WO2023060629A1 - Three-axis automatic objective table adaptable to various microscopes - Google Patents

Three-axis automatic objective table adaptable to various microscopes Download PDF

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Publication number
WO2023060629A1
WO2023060629A1 PCT/CN2021/124522 CN2021124522W WO2023060629A1 WO 2023060629 A1 WO2023060629 A1 WO 2023060629A1 CN 2021124522 W CN2021124522 W CN 2021124522W WO 2023060629 A1 WO2023060629 A1 WO 2023060629A1
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axis
stage
microscope
axis mechanism
objective table
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PCT/CN2021/124522
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French (fr)
Chinese (zh)
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李昕昱
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李昕昱
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Publication of WO2023060629A1 publication Critical patent/WO2023060629A1/en

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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/34Microscope slides, e.g. mounting specimens on microscope slides
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/26Stages; Adjusting means therefor

Definitions

  • the invention belongs to the technical field of automatic microscopes, in particular to a three-axis automatic stage that can be adapted to various microscopes.
  • the present invention provides a solution to the above-mentioned problems, and a three-axis automatic stage that can be adapted to a variety of microscopes, which includes a fixed plate, and three detachable mounted on the fixed plate axis platform and microscope;
  • the three-axis platform includes: an X-axis mechanism, a Y-axis mechanism set on the X-axis mechanism, a Z-axis mechanism set on the Y-axis mechanism, and a Z-axis mechanism set on the Z-axis mechanism
  • the first object stage for placing the detected object, the replaceable fixture set on the first object stage for adapting various detected objects
  • the microscope includes multiple lenses, and the original Equipped with a second stage that can be adjusted up and down.
  • the fixed plate is provided with a plurality of first installation holes, and the X-axis mechanism is detachably connected to the fixed plate through the plurality of first installation holes.
  • the fixing plate is provided with a plurality of second mounting holes, and the microscope is detachably connected to the fixing plate through the plurality of second mounting holes.
  • the first object stage may be provided with a condensing lens for condensing the detected object.
  • the first object stage is provided with replaceable fixtures for adapting to various objects to be tested.
  • both the three-axis platform and the microscope are connected to a control device for adjusting the position and focus of the inspected object on the first stage in cooperation with the microscope.
  • the X-axis mechanism, the Y-axis mechanism and the Z-axis mechanism are all provided with driving devices.
  • the present invention has low cost, high practicability, and can maximize the application of the microscope to various scenes; it has the first stage set on the three-axis platform and the first Two stages, realize multi-purpose of one machine; the first stage can be adjusted automatically in three directions, cooperate with lenses of different magnifications of the microscope, camera and various replaceable fixtures, to carry out inspection on the objects to be tested on the first stage Automatic observation, photo analysis, etc., to adapt to different brands and different types of microscopes of the same brand, which solves the inconvenient problem of separately modifying the loading stage and Z-axis for different microscopes, and improves the practicability.
  • Fig. 1 is a schematic structural diagram of a first use state of a preferred embodiment of the present invention
  • Fig. 2 is a schematic structural diagram of a second use state of a preferred embodiment of the present invention.
  • Fig. 3 is a schematic structural diagram of a three-axis platform in a preferred embodiment of the present invention.
  • Fig. 4 is a schematic structural view of the upper part of a replaceable fixture adapted to multiple detected objects according to a preferred embodiment of the present invention
  • Fig. 5 is a schematic structural diagram of the lower part of a replaceable fixture adapted to a single detected item in a preferred embodiment of the present invention
  • FIG. 1 of the present invention is a schematic diagram of working with the second stage 61
  • FIG. 2 is a schematic diagram of working with the first stage 50 .
  • the present invention includes a fixed plate 10, and a detachable three-axis platform (including 20, 21, 30, 40, 50 in the accompanying drawings, the same below) arranged on the fixed plate 10 with microscope 60;
  • a three-axis platform is provided at the fitting position on one side of the microscope 60, so that the microscope 60 can carry out Work can also be done using the first stage 50 on the three-axis platform.
  • the three-axis platform includes: an X-axis mechanism 20, a Y-axis mechanism 30 disposed on the X-axis mechanism 20, a Z-axis mechanism 40 disposed on the Y-axis mechanism 30, and a Z-axis mechanism 40 disposed on the Z-axis mechanism 40. and a first stage 50 for placing the detected article; and replaceable fixtures 51 and 52 (including but not limited to );
  • the three-axis platform is detachably installed, and the installation position of the three-axis platform is adjusted according to the detection requirements;
  • the X-axis mechanism 20 can drive the first object stage 50 to move laterally, so
  • the Y-axis mechanism 30 can drive the first object stage 50 to move longitudinally, and the Z-axis mechanism 40 can drive the first object stage 50 to move up and down;
  • the above-mentioned three-axis platform drives the first object stage 50 moves below the lens 62 to perform detection work, and when the first object stage 50 is used for work, the second object stage 61 is adjusted to be below the first object stage 50 to avoid.
  • the microscope 60 includes a plurality of lenses 62, and a second stage 61 that can be adjusted up and down;
  • the second stage 61 is provided with the microscope; the microscope 60 is detachably installed, and the installation position can be changed according to the requirement; it should be noted that the second stage 61 It can be customized to meet the detection requirements of various specifications.
  • the fixed plate 10 is provided with a plurality of first installation holes 11, and the X-axis mechanism 20 is detachably connected to the fixed plate 10 through the plurality of first installation holes 11;
  • a plurality of first threaded holes are provided below the X-axis mechanism 20, and the plurality of first threaded holes match the first mounting hole 11, As shown in the figure, the three-axis platform can move to a limited extent on the fixed plate 10, and then lock the three-axis platform through the first mounting hole 11 and the first threaded hole for matching the Microscope 60 job requirements.
  • the fixed plate 10 is provided with a plurality of second mounting holes 12, and the microscope 60 is detachably connected to the fixed plate 10 through the plurality of second mounting holes 12;
  • a plurality of second threaded holes are provided below the microscope 60, and the plurality of second threaded holes match the second mounting hole 12, as shown in FIG.
  • the microscope 60 can move to a limited extent on the fixed plate 10, and then lock the microscope 60 through the second mounting hole 12 and the second threaded hole for adapting to the Describe the working requirements of the microscope 60 itself.
  • both the first object stage 50 and the second object stage 61 are provided with light focusing holes (not shown, the same below) for concentrating the detected objects and for limiting the A clip (not shown, the same below) for detecting the movement of the object; the first object stage 50 and the second object stage 61 share or each have a condenser lens for collecting light on the object to be detected.
  • the first object stage 50 or the second object stage 61 is located between the spotlight and the lens of the microscope 60, the spotlight of the microscope 60 is located below the focus hole, and the lens 62 of the microscope 60 is located in the focus hole
  • the top of the object to be detected is focused to facilitate the lens 62 of the microscope 60 to observe it; the clip will limit the object to be detected on the first stage 50 or the second stage 61 to prevent being detected. Detect item movement.
  • the microscope 60 is provided with an adjustment device 63 for controlling the up and down movement of the second stage 61;
  • the Z-axis position of the second stage 61 can be adjusted by the adjusting device 63 , which can realize the focusing of the lens 62 or avoid the first stage 50 .
  • the three-axis platform and the microscope 60 are connected to a control device (not shown, the same below), and are used to cooperate with the microscope 60 to focus on the detected object on the first stage 50 and position adjustment;
  • the three-axis platform is automatically adjusted by the control device to move the detected object below the lens 62, and Focusing and focusing; in addition, the control device can also control the second stage 61 to focus and adjust.
  • first object stage 50 is provided with replaceable fixtures 51 or 52 for adapting to various detected objects.
  • the X-axis mechanism 20, the Y-axis mechanism 30 and the Z-axis mechanism 40 are all provided with driving devices (not shown, the same below);
  • the driving device is controlled by the control device without manual operation.
  • the present invention discloses a three-axis automatic stage that can be adapted to various microscopes, including a fixed plate, and a detachable three-axis platform and microscope arranged on the fixed plate; the three-axis
  • the axis platform includes: an X-axis mechanism, a Y-axis mechanism set on the X-axis mechanism, a Z-axis mechanism set on the Y-axis mechanism, and a Z-axis mechanism set on the Z-axis mechanism for placing the detected
  • the present invention has the first stage set on the three-axis platform and the second stage provided on the microscope, so that one machine can be used for multiple purposes.
  • the camera can automatically observe and take pictures of the detected objects on the first stage, so as to adapt to different brands and models of microscopes, and solve the problem of inconvenient modification of the stage and Z-axis for different microscopes, and improve practicality.

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

A three-axis automatic objective table adaptable to various microscopes, the three-axis automatic objective table comprising a fixing plate (10), and a three-axis platform and a microscope (60), which are detachably arranged on the fixing plate (10). The three-axis platform comprises: an X-axis mechanism (20); a Y-axis mechanism (30), which is arranged on the X-axis mechanism (20); a Z-axis mechanism (40), which is arranged on the Y-axis mechanism (30); a first objective table (50), which is arranged on the Z-axis mechanism (40) and configured to place an examined object; and replaceable clamps (51, 52), which are arranged on the first objective table (50) and configured to adapt to various examined objects. The microscope (60) comprises a plurality of lenses (62), and a second objective table (61) of the microscope (60). The first objective table (50) on the three-axis platform can be used interchangeably with the second objective table (61) of the microscope (60), thereby realizing multiple purposes. The first objective table (50) can be adjusted in three directions, and cooperates with the lenses (62) of different magnifications of the microscope (60), a camera and the replaceable clamps (51, 52) to automatically observe, photograph, analyze, etc., the examined object on the first objective table (50), so as to adapt to microscopes of different brands and microscopes of different models under the same brand, which solves the problem of it being inconvenient to separately replace the objective table and the Z-axis mechanism for different microscopes, thereby improving the practicability.

Description

一种可适配多种显微镜的三轴自动载物台A three-axis automatic stage adaptable to various microscopes 技术领域technical field
本发明属于自动显微镜技术领域,特别涉及一种可适配多种显微镜的三轴自动载物台。The invention belongs to the technical field of automatic microscopes, in particular to a three-axis automatic stage that can be adapted to various microscopes.
背景技术Background technique
目前,普通显微镜载物台的移动和焦距的调节分为手动和自动两种方式,每种方式各有应用场景。但每种方式的应用场景会被限制(自动调节的显微镜不能手动调节,手动调节的显微镜不能自动调节),在不同品牌或同一品牌不同型号的显微镜改装自动调节时需要很多的零部件适配不同类型的显微镜,尤其是调焦的改装需要改变原装的旋钮,人工连接电机以实现自动调节,容易对显微镜造成损坏。另外不同显微镜使用的场景不同,适用各种被检测物品的载物台的大小、形状等均不一样,使得单独改装成本大、过程繁琐,不容易标准化、规模化改装和生产,且改装后的显微镜无法再手动调节。At present, there are two ways to move the stage of a common microscope and adjust the focus: manual and automatic, each of which has its own application scenarios. However, the application scenarios of each method will be limited (automatically adjusted microscopes cannot be adjusted manually, and manually adjusted microscopes cannot be automatically adjusted), and when refitting automatic adjustments of microscopes of different brands or different models of the same brand, many parts are required to adapt to different For different types of microscopes, especially the modification of focusing needs to change the original knob, and manually connect the motor to achieve automatic adjustment, which is easy to cause damage to the microscope. In addition, different microscopes are used in different scenarios, and the size and shape of the stage suitable for various objects to be inspected are different, which makes the cost of individual modification high, the process is cumbersome, and it is not easy to standardize, scale modification and production, and after modification The microscope can no longer be adjusted manually.
发明内容Contents of the invention
有鉴于此,本发明提供了一种可以解决上述问题的方案,并可适配多种显微镜的三轴自动载物台,其包括固定板,以及可拆卸的设置在所述固定板上的三轴平台与显微镜;所述三轴平台包括:X轴机构、设于所述X轴机构上的Y轴机构、设于所述Y轴机构上的Z轴机构以及设于所述Z轴机构上且用于放置所述被检测物品的第一载物台、设于所述第一载物台上用于适配各种被检测物品的可更换夹具;所述显微镜包括多个镜头,以及原装配置可上下调节的第二载物台。In view of this, the present invention provides a solution to the above-mentioned problems, and a three-axis automatic stage that can be adapted to a variety of microscopes, which includes a fixed plate, and three detachable mounted on the fixed plate axis platform and microscope; the three-axis platform includes: an X-axis mechanism, a Y-axis mechanism set on the X-axis mechanism, a Z-axis mechanism set on the Y-axis mechanism, and a Z-axis mechanism set on the Z-axis mechanism And the first object stage for placing the detected object, the replaceable fixture set on the first object stage for adapting various detected objects; the microscope includes multiple lenses, and the original Equipped with a second stage that can be adjusted up and down.
进一步的,所述固定板设有多个第一安装孔,所述X轴机构通过多个所述第一安装孔可拆卸连接于所述固定板上。Further, the fixed plate is provided with a plurality of first installation holes, and the X-axis mechanism is detachably connected to the fixed plate through the plurality of first installation holes.
进一步的,所述固定板设有多个第二安装孔,所述显微镜通过多个所述第二安装孔可拆卸连接于所述固定板上。Further, the fixing plate is provided with a plurality of second mounting holes, and the microscope is detachably connected to the fixing plate through the plurality of second mounting holes.
进一步的,所述第一载物台可设置有用于对所述被检测物品进行聚光的聚光镜。Further, the first object stage may be provided with a condensing lens for condensing the detected object.
进一步的,所述第一载物台设置有用于可适配各种被检测物品的可更换夹具。Further, the first object stage is provided with replaceable fixtures for adapting to various objects to be tested.
进一步的,所述三轴平台、显微镜均与一控制装置连接,用于配合所述显微镜对处于所述第一载物台上的被检测物品进行位置和聚焦的调节。Further, both the three-axis platform and the microscope are connected to a control device for adjusting the position and focus of the inspected object on the first stage in cooperation with the microscope.
进一步的,所述X轴机构、Y轴机构与Z轴机构上均设置有驱动装置。Further, the X-axis mechanism, the Y-axis mechanism and the Z-axis mechanism are all provided with driving devices.
与现有技术相比,本发明成本低、实用性高、可最大限度的将显微镜应用到各种场景当中;其具有设置在三轴平台上的第一载物台与显微镜上自带的第二载物台,实现一机多用;其第一载物台可三向自动调节,配合显微镜不同倍数的镜头和摄像头及各种可更换的夹具,对第一载物台上的被检测物品进行自动观察、拍照分析等,以适应不同品牌和同一品牌不同型号的显微镜,解决了对不同显微镜需单独改装载物台、Z轴不方便的问题,提高了实用性。Compared with the prior art, the present invention has low cost, high practicability, and can maximize the application of the microscope to various scenes; it has the first stage set on the three-axis platform and the first Two stages, realize multi-purpose of one machine; the first stage can be adjusted automatically in three directions, cooperate with lenses of different magnifications of the microscope, camera and various replaceable fixtures, to carry out inspection on the objects to be tested on the first stage Automatic observation, photo analysis, etc., to adapt to different brands and different types of microscopes of the same brand, which solves the inconvenient problem of separately modifying the loading stage and Z-axis for different microscopes, and improves the practicability.
附图说明Description of drawings
图1为本发明较佳实施例的第一使用状态结构示意图;Fig. 1 is a schematic structural diagram of a first use state of a preferred embodiment of the present invention;
图2为本发明较佳实施例的第二使用状态结构示意图;Fig. 2 is a schematic structural diagram of a second use state of a preferred embodiment of the present invention;
图3为本发明较佳实施例的三轴平台结构示意图。Fig. 3 is a schematic structural diagram of a three-axis platform in a preferred embodiment of the present invention.
图4为本发明较佳实施例的一种适配多个被检测物品的可更换夹具上部分的结构示意图Fig. 4 is a schematic structural view of the upper part of a replaceable fixture adapted to multiple detected objects according to a preferred embodiment of the present invention
图5为本发明较佳实施例的一种适配单个被检测物品可更换夹具下部分的结构示意图Fig. 5 is a schematic structural diagram of the lower part of a replaceable fixture adapted to a single detected item in a preferred embodiment of the present invention
具体实施方式Detailed ways
以下对本发明的具体实施例进行进一步详细说明。应当理解的是,此处对本发明实施例的说明并不用于限定本发明的保护范围。Specific embodiments of the present invention will be further described in detail below. It should be understood that the description of the embodiments of the present invention here is not intended to limit the protection scope of the present invention.
本发明图1为使用第二载物台61进行工作的示意图,图2为使用第一载物台50进行工作的示意图。FIG. 1 of the present invention is a schematic diagram of working with the second stage 61 , and FIG. 2 is a schematic diagram of working with the first stage 50 .
请参见图1-图3,本发明包括固定板10,以及可拆卸的设置在所述固定板10上的三轴平台(包含附图中的20、21、30、40、50,下同)与显微镜60;Referring to Fig. 1-Fig. 3, the present invention includes a fixed plate 10, and a detachable three-axis platform (including 20, 21, 30, 40, 50 in the accompanying drawings, the same below) arranged on the fixed plate 10 with microscope 60;
在本发明实施例中,以所述固定板10为载体,在所述显微镜60一侧的适配位置设置有一三轴平台,以使显微镜60可以通过自带的第二载物台61进行工作,也可以使用所述三轴平台上的第一载物台50进行工作。In the embodiment of the present invention, using the fixed plate 10 as a carrier, a three-axis platform is provided at the fitting position on one side of the microscope 60, so that the microscope 60 can carry out Work can also be done using the first stage 50 on the three-axis platform.
所述三轴平台包括:X轴机构20、设于所述X轴机构20上的Y轴机构30、 设于所述Y轴机构30上的Z轴机构40以及设于所述Z轴机构40上且用于放置所述被检测物品的第一载物台50;以及设于所述第一载物台上用于适配各种被检测物品的可更换夹具51和52(包括但不限于);The three-axis platform includes: an X-axis mechanism 20, a Y-axis mechanism 30 disposed on the X-axis mechanism 20, a Z-axis mechanism 40 disposed on the Y-axis mechanism 30, and a Z-axis mechanism 40 disposed on the Z-axis mechanism 40. and a first stage 50 for placing the detected article; and replaceable fixtures 51 and 52 (including but not limited to );
本发明实施例中,所述三轴平台为可拆卸安装,且根据检测需求调节所述三轴平台的安装位置;所述X轴机构20可驱动所述第一载物台50横向移动,所述Y轴机构30可驱动所述第一载物台50纵向移动,所述Z轴机构40可驱动所述第一载物台50上下移动;通过上述三轴平台驱动所述第一载物台50移动到所述镜头62下方进行检测工作,当使用所述第一载物台50进行工作时,所述第二载物台61调节到所述第一载物台50的下方进行避开。In the embodiment of the present invention, the three-axis platform is detachably installed, and the installation position of the three-axis platform is adjusted according to the detection requirements; the X-axis mechanism 20 can drive the first object stage 50 to move laterally, so The Y-axis mechanism 30 can drive the first object stage 50 to move longitudinally, and the Z-axis mechanism 40 can drive the first object stage 50 to move up and down; the above-mentioned three-axis platform drives the first object stage 50 moves below the lens 62 to perform detection work, and when the first object stage 50 is used for work, the second object stage 61 is adjusted to be below the first object stage 50 to avoid.
所述显微镜60包括多个镜头62,以及一可上下调节的第二载物台61;The microscope 60 includes a plurality of lenses 62, and a second stage 61 that can be adjusted up and down;
本发明实施例中,所述第二载物台61为显微镜自带;所述显微镜60为可拆卸的安装,且可根据需求更换安装位置;需要说明的是,所述第二载物台61是可以定制的,以满足各种规格的检测要求。In the embodiment of the present invention, the second stage 61 is provided with the microscope; the microscope 60 is detachably installed, and the installation position can be changed according to the requirement; it should be noted that the second stage 61 It can be customized to meet the detection requirements of various specifications.
进一步的,所述固定板10设有多个第一安装孔11,所述X轴机构20通过多个所述第一安装孔11可拆卸连接于所述固定板10上;Further, the fixed plate 10 is provided with a plurality of first installation holes 11, and the X-axis mechanism 20 is detachably connected to the fixed plate 10 through the plurality of first installation holes 11;
本发明实施例中,所述X轴机构20的下方设置有多个第一螺纹孔(未示出,下同),多个所述第一螺纹孔与所述第一安装孔11相匹配,如图所示,所述三轴平台可以在所述固定板10上进行有限度的移动,再通过第一安装孔11与第一螺纹孔将所述三轴平台锁止,用于匹配所述显微镜60的工作需求。In the embodiment of the present invention, a plurality of first threaded holes (not shown, the same below) are provided below the X-axis mechanism 20, and the plurality of first threaded holes match the first mounting hole 11, As shown in the figure, the three-axis platform can move to a limited extent on the fixed plate 10, and then lock the three-axis platform through the first mounting hole 11 and the first threaded hole for matching the Microscope 60 job requirements.
进一步的,所述固定板10设有多个第二安装孔12,所述显微镜60通过多个所述第二安装孔12可拆卸连接于所述固定板10上;Further, the fixed plate 10 is provided with a plurality of second mounting holes 12, and the microscope 60 is detachably connected to the fixed plate 10 through the plurality of second mounting holes 12;
本发明实施例中,所述显微镜60的下方设置有多个第二螺纹孔(未示出,下同),多个所述第二螺纹孔与所述第二安装孔12相匹配,如图所示,所述显微镜60可以在所述固定板10上进行有限度的移动,再通过所述第二安装孔12与所述第二螺纹孔将所述显微镜60锁止,用于适配所述显微镜60自身的工作需求。In the embodiment of the present invention, a plurality of second threaded holes (not shown, the same below) are provided below the microscope 60, and the plurality of second threaded holes match the second mounting hole 12, as shown in FIG. As shown, the microscope 60 can move to a limited extent on the fixed plate 10, and then lock the microscope 60 through the second mounting hole 12 and the second threaded hole for adapting to the Describe the working requirements of the microscope 60 itself.
进一步的,所述第一载物台50与第二载物台61均设置有用于对所述被检测物品进行聚光的聚光孔(未示出,下同)和用于限制所述被检测物品移动的夹片(未示出,下同);所述第一载物台50与第二载物台61公用或者分别拥有对所述被检测物品进行聚光的聚光镜。Further, both the first object stage 50 and the second object stage 61 are provided with light focusing holes (not shown, the same below) for concentrating the detected objects and for limiting the A clip (not shown, the same below) for detecting the movement of the object; the first object stage 50 and the second object stage 61 share or each have a condenser lens for collecting light on the object to be detected.
本发明实施例中,所述第一载物台50或第二载物台61位于显微镜60的聚光灯和镜头之间,显微镜60的聚光灯位于聚光孔下方,显微镜60的镜头62位于聚光孔的上方,以对被检测物品进行聚光,方便显微镜60的镜头62对其进行观察;夹片将被检测物品限制在所述第一载物台50或第二载物台61上,防止被检测物品移动。In the embodiment of the present invention, the first object stage 50 or the second object stage 61 is located between the spotlight and the lens of the microscope 60, the spotlight of the microscope 60 is located below the focus hole, and the lens 62 of the microscope 60 is located in the focus hole The top of the object to be detected is focused to facilitate the lens 62 of the microscope 60 to observe it; the clip will limit the object to be detected on the first stage 50 or the second stage 61 to prevent being detected. Detect item movement.
进一步的,所述显微镜60上设置有一调节装置63,用于控制所述第二载物台61的上下移动;Further, the microscope 60 is provided with an adjustment device 63 for controlling the up and down movement of the second stage 61;
本发明实施例中,所述第二载物台61可通过所述调节装置63调节其Z轴位置,可实现所述镜头62调焦或者用以避开所述第一载物台50。In the embodiment of the present invention, the Z-axis position of the second stage 61 can be adjusted by the adjusting device 63 , which can realize the focusing of the lens 62 or avoid the first stage 50 .
进一步的,所述三轴平台、显微镜60均与一控制装置(未示出,下同)连接,用于配合所述显微镜60对处于所述第一载物台50上的被检测物品进行聚焦和位置的调节;Further, the three-axis platform and the microscope 60 are connected to a control device (not shown, the same below), and are used to cooperate with the microscope 60 to focus on the detected object on the first stage 50 and position adjustment;
本发明实施例中,将所述被检测物放置在所述第一载物台50上后,通过控制装置自动调节所述三轴平台,将被检测物移动到所述镜头62的下方,并且进行聚光调焦;此外,所述控制装置还可以控制所述第二载物台61进行聚光调焦和调节。In the embodiment of the present invention, after the detected object is placed on the first stage 50, the three-axis platform is automatically adjusted by the control device to move the detected object below the lens 62, and Focusing and focusing; in addition, the control device can also control the second stage 61 to focus and adjust.
进一步的,所述第一载物台50设置有用于可适配各种被检测物品的可更换夹具51或者52。Further, the first object stage 50 is provided with replaceable fixtures 51 or 52 for adapting to various detected objects.
进一步的,所述X轴机构20、Y轴机构30与Z轴机构40上均设置有驱动装置(未示出,下同);Further, the X-axis mechanism 20, the Y-axis mechanism 30 and the Z-axis mechanism 40 are all provided with driving devices (not shown, the same below);
本发明实施例中,所述驱动装置受所述控制装置控制,无需人为操作。In the embodiment of the present invention, the driving device is controlled by the control device without manual operation.
综上所述,本发明公开了一种可适配多种显微镜的三轴自动载物台,包括固定板,及可拆卸的设置在所述固定板上的三轴平台与显微镜;所述三轴平台包括:X轴机构、设于所述X轴机构上的Y轴机构、设于所述Y轴机构上的Z轴机构以及设于所述Z轴机构上且用于放置所述被检测物品的第一载物台;所述显微镜包括多个镜头,以及一可上下调节的第二载物台。本发明具有设置在三轴平台上的第一载物台与显微镜上自带的第二载物台,实现一机多用;其第一载物台可三向调节,配合显微镜不同倍数的镜头和摄像头,对第一载物台上的被检测物品进行自动观察、拍照等,以适应不同品牌、不同型号的显微镜,解决了对不同显微镜需单独改装载物台、Z轴不方便的问题,提高了实用性。In summary, the present invention discloses a three-axis automatic stage that can be adapted to various microscopes, including a fixed plate, and a detachable three-axis platform and microscope arranged on the fixed plate; the three-axis The axis platform includes: an X-axis mechanism, a Y-axis mechanism set on the X-axis mechanism, a Z-axis mechanism set on the Y-axis mechanism, and a Z-axis mechanism set on the Z-axis mechanism for placing the detected The first stage of the article; the microscope includes multiple lenses and a second stage that can be adjusted up and down. The present invention has the first stage set on the three-axis platform and the second stage provided on the microscope, so that one machine can be used for multiple purposes. The camera can automatically observe and take pictures of the detected objects on the first stage, so as to adapt to different brands and models of microscopes, and solve the problem of inconvenient modification of the stage and Z-axis for different microscopes, and improve practicality.
以上仅为本发明的较佳实施例,并不用于局限本发明的保护范围,任何在本发明精神内的修改、等同替换或改进等,都涵盖在本发明的权利要求范围内。The above are only preferred embodiments of the present invention, and are not intended to limit the protection scope of the present invention. Any modification, equivalent replacement or improvement within the spirit of the present invention is covered by the claims of the present invention.

Claims (7)

  1. 一种可适配多种显微镜的三轴自动载物台,用于显微镜自动调节被检测物品的位置和焦距,以配合所述显微镜进行自动观察、拍照和分析,其特征在于:A three-axis automatic stage that can be adapted to various microscopes is used for the microscope to automatically adjust the position and focal length of the object to be detected, so as to cooperate with the microscope for automatic observation, photographing and analysis, and is characterized in that:
    包括固定板,以及可拆卸的设置在所述固定板上的三轴平台与显微镜;It includes a fixed plate, and a detachable three-axis platform and a microscope arranged on the fixed plate;
    所述三轴平台包括:X轴机构、设于所述X轴机构上的Y轴机构、设于所述Y轴机构上的Z轴机构、设于所述Z轴机构上且用于放置所述被检测物品的第一载物台以及设于所述第一载物台上用于适配各种被检测物品的可更换夹具;The three-axis platform includes: an X-axis mechanism, a Y-axis mechanism arranged on the X-axis mechanism, a Z-axis mechanism arranged on the Y-axis mechanism, and a Z-axis mechanism arranged on the Z-axis mechanism for placing the The first stage of the object to be detected and the replaceable fixture arranged on the first stage for adapting various objects to be detected;
    所述显微镜包括多个镜头,以及一个显微镜自带的第二载物台。The microscope includes a plurality of lenses, and a second stage that comes with the microscope.
  2. 如权利要求1所述的可适配多种显微镜的三轴自动载物台,其特征在于,所述固定板设有多个第一安装孔,所述X轴机构通过多个所述第一安装孔可拆卸连接于所述固定板上。The three-axis automatic stage adaptable to various microscopes according to claim 1, wherein the fixed plate is provided with a plurality of first mounting holes, and the X-axis mechanism passes through a plurality of the first The mounting hole is detachably connected to the fixing plate.
  3. 如权利要求1所述的可适配多种显微镜的三轴自动载物台,其特征在于,所述固定板设有多个第二安装孔,所述显微镜通过多个所述第二安装孔可拆卸连接于所述固定板上。The three-axis automatic stage adaptable to various microscopes according to claim 1, wherein the fixed plate is provided with a plurality of second mounting holes, and the microscope passes through a plurality of the second mounting holes It is detachably connected to the fixing plate.
  4. 如权利要求1所述的可适配多种显微镜的三轴自动载物台,其特征在于,所述第一载物台设置有用于对所述适配各种被检测物品的可更换夹具;第一载物台与第二载物台共用或分别拥有对所述被检测物品进行聚光的聚光镜。The three-axis automatic stage adaptable to a variety of microscopes according to claim 1, wherein the first stage is provided with replaceable fixtures for adapting various detected objects; The first object stage and the second object stage share or respectively have a condensing mirror for condensing the detected object.
  5. 如权利要求4所述的可适配多种显微镜的三轴自动载物台,其特征在于,所述显微镜上设置有自带的z轴调节装置,用于控制所述第二载物台的上下移动以便在需要自动调节时第一载物台自动进入前降到指定位置;而在需要手动调节时第一载物台返回到初始位置,第二载物台手动升到指定位置。The three-axis automatic stage that can be adapted to various microscopes according to claim 4 is characterized in that, the microscope is provided with a self-contained z-axis adjustment device for controlling the movement of the second stage Move up and down so that the first stage automatically enters and falls to the designated position when automatic adjustment is required; while the first stage returns to the initial position when manual adjustment is required, and the second stage is manually raised to the designated position.
  6. 如权利要求5所述的可适配多种显微镜的三轴自动载物台,其特征在于,所述三轴平台与一个控制装置连接,用于配合所述显微镜对处于所述第一载物台上的被检测物品进行聚焦和位置的调节。The three-axis automatic stage adaptable to various microscopes according to claim 5, wherein the three-axis platform is connected with a control device for cooperating with the pair of microscopes in the first loading stage The detected items on the stage are adjusted for focus and position.
  7. 如权利要求6所述的可适配多种显微镜的三轴自动载物台,其特征在于,所述X轴机构、Y轴机构与Z轴机构上均设置有驱动装置。The three-axis automatic stage adaptable to various microscopes according to claim 6, wherein the X-axis mechanism, the Y-axis mechanism and the Z-axis mechanism are all provided with driving devices.
PCT/CN2021/124522 2021-10-12 2021-10-19 Three-axis automatic objective table adaptable to various microscopes WO2023060629A1 (en)

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