WO2024048827A1

WO2024048827A1 - Electronic apparatus and application test management method therefor

Info

Publication number: WO2024048827A1
Application number: PCT/KR2022/013274
Authority: WO
Inventors: 리윤; 잉제무
Original assignee: 쿠팡 주식회사
Priority date: 2022-09-02
Filing date: 2022-09-05
Publication date: 2024-03-07
Also published as: KR20240032346A

Abstract

An application test management method for an electronic apparatus is provided. The application test management method may comprise the steps of: obtaining information related to a first test plan, including information related to at least one test case and information related to at least one parameter for test execution; obtaining execution setting information, which corresponds to the first test plan and includes information related to a target application; performing a test on the target application on the basis of the information related to the first test plan and the execution setting information; and providing information related to the results of performing the test.

Description

Methods for managing testing of electronic devices and their applications

This disclosure relates to an electronic device and a control method for providing a user interface that allows users to create, edit, and manage combinations of parameters that must be set when testing an application in order to more easily test the application.

Before distributing an application, developers must perform various tests on the application to ensure that the application satisfies the required functions, performance, usability, stability, etc. In addition, when additional features are developed or existing features are changed after the application is distributed, the developer conducts various tests to check whether there are changes in the application's functions, performance, usability, stability, etc. due to the addition or change of the function. You have to do it again. Therefore, developers must perform numerous tests on an application in order to provide it to users.

However, in order to perform tests on an application, various parameters must be set, and there is a problem in that a lot of time and manpower is wasted when developers manually set various parameters.

In relation to this, prior literature such as KR 10-2022-0049334 A may be referred to.

The disclosed embodiments seek to provide a method for managing electronic devices and application tests thereof. More specifically, to provide an electronic device and a control method for providing a user interface that allows users to create, edit, and manage combinations of parameters that must be set when testing an application in order to more easily test the application. The purpose.

The technical challenges that this embodiment aims to achieve are not limited to the technical challenges described above, and other technical challenges can be inferred from the following embodiments.

One aspect of the present disclosure is an application test management method, comprising: obtaining information about a first test plan, including information about at least one test case and information about at least one parameter for test execution; Obtaining execution setting information corresponding to the first test plan and including information about the target application; performing a test on the target application based on information about the first test plan and the execution setting information; and providing information on the results of the test.

Additionally, in an embodiment of the present disclosure, an application test management method may be provided, further comprising providing a list of a plurality of test plans including the first test plan.

In addition, in an embodiment of the present disclosure, the information about the at least one test case includes information about a storage where at least one test script corresponding to the at least one test case is stored, providing an application test management method. can do.

Additionally, in one embodiment of the present disclosure, the at least one test case includes a test case related to a cart page; Test case about checkout page; Test case for member information page; Test case for product list page; Test case for product details page; An application test management method may be provided, including at least one of a test case related to a search result page.

Additionally, in one embodiment of the present disclosure, the information regarding the at least one parameter includes information for distinguishing the first test plan; Information on the number of times to re-perform the test if the test fails to be performed; Information about a server for retrieving first test data; Information about a server for exporting second test data; An application test management method may be provided, including at least one of setting information regarding control group and experimental group tests.

Additionally, in an embodiment of the present disclosure, information for distinguishing the first test plan includes information about the name of the first test plan; information about the user's comments regarding the first test plan; Information about the type of test object of the first test plan; and at least one of information about the category to which the first test plan belongs. An application test management method may be provided.

Additionally, in an embodiment of the present disclosure, information for distinguishing the first test plan may be provided along with a list of a plurality of test plans including the first test plan, and an application test management method may be provided.

Additionally, in an embodiment of the present disclosure, information about a server for importing the first test data or information about a server for exporting the second test data includes information about a server to be used when providing an actual service; and information about a mock server to be used when performing a test. An application test management method may be provided.

In addition, in one embodiment of the present disclosure, performing a test on the target application includes changing a request for a server to be used when providing the actual service to a request for a mock server to be used when performing the test, Can provide application test management methods.

In addition, in one embodiment of the present disclosure, the setting information regarding the control group and experimental group test includes information for overriding the user account to be used when performing the test to the control account or experimental group account based on the terminal identifier or member information. can provide an application test management method.

Additionally, in one embodiment of the present disclosure, the execution setting information includes information about a test device; Set-up information regarding control and experimental group testing; Information about the version of the target application; Information about a server for retrieving first test data; An application test management method may be provided, including at least one of information about a server for exporting second test data.

Additionally, in an embodiment of the present disclosure, checking information about a second test plan selected for editing among the list of the plurality of test plans; confirming a user input for modifying at least one of information about test cases of the second test plan and information about parameters of the second test plan; and generating a third test plan based on the user input.

In addition, in one embodiment of the present disclosure, checking information about a mock server to be used when performing a test among information about the at least one parameter; and a step of checking whether the mock server is online or offline.

In addition, in an embodiment of the present disclosure, if the mock server is online, performing a test on the target application according to the first test plan, and if the mock server is offline, providing an error message is further included. It can provide an application test management method, including:

Additionally, in one embodiment of the present disclosure, confirming at least one user account whose use is not restricted among one or more user accounts to be used when performing a test; and setting the at least one user account to restrict use for other tests.

Additionally, in one embodiment of the present disclosure, performing a test on the target application includes calling a page function library and a page object library based on information about the at least one test case. Test management methods can be provided.

Another aspect of the present disclosure includes a communication unit, a memory, and a controller, wherein the control unit provides a first test plan, including information about at least one test case and information about at least one parameter for test execution. Obtain information about, correspond to the first test plan, and obtain execution setting information including information about the target application, and based on the information about the first test plan and the execution setting information, the target An electronic device can be provided that performs a test on an application and provides information on the results of the test.

Another aspect of the present disclosure may provide a computer-readable recording medium on which a program for implementing a method performed by an electronic device is recorded.

Specific details of other embodiments are included in the detailed description and drawings.

If you follow the proposed embodiment, one or more of the following effects can be expected.

According to the embodiments of the present specification, the technical effect of increasing test execution productivity can be achieved by automatically performing application testing and providing rapid feedback to developers.

In addition, according to the embodiments of the present specification, the technical effect of reducing a lot of rework of manually performed tests and saving human resources can be achieved.

In addition, according to the embodiments of the present specification, a technical effect can be obtained that allows application testing to be performed more conveniently even in different environments using the same functions and the same test data.

In addition, according to the embodiments of the present specification, a technical effect can be obtained that allows application testing to be performed more conveniently on various types of operating systems or various types of devices.

The effect of the invention is not limited to the effects mentioned above, and other effects not mentioned will be clearly understood by those skilled in the art from the description of the claims.

1 shows a system according to one embodiment.

2A to 2D illustrate a user interface provided by an electronic device, according to an embodiment.

3A to 3B illustrate a user interface provided by an electronic device, according to an embodiment.

4A to 4D illustrate a user interface provided by an electronic device, according to an embodiment.

5A to 5F illustrate a user interface provided by an electronic device, according to an embodiment.

6A to 6G illustrate a user interface provided by an electronic device, according to an embodiment.

FIG. 7 is a diagram illustrating a process in which an electronic device manages an application test according to an embodiment.

FIG. 8 is a diagram illustrating a process in which an electronic device manages an application test according to an embodiment.

FIG. 9 is a diagram illustrating a process in which an electronic device manages an application test according to an embodiment.

FIG. 10 is a diagram illustrating a process in which an electronic device manages an application test according to an embodiment.

Figure 11 shows a flowchart of an application test management method for an electronic device according to an embodiment.

Figure 12 shows a block diagram of an electronic device according to an embodiment.

The terms used in the embodiments are general terms that are currently widely used as much as possible while considering the functions in the present disclosure, but this may vary depending on the intention or precedent of a person working in the art, the emergence of new technology, etc. In addition, in certain cases, there are terms arbitrarily selected by the applicant, and in this case, the meaning will be described in detail in the relevant description. Therefore, the terms used in this disclosure should be defined based on the meaning of the term and the overall content of this disclosure, rather than simply the name of the term.

When it is said that a part "includes" a certain element throughout the specification, this means that, unless specifically stated to the contrary, it does not exclude other elements but may further include other elements.

The expression “at least one of a, b, and c” used throughout the specification means ‘a alone’, ‘b alone’, ‘c alone’, ‘a and b’, ‘a and c’, ‘b and c ', or 'all of a, b, and c'.

The “terminal” mentioned below may be implemented as a computer or portable terminal that can connect to a server or other terminal through a network. Here, the computer includes, for example, a laptop, desktop, laptop, etc. equipped with a web browser, and the portable terminal is, for example, a wireless communication device that guarantees portability and mobility. , all types of communication-based terminals such as IMT (International Mobile Telecommunication), CDMA (Code Division Multiple Access), W-CDMA (W-Code Division Multiple Access), and LTE (Long Term Evolution), smartphones, tablet PCs, etc. It may include a handheld-based wireless communication device.

Below, with reference to the attached drawings, embodiments of the present disclosure will be described in detail so that those skilled in the art can easily practice them. However, the present disclosure may be implemented in many different forms and is not limited to the embodiments described herein.

Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings.

1 shows a system according to one embodiment.

Referring to FIG. 1 , the system may include at least one of an electronic device 100, one or

more terminals

120, 140, and 160, and a network 180. Meanwhile, the system shown in FIG. 1 shows only components related to this embodiment. Accordingly, those skilled in the art can understand that other general-purpose components may be included in addition to the components shown in FIG. 1.

The electronic device 100 is a device that configures and provides various information. The electronic device 100 may provide the configured information in the form of a web page or application screen, or may provide information in a form that can be displayed as a web page or application screen on the receiving terminal.

According to one embodiment, the electronic device 100 may provide a service for users to test applications more conveniently. For example, the electronic device 100 may provide a user interface (UI) for creating and managing a test plan, including information about test cases selected based on user input and information about parameters for test execution. ) can be provided to the user. Additionally, the electronic device 100 may perform a test on an application according to a test plan selected by the user and provide test performance result information to the user.

One or

more terminals

120, 140, and 160 are terminals used by users, and users can access services provided by the network 180 using their

respective terminals

120, 140, and 160. For example, one or

more terminals

120, 140, and 160 obtain user input for setting test cases and parameters for test execution, and request the creation of a test plan based on the obtained input to the electronic device 100. It can be sent to . Alternatively, one or

more terminals

120, 140, and 160 may obtain user input for selecting a test plan and setting a target application, and transmit a test performance request according to the obtained input to the electronic device 100.

One or

more terminals

120, 140, and 160 and the electronic device 100 may communicate with each other within the network 180. The network 180 includes a local area network (LAN), a wide area network (WAN), a value added network (VAN), a mobile radio communication network, a satellite communication network, and their respective networks. It is a comprehensive data communication network that includes a combination and allows each network constituent shown in FIG. 1 to communicate smoothly with each other, and may include wired Internet, wireless Internet, and mobile wireless communication network. Wireless communications include, for example, wireless LAN (Wi-Fi), Bluetooth, Bluetooth low energy, ZigBee, WFD (Wi-Fi Direct), UWB (ultra wideband), and infrared communication (IrDA, infrared Data Association). ), NFC (Near Field Communication), etc., but are not limited thereto.

FIGS. 2A to 2D illustrate a user interface 200 provided by the electronic device 100 according to an embodiment.

2A to 2D, the electronic device 100 provides a user interface (UI) 200 including a list of one or more test plans to the user through the user's terminal, according to an embodiment. You can. For example, a user can create, edit, or manage a test plan by selecting various icons corresponding to the test plan. Alternatively, the user can test the application according to information about the test cases and parameters included in each test plan.

At this time, the test plan may represent a set of setting information related to application testing. For example, a test plan may include information about test cases and parameters for test execution. Test cases and parameters included in the test plan will be described in detail with reference to FIGS. 4A to 4D and 5A to 5F, respectively.

According to one embodiment, the user interface 200 may include an area for displaying and managing various information about one or more test plans. For example, the user interface 200 may include an area that displays information for identifying one or more test plans, an area that displays icons for executing tests according to one or more test plans, or a status of one or more test plans. It may include a display area, etc. However, the areas shown in FIG. 2 are only an example and may be changed or omitted based on user input.

According to one embodiment, the user interface 200 may include an area 220 for selecting one or more test plans. For example, the user can manage the test plan more conveniently by selecting a check box corresponding to each of one or more test plans included in the area 220.

According to one embodiment, the user interface 200 may include an area 225 for controlling and managing one or more test plans. For example, the area 225 may display a View icon, Copy icon, Delete icon, Devices icon, or Rerun icon as icons for controlling and managing each of one or more test plans. Additionally, a bar indicating the status of one or more test plans may be displayed in area 225.

According to one embodiment, when the user selects the View icon displayed in the area 225, the electronic device 100 provides information about the storage where the test script included in the test plan corresponding to the selected View icon is stored, and information about the test case. It can provide information about parameters for information and test execution. For example, when the user selects the View icon corresponding to the first test plan 202, the electronic device 100 displays information about the storage where the test script included in the first test plan 202 is stored and the test case. A screen displaying information about the test and parameters for test execution can be provided.

According to one embodiment, when the user selects the Copy icon displayed in the area 225, the electronic device 100 generates a test plan containing the same setting information as the setting information included in the test plan corresponding to the selected Copy icon. can do. For example, when the user selects the Copy icon corresponding to the second test plan 204, the electronic device 100 provides a pop-up window displaying setting information included in the second test plan 204, and the pop-up window displays the settings information included in the second test plan 204. The user's input can be obtained to create a new test plan containing the configuration information displayed in the window. Thereafter, the electronic device 100 may create a test plan containing the same setting information as the setting information included in the second test plan 204 and add it to the list.

According to one embodiment, when the user selects the Delete icon displayed in the area 225, the electronic device 100 may delete the test plan corresponding to the selected Delete icon. For example, when the user selects the Delete icon corresponding to the fifth test plan 210, the electronic device 100 may provide a pop-up window asking whether to delete the fifth test plan 210 from the list. . At this time, if the application is being tested according to the test plan selected by the user, the electronic device 100 displays a pop-up window notifying that the application is being tested according to the test plan and asking whether to delete the test plan from the list. can be provided.

According to one embodiment, when the user selects the Devices icon displayed in the area 225, the electronic device 100 may provide information about the test device related to the test plan corresponding to the selected Devices icon. For example, when the user selects the Devices icon corresponding to the fourth test plan 208, the electronic device 100 may provide information about the test device related to the fourth test plan 208.

According to one embodiment, when the user selects the Rerun icon displayed in the area 225, the electronic device 100 may re-perform the application test according to the test plan corresponding to the selected Rerun icon. For example, if the test application according to the third test plan 206 fails, the electronic device 100 may display a Rerun icon in the area 225 instead of the Devices icon in relation to the third test plan 206. . Thereafter, when the user selects the Rerun icon corresponding to the third test plan 206, the electronic device 100 may perform an application test according to the third test plan 206 again.

According to one embodiment, a bar displayed in area 225 may indicate the status of a corresponding test plan. For example, if the application test was successfully performed as in the first test plan 202, a check icon may be displayed in the bar, and if the test plan was successfully created as in the

second test plan

204, 100 % may be displayed on the bar. Alternatively, when an application test is being performed or a test plan is being created, such as the third test plan 206 and the fourth test plan 208, the progress of the performance or creation may be displayed in the bar, and the fifth test plan ( 210), if a test plan has not been created, 0% may be displayed on the bar.

According to one embodiment, the user interface 200 may include an area 230 that displays an icon for performing an application test according to a test plan. For example, when the user selects the Run icon corresponding to the first test plan 202, the electronic device 100 may provide a pop-up window for setting run setting information. At this time, the execution setting information may include information about the application that is the target of testing, information about the version of the target application, or information about the test device. This will be described in detail with reference to FIGS. 6A to 6G.

According to one embodiment, the user interface 200 may include an area 235 that displays the name of the test plan. For example, in the area 235, BBBB may be displayed as the name of the second test plan 204, and LLLL may be displayed as the name of the fifth test plan 210. At this time, the name of the test plan is information entered by the user when creating a test plan to more easily distinguish between test plans, and may include the type of page to be tested through the test plan or the type of operating system of the target device. However, it is not limited to the above.

According to one embodiment, the user interface 200 may include an area 240 that displays user comments regarding the test plan. For example, in area 240, as a user comment regarding the third test plan 206, App automation - app release may be displayed, and as a user comment regarding the fourth test plan 208, test_2 may be displayed. can be displayed. At this time, the user's comment regarding the test plan is information entered by the user when creating the test plan to more easily distinguish between test plans, such as the type of test to be performed through the test plan or the type of operating system of the target device, etc. It may include, but is not limited to the above.

According to one embodiment, the user interface 200 may include an area 245 that displays information about at least one user identifier that performs an application test according to each of one or more test plans. For example, a first user may be displayed in the area 245 as a user identifier performing an application test according to the first test plan 202 . Alternatively, a seventh user may be displayed in the area 245 as a user identifier performing an application test according to the fifth test plan 210.

According to one embodiment, the user interface 200 may include an area 250 that includes information about the time when an application test was performed according to each of one or more test plans. For example, the area 250 may display 2020-06-15 T13:11:25 as the time at which the application test according to the second test plan 204 was performed. Alternatively, the area 245 may display 2022-06-13 T06:12:13 as the time when the application test according to the third test plan 206 was performed.

According to one embodiment, the user interface 200 may include an area 255 for providing information on the performance results of application tests according to one or more test plans. For example, when the user selects the View icon corresponding to the first test plan 202, the electronic device 100 may provide information on the performance results of an application test according to the first test plan 202.

According to one embodiment, the user interface 200 may include an area 260 for providing information on performance results of control group and experimental group tests according to one or more test plans. For example, when the user selects the AB report icon corresponding to the first test plan 202, the electronic device 100 may provide information on the performance results of the control group and experimental group tests according to the first test plan 202. there is.

According to one embodiment, the user interface 200 may include an area 265 for searching or filtering test plans according to the type of test object. For example, when the user selects the down icon in area 265 or positions the cursor within area 265, electronic device 100 displays a pull-down menu or drop-down menu containing a list of types of test objects in the test plan. A download list can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting a type of test object from the list, and display the selected type of test object in area 265 .

Referring to FIG. 2B, according to one embodiment, the electronic device 100 may provide a pull-down menu 285 including a list of test object types of the test plan. Thereafter, the electronic device 100 may obtain the user's input for selecting All and display the selected All in area 265. The types of test objects in the test plan will be described in detail with reference to FIG. 5B.

According to one embodiment, the user interface 200 may include an area 270 for searching or filtering test plans according to the category to which the test plan belongs. For example, when the user selects the downward icon in area 270 or positions the cursor within area 270, electronic device 100 displays a pull-down menu or drop-down list containing a list of categories to which the test plan belongs. can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one category from the list and display the selected category in the area 270 .

Referring to FIG. 2C, according to one embodiment, the electronic device 100 may provide a pull-down menu 290 including a list of categories to which the test plan belongs. Thereafter, the electronic device 100 may obtain the user's input for selecting Checkout and display the selected Checkout in area 270. The category to which the test plan belongs will be described in detail with reference to FIG. 5C.

According to one embodiment, the electronic device 100 may provide a list of test plans corresponding to the type of test object selected in area 265 and the category to which the test plan selected in area 270 belongs. Referring to FIG. 2D, as a user input selecting All as the type of test object and a user input selecting Checkout as the category to which the test object belongs are obtained, the electronic device 100 selects test plans corresponding to All and Checkout. A list can be provided.

According to one embodiment, the user interface 200 may include an area 275 for creating a new test plan. For example, when the user selects the New icon in the area 275, the electronic device 100 may provide a pop-up window through which a plurality of setting information can be input. The electronic device 100 may receive a user's input for setting information displayed in a pop-up window, create a test plan according to the received input, and add it to the list. This will be described in detail with reference to FIGS. 3A to 5F.

According to one embodiment, the user interface 200 may include an area 280 for searching a specific test plan. For example, when a user enters the name of a test plan to be searched or information about a user performing an application test according to the test plan into the area 280, the electronic device 100 may search for a search term corresponding to the entered search term. A test plan can be provided.

Meanwhile, the number and location of the above-mentioned areas, expressions displayed in the areas, types of user interface components, and specific examples of setting information included in the test plans are only examples, and the present disclosure provides examples different from those described above. It is obvious to those skilled in the art that this disclosure can be implemented.

FIGS. 3A and 3B illustrate a user interface 300 provided by the electronic device 100 according to an embodiment.

3A to 3B illustrate a user interface 300 for setting or changing a storage where test scripts are stored, according to an embodiment. For example, when a user input for selecting the New icon, View icon, or Copy icon in the user interface 200 or a user input for selecting the Previous icon 460 in the user interface 400 is obtained, the electronic device 100 may display the user interface 300 and receive input from the user who selects or writes in a storage where the test script is stored. Thereafter, the electronic device 100 may create a test plan or change stored setting information based on the user's input. Meanwhile, FIGS. 3A and 3B show a pop-up window as a user interface 300 for setting or changing the storage where the test script is stored, but the user interface 300 of the present disclosure is a modal window. It can be implemented in various forms such as, but is not limited to this.

According to one embodiment, the user interface 300 may include an area 320 for selecting a storage where the test script is stored. For example, when the user selects the downward icon in area 320 or positions the cursor within area 320, the electronic device 100 displays a pull-down menu or drop-down list containing a list of storages where test scripts are stored. can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one storage from the list and display the selected storage in the area 320 .

Referring to FIG. 3B, the electronic device 100 may provide a pull-down menu 360 including a list of storages where test scripts are stored. Thereafter, the electronic device 100 may obtain the user's input for selecting the first git repository and app-ui, and display the first git repository/app-ui in the area 320. At this time, the first git repository may represent the git repository where the test script is stored, and rebuild, native, cart, checkout, test, and app-ui may represent the branch where the test script is stored.

According to one embodiment, the user interface 300 may include an area 340 for copying a storage where a test script is stored. For example, when the user selects the downward icon in area 340 or positions the cursor within area 340, the electronic device 100 displays a pull-down menu or drop-down menu containing a list of previously used storage or stored storage. A download list can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one storage from the list and display the selected storage in area 340 .

According to one embodiment, the electronic device 100 may obtain a user input for selecting the Next icon 380 and then display a user interface for setting or changing a test case based on the obtained input. For example, the electronic device 100 may obtain a user input for selecting the Next icon 380 and then display the user interface 400 of FIGS. 4A to 4D.

FIGS. 4A to 4D illustrate a user interface 400 provided by the electronic device 100 according to an embodiment.

FIGS. 4A to 4D illustrate a user interface 400 for setting or changing a test case according to an embodiment. For example, user input selecting the New icon, View icon, or Copy icon in user interface 200, user input selecting Next icon 380 in user interface 300, or Previous icon ( When a user input for selecting 594) is obtained, the electronic device 100 may display the user interface 400 and receive the user's input for selecting or writing a test case. Thereafter, the electronic device 100 may create a test plan or change stored setting information based on the user's input. Meanwhile, FIGS. 4A to 4D show a pop-up window as the user interface 400 for setting or changing a test case, but the user interface 400 of the present disclosure may be implemented in various forms such as a modal window, and is limited to this. It doesn't work.

At this time, a test case may correspond to a test script written to test the service of the application that is the subject of testing, the type of page of the application, or the user interface component or object that exists within the page. there is. For example, test cases may include test cases for delivery services or test cases for streaming services. Alternatively, the test case may be a test case related to the cart page, a test case related to the checkout page, a test case related to the member information page, a test case related to the product list page, a test case related to the product details page, or a test case related to the search results page. May include test cases, etc. Test cases may include test cases for various objects that exist within a specific page.

According to one embodiment, a user may select a corresponding test case according to the service of the application that the user wants to test, the type of page of the application, or the user interface component or object present in the page. For example, if the version of the application is updated, the user can select all test cases. Alternatively, if the application's cart page has been updated, the user can select a test case related to the cart page.

According to one embodiment, the user interface 400 may include an area 420 for searching or filtering test cases. For example, when the user inputs the name of a test case to be searched into the area 420, the electronic device 100 may provide a test case corresponding to the entered search word.

According to one embodiment, the user interface 400 may include an area 440 for selecting a test case. For example, referring to FIGS. 4A to 4D , the electronic device 100 may display a list of various test cases in area 440. Thereafter, the electronic device 100 may obtain a user input for selecting a test case corresponding to a service, page, or object that the user wishes to test.

According to one embodiment, the electronic device 100 may obtain a user input for selecting the Previous icon 460 and then display a user interface for setting or changing the storage where the test script is stored based on the obtained input. there is. For example, the electronic device 100 may obtain a user input for selecting the Previous icon 460 and then display the user interface 300 of FIGS. 3A and 3B.

According to one embodiment, the electronic device 100 may obtain a user input for selecting the Next icon 480 and then display a user interface for setting or changing parameters for test execution based on the obtained input. there is. For example, the electronic device 100 may obtain a user input for selecting the Next icon 480 and then display the user interface 500 of FIGS. 5A to 5F.

FIGS. 5A to 5F illustrate a user interface 500 provided by the electronic device 100 according to an embodiment.

FIGS. 5A to 5F illustrate a user interface 500 for setting or changing parameters for test execution, according to one embodiment. For example, when a user input for selecting the New icon, View icon, or Copy icon in the user interface 200 or a user input for selecting the Next icon 480 in the user interface 400 is obtained, the electronic device 100 may display the user interface 500 and receive input from a user who selects or enters parameters for test execution. Thereafter, the electronic device 100 may create a test plan or change stored setting information based on the user's input. Meanwhile, FIGS. 5A to 5F show a pop-up window as a user interface 500 for setting or changing parameters for test execution, but the user interface 500 of the present disclosure may be implemented in various forms such as a modal window. , but is not limited to this.

At this time, parameters for test execution may include various types of parameters that must be set in relation to the test plan. For example, parameters for test execution include information to distinguish the test plan, information on the number of times to re-perform the test in case of failure to perform the test, information about the server for retrieving test data, and exporting test data. It may include information about the server for the test or setting information about the control group and experimental group tests.

According to one embodiment, the user interface 500 may include an area 502 for setting the name of the test plan. For example, when a user wants to create a new test plan, the user must enter the type of page or the type of operating system of the target device in the area (502) to more easily distinguish between the test plans. ) can be entered. Meanwhile, the name of the test plan entered in area 502 may be displayed in area 235 of the user interface 200 of FIGS. 2A to 2D.

According to one embodiment, the user interface 500 may include an area 504 for setting user comments regarding the test plan. For example, when a user wants to create a new test plan, in order to more easily distinguish the test plan, the user enters the type of test to be performed through the test plan or the type of operating system of the target device in the area (504). ) can be entered. Meanwhile, a user's comment regarding the test plan entered in the area 504 may be displayed in the area 240 of the user interface 200 of FIGS. 2A to 2D.

According to one embodiment, the user interface 500 may include an area 506 for setting the type of test object. For example, if the user selects the down icon in area 506 or positions the cursor within area 506, electronic device 100 may display a pull-down menu or drop-down menu containing a list of types of test objects in the test plan. A download list can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting a type of test object from the list, and display the selected type of test object in area 506.

Referring to FIG. 5B , the electronic device 100 may provide a pull-down menu 508 including a list of test object types of the test plan. Thereafter, the electronic device 100 may obtain the user's input for selecting a UI and display the selected UI in the area 506.

At this time, the type of test object is a parameter set to allow the user to more easily distinguish or search the test plan, and may include an application programming interface (API), a user interface (UI), or All including API and UI. . However, this is only an example, and the type of test object may be set differently from what was described above or may be changed based on user input.

According to one embodiment, the user interface 500 may include an area 510 for setting the category to which the test plan belongs. For example, when the user selects the downward icon in area 510 or positions the cursor within area 510, electronic device 100 displays a pull-down menu or drop-down list containing a list of categories to which the test plan belongs. can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one category from the list and display the selected category in the area 510 .

Referring to FIG. 5C, according to one embodiment, the electronic device 100 may provide a pull-down menu 512 including a list of categories to which the test plan belongs. Thereafter, the electronic device 100 may obtain the user's input for selecting an App-release and display the selected App-release in the area 510.

At this time, the category to which the test plan belongs is a parameter set to allow the user to more easily distinguish or search the test plan, and may include Checkout, Cart, App release, Order, or Other. However, this is only an example, and may be set differently or changed based on user input.

For example, the user can select the Edit icon corresponding to each category to change the name of the category, or select the New icon 514 to add a new category to the list. Referring to FIG. 5D , when the electronic device 100 obtains a user input for selecting the New icon 514, the electronic device 100 may display a pop-up window 516 for entering a new category.

According to one embodiment, the type of test object set in area 506 and the category to which the test plan set in area 510 belongs can be used to filter test plans as described above with respect to FIGS. 2B to 2D. . For example, in relation to a specific test plan, when the type of test object is set to UI and the category to which the test plan belongs is set to App-release, the electronic device 100 is configured to allow the user to select UI as the type of test object. By obtaining user input that selects App-release as the category to which the input and test target belongs, a list containing the corresponding test plan can be provided.

According to one embodiment, the user interface 500 may include an area 518 for setting whether to upload test performance result information according to a test plan. For example, the electronic device 100 may display a toggle switch in the area 518 as a user interface component for setting whether to upload test performance result information according to a test plan. If the user activates the toggle switch, test performance result information according to the test plan may be uploaded to the database, and if the user deactivates the toggle switch, test performance result information according to the test plan may not be uploaded to the database.

According to one embodiment, the user interface 500 may include an area 520 for setting parameters related to mail. For example, the electronic device 100 may display a toggle switch in the area 520 as a user interface component for setting whether to provide email-related information in relation to the test plan.

According to one embodiment, the user interface 500 may include an area 522 for setting parameters related to message notification. For example, the electronic device 100 may display a toggle switch in the area 522 as a user interface component for setting whether to provide information related to the test plan as a message notification.

According to one embodiment, the user interface 500 may include an area 524 for setting parameters related to log recording. For example, the electronic device 100 may display a toggle switch in area 524 as a user interface component for setting whether to provide log records related to a test plan.

According to one embodiment, the user interface 500 may include an area 526 for setting the number of times to re-perform the test when performing a test according to the test plan fails. For example, when the user selects the downward icon within area 526 or positions the cursor within area 526, electronic device 100 provides a pull-down menu or drop-down list containing a list of re-execution numbers. can do. Thereafter, the electronic device 100 may obtain a user's input for selecting the number of re-performances of one item from the list, and display the selected number of re-performances in area 526.

Referring to FIG. 5E, when the electronic device 100 fails to perform a test according to the test plan, it may provide a pull-down menu 528 that includes a list of the number of times to re-perform the test. If the user selects None, the electronic device 100 may not re-perform the test even if it fails to perform the test according to the test plan. Alternatively, when the user selects Once, Twice, or Triple, the electronic device 100 may re-perform the test up to once, twice, or three times if it fails to perform the test according to the test plan.

According to one embodiment, the user interface 500 may include an area 530 for setting a function level in relation to a test plan. For example, when the user selects the down icon within area 530 or positions the cursor within area 530, electronic device 100 may provide a pull-down menu or drop-down list containing a list of function levels. You can. Thereafter, the electronic device 100 may obtain a user's input for selecting one function level from the list and display the selected function level in the area 530.

According to one embodiment, the user interface 500 may include an area 532 for setting the number of test runners. For example, the user can enter the number of test runners to be used when performing application testing according to the test plan in area 532.

According to one embodiment, the user interface 500 may include an area 534 for setting the scope of the test plan. For example, the user can enter the scope of application testing according to the test plan into area 534.

According to one embodiment, the user interface 500 may include an area 536 for setting an operating system corresponding to an application when performing an application test according to a test plan. For example, when the user selects the downward icon in area 536 or positions the cursor within area 536, the electronic device 100 displays a pull-down menu or drop-down menu containing a list of operating systems corresponding to the target application. A list can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one operating system from the list and display the selected operating system in area 536. At this time, the operating system corresponding to the application may include Android or iOS, but is not limited thereto.

According to one embodiment, the user interface 500 may include an area 538 for setting a test device to be used when performing an application test according to a test plan. For example, when the user selects the down icon in area 538 or positions the cursor within area 538, electronic device 100 displays a pull-down menu or drop-down list containing a list of available test devices. can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one or more test devices from the list and display the selected test devices in area 538.

According to one embodiment, the user interface 500 may include an area 540 for setting whether to copy the test plan. For example, the electronic device 100 may display a toggle switch in the area 540 as a user interface component for setting whether to copy the test plan. If the user activates the toggle switch, the test plan may be copied; if the user disables the toggle switch, the test plan may not be copied.

According to one embodiment, the user interface 500 may include an area 542 for setting parameters related to production. For example, the electronic device 100 may display a toggle switch in the area 542 as a user interface component for setting parameters related to production.

According to one embodiment, the user interface 500 may include an area 550 for setting a server for retrieving test data. More specifically, the user interface 500 may include an area 552 for setting a server to be used when providing an actual service and an area 554 for setting a mock server to be used when performing a test. At this time, the electronic device 100 may change a request to retrieve data about a server to be used when providing an actual service to a request to retrieve data about a mock server to be used when performing a test.

For example, when the user selects the downward icon in the area 552 or places the cursor within the area 552, the electronic device 100 displays a pull-down menu or drop-down menu containing a list of servers to be used when providing the actual service. A list can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one server from the list and display the selected test target server in area 552.

Alternatively, when the user selects the downward icon in area 554 or positions the cursor within area 554, the electronic device 100 displays a pull-down menu or drop-down list containing a list of simulated servers to be used when performing the test. can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one server from the list and display the selected test target server in area 554.

According to one embodiment, the user interface 500 may include an area 558 for displaying a list of pairs of servers to be used when providing actual services and mock servers to be used when performing tests. For example, the electronic device 100 obtains a user input for selecting the first real server as a server to be used when providing an actual service and a user input for selecting the first mock server as a mock server to be used when performing a test, and then clicks the Add icon. As user input selecting 556 is obtained, the first real server and first mock server pair may be added to the list and displayed in area 558.

According to one embodiment, the user interface 500 may include an area 560 for deleting a pair of a server to be used when providing an actual service and a mock server to be used when performing a test. For example, when the user selects the Delete icon in the area 560, the electronic device 100 removes the pair of the server to be used when providing the actual service corresponding to the selected Delete icon and the pair of the mock server to be used when performing the test from the list, It can be deleted in area 558.

According to one embodiment, the user interface 500 may include an area 570 for setting a server for exporting test data. More specifically, the user interface 500 may include an area 572 for setting a server to be used when providing an actual service and an area 574 for setting a mock server to be used when performing a test. At this time, the electronic device 100 may change a request to export data about a server to be used when providing an actual service to a request to export data about a mock server to be used when performing a test.

For example, when the user selects the downward icon in the area 572 or positions the cursor within the area 572, the electronic device 100 displays a pull-down menu or drop-down menu containing a list of servers to be used when providing the actual service. A list can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one server from the list and display the selected test target server in area 572.

Alternatively, when the user selects the downward icon in area 574 or positions the cursor within area 574, the electronic device 100 displays a pull-down menu or drop-down list containing a list of simulated servers to be used when performing the test. can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one server from the list and display the selected test target server in area 574.

According to one embodiment, the user interface 500 may include an area 578 for displaying a list of pairs of servers to be used when providing actual services and mock servers to be used when performing tests. For example, the electronic device 100 obtains a user input for selecting the fourth real server as a server to be used when providing an actual service and a user input for selecting the fourth mock server as a mock server to be used when performing a test, and then clicks the Add icon. As a user input selecting 576 is obtained, a fourth real server and a fourth mock server pair may be added to the list and displayed in area 578.

According to one embodiment, the user interface 500 may include an area 580 for deleting a pair of a server to be used when providing an actual service and a mock server to be used when performing a test. For example, when the user selects the Delete icon in the area 580, the electronic device 100 removes the pair of the server to be used when providing the actual service corresponding to the selected Delete icon and the pair of the mock server to be used when performing the test from the list, It can be deleted in area 578.

According to one embodiment, the user interface 500 may include an area 590 for setting parameters related to control group and experimental group tests. For example, the user may enter information in area 590 to override the user account to be used when performing the test into a control account or an experimental group account based on the terminal identifier or member information. At this time, the user may enter the identifier or member information of one or more terminals to override the control account or the experimental group account into the area 590, or may not enter any information.

According to one embodiment, the user interface 500 may include an area 592 for setting a time to perform application testing according to a test plan. For example, when the user selects the downward icon in the area 592 or positions the cursor within the area 592, the electronic device 100 includes an icon for setting the test start time or test performance section, etc. You can provide a pull-down menu or drop-down list.

Referring to Figure 5f, the user can set the start time of the application test according to the test plan to UTC+8 10:10 and UTC+8 14:00.

According to one embodiment, the electronic device 100 may obtain a user input for selecting the Previous icon 594 and then display a user interface for the test script to set or change a test case based on the obtained input. there is. For example, the electronic device 100 may obtain a user input for selecting the Previous icon 594 and then display the user interface 400 of FIGS. 4A to 4D.

According to one embodiment, the electronic device 100 may obtain a user input for selecting the Save icon 596 and then generate a test plan based on the obtained input. For example, after obtaining a user input for selecting the Save icon 596, the electronic device 100 generates a test plan according to the user-entered setting information and adds it to the list of test plans shown in FIGS. 2A to 2D. You can add

FIGS. 6A to 6G illustrate a user interface 600 provided by the electronic device 100 according to an embodiment.

FIGS. 6A to 6G illustrate a user interface 600 for setting or changing execution setting information of an application test, according to an embodiment. For example, when the user selects the Run icon in the user interface 200, the electronic device 100 may display the user interface 600 and receive the user's input for selecting or entering run setting information for the test. there is. Thereafter, the electronic device 100 may perform an application test based on the user's input. Meanwhile, FIGS. 6A to 6G show a pop-up window as a user interface 600 for setting or changing application test execution settings information, but the user interface 600 of the present disclosure can be implemented in various forms such as a modal window. and is not limited to this.

At this time, the application test execution setting information may include various types of parameters that must be set in relation to the application test. For example, information about the test device, setting information about the control and experimental group tests, information about the version of the target application, information about the server for importing test data, or information about the server for exporting test data, etc. can do.

According to one embodiment, the user interface 600 may include an area 602 for setting parameters related to control group and experimental group tests. For example, the user may enter information in the area 602 to override the user account to be used when performing the test into a control account or an experimental group account based on the terminal identifier or member information. At this time, the user may enter the identifier or member information of one or more terminals to override the control account or the experimental group account into the area 602, or may not enter any information.

According to one embodiment, the user interface 600 may include an area 604 for setting an operating system corresponding to an application when performing an application test according to a test plan. For example, when the user selects the downward icon in area 604 or positions the cursor within area 604, the electronic device 100 displays a pull-down menu or drop-down menu containing a list of operating systems corresponding to the target application. A list can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one operating system from the list and display the selected operating system in area 604. At this time, the operating system corresponding to the application may include Android or iOS, but is not limited thereto.

According to one embodiment, the user interface 600 may include an area 606 for selecting an application to be tested. More specifically, the user interface 600 may include an area 608 for selecting the build type of the application to be tested. For example, if the user selects the down icon within area 608 or positions the cursor within area 608, electronic device 100 may provide a pull-down menu or drop-down list containing a list of build types. You can. Thereafter, the electronic device 100 may obtain a user's input for selecting one build type from the list and display the selected build type in area 608.

Referring to FIG. 6B, the electronic device 100 may provide a pull-down menu 610 including a list of build types of applications. Thereafter, the electronic device 100 may obtain a user's input for selecting one build type and display the selected build type in area 608.

Referring to FIG. 6C, when the electronic device 100 obtains a user input for selecting a release build from the list of application build types, the electronic device 100 displays an area 612 for selecting an application to be tested. ) can be displayed. For example, when the user selects the downward icon in area 612 or positions the cursor within area 612, the electronic device 100 may provide a pull-down menu 614 including a list of applications. . Thereafter, the electronic device 100 may obtain a user's input for selecting one application from the list and display the selected build type in area 612.

Referring to FIG. 6D, when the electronic device 100 obtains a user input for selecting dev build from the list of build types of an application, the electronic device 100 may display an area 616 for selecting a developer. there is. For example, when the user selects the downward icon in area 616 or positions the cursor within area 616, the electronic device 100 may provide a pull-down menu 618 including a list of developers. . Thereafter, the electronic device 100 may obtain a user's input for selecting one developer from the list and display the selected developer in area 616.

Referring to FIG. 6E, when the electronic device 100 obtains a user input for selecting dev build from the list of build types of the application, the electronic device 100 opens an area ( 620) can be displayed. For example, when the user selects the downward icon in area 620 or positions the cursor within area 620, the electronic device 100 may provide a pull-down menu 622 including a list of branches. . Thereafter, the electronic device 100 may obtain the user's input for selecting one branch from the list and display the selected branch in the area 620.

Referring to FIG. 6F, when the electronic device 100 obtains a user input for selecting dev build from a list of application build types, the electronic device 100 enters an area 624 for selecting an application to be tested. ) can be displayed. For example, when the user selects the downward icon in area 624 or positions the cursor within area 624, the electronic device 100 may provide a pull-down menu 626 including a list of applications. . Thereafter, the electronic device 100 may obtain a user's input for selecting one application from the list and display the selected build type in area 624.

Referring to FIG. 6G, when the electronic device 100 obtains a user input for selecting an app URL from a list of application build types, the electronic device 100 creates an area 628 for entering the application to be tested. ) can be displayed. For example, the user may enter the URL address where the script related to the application subject to testing is stored into the area 628.

Meanwhile, if the user does not select an application to be tested in the area 606, the electronic device 100 may perform a test on the application currently on the server.

According to one embodiment, the user interface 600 may include an area 630 for setting a test device to be used when performing an application test according to a test plan. For example, when the user selects the downward icon in area 630 or positions the cursor within area 630, electronic device 100 displays a pull-down menu or drop-down list containing a list of available test devices. can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one or more test devices from the list and display the selected test devices in the area 630.

According to one embodiment, the user interface 600 may include an area 632 for setting whether to copy the test plan. For example, the electronic device 100 may display a toggle switch in the area 632 as a user interface component for setting whether to copy the test plan. If the user activates the toggle switch, the test plan may be copied; if the user disables the toggle switch, the test plan may not be copied.

According to one embodiment, the user interface 600 may include an area 634 for setting parameters related to production. For example, the electronic device 100 may display a toggle switch in the area 634 as a user interface component for setting parameters related to production.

According to one embodiment, the user interface 600 may include an area 640 for setting a server for retrieving test data. More specifically, the user interface 600 may include an area 642 for setting a server to be used when providing an actual service and an area 644 for setting a mock server to be used when performing a test. At this time, the electronic device 100 may change a request to retrieve data about a server to be used when providing an actual service to a request to retrieve data about a mock server to be used when performing a test.

For example, when the user selects the downward icon in the area 642 or positions the cursor within the area 642, the electronic device 100 displays a pull-down menu or drop-down menu containing a list of servers to be used when providing the actual service. A list can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one server from the list and display the selected test target server in area 642.

Alternatively, when the user selects the downward icon in area 644 or positions the cursor within area 644, the electronic device 100 displays a pull-down menu or drop-down list containing a list of simulated servers to be used when performing the test. can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one server from the list, and display the selected test target server in area 644.

According to one embodiment, the user interface 600 may include an area 648 for displaying a list of pairs of servers to be used when providing actual services and mock servers to be used when performing tests. For example, the electronic device 100 obtains a user input for selecting the 7th real server as a server to be used when providing an actual service and a user input for selecting the 7th mock server as a mock server to be used when performing a test, and then clicks the Add icon. As user input for selecting 646 is obtained, the 7th real server and 7th mock server pair may be added to the list and displayed in area 648.

According to one embodiment, the user interface 600 may include an area 650 for deleting a pair of a server to be used when providing an actual service and a mock server to be used when performing a test. For example, when the user selects the Delete icon in the area 650, the electronic device 100 removes the pair of the server to be used when providing the actual service corresponding to the selected Delete icon and the pair of the mock server to be used when performing the test from the list, It can be deleted in area 648.

According to one embodiment, the user interface 600 may include an area 660 for setting a server for exporting test data. More specifically, the user interface 600 may include an area 662 for setting a server to be used when providing an actual service and an area 664 for setting a mock server to be used when performing a test. At this time, the electronic device 100 may change a request to export data about a server to be used when providing an actual service to a request to export data about a mock server to be used when performing a test.

For example, when the user selects the downward icon in the area 662 or positions the cursor within the area 662, the electronic device 100 displays a pull-down menu or drop-down menu containing a list of servers to be used when providing the actual service. A list can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one server from the list and display the selected test target server in area 662.

Alternatively, when the user selects the downward icon in area 664 or positions the cursor within area 664, the electronic device 100 displays a pull-down menu or drop-down list containing a list of simulated servers to be used when performing the test. can be provided. Thereafter, the electronic device 100 may obtain a user's input for selecting one server from the list and display the selected test target server in area 664.

According to one embodiment, the user interface 600 may include an area 668 for displaying a list of pairs of servers to be used when providing actual services and mock servers to be used when performing tests. For example, the electronic device 100 obtains a user input for selecting the 10th real server as a server to be used when providing an actual service and a user input for selecting the 10th mock server as a mock server to be used when performing a test, and then clicks the Add icon. As user input for selecting 666 is obtained, the 10th real server and the 10th mock server pair may be added to the list and displayed in area 668.

According to one embodiment, the user interface 600 may include an area 670 for deleting a pair of a server to be used when providing an actual service and a mock server to be used when performing a test. For example, when the user selects the Delete icon in the area 670, the electronic device 100 removes the pair of the server to be used when providing the actual service corresponding to the selected Delete icon and the pair of the mock server to be used when performing the test from the list, It can be deleted in area 668.

According to one embodiment, the electronic device 100 may close the user interface 600 after obtaining a user input for selecting the Cancel icon 680. Alternatively, the electronic device 100 may obtain a user input for selecting the Run icon 682 and then perform an application test according to the input run setting information.

FIG. 7 is a diagram illustrating a process in which the electronic device 100 manages an application test according to an embodiment.

In step S700, the electronic device 100 may check information about the mock server according to one embodiment. More specifically, before performing an application test, the electronic device 100 may check information about a mock server set in relation to a server for importing test data or a server for exporting test data. For example, the electronic device 100 may use a mock server to be used when performing a test entered in area 554 or area 574 of FIG. 5A or perform a test entered into area 644 or area 664 of FIG. 6A. You can check the mock server to be used.

In step S720, the electronic device 100 may check whether the mock server is online according to one embodiment. For example, before performing an application test, the electronic device 100 may check whether a mock server set in relation to a server for importing test data or a server for exporting test data is online. If all the mock servers are online, the electronic device 100 may perform step S740, and if at least one mock server is offline, the electronic device 100 may perform step S780.

In step S740, the electronic device 100 may perform a test on a target application according to a test plan, according to an embodiment. For example, the electronic device 100 may perform a test on the target application according to setting information and execution setting information included in the test plan.

In step S760, when all mock servers are online, the electronic device 100 may cancel one or more settings after performing an application test. For example, the electronic device 100 may stop the appium server, cancel settings for the user account used when performing the test, and cancel settings for the mock server used when performing the test. Alternatively, the electronic device 100 may cancel the proxy setting or cancel the setting for overriding the user account used when performing the test with the control account or the experimental group account.

In step S780, if at least one mock server is offline, the electronic device 100 may provide an error message. For example, the electronic device 100 may provide an error message indicating that the test cannot be performed because at least one mock server is offline.

FIG. 8 is a diagram illustrating a process in which the electronic device 100 manages an application test according to an embodiment.

In step S800, the electronic device 100 may confirm one or more user accounts to be used when performing a test, according to one embodiment. For example, the electronic device 100 may check one or more user accounts that can be used when performing a test in a user account pool.

In step S820, the electronic device 100 may check whether the user account is restricted. For example, the electronic device 100 may identify at least one user account whose use is restricted among one or more verified user accounts. At this time, restricting the use of a user account may mean that a specific user has locked the user account from being used by other users in order to use it to perform application testing.

In step S840, the electronic device 100 may not use a user account whose use is restricted. For example, the electronic device 100 may not use at least one user account whose use is confirmed to be restricted.

In step S860, the electronic device 100 may set the user account to restrict use for other tests. For example, the electronic device 100 may lock at least one user account whose use is confirmed to be unrestricted to prevent another user from using the at least one user account.

In step S880, the electronic device 100 may perform a test using a user account. For example, the electronic device 100 may perform a test using a user account that is set to restrict use for other tests.

FIG. 9 is a diagram illustrating a process in which the electronic device 100 manages an application test according to an embodiment.

According to one embodiment, when performing an application test according to a test plan, the electronic device 100 may perform the application test according to a test script corresponding to the test case 900 included in the test plan. At this time, the electronic device 100 may perform application testing based on a 3-layer architecture.

For example, the electronic device 100 may call the page function library 920 based on the test case 900. Additionally, the electronic device 100 may call the object operation library 940 or the page object library 960 based on the page function library 920.

According to one embodiment, the page function library 920 may include reusable functions based on a page that can call an object store for object operations. Additionally, the page object library 960 may be reflected in the page library element definition.

According to one embodiment, when the electronic device 100 calls the object operation library 940 based on the page function library 920, appium (980), PIL (982), adb utils (984), and redis You can use tools or frameworks such as (986), pytest (988), mitm proxy (990), or autoRunner (992). At this time, mitm proxy 990 may refer to a tool for setting proxy-related parameters, and autoRunner 992 may refer to a framework for executing tests on multiple devices.

FIG. 10 is a diagram illustrating a process in which the electronic device 100 manages an application test according to an embodiment.

In step S1000, the electronic device 100 may check whether the framework used according to one embodiment is autoRunner. For example, the electronic device 100 determines whether the framework used is autoRunner or pytest, determines the properties for generating execution settings information, and based on information about the operating system included in the execution settings information, actually executes the page library. It can be reflected in the object repository.

In step S1020, the electronic device 100 may check the test plan according to an embodiment. For example, if it is confirmed that the framework used is autoRunner, the electronic device 100 can check the test plan.

In step S1040, the electronic device 100 may perform an application test according to a test plan, according to an embodiment. For example, the electronic device 100 may perform a test on the target application according to the setting information and execution setting information included in the confirmed test plan.

In step S1060, the electronic device 100 may control the appium server and record the appium server log according to an embodiment. For example, the electronic device 100 may control the Appium server to perform automatic start, automatic stop, and automatic error handling (restart), and may record an Appium server log during the process. Additionally, the electronic device 100 may record an android debug bridge (adb) log by a daemon thread and filter crash/application not responding (anr) errors into local log files of other daemon threads.

Figure 11 shows a flowchart of an application test management method for an electronic device according to an embodiment. The foregoing description may apply to overlapping content.

In step S1100, the electronic device may obtain information about the first test plan, including information about at least one test case and information about at least one parameter for test execution.

According to one embodiment, the information about at least one test case may include information about a storage in which at least one test script corresponding to the at least one test case is stored.

According to one embodiment, the at least one test case includes a test case for a cart page, a test case for a checkout page, a test case for a member information page, a test case for a product list page, and a test case for a product detail information page. It may include at least one of test cases and test cases related to the search results page.

According to one embodiment, information about at least one parameter includes information for distinguishing the first test plan, information about the number of times to re-perform the test when performing the test, and information for retrieving the first test data. It may include at least one of information about the server, information about the server for exporting the second test data, and setting information about the control group and experimental group tests.

According to one embodiment, the information for distinguishing the first test plan includes information about the name of the first test plan, information about the user's comment regarding the first test plan, and the type of test object of the first test plan. It may include at least one of information about and information about the category to which the first test plan belongs.

According to one embodiment, information for distinguishing the first test plan may be provided along with a list of a plurality of test plans including the first test plan.

According to one embodiment, the information about the server for importing the first test data or the information about the server for exporting the second test data includes information about the server to be used when providing the actual service and a mock to be used when performing the test. May contain information about the server.

According to one embodiment, the setting information regarding the control group and experimental group tests may include information for overriding the user account to be used when performing the test to the control account or experimental group account based on the terminal identifier or member information.

In step S1120, the electronic device may obtain execution setting information that corresponds to the first test plan and includes information about the target application.

According to one embodiment, the execution setting information includes information about the test device, setting information about the control group and experimental group tests, information about the version of the target application, information about the server for retrieving the first test data, and the second test It may contain at least one piece of information about the server for exporting data.

In step S1140, the electronic device may perform a test on the target application based on information about the first test plan and execution setting information.

According to one embodiment, when performing a test on a target application, the electronic device may change a request for a server to be used when providing an actual service to a request for a mock server to be used when performing the test.

According to one embodiment, when performing a test on a target application, the electronic device may call a page function library and a page object library based on information about at least one test case.

In step S1160, the electronic device may provide information on the results of the test.

According to one embodiment, the electronic device may provide a list of a plurality of test plans including the first test plan.

According to one embodiment, the electronic device checks information about a second test plan selected for editing among a list of a plurality of test plans, and provides information about test cases of the second test plan and parameters of the second test plan. A user input that modifies at least one of the information may be confirmed, and a third test plan may be created based on the user input.

According to one embodiment, the electronic device may check information about a simulated server to be used when performing a test among information about at least one parameter and determine whether the simulated server is online or offline.

According to one embodiment, if the mock server is online, the electronic device may perform a test on the target application according to the first test plan, and if the mock server is offline, the electronic device may provide an error message.

According to one embodiment, the electronic device may check at least one user account whose use is not restricted among one or more user accounts to be used when performing a test, and set the at least one user account to restrict use for other tests. .

FIG. 12 shows a block diagram of an electronic device 100 according to an embodiment.

According to one embodiment, the electronic device 100 may include a communication device 1220, a memory 1240, and a controller 1260. The electronic device 100 shown in FIG. 12 shows only components related to this embodiment. Accordingly, those skilled in the art can understand that other general-purpose components may be included in addition to the components shown in FIG. 12. Since the electronic device 100 may include content related to the above-described server, description of overlapping content will be omitted. In an embodiment, the communication unit may include one or more transceivers. Additionally, in an embodiment, the control unit may include one or more processors.

The communication unit 1220 is a device for performing wired/wireless communication and can communicate with external electronic devices. The external electronic device may be a terminal or server. In addition, communication technologies used by the communication unit 1220 include Global System for Mobile communication (GSM), Code Division Multi Access (CDMA), Long Term Evolution (LTE), 5G, Wireless LAN (WLAN), and Wireless-Fidelity (Wi-Fi). ), Bluetooth, RFID (Radio Frequency Identification), Infrared Data Association (IrDA), ZigBee, NFC (Near Field Communication), etc.

The control unit 1260 can control the overall operation of the electronic device 100 and process data and signals. The control unit 1260 may be composed of at least one hardware unit. Additionally, the control unit 1260 may operate by one or more software modules generated by executing program codes stored in the memory 1240. The control unit 1260 may include a processor and a memory, and the processor may execute program codes stored in the memory to control the overall operation of the electronic device 100 and process data and signals. Additionally, in an embodiment, the control unit 1260 may include at least one processor.

The control unit 1260 obtains information about the first test plan, including information about at least one test case and information about at least one parameter for test execution, corresponds to the first test plan, and applies the target application. Execution setting information including information on may be obtained, a test on the target application may be performed based on the information on the first test plan and the execution setting information, and information on test performance results may be provided.

Electronic devices according to the above-described embodiments include a processor, memory for storing and executing program data, permanent storage such as a disk drive, a communication port for communicating with an external device, a touch panel, keys, buttons, etc. It may include the same user interface device, etc. Methods implemented as software modules or algorithms may be stored on a computer-readable recording medium as computer-readable codes or program instructions executable on the processor. Here, computer-readable recording media include magnetic storage media (e.g., ROM (read-only memory), RAM (random-access memory), floppy disk, hard disk, etc.) and optical read media (e.g., CD-ROM). ), DVD (Digital Versatile Disc), etc. The computer-readable recording medium is distributed among computer systems connected to a network, so that computer-readable code can be stored and executed in a distributed manner. The media may be readable by a computer, stored in memory, and executed by a processor.

This embodiment can be represented by functional block configurations and various processing steps. These functional blocks may be implemented in various numbers of hardware or/and software configurations that execute specific functions. For example, embodiments include integrated circuit configurations such as memory, processing, logic, look-up tables, etc. that can execute various functions under the control of one or more microprocessors or other control devices. can be hired. Similar to how the components can be implemented as software programming or software elements, the present embodiments include various algorithms implemented as combinations of data structures, processes, routines or other programming constructs, such as C, C++, Java ( It can be implemented in a programming or scripting language such as Java), assembler, etc. Functional aspects may be implemented as algorithms running on one or more processors. Additionally, this embodiment may employ conventional technologies for electronic environment settings, signal processing, and/or data processing. Terms such as “mechanism,” “element,” “means,” and “configuration” may be used broadly and are not limited to mechanical and physical configurations. The term may include the meaning of a series of software routines in connection with a processor, etc.

The above-described embodiments are merely examples and other embodiments may be implemented within the scope of the claims described below.

Claims

In a method for managing application testing of an electronic device,

Obtaining information about a first test plan, including information about at least one test case and information about at least one parameter for test execution;

Obtaining execution setting information corresponding to the first test plan and including information about the target application;

performing a test on the target application based on information about the first test plan and the execution setting information; and

An application test management method, including providing information on performance results of the test.
According to claim 1,

An application test management method further comprising providing a list of a plurality of test plans including the first test plan.
The method of claim 1, wherein the information about the at least one test case is:

An application test management method including information about a storage in which at least one test script corresponding to the at least one test case is stored.
The method of claim 1, wherein the at least one test case is:

Test case on cart page;

Test case about checkout page;

Test case for member information page;

Test case for product list page;

Test case for product details page; and

A method for managing application testing, including at least one test case related to a search results page.
The method of claim 1, wherein the information about the at least one parameter is:

Information for distinguishing the first test plan;

Information on the number of times to re-perform the test if the test fails to be performed;

Information about a server for retrieving first test data;

Information about a server for exporting second test data; and

An application test management method, including at least one of setting information regarding control group and experimental group tests.
The method of claim 5, wherein the information for distinguishing the first test plan is:

information regarding the name of the first test plan;

information about the user's comments regarding the first test plan;

Information about the type of test object of the first test plan; and

An application test management method including at least one of information about a category to which the first test plan belongs.
The method of claim 5, wherein the information for distinguishing the first test plan is:

An application test management method provided with a list of a plurality of test plans including the first test plan.
The method of claim 5, wherein the information about the server for importing the first test data or the information about the server for exporting the second test data is:

Information about the server to be used when providing the actual service; and

An application test management method that includes information about the mock server to be used when performing testing.
The method of claim 8, wherein performing a test on the target application includes:

An application test management method comprising changing a request for a server to be used when providing the actual service to a request for a mock server to be used when performing the test.
The method of claim 5, wherein the setting information regarding the control group and experimental group tests is,

An application test management method including information for overriding a user account to be used when performing a test into a control account or an experimental group account based on the identifier or member information of the terminal.
The method of claim 1, wherein the execution setting information is:

Information about the test device;

Set-up information regarding control and experimental group testing;

Information about the version of the target application;

Information about a server for retrieving first test data; and

An application test management method, comprising at least one of information about a server for exporting second test data.
According to clause 2,

Confirming information about a second test plan selected for editing from the list of the plurality of test plans;

confirming a user input for modifying at least one of information about test cases of the second test plan and information about parameters of the second test plan; and

An application test management method further comprising generating a third test plan based on the user input.
According to claim 1,

Confirming information about a mock server to be used when performing a test among information about the at least one parameter; and

An application test management method further comprising checking whether the mock server is online or offline.
According to claim 13,

If the mock server is online, performing a test on the target application according to the first test plan, and if the mock server is offline, providing an error message.
According to claim 1,

Confirming at least one user account whose use is not restricted among one or more user accounts to be used when performing a test; and

Application test management method further comprising setting the at least one user account to restrict use for other tests.
The method of claim 1, wherein performing a test on the target application comprises:

An application test management method, comprising calling a page function library and a page object library based on information about the at least one test case.
A non-transitory computer-readable recording medium that records a program for executing the method of claim 1 on a computer.
As an electronic device,

Ministry of Communications;

Memory; and

It includes a controller, wherein the controller includes:

Obtain information about a first test plan, including information about at least one test case and information about at least one parameter for test execution,

Acquire execution setting information corresponding to the first test plan and including information about the target application,

Based on the information about the first test plan and the execution settings information, perform a test on the target application,

An electronic device that provides information on the results of the test.