WO2024027455A1 - Arc spectrum identification method and apparatus - Google Patents
Arc spectrum identification method and apparatus Download PDFInfo
- Publication number
- WO2024027455A1 WO2024027455A1 PCT/CN2023/106109 CN2023106109W WO2024027455A1 WO 2024027455 A1 WO2024027455 A1 WO 2024027455A1 CN 2023106109 W CN2023106109 W CN 2023106109W WO 2024027455 A1 WO2024027455 A1 WO 2024027455A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- arc
- light intensity
- spectrum
- wavelength
- measurement points
- Prior art date
Links
- 238000001228 spectrum Methods 0.000 title claims abstract description 132
- 238000000034 method Methods 0.000 title claims abstract description 46
- 238000005259 measurement Methods 0.000 claims description 113
- 238000006243 chemical reaction Methods 0.000 claims description 12
- 238000012545 processing Methods 0.000 claims description 12
- 230000006870 function Effects 0.000 claims description 11
- 238000004364 calculation method Methods 0.000 claims description 9
- 238000004590 computer program Methods 0.000 claims description 8
- 230000003595 spectral effect Effects 0.000 abstract description 8
- 230000009471 action Effects 0.000 abstract description 6
- 238000010891 electric arc Methods 0.000 abstract 1
- 230000007935 neutral effect Effects 0.000 description 9
- 238000004891 communication Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 238000012544 monitoring process Methods 0.000 description 5
- 239000013307 optical fiber Substances 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 238000003745 diagnosis Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000009977 dual effect Effects 0.000 description 2
- 230000005672 electromagnetic field Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 206010000369 Accident Diseases 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- JJWKPURADFRFRB-UHFFFAOYSA-N carbonyl sulfide Chemical compound O=C=S JJWKPURADFRFRB-UHFFFAOYSA-N 0.000 description 1
- 238000002485 combustion reaction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1218—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing using optical methods; using charged particle, e.g. electron, beams or X-rays
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y04—INFORMATION OR COMMUNICATION TECHNOLOGIES HAVING AN IMPACT ON OTHER TECHNOLOGY AREAS
- Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
- Y04S10/00—Systems supporting electrical power generation, transmission or distribution
- Y04S10/50—Systems or methods supporting the power network operation or management, involving a certain degree of interaction with the load-side end user applications
- Y04S10/52—Outage or fault management, e.g. fault detection or location
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
An arc spectrum identification method and apparatus, which belong to the technical field of power system relay protection. In the method, an intrinsic spectrum of an electric arc is quickly found by using a Euclidean distance, minimizing a target function and using a spectral threshold truncation method; and a signal is then sent to a protection control apparatus, such that the protection control apparatus outputs alarm and tripping signals conveniently. By means of the method, a high action speed, convenient mounting and debugging, high expandability, high reliability, and great cost performance are achieved. The arc spectrum identification apparatus is developed according to to an arc spectrum identification method, and particularly, after a spectrum identification apparatus of this type is additionally mounted on an existing switch cabinet, the existing switch cabinet can operate more reliably and more safely.
Description
本发明属于电力系统继电保护技术领域，具体涉及一种电弧光谱识别方法和装置。The invention belongs to the technical field of power system relay protection, and specifically relates to an arc spectrum identification method and device.
故障经过长时间运行，易引发严重的电缆沟、开关柜、甚至变电站起火事故。接地故障电流由于电与介质初期不稳定接触、电弧不稳定燃烧、介质物理化学变化等原因，因而弧光故障具有一定的随机性，故障电流存在非线性畸变，这一特点得到研究者的广泛认同，这种畸变主要源于燃弧过程中阻抗和介质的非线性。After long-term operation, the fault can easily cause serious fire accidents in cable trenches, switch cabinets, and even substations. Due to the unstable initial contact between electricity and the medium, unstable arc combustion, physical and chemical changes of the medium, etc., the ground fault current has a certain degree of randomness in the arc fault, and the fault current has nonlinear distortion. This feature has been widely recognized by researchers. This distortion is mainly due to the nonlinearity of impedance and medium during the arc burning process.
DL/T 872-2016《小电流接地系统单相接地故障选线装置技术条件》规定："故障选线装置应能准确选出故障支路"，中性点经消弧线圈接地方式时，需要注入变频和行波信号，即不能对接地故障性质进行判断，不易及时切除永久性单相接地故障线路，在发生人身触电时不能及时脱离电源，存在较大的安全风险；当中性点经小电阻接地时，故障电流较大，可抑制间歇性弧光接地过电压的产生，馈线零序保护会顺利动作使线路跳闸，但动作时间较长(大于3s)，假设故障线路不能被及时切除，线路会造成极大的人身安全风险，2019年5月10日南方电网公司某供电局10kV组合互感器(油浸式)爆炸起火，线路保护装置动作时间太慢，没有及时切断电源，并最终导致2人死亡事故，教训极其惨烈。在电气火灾和人身防护的需求下，弧光保护技术得到快速发展，GB/T 14598.302-2016《弧光保护装置技术要求》对配电系统弧光保护装置提出动作时间在20ms内切除弧光故障，弧光保护逻辑有弧光单判据，弧光和电流双判据两种方式，目前应用较多的是双判据，保护装置动作逻辑如图2所示，多处安装弧光探头和电流传感器，弧光传感器安装在母线侧，电流传感器安装在进线处，直接取“与”操作，作为出口信号。由于弧光保护逻辑的限值，且用户存在弧光保护，致使出口跳闸信号一般都送入进线断路器处，扩大了停电范围，影响了供电可靠性。DL/T 872-2016 "Technical Conditions for Single-Phase Ground Fault Line Selection Device in Small Current Grounding System" stipulates: "The fault line selection device should be able to accurately select the fault branch." When the neutral point is grounded through an arc suppression coil, it is required Injecting frequency conversion and traveling wave signals means that the nature of the ground fault cannot be judged, and it is difficult to remove the permanent single-phase ground fault line in time. In the event of personal electric shock, it cannot be separated from the power supply in time, which poses a greater safety risk; when the neutral point passes through a small resistance When grounded, the fault current is large, which can suppress the generation of intermittent arc grounding overvoltage. The feeder zero sequence protection will operate smoothly to trip the line, but the action time is long (more than 3s). If the faulted line cannot be removed in time, the line will Causing great personal safety risks, on May 10, 2019, a 10kV combined transformer (oil-immersed type) of a power supply bureau of China Southern Power Grid exploded and caught fire. The line protection device acted too slowly and failed to cut off the power supply in time, eventually killing 2 people. Fatal accidents teach extremely tragic lessons. With the demand for electrical fire and personal protection, arc protection technology has developed rapidly. GB/T 14598.302-2016 "Technical Requirements for Arc Protection Devices" proposes an action time for arc protection devices in distribution systems to remove arc faults within 20ms. Arc protection logic There are two methods: arc light single criterion and arc light and current double criterion. The dual criterion is currently used more often. The action logic of the protection device is shown in Figure 2. Arc probes and current sensors are installed in many places. The arc sensor is installed on the busbar. On the side, the current sensor is installed at the incoming line, and the "AND" operation is directly taken as the exit signal. Due to the limits of the arc protection logic and the user's arc protection, the outlet trip signal is generally sent to the incoming circuit breaker, which expands the scope of the power outage and affects the reliability of the power supply.
现有专利ZL201310038256.7，名称：一种高精度电信号测量设备装置和方法，主要给出了电学信号的补偿识别和控制计量方法，没有给出光谱的准确识别方法；专利ZL201610945569.4，名称：一种弧光保护装置及其故障诊断方法，也是采集相应的电压、电流信号，使弧光故障诊断方法加准备，没有涉及光谱
的信息。传感器，如光谱检测传感器采集到的电弧光谱信号如图3所示，一般包括2个参数，x为波长，y为光强度，对应电弧不同光谱波长，则存在x1…xn，不同电弧强度，则存在y1…yn，由于电弧产生时，外界光源(如太阳光、室内照明光源)的干扰，使得准确判断出电弧发生，存在一定的难度，甚至存在误判风险，因此如何克服现有技术的不足是目前电力系统继电保护技术领域亟需解决的问题。Existing patent ZL201310038256.7, name: A high-precision electrical signal measurement equipment device and method, which mainly provides the compensation identification and control measurement method of electrical signals, but does not provide an accurate identification method of the spectrum; patent ZL201610945569.4, name : An arc protection device and its fault diagnosis method, which also collects corresponding voltage and current signals to prepare the arc fault diagnosis method, and does not involve spectrum Information. The arc spectrum signal collected by the sensor, such as the spectrum detection sensor, is shown in Figure 3. It generally includes two parameters, x is the wavelength, and y is the light intensity. Corresponding to different spectral wavelengths of the arc, there are x 1 ... x n and different arc intensities. , then there is y 1 ...y n . Due to the interference from external light sources (such as sunlight and indoor lighting sources) when an arc occurs, it is difficult to accurately determine the occurrence of an arc, and there is even a risk of misjudgment. Therefore, how to overcome the current situation? Technical deficiencies are an urgent problem that needs to be solved in the current field of power system relay protection technology.
发明内容Contents of the invention
本发明的目的是为了解决现有技术的不足，提供一种电弧光谱识别方法和装置，克服了现有弧光光谱识别方法存在可靠性不高的问题，解决存在光干扰源状况下光谱的准确测量问题，提高光谱检测准确性。The purpose of the present invention is to solve the shortcomings of the existing technology, provide an arc spectrum identification method and device, overcome the problem of low reliability of the existing arc spectrum identification method, and solve the problem of accurate measurement of spectrum in the presence of light interference sources. problem and improve the accuracy of spectral detection.
为实现上述目的，本发明采用的技术方案如下：In order to achieve the above objects, the technical solutions adopted by the present invention are as follows:
一种电弧光谱识别方法，包括以下步骤：An arc spectrum identification method includes the following steps:
步骤(1)，通过电弧传感器测量短路造成的电弧，得到电弧光谱数值曲线；Step (1), measure the arc caused by the short circuit through an arc sensor, and obtain the arc spectrum numerical curve;
步骤(2)，对电弧光谱光强度的测量值进行从大到小进行降序排序，找到光强度排序靠前的n个波长光谱的测量点，该n个测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；Step (2): Sort the measured values of the arc spectrum light intensity in descending order from large to small, and find the n measurement points of the wavelength spectrum with the top order of light intensity. The wavelengths of the n measurement points are x 1 , x 2 ,…x n , the light intensity is y 1 , y 2 ,…y n in sequence;
步骤(3)，对步骤(2)获得的n个波长光谱的测量点之间的欧式距离进行计算；Step (3), calculate the Euclidean distance between the measurement points of the n wavelength spectra obtained in step (2);
步骤(4)，按照目标函数最小化进行迭代计算，直到找到S最小时对应的yi；Step (4), according to the objective function Minimize and perform iterative calculations until the y i corresponding to the minimum S is found;
其中，
in,
in,
式中，yj
D表示第D次迭代时的光强值，其中，yj
D的初始值设为n个波长光谱测量点中的光强度最大值；然后每次迭代时，取n个波长光谱测量点中的光强度大于dc的任意一个测量点的光强度值；cdi为第i个电弧测量点的光强度；dij为n个波长光谱测量点中波长xi和xj的欧式距离，dc为光谱测量点光强度的
截断阈值；χ为测量点波长与光强度的转换系数；D为迭代次数；In the formula, y j D represents the light intensity value at the D-th iteration, where the initial value of y j D is set to the maximum light intensity value among n wavelength spectrum measurement points; then in each iteration, n wavelengths are taken The light intensity in the spectrum measurement point is greater than the light intensity value of any measurement point in dc; cd i is the light intensity of the i-th arc measurement point; d ij is the European formula of wavelengths x i and x j in the n wavelength spectrum measurement points distance, dc is the spectral measurement point light intensity Cutoff threshold; χ is the conversion coefficient between wavelength and light intensity at the measurement point; D is the number of iterations;
步骤(5)，当步骤(4)得到的光强度yi大于等于设定的光强阈值时，则判定电弧短路已经发生，否则没有发生电弧短路。Step (5), when the light intensity yi obtained in step (4) is greater than or equal to the set light intensity threshold, it is determined that an arc short circuit has occurred, otherwise no arc short circuit has occurred.
进一步，优选的是，步骤(2)中，n的取值为光强度大于截断阈值测量点数量的20倍及以上；不同测量点的波长间距为光强度测量点的分辨率。Further, preferably, in step (2), the value of n is 20 times or more the number of measurement points where the light intensity is greater than the cutoff threshold; the wavelength spacing of different measurement points is the resolution of the light intensity measurement points.
进一步，优选的是，步骤(3)中，设n个波长光谱测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；Further, preferably, in step (3), it is assumed that the wavelengths of the n wavelength spectrum measurement points are x 1 , x 2 ,...x n in sequence, and the light intensities are y 1 , y 2 ,...y n in sequence;
这些波长光谱测量点间的欧式距离dij(x)为：
The Euclidean distance d ij (x) between these wavelength spectrum measurement points is:
The Euclidean distance d ij (x) between these wavelength spectrum measurement points is:
进一步，优选的是，步骤(4)中，dc的取值范围为[dc最小值,dc最大值]，其中，dc最大值为电弧光谱最大波长减去最小波长，最小值为dc最大值的(2-10)％。Further, preferably, in step (4), the value range of dc is [dc minimum value, dc maximum value], where the dc maximum value is the maximum wavelength of the arc spectrum minus the minimum wavelength, and the minimum value is the maximum dc value. (2-10)%.
进一步，优选的是，步骤(4)中，dc为电弧光谱最大波长减去最小波长的20％。Further, preferably, in step (4), dc is the maximum wavelength of the arc spectrum minus 20% of the minimum wavelength.
进一步，优选的是，光强阈值不低于肉眼感知电弧光强度的最大值。Further, it is preferred that the light intensity threshold is not lower than the maximum value of the arc light intensity perceived by the naked eye.
进一步，优选的是，光强阈值在室内封闭空间内为5000Lux-10000Lux，在室外环境中为15000Lux-40000Lux。Further, preferably, the light intensity threshold is 5000Lux-10000Lux in an indoor closed space and 15000Lux-40000Lux in an outdoor environment.
本发明同时提供一种电弧光谱识别装置，包括电弧传感器和识别系统，电弧传感器测量短路造成的电弧，得到电弧光谱，传输至识别系统；The invention also provides an arc spectrum identification device, which includes an arc sensor and an identification system. The arc sensor measures the arc caused by the short circuit, obtains the arc spectrum, and transmits it to the identification system;
所述的识别系统包括：The identification system includes:
第一处理模块，用于对电弧光谱光强度的测量值进行从大到小进行降序排序，找到光强度排序靠前的n个波长光谱的测量点，该n个测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；The first processing module is used to sort the measured values of the arc spectrum light intensity in descending order from large to small, and find the n measurement points of the wavelength spectrum with the top light intensity sorting. The wavelengths of the n measurement points are x 1 in order. , x 2 ,…x n , the light intensity is y 1 , y 2 ,…y n in sequence;
第二处理模块，用于对获得的n个波长光谱的测量点之间的欧式距离进行计算；The second processing module is used to calculate the Euclidean distance between the measurement points of the obtained n wavelength spectra;
第三处理模块，用于按照目标函数最小化进行迭代计算，直到找到S最小时对应的yi；
The third processing module is used to follow the objective function Minimize and perform iterative calculations until the y i corresponding to the minimum S is found;
其中，
in,
in,
式中，yj
D表示第D次迭代时的光强值，其中，yj
D的初始值设为n个波长光谱测量点中的光强度最大值；然后每次迭代时，取n个波长光谱测量点中的光强度大于dc的任意一个测量点的光强度值；cdi为第i个电弧测量点的光强度；dij为n个波长光谱测量点中波长xi和xj的欧式距离，dc为光谱测量点光强度的截断阈值；χ为测量点波长与光强度的转换系数；In the formula, y j D represents the light intensity value at the D-th iteration, where the initial value of y j D is set to the maximum light intensity value among n wavelength spectrum measurement points; then in each iteration, n wavelengths are taken The light intensity in the spectrum measurement point is greater than the light intensity value of any measurement point in dc; cd i is the light intensity of the i-th arc measurement point; d ij is the European formula of wavelengths x i and x j in the n wavelength spectrum measurement points Distance, dc is the cutoff threshold of light intensity at the spectrum measurement point; χ is the conversion coefficient between wavelength and light intensity at the measurement point;
电弧短路判断模块，用于当第三处理模块处理得到的光强度yi大于等于设定的光强阈值时，则判定电弧短路已经发生，否则没有发生电弧短路。The arc short circuit determination module is used to determine that an arc short circuit has occurred when the light intensity yi obtained by the third processing module is greater than or equal to the set light intensity threshold; otherwise, no arc short circuit has occurred.
本发明还提供一种电子设备，包括存储器、处理器及存储在存储器上并可在处理器上运行的计算机程序，其特征在于，所述处理器执行所述程序时实现上述电弧光谱识别方法的步骤。The present invention also provides an electronic device, which includes a memory, a processor and a computer program stored in the memory and executable on the processor. The feature is that when the processor executes the program, the above arc spectrum identification method is implemented. step.
本发明另外提供一种非暂态计算机可读存储介质，其上存储有计算机程序，该计算机程序被处理器执行时实现如上述电弧光谱识别方法的步骤。The present invention further provides a non-transitory computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the above arc spectrum identification method are implemented.
本发明步骤(1)中，通过电弧传感器测量短路造成的电弧，得到电弧光谱数值曲线；然后可判断获得电弧光谱数值曲线中电弧最大光谱波长点和最小光谱波长点；根据电弧光谱传感器的测量范围，最大光谱波长点为电弧光谱传感器最大测量范围的上限值；最小光谱波长点为电弧光谱传感器最小测量范围的下限值。In step (1) of the present invention, the arc caused by the short circuit is measured by the arc sensor to obtain the arc spectrum numerical curve; then the maximum spectral wavelength point and the minimum spectral wavelength point of the arc in the arc spectrum numerical curve can be determined; according to the measurement range of the arc spectrum sensor , the maximum spectrum wavelength point is the upper limit of the arc spectrum sensor's maximum measurement range; the minimum spectrum wavelength point is the lower limit of the arc spectrum sensor's minimum measurement range.
本发明步骤(3)中，目标函数最小值对应的yi，即为电弧光谱的波长输出光强度准确值yi。In step (3) of the present invention, the yi corresponding to the minimum value of the objective function is the accurate value yi of the wavelength output light intensity of the arc spectrum.
本发明步骤(4)中，χ为测量点波长与光强度的转换系数，取值为5000-20000，优选为10000。本发明对迭代次数D不做限制吗。In step (4) of the present invention, χ is the conversion coefficient between the wavelength of the measurement point and the light intensity, and its value is 5000-20000, preferably 10000. Does this invention place no limit on the number of iterations D?
本发明步骤(5)中，光强阈值优选在室内封闭空间内为5000Lux-10000Lux，在室外环境中为15000Lux-40000Lux。由于光强度在光纤传输过程中会存在衰减现象，本发明给出的上述优选值是采用归一化处理过的，即此时光纤长度为1m时等效出来的。In step (5) of the present invention, the light intensity threshold is preferably 5000Lux-10000Lux in an indoor closed space and 15000Lux-40000Lux in an outdoor environment. Since the light intensity will attenuate during the optical fiber transmission process, the above preferred values given by the present invention are normalized, that is, they are equivalent when the optical fiber length is 1 m.
通过本发明方法迭使得电弧的测量不受外部光源或干扰源光谱的影响，正
确识别并输出电弧的特征波长及相对应的光强度。Through the method of the present invention, the measurement of the arc is not affected by the spectrum of external light sources or interference sources. Correctly identify and output the characteristic wavelength of the arc and the corresponding light intensity.
当本发明判定电弧短路已经发生，则输出控制信号到上一级监控预警系统或装置中，然后显示“报警”，“跳闸”信号在上一级监控预警系统或装置，方便监控预警系统或装置人工进一步判别或直接投切断路器动作回路。When the present invention determines that an arc short circuit has occurred, it outputs a control signal to the upper-level monitoring and early warning system or device, and then displays "alarm" and "trip" signals in the upper-level monitoring and early warning system or device, which facilitates monitoring of the early warning system or device. Manually further judge or directly switch on the circuit breaker action loop.
本发明与现有技术相比，其有益效果为：Compared with the prior art, the beneficial effects of the present invention are:
本发明方法测量准确，动作速度快、可扩展性强、可靠性高、性价比高，特别是在有日光灯等干扰源(200nm-1500nm)情况下，仍能准确识别光谱的特征波长，识别准确率提高了18％-25％。The method of the invention has accurate measurement, fast action speed, strong scalability, high reliability and high cost performance. Especially in the presence of interference sources (200nm-1500nm) such as fluorescent lamps, the characteristic wavelength of the spectrum can still be accurately identified, and the identification accuracy is high. Improved by 18%-25%.
假设现有开关柜加装弧光保护装置的条件下，由于识别短路比现有传统弧光保护装置更准确，因此有助于使现有的开关柜运营更可靠、更安全。例如当电弧短路情况下，电弧测量点波长与光强度的转换系数χ，识别准确率提高了18％-25％，尤其是χ取值10000，识别准确率可稳定提高25％。Assuming that the existing switch cabinet is equipped with an arc protection device, since short circuit identification is more accurate than the existing traditional arc protection device, it will help to make the operation of the existing switch cabinet more reliable and safer. For example, when an arc is short-circuited, the conversion coefficient χ between the wavelength of the arc measurement point and the light intensity increases the recognition accuracy by 18%-25%. Especially when χ takes a value of 10,000, the recognition accuracy can be steadily increased by 25%.
图1本发明电弧光谱识别方法的流程图；Figure 1 is a flow chart of the arc spectrum identification method of the present invention;
图2传统高性能弧光保护方法；其中，Td表示时间继电器，≥1表示取逻辑或，&表示取逻辑与；Figure 2 Traditional high-performance arc protection method; where Td represents a time relay, ≥1 represents a logical OR, & represents a logical AND;
图3正常电弧光谱识别曲线；Figure 3 Normal arc spectrum identification curve;
图4是本发明电弧光谱识别装置的结构示意图；Figure 4 is a schematic structural diagram of the arc spectrum identification device of the present invention;
图5为本发明电子设备结构示意图。Figure 5 is a schematic structural diagram of the electronic equipment of the present invention.
下面结合实施例对本发明作进一步的详细描述。The present invention will be described in further detail below with reference to examples.
本领域技术人员将会理解，下列实施例仅用于说明本发明，而不应视为限定本发明的范围。实施例中未注明具体技术或条件者，按照本领域内的文献所描述的技术或条件或者按照产品说明书进行。所用材料或设备未注明生产厂商者，均为可以通过购买获得的常规产品。Those skilled in the art will understand that the following examples are only used to illustrate the present invention and should not be regarded as limiting the scope of the present invention. If specific techniques or conditions are not specified in the examples, the techniques or conditions described in literature in the field or product instructions will be followed. If the manufacturer of the materials or equipment used is not indicated, they are all conventional products that can be purchased.
开关柜体内产生弧光故障时，常规多采用双判据(过流、弧光信号)进行诊断，或采用“多判据”进行诊断测量，即多了零序电流、零序电压、低电压信号判据，由于常规开关柜体内，多个高压一次设备集结，这些设备会在短路时产生不同的零序电流、零序电压信号，即而在短路故障发生时，零序信号也会发生突变，在这种条件下，首先多种信号自由结合进行，部分间隔一点时间，一般为0.2-2个周波，这个主要是考虑单相或三相弧光短路时，当前相或三相出现电压、电
流跳变时，作为中性点电流、电压信号均会出现突变，不同硬件条件不一样，有的安装有中性点电流互感器、中性点电压互感器，直接从互感器二次线圈取出即可，没有安装中性点电流互感器、中性点电压互感器的情况，需要把电压信号、电流信号做一个软件连接，即末端连接到一起，作为互感器中性电压信号、中性电流信号。如图2所示，对单个开关柜可看作是一个封闭的电磁场，由于电弧产生时，短路事件已经发生，易受电磁场影响，因此需要采集零序电流、过流信号等进行判断，而且电信号为了将这种杂波信号隔离，需要耗费巨大的计算量，增加硬件成本，还不一定能够识别准确，因此本发明在常规电弧光监测方法上，提出一种新的电弧光谱识别方法，可应用于高性能弧光监测。When an arc fault occurs in a switch cabinet, dual criteria (overcurrent and arc light signals) are usually used for diagnosis, or "multi-criteria" are used for diagnostic measurement, that is, zero-sequence current, zero-sequence voltage, and low-voltage signal criteria are added. According to reports, due to the accumulation of multiple high-voltage primary devices in conventional switch cabinets, these devices will produce different zero-sequence current and zero-sequence voltage signals during a short circuit. That is, when a short-circuit fault occurs, the zero-sequence signal will also mutate. Under this condition, a variety of signals are first combined freely, and some are separated by a little time, usually 0.2-2 cycles. This is mainly considered when a single-phase or three-phase arc short circuit occurs, and voltage and current appear in the current phase or three phases. When the current jumps, the neutral point current and voltage signals will undergo sudden changes. Different hardware conditions are different. Some are equipped with neutral point current transformers and neutral point voltage transformers, which are directly taken out from the secondary coil of the transformer. That is, if there is no neutral point current transformer or neutral point voltage transformer installed, the voltage signal and current signal need to be connected by software, that is, the ends are connected together as the neutral voltage signal and neutral current of the transformer. Signal. As shown in Figure 2, a single switch cabinet can be regarded as a closed electromagnetic field. Since the short circuit event has already occurred when the arc is generated, it is susceptible to the influence of the electromagnetic field. Therefore, it is necessary to collect zero sequence current, overcurrent signals, etc. for judgment, and the electrical In order to isolate this kind of clutter signal, a huge amount of calculation is required, the hardware cost is increased, and the identification may not be accurate. Therefore, the present invention proposes a new arc spectrum identification method based on the conventional arc light monitoring method, which can For high-performance arc monitoring applications.
传感器，如光谱检测传感器采集到的电弧光谱信号如图3所示，一般包括2个参数，x为波长，y为光强度，对应电弧不同光谱波长，则存在x1…xn，不同电弧强度，则存在y1…yn，由于电弧产生时，外界光源(如太阳光、室内照明光源)的干扰，使得准确判断出电弧发生，存在一定的难度，甚至存在误判风险，本发明提出一种电弧光谱准确识别方法和装置。The arc spectrum signal collected by the sensor, such as the spectrum detection sensor, is shown in Figure 3. It generally includes two parameters, x is the wavelength, and y is the light intensity. Corresponding to different spectral wavelengths of the arc, there are x 1 ... x n and different arc intensities. , then there are y 1 ...y n . Due to the interference from external light sources (such as sunlight, indoor lighting sources) when the arc occurs, it is difficult to accurately determine the occurrence of the arc, and there is even a risk of misjudgment. The present invention proposes a A method and device for accurately identifying arc spectrum.
一种电弧光谱识别方法，包括以下步骤：An arc spectrum identification method includes the following steps:
步骤(1)，通过电弧传感器测量短路造成的电弧，得到电弧光谱数值曲线；Step (1), measure the arc caused by the short circuit through an arc sensor, and obtain the arc spectrum numerical curve;
步骤(2)，对电弧光谱光强度的测量值进行从大到小进行降序排序，找到光强度排序靠前的n个波长光谱的测量点，该n个测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；Step (2): Sort the measured values of the arc spectrum light intensity in descending order from large to small, and find the n measurement points of the wavelength spectrum with the top order of light intensity. The wavelengths of the n measurement points are x 1 , x 2 ,…x n , the light intensity is y 1 , y 2 ,…y n in sequence;
步骤(3)，对步骤(2)获得的n个波长光谱的测量点之间的欧式距离进行计算；Step (3), calculate the Euclidean distance between the measurement points of the n wavelength spectra obtained in step (2);
步骤(4)，按照目标函数最小化进行迭代计算，直到找到S最小时对应的yi；Step (4), according to the objective function Minimize and perform iterative calculations until the y i corresponding to the minimum S is found;
其中，
in,
in,
式中，yj
D表示第D次迭代时的光强值，其中，yj
D的初始值设为n个波长
光谱测量点中的光强度最大值；然后每次迭代时，取n个波长光谱测量点中的光强度大于dc的任意一个测量点的光强度值；cdi为第i个电弧测量点的光强度；dij为n个波长光谱测量点中波长xi和xj的欧式距离，dc为光谱测量点光强度的截断阈值；χ为测量点波长与光强度的转换系数；D为迭代次数；In the formula, y j D represents the light intensity value at the D-th iteration, where the initial value of y j D is set to n wavelengths The maximum value of the light intensity in the spectrum measurement point; then in each iteration, take the light intensity value of any measurement point where the light intensity in the n wavelength spectrum measurement points is greater than dc; cd i is the light of the i-th arc measurement point Intensity; d ij is the Euclidean distance between wavelengths x i and x j in n wavelength spectrum measurement points, dc is the cutoff threshold of light intensity at the spectrum measurement point; χ is the conversion coefficient between wavelength and light intensity at the measurement point; D is the number of iterations;
步骤(5)，当步骤(4)得到的光强度yi大于等于设定的光强阈值时，则判定电弧短路已经发生，否则没有发生电弧短路。Step (5), when the light intensity yi obtained in step (4) is greater than or equal to the set light intensity threshold, it is determined that an arc short circuit has occurred, otherwise no arc short circuit has occurred.
步骤(2)中，n的取值为光强度大于截断阈值测量点数量的20倍及以上；不同测量点的波长间距为光强度测量点的分辨率。In step (2), the value of n is 20 times or more the number of measurement points where the light intensity is greater than the cutoff threshold; the wavelength spacing of different measurement points is the resolution of the light intensity measurement points.
步骤(3)中，设n个波长光谱测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；In step (3), assume that the wavelengths of n wavelength spectrum measurement points are x 1 , x 2 ,...x n in sequence, and the light intensities are y 1 , y 2 ,...y n in sequence;
这些波长光谱测量点间的欧式距离dij(x)为：
The Euclidean distance d ij (x) between these wavelength spectrum measurement points is:
The Euclidean distance d ij (x) between these wavelength spectrum measurement points is:
步骤(4)中，dc的取值范围为[dc最小值,dc最大值]，其中，dc最大值为电弧光谱最大波长减去最小波长，最小值为dc最大值的(2-10)％。In step (4), the value range of dc is [dc minimum value, dc maximum value], where the dc maximum value is the maximum wavelength of the arc spectrum minus the minimum wavelength, and the minimum value is (2-10)% of the dc maximum value .
步骤(4)中，dc为电弧光谱最大波长减去最小波长的20％。In step (4), dc is the maximum wavelength of the arc spectrum minus 20% of the minimum wavelength.
光强阈值不低于肉眼感知电弧光强度的最大值。The light intensity threshold shall not be lower than the maximum value of the arc light intensity perceived by the naked eye.
光强阈值在室内封闭空间内为5000Lux-10000Lux，在室外环境中为15000Lux-40000Lux。The light intensity threshold is 5000Lux-10000Lux in indoor enclosed spaces and 15000Lux-40000Lux in outdoor environments.
由于光谱的范围非常宽，波长从0.1nm的宇宙射线到100km的近红外波，涉及15个数量级，这样的迭代方法非常漫长，因此本发明采用对任意波长的光强度cdi进行相关迭代。遍历所有测量点，一直找到目标函数的最小值，即为电弧光谱的特征波长，特征波长对应的光强度即为电弧准确的光强度。Since the range of the spectrum is very wide, with wavelengths ranging from cosmic rays of 0.1 nm to near-infrared waves of 100 km, involving 15 orders of magnitude, such an iterative method is very long, so the present invention uses relevant iterations on the light intensity cd i of any wavelength. Traverse all measurement points until the minimum value of the objective function is found, which is the characteristic wavelength of the arc spectrum. The light intensity corresponding to the characteristic wavelength is the accurate light intensity of the arc.
如图4所示，一种电弧光谱识别装置，其特征在于：包括电弧传感器101和识别系统，电弧传感器测量短路造成的电弧，得到电弧光谱，传输至识别系统；As shown in Figure 4, an arc spectrum identification device is characterized by: including an arc sensor 101 and an identification system. The arc sensor measures the arc caused by the short circuit, obtains the arc spectrum, and transmits it to the identification system;
所述的识别系统包括：The identification system includes:
第一处理模块102，用于对电弧光谱光强度的测量值进行从大到小进行降序排序，找到光强度排序靠前的n个波长光谱的测量点，该n个测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；
The first processing module 102 is used to sort the measured values of the arc spectrum light intensity in descending order from large to small, and find the n measurement points of the wavelength spectrum with the top order of light intensity. The wavelengths of the n measurement points are x in order. 1 , x 2 ,…x n , the light intensity is y 1 , y 2 ,…y n in sequence;
第二处理模块103，用于对获得的n个波长光谱的测量点之间的欧式距离进行计算；The second processing module 103 is used to calculate the Euclidean distance between the measurement points of the obtained n wavelength spectra;
第三处理模块104，用于按照目标函数最小化进行迭代计算，直到找到S最小时对应的yi；
The third processing module 104 is used to perform Minimize and perform iterative calculations until the y i corresponding to the minimum S is found;
其中，
in,
in,
式中，yj
D表示第D次迭代时的光强值，其中，yj
D的初始值设为n个波长光谱测量点中的光强度最大值；然后每次迭代时，取n个波长光谱测量点中的光强度大于dc的任意一个测量点的光强度值；cdi为第i个电弧测量点的光强度；dij为n个波长光谱测量点中波长xi和xj的欧式距离，dc为光谱测量点光强度的截断阈值；χ为测量点波长与光强度的转换系数；D为迭代次数；In the formula, y j D represents the light intensity value at the D-th iteration, where the initial value of y j D is set to the maximum light intensity value among n wavelength spectrum measurement points; then in each iteration, n wavelengths are taken The light intensity in the spectrum measurement point is greater than the light intensity value of any measurement point in dc; cd i is the light intensity of the i-th arc measurement point; d ij is the European formula of wavelengths x i and x j in the n wavelength spectrum measurement points Distance, dc is the cutoff threshold of light intensity at the spectrum measurement point; χ is the conversion coefficient between wavelength and light intensity at the measurement point; D is the number of iterations;
电弧短路判断模块105，用于当第三处理模块处理得到的光强度yi大于等于设定的光强阈值时，则判定电弧短路已经发生，否则没有发生电弧短路。The arc short circuit determination module 105 is used to determine that an arc short circuit has occurred when the light intensity yi obtained by the third processing module is greater than or equal to the set light intensity threshold; otherwise, no arc short circuit has occurred.
本发明实施例提供的系统是用于执行上述各方法实施例的，具体流程和详细内容请参照上述实施例，此处不再赘述。The system provided by the embodiments of the present invention is used to execute the above method embodiments. Please refer to the above embodiments for specific processes and details, which will not be described again here.
图5为本发明实施例提供的电子设备结构示意图，参照图5，该电子设备可以包括：处理器(processor)201、通信接口(Communications Interface)202、存储器(memory)203和通信总线204，其中，处理器201，通信接口202，存储器203通过通信总线204完成相互间的通信。处理器201可以调用存储器203中的逻辑指令，以执行如下方法：Figure 5 is a schematic structural diagram of an electronic device provided by an embodiment of the present invention. Referring to Figure 5, the electronic device may include: a processor (processor) 201, a communications interface (Communications Interface) 202, a memory (memory) 203 and a communication bus 204, where , the processor 201, the communication interface 202, and the memory 203 complete communication with each other through the communication bus 204. The processor 201 can call logical instructions in the memory 203 to perform the following methods:
获取电弧光谱数值曲线；Obtain the arc spectrum numerical curve;
对电弧光谱光强度的测量值进行从大到小进行降序排序，找到光强度排序靠前的n个波长光谱的测量点，该n个测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；Sort the measured values of the arc spectrum light intensity in descending order from large to small, and find the n measurement points of the wavelength spectrum with the highest light intensity sorting. The wavelengths of the n measurement points are x 1 , x 2 ,...x n , the light intensity is y 1 , y 2 ,...y n in sequence;
对获得的n个波长光谱的测量点之间的欧式距离进行计算；
Calculate the Euclidean distance between the measurement points of the obtained n wavelength spectra;
按照目标函数最小化进行迭代计算，直到找到S最小时对应的yi；According to the objective function Minimize and perform iterative calculations until the y i corresponding to the minimum S is found;
其中，
in,
in,
式中，yj
D表示第D次迭代时的光强值，其中，yj
D的初始值设为n个波长光谱测量点中的光强度最大值；然后每次迭代时，取n个波长光谱测量点中的光强度大于dc的任意一个测量点的光强度值；cdi为第i个电弧测量点的光强度；dij为n个波长光谱测量点中波长xi和xj的欧式距离，dc为光谱测量点光强度的截断阈值；χ为测量点波长与光强度的转换系数；D为迭代次数；In the formula, y j D represents the light intensity value at the D-th iteration, where the initial value of y j D is set to the maximum light intensity value among n wavelength spectrum measurement points; then in each iteration, n wavelengths are taken The light intensity in the spectrum measurement point is greater than the light intensity value of any measurement point in dc; cd i is the light intensity of the i-th arc measurement point; d ij is the European formula of wavelengths x i and x j in the n wavelength spectrum measurement points Distance, dc is the cutoff threshold of light intensity at the spectrum measurement point; χ is the conversion coefficient between wavelength and light intensity at the measurement point; D is the number of iterations;
当得到的光强度yi大于等于设定的光强阈值时，则判定电弧短路已经发生，否则没有发生电弧短路。When the obtained light intensity yi is greater than or equal to the set light intensity threshold, it is determined that an arc short circuit has occurred, otherwise no arc short circuit has occurred.
此外，上述的存储器203中的逻辑指令可以通过软件功能单元的形式实现并作为独立的产品销售或使用时，可以存储在一个计算机可读取存储介质中。基于这样的理解，本发明的技术方案本质上或者说对现有技术做出贡献的部分或者该技术方案的部分可以以软件产品的形式体现出来，该计算机软件产品存储在一个存储介质中，包括若干指令用以使得一台计算机设备(可以是个人计算机，服务器，或者网络设备等)执行本发明各个实施例所述方法的全部或部分步骤。而前述的存储介质包括：U盘、移动硬盘、只读存储器(ROM，Read-Only Memory)、随机存取存储器(RAM，Random Access Memory)、磁碟或者光盘等各种可以存储程序代码的介质。In addition, the above-mentioned logical instructions in the memory 203 can be implemented in the form of software functional units and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present invention essentially or the part that contributes to the existing technology or the part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium, including Several instructions are used to cause a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention. The aforementioned storage media include: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), magnetic disk or optical disk and other media that can store program code. .
另一方面，本发明实施例还提供一种非暂态计算机可读存储介质，其上存储有计算机程序，该计算机程序被处理器执行时实现以执行上述各实施例提供的电弧光谱识别方法，例如包括：On the other hand, embodiments of the present invention also provide a non-transitory computer-readable storage medium on which a computer program is stored. The computer program is implemented when executed by a processor to execute the arc spectrum identification method provided by the above embodiments. Examples include:
获取电弧光谱数值曲线；Obtain the arc spectrum numerical curve;
对电弧光谱光强度的测量值进行从大到小进行降序排序，找到光强度排序靠前的n个波长光谱的测量点，该n个测量点的波长依次为x1，x2,…xn，光强
度依次为y1，y2,…yn；Sort the measured values of the arc spectrum light intensity in descending order from large to small, and find the n measurement points of the wavelength spectrum with the highest light intensity sorting. The wavelengths of the n measurement points are x 1 , x 2 ,...x n , light intensity The degrees are y 1 , y 2 ,...y n ;
对获得的n个波长光谱的测量点之间的欧式距离进行计算；Calculate the Euclidean distance between the measurement points of the obtained n wavelength spectra;
按照目标函数最小化进行迭代计算，直到找到S最小时对应的yi；According to the objective function Minimize and perform iterative calculations until the y i corresponding to the minimum S is found;
其中，
in,
in,
式中，yj
D表示第D次迭代时的光强值，其中，yj
D的初始值设为n个波长光谱测量点中的光强度最大值；然后每次迭代时，取n个波长光谱测量点中的光强度大于dc的任意一个测量点的光强度值；cdi为第i个电弧测量点的光强度；dij为n个波长光谱测量点中波长xi和xj的欧式距离，dc为光谱测量点光强度的截断阈值；χ为测量点波长与光强度的转换系数；In the formula, y j D represents the light intensity value at the D-th iteration, where the initial value of y j D is set to the maximum light intensity value among n wavelength spectrum measurement points; then in each iteration, n wavelengths are taken The light intensity in the spectrum measurement point is greater than the light intensity value of any measurement point in dc; cd i is the light intensity of the i-th arc measurement point; d ij is the European formula of wavelengths x i and x j in the n wavelength spectrum measurement points Distance, dc is the cutoff threshold of light intensity at the spectrum measurement point; χ is the conversion coefficient between wavelength and light intensity at the measurement point;
当得到的光强度yi大于等于设定的光强阈值时，则判定电弧短路已经发生，否则没有发生电弧短路。When the obtained light intensity yi is greater than or equal to the set light intensity threshold, it is determined that an arc short circuit has occurred, otherwise no arc short circuit has occurred.
以上所描述的装置实施例仅仅是示意性的，其中所述作为分离部件说明的单元可以是或者也可以不是物理上分开的，作为单元显示的部件可以是或者也可以不是物理单元，即可以位于一个地方，或者也可以分布到多个网络单元上。可以根据实际的需要选择其中的部分或者全部模块来实现本实施例方案的目的。本领域普通技术人员在不付出创造性的劳动的情况下，即可以理解并实施。The device embodiments described above are only illustrative. The units described as separate components may or may not be physically separated. The components shown as units may or may not be physical units, that is, they may be located in One location, or it can be distributed across multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. Persons of ordinary skill in the art can understand and implement the method without any creative effort.
通过以上的实施方式的描述，本领域的技术人员可以清楚地了解到各实施方式可借助软件加必需的通用硬件平台的方式来实现，当然也可以通过硬件。基于这样的理解，上述技术方案本质上或者说对现有技术做出贡献的部分可以以软件产品的形式体现出来，该计算机软件产品可以存储在计算机可读存储介质中，如ROM/RAM、磁碟、光盘等，包括若干指令用以使得一台计算机设备(可以是个人计算机，服务器，或者网络设备等)执行各个实施例或者实施例的某些部分所述的方法。Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and of course, it can also be implemented by hardware. Based on this understanding, the part of the above technical solution that essentially contributes to the existing technology can be embodied in the form of a software product. The computer software product can be stored in a computer-readable storage medium, such as ROM/RAM, magnetic disk, optical disk, etc., including a number of instructions to cause a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in various embodiments or certain parts of the embodiments.
应用实例
Applications
某电弧光谱识别曲线如图3所示，dc表示光谱测量点光强度的截断阈值取(15000-40000)Lux，本实例中取20000Lux，大于此截断阈值的测量光谱测量点有45个，光谱最大测量波长为820nm，最小测量波长为200nm，光谱波长测量分辨率为2nm，所有测量点为310个，χ为测量点波长与光强度的转换系数，取值10000，根据电弧光谱识别目标函数最小的迭代规律，找到电弧光谱的特征波长为426nm，此时对应的光强度为28400Lux，大于光强阈值，光强阈值为25000Lux，证明此时已经发生电弧短路，因此输出电弧短路控制信号。此光强阈值一般情况下，在有外界光源干扰情况下何没有干扰情况下是不一样的，有外界光源干扰情况下，光强阀值要大于没有外界光源干扰情况下光强阀值的2倍及以上。此外判断短路实际是否发生的光强阀值与光纤衰减有关系，在安装和出厂时需要根据光纤长度进行标定。(添加的)。A certain arc spectrum identification curve is shown in Figure 3. dc indicates that the truncation threshold of the light intensity of the spectrum measurement point is (15000-40000) Lux. In this example, 20000 Lux is taken. There are 45 measurement spectrum measurement points greater than this truncation threshold, and the spectrum is the largest The measurement wavelength is 820nm, the minimum measurement wavelength is 200nm, the spectral wavelength measurement resolution is 2nm, and all measurement points are 310. χ is the conversion coefficient between the wavelength and light intensity of the measurement point, with a value of 10000. According to the arc spectrum, the minimum objective function is identified According to the iteration rule, the characteristic wavelength of the arc spectrum is found to be 426nm. At this time, the corresponding light intensity is 28400Lux, which is greater than the light intensity threshold. The light intensity threshold is 25000Lux, which proves that an arc short circuit has occurred at this time, so the arc short circuit control signal is output. In general, this light intensity threshold is different with and without external light source interference. With external light source interference, the light intensity threshold is 2 times greater than the light intensity threshold without external light source interference. times and above. In addition, the light intensity threshold for judging whether a short circuit actually occurs is related to the attenuation of the optical fiber, and needs to be calibrated according to the length of the optical fiber during installation and delivery. (Additional).
假设此时电弧光谱的特征波长，对应的光强度小于光强阈值，证明此时没有发生电弧短路，因此不输出电弧短路控制信号。即只有计算目标函数最小时对应yi大于等于光强阈值时，证明此时已经发生电弧短路；光强度小于光强阈值时，证明此时没有发生电弧短路。Assume that the characteristic wavelength of the arc spectrum at this time and the corresponding light intensity are less than the light intensity threshold, proving that no arc short circuit occurs at this time, so no arc short circuit control signal is output. That is, only when the calculated objective function is minimized and corresponding to y i is greater than or equal to the light intensity threshold, it is proved that an arc short circuit has occurred at this time; when the light intensity is less than the light intensity threshold, it is proved that no arc short circuit has occurred at this time.
以上显示和描述了本发明的基本原理、主要特征和本发明的优点。本行业的技术人员应该了解，本发明不受上述实施例的限制，上述实施例和说明书中描述的只是说明本发明的原理，在不脱离本发明精神和范围的前提下，本发明还会有各种变化和改进，这些变化和改进都落入要求保护的本发明范围内。本发明要求保护范围由所附的权利要求书及其等效物界定。
The basic principles, main features and advantages of the present invention have been shown and described above. Those skilled in the industry should understand that the present invention is not limited by the above embodiments. The above embodiments and descriptions only illustrate the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention will also have other aspects. Various changes and modifications are possible, which fall within the scope of the claimed invention. The scope of protection of the present invention is defined by the appended claims and their equivalents.
Claims (10)
- 一种电弧光谱识别方法，其特征在于：包括以下步骤：An arc spectrum identification method, characterized by: including the following steps:步骤(1)，通过电弧传感器测量短路造成的电弧，得到电弧光谱数值曲线；Step (1), measure the arc caused by the short circuit through an arc sensor, and obtain the arc spectrum numerical curve;步骤(2)，对电弧光谱光强度的测量值进行从大到小进行降序排序，找到光强度排序靠前的n个波长光谱的测量点，该n个测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；Step (2): Sort the measured values of the arc spectrum light intensity in descending order from large to small, and find the n measurement points of the wavelength spectrum with the top order of light intensity. The wavelengths of the n measurement points are x 1 , x 2 ,…x n , the light intensity is y 1 , y 2 ,…y n in sequence;步骤(3)，对步骤(2)获得的n个波长光谱的测量点之间的欧式距离进行计算；Step (3), calculate the Euclidean distance between the measurement points of the n wavelength spectra obtained in step (2);步骤(4)，按照目标函数最小化进行迭代计算，直到找到S最小时对应的yi；Step (4), according to the objective function Minimize and perform iterative calculations until the y i corresponding to the minimum S is found;其中，
in,
式中，yj D表示第D次迭代时的光强值，其中，yj D的初始值设为n个波长光谱测量点中的光强度最大值；然后每次迭代时，取n个波长光谱测量点中的光强度大于dc的任意一个测量点的光强度值；cdi为第i个电弧测量点的光强度；dij为n个波长光谱测量点中波长xi和xj的欧式距离，dc为光谱测量点光强度的截断阈值；χ为测量点波长与光强度的转换系数；D为迭代次数；In the formula, y j D represents the light intensity value at the D-th iteration, where the initial value of y j D is set to the maximum light intensity value among n wavelength spectrum measurement points; then in each iteration, n wavelengths are taken The light intensity in the spectrum measurement point is greater than the light intensity value of any measurement point in dc; cd i is the light intensity of the i-th arc measurement point; d ij is the European formula of wavelengths x i and x j in the n wavelength spectrum measurement points Distance, dc is the cutoff threshold of light intensity at the spectrum measurement point; χ is the conversion coefficient between wavelength and light intensity at the measurement point; D is the number of iterations;步骤(5)，当步骤(4)得到的光强度yi大于等于设定的光强阈值时，则判定电弧短路已经发生，否则没有发生电弧短路。Step (5), when the light intensity yi obtained in step (4) is greater than or equal to the set light intensity threshold, it is determined that an arc short circuit has occurred, otherwise no arc short circuit has occurred. - 根据权利要求1所述的电弧光谱识别方法，其特征在于：步骤(2)中，n的取值为光强度大于截断阈值测量点数量的20倍及以上；不同测量点的波长间距为光强度测量点的分辨率。The arc spectrum identification method according to claim 1, characterized in that: in step (2), the value of n is 20 times or more the light intensity is greater than the number of measurement points of the cutoff threshold; the wavelength spacing of different measurement points is the light intensity The resolution of the measuring point.
- 根据权利要求1所述的电弧光谱识别方法，其特征在于：步骤(3)中，设n个波长光谱测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；这些波长光谱测量点间的欧式距离dij(x)为：
The arc spectrum identification method according to claim 1, characterized in that: in step (3), assume that the wavelengths of n wavelength spectrum measurement points are x 1 , x 2 ,...x n in sequence, and the light intensity is y 1 in sequence, y 2 ,…y n ; the Euclidean distance d ij (x) between these wavelength spectrum measurement points is:
- 根据权利要求1所述的电弧光谱识别方法，其特征在于：步骤(4)中，dc的取值范围为[dc最小值,dc最大值]，其中，dc最大值为电弧光谱最大波长减去最小波长，最小值为dc最大值的(2-10)％。The arc spectrum identification method according to claim 1, characterized in that: in step (4), the value range of dc is [dc minimum value, dc maximum value], wherein the dc maximum value is the maximum wavelength of the arc spectrum minus Minimum wavelength, the minimum value is (2-10)% of the maximum value of dc.
- 根据权利要求4所述的电弧光谱识别方法，其特征在于：步骤(4)中，dc为电弧光谱最大波长减去最小波长的20％。The arc spectrum identification method according to claim 4, characterized in that: in step (4), dc is 20% of the maximum wavelength of the arc spectrum minus the minimum wavelength.
- 根据权利要求1所述的电弧光谱识别方法，其特征在于：光强阈值不低于肉眼感知电弧光强度的最大值。The arc spectrum identification method according to claim 1, characterized in that: the light intensity threshold is not lower than the maximum value of the arc light intensity perceived by the naked eye.
- 根据权利要求1所述的电弧光谱识别方法，其特征在于：光强阈值在室内封闭空间内为5000Lux-10000Lux，在室外环境中为15000Lux-40000Lux。The arc spectrum identification method according to claim 1, characterized in that: the light intensity threshold is 5000Lux-10000Lux in an indoor closed space and 15000Lux-40000Lux in an outdoor environment.
- 一种电弧光谱识别装置，其特征在于：包括电弧传感器和识别系统，电弧传感器测量短路造成的电弧，得到电弧光谱，传输至识别系统；An arc spectrum identification device, characterized by: including an arc sensor and an identification system. The arc sensor measures the arc caused by the short circuit, obtains the arc spectrum, and transmits it to the identification system;所述的识别系统包括：The identification system includes:第一处理模块，用于对电弧光谱光强度的测量值进行从大到小进行降序排序，找到光强度排序靠前的n个波长光谱的测量点，该n个测量点的波长依次为x1，x2,…xn，光强度依次为y1，y2,…yn；The first processing module is used to sort the measured values of the arc spectrum light intensity in descending order from large to small, and find the n measurement points of the wavelength spectrum with the top light intensity sorting. The wavelengths of the n measurement points are x 1 in order. , x 2 ,…x n , the light intensity is y 1 , y 2 ,…y n in sequence;第二处理模块，用于对获得的n个波长光谱的测量点之间的欧式距离进行计算；The second processing module is used to calculate the Euclidean distance between the measurement points of the obtained n wavelength spectra;第三处理模块，用于按照目标函数最小化进行迭代计算，直到找到S最小时对应的yi；The third processing module is used to follow the objective function Minimize and perform iterative calculations until the y i corresponding to the minimum S is found;其中，
in,
式中，yj D表示第D次迭代时的光强值，其中，yj D的初始值设为n个波长光谱测量点中的光强度最大值；然后每次迭代时，取n个波长光谱测量点中的光强度大于dc的任意一个测量点的光强度值；cdi为第i个电弧测量点的光强度；dij为n个波长光谱测量点中波长xi和xj的欧式距离，dc为光谱测量点光强度的截断阈值；χ为测量点波长与光强度的转换系数； In the formula, y j D represents the light intensity value at the D-th iteration, where the initial value of y j D is set to the maximum light intensity value among n wavelength spectrum measurement points; then in each iteration, n wavelengths are taken The light intensity in the spectrum measurement point is greater than the light intensity value of any measurement point in dc; cd i is the light intensity of the i-th arc measurement point; d ij is the European formula of wavelengths x i and x j in the n wavelength spectrum measurement points Distance, dc is the cutoff threshold of light intensity at the spectrum measurement point; χ is the conversion coefficient between wavelength and light intensity at the measurement point;电弧短路判断模块，用于当第三处理模块处理得到的光强度yi大于等于设定的光强阈值时，则判定电弧短路已经发生，否则没有发生电弧短路。The arc short circuit determination module is used to determine that an arc short circuit has occurred when the light intensity yi obtained by the third processing module is greater than or equal to the set light intensity threshold; otherwise, no arc short circuit has occurred. - 一种电子设备，包括存储器、处理器及存储在存储器上并可在处理器上运行的计算机程序，其特征在于，所述处理器执行所述程序时实现如权利要求1至7任一项所述电弧光谱识别方法的步骤。An electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that when the processor executes the program, the program as claimed in any one of claims 1 to 7 is achieved. Describe the steps of the arc spectrum identification method.
- 一种非暂态计算机可读存储介质，其上存储有计算机程序，其特征在于，该计算机程序被处理器执行时实现如权利要求1至7任一项所述电弧光谱识别方法的步骤。 A non-transitory computer-readable storage medium on which a computer program is stored, characterized in that when the computer program is executed by a processor, the steps of the arc spectrum identification method according to any one of claims 1 to 7 are implemented.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210914105.2A CN114966472B (en) | 2022-08-01 | 2022-08-01 | Electric arc spectrum identification method and device |
| CN202210914105.2 | 2022-08-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2024027455A1 true WO2024027455A1 (en) | 2024-02-08 |
Family
ID=82970043
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/CN2023/106109 WO2024027455A1 (en) | 2022-08-01 | 2023-07-06 | Arc spectrum identification method and apparatus |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN114966472B (en) |
| WO (1) | WO2024027455A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114966472B (en) * | 2022-08-01 | 2022-10-21 | 云南电力试验研究院(集团)有限公司 | Electric arc spectrum identification method and device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100321838A1 (en) * | 2009-06-18 | 2010-12-23 | General Electric Company | Arc flash detection system |
| KR101307470B1 (en) * | 2013-07-10 | 2013-09-12 | 주식회사 케이디파워 | Arc flash detection man-machine interface |
| CN104569684A (en) * | 2015-01-14 | 2015-04-29 | 上海和伍新材料科技有限公司 | Fault electric arc detection method based on electric arc spectrum signals |
| CN110441647A (en) * | 2019-09-06 | 2019-11-12 | 云南电网有限责任公司电力科学研究院 | Arc light assessment of risks method and device based on spectral intensity information |
| CN110794326A (en) * | 2019-09-26 | 2020-02-14 | 昆明理工大学 | Line selection method, device and system for short-circuit protection of power distribution system |
| CN114966472A (en) * | 2022-08-01 | 2022-08-30 | 云南电力试验研究院(集团)有限公司 | Electric arc spectrum identification method and device |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6636843B2 (en) * | 2000-12-14 | 2003-10-21 | Timbre Technologies, Inc. | System and method for grating profile classification |
| JP5730469B2 (en) * | 2009-03-27 | 2015-06-10 | 古河電気工業株式会社 | Tunable light source device |
| CN103823179A (en) * | 2014-01-15 | 2014-05-28 | 云南电力试验研究院（集团）有限公司电力研究院 | Non-contact spatial high-frequency high-voltage circuit breaker operation characteristics measurement method |
| CN105445611B (en) * | 2014-05-30 | 2019-11-08 | 西门子公司 | The detection method and detection device of fault electric arc |
| CN107064753A (en) * | 2017-03-23 | 2017-08-18 | 西南交通大学 | Bow net arc-plasma Multi-parameter Data Acquisition method and apparatus |
| CN110308377B (en) * | 2019-07-23 | 2021-06-15 | 南京航空航天大学 | Arc detection method for multi-electric-plane direct-current system |
| CN112285504B (en) * | 2020-10-27 | 2023-11-17 | 华北电力大学 | Multispectral solar blind narrow-band ultraviolet imager and method for detecting different discharge states thereof |
-
2022
- 2022-08-01 CN CN202210914105.2A patent/CN114966472B/en active Active
-
2023
- 2023-07-06 WO PCT/CN2023/106109 patent/WO2024027455A1/en unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100321838A1 (en) * | 2009-06-18 | 2010-12-23 | General Electric Company | Arc flash detection system |
| KR101307470B1 (en) * | 2013-07-10 | 2013-09-12 | 주식회사 케이디파워 | Arc flash detection man-machine interface |
| CN104569684A (en) * | 2015-01-14 | 2015-04-29 | 上海和伍新材料科技有限公司 | Fault electric arc detection method based on electric arc spectrum signals |
| CN110441647A (en) * | 2019-09-06 | 2019-11-12 | 云南电网有限责任公司电力科学研究院 | Arc light assessment of risks method and device based on spectral intensity information |
| CN110794326A (en) * | 2019-09-26 | 2020-02-14 | 昆明理工大学 | Line selection method, device and system for short-circuit protection of power distribution system |
| CN114966472A (en) * | 2022-08-01 | 2022-08-30 | 云南电力试验研究院(集团)有限公司 | Electric arc spectrum identification method and device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN114966472B (en) | 2022-10-21 |
| CN114966472A (en) | 2022-08-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10132853B2 (en) | Wide area fault detection method using PMU data | |
| Tang et al. | A high-speed protection scheme for the DC transmission line of a MMC-HVDC grid | |
| WO2019127440A1 (en) | Method and device for handling direct current arc | |
| WO2024027455A1 (en) | Arc spectrum identification method and apparatus | |
| US20150054523A1 (en) | Devices and techniques for detecting faults in photovoltaic systems | |
| WO2023206897A1 (en) | Method and system for identifying single-phase grounding fault on the basis of multi-dimensional electric-energy information fusion | |
| EP3723224B1 (en) | Time domain distance protection based on polarity comparison for power transmission lines | |
| CN109596956B (en) | DC series arc detection method and device | |
| CN104062555B (en) | The discrimination method of distribution line high resistance earthing fault characteristic harmonics | |
| CN209561923U (en) | Intelligent railway weak electric system power lightning protection distribution device | |
| CN210534262U (en) | Large-current fault line selection system of resonance grounding system | |
| US20230053431A1 (en) | Arc fault detection using machine learning | |
| WO2023045008A1 (en) | Wavelet decomposition-based intelligent self-adaptive arc detection method and device using same | |
| CN102901943B (en) | Regional power grid-based sample data exception detection and over-current protection method | |
| CN112213662B (en) | High-voltage cable single-phase earth fault judgment device and method | |
| Adewole | Investigation of methodologies for fault detection and diagnosis in electric power system protection | |
| Zhou et al. | Method of cable incipient faults detection and identification based on wavelet transform and gray correlation analysis | |
| Wu et al. | A new algorithm for busbar protection based on the comparison of initial traveling wave power | |
| CN103066579A (en) | Grid fault measuring and control device | |
| CN217214433U (en) | Transformer with lightning protection function | |
| CN115207981B (en) | Low-frequency injection type anti-islanding protection method and system for multi-path photovoltaic access platform area | |
| de Miguel et al. | Implementation of a digital directional Fault Passage Indicator | |
| CN108736435A (en) | A kind of Fault Locating Method, device, positioning device and storage medium | |
| CN212726459U (en) | Line protection integrated measurement and control device | |
| CN113419103B (en) | Electrical fire early warning system and method for transformer for station |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 23849164 Country of ref document: EP Kind code of ref document: A1 |