WO2024031764A1

WO2024031764A1 - Method for determining offset of wave, apparatus, device, and storage medium

Info

Publication number: WO2024031764A1
Application number: PCT/CN2022/117247
Authority: WO
Inventors: 孔祥健; 胡家艳; 张慕婵; 陈宏刚; 张博; 罗勇; 马卫东
Original assignee: 武汉光迅科技股份有限公司
Priority date: 2022-08-12
Filing date: 2022-09-06
Publication date: 2024-02-15
Also published as: CN117639914A

Abstract

Provided in the embodiments of the present disclosure are a method for determining the offset of a wave, an apparatus, a device, and a storage medium. The method comprises: acquiring loss data of a wave at a first working temperature; determining whether the loss data satisfies the requirement of a preset index; and, when the loss data satisfies the requirement of the preset index, determining a target offset of the wave at the first working temperature on the basis of the loss data and the preset index. By acquiring the loss data of the wave at the first working temperature and by determining the target offset of the wave at the first working temperature on the basis of the requirement of the preset index corresponding to the loss data, chips are screened according to the target offset, thereby increasing the utilization rate of the chips while ensuring the qualified rate of finished products.

Description

Method, device, equipment and storage medium for determining wave offset

Technical field

The present disclosure relates to the technical field of optical fiber communication, and in particular to a method, device, equipment and storage medium for determining the offset of a wave.

Background technique

In optical communication systems, especially in wavelength division multiplexing (WDM) optical networks, filters are core components. Usually, the filter can be placed in front of the photodetector to form a tuned receiver, or the filter can be placed in the laser cavity to form a wavelength-tunable light source. The filter has a wide range of application scenarios.

In practical applications, changes in ambient temperature will cause changes in filter insertion loss (Insertion Loss, also known as insertion loss) and wavelength shift, and wavelength shift will further cause changes in the filter's insertion loss, bandwidth and crosstalk indicators. changes, so a certain degree of redundancy needs to be considered when screening room temperature device indicators or chip indicators. If necessary, a certain temperature compensation packaging scheme needs to be adopted so that the filter indicators within the operating temperature range meet certain requirements, thereby ensuring optical communication. normal operation of the network.

Screening of normal temperature indicators requires considering a certain indicator redundancy. Since chips account for a very large proportion in the cost of the product, in order to ensure chip utilization, usually the smaller the indicator redundancy, the better; however, in production, the product qualification rate is Key indicators, and the production process of filter products is complex and numerous. The previous process is the raw material for the next process. In addition, considering the volatility of the production process, the smaller the redundancy of chip indicator screening, the lower the pass rate of subsequent processes. , which leads to the paradoxical phenomenon that the final product qualification rate is lower. Therefore, how to improve the utilization rate of chips in the previous process while ensuring the qualification rate of subsequent processes is an issue that needs to be solved urgently.

There is currently no effective solution to the above problems.

Contents of the invention

In view of this, the present disclosure provides a method, device, equipment and storage medium for determining the offset of a wave.

The technical solution of the present disclosure is implemented as follows:

Embodiments of the present disclosure provide a method for determining the offset of a wave, including:

Obtain loss data of the wave at the first operating temperature;

Determine whether the loss data meets the requirements of the preset indicators;

If the loss data meets the requirements of the preset index, the target offset of the wave at the first operating temperature is determined based on the loss data and the preset index.

In the above solution, the loss data includes accuracy data of the wave; the preset index includes an accuracy index; the method further includes:

determining first wavelength data of said wave at said first operating temperature;

Process the first wavelength data based on a preset method to determine the accuracy data of the wave at the first operating temperature;

If the accuracy data meets the requirements of the accuracy index, a target offset of the wave at the first operating temperature is determined based on the accuracy data and the accuracy index.

In the above solution, the loss data includes insertion loss data of the wave; the preset index includes an insertion loss index; the method further includes:

determining second wavelength data of the wave at the first operating temperature based on the insertion loss data;

Based on the insertion loss index, determine third wavelength data of the wave at the first operating temperature;

If the insertion loss data meets the requirements of the insertion loss index, the target offset of the wave at the first operating temperature is determined based on the second wavelength data and the third wavelength data.

In the above solution, the loss data includes bandwidth data of the wave, and the bandwidth data includes first bandwidth data and second bandwidth data; the preset index includes a bandwidth index; the method further includes:

Determining fourth wavelength data of said wave at said first operating temperature;

determining the first bandwidth data and the second bandwidth data based on the fourth wavelength data;

If the first bandwidth data and the second bandwidth data meet the requirements of the bandwidth index, a target offset of the wave at the first operating temperature is determined based on the bandwidth index.

In the above solution, the loss data includes crosstalk data of the wave; the preset index includes a crosstalk index; the method further includes:

If the crosstalk data meets the requirements of the crosstalk index, a target offset of the wave at the first operating temperature is determined based on the crosstalk data and the crosstalk index.

In the above solution, the method further includes:

Obtain the first loss data among the plurality of loss data of the wave at the first operating temperature; wherein the first loss data is any loss data among the plurality of loss data;

The first offset of the wave at the first operating temperature is determined based on the first loss data and a first preset index among a plurality of the preset indexes; wherein, the first preset index Characterizing an indicator corresponding to the first loss data;

Based on the first offset and second loss data among the plurality of loss data, a target offset of the wave at the first operating temperature is determined; wherein the second loss data represents the Any loss data among the plurality of loss data except the first loss data.

In the above solution, after determining the target offset of the wave at the first operating temperature based on the loss data at the first operating temperature and the preset index, the method further includes:

Obtain the loss data of the wave at a second operating temperature; wherein the second operating temperature represents any operating temperature other than the first operating temperature;

Determine whether the loss data at the second operating temperature meets the requirements of the preset indicators;

When the loss data at the second operating temperature meets the requirements of the preset index, it is determined based on the loss data at the second operating temperature and the preset index that the wave is in the second operation state. Target offset at temperature;

An operating offset of the wave is determined based on the target offset at the first operating temperature and the target offset at the second operating temperature.

Embodiments of the present disclosure provide a device for determining the offset of a wave. The device includes: an interaction module, a control module, a storage module and an operation module; the control module is connected to the interaction module, the storage module and the calculation module respectively. The above operation module connection;

The interactive module is used to input operation instructions and send the operation instructions to the control module;

The control module is configured to receive the operation instruction, retrieve the operation task corresponding to the operation instruction in the storage module, and allocate the operation task to the operation module;

The computing module is configured to receive the computing task, calculate the offset of the wave based on the computing task, and store the offset of the wave as the computing result in the storage module;

The storage module is used to store the operation tasks corresponding to the operation instructions and store the operation results.

In the above scenario:

The control module is also used to send the operation results stored in the storage module to the interactive module;

The interactive module is also used to receive and display the operation results sent by the control module.

In the above solution, the computing module includes: a laser emission unit, a polarization control unit, a spectroscopic unit, a filter to be tested, a power monitoring unit and a computing unit;

The laser emitting unit is used to emit laser light with a wavelength;

The polarization control unit is used to control the laser to traverse polarization states;

The spectroscopic unit is used to split the laser;

The filter to be tested is used to pass the laser;

The power monitoring unit is used to monitor the optical power of the laser;

The calculation unit is configured to calculate the offset of the wave based on the wavelength-transmittance data corresponding to the optical power.

An embodiment of the present disclosure provides a device for determining a wave offset, which includes:

The first acquisition module is used to acquire the loss data of the wave at the first operating temperature;

A judgment module used to judge whether the loss data meets the requirements of the preset indicators;

A first determination module, configured to determine the target deflection of the wave at the first operating temperature based on the loss data and the preset index when the loss data meets the requirements of the preset index. Shift amount.

An embodiment of the present disclosure provides a device for determining a wave offset, including a memory and a processor. The memory stores a computer program that can be run on the processor. When the processor executes the program, the above is implemented. steps in the method.

Embodiments of the present disclosure provide a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps in the above method are implemented.

Embodiments of the present disclosure provide a method, device, equipment and storage medium for determining a wave offset. Wherein, the method includes: obtaining the loss data of the wave at the first operating temperature; judging whether the loss data meets the requirements of the preset index; when the loss data meets the requirements of the preset index , determining the target offset of the wave at the first operating temperature based on the loss data and the preset index. By obtaining the loss data of the wave at the first operating temperature and combining the requirements of the preset index corresponding to the loss data, the target offset of the wave at the first operating temperature is determined. The above target offset is used to screen the chips to ensure the pass rate of the chips.

Description of drawings

Figure 1 is a schematic flow chart of a method for determining the offset of a wave according to an embodiment of the present disclosure;

Figure 2 is a schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions according to the method for determining the wave offset according to the embodiment of the present disclosure;

Figure 3 is a partially enlarged schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions according to the method for determining the wave offset according to the embodiment of the present disclosure;

Figure 4 is a schematic diagram illustrating the definition of central wavelength and wavelength accuracy in the method for determining wave offset according to an embodiment of the present disclosure;

Figure 5 is a schematic diagram of the insertion loss definition in the method for determining the offset of the wave according to the embodiment of the present disclosure;

Figure 6 is a schematic diagram of the bandwidth definition in the method for determining the offset of the wave according to the embodiment of the present disclosure;

Figure 7 is a schematic diagram of the definition of crosstalk in the method for determining the offset of a wave according to an embodiment of the present disclosure;

Figure 8 is a schematic structural diagram of a device for determining the offset of a wave according to an embodiment of the present disclosure;

Figure 9 is a schematic structural diagram of a device for determining the offset of a wave according to an embodiment of the present disclosure;

FIG. 10 is a schematic diagram of the hardware structure of a device for determining wave offset according to an embodiment of the present disclosure.

Detailed ways

In order to make the purpose, technical solutions and advantages of the embodiments of the present disclosure more clear, the specific technical solutions disclosed will be further described in detail below in conjunction with the drawings in the embodiments of the present disclosure. The following examples serve to illustrate the disclosure but are not intended to limit the scope of the disclosure.

In related technologies, changes in temperature in the optical communication network environment will cause changes in filter indicators. Therefore, a certain redundancy needs to be considered when screening normal temperature indicators or chip indicators. In production, chips account for a large proportion of the product cost. Very large. In order to ensure the utilization of the chip, it is usually hoped that the redundancy of filter chip index screening should be as small as possible. However, considering the volatility of the production process, especially the volatility of temperature compensation, the smaller the redundancy of index screening, the better. This will lead to the paradoxical phenomenon that the final product qualification rate will be lower. In response to this contradictory phenomenon, this embodiment proposes an index of the wavelength shift amount of the filter, based on which the chip and temperature compensation design are screened, so as to ensure the product qualification rate while improving the chip utilization rate.

This embodiment proposes a method for determining the offset of a wave. This method is applied to a device for determining the offset of a wave. The functions implemented by this method can be called by the processor in the device for determining the offset of the wave. To implement, of course the program code can be stored in a computer storage medium. It can be seen that the computing device at least includes a processor and a storage medium.

Figure 1 is a schematic flow chart of a method for determining the offset of a wave according to an embodiment of the present disclosure. As shown in Figure 1, the method includes:

Step 101: Obtain the loss data of the wave at the first operating temperature;

Step 102: Determine whether the loss data meets the requirements of the preset indicators;

Step 103: If the loss data meets the requirements of the preset index, determine the target offset of the wave at the first operating temperature based on the loss data and the preset index.

In step 101: the determination process of the wave offset can be determined according to the actual situation, and is not limited here. As an example, the method for determining the offset amount of the wave may be a method for evaluating the offset amount of the filter wavelength.

The first working temperature can be determined according to actual conditions and is not limited here. As an example, the first working temperature may be any temperature under normal temperature. The loss data may be data defining an index of the wave at a first operating temperature. The loss data is related to the first operating temperature. Specifically, the loss data may be any one of precision data, insertion loss data, bandwidth data and crosstalk data. The loss data can also be index data such as passband flatness data and polarization-related loss data, and the calculation method for the offset of the corresponding wave is the same.

In step 102: the preset index may be a defined index of the wave related to the loss data. Specifically, the preset index may be any index among accuracy index, insertion loss index, bandwidth index and crosstalk index. Determining whether the loss data meets the requirements of the preset index may be: judging whether the accuracy data meets the requirements of the accuracy index, or judging whether the insertion loss data meets the requirements of the insertion loss index, or judging whether the bandwidth data meets the requirements of the insertion loss index. bandwidth index requirements, or determine whether the crosstalk data meets the crosstalk index requirements.

In step 103: the process of determining the target offset of the wave at the first operating temperature based on the loss data and the preset index can be determined according to the actual situation, and is not limited here. As an example, the target offset of the wave at the first operating temperature may be determined based on wavelength-transmittance data, combined with the loss data and the preset index.

Embodiments of the present disclosure provide a method for determining the offset of a wave, obtaining the loss data of the wave at the first operating temperature; determining whether the loss data meets the requirements of the preset index; If the requirement of the preset index is met, the target offset of the wave at the first operating temperature is determined based on the loss data and the preset index. By obtaining the loss data of the wave at the first operating temperature and combining the requirements of the preset index corresponding to the loss data, the target offset of the wave at the first operating temperature is determined. Screening chips with the above target offset ensures that the finished product qualification rate is ensured and the utilization rate of the chip is also improved.

In an optional embodiment of the present disclosure, the loss data includes accuracy data of the wave; the preset index includes an accuracy index; the method further includes:

In this embodiment, the first wavelength data can be determined according to actual conditions and is not limited here. As an example, the first wavelength data may be a central wavelength, which represents the corresponding wavelength value at the center of the spectral range covered by the peak insertion loss reduction ndB.

The accuracy index can be determined according to actual conditions and is not limited here. As an example, the accuracy index may be wavelength accuracy requirements.

The process of determining the first wavelength data of the wave at the first operating temperature can be determined according to actual conditions and is not limited here. As an example, according to the wavelength-transmittance data under the first operating temperature situation, the corresponding center wavelength at the center of the spectral range covered by the peak insertion loss reduction ndB is determined.

Processing the first wavelength data based on a preset method and determining the accuracy data of the wave at the first operating temperature may be: determining the preset wavelength data based on a preset criterion, based on the preset method The preset wavelength data and the first wavelength data are processed to determine accuracy data of the wave at the first operating temperature.

The determination of the preset wavelength data according to the preset criteria can be determined according to actual conditions, and is not limited here. As an example, one of the ITU wavelengths can be selected according to the International Telecommunication Union (International Telecommunication Union, ITU) standard.

Processing the preset wavelength data and the first wavelength data based on the preset method, determining the accuracy data of the wave at the first operating temperature may be, combining the first wavelength data and the first wavelength data. The difference is performed on the preset wavelength data to determine the accuracy data of the wave at the first operating temperature.

In the case where the accuracy data meets the requirements of the accuracy index, determining the target offset of the wave at the first operating temperature based on the accuracy data and the accuracy index may be, where When the accuracy data meets the requirements of the accuracy index, the target offset of the wave at the first operating temperature is obtained by difference between each accuracy value in the accuracy index and the accuracy data. . Wherein, the target offset may be a precision offset, and the precision offset may be a precision offset range.

For ease of understanding, we can assume a 48-channel filter (wavelength division multiplexer) with 100GHz channel spacing. The starting frequencies are 196100GHz and 191400GHz respectively. According to the ITU standard, one of the ITU wavelengths is selected as λ _ITU = 1529.553nm (f _ITU = 196000GHz) channel, λ _ITU can represent the ITU center wavelength shown in Figures 4 to 7, and the specific values are not limited to the aforementioned examples. Figure 2 is a schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions according to the method for determining the wave offset according to the embodiment of the present disclosure. The ordinate of Figure 2 represents the transmittance (Transmittance), and the horizontal axis of Figure 2 The coordinates represent wavelength (Wavelength). In the related art, insertion loss has an inverse relationship with transmittance. The wavelength-transmittance data of the channel at room temperature 25°C is shown in Figure 2. FIG. 2 is partially enlarged. FIG. 3 is a partially enlarged schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions according to the method for determining the wave offset according to the embodiment of the present disclosure. The ordinate of FIG. 3 represents the transmittance (Transmittance). ), the abscissa in Figure 3 represents wavelength (Wavelength). The wavelength-transmittance data when the wavelength is selected as 1524-1534nm is shown in Figure 3. Figure 4 is a schematic diagram of the definition of the center wavelength and wavelength accuracy in the method for determining the wave offset according to the embodiment of the present disclosure. As shown in Figure 4, according to the wavelength-transmittance data of the channel at room temperature of 25°C, the starting point from the peak value is determined. The peak insertion loss at the wavelength is reduced by 3dB. The corresponding central wavelength λ _c at the center of the spectral range covered (i.e., the 3dB central wavelength λ _c shown in the figure) is 1529.526nm. The calculation of the accuracy data of the wave is as shown in formula (1):

Δλ＝λ _c -λ _ITU (1)

In formula (1), Δλ is the accuracy data of the wave, such as the center wavelength accuracy Δλ shown in the figure. According to the above formula (1), the accuracy data Δλ of the wave is determined to be -27pm. Based on the wavelength accuracy requirement Δλ _WA is [-40,40]pm, it is determined that the wave accuracy meets the wavelength accuracy requirement. The calculation of the accuracy offset of the wave is as shown in formula (2):

Δλ _range =Δλ _WA +λ _ITU -λ _C (2)

In equation (2), Δλ _range is the accuracy offset of the wave. According to the above formula (2), the accurate offset range of the wave at room temperature 25°C is calculated to be [-13,67]pm.

In an optional embodiment of the present disclosure, the loss data includes insertion loss data of the wave; the preset index includes an insertion loss index; the method further includes:

In this embodiment, the insertion loss data can be determined according to the actual situation. The insertion loss data can be the maximum insertion loss within the effective bandwidth of the channel, the peak insertion loss, or the center wavelength insertion loss. , there is no limitation here, the calculation idea of the wavelength shiftable amount is the same. As an example, the insertion loss data may be the maximum insertion loss within the effective bandwidth of the channel.

Determining the second wavelength data of the wave at the first operating temperature based on the insertion loss data may be based on the maximum insertion loss within the effective bandwidth of the channel and the wavelength-transmittance of the wave at normal temperature. data to determine second wavelength data of said wave at said first operating temperature.

The insertion loss index can be determined according to the actual situation, and is not limited here. The insertion loss index can be the insertion loss index requirement within the effective bandwidth. As an example, the insertion loss index may be the insertion loss index requirement within the effective bandwidth ±12.5 GHz, for example, within 6 dB.

Determining the third wavelength data of the wave at the first operating temperature based on the insertion loss index may be based on the insertion loss index requirements within the effective bandwidth and the wavelength-transmittance data of the wave at normal temperature. , determine the third wavelength data of the wave at the first operating temperature.

When the insertion loss data meets the requirements of the insertion loss index, determining the target deflection of the wave at the first operating temperature based on the second wavelength data and the third wavelength data. The shift amount can be: when the maximum insertion loss within the effective bandwidth of the channel is less than the insertion loss index requirement within the effective bandwidth, the difference between the third wavelength data and the second wavelength data is obtained to obtain the wave in the Target offset at first operating temperature. The target offset may be an insertion loss offset, and the insertion loss offset may be an insertion loss offset range.

In order to facilitate understanding, Figure 5 is a schematic diagram of the insertion loss definition in the method for determining the wave offset according to the embodiment of the present disclosure. As shown in Figure 5, it can be assumed that the insertion loss data is the maximum insertion loss within the effective bandwidth of the channel, especially It is important to note that temperature-dependent wavelength shift does not affect peak insertion loss, but temperature-dependent loss does. The calculation of the insertion loss offset based on the wave insertion loss data can be calculated using the central wavelength, such as the 3dB central wavelength λ _c shown in Figure 4, or the ITU central wavelength, which is used in the embodiment of the present disclosure. The ITU center wavelength is calculated. The center wavelength insertion loss shown in the figure represents the insertion loss value corresponding to the ITU center wavelength. According to the wavelength-transmittance data, the insertion loss within the effective bandwidth of the +/-12.5GHz channel is calculated to be 5dB at room temperature of 25°C. At this time, the minimum value λ _min and the maximum value λ _max of the wavelength within the effective bandwidth range are calculated as follows: formula (3 ) and (4):

In formulas (3) and (4), c represents the speed of light constant, and c=299792458m/s, and Δf _passband represents the effective bandwidth of the channel. In the embodiment of the present disclosure, Δf _passband =25GHz is substituted, where Δf _passband /2 corresponds to 12.5GHz, and -Δf _passband /2 corresponds to -12.5GHz.

According to the above formulas (3) and (4), the second wavelength data is calculated based on the insertion loss data, that is, the effective bandwidth range is [1529.456, 1529.651] nm, and the insertion loss based on the in-band insertion loss requirement is within 6dB. Indicators, combined with the wavelength-transmittance data at room temperature of 25°C, from 1529.456nm to the short wavelength direction, the wavelength corresponding to the insertion loss of 6dB is determined to be 1529.154nm; from 1529.651nm to the long wavelength direction, the wavelength corresponding to the insertion loss of 6dB is determined to be 1529.907 nm, the third wavelength data is calculated, that is, the bandwidth range corresponding to the insertion loss index is [1529.154, 1529.907] nm.

At this time, the bandwidth offset of the wave calculated based on the second wavelength data and the third wavelength data can be: from 1529.456nm to the short wavelength direction, 1529.456-1529.154=0.302nm=302pm, and from 1529.651nm to the short wavelength direction. In the long wavelength direction, 1529.907-1529.651=0.256nm=256pm. To sum up, based on the requirement that the insertion loss is within 6dB, the offset range of the insertion loss is [-302,256]pm.

In an optional embodiment of the present disclosure, the loss data includes bandwidth data of the wave, and the bandwidth data includes first bandwidth data and second bandwidth data; the preset indicator includes a bandwidth indicator; Methods also include:

In this embodiment, the fourth wavelength data can be determined according to actual conditions and is not limited here. As an example, the fourth wavelength data may be the first wavelength value and the second wavelength value corresponding to the spectral range covered by the peak insertion loss reduction ndB. As an example, the first wavelength value may represent a short wavelength value corresponding to a peak insertion loss decrease of ndB; the second wavelength value may represent a long wavelength value corresponding to a peak insertion loss decrease of ndB, and vice versa.

The bandwidth index can be determined according to actual conditions and is not limited here. As an example, the bandwidth indicator may be an indicator requirement based on ndB net bandwidth.

The first bandwidth data can be determined according to actual conditions and is not limited here. As an example, the first bandwidth data may be full bandwidth data. The second bandwidth data can be determined according to actual conditions and is not limited here. As an example, the second bandwidth data may be net bandwidth data.

Determining the first bandwidth data and the second bandwidth data based on the fourth wavelength data may include: determining a first bandwidth value based on the first wavelength value; determining a second bandwidth based on the second wavelength value. value; sum the first bandwidth value and the second bandwidth value to obtain the first bandwidth data; accumulate the smaller wavelength value of the first wavelength value and the second wavelength value twice. , obtain the second bandwidth data.

In the case where the first bandwidth data and the second bandwidth data meet the requirements of the bandwidth indicator, determining the target offset of the wave at the first operating temperature based on the bandwidth indicator may be, In the case where the first bandwidth data and the second bandwidth data are greater than the index requirement based on ndB net bandwidth; determine the wavelength based on the bandwidth index, the fourth wavelength data and the ITU wavelength selected according to the ITU standard. Target offset at said first operating temperature. The target offset may be a bandwidth offset, and the bandwidth offset may be a bandwidth offset range.

In order to facilitate understanding, Figure 6 is a schematic diagram of the bandwidth definition in the method for determining the wave offset according to the embodiment of the present disclosure. As shown in Figure 6, assuming that the ndB bandwidth is defined as the spectrum width covered by the peak insertion loss reduced by ndB, the full bandwidth = BW1+BW2, net bandwidth = 2×min (BW1, BW2), the full bandwidth index under this bandwidth definition is not affected by wavelength offset. The index based on ndB net bandwidth requires BW _net GHz, the maximum wavelength shifted to the shortwave direction The calculations of the offset Δλ _nBW- and the maximum wavelength offset Δλ _nBW+ that shift toward the long wave direction are as shown in formulas (5) and (6) respectively:

In formulas (5) and (6), c represents the speed of light constant, and c=299792458m/s, λ _n- represents the short wavelength value corresponding to the peak insertion loss decrease of ndB at room temperature of 25°C, and λ _n+ represents the short wavelength value at room temperature of 25°C. The calculation and analysis idea is also applicable to the long wavelength value corresponding to the peak insertion loss decreasing by ndB. The definition of ndB bandwidth is based on the case where the ITU wavelength insertion loss decreases by ndB. The calculation idea of the wavelength offset amount is the same. According to the definition of wavelength-transmittance data, it is calculated that the short wavelength value and long wavelength value corresponding to a 3dB drop in peak insertion loss at room temperature of 25°C are λ _3- =1529.025nm and λ ₃₊ =1530.027nm respectively. The calculations of the first bandwidth value BW1 and the second bandwidth value BW2 are as shown in formulas (7) and (8) respectively:

BW1＝c/λ _3- -f _ITU ＝c/1529.025-196000＝67.7GHz (7)

BW2＝f _ITU -c/λ ₃₊ ＝196000-c/1530.027＝60.67GHz (8)

At this time, BW1=67.7GHz and BW2=60.67GHz. Accordingly, the net bandwidth data and the full bandwidth data are 121.34GHz and 128.37GHz respectively. Based on the requirement that the 3dB net bandwidth index is above 120GHz, combined with the wavelength-transmittance data at room temperature of 25°C, if there is a shift in the shortwave direction, the calculation of the maximum wavelength shift is as shown in formula (9):

Based on the 3dB net bandwidth index requirement of 120GHz or above, combined with the wavelength-transmittance data at room temperature of 25°C, if it shifts to the long wave direction, the calculation of the maximum wavelength shift is as shown in formula (10):

In summary, based on the requirement of insertion loss 3dB bandwidth within 120GHz, the bandwidth offset range of the wave is [-5,59]pm.

In an optional embodiment of the present disclosure, the loss data includes crosstalk data of the wave; the preset index includes a crosstalk index; the method further includes:

In this embodiment, when the crosstalk data meets the requirements of the crosstalk index, the target offset of the wave at the first operating temperature is determined based on the crosstalk data and the crosstalk index. It may be that, when the crosstalk data is greater than the requirement of the crosstalk index, the target offset of the wave at the first operating temperature is determined based on the crosstalk data and the crosstalk index. The target offset may be a crosstalk offset, and the crosstalk offset may be a crosstalk offset range.

The crosstalk data can be determined according to actual conditions and is not limited here. As an example, the crosstalk data may be adjacent crosstalk data, non-adjacent crosstalk data or total crosstalk data. The crosstalk index can be determined according to actual conditions and is not limited here. As an example, the crosstalk indicator may be an adjacent crosstalk requirement indicator, a non-adjacent crosstalk requirement indicator, or a total crosstalk requirement indicator. The target offset may be an adjacent crosstalk offset, a non-adjacent crosstalk offset or a total crosstalk offset, and the adjacent crosstalk offset may be an adjacent crosstalk offset range, and the The non-adjacent crosstalk offset may be a non-adjacent crosstalk offset range, and the total crosstalk offset may be a total crosstalk offset range.

In order to facilitate understanding, Figure 7 is a schematic diagram of the definition of crosstalk in the method for determining the offset of a wave according to an embodiment of the present disclosure. It is assumed that adjacent crosstalk (also called "adjacent channel crosstalk", AX) is defined as the interpolation within the effective bandwidth range of the channel. The difference between the maximum loss value and the minimum insertion loss value of the adjacent channel within the corresponding channel effective bandwidth range, as shown in Figure 7. The adjacent crosstalk usually takes the minimum value of the left adjacent crosstalk and the right adjacent crosstalk. According to the wavelength - Based on the transmittance data, the adjacent crosstalk is calculated to be 7.58dB at room temperature of 25°C. Based on the adjacent crosstalk requirement of 4dB or more, combined with the wavelength-transmittance data at room temperature of 25°C, if it shifts to shortwave, the maximum value of the insertion loss in the effective bandwidth of the channel is within the corresponding channel effective bandwidth range of the adjacent channel. The minimum value of insertion loss will change, and the corresponding difference will also change. As the wavelength shifts toward shortwave, when the adjacent crosstalk is less than 4dB for the first time, the adjacent crosstalk offset toward shortwave can be calculated. In the same way, the adjacent crosstalk offset toward shortwave can be calculated. The adjacent crosstalk offset of the long wave offset, thereby determining the adjacent crosstalk offset range.

Assuming that non-adjacent crosstalk (also called "non-adjacent channel crosstalk", NX) is defined as the difference between the maximum insertion loss within the effective bandwidth range of the channel and the minimum insertion loss value of the non-adjacent channel within the corresponding channel effective bandwidth range, As shown in Figure 7, non-adjacent crosstalk usually takes the minimum value among all non-adjacent crosstalk. Based on the wavelength-transmittance data, the non-adjacent crosstalk is calculated to be 38.33dB at room temperature of 25°C. Based on the non-adjacent crosstalk requirement of 30dB or more, combined with the wavelength-transmittance data at room temperature of 25°C, if the non-adjacent crosstalk shifts to shortwave and the non-adjacent crosstalk is less than 30dB for the first time, calculate the non-adjacent crosstalk offset that shifts to shortwave. In the same way, the non-adjacent crosstalk offset that shifts to long wavelength can be calculated to determine the range of non-adjacent crosstalk offset.

Assuming that the total crosstalk (TX) is defined as the sum of all adjacent crosstalk and non-adjacent crosstalk, the total crosstalk TX _j of channel j is calculated as shown in formula (11):

In formula (11), 1≤j≤N, 1≤i≤N, N represents the total number of channels, and i, j and N are all positive integers. AX _j,i represents the adjacent crosstalk of channel j to channel i, where AX _j,j-1 represents left adjacent crosstalk, AX _j,j+1 represents right adjacent crosstalk, NX _j,i represents channel j to channel i non-adjacent crosstalk, that is, i≠j,j±1. Based on the wavelength-transmittance data, the total crosstalk index at room temperature 25°C is calculated to be 5.66dB. Based on the total crosstalk requirement of more than 3dB, combined with the wavelength-transmittance data at room temperature of 25°C, if the total crosstalk shifts to shortwave and the total crosstalk is less than 3dB for the first time, the total crosstalk shift to shortwave can be calculated. Similarly, the total crosstalk shift to longwave can be calculated. The total crosstalk offset of the offset, thereby determining the total crosstalk offset range.

The blocking bandwidth shown in Figure 7 represents the effective bandwidth of other channels, that is, the effective bandwidth of adjacent channels and non-adjacent channels.

In some embodiments, the amount of wavelength shiftability is the intersection of the amount of wavelength shiftability based on wavelength accuracy, insertion loss, net bandwidth, and crosstalk conditions. In order to facilitate understanding, by intersecting the wavelength offset amount based on wavelength accuracy, insertion loss, net bandwidth and crosstalk, it is determined that the wavelength offset range based on wavelength accuracy, insertion loss and bandwidth is [-5,59 ]pm.

In an optional embodiment of the present disclosure, the method further includes:

In this embodiment, the first loss data can be determined according to the actual situation, and can be any one of accuracy data, insertion loss data, bandwidth data and crosstalk data, which is not limited here. As an example, the first loss data may be accuracy data. The first preset index can be determined according to actual conditions and is not limited here. As an example, the first preset index may be any index among accuracy index, insertion loss index, bandwidth index and crosstalk index.

Determining the first offset of the wave at the first operating temperature based on the first loss data and a first preset index among a plurality of the preset indexes may be, based on the accuracy data and an accuracy index determine the accuracy offset of the wave at the first operating temperature.

Determining the target offset of the wave at the first operating temperature based on the accuracy offset and the second loss data among the plurality of loss data may be, traversing the accuracy offset and The second loss data among the plurality of loss data determines the target offset of the wave at the first operating temperature.

The second loss data can be determined according to the actual situation, and can be any data among insertion loss data, bandwidth data and crosstalk data except that the first loss data is accuracy data, which is not limited here. As an example, the second loss data may be insertion loss data.

Determining the target offset of the wave at the first operating temperature based on the accuracy offset and the second loss data among the plurality of loss data may be to determine whether the insertion loss data satisfies The accuracy offset; when the insertion loss data satisfies the accuracy offset, determine whether the bandwidth data satisfies the accuracy offset; when the bandwidth data satisfies the accuracy offset In the case of; determine whether the crosstalk data satisfies the precision offset; in the case where the crosstalk data satisfies the precision offset, determine the target offset of the wave at the first operating temperature quantity.

In order to facilitate understanding, the accuracy offset of the wave calculated based on the accuracy data of the wave can be substituted to calculate whether the insertion loss data meets the requirements. If the requirements are met, the accuracy offset of the wave calculated based on the accuracy data of the wave is: The target offset of the wave based on the accuracy data of the wave and the insertion loss data. Otherwise, the range is reduced based on the accuracy offset of the wave calculated based on the accuracy data of the wave, and the insertion loss offset corresponding to the insertion loss data is calculated. . According to this method, the insertion loss offset is substituted into the bandwidth data and crosstalk data, and the target offset [-Δλ _- ,Δλ ₊ ] that meets the wavelength accuracy, insertion loss, bandwidth and crosstalk index requirements is finally calculated.

In an optional embodiment of the present disclosure, after determining the target offset of the wave at the first operating temperature based on the loss data at the first operating temperature and the preset index, the The above methods also include:

In this embodiment, the first working temperature can be determined according to actual conditions and is not limited here. As an example, the first working temperature may be any temperature under normal temperature, and the second working temperature represents any working temperature other than the first working temperature. Specifically, the first working temperature may be 25°C, wherein the working temperature ranges from -5°C to 65°C, and the second working temperature represents any working temperature from -5°C to 65°C except 25°C.

Determining the operating offset of the wave based on the target offset at the first operating temperature and the target offset at the second operating temperature may be: The target offset is intersected with the target offset at the second operating temperature other than the first operating temperature to obtain an offset with the smallest range, and the offset with the smallest range is taken as The working offset of the wave completes the temperature compensation design of the target offset.

Based on the target offset calculated by the wavelength offset evaluation method, the temperature compensation is designed so that the target offset range within the operating temperature of the filter after temperature compensation is smaller than the wavelength operating offset range.

The embodiment of the present disclosure determines the target offset of the wave at the first operating temperature by obtaining the loss data of the wave at the first operating temperature and combining the requirements of the preset index corresponding to the loss data. The target offset can be further evaluated by introducing temperature-related losses. The evaluation method provided by this disclosure is simple and efficient, and based on this, the chip and temperature compensation design can be screened to improve chip utilization while ensuring product qualification rate.

Based on the above method, embodiments of the present disclosure also provide a device for determining the offset amount of a wave, wherein the device for determining the filter index may be a device for evaluating the offset amount of the filter wavelength. Figure 8 is a schematic structural diagram of a wave offset determination device according to an embodiment of the present disclosure. As shown in Figure 8, the device 800 includes: an interaction module 801, a control module 802, a storage module 803 and an operation module 804; the control module Module 802 is connected to the interactive module 801, the storage module 803 and the computing module 804 respectively;

The interactive module 801 is used to input operation instructions and send the operation instructions to the control module;

The control module 802 is configured to receive the operation instruction, retrieve the operation task corresponding to the operation instruction in the storage module, and allocate the operation task to the operation module;

The operation module 804 is configured to receive the operation task, calculate the offset of the wave based on the operation task, and store the offset of the wave as the operation result in the storage module;

The storage module 803 is used to store the operation tasks corresponding to the operation instructions and store the operation results.

In this embodiment, the interactive module 801 may be a web client, the control module 802 may be a server, the storage module 803 may be a database, and the computing module 804 may be an offset computing system. Input the offset operation instruction through the web terminal and send the operation instruction to the server; after receiving the offset operation instruction, the server retrieves the recorded offset in the database The offset calculation task is assigned to the offset calculation system; the offset calculation system records the result of the offset calculation in the database. Wherein, the web terminal is used to input the offset operation instruction; the server is used to retrieve the offset corresponding to the offset operation instruction in the database according to the offset operation instruction. Computational tasks, allocate the offset computation tasks to the offset computation system; the database is used to record the offset computation tasks and offset computation results corresponding to the offset computation instructions; the The offset calculation system is used to receive offset calculation tasks and perform offset calculations.

In an optional embodiment of the present disclosure:

The control module 802 is also used to send the operation results stored in the storage module to the interaction module;

The interactive module 801 is also used to receive and display the operation results sent by the control module.

In this embodiment, the offset calculation results stored in the database are uploaded to the web end through the server for display. The server is further configured to send the offset calculation result stored in the database to the web client; the web client is further configured to receive and display the offset calculation result sent by the server.

In an optional embodiment of the present disclosure, the computing module 804 includes: a laser emission unit 8041, a polarization control unit 8042, a spectroscopic unit 8043, a filter to be tested 8044, a power monitoring unit 8045, and a computing unit 8046;

The laser emitting unit 8041 is used to emit laser light with a wavelength;

The polarization control unit 8042 is used to control the laser to traverse polarization states;

The light splitting unit 8043 is used to split the laser;

The filter to be tested 8044 is used to pass the laser;

The power monitoring unit 8045 is used to monitor the optical power of the laser;

The calculation unit 8046 is configured to calculate the offset of the wave based on the wavelength-transmittance data corresponding to the optical power.

In this embodiment, the laser emitting unit 8041 may be a tunable laser, the polarization control unit 8042 may be a polarization controller, the spectroscopic unit 8043 may be a spectrometer, and the power monitoring unit 8045 may be a multi-channel power The calculation unit 8046 may be an offset calculation device. The main function of the tunable laser is to emit light in a certain wavelength range; the main function of the polarization controller is to allow the incoming light to traverse all polarization states; the main function of the optical splitter is to split the light to achieve simultaneous Many devices are tested at the same time, that is, the devices share a set of light sources and polarization controllers; the main function of the offset calculation device is to perform offset calculation; the main function of the multi-channel power meter is to monitor the power value.

The tunable laser emits light, and the wavelength value of the light emitted by the tunable laser is scanned within a certain wavelength range. After the polarization controller traverses all polarization states, the light emitted by the tunable laser is split by the spectrometer. , at this time, first connect the optical splitter to the multi-channel power meter to obtain the stored light value; then connect the optical splitter to the filter to be tested, and the light split by the optical splitter enters the filter to be tested respectively. Test the filter. After the light is output from the filter to be measured, it reaches the multi-channel power meter to obtain the power value. Combined with the synchronization function, the wavelength value is obtained, and the stored light value is subtracted to finally obtain the wavelength-transmittance data. The offset calculation device implements calculation of the offset of the wave based on the wavelength-transmittance data.

This embodiment also provides a device for determining the offset of a wave. Figure 9 is a schematic structural diagram of a device for determining the offset of a wave according to an embodiment of the present disclosure. As shown in Figure 9, the device 900 includes:

The first acquisition module 901 is used to acquire the loss data of the wave at the first operating temperature;

The first judgment module 902 is used to judge whether the loss data meets the requirements of the preset indicators;

The first determination module 903 is configured to determine the target of the wave at the first operating temperature based on the loss data and the preset index if the loss data meets the requirements of the preset index. Offset.

In other embodiments, the loss data includes accuracy data of the wave; the preset index includes an accuracy index; the first acquisition module 901 includes a first determination unit and a processing unit; the first determination module 903 includes a second determining unit.

The first determination unit is used to determine the first wavelength data of the wave at the first operating temperature;

The processing unit is configured to process the first wavelength data based on a preset method and determine the accuracy data of the wave at the first operating temperature;

The second determination unit is configured to determine the target deflection of the wave at the first operating temperature based on the accuracy data and the accuracy index when the accuracy data meets the requirements of the accuracy index. Shift amount.

In other embodiments, the loss data includes insertion loss data of the wave; the preset index includes an insertion loss index; and the first determining unit is further configured to determine the insertion loss based on the insertion loss data. The second wavelength data of the wave at the first operating temperature; determining the third wavelength data of the wave at the first operating temperature based on the insertion loss index; the second determination unit is also configured to If the insertion loss data meets the requirements of the insertion loss index, the target offset of the wave at the first operating temperature is determined based on the second wavelength data and the third wavelength data.

In other embodiments, the loss data includes bandwidth data of the wave, and the bandwidth data includes first bandwidth data and second bandwidth data; the preset index includes a bandwidth index; the first determining unit, Also used to determine the fourth wavelength data of the wave at the first operating temperature; determine the first bandwidth data and the second bandwidth data based on the fourth wavelength data; the second determination unit, Also configured to determine the target offset of the wave at the first operating temperature based on the bandwidth indicator when the first bandwidth data and the second bandwidth data meet the requirements of the bandwidth indicator. .

In other embodiments, the loss data includes crosstalk data of the wave; the preset index includes a crosstalk index; and the second determination unit is also configured to provide the crosstalk data when the crosstalk data meets the requirements of the crosstalk index. In the case of , a target offset of the wave at the first operating temperature is determined based on the crosstalk data and the crosstalk indicator.

In other embodiments, the device 900 further includes:

The second determination module is used to obtain the first loss data among the plurality of loss data of the wave at the first operating temperature; wherein the first loss data is any loss data among the plurality of loss data. ;

A third determination module, configured to determine the first offset of the wave at the first operating temperature based on the first loss data and a first preset index among a plurality of the preset indexes; wherein, The first preset index represents an index corresponding to the first loss data;

A fourth determination module, configured to determine the target offset of the wave at the first operating temperature based on the first offset and the second loss data among the plurality of loss data; wherein, the The second loss data represents any loss data among the plurality of loss data except the first loss data.

In other embodiments, after determining the target offset of the wave at the first operating temperature based on the loss data at the first operating temperature and the preset indicator, the device 900 further includes :

A second acquisition module, configured to acquire the loss data of the wave at a second operating temperature; wherein the second operating temperature represents any operating temperature other than the first operating temperature;

The second judgment module is used to judge whether the loss data at the second operating temperature meets the requirements of the preset indicators;

A fifth determination module, configured to determine the loss data at the second operating temperature and the preset index based on the loss data at the second operating temperature and the preset index when the loss data at the second operating temperature meets the requirements of the preset index. The target offset of the wave at the second operating temperature;

A sixth determination module is configured to determine the operating offset of the wave based on the target offset at the first operating temperature and the target offset at the second operating temperature.

It should be noted that in the embodiments of the present disclosure, if the above-mentioned method for determining the wave offset is implemented in the form of a software function module and is sold or used as an independent product, it can also be stored in a computer-readable storage. in the medium. Based on this understanding, the technical embodiments of the embodiments of the present disclosure can be embodied in the form of software products in nature or in part that contribute to the existing technology. The computer software products are stored in a storage medium and include a number of instructions. So that a device for determining the offset of the wave (which may be a personal computer, a server, a network device, etc.) executes all or part of the methods described in various embodiments of the present disclosure. The aforementioned storage media include: U disk, mobile hard disk, read-only memory (Read Only Memory, ROM), magnetic disk or optical disk and other media that can store program code. As such, disclosed embodiments are not limited to any specific combination of hardware and software.

Correspondingly, embodiments of the present disclosure provide a device for determining the offset of a wave, including a memory and a processor. The memory stores a computer program that can be run on the processor. When the processor executes the program, the The above embodiments provide steps in the method for determining the offset of a wave.

Correspondingly, embodiments of the present disclosure provide a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps in the method for determining the offset of a wave provided in the above embodiments are implemented.

It should be pointed out here that the above description of the storage medium and device embodiments is similar to the description of the above method embodiments, and has similar beneficial effects as the method embodiments. For technical details not disclosed in the storage medium and device embodiments of the present disclosure, please refer to the description of the method embodiments of the present disclosure for understanding.

It should be noted that Figure 10 is a schematic structural diagram of a hardware entity of a device for determining the offset of a wave according to an embodiment of the present disclosure. As shown in Figure 10 , the hardware entity of the device 1000 for determining the offset of a wave includes: processing Optionally, the device 1000 for determining the offset of the wave may also include a communication interface 1002.

It can be understood that the memory 1003 can be a volatile memory or a non-volatile memory, and can also include both volatile and non-volatile memories. Among them, non-volatile memory can be read-only memory (ROM, Read Only Memory), programmable read-only memory (PROM, Programmable Read-Only Memory), erasable programmable read-only memory (EPROM, Erasable Programmable Read-Only Memory). Only Memory), Electrically Erasable Programmable Read-Only Memory (EEPROM, Electrically Erasable Programmable Read-Only Memory), Magnetic Random Access Memory (FRAM, ferromagnetic random access memory), Flash Memory, Magnetic Surface Memory , optical disk, or compact disc (CD-ROM, Compact Disc Read-Only Memory); magnetic surface memory can be disk storage or tape storage. Volatile memory can be random access memory (RAM, Random Access Memory), which is used as an external cache. By way of illustration, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Synchronous Static Random Access Memory (SSRAM), Dynamic Random Access Memory Memory (DRAM, Dynamic Random Access Memory), synchronous dynamic random access memory (SDRAM, Synchronous Dynamic Random Access Memory), double data rate synchronous dynamic random access memory (DDRSDRAM, Double Data Rate Synchronous Dynamic Random Access Memory), enhanced Type Synchronous Dynamic Random Access Memory (ESDRAM, Enhanced Synchronous Dynamic Random Access Memory), Synchronous Link Dynamic Random Access Memory (SLDRAM, SyncLink Dynamic Random Access Memory), Direct Memory Bus Random Access Memory (DRRAM, Direct Rambus Random Access Memory) ). The memory 1003 described in embodiments of the present disclosure is intended to include, but not be limited to, these and any other suitable types of memory.

The methods disclosed in the above embodiments of the present disclosure can be applied to the processor 1001 or implemented by the processor 1001. The processor 1001 may be an integrated circuit chip with signal processing capabilities. During the implementation process, each step of the above method can be completed by instructions in the form of hardware integrated logic circuits or software in the processor 1001 . The above-mentioned processor 1001 can be a general-purpose processor, a digital signal processor (DSP, Digital Signal Processor), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The processor 1001 can implement or execute the disclosed methods, steps and logical block diagrams in the embodiments of the present disclosure. A general-purpose processor may be a microprocessor or any conventional processor, etc. The steps of the method disclosed in conjunction with the embodiments of the present disclosure can be directly implemented by a hardware decoding processor, or executed by a combination of hardware and software modules in the decoding processor. The software module may be located in a storage medium, and the storage medium is located in the memory 1003. The processor 1001 reads the information in the memory 1003, and completes the steps of the foregoing method in combination with its hardware.

In an exemplary embodiment, the device for determining the offset of the wave may be one or more Application Specific Integrated Circuits (ASICs, Application Specific Integrated Circuits), DSPs, Programmable Logic Devices (PLDs, Programmable Logic Devices), complex programmable logic devices, Programmable logic device (CPLD, Complex Programmable Logic Device), Field-Programmable Gate Array (FPGA, Field-Programmable Gate Array), general-purpose processor, controller, microcontroller (MCU, Micro Controller Unit), microprocessor (Microprocessor) ), or other electronic components for performing the aforementioned method.

In the several embodiments provided in this disclosure, it should be understood that the disclosed methods and devices can be implemented in other ways. The device embodiments described above are only illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods, such as: multiple units or components may be combined, or can be integrated into another observation, or some features can be ignored, or not implemented. In addition, the communication connection between the various components shown or discussed may be through some interfaces, indirect coupling or communication connection of equipment or units, and may be electrical, mechanical or other forms.

The units described above as separate components may or may not be physically separated. The components shown as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units; Some or all of the units may be selected according to actual needs to achieve the purpose of this embodiment.

Those of ordinary skill in the art can understand that all or part of the steps to implement the above method embodiments can be completed through hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, the execution includes: The steps of the above method embodiment; and the aforementioned storage media include: mobile storage devices, read-only memory (ROM, Read-Only Memory), magnetic disks or optical disks and other various media that can store program codes.

Alternatively, if the above-mentioned integrated units in the embodiments of the present disclosure are implemented in the form of software functional units and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical embodiments of the embodiments of the present disclosure can be embodied in the form of software products in nature or in part that contribute to the existing technology. The computer software products are stored in a storage medium and include a number of instructions. So that a device for determining the offset of the wave (which may be a personal computer, a server, a network device, etc.) executes all or part of the methods described in various embodiments of the present disclosure. The aforementioned storage media include: mobile storage devices, ROMs, magnetic disks or optical disks and other media that can store program codes.

The method, device, and computer storage medium for determining the offset of a wave described in the examples of this disclosure are only examples of the embodiments of the present disclosure, but are not limited thereto. As long as it involves the method, device, and computer storage medium for determining the offset of the wave, Both devices and computer storage media are within the scope of this disclosure.

It will be understood that reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic associated with the embodiment is included in at least one embodiment of the present disclosure. Thus, the appearances of "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily referring to the same embodiment. Furthermore, the particular features, structures or characteristics may be combined in any suitable manner in one or more embodiments. It should be understood that in various embodiments of the present disclosure, the size of the sequence numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its functions and internal logic, and should not be used in the embodiments of the present disclosure. The implementation process constitutes any limitation. The above serial numbers of the embodiments of the present disclosure are only for description and do not represent the advantages and disadvantages of the embodiments.

It should be noted that, in this document, the terms "comprising", "comprises" or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article or device that includes a series of elements not only includes those elements, It also includes other elements not expressly listed or inherent in the process, method, article or apparatus. Without further limitation, an element defined by the statement "comprises a..." does not exclude the presence of additional identical elements in a process, method, article or apparatus that includes that element.

The above are only embodiments of the present disclosure, but the protection scope of the present disclosure is not limited thereto. Any person familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present disclosure, and should are covered by the protection scope of this disclosure. Therefore, the protection scope of the present disclosure should be subject to the protection scope of the claims.

Claims

A method for determining the offset of a wave, including:

Obtain loss data of the wave at the first operating temperature;

Determine whether the loss data meets the requirements of the preset indicators;

If the loss data meets the requirements of the preset index, the target offset of the wave at the first operating temperature is determined based on the loss data and the preset index.
The method according to claim 1, wherein the loss data includes accuracy data of the wave; the preset index includes an accuracy index; the method further includes:

determining first wavelength data of said wave at said first operating temperature;

Process the first wavelength data based on a preset method to determine the accuracy data of the wave at the first operating temperature;

If the accuracy data meets the requirements of the accuracy index, a target offset of the wave at the first operating temperature is determined based on the accuracy data and the accuracy index.
The method according to claim 1, wherein the loss data includes insertion loss data of the wave; the preset index includes an insertion loss index; the method further includes:

determining second wavelength data of the wave at the first operating temperature based on the insertion loss data;

Based on the insertion loss index, determine third wavelength data of the wave at the first operating temperature;

If the insertion loss data meets the requirements of the insertion loss index, the target offset of the wave at the first operating temperature is determined based on the second wavelength data and the third wavelength data.
The method according to claim 1, wherein the loss data includes bandwidth data of the wave, the bandwidth data includes first bandwidth data and second bandwidth data; the preset index includes a bandwidth index; the method Also includes:

Determining fourth wavelength data of said wave at said first operating temperature;

determining the first bandwidth data and the second bandwidth data based on the fourth wavelength data;

If the first bandwidth data and the second bandwidth data meet the requirements of the bandwidth index, a target offset of the wave at the first operating temperature is determined based on the bandwidth index.
The method according to claim 1, wherein the loss data includes crosstalk data of the wave; the preset index includes a crosstalk index; the method further includes:

If the crosstalk data meets the requirements of the crosstalk index, a target offset of the wave at the first operating temperature is determined based on the crosstalk data and the crosstalk index.
The method of claim 1, further comprising:

Obtain the first loss data among the plurality of loss data of the wave at the first operating temperature; wherein the first loss data is any loss data among the plurality of loss data;

The first offset of the wave at the first operating temperature is determined based on the first loss data and a first preset index among a plurality of the preset indexes; wherein, the first preset index Characterizing an indicator corresponding to the first loss data;

Based on the first offset and second loss data among the plurality of loss data, a target offset of the wave at the first operating temperature is determined; wherein the second loss data represents the Any loss data among the plurality of loss data except the first loss data.
The method of claim 1, wherein after determining the target offset of the wave at the first operating temperature based on the loss data at the first operating temperature and the preset indicator, the Methods also include:

Obtain the loss data of the wave at a second operating temperature; wherein the second operating temperature represents any operating temperature other than the first operating temperature;

Determine whether the loss data at the second operating temperature meets the requirements of the preset indicators;

When the loss data at the second operating temperature meets the requirements of the preset index, it is determined based on the loss data at the second operating temperature and the preset index that the wave is in the second operation state. Target offset at temperature;

An operating offset of the wave is determined based on the target offset at the first operating temperature and the target offset at the second operating temperature.
A device for determining the offset of a wave, the device includes: an interaction module, a control module, a storage module and an operation module; the control module is connected to the interaction module, the storage module and the operation module respectively;

The interactive module is used to input operation instructions and send the operation instructions to the control module;

The control module is configured to receive the operation instruction, retrieve the operation task corresponding to the operation instruction in the storage module, and allocate the operation task to the operation module;

The computing module is configured to receive the computing task, calculate the offset of the wave based on the computing task, and store the offset of the wave as the computing result in the storage module;

The storage module is used to store the operation tasks corresponding to the operation instructions and store the operation results.
The device of claim 8, wherein:

The control module is also used to send the operation results stored in the storage module to the interactive module;

The interactive module is also used to receive and display the operation results sent by the control module.
The device according to claim 8, wherein the computing module includes: a laser emission unit, a polarization control unit, a spectroscopic unit, a filter to be tested, a power monitoring unit and a computing unit;

The laser emitting unit is used to emit laser light with a wavelength;

The polarization control unit is used to control the laser to traverse polarization states;

The spectroscopic unit is used to split the laser;

The filter to be tested is used to pass the laser;

The power monitoring unit is used to monitor the optical power of the laser;

The calculation unit is configured to calculate the offset of the wave based on the wavelength-transmittance data corresponding to the optical power.
A device for determining wave offset, including:

The first acquisition module is used to acquire the loss data of the wave at the first operating temperature;

The first judgment module is used to judge whether the loss data meets the requirements of the preset indicators;

A first determination module, configured to determine the target deflection of the wave at the first operating temperature based on the loss data and the preset index when the loss data meets the requirements of the preset index. Shift amount.
A device for determining the offset of a wave, including a memory and a processor. The memory stores a computer program that can be run on the processor. When the processor executes the program, any one of claims 1 to 7 is implemented. A step in the method.
A computer-readable storage medium on which a computer program is stored, wherein the steps in the method of any one of claims 1 to 7 are implemented when the computer program is executed by a processor.