WO2024077692A1

WO2024077692A1 - Oscilloscope probe, probe detection method and apparatus, oscilloscope, system, and medium

Info

Publication number: WO2024077692A1
Application number: PCT/CN2022/130230
Authority: WO
Inventors: 郑刘康; 刘哲源; 顾小勇; 王悦
Original assignee: 普源精电科技股份有限公司
Priority date: 2022-10-13
Filing date: 2022-11-07
Publication date: 2024-04-18
Also published as: CN115469125A

Abstract

Disclosed in the present invention are an oscilloscope probe, a probe detection method and apparatus, an oscilloscope, a system, and a storage medium. The oscilloscope probe comprises a signal testing path and a detection circuit, wherein the signal testing path is used for connecting to an oscilloscope channel of an oscilloscope and transmitting a signal under test to the oscilloscope channel; and the detection circuit comprises a capacitor and a detection connector, a first end of the capacitor being grounded, a second end of the capacitor being electrically connected to a first end of the detection connector, and a second end of the detection connector being used for connecting to an identification circuit in the oscilloscope, wherein the capacitance value of the capacitor is related to the type of the oscilloscope probe. By means of the technical solution, the measurement accuracy and reliability can be effectively ensured while the power consumption is reduced.

Description

Oscilloscope probe, probe detection method, device, oscilloscope, system and medium

Technical Field

The embodiments of the present invention relate to the field of computer technology, and in particular to an oscilloscope probe, a probe detection method, a probe detection device, an oscilloscope, a system and a storage medium.

Background technique

The probe is an important part of the oscilloscope system, and plays a vital role in the integrity of the measured signal input into the oscilloscope. Therefore, a reliable method is needed in the oscilloscope system to detect whether the probe is normally connected to the oscilloscope to complete the accurate measurement of the measured signal. After the oscilloscope probe is connected to the oscilloscope, for different probes, it is necessary to set the correct coupling mode, attenuation ratio, input resistance and other channel parameters for the channel to which the probe is connected, so as to ensure the correct use of the probe, reduce the probability of test errors, and help oscilloscope users obtain measurement results conveniently and quickly.

At present, the access detection scheme of oscilloscope probes generally adopts the resistor voltage division method. The problem faced by this method is that if a resistor with a smaller resistance value is selected, it will generate a large amount of heat. Since the sealing of the oscilloscope probe is relatively high, when its heat is transferred to the circuit board, it is easy to increase the temperature of the analog channel, affecting the measured signal in the oscilloscope system, thereby reducing the reliability of the measurement system, while bringing unnecessary power waste to the oscilloscope system and bringing certain power supply pressure to the overall power supply system. In addition, the resistor voltage division method is used to identify the different types of probes connected to the oscilloscope. Due to the wide variety of types and models of oscilloscope probes, the types of resistors used are relatively more. If a resistor with a larger resistance value is used to complete the voltage division, then the resistor with a larger resistance value can be approximated as a passive antenna. When the oscilloscope measures a small signal, the noise will be superimposed on the measurement signal, which will seriously affect the accuracy of the test.

Summary of the invention

The embodiments of the present invention provide an oscilloscope probe, a probe detection method, a device, an oscilloscope, a system and a storage medium, which can optimize the existing probe detection solution.

According to one aspect of the present invention, an oscilloscope probe is provided, comprising a signal test path and a detection circuit, wherein:

The signal test path is used to connect to an oscilloscope channel of an oscilloscope and send the measured signal to the oscilloscope channel;

The detection circuit includes a capacitor and a detection connector, the first end of the capacitor is grounded, the second end of the capacitor is electrically connected to the first end of the detection connector, and the second end of the detection connector is used to connect to the identification circuit in the oscilloscope, wherein the capacitance value of the capacitor is related to the type of the oscilloscope probe.

According to another aspect of the present invention, a probe detection method is provided, which is executed by a processor in an oscilloscope, wherein the oscilloscope further comprises an identification circuit, wherein the identification circuit comprises a resistor, a constant voltage source and a voltage detection unit, wherein a first end of the resistor is electrically connected to a first end of the voltage detection unit and is used to be connected to a detection connector of an oscilloscope probe, a second end of the resistor is connected to a first end of the constant voltage source, a second end of the constant voltage source is grounded, and a second end of the voltage detection unit is connected to the processor;

The method comprises:

Acquire multiple groups of voltage data, wherein each group of voltage data includes a voltage value of the first end of the resistor detected by the voltage detection unit and a detection time corresponding to the voltage value;

Determine a target capacitance value of a capacitor in a current oscilloscope probe according to the multiple sets of voltage data;

Based on a preset mapping relationship, the target type of the current oscilloscope probe is determined according to the target capacitance value, wherein the preset mapping relationship includes a corresponding relationship between the capacitance value and the type of the oscilloscope probe.

According to another aspect of the present invention, a probe detection device is provided, which is integrated in an oscilloscope, wherein the oscilloscope further comprises an identification circuit, wherein the identification circuit comprises a resistor, a constant voltage source and a voltage detection unit, wherein a first end of the resistor is electrically connected to a first end of the voltage detection unit and is used to be connected to a detection connector of an oscilloscope probe, a second end of the resistor is connected to a first end of the constant voltage source, a second end of the constant voltage source is grounded, and a second end of the voltage detection unit is connected to the processor;

The device comprises:

A voltage data acquisition module, used to acquire multiple groups of voltage data, wherein each group of voltage data includes a voltage value of the first end of the resistor detected by the voltage detection unit and a detection time corresponding to the voltage value;

A capacitance value determination module, used to determine a target capacitance value of a capacitor in a current oscilloscope probe according to the plurality of sets of voltage data;

The type determination module is used to determine the target type of the current oscilloscope probe according to the target capacitance value based on a preset mapping relationship, wherein the preset mapping relationship includes a corresponding relationship between the capacitance value and the type of the oscilloscope probe.

According to another aspect of the present invention, there is provided an oscilloscope, comprising an identification circuit, a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein:

The identification circuit includes a resistor, a constant voltage source and a voltage detection unit, wherein a first end of the resistor is electrically connected to a first end of the voltage detection unit and is used to be connected to a detection connector of an oscilloscope probe, a second end of the resistor is connected to a first end of the constant voltage source, a second end of the constant voltage source is grounded, and a second end of the voltage detection unit is connected to the processor;

When the processor executes the computer program, the probe detection method described in any embodiment of the present invention is implemented.

According to another aspect of the present invention, an oscilloscope system is provided, comprising the oscilloscope probe according to any embodiment of the present invention, and the oscilloscope according to any embodiment of the present invention.

According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the probe detection method described in any embodiment of the present invention when executed.

The technical solution of the embodiment of the present invention replaces the resistor in the detection circuit of the oscilloscope probe with a capacitor. The capacitance value of the capacitor is related to the type of the oscilloscope probe, that is, the type of the probe can be determined by detecting the capacitance value. Compared with the resistor voltage division method, there is no extra power waste, no excess heat will be brought to the system to cause system detection temperature drift, and no excessive noise will be introduced into the precision probe. While saving power consumption, it can effectively ensure measurement accuracy and reliability.

It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description.

BRIEF DESCRIPTION OF THE DRAWINGS

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

1 is a schematic diagram of a connection between an oscilloscope probe and an oscilloscope provided in an embodiment of the present invention;

FIG2 is a flow chart of a probe detection method provided by an embodiment of the present invention;

FIG3 is a flow chart of another probe detection method provided by an embodiment of the present invention;

FIG. 4 is a schematic structural diagram of a probe detection device provided by an embodiment of the present invention.

Detailed ways

In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

The oscilloscope probe (hereinafter referred to as probe) provided in the embodiment of the present invention may include a passive probe and an active probe. FIG1 is a schematic diagram of connecting an oscilloscope probe and an oscilloscope provided in the embodiment of the present invention, and FIG1 includes a probe 10 and an oscilloscope 20 provided in the embodiment of the present invention. The probe 10 includes a signal test path 110 and a detection circuit 120.

The signal test path 110 is used to connect to the oscilloscope channel 210 of the oscilloscope 20, and send the measured signal to the oscilloscope channel 210. Exemplarily, for a passive probe, the signal test path may include an analog front end (such as a probe amplifier), a cable, and a probe connector, and the probe connector may specifically be a Bayonet Neill-Concelman (BNC) connector; for an active probe, in addition to the analog front end (such as a probe amplifier), a cable, and a probe connector, it may also include a digital-to-analog converter (DAC) and a probe control unit.

The detection circuit 120 includes a capacitor 121 and a detection connector 122, wherein the first end of the capacitor 121 is grounded, the second end of the capacitor 121 is electrically connected to the first end of the detection connector 122, and the second end of the detection connector 122 is used to connect to the identification circuit 220 in the oscilloscope, wherein the capacitance value of the capacitor is related to the type of the oscilloscope probe.

There are many types of oscilloscope probes, which can include high-resistance probes, high-voltage probes, and current probes in addition to passive probes and active probes. In the embodiment of the present disclosure, in order to distinguish different types of probes, different capacitance values can be selected for the capacitor 121. For example, the capacitance value corresponding to the high-resistance probe is 1 microfarad, the capacitance value corresponding to the high-voltage probe is 100 microfarad, the capacitance value corresponding to the current probe is 10 microfarad, and so on.

In the related art, the access detection scheme of the oscilloscope probe generally adopts the resistance voltage division method, that is, the position of the capacitor 121 in Figure 1 is a resistor. As mentioned above, in order to distinguish probes of different models and types, it is inevitable to choose a resistor with a larger or smaller resistance. A smaller resistor may generate a large amount of heat, affecting the measured signal in the oscilloscope system, thereby reducing the reliability of the measurement system, causing unnecessary power waste for the oscilloscope system, and also bringing certain power supply pressure to the overall power supply system. A larger resistor may also superimpose noise on the measurement signal, seriously affecting the accuracy of the test.

In the embodiment of the present invention, the above problem can be effectively solved by replacing the resistor with a capacitor. When the probe is connected to the oscilloscope, the constant voltage source in the oscilloscope will charge the capacitor. After the capacitor is fully charged, the voltage is stable. The identification circuit in the oscilloscope can detect the stable voltage. The type of probe can be determined by determining the capacitance value of the capacitor. The specific method of determining the capacitance value is not limited.

Exemplarily, the oscilloscope 20 may include a processor 230, the identification circuit 220 includes a resistor 221, a constant voltage source 222 and a voltage detection unit 223, the first end of the resistor 221 is electrically connected to the first end of the voltage detection unit 223, and is used to connect to the detection connector 122 of the probe 10, the second end of the resistor 221 is connected to the first end of the constant voltage source 222, the second end of the constant voltage source 222 is grounded, and the second end of the voltage detection unit 223 is connected to the processor 230. Optionally, the voltage detection unit 223 can detect the voltage value of the first end of the resistor 221, and then calculate the capacitance value of the capacitor 121. Among them, the voltage detection unit 223 can be a digital-to-analog converter (ADC).

The charging of the capacitor is generally completed in a limited time period. There is no extra power waste, nor will it bring excess heat to the system and cause system detection temperature drift like small resistance voltage dividers. At the same time, it will not introduce excessive noise to the precision probe like large resistances.

After accurately identifying the type of probe, the oscilloscope can set the correct channel parameters such as coupling mode, attenuation ratio and input resistance for the channel to which the probe is connected, so as to ensure the correct use of the probe.

Long-term use of oscilloscope probes can easily lead to aging of the mechanical structure of the contact end, which in turn causes poor contact between the oscilloscope probe and the oscilloscope system. In addition, since the oscilloscope probe needs to change different test points during the signal measurement process, it is also easy to cause a short circuit between the probe interface and the pins of the oscilloscope channel detection. If a resistor voltage divider solution is used, since the resistor has no voltage holding ability, when the above situation occurs, the oscilloscope system cannot detect the voltage divider value of the probe resistor. The system will determine that the probe is not connected to the oscilloscope at this time, causing the oscilloscope system to misdetect, the test process is blocked, and the entire test process is affected. In addition, if the system determines that the probe is not connected to the oscilloscope at this time, the channel parameters previously set for the probe will be cleared. When the probe is reconnected, the channel parameters need to be reset. If the probe is frequently connected and disconnected due to poor contact, a lot of time will be wasted on setting the channel parameters, which seriously affects the test efficiency.

By adopting the technical solution of the embodiment of the present invention, when the mechanical structure of the probe ages due to long-term use or the connection becomes loose during the measurement process, since the capacitor has a certain voltage holding ability, if it is disconnected due to poor contact but the connection is restored in a short time, the change pattern of the capacitor voltage can be determined by detecting and identifying the circuit to identify the poor contact phenomenon, and then targeted processing can be performed, such as prompting the user, which helps the user to adopt corresponding measures to continue the test.

In some embodiments, the oscilloscope probe is characterized in that it also includes: a first indicator light connected in parallel with the capacitor and/or a second indicator light connected to the probe control unit; wherein the first indicator light is used to indicate the abnormality of the probe by switching between an off state and an on state when the current flowing through the first indicator light changes due to an abnormality of the probe; the probe control unit is located in the oscilloscope probe, and is used to control the second indicator light to change to a target working state when receiving the probe abnormality indication sent by the oscilloscope, and the target working state is used to indicate the abnormality of the probe. The advantage of such a setting is that an indicator light is added to the probe, and when an abnormality occurs in the probe due to poor contact or other reasons, the user can be promptly reminded of the occurrence of the abnormality through the indicator light. Optionally, the indicator light can be a light emitting diode (LED) or the like.

Exemplary, for passive probes, there is generally no probe control unit inside the probe, and an abnormal reminder can be made by connecting the first indicator light in parallel to the capacitor in the detection circuit. When the probe produces aging of the mechanical structure due to long-term use or loose connection during the measurement process, the capacitor has a certain charge storage capacity, so the voltage stability of the non-grounded side of the capacitor can be maintained. When the probe is loose, the constant voltage source 222 inside the oscilloscope provides the charging path of the capacitor 121 through the detection connector 122 of the probe 10 with a short circuit or incomplete contact risk, when the charging current to the capacitor 121 is less than the discharge current of the capacitor 121, the voltage of the capacitor 121 connected to the detection connector 122 will be reduced, if the oscilloscope 20 and the detection connector 122 of the probe 10 are restored to normal connection, the charging current on the capacitor 121 will be greater than its discharge current, so the current flowing through the first indicator light will also change, so that the first indicator light flashes, so as to achieve the purpose of abnormal reminder, if the probe is frequently connected and disconnected due to poor contact, the first indicator light will flash frequently, which can enhance the effectiveness of the reminder.

Exemplarily, for active probes, abnormal reminders can also be made through the second indicator light. As described above, when the charging current to capacitor 121 is less than the discharge current of capacitor 121, the voltage connected to the probe detection connector of capacitor 121 will decrease. If the oscilloscope 20 and the detection connector 122 of the probe 10 are restored to normal connection, the charging current on capacitor 121 will be greater than its discharge current, then the voltage of the detection connector 122 of the probe 10 that can be detected by the oscilloscope system will change repeatedly within the range calibrated within the system (such as 0 to the voltage value of the constant voltage source), and then determine that the probe is abnormal, and send a probe abnormal indication to the probe control unit, so that the probe control unit can control the second indicator light to change to the target working state for prompting the probe abnormality when receiving the probe abnormal indication. The target working state can be, for example, always on or flashing, etc., which is not specifically limited.

Of course, it should be noted that for active probes, abnormal reminders can also be given through the first indicator light, and the first indicator light and the second indicator light can also be set at the same time, and reminders can be given through the two types of indicator lights at the same time to further enhance the effectiveness of the reminder.

FIG2 is a flow chart of a probe detection method provided by an embodiment of the present invention. This embodiment is applicable to the case of detecting the type of the oscilloscope probe provided by the embodiment of the present invention. The method can be executed by a probe detection device, which can be implemented in the form of hardware and/or software. The probe detection device can be configured in an oscilloscope, specifically in a processor of the oscilloscope, and the method is executed by the processor. The oscilloscope also includes an identification circuit, the identification circuit includes a resistor, a constant voltage source and a voltage detection unit, the first end of the resistor is electrically connected to the first end of the voltage detection unit, and is used to connect to the detection connector of the oscilloscope probe, the second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor. The specific connection relationship can be seen in FIG1.

As shown in FIG. 2 , the method includes:

Step 201 : Acquire multiple groups of voltage data, wherein each group of voltage data includes a voltage value of a first end of a resistor detected by a voltage detection unit and a detection time corresponding to the voltage value.

Exemplarily, the voltage value of the first end of the resistor can be detected by a voltage detection unit at a preset frequency or in real time, and when the voltage value is detected, the corresponding detection time is recorded. The detected voltage value and the corresponding detection time are associated and stored as a set of voltage data. After multiple detections, multiple sets of voltage data can be obtained.

Step 202: Determine a target capacitance value of a capacitor in a current oscilloscope probe according to multiple sets of voltage data.

Exemplarily, the current oscilloscope probe can be understood as the oscilloscope probe currently connected to the oscilloscope. As described above, when the probe is connected to the oscilloscope, the constant voltage source in the oscilloscope will charge the capacitor. After the capacitor is fully charged, the voltage is stable, and the identification circuit in the oscilloscope can detect the stable voltage. After the stable voltage is detected, the capacitance value of the capacitor in the oscilloscope probe currently connected to the oscilloscope can be calculated.

Step 203 : Based on a preset mapping relationship, determine the target type of the current oscilloscope probe according to the target capacitance value, wherein the preset mapping relationship includes a corresponding relationship between the capacitance value and the type of the oscilloscope probe.

Exemplarily, when designing each oscilloscope probe, the correspondence between the capacitance value of the capacitor in the probe and the type of probe can be recorded to form a preset mapping relationship, and the preset mapping relationship can be written into the oscilloscope. For example, a separate configuration file can be generated in the oscilloscope to store the preset mapping relationship, and when the probe type needs to be determined based on the capacitance value, the preset mapping relationship can be read from it. Optionally, after the preset mapping relationship is written into the oscilloscope, it can support modification, such as adding the correspondence between the capacitance value corresponding to a new type of probe and the type of oscilloscope probe, or modifying the stored correspondence, etc., to improve scalability.

The probe detection method of the embodiment of the present invention replaces the resistor in the detection circuit of the oscilloscope probe with a capacitor, the capacitance value of the capacitor is related to the type of the oscilloscope probe, the oscilloscope can continuously detect the voltage value of the resistor end connected to the detection connector of the probe inside the oscilloscope through a voltage detection unit, calculate the capacitance value of the capacitor in the currently connected probe according to the voltage value and the corresponding detection time, and then quickly determine the current probe type according to a preset mapping relationship including the correspondence between the capacitance value and the probe type. Compared with the resistor voltage division method, there is no extra power waste, no excess heat will be brought to the system to cause the occurrence of system detection temperature drift, and no excessive noise will be introduced into the precision probe. While saving power consumption, it can effectively ensure measurement accuracy and reliability.

Optionally, after determining the target type of the current oscilloscope probe, the method may further include: setting channel parameters for the connected channel of the current oscilloscope probe according to the target type, wherein the channel parameters may include coupling mode, attenuation ratio, input resistance, etc. Optionally, locking the parameter value of the preset channel parameter that has been set to prevent the user from setting the wrong channel parameter to damage the probe and the oscilloscope measurement system.

Optionally, for active probes, the target serial number of the current oscilloscope probe can be obtained through the control data line connected to the probe control unit, and channel parameters can be set for the channel to which the current oscilloscope probe is connected according to the target type and target serial number, so that the channel parameters can be set more accurately.

In some embodiments, the target capacitance value of the capacitor in the current oscilloscope probe is determined according to the multiple sets of voltage data, including: determining the target capacitance value of the capacitor in the current oscilloscope probe according to the voltage value of the constant voltage source, the first detection time in the first voltage data, the target voltage value in the second voltage data, and the second detection time in the second voltage data; wherein the voltage value in the previous set of voltage data of the first voltage data is the voltage value of the constant voltage source; the voltage value of the constant voltage source is greater than the voltage value in the first voltage data; the second voltage data is the first set of voltage data in a continuous multiple sets of target voltage data; the absolute difference between each voltage value in the multiple sets of target voltage data and the target voltage value is less than the first preset threshold; the number of groups of the target voltage data is greater than the second preset threshold. The advantage of such a setting is that the target capacitance value of the capacitor in the current oscilloscope probe can be accurately calculated, and then the type of probe can be accurately detected. Among them, the first preset threshold can be set according to actual needs (such as detection accuracy, etc.), and the second preset threshold can be set according to actual conditions (such as the length of time the capacitor is fully charged and the detection frequency of the voltage detection unit, etc.). Exemplarily, the target capacitance value can be determined based on the capacitor charging formula.

Exemplarily, when the probe 10 is not connected to the oscilloscope 20, the voltage detected by the voltage detection unit 223 in the oscilloscope 20 is the voltage (denoted as V) of the constant voltage source 222 on the resistor 221 (for ease of description, its resistance is denoted as R). When the probe 10 is not connected to the oscilloscope 20, it is necessary to charge the capacitor 121 (for ease of description, its capacitance is denoted as C) in the probe 10, and the voltage detected by the voltage detection unit 223 begins to decrease. At this time, the detection time is denoted as _t1 (which can be understood as the first detection time). When the voltage detected by the voltage detection unit 223 stabilizes at _Vt (which can be understood as the target voltage value), the earliest time _t2 (which can be understood as the second detection time) when the voltage on the resistor 221 becomes _Vt in the internally stored data record can be found, and the capacitance value C of the capacitor 121 can be calculated according to the capacitor charging formula:

_t2 - _t1 =R*Cln[V/( _VVt )]

In some embodiments, after determining the target type of the current oscilloscope probe according to the target capacitance value based on the preset mapping relationship, it also includes: setting the corresponding channel parameters in the oscilloscope to the target parameter values that match the target type; continuing to obtain multiple sets of voltage data, if the change in the voltage value in the multiple sets of voltage data obtained satisfies the preset change rule, then maintaining the parameter value of the channel parameter as the target parameter value. Wherein, the preset change rule includes: after rising from the first voltage value to the peak value, it drops to the second voltage value within a preset time; and the absolute difference between the first voltage value and the second voltage value and the target voltage value, respectively, is less than the first preset threshold. The advantage of such a setting is that if it is detected that the probe has poor contact, etc., the previously set channel parameters can be kept unchanged, avoiding frequent connection and disconnection of the probe due to poor contact, wasting a lot of time on setting the channel parameters, and improving test efficiency.

As mentioned above, when the probe has poor contact, the detected voltage will rise slowly, and will not directly return to the voltage of the unconnected state like the resistor voltage division detection scheme. If the connection is restored within a certain period of time, the voltage will slowly drop. According to this rule, the poor contact situation can be identified. The preset time can be set according to actual needs.

In some embodiments, the method may further include: continuing to acquire multiple sets of voltage data, and if the change of the voltage value in the acquired multiple sets of voltage data satisfies the preset change rule, then outputting the preset abnormal prompt information through the display device of the oscilloscope and/or sending the probe abnormal indication to the probe control unit in the current oscilloscope probe. Wherein, the probe abnormal indication is used to instruct the probe control unit to control the indicator light in the current oscilloscope probe to change to the target working state, and the target working state is used to indicate the probe abnormality; wherein, the preset change rule includes: after rising from the first voltage value to the peak value, it drops to the second voltage value within a preset time; and the absolute difference between the first voltage value and the second voltage value and the target voltage value, respectively, is less than the first preset threshold. The advantage of such a setting is that if the probe is detected to have poor contact, etc., an abnormal prompt can be output on the display device of the oscilloscope in time, or the probe can be instructed to give an abnormal prompt through the indicator light, which helps the user to take corresponding measures to continue the test.

The detection method in the embodiment of the present invention is different from the resistance voltage division detection method. When the probe connector is aged and loose, in the resistance detection method, the pin voltage detected by the oscilloscope system at this time is consistent with the voltage value detected when the oscilloscope probe is not connected to the channel, which is easy to cause the oscilloscope to misjudge. In the embodiment of the present invention, the change law of the detected voltage can be used to accurately distinguish between the poor contact situation and the real disconnection situation. If the poor contact is determined, the oscilloscope will remind the user that the oscilloscope probe used has a risk of poor contact and needs to be repaired or replaced in time, while keeping the set channel parameters unchanged to improve the test efficiency.

FIG3 is a flow chart of another probe detection method provided by an embodiment of the present invention, which is optimized based on the above optional embodiments. As shown in FIG3 , the method includes:

Step 301 : Acquire multiple groups of voltage data, wherein each group of voltage data includes a voltage value of a first end of a resistor detected by a voltage detection unit and a detection time corresponding to the voltage value.

Step 302, based on the capacitor charging formula, determine the target capacitance value of the capacitor in the current oscilloscope probe according to the voltage value of the constant voltage source, the first detection time in the first voltage data, the target voltage value in the second voltage data, and the second detection time in the second voltage data.

Step 303 : Based on a preset mapping relationship, determine the target type of the current oscilloscope probe according to the target capacitance value, wherein the preset mapping relationship includes a corresponding relationship between the capacitance value and the type of the oscilloscope probe.

Step 304: Set the corresponding channel parameters in the oscilloscope to target parameter values that match the target type.

Step 305, continue to obtain multiple groups of voltage data. If the change of the voltage value in the multiple groups of voltage data obtained meets the preset change rule, the parameter value of the channel parameter is maintained as the target parameter value, the preset abnormal prompt information is output through the display device of the oscilloscope, and the probe abnormality indication is sent to the probe control unit in the current oscilloscope probe.

Exemplarily, the preset abnormal prompt information may be, for example, text information displayed on the display screen of the oscilloscope, such as “The current probe may have poor contact, please pay attention to repair or replace it”.

The probe detection method provided in the embodiment of the present invention replaces the resistor in the detection circuit of the oscilloscope probe with a capacitor. There is a corresponding relationship between the capacitance value of the capacitor and the type of the oscilloscope probe. Based on the corresponding relationship, the current probe type can be quickly determined according to the calculated capacitance value, which can effectively ensure the measurement accuracy and reliability, and can detect the aging of the mechanical structure of the probe. The user can be reminded in time through the oscilloscope display device and the probe indicator light, so as to maintain the set channel parameters, enhance the user experience, and effectively improve the test efficiency.

The embodiment of the present invention also provides a probe detection device, which is integrated in an oscilloscope. The oscilloscope also includes an identification circuit, and the identification circuit includes a resistor, a constant voltage source, and a voltage detection unit. The first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe. The second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor. Figure 4 is a schematic diagram of the structure of a probe detection device provided by an embodiment of the present invention. The probe detection device, as shown in Figure 4, includes:

A voltage data acquisition module 401 is used to acquire multiple groups of voltage data, wherein each group of voltage data includes a voltage value of the first end of the resistor detected by the voltage detection unit and a detection time corresponding to the voltage value;

A capacitance value determination module 402, configured to determine a target capacitance value of a capacitor in a current oscilloscope probe according to the plurality of sets of voltage data;

The type determination module 403 is used to determine the target type of the current oscilloscope probe according to the target capacitance value based on a preset mapping relationship, wherein the preset mapping relationship includes a corresponding relationship between the capacitance value and the type of the oscilloscope probe.

The probe detection device provided by the embodiment of the present invention replaces the resistor in the detection circuit of the oscilloscope probe with a capacitor, the capacitance value of the capacitor is related to the type of the oscilloscope probe, the oscilloscope can continuously detect the voltage value of the resistor end connected to the detection connector of the probe inside the oscilloscope through a voltage detection unit, calculate the capacitance value of the capacitor in the currently connected probe according to the voltage value and the corresponding detection time, and then quickly determine the current probe type according to a preset mapping relationship including the correspondence between the capacitance value and the probe type. Compared with the resistor voltage division method, there is no extra power waste, no excess heat will be brought to the system to cause the occurrence of system detection temperature drift, and no excessive noise will be introduced into the precision probe. While saving power consumption, it can effectively ensure measurement accuracy and reliability.

Optionally, the capacitance value determination module is specifically used for:

The target capacitance value of the capacitor in the current oscilloscope probe is determined according to the voltage value of the constant voltage source, the first detection time in the first voltage data, the target voltage value in the second voltage data, and the second detection time in the second voltage data; wherein the voltage value in the previous group of voltage data of the first voltage data is the voltage value of the constant voltage source; the voltage value of the constant voltage source is greater than the voltage value in the first voltage data; the second voltage data is the first group of voltage data in a plurality of consecutive groups of target voltage data; the absolute difference between each voltage value in the plurality of groups of target voltage data and the target voltage value is less than a first preset threshold; and the number of groups of the target voltage data is greater than a second preset threshold.

Optionally, the device further comprises:

A parameter setting module, configured to set corresponding channel parameters in the oscilloscope to target parameter values matching the target type after determining the target type of the current oscilloscope probe according to the target capacitance value based on the preset mapping relationship;

A parameter value maintaining module, used for continuously acquiring multiple sets of voltage data, and if the changes in the voltage values in the acquired multiple sets of voltage data satisfy a preset change rule, maintaining the parameter value of the channel parameter as the target parameter value;

Among them, the preset change rule includes: after rising from a first voltage value to a peak value, it drops to a second voltage value within a preset time period; and the absolute differences between the first voltage value and the second voltage value and the target voltage value, respectively, are both less than the first preset threshold.

Optionally, the device further comprises:

an abnormality prompt module, used for continuing to acquire multiple sets of voltage data, and if the change of the voltage value in the acquired multiple sets of voltage data satisfies the preset change rule, outputting preset abnormality prompt information through the display device of the oscilloscope and/or sending a probe abnormality indication to the probe control unit in the current oscilloscope probe;

Wherein, the probe abnormality indication is used to instruct the probe control unit to control the indicator light in the current oscilloscope probe to change to a target working state, and the target working state is used to indicate probe abnormality;

The embodiment of the present invention further provides an oscilloscope, in which the probe detection device provided by the embodiment of the present invention can be integrated. The oscilloscope includes an identification circuit, a memory, a processor, and a computer program stored in the memory and executable on the processor. The identification circuit includes a resistor, a constant voltage source, and a voltage detection unit, wherein the first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe, the second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor; when the processor executes the computer program, the probe detection method provided by the embodiment of the present invention is implemented. The specific structure of the oscilloscope can be seen in Figure 1 and the relevant content above.

An embodiment of the present invention further provides an oscilloscope system, comprising the oscilloscope probe as described in any embodiment of the present invention, and the oscilloscope as described in any embodiment of the present invention.

An embodiment of the present invention further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and the computer program is used to enable a processor to implement the probe detection method described in any embodiment of the present invention when executed.

In the context of the present invention, a computer readable storage medium may be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, device, or equipment. A computer readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or equipment, or any suitable combination of the foregoing. Alternatively, a computer readable storage medium may be a machine readable signal medium. A more specific example of a machine readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

To provide interaction with a user, the systems and techniques described herein may be implemented on an oscilloscope having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user can provide input to the oscilloscope. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

The probe detection device, oscilloscope and storage medium provided in the above embodiments can execute the probe detection method provided in any embodiment of the present invention, and have the corresponding functional modules and beneficial effects of executing the method. For technical details not described in detail in the above embodiments, please refer to the probe detection method provided in any embodiment of the present invention.

The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

An oscilloscope probe, characterized in that it comprises a signal test path and a detection circuit, wherein:

The signal test path is used to connect to an oscilloscope channel of an oscilloscope and send the measured signal to the oscilloscope channel;

The detection circuit includes a capacitor and a detection connector, the first end of the capacitor is grounded, the second end of the capacitor is electrically connected to the first end of the detection connector, and the second end of the detection connector is used to connect to the identification circuit in the oscilloscope, wherein the capacitance value of the capacitor is related to the type of the oscilloscope probe.
The oscilloscope probe according to claim 1, further comprising: a first indicator light connected in parallel with the capacitor and/or a second indicator light connected to a probe control unit;

Among them, the first indicator light is used to indicate the probe abnormality by switching between an off state and a lit state when the current flowing through the first indicator light changes due to a probe abnormality; the probe control unit is located in the oscilloscope probe, and is used to control the second indicator light to change to a target working state when receiving a probe abnormality indication sent by the oscilloscope, and the target working state is used to indicate the probe abnormality.
A probe detection method, characterized in that it is executed by a processor in an oscilloscope, the oscilloscope further comprising an identification circuit, the identification circuit comprising a resistor, a constant voltage source and a voltage detection unit, the first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to be connected to a detection connector of the oscilloscope probe, the second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor;

The method comprises:

Acquire multiple groups of voltage data, wherein each group of voltage data includes a voltage value of the first end of the resistor detected by the voltage detection unit and a detection time corresponding to the voltage value;

Determine a target capacitance value of a capacitor in a current oscilloscope probe according to the multiple sets of voltage data;

Based on a preset mapping relationship, the target type of the current oscilloscope probe is determined according to the target capacitance value, wherein the preset mapping relationship includes a corresponding relationship between the capacitance value and the type of the oscilloscope probe.
The method according to claim 3, characterized in that determining the target capacitance value of the capacitor in the current oscilloscope probe according to the multiple sets of voltage data comprises:

The target capacitance value of the capacitor in the current oscilloscope probe is determined according to the voltage value of the constant voltage source, the first detection time in the first voltage data, the target voltage value in the second voltage data, and the second detection time in the second voltage data; wherein the voltage value in the previous group of voltage data of the first voltage data is the voltage value of the constant voltage source; the voltage value of the constant voltage source is greater than the voltage value in the first voltage data; the second voltage data is the first group of voltage data in multiple consecutive groups of target voltage data; the absolute difference between each voltage value in the multiple groups of target voltage data and the target voltage value is less than a first preset threshold; and the number of groups of target voltage data is greater than a second preset threshold.
The method according to claim 4, characterized in that after determining the target type of the current oscilloscope probe according to the target capacitance value based on the preset mapping relationship, it also includes:

Setting corresponding channel parameters in the oscilloscope to target parameter values matching the target category;

Continue to acquire multiple sets of voltage data, and if changes in voltage values in the acquired multiple sets of voltage data satisfy a preset change rule, maintain the parameter value of the channel parameter as the target parameter value;

Among them, the preset change rule includes: after rising from a first voltage value to a peak value, it drops to a second voltage value within a preset time period; and the absolute differences between the first voltage value and the second voltage value and the target voltage value, respectively, are both less than the first preset threshold.
The method according to claim 4, further comprising:

Continue to acquire multiple sets of voltage data, and if changes in voltage values in the acquired multiple sets of voltage data satisfy a preset change rule, output preset abnormal prompt information through the display device of the oscilloscope and/or send a probe abnormality indication to a probe control unit in the current oscilloscope probe;

Wherein, the probe abnormality indication is used to instruct the probe control unit to control the indicator light in the current oscilloscope probe to change to a target working state, and the target working state is used to indicate probe abnormality;

Among them, the preset change rule includes: after rising from a first voltage value to a peak value, it drops to a second voltage value within a preset time period; and the absolute differences between the first voltage value and the second voltage value and the target voltage value, respectively, are both less than the first preset threshold.
A probe detection device, characterized in that it is integrated in an oscilloscope, the oscilloscope further comprises an identification circuit, the identification circuit comprises a resistor, a constant voltage source and a voltage detection unit, a first end of the resistor is electrically connected to a first end of the voltage detection unit and is used to be connected to a detection connector of an oscilloscope probe, a second end of the resistor is connected to a first end of the constant voltage source, a second end of the constant voltage source is grounded, and a second end of the voltage detection unit is connected to the processor;

The device comprises:

A voltage data acquisition module, used to acquire multiple groups of voltage data, wherein each group of voltage data includes a voltage value of the first end of the resistor detected by the voltage detection unit and a detection time corresponding to the voltage value;

A capacitance value determination module, used to determine a target capacitance value of a capacitor in a current oscilloscope probe according to the plurality of sets of voltage data;

The type determination module is used to determine the target type of the current oscilloscope probe according to the target capacitance value based on a preset mapping relationship, wherein the preset mapping relationship includes a corresponding relationship between the capacitance value and the type of the oscilloscope probe.
An oscilloscope comprises an identification circuit, a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that:

The identification circuit includes a resistor, a constant voltage source and a voltage detection unit, wherein a first end of the resistor is electrically connected to a first end of the voltage detection unit and is used to be connected to a detection connector of an oscilloscope probe, a second end of the resistor is connected to a first end of the constant voltage source, a second end of the constant voltage source is grounded, and a second end of the voltage detection unit is connected to the processor;

When the processor executes the computer program, the method according to any one of claims 3 to 6 is implemented.
An oscilloscope system, characterized by comprising the oscilloscope probe according to any one of claims 1 to 2, and the oscilloscope according to claim 8.
A computer-readable storage medium having a computer program stored thereon, characterized in that when the program is executed by a processor, the method according to any one of claims 3 to 6 is implemented.