface layer may be substantially free of crystallites and/or is substantially amorphous. For example, the alkali-depleted surface layer can include less than about 1 volume% crystallites. [0053] In embodiments, the alkali-depleted surface layer is substantially free of hydrogen. Such hydrogen may be present in the form of H+, H3O+, H2O or combinations thereof. In embodiments, the alkali-depleted surface layer includes about 0.1 atomic% hydrogen or less (e.g., about 0.08 atomic% hydrogen or less, about 0.06 atomic% hydrogen or less, about 0.05 atomic% hydrogen or less, about 0.04 atomic% hydrogen or less, about 0.02 atomic% hydrogen or less, or about 0.01 atomic% hydrogen or less). In contrast, glass substrates that are treated by leaching or other wet chemical treatments typically have surface layers that include hydrogen. [0054] In alternative embodiments, the alkali-depleted surface layer may have hydrogen injected into its composition under certain thermal poling conditions. For example, under conditions in which thermal poling occurs in air, the alkali-depleted surface layer may include hydrogen in amount greater than that indicated in the paragraph immediately above. [0055] In embodiments, the alkali-containing bulk and the alkali-depleted surface layer comprise B2O3 and SiO2. The alkali-containing bulk and the alkali-depleted surface layer each have an atomic structure that comprises boron in one or more coordination states.
[0056] In embodiments, the alkali-depleted surface layer includes boron in the 3- coordinated state (interchangeably referred to as trigonal B[3] units or simply B[3]) and boron in the 4-coordinated state (interchangeably referred to as tetrahedral B[4] units or simply B[4]). In embodiments, substantially all the boron in the alkali-depleted surface layer is in the 3- coordinated state. In embodiments, most of the boron in the alkali-depleted surface layer is in the 3-coordinated state. For example, from about 55% to about 100% by fraction (e.g., from about 60% to about 100%, from about 65% to about 100%, from about 70% to about 100%, from about 75% to about 100%, from about 75% to about 95%, from about 80% to about 100%, and comprising all sub-ranges and sub-values between these range endpoints) of a total amount of boron in the alkali-depleted surface layer is in in the 3-coordinated state. Conversely, less than about 45% by fraction (e.g., less than about 40%, less than about 35%, less than about 30%, less than about 25%, less than about 20%, less than about 15%, less than about 10%, less than about 5%, or less than about 2.5%) of a total amount of boron in the alkali-depleted surface layer is in in the 4-coordinated state. [0057] In embodiments, the alkali-containing bulk includes boron in the 3-coordinated state and boron in the 4-coordinated state. In embodiments, a majority (i.e., an amount greater than half of the total) of the boron in the alkali-containing bulk is in the 4-coordinated state. For example, from about 51% to about 100% by fraction (e.g., from about 55% to about 100%, from about 60% to about 100%, from about 65% to about 100%, from about 70% to about 100%, from about 70% to about 95%, from about 80% to about 100%, and comprising all sub- ranges and sub-values between these range endpoints) of a total amount of boron in the alkali- containing bulk is in in the 4-coordinated state. [0058] In some instances, the alkali-depleted surface layer is substantially free of non- bridging oxygens, while, in some embodiments, the alkali-containing bulk comprises non- bridging oxygens and bridging oxygens. An alkali-depleted surface layer may also be present or formed when the alkali-containing bulk is substantially free of non-bridging oxygens. [0059] In embodiments, the alkali-depleted surface layer comprises B2O3 in a range of from about 1 mol% to about 90 mol%. In embodiments, the amount of B2O3 may be in the range from about 1 mol% to about 80 mol%, from about 1 mol% to about 70 mol%, from about 1 mol% to about 60 mol%, from about 1 mol% to about 50 mol%, from about 5 mol% to about 90 mol%, from about 10 mol% to about 90 mol%, from about 20 mol% to about 90 mol%, from about 30 mol% to about 90 mol%, from about 1 mol% to about 55 mol%, 5 mol% to about 45 mol%, or from about 3 mol% to about 35 mol%.
[0060] In exemplary embodiments, the alkali-depleted surface layer comprises a binary B2O3-SiO2 composition, though other non-alkali components may be included. [0061] The glass substrate, prior to thermal poling treatment, as will be described herein, and the alkali-containing bulk may include a variety of glass compositions. Such glass compositions used in the glass substrate prior to thermal poling treatment and present in the alkali-containing bulk after thermal poling treatment may be referred to herein as a “precursor” glass or glass composition. The precursor compositions may range from simple alkali or alkaline-earth silicates, borosilicates, or boroaluminosilicates, to more complex multicomponent glasses able to form an altered surface layer by the process of thermal poling. In one embodiment, the alkali-containing bulk may show signs of nanoscale phase-separation but, when these glasses were subjected to thermal poling, the layers included a single-phase. [0062] In embodiments, the precursor glass composition is configured to form a homogeneous glass (i.e., not phase-separated, not devitrified). [0063] In embodiments, the precursor glass composition comprises some alkali. For example, the precursor glass composition comprises greater than or equal to 1 mol% alkali- metal oxide selected from Li2O, Na2O, K2O, Rb2O, and Cs2O. In an exemplary embodiment, the precursor glass composition comprises greater than or equal to 1 mol% Na2O. For example, the precursor glass composition can comprise greater than or equal to 1, 1.5, 2, 3, 4, 5, 6, 7, 8, 9, or 10 mol% Na2O. [0064] In embodiments, the precursor glass composition comprises some boron. For example, the precursor glass composition comprises greater than or equal to 1 mol% B2O3. In embodiments, the precursor glass composition can comprise greater than or equal to 1, 1.5, 2, 3, 4, 5, 6, 7, 8, 9, 10, 15, or 20 mol% B2O3. [0065] In embodiments, the precursor glass composition is a simple sodium borosilicate that comprises Na2O, B2O3, and SiO2. In one example, the precursor glass composition comprises from about 8.5 mol% to about 43 mol% Na2O, from about 9 mol% to about 87 mol% B2O3, and from about 9.5 mol% to about 88 mol% SiO2. In another example, the precursor glass composition comprises from about 9.5 mol% to about 39 mol% Na2O, from about 10 mol% to about 79.5 mol% B2O3, and from about 10.5 mol% to about 80 mol% SiO2. [0066] In embodiments, there is a relationship between the amounts of silicon and boron that follows: atomic% silicon > atomic% boron. For example, the precursor glass composition comprises from about 8.7 mol% to about 21.5 mol% Na2O, from about 9 mol% to about 33
mol% B2O3, and from about 54 mol% to about 88 mol% SiO2. In another example, the precursor glass composition comprises from about 9.5 mol% to about 19.5 mol% Na2O, from about 10 mol% to about 30 mol% B2O3, and from about 60 mol% to about 80 mol% SiO2. [0067] In embodiments, the precursor glass composition is an alkali-containing borosilicate, an alkali-containing boroaluminosilicate, or a combination thereof. In such embodiments, there is a relation in which the amount of silicon is greater than the amount of amount of boron alone, the amount of aluminum alone, or the combined amounts of boron and aluminum (e.g., atomic% silicon > [atomic% aluminum + atomic% boron]). In embodiments, the amount of alkali may be limited such that there is no invert glass with more alkali than network-former. In such embodiments, there is a relationship among the amounts of alkali, aluminum, boron, and silicon that follows: atomic% alkali < (atomic% silicon + atomic% aluminum + atomic% boron). [0068] In an exemplary embodiment, the precursor glass composition comprises from about 46 mol% to about 80 mol% SiO2, from about 0 mol% to about 17 mol% Na2O, from about 8 mol% to about 25 mol% Al2O3, from about 2 mol% to about 15 mol% B2O3, from about 0 mol% to about 8 mol% MgO, from about 0 mol% to about 5 mol% K2O, from about 0 mol% to about 11 mol% CaO, and from about 0.05 mol% to about 0.5 mol% SnO2. [0069] In another exemplary embodiments, the precursor glass composition comprises from about 57 mol% to about 67 mol% SiO2, from about 1 mol% to about 14 mol% Na2O, from about 11 mol% to about 21 mol% Al2O3, from about 3 mol% to about 10 mol% B2O3, from about 0 mol% to about 5 mol% MgO, from about 0 mol% to about 3 mol% K2O, from about 0 mol% to about 8 mol% CaO, and from about 0.05 mol% to about 0.25 mol% SnO2. [0070] In embodiments, the precursor glass composition may be substantially free of aluminum. For example, the precursor glass composition and/or the glass substrate after thermal poling treatment may include less than about 1 mol%, or less than about 0.1 mol% Al2O3 or aluminum in any state. [0071] In embodiments, the alkali-containing bulk may include an amount of Na2O that is about equal to the amount of B2O3 present in the bulk. [0072] Fining agents may be included in the precursor glass compositions described herein such as SnO2 and other known fining agents.
[0073] In embodiments, the glass substrate after thermal poling treatment exhibits a refractive index in the range from about 1.45 to about 1.55, with the alkali-depleted surface layer exhibiting a lower refractive index than the alkali-containing bulk. [0074] In embodiments, the glass substrate may exhibit an average strain-to-failure at a surface on one or more opposing major surface that is 0.5% or greater, 0.6% or greater, 0.7% or greater, 0.8% or greater, 0.9% or greater, 1% or greater, 1.1% or greater, 1.2% or greater, 1.3% or greater, 1.4% or greater 1.5% or greater or even 2% or greater, as measured using ball- on-ring testing using at least 5, at least 10, at least 15, or at least 20 samples. In embodiments, the glass substrate may exhibit an average strain-to-failure at its surface on one or more opposing major surface of about 1.2%, about 1.4%, about 1.6%, about 1.8%, about 2.2%, about 2.4%, about 2.6%, about 2.8%, or about 3% or greater. [0075] After thermal poling treatment, the glass substrates described herein may exhibit an elastic modulus (or Young’s modulus) in a range of from about 30 GPa to about 120 GPa. For example, the elastic modulus of the glass substrate may be in a range of from about 30 GPa to about 110 GPa, from about 30 GPa to about 100 GPa, from about 30 GPa to about 90 GPa, from about 30 GPa to about 80 GPa, from about 30 GPa to about 70 GPa, from about 40 GPa to about 120 GPa, from about 50 GPa to about 120 GPa, from about 60 GPa to about 120 GPa, or from about 70 GPa to about 120 GPa, and all ranges and sub-ranges therebetween. [0076] In embodiments, the glass substrate may be strengthened or non-strengthened. For example, thermal poling may be performed on strengthened glass substrates such that the alkali-depleted surface layer is formed on top of a compressive stress layer in the strengthened glass substrate. [0077] The glass substrate may be substantially planar or sheet-like, although other embodiments may utilize a curved or otherwise shaped or sculpted substrate. The glass substrate may be substantially optically clear, transparent, and free from light scattering. In such embodiments, the glass substrate may exhibit an average total transmittance over the optical wavelength regime of about 85% or greater, about 86% or greater, about 87% or greater, about 88% or greater, about 89% or greater, about 90% or greater, about 91% or greater or about 92% or greater. [0078] Additionally, or alternatively, the physical thickness of the glass substrate may vary along one or more of its dimensions for aesthetic and/or functional reasons. For example, the edges of the glass substrate may be thicker as compared to more central regions of the glass
substrate. The length, width, and physical thickness dimensions of the glass substrate may also vary according to the application or use. [0079] The glass substrate may be provided using various forming methods, which can include float glass processes and down-draw processes such as fusion draw and slot draw. [0080] The resulting glass substrates including the alkali-containing bulk and alkali- depleted surface layer described herein exhibit improved corrosion resistance, improved diffusion barrier properties, higher hardness and/or elastic-modulus values, greater fatigue resistance, and/or improved damage resistance (via so-called anomalous deformation). [0081] The glass network has a near-maximal degree of connectivity, which favors high hardness and/or modulus. The absence of mobile alkali or other network-modifiers means there are very limited pathways for ionic hopping conduction, translating to inhibited diffusion (aka diffusion barrier) properties. Likewise, the absence of mobile alkali or other network-modifiers will increase resistance to corrosion in chemistries that operate primarily by an ion-exchange mechanism (e.g., H+/H3O+ ļ Na+), a prime example being acidic chemistries. Even in chemistries that do not operate primarily by an ion-exchange mechanism, the absence of non- bridging oxygen and high network connectivity is expected to lead to reduced network dissolution, for example in neutral of alkaline-pH chemistries (consider silica dissolution rates versus other multicomponent glasses in basic-pH). To those knowledgeable in the art, fatigue resistance and crack initiation are substantially worse in alkali-containing glasses as compared to materials like silica, and thus the alkali-depleted surface layer thus would be expected to show a lower fatigue parameter and high crack initiation threshold. Lastly, the indentation behavior has been structurally linked in glasses to well-connected networks that have a substantial amount of free volume. As the layers described in this disclosure are formed well below Tg, they are expected to be far from the melt-equilibrium structure one might otherwise obtain by melting, and thus likely contain substantial free volume, translating to expectation of anomalous deformation behavior and so-called native damage resistance. [0082] In embodiments, the alkali-depleted surface layer comprises a layer refractive index that is less than a bulk refractive index of the alkali-containing bulk. For example, the alkali- depleted surface layer may have a refractive index that is in the range from about 1.45 to about 1.55 at a wavelength of about 550 nm. This result is of generally sufficient index contrast and thickness to produce a visible anti-reflection effect in the thermally poled glasses. Moreover, in the case of borosilicate glasses, the boron structural units are modified from tetrahedral B[4]
units to trigonal B[3] units in the alkali-depleted surface layer. Trigonal B[3] units may correspond to lower glass density compared to their B[4] counterparts. This in turn, may further increase the refractive index contrast between poled and bulk material for borosilicates compared to aluminosilicate glasses. [0083] In embodiments, the glass substrate having an alkali-containing bulk and an alkali- depleted surface layer may exhibit increased elastic modulus as compared to the alkali- containing bulk (or the glass substrate before the alkali-depleted surface layer is formed). For example, the glass substrate may have an elastic modulus that is about 10% greater than the elastic modulus of the alkali-containing bulk (or the glass substrate before the alkali-depleted surface layer is formed). For example, where the alkali-containing bulk (or the glass substrate before the alkali-depleted surface layer is formed) exhibits an elastic modulus of about 80 GPa, the glass substrate exhibits an elastic modulus of about 90 GPa. [0084] In embodiments, the hardness of the glass substrates described herein is also greater than the hardness of the alkali-containing bulk. For example, the hardness of the glass substrate may be about 10% or even 20% greater than the hardness of the alkali-containing bulk (or the glass substrate before the alkali-depleted surface layer is formed). In one example, the hardness of the alkali-containing bulk (or the glass substrate before the alkali-depleted surface layer is formed) may be about 6 GPa, while the glass substrate exhibits a hardness of about 7 GPa, at indentation depths from about 0 nm to about 200 nm. Unless otherwise specified, the hardness values described herein refer to Vickers hardness. [0085] In embodiments, the alkali-depleted surface layers also block ion diffusion either into the glass substrate or from the alkali-containing bulk to the alkali-depleted surface layer . [0086] The glass substrates described herein may exhibit an increased chemical durability in terms of resistance to dissolution in acid, water, or base. In some examples, the glass substrate exhibits a decrease in dissolution rates in acid, water, or base of about 1.5 times or more or even about 10 times or more. [0087] A second aspect of this disclosure pertains to a method of forming a glass substrate with a modified surface layer. The method includes providing a glass substrate comprising a concentration of alkali and a surface layer and reducing the concentration of alkali in the surface layer. In embodiments, the resulting surface layer with reduced concentration of alkali comprises a substantially homogenous composition.
[0088] In embodiments, reducing the concentration of alkali in the surface layer includes contacting a surface of the glass substrate with an electrode and subjecting the glass substrate to thermal poling. [0089] Prior to thermal poling treatment, the surface of the glass substrate (and thus the surface layer) may be cleaned or treated to remove typical contamination that may accumulate after forming, storage and shipping. Alternatively, the glass substrate may be subjected to treatment immediately after forming to eliminate the accumulation of contamination. [0090] The electrode used in thermal poling may include an anode in contact with an anodic surface of the glass substrate and a cathode in contact with a cathodic surface of the glass substrate. The anodic surface is subjected to positive direct current (DC) bias while the cathodic surface is subject to negative DC bias. [0091] In embodiments, the electrode material is substantially more conductive than the glass at the poling temperature to provide for field uniformity over the modified surface area. It is also desirable that the anodic electrode material be relatively oxidation resistant to minimize the formation of an interfacial oxide compound that could cause sticking of the glass to the template. Exemplary anodic electrode materials include noble metals (e.g., Au, Pt, Pd, etc.) or oxidation-resistant, conductive films (e.g., TiN and TiAlN). [0092] The cathodic electrode material may also be conductive to likewise provide for field uniformity over the modified area. Exemplary materials for the cathodic electrode material include materials that can accept alkali ions from the glass, such as graphite. In embodiments, a physical cathodic electrode may not always be necessary to be brought into contact, due to surface discharge. [0093] In embodiments, the electrode(s) are separate components that are brought into contact with the glass, and thus can be separated after processing without complex removal steps. Electrodes can generally comprise a bulk material, or take the form of a thin film, for example, a conductive thin film or coating that is deposited on the glass to serve as an electrode. [0094] In embodiments, the electrode can generally cover all or only part of the surface and may be intermittent or patterned as desired. Patterning can be achieved by any of a variety of methods, such as lithographic techniques, mechanical machining, or otherwise. [0095] The curvature and/or flatness of the glass and the electrode should be ideally matched to provide for reasonably intimate contact at the interface over the affected area. However, even if initial contact is not intimate, the electrostatic charge at the interface when
voltage is applied will tend to pull the two surfaces into intimate contact as an inherent part of the method. [0096] Thermal poling may include applying voltage to the glass substrate such that the anode is positively-biased relative to the glass substrate to induce alkali depletion at the anodic surface of the glass. The voltage may be DC voltage or DC-biased AC voltage. Prior to applying the voltage, the method may include heating the glass substrate and electrode (i.e., the stack including an anode/glass/cathode) to a temperature below Tg prior to applying voltage to the glass substrate. In embodiments, the glass substrate and electrode may be heated to a process temperature in the range from about 25 °C to about Tg, or from about 100 °C to about 300 °C. In embodiments, equilibrium at the desired process temperature may be useful in thermal poling to ensure temperature uniformity. [0097] In embodiments, the thermal poling treatment includes applying voltage in the range from about 100 volts to about 10,000 volts (e.g., from about 100 volts to about 1000 volts) to the glass substrate for a duration in the range from about 1 minute to about 6 hours (e.g., from about 5 minutes to about 60 minutes or from about 15 minutes to about 30 minutes). It should be appreciated that thermal poling treatment times and voltages may vary depending on glass composition. In embodiments, the glass substrate is subjected to thermal poling under vacuum in an inert gas environment (e.g., dry N2) or a permeable gas environment (e.g., He). [0098] The voltage may be applied in either one or more discrete steps to achieve a maximum desired value, or ramped (or increased) in a controlled/current-limited manner up to the process voltage. Various approaches have the advantage of potentially circumventing thermal dielectric breakdown with the passage of too much current through the glass, especially with low-resistivity glasses, allowing for higher final poling voltages and possibly thicker surface layers. Alternatively, as breakdown strength varies with glass composition, surface condition, and ambient temperature, an “instant-on” strategy for applying voltage may also be tolerated under some conditions and could be desired for convenience. [0099] After thermal poling treatment, the glass substrate may be cooled to a temperature in the range from about 25 °C to about 80 °C for subsequent handling. The voltage may be removed prior to cooling or after cooling. [0100] In embodiments, an apparatus suitable for performing poling treatments can include any system that can simultaneously maintain heat and voltage to the glass/electrode stack in a controlled manner while avoiding practical problems such as leakage current paths or arcing.
In embodiments, the apparatus also provides control of the process atmosphere (e.g., under vacuum, in an inert gas environment such as dry N2, or permeable gas environment), which can minimize atmosphere effects and/or occluded gas at the interface. An example apparatus suitable for performing thermal poling treatments is disclosed in U.S. Provisional Patent Application Serial No. 63/193,334, filed on March 21, 2022, the disclosure of which is incorporated herein by reference in its entirety. [0101] EXAMPLES [0102] Various embodiments of the present disclosure can be better understood by reference to the following Example which is offered by way of illustration. The present disclosure is not limited to the Example given herein. [0103] EXAMPLE 1 [0104] A series of sodium borosilicate glasses were melted, and the compositions verified by inductively coupled plasma optical emission spectrometry (ICP-OES). Bulk composition results are given in Table 1. Table 1 includes the results as measured by ICP-OES (left) and the mapping target values (right) used in the ternary diagrams of FIG.2A and FIG.2B. [0105] Table 1: Bulk composition information for Examples 1-10.
[0106] A ternary diagram summarizing the precursor glass compositions and the corresponding experimental strategy is shown in FIG. 2A. Model glasses in the Na2O-B2O3- SiO 2 system represent “precursor” or bulk glass compositions, upon which depleted surface
layers were synthesized by thermal poling on the positively-biased surface of the glass. After thermal poling, the corresponding compositional effect is to create an alkali-depleted surface layer, wherein the modifier species is driven out of the surface layer. The network-former-only compositions that were generated in the alkali-depleted surface layer are projected onto the B2O3-SiO2 binary edge of the diagram, as shown in FIG.2B. Unless specified herein, the bulk glass or the alkali-containing bulk glass has the same composition, structure and features as the precursor glass before being subjected to thermal poling. [0107] Use of simple ternary compositions as shown in Table 1 allows for more definitive determination of structure, while still maintaining relevance with commercial and other useful compositions. In addition, the compositions were also selected to provide examples where alkali-depleted surface layers are synthesized with final compositions overlapping one another but formed from precursor glasses of different initial compositions and structure from one another (i.e., to demonstrate that alkali-depleted surface layers having the same compositions can be formed from various precursor glasses). In this way, the role of precursor glass composition could also be probed, with varied concentrations and types of alkali-charge- balanced species in the structure. [0108] Glass sheets were formed from the precursor glass compositions shown in Table 1 and polished into planar coupons having dimensions from about 25 to 50 mm square. The coupons have a thickness of about 1.0 mm. [0109] For thermal poling, a bulk high-purity platinum (Pt) monolith was obtained and polished to an optical finish. This element was placed in contact with the surface of each glass sheet for use as the positively-biased electrode. On the cathode side of each glass sheet, a section of graphite foil (e.g., graphite foil supplied by Graftech International, under the trademark Grafoil®) was used. The electrode sizes were controlled such that they did not cover the entire surface of the glass on either side, to reduce or eliminate leakage currents. [0110] After loosely stacking the electrodes and glass sheet, each such stack was introduced into a vacuum furnace and a dry nitrogen atmosphere was created and heated to a temperature between about 200 °C and 300 °C. After equilibrating at a temperature in this range for about 15 minutes, a voltage of about +300V was applied to the platinum electrode, with current limited to 1 mA maximum. An initial increase in current was observed, followed by a slow decay as the alkali-depleted surface layer formed. The voltage was applied for a period of about 15 minutes, after which the heater was shut off and the stack of electrodes and
glass sheet was allowed to cool under voltage. When the temperature of the stack was less than about 100 °C, the voltage was removed, the chamber was vented, and the stack was manually separated. [0111] The glass sheet after thermal poling was compared to the same glass sheet that was unpoled or did not undergo thermal poling for various forms of analysis. [0112] The presence, depth, and composition of the alkali-depleted surface layers and portions of the bulk were evaluated using secondary-ion-mass-spectrometry (SIMS). The results of these analyses for Examples 4-8 of Table 1 are summarized in FIGS. 3-7, respectively. In FIGS. 3-7, the SIMS elemental depth profiles are presented as concentrations of the elements noted in the corresponding legends on the positively biased surface as a function of depth (nm). [0113] FIGS. 3-7 show the creation and presence of alkali-depleted surface layers having a thickness in a range of from about 100 nm to about 500 nm in a wide variety of glass compositions. [0114] X-ray photoelectron spectroscopy (XPS) analyses were performed to evaluate and quantify the composition of the alkali-depleted surface layer to corroborate the SIMS findings. The results are given in Table 2 and are reported as the average of three measurement points per sample. [0115] Table 2. XPS data for the surface composition of the positively-biased surface of select Examples.
[0116] Near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy were pursued at a synchrotron facility to probe the structure of the sodium borosilicate poled surface layers of select Examples and understand whether the structures were uniquely differentiated from
the precursor glass. Data were acquired in partial-electron-yield (TEY) mode to ensure results were representative of the poled layer structure (i.e., surface-sensitive mode, top 2-5nm), and were performed primarily at the B K-edge. For detailed procedure, refer to “Boron coordination structure at the surfaces of sodium borosilicate and aluminoborosilicate glasses by B K-edge NEXAFS,” Journal of Non-Crystalline Solids Vol.545, 1 October 2020, 120247. The primary metric for glass structure extracted from this analysis is the fraction of 4-fold-coordinated boron relative to total boron. This parameter is referred to as N4 = %B[4] / (%B[3]+%B[4]) [0117] FIG. 8 summarizes the results from the B K-edge NEXAFS analysis, comparing poled anode-side surfaces versus air-fracture surfaces (representing bulk glass structure) for Examples 4-7 after thermal poling. The results indicate that boron shifts to being primarily 3- coordinated in the poled layers (N4 § 0), compared to a much higher N4 fraction in the parent glass (usually a mix of B[3] and B[4], i.e., N4 > 0). Without being bound by theory, this change understood from expectations of a B2O3-SiO2 glass composition in the layer that is depleted of Na, and thus there is no alkali available to charge-compensate B in a 4-fold coordinated state. This interpretation assumes—and in fact supports—that the depletion-layer structure resynthesizes in situ well below the Tg range of the parent glass to form a unique layer structure and satisfy the bonding requirements of the remaining network-formers in the depletion layer, as discussed in Smith et al, Journal of the American Ceramic Society, 2019. 102(6): p. 3037- 3062. [0118] Molecular simulations were performed on a series of alkali and alkaline-earth borosilicate glasses to compare their structures before and after poling. The compositions studied are shown in Table 3 and include Na, K, Mg and Ca- borosilicates. In all the compositions simulated, B2O3/SiO2 ratio of mole fractions were kept constant (i.e., approximately 0.51). In Table 3, M = Na, K, Mg, or Ca, as illustrated in FIG.9 and FIG.10 [0119] Table 3. Precursor Compositions for Molecular Simulations
[0120] FIG.9 illustrates fraction of boron 3-coorindated (black) and 4-coordinated (red) in the series of alkali and alkaline-earth borosilicate compositions shown in Table 3. As shown in FIG. 9, after thermal poling, there is an observable change in coordination number of boron from a 4-coordinated to 3-coordinated state. FIG. 9 also shows the ratio of B[4] to B[3] conversion increases with network modifiers content because the fraction of B[4] increases with concentration. [0121] Referring to FIG. 10, molecular dynamics simulations show that the change in coordination states also leads to altered Young’s modulus. FIG. 10 depicts Young’s modulus of sodium borosilicates varying in composition as-melted ternary, as-melted binary, and binary obtained through thermal poling. As shown, the Young’s modulus of the alkali-depleted surface layer is generally lower than the bulk. [0122] The results of the molecular simulations help to further establish/verify the broad applicability of thermal poling to create articles with altered layers when starting with parent glasses that have a wide of range of different modifier species, such as those disclosed herein. [0123] While the disclosure has been illustrated and described in detail in the drawings and foregoing description, the same should be considered as illustrative and not restrictive in character. It is understood that only the preferred embodiments have been presented and that all changes, modifications, and further applications that come within the spirit of the disclosure are desired to be protected.
Claims
CLAIMS What is claimed is: 1. A glass substrate, comprising: an alkali-containing bulk; and an alkali-depleted surface layer, wherein the alkali-depleted surface layer is amorphous and comprises a substantially homogenous composition, and wherein the alkali-containing bulk and the alkali-depleted surface layer comprise B2O3 and SiO2. 2. The glass substrate of claim 1, wherein the alkali-depleted surface layer comprises about 0.5 atomic% alkali or less. 3. The glass substrate of claim 1 or claim 2, wherein the alkali-depleted surface layer comprises an atomic structure comprising boron substantially in a 3-coordinated state. 4. The glass substrate of claim 3, wherein greater than about 60% by fraction of a total amount of boron in the alkali-depleted surface layer is in a 3-coordinated state. 5. The glass substrate of claim 3, wherein greater than about 70% by fraction of a total amount of boron in the alkali-depleted surface layer is in a 3-coordinated state. 6. The glass substrate of claim 3, wherein greater than about 75% by fraction of a total amount of boron in the alkali-depleted surface layer is in a 3-coordinated state. 7. The glass substrate of any one of claims 1-6, wherein the alkali-containing bulk comprises an atomic structure comprising boron in a 3-coordinated state and boron in a 4- coordinated state. 8. The glass substrate of claim 7, wherein greater than about 51% by fraction of a total amount of boron in the alkali-containing bulk is in a 4-coordinated state.
9. The glass substrate of any one of claims 1-8, wherein the alkali-depleted surface layer is substantially free of non-bridging oxygens. 10. The glass substrate of claim 9, wherein the alkali-containing bulk comprises non- bridging oxygens and bridging oxygens. 11. The glass substrate of claim 10, wherein the alkali-containing bulk is substantially free of non-bridging oxygens. 12. The glass substrate of any one of claims 1-11, wherein the alkali-containing bulk comprises an alkali-metal oxide selected from Li2O, Na2O, K2O, Rb2O and Cs2O. 13. The glass substrate of claim 12, wherein the alkali-containing bulk comprises at least 1 mol% Na2O, K2O, or Li2O. 14. The glass substrate of claim 12, wherein the alkali-containing bulk comprises at least 1mol% Na2O. 15. The glass substrate of any one of claims 1-14, wherein the alkali-depleted surface layer comprises B2O3 in the range from about 10 mol% to about 90 mol%. 16. The glass substrate of any one of claims 1-15, wherein the alkali-depleted surface layer comprises a binary B2O3-SiO2 composition. 17. The glass substrate of any one of claims 1-16, wherein atomic% silicon is greater than atomic% boron.
18. A glass substrate, comprising: a substrate thickness; an alkali-containing bulk having a bulk refractive index; and an alkali-depleted surface layer comprising a layer thickness in a range of from about 10 nm to about 3000 nm, wherein the alkali-depleted surface layer comprises a layer refractive index that is less than the bulk refractive index, wherein the alkali-containing bulk and the alkali-depleted surface layer comprise B2O3 and SiO2. 19. The glass substrate of claim 18, wherein atomic% silicon is greater than atomic% boron. 20. A method of forming a glass substrate with a modified surface layer, comprising: providing a glass substrate comprising a concentration of alkali, a glass transition temperature (Tg) and a surface layer, the glass substrate comprising B2O3 and SiO2; and reducing the concentration of alkali in the surface layer, wherein the surface layer with reduced concentration of alkali comprises a substantially homogenous composition. 21. The method of claim 20, wherein atomic% silicon is greater than atomic% boron. The method of claim 20 or claim 21, wherein reducing the concentration of alkali in the surface layer comprising contacting a surface of the glass substrate with an electrode; and subjecting the glass substrate to thermal poling. 23. The method of claim 22, wherein the electrode comprises an anode in contact with an anodic surface of the glass substrate and a cathode in contact with the cathodic surface of the glass substrate, and wherein thermal poling comprises applying voltage to the glass substrate such that the anode is positively biased relative to the glass substrate to induce alkali depletion at the anodic surface of the glass. 24. The method of claim 22, wherein thermal poling comprises heating the glass substrate and electrode to a temperature below Tg prior to applying voltage to the glass substrate.
25. The method of claim 22, wherein thermal poling comprises applying voltage in the range from about 100 volts to about 10,000 volts to the glass substrate for a duration in the range from about 1 minute to about 6 hours. 26. The method of claim 22, wherein the glass substrate is subjected to thermal poling under vacuum, in an inert gas environment, or a permeable gas environment.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US202263428767P | 2022-11-30 | 2022-11-30 | |
US63/428,767 | 2022-11-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2024118372A1 true WO2024118372A1 (en) | 2024-06-06 |
Family
ID=91324782
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2023/080485 WO2024118372A1 (en) | 2022-11-30 | 2023-11-20 | Borosilicate glass with modified surface layer |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2024118372A1 (en) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20190177206A1 (en) * | 2017-12-13 | 2019-06-13 | Corning Incorporated | Polychromatic articles and methods of making the same |
US20190358934A1 (en) * | 2013-04-10 | 2019-11-28 | Schott Glass Technologies (Suzhou) Co. Ltd. | Flexible Glass/Metal Foil Composite Articles and Production Process Thereof |
WO2020167400A1 (en) * | 2019-02-12 | 2020-08-20 | Corning Incorporated | Polychromatic glass & glass-ceramic articles and methods of making the same |
US20210221730A1 (en) * | 2013-08-15 | 2021-07-22 | Corning Incorporated | Aluminoborosilicate glass substantially free of alkali oxides |
US20220009823A1 (en) * | 2018-11-16 | 2022-01-13 | Corning Incorporated | Glass ceramic devices and methods with tunable infrared transmittance |
WO2022098618A1 (en) * | 2020-11-06 | 2022-05-12 | Corning Incorporated | Substrates with improved electrostatic performance |
-
2023
- 2023-11-20 WO PCT/US2023/080485 patent/WO2024118372A1/en unknown
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20190358934A1 (en) * | 2013-04-10 | 2019-11-28 | Schott Glass Technologies (Suzhou) Co. Ltd. | Flexible Glass/Metal Foil Composite Articles and Production Process Thereof |
US20210221730A1 (en) * | 2013-08-15 | 2021-07-22 | Corning Incorporated | Aluminoborosilicate glass substantially free of alkali oxides |
US20190177206A1 (en) * | 2017-12-13 | 2019-06-13 | Corning Incorporated | Polychromatic articles and methods of making the same |
US20220009823A1 (en) * | 2018-11-16 | 2022-01-13 | Corning Incorporated | Glass ceramic devices and methods with tunable infrared transmittance |
WO2020167400A1 (en) * | 2019-02-12 | 2020-08-20 | Corning Incorporated | Polychromatic glass & glass-ceramic articles and methods of making the same |
WO2022098618A1 (en) * | 2020-11-06 | 2022-05-12 | Corning Incorporated | Substrates with improved electrostatic performance |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10472271B2 (en) | Glass with modified surface layer | |
JP6589034B2 (en) | Glass with improved total pitch stability | |
US20150093581A1 (en) | Toughened glass substrate and manufacturing process therefor | |
KR20220140021A (en) | Dimensionally stable fast etching glasses | |
JP2018513828A (en) | Chemically temperable glass plate | |
CA2739098A1 (en) | Intermediate thermal expansion coefficient glass | |
TW200804219A (en) | Float glass for display substrate and process for producing the same | |
EP0854117A1 (en) | Soda-lime-silica glass compositions and uses thereof | |
WO2005012198A1 (en) | Alkali-free glass | |
JP2001151534A (en) | Glass substrate for liquid crystal display | |
EP0939060A1 (en) | Substrate glass for displays | |
WO2008062847A1 (en) | Glass for information recording medium substrate | |
KR0141907B1 (en) | Lcd panel production | |
JPH08290938A (en) | Glass for substrate | |
JPH1059741A (en) | Non-alkali glass and its production | |
US20040138044A1 (en) | Glass composition for poling and glass functional product containing the same | |
JP2000159541A (en) | Non-alkali glass and its production | |
US20210395137A1 (en) | Glass and glass ceramic composite and method | |
JP2005089286A (en) | Glass base plate for flat panel display device | |
JP2018518443A (en) | Glass plate that can have controlled warpage due to chemical strengthening | |
JP2001226138A (en) | Glass substrate for flat panel display device | |
JPH08290939A (en) | Glass for substrate | |
WO2024118372A1 (en) | Borosilicate glass with modified surface layer | |
US20210395142A1 (en) | Tough glass composite and method | |
JP3867817B2 (en) | Substrate glass |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 23898575 Country of ref document: EP Kind code of ref document: A1 |