WO2024011756A1 - Image acquisition parameter adjustment method and system, electronic device, and storage medium - Google Patents

Abstract

An image acquisition parameter adjustment method and system, an electronic device, and a storage medium. The method comprises: acquiring an initial comprehensive test chart obtained by an image acquisition device when performing image acquisition on a comprehensive test card; identifying position information of a first object image corresponding to a first adjustment reference object in the initial comprehensive test chart, and on the basis of the position information, adjusting a focal length parameter; controlling the image acquisition device to perform image acquisition on the comprehensive test card on the basis of the adjusted focal length parameter, obtaining a target comprehensive test chart; identifying a second object image corresponding to a second adjustment reference object in the target comprehensive test chart; and adjusting a corresponding image acquisition parameter on the basis of the second object image.

Description

Image acquisition parameter adjustment method and system, electronic equipment and storage medium

Cross-references to related applications

This application requires the priority of the Chinese patent application submitted to the China Patent Office on July 13, 2022, with the application number 202210819683.8, and the application name is "Image acquisition parameter adjustment method, comprehensive test card, device and electronic equipment". Hereby, Its entire text is incorporated by reference.

Technical field

The present application relates to the field of image technology, and in particular to an image acquisition parameter adjustment method and system, electronic equipment and computer-readable storage media.

Background technique

With the development of image technology, image acquisition parameter adjustment technology has emerged. The quality of image acquisition parameters determines the quality of the image. The traditional method of adjusting image acquisition parameters is to adjust the corresponding parameters through special test cards corresponding to each image acquisition parameter, such as using grayscale test cards to adjust color saturation and using distortion test cards to adjust image distortion, etc.

However, there are many types of image acquisition parameters. Using special test cards corresponding to each image acquisition parameter to adjust the image acquisition parameters is not only difficult for non-professionals, but also takes a long time and the adjustment efficiency is low.

Contents of the invention

Based on this, it is necessary to address the above technical problems and provide an image acquisition parameter adjustment method and system, electronic equipment and computer-readable storage media that can improve adjustment efficiency.

In a first aspect, this application provides a method for adjusting image acquisition parameters. The method includes the following steps.

Obtain the initial comprehensive test chart obtained by image acquisition of the comprehensive test card by the image acquisition device; the comprehensive test card is provided with a first adjustment reference object and at least one second adjustment reference object; the first adjustment reference object is used for Adjust the focal length parameter; each second adjustment reference object is used to adjust the corresponding image acquisition parameter.

Identify the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart, and adjust the focal length parameter based on the position information.

The image acquisition device is controlled to collect images of the comprehensive test card based on the adjusted focal length parameter to obtain the target comprehensive test chart.

Identify the second object image corresponding to the second adjustment reference object in the target comprehensive test chart.

Corresponding image acquisition parameters are adjusted based on the second object image.

In some embodiments, the location information includes coordinates of the first object image in the initial comprehensive test map.

The adjustment of the focal length parameter based on the position information includes the following steps.

Based on the coordinates, a focal length parameter of the image acquisition device is adjusted so that the image acquisition device focuses on the first adjustment reference object.

In some embodiments, adjusting the focal length parameter of the image acquisition device based on the coordinates includes the following steps.

The focal length parameters of the image acquisition device are gradually adjusted multiple times based on the coordinates, and images are collected on the comprehensive test card based on the focal length parameters after each adjustment to obtain multiple candidate images after multiple focal length adjustments.

The sharpness of the image corresponding to the first adjustment reference object in each of the candidate images is calculated respectively.

The focal length parameter corresponding to the candidate picture with the highest definition among the plurality of candidate pictures is determined as the focal length parameter after focusing on the first adjustment reference object.

In some embodiments, the first adjustment reference object is a plurality of reference patterns with different shapes and sharpness greater than a sharpness threshold.

Calculating the sharpness of images corresponding to the first adjustment reference object in each of the candidate images includes the following steps.

For each candidate image, calculate the edge gradient of each reference pattern in each candidate image.

Based on the edge gradient, the sharpness of the image corresponding to each of the reference patterns in the corresponding selected pictures is determined.

In some embodiments, adjusting corresponding image acquisition parameters based on the second object image includes the following steps.

Based on the difference in corresponding image acquisition parameters between the second object image and the second adjustment reference object in the comprehensive test card, a correction matrix for the image acquisition parameters is determined.

Based on the correction matrix, the image acquisition parameters are adjusted.

In some embodiments, the at least one second adjustment reference object includes a white balance adjustment color patch, and the second object image includes a white balance color patch map in the target comprehensive test image.

Determining a correction matrix for the image acquisition parameters based on the difference in corresponding image acquisition parameters between the second object image and the second adjustment reference object in the comprehensive test card includes the following steps.

A first color average of pixels within a central area of the white balance patch map is determined.

Determine the second color average value of the pixels in the central area of the white balance adjustment color block in the comprehensive test card.

A white balance correction matrix for a white balance parameter is determined based on the difference between the first color average and the second color average.

In some embodiments, the at least one second adjustment reference object includes a plurality of color correction color patches; the second object image includes a plurality of color correction color patch images in the target comprehensive test image.

Determining a correction matrix for the image acquisition parameters based on the difference in corresponding image acquisition parameters between the second object image and the second adjustment reference object in the comprehensive test card includes the following steps.

Color values of the plurality of color correction color patch diagrams are determined respectively.

The color values of the multiple color correction color block diagrams are compared with the color values of the corresponding color correction color blocks in the comprehensive test card.

Generate a color correction matrix for color parameters based on the difference comparison results.

In some embodiments, the electronic device identifies the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart, and adjusts the focal length parameter based on the position information, including: identifying The position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart; based on the position information, determine whether the focal length parameter needs to be adjusted; if so, based on the position information, Adjust the focal length parameter to obtain the adjusted focus parameter; if not, the adjusted focus parameter is the same as the current focus parameter that does not need to be adjusted, that is, no adjustment is made to the current focus parameter, but the Adjustment processing of the next image acquisition parameter (that is, the image acquisition parameter corresponding to the second adjustment reference object).

In some embodiments, the electronic device adjusts the corresponding image acquisition parameters based on the second object image, including: determining whether the corresponding image acquisition parameters need to be adjusted based on the second object image; if so , then the corresponding image acquisition parameters are adjusted based on the second object image to obtain the corresponding processed image acquisition parameters; if not, the corresponding image acquisition parameters that currently do not need to be processed remain unchanged. Change.

In the second aspect, this application also provides an image acquisition parameter adjustment system, including an image acquisition device, a comprehensive test card and an image acquisition parameter adjustment device.

The image acquisition parameter adjustment device is connected to the image acquisition equipment, and the image acquisition equipment is connected to the comprehensive test card held.

The image acquisition parameter adjustment device includes an acquisition module, an identification module and an adjustment module.

The acquisition module is used to acquire the initial comprehensive test chart obtained by image acquisition of the comprehensive test card by the image acquisition device; the comprehensive test card is provided with a first adjustment reference object and at least one second adjustment reference object; the first The adjustment reference object is used to adjust the focal length parameter; each second adjustment reference object is used to adjust the corresponding image acquisition parameter.

An identification module for identifying the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart, and adjusting the focal length parameter based on the position information; controlling the image acquisition device based on the adjustment The final focal length parameter is used to collect images of the comprehensive test card to obtain the target comprehensive test chart.

An adjustment module, configured to identify the second object image corresponding to the second adjustment reference object in the target comprehensive test chart; and adjust the corresponding image acquisition parameters based on the second object image.

In some embodiments, the comprehensive test card includes a card body, and the first adjustment reference object and the at least one second adjustment reference object are provided on the surface of the card body.

In some embodiments, the first adjustment reference object includes a plurality of reference patterns with different shapes and sharpness greater than the sharpness threshold; the second adjustment reference object includes white balance adjustment color blocks and color correction color blocks. of at least one.

In some embodiments, the comprehensive test card also includes an identification code and a blank area; the identification code is used to identify the identity information of the comprehensive test card; the blank area is used to fill in target information, and the target information represents the need information filled in.

In a third aspect, this application also provides an electronic device. The electronic device includes a memory and a processor. The memory stores a computer program. When the processor executes the computer program, the steps of the above method are implemented.

In a fourth aspect, this application also provides a computer-readable storage medium. The computer-readable storage medium has a computer program stored thereon, and when the computer program is executed by a processor, the steps of the above method are implemented.

The above-mentioned image acquisition parameter adjustment method and system, electronic equipment and storage medium obtain an initial comprehensive test chart obtained by image acquisition of the comprehensive test card by the image acquisition device; the comprehensive test card is provided with a first adjustment reference object and at least one Each second adjustment reference object is used to adjust the focal length parameter; each second adjustment reference object is used to adjust the corresponding image acquisition parameter; identify where the first adjustment reference object is. The position information of the corresponding first object image in the initial comprehensive test chart is used, and the focal length parameter is adjusted based on the position information; the image acquisition device is controlled to collect images of the comprehensive test card based on the adjusted focal length parameter to obtain the target comprehensive Test chart; identify the second object image corresponding to the second adjustment reference object in the target comprehensive test chart; adjust the corresponding image acquisition parameters based on the second object image. The image acquisition parameter adjustment system of this application includes comprehensive test cards for different adjustment reference objects. Based on this comprehensive test card, this application proposes an image acquisition parameter adjustment method, that is, through the first adjustment reference object, the focal length parameter of the image acquisition device is adjusted. Adjustment is made, and other image acquisition parameters except the focal length parameter are adjusted through the second adjustment reference object. Furthermore, multiple image acquisition parameters are adjusted through a comprehensive test card to avoid frequent replacement of test cards in order to adjust different image acquisition parameters. This not only reduces the difficulty of adjusting image acquisition parameters, but also saves the time of manually adjusting image acquisition parameters and improves improve the efficiency of adjusting image acquisition parameters.

Description of drawings

Figure 1 is an application environment diagram of the image acquisition parameter adjustment method in one embodiment.

Figure 2 is a schematic flowchart of an image acquisition parameter adjustment method in one embodiment.

Figure 3 is a schematic diagram of a comprehensive test card in one embodiment.

Figure 4 is a structural block diagram of an image acquisition parameter adjustment device in one embodiment.

Figure 5 is a structural block diagram of an identification module in an embodiment.

Figure 6 is an internal structure diagram of an electronic device in one embodiment.

Detailed ways

In order to make the purpose, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application and are not used to limit the present application.

Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing specific embodiments only and is not intended to limit the application.

The image acquisition parameter adjustment method provided by the embodiment of the present application can be applied in the application environment as shown in Figure 1. As shown in Figure 1, the image acquisition device 101 collects images of the comprehensive test card 102. The image acquisition device 101 sends the collected images to the electronic device 103. The electronic device 103 analyzes and processes the images sent by the image acquisition device 101, and The image acquisition device 101 is controlled to adjust image acquisition parameters.

In some embodiments, the electronic device 103 obtains the initial comprehensive test chart obtained by image acquisition of the comprehensive test card 102 by the image acquisition device 101; the electronic device 103 identifies the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart. position information, and controls the image acquisition device 101 to adjust the focal length parameter based on the position information; the image acquisition device 101 performs image acquisition on the comprehensive test card based on the adjusted focal length parameter, and obtains the target comprehensive test chart; the electronic device 103 performs image acquisition on each third When adjusting the image acquisition parameters corresponding to the second adjustment reference object, identify the second object image corresponding to the second adjustment reference object in the target comprehensive test chart; the image acquisition device 101 adjusts the corresponding image acquisition parameters based on the second object image. deal with.

It should be noted that the electronic device 103 can be independent from the outside of the image acquisition device 101 or integrated in the image acquisition device 101, which is not limited in this embodiment.

In some embodiments, as shown in FIG. 2 , a method for adjusting image acquisition parameters is provided. This method is explained by taking the method applied to the electronic device 103 in FIG. 1 as an example, that is, the execution subject of the method is the electronic device 103 . The image acquisition parameter adjustment method includes the following steps 201 to 205.

Step 201: Obtain the initial comprehensive test chart obtained by image acquisition of the comprehensive test card by the image acquisition device; the comprehensive test card is provided with a first adjustment reference object and at least one second adjustment reference object; the first adjustment reference object is used for The focal length parameter is adjusted; each second adjustment reference object is used to adjust the corresponding image acquisition parameter.

Among them, the image acquisition device is a device used to acquire images. Image collection devices include but are not limited to mobile terminals with cameras, cameras, cameras, scanners, video capture cards, and other devices with image collection functions, etc.

Among them, the image acquisition parameters are parameters set by the image acquisition device to acquire images. In some embodiments, the image acquisition parameters include, but are not limited to, at least one of focal length parameters, resolution parameters, dynamic range parameters, distortion parameters, and the like.

Among them, the comprehensive test card is a test card used to adjust various image acquisition parameters. The comprehensive test card includes multiple adjustment reference objects. In some embodiments, multiple image acquisition parameters can be adjusted by combining multiple adjustment objects in the test chart. It can be understood that the image obtained by collecting images of the comprehensive test card for the first time is the initial comprehensive test chart.

The adjustment reference object is an object that the image acquisition device refers to when adjusting image acquisition parameters.

In some embodiments, the adjustment reference object appears as a pattern in the comprehensive test chart. A variety of different patterns are included in the comprehensive test chart to adjust a variety of image acquisition parameters through a variety of different patterns. Exemplarily, the image acquisition parameters include dynamic range parameters. Taking the dynamic range parameters as an example, when adjusting the dynamic range parameters, the adjustment reference object is the grayscale pattern in the comprehensive test card. By analyzing the grayscale pattern on the initial comprehensive test chart collected, the current dynamic range parameters are determined. If the current dynamic range parameters do not meet the requirements, adjust the dynamic range parameters of the image acquisition device. It can be understood that different image acquisition parameters correspond to different adjustment reference objects.

The first adjustment reference object represents a corresponding reference object when adjusting the focal length parameter. In some embodiments, the first reference object includes at least one focus pattern, and the image acquisition device adjusts the focus parameter based on the focus pattern.

The second adjustment reference object is an object referenced when adjusting other image acquisition parameters except the focal length parameter. In some embodiments, the second adjustment reference object is related to the type of image acquisition parameter. For example, when adjusting distortion parameters, the second adjustment reference object is the grid lines on the comprehensive test card. When adjusting color parameters, the second adjustment reference object is each color block on the comprehensive test card.

It should be noted that the second adjustment reference object does not specifically refer to the adjustment reference object corresponding to a certain image acquisition parameter, but is just to distinguish it from the first adjustment reference object. Other reference objects except the adjustment reference object corresponding to the focal length parameter All can be called the second adjustment reference object.

Step 202: Identify the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart, and adjust the focal length parameter based on the position information.

Wherein, the first object image is an image of the first adjustment reference object presented in the initial comprehensive test chart.

It can be understood that the electronic device can locate the image corresponding to the comprehensive test card from the initial comprehensive test chart to obtain the test card image. Then, the position information of the first object image is identified from the test card image. The electronic device may also determine the position conversion relationship between the design drawing of the comprehensive test card and the initial comprehensive test chart, and directly determine the position information of the first object image corresponding to the first adjustment reference object from the initial comprehensive test chart. There is no restriction on this.

In some embodiments, the electronic device can extract features of the design drawing of the comprehensive test chart and the test card image in the initial comprehensive test chart, and perform feature matching to obtain a homography transformation matrix. The electronic device may determine the coordinates of the vertices of the comprehensive test card in the initial comprehensive test graph based on the coordinates of the vertices of the comprehensive test card in the design graph and the homography transformation matrix. Then, by first adjusting the relative position relationship of the reference object in the design drawing of the comprehensive test card, the first object image is determined from the test card image, so as to obtain the position information of the first object image in the initial comprehensive test chart.

In some embodiments, the electronic device can extract features of the design drawing of the comprehensive test card and the test card image in the initial comprehensive test chart through a feature matching algorithm, and perform feature matching to obtain a homography transformation matrix.

It can be understood that the electronic device can analyze the initial comprehensive test chart to determine whether the focal length parameter adjustment process needs to be performed. If so, the focal length parameter adjustment process is performed. If not (that is, it is determined that the focal length parameter adjustment does not need to be performed), the focal length parameter adjustment process is not required. Instead of adjusting the parameters, the next image acquisition parameter (that is, the image acquisition parameter corresponding to the second adjustment reference object) is adjusted.

In some embodiments, the electronic device identifies the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart, and adjusts the focus parameter based on the position information, including: identifying The position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart; based on the position information, determine whether the focal length parameter needs to be adjusted; if so, based on the position information, Adjust the focal length parameter to obtain the adjusted focus parameter; if not, the adjusted focus parameter is the same as the current focus parameter that does not need to be adjusted, that is, no adjustment is made to the current focus parameter, but the Adjustment processing of the next image acquisition parameter (that is, the image acquisition parameter corresponding to the second adjustment reference object).

In some embodiments, the electronic device adjusts the corresponding image acquisition parameters based on the second object image, including: determining whether the corresponding image acquisition parameters need to be adjusted based on the second object image; if so , then the corresponding image acquisition parameters are adjusted based on the second object image to obtain the corresponding processed image acquisition parameters; if not, the corresponding image acquisition parameters that currently do not need to be processed remain unchanged. Change.

In some embodiments, the electronic device can determine whether the focus parameter reaches the sharpness threshold by calculating the sharpness of the first object image in the initial comprehensive test chart. If the sharpness does not reach the sharpness threshold, it is determined that the image acquisition device needs to adjust the focus parameter. adjustment processing. If the sharpness reaches the sharpness threshold, it is determined that the image acquisition device does not need to adjust the focal length parameter.

Among them, clarity is one of the determining factors of image quality. The higher the clarity, the more detailed the image performance. The sharpness threshold is the critical value that characterizes whether an image is clear or not. The size of the sharpness threshold is related to the pixels and resolution of the image acquisition device. Different image acquisition devices have different sharpness thresholds.

Step 203: Control the image acquisition device to collect images of the comprehensive test card based on the adjusted focal length parameter to obtain the target comprehensive test chart.

Among them, the target comprehensive test image is an image obtained by image acquisition of the comprehensive test card after the image acquisition equipment adjusts the focal length parameters. It can be understood that using the adjusted focal length parameter can meet the sharpness requirements of image acquisition, that is, the sharpness reaches the sharpness threshold. Therefore, the target comprehensive test chart is an image obtained by image acquisition of the comprehensive test card by the image acquisition device based on the adjusted focal length parameter. In other words, the clarity of the target comprehensive test chart has reached the sharpness threshold.

Step 204: Identify the second object image corresponding to the second adjustment reference object in the target comprehensive test chart.

Wherein, the second object image is an image of the second adjustment reference object presented in the target comprehensive test chart.

It can be understood that when the electronic device adjusts the image acquisition parameters corresponding to each second adjustment reference object, it first identifies the second object image corresponding to the second adjustment reference object in the target comprehensive test chart, and then uses each image acquisition parameter to The corresponding second object image is used to determine whether the image acquisition parameters meet the requirements. If the requirements are not met, the image acquisition parameters are adjusted based on the second object image. If the requirements are met, it is determined that the image acquisition device does not need to adjust the image acquisition parameters corresponding to the second object image.

Step 205: Adjust the corresponding image acquisition parameters based on the second object image.

Specifically, the electronic device determines whether the image acquisition parameters meet the requirements through the second object image corresponding to each image acquisition parameter. If the requirements are not met, the image acquisition parameters corresponding to the second object image are adjusted. If the requirements are met, it is determined that there is no need to adjust the image acquisition parameters corresponding to the second object image of the image acquisition device. In some embodiments, the electronic device can determine the difference in corresponding image acquisition parameters between the second object image and the second adjustment reference object in the comprehensive test card, and adjust the image acquisition parameters of the image acquisition device based on the difference.

It can be understood that the method of the present application is suitable for image acquisition parameters with corresponding second adjustment reference objects set in the comprehensive test card.

It should be noted that the image acquisition parameters of the corresponding second adjustment reference object are set in the comprehensive test card. When adjusting the image acquisition parameters, steps 204 to 205 can be performed. If the image acquisition parameters of the corresponding second positioning reference object are not set in the comprehensive test card, the image acquisition parameters can be adjusted according to the preset adjustment rules. For example, the exposure time parameter can be adjusted to a preset time range.

In the above image acquisition parameter adjustment method, an initial comprehensive test chart is obtained by acquiring an image acquisition device on a comprehensive test card; the comprehensive test card is provided with a first adjustment reference object and at least one second adjustment reference object; The first adjustment reference object is used to adjust the focal length parameter; each second adjustment reference object is used to adjust the corresponding image acquisition parameter; identify the corresponding first adjustment reference object in the comprehensive comprehensive test chart The position information of the first object image, and adjust the focal length parameter based on the position information; control the image acquisition device to perform image acquisition on the comprehensive test card based on the adjusted focal length parameter to obtain the target comprehensive test chart; identify the first 2. Adjust the second object image corresponding to the reference object in the target comprehensive test chart; adjust the corresponding image acquisition parameters based on the second object image. Adjusting multiple image acquisition parameters through a comprehensive test card avoids frequent replacement of test cards in order to adjust different image acquisition parameters. It not only reduces the difficulty of adjusting image acquisition parameters, but also saves the time of manually adjusting image acquisition parameters and improves efficiency. Adjust image acquisition parameters for efficiency.

In some embodiments, the location information includes coordinates of the first object image in the initial comprehensive test map. The electronic device adjusting the focal length parameter based on the position information includes: adjusting the focal length parameter of the image acquisition device based on the coordinates, so that the image acquisition device focuses on the first adjustment reference object.

It can be understood that the initial comprehensive test image and the first object image are in the same image coordinate system. In some embodiments, determining the coordinates of the first object image in the initial comprehensive test chart is to determine the coordinates of the first object image in the image coordinate system, and then based on the correspondence between the internal coordinate system of the image acquisition device and the image coordinate system relationship to determine the coordinates of the first adjustment reference object in the internal coordinate system.

In some embodiments, adjusting the focal length parameter of the image acquisition device based on coordinates means that the image acquisition device moves the focus point to the coordinates of the first adjustment reference object in the internal coordinate system, that is to say, the first adjustment reference object is the focus subject, When the focus point is accurately aligned with the focus subject, an adjustment of the focal length parameter is completed.

Among them, the image coordinate system is a coordinate system with the center of the image plane as the coordinate origin, the X axis and the Y axis being parallel to the two vertical sides of the image plane respectively, and (x, y) representing its coordinate value.

Among them, the internal coordinate system takes the optical center of the image acquisition device as the coordinate origin. The X-axis and Y-axis are parallel to the X-axis and Y-axis of the image coordinate system respectively. The optical axis of the image acquisition device is the Z-axis. Use (Xc, Yc ,Zc) represents its coordinate value.

It can be understood that through the projection mapping relationship between the internal coordinate system and the image coordinate system, the coordinates of the first adjustment reference object in the internal coordinate system can be determined. In other embodiments, adjusting the focal length parameter of the image acquisition device is by slowly moving the focus point of the image acquisition device so that the focus point is aligned with the first adjustment reference object.

In the above embodiment, the focal length parameter is adjusted based on the coordinates of the first object image in the initial comprehensive test chart, which is simple and efficient.

In some embodiments, adjusting the focal length parameter of the image acquisition device based on the coordinates so that the image acquisition device focuses on the first adjustment reference object includes: the electronic device controls the image acquisition device to gradually adjust the focus of the image acquisition device multiple times based on the coordinates. parameters, and collect images of the comprehensive test card based on the focal length parameters after each adjustment, and obtain multiple candidate images after multiple focal length adjustments; the electronic device calculates the clarity of the image corresponding to the first adjustment reference object in each candidate image. degree; determining the focal length parameter corresponding to the candidate picture with the highest definition among the plurality of candidate pictures as the focal length parameter after focusing on the first adjustment reference object.

Among them, the candidate image is the image obtained by collecting the image of the comprehensive test card after the image acquisition device adjusts the focal length parameter each time. It can be understood that the number of candidate images is related to the number of adjustments to the focal length parameter.

In some embodiments, after each adjustment of the focal length parameter of the image acquisition device, the image acquisition device will re-acquire images of the comprehensive test card to obtain candidate images, and then calculate the first adjustment in the candidate images through the image sharpness evaluation function Referring to the sharpness of the reference object, when the sharpness is greater than the sharpness threshold, the focal length parameter corresponding to the sharpness is determined to be the focal length parameter after focusing on the first adjusted reference object. When the sharpness is less than the sharpness threshold, the focus point coordinates of the image acquisition device are adjusted multiple times, and the sharpness of the candidate image obtained each time is calculated until the sharpness of the candidate image is greater than the sharpness threshold. The focal length parameter corresponding to the candidate image that meets the sharpness threshold is determined as the focal length parameter after focusing on the first adjustment reference object.

In some embodiments, the electronic device calculates the sharpness of a limited number of candidate images, and selects the focal length parameter corresponding to the candidate image with the highest definition as the focal length parameter after focusing on the first adjustment reference object. It can be understood that the purpose of selecting a limited number of candidate images is to save adjustment time and avoid repeatedly adjusting the focal length parameter, which affects the adjustment of other image acquisition parameters.

In the above embodiment, by adjusting the focal length parameter of the image acquisition device multiple times, the focal length parameter corresponding to the highest definition of the candidate image is determined as the focal length parameter after focusing on the first adjustment reference object, and the accuracy of the obtained focal length parameter is higher.

In some embodiments, the first adjustment reference object is a plurality of reference patterns with different shapes and sharpness greater than the sharpness threshold; respectively calculating the sharpness of the image corresponding to the first adjustment reference object in each candidate image includes: For each candidate image, calculate the edge gradient of each reference pattern in each candidate image; based on the edge gradient, determine the clarity of the image corresponding to each reference pattern in the corresponding candidate image.

Among them, sharpness is an indicator that reflects the sharpness of image edges. The sharpness of image edges is positively related to the size of the sharpness value.

Among them, the sharpness threshold is a critical value indicating that the sharpness of the reference pattern reaches the required sharpness requirement.

In some embodiments, a plurality of reference patterns with different shapes and sharpness greater than the sharpness threshold (ie, sharp edges) are selected as the first adjustment reference objects. When adjusting the focal length parameter, after aligning the focus with the reference pattern, the image acquisition device collects images of the comprehensive test card to obtain candidate images.

Among them, the edge gradient is the gradient value of the edge of the image, which is used to characterize the speed of the edge change of the image.

In some embodiments, the electronic device calculates the edge gradient of each reference pattern in the candidate image by calling the image sharpness evaluation function. When the edge gradient is greater than the preset gradient value, it indicates that the edge change of each reference pattern is the most significant, that is to say, the candidate The image has met the clarity requirements.

The reference pattern is a pattern that the image acquisition device refers to when adjusting the focal length parameter. It can be understood that the purpose of adjusting the focal length parameter of the image acquisition device is to obtain a high-definition image. Each time the focal length parameter is adjusted, the sharpness of the candidate image needs to be calculated, and the sharpness is positively related to the edge gradient. In order to facilitate the calculation of the sharpness of the candidate image, a reference pattern with sharp edges (that is, the sharpness is greater than the sharpness threshold) is selected as the first adjustment reference object.

In the above embodiment, the sharpness of each candidate image is determined by calculating the edge gradient corresponding to each reference pattern in the candidate image, which is convenient and simple.

In some embodiments, adjusting the corresponding image acquisition parameters based on the second object image includes: the electronic device determines the corresponding image acquisition parameter based on the difference between the second object image and the second adjustment reference object in the comprehensive test card. Correction matrix for image acquisition parameters; based on the correction matrix, the image acquisition parameters are adjusted.

Among them, the correction matrix is a matrix used to correct image acquisition parameters. The correction matrix includes, but is not limited to, a white balance correction matrix for white balance parameters and a color correction matrix for color parameters.

In some embodiments, whether there is a difference in the same image acquisition parameter corresponding to the second object image and the second adjustment reference object is compared. When there is a difference, the corresponding image acquisition parameters are adjusted based on the correction matrix. When there is no difference, there is no need to adjust the corresponding image acquisition parameters.

In some embodiments, the electronic device compares whether there is a difference in color values between the white balance color patch in the comprehensive test chart and the second object image. The second object image is an image in which the white balance color patch appears in the target comprehensive test chart. When there is a difference, the white balance correction matrix is determined from the white balance color patch in the comprehensive test chart and the second object image. When there is no difference, there is no need to adjust the white balance parameters.

In some embodiments, the electronic device compares whether there is a difference in the average value of the color values of the multiple color correction color patches in the comprehensive test card and the second object image. The second object image is the multiple color correction color patches in the target comprehensive test. The image presented in the figure. When there is a difference, the color correction matrix is determined from the plurality of color correction color patches in the comprehensive test card and the second object image. When there is no difference, there is no need to adjust the color parameters.

In the above embodiment, the image acquisition parameters are adjusted based on the correction matrix with high accuracy.

In some embodiments, at least one second adjustment reference object includes a white balance adjustment color block; the second object image includes a white balance color block diagram in the target comprehensive test chart; and the electronic device is based on the second object image and the comprehensive test chart. The second adjustment refers to the difference in the corresponding image acquisition parameters of the reference object. Determining the correction matrix for the image acquisition parameters includes: determining the first color average value of the pixels in the center area of the white balance color block diagram; determining the white color in the comprehensive test card. Balance adjusts the second color average value of the pixels in the central area of the color patch; determines a white balance correction matrix for the white balance parameter based on the difference between the first color average value and the second color average value.

In some embodiments, the electronic device determines the difference in white balance parameters corresponding to the second object image and the second adjustment reference object, and when there is a difference, determines the white balance correction based on the first color average and the second color average. matrix. It can be understood that the second object image in this embodiment is a white balance color patch map, and the second adjustment reference object is a white balance adjustment color patch.

In some embodiments, the electronic device calculates the average of the red, green, and blue channel values of each pixel in the central area of the white balance color patch map, that is, the first color average. Calculate the average value of the red, green, and blue channel values of each pixel in the central area of the white balance adjustment color block, that is, the second color average value. When there is a difference between the first color average value and the second color average value, an adjustment parameter between the first color average value and the second color average value is determined. For example, the average value of the red, green, and blue channel values of each pixel in the central area of the white balance color patch is divided by the average value of the red, green, and blue channel values of each pixel in the central area of the white balance adjustment color patch, that is, The red channel value adjustment ratio is obtained by dividing the average red channel value of each pixel in the center area of the white balance color patch map by the average red channel value of each pixel in the center area of the white balance color patch map. The same method can be used to obtain the green channel value adjustment ratio and the blue channel value adjustment ratio, and finally obtain the red, green, and blue channel value adjustment matrix, that is, the white balance correction matrix.

In the above embodiment, the white balance correction matrix is obtained through the first color average and the second color average, and the white balance parameters are adjusted through the white balance matrix, which is both efficient and accurate.

In some embodiments, at least one second adjustment reference object includes a plurality of color correction color patches; the second object image includes a plurality of color correction color patch images in the target comprehensive test image; the electronic device is based on the second object image and The second adjustment in the comprehensive test card refers to the difference in the corresponding image acquisition parameters of the reference object. Determining the correction matrix for the image acquisition parameters includes: determining the color values of multiple color correction color patch diagrams respectively; combining the multiple color correction color patch diagrams. The color values are compared with the color values of the corresponding color correction color blocks in the comprehensive test card; a color correction matrix for color parameters is generated based on the difference comparison results.

In some embodiments, the electronic device determines a difference between the color values in the color correction patch diagram and the color values in the color correction patch. When there is a difference, a color correction matrix is generated based on the color values of the color correction color patch diagram and the color values of the color correction color patch.

In some embodiments, the generation of the color correction matrix is described by taking six color correction color patches as an example. It can be understood that the color correction color patch diagram is an image of the color correction color patches presented in the target comprehensive test chart, so the color patches in the color correction color patch diagram correspond to the color correction color patches one-to-one.

In some embodiments, the electronic device calculates the red, green, and blue channel values of the six color correction color patches, and calculates the red, green, and blue channel values of the six color patches in the color correction color patch map. Compare the red, green, and blue channel values of the color blocks of the same color in the color correction color block diagram and the red, green, and blue channel values in the color correction color block in turn to obtain the difference in color values. If there is a difference in color, a color correction matrix is generated based on the red, green, and blue channel values of the color block of the same color in the color correction color block diagram, and the red, green, and blue channel values in the color correction color block.

In the above embodiment, a color correction matrix is generated based on the red, green, and blue channel values of each color correction color block in the comprehensive test card, and based on the red, green, and blue channel values of each color correction color block in the color correction color block diagram, that is, Efficient and accurate.

It should be understood that although the steps in the flowcharts involved in the above-mentioned embodiments are shown in sequence as indicated by the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated in this article, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least some of the steps in the flowcharts involved in the above embodiments may include multiple steps or stages. These steps or stages are not necessarily executed at the same time, but may be completed at different times. The execution order of these steps or stages is not necessarily sequential, but may be performed in turn or alternately with other steps or at least part of the steps or stages in other steps.

In some embodiments, the present application also provides a comprehensive test card, which includes a card body; a first adjustment reference object and at least one second adjustment reference object are provided on the surface of the card body; the first adjustment reference object The object is the reference object used to adjust the focus parameters.

In some embodiments, the first adjustment reference object includes a plurality of reference patterns with different shapes and sharpness greater than the sharpness threshold; the second adjustment reference object includes at least one of a white balance adjustment color patch and a color correction color patch. .

In some embodiments, the comprehensive test card also includes an identification code and a blank area; the identification code is used to identify the identity information of the comprehensive test card; the blank area is used to fill in target information, and the target information represents the need information filled in.

In some embodiments, as shown in Figure 3, a schematic diagram of a comprehensive test card is provided.

The following is a detailed description of the comprehensive test card.

The comprehensive test card includes a white balance adjustment color block 301 (i.e., the second adjustment reference object), a reference pattern 302 (i.e., the first adjustment reference object), a color correction color block 303 (i.e., the second adjustment reference object), an identification code 304, and Blank area (not shown in the figure).

Among them, the white balance adjustment color block 301 is used to adjust the white balance parameters. It can be understood that, in order to facilitate white balance adjustment, the area of the white balance adjustment color patch 301 may be several times the area of the remaining reference patterns. The specific size of the white balance adjustment color block 301 is not limited.

Among them, the reference pattern 302 includes at least one pattern whose sharpness is greater than the sharpness threshold (i.e., the edge is sharp), and the reference pattern 302 is used to adjust the focal length parameter. It can be understood that there are many patterns whose sharpness is greater than the sharpness threshold, so the shape and number of the reference patterns can be selected according to requirements.

It should be noted that the number and shape of the reference patterns 302 are not limited to those shown in FIG. 3 . This embodiment only illustrates the reference patterns and is not used to limit the present application.

Among them, the color correction color block 303 is used to adjust color parameters. It can be understood that, considering the difficulty of obtaining the color correction color block 303, a variety of colors with relatively simple manufacturing processes are selected from the standard color card as the color correction color block 303. The color and quantity of the color correction color block 303 can be selected according to needs. .

In some embodiments, emerald green, deep red, orange, lake blue, lemon yellow and purple can be selected from the standard color card as the color correction color block 303 . It is also possible to select red, orange, titanium white, sky blue, and light green from the standard color card as the color correction color block 303 . You can also select purple, orange, light yellow, ultramarine, black, or purple from the standard color card as the color correction color block 303 .

It should be noted that the color and quantity of the color correction color blocks can be selected according to requirements. This embodiment only illustrates the color correction color blocks and is not intended to limit the present application.

Among them, the identification code 304 is used to identify the identity information of the comprehensive test card. Identity information includes but is not limited to the model and size of the comprehensive test card, etc.

The blank area is a blank area in the comprehensive test card, used for filling in target information, and the target information represents the information that needs to be filled in. For example, target information includes but is not limited to logos and barcodes.

It can be understood that the white balance adjustment color patch 301 (i.e., the second adjustment reference object), the color correction color patch 303 (i.e., the second adjustment reference object), and the reference pattern 302 (i.e., the first adjustment reference object) in the comprehensive test card shown in Figure 3 The order of arrangement of the reference object) and the identification code 304 is not fixed, and can be randomly combined and arranged. In addition, the size of the comprehensive test card can be determined according to requirements, and is not limited in this embodiment.

In the above embodiment, a comprehensive test card is provided that can adjust image acquisition parameters such as white balance parameters, color parameters, and focal length parameters. This avoids frequent replacement of test cards in order to adjust different image acquisition parameters, which not only reduces the cost of adjusting image acquisition parameters, saves the time of manually adjusting image acquisition parameters, and improves adjustment efficiency.

Based on the same inventive concept, embodiments of the present application also provide an image acquisition parameter adjustment device for implementing the above-mentioned image acquisition parameter adjustment method. The implementation solution provided by this device to solve the problem is similar to the implementation solution recorded in the above method. Therefore, the specific limitations in the one or more image acquisition parameter adjustment device embodiments provided below can be found in the image acquisition parameter adjustment above. The limitations of the method will not be repeated here.

In some embodiments, as shown in Figure 4, an image acquisition parameter adjustment system is provided. The image acquisition parameter adjustment system includes an image acquisition device 101, a comprehensive test card 102, and an image acquisition parameter adjustment device. The image acquisition parameter adjustment device is connected to the image acquisition device 101, and the image acquisition device 101 is connected to the comprehensive test card 102 held. The image acquisition parameter adjustment device includes: an acquisition module 401, an identification module 402, and an adjustment module 403.

The acquisition module 401 is used to acquire the initial comprehensive test chart obtained by image acquisition of the comprehensive test card by the image acquisition device; the comprehensive test card is provided with a first adjustment reference object and at least one second adjustment reference object; the first adjustment reference object Used to adjust the focal length parameters; each second adjustment reference object is used to adjust the corresponding image acquisition parameters.

The identification module 402 is used to identify the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart, and adjust the focal length parameter based on the position information; control the image acquisition device to perform the comprehensive test based on the adjusted focal length parameter. The card performs image acquisition and obtains the target comprehensive test chart.

The adjustment module 403 is used to identify the second object image corresponding to the second adjustment reference object in the target comprehensive test chart; and adjust the corresponding image acquisition parameters based on the second object image.

In some embodiments, the identification module 402 is used to adjust the focal length parameter of the image acquisition device based on the coordinates, so that the image acquisition device focuses on the first adjustment reference object.

In some embodiments, as shown in Figure 5, a structural block diagram of the identification module 402 is provided, specifically including an adjustment unit 4021, a calculation unit 4022 and a determination unit 4023.

The adjustment unit 4021 is used to gradually adjust the focal length parameters of the image acquisition device multiple times based on coordinates, and perform image acquisition on the comprehensive test card based on the focal length parameters after each adjustment, to obtain multiple candidate images after multiple focal length adjustments.

The calculation unit 4022 is used to respectively calculate the sharpness of the image corresponding to the first adjustment reference object in each candidate image.

The determination unit 4023 is configured to determine the focal length parameter corresponding to the candidate picture with the highest definition among the plurality of candidate pictures as the focal length parameter after focusing on the first adjustment reference object.

In some embodiments, the recognition module 402 is specifically configured to calculate, for each candidate image, the edge gradient of each reference pattern in each candidate image; based on the edge gradient, determine the edge gradient of each reference pattern in the corresponding candidate image. Clarity.

In some embodiments, the adjustment module 403 is used to determine a correction matrix for the image acquisition parameters based on the difference in corresponding image acquisition parameters between the second object image and the second adjustment reference object in the comprehensive test card; based on the correction matrix, Adjust image acquisition parameters.

In some embodiments, the adjustment module 403 is specifically configured to determine the first color average of the pixels in the central area of the white balance color block diagram; determine the second color average of the pixels in the central area of the white balance adjustment color block in the comprehensive test card. value; determine a white balance correction matrix for the white balance parameter based on the difference between the first color average and the second color average.

In some embodiments, the adjustment module 403 is further configured to determine the color values of multiple color correction color patch diagrams respectively; compare the color values of the multiple color correction color patch diagrams with the corresponding color correction color patch values in the comprehensive test card. Color values are compared for differences; a color correction matrix for color parameters is generated based on the difference comparison results.

Each module in the above image acquisition parameter adjustment device can be realized in whole or in part by software, hardware and combinations thereof. Each of the above modules can be embedded in or independent of the processor in the electronic device in the form of hardware, or can be stored in the memory of the electronic device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

In some embodiments, an electronic device is provided. The electronic device may be a server, and its internal structure diagram may be as shown in FIG. 6 . The electronic device includes a processor, memory and network interface connected via a system bus. Among them, the processor of the electronic device is used to provide computing and control capabilities. The memory of the electronic device includes non-volatile storage media and internal memory. The non-volatile storage medium stores operating systems, computer programs and databases. This internal memory provides an environment for the execution of operating systems and computer programs in non-volatile storage media. The network interface of the electronic device is used to communicate with an external terminal through a network connection. The computer program implements an image acquisition parameter adjustment method when executed by a processor.

Those skilled in the art can understand that the structure shown in Figure 6 is only a block diagram of a partial structure related to the solution of the present application, and does not constitute a limitation on the electronic equipment to which the solution of the present application is applied. Specific electronic devices can May include more or fewer parts than shown, or combine certain parts, or have a different arrangement of parts.

In some embodiments, an electronic device is provided, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, it implements the steps in the above method embodiments.

In some embodiments, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage. In the media, when executed, the computer program may include the processes of the above method embodiments. Any reference to memory, database or other media used in the embodiments provided in this application may include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive memory (ReRAM), magnetic variable memory (Magnetoresistive Random Access Memory (MRAM), ferroelectric memory (Ferroelectric Random Access Memory, FRAM), phase change memory (Phase Change Memory, PCM), graphene memory, etc. Volatile memory may include random access memory (Random Access Memory, RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in many forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM). The databases involved in the various embodiments provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include blockchain-based distributed databases, etc., but are not limited thereto. The processors involved in the various embodiments provided in this application may be general-purpose processors, central processing units, graphics processors, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to this.

The technical features of the above embodiments can be combined in any way. To simplify the description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, all possible combinations should be used. It is considered to be within the scope of this manual.

The above-described embodiments only express several implementation modes of the present application, and their descriptions are relatively specific and detailed, but should not be construed as limiting the patent scope of the present application. It should be noted that, for those of ordinary skill in the art, several modifications and improvements can be made without departing from the concept of the present application, and these all fall within the protection scope of the present application. Therefore, the scope of protection of this application should be determined by the appended claims.

Claims (15)

1. An image acquisition parameter adjustment method, characterized by including:

   Obtain the initial comprehensive test chart obtained by image acquisition of the comprehensive test card by the image acquisition device; the comprehensive test card is provided with a first adjustment reference object and at least one second adjustment reference object; the first adjustment reference object is used for Adjust the focal length parameters; each second adjustment reference object is used to adjust the corresponding image acquisition parameters;

   Identify the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart, and adjust the focal length parameter based on the position information;

   Control the image acquisition device to collect images of the comprehensive test card based on the adjusted focal length parameter to obtain the target comprehensive test chart;

   Identify the second object image corresponding to the second adjustment reference object in the target comprehensive test chart;

   Corresponding image acquisition parameters are adjusted based on the second object image.
2. The method according to claim 1, wherein the position information includes the coordinates of the first object image in the initial comprehensive test chart;

   The adjustment of focal length parameters based on the position information includes:

   Based on the coordinates, a focal length parameter of the image acquisition device is adjusted so that the image acquisition device focuses on the first adjustment reference object.
3. The method of claim 2, wherein adjusting the focal length parameter of the image acquisition device based on the coordinates includes:

   Step by step adjust the focal length parameter of the image acquisition device multiple times based on the coordinates, and perform image acquisition on the comprehensive test card based on the focal length parameter after each adjustment to obtain multiple candidate images after multiple focal length adjustments;

   Calculate respectively the sharpness of the image corresponding to the first adjustment reference object in each of the candidate images;

   The focal length parameter corresponding to the candidate picture with the highest definition among the plurality of candidate pictures is determined as the focal length parameter after focusing on the first adjustment reference object.
4. The method according to claim 3, characterized in that the first adjustment reference object is a plurality of reference patterns with different shapes and sharpness greater than a sharpness threshold;

   The separately calculating the sharpness of the image corresponding to the first adjustment reference object in each of the candidate images includes:

   For each candidate image, calculate the edge gradient of each reference pattern in each candidate image;

   Based on the edge gradient, the sharpness of the image corresponding to each reference pattern in the corresponding candidate image is determined.
5. The method according to any one of claims 1 to 4, characterized in that the adjustment of corresponding image acquisition parameters based on the second object image includes:

   Based on the difference in corresponding image acquisition parameters between the second object image and the second adjustment reference object in the comprehensive test card, determine a correction matrix for the image acquisition parameters;

   Based on the correction matrix, the image acquisition parameters are adjusted.
6. The method of claim 5, wherein the at least one second adjustment reference object includes a white balance adjustment color patch; the second object image includes a white balance color patch in the target comprehensive test image. picture;

   Determining a correction matrix for the image acquisition parameters based on the difference in corresponding image acquisition parameters between the second object image and the second adjustment reference object in the comprehensive test card includes:

   Determining a first color average value of pixels in the central area of the white balance color patch map;

   Determine the second color average value of the pixels in the central area of the white balance adjustment color block in the comprehensive test card;

   A white balance correction matrix for a white balance parameter is determined based on the difference between the first color average and the second color average.
7. The method of claim 5, wherein the at least one second adjustment reference object includes a plurality of color correction color blocks; the second object image includes a plurality of colors in the target comprehensive test chart. Corrected color block diagram;

   Determining a correction matrix for the image acquisition parameters based on the difference in corresponding image acquisition parameters between the second object image and the second adjustment reference object in the comprehensive test card includes:

   Determine the color values of the plurality of color correction color block diagrams respectively;

   Compare the color values of the plurality of color correction color block diagrams with the color values of the corresponding color correction color blocks in the comprehensive test card;

   Based on the difference comparison results, a color correction matrix for color parameters is generated.
8. The method according to claim 1, characterized in that the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart is identified, and the focal length parameter is determined based on the position information. Adjustments include:

   Identify the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart;

   Based on the position information, determine whether the focal length parameter needs to be adjusted;

   If so, adjust the focus parameter based on the position information to obtain the adjusted focus parameter;

   If not, the adjusted focus parameter is the same as the focus parameter that currently does not need to be adjusted.
9. The method according to claim 1, characterized in that the adjustment of corresponding image acquisition parameters based on the second object image includes:

   Based on the second object image, determine whether corresponding image acquisition parameters need to be adjusted;

   If yes, adjust the corresponding image acquisition parameters based on the second object image to obtain the corresponding processed image acquisition parameters;

   If not, the corresponding image acquisition parameters that currently do not need to be processed remain unchanged.
10. An image acquisition parameter adjustment system, including image acquisition equipment, a comprehensive test card and an image acquisition parameter adjustment device, which is characterized by:

    The image acquisition parameter adjustment device is connected to the image acquisition equipment, and the image acquisition equipment is connected to the comprehensive test card held;

    The image acquisition parameter adjustment device includes:

    An acquisition module, configured to acquire an initial comprehensive test chart obtained by collecting images of the comprehensive test card by the image acquisition device; the comprehensive test card is provided with a first adjustment reference object and at least one second adjustment reference object; The first adjustment reference object is used to adjust the focal length parameter; each second adjustment reference object is used to adjust the corresponding image acquisition parameter;

    An identification module for identifying the position information of the first object image corresponding to the first adjustment reference object in the initial comprehensive test chart, and adjusting the focal length parameter based on the position information; controlling the image acquisition device based on the adjustment The final focal length parameter is used to collect images of the comprehensive test card to obtain the target comprehensive test chart;

    An adjustment module, configured to identify the second object image corresponding to the second adjustment reference object in the target comprehensive test chart; and adjust the corresponding image acquisition parameters based on the second object image.
11. The image acquisition parameter adjustment system according to claim 10, characterized in that:

    The comprehensive test card includes a card body;

    The first adjustment reference object and the at least one second adjustment reference object are provided on the surface of the card body.
12. The image acquisition parameter adjustment system according to claim 11, wherein the first adjustment reference object includes a plurality of reference patterns with different shapes and sharpness greater than a sharpness threshold; the second adjustment reference object includes At least one of a white balance adjustment patch and a color correction patch.
13. The comprehensive test card according to claim 11, characterized in that the comprehensive test card further includes an identification code and a blank area; the identification code is used to identify the identity information of the comprehensive test card; the blank area is used to fill in Target information, which represents the information that needs to be filled in.
14. An electronic device includes a memory and a processor, the memory stores a computer program, and is characterized in that when the processor executes the computer program, the steps of the method described in any one of claims 1 to 9 are implemented.
15. A computer-readable storage medium with a computer program stored thereon, characterized in that when the computer program is executed by a processor, the steps of the method described in any one of claims 1 to 9 are implemented.

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