WO2023117188A1

WO2023117188A1 - Electronics test bench system

Info

Publication number: WO2023117188A1
Application number: PCT/EP2022/080191
Authority: WO
Inventors: Ronald GREINER
Original assignee: Ams-Osram Ag
Priority date: 2021-12-22
Filing date: 2022-10-28
Publication date: 2023-06-29

Abstract

An electronics test bench system (100) comprising: a frame (101) and a top plate (102) removably coupled to the frame (101) with a hinged connection (103), the top plate (102) configured to receive a device under test, DUT, thereon and the top plate (102) defining a plurality of openings (201) having the same size; a plurality of adapters (301), each adapter secured to an underside of the top plate (102) and comprising a plug and at least one socket, the plugs of respective adapters (301) having the same size, each plug being received in a respective one of the same sized plurality of openings (201) of the top plate (102) and being configured to connect to the DUT; and a plurality of connector cables (501), each cable connected at one end to a respective socket of an adapter (301) and at another end to an item of test equipment (302) to connect the item of test equipment (302) to the DUT through the plurality of adapters (301).

Description

Electronics Test Bench System

Field

The present disclosure relates to an electronics test bench system and kit of parts for assembly into such a system.

Background

Electronics test benches are used in the manufacturing of various electronics including semiconductor devices, printed circuit boards, semiconductor chips and the like. They are often desktop sized devices positioned on a lab bench to provide a place to safely put a device under test (DUT) while carrying out various tests and diagnostics on it using one or more items of test equipment such as oscilloscopes and the like. Typically, the user will be expected to test many duplicates of the same type of DUT from a given production batch as part of quality control.

In known electronics test benches, the DUT (for example one or more chips and the printed circuit board, PCB, they may be mounted to) may be held in a raised position by a frame allowing the user to place the one or more items of test equipment in the vicinity of the DUT. The user then connects the one or more items of test equipment using connecting cables to the DUT, typically securing the plug or socket of the connecting cable to the DUT using one or more screws. If there are many items of test equipment and/or many connecting cables, it can be cumbersome and time-consuming to connect the DUT to the items of test equipment. Once the DUT is finally connected, the user can then safely test it.

Once the testing of one DUT is complete, the user has to individually unscrew the plugs or sockets of the connecting cables from the tested DUT, and replace it with a the next, untested DUT by again individually screwing the plugs or sockets of the cables to the DUT.

If the user has to test many DUTs, this disconnecting and reconnecting is cumbersome and time consuming. Summary

In general terms, the present disclosure overcomes the above and other problems by providing a modular test bench with a top plate having a plurality of the same sized openings thereon and adapters which at one end all have an identically sized plug or socket type to fit into the plurality of identical openings. The surface of the top plate is thereby provided with a plurality of identical, standardised plugs or sockets held stationary by the top plate allowing a user to very rapidly, sequentially test many devices under test (DUT) because the placing of the DllTs on the test bench and the taking of the DllTs off the test bench does not require the separate securing of any of the connectors cables of an item or items of test equipment (such as oscilloscopes and the like) directly to the DUT. Instead, the user only has set up the test bench once by connecting the connectors of the test equipment to the adapters which remain in place, connected to and secured to the top plate of the test bench.

When the user is testing many of the same DUTs with the same arrangement of plugs or sockets thereon, the test bench of the present disclosure saves the user significant amounts of time because the user does not need to manually, disconnect each test equipment connector separately and reconnect them all again separately to the next DUT. Rather, they simply place the DUT on top of the top plate, which is initially set up with the plugs or sockets in the desired configuration. When placing a DUT on the top plate, the user simply has to lightly press down on the DUT to push its plugs or sockets into those of the adapters received through the top plate. When removing a DUT from the top plate, the user simply has to lift the DUT up to disconnect it from the plugs or sockets of the adapters. There is no need to separately secure the connectors of items of test equipment directly to the DUTs because these are instead connected to the adapters, which all remain in place during DUT testing, thereby reducing the risk of user error.

Further, advantageously, once testing of one type of DUT is complete, because the adapters and openings of the top plate are all the same size it is straightforward for the user to move an adapter (and thus item of test equipment connection) to a different opening as desired. This is advantageous because in current systems the connectors of different items of test equipment come in many different shapes and sizes, making it cumbersome to reconfigure a test bench correctly.

The test bench is further provided with a hinge to removably connect the top plate to the frame. Advantageously, when connected, the hinge allows the top plate to be rotated about the hinge to provide improved access to an underside surface of the top plate to allow the adapters to be easily connected, disconnected and moved.

In other words, the top plate and adapters together provide a secure and stationary surface for testing of DllTs, which can be easily reconfigured when required.

Thus, according to a first aspect of the present disclosure, there is provided an electronics test bench system comprising: a frame and a top plate removably coupled to the frame with a hinged connection, the top plate configured to receive a device under test, DUT, thereon and the top plate defining a plurality of openings having the same size; a plurality of adapters, each adapter secured to an underside of the top plate and comprising a plug and at least one socket, the sockets of respective adapters having different sizes and the plugs of respective adapters having the same size, each plug being received in a respective one of the same sized plurality of openings of the top plate and being configured to connect to the DUT; and a plurality of connector cables, each cable connected at one end to a respective socket of an adapter and at another end to an item of test equipment to connect the item of test equipment to the DUT through the plurality of adapters.

Optionally, the frame comprises a pair of sidewalls and said hinged connection, the pair of sidewalls being joined by the top plate through the hinged connection.

Advantageously, this provides an open front and/or rear of the test bench for easy positioning of test equipment, such as an oscilloscope and the like therein or thereunder and allows the top plate to be rotated about the hinge to provide easy access to an underside thereof.

Optionally, the top plate comprises a plurality of screw holes, wherein the adapters each comprise corresponding screws configured to secure the adapters to the underside of the top plate. Advantageously, by providing the means to secure the connection of the item of test equipment on the adapters and the top plate, it is not necessary to directly secure anything to the DUT, saving time when positioning the DUT on and removing it from the test bench.

Optionally, the top plate is configured to move about the hinge to an angle of between CI- 45 degrees, preferably 0-35.5 degrees relative to an upper surface of the frame.

Advantageously, this provides the user with ease of access to the underside of the top plate when securing the adapters thereto and when reconfiguring the positioning of the adapters on the underside of the top plate if required.

Optionally, the electronics test bench system comprises a gas spring configured to hold the top plate at said angle relative to the upper surface of the frame.

Advantageously, this ensures the top plate can be held at the angle without the user needing to hold it there manually, thereby making it easier for the user when securing and reconfiguring the positioning of the adapters on an underside of the top plate. It is envisaged that the gas spring may have a strength of between 0-100N, preferably 40- 60N, preferably 50N.

Optionally, the electronics test bench system comprises a safety bolt configured to lock the top plate in a position relative to the frame.

Advantageously, this improves the safety of the test bench and in particular the top plate, which may move relative to the other elements of the top plate.

Optionally, the electronics test bench comprises a sealing ring arranged on a surface of the top plate to seal a space between the DUT and the top plate; and an air conduit to provide air flow into said space to heat or cool the DUT.

Advantageously, by providing the air conduit and sealing ring as part of the test bench, this arrangement allows the DUT to be heated and/or cooled without the need to provide and install separate air conduits on the test bench, thereby saving the user time and effort. The air conduit is envisaged to be a purge air connection and the sealing ring may be positioned on a correspondingly shaped ring or region of low relief on the top plate to allow a seal to be provided and secured thereto with, for example, one or more screws. The purge air connection and seal, and the heat or cooling provided thereby, may be used to, for example prevent icing or overheating in the sealed space between the top plate and the DUT. The purge air connection may also be used to flush the space with dry air, and to create over pressure. Should any of the plurality of openings on the top plate not be fitted with an adapter, a dummy plug may be used to fill it to ensure the space between the top plate and DUT remains sealed.

Optionally, the electronics test bench system comprises a housing mounted on the top plate to enclose and optically isolate the DUT. Further, optionally, the item of test equipment may comprise a laser source and wherein the housing comprises a lid and an interlock configured to prevent activation of the laser source until the lid is in a closed position. Further, optionally, the electronics test bench system comprises an indicator configured to indicate if the laser source is activated.

Advantageously, by providing a housing as part of the test bench system, it allows the DUT optically isolated without the need to provide and install a separate housing or laser safety box thereby saving the user time and effort. Further, the interlock improves the safety of the user as it will prevent the light source from being activated unless the lid of the housing is closed. The interlock may be provided as a switch coupled to the power supply of the laser source whereby the switch is only closed when the lid of the housing is closed. The indicator may be coupled to the switch whereby when the switch (and thus lid) is closed, the indictor provides an indication to the user that the laser source is activated.

Optionally, the frame of the electronics test bench system is connected to an electrical ground.

Advantageously, this ensures the DUT and any highly sensitive circuits therein is less likely to be subject to damage from stray currents and charges which may otherwise accumulate in the material, for example metal, of the test bench. Further, it provides a convenient attachment point for a user’s antistatic wristband which they may be wearing when handling the DUT. Optionally, each adapter comprises an outer housing partially surrounding the plug of the adapter, the adapter being secured to the top plate with the outer housing; and wherein the plug is configured to be moveable within the outer housing when the adapter is secured to the top plate to allow the DUT to move relative to the top plate when received thereon.

Advantageously, this allows the DUT to be positioned on the top plate in a “floating” arrangement. That is, the plugs of the adapters have some freedom of amount relative to the adapter and thus relative to the top plate. Accordingly, the user needs only to approximately align any corresponding sockets or plugs of the DUT with the plugs or sockets of the adapters as the freedom of movement of the plug or sockets of the adapters ensures that, when the user pushes the DUT down onto the top plate, the DUT sockets or plugs will slip easily into those of the adapters thereby making the positioning of the DUT on the top plate significantly easier than any system where the plugs or sockets are entirely rigid and have no freedom of movement relative to the top plate.

Optionally, each of the connector cables comprises a bundle of wires, each wire joined at a first end to a corresponding contact in the socket of a corresponding adapter by soldering. Optionally, each of the connector cables at a second end opposite the first end comprises a plug or socket of a different size to the plug or socket of the plurality of adapters. Optionally, the electronics test bench system further comprises a plurality of second adapters connected to the item of test equipment and configured to receive the plugs or sockets of the connector cables therein to connect the item of test equipment to the DUT through the plurality of second adapters, through the connector cables, and through the first adapters.

Advantageously, this configuration provides the DUT with a plurality of standardised plugs and cables that do not need to be separately, manually secured to the DUT. The cables also allow any handling of connections to occur away from the DUT, for example in a position, which is more accessible. Optionally, the plugs or sockets of the connector cables may also be all of the same size and/or type so that the electronics test bench system of the present disclosure provides a standardised set of identical adapters and connector cables with standardised socket or plug. The second set of adapters (also referred to herein as a transition connector) can be used to adapt the standardised socket or plug of the connector cables to the size or type to match a corresponding plug or socket of the item of test equipment being connected to.

It will be appreciated that these and other advantages are also provided by a kit of parts configured for assembly into the above described electronics test bench system.

Thus, according to a second aspect of the present disclosure, there is provided: a kit of parts for assembly into the electronics test bench system of any preceding claim, the kit of parts comprising: a frame and a first top plate configured to connect to the frame with a hinge, the top plate configured to receive a device under test, DUT, thereon and the top plate defining a plurality of openings having the same size; a plurality of adapters, each adapter configured to be secured to an underside of the top plate and comprising a plug and at least one socket, the sockets of respective adapters having different sizes and the plugs of respective adapters having the same size, each plug configured to be received in a respective one of the same sized plurality of openings of the top plate and being configured to connect to the DUT; and a plurality of connector cables, each cable configured to connect at one end to a respective socket of an adapter and at another end to an item of test equipment to connect the item of test equipment to the DUT through the plurality of adapters.

Optionally, the kit of parts comprises a second top plate having a different width to the first top plate, whereby the second top plate is configured to replace the first top plate to change a width of the electronics test bench system assembled from the kit of parts.

Advantageously, by providing the kit of parts with a plurality of top plates of different widths, the user may easily change the width of the test bench to match whatever DUT they are testing. For example, the top plate removably connected to the frame with the hinge may be removed and replaced with a narrower top plate without needing to use a different frame or hinge. The kit of parts according to the present disclosure is accordingly highly customisable.

Brief description of the drawings

These and other aspects will now be described, by way of example only, with reference to the accompanying figures in which: Figure 1 illustratively shows an exploded view of an electronics test bench system according to the present disclosure.

Figure 2 illustratively shows a top or upper view of the top plate of Figure 1.

Figure 3 illustratively shows a view of an electronics test bench system according to the present disclosure.

Figure 4 illustratively shows a view of an adapter according to the present disclosure.

Figure 5 illustratively shows a view of an adapter and connector cable according to the present disclosure.

Figure 6 illustratively shows a plurality of different transition connectors according to the present disclosure.

Figure 7 illustratively shows a purge air system according to the present disclosure.

Figure 8 illustratively shows a housing according to the present disclosure.

Like-numbered reference numbers refer to like features.

Detailed Description

Figure 1 illustratively shows an exploded view of an electronics test bench system 100 according to the present disclosure. The test bench system 100 comprises a frame 101 comprising a pair of side walls 101a, 101b, a top plate 102 and a hinged connection 103 comprising a pair of hinges 103a, 103b (one on each of the pair of side walls 101a, 101b). The top plate 102 is removably coupled to the frame 101 by the hinged connection 103. To couple the top plate 102 to the frame 101 it may be inserted into one or more elongate slots 104 on each of the hinges 103a, 103b and secured using, for example screws. To remove and/or replace the top plate 102 with a top plate of a different size, the user simply has to slide the current top plate 102 out and slide a new one in. Each of the side walls 101a, 101 b is provided with a foot 105a, 105b to provide a more stable lower surface on with on which the test bench may stand. The feet 105a, 105b may be provided with one or more holes or openings 106 to allow the test bench to be secured to a surface, for example a worktop, using screws or other means. Each of the side walls 101a, 101b is further provided with one or more holes or openings 107 with which one or more items of test equipment may be secured to the test bench.

Each of the hinges 103a, 103b is provided with a gas spring 108a, 108b to keep the hinge at a preferred angle when open without the user needing to manually hold it at that angle. This is particularly useful when the user needs access to the underside of the top plate.

The electronics test bench system of Figure 1 further comprises an air conduit 109 which functions as a purge air connection as described above. The top plate 102 is provided with an opening therethrough to allow air from the air conduit 109 to pass through the top plate to reach the DUT.

Each of the sidewalls further comprise a safety bolt 110a, 110b configured to lock the top plate in a position, for example, in the fully down, 0 angle position relative to a top surface of the frame, or at a different angle, for example, between 0-45 degrees or preferably 0-35 degrees relative to the top surface of the frame.

The electronics test bench system of Figure 1 further comprises one or more removable side walls 111a, 111b, which together with the hinged connections 103a, 103b may be the side walls of a housing with which the DUT may be enclosed. The side walls 111a, 111 b may be slotted into one or more elongate slots in the hinged connections 103a, 103b in a similar manner to the top plate 102.

Figure 2 illustratively shows a top or upper view of the top plate 102 of Figure 1. Like- numbered reference numerals refer to like features. The top plate 102 has an approximately rectangular shape and defines a plurality of the same size openings 201 therethrough. On each side of each opening 201 a screw hole is provided. The top plate 201 further defines one or more recessed or low relief regions 202a, 202b arranged to receive for example, an elastomeric sealing ring (not shown) therein to allow the DUT to be sealed against the top plate 102. The plurality of openings 201 are configured to receive a plug or socket of an adapter therethrough whereby one or more securing screws of the adapter are screwed into the screw holes of the top plate 102 to secure the adapter thereto. Thus, when the adapters are secured to the top plate and the plugs or sockets are received through the plurality of openings, the upper or top surface of the top plate 102 (as shown in Figure 2) is ready to receive a DUT thereon by aligning the corresponding identically sized plugs or sockets of the DUT with those emerging from the upper surface of the top plate 102.

Figure 3 illustratively shows a view of an assembled electronics test bench system 100 according to the present disclosure. Like-numbered reference numerals refer to like features. Not all features shown in Figure 1 have been numbered in Figure 3 although they are envisaged to be present. Figure 3 further shows a plurality of adapters 301 secured to an underside of the top plate 102 for example using one or more screws in a housing of the adapter screwed into corresponding screw holes in the top plate 102. Each adapter 301 comprises a plug on its upper side facing the top plate 102 and at least one socket on its underside facing away from the top plate 102.

The plugs of the adapters 301 are all of the same size and plug type, and fit into the same sized openings 201 on the top plate 102, thereby protruding through the top plate 102 to provide the upper side of the top plate 102 with protruding plugs onto which corresponding sockets of a DUT can be lowered and thus connected. Thereby, the upper surface of the top plate 102 is provided with a standardised set of identical plugs to connect to the DUT.

The item of test equipment 302 may be secured to the frame 101 using, for example, one or more screws to screw into corresponding screw holes in the frame 101.

The sockets of the adapters 301 , i.e. on the side facing away from the top plate 102, may all have the same sizes and be of the same types and be configured to couple to a corresponding connector cable (not shown in Figure 3).

Figure 3 further shows a plurality of second adapters 303 (also referred to herein as transition connectors) of the electronics test bench system 100 which may be provided at one end with a standardised, same size and type of socket or plug and at another end with a plug or socket to match that of the item of test equipment 302 that is being connected to. Connector cables (not shown in Figure 3) may accordingly be coupled at one end to the adapters 301 and at the other end to a plug or socket to be received in the transition connectors 303 which in turn are received in the item of test equipment 302. In this way, all the connections out of the DUT and to the position of the item of test equipment 302 can be standardised to be the same size and type whereby the user need only select the suitable transition connector 303 in the easily accessible position at the end of the connector cables to set up the electronics test bench system 100 with the item of test equipment whose modules may have a wide variety of different plug and socket types and sizes.

Figure 4 illustratively shows a cut through of one of the plurality of adapters 301 of Figure 3. Like-numbered reference numerals refer to like features. The adapter 301 comprises an outer housing 401 partially surrounding the plug 402 of the adapter 301. The outer housing 401 comprises two opposing plates 401a, 401b which may be screwed together through matching screws and screw holes 403 in the opposing plates 401a, 401 b. The adapter 301 comprises a pair of screws 404a, 404b which run through the outer housing 401 and which are configured to screw into the screw holes in the top plate 102 of the electronics test bench system 100 to secure the adapter to the top plate with the outer housing 401 . Figure 4 also shows illustratively shows a socket 405 of a DUT with which the plug 402 of the adapter 301 is configured to engage when connecting to the DUT.

The outer housing 401 is defining a space in which the plug 402 is positioned whereby the space is large enough for the plug 402 to be moveable within the outer housing 401 when the adapter 302 is secured to the top plate 102. By providing the plug 402 with a degree of freedom of movement within the outer housing 401 (for example, in a direction parallel and/or perpendicular to the upper surface of the top plate 102 as indicated by the arrows shown in Figure 4), it becomes easier to connect multiple sockets 405 of the DUT to the plurality of plugs 301 protruding from the top plate 301 as compared to a system where the plugs have no freedom of movement. This is because in systems where the plugs have no freedom of movement, they must all be simultaneously positioned perfectly to match the sockets of the DUT, which is challenging in practice. In other words, this extra tolerance allows the DUT to “float” on the top plate 102 (that is, have a slight degree of freedom of movement relative to the top plate 102) making it significantly easier to place, connect, disconnect, and remove the DUT from the top plate 102 compared to known systems. The adapters are further provided with a plurality of contact pads onto which wires 406 of connector cables may be joined, for example by soldering.

Figure 5 illustratively shows a view of the adapter 301 of Figure 4 in an assembled state coupled to a connector cable 501 comprising a bundle of wires 406 soldered to the adapter 301 at one end and coupled to a plug or socket 502 of the connector cable 501 at another end. Like-numbered reference numerals refer to like features. The broken line indicates a length of cable, which is not shown in Figure 5. The plug or socket 502 of the connector cable 501 may similarly be provided with an outer housing and contact pads with which the wires 406 of the cable are coupled, for example by soldering. The plug or socket 502 of the connector cable 501 may have a different size and/or type compared to those of the adapter 301 but may, among themselves, all be the same size which is convenient to the user who may accordingly use all of the same connector cables 501 on all adapters 301 when setting up the electronics test bench system 100 of the present disclosure.

Figure 6 illustratively shows a plurality of different transition connectors or second adapters 303a, 303b, 303c, 303d according to the present disclosure. Like-numbered reference numerals refer to like features. As described above, the transition connectors connect at one end to standardised, same size and type plug or socket of the connector cables and at the other end to a plug or socket of the item of test equipment which may come in a wide variety of different sizes and types. The transition connectors may each be provided with a plurality of sockets or plugs to allow multiple cable connectors to be connected thereto.

Figure 7 illustratively shows a purge air system according to the present disclosure. Like- numbered reference numerals refer to like features. A sealing ring 701 is arranged on a surface of the top plate 102 to seal a space between the DUT 702 and the top plate 10. An air conduit 109 is arranged along an underside 102 of the test plate and has an opening 109a at a surface of the frame 101 or hinge 103 and an opening 109b under the DUT 702 on the test plate 102 to provide air flow into the sealed space. Pressurised air may be provided through the opening in the frame 101 or hinge 103 which flows through the air conduit 109 into the sealed space where it may circulate.. The air provides a positive pressure in the sealed space and may be used to heat or cool the DUT 702. A dummy plug 703 in the shape of the adapter plug may be provided to seal off any of the openings in the top plate 102 not filled by an actual adapter plug.

Figure 8 illustratively shows a housing 801 mounted on the top plate of an electronics testing system according to the present disclosure. The housing 801 may be used to enclose and optically isolate the DUT. As the housing is built out of a conductive material, it also may be used as a shielding against electromagnetic waves and as a protective safety device for the user to protect him or her against any high voltages flowing through or on the DUT whereby the housing, like the rest of the frame and top plate of the system is grounded. Like-numbered reference numerals refer to like features. The housing 801 comprises side walls 801a and a lid 801 b and can be secured to the frame 101 or hinge 103 using lugs in the side walls 801a that engage with shaped notches in the frame 101 or hinge 103.

The housing 801 may comprise on or more interlocks 802 for example switches coupled to a laser source of an item of test equipment. The switches are activated only when the lid 801b is in the closed position and thus prevent the laser source from activating unless the lid 801 b is in the closed position and the switches have been activated. An indicator 803 such as a light may be provided on the housing 801 configured to indicate if the laser source is activated or not.

Other effective alternatives will occur to the skilled person. It will be understood that the invention is not limited to the described embodiments and encompasses modifications apparent to those skilled in the art lying within the scope of the claims appended hereto.

For example, the terms top, upper side, under side, upper surface and so on are not intended to be limiting and are used as labels to refer to the above described features rather than to any specific orientations. Other orientations are accordingly also envisaged.

For example, where the term plug and socket are used, it is also envisaged that an opposite arrangement is possible. For example, where a plug is referred to it is envisaged that this may be a socket and vice versa the terms are accordingly intended to refer to a mating engagement between opposing, matching components, elements or features. For example, it is envisaged that the electronic test bench system of the present disclosure may be used in conjunction with a ThermoStream ™ adapter to control the temperature of the DUT in conjunction with the purge air connection.

For example, the holes in the frame with which the item of test equipment may be secured to the frame may be slots having a length that allow some degree of freedom of the positioning of where the screws are positioned to match those of the item of test equipment being secured.

For example, it will be appreciated that the electronics test bench system of the present disclosure provides a way to standardise the cumbersome connections to a DUT allowing the process of connecting and disconnecting a DUT from a test bench to be significantly easier and less time consuming. Further, by providing commonly, universal sized openings in the top plate and matching adapters and cable connectors, the need for many different sizes and types of plugs and cables connecting to the DUT is reduced thereby saving costs in test bench and accessory production as the only part with different size or type of plug or socket are the transition connectors.

List of reference numerals:

100 electronics test bench system

101 frame

101a side wall

101 b side wall

102 top plate

103 hinged connection

103a hinge

103b hinge

104 slots

105a foot

105 b foot

106 opening

107 opening

108a gas spring

108b gas spring 109 air conduit

109a opening

109b opening

110a safety bolt

110b safety bolt

111a side wall

111b side wall

201 plurality of openings

202a low relief region

202b low relief region

301 plurality of adapters

302 item of test equipment

303 transition connectors

303a transition connector

303b transition connector

303c transition connector

303d transition connector

401 outer housing

402 plug

403 screw hole

404a screw

404b screw

405 socket

406 wires

501 connector cable

502 plug or socket

701 sealing ring

702 device under test (DUT)

703 dummy plug 801 housing

801a side walls

801b lid

802 interlocks 803 indicator

Claims

CLAIMS:

1 . An electronics test bench system (100) comprising: a frame (101) and a top plate (102) removably coupled to the frame (101) with a hinged connection (103), the top plate (102) configured to receive a device under test, DUT, thereon and the top plate (102) defining a plurality of openings (201) having the same size; a plurality of adapters (301), each adapter secured to an underside of the top plate (102) and comprising a plug and at least one socket, the plugs of respective adapters (301) having the same size, each plug being received in a respective one of the same sized plurality of openings (201) of the top plate (102) and being configured to connect to the DUT; and a plurality of connector cables (501), each cable connected at one end to a respective socket of an adapter (301) and at another end to an item of test equipment (302) to connect the item of test equipment (302) to the DUT through the plurality of adapters (301).

2. The electronics test bench system of any preceding claim, wherein the frame

(101) comprises a pair of sidewalls (101a, 101 b) and said hinged connection (103), the pair of sidewalls (101a, 101 b) being joined by the top plate (102) through the hinged connection (103).

3. The electronics test bench of any preceding claim, wherein the top plate (102) comprises a plurality of screw holes and wherein the adapters (301) each comprise corresponding screws configured to secure the adapters (301) to the underside of the top plate (102).

4. The electronics test bench system of any preceding claim, wherein the top plate

(102) is configured to move about the hinged connection (103) to an angle of between 0-45 degrees, preferably 0-35.5 degrees relative to an upper surface of the frame (101).

5. The electronics test bench system of claim 4 comprising a gas spring (108a, 108b) configured to hold the top plate (102) at said angle relative to the upper surface of the frame (101).

6. The electronics test bench system of any preceding claim comprising a safety bolt (110a, 110b) configured to lock the top plate (102) in a position relative to the frame (101).

7. The electronics test bench system of any preceding claim comprising: a sealing ring (701) arranged on a surface of the top plate (102) to seal a space between the DUT and the top plate (102); and an air conduit (109) to provide air flow into said space to heat or cool the DUT.

8. The electronics test bench system of any preceding claim comprising: a housing (801) mounted on the top plate to enclose and optically isolate the DUT.

9. The electronics test bench system of claim 8, wherein the item of test equipment (302) comprises a laser source and wherein the housing (801) comprises a lid (801b) and an interlock (802) configured to prevent activation of the laser source until the lid (801 b) is in a closed position.

10. The electronics test bench system of claim 9 comprising an indicator (803) configured to indicate if the laser source is activated.

11. The electronics test bench system of any preceding claim, wherein the frame (101) is connected to an electrical ground.

12. The electronics test bench system of any preceding claim, wherein each adapter (301) comprises an outer housing (401) partially surrounding the plug (402) of the adapter (301), the adapter (301) being secured to the top plate (102) with the outer housing (401); and wherein the plug (402) is configured to be moveable within the outer housing (401) when the adapter (301) is secured to the top plate (102) to allow the DUT to move relative to the top plate (102) when received thereon. 19

13. The electronics test bench system of any preceding claim, wherein each of the connector cables (501) comprises a bundle of wires, each wire joined at a first end to a corresponding contact in the socket (405) of a corresponding adapter (301) by soldering.

14. The electronics test bench system of claim 13, wherein each of the connector cables (501) at a second end opposite the first end comprises a plug or socket of a different size to the plug or socket of the plurality of adapters (301).

15. The electronics test bench system of claim 14, comprising a plurality of second adapters (303) connected to the item of test equipment (302) and configured to receive the plugs or sockets of the connector cables (501) therein to connect the item of test equipment (302) to the DUT through the plurality of second adapters (303), through the connector cables (501), and through the first adapters (301).

16. A kit of parts for assembly into the electronics test bench system of any preceding claim, the kit of parts comprising: a frame (101) and a first top plate (102) configured to be coupled to the frame (101) with a hinged connection (103), the top plate (102) configured to receive a device under test, DUT, thereon and the top plate (102) defining a plurality of openings (201) having the same size; a plurality of adapters (301), each adapter (301) configured to be secured to an underside of the top plate (102) and comprising a plug and at least one socket, the plugs of respective adapters (301) having the same size, each plug configured to be received in a respective one of the same sized plurality of openings (201) of the top plate (102) and being configured to connect to the DUT; and a plurality of connector cables (501), each cable configured to connect at one end to a respective socket of an adapter (301) and at another end to an item of test equipment (302) to connect the item of test equipment (302) to the DUT through the plurality of adapters (301).

17. The kit of parts of claim 16, comprising a second top plate having a different width to the first top plate (102), whereby the second top plate is configured to replace the first top plate (102) to change a width of the electronics test bench system (100) assembled from the kit of parts.