WO2023134792A3 - Led lamp wick defect detection method - Google Patents

Led lamp wick defect detection method Download PDF

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Publication number
WO2023134792A3
WO2023134792A3 PCT/CN2023/086006 CN2023086006W WO2023134792A3 WO 2023134792 A3 WO2023134792 A3 WO 2023134792A3 CN 2023086006 W CN2023086006 W CN 2023086006W WO 2023134792 A3 WO2023134792 A3 WO 2023134792A3
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WO
WIPO (PCT)
Prior art keywords
led lamp
obtaining
image
defect detection
binary image
Prior art date
Application number
PCT/CN2023/086006
Other languages
French (fr)
Chinese (zh)
Other versions
WO2023134792A2 (en
Inventor
周皓
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苏州迈创信息技术有限公司
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Application filed by 苏州迈创信息技术有限公司 filed Critical 苏州迈创信息技术有限公司
Publication of WO2023134792A2 publication Critical patent/WO2023134792A2/en
Publication of WO2023134792A3 publication Critical patent/WO2023134792A3/en

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/136—Segmentation; Edge detection involving thresholding
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/762—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using clustering, e.g. of similar faces in social networks
    • G06V10/763—Non-hierarchical techniques, e.g. based on statistics of modelling distributions
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

Abstract

The present invention relates to the technical field of image processing, in particular to an LED lamp wick defect detection method. The method comprises: collecting a LED lamp wick image having a plurality of LED lamps, clustering the obtained LED lamp wick image on the basis of gray value, and obtaining highlight areas in the LED lamp wick image; determining sub-areas of individual LED lamp wicks according to the highlight areas; obtaining an initial segmentation threshold corresponding to each sub-area, obtaining an initial binary image according to the initial segmentation threshold, on the basis of the initial binary image, obtaining a gradient value of edge pixel points and a segmentation area of the LED lamp wicks, and constructing an adjustment target function; on the basis of the adjustment target function, obtaining a final segmentation threshold of each sub-area by using a simulated annealing algorithm; obtaining a final binary image by means of a final segmentation threshold value; and performing template image matching on the final binary image and a standard binary image, so as to complete defect detection of the LED lamp wicks. In the invention, the precision of defect detection is improved by means of local threshold segmentation.
PCT/CN2023/086006 2022-12-15 2023-04-03 Led lamp wick defect detection method WO2023134792A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202211611872.2A CN115601367B (en) 2022-12-15 2022-12-15 LED lamp wick defect detection method
CN202211611872.2 2022-12-15

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WO2023134792A2 WO2023134792A2 (en) 2023-07-20
WO2023134792A3 true WO2023134792A3 (en) 2023-09-07

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Family Applications (1)

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PCT/CN2023/086006 WO2023134792A2 (en) 2022-12-15 2023-04-03 Led lamp wick defect detection method

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CN (1) CN115601367B (en)
LU (1) LU504271B1 (en)
WO (1) WO2023134792A2 (en)

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WO2023134792A2 (en) 2023-07-20
CN115601367A (en) 2023-01-13
CN115601367B (en) 2023-04-07
LU504271B1 (en) 2023-07-31

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