WO2024088015A1 - 扫描成像设备和扫描成像方法 - Google Patents

扫描成像设备和扫描成像方法 Download PDF

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Publication number
WO2024088015A1
WO2024088015A1 PCT/CN2023/122436 CN2023122436W WO2024088015A1 WO 2024088015 A1 WO2024088015 A1 WO 2024088015A1 CN 2023122436 W CN2023122436 W CN 2023122436W WO 2024088015 A1 WO2024088015 A1 WO 2024088015A1
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WO
WIPO (PCT)
Prior art keywords
vertical arm
scanning imaging
imaging device
transmission
slide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2023/122436
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English (en)
French (fr)
Inventor
李洪旗
史俊平
宋全伟
樊旭平
孟辉
高克金
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nuctech Co Ltd
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Nuctech Co Ltd
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Filing date
Publication date
Application filed by Nuctech Co Ltd filed Critical Nuctech Co Ltd
Publication of WO2024088015A1 publication Critical patent/WO2024088015A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter

Definitions

  • the present disclosure relates to the field of radiation measurement, and in particular, to a scanning imaging device and method.
  • X-ray security inspection equipment is widely used in civil aviation, trains, docks and other places. At present, the transportation environment is becoming more and more complex, and the circulation is becoming more and more busy, which requires fast and reliable security inspection equipment. In addition, many security inspection places require security inspection equipment that is fast to operate and as compact as possible.
  • the present disclosure provides a scanning imaging device, comprising:
  • bracket comprising a horizontal arm and a vertical arm
  • horizontal arm and the vertical arm define an inspection channel, and the horizontal arm is located above the inspection channel;
  • the horizontal arm can carry the top backscatter module to swing back and forth at a small angle around the rotation axis of the vertical arm.
  • the vertical arm includes a first vertical arm and a second vertical arm, and the horizontal arm and the second vertical arm can swing back and forth around the first vertical arm at a small angle.
  • the scanning imaging device also includes a transmission module, wherein the transmission module includes a transmission ray source and a transmission detector, the transmission ray source is installed on one side of the first vertical arm, and the transmission detector is installed on the second vertical arm and/or the horizontal arm to receive the ray beam emitted by the transmission ray source.
  • the transmission module includes a transmission ray source and a transmission detector
  • the transmission ray source is installed on one side of the first vertical arm
  • the transmission detector is installed on the second vertical arm and/or the horizontal arm to receive the ray beam emitted by the transmission ray source.
  • the first vertical arm includes a first vertical arm portion and a first vertical arm slide, wherein the first vertical arm slide carries the first vertical arm portion and is capable of moving along the extension direction of the inspection channel, the first vertical arm portion is capable of rotating relative to the first vertical arm slide, and the transmitted ray source is mounted to the first vertical arm portion so as to rotate with the first vertical arm portion relative to the first vertical arm slide.
  • the second vertical arm comprises a second vertical arm portion and a second vertical arm slide, wherein the second vertical arm slide carries the second vertical arm portion and is movable along an extension direction of the inspection channel.
  • the scanning imaging device further comprises a first side backscatter module mounted on the first vertical arm slide, and the transmission ray source and the first side backscatter module are arranged along the extension direction of the inspection channel so that the rays emitted by the transmission ray source do not affect the first side backscatter inspection of the first side backscatter module; and/or
  • the scanning imaging device further comprises a second side backscatter module mounted on the second vertical arm slide, and the transmission detector and the second side backscatter module are arranged along the extension direction of the inspection channel so that the radiation emitted by the transmission radiation source does not affect the second side backscatter inspection of the second side backscatter module;
  • the transmission detector is mounted on the second vertical arm portion.
  • the first vertical arm slide is capable of moving at a first speed along the extension direction of the inspection channel
  • the second vertical arm portion is capable of moving at a second speed along the extension direction of the inspection channel along with the second vertical arm slide, and the first speed and the second speed are configured to have a difference so that the second vertical arm swings at a small angle relative to the first vertical arm.
  • the second vertical arm slide is provided with a protective wall for blocking the transmission beam emitted by the transmission ray source.
  • the radiation beam emitted by the transmission radiation source is a planar radiation beam
  • the planar radiation beam cuts through the inspection channel substantially transversely to the extension direction of the inspection channel.
  • the top backscatter module is installed at a position on the horizontal arm that is not cut by the planar ray beam.
  • the first vertical arm slide includes a first driving device to drive the first vertical arm slide to move at a first speed along the extension direction of the inspection channel
  • the second vertical arm slide includes a second driving device to drive the second vertical arm slide to move at a second speed along the extension direction of the inspection channel.
  • One aspect of the present disclosure provides a scanning imaging method, comprising using the above-mentioned scanning imaging device to perform imaging on an object in the inspection channel so as to inspect the object.
  • FIG. 1 is a schematic cross-sectional view of a scanning imaging device according to an embodiment of the present disclosure.
  • FIG. 2 is a schematic top view of a scanning imaging device according to an embodiment of the present disclosure.
  • FIG. 3 is a schematic cross-sectional view of a scanning imaging device according to an embodiment of the present disclosure.
  • FIG. 4 is a schematic top view of a scanning imaging device according to an embodiment of the present disclosure.
  • FIG. 5 is a schematic side view of a scanning imaging device according to one embodiment of the present disclosure.
  • the relative positional relationship may also change accordingly.
  • an element such as a layer, a film, a region or a substrate substrate is referred to as being “on” or “under” another element, the element may be “directly” located “on” or “under” another element, or there may be an intermediate element.
  • FIG1 is a cross-sectional schematic diagram of a scanning imaging device according to an embodiment of the present disclosure.
  • the scanning imaging device includes a bracket 100, and the bracket 100 includes a horizontal arm 110 and a vertical arm, and the horizontal arm 110 and the vertical arm define an inspection channel, and the horizontal arm 110 is located above the inspection channel.
  • the vertical arm includes a vertical arm on the right side (hereinafter also referred to as the first vertical arm 121) and a vertical arm on the left side (hereinafter also referred to as the second vertical arm 122).
  • the vertical arm may only include the vertical arm on the right side.
  • the scanning imaging device includes a backscatter module, which is mounted on the horizontal arm 110 and can be referred to as a top backscatter module 210.
  • the top backscatter module 210 includes a top backscatter radiation source 210-1 and a top backscatter detector 210-2 located on the same side of the inspected object.
  • the top backscatter detector 210-2 is located between the top backscatter radiation source 210-1 and the inspected object (inspected object).
  • the top backscatter radiation source 210-1 and the top backscatter detector 210-2 are located at the same level on the horizontal arm 110.
  • the horizontal arm 110 can carry the top backscatter module 210 to make a small-angle reciprocating swing around the rotation axis of the vertical arm, and the top backscatter
  • the module 210 can scan the object (the inspected object) in the inspection channel while the horizontal arm 110 makes a small reciprocating swing. According to this embodiment, even if the inspected object is not moving, the swing of the horizontal arm 110 can also perform a local backscatter inspection on the top of the inspected object that is difficult to observe.
  • the vertical arm includes a first vertical arm 121 and a second vertical arm 122, and the horizontal arm 110 and the second vertical arm 122 can swing back and forth around the first vertical arm 121 with a small angle.
  • the small angle can be any angle less than 5 degrees, and can be any angle less than 8 degrees, less than 10 degrees, less than 15 degrees, etc.
  • the small angle is a measure that describes the amplitude of the swing of the horizontal arm 110 around the first vertical arm 121.
  • the swing amplitude can be set according to actual needs, and the associated equipment can be fine-tuned.
  • the scanning imaging device includes a transmission module 300, wherein the transmission module 300 includes a transmission ray source 301 and a transmission detector (not shown), the transmission ray source 301 is installed on one side of the first vertical arm 121, for example, the transmission ray source 301 is fixedly connected to the lower end of the first vertical arm 121, and the transmission detector is installed on the second vertical arm 122 and/or the horizontal arm 110 to receive the ray beam emitted by the transmission ray source 301.
  • the transmission detector is not shown in FIGS. 1-2 .
  • the scanning imaging device includes the top backscatter module 210 and the transmission module 300 as shown above, and the horizontal arm 110 can swing back and forth at a small angle around the central axis of the first vertical arm 121, so that the top backscatter module 210 can perform a small-angle reciprocating swing backscatter inspection on the top of the inspected object, and the transmission module 300 emits transmission rays from the side of the first vertical arm 121 toward the inspected object to perform a transmission inspection.
  • the inspected object can move along the extension direction of the inspection channel, thereby realizing a scanning inspection of the inspected object.
  • This embodiment realizes a transmission inspection of the interior of the inspected object and a backscatter inspection of the top, and in particular, a local backscatter inspection can be realized for a portion of the top that is difficult to inspect.
  • the top backscatter inspection can realize a further inspection of the portion of the top that is difficult to inspect.
  • the first vertical arm 121 includes a first vertical arm portion 121-1 and a first vertical arm slide 121-2.
  • the first vertical arm slide 121-2 is configured to be movable along the extension direction of the inspection channel, and the first vertical arm portion 121-1 can rotate relative to the first vertical arm slide 121-2.
  • the first vertical arm slide 121-2 can have a length extending along the extension direction of the inspection channel.
  • the transmission ray source 301 of the transmission module 300 is mounted to the first vertical arm portion 121-1, so that when the first vertical arm portion 121-1 rotates, the transmission ray source 301 can rotate with the first vertical arm portion 121-1, so that the rays emitted by the ray source toward the inspected object can make a swinging motion, thereby realizing transmission inspection at different angles and obtaining richer information.
  • the scanning imaging device further includes a first side backscatter module 220 mounted on the first vertical arm slide 121 - 2 , and the first side backscatter module 220 includes a first side backscatter module 220 located on the right side of the inspected object.
  • Transmission ray source 301 and first side backscatter module 220 are arranged along the extension direction of the inspection channel, so that the rays emitted by transmission ray source 301 will not affect the first side backscatter inspection of first side backscatter module 220. In one embodiment, for example, as shown in FIGS.
  • first vertical arm slide 121-2 may be a cabin, accommodating first side backscatter module 220.
  • first side backscatter module 220 may be one, two or more, as long as the interference or crosstalk that may occur between each first side backscatter module does not affect the degree of image degradation.
  • two first side backscatter modules 220 are arranged on both sides of first vertical arm portion 121-1. Since first vertical arm slide 121-2 is provided in this embodiment, it has a length extending along the extension direction of the inspection channel, thus allowing a more flexible number of first side backscatter modules. More first side backscatter modules allow inspection to be more rapid and accurate.
  • the second vertical arm 122 includes a second vertical arm portion 122-1 and a second vertical arm slide 122-2, and the second vertical arm slide 122-2 is capable of sliding.
  • the second vertical arm slide 122-2 has a length extending along the extension direction of the inspection channel.
  • the scanning imaging device also includes a second side backscattering module 230, which is installed on the second vertical arm slide 122-2, and the second side backscattering module 230 includes a second side backscattering radiation source 230-1 and a second side backscattering detector 230-2 located on the same side of the inspected object (FIG. 3 shows that it is located on the left side).
  • the second side backscattering detector 230-2 can be arranged between the side of the inspected object and the second side backscattering radiation source 230-1 as shown in FIG3 , however, it should be known that this is not necessary.
  • the second side backscattering detector 230-2 can be located side by side with the second side backscattering radiation source 230-1 on the second vertical arm slide 122-2.
  • the transmission detector and the second side backscattering module 230 are arranged along the extension direction of the inspection channel so that the rays emitted by the transmission ray source 301 will not affect the second side backscattering inspection of the second side backscattering module 230.
  • the second side backscattering modules 230 are arranged on both sides of the second vertical arm portion 122-1; it should be known that the second side backscattering modules can be one, two or more, as long as the interference or crosstalk that may occur between the second side backscattering modules does not affect the degree of image degradation. Since the second vertical arm slide 122-2 is provided in the present embodiment, it has a length extending along the extension direction of the inspection channel, thereby allowing a more flexible number of second side backscattering modules. More second side backscattering modules allow for faster and more accurate inspections.
  • the first vertical arm slide 121-2 can move along the extension direction of the inspection channel at a first speed
  • the second vertical arm portion 122-1 can move along the direction of the inspection channel with the second vertical arm slide 122-2 at a second speed
  • the first speed and the second speed are configured to have a difference so that the second vertical arm 122 swings at a small angle relative to the first vertical arm 121.
  • the first vertical arm slide 121-2 includes a first driving device 121-3, and the first driving device 121-3 drives the first vertical arm slide 121-2 to move along the extension direction of the inspection channel at a desired speed.
  • the second vertical arm slide 122-2 includes a second driving device 122-3, and the second driving device 122-3 drives the first vertical arm slide 121-2 to move along the extension direction of the inspection channel at a desired speed.
  • the second vertical arm slide 122-2 is driven to move along the extension direction of the inspection channel at a desired speed.
  • the first drive device 121-3 and the second drive device 122-3 can be controlled in linkage or independently.
  • the horizontal arm 110 will not continue to remain horizontal along the paper surface, but will begin to deflect, thereby realizing the rotation of the first vertical arm portion 121-1 and the horizontal arm 110; when the first vertical arm slide 121-2 and the second vertical arm slide 122-2 move in opposite directions at different speeds, the first vertical arm portion 121-1 and the horizontal arm 110 can be rotated in opposite directions, thereby realizing the swing of the first vertical arm portion 121-1 and the horizontal arm 110.
  • the swinging of the first vertical arm portion 121-1 and the horizontal arm 110 can also be achieved by adjusting the speed of the first vertical arm slide 121-2 along the extension direction of the inspection channel in the same direction to be greater than or less than the speed of the second vertical arm slide 122-2 along the extension direction of the inspection channel at different time periods during the inspection process.
  • the second vertical arm portion 122-1 is connected to the second vertical arm slide 122-2 by sliding, and a certain margin is allowed in the direction perpendicular to the extension direction of the inspection channel. That is, during the swinging of the first vertical arm 121 and the horizontal arm 110, the second vertical arm portion 122-1 can be allowed to move with a small stroke in the lateral direction of the extension direction of the inspection channel.
  • a pulley 122-11 is provided at the bottom of the second vertical arm portion 122-1, and a slide groove 122-21 is provided at the top of the second vertical arm slide 122-2, and the pulley of the second vertical arm portion 122-1 slides in the slide groove 122-21 of the second vertical arm slide 122-2.
  • the pulley 122-11 of the second vertical arm portion 122-1 slides back and forth in the slide groove 122-21 at the top of the second vertical arm slide 122-2. It should be known that the cooperation between the pulley 122-11 and the slide groove 122-21 allows the pulley 122-11 to have a certain displacement in the transverse direction of the inspection channel.
  • the slide groove provided on the top of the second vertical arm slide 122-2 is arc-shaped, which is not shown in Figures 2 and 4.
  • the pulley 122-11 and the slide groove 122-21 can be configured so that the pulley 122-11 slides in the slide groove 122-21 against the two side walls of the slide groove 122-21.
  • a protective wall 400 is provided on the second vertical arm slide 122-2 to block the transmission beam emitted by the transmission radiation source 301.
  • the radiation beam of the radiation source 301 of the transmission module 300 is a planar radiation beam, and the planar radiation beam cuts through the inspection channel substantially in the transverse direction of the inspection channel.
  • the protective wall 400 shown in FIGS. 2 and 4 has a limited length in the extension direction of the inspection channel, and the slide groove on the second vertical arm slide 122-2 is shown in FIGS. 2 and 4 as coinciding with the protective wall 400, however, the slide groove may be located on the side of the protective wall 400 close to the inspection channel.
  • the radiation source 301 of the transmission module 300 is set to the first vertical arm portion 121-1, and the detector of the transmission module 300 It is arranged on the second vertical arm part 122-1 and/or the horizontal arm 110, so that during the swinging process of the first vertical arm part 121-1, the beam of radiation from the radiation source is always received by the detector, and the second side backscattering module 230 is installed at the position of the second vertical arm slide 122-2 so that the beam of radiation from the radiation source 301 of the transmission module 300 will not pass through or irradiate the second side backscattering module 230.
  • the top backscatter module 210 and the first side backscatter module 220 and the second side backscatter module 230 may have a backscatter ray source, a backscatter detector and a collimator.
  • the backscatter radiation source may be an X-ray machine.
  • the top backscatter module 210 is used as an example.
  • the number of the top backscatter modules 210 may be one or two, and multiple top backscatter modules 210 may be installed at positions on the horizontal arm that are not cut by the planar beam.
  • top backscatter modules 210 are shown, which are respectively arranged on both sides of the horizontal arm 110, that is, in the extension direction of the inspection channel, the top backscatter modules 210 and the horizontal arm 110 are arranged in sequence front and back.
  • the rays emitted by the backscatter ray source of the top backscatter module 210 are collimated by the collimator and then emitted to the inspection channel.
  • the object to be inspected When the object to be inspected is located in the inspection channel, the object to be inspected reflects the rays emitted by the top backscatter ray source, and the reflected rays are detected by the backscatter detector, thereby obtaining a detection signal.
  • the top backscatter ray source of the top backscatter module 210 is a flying point ray source.
  • the scanning imaging device includes a transmission module 300 and a plurality of backscatter modules, such as a top backscatter module 210, a first side backscatter module 220, and a second side backscatter module 230, wherein the top backscatter module 210 is located at the horizontal arm 110, the first side backscatter module 220 is located at the first vertical arm slide 121-2, and the second side backscatter module 230 is located at the second vertical arm slide 122-2.
  • the transmission module 300 emits a transmission ray beam toward the inspected object in the inspection channel to perform a transmission inspection.
  • the top backscatter module 210, the first side backscatter module 220, and the second side backscatter module 230 respectively emit backscatter rays from the top side, the right side, and the left side of the inspection channel to perform a backscatter inspection.
  • the scanning imaging device can realize a full-scale inspection of the surface and the interior of the inspected object in the inspection channel.
  • the scanning imaging device can inspect a part of the inspected object.
  • the inspected object is stationary, while the first vertical arm slide 121-2 and the second vertical arm slide 122-2 of the scanning imaging device move (reciprocatingly) along the extension direction of the inspection channel at a predetermined speed difference, so that the first vertical arm part 121-1 rotates relative to the first vertical arm slide 121-2, and the horizontal arm 110 performs a swing;
  • the transmission module 300 emits a transmission beam of rays to illuminate the inspected object at different angles, and the detector collects the radiation signal to obtain signals at different illumination angles;
  • the top backscattering module 210 emits a backscattering beam of rays to illuminate the inspected object, and detects the backscattering signal to realize the backscattering inspection of the local area on the top of the inspected object.
  • the local inspection can be an inspection of key parts, an inspection of suspected parts, or a local repeated verification. Therefore, the scanning imaging device disclosed in the present invention can realize the inspection of the inspected object. Full and partial inspection and re-inspection of the object to be inspected.
  • One aspect of the present disclosure further provides a scanning imaging method, comprising using the above-mentioned scanning imaging device to perform imaging on an object in the inspection channel so as to inspect the object.
  • the inspected object is conveyed or moved in the inspection channel, and the transmission module 300 of the scanning imaging device irradiates the transmission ray beam toward the inspected object, while the top backscatter module 210, the first side backscatter module 220, and the second side backscatter module 230 irradiate rays for backscattering from the top, right, and left sides, respectively.
  • the scanning imaging device can obtain the transmission information and backscatter information of the inspected object, realize a comprehensive inspection of the inside and outside of the inspected object, and can combine the transmission inspection and the backscatter inspection for demonstration.
  • the object to be inspected may be stationary, and the scanning imaging device may be driven by the first driving device 121-3 and the second driving device 122-3 along the inspection channel, scanning from one end of the object to be inspected to the other opposite end of the object to be inspected.
  • the first driving device 121-3 may drive the first vertical arm slide 121-2
  • the second driving device 122-3 may drive the second vertical arm slide 122-2.
  • the first driving device 121-3 and the second driving device 122-3 are schematically represented by multiple wheels or wheel groups.
  • the scanning imaging device may also include a track, and the first driving device 121-3 and the second driving device 122-3 respectively move on the corresponding track through their respective multiple pulleys or pulley groups.
  • the first driving device 121-3 and the second driving device 122-3 of the scanning imaging device are moved respectively by their respective multiple pulleys or pulley groups, and the first driving device 121-3 and the second driving device 122-3 can control the movement direction of their respective multiple pulleys or pulley groups.
  • a track is not required.
  • the inspected object moves along the inspection channel
  • the scanning imaging device drives the scanning imaging device to scan from one end of the inspected object to the other opposite end of the inspected object along the inspection channel through the first driving device 121-3 and the second driving device 122-3, wherein the moving direction of the inspected object is opposite to the scanning direction of the scanning imaging device.
  • a conveying device may be arranged in the inspection channel to convey the inspected object.
  • the inspected object moves in one direction, and the scanning imaging device moves in another opposite direction, while the scanning imaging device emits a transmitted ray beam and backscattered rays to the inspected object, thereby achieving internal and external inspection of the inspected object.
  • the inspected object is stationary in the inspection channel, and the first vertical arm slide 121-2 and the second vertical arm slide 122-2 of the scanning imaging device are controlled to move (reciprocatingly) along the extension direction of the inspection channel at a predetermined speed difference, so that the first vertical arm part 121-1 rotates relative to the first vertical arm slide 121-2, and the horizontal arm 110 performs a swing.
  • the transmission module 300 emits a transmission beam of radiation to illuminate the inspected object at different angles, and the radiation signal is collected by the detector to obtain signals at different irradiation angles; the top backscattering module 210 emits a backscattered beam of rays to illuminate the inspected object, and detects the backscattered signal to realize the backscattered inspection of the local area on the top of the inspected object.
  • the local inspection can be the inspection of key parts, the inspection of suspected parts, or the local repeated verification (re-inspection), so the scanning imaging device disclosed in the present invention can realize the inspection and re-inspection of the whole and part of the inspected object.
  • the local inspection can be realized by rotating the first vertical arm part 121-1 without moving the large inspected object and the scanning imaging device, which can save operating costs and improve operational flexibility.

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Abstract

本公开提供一种扫描成像设备和扫描成像方法。扫描成像设备包括：支架，所述支架包括水平臂和竖直臂；安装于所述水平臂上的顶背散射模块。支架的水平臂和竖直臂限定检查通道，水平臂位于所述检查通道的上方。水平臂能够携带顶背散射模块绕竖直臂的转动轴线作小角度的往复摆动。

Description

扫描成像设备和扫描成像方法
本申请要求于2022年10月28日提交的、申请号为202211334914.2的中国专利申请的优先权，其全部内容通过引用结合在本申请中。
技术领域
本公开涉及辐射测量领域，具体地，涉及扫描成像设备和方法。
背景技术
X射线安检设备广泛用于民航、火车、码头等场所，目前运输环境越来越复杂，流通越来越繁忙，需要快速且可靠的安检设备。此外，许多安检场所需要操作快捷，同时体积尽量紧凑的安检设备。
发明内容
本公开提供一种扫描成像设备，包括：
支架，所述支架包括水平臂和竖直臂；和
安装于所述水平臂上的顶背散射模块；
其中，所述水平臂和所述竖直臂限定检查通道，所述水平臂位于所述检查通道的上方；并且
其中，所述水平臂能够携带所述顶背散射模块绕所述竖直臂的旋转轴线作小角度的往复摆动。
在一个实施例中，竖直臂包括第一竖直臂和第二竖直臂，所述水平臂和所述第二竖直臂能够绕所述第一竖直臂以小角度往复摆动。
在一个实施例中，扫描成像设备还包括透射模块，其中所述透射模块包括透射射线源和透射探测器，所述透射射线源安装在所述第一竖直臂一侧，所述透射探测器安装在所述第二竖直臂和/或所述水平臂上以便接收由所述透射射线源发射的射线束。
在一个实施例中，第一竖直臂包括第一竖直臂部分和第一竖直臂滑座，其中所述第一竖直臂滑座承载第一竖直臂部分并且能够沿所述检查通道的延伸方向移动，所述第一竖直臂部分能够相对于第一竖直臂滑座转动，所述透射射线源安装至所述第一竖直臂部分以便随着第一竖直臂部分相对于第一竖直臂滑座转动。
在一个实施例中，第二竖直臂包括第二竖直臂部分和第二竖直臂滑座，其中第二竖直臂滑座承载第二竖直臂部分并且能够沿检查通道的延伸方向移动。
在一个实施例中，扫描成像设备还包括第一侧背散射模块，安装在所述第一竖直臂滑座，并且所述透射射线源和所述第一侧背散射模块沿所述检查通道的延伸方向布置，以便所述透射射线源发射的射线不会影响所述第一侧背散射模块的第一侧背散射检查；和/或
扫描成像设备还包括第二侧背散射模块，安装在所述第二竖直臂滑座，并且所述透射探测器和所述第二侧背散射模块沿所述检查通道的延伸方向布置，以便所述透射射线源发射的射线不会影响所述第二侧背散射模块的第二侧背散射检查；
所述透射探测器安装在所述第二竖直臂部分。
在一个实施例中，第一竖直臂滑座能够以第一速度沿所述检查通道的延伸方向移动，同时第二竖直臂部分能够随所述第二竖直臂滑座以第二速度沿所述检查通道的延伸方向移动，所述第一速度和所述第二速度配置成具有差值以便所述第二竖直臂相对于第一竖直臂以小角度摆动。
在一个实施例中，第二竖直臂滑座设置防护墙，用于阻挡透射射线源发射的透射束。
在一个实施例中，所述透射射线源发射的射线束为面型射线束，并且所述面型射线束沿所述检查通道的延伸方向的大体横向切过所述检查通道。
在一个实施例中，顶背散射模块被安装在所述水平臂上的不被所述面型射线束切过的位置上。
在一个实施例中，第一竖直臂滑座包括第一驱动装置以便驱动第一竖直臂滑座以第一速度沿所述检查通道的延伸方向移动，第二竖直臂滑座包括第二驱动装置以便驱动第二竖直臂滑座以第二速度沿所述检查通道方向的延伸方向移动。
本公开的一方面提供一种扫描成像方法，包括使用上述扫描成像设备对所述检查通道内的物体实施成像，以便检查所述物体。
附图说明
图1是根据本公开的一个实施例的扫描成像设备的截面示意图。
图2是根据本公开的一个实施例的扫描成像设备的俯视示意图。
图3是根据本公开的一个实施例的扫描成像设备的截面示意图。
图4是根据本公开的一个实施例的扫描成像设备的俯视示意图。
图5是根据本公开的一个实施例的扫描成像设备的示意侧视图。
具体实施方式
为更清楚地阐述本公开的目的、技术方案及优点，以下将结合附图对本公开的实施例进行详细的说明。应当理解，下文对于实施例的描述旨在对本公开的总体构思进行解释和说明，而不应当理解为是对本公开的限制。在说明书和附图中，相同或相似的附图标记指代相同或相似的部件或构件。为了清晰起见，附图不一定按比例绘制，并且附图中可能省略了一些公知部件和结构。
除非另外定义，本公开使用的技术术语或者科学术语应当为本公开所属领域内具有一般技能的人士所理解的通常意义。本公开中使用的“第一”、“第二”以及类似的词语并不表示任何顺序、数量或者重要性，而只是用来区分不同的组成部分。措词“一”或“一个”不排除多个。“包括”或者“包含”等类似的词语意指出现该词前面的元件或者物件涵盖出现在该词后面列举的元件或者物件及其等同，而不排除其他元件或者物件。“连接”或者“相连”等类似的词语并非限定于物理的或者机械的连接，而是可以包括电性的连接，不管是直接的还是间接的。“上”、“下”、“左”、“右”“顶”或“底”等等仅用于表示相对位置关系，当被描述对象的绝对位置改变后，则该相对位置关系也可能相应地改变。当诸如层、膜、区域或衬底基板之类的元件被称作位于另一元件“上”或“下”时，该元件可以“直接”位于另一元件“上”或“下”，或者可以存在中间元件。
图1是根据本公开的一个实施例的扫描成像设备的截面示意图。如图1所示，扫描成像设备包括支架100，支架100包括水平臂110和竖直臂，水平臂110和竖直臂限定检查通道，水平臂110位于检查通道的上方。图1中，竖直臂包括右侧的竖直臂(以下也称为第一竖直臂121)和左侧的竖直臂(以下也称为第二竖直臂122)。在另一实施例中，竖直臂可以仅包括右侧的竖直臂。
在一个实施例中，扫描成像设备包括一个背散射模块，该背散射模块安装于水平臂110上，可以称为顶背散射模块210。如图3所示，顶背散射模块210包括位于被检查对象同一侧的顶背散射辐射源210-1和顶背散射探测器210-2。例如，顶背散射探测器210-2位于顶背散射辐射源210-1和被检查对象(被检物)之间。在另一实施例中，顶背散射辐射源210-1和顶背散射探测器210-2位于水平臂110上同一水平。在本实施例中，水平臂110能够携带顶背散射模块210绕竖直臂的旋转轴线作小角度的往复摆动，顶背散射 模块210能够在随着水平臂110作小角度的往复摆动时对检查通道内的对象(被检查对象)执行扫描。根据本实施例，即使被检查对象不动，通过水平臂110的摆动也可以对被检查对象的顶部难以观察的部位进行局部的背散射检查。
在一个实施例中，参照图1-2所示，竖直臂包括第一竖直臂121和第二竖直臂122，水平臂110和第二竖直臂122一起能够绕第一竖直臂121以小角度的幅度往复摆动。小角度可以是小于5度的任何角度，可以是小于8度、小于10度、小于15度等的任何角度。在该实施例中，小角度是描述水平臂110围绕第一竖直臂121摆动的幅度的度量。摆动幅度可以根据实际需要进行设置，并对相关联的设备进行微调。
在一个实施例中，参照图1-2所示，扫描成像设备包括透射模块300，其中透射模块300包括透射射线源301和透射探测器(未示出)，透射射线源301安装在第一竖直臂121一侧，例如透射射线源301与第一竖直臂121的下端固定连接，透射探测器安装在第二竖直臂122和/或水平臂110上以便接收由透射射线源301发射的射线束。为了让视图简单明了，图1-2中未示出透射探测器。
在一个实施例中，参照图1-3所示，扫描成像设备包括如上所示的顶背散射模块210和透射模块300，水平臂110可以绕第一竖直臂121的中心轴线小角度往复摆动，从而顶背散射模块210能够对被检查对象的顶部执行小角度往复摆动式的背散射检查，同时透射模块300从第一竖直臂121一侧朝向被检查对象发射透射射线，以便执行透射检查。在本实施例中，被检查对象能够沿检查通道的延伸方向移动，从而实现被检查对象的扫描检查。本实施例实现对被检查对象的内部的透射检查和顶部的背散射检查，并且尤其地，可以对顶部难以检查的部位实现局部背散射检查。例如集装箱、大型包裹这样的对象，顶部背散射检查能够实现对顶部难以检查的部分的进一步的检查。
参照图1-4，在一个实施例中，第一竖直臂121包括第一竖直臂部分121-1和第一竖直臂滑座121-2。在本实施例中，第一竖直臂滑座121-2设置成能够沿检查通道的延伸方向移动，第一竖直臂部分121-1能够相对于第一竖直臂滑座121-2转动。如图2所示，第一竖直臂滑座121-2可以具有沿检查通道的延伸方向延伸的长度。透射模块300的透射射线源301安装至第一竖直臂部分121-1，从而透射射线源301可以在第一竖直臂部分121-1转动的时候，随着第一竖直臂部分121-1转动，从而射线源朝向被检查对象发射的射线可以做出摆动动作，实现不同角度的透射检查，获得更加丰富的信息。
在一个实施例中，如图3所示，扫描成像设备还包括第一侧背散射模块220，安装在第一竖直臂滑座121-2，第一侧背散射模块220包括位于被检查对象的右侧的第一侧 背散射辐射源220-1和第一侧背散射探测器220-2。透射射线源301和第一侧背散射模块220沿检查通道的延伸方向布置，以便透射射线源301发射的射线不会影响第一侧背散射模块220的第一侧背散射检查。在一个实施例中，例如，如图2和4所示，第一竖直臂滑座121-2可以是舱体，容纳第一侧背散射模块220。在一个实施例中，第一侧背散射模块220可以是一个、两个或更多个，只要各个第一侧背散射模块之间可能出现的干扰或串扰不会影响图像的退化的程度即可。例如，如图4所示，两个第一侧背散射模块220设置在第一竖直臂部分121-1的两侧。由于本实施例中设置第一竖直臂滑座121-2，其具有沿检查通道的延伸方向延伸的长度，因而允许更加灵活的第一侧背散射模块的数量。较多的第一侧背散射模块允许检查更加迅速准确。
在一个实施例中，如图2所示，第二竖直臂122包括第二竖直臂部分122-1和第二竖直臂滑座122-2，第二竖直臂滑座122-2能够滑动。第二竖直臂滑座122-2具有沿检查通道的延伸方向延伸的长度。如图3所示，扫描成像设备还包括第二侧背散射模块230，安装在第二竖直臂滑座122-2，第二侧背散射模块230包括位于被检查对象同一侧(图3示出位于左侧)的第二侧背散射辐射源230-1和第二侧背散射探测器230-2。第二侧背散射探测器230-2可以如图3所示设置在被检查对象的侧面和第二侧背散射辐射源230-1之间，然而，应该知道这并不是必须的。例如，第二侧背散射探测器230-2可以和第二侧背散射辐射源230-1位于第二竖直臂滑座122-2上并排的位置。透射探测器和第二侧背散射模块230沿检查通道的延伸方向布置，以便透射射线源301发射的射线不会影响第二侧背散射模块230的第二侧背散射检查。例如，如图4所示，第二侧背散射模块230设置在第二竖直臂部分122-1的两侧；应该知道，第二侧背散射模块可以是一个、两个或更多个，只要各个第二侧背散射模块之间可能出现的干扰或串扰不会影响图像的退化的程度即可。由于本实施例中设置第二竖直臂滑座122-2，其具有沿检查通道的延伸方向延伸的长度，因而允许更加灵活的第二侧背散射模块的数量。较多的第二侧背散射模块允许检查更加迅速准确。
在一个实施例中，第一竖直臂滑座121-2能够以第一速度沿检查通道的延伸方向移动，同时第二竖直臂部分122-1能够随第二竖直臂滑座122-2以第二速度沿检查通道方向移动，第一速度和第二速度配置成具有差值以便第二竖直臂122相对于第一竖直臂121以小角度摆动。在本实施例中，如图5所示，第一竖直臂滑座121-2包括第一驱动装置121-3，通过第一驱动装置121-3驱动第一竖直臂滑座121-2以想要的速度沿检查通道的延伸方向移动。第二竖直臂滑座122-2包括第二驱动装置122-3，通过第二驱动装置122-3 驱动第二竖直臂滑座122-2以想要的速度沿检查通道的延伸方向移动。第一驱动装置121-3和第二驱动装置122-3可以是联动地控制，也可以是独立地控制。当第一竖直臂滑座121-2沿检查通道的延伸方向的速度大于第二竖直臂滑座122-2沿检查通道的延伸方向的速度(假定方向一致)，可以知道如图4所示，水平臂110将不会继续沿纸面保持水平，而是开始偏转，这样实现了第一竖直臂部分121-1和水平臂110的转动；当第一竖直臂滑座121-2和第二竖直臂滑座122-2沿相反方向以不同速度移动时，可以实现第一竖直臂部分121-1和水平臂110的反向的转动，从而实现第一竖直臂部分121-1和水平臂110的摆动。在本公开的其他实施例中，也可以通过在检查过程中的不同时段，沿相同的方向调整第一竖直臂滑座121-2沿检查通道的延伸方向的速度以大于或小于第二竖直臂滑座122-2沿检查通道的延伸方向的速度，实现第一竖直臂部分121-1和水平臂110的摆动。
在一个实施例中，第二竖直臂部分122-1与第二竖直臂滑座122-2之间采用滑动连接，并且在垂直于检查通道的延伸方向的方向上允许一定的裕量。即，在第一竖直臂121和水平臂110摆动过程中，第二竖直臂部分122-1可以被允许在检查通道的延伸方向的横向上有小行程的移动。
在一个实施例中，如图2、4所示，第二竖直臂部分122-1的底部设置有滑轮122-11，第二竖直臂滑座122-2顶部设置有滑槽122-21，第二竖直臂部分122-1的滑轮在第二竖直臂滑座122-2的滑槽122-21内滑动。在本实施例中，当第一竖直臂部分121-1往复转动时，水平臂和第二竖直臂部分122-1往复摆动，第二竖直臂部分122-1的滑轮122-11在第二竖直臂滑座122-2顶部的滑槽122-21内往复滑动，应该知道滑轮122-11和滑槽122-21之间的配合允许滑轮122-11在检查通道的横向方向上具有一定的位移。
在另一实施例中，第二竖直臂滑座122-2的顶部设置的滑槽为弧形，图2和图4未示出。在本实施例中，滑轮122-11和滑槽122-21可以设置为滑轮122-11在滑槽122-21内抵靠滑槽122-21的两个侧壁滑动。
在一个实施例中，如图2和图4所示，第二竖直臂滑座122-2上设置防护墙400，用于阻挡透射射线源301发射的透射束。透射模块300的辐射源301的射线束为面型射线束，并且面型射线束沿检查通道的大体横向切过检查通道。图2和图4中示出的防护墙400在检查通道的延伸方向上具有有限长度，图2和图4中将第二竖直臂滑座122-2上的滑槽示出为与防护墙400重合，然而，滑槽可以位于防护墙400的靠近检查通道的一侧。由此，透射模块300的射线源301设置到第一竖直臂部分121-1，透射模块300的探测器 设置在第二竖直臂部分122-1和/或水平臂110上，从而在第一竖直臂部分121-1的摆动过程中，辐射源的射线束始终被探测器接收，并且第二侧背散射模块230安装在第二竖直臂滑座122-2的位置使得透射模块300的射线源301的射线束不会穿过或照射第二侧背散射模块230。
在本公开的实施例中，顶背散射模块210以及第一侧背散射模块220、第二侧背散射模块230可以具有背散射射线源、背散射探测器以及准直器。背散射辐射源可以是X光机。如图5所示，以顶背散射模块210作为示例说明。顶背散射模块210的数量可以是一个或两个，设置多个，被安装在水平臂上的不被面型射线束切过的位置上。在图5中，示出了两个顶背散射模块210，分别设置在水平臂110的两侧，也就是在检查通道的延伸方向上，顶背散射模块210和水平臂110前后依次布置。顶背散射模块210的背散射射线源发射的射线经过准直器准直后射向检查通道，当被检查对象位于检查通道时，被检查对象反射顶背散射射线源发射的射线，反射的射线经由背散射探测器检测，从而得出检测信号。
在本公开的一个实施例中，顶背散射模块210的顶背散射射线源是飞点射线源。
在一个实施例中，扫描成像设备包括透射模块300以及多个背散射模块，例如顶背散射模块210、第一侧背散射模块220和第二侧背散射模块230，其中顶背散射模块210位于水平臂110，第一侧背散射模块220位于第一竖直臂滑座121-2，第二侧背散射模块230位于第二竖直臂滑座122-2。透射模块300朝向检查通道的被检查对象发射透射射线束，执行透射检查。顶背散射模块210、第一侧背散射模块220和第二侧背散射模块230分别从检查通道的顶侧、右侧以及左侧发射背散射射线，执行背散射检查。由此，当被检查对象在检查通道内通过或移动时，扫描成像设备可以实现对检查通道内的被检查对象的表面和内部的全方位检查。
在一个实施例中，扫描成像设备可以对被检查对象的局部进行检查，例如被检查对象静止，而扫描成像设备的第一竖直臂滑座121-2和第二竖直臂滑座122-2以预定的速度差沿检查通道的延伸方向(往复)移动，从而使得第一竖直臂部分121-1相对于第一竖直臂滑座121-2转动，水平臂110执行摆动；与此同时，透射模块300发射透射射线束以不同的角度照射被检查对象，通过探测器收集射线信号，获得不同照射角度获得信号；顶背散射模块210发射背散射射线束照射被检查对象，通过检测背散射信号实现对被检查对象的顶部的局部区域的背散射检查。局部检查可以是重点部位的检查，也可以是嫌疑部位的检查，也可以是局部重复验证，因而本公开的扫描成像设备可以实现被检 查对象的全部和局部的检查和复检。
本公开的一方面还提供一种扫描成像方法，包括使用上述扫描成像设备对所述检查通道内的物体实施成像，以便检查所述物体。
具体地，在一个实施例中，被检查对象在检查通道内被传送或移动，扫描成像设备的透射模块300朝向被检查对象照射透射射线束，同时顶背散射模块210、第一侧背散射模块220、第二侧背散射模块230分别从顶侧、右侧以及左侧照射用于背散射的射线，由此扫描成像设备能够获得被检查对象的透射信息和背散射信息，实现对被检查对象的内部和外部的全方位的检查，并且可以将透射检查和背散射检查结合论证。
在一个实施例中，被检查对象可以是静止的，扫描成像设备可以通过第一驱动装置121-3和第二驱动装置122-3驱动扫描成像设备沿检查通道，从被检查对象的一端扫描至被检查对象的相对的另一端。此处需要说明的是，如图1和图5所示，第一驱动装置121-3驱动的可以是第一竖直臂滑座121-2，第二驱动装置122-3驱动的可以是第二竖直臂滑座122-2，图5中第一驱动装置121-3和第二驱动装置122-3用多个轮或轮组示意地表示。在另一实施例中，扫描成像设备还可以包括轨道，第一驱动装置121-3和第二驱动装置122-3分别通过各自的多个滑轮或滑轮组在相应的轨道上移动。在一个实施例中，扫描成像设备的第一驱动装置121-3和第二驱动装置122-3分别通过各自的多个滑轮或滑轮组移动，并且第一驱动装置121-3和第二驱动装置122-3能够控制各自的多个滑轮或滑轮组的运动方向，在本实施例中，轨道不是必须的。
在一个实施例中，被检查对象沿检查通道移动，同时扫描成像设备通过第一驱动装置121-3和第二驱动装置122-3驱动扫描成像设备沿检查通道从被检查对象的一端扫描至被检查对象的相对的另一端，其中被检查对象的移动方向与扫描成像设备的扫描方向相反。在一个实施例中，检查通道内可以布置传送装置以便传送被检查对象。
在一个实施例中，根据本公开的方法，被检查对象朝向一个方向移动，扫描成像设备朝向相反的另一方向移动，同时扫描成像设备对被检查对象发射透射射线束和背散射射线，实现对被检查对象的内部和外部的检查。
在一个实施例中，根据本公开的方法，被检查对象静止位于检查通道内，控制扫描成像设备的第一竖直臂滑座121-2和第二竖直臂滑座122-2以预定的速度差沿检查通道的延伸方向(往复)移动，从而使得第一竖直臂部分121-1相对于第一竖直臂滑座121-2转动，水平臂110执行摆动，与此同时，透射模块300发射透射射线束以不同的角度照射被检查对象，通过探测器收集射线信号，获得不同照射角度获得信号；顶背散射模块 210发射背散射射线束照射被检查对象，通过检测背散射信号实现对被检查对象的顶部的局部区域的背散射检查。局部检查可以是重点部位的检查，也可以是嫌疑部位的检查，也可以是局部重复验证(复检)，因而本公开的扫描成像设备可以实现被检查对象的全部和局部的检查和复检。通过第一竖直臂部分121-1的转动实现局部检查可以不必移动大的被检查对象和扫描成像设备，可以节约操作成本，提高操作灵活度。
本公开的多个实施例不是为了限制本公开的原理或结构，而是为了帮助理解本公开的原理和技术方案，本领域技术人员在阅读本公开的实施例之后能够想到本公开中未记载的其他实施例，这些未在本公开中描述的实施例也应视为包括在本公开中，并且本公开的实施例以及未在本公开中描述的实施例可以组合以得出本公开的其他实施方式。本公开的范围应以权利要求的限定为准。

Claims (12)

  1. 一种扫描成像设备，包括：
    支架，所述支架包括水平臂和竖直臂；和
    安装于所述水平臂上的顶背散射模块；
    其中，所述水平臂和所述竖直臂限定检查通道，所述水平臂位于所述检查通道的上方；并且
    其中，所述水平臂能够携带所述顶背散射模块绕所述竖直臂的旋转轴线作小角度的往复摆动。
  2. 根据权利要求1所述的扫描成像设备，其中所述竖直臂包括第一竖直臂和第二竖直臂，所述水平臂和所述第二竖直臂能够绕所述第一竖直臂以小角度往复摆动。
  3. 根据权利要求2所述的扫描成像设备，还包括透射模块，其中所述透射模块包括透射射线源和透射探测器，所述透射射线源安装在所述第一竖直臂一侧，所述透射探测器安装在所述第二竖直臂和/或所述水平臂上以便接收由所述透射射线源发射的射线束。
  4. 根据权利要求3所述扫描成像设备，其中第一竖直臂包括第一竖直臂部分和第一竖直臂滑座，其中所述第一竖直臂滑座承载第一竖直臂部分并且能够沿所述检查通道的延伸方向移动，所述第一竖直臂部分能够相对于第一竖直臂滑座转动，所述透射射线源安装至所述第一竖直臂部分以便随着第一竖直臂部分相对于第一竖直臂滑座转动。
  5. 根据权利要求4所述扫描成像设备，其中第二竖直臂包括第二竖直臂部分和第二竖直臂滑座，其中所述第二竖直臂滑座承载第二竖直臂部分并且能够沿所述检查通道的延伸方向移动。
  6. 根据权利要求5所述扫描成像设备，还包括第一侧背散射模块，安装在所述第一竖直臂滑座，并且所述透射射线源和所述第一侧背散射模块沿所述检查通道的延伸方向布置，以便所述透射射线源发射的射线不会影响所述第一侧背散射模块的第一侧背散射检查；和/或
    扫描成像设备还包括第二侧背散射模块，安装在所述第二竖直臂滑座，并且所述透 射探测器和所述第二侧背散射模块沿所述检查通道的延伸方向布置，以便所述透射射线源发射的射线不会影响所述第二侧背散射模块的第二侧背散射检查；
    所述透射探测器安装在所述第二竖直臂部分。
  7. 根据权利要求6所述扫描成像设备，其中第一竖直臂滑座能够以第一速度沿所述检查通道的延伸方向移动，同时第二竖直臂部分能够随所述第二竖直臂滑座以第二速度沿所述检查通道的延伸方向移动，所述第一速度和所述第二速度配置成具有差值以便所述第二竖直臂相对于第一竖直臂以小角度摆动。
  8. 根据权利要求6所述扫描成像设备，其中第二竖直臂滑座设置防护墙，用于阻挡透射射线源发射的透射束。
  9. 根据权利要求3所述的扫描成像设备，其中所述透射射线源发射的射线束为面型射线束，并且所述面型射线束沿所述检查通道的延伸方向的大体横向切过所述检查通道。
  10. 根据权利要求9所述的扫描成像设备，其中顶背散射模块被安装在所述水平臂上的不被所述面型射线束切过的位置上。
  11. 根据权利要求7所述的扫描成像设备，其中第一竖直臂滑座包括第一驱动装置以便驱动第一竖直臂滑座以第一速度沿所述检查通道的延伸方向移动，第二竖直臂滑座包括第二驱动装置以便驱动第二竖直臂滑座以第二速度沿所述检查通道方向的延伸方向移动。
  12. 一种扫描成像方法，包括使用如权利要求1-11中任一项所述的扫描成像设备对所述检查通道内的物体实施成像，以便检查所述物体。
PCT/CN2023/122436 2022-10-28 2023-09-28 扫描成像设备和扫描成像方法 Ceased WO2024088015A1 (zh)

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