WO2024066740A1

WO2024066740A1 - Detection circuit and control method therefor, and vehicle-mounted terminal device

Info

Publication number: WO2024066740A1
Application number: PCT/CN2023/111253
Authority: WO
Inventors: 屈明广; 王堋钰; 罗光军; 龙亚平
Original assignee: 华为技术有限公司
Priority date: 2022-09-27
Filing date: 2023-08-04
Publication date: 2024-04-04
Also published as: CN117824870A

Abstract

A detection circuit, comprising a first temperature sensing circuit (11), a second temperature sensing circuit (12), and a comparison circuit (13). The first temperature sensing circuit (11) and the second temperature sensing circuit (12) are integrated on a plurality of sampling points of an SoC in an automobile, and are configured to measure the temperature of a same sampling point within a preset time period. The first temperature sensing circuit (11) is further configured to convert the measured temperature into a first voltage according to a temperature-voltage fitting formula. The second temperature sensing circuit (12) is further configured to convert the measured temperature into a second voltage according to the temperature-voltage fitting formula that is used for representing the conversion relationship between temperature and voltage. The comparison circuit (13) is configured to compare the first voltage and the second voltage, and report a first comparison result if a difference between the first voltage and the second voltage is greater than a preset parameter. Also disclosed are a control method for the detection circuit, and a vehicle-mounted terminal device, relating to the technical field of automobiles, and capable of measuring the temperature of a sampling point and detecting whether a fault occurs to the first temperature sensing circuit (11) and the second temperature sensing circuit (12) that are used for measuring temperature, thereby improving the accuracy of the detection circuit.

Description

Detection circuit and control method thereof, and vehicle-mounted terminal equipment

This application claims priority to the Chinese patent application filed with the China Patent Office on September 27, 2022, with application number 202211179615.6 and application name “Detection circuit and control method thereof, vehicle-mounted terminal equipment”, all contents of which are incorporated by reference in this application.

Technical Field

The present application relates to the field of automobile technology, and in particular to a detection circuit and a control method thereof, and a vehicle-mounted terminal device.

Background technique

As the core of the vehicle system, the system on chip (SoC) integrates hardware such as the central processing unit (CPU), embedded neural network processor (NPU), image signal processor (ISP), video encoding (VENC), and video decoding (VDEC). The workload is heavy, which makes the ambient temperature of the SoC vary greatly.

For the SoC to work properly, it must be ensured that the SoC operates within the allowable junction temperature range, otherwise the working stability of the SoC cannot be guaranteed. Therefore, it is necessary to provide a complete solution that can detect the real-time operating temperature of the SoC in real time, accurately, safely and reliably during driving.

Summary of the invention

In order to solve the above technical problems, the present application provides a detection circuit and a control method thereof, and a vehicle-mounted terminal device, which can not only detect the temperature of the sampling point, but also detect whether the first temperature sensing circuit and the second temperature sensing circuit used for temperature measurement are faulty, so as to improve the accuracy of the detection circuit.

In a first aspect, the present application provides a memory, which includes a first temperature sensing circuit, a second temperature sensing circuit, and a comparison circuit. The first temperature sensing circuit and the second temperature sensing circuit are integrated on multiple sampling points of the SoC in the car, and are configured to detect the temperature of the same sampling point within a preset time. The first temperature sensing circuit is also configured to convert the detected temperature into a first voltage according to a temperature-voltage fitting formula. The second temperature sensing circuit is also configured to convert the detected temperature into a second voltage according to a temperature-voltage fitting formula, and the temperature-voltage fitting formula is used to characterize the conversion relationship between temperature and voltage. The comparison circuit is configured to compare the first voltage and the second voltage, and if the difference between the first voltage and the second voltage is greater than a preset parameter, a first comparison result is reported.

The multiple sampling points may be multiple different physical locations in the SoC. Optionally, locations in the SoC where the SoC is in a working state and where the heat generation and temperature are relatively high may be selected as sampling points. For example, the multiple sampling points may include an image processor, a central processing unit, an embedded neural network processor, a video encoder, a video decoder, and the like.

The present application can use the first temperature sensing circuit and the second temperature sensing circuit to detect the temperature of the sampling point, so as to avoid the temperature of the sampling point exceeding the allowable junction temperature range without being discovered, affecting the working stability of the SoC. On this basis, the detection circuit of the present application also includes a comparison circuit. Since the first temperature sensing circuit and the second temperature sensing circuit integrated on the same sampling point are very close in the physical layout, and the physical distance between the two is in the micron level, the difference between the detection results of the first temperature sensing circuit and the second temperature sensing circuit should be very small in theory. Therefore, the comparison circuit can also be used to compare the first voltage measured by the first temperature sensing circuit and the second voltage measured by the second temperature sensing circuit. If the difference between the first voltage and the second voltage is greater than the preset parameter, it may be that the first temperature sensing circuit and/or the second temperature sensing circuit are faulty, resulting in inaccurate detection results of the first temperature sensing circuit and/or the second temperature sensing circuit. In this case, the comparison circuit can report the first comparison result indicating that the first temperature sensing circuit and/or the second temperature sensing circuit are faulty, and other devices in the vehicle-mounted terminal device handle this problem, thereby improving the accuracy of the detection circuit detecting the temperature.

In some possible implementations, whether in the functional mode or in the first test mode, the first temperature sensing circuit and the second temperature sensing circuit simultaneously detect the temperature of the same sampling point. The comparison circuit is configured to perform real-time comparison between the received first voltage and the second voltage.

Compared with the time-sharing operation of the first temperature sensing circuit and the second temperature sensing circuit, when the first temperature sensing circuit and the second temperature sensing circuit operate at the same time, the first temperature sensing circuit There is no temperature measurement time difference between the first temperature sensing circuit and the second temperature sensing circuit. Therefore, the comparison result when the first temperature sensing circuit and the second temperature sensing circuit work at the same time is more accurate.

In some possible implementations, the first temperature sensing circuit and the second temperature sensing circuit detect the temperature of the same sampling point in a time-sharing manner. In the functional mode, the second temperature sensing circuit does not detect the temperature of the sampling point, the first temperature sensing circuit detects the first temperature of the sampling point, and converts the first temperature into a first voltage according to the temperature-voltage fitting formula. In the first test mode, the first temperature sensing circuit stops detecting the temperature of the sampling point, the second temperature sensing circuit detects the second temperature of the sampling point, and converts the second temperature into a second voltage according to the temperature-voltage fitting formula; the time difference between detecting the second temperature and detecting the first temperature is within a preset time range.

Compared with the first temperature sensing circuit and the second temperature sensing circuit working at the same time, when the first temperature sensing circuit and the second temperature sensing circuit work in time sharing, the second temperature sensing circuit does not need to work in the functional mode, and the first temperature sensing circuit does not need to work in the first test mode, which can reduce the power consumption of the detection circuit.

In some possible implementations, the temperature voltage fitting formula is Wherein, T represents the temperature collected by the first temperature sensing circuit and the second temperature sensing circuit, VT represents the first voltage and the second voltage, V25 represents the reference voltage corresponding to the temperature of 25°C, and a represents the linear slope of the temperature-voltage fitting formula. In this way, when the reference temperature is 25°C and the reference voltage V25 corresponding to the reference temperature is known, the first temperature can be converted into the first voltage and the second temperature can be converted into the second voltage according to the temperature-voltage fitting formula.

In some possible implementations, the first temperature sensing circuit includes a first bandgap reference voltage generator and a first temperature sensor, and the first bandgap reference voltage generator is used to provide a reference voltage for the first temperature sensor. The second temperature sensing circuit includes a second bandgap reference voltage generator and a second temperature sensor, and the second bandgap reference voltage generator is used to provide a reference voltage for the second temperature sensor.

The characteristic that "the first bandgap reference voltage generator and the second bandgap reference voltage generator are very little affected by the power supply and the preparation process parameters, and the relationship with the temperature is determined" can be utilized. The first bandgap reference voltage generator is used to provide a reference voltage for the first temperature sensor, and the second bandgap reference voltage generator is used to provide a reference voltage for the second temperature sensor.

Taking the example that both the first temperature sensor and the second temperature sensor are bipolar junction transistors, the material of the first temperature sensor is different from the material of the second temperature sensor, and/or the size of the first temperature sensor is different from the size of the second temperature sensor, that is, the first temperature sensor and the second temperature sensor are two heterogeneous bipolar junction transistors.

By comparing the first voltage converted by the heterogeneous first temperature sensor and the second voltage converted by the second temperature sensor through the comparison circuit, if the difference between the first temperature and the second temperature is within the preset parameter range, the temperature difference between the first temperature and the second temperature is very small. The temperature difference detected by the heterogeneous first temperature sensor and the second temperature sensor is very small, which further indicates that the temperatures detected by the first temperature sensor and the second temperature sensor are relatively accurate.

In some possible implementations, the comparison circuit is further configured to output a second comparison result when the difference between the first voltage and the second voltage is less than or equal to a preset parameter, and the second comparison result is used to indicate that both the first temperature sensing circuit and the second temperature sensing circuit are fault-free, and that the temperatures of the sampling points detected by the first temperature sensing circuit and the second temperature sensing circuit are both credible and reliable.

In some possible implementations, the first temperature sensing circuit is further configured to output a temperature alarm interrupt signal when the detected temperature exceeds a temperature threshold range, and the temperature threshold range is the junction temperature range allowed at the sampling point. The second temperature sensing circuit is further configured to output a temperature alarm interrupt signal when the detected temperature exceeds the temperature threshold range. This prevents the temperature at the sampling point from exceeding the allowable junction temperature range without being detected, thereby affecting the working stability of the SoC.

Furthermore, in order to detect whether the first temperature sensing circuit and the second temperature sensing circuit can output an over-temperature alarm interrupt signal after detecting a temperature exceeding the temperature threshold range, the first temperature sensing circuit and the second temperature sensing circuit can also be tested. For example, a temperature value can be directly input to the first temperature sensing circuit and the second temperature sensing circuit, and the temperature value exceeds the temperature threshold range to detect whether the first temperature sensing circuit and the second temperature sensing circuit can directly output an over-temperature alarm interrupt signal. If the first temperature sensing circuit and/or the second temperature sensing circuit do not output an over-temperature alarm, If the interrupt signal is received, the fault is reported.

In some possible implementations, the detection circuit further includes a multiplexer, an analog-to-digital converter, and a digital conversion circuit. The first temperature sensing circuit and/or the second temperature sensing circuit inputs the first voltage and/or the second voltage to the analog-to-digital converter through the multiplexer. The analog-to-digital converter is configured to convert the first voltage into a first digital signal, and/or, convert the second voltage into a second digital signal, and send the first digital signal and/or the second digital signal to the digital conversion circuit. The digital conversion circuit is configured to convert the first digital signal into a first temperature code value in the form of a digital signal, and/or, convert the second digital signal into a second temperature code value in the form of a digital signal. The comparison circuit is configured to compare the first voltage and the second voltage, and if the difference between the first voltage and the second voltage is greater than a preset parameter, then report a first comparison result, including: a comparison circuit is configured to compare the first temperature code value and the second temperature code value, and if the difference between the first temperature code value and the second temperature code value is greater than a preset parameter, then report the first comparison result.

For example, the first temperature sensing circuit and the second temperature sensing circuit work simultaneously. No matter in the functional mode or the first test mode, the first temperature sensing circuit can input the first voltage to the analog-to-digital converter through the multiplexer, and the second temperature sensing circuit can also input the second voltage to the analog-to-digital converter through the multiplexer.

Next, the analog-to-digital conversion circuit receives the first voltage and the second voltage, converts the first voltage into a first digital signal, converts the second voltage into a second digital signal, and then sends the first digital signal and the second digital signal to the digital conversion circuit.

Next, the digital conversion circuit receives the first digital signal and the second digital signal, converts the first digital signal into a first temperature code value in the form of a digital signal, converts the second digital signal into a second temperature code value in the form of a digital signal, and sends the first temperature code value and the second temperature code value to the input end of the comparison circuit. The comparison circuit compares the received first temperature code value and the second temperature code value, and reports a first comparison result if the difference between the first temperature code value and the second temperature code value is greater than a preset parameter; and reports a second comparison result if the difference between the first temperature code value and the second temperature code value is less than or equal to the preset parameter.

For another example, the first temperature sensing circuit and the second temperature sensing circuit work in time-sharing mode. In the functional mode, the first temperature sensing circuit can input the first voltage to the analog-to-digital converter through the multiplexer. The analog-to-digital conversion circuit can receive the first voltage, convert the first voltage into a first digital signal, and send the first digital signal to the digital conversion circuit. The digital conversion circuit receives the first digital signal, converts the first digital signal into a first temperature code value in the form of a digital signal, and sends the first temperature code value to the input end of the comparison circuit.

Then, in the first test mode, the second temperature sensing circuit can input the second voltage to the analog-to-digital converter through the multiplexer. The analog-to-digital conversion circuit can receive the second voltage, convert the second voltage into a second digital signal, and send the second digital signal to the digital conversion circuit. In the first test mode, the digital conversion circuit receives the second digital signal, converts the second digital signal into a second temperature code value in the form of a digital signal, and sends the second temperature code value to the input end of the comparison circuit.

Next, the comparison circuit compares the received first temperature code value and the second temperature code value. If the difference between the first temperature code value and the second temperature code value is greater than the preset parameter, the first comparison result is reported; if the difference between the first temperature code value and the second temperature code value is less than or equal to the preset parameter, the second comparison result is reported.

In some possible implementations, the detection circuit also includes an amplifier, which is electrically connected between the multiplexer and the analog-to-digital converter and is used to amplify the first voltage and/or the second voltage to avoid the first voltage and the second voltage being too small, the first temperature code value and the second temperature code value being too small, resulting in inaccurate comparison results of the comparison circuit.

In some possible implementations, the detection circuit also includes a test circuit. The test circuit can also be used to test the multiplexer, amplifier, analog-to-digital converter, and digital conversion circuit to avoid inaccurate comparison results of the comparison circuit due to failure of the multiplexer, and/or the amplifier, and/or the analog-to-digital converter, and/or the digital conversion circuit. For example, the test circuit includes a voltage divider resistor.

Specifically, in the second test mode, the first temperature sensing circuit and the second temperature sensing circuit stop detecting the temperature of the sampling point, the test circuit inputs the test voltage to the analog-to-digital converter through the multiplexer, and the test voltage outputs the test temperature code value through the analog-to-digital converter and the digital conversion circuit. The comparison circuit is also configured to compare the test temperature code value with the expected temperature code value, and if the difference between the test temperature code value and the expected temperature code value is greater than a preset parameter, a third comparison result is reported; the expected temperature code value is used to indicate the ideal temperature code value corresponding to the test voltage.

In some possible implementations, the detection circuit further includes a first register. The digital conversion circuit is further configured to send the first temperature code value and the second temperature code value to the first register, so as to temporarily store the first temperature code value and the second temperature code value using the first register. The first register is configured to output a ready signal.

In some possible implementations, the detection circuit further includes a sampling circuit, a second register, and an alarm circuit.

In the case where the first temperature sensing circuit and the second temperature sensing circuit simultaneously detect the temperature of the same sampling point, the comparison circuit is further configured to input the second comparison result to the alarm circuit. The alarm circuit is configured to respond to the received second comparison result and send a sampling signal to the sampling circuit. The sampling circuit is configured to respond to the received sampling signal, receive a ready signal, and collect the first temperature code value and the second temperature code value corresponding to the second comparison result from the first register, and send the first temperature code value and the second temperature code value to the second register for storage.

Alternatively, when the first temperature sensing circuit and the second temperature sensing circuit simultaneously detect the temperature of the same sampling point, the comparison circuit is further configured to input the first comparison result to the alarm circuit. The alarm circuit is configured to send a stop sampling signal to the sampling circuit in response to the received first comparison result. The sampling circuit is configured to stop collecting the first temperature code value and the second temperature code value corresponding to the first comparison result from the first register in response to the received stop sampling signal.

Alternatively, in the case where the first temperature sensing circuit and the second temperature sensing circuit detect the temperature of the same sampling point in time-sharing, the sampling circuit is configured to receive a ready signal, collect multiple first temperature code values and multiple second temperature code values from the first register, calculate the average value of the multiple first temperature code values as the first average value, calculate the average value of the multiple second temperature code values as the second average value, and send the first average value and the second average value to the comparison circuit. The comparison circuit is configured to compare the first average value and the second average value. The comparison circuit is also configured to send the second comparison result to the alarm circuit. The alarm circuit is configured to respond to the received second comparison result and send a sampling signal to the sampling circuit. The sampling circuit is configured to respond to the received sampling signal and send the first temperature code value and the second temperature code value corresponding to the second comparison result to the second register for storage.

Alternatively, when the first temperature sensing circuit and the second temperature sensing circuit detect the temperature of the same sampling point in time-sharing, the comparison circuit is further configured to send the first comparison result to the alarm circuit. The alarm circuit is configured to send a stop sampling signal to the sampling circuit in response to the received first comparison result. The sampling circuit is configured to stop sending the first temperature code value and the second temperature code value corresponding to the first comparison result to the second register in response to the received stop sampling signal.

In a second aspect, the present application provides a vehicle-mounted terminal device, characterized in that it includes a SoC and the detection circuit described in the first aspect.

The second aspect and any implementation of the second aspect correspond to the first aspect and any implementation of the first aspect respectively. The technical effects corresponding to the second aspect and any implementation of the second aspect can refer to the technical effects corresponding to the first aspect and any implementation of the first aspect, which will not be repeated here.

In some possible implementations, the vehicle-mounted terminal device also includes a low-power microcontroller unit, a fault collection circuit, and a safety island integrated on the SoC, and an off-chip microcontroller unit integrated outside the SoC.

A low-power microcontroller unit is used to configure the working mode of the detection circuit.

For example, the low-power microcontroller unit initiates a test to detect whether the first temperature sensing circuit and the second temperature sensing circuit can normally output an over-temperature alarm interrupt signal. It can configure a temperature value that exceeds the temperature threshold range for the first temperature sensing circuit and the second temperature sensing circuit to detect whether the first temperature sensing circuit and the second temperature sensing circuit can output an over-temperature alarm interrupt signal after detecting a temperature that exceeds the temperature threshold range.

For another example, the low power micro control unit initiates the second test mode and controls the test circuit to output a test voltage to detect whether the multiplexer, and/or the analog-to-digital converter, and/or the digital conversion circuit fails.

For another example, the low-power microcontroller unit initiates a test to detect whether the first register and the second register have faults, and configures write signals for the first register and the second register to determine whether the first register or the second register has faults based on the signals read from the first register and the second register.

The fault collection circuit is used to collect the faults of each hardware circuit in the SoC and send the faults to the safety island or the off-chip micro-control unit. The hardware circuit includes the detection circuit and the sampling point of the SoC. For example, after the alarm circuit receives the first comparison result, it can also send the first comparison result to the fault collection circuit, and the fault collection circuit decides whether to ignore the first comparison result or continue to report the first comparison result to the safety island or the off-chip micro-control unit.

The safety island and the off-chip microcontroller unit are used to receive the faults sent by the fault collection circuit and process the faults. For example, outside the polling time of the low-power microcontroller unit, if the first temperature sensing circuit and/or the second temperature sensing circuit detects that the temperature of the sampling point exceeds the allowable junction temperature, not only can the over-temperature alarm interrupt signal be sent to the low-power microcontroller unit, but also the over-temperature alarm interrupt signal can be sent to the off-chip microcontroller unit, and the off-chip microcontroller unit controls the board-level reset circuit or the power control circuit to reset or power off the SoC or the sampling point to avoid burning the SoC.

In a third aspect, the present application provides a control method for a detection circuit, wherein the detection circuit includes a first temperature sensing circuit, a second temperature sensing circuit, and a comparison circuit, wherein the first temperature sensing circuit and the second temperature sensing circuit are integrated at multiple sampling points of the SoC in the car.

The control method of the detection circuit includes: using a first temperature sensing circuit and a second temperature sensing circuit to detect the temperature of the same sampling point within a preset time. According to the temperature-voltage fitting formula, the detected temperature is converted into a first voltage by the first temperature sensing circuit, and the temperature-voltage fitting formula is used to characterize the conversion relationship between temperature and voltage. According to the temperature-voltage fitting formula, the detected temperature is converted into a second voltage by the second temperature sensing circuit. Using a comparison circuit, the first voltage and the second voltage are compared, and if the difference between the first voltage and the second voltage is greater than a preset parameter, the first comparison result is reported.

The third aspect and any implementation of the third aspect correspond to the first aspect and any implementation of the first aspect, respectively. The technical effects corresponding to the third aspect and any implementation of the third aspect can refer to the technical effects corresponding to the first aspect and any implementation of the first aspect, which will not be repeated here.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG1 is a diagram showing the relationship between modules in a SoC provided in an embodiment of the present application;

FIG2a is a diagram showing the locations of the first temperature sensing circuit and the second temperature sensing circuit provided in an embodiment of the present application;

FIG2b is a connection diagram of various circuits in a detection circuit provided in an embodiment of the present application;

FIG3 is a temperature voltage fitting diagram provided in an embodiment of the present application;

FIG4a is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application;

FIG4b is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application;

FIG5a is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application;

FIG5b is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application;

FIG5c is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application;

FIG6a is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application;

FIG6b is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application;

FIG6c is a connection diagram of various circuits in another detection circuit provided in an embodiment of the present application;

FIG7a is a working timing diagram of a first register and a sampling circuit provided in an embodiment of the present application;

FIG7b is a working timing diagram of another first register and sampling circuit provided in an embodiment of the present application;

FIG7c is a working timing diagram of another first register and sampling circuit provided in an embodiment of the present application;

FIG8a is a test diagram of a first register or a second register provided in an embodiment of the present application;

FIG8b is another test diagram of the first register or the second register provided in an embodiment of the present application;

FIG9 is a diagram showing the relationship between modules in the vehicle-mounted terminal device provided in an embodiment of the present application;

FIG10 is a working sequence diagram of a functional mode, a first test mode, and a second test mode provided in an embodiment of the present application;

FIG. 11 is a flow chart of a control detection circuit provided in an embodiment of the present application.

Reference numerals:
11-first temperature sensing circuit; 12-second temperature sensing circuit; 13-third temperature sensing circuit; 14-fourth temperature sensing circuit; 15-analog-to-digital converter; 16-
Digital conversion circuit; 17-amplifier; 18-test circuit; 21-first register; 22-sampling circuit; 23-second register; 24-alarm circuit.

Detailed ways

The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

The term "and/or" in this article is merely a description of the association relationship of associated objects, indicating that three relationships may exist. For example, A and/or B can mean: A exists alone, A and B exist at the same time, and B exists alone.

The terms "first" and "second" in the description and claims of the embodiments of the present application are used to distinguish different objects rather than to describe a specific order of objects. For example, a first target object and a second target object are used to distinguish different target objects rather than to describe a specific order of target objects.

In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

In the description of the embodiments of the present application, unless otherwise specified, the meaning of "multiple" refers to two or more than two. For example, multiple processing units refer to two or more processing units; multiple systems refer to two or more systems.

The embodiment of the present application provides a vehicle-mounted terminal device, which is applied to a vehicle, and the vehicle may be a smart car, an automatic driving car, an ordinary car driven by a human, etc., and the embodiment of the present application does not limit this. For the convenience of explanation, the following takes an automatic driving car as an example for illustration.

As the level of automobile intelligence increases, regulatory requirements, industry access standards, and consumer requirements and concerns about automobile functional safety are also increasing. In order to achieve the safety goals of automobiles, the International Organization for Standardization (ISO) divides the chips in the automotive industry into quality management (QM) and automotive safety integrity level (ASIL). Based on the evaluation of the three dimensions of hazard severity S, exposure E, and controllability C, the automotive safety integrity level includes four levels: ASIL A, ASIL B, ASIL C, and ASIL D. From ASIL A to ASIL D, the safety level increases successively. Only when the highest hazard combination requirements (i.e., S3+E4+C3) are met can the ASIL D level be achieved.

As shown in Figure 1, in the field of autonomous driving, SoC is the core of the mobile data center (MDC) platform. It integrates hardware circuits such as the central processing unit (CPU), embedded neural network processor (NPU), image signal processor (ISP), video encoder (VENC), and video decoder (VDEC); it is connected to various sensors, such as light detection and ranging (LIDAR), camera, radio detection and ranging (RADAR), etc.; it carries data analysis and intelligent processing of signals transmitted by these sensors, such as perception and fusion, planning and control, functional safety strategy control, etc. Therefore, ensuring that the core SoC of MDC can work stably and reliably is a basic problem that the autonomous driving system must solve. In particular, the SoC of MDC is directly related to personal safety. Therefore, the SoC of MDC must pass the automotive-grade safety certification of professional safety certification agencies before it can be truly installed on commercial vehicles. Among them, the ASIL-D safety level is a necessary condition to meet the L3, L4, and L5 autonomous driving safety level requirements.

L3 stands for conditional autonomous driving. Under certain conditions, the autonomous driving system completes all driving operations, and the driver provides appropriate responses based on the autonomous driving system's requests.

L4 stands for highly automated driving. The automated driving system can complete all driving operations, and the automated driving car can be driven on some roads without the need for a driver.

L5 means fully automated driving, where the driver does not need to participate in driving operations at all.

The background technology mentioned that in order for SoC to work properly, it must be ensured that SoC works within the allowable junction temperature range, which is usually between -40°C and 95°C. SoC includes multiple sampling points at different physical locations. If the temperature of any sampling point exceeds the allowable junction temperature range, the working stability of SoC may not be guaranteed, and even accidents that endanger personal safety may occur. Here, those skilled in the art should know that junction temperature refers to: the actual operating temperature of semiconductor devices in electronic equipment.

In addition, if the sensor used to detect the temperature of the sampling point fails, the temperature detected by the sensor may be inaccurate, so that the actual temperature of the sampling point may exceed the allowable junction temperature range without being detected, resulting in the inability to ensure the working stability of the SoC, and even accidents that endanger personal safety may occur. Alternatively, due to the inaccurate temperature detected by the sensor, false alarms are triggered, affecting the user experience.

Based on the above, an embodiment of the present application provides a detection circuit, which may include a first temperature sensing circuit and a second temperature sensing circuit, and is integrated in a SoC. The first temperature sensing circuit and the second temperature sensing circuit can be used to detect the temperature of the same sampling point to avoid at least some sampling points operating outside the allowable junction temperature range without being discovered. At the same time, the temperatures detected by the first temperature sensing circuit and the second temperature sensing circuit can also serve as a reference to each other to avoid inaccurate measured temperatures due to damage to the first temperature sensing circuit and/or the second temperature sensing circuit.

As shown in Fig. 2a and Fig. 2b, the detection circuit includes a first temperature sensing circuit 11, a second temperature sensing circuit 12, and a comparison circuit 13. The first temperature sensing circuit 11 and the second temperature sensing circuit 12 are integrated at multiple sampling points of the SoC in the car and are configured to detect the temperature of the same sampling point within a preset time.

The first temperature sensing circuit 11 is further configured to convert the detected temperature into a first voltage according to a temperature-voltage fitting formula. The temperature-voltage fitting formula is used to characterize the conversion relationship between temperature and voltage. The second temperature sensing circuit 12 is further configured to convert the detected temperature into a second voltage according to the temperature-voltage fitting formula.

The comparison circuit 13 is configured to compare the first voltage and the second voltage, and report a first comparison result if the difference between the first voltage and the second voltage is greater than a preset parameter. The first comparison result is used to indicate that the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 is faulty.

The present application can use the first temperature sensing circuit 11 and the second temperature sensing circuit 12 to detect the temperature of the sampling point to avoid the temperature of the sampling point exceeding the allowable junction temperature range without being discovered, affecting the working stability of the SoC. On this basis, the detection circuit of the present application also includes a comparison circuit 13. Since the first temperature sensing circuit 11 and the second temperature sensing circuit 12 integrated at the same sampling point are very close in the physical layout, and the physical distance between the two is in the micron level, theoretically, the difference in the detection results of the first temperature sensing circuit 11 and the second temperature sensing circuit 12 should be very small. Therefore, the comparison circuit 13 can also be used to compare the first voltage measured by the first temperature sensing circuit 11 and the second voltage measured by the second temperature sensing circuit 12. If the difference between the first voltage and the second voltage is greater than the preset parameter, it may be that the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 is faulty, resulting in inaccurate detection results of the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12. In this case, the comparison circuit 13 can report the first comparison result indicating that the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 has a fault, and other components in the vehicle-mounted terminal device can handle this problem, thereby improving the accuracy of the detection circuit in detecting temperature.

In some possible implementations, the multiple sampling points may be multiple different physical locations in the SoC. Optionally, locations in the SoC where the SoC is in a working state and where the heat generation and temperature are relatively high may be selected as sampling points. For example, as shown in FIG2a , the multiple sampling points may include an image processor, a central processing unit, an embedded neural network processor, a video encoder, a video decoder, and the like.

In some possible implementations, the detection circuit can operate in a functional mode to monitor the temperature of a sampling point. The detection circuit can also operate in a first test mode to test whether the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 fails.

In some possible implementations, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 are configured to detect the temperature of the same sampling point within a preset time, which means that the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can both detect the temperature of the same sampling point, and the time difference between the first temperature sensing circuit 11 and the second temperature sensing circuit 12 measuring the temperature of the same sampling point is within a preset time range. The embodiment of the present application does not limit the range of the preset time, as long as the temperature of the sampling point does not change rapidly within the preset time. For example, the preset time range can be 10ms to 40ms.

In one case, whether in the functional mode or in the first test mode, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 both detect the temperature of the same sampling point at the same time. After the first temperature sensing circuit 11 converts the detected first temperature into a first voltage and the second temperature sensing circuit 12 converts the detected second temperature into a second voltage, the first voltage and the second voltage can be sent to the comparison circuit 13 at the same time. The comparison circuit 13 can compare the first voltage and the second voltage in real time each time it receives a first voltage and a second voltage. Compared with the time-sharing operation of the first temperature sensing circuit 11 and the second temperature sensing circuit 12, because there is no temperature measurement time difference between the first temperature sensing circuit 11 and the second temperature sensing circuit 12 when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work at the same time, the comparison result when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work at the same time is more accurate.

In another case, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time sharing. In the functional mode, the enable temp_en2 for controlling the operation of the second temperature sensing circuit 12 = 0, indicating that no enable signal is sent to the second temperature sensing circuit 12, the second temperature sensing circuit 12 is in a non-operating state, and the temperature of the sampling point is not detected. The enable temp_en1 for controlling the operation of the first temperature sensing circuit 11 = 1, the first temperature sensing circuit 11 is in a working state, and the first temperature sensing circuit 11 can detect the temperature of the sampling point in real time, which is named the first temperature. The first temperature sensing circuit 11 can also convert the first temperature into a first voltage according to the temperature-voltage fitting formula.

In the first test mode, the enable temp_en1 for controlling the operation of the first temperature sensing circuit 11 is 0, indicating that no enable signal is sent to the first temperature sensing circuit 11, and the first temperature sensing circuit 11 can be switched to a non-operating state and stop detecting the temperature of the sampling point. The enable temp_en2 for controlling the operation of the second temperature sensing circuit 12 is 1, and the second temperature sensing circuit 12 is switched to an operating state, and the second temperature sensing circuit 12 can detect the temperature of the sampling point, which is named the second temperature. The second temperature sensing circuit can also convert the second temperature into a second voltage according to the temperature-voltage fitting formula.

Compared with the first temperature sensing circuit 11 and the second temperature sensing circuit 12 working at the same time, when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time-sharing mode, the second temperature sensing circuit 12 does not need to work in the functional mode, and the first temperature sensing circuit 11 does not need to work in the first test mode, which can reduce the power consumption of the detection circuit.

Optionally, in a continuous function mode and a first test mode, the first temperature sensing circuit 11 in the function mode may be The first voltage input to the comparison circuit 13 once is compared with the second voltage input to the comparison circuit 13 for the first time by the second temperature sensing circuit 12, so as to avoid the time interval between detecting the first temperature and the second temperature exceeding the preset time, resulting in a large temperature difference at the sampling point due to the long interval time, and being mistakenly judged as a failure of the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12.

Optionally, the comparison circuit 13 may also compare multiple first voltages with multiple second voltages. For example, the comparison circuit 13 may compare an average value of 16 first voltages with an average value of 16 second voltages.

The above example is explained by taking the case where the detection circuit first works in the functional mode and then works in the first test mode when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time-sharing mode. In other possible implementations, when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time-sharing mode, the detection circuit may also first work in the first test mode and then work in the functional mode, which is not limited in the embodiments of the present application.

In some possible implementations, the temperature-voltage fitting formula may be used to characterize the conversion relationship between temperature and voltage, so as to convert a first temperature into a first voltage and convert a second temperature into a second voltage.

FIG3 shows a temperature and voltage fitting curve diagram. The fitted actual temperature-voltage curve diagram can be regarded as a linear ideal temperature-voltage relationship diagram, thereby obtaining Formula 1: V ₂₅ =25*a+b, Formula 2: _VT =T*a+b. Subtracting Formula 1 from Formula 2, the temperature-voltage fitting formula can be obtained: Wherein, T represents the first temperature detected by the first temperature sensing circuit 11, and VT represents the first voltage; or, T represents the second temperature detected by the second temperature sensing circuit 12, and VT represents the second voltage. V25 represents the reference voltage corresponding to the temperature of 25°C. a represents the linear slope of the temperature voltage fitting formula.

In this way, when the reference temperature is known to be 25° C. and the reference voltage V25 corresponding to the reference temperature, the first temperature can be converted into the first voltage and the second temperature can be converted into the second voltage according to the temperature-voltage fitting formula.

It should be noted here that the reference temperature is 25°C and the reference voltage corresponding to the reference temperature is V25, which is only an example. Optionally, the reference temperature and the reference voltage can also be other, as long as the relationship between the reference temperature and the reference voltage can satisfy the ideal temperature-voltage relationship diagram shown in Figure 3. The above temperature-voltage fitting formula is only an example, and the temperature-voltage fitting formula can also be other, which is not limited in the embodiments of the present application.

In some possible implementation methods, the embodiments of the present application do not limit the specific circuit structures of the first temperature sensing circuit 11 and the second temperature sensing circuit 12, as long as the first temperature sensing circuit 11 can convert the first temperature into the first voltage based on the temperature-voltage fitting formula, and the second temperature sensing circuit 12 can convert the second temperature into the second voltage based on the temperature-voltage fitting formula.

Optionally, as shown in FIG4a , the first temperature sensing circuit 11 includes a first bandgap reference voltage generator (BGR) 111 and a first temperature sensor 112, wherein the first bandgap reference voltage generator 111 is used to provide a reference voltage Vref for the first temperature sensor 112. The second temperature sensing circuit 12 includes a second bandgap reference voltage generator 121 and a second temperature sensor 122, wherein the second bandgap reference voltage generator 121 is used to provide a reference voltage Vref for the second temperature sensor 122.

The characteristic that "the first bandgap reference voltage generator 111 and the second bandgap reference voltage generator 121 are very little affected by the power supply and the manufacturing process parameters, and the relationship with the temperature is determined" can be utilized. The first bandgap reference voltage generator 111 is used to provide a reference voltage Vref for the first temperature sensor 112, and the second bandgap reference voltage generator 121 is used to provide a reference voltage Vref for the second temperature sensor 122.

The embodiment of the present application does not limit the specific circuit structure of the first temperature sensor 112 and the second temperature sensor 122, as long as the first temperature sensor 112 and the second temperature sensor 122 can convert the detected temperature into a voltage value according to a predetermined temperature-voltage fitting formula.

Optionally, the first temperature sensor 112 and the second temperature sensor 122 may both be bipolar junction transistors. Of course, the first temperature sensor 112 and the second temperature sensor 122 can also be different temperature sensors, which is not limited in the embodiment of the present application.

In some possible implementations, taking the example that both the first temperature sensor 112 and the second temperature sensor 122 are bipolar junction transistors, the size and material of the first temperature sensor 112 may be the same as the size and material of the second temperature sensor 122. In other possible implementations, the size of the first temperature sensor 112 is different from the size of the second temperature sensor 122, and/or the material of the first temperature sensor 112 is different from the material of the second temperature sensor 122, that is, the first temperature sensor 112 and the second temperature sensor 122 are two heterogeneous bipolar junction transistors.

By comparing the comparison circuit 13, if the difference between the first voltage converted by the heterogeneous first temperature sensor 112 and the second voltage converted by the second temperature sensor 122 is within the preset parameter range, the temperature difference between the first temperature and the second temperature is very small. The temperature difference detected by the heterogeneous first temperature sensor 112 and the second temperature sensor 122 is very small, which further indicates that the temperatures detected by the first temperature sensor 112 and the second temperature sensor 122 are relatively accurate.

In some other possible implementations, the size of the first temperature sensor 112 may also be the same as the size of the second temperature sensor 122 , and the material of the first temperature sensor 112 may also be the same as the material of the second temperature sensor 122 .

On this basis, as shown in FIG4b, the detection circuit may further include a third temperature sensing circuit 103 and a fourth temperature sensing circuit 104, and the third temperature sensing circuit 103 and the fourth temperature sensing circuit 104 are integrated with the first temperature sensing circuit 11 and the second temperature sensing circuit 12 at the same sampling point. In addition, the third temperature sensing circuit 103 includes a third bandgap reference voltage generator and a third temperature sensor, and the fourth temperature sensing circuit 104 includes a fourth bandgap reference voltage generator and a fourth temperature sensor. The size of the third temperature sensor is the same as that of the fourth temperature sensor, and the material of the third temperature sensor is the same as that of the fourth temperature sensor. The size of the third temperature sensor and the fourth temperature sensor is different from the size of the first temperature sensor 112 and the second temperature sensor 122, and the material of the third temperature sensor and the fourth temperature sensor is different from the material of the first temperature sensor 112 and the second temperature sensor 122. That is, the third temperature sensor and the fourth temperature sensor are heterogeneous temperature sensors with the first temperature sensor 112 and the second temperature sensor 122.

In this way, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can be used for reference with the third temperature sensing circuit 103 and the fourth temperature sensing circuit 104. If the difference between the detection results of the first temperature sensing circuit 11 and the second temperature sensing circuit 12 and the detection results of the third temperature sensing circuit 103 and the fourth temperature sensing circuit 104 is within the preset parameter range, it means that the temperatures detected by the first temperature sensor 112, the second temperature sensor 122, the third temperature sensing circuit 103 and the fourth temperature sensing circuit 104 are relatively accurate.

In some possible implementations, the embodiments of the present application do not limit the specific values and manifestations of the preset parameters. The specific values of the preset parameters are related to the object compared by the comparison circuit 13, the preset time and other parameters. For example, the comparison circuit 13 compares the first voltage and the second voltage, and the value of the preset parameter can be a preset voltage value. For another example, the comparison circuit 13 below compares the first temperature code value and the second temperature code value, and the value of the preset parameter can be a preset temperature code value. Whether the preset parameter is a preset voltage value or a preset temperature code value, it can correspond to a temperature value. For example, a preset temperature code value of 6 indicates that the temperature value is 0.5°C, that is, if the difference between the first temperature and the second temperature is greater than 0.5°C, the comparison circuit 13 outputs a first comparison result. The temperature value corresponding to the preset parameter is 0.5°C for demonstration only. Optionally, the temperature value corresponding to the preset parameter can be 2°C.

In some possible implementations, a temperature threshold range may be set for the temperature of the sampling point. Once the temperature detected by the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 exceeds the temperature threshold range, the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 may directly output an over-temperature alarm interrupt signal. The temperature threshold range may be an allowable junction temperature range of -40°C to 95°C.

In order to detect whether the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can output an over-temperature alarm interrupt signal after detecting a temperature exceeding the temperature threshold range, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can also be tested. For example, a temperature value can be directly input to the first temperature sensing circuit 11 and the second temperature sensing circuit 12, and the temperature value exceeds the temperature threshold range to detect whether the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can directly output an over-temperature alarm interrupt signal. If the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 does not output an over-temperature alarm interrupt signal, the fault is reported.

In some possible implementations, the SoC includes multiple sampling points to be detected. During the detection process, the temperatures of the multiple sampling points can be detected simultaneously, or they can be detected in turn in a sequence. If the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 integrated at one of the sampling points fails, or the temperature of one sampling point exceeds the temperature threshold range, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 integrated at other sampling points will continue to detect.

The above embodiment describes that when the difference between the first voltage and the second voltage is greater than the preset parameter, the comparison circuit 13 outputs the first comparison result. In some other possible implementations, the difference between the first voltage and the second voltage may also be less than or equal to a preset parameter. In this case, the comparison circuit 13 may output a second comparison result, and the second comparison result is used to indicate that both the first temperature sensing circuit 11 and the second temperature sensing circuit 12 are fault-free, and the temperatures of the sampling points detected by the first temperature sensing circuit 11 and the second temperature sensing circuit 12 are credible and reliable.

In some embodiments, as shown in FIG. 5 a , the detection circuit may further include a multiplexer 14 , an analog-to-digital converter 15 , and a digital conversion circuit 16 .

The first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 may input the first voltage and/or the second voltage to the analog-to-digital converter 15 through the multiplexer 14 .

The analog-to-digital conversion circuit 15 is configured to convert the first voltage into a first digital signal and/or convert the second voltage into a second digital signal, and send the first digital signal and/or the second digital signal to the digital conversion circuit 16 .

The digital conversion circuit 16 is configured to convert the first digital signal into a first temperature code value in the form of a digital signal, and/or to convert the second digital signal into a second temperature code value in the form of a digital signal.

For example, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work simultaneously. No matter in the functional mode or the first test mode, the first temperature sensing circuit 11 can input the first voltage to the analog-to-digital converter 15 through the multiplexer 14, and the second temperature sensing circuit 12 can also input the second voltage to the analog-to-digital converter 15 through the multiplexer 14.

Next, the analog-to-digital conversion circuit 15 receives the first voltage and the second voltage, converts the first voltage into a first digital signal, converts the second voltage into a second digital signal, and then sends the first digital signal and the second digital signal to the digital conversion circuit 16 .

Next, the digital conversion circuit 16 receives the first digital signal and the second digital signal, converts the first digital signal into a first temperature code value in the form of a digital signal, converts the second digital signal into a second temperature code value in the form of a digital signal, and sends the first temperature code value and the second temperature code value to the input end of the comparison circuit 13. The comparison circuit 13 compares the received first temperature code value and the second temperature code value, and reports a first comparison result if the difference between the first temperature code value and the second temperature code value is greater than a preset parameter; and reports a second comparison result if the difference between the first temperature code value and the second temperature code value is less than or equal to the preset parameter.

For another example, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time-sharing mode. In the functional mode, the first temperature sensing circuit 11 can input the first voltage to the analog-to-digital converter 15 through the multiplexer 14. The analog-to-digital conversion circuit 15 can receive the first voltage, convert the first voltage into a first digital signal, and send the first digital signal to the digital conversion circuit 16. The digital conversion circuit 16 receives the first digital signal, converts the first digital signal into a first temperature code value in the form of a digital signal, and sends the first temperature code value to the input end of the comparison circuit 13.

Next, in the first test mode, the second temperature sensing circuit 12 can input the second voltage to the analog-to-digital converter 15 through the multiplexer 14. The analog-to-digital conversion circuit 15 can receive the second voltage, convert the second voltage into a second digital signal, and send the second digital signal to the digital conversion circuit 16. In the first test mode, the digital conversion circuit 16 receives the second digital signal, converts the second digital signal into a second temperature code value in the form of a digital signal, and sends the second temperature code value to the input end of the comparison circuit 13.

Next, the comparison circuit 13 compares the received first temperature code value and the second temperature code value. If the difference between the first temperature code value and the second temperature code value is greater than the preset parameter, the first comparison result is reported; if the difference between the first temperature code value and the second temperature code value is less than or equal to the preset parameter, the second comparison result is reported.

In some possible implementations, the first comparison result and the second comparison result may also be embodied in the form of digital signals. For example, the comparison circuit 13 outputs 0, indicating that the comparison circuit 13 outputs the first comparison result. The comparison circuit 13 outputs 1, indicating that the comparison circuit outputs the second comparison result.

Of course, the first comparison result and the second comparison result may also be represented by more bits and other digital signals, which is not limited in the embodiment of the present application.

In some possible implementations, the embodiments of the present application do not limit the number of bits of the first temperature code value and the second temperature code value. Optionally, if the memory allows, the number of bits of the first temperature code value and the second temperature code value can be as many as possible so as to correspond to each temperature more accurately. For example, the number of bits of the first temperature code value and the second temperature code value can be 16 bits, 32 bits, etc. For the convenience of explanation, the following description is based on the assumption that the number of bits of the first temperature code value and the second temperature code value is 16 bits.

In some possible implementations, as shown in FIG. 5b , the detection circuit may further include an amplifier 17, which may be electrically connected between the multiplexer 14 and the analog-to-digital converter 15, and is used to amplify the first voltage and/or the second voltage to prevent the first voltage and the second voltage from being too small, the first temperature code value and the second temperature code value from being too small, and causing the comparison result of the comparison circuit 13 to be inaccurate. Yes.

In some embodiments, the multiplexer 14, amplifier 17, analog-to-digital converter 15, and digital conversion circuit 16 may also be tested to avoid inaccurate comparison results of the comparison circuit 13 due to malfunctions of the multiplexer 14, and/or the amplifier 17, and/or the analog-to-digital converter 15, and/or the digital conversion circuit 16.

Based on this, as shown in Fig. 5c, the detection circuit may further include a test circuit 18, and the detection circuit may also operate in a second test mode. The second test mode is used to detect whether the multiplexer 14, and/or the analog-to-digital converter 15, and/or the digital conversion circuit 16 has a fault.

In the second test mode, the enable temp_en1 for controlling the operation of the first temperature sensing circuit 11 is set to 0, and the enable temp_en2 for controlling the operation of the second temperature sensing circuit 12 is set to 0, and the first temperature sensing circuit 11 and the second temperature sensing circuit 12 stop detecting the temperature of the sampling point. The test circuit 18 inputs a test voltage to the analog-to-digital converter 15 through the multiplexer 14, and then the test voltage outputs a test temperature code value through the analog-to-digital converter 15 and the digital conversion circuit 16.

The comparison circuit 13 is further configured to compare the test temperature code value with the expected temperature code value, and if the difference between the test temperature code value and the expected temperature code value is greater than a preset parameter, a third comparison result is reported. The expected temperature code value is used to indicate an ideal temperature code value corresponding to the test voltage. The third comparison result is used to indicate that the multiplexer 14, and/or the analog-to-digital converter 15, and/or the digital conversion circuit 16 has a fault, and the comparison circuit 13 outputs the third comparison result.

In some possible implementations, the test circuit 18 can output multiple test voltages with different voltage values to detect whether the multiplexer 14, the analog-to-digital converter 15, and the digital conversion circuit 16 fail under different test voltage modes. For example, the test voltage can be divided into at least three levels: high, medium, and low, and the specific voltage value of each level can be set according to actual conditions. The above-mentioned high, medium, and low test voltages can be the same as the voltage values converted by the high, medium, and third temperature according to the temperature voltage fitting formula.

For example, when the allowable junction temperature range is -40℃～105℃, the high-range test voltage can be 80℃, which is the same voltage value converted according to the temperature-voltage fitting formula; the mid-range test voltage can be 30℃, which is the same voltage value converted according to the temperature-voltage fitting formula; the low-range test voltage can be -20℃, which is the same voltage value converted according to the temperature-voltage fitting formula.

The present application does not limit the specific circuit structure of the test circuit 18, as long as the test circuit 18 can output multiple test voltages with different voltage values. Optionally, the test circuit 18 can be a voltage divider resistor.

In some embodiments, as shown in FIG6a and FIG6b , the test circuit 18 may further include a first register 21 , a sampling circuit 22 , a second register 23 , and an alarm circuit 24 . The output end of the comparison circuit 13 is also electrically connected to the alarm circuit 24 .

As shown in Fig. 6a, when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work simultaneously, the digital conversion circuit 16 can send the first temperature code value and the second temperature code value to the first register 21. After receiving the first temperature code value and the second temperature code value, the first register 21 can send a ready signal ready to the sampling circuit 22. If the comparison circuit sends the second comparison result to the alarm circuit 24, the alarm circuit 24 sends a sampling signal to the sampling circuit. The sampling circuit 22 can receive the ready signal ready, and collect the first temperature code value and the second temperature code value from the first register 21, and send the collected first temperature code value and the second temperature code value to the second register 23 for storage, so as to facilitate subsequent fault analysis and location, as well as responsibility definition and problem tracing after a traffic accident occurs.

If the comparison circuit 13 inputs the first comparison result to the alarm circuit 24, it means that the first temperature code value and the second temperature code value corresponding to the first comparison result are temporarily unreliable and do not need to be stored in the second register 23. Therefore, after receiving the first comparison result, the alarm circuit 24 sends a stop sampling signal to the sampling circuit 22. The sampling circuit 22 receives the stop sampling signal and does not collect the first temperature code value and the second temperature code value corresponding to the first comparison result from the first register 21.

As shown in FIG6b, when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time-sharing mode, in the functional mode, the digital conversion circuit 16 sends the converted first temperature code value to the first register 21. After receiving the first temperature code value, the first register 21 can send a ready signal ready to the sampling circuit 22. After receiving the ready signal ready, the sampling circuit 22 can collect the first temperature code value.

Next, in the first test mode, the digital conversion circuit 16 sends the converted second temperature code value to the first register 21. After receiving the second temperature code value, the first register 21 may send a ready signal ready to the sampling circuit 22. After receiving the ready signal ready, the sampling circuit 22 may collect the second temperature code value.

On this basis, if the comparison circuit 13 compares a first temperature code value with a second temperature code value, the sampling circuit 22 can send a first temperature code value and a second temperature code value to the comparison circuit 13, and the comparison circuit 13 compares the first temperature code value with the second temperature code value. If the comparison circuit 13 outputs a first comparison result, the comparison circuit 13 can compare the first temperature code value with the second temperature code value. The result is sent to the alarm circuit 24.

As shown in FIG6c, if the comparison circuit 13 compares a plurality of first temperature code values with a plurality of second temperature code values, the sampling circuit 22 may also first calculate the average value of the plurality of first temperature code values to obtain a first average value, calculate the average value of the plurality of second temperature code values to obtain a second average value, and then send the first average value and the second average value to the comparison circuit 13, and the comparison circuit 13 compares the first average value with the second average value. If the comparison circuit 13 outputs a first comparison result, the comparison circuit 13 may send the first comparison result to the alarm circuit 24. Compared with the comparison circuit 13 comparing a first temperature code value with a second temperature code value, the comparison circuit 13 compares the first average value with the second average value, which can avoid that some first temperature code values or second temperature code values have glitches, resulting in an error in the comparison of the comparison circuit 13, and then causing the alarm circuit 24 to report incorrectly.

Next, if the comparison circuit 13 inputs the first comparison result to the alarm circuit 24, it means that the first temperature code value and the second temperature code value corresponding to the first comparison result are temporarily unreliable and do not need to be stored in the second register 23. Therefore, after receiving the first comparison result, the alarm circuit 24 sends a stop sampling signal to the sampling circuit 22. The sampling circuit 22 receives the stop sampling signal and no longer sends the first temperature code value and the second temperature code value corresponding to the first comparison result to the second register 23.

If the comparison circuit 13 inputs the second comparison result to the alarm circuit 24, the alarm circuit 24 sends a sampling signal to the sampling circuit 22. The sampling circuit 22 receives the sampling signal and sends the first temperature code value and the second temperature code value corresponding to the second comparison result to the second register 23 for storage, so as to facilitate subsequent fault analysis and location, as well as responsibility definition and problem tracing after a traffic accident occurs.

The above description exemplarily illustrates the connection relationship and the working process of the first register 21, the sampling circuit 22, the second register 23, the alarm circuit 24 and the comparison circuit 13 when the first temperature code value is compared with the second temperature code value. In other possible implementations, when the test temperature code value is compared with the first temperature code value or the second temperature code value, the connection relationship and the working process shown in Figures 6a and 6b can also be used, which will not be repeated here.

For example, as shown in Figures 7a to 7c, the comparison circuit 13 can compare 16 16-bit first temperature code values with 16 16-bit second temperature code values. Of course, the number of first temperature code values and second temperature code values compared by the comparison circuit 13 can also be other, and the embodiment of the present application does not limit this.

FIG7a shows a timing diagram of the operation of each circuit in the detection circuit when the first temperature sensing circuit 11 is working. As shown in FIG7a and FIG7c, under the control of the enable signal temp_en1, the first temperature sensing circuit 11 detects the first temperature of the sampling point and converts the first temperature into a first voltage. After a series of conversions, the first voltage is stored in the first register 21 as a first temperature code value. Among them, reg1~reg16 can represent 16 first temperature code values. Each time the first register 21 receives a first temperature code value, it sends a ready signal ready to the sampling circuit 22. Each time the sampling circuit 22 receives a ready signal ready, it can collect a first temperature code value from the first register 21 until the sampling circuit 22 collects 1 to 16 first temperature code values from the first register 21. While the sampling circuit 22 receives the 17th ready signal ready sent by the first register 21, it can also calculate the first average value reg17 of the 1st to 16th first temperature code values.

FIG7b shows a timing diagram of the operation of each circuit in the detection circuit when the first temperature sensing circuit 12 is working. As shown in FIG7b and FIG7c, under the control of the enable signal temp_en2, the second temperature sensing circuit 12 detects the second temperature of the sampling point and converts the second temperature into a second voltage. After a series of conversions, the second voltage is stored in the first register 21 as a second temperature code value. Among them, reg1~reg16 can represent 16 second temperature code values. Each time the first register 21 receives a second temperature code value, it sends a ready signal ready to the sampling circuit 22. Each time the sampling circuit 22 receives a ready signal ready, it can collect a second temperature code value from the first register 21 until the sampling circuit 22 collects 1 to 16 second temperature code values from the first register 21. While the sampling circuit 22 receives the 17th ready signal ready sent by the first register 21, it can also calculate the second average value reg17 of the 1st to 16th second temperature code values.

In some possible implementations, the detection circuit may further include a counter to detect whether the first register 21 can output a ready signal ready on time. A specified counting time, such as 25 microseconds, may be configured for the first register 21, and the countdown function of the counter may be started. If the first register 21 should input a ready signal ready to the sampling circuit 22 when the counter is 0, the first register 21 may output a ready signal ready on time. If the first register 21 has not input a ready signal ready to the sampling circuit 22 when the counter is 0, the first register 21, and/or the digital conversion circuit 16, and/or the analog-to-digital converter 15, and/or the multiplexer 14, and/or the first temperature sensing circuit 11, and/or the second temperature sensing circuit 12, and/or the internal logic of the first register 21 may be faulty, and the fault may be reported.

In some possible implementations, as shown in FIG. 8 a and FIG. 8 b , the first register 21 and the second register 23 may also be tested to detect whether the signals read out are consistent with the signals written therein.

For example, 0000 can be directly written to the first register 21 or the second register 23, and then the signal in the first register 21 or the second register 23 can be read. As shown in FIG8a, if the signal read from the first register 21 or the second register 23 is also 0000, the first register 21 or the second register 23 can work normally; as shown in FIG8b, if the signal read from the first register 21 or the second register 23 is inconsistent with 0000, for example, the read signal is 0001, the first register 21 or the second register 23 may have a fault, and the fault should be reported.

In some embodiments, as shown in FIG9 , the vehicle-mounted terminal device may further include a low power microcontroller unit (LP MCU), a esception management unit (EMU), and a safety island. The LP MCU, EMU, and safety island may also be integrated on the SoC. In addition, the vehicle-mounted terminal device may further include an off-chip microcontroller unit (MCU) integrated outside the SoC. The MCU is used to monitor the working status of each core chip (such as SoC) in the vehicle-mounted terminal device.

The LP MCU can be an automotive-grade microcontroller unit (for example, ARM's R52 core). The LP MCU can run low-power firmware, SoC temperature detection software, etc., switch between various working modes, and read the first temperature code value or the second temperature code value of the sampling point detected in real time by the second register 23 by configuring test parameters and timed polling.

For example, the LP MCU initiates a test to detect whether the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can normally output an over-temperature alarm interrupt signal. It can configure a temperature value that exceeds the temperature threshold range for the first temperature sensing circuit 11 and the second temperature sensing circuit 12 to detect whether the first temperature sensing circuit 11 and the second temperature sensing circuit 12 can output an over-temperature alarm interrupt signal after detecting a temperature that exceeds the temperature threshold range.

For another example, the LP MCU initiates a second test mode and controls the test circuit to output a test voltage to detect whether the multiplexer 14, and/or the analog-to-digital converter 15, and/or the digital conversion circuit 16 fails.

For another example, the LP MCU initiates a test to detect whether the first register 21 and the second register 23 have a fault, and configures a write signal for the first register 21 and the second register 23 to determine whether the first register 21 or the second register 23 has a fault based on the signals read from the first register 21 and the second register 23.

In some possible implementations, the LP MCU may actively poll the temperature of the sampling point detected by the first temperature sensing circuit 11 or the second temperature sensing circuit 12 at intervals. The temperature obtained by the LP MCU through active polling may be the average temperature of the sampling point over a period of time, and the temperature threshold range for detecting the average temperature may be the first temperature threshold range. In addition, the LP MCU may also receive the temperature of the sampling point sent by the first temperature sensing circuit 11 or the second temperature sensing circuit 12 outside the polling time. The first temperature sensing circuit 11 or the second temperature sensing circuit 12 actively sends the temperature of the sampling point to the LP MCU, indicating that the temperature of the sampling point suddenly rises at a certain moment and exceeds the allowable junction temperature. The temperature threshold range for detecting that the first temperature sensing circuit 11 or the second temperature sensing circuit 12 actively sends the temperature to the LP MCU may be the second temperature threshold range.

Optionally, taking the high temperature threshold as an example, the second temperature threshold range may be greater than the first temperature threshold range. For example, the first temperature threshold range is 90°C, and the second temperature threshold range may be 105°C.

In some possible implementations, the embodiments of the present application do not limit the rule for the LP MCU to actively poll the temperature of the sampling point from the first temperature sensing circuit 11 or the second temperature sensing circuit 12, as long as the functional mode is not executed when the first test mode and the second test mode are executed. This prevents the temperature detected by the first temperature sensing circuit 11 or the second temperature sensing circuit 12 in the functional mode from affecting the detection results of the first test mode and the second test mode, causing the comparison result output by the comparison circuit 13 to be unreliable.

Based on this, as shown in Figure 10, the functional mode should be executed in a time-sharing manner with the first test mode and the second test mode. For example, the functional mode, the first test mode, and the second test mode can be executed in sequence. Of course, the order can also be other, and the embodiments of the present application are not limited to this. Among them, there is a certain time interval between the first test and the second test mode, and there is also a certain time interval when different test voltages are used for testing in the second test mode. The time interval can be set according to the fault tolerant time interval (FTTI). For example, the time interval can be 30ms.

In some possible implementations, when the SoC is powered on, except for the first test mode and the second test mode, the detection circuit can execute the functional mode in real time or at certain periodic intervals, which is not limited in the embodiments of the present application.

In some possible implementations, the LP MCU can initiate a predetermined thermal protection measure after receiving an over-temperature alarm interrupt signal during the polling process. For example, if the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 detects that the temperature of the sampling point exceeds 95°C, dynamic voltage and frequency scaling (DVFS) can be called to adjust the frequency and voltage of the sampling point. Of course, in order to make the self-driving car reach the automotive grade, the LP MCU can also send the over-temperature warning interrupt signal received during the polling process to the safety island or the off-chip MCU, which will call the dynamic voltage and frequency adjustment.

EMU can be a hardware circuit used for fault management in SoC, which can gather fault problems of all hardware circuits in SoC, including fault problems of sampling points, first temperature sensing circuit 11, second temperature sensing circuit 12, multiplexer 14, analog-to-digital converter 15, digital conversion circuit 16, amplifier 17, first register 21, second register 23, etc., and can also collect the above-mentioned over-temperature alarm interrupt signal. EMU can report the faults of each hardware circuit and the over-temperature alarm interrupt signal to the safety island or the off-chip MCU. For example, after the alarm circuit 24 receives the first comparison result, it can also send the first comparison result to EMU, and EMU decides to ignore the first comparison result or continue to report the first comparison result to the safety island or the off-chip MCU.

In some possible implementations, if the alarm circuit 24 sends multiple consecutive second comparison results and one second comparison result to the EMU, the EMU can ignore the first comparison result and no longer report the first comparison result to the safety island or the off-chip MCU. If the alarm circuit 24 sends multiple second comparison results to the EMU continuously, the EMU continues to report the first comparison result to the safety island or the off-chip MCU, and the safety island or the off-chip MCU handles the fault. The safety island is a microcontroller unit on the SoC chip for monitoring personal safety. It can monitor key sampling points such as the CPU and NPU on the SoC, and has clock, power supply and reset logic independent of other sampling points of the SoC. On its processor, a set of fault management software is running, which is specifically used to receive and process various software and hardware faults and functional failures related to personal safety, as well as over-temperature alarm interrupt signals.

The off-chip MCU, the off-chip automotive-grade MCU is used to monitor the working status of each core chip (such as SoC) in the vehicle-mounted terminal device. Once a fatal fault is detected in the core chip, the off-chip MCU can take over the vehicle control task in a short time, such as controlling the vehicle to pull over urgently. For example, outside the polling time of the LP MCU, if the first temperature sensing circuit 11 and/or the second temperature sensing circuit 12 detects that the temperature of the sampling point exceeds the allowable junction temperature, not only can the over-temperature alarm interrupt signal be sent to the LP MCU, but also the over-temperature alarm interrupt signal can be sent to the off-chip MCU. The off-chip MCU controls the board-level reset circuit or the power control circuit to reset or power off the SoC or the sampling point to avoid burning the SoC. In another embodiment, an embodiment of the present application provides a control method for a detection circuit, the detection circuit includes a first temperature sensing circuit, a second temperature sensing circuit, and a comparison circuit, the first temperature sensing circuit and the second temperature sensing circuit are integrated at multiple sampling points of the SoC in the car. As shown in Figure 11, the control method includes the following steps:

S110, using the first temperature sensing circuit and the second temperature sensing circuit to detect the temperature of the same sampling point within a preset time.

S120, converting the detected temperature into a first voltage through a first temperature sensing circuit according to a temperature-voltage fitting formula, where the temperature-voltage fitting formula is used to characterize a conversion relationship between temperature and voltage.

S130, converting the detected temperature into a second voltage through a second temperature sensing circuit according to a temperature-voltage fitting formula.

In some possible implementations, step S120 and step S130 may be performed simultaneously, that is, the first temperature sensing circuit 11 and the second temperature sensing circuit 12 of the aforementioned embodiment operate simultaneously.

In some other possible implementations, when the first temperature sensing circuit 11 and the second temperature sensing circuit 12 work in time-sharing mode, step S120 may be performed first and then step S130; or, step S130 may be performed first and then step S120.

S140, using a comparison circuit to compare the first voltage and the second voltage, if the difference between the first voltage and the second voltage is greater than a preset parameter, reporting a first comparison result.

The explanation and beneficial effects of the embodiments of the present application are the same as those of the aforementioned embodiments and will not be repeated here.

The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present application, ordinary technicians in this field can also make many forms without departing from the purpose of the present application and the scope of protection of the claims, all of which are within the protection of the present application.

Claims

A detection circuit, characterized in that it includes a first temperature sensing circuit, a second temperature sensing circuit, and a comparison circuit;

The first temperature sensing circuit and the second temperature sensing circuit are integrated on multiple sampling points of the SoC in the car and are configured to detect the temperature of the same sampling point within a preset time;

The first temperature sensing circuit is further configured to convert the detected temperature into a first voltage according to a temperature-voltage fitting formula; the temperature-voltage fitting formula is used to characterize the conversion relationship between temperature and voltage;

The second temperature sensing circuit is further configured to convert the detected temperature into a second voltage according to the temperature-voltage fitting formula;

The comparison circuit is configured to compare the first voltage and the second voltage, and report a first comparison result if the difference between the first voltage and the second voltage is greater than a preset parameter.
The detection circuit according to claim 1, characterized in that the first temperature sensing circuit and the second temperature sensing circuit simultaneously detect the temperature of the same sampling point;

The comparison circuit is configured to compare the received first voltage and the received second voltage in real time.
The detection circuit according to claim 1, characterized in that the first temperature sensing circuit and the second temperature sensing circuit detect the temperature of the same sampling point in a time-sharing manner;

In the functional mode, the second temperature sensing circuit does not detect the temperature of the sampling point, the first temperature sensing circuit detects the first temperature of the sampling point, and converts the first temperature into the first voltage according to the temperature-voltage fitting formula;

In the first test mode, the first temperature sensing circuit stops detecting the temperature of the sampling point, the second temperature sensing circuit detects the second temperature of the sampling point, and converts the second temperature into the second voltage according to the temperature-voltage fitting formula; the time difference between detecting the second temperature and detecting the first temperature is within the preset time range.
The detection circuit according to any one of claims 1 to 3, characterized in that the temperature voltage fitting formula is:

Among them, T represents the temperature collected by the first temperature sensing circuit and the second temperature sensing circuit, VT is the first voltage and the second voltage, V25 represents the reference voltage corresponding to the temperature of 25°C, and a represents the linear slope of the temperature-voltage fitting formula.
The detection circuit according to claim 4 is characterized in that

The first temperature sensing circuit includes a first bandgap reference voltage generator and a first temperature sensor, wherein the first bandgap reference voltage generator is used to provide the reference voltage for the first temperature sensor;

The second temperature sensing circuit includes a second bandgap reference voltage generator and a second temperature sensor, wherein the second bandgap reference voltage generator is used to provide the reference voltage for the second temperature sensor.
The detection circuit according to claim 5 is characterized in that both the first temperature sensor and the second temperature sensor are bipolar junction transistors.
The detection circuit according to claim 5 or 6 is characterized in that the material of the first temperature sensor is different from the material of the second temperature sensor, and/or the size of the first temperature sensor is different from the size of the second temperature sensor.
The detection circuit according to claim 1 is characterized in that the comparison circuit is further configured to output a second comparison result when the difference between the first voltage and the second voltage is less than or equal to the preset parameter.
The detection circuit according to claim 1 is characterized in that

The first temperature sensing circuit is further configured to output a temperature alarm interrupt signal when the detected temperature exceeds a temperature threshold range; the temperature threshold range is a junction temperature range allowed by the sampling point;

The second temperature sensing circuit is further configured to output a temperature alarm interrupt signal when the detected temperature exceeds the temperature threshold range.
The detection circuit according to any one of claims 1 to 3, characterized in that the detection circuit further comprises a multiplexer, an analog-to-digital converter, and a digital conversion circuit;

The first temperature sensing circuit and/or the second temperature sensing circuit inputs the first voltage and/or the second voltage to the analog-to-digital converter through the multiplexer;

The analog-to-digital converter is configured to convert the first voltage into a first digital signal, and/or convert the second voltage into a second digital signal, and send the first digital signal and/or the second digital signal to the digital conversion circuit;

The digital conversion circuit is configured to convert the first digital signal into a first temperature code value in the form of a digital signal, and/or to convert the second digital signal into a second temperature code value in the form of a digital signal;

The comparison circuit is configured to compare the first voltage and the second voltage, and if the difference between the first voltage and the second voltage is greater than a preset parameter, a first comparison result is reported, including: the comparison circuit is configured to compare the first temperature code value and the second temperature code value, and if the difference between the first temperature code value and the second temperature code value is greater than the preset parameter, the first comparison result is reported.
The detection circuit according to claim 10 is characterized in that the detection circuit also includes an amplifier, and the amplifier is electrically connected between the multiplexer and the analog-to-digital converter.
The detection circuit according to claim 10 or 11, characterized in that the detection circuit further comprises a test circuit;

In the second test mode, the first temperature sensing circuit and the second temperature sensing circuit stop detecting the temperature of the sampling point, the test circuit inputs a test voltage to the analog-to-digital converter through the multiplexer, and the test voltage outputs a test temperature code value through the analog-to-digital converter and the digital conversion circuit;

The comparison circuit is further configured to compare the test temperature code value with the expected temperature code value, and report a third comparison result if the difference between the test temperature code value and the expected temperature code value is greater than the preset parameter; the expected temperature code value is used to indicate an ideal temperature code value corresponding to the test voltage.
The detection circuit according to claim 12 is characterized in that the test circuit includes a voltage dividing resistor.
The detection circuit according to any one of claims 10 to 13, characterized in that the detection circuit further comprises a first register;

The digital conversion circuit is further configured to send the first temperature code value and the second temperature code value to the first register;

The first register is configured to output a ready signal.
The detection circuit according to claim 14 is characterized in that the detection circuit further comprises a sampling circuit, a second register, and an alarm circuit; the first temperature sensing circuit and the second temperature sensing circuit simultaneously detect the temperature of the same sampling point;

The comparison circuit is further configured to input a second comparison result to the alarm circuit;

The alarm circuit is configured to respond to the received second comparison result and send a sampling signal to the sampling circuit;

The sampling circuit is configured to receive the ready signal in response to receiving the sampling signal, collect the first temperature code value and the second temperature code value corresponding to the second comparison result from the first register, and send the first temperature code value and the second temperature code value to the second register for storage.
The detection circuit according to claim 15, characterized in that

The comparison circuit is further configured to input the first comparison result to the alarm circuit;

The alarm circuit is configured to send a stop sampling signal to the sampling circuit in response to the received first comparison result;

The sampling circuit is configured to stop collecting the first temperature code value and the second temperature code value corresponding to the first comparison result from the first register in response to the received stop sampling signal.
The detection circuit according to claim 14 is characterized in that the detection circuit further comprises a sampling circuit, a second register, and an alarm circuit; the first temperature sensing circuit and the second temperature sensing circuit detect the temperature of the same sampling point in a time-sharing manner;

The sampling circuit is configured to receive the ready signal, collect a plurality of the first temperature code values and a plurality of the second temperature code values from the first register, calculate an average value of the plurality of the first temperature code values as a first average value, calculate an average value of the plurality of the second temperature code values as a second average value, and send the first average value and the second average value to the comparison circuit;

The comparison circuit is configured to compare the first temperature code value and the second temperature code value, including: the comparison circuit is configured to compare the first average value and the second average value;

The comparison circuit is further configured to send a second comparison result to the alarm circuit;

The alarm circuit is configured to respond to the received second comparison result and send a sampling signal to the sampling circuit;

The sampling circuit is configured to send the first temperature code value and the second temperature code value corresponding to the second comparison result to the second register for storage in response to receiving the sampling signal.
The detection circuit according to claim 17, characterized in that the comparison circuit is further configured to send the first comparison result to the alarm circuit;

The alarm circuit is configured to send a stop sampling signal to the sampling circuit in response to the received first comparison result;

The sampling circuit is configured to stop sending the first temperature code value and the second temperature code value corresponding to the first comparison result to the second register in response to the received stop sampling signal.
The detection circuit according to claim 1 is characterized in that the sampling point includes at least one of an image processor, a central processing unit, an embedded neural network processor, a video encoder, and a video decoder.
A vehicle-mounted terminal device, characterized by comprising a SoC and a detection circuit as described in any one of claims 1-19.
The vehicle-mounted terminal device according to claim 20 is characterized in that the vehicle-mounted terminal device also includes a low-power microcontroller unit, a fault collection circuit, a safety island integrated on the SoC, and an off-chip microcontroller unit integrated outside the SoC;

The low-power micro control unit is used to configure the working mode of the detection circuit;

The fault collection circuit is used to collect faults of various hardware circuits in the SoC and send the faults to the safety island or the off-chip micro control unit; the hardware circuit includes the detection circuit and the sampling point of the SoC;

The safety island and the off-chip micro control unit are used to receive the fault sent by the fault collection circuit and process the fault.
A control method for a detection circuit, characterized in that the detection circuit comprises a first temperature sensing circuit, a second temperature sensing circuit, and a comparison circuit, wherein the first temperature sensing circuit and the second temperature sensing circuit are integrated at multiple sampling points of a SoC in an automobile;

Using the first temperature sensing circuit and the second temperature sensing circuit to detect the temperature of the same sampling point within a preset time;

According to a temperature-voltage fitting formula, the detected temperature is converted into a first voltage by the first temperature sensing circuit; the temperature-voltage fitting formula is used to characterize the conversion relationship between temperature and voltage;

According to the temperature-voltage fitting formula, the detected temperature is converted into a second voltage by the second temperature sensing circuit;

The first voltage and the second voltage are compared by using the comparison circuit, and if the difference between the first voltage and the second voltage is greater than a preset parameter, a first comparison result is reported.