WO2024005798A1 - Système sur puce comprenant un module de diagnostic - Google Patents

Système sur puce comprenant un module de diagnostic Download PDF

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Publication number
WO2024005798A1
WO2024005798A1 PCT/US2022/035388 US2022035388W WO2024005798A1 WO 2024005798 A1 WO2024005798 A1 WO 2024005798A1 US 2022035388 W US2022035388 W US 2022035388W WO 2024005798 A1 WO2024005798 A1 WO 2024005798A1
Authority
WO
WIPO (PCT)
Prior art keywords
soc
integrated circuit
machine learning
anomaly
computer
Prior art date
Application number
PCT/US2022/035388
Other languages
English (en)
Inventor
Peter Robertson
Original Assignee
Siemens Industry Software Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Industry Software Inc. filed Critical Siemens Industry Software Inc.
Priority to PCT/US2022/035388 priority Critical patent/WO2024005798A1/fr
Publication of WO2024005798A1 publication Critical patent/WO2024005798A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning

Abstract

L'invention concerne un système sur puce (SoC). Le SoC comprend un circuit intégré, un moniteur analytique intégré configuré pour générer des données analytiques par surveillance d'une ou plusieurs interactions à l'intérieur du circuit intégré, et un module de diagnostic comprenant un algorithme d'apprentissage automatique entraîné pour détecter une anomalie dans les données analytiques indiquant une condition de défaut du circuit intégré.
PCT/US2022/035388 2022-06-28 2022-06-28 Système sur puce comprenant un module de diagnostic WO2024005798A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/US2022/035388 WO2024005798A1 (fr) 2022-06-28 2022-06-28 Système sur puce comprenant un module de diagnostic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2022/035388 WO2024005798A1 (fr) 2022-06-28 2022-06-28 Système sur puce comprenant un module de diagnostic

Publications (1)

Publication Number Publication Date
WO2024005798A1 true WO2024005798A1 (fr) 2024-01-04

Family

ID=82702989

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2022/035388 WO2024005798A1 (fr) 2022-06-28 2022-06-28 Système sur puce comprenant un module de diagnostic

Country Status (1)

Country Link
WO (1) WO2024005798A1 (fr)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080040089A1 (en) * 2006-07-18 2008-02-14 Wendemagagnehu Beyene Efficient Characterization of High-Speed Circuits
US20080141072A1 (en) * 2006-09-21 2008-06-12 Impact Technologies, Llc Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life
US20170031792A1 (en) * 2014-04-16 2017-02-02 Siemens Aktiengesellschaft Transferring failure samples using conditional models for machine condition monitoring
US20200125959A1 (en) * 2019-12-19 2020-04-23 Intel Corporation Autoencoder Neural Network for Signal Integrity Analysis of Interconnect Systems
EP3849108A1 (fr) * 2020-01-10 2021-07-14 Nokia Technologies Oy Appareil, procédé et système pour la fourniture d'une estimation de l'état d'un dispositif
CN113570070A (zh) * 2021-09-23 2021-10-29 深圳市信润富联数字科技有限公司 流式数据采样与模型更新方法、装置、系统与存储介质
CN113687209A (zh) * 2021-07-15 2021-11-23 上海华岭集成电路技术股份有限公司 基于深度学习的集成电路测试异常分析系统及其方法
CN114660443A (zh) * 2022-05-24 2022-06-24 南京宏泰半导体科技有限公司 一种基于机器学习的集成电路ate自动复测系统及方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080040089A1 (en) * 2006-07-18 2008-02-14 Wendemagagnehu Beyene Efficient Characterization of High-Speed Circuits
US20080141072A1 (en) * 2006-09-21 2008-06-12 Impact Technologies, Llc Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life
US20170031792A1 (en) * 2014-04-16 2017-02-02 Siemens Aktiengesellschaft Transferring failure samples using conditional models for machine condition monitoring
US20200125959A1 (en) * 2019-12-19 2020-04-23 Intel Corporation Autoencoder Neural Network for Signal Integrity Analysis of Interconnect Systems
EP3849108A1 (fr) * 2020-01-10 2021-07-14 Nokia Technologies Oy Appareil, procédé et système pour la fourniture d'une estimation de l'état d'un dispositif
CN113687209A (zh) * 2021-07-15 2021-11-23 上海华岭集成电路技术股份有限公司 基于深度学习的集成电路测试异常分析系统及其方法
CN113570070A (zh) * 2021-09-23 2021-10-29 深圳市信润富联数字科技有限公司 流式数据采样与模型更新方法、装置、系统与存储介质
CN114660443A (zh) * 2022-05-24 2022-06-24 南京宏泰半导体科技有限公司 一种基于机器学习的集成电路ate自动复测系统及方法

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