WO2022239425A1

WO2022239425A1 - State detection system

Info

Publication number: WO2022239425A1
Application number: PCT/JP2022/009897
Authority: WO
Inventors: 拓己石渡; 三郎平岡
Original assignee: コニカミノルタ株式会社
Priority date: 2021-05-10
Filing date: 2022-03-08
Publication date: 2022-11-17
Also published as: JPWO2022239425A1

Abstract

This state detection system is of an electromagnetic wave reading type and comprises: an electromagnetic wave responsive material (1) that is arranged so as to be sensitive to a material state to be detected in a testing target object (M) and that changes its own electromagnetic wave reflection characteristics in accordance with the material state; a reader (2) that acquires the spectrum of a reflected wave by transmitting an electromagnetic wave to the location where the electromagnetic wave responsive material (1) is arranged in the testing target object (M) from outside of the testing target object (M) and receiving the reflected wave thereof; and an analysis device (3) that estimates the distribution of the material state in the testing target object (M) on the basis of spectra acquired at a plurality of locations in the testing target object (M) during the same window of time.

Description

State detection system

The present disclosure relates to a state detection system.

In recent years, attention has been focused on state detection systems that detect the distribution of material states in objects using hyperspectral imaging. Hyperspectral imaging can capture the material state of each inspected position of an object as spectral information for each pixel, and can acquire an amount of information not found in conventional imaging techniques. In particular, one of the notable uses of hyperspectral imaging is the use of wide-range physical property evaluation that makes use of the feature of combining spatial information of images and physical property information of spectra.

Patent Document 1 discloses a technique for land cover classification using hyperspectral imaging.

JP 2015-207235 A

By the way, in putting this type of state detection system into practical use, it is an urgent issue to improve the detection sensitivity and ensure the accuracy when estimating the state of the detection target.

In this regard, a state detection system using hyperspectral imaging can usually detect only the material state that is conspicuously visible in the external appearance of the object, and the material state that is difficult to appear in the external appearance of the object (for example, pressurized state or temperature state). ), weak changes in the material state of the object over time, and the material state (for example, composition state) inside the object cannot be detected. Therefore, a state detection system using hyperspectral imaging leads to a delay in detection of an abnormal state occurring in an object, and cannot accurately detect quality defects in an object shipped as a product.

The present disclosure has been made in view of such problems, and aims to provide a state detection system capable of detecting the distribution of the material state of an object more accurately.

The main disclosure that solves the above-mentioned problems is
An electromagnetic wave reading type state detection system,
an electromagnetic wave responsive material disposed in a state sensitive to the state of the material to be detected of the object to be inspected;
a reader that transmits an electromagnetic wave from the outside of the object to be inspected to the position where the electromagnetic wave responsive material is arranged in the object to be inspected, receives the reflected wave, and acquires the spectrum of the reflected wave; ,
an analysis device for estimating the distribution of the material state in the object to be inspected based on the spectra obtained at a plurality of positions in the object to be inspected during the same time period;
A condition detection system comprising:

According to the state detection system according to the present disclosure, it is possible to more accurately detect the distribution of the material state of the object.

A diagram showing an example of the overall configuration of a state detection system according to the present disclosure FIG. 4 is a diagram schematically explaining the distribution of material properties of an object detected by the state detection system according to the present disclosure; A diagram showing an example of an arrangement mode of sensors in an object to be inspected as seen from the reader side according to the present disclosure. A diagram showing an example of a specific configuration of a sensor according to the present disclosure A diagram showing an example of a reflected wave spectrum of a sensor according to the present disclosure FIG. 11 is a diagram showing a mode of detecting an expansion/contraction state (that is, shape change) of an object to be inspected by a sensor according to the present disclosure; FIG. 11 is a diagram showing a mode of detecting an expansion/contraction state (that is, shape change) of an object to be inspected by a sensor according to the present disclosure; FIG. 4 is a diagram showing a mode of detecting the thickness of an object to be inspected by a sensor according to the present disclosure; FIG. 4 is a diagram showing a mode of detecting the thickness of an object to be inspected by a sensor according to the present disclosure; FIG. 4 is a diagram showing a mode of detecting the material composition of an object to be inspected by a sensor according to the present disclosure; FIG. 4 is a diagram showing a mode of detecting the material composition of an object to be inspected by a sensor according to the present disclosure; FIG. 4 is a diagram showing a mode of detecting the degree of oxidation of an object to be inspected by a sensor according to the present disclosure; FIG. 4 is a diagram showing a mode of detecting the degree of oxidation of an object to be inspected by a sensor according to the present disclosure; FIG. 4 is a diagram showing a mode of detecting the strength of electrical anisotropy (eg, orientation) of an object to be inspected by a sensor according to the present disclosure; FIG. 4 is a diagram showing a mode of detecting the strength of electrical anisotropy (eg, orientation) of an object to be inspected by a sensor according to the present disclosure; FIG. 4 is a diagram showing an example of another arrangement of sensors in an object to be inspected as viewed from the reader side according to the present disclosure; FIG. 10 is a diagram showing the configuration of a sensor according to Modification 1; FIG. 11 is a diagram illustrating an example of a mechanism for detecting a state using a sensor according to Modification 1; The figure which shows the structure of the sensor based on the modification 2. The figure which shows the structure of the sensor based on the modification 2. A diagram showing an example of the configuration of a reader and an analysis device according to the present disclosure FIG. 5 is a diagram illustrating an example of a method for estimating the distribution of the material state of an object to be inspected by the analysis apparatus according to the present disclosure; FIG. 5 is a diagram explaining an example of the operation of the state detection system according to the present disclosure; FIG. 2 is a diagram for explaining an embodiment of the state detection system according to the first embodiment; FIG. FIG. 2 is a diagram for explaining an embodiment of the state detection system according to the first embodiment; FIG. FIG. 2 is a diagram for explaining an embodiment of the state detection system according to the first embodiment; FIG. FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a second embodiment; FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a second embodiment; FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a second embodiment; FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a third embodiment; FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a third embodiment; FIG. 10 is a diagram illustrating an embodiment of a state detection system according to a third embodiment; FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fourth embodiment; FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fourth embodiment; FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fourth embodiment; FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fifth embodiment; FIG. 11 is a diagram illustrating an embodiment of a state detection system according to a fifth embodiment; FIG. 11 is a diagram for explaining an embodiment of a state detection system according to a sixth embodiment; FIG. 11 is a diagram for explaining an embodiment of a state detection system according to a seventh embodiment; FIG. 11 is a diagram for explaining an embodiment of a state detection system according to a seventh embodiment; FIG. 11 is a diagram for explaining an embodiment of a state detection system according to a seventh embodiment; FIG. 11 is a diagram illustrating an embodiment of a state detection system according to an eighth embodiment; FIG. 11 is a diagram illustrating an embodiment of a state detection system according to an eighth embodiment; FIG. 11 is a diagram illustrating an embodiment of a state detection system according to an eighth embodiment; FIG. 11 is a diagram for explaining an embodiment of a state detection system according to a ninth embodiment; FIG. 11 is a diagram for explaining an embodiment of a state detection system according to a ninth embodiment;

Preferred embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings. In the present specification and drawings, constituent elements having substantially the same functions are denoted by the same reference numerals, thereby omitting redundant description.

<Background leading up to this disclosure>
Before describing the configuration of the state detection system according to the present disclosure, the background will be described first.

The inventors of the present application have made intensive studies on a method for detecting the distribution of the state of materials in an object to be inspected. We came up with the idea of a state detection system using sensor tags.

This type of state detection system is generally arranged in a state sensitive to the material state of an object to be inspected, and transmits and receives electromagnetic waves to and from a sensor tag that changes its own electromagnetic wave reflection characteristics according to the material state of the object, and a reader for acquiring the frequency spectrum of the reflected wave from the object to be inspected (hereinafter referred to as the "reflected wave spectrum"). In this type of state detection system, the reader receives a reflected wave from the sensor tag when an electromagnetic wave is transmitted to the sensor tag, thereby obtaining a change in the electromagnetic wave reflection characteristic of the sensor tag. Estimate the state change of the target object.

Incidentally, in this type of state detection system, typically, data of the reference pattern of the electromagnetic wave reflection characteristics of the sensor tag is stored in advance by experiment or the like, and the data of the reference pattern and the sensor tag obtained this time are stored. A method of estimating a state change of an object to be inspected is adopted by collating it with electromagnetic wave reflection characteristics.

In this way, in a state detection system using electromagnetic wave reading type sensor tags, changes in the state of an object to be inspected are captured as changes in the electromagnetic wave reflection characteristics of the sensor tag. Sensitivity can be improved compared to condition detection systems that use captured hyperspectral imaging. In addition, in a state detection system using an electromagnetic wave reading type sensor tag, it is possible to selectively detect a specific material state of an object to be inspected. It becomes possible to detect the internal state.

However, in a state detection system using an electromagnetic wave reading type chipless sensor tag, it is difficult to secure the intensity of the reflected wave from the sensor tag, so it is difficult to secure a good SN ratio, and it is difficult to improve in terms of estimation accuracy or accuracy. It turns out that there is room.

In view of such problems, the inventors of the present application came up with the following configuration of the state detection system according to the present disclosure.

<Basic configuration of state detection system according to the present disclosure>
A basic configuration of a state detection system (hereinafter referred to as “state detection system U”) according to an embodiment of the present disclosure will be described below with reference to FIGS. 1A and 1B. The state detection system U according to the present disclosure is constructed based on the state detection system using the electromagnetic wave reading type sensor tag described above.

FIG. 1A is a diagram showing an example of the overall configuration of the state detection system U. FIG. FIG. 1B is a diagram schematically explaining the distribution of material properties of an object M detected by the state detection system U. As shown in FIG.

The state detection system U includes a sensor tag 1, a reader 2, and an analysis device 3.

Here, the sensor tag 1 (corresponding to the "electromagnetic wave reflector" of the present invention) is sensitive to the specific material condition of the object M (that is, the material condition to be detected) on the surface or inside of the object M to be inspected. placed in a state. The sensor tag 1 has, for example, a resonator whose resonance state changes according to the specific material state of the object M, and has a reflection characteristic (hereinafter referred to as "the sensor tag 1's Also referred to as "electromagnetic wave reflection characteristics" or "reflected wave spectrum of the sensor tag 1"), information relating to the material state of the object M is transferred to the reader 2 (details will be described later). At least one sensor tag 1 is arranged at each of a plurality of inspection target positions Ma (see FIG. 1B) in the inspection target object M. As shown in FIG.

The reader 2 transmits an electromagnetic wave to the presence position of the sensor tag 1 of the inspection target object M (that is, the inspection target position Ma of the inspection target object M) and receives the reflected wave, and the reflected wave spectrum ( That is, the reflected wave spectrum characterized by the electromagnetic wave reflection characteristics of the sensor tag 1 is acquired. At this time, the reader 2 acquires the reflected wave spectrum at each of the plurality of inspection target positions Ma of the inspection target object M by electronic scanning or the like.

The analysis device 3 estimates the distribution of the state of the material to be detected in the object M based on the reflected wave spectrum acquired by the reader 2 at each of the plurality of inspection positions Ma in the object M to be inspected (for example, (see FIG. 16A). At this time, the analysis device 3 refers to the reflected wave spectra obtained at each of the plurality of inspection target positions Ma of the inspection target object M, and compares them with each other and/or generates reference data based on them. Thus, the material state (for example, normal and abnormal distribution) of each inspection target position of the inspection target object M is estimated, thereby enabling highly accurate state estimation (details will be described later). ).

The object M to be inspected by the state detection system U is, for example, a concrete structure, a resin material, a ceramic material, or a sheet material. Then, the state detection system U detects, for example, corrosion occurring inside the inspection target object M, cracks in the inspection target object M, composition of constituent materials of the inspection target object M, and the like, and detects these inspection target object It is applied to the quality control at the manufacturing site of M and the check of the deterioration state when the use is started in the actual environment.

However, the object M to be inspected is not limited to the above, and may be any dielectric material. Further, the material condition to be detected by the condition detection system U may be any material property and/or structural property of the object M to be inspected.

The state detection system U according to the present embodiment is typically constructed based on the use of electromagnetic waves in the UWB band, millimeter wave band, or sub-millimeter wave band (range of 3.1 GHz to 3 THz). ing. That is, the sensor tag 1 is configured to respond to electromagnetic waves in such a band, and the reader 2 is configured to detect the material properties for each position of the object to be inspected using the electromagnetic waves in this band. Electromagnetic waves in such a band have characteristics such as a short wavelength, high directivity (that is, rectilinearity) of the electromagnetic wave, and high frequency resolution at the time of detection. By using electromagnetic waves in such a band, it is possible to achieve high area resolution when grasping the distribution of the material properties of the object M to be inspected, and the size of the sensor tag 1 can also be reduced.

<Structure of sensor tag 1>
An example of the configuration of the sensor tag 1 will be described with reference to FIGS. 2 to 10B.

FIG. 2 is a diagram showing an example of how the sensor tags 1 are arranged in the inspection object M viewed from the reader 2 side.

FIG. 3 is a diagram showing an example of a specific configuration of the sensor tag 1. FIG. FIG. 4 is a diagram showing an example of the reflected wave spectrum of the sensor tag 1. FIG.

For example, a plurality of sensor tags 1 are dispersedly arranged on the surface or inside the inspection target region of the inspection target object M in a state sensitive to the material state of the detection target of the inspection target object M. The inspection target area of the inspection target object M is divided into, for example, a plurality of small areas, and at least one sensor tag 1 is provided for each small area. In other words, the plurality of inspection target positions Ma in FIG. 1B are the positions of the small areas obtained by partitioning the inspection target area of the inspection target object M, respectively. Each sensor tag 1 detects the material state of the inspection target object M at each inspection target position Ma.

The sensor tag 1 detects, for example, the state of the material to be detected of the object M as the resonance state of the resonator 1a (see, for example, FIG. 3), and transmits information on the state of the material when electromagnetic waves are emitted from the reader 2. (ie, the position of the resonance peak and the peak intensity at the resonance peak) regarding the pattern of the reflected wave spectrum of . The reflected wave of the sensor tag 1 is superimposed on the reflected wave of the inspection target object M itself, and is acquired by the reader 2. A unique pattern centered on the resonance peak position of the resonator 1a is drawn. Therefore, the reflected wave spectrum pattern of the sensor tag 1 (see, for example, FIG. 4) can be clearly identified from the reflected wave spectrum pattern of the inspection object M itself.

FIG. 2 shows, as an example, a mode in which eight sensor tags 1 are distributed and arranged at eight inspection target positions Ma of an inspection target object M. Each detects the material state of each of the eight inspection target positions Ma. Then, the reader 2, for example, based on the electromagnetic wave reflection characteristics of the eight sensor tags 1 extracted from the reflected wave spectrum obtained when the electromagnetic wave is transmitted to each of the eight inspection target positions Ma of the inspection target object M to detect the distribution of the material state in the object M to be inspected (see FIG. 1B).

The sensor tag 1 has, for example, a resonant structure that resonates when externally irradiated with an electromagnetic wave of a predetermined frequency and absorbs or reflects the electromagnetic wave. The sensor tag 1 according to the present embodiment has an electromagnetic wave reflection characteristic that absorbs electromagnetic waves with a frequency that matches its own resonance frequency and reflects electromagnetic waves with frequencies other than that (see FIG. 4).

The sensor tag 1 is composed of, for example, a resonator 1a, an isolation layer 1b, and a back reflector 1c, which are arranged in order from the front side.

The resonator 1a is, for example, a conductor pattern formed in a strip shape, absorbs an electromagnetic wave of a frequency matching its own resonance frequency, and reflects the electromagnetic wave when irradiated with an electromagnetic wave of a frequency other than that. do. The resonator 1a resonates, for example, when it is irradiated with an electromagnetic wave having a frequency corresponding to 1/2λ of the resonator length (length in the longitudinal direction of the resonator 1a).

Although FIG. 3 shows only one resonator 1a, the sensor tag 1 is preferably provided with a plurality of resonators 1a having mutually different resonance frequencies. This makes it possible to further diversify the reflected wave spectrum pattern of the sensor tag 1 and improve the distinguishability from the reflected wave spectrum pattern of the inspection target object M itself.

The isolation layer 1b is an insulating material layer or an insulating space layer (including a space where no object is arranged), is formed between the resonator 1a and the back reflector 1c, and is formed between the resonator 1a and the back reflector 1c. insulate between The isolation layer 1b may be partially or entirely composed of the object M to be inspected.

The back reflector 1c is a material having characteristics of reflecting electromagnetic waves, such as a metal material such as silver, gold, copper, or aluminum, and is disposed facing the resonator 1a via the isolation layer 1b, The electromagnetic wave irradiated to the sensor tag 1 is reflected. The rear reflector 1c also functions to amplify the resonance phenomenon that occurs in the resonator 1a. Specifically, when the back reflector 1c exists, the resonance phenomenon occurring in the resonator 1a also occurs between the resonator 1a and the back reflector 1c, and the resonance phenomenon is amplified. That is, the back reflector 1c increases the resonance peak when a resonance phenomenon occurs in the resonator 1a. A part or the whole of the back reflector 1c may be composed of the object M to be inspected.

The resonance peak at frequency f0 in the reflected wave spectrum of FIG. 4 represents power loss (absorption) due to resonance of the resonator 1a. The baseband region in the reflected wave spectrum of FIG. 4 represents the reflection of the electromagnetic wave from the rear reflector 1c when the resonator 1a is not resonating.

In the sensor tag 1, for example, a change in the state of at least one of the resonator 1a, the isolation layer 1b, or the back reflector 1c is a change in the state of the material to be detected of the object M to be inspected (e.g., shape change, structure change, etc.). change, ambient atmosphere change, physical property change, etc.).

It should be noted that the material state of the object M to be detected by the sensor tag 1 is arbitrary. The state of the material to be detected includes, for example, the expansion and contraction of the constituent material in the object M to be inspected, the thickness of the constituent material in the object M to be inspected, the corrosion state (degree of oxidation) of the constituent material in the object M to be inspected, Orientation state of constituent materials in the inspection object M, composition state of the constituent materials in the inspection object M, pressure state in the inspection object M, wear state in the inspection object M, cracks in the inspection object M Occurrence state, dielectric constant in the object M to be inspected, detachment state of the region joining a plurality of members in the object M to be inspected, moisture content in the object M to be inspected, temperature in the object M to be inspected, etc. is mentioned.

5A to 9B are diagrams showing an example of detection modes of the material state of the inspection target object M by the sensor tag 1. FIG.

FIGS. 5A and 5B are diagrams showing how the sensor tag 1 detects the expansion/contraction state (that is, shape change) of the object M to be inspected. In this embodiment, the sensor tag 1 is made of, for example, a member that allows the resonator 1a to expand and contract in the longitudinal direction. Then, the sensor tag 1 detects the expansion/contraction state of the object M to be inspected as a change in the length of the resonator 1a. A change in the length of the resonator 1a is expressed as a change in resonance frequency in the reflected wave spectrum of the sensor tag 1. FIG.

FIGS. 6A and 6B are diagrams showing modes of detecting the thickness of the inspection target object M with the sensor tag 1. FIG. In this embodiment, the sensor tag 1 is arranged such that the thickness of the isolation layer 1b (that is, the distance between the resonator 1a and the back reflector 1c) changes in conjunction with the thickness of the inspection object M, for example. It is configured. Then, the sensor tag 1 detects the thickness of the object M to be inspected as a change in the thickness of the isolation layer 1b. In the structure of the sensor tag 1 shown in FIG. 3, the intensity of the reflected wave from the sensor tag 1 becomes maximum when the distance between the resonator 1a and the back surface reflector 1c is a predetermined distance. The distance to the reflector 1c becomes smaller as the distance from the predetermined distance increases. In other words, a change in the thickness of the isolation layer 1b appears as a change in the peak intensity of the resonance peak in the reflected wave spectrum of the sensor tag 1. FIG.

FIGS. 7A and 7B are diagrams showing modes of detecting the material composition of the inspection target object M with the sensor tag 1. FIG. In this embodiment, the sensor tag 1 has, for example, a structure in which a portion of the object M to be inspected is arranged in the isolation layer 1b, or a structure in which the object M to be inspected is the isolation layer 1b itself. Then, the sensor tag 1 detects a change in the material composition of the object M to be inspected as a change in dielectric constant of the isolation layer 1b. The change in the dielectric constant of the isolation layer 1b is expressed as a change in the resonance frequency of the resonator 1a in the reflected wave spectrum of the sensor tag 1. FIG.

FIGS. 8A and 8B are diagrams showing modes in which the sensor tag 1 detects the degree of oxidation of the object M to be inspected. In this aspect, the sensor tag 1 is configured such that the back reflector 1c is part of the object M to be inspected, for example. Then, the sensor tag 1 detects the degree of oxidation of the object M to be inspected as a change in conductivity of the back reflector 1c. A change in the conductivity of the back reflector 1c is expressed as a change in the peak intensity of the resonance peak in the reflected wave spectrum of the sensor tag 1. FIG.

FIGS. 9A and 9B are diagrams showing how the sensor tag 1 detects the strength of the electrical anisotropy (eg, orientation) of the object M to be inspected. In this aspect, the sensor tag 1 has, for example, a structure in which a portion of the object M to be inspected is arranged within the isolation layer 1b. Then, the sensor tag 1 detects the strength of the electrical anisotropy of the object M to be inspected from the magnitude of the peak intensity of the resonance peak.

9A and 9B, the sensor tag 1 detects the strength of the electrical anisotropy of the object M to be inspected. This is based on the fact that it depends on the ease of occurrence of the resonance phenomenon of the electromagnetic field generated in the That is, in the sensor tag 1, the resonance current that flows when the resonator 1a resonates flows along the extending direction of the resonator 1a. The direction of flow of this resonant current determines the direction of the electromagnetic field generated around the resonator 1a (for example, the isolation layer 1b). Therefore, the object M to be inspected has electrical anisotropy, and the arrangement direction of the object M to be inspected (that is, the polarization direction of the object M to be inspected) is the direction of the electromagnetic field generated by this resonance current. , the presence of the inspection object M functions to strengthen the resonance phenomenon of the electromagnetic field generated around the resonator 1a, increasing the peak intensity of the resonance peak.

Here, the arrangement position of the sensor tag 1 in the object M to be inspected will be explained.

The sensor tag 1 is arranged on the surface or inside of the object M to be inspected so as to be responsive to the state of the material to be detected of the object M to be inspected. Whether the sensor tag 1 is arranged on the surface of the object M to be inspected or arranged inside it depends on the type of material condition of the object M to be inspected and the portion of the object M to be detected. Therefore, preferred embodiments are different.

When the part to be detected in the object M to be inspected is only the surface layer of the object M to be inspected, the sensor tag 1 is arranged on the surface of the object M to be inspected by, for example, a sticking method or a coating method. Just do it. Further, when the part to be detected by the sensor tag 1 is only the surface layer part of the object M to be inspected, the sensor tag 1 is attached or coated on the surface of the sensor group installation sheet, and the sensor group installation sheet is installed at the time of inspection. A sheet may be placed on the inspection target object M (see, for example, FIG. 22B described later). The method of arranging these sensor tags 1 is simple, and the manufacturing cost for constructing the state detection system U can be reduced. For example, the sensor tag 1 can be avoided from affecting the material strength), and the sensor tag 1 (resonator 1a) provided at a plurality of locations can be easily aligned. It is more preferable than the aspect of mixing inside the object M to be inspected.

On the other hand, when the sensor tag 1 is intended to detect the state of the material inside the object M to be inspected, the sensor tag 1 is integrated with the material constituting the object M to be inspected inside the object M to be inspected. (see, eg, FIG. 16B below). For example, the sensor tag 1 may be embedded inside the inspection target object M so as to be mixed with the material constituting the inspection target object M in the process of forming the inspection target object M, or may be embedded in the inspection target object M. It may be embedded inside the object to be inspected M so as to be sandwiched between the materials constituting M. In such a configuration, the sensor tag 1 may be entirely embedded inside the object M to be inspected, or only a part of the configuration (for example, only the resonator 1a) may be embedded inside the object M to be inspected. may be embedded in

Further, it is preferable that the sensor tags 1 are arranged at regular intervals in the inspection target object M (see, for example, FIG. 2). As a result, it is possible to suppress a situation in which the reflected wave intensity when reading the reflected wave spectrum by the reader 2 changes greatly for each position of the detection target due to the difference in the existence density of the sensor tags 1 in the inspection target object M. can be done.

In addition, it is preferable that the sensor tags 1 are arranged in the inspection target object M with the resonators 1a oriented in the same direction (see FIG. 2, for example). As a result, it is possible to prevent the high-sensitivity direction from being different with respect to the polarization direction of the electromagnetic wave for each inspection target position Ma.

Further, in the inspection target object M, sensor tags 1 having different resonance frequencies for each inspection target position Ma may be used. Thereby, the identifiability of each inspection target position Ma in the inspection target object M can be enhanced.

FIG. 10 is a diagram showing an example of another arrangement mode of the sensor tag 1 in the inspection target object M viewed from the reader 2 side.

As shown in FIG. 10, in the object M to be inspected, the sensor tag 1 has a plurality of types of resonators 1a having different resonance frequencies for each position Ma to be inspected (that is, a small area in the object M to be inspected). is preferably provided. FIG. 10 shows a mode in which two types of

sensor tags

1X and 1Y having resonators 1a with mutually different resonance frequencies are arranged at each inspection target position Ma in the inspection target object M. FIG.

If only one type of sensor tag 1 is provided for each inspection target position Ma, the high-sensitivity band of the state of the material to be detected may be restricted to a narrow band. In this respect, multiple types of

sensor tags

1X and 1Y are arranged for each inspection target position Ma, and the multiple types of

sensor tags

1X and 1Y are each provided with a high sensitivity band for the state of the material to be detected. material state can be detected. For example, when the

sensor tags

1X and 1Y are used for detecting the temperature inside the object M to be inspected, the sensor tag 1X having a high sensitivity band to a temperature of around 30° C. and the sensor tag 1Y having a high sensitivity band to a temperature of around 50° C. By arranging the sensor tag 1Y having a high-sensitivity band with respect to the temperature, it is possible to detect the state of the material with higher sensitivity with respect to the temperature.

It should be noted that the plurality of types of

sensor tags

1X and 1Y may share the isolation layer 1b and the back reflector 1c, and may differ only in the configuration of the resonator 1a (that is, the resonator length).

[Modification 1 of sensor tag 1]
11A is a diagram showing the configuration of the sensor tag 1 according to Modification 1. FIG. FIG. 11B is a diagram illustrating a mechanism for detecting a state using the sensor tag 1 according to Modification 1. FIG.

The sensor tag 1 shown in FIG. 11A has a configuration in which a conversion unit 1d is added to the sensor tag 1 shown in FIG.

The conversion unit 1d is made of a material that responds to a specific material condition of the object M to be inspected (that is, the material condition to be detected). The conversion unit 1d is arranged in contact with the resonator 1a, and changes the electromagnetic wave reflection characteristics of the resonator 1a by changing the physical properties of the conversion unit 1d. That is, the sensor tag 1 is configured such that the change in the physical properties of the conversion portion 1d is linked to the change in the material state of the object M to be inspected.

Specifically, the conversion unit 1d is made of a material that changes at least one of the dielectric constant, the dielectric loss tangent (tan δ), and the conductivity in accordance with changes in the specific material state of the inspection object M to which the conversion unit 1d is sensitive. be done. When the change in the material state occurs, the conversion unit 1d changes the dielectric constant, dielectric loss tangent, or electrical conductivity of the region adjacent to the resonator 1a through the change in its own dielectric constant, dielectric loss tangent, or electrical conductivity. is changed to change the electromagnetic wave reflection characteristic change of the resonator 1a. In the converter 1d, for example, a change in the dielectric constant and dielectric loss tangent of the region adjacent to the resonator 1a induces a change in the resonance frequency of the resonator 1a due to the short wavelength effect, and a change in conductivity in the region adjacent to the resonator 1a. This induces a change in the peak intensity of the resonance peak when the resonator 1a resonates.

As for the material of the conversion unit 1d, when it is desired to detect the strain generated inside the inspection target object M by the state detection system U, the conversion unit 1d is selectively made of A material that reacts and changes physical properties is used. If the state detection system U is to detect the composition of the constituent material of the object M to be inspected, the conversion unit 1d may be a material whose physical properties change in response to the composition of the constituent material of the object M to be inspected. is used.

The material of the conversion portion 1d includes, for example, a liquid crystal material (e.g., nematic liquid crystal, cholesteric liquid crystal), a phase transition material (e.g., wax, microcapsule, phenanthrene), or polymerized or crosslinked material in response to heat or light. , irritant irreversibly reactive materials that decompose, etc. may be used. These materials can effectively cause a change in the dielectric constant of the conversion section 1d due to a change in the state of the surrounding environment. Examples of the material of the conversion portion 1d include a semiconductor doped with an active point (a substance that converts a semiconductor into a conductor in response to a change in the external environment, such as a copper complex that adsorbs gas molecules), an anisotropic conductive material, and the like. Alternatively, a conductor doped with a metal having a different ionization tendency than the conductor forming the resonator may be used. These materials can effectively cause a change in conductivity of the conversion portion 1d due to a change in the state of the surrounding environment.

The conversion section 1d is arranged integrally with the resonator 1a, for example, and in this embodiment, the conversion section 1d is arranged so as to entirely cover the resonator 1 (that is, the strip conductor). . However, the conversion portion 1d may be located at a position where at least a part of the conversion portion 1d is in contact with the resonator 1a and a change in the electromagnetic wave reflection characteristics of the resonator 1a can be induced. For example, the conversion section 1d may be provided inside the isolation layer 1b or may be provided on the side of the resonator 1a.

In this way, the converter 1d changes the electromagnetic wave reflection characteristic of the resonator 1a (that is, changes the reflected wave spectrum), so that the reader 2 selectively detects the specific material state of the inspection target object M. allow it to be captured.

[Modification 2 of sensor tag 1]
FIG. 12A is a diagram showing the configuration of the sensor tag 1 according to Modification 2. FIG.

12A is a diagram showing the configuration of the sensor tag 1 according to Modification 2. FIG. FIG. 12B is a modification of the sensor tag 1 shown in FIG. 12A, and shows a configuration in which the sensor tag 1 shown in FIG. 12A is provided with a conversion section 1d.

The sensor tag 1 according to Modification 2 is composed of an electromagnetic wave reflector 1e and a slot-type resonator 1a formed in the electromagnetic wave reflector 1e.

The electromagnetic wave reflector 1e is made of a plate-like, sheet-like, film-like, or foil-like conductive material such as aluminum or copper. The electromagnetic wave reflector 1e has a rectangular slot formed by cutting out a part of a solid conductor material, and the slot forms a resonator 1a. This resonator 1a typically resonates when the length of the slot corresponds to approximately λ/2 of the wavelength of the irradiated electromagnetic wave.

The principle of detecting the material state of the object M to be inspected in the sensor tag 1 according to Modification 2 is the same as that of the sensor tag 1 shown in FIG. That is, the sensor tag 1 according to Modification 2 is configured such that the change in the state of at least one of the resonator 1a and the electromagnetic wave reflector 1e is linked to the change in the material state of the object M to be inspected. The sensor tag 1 according to Modification 2 changes its own electromagnetic wave reflection characteristics based on, for example, changes in the dielectric constant of an inspection target object M (not shown) arranged on the base of the resonator 1a, and performs inspection. The material state of the target object M is detected.

Also in the sensor tag 1 according to Modification 2, a conversion unit 1d may be provided as shown in FIG. 12B.

Other modified examples of the sensor tag 1 include a mode using a ring-shaped or U-shaped resonator 1a. In particular, when it is desired to avoid the directional dependence of the sensitivity of the sensor tag 1 (the polarization direction of the electromagnetic wave and the direction of change in the material state of the object M to be inspected), it is preferable to use the ring-shaped resonator 1a.

For details of the configuration of the sensor tag 1 shown above, see, for example, International Application No. PCT/JP2019/042609, Japanese Patent Application No. 2020-077776, and International Application No. PCT/JP2020/031705, which are prior applications of the present applicant. .

<Configuration of Reader 2>
Next, an example of the configuration of the reader 2 will be described. For example, when acquiring a reflected wave spectrum from the sensor tag 1, the reader 2 is arranged so as to be directly facing the inspection object M (that is, the sensor tag 1) at a distance of several centimeters to several meters. Then, the reader 2 transmits an electromagnetic wave to each inspection target position Ma where the sensor tag 1 in the inspection target object M is arranged, receives a reflected wave from each inspection target position Ma, and receives a reflected wave from each inspection target position Ma. Acquire the reflected wave spectrum at the position Ma.

FIG. 13 is a diagram showing an example of the configuration of the reader 2 and the analysis device 3.

The reader 2 includes a transmitter 21, a receiver 22, and a controller 23.

The transmission unit 21 includes, for example, a transmission antenna (eg, phased array antenna), an oscillator, and the like. The transmitter 21 transmits, for example, sinusoidal electromagnetic waves having peak intensity at a single frequency. Then, the transmission unit 21 temporally changes the transmission frequency of the electromagnetic wave transmitted from the transmission antenna, and sweeps the frequency within a preset predetermined frequency band. The transmission unit 21, for example, within the frequency band (range of 3.1 GHz to 3 THz) of the UWB band, millimeter wave band or sub-millimeter wave band, for example, every bandwidth of 500 MHz or less, preferably every 10 MHz bandwidth A frequency sweep is performed while changing the transmission frequency in a pattern. The frequency band of the electromagnetic wave transmitted by the transmitter 1 is set so as to include the resonance frequency of the resonator 1a of the sensor tag 1. FIG.

Instead of frequency sweeping, the transmitting unit 21 may temporarily collectively irradiate electromagnetic waves having a specific intensity profile in a predetermined frequency band (ie, impulse method).

In addition, the transmission unit 21 temporally sequentially changes the transmission direction of the electromagnetic wave so as to scan the inspection target area of the inspection target object M. Although the electromagnetic wave scanning method by the transmission unit 21 is arbitrary, for example, the transmission unit 21 raster scans the inspection target object M by electronic scanning using a phased array antenna. That is, the transmission unit 21 changes the transmission direction of the electromagnetic wave to be transmitted while sweeping the frequency of the electromagnetic wave to be transmitted so that the reflected wave spectrum of each inspection target position Ma of the inspection target object M can be obtained.

The receiving unit 22 includes, for example, a receiving antenna (for example, a phased array antenna) and a received signal processing circuit that detects the intensity and phase of the reflected wave based on the received signal of the reflected wave acquired by the receiving antenna. be done. Then, the receiving unit 22 receives the reflected wave from the inspection target object M (that is, the sensor tag 1) generated when the transmitting unit 21 transmits the electromagnetic wave with the receiving antenna, and the received signal processing circuit receives the reflected wave. A received wave signal is received and processed to generate a reflected wave spectrum of the inspection target object M from the intensity of the reflected wave detected at each transmission frequency of the electromagnetic wave.

In addition, the receiving unit 22 temporally sequentially changes the receiving direction of the reflected wave so as to correspond to the scanning position (that is, the electromagnetic wave transmitting direction) by the transmitting unit 21 . As a scanning method in the receiving direction by the receiving unit 22, for example, electronic scanning using a phased array antenna is used as in the case of the transmitting unit 21. FIG. Thereby, the receiving unit 22 acquires the reflected wave spectrum (frequency spectrum) of each inspection target position Ma of the inspection target object M. FIG.

The signal processing circuits of the transmitting section 21 and the receiving section 22 may be integrally configured by a vector network analyzer.

The control unit 23 is a microcomputer including, for example, a CPU (Central Processing Unit), ROM (Read Only Memory), RAM (Random Access Memory), etc., and controls the reader 2 in an integrated manner. For example, the control unit 23 may cause the transmission unit 21 and the reception unit 22 to execute the above-described processing at predetermined time intervals in order to sequentially monitor the material state of the object M to be detected. The transmission unit 21 and the reception unit 22 may be caused to execute the above-described processing in response to the reflected wave spectrum acquisition command.

In addition to the above configuration, the reader 2 may have a camera in order to confirm the location of the object M to be inspected where the electromagnetic wave scanning has been performed by the transmitting unit 21 and the receiving unit 22. good.

<Configuration of analysis device 3>
The analysis device 3 includes a material state estimating unit 31 for estimating the distribution of the material state of the inspection target object M, and an image display unit 32 for displaying an image of the distribution of the material state of the inspection target object M estimated by the material state estimating unit 31. Prepare.

FIG. 14 is a diagram illustrating an example of a method of estimating the distribution of the material state of the inspection target object M by the analysis device 3 (material state estimating unit 31). FIG. 14 shows reflected wave spectra acquired at different positions in the inspection object M during the same time period. In FIG. 14, the reflected wave spectrum obtained at the second point in the inspection object M has a frequency shift of about 0.2 GHz from the reflected wave spectrum obtained at the first point in the inspection object M. , where the second point in the inspected object M is presumed to be in an abnormal state.

The material state estimation unit 31 acquires the reflected wave spectrum of the inspection target object M (that is, the reflected wave spectrum characterized by the electromagnetic wave reflection characteristics of the sensor tag 1) from the reader 2, and obtains the reflected wave spectrum Based on this, the material state of the object M to be inspected is estimated. At this time, the material condition estimating unit 31 refers to the reflected wave spectra obtained at a plurality of inspection target positions Ma of the inspection target object M in the same time period, and compares them with each other and/or based on them. , the distribution of the material state of the object M (for example, normal and abnormal distributions) is estimated.

Various noise components are superimposed on the reflected wave spectrum acquired by the reader 2, in addition to reflected wave components that depend on the state of the material of the inspection object M captured by the sensor tag 1. Specifically, the electromagnetic wave reflection characteristic itself of the sensor tag 1 may change due to the state of materials other than the detection target of the inspection target object M (for example, the sensor tag 1 may Even with a configuration that detects the pressure state, the electromagnetic wave reflection characteristics of the sensor tag 1 may change under the influence of the temperature in the object M to be inspected). The reflected wave spectrum acquired by the reader 2 also includes reflected wave components from the inspection target object M itself and reflected wave components from surrounding objects of the inspection target object M. And since these are affected by various factors of the surrounding environment (for example, temperature, humidity, light intensity, magnetic field, etc.), even if the material state of the object M to be detected is the same, the reader 2 The acquired reflected wave spectrum changes from time to time.

In this way, the reflected wave spectrum acquired by the reader 2 is superimposed with a lot of noise. The method of estimating the state of the material of the object M to be detected by collating it with the data of the reference pattern prepared in advance may lack accuracy.

From this point of view, the material state estimating unit 31 does not estimate the material properties of the inspection object M only with the reflected wave spectrum obtained at one position of the inspection object M, but rather estimates the material properties of the inspection object M in the same time zone (for example , during one electromagnetic wave scan), refer to the reflected wave spectra obtained at each of a plurality of inspection positions Ma of the inspection object M, and compare them with each other and/or generate reference data based on them By doing so, the distribution of the material state in the object M to be inspected is estimated (see FIG. 14). For example, the material state estimation unit 31 estimates the presence or absence of an abnormal point of the material state in the object M to be inspected. The abnormal point of the material state in the object M to be inspected is, for example, a position where corrosion occurs in the object M to be inspected or an abnormality in the composition of the constituent material in the object M to be inspected. means position.

According to this analysis method of the material condition estimation unit 31, the reflected wave spectra obtained at two mutually adjacent locations in the inspection object M in the same time period have substantially the same noise components superimposed on these reflected wave spectra. Therefore, it is based on the technical idea that if the material state of the object M to be inspected is the same at the two locations, the pattern will be the same. In other words, when the patterns of reflected wave spectra obtained at two adjacent locations in the inspection object M are different in the same time period, it means that one of the two locations is in an abnormal state. do. That is, by comparing the reflected wave spectrum of the estimated position in the inspection target object M with, for example, the reflected wave spectra obtained at the surrounding positions, it is possible to determine whether the material state of the estimated target position is normal. It is possible to estimate whether it is in an abnormal state.

However, when estimating the distribution of the material state in the inspection target object M, the material state estimation unit 31 does not necessarily need to estimate which position is abnormal and which position is normal. For example, the material state estimation unit 31 may estimate only the uniformity of the distribution of the material state in the object M to be inspected. In this case, the material state estimating section 31 may only estimate whether or not the reflected wave spectra obtained at each of the plurality of inspection target positions Ma in the inspection target object M are the same.

Specifically, the material state estimating unit 31, for example, calculates the reflected wave spectrum obtained at each of the plurality of inspection target positions Ma in the inspection target object M (that is, each of the plurality of inspection target positions Ma in the inspection target object M). The electromagnetic wave reflection characteristics of the sensor tag 1 appearing in the frequency spectrum obtained in ) are compared, and an analysis regarding their identity is performed to estimate the uniformity of the distribution of the material state in the inspection target object M. In this case, for example, when there is a specific reflected wave spectrum among the reflected wave spectra obtained at each of the plurality of inspection target positions Ma in the inspection target object M, the material state estimation unit 31 determines that the specific reflected wave spectrum The inspection target position Ma from which the reflected wave spectrum is obtained is specified as an abnormal state (that is, majority rule).

The identity analysis by the material state estimator 31 is typically performed by determining the electromagnetic wave reflection characteristics of the sensor tag 1 appearing in the reflected wave spectrum (resonance peak peak position and/or peak intensity). At this time, the material state estimation unit 31 preferably performs analysis based on pattern matching such as template matching and trained learner models (for example, SVM (Support Vector Machine) and neural networks). . From the reflected wave spectrum acquired by the reader 2, it is often difficult to accurately identify the peak position and peak intensity of the resonance peak of the sensor tag 1. However, by using an analysis method based on pattern matching, the reflected It is possible to determine the identity of two reflected wave spectra by comparing the entire patterns of the reflected wave spectra without performing processing for specifying the peak position and peak intensity of the resonance peak in the wave spectrum. In such a method, typically, the identity of the two reflected wave spectra is determined based on the amount of frequency shift of the entire pattern of the reflected wave spectrum and the amount of change in the peak intensity of the entire vicinity of the resonance peak in the reflected wave spectrum. to judge.

When comparing the two reflected wave spectra, the material state estimation unit 31 refers to discrimination reference data stored in advance in a storage unit (for example, the ROM of the analysis device 3 not shown) to determine the two reflected wave spectra. (for example, the amount of frequency shift or the amount of change in peak intensity) is greater than or equal to a threshold value, it may be determined that the estimation target position is abnormal. Such discrimination reference data can be obtained in advance through experiments or simulations, for example. Further, such discrimination reference data may be stored in association with the degree of change in the state of the material according to the magnitude of the difference.

As described above, in the analysis apparatus 3 according to the present embodiment, the reflected wave spectra obtained at each of the plurality of inspection target positions Ma in the inspection target object M are referred to in the same time zone, and these are compared with each other. By doing and/or generating reference data based on these, a method of estimating the distribution of the material state of the object M (for example, distribution related to normal and abnormal) is adopted.

As a result, the distribution of the material state of the inspection target object M (for example, the normal and abnormal distributions) can be obtained even under circumstances in which only reflected wave spectra that change from time to time due to various factors in the surrounding environment can be obtained. can be estimated accurately. In addition, this makes it possible to estimate the distribution of the material state of the object M to be inspected without pre-storing reference patterns of all reflected wave spectra obtained under various different conditions.

It should be noted that the "reflected wave spectra obtained at each of a plurality of inspection target positions Ma in the inspection target object M in the same time zone" referred to here means that the surrounding environment of the inspection target object M is close to the extent that the surrounding environment does not change. It means a time zone, and does not necessarily have to be the reflected wave spectrum obtained at each inspection target position Ma in the inspection target object M in one electromagnetic wave scanning.

The image display unit 32 converts the distribution of the material state of the object to be inspected M obtained by the analysis into, for example, an image pattern (hereinafter referred to as a “material distribution image”), and displays it on the display unit (for example, the analysis device 3 LCD display). For example, the image display unit 32 associates the type of the material state of the detection target with the image color using a conversion table prepared in advance, and for each inspection target position Ma of the inspection target object M, displays the inspection target position Ma. A material distribution image is generated by changing the image color according to the material state.

At that time, for example, the image generation unit 32 converts the material distribution image into an electromagnetic wave reflection intensity image (for example, an image expressing the reflection intensity for each scanning position in gray scale) obtained when the inspection target object M is scanned with electromagnetic waves. Preferably, a superimposed display image is generated and the display image is output to the display unit (see FIG. 16A). As a result, it is possible to recognize the shape of the entire inspection target object M, so that the user is provided with information that clarifies the correspondence relationship between the position of the inspection target object M and the material state of the inspection target object M. It is possible.

However, the image generator 32 may generate a display image in which the material distribution image is superimposed on the camera image instead of the electromagnetic wave reflection intensity image.

In addition, in the analysis device 3 (material state estimation unit 31) according to the present embodiment, the method of estimating the distribution of the material state of the object M (for example, distribution related to normal and abnormal) can be modified in various ways.

For example, when the material state estimating unit 31 analyzes the identity of the reflected wave spectra obtained at each of the plurality of inspection target positions Ma in the inspection target object M, the electromagnetic wave reflection characteristics of the sensor tag 1 are calculated from these reflected wave spectra. may be extracted, and the sameness analysis may be performed using the electromagnetic wave reflection characteristics of the extracted sensor tag 1 .

Further, the material state estimating unit 31 generates reference data for estimating the normal state and the abnormal state based on the reflected wave spectrum obtained at each of the plurality of inspection target positions Ma in the inspection target object M. good too. For example, the material condition estimation unit 31 may generate reflected wave spectra obtained at a plurality of positions around the estimation target position as the reference data.

Further, the material state estimation unit 31 acquires the reflected wave spectrum at each inspection target position Ma of the inspection target object M when the entire inspection target object M is in a normal state, for example, immediately after the inspection target object M is manufactured. Then, differences in reflected wave spectra (for example, differences in peak positions and peak intensities of resonance peaks) obtained at mutually different positions of the inspection target object M may be grasped. Then, in the subsequent comparison processing, the material state estimating unit 31 estimates whether the estimation target position is normal or abnormal based on changes in the difference in the reflected wave spectra obtained at mutually different positions of the inspection target object M. may be performed.

<Operation of state detection system U>
15A and 15B are diagrams for explaining an example of the operation of the state detection system U. FIG. Note that the processing of the flowchart of FIG. 15 is processing that is executed, for example, triggered by an inspection command start command from the user.

In step S10, the reader 2 transmits electromagnetic waves to irradiate the inspection target area of the inspection target object M (that is, the area in which the plurality of sensor tags 1 are dispersedly arranged), and the electromagnetic wave is reflected from the inspection target object M. receive waves. Then, the reader 2 switches the electromagnetic wave transmission direction of the transmission unit 21 and the electromagnetic wave reception direction of the reception unit 22, and scans the inspection target area of the inspection target object M with electromagnetic waves. At this time, the reader 2 sweeps the transmission frequency at each scanning position, and obtains the reflected wave spectrum from the inspection object M in a predetermined frequency band. The reader 2 then transmits the reflected wave spectrum obtained at each scanning position of the object M to be inspected to the analysis device 3 via a communication line.

In step S20, the analysis device 3 refers to the reflected wave spectrum of each scanning position of the inspection target object M obtained in step S10, and compares them with each other and/or generates reference data based on them. Thus, the distribution of the material state in the object M to be inspected (for example, the distribution of normal and abnormal) is estimated.

In step S30, the analysis device 3 generates a material distribution image of the inspection object M using the information regarding the distribution of the material state in the inspection object M obtained in step S20. Then, the analysis device 3 generates a display image (for example, see FIG. 16A) in which the material distribution image of the inspection object M is superimposed on the electromagnetic wave reflection intensity image obtained when the inspection object M is scanned with electromagnetic waves. Then, the display image is output to the display unit.

Through the series of processes described above, the state detection system U provides the user with information on the distribution of the material state in the object M to be inspected.

Specific application examples of the state detection system U according to the present disclosure are shown below.

[Example 1]
FIG. 16A is a diagram illustrating an implementation of the state detection system U according to the first embodiment. The left diagram in FIG. 16A shows a camera image of reinforced concrete (inspection target object M of the present embodiment) photographed by the reader 2, and the right diagram in FIG. 16A is based on the reflected wave spectrum acquired by the reader 2. FIG. 16B shows an electromagnetic wave reflection intensity image of the reinforced concrete in the left diagram of FIG. Note that FIG. 16A shows a mode in which the material state distribution image of reinforced concrete is displayed in a form superimposed on the electromagnetic wave reflection intensity image (the right diagram in FIG. 16A).

It is generally known that the reinforced concrete used in buildings is not permanent and deteriorates as the reinforcing steel corrodes. Normally, the composition of reinforced concrete is adjusted so that it becomes basic at the construction stage, but this is the process of corrosion, in the following manner: concrete neutralization → reinforcing bar corrosion (rust) → concrete cracking → concrete peeling → reinforcing bar breaking → collapse Corrosion progresses. At present, it is possible to grasp the state of corrosion from the middle stage of corrosion, when cracks appear on the concrete surface. Although the industry dislikes this inspection because it involves the risk of drilling a hole and is time-consuming, there is currently no means of non-destructive inspection.

In order to solve this problem, the state detection system U according to the present embodiment is applied to detecting the state of corrosion of reinforcing bars in the reinforced concrete (hereinafter referred to as "reinforced concrete M1") using reinforced concrete as the inspection target object M. It is

FIG. 16B is a diagram showing an example of how the sensor tag 1 is arranged in the reinforced concrete M1. FIG. 16C is a diagram showing an example of changes over time in the peak intensity of the resonance peak of the sensor tag 1 due to corrosion of reinforcing bars in the reinforced concrete M1.

In the state detection system U according to the present embodiment, the sensor tags 1 are embedded in, for example, a plurality of positions of the reinforced concrete M1 (for example, 28 inspection target positions Ma shown as black areas in the left diagram of FIG. 16A). be. The sensor tag 1 according to the present embodiment is formed by embedding a resonator 1a (here, a strip conductor) at a position about 3 to 10 mm away from the reinforcing bars in the concrete when the reinforced concrete M1 is constructed. Specifically, the sensor tag 1 according to this embodiment has the sensor structure shown in FIG. and a rear reflector 1c made of a reinforcing bar of M1 (see FIG. 16B). In the sensor tag 1 according to the present embodiment, when the corroded portion M1Q occurs in the reinforcing bar of the reinforced concrete M1, the corroded portion M1Q causes the conductivity of the reinforcing bar (that is, the back reflector 1c) to decrease. This causes an electromagnetic wave reflection characteristic that reduces the resonance peak of the resonator 1a (see FIG. 16C).

In the state detection system U according to the present embodiment, a plurality of such sensor tags 1 are embedded in the concrete along the extending direction of the reinforcing bars, for example, when the reinforced concrete M1 is constructed. When the sensor tag 1 is attached to the surface of the reinforced concrete M1, it is difficult for the sensor tag 1 to detect the state of corrosion of the reinforcing bars inside the reinforced concrete M1. Therefore, in the state detection system U according to the present embodiment, the sensor tag 1 is arranged inside the reinforced concrete M1.

For example, the reader 2 acquires the reflected wave spectrum of each inspection target position Ma of the reinforced concrete M1 while scanning the inspection target area of the reinforced concrete M1 with electromagnetic waves.

The analysis device 3 refers to the reflected wave spectra obtained at each inspection target position Ma of the reinforced concrete M1 and compares them to estimate the distribution of the state of corrosion of the reinforcing bars in the reinforced concrete. Corrosion of reinforcing bars in the reinforced concrete M1 progresses locally from easily corroded portions over time after construction of the reinforced concrete M1. From this point of view, the analysis device 3 finds the inspection target position Ma where the corroded portion M1Q occurs, for example, by analyzing the identity of the reflected wave spectrum obtained at each inspection target position Ma of the reinforced concrete M1. Then, the analysis device 3 determines whether or not the reinforcing bars are corroded at all inspection target positions Ma of the reinforced concrete M1, and generates a material state distribution image (see the right diagram of FIG. 16A) from the determination result.

With such a configuration, the state detection system U according to the present embodiment makes it possible to grasp the presence or absence of the corroded portion M1Q in the reinforced concrete M1 and the location of the corroded portion M1Q.

At this time, the analysis device 3 may store in advance corrosion degree determination reference data that associates the degree of decrease in the peak intensity of the resonance peak of the sensor tag 1 with the degree of corrosion of the reinforcement. In this case, the analysis device 3, for example, from the degree of decrease in the peak intensity of the resonance peak in the reflected wave spectrum at the inspection target position Ma where the corroded portion M1Q occurs with respect to the reflected wave spectrum of the uncorroded rebar, The corrosion degree of the reinforcing bar at the inspection target position Ma may be estimated by referring to the corrosion degree discrimination reference data.

In addition, in the state detection system U according to the present embodiment, for example, after the construction of the reinforced concrete M1, it is preferable to monitor the temporal change of the state of the reinforced concrete M1 (that is, the degree of corrosion of the reinforcing bars) through periodic inspections by workers. preferable. In other words, the analysis device 3 monitors, for example, the time-dependent change in the reflected wave spectrum (for example, the time-dependent change in the peak intensity of the resonance peak) obtained at each inspection timing, and is used as a reference for estimating the state of corrosion of the reinforcing bars in the reinforced concrete M1. Information is preferred. This makes it possible to more accurately estimate the distribution of the state of corrosion of reinforcing bars in reinforced concrete.

With the configuration described above, the state detection system U according to the present embodiment can monitor the state of corrosion of reinforcing bars in the reinforced concrete M1 and reliably perform maintenance and management of the reinforced concrete M1.

[Example 2]
FIG. 17A is a diagram illustrating an embodiment of the state detection system U according to the second embodiment.

In recent years, fiber reinforced resins such as CFRTP have attracted attention as lightweight and strong materials. Injection molding is generally used as one of the means for molding fiber reinforced resin, but when a large area member is molded by injection molding, at the end away from the injection nozzle in the fiber reinforced resin, the fibers The problem is that the content decreases, the fibers become unaligned, and the strength of the fiber-reinforced resin decreases.

In order to solve this problem, the state detection system U according to the present embodiment uses a fiber reinforced resin as an inspection target object M, and the fiber content and the fiber content in the fiber reinforced resin (hereinafter referred to as "fiber reinforced resin M2") and/or to detect the distribution of fiber alignment (ie, orientation).

In the state detection system U according to this embodiment, a plurality of sensor tags 1 are arranged, for example, by affixing method over the entire back surface of the injection-molded fiber reinforced resin M2. In addition, in the state detection system U according to the present embodiment, for example, in order to detect the degree of alignment of the fibers and the content of the fibers for each inspection target position Ma in the fiber reinforced resin M2, for each inspection target position Ma A sensor tag 1 for detecting the degree of alignment of fibers (see FIGS. 9A and 9B) and a sensor tag 1 for detecting the content of fibers (see FIGS. 7A and 7B) are arranged.

FIG. 17B is a diagram showing differences in reflected wave spectra of the sensor tag 1 due to differences in the degree of alignment of fibers in the fiber reinforced resin M2. For example, when the fibers in the fiber-reinforced resin M2 are aligned parallel to the extending direction of the resonator length of the resonator 1a of the sensor tag 1, the resonance peak in the sensor tag 1 (resonance The peaks f2a, f2b, f2c) increase. Therefore, when the degree of alignment of the fibers in the fiber reinforced resin M2 is high (that is, the orientation is high), the reflected wave spectrum of the sensor tag 1 becomes a reflected wave spectrum like the solid line in FIG. When the fibers inside are not aligned, the reflected wave spectrum is such that the resonance peaks f2a, f2b, and f2c disappear, as indicated by the dotted line in FIG. 17B.

FIG. 17C is a diagram showing differences in reflected wave spectra due to differences in fiber content in the fiber reinforced resin M2. The amount of fiber content in the fiber reinforced resin M2 is expressed as a change in dielectric constant of the fiber reinforced resin M2, for example. Therefore, when the fiber content in the fiber reinforced resin M2 is high, the reflected wave spectrum of the sensor tag 1 has a resonance peak (resonance The position of the peak f2d) will change.

The reader 2 is arranged above the fiber reinforced resin M2 being conveyed by the conveyor and separated from the conveyor by several meters. An electromagnetic wave is transmitted to the existence position of 1, and the reflected wave spectrum of each inspection target position Ma of the fiber reinforced resin M2 is acquired.

The analysis device 3 compares the reflected wave spectrum obtained at each inspection target position Ma of the fiber reinforced resin M2, and the distribution of the fiber content and/or the degree of alignment (that is, orientation) of the fibers in the fiber reinforced resin M2. to estimate For example, the analysis device 3 determines that an abnormal position exists in the fiber reinforced resin M2 when the fiber content rate and orientation are uneven among a plurality of inspection target positions Ma in the fiber reinforced resin M2. do. Then, when the fiber content rate and orientation are uneven in the manufactured fiber reinforced resin M2, the analysis device 3 instructs the conveying device to discard the fiber reinforced resin M2.

On the other hand, the analysis device 3 estimates the reflected wave spectrum in a normal state from the reflected wave spectrum obtained at the central position near the injection nozzle in the fiber reinforced resin M2, and based on this, from the injection nozzle in the fiber reinforced resin M2 Abnormality or the like at the remote end may be determined.

With the configuration described above, the state detection system U according to the present embodiment can suppress unevenness in the fiber content and orientation in the fiber reinforced resin M2.

In the state detection system U according to this embodiment, when using the sensor tag 1 shown in FIG. , the sensitivity of the sensor tag 1 to the degree of alignment of the fibers in the fiber reinforced resin M2 may be reduced. Therefore, in the state detection system U according to the present embodiment, when using the configuration of the sensor tag 1 shown in FIG. It is preferable to provide sensor tags 1 of different types. On the other hand, in order to avoid direction dependence of the sensitivity of the sensor tag 1, the resonator 1a of the sensor tag 1 may be ring-shaped.

[Example 3]
FIG. 18A is a diagram illustrating an embodiment of the state detection system U according to the third embodiment.

In recent years, as sheet-like products have become thinner, in the roll manufacturing process, uneven pressure applied to the rollers in the process and to the winding core around which the sheet-like products are wound has adversely affected the quality of the roll products. has become an issue. Therefore, there is a demand to quantitatively control the pressure unevenness inside the roll in order to optimize the tension during winding of the roll product.

In order to solve this problem, the state detection system U according to the present embodiment uses a winding core around which a sheet product is wound as an object M to be inspected, and the distribution of pressure applied to the winding core (hereinafter referred to as "winding core M3"). It is used for detecting

FIG. 18B is a diagram showing an example of changes in reflected wave spectrum of the sensor tag 1 observed when pressure unevenness occurs in the winding core M3. FIG. 18C is a diagram showing an example of a material state distribution image generated by the analysis device 3. FIG.

In the state detection system U according to this embodiment, the sensor tag 1 is attached to the outer peripheral surface of the winding core M3, for example, before the sheet-shaped product Mf is wound, and the sheet-shaped product Mf is attached to the winding core M3. At each winding timing, the pressure applied from the sheet product Mf to the winding core M3 is detected. As the sensor tag 1 according to this embodiment, for example, one having a conversion portion 1d made of an anisotropic conductive film whose conductivity changes with pressure is used (see FIG. 11A). As a result, the sensor tag 1 converts changes in the pressure applied to the winding core M3 into changes in its own electromagnetic wave reflection characteristics. That is, the sensor tag 1 changes the conductivity of the conversion portion 1d in accordance with the change in the pressure applied to the winding core M3, thereby changing the peak intensity of the resonance peak in the reflected wave spectrum.

In the state detection system U according to the present embodiment, such sensor tags 1 are arranged over the entire area of the winding core M3 (see, for example, the left diagram of FIG. 18C), and the pressure distribution applied to the winding core M3 is detected. .

The reader 2 is arranged, for example, on the inner peripheral surface side of the winding core M3, and at each timing when the sheet-like product Mf is wound around the winding core M3, the reader 2 detects each inspection target position Ma of the winding core M3. An electromagnetic wave is transmitted and received, and a reflected wave spectrum of each inspection target position Ma of the winding core M3 is obtained.

The analysis device 3 compares the reflected wave spectra obtained at each inspection target position Ma of the winding core M3 at each timing when the sheet product Mf is wound around the winding core M3, and performs each inspection of the winding core M3. Estimate the distribution of pressure applied to the target position Ma. At this time, the analysis device 3 determines, for example, whether or not the reflected wave spectra obtained at each inspection target position Ma of the winding core M3 have the same pattern. Always monitor whether or not pressure unevenness occurs.

When pressure unevenness begins to appear on the outer peripheral surface of the winding core M3, the analysis device 3 adjusts the curvature of the rollers in the upstream process, etc., and eliminates the pressure unevenness applied to the winding core M3. At this time, the analysis device 3 determines at which position in the winding core M3 the reflected wave spectrum has changed to an abnormal state, and whether the change in the reflected wave spectrum is in the increasing direction of the peak intensity of the resonance peak or in the decreasing direction. and the degree of the change, the curvature and the like of the rollers in the upstream process are adjusted.

With the configuration described above, the state detection system U according to the present embodiment can suppress pressure unevenness occurring in the winding core M3.

In addition, in the state detection system U according to the present embodiment, by detecting the pressure itself applied to the core M3, it is possible to adjust the curvature of the rollers in the upstream process, etc. It is possible to eliminate unevenness in the pressure applied to the core M3 at an earlier stage than the timing of detecting the occurrence of a change in the appearance of the Mf due to deterioration in quality. Therefore, according to the state detection system U according to the present embodiment, it is possible to reliably avoid deterioration in product quality due to uneven pressure applied to the winding core M3.

In the above description, the configuration of the state detection system U for detecting the distribution of pressure applied to the winding core M3 is shown. The configuration of the state detection system U for detecting the pressure distribution can also be realized with a configuration similar to that described above.

[Example 4]
FIG. 19A is a diagram illustrating an embodiment of the state detection system U according to the fourth embodiment.

In general, many car accidents are caused by tire trouble, the main cause of which is the decrease in air pressure and wear of the tires. While many services for monitoring air pressure are provided, the technology for automatically measuring wear is not yet common. As the use of IoT in automobiles accelerates in anticipation of autonomous driving, there is a demand for automation of maintenance, and there is a demand for enabling automatic real-time measurement of tire wear. In particular, depending on the driving style, such as sudden braking or touch-and-go, uneven tire wear often occurs on the entire circumference. It is one of the reasons why it is not possible.

In order to solve this problem, the state detection system U according to the present embodiment is applied to detect the wear distribution of a tire (hereinafter referred to as "tire M4") using a vehicle tire as an inspection target object M. ing.

FIG. 19B is a diagram showing an example of changes in reflected wave spectrum of the sensor tag 1 observed when the tire M4 wears. FIG. 19C is a diagram showing an example of a material state distribution image generated by the analysis device 3. FIG.

In the state detection system U according to this embodiment, the sensor tag 1 is embedded, for example, inside the tire M4 (for example, the area between the tread and the belt that constitute the tire M4). Then, when the tread of the tire M4 wears, the sensor tag 1 changes a part of the underlying portion of the sensor tag 1 into an air layer, and the sensor tag 1 resonates its own reflected wave spectrum so as to respond to the state in which the dielectric constant is lowered. Change the position of the peak to the high frequency side (see FIG. 19B).

In the condition detection system U according to this embodiment, the sensor tag 1 is arranged, for example, over the entire circumference of the tire M4, and the wear condition of the entire surface of the tire M4 is sequentially monitored.

The reader 2 is arranged, for example, at a position facing the tire M4 inside the vehicle, separated from the tread outer peripheral surface of the tire M4 by about 30 cm. An electromagnetic wave is transmitted to one existing position, and the reflected wave spectrum of each of the plurality of inspection target positions Ma of the tire M4 is acquired. In addition, the reader 2 may be arranged under the road surface in order to deal with a vehicle not equipped with a reader.

The analysis device 3 compares the reflected wave spectra obtained at each of the plurality of inspection target positions Ma of the tire M4, and estimates the distribution of the wear state of the plurality of inspection target positions Ma in the tire M4. At this time, the analysis device 3, for example, determines whether or not the reflected wave spectra obtained at each of the plurality of inspection target positions Ma in the tire M4 have the same pattern. Whether or not it has occurred is constantly monitored, and the monitoring result is output as a material state distribution image (see FIG. 19C).

At this time, for example, when a reflected wave spectrum indicating an abnormal state is found among the reflected wave spectra obtained at each of the plurality of inspection target positions Ma in the tire M4, the analysis device 3 The degree of wear at that location may be determined based on the amount of frequency shift in the wave spectrum.

The state detection system U according to the present embodiment can reliably detect wear occurring in the tire M4 with the configuration described above.

[Example 5]
FIG. 20A is a diagram illustrating an embodiment of the state detection system U according to the fifth embodiment.

In general, belt conveyors are known to break due to deterioration over time when operated in a poor environment. Once broken, it takes a long time to replace, resulting in downtime loss. Typical causes of breakage of such belt conveyors include peeling of the belts at the belt joints that connect the belts, and cracks that occur in the belt main body.

In order to solve this problem, the state detection system U according to the present embodiment uses a belt conveyor as an inspection target object M to detect peeling and cracking of the belt that occurs in the belt conveyor (hereinafter referred to as "belt conveyor M5"). It is used for detecting

FIG. 20B shows changes in the reflected wave spectrum of the sensor tag 1 observed when the belt peeling occurs at the belt joint portion ML1 of the belt conveyor M5 and when a crack occurs at the belt main body portion ML2 of the belt conveyor M5. It is a figure which shows an example.

In the state detection system U according to the present embodiment, the sensor tag 1 is interposed between one belt and the other belt at the belt junction ML1 of the belt conveyor M5, as shown in the enlarged view of FIG. , and is arranged on the back side of the belt main body ML2 of the belt conveyor M5.

When the belt joint ML1 of the belt conveyor M5 separates from the sensor tag 1 disposed at the belt joint ML1 of the belt conveyor M5, part of the periphery of the sensor tag 1 changes into an air layer, and the underlying portion of the sensor tag 1 changes. Detects that the dielectric constant of That is, the sensor tag 1 disposed at the belt joint portion ML1 of the belt conveyor M5 detects the separation state of the belt joint portion ML1 as a change in the peak position of the resonance peak in the reflected wave spectrum (here, shifting to the high frequency side). information related to the occurrence of is passed to the reader 2.

In addition, when a crack occurs in the belt conveyor M5, the sensor tag 1 disposed on the belt main body ML2 of the belt conveyor M5 changes part of the periphery of the sensor tag 1 into an air layer, and the underlying portion of the sensor tag 1 changes. Detects a decrease in dielectric constant. That is, the sensor tag 1 disposed on the belt main body ML2 of the belt conveyor M5 detects cracks in the belt main body ML2 as changes in the peak position of the resonance peak in the reflected wave spectrum (here, shifting to the high frequency side). Information related to the occurrence is passed to the reader 2 .

Here, since the distance between the belt joint portion ML1 and the belt main body portion ML2 is close, the sensor tag 1 arranged at the belt joint portion ML1 and the sensor tag 1 arranged at the belt main body portion ML2 have different resonance frequencies. Sensor tag 1 is adopted. In other words, this allows the reader 2 to detect both the state of the belt joint portion ML1 and the state of the belt main body portion ML2 by transmitting and receiving electromagnetic waves once.

In the state detection system U according to this embodiment, such sensor tags 1 are arranged over the entire circumference of the belt conveyor M5.

The reader 2 is arranged, for example, several meters apart from the belt conveyor M5, transmits an electromagnetic wave to the existing position of the sensor tag 1 in the belt conveyor M5, and detects the reflected wave spectrum of each inspection target position Ma of the belt conveyor M5. to get Then, the analysis device 3 compares the reflected wave spectra obtained at each inspection target position Ma of the belt conveyor M5, and estimates the distribution of the peeling occurrence state and the crack occurrence state at each inspection target position Ma of the belt conveyor M5.

With the configuration described above, the state detection system U according to the present embodiment can reliably perform maintenance management of the belt conveyor M5 and prevent damage to the belt conveyor M5.　

[Example 6]
FIG. 21 is a diagram illustrating an embodiment of the state detection system U according to the sixth embodiment.

In general, it is known that rubber products and sheet-like products are partially stretched during the manufacturing process, causing partial changes in material properties such as dielectric constant. However, since the dielectric constant in rubber products and sheet-like products cannot be visualized, the conventional hyper-imaging method cannot capture changes in material properties that occur in rubber products and sheet-like products.

In order to solve this problem, the state detection system U according to the present embodiment uses a rubber product as an inspection target object M, and the rubber product (hereinafter referred to as "rubber product M6") partially generates It is used for detecting changes in dielectric constant. In the following, only the configuration for detecting the dielectric constant distribution in the rubber product M6 will be shown, but the configuration for detecting the dielectric constant distribution in the sheet-like product can also be realized with the same configuration. .

　In the state detection system U according to the present embodiment, the sensor tag 1 is attached, for example, to the back surface of the rubber product M6. In the state detection system U according to this embodiment, the sensor tags 1 are arranged over the entire area of the rubber product M6 to detect the dielectric constant of each inspection target position Ma of the rubber product M6. In the sensor tag 1, when the dielectric constant of the rubber product M6 changes, the peak position of the resonance peak changes. , to detect changes in the dielectric constant of the rubber product M6.

The reader 2 is arranged, for example, during the quality control process of the manufactured rubber product M6. For example, the leader 2 is spaced apart from the rubber product M6 during the process in which the manufactured rubber product M6 is conveyed. An electromagnetic wave is transmitted to the existing position of the sensor tag 1 of the product M6, and the reflected wave spectrum of each of the plurality of inspection target positions Ma in the rubber product M6 is obtained.

For example, the analysis device 3 determines whether or not the reflected wave spectra obtained at each of the plurality of inspection target positions Ma in the rubber product M6 have the same pattern, thereby determining the dielectric constant in the rubber product M6. It constantly monitors whether or not any abnormality has occurred, and outputs the monitoring result as a material condition distribution image.

With the configuration described above, the state detection system U according to the present embodiment can reliably perform quality control of the rubber product M6.

[Example 7]
22A, 22B, and 22C are diagrams illustrating an embodiment of the state detection system U according to the seventh embodiment.

In general, many sheet products M7 are formed by laminating a plurality of different types of single-layer sheets M7a and M7b (see FIG. 22A). In order to assure the quality of the sheet-like product M7, there is a demand for a method of non-destructively inspecting the cured state of the bonded portion where the single-layer sheets M7a and M7b in the sheet-like product M7 are bonded together.

In order to solve this problem, the state detection system U according to the present embodiment is applied to detect the hardened state of the joints in the sheet-like product M7 as the inspection target object M. .

Note that FIG. 22A schematically shows the manufacturing process of the sheet product M7. Moreover, FIG. 22B shows an arrangement mode of the sensor tag 1 for performing peeling inspection in the sheet-like product M7. Further, FIG. 22C is a diagram showing an example of changes in the reflected wave spectrum observed when a peeled portion M7Q occurs in the sheet-like product M7.

In the state detection system U according to the present embodiment, the sensor tag 1 detects, for example, the peeled state of the joints in the sheet product M7 from the change in the dielectric constant of the underlying portion of the sensor tag 1. That is, the sensor tag 1 detects that when the joint in the sheet product M7 is peeled off, part of the part changes to an air layer and the dielectric constant around the sensor tag 1 (resonator) decreases. .

In the state detection system U according to this embodiment, the sensor tags 1 are arranged, for example, on a sensor group installation sheet 100 on which many sensor tags 1 are arranged on the entire surface. In the state detection system U according to the present embodiment, the sensor group installation sheet 100 is placed so that the sensor tag 1 is brought into contact with one surface of the completed sheet product M7 during the quality control process.

The reader 2 transmits electromagnetic waves to the sensor group installation sheet 100 and the sheet-like product M7 in a state where the sensor group installation sheet 100 is placed on the sheet-like product M7. Acquire the reflected wave spectrum of Ma.

The analysis device 3 compares the reflected wave spectra obtained at each of the positions Ma to be inspected in the sheet-like product M7, and determines whether the reflected wave spectra obtained at each of the positions Ma to be inspected in the sheet-like product M7 have the same pattern. It is determined whether or not. Based on this, it is estimated whether or not the peeled portion M7Q is generated at any position in the entire area of the sheet-shaped product M7.

With the configuration described above, the state detection system U according to the present embodiment can reliably perform quality control of the sheet product M7.

[Example 8]
FIG. 23A is a diagram illustrating an embodiment of the state detection system U according to the eighth embodiment.

In recent years, smart agriculture has been attracting attention due to concerns over food, such as a decrease in the number of farmers, global climate change, and population growth. In smart agriculture, the environment inside the house is controlled using various sensors, but most of the physical quantities use the values of the sensors at the representative points in the large house, and the variations depending on the location in the house cannot be reflected. not For example, watering to the ridges in the house is indirectly converted from the water flow rate, and there is a problem that even if there is unevenness in watering due to individual differences in nozzles, it cannot be detected. Moreover, the speed of drying due to differences in the environment such as sunlight and the distance from the wall of the house cannot be taken into consideration.

In order to solve this problem, the state detection system U according to the present embodiment detects the distribution of the water content in the soil (hereinafter referred to as "soil M8"), which is the soil in the greenhouse as the inspection target object M. It is applied for the use to do.

FIG. 23B is a diagram showing an example of an arrangement mode of sensor tags 1 for monitoring the moisture content distribution of soil M8. FIG. 23C shows the reflected wave spectrum of the sensor tag 1 observed when there is sufficient moisture in the soil M8, and the sensor tag 1 observed when there is no moisture in the soil M8 (dry state). is a diagram showing a reflected wave spectrum of .

In the state detection system U according to this embodiment, the sensor tag 1 is arranged on or inside the soil M8, for example. For example, the sensor tag 1 according to the present embodiment has a structure having a conversion part 1d that affects the resonance state of the resonator 1a according to changes in the moisture content of the soil M8 (see FIG. 12B). . Then, the conversion unit 1d collects water in the soil M8, and causes a change in the peak position and/or the peak intensity of the resonance peak of the resonator 1a according to the change in the water content of the soil M8. Here, when a sufficient amount of water is present in the soil M8, the conversion unit 1d collects the water in the soil M8, suppresses the flow of the resonance current around the resonator 1a, and suppresses the resonance current of the resonator 1a. It works to reduce peaks. Note that the conversion unit 1d may be configured to cause a change in permittivity around the resonator 1a in accordance with a change in the moisture content of the soil M8. That is, the sensor tag 1 according to this embodiment detects changes in the water content of the soil M8 as changes in the peak position and/or the peak intensity of the resonance peak.

In the state detection system U according to the present embodiment, the sensor tag 1 is arranged at each position (inspection target position Ma) where the plant to be observed exists in the entire area of the soil M8, and each inspection target position Ma of the soil M8 is arranged. to detect the moisture content of

The reader 2, for example, transmits electromagnetic waves to the position where the sensor tag 1 exists in the soil M8, and acquires the reflected wave spectrum of each inspection target position Ma in the soil M8. Further, the analysis device 3 determines, for example, whether or not the reflected wave spectrum of each inspection target position Ma in the soil M8 has the same pattern. It constantly monitors whether or not there is any, and outputs the monitoring result as a material state distribution image.

In addition, in the state detection system U according to the present embodiment, for example, when a dry place occurs in the soil M8, water is selectively supplied to the dry place to suppress root rot of the plant. may

With the configuration described above, the state detection system U according to the present embodiment can monitor the occurrence of unevenness in the amount of moisture in the soil M8 inside the house.

[Example 9]
FIG. 24A is a diagram illustrating an embodiment of the state detection system U according to the ninth embodiment.

In Example 8, we focused on the importance of detecting the amount of moisture in the soil inside the greenhouse, but in smart agriculture, in addition to detecting the amount of moisture in the soil, we are also interested in monitoring the temperature distribution. In particular, there is a demand for monitoring the surface temperature of crops because excessive heat applied to crops before harvest by sunlight deteriorates the quality of the crops.

In order to solve this problem, the state detection system U according to the present embodiment is used to detect the distribution of temperature in a plant (hereinafter referred to as "plant M9") in a greenhouse as an object to be inspected M. applied to

FIG. 24B is a diagram showing an example of changes in the reflected wave spectrum of the sensor tag 1 according to changes in the temperature of the plant M9.

In the state detection system U according to this embodiment, the sensor tag 1 is attached, for example, to the surface of the fruit in the plant M9. For example, the sensor structure shown in FIG. 12B is applied to the sensor tag 1 according to the present embodiment, and the conversion unit 1d responds to the temperature of the fruit to cause a change in dielectric constant around the resonator 1a. Note that FIG. 24B shows changes in the reflected wave spectrum when a paraffin-impregnated nonwoven fabric that melts at 60 degrees is used as the converting portion 1d. The position of the resonance peak of the resonator 1a changes when the frequency exceeds the degree.

In the state detection system U according to this embodiment, the sensor tag 1 is arranged for each fruit (inspection target position Ma) in the plant M9 to detect the temperature of each fruit in the plant M9.

For example, the reader 2 transmits electromagnetic waves to each inspection target position Ma in the plant M9, and acquires the reflected wave spectrum of each inspection target position Ma in the plant M9. Further, the analysis device 3, for example, determines whether or not the reflected wave spectrum of each inspection target position Ma in the plant M9 has the same pattern. It constantly monitors whether or not (for example, partial direct sunlight) is generated, and outputs the monitoring result as a material condition distribution image.

In addition, in the state detection system U according to the present embodiment, for example, when a temperature abnormality occurs at an inspection target position Ma in the plant M9, a heat shielding curtain is selectively applied to the inspection target position Ma. may be performed.

With the configuration described above, the state detection system U according to the present embodiment can monitor the occurrence of temperature unevenness in the plant M9.

<effect>
As described above, the state detection system U according to the present disclosure is
an electromagnetic wave responsive material disposed in a state of being responsive to the state of the material to be detected of the object to be inspected, and changing its own electromagnetic wave reflection characteristics according to the state of the material;
a reader that transmits an electromagnetic wave from the outside of the object to be inspected to the position where the electromagnetic wave responsive material is arranged in the object to be inspected, receives the reflected wave, and acquires the spectrum of the reflected wave; ,
By referring to the spectra acquired at a plurality of positions in the object to be inspected during the same time period by the reader and comparing them with each other and/or generating reference data based thereon, an analysis device for estimating the distribution of the material state in the inspected object;
Prepare.

Therefore, according to the state detection system U according to the present disclosure, an abnormality occurring in a part of the inspection object M (for example, the inspection object M occurrence of internal corrosion and abnormalities in the composition of the constituent materials in the object M to be inspected) can be detected accurately and easily. In addition, this makes it difficult to store, in advance, identifiable reference data of reflected wave spectra of all patterns assuming various environmental changes through experiments and simulations, as in the state detection system according to the prior art. and complicated work can be avoided.

In addition, according to the state detection system U according to the present disclosure, it is possible to provide the user with the distribution of the state of materials in the object M to be inspected as a state distribution image. As a result, the user can easily grasp the material condition of the entire inspection object M without overlooking an abnormality occurring in a part of the inspection object M. In addition, this also enables the user to easily perform, for example, repair work (for example, reinforcement work for a concrete structure) on the object M to be inspected.

In the above embodiment, the chipless sensor tag 1 is shown as an example of the electromagnetic wave responsive material arranged in the object M to be inspected. However, in the state detection system U according to the present disclosure, if the electromagnetic wave response material responds to the state of the material to be detected of the object to be inspected and changes its own electromagnetic wave reflection characteristics according to the state of the material, the chipless Unlike the sensor tag 1, it may not have a resonator 1a.

Specific examples of the present invention have been described in detail above, but these are merely examples and do not limit the scope of the claims. The technology described in the claims includes various modifications and changes of the specific examples illustrated above.

The disclosure contents of the specification, drawings and abstract contained in the Japanese application of Japanese Patent Application No. 2021-079664 filed on May 10, 2021 are incorporated herein by reference.

U state detection system
1 Chipless sensor tag (electromagnetic wave response material)

1a resonator

1b isolation layer 1c rear reflector 1d converter 1e electromagnetic wave reflector 2 reader 21 transmitter 22 receiver 23 controller 3 analyzer 31 material state estimator 32 image display M (M1, M2, M3, M4 , M5, M6, M7, M8, M9) Object to be inspected Ma Position to be inspected

Claims

An electromagnetic wave reading type state detection system,
an electromagnetic wave responsive material disposed in a state sensitive to the state of the material to be detected of the object to be inspected;
a reader that transmits an electromagnetic wave from the outside of the object to be inspected to the position where the electromagnetic wave responsive material is arranged in the object to be inspected, receives the reflected wave, and acquires the spectrum of the reflected wave; ,
an analysis device for estimating the distribution of the material state in the object to be inspected based on the spectra obtained at a plurality of positions in the object to be inspected during the same time period;
A condition detection system comprising:
The distribution of the material state in the inspection target object estimated by the analysis device is a normal/abnormal distribution of the material state in the inspection target object,
The condition detection system of claim 1.
The analysis device refers to the spectra acquired at a plurality of positions in the inspection target object in the same time period, compares them with each other, and/or generates reference data based on them, estimating a distribution of the material state in the inspected object;
The state detection system according to claim 1 or 2.
The analysis device analyzes the spectrum acquired at the plurality of positions and/or the identity of the electromagnetic wave reflection characteristics of the electromagnetic wave responsive material appearing in the spectra, thereby determining the distribution of the state of the material in the object to be inspected. to estimate
The state detection system according to any one of claims 1 to 3.
The reader transmits and receives electromagnetic waves so as to scan a predetermined area of the object to be inspected, and acquires the spectrum of the reflected wave at each of the plurality of positions in the object to be inspected.
The state detection system according to any one of claims 1 to 4.
The analysis device superimposes an image showing the distribution of the material state on the electromagnetic wave reflection intensity image of the inspection target object and/or the camera image of the inspection target object, and outputs the image for display.
The state detection system according to any one of claims 1 to 5.
The reader obtains the spectrum by transmitting an electromagnetic wave over a predetermined frequency band to the object to be inspected by a sweep method or an impulse method.
The state detection system according to any one of claims 1 to 6.
The electromagnetic wave responsive material is a chipless sensor tag having a resonator that resonates with an externally irradiated electromagnetic wave of a specific frequency,
The electromagnetic wave responsive material is configured such that the position of the resonance peak and/or the signal intensity of the resonance peak of the resonator changes according to the change in the material state.
The condition detection system according to any one of claims 1 to 7.
The electromagnetic wave responsive material is made of a material that changes at least one of a dielectric constant, a dielectric loss tangent, and an electrical conductivity in response to the material state of the inspection target object, and is disposed integrally with the resonator. including the part
The condition detection system according to claim 8.
A plurality of electromagnetic wave responsive materials distributed over the entire inspection target area of the inspection target object and arranged to individually detect the material state of the inspection target object,
A condition detection system according to any one of claims 1 to 9.
The plurality of electromagnetic wave responsive materials are arranged at equal intervals in the inspection target area of the inspection target object,
The condition detection system of claim 10.
The electromagnetic wave responsive material is arranged in a state of being applied or attached to the surface of the object to be inspected,
A condition detection system according to any one of claims 1 to 11.
The electromagnetic wave responsive material is arranged inside the object to be inspected integrally with a material constituting the object to be inspected,
A condition detection system according to any one of claims 1 to 12.
The electromagnetic wave responsive material is configured to respond to electromagnetic waves in a frequency band of UWB band, millimeter wave band or sub-millimeter wave band,
14. A condition detection system according to any one of claims 1-13.
wherein the material condition to be detected is a corrosion condition of a constituent material in the inspected object;
15. A condition detection system according to any preceding claim.
wherein the material state to be detected is the compositional state of constituent materials in the inspected object;
15. A condition detection system according to any preceding claim.
wherein the material state to be detected is the orientation state of constituent materials in the inspected object;
15. A condition detection system according to any preceding claim.
wherein the material condition to be detected is a pressure condition in the inspected object;
15. A condition detection system according to any preceding claim.
wherein the material condition to be detected is a wear condition in the inspected object;
15. A condition detection system according to any preceding claim.
wherein the material condition to be detected is a crack occurrence condition in the inspected object;
15. A condition detection system according to any preceding claim.
wherein the material state to be detected is the dielectric constant in the object under test;
15. A condition detection system according to any preceding claim.
The material state to be detected is a delamination state of a region where a plurality of members are joined together in the object to be inspected.
15. A condition detection system according to any preceding claim.
wherein the material condition to be detected is moisture content in the inspected object;
15. A condition detection system according to any preceding claim.
the material condition to be detected is the temperature in the inspected object;
15. A condition detection system according to any preceding claim.