WO2022114237A1 - Carbon film - Google Patents

Carbon film Download PDF

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Publication number
WO2022114237A1
WO2022114237A1 PCT/JP2021/043974 JP2021043974W WO2022114237A1 WO 2022114237 A1 WO2022114237 A1 WO 2022114237A1 JP 2021043974 W JP2021043974 W JP 2021043974W WO 2022114237 A1 WO2022114237 A1 WO 2022114237A1
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cnt
carbon film
carbon
aggregate
carbon nanotube
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PCT/JP2021/043974
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French (fr)
Japanese (ja)
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智子 山岸
貢 上島
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日本ゼオン株式会社
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Priority to JP2022565519A priority Critical patent/JPWO2022114237A1/ja
Publication of WO2022114237A1 publication Critical patent/WO2022114237A1/en

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    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/15Nano-sized carbon materials
    • C01B32/158Carbon nanotubes
    • C01B32/16Preparation
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00Screening of apparatus or components against electric or magnetic fields

Definitions

  • the present invention relates to a carbon film.
  • CNT carbon nanotubes
  • CNT aggregate an aggregate composed of a plurality of CNTs
  • Patent Document 1 uses a carbon nanotube aggregate having a region of 10 nm or more in which pores having a bore size of 400 nm or more and 1500 nm or less, which are measured by a mercury intrusion method, have a Log differential pore volume of 0.006 cm 3 / g or less. Therefore, a carbon film having excellent mechanical strength is formed.
  • electromagnetic wave shielding has been attracting attention as an application of carbon film.
  • an object of the present invention is to provide a carbon film having excellent electromagnetic wave shielding performance.
  • the present inventors have made extensive studies to achieve the above object. Then, the present inventors investigated the microscopic properties of the carbon film formed by using the carbon nanotube aggregate, and the carbon film having an average surface roughness of 4.0 ⁇ m or more shields electromagnetic waves well. We have newly found what we can obtain and completed the present invention.
  • the present invention aims to solve the above problems advantageously, and the carbon film of the present invention is a carbon film made of an aggregate of carbon nanotubes, and the average value of the surface roughness is 4. It is characterized in that it is 0 ⁇ m or more.
  • the average value of the surface roughness of the carbon film is 4.0 ⁇ m or more, the carbon film is excellent in electromagnetic wave shielding performance.
  • the surface roughness of the carbon film can be measured by the method described in the examples of the present specification.
  • the average value of the surface roughness is 5.0 ⁇ m or more.
  • the electromagnetic wave shielding performance is further excellent.
  • the carbon film of the present invention is preferably a self-supporting film.
  • the carbon film which is a self-supporting film, has excellent handleability, and when used as an electromagnetic wave shielding sheet, for example, the degree of freedom in arranging the sheet can be increased.
  • the "self-supporting film” refers to a film that can maintain its film shape by itself without being damaged even in the absence of a support.
  • the carbon nanotube aggregate satisfies at least one of the following conditions (1) to (3).
  • a pore distribution curve showing the relationship between the pore diameter and the Log differential pore volume obtained from the adsorption isotherm of liquid nitrogen at 77K based on the Barrett-Joiner-Halenda method.
  • the largest peak in is in the range of pore diameters greater than 100 nm and less than 400 nm.
  • At least one peak of the two-dimensional spatial frequency spectrum of the electron microscope image of the carbon nanotube aggregate exists in the range of 1 ⁇ m -1 or more and 100 ⁇ m -1 or less.
  • a carbon film made of an aggregate of carbon nanotubes satisfying the above-mentioned predetermined conditions is further excellent in electromagnetic wave shielding performance. The sufficiency of the above-mentioned predetermined conditions can be determined according to the method described in the examples.
  • the laser microscope image obtained about the surface of the carbon film produced in Example 1 is shown.
  • the laser microscope image obtained about the surface of the carbon film produced in Example 2 is shown.
  • the laser microscope image obtained about the surface of the carbon film produced in Example 3 is shown.
  • the laser microscope image obtained about the surface of the carbon film prepared in Example 4 is shown.
  • the laser microscope image obtained about the surface of the carbon film prepared in the comparative example 1 is shown.
  • An SEM image of the CNT aggregate according to an example is shown.
  • the FIR resonance chart acquired for the CNT aggregate according to an example is shown.
  • the pore distribution curve of the CNT aggregate according to an example is shown. It is an SEM image of the CNT aggregate according to one example. It is a two-dimensional spatial frequency spectrum of the image of FIG. 8A. It is an SEM image of the CNT aggregate according to another example.
  • 9 is a two-dimensional spatial frequency spectrum of the image of FIG. 9C.
  • the schematic configuration of the CNT manufacturing apparatus is shown.
  • the carbon film of the present invention is composed of an aggregate of a plurality of carbon nanotubes (a carbon nanotube aggregate).
  • the carbon film of the present invention may contain, for example, CNT aggregates and components other than CNTs inevitably mixed in the process of producing the carbon film, but the proportion of CNTs in the carbon film is 95% by mass.
  • the above is preferable, 98% by mass or more is more preferable, 99% by mass or more is further preferable, 99.5% by mass or more is particularly preferable, and 100% by mass (that is,).
  • the carbon film consists only of CNTs) is most preferable.
  • the carbon film of the present invention is composed of an aggregate of carbon nanotubes.
  • the carbon film of the present invention is characterized in that the average value of the surface roughness is 4.0 ⁇ m or more.
  • the carbon film of the present invention having an average surface roughness of 4.0 ⁇ m or more is excellent in electromagnetic wave shielding performance. Therefore, the carbon film of the present invention is not particularly limited, but can be advantageously used, for example, as an electromagnetic wave shielding sheet.
  • the carbon film of the present invention is preferably a self-supporting film. If the carbon film is a self-supporting film, the carbon film is excellent in handleability, and when used as an electromagnetic wave shielding sheet, for example, the degree of freedom in arranging the sheet is high.
  • the carbon film of the present invention having an average surface roughness of 4.0 ⁇ m or more, there are gaps of an appropriate size or more between the carbon nanotubes as constituents, and therefore, electromagnetic waves are generated in such gaps. It is presumed that the energy of the electromagnetic wave that has entered the carbon film can be attenuated by the diffused reflection. Therefore, according to the carbon film of the present invention, it is considered that excellent electromagnetic wave shielding performance can be exhibited.
  • the average value of the surface roughness of the carbon film needs to be 4.0 ⁇ m or more, preferably 5.0 ⁇ m or more, more preferably 5.5 ⁇ m or more, and 6.5 ⁇ m or more. More preferred. When the average value of the surface roughness of the carbon film is at least the above lower limit value, excellent electromagnetic wave shielding can be exhibited.
  • the average value of the surface roughness of the carbon film may be, for example, 30 ⁇ m or less.
  • FIGS. 1 to 5 show, as an example, laser microscope images obtained for carbon film surfaces having various average surface roughness values, which were produced in Examples 1 and Comparative Examples described later.
  • FIG. 1 is one of the laser microscope images of the carbon film surface prepared in Example 1, and the average value of the surface roughness calculated for the carbon film was 10.9 ⁇ m.
  • FIG. 2 is one of the laser microscope images of the carbon film surface prepared in Example 2, and the average value of the surface roughness calculated for the carbon film was 6.3 ⁇ m.
  • FIG. 3 is one of the laser microscope images of the carbon film surface prepared in Example 3, and the average value of the surface roughness calculated for the carbon film was 5.5 ⁇ m.
  • FIG. 1 is one of the laser microscope images of the carbon film surface prepared in Example 1, and the average value of the surface roughness calculated for the carbon film was 10.9 ⁇ m.
  • FIG. 2 is one of the laser microscope images of the carbon film surface prepared in Example 2, and the average value of the surface roughness calculated for the carbon film was 6.3 ⁇ m.
  • FIGS. 1 to 5 correspond to the relative intensities of the reflected light reflected by the surface of the single-layer film and detected by the sensor of the laser microscope when irradiated with the laser light. That is, in FIGS. 1 to 5, when the laser beam is irradiated, the portion having high brightness of the reflected light is displayed on the white side, and the portion having low brightness of the reflected light is displayed on the black side. From FIGS. 1 to 5, when the laser beam is irradiated, the portion having high brightness of the reflected light is displayed on the white side, and the portion having low brightness of the reflected light is displayed on the black side. From FIGS.
  • the amount of electromagnetic waves reflected from the surface of the carbon film is small when the average value of the surface roughness is large, in other words, the electromagnetic wave shielding performance is high and the average value of the surface roughness is small. In some cases, it can be estimated that the amount of electromagnetic waves reflected from the surface of the carbon film tends to be large, in other words, the electromagnetic wave shielding performance tends to be low.
  • the carbon film of the present invention is used to form a carbon film by forming an aggregate of carbon nanotubes into a carbon film.
  • a CNT aggregate satisfying at least any one of (1) to (3) described later is used.
  • the CNT aggregate Prior to the film formation of the CNT aggregate, the CNT aggregate is subjected to a dry pulverization treatment. It can be produced by satisfying at least one of the above.
  • CNT aggregate used for preparing the carbon film for example, a known CNT aggregate such as a CNT aggregate obtained by using the super growth method (see International Publication No. 2006/011655) can also be used. However, it is preferable to use a novel CNT aggregate that satisfies at least one of the conditions (1) to (3).
  • a carbon film made of a CNT aggregate satisfying at least one of the following conditions (1) to (3) is excellent in electromagnetic wave shielding performance.
  • the plasmon resonance of the carbon nanotube dispersion is obtained. There is at least one peak based on the wave number in the range of 300 cm -1 to 2000 cm -1 or less.
  • the pore distribution curve showing the relationship between the pore diameter and the Log differential pore volume, which is obtained from the adsorption isotherm of liquid nitrogen at 77K for the carbon nanotube aggregate based on the Barrett-Joiner-Halenda method. The largest peak is in the range of pore diameters greater than 100 nm and less than 400 nm.
  • At least one peak of the two-dimensional spatial frequency spectrum of the electron microscope image of the carbon nanotube aggregate exists in the range of 1 ⁇ m -1 or more and 100 ⁇ m -1 or less.
  • FIG. 6 shows a scanning electron microscope (SEM) image of an example of a CNT aggregate satisfying at least one of the above (1) to (3).
  • SEM scanning electron microscope
  • the condition (1) is "a carbon nanotube dispersion in a spectrum obtained by Fourier transform infrared spectroscopic analysis of a carbon nanotube dispersion obtained by dispersing carbon nanotube aggregates so that the bundle length is 10 ⁇ m or more. There is at least one peak based on the plasmon resonance in the range of wavenumbers of 300 cm -1 to 2000 cm -1 or less. "
  • strong absorption characteristics in the far infrared region are widely known as optical characteristics of CNTs. It is believed that the strong absorption characteristics in the far infrared region are due to the diameter and length of the CNTs.
  • the absorption characteristics in the far-infrared region more specifically, the relationship between the peak based on the plasmon resonance of CNT and the length of CNT, the non-patent document (T.Morimoto et.al., "Length-Dependent Plasmon” Resonance in Single-Walled Carbon Nanotubes ”, pp 9897-9904, Vol.8, No.10, ACS NANO, 2014).
  • the present inventors have detected a peak based on the plasmon resonance of CNT in the spectrum obtained by Fourier transform infrared spectroscopic analysis based on the contents of the study as described in the above non-patent document and the original knowledge.
  • the position to be used could be affected by the distance between the defect points in the CNT, and verification was performed. Then, the present inventors have found that the position where the peak based on the plasmon resonance of the CNT is detected can serve as an index corresponding to the distance between the bending points in the CNT having a wavy structure, and the above conditions. (1) was set.
  • the wave number is 300 cm -1 to 2000 cm -1 or less, preferably the wave number 500 cm -1 to 2000 cm -1 or less, and more preferably the wave number 650 cm -1 to 2000 cm -1 or less. If a peak based on the plasmon resonance of the CNT is present, the CNT can exhibit good electromagnetic wave shielding performance when forming a carbon film.
  • FIG. 7 shows a spectrum (FIR resonance chart) obtained by Fourier transform infrared spectroscopic analysis of the CNT aggregates used in Examples 1 to 4 and Comparative Example 1 described later.
  • the wave number is sharp around 840 cm -1 and around 1300 cm -1 and 1700 cm -1 . Can be seen to be confirmed. These sharp peaks do not correspond to "peaks based on plasmon resonance of carbon nanotube dispersion", and each corresponds to infrared absorption derived from a functional group.
  • the sharp peak near wave number 840 cm -1 is due to the CH out-of-plane angular vibration; the sharp peak near wave number 1300 cm -1 is due to the epoxy three-membered ring expansion and contraction vibration; wave number 1700 cm.
  • a peak similar to the S1 peak is detected.
  • the upper limit of the determination of the presence or absence of a peak based on the plasmon resonance of the CNT dispersion under the condition (1) was set to 2000 -1 cm or less.
  • CNT dispersion in order to acquire the spectrum by Fourier transform infrared spectroscopic analysis, it is necessary to obtain the CNT dispersion by dispersing the CNT aggregate so that the bundle length is 10 ⁇ m or more.
  • CNT aggregate, water, and a surfactant for example, sodium dodecylbenzene sulfonate
  • a dispersion liquid in which a CNT dispersion having a length of 10 ⁇ m or more is dispersed.
  • the bundle length of the CNT dispersion can be obtained by analyzing with a wet image analysis type particle size measuring device.
  • a measuring device calculates the area of each dispersion from an image obtained by photographing the CNT dispersion, and is also referred to as the diameter of a circle having the calculated area (hereinafter, also referred to as ISO circle diameter (ISO area diameter)). There is) can be obtained. Then, in the present specification, the bundle length of each dispersion is defined as the value of the ISO circle diameter thus obtained.
  • Condition (2) stipulates that "the maximum peak in the pore distribution curve is in the range of more than 100 nm and less than 400 nm in pore diameter.”
  • the pore distribution of the carbon nanotube aggregate can be obtained from the adsorption isotherm of liquid nitrogen at 77K based on the BJH method.
  • the fact that the peak in the pore distribution curve obtained by measuring the carbon nanotube aggregate is in the range of more than 100 nm means that in the carbon nanotube aggregate, there are voids of a certain size between the CNTs, and the CNTs are present. It means that it is not in a state of being overly densely aggregated.
  • the upper limit of 400 nm is the measurement limit of the measuring device (BELSORP-mini II) used in the examples.
  • the value of the Log differential pore volume at the maximum peak of the pore distribution curve of the CNT aggregate is preferably 2.0 cm 3 / g or more. ..
  • Condition (3) stipulates that "at least one peak of the two-dimensional spatial frequency spectrum of the electron microscope image of the carbon nanotube aggregate exists in the range of 1 ⁇ m -1 or more and 100 ⁇ m -1 or less.” Satisfiability of such a condition can be determined as follows. First, the CNT aggregate to be determined is magnified and observed (for example, 10,000 times) using an electron microscope (for example, an electrolytic radiation scanning electron microscope), and a plurality of electron microscope images are obtained in a 1 cm square field (for example). For example, 10 sheets) will be acquired. The obtained plurality of electron microscope images are subjected to a fast Fourier transform (FFT) process to obtain a two-dimensional spatial frequency spectrum.
  • FFT fast Fourier transform
  • the two-dimensional spatial frequency spectra obtained for each of the plurality of electron microscope images are binarized, and the average value of the peak positions appearing on the highest frequency side is obtained.
  • the average value of the obtained peak positions was within the range of 1 ⁇ m -1 or more and 100 ⁇ m -1 or less, it was determined that the condition (3) was satisfied.
  • a clear peak obtained by performing an isolated point extraction process that is, a reverse operation of removing isolated points
  • the condition (3) is not satisfied.
  • the peak of the two-dimensional spatial frequency spectrum exists in the range of 2.6 ⁇ m -1 or more and 100 ⁇ m -1 or less.
  • the CNT aggregate preferably satisfies at least two of the above conditions (1) to (3), and the above (1) to (3). It is more preferable to satisfy all the conditions.
  • the CNT aggregate that can be used for forming the carbon film of the present invention preferably has the following properties in addition to the above conditions (1) to (3).
  • the total specific surface area of the CNT aggregate by the BET method is preferably 600 m 2 / g or more, more preferably 800 m 2 / g or more, preferably 2600 m 2 / g or less, and more preferably 1400 m 2 / g or less. Is. Further, in the case of the opening-treated one, it is preferably 1300 m 2 / g or more. According to the CNT aggregate having a high specific surface area, the electromagnetic wave can be more diffusely reflected inside the carbon film, and as a result, the electromagnetic wave shielding performance of the carbon film can be further improved.
  • the CNT aggregate may contain mainly single-walled CNTs, and may contain two-walled CNTs and multi-walled CNTs to the extent that the functions are not impaired.
  • the total specific surface area of CNTs by the BET method can be measured, for example, by using a BET specific surface area measuring device compliant with JIS Z8830.
  • the average height of the CNTs constituting the CNT aggregate is preferably 10 ⁇ m or more and 10 cm or less, and more preferably 100 ⁇ m or more and 2 cm or less.
  • the average height of the CNTs constituting the CNT aggregate is 10 ⁇ m or more, it is possible to prevent aggregation with the adjacent CNT bundle and easily disperse the CNTs.
  • the average height of the CNTs constituting the CNT aggregate is 10 ⁇ m or more, it becomes easy to form a network between the CNTs, and the CNTs can be suitably used in applications requiring conductivity or mechanical strength.
  • the average height of the CNTs constituting the CNT aggregate is 10 cm or less, the formation can be performed in a short time, so that the adhesion of carbon-based impurities can be suppressed and the specific surface area can be improved. If the average height of the CNTs constituting the CNT aggregate is 2 cm or less, it can be more easily dispersed.
  • the average height of the CNTs can be determined by measuring the height of 100 randomly selected CNTs using a scanning electron microscope (SEM).
  • the tap bulk density of the CNT aggregate is preferably 0.001 g / cm 3 or more and 0.2 g / cm 3 or less. Since the CNT aggregates in such a density range do not excessively strengthen the bonds between the CNTs, they are excellent in dispersibility and can be molded into various shapes. When the tap bulk density of the CNT aggregate is 0.2 g / cm 3 or less, the bond between the CNTs is weakened, so that when the CNT aggregate is stirred with a solvent or the like, it becomes easy to disperse it uniformly. Further, when the tap bulk density of the CNT aggregate is 0.001 g / cm 3 or more, the integrity of the CNT aggregate is improved and the handling becomes easy.
  • the tap bulk density is the apparent bulk density in a state where the powdery CNT aggregate is filled in a container, the voids between the powder particles are reduced by tapping or vibration, and the containers are tightly packed.
  • the average outer diameter of the CNTs constituting the CNT aggregate is preferably 0.5 nm or more, more preferably 1.0 nm or more, preferably 15.0 nm or less, and 10.0 nm or less. It is more preferably 5.0 nm or less, and further preferably 5.0 nm or less.
  • the average outer diameter of CNTs is 0.5 nm or more, bundling between CNTs can be reduced and a high specific surface area can be maintained.
  • the average outer diameter of CNTs is 15.0 nm or less, the ratio of multi-walled CNTs can be reduced and a high specific surface area can be maintained.
  • the average outer diameter of the CNT can be obtained by measuring the diameter (outer diameter) of 100 randomly selected CNTs using a transmission electron microscope (TEM).
  • the average diameter (Av) and standard deviation ( ⁇ ) of CNTs may be adjusted by changing the manufacturing method and manufacturing conditions of CNTs, or by combining a plurality of types of CNTs obtained by different manufacturing methods. May be good.
  • the G / D ratio of the CNT aggregate is preferably 1 or more and 50 or less. It is considered that the CNT aggregate having a G / D ratio of less than 1 has low crystallinity of single-walled CNTs, has a lot of stains such as amorphous carbon, and has a high content of multi-walled CNTs. On the other hand, CNT aggregates having a G / D ratio of more than 50 have high linearity, and CNTs tend to form bundles with few gaps, which may reduce the specific surface area.
  • the G / D ratio is an index generally used for evaluating the quality of CNTs.
  • G band Around 1600 cm -1
  • D band around 1350 cm -1
  • G band is a vibration mode derived from the hexagonal lattice structure of graphite, which is the cylindrical surface of CNT
  • D band is a vibration mode derived from an amorphous portion. Therefore, the higher the peak intensity ratio (G / D ratio) between the G band and the D band, the higher the crystallinity (linearity) of the CNT.
  • the purity of the CNT aggregate is as high as possible.
  • the term "purity" as used herein is carbon purity, and is a value indicating what percentage of the mass of the CNT aggregate is composed of carbon. Although there is no upper limit to the purity for obtaining a high specific surface area, it is difficult to obtain a CNT aggregate of 99.9999% by mass or more in manufacturing. If the purity is less than 95% by mass, it becomes difficult to obtain a specific surface area of more than 1000 m 2 / g in the unopened state.
  • the purity of the single-walled CNT is preferably 95% by mass or more.
  • the purity of a predetermined CNT aggregate satisfying at least one of the above-mentioned conditions (1) to (3) is usually 98% by mass or more, preferably 99.9% by mass, even without purification treatment. The above can be done. Almost no impurities are mixed in the CNT aggregate, and various characteristics inherent in CNT can be fully exhibited.
  • the carbon purity of the CNT aggregate can be obtained from elemental analysis using fluorescent X-rays, thermogravimetric analysis (TGA), or the like.
  • the method for producing the CNT aggregate is not particularly limited, and the production conditions can be adjusted according to the desired properties.
  • the conditions for growth of the CNT aggregate are all of the following (a) to (c). It is necessary to meet.
  • the growth rate of the CNT aggregate is 5 ⁇ m / min or more.
  • the concentration of the catalyst activator in the growth atmosphere of the CNT aggregate is 4% by volume or more.
  • C When the CNT aggregate grows, an obstacle exists in the growth direction of the CNTs constituting the CNT aggregate.
  • the above conditions (a) to (c) are not particularly limited as long as the above conditions (a) to (c) are satisfied when the CNT aggregate is grown, and known methods such as a fluidized bed method, a mobile layer method and a fixed layer method are used.
  • the CNT synthesis process according to the above can be adopted.
  • the fluidized bed method means a synthesis method for synthesizing CNTs while fluidizing a granular carrier carrying a catalyst for synthesizing CNTs (hereinafter, also referred to as a granular catalyst carrier).
  • the moving layer method and the fixed layer method mean a synthetic method for synthesizing CNTs without flowing a carrier (particulate carrier or plate-like carrier) carrying a catalyst.
  • the production method satisfying all of the above-mentioned (a) to (c) uses the catalyst carrier forming step of forming the catalyst carrier and the catalyst carrier obtained in the catalyst carrier forming step.
  • the CNT synthesis step of synthesizing the CNT and the recovery step of recovering the CNT synthesized in the CNT synthesis step are included.
  • the catalyst carrier forming step can be carried out according to a known wet or dry catalyst carrier method.
  • the recovery step can be carried out using a known separation / recovery device such as a classification device.
  • the CNT synthesis process In the CNT synthesis step, all of the above conditions (a) to (c) are satisfied when the CNT grows. Specifically, the condition (a) that "the growth rate of the carbon nanotube aggregate is 5 ⁇ m / min or more" is satisfied by appropriately adjusting the concentration and temperature of the raw material gas as a carbon source in the CNT growth atmosphere. be able to.
  • the raw material gas as a carbon source is not particularly limited, and hydrocarbon gas such as methane, ethane, ethylene, propane, butane, pentane, hexane, heptane, propylene and acetylene; methanol, ethanol and the like. Gas of lower alcohols; as well as mixtures thereof can also be used.
  • this raw material gas may be diluted with an inert gas.
  • the growth rate of the CNT aggregate is preferably 10 ⁇ m / min or more.
  • the temperature can be adjusted, for example, in the range of 400 ° C. or higher and 1100 ° C. or lower.
  • the raw material gas as a carbon source preferably contains ethylene.
  • ethylene By heating ethylene in a predetermined temperature range (700 ° C. or higher and 900 ° C. or lower), the decomposition reaction of ethylene is promoted, and when the decomposition gas comes into contact with the catalyst, high-speed growth of CNT is possible.
  • the thermal decomposition time is too long, the decomposition reaction of ethylene proceeds too much, causing deactivation of the catalyst and adhesion of carbon impurities to the CNT aggregate.
  • the thermal decomposition time is preferably 0.5 seconds or more and 10 seconds or less with respect to the ethylene concentration range of 0.1% by volume or more and 40% by volume or less.
  • the heating flow path volume is the volume of the flow path heated to a predetermined temperature T ° C. through which the raw material gas passes before coming into contact with the catalyst, and the raw material gas flow rate is a flow rate at 0 ° C. and 1 atm.
  • the concentration of the catalyst activator in the growth atmosphere of the carbon nanotube aggregate is preferably 5% by volume or more.
  • the catalyst activator is not particularly limited, and is an oxygen-containing compound having a low carbon number such as water, oxygen, ozone, acidic gas, nitrogen oxide, carbon monoxide and carbon dioxide; alcohols such as ethanol and methanol; tetrahydrofuran.
  • Ethers such as; ketones such as acetone; aldehydes; esters; and mixtures thereof. Of these, carbon dioxide is preferable.
  • a substance containing both carbon and oxygen, such as carbon monoxide and alcohols, may have both functions as a raw material gas and a catalyst activator.
  • carbon monoxide acts as a catalytically activating substance when combined with a more reactive raw material gas such as ethylene, and acts as a raw material gas when combined with a catalytically activating substance that exhibits a large catalytically activating effect even in a trace amount such as water. ..
  • the CNT synthesis step is carried out by supplying the raw material gas while supplying gas from below to flow the particulate catalyst carrier.
  • the raw material gas may be supplied while continuously transporting the particulate catalyst carrier by screw rotation.
  • the catalyst carrier has a carrier and a catalyst supported on the surface of the carrier, and the carrier is a portion forming a matrix structure for supporting, fixing, forming, or forming a catalyst on the surface of the carrier.
  • the structure of the carrier may be only the carrier, or may be a carrier with a base layer provided with an arbitrary base layer for satisfactorily supporting the catalyst on the surface of the carrier.
  • the shape of the carrier is preferably in the form of particles, and the particle size thereof is preferably 1 mm or less, more preferably 0.7 mm or less, and further preferably 0.4 mm or less in terms of volume average particle size. It is preferably 0.05 mm or more.
  • the growing CNT bundle becomes thin, which is advantageous for forming a wavy structure.
  • the apparent density of the particles is preferably 3.8 g / cm 3 or more, more preferably 5.8 g / cm 3 or more, and preferably 8 g / cm 3 or less.
  • the force applied to the growing CNT bundle is increased, which is advantageous for forming a wavy structure.
  • the material of the carrier is preferably a metal oxide containing at least one element of Al and Zr. Among them, zirconia beads containing Zr having a large elemental amount are particularly preferable.
  • a particulate carrier as a method of supporting the catalyst on the surface of the particulate carrier, for example, a method of using a rotary drum type coating device provided with a substantially cylindrical rotary drum can be mentioned. ..
  • the solution containing the components that can form the underlayer is prepared in the form of particles prior to spraying and drying the catalyst solution.
  • the underlayer is placed on the surface of the carrier by spraying and drying on the surface of the carrier. According to such a method, the catalyst layer and the base layer can be formed relatively easily and evenly.
  • a "formation step” for reducing the catalyst carried on the catalyst carrier is carried out prior to the "growth step” carried out so as to satisfy the above conditions (a) to (c).
  • a "cooling step” for cooling the catalyst carrier on which the CNT has grown can be carried out.
  • an atmosphere containing a catalyst carrier is used as a reducing gas atmosphere, and at least one of the reduced gas atmosphere or the catalyst carrier is heated to reduce and atomize the catalyst supported on the catalyst carrier. do.
  • the temperature of the catalyst carrier or the reducing gas atmosphere in the formation step is preferably 400 ° C. or higher and 1100 ° C. or lower.
  • the implementation time of the formation step may be 3 minutes or more and 120 minutes or less.
  • the reducing gas for example, hydrogen gas, ammonia gas, water vapor, or a mixed gas thereof can be used.
  • the reducing gas may be a mixed gas obtained by mixing these gases with an inert gas such as helium gas, argon gas or nitrogen gas.
  • the catalyst carrier on which the CNT has grown is cooled in an inert gas environment.
  • the inert gas an inert gas similar to the inert gas that can be used in the growth step can be used.
  • the temperature of the catalyst carrier on which the CNTs have grown is preferably lowered to 400 ° C. or lower, more preferably 200 ° C. or lower.
  • the CNT aggregate before film formation can be subjected to a dry pulverization treatment.
  • the "dry crushing treatment” means a crushing treatment in a state where the crushing target substantially does not contain a solvent (for example, a state where the solid content concentration is 95% or more).
  • the crushing device that can be used for the dry crushing process is not particularly limited as long as it is a device that can apply a physical load to an aggregate composed of fine structures by stirring or the like.
  • a mixer provided with rotating blades can be used.
  • the crushing conditions are not particularly limited.
  • the rotation speed is preferably 500 rpm or more and 5000 rpm or less
  • the crushing time is preferably 10 seconds or more and 20 minutes or less.
  • the carbon film of the present invention By filming the CNT aggregate, the carbon film of the present invention can be obtained.
  • the method for forming a film of the CNT aggregate is not particularly limited, but a CNT dispersion liquid is prepared by dispersing the CNT aggregate in a dispersion medium such as water or an organic solvent, and at least the dispersion medium is prepared from the CNT dispersion liquid. A method of removing a part thereof is preferably mentioned.
  • the method for preparing the CNT dispersion is not particularly limited, but the CNT dispersion is known to be a dispersion method using a stirring blade, a dispersion method using an ultrasonic wave, a dispersion method using a shearing force, and the like. It can be obtained by dispersing in a dispersion medium by the above method.
  • the CNTs are appropriately dispersed in the CNT dispersion liquid.
  • the CNT dispersion liquid does not contain a dispersant.
  • the CNT dispersion liquid is substantially composed only of CNT and the dispersion medium.
  • the CNT dispersion liquid is substantially composed of only CNT and the dispersion medium
  • the dispersion medium means that 99.9% by mass or more of the constituents of the CNT dispersion liquid are inevitably attached to CNT and CNT. It means that it consists of impurities and unavoidable impurities associated with the dispersion medium and the dispersion medium.
  • the method for removing the dispersion medium from the CNT dispersion liquid include known methods such as filtration and drying.
  • the filtration method is not particularly limited, and known filtration methods such as natural filtration, vacuum filtration (suction filtration), pressure filtration, and centrifugal filtration can be used.
  • drying method known drying methods such as a hot air drying method, a vacuum drying method, a hot roll drying method, and an infrared irradiation method can be used.
  • the drying temperature is not particularly limited, but is usually room temperature to 200 ° C.
  • the drying time is not particularly limited, but is usually 1 hour or more and 48 hours or less. Further, the drying can be performed on a known substrate, although the drying is not particularly limited.
  • the carbon film of the present invention can be obtained by further drying the film-shaped filter medium (primary sheet) obtained by filtering the CNT dispersion liquid.
  • the thickness of the carbon film of the present invention is preferably 5 ⁇ m or more, more preferably 10 ⁇ m or more, preferably 200 ⁇ m or less, and even more preferably 150 ⁇ m or less.
  • the carbon film can have sufficient mechanical strength and can exhibit more excellent electromagnetic wave shielding performance.
  • the thickness is 200 ⁇ m or less, the weight of the carbon film can be reduced.
  • the "thickness" of the carbon film can be measured by using the method described in Examples.
  • FT-IR ⁇ Fourier transform infrared spectroscopy
  • the effective length of plasmon is shown in Table 1.
  • the FIR resonance chart of the obtained FIR spectrum is shown in FIG. 7. As shown in FIG. 7, in the curves corresponding to the CNT aggregates used in Examples 1 to 4 and Comparative Example 1, a peak of optical density was observed above 300 cm -1 .
  • the plasmon peak top position was obtained from an approximate curve by polynomial fit using drawing software.
  • CNT aggregate ⁇ Creation of pore distribution curve (CNT aggregate)>
  • adsorption isotherms were measured using BELSORP-miniII (manufactured by Microtrac Bell) at 77 K using liquid nitrogen (adsorption equilibrium time was set to 500 seconds).
  • vacuum degassing was performed at 100 ° C. for 12 hours. From the adsorption amount of this adsorption isotherm, the pore distribution curve of each sample was obtained by the BJH method.
  • FIG. 8 in the CNT aggregates used in Examples 1 to 4 and Comparative Example 1, the maximum peak of the Log differential pore volume was confirmed in the region having a pore diameter of 100 nm or more.
  • the measurement range of the pore diameter was set to 1 nm or more and less than 400 nm.
  • FIG. 9A is one of the ten images acquired for the prepared CNT aggregate
  • FIG. 9B is a two-dimensional spatial frequency spectrum acquired for such images.
  • the component closer to the center means the low frequency component, and the component located more outward from the center corresponds to the higher frequency component.
  • the arrow indicates the peak position (3 ⁇ m -1 ) of the highest wave number among the clear peaks detected in the region of 1 to 100 ⁇ m -1 .
  • FIG. 9C is one of the 10 images acquired for the CNT aggregate used in Example 4, and
  • FIG. 9D is a two-dimensional spatial frequency spectrum acquired for such an image.
  • the component closer to the center means the low frequency component, and the component located more outward from the center corresponds to the higher frequency component.
  • ⁇ Thickness> The thickness of the carbon film was measured using a "Digimatic standard outside micrometer" manufactured by Mitutoyo.
  • ⁇ Average value of surface roughness of carbon film> For the average value of the surface roughness of the carbon film, the surface roughness was measured for four randomly set areas of 5 cm ⁇ 7 cm using a one-shot 3D shape measuring machine (“VR-5000” manufactured by KEYENCE CORPORATION). did. Then, the arithmetic mean value of the obtained four surface roughness values was calculated and used as the "average value of the surface roughness of the carbon film”.
  • the reflectance coefficient S11 and the transmission coefficient S21 were measured by the ASTM method (coaxial structure), and the electromagnetic wave shielding effect [dB] was calculated. Then, the electromagnetic wave shielding effect [dB] at the measurement frequencies of 0.1 MHz, 1 MHz, and 10 MHz was evaluated according to the following criteria. The larger the value of the electromagnetic wave shielding effect [dB] at a certain frequency, the better the electromagnetic wave shielding performance of the carbon film at that frequency.
  • B The electromagnetic wave shielding effect is 30 dB or more and less than 40 dB.
  • C The electromagnetic wave shielding effect is 20 dB or more and less than 30 dB.
  • D The electromagnetic wave shielding effect is less than 20 dB.
  • FIG. 10 shows a schematic configuration of the CNT manufacturing apparatus used at the time of synthesis.
  • the CNT manufacturing apparatus 100 shown in FIG. 10 is composed of a heater 101, a reaction tube 102, a dispersion plate 103, a reducing gas / raw material gas introduction port 104, an exhaust port 105, and a gas heating promotion unit 106.
  • Synthetic quartz was used as the material of the reaction tube 102 and the dispersion plate 103.
  • Catalyst carrier forming step >> The catalyst carrier forming step will be described below.
  • Zirconia (zirconium dioxide) beads (ZrO 2 , volume average particle diameter D50: 350 ⁇ m) as a carrier are put into a rotary drum type coating device, and the aluminum-containing solution is sprayed with a spray gun while stirring the zirconia beads (20 rpm). While spray spraying (spray amount 3 g / min, spray time 940 seconds, spray air pressure 10 MPa), compressed air (300 L / min) was supplied into the rotating drum and dried to form an aluminum-containing coating film on the zirconia beads. .. Next, firing treatment was performed at 480 ° C. for 45 minutes to prepare primary catalyst particles on which an aluminum oxide layer was formed.
  • the iron catalyst solution is spray-sprayed with a spray gun (spray amount 2 g / min, spray time 480 seconds, spray air pressure 5 MPa). ), While supplying compressed air (300 L / min) into the rotating drum, the mixture was dried to form an iron-containing coating film on the primary catalyst particles. Next, a firing treatment was carried out at 220 ° C. for 20 minutes to prepare a catalyst carrier on which an iron oxide layer was further formed.
  • ⁇ CNT synthesis process 300 g of the catalyst carrier thus produced is put into the reaction tube 102 of the CNT manufacturing apparatus 100, and the catalyst carrier 107 is fluidized by circulating gas, and the formation step, the growth step, and the cooling step are performed in this order.
  • the treatment was performed to produce a CNT aggregate.
  • the conditions of each step included in the CNT synthesis step were set as follows.
  • the CNT aggregate synthesized on the catalyst carrier was separated and recovered using a forced vortex classification device (rotation speed 3500 rpm, air air volume 3.5 Nm 3 / min). The recovery rate of the CNT aggregate was 99%.
  • the characteristics of the CNT aggregate produced by this example are tap bulk density: 0.01 g / cm 3 , CNT average height: 200 ⁇ m, BET specific surface area: 800 m 2 / g, average outer diameter: 4.0 nm, The carbon purity was 99%.
  • Example 1 Add 1000 g of water to 1 g of the CNT aggregate obtained as described above, and stir with an ultra-high-speed emulsification / dispersion device (product name "Lab Solution (registered trademark)", manufactured by Shinky Co., Ltd.) at a rotation speed of 3000 rpm for 10 minutes. Then, a CNT dispersion liquid was obtained. The obtained CNT dispersion liquid was applied onto the substrate. The coating film on the substrate was vacuum dried at a temperature of 80 ° C. for 24 hours to form a carbon film on the substrate. Then, the carbon film was peeled off from the substrate to obtain a carbon film (self-supporting film) having a thickness of 100 ⁇ m. The electromagnetic wave shielding performance of the obtained carbon film was evaluated. The results are shown in Table 1.
  • Example 2 In preparing the CNT dispersion liquid, a dispersion treatment was carried out for 10 minutes using an ultrasonic disperser (a desktop ultrasonic cleaner manufactured by Bransonic Co., Ltd.). A carbon film (self-supporting film) having a thickness of 100 ⁇ m was obtained in the same manner as in Example 1 except for these points. The electromagnetic wave shielding performance of the obtained carbon film was evaluated. The results are shown in Table 1.
  • Example 3 In preparing the CNT dispersion liquid, a jet mill (manufactured by Yoshida Kikai Kogyo Co., Ltd., NanoVeta) was used to carry out dispersion treatment under the condition of 100 MPa for 15 minutes. A carbon film (self-supporting film) having a thickness of 100 ⁇ m was obtained in the same manner as in Example 1 except for these points. The electromagnetic wave shielding performance of the obtained carbon film was evaluated. The results are shown in Table 1.
  • FIG. 11 shows a schematic configuration of the CNT aggregate manufacturing apparatus 200 used.
  • the CNT aggregate manufacturing apparatus 200 shown in FIG. 11 includes a formation unit 202, a growth unit 204, a transfer unit 207 that conveys a base material between the formation unit 202 and the growth unit 204, and the formation unit 202 and the growth unit.
  • a connection unit 208 for spatially connecting the 204 to each other and a gas mixing prevention device 203 for preventing gas from being mixed with each other between the formation unit 202 and the growth unit 204 are provided.
  • the CNT aggregate manufacturing apparatus 200 is arranged in the inlet purge device 201 arranged in the front stage of the formation unit 202, the outlet purge device 205 arranged in the rear stage of the growth unit 204, and further in the rear stage of the outlet purge device 205. It is provided with a component such as a cooling unit 206.
  • the formation unit 202 includes a formation furnace 202a for holding the reducing gas, a reducing gas injection device 202b for injecting the reducing gas, a heating device 202c for heating at least one of the catalyst and the reducing gas, and a gas in the furnace. It is composed of an exhaust device 202d or the like that discharges to the outside of the system.
  • the gas mixing prevention device 203 includes an exhaust device 203a and a purge gas injection device 203b for injecting a purge gas (seal gas).
  • the growth unit 204 includes a growth furnace 204a for maintaining the raw material gas environment, a raw material gas injection device 204b for injecting the raw material gas, a heating device 204c for heating at least one of the catalyst and the raw material gas, and the inside of the furnace. It is equipped with an exhaust device 204d or the like that discharges gas to the outside of the system.
  • the inlet purging device 201 is attached to a connecting portion 209 connecting the front chamber 213, which is a component for introducing the base material 211 into the system via the hopper 212, and the formation furnace 202a.
  • the cooling unit 206 includes a cooling container 206a for holding the inert gas, and a water-cooled cooling device 206b arranged so as to surround the inner space of the cooling container 206a.
  • the transport unit 207 is a unit that continuously transports the base material 211 by screw rotation. It is mounted by a screw blade 207a and a drive device 207b that can rotate the screw blade to exert a substrate transporting ability.
  • the heating device 214 is configured to be able to heat the inside of the system at a temperature lower than the heating temperature in the formation unit, and heats the vicinity of the drive device 207b.
  • Zirconia (zirconium dioxide) beads (ZrO 2 , volume average particle diameter D50: 650 ⁇ m) as a base material are put into a rotary drum type coating device, and the aluminum-containing solution is sprayed while stirring the zirconia beads (20 rpm). While spraying (spray amount 3 g / min, spray time 940 seconds, spray air pressure 10 MPa) and drying while supplying compressed air (300 L / min) into the rotating drum, an aluminum-containing coating film is formed on the zirconia beads. did. Next, firing treatment was performed at 480 ° C. for 45 minutes to prepare primary catalyst particles on which an aluminum oxide layer was formed.
  • the iron catalyst solution is spray-sprayed with a spray gun (spray amount 2 g / min, spray time 480 seconds, spray air pressure 5 MPa). ), While supplying compressed air (300 L / min) into the rotating drum, the mixture was dried to form an iron-containing coating film on the primary catalyst particles. Next, a calcination treatment was carried out at 220 ° C. for 20 minutes to prepare a base material on which an iron oxide layer was further formed.
  • Feeder hopper Feed speed: 1.25kg / h ⁇ Displacement: 10sLm (natural exhaust from the gap)
  • Inlet purge device Purge gas: Nitrogen 40sLm Formation unit ⁇ Temperature in the furnace: 800 °C -Reducing gas: nitrogen 6sLm, hydrogen 54sLm ⁇ Displacement: 60sLm ⁇ Processing time: 20 minutes Gas contamination prevention device ⁇ Purge gas: 20sLm ⁇ Displacement of the exhaust device: 62sLm Growth unit ⁇ Temperature in the furnace: 830 °C -Raw material gas: Nitrogen 15sLm, Ethylene 5sLm, Carbon dioxide 1sLm, Hydrogen 3sLm ⁇ Displacement: 47sLm ⁇ Processing time: 10 minutes Outlet purge device ⁇ Purge gas: Nitrogen 45sLm Cooling unit ⁇ Cooling temperature: Room temperature ⁇ Displacement: 10sLm (natural exhaust from gaps) Continuous production was performed under the above conditions.
  • the characteristics of the CNT aggregate produced by this example are typically tap bulk density: 0.02 g / cm 3 , CNT average length: 150 ⁇ m, BET-specific surface area: 900 m 2 / g, average outer diameter: It was 4.0 nm and had a carbon purity of 99%.

Abstract

Provided is a carbon film comprising carbon nanotube aggregates. The average surface roughness value of the carbon film is 4.0 μm or more.

Description

炭素膜Carbon film
 本発明は、炭素膜に関するものである。 The present invention relates to a carbon film.
 近年、導電性、熱伝導性及び機械的特性に優れる材料として、カーボンナノチューブ(以下、「CNT」と称することがある。)が注目されている。しかし、CNTは直径がナノメートルサイズの微細な構造体であるため、単体では取り扱い性や加工性が悪い。そこで、取り扱い性や加工性を確保して各種用途に用いるべく、複数本のCNTからなる集合体(以下、「カーボンナノチューブ集合体」と称する。)を膜化して炭素膜を形成することが従来から行われている(例えば、特許文献1参照)。 In recent years, carbon nanotubes (hereinafter, may be referred to as "CNT") have been attracting attention as a material having excellent conductivity, thermal conductivity and mechanical properties. However, since CNT is a fine structure having a diameter of nanometer size, it is difficult to handle and process by itself. Therefore, in order to secure handleability and processability and use it for various purposes, it has been conventionally used to form a carbon film by forming an aggregate composed of a plurality of CNTs (hereinafter referred to as "carbon nanotube aggregate"). (See, for example, Patent Document 1).
 特許文献1では、水銀圧入法により測定される、ボアサイズが400nm以上1500nm以下の細孔が、Log微分細孔容積0.006cm/g以下となる10nm以上の領域を備えるカーボンナノチューブ集合体を用いて、機械的強度に優れる炭素膜が形成されている。 Patent Document 1 uses a carbon nanotube aggregate having a region of 10 nm or more in which pores having a bore size of 400 nm or more and 1500 nm or less, which are measured by a mercury intrusion method, have a Log differential pore volume of 0.006 cm 3 / g or less. Therefore, a carbon film having excellent mechanical strength is formed.
特開2018-145027号公報Japanese Unexamined Patent Publication No. 2018-14502
 ここで近年、炭素膜の用途として、電磁波シールドが注目されている。しかしながら、上記従来の炭素膜の電磁波を遮断する性能、すなわち、電磁波シールド性能には、一層の向上の余地があった。 Here, in recent years, electromagnetic wave shielding has been attracting attention as an application of carbon film. However, there is room for further improvement in the performance of blocking the electromagnetic waves of the conventional carbon film, that is, the electromagnetic wave shielding performance.
 そこで、本発明は、電磁波シールド性能に優れる炭素膜の提供を目的とする。 Therefore, an object of the present invention is to provide a carbon film having excellent electromagnetic wave shielding performance.
 本発明者らは、上記目的を達成するために鋭意検討を重ねた。そして、本発明者らは、カーボンナノチューブ集合体を用いて形成される炭素膜の微小性状について検討し、表面粗さの平均値が4.0μm以上である炭素膜が、電磁波を良好に遮蔽し得ることを新たに見出し、本発明を完成させた。 The present inventors have made extensive studies to achieve the above object. Then, the present inventors investigated the microscopic properties of the carbon film formed by using the carbon nanotube aggregate, and the carbon film having an average surface roughness of 4.0 μm or more shields electromagnetic waves well. We have newly found what we can obtain and completed the present invention.
 即ち、この発明は、上記課題を有利に解決することを目的とするものであり、本発明の炭素膜は、カーボンナノチューブ集合体よりなる炭素膜であって、表面粗さの平均値が4.0μm以上である、ことを特徴とする。炭素膜の表面粗さの平均値が4.0μm以上であれば、かかる炭素膜は電磁波シールド性能に優れる。
 ここで、炭素膜の表面粗さは、本明細書の実施例に記載の方法により測定することができる。
That is, the present invention aims to solve the above problems advantageously, and the carbon film of the present invention is a carbon film made of an aggregate of carbon nanotubes, and the average value of the surface roughness is 4. It is characterized in that it is 0 μm or more. When the average value of the surface roughness of the carbon film is 4.0 μm or more, the carbon film is excellent in electromagnetic wave shielding performance.
Here, the surface roughness of the carbon film can be measured by the method described in the examples of the present specification.
 ここで、本発明の炭素膜において、表面粗さの平均値が、5.0μm以上であることが好ましい。炭素膜の表面粗さの平均値が5.0μm以上であれば、電磁波シールド性能に一層優れる。 Here, in the carbon film of the present invention, it is preferable that the average value of the surface roughness is 5.0 μm or more. When the average value of the surface roughness of the carbon film is 5.0 μm or more, the electromagnetic wave shielding performance is further excellent.
 ここで、本発明の炭素膜は自立膜であることが好ましい。自立膜である炭素膜はハンドリング性に優れ、例えば電磁波遮蔽シートとして用いるに際して、当該シートの配置の自由度を高めることができる。なお、本発明において、「自立膜」とは、支持体が存在せずとも破損せずに、単独で膜形状を維持し得る膜をいう。 Here, the carbon film of the present invention is preferably a self-supporting film. The carbon film, which is a self-supporting film, has excellent handleability, and when used as an electromagnetic wave shielding sheet, for example, the degree of freedom in arranging the sheet can be increased. In the present invention, the "self-supporting film" refers to a film that can maintain its film shape by itself without being damaged even in the absence of a support.
 また、本発明の炭素膜において、前記カーボンナノチューブ集合体が、下記(1)~(3)の条件のうち少なくとも1つを満たすことが好ましい。
(1)前記カーボンナノチューブ集合体を、バンドル長が10μm以上になるように分散させて得たカーボンナノチューブ分散体について、フーリエ変換赤外分光分析して得たスペクトルにおいて、前記カーボンナノチューブ分散体のプラズモン共鳴に基づくピークが、波数300cm-1超2000cm-1以下の範囲に、少なくとも1つ存在する。
 (2)前記カーボンナノチューブ集合体について、液体窒素の77Kでの吸着等温線から、Barrett-Joyner-Halenda法に基づいて得られる、細孔径とLog微分細孔容積との関係を示す細孔分布曲線における最大のピークが、細孔径100nm超400nm未満の範囲にある。
 (3)前記カーボンナノチューブ集合体の電子顕微鏡画像の二次元空間周波数スペクトルのピークが、1μm-1以上100μm-1以下の範囲に少なくとも1つ存在する。
 上記所定の条件を満たすカーボンナノチューブ集合体よりなる炭素膜は、電磁波シールド性能に一層優れる。なお、上記所定の条件の充足性は、実施例に記載の方法に従って判定することができる。
Further, in the carbon film of the present invention, it is preferable that the carbon nanotube aggregate satisfies at least one of the following conditions (1) to (3).
(1) The plasmon of the carbon nanotube dispersion in the spectrum obtained by Fourier transform infrared spectroscopic analysis of the carbon nanotube dispersion obtained by dispersing the carbon nanotube aggregate so that the bundle length is 10 μm or more. There is at least one resonance-based peak in the range of wavenumbers above 300 cm -1 and above 2000 cm -1 .
(2) For the carbon nanotube aggregate, a pore distribution curve showing the relationship between the pore diameter and the Log differential pore volume obtained from the adsorption isotherm of liquid nitrogen at 77K based on the Barrett-Joiner-Halenda method. The largest peak in is in the range of pore diameters greater than 100 nm and less than 400 nm.
(3) At least one peak of the two-dimensional spatial frequency spectrum of the electron microscope image of the carbon nanotube aggregate exists in the range of 1 μm -1 or more and 100 μm -1 or less.
A carbon film made of an aggregate of carbon nanotubes satisfying the above-mentioned predetermined conditions is further excellent in electromagnetic wave shielding performance. The sufficiency of the above-mentioned predetermined conditions can be determined according to the method described in the examples.
 本発明によれば、電磁波シールド性能に優れる炭素膜を提供することができる。 According to the present invention, it is possible to provide a carbon film having excellent electromagnetic wave shielding performance.
実施例1にて作製した炭素膜の表面について取得したレーザー顕微鏡画像を示す。The laser microscope image obtained about the surface of the carbon film produced in Example 1 is shown. 実施例2にて作製した炭素膜の表面について取得したレーザー顕微鏡画像を示す。The laser microscope image obtained about the surface of the carbon film produced in Example 2 is shown. 実施例3にて作製した炭素膜の表面について取得したレーザー顕微鏡画像を示す。The laser microscope image obtained about the surface of the carbon film produced in Example 3 is shown. 実施例4にて作成した炭素膜の表面について取得したレーザー顕微鏡画像を示す。The laser microscope image obtained about the surface of the carbon film prepared in Example 4 is shown. 比較例1にて作製した炭素膜の表面について取得したレーザー顕微鏡画像を示す。The laser microscope image obtained about the surface of the carbon film prepared in the comparative example 1 is shown. 一例にかかるCNT集合体のSEM画像を示す。An SEM image of the CNT aggregate according to an example is shown. 一例にかかるCNT集合体について取得したFIR共鳴チャートを示す。The FIR resonance chart acquired for the CNT aggregate according to an example is shown. 一例にかかるCNT集合体の細孔分布曲線を示す。The pore distribution curve of the CNT aggregate according to an example is shown. 一例にかかるCNT集合体のSEM画像である。It is an SEM image of the CNT aggregate according to one example. 図8Aの画像の二次元空間周波数スペクトルである。It is a two-dimensional spatial frequency spectrum of the image of FIG. 8A. 他の一例にかかるCNT集合体のSEM画像である。It is an SEM image of the CNT aggregate according to another example. 図9Cの画像の二次元空間周波数スペクトルである。9 is a two-dimensional spatial frequency spectrum of the image of FIG. 9C. CNT製造装置の概略構成を示す。The schematic configuration of the CNT manufacturing apparatus is shown. 実施例4で使用したCNT製造装置の概略構成を示す。The schematic configuration of the CNT manufacturing apparatus used in Example 4 is shown.
 以下、本発明の実施形態について詳細に説明する。
 本発明の炭素膜は、複数本のカーボンナノチューブの集合体(カーボンナノチューブ集合体)で構成される。なお、本発明の炭素膜は、例えば、CNT集合体及び炭素膜の製造過程において不可避に混入するCNT以外の成分を含んでいてもよいが、炭素膜中に占めるCNTの割合は、95質量%以上であることが好ましく、98質量%以上であることがより好ましく、99質量%以上であることが更に好ましく、99.5質量%以上であることが特に好ましく、100質量%であること(即ち、炭素膜がCNTのみからなること)が最も好ましい。
Hereinafter, embodiments of the present invention will be described in detail.
The carbon film of the present invention is composed of an aggregate of a plurality of carbon nanotubes (a carbon nanotube aggregate). The carbon film of the present invention may contain, for example, CNT aggregates and components other than CNTs inevitably mixed in the process of producing the carbon film, but the proportion of CNTs in the carbon film is 95% by mass. The above is preferable, 98% by mass or more is more preferable, 99% by mass or more is further preferable, 99.5% by mass or more is particularly preferable, and 100% by mass (that is,). , The carbon film consists only of CNTs) is most preferable.
 ここで、本発明の炭素膜は、カーボンナノチューブ集合体よりなる。本発明の炭素膜は、表面粗さの平均値が4.0μm以上であることを特徴とする。表面粗さの平均値が4.0μm以上である本発明の炭素膜は、電磁波シールド性能に優れる。そのため、本発明の炭素膜は、特に限定されないが、例えば電磁波遮蔽シートとして有利に使用することができる。さらに、本発明の炭素膜は自立膜であることが好ましい。炭素膜が自立膜であれば、かかる炭素膜はハンドリング性に優れ、例えば電磁波遮蔽シートとして用いるに際して、当該シートの配置の自由度が高い。 Here, the carbon film of the present invention is composed of an aggregate of carbon nanotubes. The carbon film of the present invention is characterized in that the average value of the surface roughness is 4.0 μm or more. The carbon film of the present invention having an average surface roughness of 4.0 μm or more is excellent in electromagnetic wave shielding performance. Therefore, the carbon film of the present invention is not particularly limited, but can be advantageously used, for example, as an electromagnetic wave shielding sheet. Further, the carbon film of the present invention is preferably a self-supporting film. If the carbon film is a self-supporting film, the carbon film is excellent in handleability, and when used as an electromagnetic wave shielding sheet, for example, the degree of freedom in arranging the sheet is high.
 表面粗さの平均値が4.0μm以上である本発明の炭素膜においては、構成要素であるカーボンナノチューブ間に適度なサイズの間隙が一定程度以上存在しているため、かかる間隙にて、電磁波が乱反射されることにより炭素膜に侵入した電磁波のエネルギーが減衰し得ると推察される。従って、本発明の炭素膜によれば、優れた電磁波シールド性能を呈することができると考えられる。 In the carbon film of the present invention having an average surface roughness of 4.0 μm or more, there are gaps of an appropriate size or more between the carbon nanotubes as constituents, and therefore, electromagnetic waves are generated in such gaps. It is presumed that the energy of the electromagnetic wave that has entered the carbon film can be attenuated by the diffused reflection. Therefore, according to the carbon film of the present invention, it is considered that excellent electromagnetic wave shielding performance can be exhibited.
(炭素膜の表面粗さの平均値)
 炭素膜の表面粗さの平均値は、4.0μm以上である必要があり、5.0μm以上であることが好ましく、5.5μm以上であることがより好ましく、6.5μm以上であることがさらに好ましい。炭素膜の表面粗さの平均値が上記下限値以上であれば、優れた電磁波シールドを発揮することができる。なお、炭素膜の表面粗さの平均値は、例えば、30μm以下であり得る。
(Average value of surface roughness of carbon film)
The average value of the surface roughness of the carbon film needs to be 4.0 μm or more, preferably 5.0 μm or more, more preferably 5.5 μm or more, and 6.5 μm or more. More preferred. When the average value of the surface roughness of the carbon film is at least the above lower limit value, excellent electromagnetic wave shielding can be exhibited. The average value of the surface roughness of the carbon film may be, for example, 30 μm or less.
 なお、図1~5に、例として、後述する実施例1及び比較例にて作製した、表面粗さの平均値が種々異なる炭素膜表面について取得したレーザー顕微鏡画像を示す。図1は、実施例1にて作製した炭素膜表面のレーザー顕微鏡画像のうちの一枚であり、かかる炭素膜について算出した表面粗さの平均値の値は、10.9μmであった。図2は、実施例2にて作製した炭素膜表面のレーザー顕微鏡画像のうちの一枚であり、かかる炭素膜について算出した表面粗さの平均値の値は、6.3μmであった。図3は、実施例3にて作製した炭素膜表面のレーザー顕微鏡画像のうちの一枚であり、かかる炭素膜について算出した表面粗さの平均値の値は、5.5μmであった。図4は、実施例4にて作製した炭素膜表面のレーザー顕微鏡画像のうちの一枚であり、かかる炭素膜について算出した表面粗さの平均値の値は、4.1μmであった。図5は、比較例1にて作製した炭素膜表面のレーザー顕微鏡画像のうちの一枚であり、かかる炭素膜について算出した表面粗さの平均値の値は、2.5μmであった。これらの図1~5における濃淡は、レーザー光を照射した場合に単層膜表面にて反射されてレーザー顕微鏡のセンサにて検出される反射光の相対強度に相当する。即ち、図1~5では、レーザー光を照射した場合に反射光の輝度の高い部分が白色側に、反射光の輝度の低い部分が黒色側に表示されている。図1~5より、表面粗さの平均値の値が大きいほど、レーザー光を照射した場合の反射光の輝度が低く、表面粗さの平均値の値が小さいほど、レーザー光を照射した場合の反射光の輝度が高いことが分かる。レーザー光を電磁波に置き換えると、表面粗さの平均値の値が大きい場合に炭素膜表面から反射される電磁波量が小さく、言い換えれば電磁波シールド性能が高く、表面粗さの平均値の値が小さい場合に炭素膜表面から反射される電磁波量が大きく、言い換えれば電磁波シールド性能が低い傾向があることが推定できる。 Note that FIGS. 1 to 5 show, as an example, laser microscope images obtained for carbon film surfaces having various average surface roughness values, which were produced in Examples 1 and Comparative Examples described later. FIG. 1 is one of the laser microscope images of the carbon film surface prepared in Example 1, and the average value of the surface roughness calculated for the carbon film was 10.9 μm. FIG. 2 is one of the laser microscope images of the carbon film surface prepared in Example 2, and the average value of the surface roughness calculated for the carbon film was 6.3 μm. FIG. 3 is one of the laser microscope images of the carbon film surface prepared in Example 3, and the average value of the surface roughness calculated for the carbon film was 5.5 μm. FIG. 4 is one of the laser microscope images of the carbon film surface prepared in Example 4, and the average value of the surface roughness calculated for the carbon film was 4.1 μm. FIG. 5 is one of the laser microscope images of the carbon film surface prepared in Comparative Example 1, and the average value of the surface roughness calculated for the carbon film was 2.5 μm. The shades in FIGS. 1 to 5 correspond to the relative intensities of the reflected light reflected by the surface of the single-layer film and detected by the sensor of the laser microscope when irradiated with the laser light. That is, in FIGS. 1 to 5, when the laser beam is irradiated, the portion having high brightness of the reflected light is displayed on the white side, and the portion having low brightness of the reflected light is displayed on the black side. From FIGS. 1 to 5, the larger the value of the average value of the surface roughness, the lower the brightness of the reflected light when irradiated with the laser light, and the smaller the value of the average value of the surface roughness, the lower the brightness of the reflected light, the more the laser light is irradiated. It can be seen that the brightness of the reflected light is high. When the laser beam is replaced with electromagnetic waves, the amount of electromagnetic waves reflected from the surface of the carbon film is small when the average value of the surface roughness is large, in other words, the electromagnetic wave shielding performance is high and the average value of the surface roughness is small. In some cases, it can be estimated that the amount of electromagnetic waves reflected from the surface of the carbon film tends to be large, in other words, the electromagnetic wave shielding performance tends to be low.
(炭素膜の製造方法)
 ここで、本発明の炭素膜は、カーボンナノチューブ集合体を膜化して炭素膜とするに際し、
 CNT集合体として、後述する(1)~(3)の少なくとも何れかの条件を満たすCNT集合体を用いること、
 CNT集合体の膜化に先んじて、当該CNT集合体に対して乾式粉砕処理を施すこと、
 の少なくとも一方を満たすことで作製することができる。
(Manufacturing method of carbon film)
Here, the carbon film of the present invention is used to form a carbon film by forming an aggregate of carbon nanotubes into a carbon film.
As the CNT aggregate, a CNT aggregate satisfying at least any one of (1) to (3) described later is used.
Prior to the film formation of the CNT aggregate, the CNT aggregate is subjected to a dry pulverization treatment.
It can be produced by satisfying at least one of the above.
<CNT集合体>
 ここで、炭素膜の調製に用いるCNT集合体としては、例えば、スーパーグロース法(国際公開第2006/011655号参照)を用いて得られるCNT集合体などの既知のCNT集合体を用いることもできるが、(1)~(3)の条件のうち少なくとも1つを満たす新規のCNT集合体を用いることが好ましい。以下の(1)~(3)の条件のうち少なくとも1つを満たすCNT集合体よりなる炭素膜は、電磁波シールド性能に優れる。
<CNT aggregate>
Here, as the CNT aggregate used for preparing the carbon film, for example, a known CNT aggregate such as a CNT aggregate obtained by using the super growth method (see International Publication No. 2006/011655) can also be used. However, it is preferable to use a novel CNT aggregate that satisfies at least one of the conditions (1) to (3). A carbon film made of a CNT aggregate satisfying at least one of the following conditions (1) to (3) is excellent in electromagnetic wave shielding performance.
 (1)カーボンナノチューブ集合体を、バンドル長が10μm以上になるように分散させて得たカーボンナノチューブ分散体について、フーリエ変換赤外分光分析して得たスペクトルにおいて、カーボンナノチューブ分散体のプラズモン共鳴に基づくピークが、波数300cm-1超2000cm-1以下の範囲に、少なくとも1つ存在する。
 (2)カーボンナノチューブ集合体について、液体窒素の77Kでの吸着等温線から、Barrett-Joyner-Halenda法に基づいて得られる、細孔径とLog微分細孔容積との関係を示す細孔分布曲線における最大のピークが、細孔径100nm超400nm未満の範囲にある。
 (3)カーボンナノチューブ集合体の電子顕微鏡画像の二次元空間周波数スペクトルのピークが、1μm-1以上100μm-1以下の範囲に少なくとも1つ存在する。
(1) In the spectrum obtained by Fourier transform infrared spectroscopic analysis of the carbon nanotube dispersion obtained by dispersing the carbon nanotube aggregate so that the bundle length is 10 μm or more, the plasmon resonance of the carbon nanotube dispersion is obtained. There is at least one peak based on the wave number in the range of 300 cm -1 to 2000 cm -1 or less.
(2) In the pore distribution curve showing the relationship between the pore diameter and the Log differential pore volume, which is obtained from the adsorption isotherm of liquid nitrogen at 77K for the carbon nanotube aggregate based on the Barrett-Joiner-Halenda method. The largest peak is in the range of pore diameters greater than 100 nm and less than 400 nm.
(3) At least one peak of the two-dimensional spatial frequency spectrum of the electron microscope image of the carbon nanotube aggregate exists in the range of 1 μm -1 or more and 100 μm -1 or less.
 上記条件(1)~(3)のうちの少なくとも1つを満たすCNT集合体よりなる炭素膜が電磁波シールド性能に優れる理由は明らかではないが、以下の通りであると推察される。図6に、上記(1)~(3)のうちの少なくとも1つを満たすCNT集合体の一例の走査型電子顕微鏡(SEM)画像を示す。図6に示すように、上記条件(1)~(3)のうちの少なくとも満たすCNT集合体を構成するCNTは、波状構造を有する。かかる「波状構造」に起因して、CNT集合体を構成する各CNT間において、電磁波が乱反射すると考えられる。かかる乱反射の過程で、電磁波のエネルギーが失われ、その結果が高い電磁波シールド性能に反映されると推察される。以下、本発明のCNT集合体が満たし得る上記条件(1)~(3)について、それぞれ詳述する。 The reason why the carbon film composed of CNT aggregates satisfying at least one of the above conditions (1) to (3) is excellent in electromagnetic wave shielding performance is not clear, but it is presumed to be as follows. FIG. 6 shows a scanning electron microscope (SEM) image of an example of a CNT aggregate satisfying at least one of the above (1) to (3). As shown in FIG. 6, the CNTs constituting the CNT aggregate satisfying at least the above conditions (1) to (3) have a wavy structure. Due to such a "wavy structure", it is considered that electromagnetic waves are diffusely reflected between the CNTs constituting the CNT aggregate. It is presumed that the energy of the electromagnetic wave is lost in the process of such diffuse reflection, and the result is reflected in the high electromagnetic wave shielding performance. Hereinafter, the above conditions (1) to (3) that can be satisfied by the CNT aggregate of the present invention will be described in detail.
<<条件(1)>>
 条件(1)は、「カーボンナノチューブ集合体を、バンドル長が10μm以上になるように分散させて得たカーボンナノチューブ分散体について、フーリエ変換赤外分光分析して得たスペクトルにおいて、カーボンナノチューブ分散体のプラズモン共鳴に基づくピークが、波数300cm-1超2000cm-1以下の範囲に、少なくとも1つ存在する。」ことを規定する。ここで、従来から、CNTの光学特性として、遠赤外領域における強い吸収特性が広く知られている。かかる遠赤外領域における強い吸収特性は、CNTの直径及び長さに起因ものであると考えられている。なお、遠赤外線領域における吸収特性、より具体的には、CNTのプラズモン共鳴に基づくピークと、CNTの長さとの関係については、非特許文献(T.Morimoto et.al., “Length-Dependent Plasmon Resonance in Single-Walled Carbon Nanotubes”, pp 9897-9904, Vol.8, No.10, ACS NANO, 2014)にて詳細に検討されている。本発明者らは、上記非特許文献に記載されたような検討内容、及び、独自の知見に基づいて、フーリエ変換赤外分光分析して得たスペクトルにおいて、CNTのプラズモン共鳴に基づくピークの検出される位置が、CNTにおける欠陥点の間の距離により何らかの影響を受け得ると推測し、検証を行った。そして、本発明者らは、CNTのプラズモン共鳴に基づくピークの検出される位置が、波状構造を有するCNTにおける屈曲点間の道のりに対応する指標としての役割を果たし得ることを見出し、上記の条件(1)を設定した。
<< Condition (1) >>
The condition (1) is "a carbon nanotube dispersion in a spectrum obtained by Fourier transform infrared spectroscopic analysis of a carbon nanotube dispersion obtained by dispersing carbon nanotube aggregates so that the bundle length is 10 μm or more. There is at least one peak based on the plasmon resonance in the range of wavenumbers of 300 cm -1 to 2000 cm -1 or less. " Here, conventionally, strong absorption characteristics in the far infrared region are widely known as optical characteristics of CNTs. It is believed that the strong absorption characteristics in the far infrared region are due to the diameter and length of the CNTs. Regarding the absorption characteristics in the far-infrared region, more specifically, the relationship between the peak based on the plasmon resonance of CNT and the length of CNT, the non-patent document (T.Morimoto et.al., "Length-Dependent Plasmon" Resonance in Single-Walled Carbon Nanotubes ”, pp 9897-9904, Vol.8, No.10, ACS NANO, 2014). The present inventors have detected a peak based on the plasmon resonance of CNT in the spectrum obtained by Fourier transform infrared spectroscopic analysis based on the contents of the study as described in the above non-patent document and the original knowledge. It was estimated that the position to be used could be affected by the distance between the defect points in the CNT, and verification was performed. Then, the present inventors have found that the position where the peak based on the plasmon resonance of the CNT is detected can serve as an index corresponding to the distance between the bending points in the CNT having a wavy structure, and the above conditions. (1) was set.
 条件(1)において、波数300cm-1超2000cm-1以下の範囲に、好ましくは波数500cm-1以上2000cm-1以下の範囲に、より好ましくは波数650cm-1以上2000cm-1以下の範囲に、CNTのプラズモン共鳴に基づくピークが存在していれば、かかるCNTは炭素膜を形成した場合に良好な電磁波シールド性能を呈し得る。 In the condition (1), the wave number is 300 cm -1 to 2000 cm -1 or less, preferably the wave number 500 cm -1 to 2000 cm -1 or less, and more preferably the wave number 650 cm -1 to 2000 cm -1 or less. If a peak based on the plasmon resonance of the CNT is present, the CNT can exhibit good electromagnetic wave shielding performance when forming a carbon film.
 図7に、後述する実施例1~4、及び比較例1にて用いたCNT集合体をフーリエ変換赤外分光分析して得られたスペクトル(FIR共鳴チャート)を示す。図7より明らかなように、得られたスペクトルにおいて、CNT分散体のプラズモン共鳴に基づく比較的緩やかなピーク以外に、波数840cm-1付近、1300cm-1付近、及び1700cm-1付近に、鋭いピークが確認されることが分かる。これらの鋭いピークは、「カーボンナノチューブ分散体のプラズモン共鳴に基づくピーク」には該当せず、それぞれが、官能基由来の赤外吸収に対応している。より具体的には、波数840cm-1付近の鋭いピークは、C-H面外変角振動に起因し;波数1300cm-1付近の鋭いピークは、エポキシ三員環伸縮振動に起因し;波数1700cm-1付近の鋭いピークは、C=O伸縮振動に起因する。なお、波数2000cm-1超の領域では、プラズモン共鳴とは別に、上記したT.Morimotoらによる非特許文献でも言及されているように、S1ピークに類するピークが検出されるため、本発明者らは、条件(1)におけるCNT分散体のプラズモン共鳴に基づくピークの有無の判定上限を2000-1cm以下とした。 FIG. 7 shows a spectrum (FIR resonance chart) obtained by Fourier transform infrared spectroscopic analysis of the CNT aggregates used in Examples 1 to 4 and Comparative Example 1 described later. As is clear from FIG. 7, in the obtained spectrum, in addition to the relatively gentle peak based on the plasmon resonance of the CNT dispersion, the wave number is sharp around 840 cm -1 and around 1300 cm -1 and 1700 cm -1 . Can be seen to be confirmed. These sharp peaks do not correspond to "peaks based on plasmon resonance of carbon nanotube dispersion", and each corresponds to infrared absorption derived from a functional group. More specifically, the sharp peak near wave number 840 cm -1 is due to the CH out-of-plane angular vibration; the sharp peak near wave number 1300 cm -1 is due to the epoxy three-membered ring expansion and contraction vibration; wave number 1700 cm. The sharp peak near -1 is due to C = O expansion and contraction vibration. In the region where the wave number exceeds 2000 cm -1 , apart from the plasmon resonance, as mentioned in the above-mentioned non-patent document by T. Morimoto et al., A peak similar to the S1 peak is detected. The upper limit of the determination of the presence or absence of a peak based on the plasmon resonance of the CNT dispersion under the condition (1) was set to 2000 -1 cm or less.
 ここで、条件(1)において、フーリエ変換赤外分光分析によるスペクトルを取得するにあたり、バンドル長が10μm以上になるように、CNT集合体を分散させることにより、CNT分散体を得る必要がある。ここで、例えば、CNT集合体、水、及び界面活性剤(例えば、ドデシルベンゼンスルホン酸ナトリウム)を適切な比率で配合して、超音波等により所定時間にわたり撹拌処理することで、水中に、バンドル長が10μm以上であるCNT分散体が分散されてなる分散液を得ることができる。 Here, under the condition (1), in order to acquire the spectrum by Fourier transform infrared spectroscopic analysis, it is necessary to obtain the CNT dispersion by dispersing the CNT aggregate so that the bundle length is 10 μm or more. Here, for example, CNT aggregate, water, and a surfactant (for example, sodium dodecylbenzene sulfonate) are blended in an appropriate ratio and stirred with ultrasonic waves or the like for a predetermined time to be bundled in water. It is possible to obtain a dispersion liquid in which a CNT dispersion having a length of 10 μm or more is dispersed.
 CNT分散体のバンドル長は、湿式画像解析型の粒度測定装置により解析することで、得ることができる。かかる測定装置は、CNT分散体を撮影して得られた画像から、各分散体の面積を算出して、算出した面積を有する円の直径(以下、ISO円径(ISO area diameter)とも称することがある)を得ることができる。そして、本明細書では、各分散体のバンドル長は、このようにして得られるISO円径の値であるものとして、定義した。 The bundle length of the CNT dispersion can be obtained by analyzing with a wet image analysis type particle size measuring device. Such a measuring device calculates the area of each dispersion from an image obtained by photographing the CNT dispersion, and is also referred to as the diameter of a circle having the calculated area (hereinafter, also referred to as ISO circle diameter (ISO area diameter)). There is) can be obtained. Then, in the present specification, the bundle length of each dispersion is defined as the value of the ISO circle diameter thus obtained.
<<条件(2)>>
 条件(2)は、「細孔分布曲線における最大のピークが、細孔径100nm超400nm未満の範囲にある。」ことを規定する。カーボンナノチューブ集合体の細孔分布は、液体窒素の77Kでの吸着等温線から、BJH法に基づいて求めることができる。そして、カーボンナノチューブ集合体について測定して得た細孔分布曲線におけるピークが100nm超の範囲にあるということは、カーボンナノチューブ集合体において、CNT間にある程度の大きさの空隙が存在し、CNTが過度に過密に凝集した状態となっていないことを意味する。なお、上限の400nmは、実施例で用いた測定装置(BELSORP-mini II)における測定限界である。
<< Condition (2) >>
Condition (2) stipulates that "the maximum peak in the pore distribution curve is in the range of more than 100 nm and less than 400 nm in pore diameter." The pore distribution of the carbon nanotube aggregate can be obtained from the adsorption isotherm of liquid nitrogen at 77K based on the BJH method. The fact that the peak in the pore distribution curve obtained by measuring the carbon nanotube aggregate is in the range of more than 100 nm means that in the carbon nanotube aggregate, there are voids of a certain size between the CNTs, and the CNTs are present. It means that it is not in a state of being overly densely aggregated. The upper limit of 400 nm is the measurement limit of the measuring device (BELSORP-mini II) used in the examples.
 ここで、炭素膜の電磁波シールド性能を更に向上させる観点から、CNT集合体の細孔分布曲線の最大のピークにおけるLog微分細孔容積の値は、2.0cm/g以上であることが好ましい。 Here, from the viewpoint of further improving the electromagnetic wave shielding performance of the carbon film, the value of the Log differential pore volume at the maximum peak of the pore distribution curve of the CNT aggregate is preferably 2.0 cm 3 / g or more. ..
<<条件(3)>>
 条件(3)は、「カーボンナノチューブ集合体の電子顕微鏡画像の二次元空間周波数スペクトルのピークが、1μm-1以上100μm-1以下の範囲に少なくとも1つ存在する。」ことを規定する。かかる条件の充足性は、下記の要領で判定することができる。まず、判定対象であるCNT集合体を、電子顕微鏡(例えば、電解放射走査型電子顕微鏡)を用いて拡大観察(例えば、1万倍)して、1cm四方の視野で電子顕微鏡画像を複数枚(例えば、10枚)取得する。得られた複数枚の電子顕微鏡画像について、高速フーリエ変換(FFT)処理を行い、二次元空間周波数スペクトルを得る。複数枚の電子顕微鏡画像のそれぞれについて得られた二次元空間周波数スペクトルを二値化処理して、最も高周波数側に出るピーク位置の平均値を求める。得られたピーク位置の平均値が1μm-1以上100μm-1以下の範囲内である場合には、条件(3)を満たすとして判定した。ここで、上記の判定において用いる「ピーク」としては、孤立点の抽出処理(即ち、孤立点除去の逆操作)を実施して得られた明確なピークを用いるものとする。従って、孤立点の抽出処理を実施した際に1μm-1以上100μm-1以下の範囲内にて明確なピークが得られない場合には、条件(3)は満たさないものとして判定する。
<< Condition (3) >>
Condition (3) stipulates that "at least one peak of the two-dimensional spatial frequency spectrum of the electron microscope image of the carbon nanotube aggregate exists in the range of 1 μm -1 or more and 100 μm -1 or less." Satisfiability of such a condition can be determined as follows. First, the CNT aggregate to be determined is magnified and observed (for example, 10,000 times) using an electron microscope (for example, an electrolytic radiation scanning electron microscope), and a plurality of electron microscope images are obtained in a 1 cm square field (for example). For example, 10 sheets) will be acquired. The obtained plurality of electron microscope images are subjected to a fast Fourier transform (FFT) process to obtain a two-dimensional spatial frequency spectrum. The two-dimensional spatial frequency spectra obtained for each of the plurality of electron microscope images are binarized, and the average value of the peak positions appearing on the highest frequency side is obtained. When the average value of the obtained peak positions was within the range of 1 μm -1 or more and 100 μm -1 or less, it was determined that the condition (3) was satisfied. Here, as the "peak" used in the above determination, a clear peak obtained by performing an isolated point extraction process (that is, a reverse operation of removing isolated points) is used. Therefore, if a clear peak cannot be obtained within the range of 1 μm -1 or more and 100 μm -1 or less when the isolated point extraction process is performed, it is determined that the condition (3) is not satisfied.
 ここで、炭素膜の電磁波シールド性能を更に向上させる観点から、二次元空間周波数スペクトルのピークが、2.6μm-1以上100μm-1以下の範囲に存在することが好ましい。 Here, from the viewpoint of further improving the electromagnetic wave shielding performance of the carbon film, it is preferable that the peak of the two-dimensional spatial frequency spectrum exists in the range of 2.6 μm -1 or more and 100 μm -1 or less.
 そして、炭素膜の電磁波シールド性能を更に向上させる観点から、CNT集合体は、上記(1)~(3)の条件のうちを少なくとも2つを満たすことが好ましく、(1)~(3)の条件全てを満たすことがより好ましい。 From the viewpoint of further improving the electromagnetic wave shielding performance of the carbon film, the CNT aggregate preferably satisfies at least two of the above conditions (1) to (3), and the above (1) to (3). It is more preferable to satisfy all the conditions.
<<その他の性状>>
 なお、本発明の炭素膜の形成に使用し得るCNT集合体は、上記(1)~(3)の条件以外にも、以下の性状を有することが好ましい。
<< Other properties >>
The CNT aggregate that can be used for forming the carbon film of the present invention preferably has the following properties in addition to the above conditions (1) to (3).
 例えば、CNT集合体は、BET法による全比表面積が、好ましくは600m/g以上、より好ましくは800m/g以上であり、好ましくは2600m/g以下、より好ましくは1400m/g以下である。さらに開口処理したものにあっては、1300m/g以上であることが好ましい。高い比表面積を有するCNT集合体によれば、炭素膜内部にて電磁波を一層良好に乱反射ささえることができ、その結果、炭素膜の電磁波シールド性能を更に向上させることができる。CNT集合体は、単層CNTを主として、機能を損なわない程度に、2層CNTと多層CNTを含んでもよい。CNTのBET法による全比表面積は、例えば、JIS Z8830に準拠した、BET比表面積測定装置を用いて測定できる。 For example, the total specific surface area of the CNT aggregate by the BET method is preferably 600 m 2 / g or more, more preferably 800 m 2 / g or more, preferably 2600 m 2 / g or less, and more preferably 1400 m 2 / g or less. Is. Further, in the case of the opening-treated one, it is preferably 1300 m 2 / g or more. According to the CNT aggregate having a high specific surface area, the electromagnetic wave can be more diffusely reflected inside the carbon film, and as a result, the electromagnetic wave shielding performance of the carbon film can be further improved. The CNT aggregate may contain mainly single-walled CNTs, and may contain two-walled CNTs and multi-walled CNTs to the extent that the functions are not impaired. The total specific surface area of CNTs by the BET method can be measured, for example, by using a BET specific surface area measuring device compliant with JIS Z8830.
 また、CNT集合体を構成するCNTの平均高さは、10μm以上10cm以下であることが好ましく、100μm以上2cm以下であることがより好ましい。CNT集合体を構成するCNTの平均高さが10μm以上あると、隣接するCNTバンドルとの凝集を防ぎ、容易に分散させることが可能になる。CNT集合体を構成するCNTの平均高さが10μm以上であれば、CNT同士のネットワークを形成し易くなり、導電性または機械強度が必要とされる用途において好適に用いることができる。CNT集合体を構成するCNTの平均高さが10cm以下であると、生成を短時間で行なえるため炭素系不純物の付着を抑制でき比表面積を向上できる。CNT集合体を構成するCNTの平均高さが2cm以下であればより容易に分散させることが可能になる。なお、CNTの平均高さは、走査型電子顕微鏡(SEM)を用いて無作為に選択したCNT100本の高さを測定して求めることができる。 Further, the average height of the CNTs constituting the CNT aggregate is preferably 10 μm or more and 10 cm or less, and more preferably 100 μm or more and 2 cm or less. When the average height of the CNTs constituting the CNT aggregate is 10 μm or more, it is possible to prevent aggregation with the adjacent CNT bundle and easily disperse the CNTs. When the average height of the CNTs constituting the CNT aggregate is 10 μm or more, it becomes easy to form a network between the CNTs, and the CNTs can be suitably used in applications requiring conductivity or mechanical strength. When the average height of the CNTs constituting the CNT aggregate is 10 cm or less, the formation can be performed in a short time, so that the adhesion of carbon-based impurities can be suppressed and the specific surface area can be improved. If the average height of the CNTs constituting the CNT aggregate is 2 cm or less, it can be more easily dispersed. The average height of the CNTs can be determined by measuring the height of 100 randomly selected CNTs using a scanning electron microscope (SEM).
 CNT集合体のタップかさ密度は、0.001g/cm3以上0.2g/cm3以下であることが好ましい。このような密度範囲にあるCNT集合体は、CNT同士の結びつきが過度に強まらないため、分散性に優れており、様々な形状に成形加工することが可能である。CNT集合体のタップかさ密度が0.2g/cm3以下であれば、CNT同士の結びつきが弱くなるので、CNT集合体を溶媒などに撹拌した際に、均質に分散させることが容易になる。また、CNT集合体のタップかさ密度が0.001g/cm3以上であれば、CNT集合体の一体性が向上されハンドリングが容易になる。タップかさ密度とは、粉体状のCNT集合体を容器に充填した後、タッピングまたは振動等により粉体粒子間の空隙を減少させ、密充填させた状態での見かけかさ密度である。 The tap bulk density of the CNT aggregate is preferably 0.001 g / cm 3 or more and 0.2 g / cm 3 or less. Since the CNT aggregates in such a density range do not excessively strengthen the bonds between the CNTs, they are excellent in dispersibility and can be molded into various shapes. When the tap bulk density of the CNT aggregate is 0.2 g / cm 3 or less, the bond between the CNTs is weakened, so that when the CNT aggregate is stirred with a solvent or the like, it becomes easy to disperse it uniformly. Further, when the tap bulk density of the CNT aggregate is 0.001 g / cm 3 or more, the integrity of the CNT aggregate is improved and the handling becomes easy. The tap bulk density is the apparent bulk density in a state where the powdery CNT aggregate is filled in a container, the voids between the powder particles are reduced by tapping or vibration, and the containers are tightly packed.
 さらに、CNT集合体を構成するCNTの平均外径は、0.5nm以上であることが好ましく、1.0nm以上であることが更に好ましく、15.0nm以下であることが好ましく、10.0nm以下であることがより好ましく、5.0nm以下であることが更に好ましい。CNTの平均外径が0.5nm以上であれば、CNT同士のバンドル化が低減でき、高い比表面積を維持できる。CNTの平均外径が15.0nm以下であれば、多層CNT比率を低減でき、高い比表面積を維持することができる。ここで、CNTの平均外径は、透過型電子顕微鏡(TEM)を用いて無作為に選択したCNT100本の直径(外径)を測定して求めることができる。CNTの平均直径(Av)及び標準偏差(σ)は、CNTの製造方法や製造条件を変更することにより調整してもよいし、異なる製法で得られたCNTを複数種類組み合わせることにより調整してもよい。 Further, the average outer diameter of the CNTs constituting the CNT aggregate is preferably 0.5 nm or more, more preferably 1.0 nm or more, preferably 15.0 nm or less, and 10.0 nm or less. It is more preferably 5.0 nm or less, and further preferably 5.0 nm or less. When the average outer diameter of CNTs is 0.5 nm or more, bundling between CNTs can be reduced and a high specific surface area can be maintained. When the average outer diameter of CNTs is 15.0 nm or less, the ratio of multi-walled CNTs can be reduced and a high specific surface area can be maintained. Here, the average outer diameter of the CNT can be obtained by measuring the diameter (outer diameter) of 100 randomly selected CNTs using a transmission electron microscope (TEM). The average diameter (Av) and standard deviation (σ) of CNTs may be adjusted by changing the manufacturing method and manufacturing conditions of CNTs, or by combining a plurality of types of CNTs obtained by different manufacturing methods. May be good.
 CNT集合体のG/D比は1以上50以下であることが好ましい。G/D比が1に満たないCNT集合体は、単層CNTの結晶性が低く、アモルファスカーボンなどの汚れが多い上、多層CNTの含有量が多いことが考えられる。反対にG/D比が50を超えるCNT集合体は直線性が高く、CNTが隙間の少ないバンドルを形成しやすく、比表面積が減少する可能性がある。G/D比とはCNTの品質を評価するのに一般的に用いられている指標である。ラマン分光装置によって測定されるCNTのラマンスペクトルには、Gバンド(1600cm-1付近)とDバンド(1350cm-1付近)と呼ばれる振動モードが観測される。GバンドはCNTの円筒面であるグラファイトの六方格子構造由来の振動モードであり、Dバンドは非晶箇所に由来する振動モードである。よって、GバンドとDバンドのピーク強度比(G/D比)が高いものほど、結晶性(直線性)の高いCNTと評価できる。 The G / D ratio of the CNT aggregate is preferably 1 or more and 50 or less. It is considered that the CNT aggregate having a G / D ratio of less than 1 has low crystallinity of single-walled CNTs, has a lot of stains such as amorphous carbon, and has a high content of multi-walled CNTs. On the other hand, CNT aggregates having a G / D ratio of more than 50 have high linearity, and CNTs tend to form bundles with few gaps, which may reduce the specific surface area. The G / D ratio is an index generally used for evaluating the quality of CNTs. Vibration modes called G band (around 1600 cm -1 ) and D band (around 1350 cm -1 ) are observed in the Raman spectrum of CNTs measured by a Raman spectroscope. The G band is a vibration mode derived from the hexagonal lattice structure of graphite, which is the cylindrical surface of CNT, and the D band is a vibration mode derived from an amorphous portion. Therefore, the higher the peak intensity ratio (G / D ratio) between the G band and the D band, the higher the crystallinity (linearity) of the CNT.
 高い比表面積を得るため、CNT集合体の純度は極力高いことが望ましい。ここでいう純度とは、炭素純度であり、CNT集合体の質量の何パーセントが炭素で構成されているかを示す値である。高い比表面積を得る上での純度に上限はないが、製造上、99.9999質量%以上のCNT集合体を得ることは困難である。純度が95質量%に満たないと、開口処理されてない状態で、1000m/gを超える比表面積を得ることが困難となる。さらに、金属不純物を含んで炭素純度が95質量%に満たないと、開口処理において金属不純物が酸素と反応などしてCNTの開口を妨げるため、結果として、比表面積の拡大が困難となる。これらの点から、単層CNTの純度は95質量%以上であることが好ましい。
 上述した(1)~(3)の条件の少なくとも何れかを満たす所定のCNT集合体は、精製処理を行わなくても、その純度は、通常、98質量%以上、好ましくは99.9質量%以上とすることができる。当該CNT集合体には不純物が殆ど混入しておらず、CNT本来の諸特性を充分に発揮することができる。CNT集合体の炭素純度は、蛍光X線を用いた元素分析や熱重量測定分析(TGA)等から得ることができる。
In order to obtain a high specific surface area, it is desirable that the purity of the CNT aggregate is as high as possible. The term "purity" as used herein is carbon purity, and is a value indicating what percentage of the mass of the CNT aggregate is composed of carbon. Although there is no upper limit to the purity for obtaining a high specific surface area, it is difficult to obtain a CNT aggregate of 99.9999% by mass or more in manufacturing. If the purity is less than 95% by mass, it becomes difficult to obtain a specific surface area of more than 1000 m 2 / g in the unopened state. Further, if the carbon purity is less than 95% by mass including the metal impurities, the metal impurities react with oxygen in the opening treatment and hinder the opening of the CNT, and as a result, it becomes difficult to increase the specific surface area. From these points, the purity of the single-walled CNT is preferably 95% by mass or more.
The purity of a predetermined CNT aggregate satisfying at least one of the above-mentioned conditions (1) to (3) is usually 98% by mass or more, preferably 99.9% by mass, even without purification treatment. The above can be done. Almost no impurities are mixed in the CNT aggregate, and various characteristics inherent in CNT can be fully exhibited. The carbon purity of the CNT aggregate can be obtained from elemental analysis using fluorescent X-rays, thermogravimetric analysis (TGA), or the like.
<<CNT集合体の製造方法>>
 CNT集合体を製造する方法は特に限定されず、所望の性状に応じて製造条件を調整することができる。例えば、上述した(1)~(3)の条件の少なくとも何れかを満たすCNT集合体を製造するに際しては、CNT集合体の成長時の条件が、下記の(a)~(c)の全てを満たすことが必要である。
 (a)CNT集合体の成長速度が5μm/分以上である。
 (b)CNT集合体の成長雰囲気における触媒賦活物質濃度が4体積%以上である。
 (c)CNT集合体の成長時に、CNT集合体を構成するCNTの成長方向に障害物が存在する。
<< Manufacturing method of CNT aggregate >>
The method for producing the CNT aggregate is not particularly limited, and the production conditions can be adjusted according to the desired properties. For example, when producing a CNT aggregate that satisfies at least one of the above-mentioned conditions (1) to (3), the conditions for growth of the CNT aggregate are all of the following (a) to (c). It is necessary to meet.
(A) The growth rate of the CNT aggregate is 5 μm / min or more.
(B) The concentration of the catalyst activator in the growth atmosphere of the CNT aggregate is 4% by volume or more.
(C) When the CNT aggregate grows, an obstacle exists in the growth direction of the CNTs constituting the CNT aggregate.
 そして、上述した(a)~(c)の全てを満たす製造方法により、上述した(1)~(3)の条件の少なくとも何れかを満たすCNT集合体を効率的に製造することができる。さらに、かかる製造方法では、CNT集合体の成長時に上記条件(a)~(c)が満たされる限りにおいて特に限定されることなく、流動層法、移動層法及び固定層法等の既知の方途に従うCNT合成工程を採用することができる。ここで、流動層法とは、CNTを合成するための触媒を担持した粒状の担体(以下、粒状触媒担持体とも称する)を流動化させながら、CNTを合成する合成方法を意味する。また、移動層法及び固定層法とは、触媒を担持した担体(粒子状担体或いは板状担体)を流動させることなく、CNTを合成する合成方法を意味する。 Then, by the production method satisfying all of the above-mentioned (a) to (c), it is possible to efficiently produce the CNT aggregate satisfying at least one of the above-mentioned conditions (1) to (3). Further, in such a production method, the above conditions (a) to (c) are not particularly limited as long as the above conditions (a) to (c) are satisfied when the CNT aggregate is grown, and known methods such as a fluidized bed method, a mobile layer method and a fixed layer method are used. The CNT synthesis process according to the above can be adopted. Here, the fluidized bed method means a synthesis method for synthesizing CNTs while fluidizing a granular carrier carrying a catalyst for synthesizing CNTs (hereinafter, also referred to as a granular catalyst carrier). Further, the moving layer method and the fixed layer method mean a synthetic method for synthesizing CNTs without flowing a carrier (particulate carrier or plate-like carrier) carrying a catalyst.
 一例において、上述した(a)~(c)の全てを満たす製造方法は、触媒担持体を形成する触媒担持体形成工程と、かかる触媒担持体形成工程にて得られた触媒担持体を用いてCNTを合成するCNT合成工程と、かかるCNT合成工程で合成されたCNTを回収する回収工程と、を含む。そして、触媒担持体形成工程は、湿式又は乾式の既知の触媒担持法に従って、実施することができる。また、回収工程は分級装置などの既知の分離回収装置を用いて実施することができる。 In one example, the production method satisfying all of the above-mentioned (a) to (c) uses the catalyst carrier forming step of forming the catalyst carrier and the catalyst carrier obtained in the catalyst carrier forming step. The CNT synthesis step of synthesizing the CNT and the recovery step of recovering the CNT synthesized in the CNT synthesis step are included. Then, the catalyst carrier forming step can be carried out according to a known wet or dry catalyst carrier method. In addition, the recovery step can be carried out using a known separation / recovery device such as a classification device.
[CNT合成工程]
 CNT合成工程では、CNTの成長時に、上記の条件(a)~(c)を全て満たすようにする。具体的には、CNT成長雰囲気における、炭素源となる原料ガスの濃度及び温度等を適宜調節すること「カーボンナノチューブ集合体の成長速度が5μm/分以上である。」という条件(a)を満たすことができる。ここで、炭素源となる原料ガスとしては、特に限定されることなく、メタン、エタン、エチレン、プロパン、ブタン、ペンタン、ヘキサン、ヘプタン、プロピレン及びアセチレンなどの炭化水素のガス;メタノール、エタノールなどの低級アルコールのガス;並びに、これらの混合物も使用可能である。また、この原料ガスは、不活性ガスで希釈されていてもよい。また、得られるCNT集合体の分散性を一層高めつつ炭素膜の電磁波シールド性能を更に向上させる観点から、CNT集合体の成長速度は、10μm/分以上であることが好ましい。なお、温度は、例えば、400℃以上1100℃以下の範囲で調節することができる。
[CNT synthesis process]
In the CNT synthesis step, all of the above conditions (a) to (c) are satisfied when the CNT grows. Specifically, the condition (a) that "the growth rate of the carbon nanotube aggregate is 5 μm / min or more" is satisfied by appropriately adjusting the concentration and temperature of the raw material gas as a carbon source in the CNT growth atmosphere. be able to. Here, the raw material gas as a carbon source is not particularly limited, and hydrocarbon gas such as methane, ethane, ethylene, propane, butane, pentane, hexane, heptane, propylene and acetylene; methanol, ethanol and the like. Gas of lower alcohols; as well as mixtures thereof can also be used. Further, this raw material gas may be diluted with an inert gas. Further, from the viewpoint of further improving the electromagnetic wave shielding performance of the carbon film while further improving the dispersibility of the obtained CNT aggregate, the growth rate of the CNT aggregate is preferably 10 μm / min or more. The temperature can be adjusted, for example, in the range of 400 ° C. or higher and 1100 ° C. or lower.
 CNT成長雰囲気下にて、炭素源となる原料ガスはエチレンを含むことが好ましい。エチレンを所定の温度範囲(700℃以上900℃以下)の範囲で加熱することで、エチレンの分解反応が促進され、その分解ガスが触媒と接触した際に、CNTの高速成長が可能になる。しかしながら、熱分解時間が長すぎると、エチレンの分解反応が進みすぎ、触媒の失活やCNT集合体への炭素不純物付着を引き起こす。本発明のCNT集合体製造においては、エチレン濃度0.1体積%以上40体積%以下の範囲に対して、熱分解時間0.5秒以上10秒以下の範囲が好ましい。0.5秒未満ではエチレンの熱分解が不足し、高比表面積なCNT集合体を高速に成長させることが困難になる。10秒より長いと、エチレンの分解が進み過ぎ、炭素不純物が多く発生し、触媒失活やCNT集合体の品質低下を引き起こしてしまう。熱分解時間は以下の式から計算する。
(熱分解時間)=(加熱流路体積)/{(原料ガス流量)×(273.15+T)/273.15}
 ここで加熱流路体積とは、原料ガスが触媒に接触する前に通過する、所定温度T℃に加熱された流路の体積であり、原料ガス流量は0℃、1atmにおける流量である。
Under the CNT growth atmosphere, the raw material gas as a carbon source preferably contains ethylene. By heating ethylene in a predetermined temperature range (700 ° C. or higher and 900 ° C. or lower), the decomposition reaction of ethylene is promoted, and when the decomposition gas comes into contact with the catalyst, high-speed growth of CNT is possible. However, if the thermal decomposition time is too long, the decomposition reaction of ethylene proceeds too much, causing deactivation of the catalyst and adhesion of carbon impurities to the CNT aggregate. In the production of the CNT aggregate of the present invention, the thermal decomposition time is preferably 0.5 seconds or more and 10 seconds or less with respect to the ethylene concentration range of 0.1% by volume or more and 40% by volume or less. In less than 0.5 seconds, the thermal decomposition of ethylene is insufficient, and it becomes difficult to grow a CNT aggregate having a high specific surface area at high speed. If it is longer than 10 seconds, the decomposition of ethylene proceeds too much, and a large amount of carbon impurities are generated, which causes catalyst deactivation and deterioration of the quality of CNT aggregates. The pyrolysis time is calculated from the following formula.
(Pyrolysis time) = (Heating flow path volume) / {(Raw material gas flow rate) x (273.15 + T) / 273.15}
Here, the heating flow path volume is the volume of the flow path heated to a predetermined temperature T ° C. through which the raw material gas passes before coming into contact with the catalyst, and the raw material gas flow rate is a flow rate at 0 ° C. and 1 atm.
 また、CNT成長時に供給する触媒賦活物質の供給速度を適宜調節することで、「カーボンナノチューブ集合体の成長雰囲気における触媒賦活物質濃度が4体積%以上である。」という条件(b)を満たすことができる。炭素膜の電磁波シールド性能を更に向上させる観点から、CNT集合体の成長雰囲気における触媒賦活物質濃度は、5体積%以上であることが好ましい。触媒賦活物質としては、特に限定されることなく、水、酸素、オゾン、酸性ガス、酸化窒素、一酸化炭素及び二酸化炭素などの低炭素数の含酸素化合物;エタノール、メタノールなどのアルコール類;テトラヒドロフランなどのエーテル類;アセトンなどのケトン類;アルデヒド類;エステル類;並びにこれらの混合物が挙げられる。この中でも、二酸化炭素が好適である。なお、一酸化炭素やアルコール類など、炭素と酸素の両方を含む物質は、原料ガスと触媒賦活物質との両方の機能を有する場合がある。例えば一酸化炭素は、エチレンなどのより反応性の高い原料ガスと組み合わせれば触媒賦活物質として作用し、水などの微量でも大きな触媒賦活作用を示す触媒賦活物質と組み合わせれば原料ガスとして作用する。 Further, by appropriately adjusting the supply rate of the catalyst activator supplied during CNT growth, the condition (b) that "the concentration of the catalyst activator in the growth atmosphere of the carbon nanotube aggregate is 4% by volume or more" is satisfied. Can be done. From the viewpoint of further improving the electromagnetic wave shielding performance of the carbon film, the concentration of the catalyst activator in the growth atmosphere of the CNT aggregate is preferably 5% by volume or more. The catalyst activator is not particularly limited, and is an oxygen-containing compound having a low carbon number such as water, oxygen, ozone, acidic gas, nitrogen oxide, carbon monoxide and carbon dioxide; alcohols such as ethanol and methanol; tetrahydrofuran. Ethers such as; ketones such as acetone; aldehydes; esters; and mixtures thereof. Of these, carbon dioxide is preferable. A substance containing both carbon and oxygen, such as carbon monoxide and alcohols, may have both functions as a raw material gas and a catalyst activator. For example, carbon monoxide acts as a catalytically activating substance when combined with a more reactive raw material gas such as ethylene, and acts as a raw material gas when combined with a catalytically activating substance that exhibits a large catalytically activating effect even in a trace amount such as water. ..
 さらにまた、CNT合成工程において流動層法を選択すること或いは、移動層法や固定層法において触媒担持体の配置間隔を調節することにより、「カーボンナノチューブ集合体の合成時に、カーボンナノチューブ集合体を構成するカーボンナノチューブの成長方向に障害物が存在する。」という条件(c)を満たすことができる。 Furthermore, by selecting the fluidized layer method in the CNT synthesis step or adjusting the arrangement interval of the catalyst carriers in the mobile layer method or the fixed layer method, "when synthesizing the carbon nanotube aggregate, the carbon nanotube aggregate is formed. The condition (c) that "there is an obstacle in the growth direction of the constituent carbon nanotubes" can be satisfied.
 ここで、前記流動層法にてCNTを合成する際には、CNT合成工程は、例えば、下方からガスを供給して粒子状の触媒担持体を流動させつつ、原料ガスを供給して実施してもよいし、粒子状の触媒担持体をスクリュー回転によって連続的に搬送しながら、原料ガスを供給して実施してもよい。 Here, when CNT is synthesized by the fluidized bed method, for example, the CNT synthesis step is carried out by supplying the raw material gas while supplying gas from below to flow the particulate catalyst carrier. Alternatively, the raw material gas may be supplied while continuously transporting the particulate catalyst carrier by screw rotation.
 触媒担持体は担体と当該担体の表面に担持された触媒とを有し、担体は当該担体表面に触媒を付着、固定、成膜、または形成などして担持するための母体構造を成す部分である。担体の構造としては、当該担体のみでも良く、当該担体の表面上に触媒を良好に担持するための任意の下地層を設けた下地層付き担体でも良い。担体の形状は粒子状であることが好ましく、その粒子径は、体積平均粒子径で1mm以下であることが好ましく、0.7mm以下であることがより好ましく、0.4mm以下であることが更に好ましく、0.05mm以上であることが好ましい。粒子径が上記上限以下であれば、成長するCNTバンドルが細くなり、波状構造を形成するに有利になる。粒子密度は、見かけ密度で3.8g/cm以上であることが好ましく、5.8g/cm以上であることがより好ましく、8g/cm以下であることが好ましい。粒子密度が上記下限以上であれば、成長中のCNTバンドルに加わる力が高まり、波状構造を形成するに有利になる。担体の材質は、Al及びZrの内の何れか1種以上の元素を含む金属酸化物であることが好ましい。中でも、大きな元素量をもったZrを含むジルコニアビーズが特に好ましい。 The catalyst carrier has a carrier and a catalyst supported on the surface of the carrier, and the carrier is a portion forming a matrix structure for supporting, fixing, forming, or forming a catalyst on the surface of the carrier. be. The structure of the carrier may be only the carrier, or may be a carrier with a base layer provided with an arbitrary base layer for satisfactorily supporting the catalyst on the surface of the carrier. The shape of the carrier is preferably in the form of particles, and the particle size thereof is preferably 1 mm or less, more preferably 0.7 mm or less, and further preferably 0.4 mm or less in terms of volume average particle size. It is preferably 0.05 mm or more. When the particle size is equal to or less than the above upper limit, the growing CNT bundle becomes thin, which is advantageous for forming a wavy structure. The apparent density of the particles is preferably 3.8 g / cm 3 or more, more preferably 5.8 g / cm 3 or more, and preferably 8 g / cm 3 or less. When the particle density is equal to or higher than the above lower limit, the force applied to the growing CNT bundle is increased, which is advantageous for forming a wavy structure. The material of the carrier is preferably a metal oxide containing at least one element of Al and Zr. Among them, zirconia beads containing Zr having a large elemental amount are particularly preferable.
 例えば、粒子状の担体を用いる場合において、粒子状の担体の表面に触媒を担持させる方法としては、例えば、略円筒状の回転ドラムを備える回転ドラム式塗工装置を用いる方法を挙げることができる。なお、粒子状の担体の表面に下地層を配置してから触媒を担持させる場合には、触媒溶液を噴霧し乾燥することに先立って、下地層を構成し得る成分を含む溶液を粒子状の担体表面に噴霧し乾燥して担体表面に下地層を配置する。このような方法によれば、触媒層や下地層を比較的簡単で、且つむらなく形成することができる。 For example, when a particulate carrier is used, as a method of supporting the catalyst on the surface of the particulate carrier, for example, a method of using a rotary drum type coating device provided with a substantially cylindrical rotary drum can be mentioned. .. When the catalyst is supported after arranging the underlayer on the surface of the particulate carrier, the solution containing the components that can form the underlayer is prepared in the form of particles prior to spraying and drying the catalyst solution. The underlayer is placed on the surface of the carrier by spraying and drying on the surface of the carrier. According to such a method, the catalyst layer and the base layer can be formed relatively easily and evenly.
 そして、CNT合成工程では、上記条件(a)~(c)を満たすようにして実施される「成長工程」に先立って、触媒担持体に担持された触媒を還元する「フォーメーション工程」を実施するとともに、成長工程を終了させた後に、CNTが成長した触媒担持体を冷却する「冷却工程」を実施することができる。「フォーメーション工程」では、例えば、触媒担持体を含む雰囲気を還元ガス雰囲気として、かかる還元ガス雰囲気又は触媒担持体のうち少なくとも一方を加熱して、触媒担持体に担持された触媒を還元及び微粒子化する。フォーメーション工程における触媒担持体又は還元ガス雰囲気の温度は、好ましくは400℃以上1100℃以下である。また、フォーメーション工程の実施時間は、3分以上120分以下であり得る。なお、還元ガスとしては、例えば、水素ガス、アンモニアガス、水蒸気及びそれらの混合ガスを用いることができる。また、還元ガスは、これらのガスをヘリウムガス、アルゴンガス、窒素ガス等の不活性ガスと混合した混合ガスでもよい。
 一方、「冷却工程」では、CNTが成長した触媒担持体を不活性ガス環境下において冷却する。ここで、不活性ガスとしては、成長工程で使用し得る不活性ガスと同様の不活性ガスを使用し得る。また、冷却工程では、CNTが成長した触媒担持体の温度は、好ましくは400℃以下、さらに好ましくは200℃以下まで低下させる。
Then, in the CNT synthesis step, a "formation step" for reducing the catalyst carried on the catalyst carrier is carried out prior to the "growth step" carried out so as to satisfy the above conditions (a) to (c). At the same time, after the growth step is completed, a "cooling step" for cooling the catalyst carrier on which the CNT has grown can be carried out. In the "formation step", for example, an atmosphere containing a catalyst carrier is used as a reducing gas atmosphere, and at least one of the reduced gas atmosphere or the catalyst carrier is heated to reduce and atomize the catalyst supported on the catalyst carrier. do. The temperature of the catalyst carrier or the reducing gas atmosphere in the formation step is preferably 400 ° C. or higher and 1100 ° C. or lower. Further, the implementation time of the formation step may be 3 minutes or more and 120 minutes or less. As the reducing gas, for example, hydrogen gas, ammonia gas, water vapor, or a mixed gas thereof can be used. Further, the reducing gas may be a mixed gas obtained by mixing these gases with an inert gas such as helium gas, argon gas or nitrogen gas.
On the other hand, in the "cooling step", the catalyst carrier on which the CNT has grown is cooled in an inert gas environment. Here, as the inert gas, an inert gas similar to the inert gas that can be used in the growth step can be used. Further, in the cooling step, the temperature of the catalyst carrier on which the CNTs have grown is preferably lowered to 400 ° C. or lower, more preferably 200 ° C. or lower.
<乾式粉砕処理>
 本発明の炭素膜を得るに際し、必要に応じて、膜化前のCNT集合体に対し乾式粉砕処理を施すことができる。なお、本発明において「乾式粉砕処理」とは、粉砕対象が実質的に溶媒を含有しない状態(例えば、固形分濃度が95%以上の状態)での粉砕処理を意味する。
<Drywall crushing process>
In obtaining the carbon film of the present invention, if necessary, the CNT aggregate before film formation can be subjected to a dry pulverization treatment. In the present invention, the "dry crushing treatment" means a crushing treatment in a state where the crushing target substantially does not contain a solvent (for example, a state where the solid content concentration is 95% or more).
 乾式粉砕処理に使用し得る粉砕装置としては、微細な構造体からなる集合体に対し、撹拌などにより物理的負荷をかけ得る装置であれば特に限定されない。このような装置としては、回転羽を備えるミキサーを使用することができる。
 また粉砕条件は特に限定されない。例えば、粉砕装置として回転羽を備えるミキサーを用いる場合、回転速度は、500rpm以上5000rpm以下であることが好ましく、粉砕時間は10秒以上20分以下であることが好ましい。
The crushing device that can be used for the dry crushing process is not particularly limited as long as it is a device that can apply a physical load to an aggregate composed of fine structures by stirring or the like. As such a device, a mixer provided with rotating blades can be used.
The crushing conditions are not particularly limited. For example, when a mixer provided with rotating blades is used as the crushing device, the rotation speed is preferably 500 rpm or more and 5000 rpm or less, and the crushing time is preferably 10 seconds or more and 20 minutes or less.
<膜化>
 CNT集合体を膜化することで、本発明の炭素膜を得ることができる。ここで、CNT集合体を膜化する方法は特に限定されないが、CNT集合体を水又は有機溶媒などの分散媒に分散させることでCNT分散液を調製し、当該CNT分散液から少なくとも分散媒の一部を除去する方法が好ましく挙げられる。
<Membrane formation>
By filming the CNT aggregate, the carbon film of the present invention can be obtained. Here, the method for forming a film of the CNT aggregate is not particularly limited, but a CNT dispersion liquid is prepared by dispersing the CNT aggregate in a dispersion medium such as water or an organic solvent, and at least the dispersion medium is prepared from the CNT dispersion liquid. A method of removing a part thereof is preferably mentioned.
 CNT分散液の調製方法は、特に限定されないが、CNT分散液は、CNT集合体を、撹拌羽を用いた分散方法、超音波を用いた分散方法、及びせん断力を用いた分散方法などの既知の方法で分散媒中に分散させることにより得ることができる。ここで、得られる炭素膜の電磁波シールド性能を一層高める観点から、CNT分散液中にて、CNTが適度に分散していることが好ましい。好ましくは、CNT分散液が分散剤を非含有であることが好ましい。言い換えると、CNT分散液が、実質的にCNT及び分散媒のみからなることが好ましい。なお、本明細書において、「CNT分散液が、実質的にCNT及び分散媒のみからなる」とは、CNT分散液の構成成分の99.9質量%以上が、CNTとCNTに付随する不可避的不純物、及び分散媒及び分散媒に付随する不可避的不純物からなることを意味する。
 そして、CNT分散液から分散媒を除去する方法としては、濾過、乾燥等の既知の方法が挙げられる。
 濾過の方法としては、特に限定されることなく、自然濾過、減圧濾過(吸引濾過)、加圧濾過、遠心濾過などの既知の濾過方法を用いることができる。
 乾燥の方法としては、熱風乾燥法、真空乾燥法、熱ロール乾燥法、赤外線照射法等の既知の乾燥方法を用いることができる。乾燥温度は、特に限定されないが、通常、室温~200℃、乾燥時間は、特に限定されないが、通常、1時間以上48時間以内である。また、乾燥は、特に限定されないが、既知の基材上で行うことができる。
The method for preparing the CNT dispersion is not particularly limited, but the CNT dispersion is known to be a dispersion method using a stirring blade, a dispersion method using an ultrasonic wave, a dispersion method using a shearing force, and the like. It can be obtained by dispersing in a dispersion medium by the above method. Here, from the viewpoint of further enhancing the electromagnetic wave shielding performance of the obtained carbon film, it is preferable that the CNTs are appropriately dispersed in the CNT dispersion liquid. Preferably, the CNT dispersion liquid does not contain a dispersant. In other words, it is preferable that the CNT dispersion liquid is substantially composed only of CNT and the dispersion medium. In the present specification, "the CNT dispersion liquid is substantially composed of only CNT and the dispersion medium" means that 99.9% by mass or more of the constituents of the CNT dispersion liquid are inevitably attached to CNT and CNT. It means that it consists of impurities and unavoidable impurities associated with the dispersion medium and the dispersion medium.
Examples of the method for removing the dispersion medium from the CNT dispersion liquid include known methods such as filtration and drying.
The filtration method is not particularly limited, and known filtration methods such as natural filtration, vacuum filtration (suction filtration), pressure filtration, and centrifugal filtration can be used.
As the drying method, known drying methods such as a hot air drying method, a vacuum drying method, a hot roll drying method, and an infrared irradiation method can be used. The drying temperature is not particularly limited, but is usually room temperature to 200 ° C., and the drying time is not particularly limited, but is usually 1 hour or more and 48 hours or less. Further, the drying can be performed on a known substrate, although the drying is not particularly limited.
 これらの中でも、分散媒の除去には少なくとも乾燥を採用することが好ましい。
 なお、上記濾過と乾燥を組み合わせて用いることもできる。例えば、CNT分散液を濾過して得られた膜状の濾物(一次シート)を、更に乾燥することにより、本発明の炭素膜を得ることができる。
Among these, it is preferable to employ at least drying for removing the dispersion medium.
In addition, the above-mentioned filtration and drying can be used in combination. For example, the carbon film of the present invention can be obtained by further drying the film-shaped filter medium (primary sheet) obtained by filtering the CNT dispersion liquid.
(炭素膜の性状)
 ここで、本発明の炭素膜の厚みは、5μm以上であることが好ましく、10μm以上であることがより好ましく、200μm以下であることが好ましく、150μm以下であることがより好ましい。厚みが5μm以上であれば、炭素膜は十分な機械的強度を有し得ると共に、一層優れた電磁波シールド性能を発揮することができる。一方、厚みが200μm以下であれば、炭素膜を軽量化することができる。
 なお、炭素膜の「厚み」は、実施例に記載の方法を用いて測定することができる。
(Characteristics of carbon film)
Here, the thickness of the carbon film of the present invention is preferably 5 μm or more, more preferably 10 μm or more, preferably 200 μm or less, and even more preferably 150 μm or less. When the thickness is 5 μm or more, the carbon film can have sufficient mechanical strength and can exhibit more excellent electromagnetic wave shielding performance. On the other hand, if the thickness is 200 μm or less, the weight of the carbon film can be reduced.
The "thickness" of the carbon film can be measured by using the method described in Examples.
 以下に実施例を挙げて本発明を具体的に説明するが、本発明はこれらの実施例に限定されるものではない。
 なお、実施例及び比較例において、各種測定及び評価は、以下の通りに実施した。
Hereinafter, the present invention will be specifically described with reference to examples, but the present invention is not limited to these examples.
In the examples and comparative examples, various measurements and evaluations were carried out as follows.
<フーリエ変換赤外分光分析(FT-IR)>
 CNT集合体10mgに対して、界面活性剤としてのドデシルベンゼンスルホン酸ナトリウムを1質量%の濃度で含有する水100gを加え、超音波バスを用いて45Hzで1分間撹拌して、各CNT集合体の分散液100mlを得た。
 上述のように調製した各分散液について、同組成の溶媒を用いて2倍希釈し、それぞれシリコン基板上に滴下し乾燥させた後、フーリエ変換赤外分光光度計を用いて、プラズモン遠赤外(FIR)共鳴ピークにより、プラズモン実効長を測定した。プラズモン実効長については、表1に示す。そして、得られたFIRスペクトルについては、図7にFIR共鳴チャートを示す。図7に示すように、実施例1~4、比較例1で用いたCNT集合体に対応するカーブは、300cm-1超に光学濃度のピークが認められた。なお、プラズモンピークトップ位置は作図ソフトウェアを用いて多項式フィットによる近似曲線から取得した。
<Fourier transform infrared spectroscopy (FT-IR)>
To 10 mg of the CNT aggregate, 100 g of water containing sodium dodecylbenzenesulfonate as a surfactant at a concentration of 1% by mass was added, and the mixture was stirred at 45 Hz for 1 minute using an ultrasonic bath, and each CNT aggregate was stirred. 100 ml of the dispersion was obtained.
Each dispersion prepared as described above is diluted 2-fold with a solvent having the same composition, dropped onto a silicon substrate and dried, and then plasmon far infrared using a Fourier transform infrared spectrophotometer. The effective length of the plasmon was measured by the (FIR) resonance peak. The effective length of plasmon is shown in Table 1. The FIR resonance chart of the obtained FIR spectrum is shown in FIG. 7. As shown in FIG. 7, in the curves corresponding to the CNT aggregates used in Examples 1 to 4 and Comparative Example 1, a peak of optical density was observed above 300 cm -1 . The plasmon peak top position was obtained from an approximate curve by polynomial fit using drawing software.
<CNTバンドル長さ測定>
 FT-IR測定にて作製の各分散液について、フロー式粒子画像解析装置(ジャスコインタナショナル社製、循環型画像解析粒度分布計「CF-3000」)を用いて、分散液中に存在するCNT分散体のISO円径平均値を測定し、得られた値をCNTバンドル長さとした。解析条件は以下とした。
<解析条件>
 ・注入量:50ml(サンプリング容量1.2%)
 ・フローセルスペーサー:1000μm
 ・フロントレンズ倍率:2倍
 ・テレセントリックレンズ倍率0.75倍
 ・ピクセル当たりの長さ:2.3μm/pixel
 各分散液について、循環させながら同条件で4回測定を行い、それらの算術平均値を求めた。
<Measurement of CNT bundle length>
For each dispersion prepared by FT-IR measurement, CNT present in the dispersion using a flow-type particle image analyzer (circulation type image analysis particle size distribution meter "CF-3000" manufactured by Jasco International Co., Ltd.). The average ISO circle diameter of the dispersion was measured, and the obtained value was taken as the CNT bundle length. The analysis conditions were as follows.
<Analysis conditions>
-Injection amount: 50 ml (sampling capacity 1.2%)
・ Flow cell spacer: 1000 μm
・ Front lens magnification: 2x ・ Telecentric lens magnification 0.75x ・ Length per pixel: 2.3μm / pixel
Each dispersion was measured four times under the same conditions while being circulated, and their arithmetic mean values were calculated.
<細孔分布曲線の作成(CNT集合体)>
 CNT集合体10mg以上について、吸着等温線をBELSORP-miniII(マイクロトラックベル製)を用いて77Kで液体窒素を用いて計測した(吸着平衡時間は500秒とした)。前処理として、100℃で12時間、真空脱気を行った。この吸着等温線の吸着量からBJH法により各サンプルの細孔分布曲線を得た。その結果を図8に示す。図8に示すように、実施例1~4、比較例1で用いたCNT集合体は細孔径100nm以上の領域にLog微分細孔容積の最大のピークが確認された。
 なお、CNT集合体の細孔分布曲線の作成に際し、細孔径の測定範囲は1nm以上400nm未満とした。
<Creation of pore distribution curve (CNT aggregate)>
For 10 mg or more of CNT aggregates, adsorption isotherms were measured using BELSORP-miniII (manufactured by Microtrac Bell) at 77 K using liquid nitrogen (adsorption equilibrium time was set to 500 seconds). As a pretreatment, vacuum degassing was performed at 100 ° C. for 12 hours. From the adsorption amount of this adsorption isotherm, the pore distribution curve of each sample was obtained by the BJH method. The results are shown in FIG. As shown in FIG. 8, in the CNT aggregates used in Examples 1 to 4 and Comparative Example 1, the maximum peak of the Log differential pore volume was confirmed in the region having a pore diameter of 100 nm or more.
When creating the pore distribution curve of the CNT aggregate, the measurement range of the pore diameter was set to 1 nm or more and less than 400 nm.
<電子顕微鏡画像の二次元空間周波数スペクトル解析>
 後述する手順に従って準備したCNT集合体について、0.01mgをカーボンテープ上に乗せブロワーで吹いて余分なCNTを除去して試料を作製し、電解放射走査型電子顕微鏡にて1万倍で観察し、任意に抽出した1cm四方の視野で写真を10枚撮影した。撮影した10枚の電子顕微鏡画像について、それぞれ、高速フーリエ変換処理を行い、二次元空間周波数スペクトルを得た。得られた二次元空間周波数スペクトルのぞれぞれについて、2値化処理を行い、最も外側(高周波数側)に出るピーク位置を求めて、平均値を得た。なお、2値化処理に際しては、高速フーリエ変換処理を経て得られた数値について、0.75超の値を1とし、その他の値をゼロとした。図9Aは、準備したCNT集合体について取得した10枚の画像のうちの一枚であり、図9Bは、かかる画像について取得した二次元空間周波数スペクトルである。図9Bにおいて、より中心に近い成分が低周波成分を意味し、中心からより外側に位置する成分が、より高周波の成分に対応する。図中、矢印にて、1~100μm-1の領域に検出された明瞭なピークのうち、最も高波数のピーク位置(3μm-1)を示す。さらに、図9Cは、実施例4で用いたCNT集合体について取得した10枚の画像のうちの一枚であり、図9Dは、かかる画像について取得した二次元空間周波数スペクトルである。図9Dにおいて、より中心に近い成分が低周波成分を意味し、中心からより外側に位置する成分が、より高周波の成分に対応する。
<Two-dimensional spatial frequency spectrum analysis of electron microscope images>
For the CNT aggregate prepared according to the procedure described later, 0.01 mg was placed on a carbon tape and blown with a blower to remove excess CNTs to prepare a sample, which was observed at 10,000 times with an electrolytic radiation scanning electron microscope. , 10 photographs were taken with a 1 cm square field of view arbitrarily extracted. Fast Fourier transform processing was performed on each of the 10 electron microscope images taken to obtain a two-dimensional spatial frequency spectrum. Each of the obtained two-dimensional spatial frequency spectra was subjected to binarization processing, and the peak position appearing on the outermost side (high frequency side) was obtained to obtain an average value. In the binarization process, the values over 0.75 were set to 1 and the other values were set to zero for the numerical values obtained through the fast Fourier transform process. FIG. 9A is one of the ten images acquired for the prepared CNT aggregate, and FIG. 9B is a two-dimensional spatial frequency spectrum acquired for such images. In FIG. 9B, the component closer to the center means the low frequency component, and the component located more outward from the center corresponds to the higher frequency component. In the figure, the arrow indicates the peak position (3 μm -1 ) of the highest wave number among the clear peaks detected in the region of 1 to 100 μm -1 . Further, FIG. 9C is one of the 10 images acquired for the CNT aggregate used in Example 4, and FIG. 9D is a two-dimensional spatial frequency spectrum acquired for such an image. In FIG. 9D, the component closer to the center means the low frequency component, and the component located more outward from the center corresponds to the higher frequency component.
<厚み>
 炭素膜の厚みは、ミツトヨ社製「デジマチック標準外側マイクロメータ」を用いて測定した。
<Thickness>
The thickness of the carbon film was measured using a "Digimatic standard outside micrometer" manufactured by Mitutoyo.
<炭素膜の表面粗さの平均値>
 炭素膜の表面粗さの平均値は、ワンショット3D形状測定機(キーエンス社製、「VR-5000」)を用いて、ランダムに設定した4つの5cm×7cmの領域について、表面粗さを測定した。そして、得られた4つの表面粗さの値の算術平均値を算出し、「炭素膜の表面粗さの平均値」とした。
<Average value of surface roughness of carbon film>
For the average value of the surface roughness of the carbon film, the surface roughness was measured for four randomly set areas of 5 cm × 7 cm using a one-shot 3D shape measuring machine (“VR-5000” manufactured by KEYENCE CORPORATION). did. Then, the arithmetic mean value of the obtained four surface roughness values was calculated and used as the "average value of the surface roughness of the carbon film".
<電磁波シールド性能>
 炭素膜について、ASTM法(同軸構造)により、反射係数S11及び透過係数S21を測定し、電磁波シールド効果[dB]を算出した。
 そして、測定周波数0.1MHz、1MHz、10MHzにおける電磁波シールド効果[dB]について、以下の基準により評価した。なお、ある周波数での電磁波シールド効果[dB]の値が大きいほど、炭素膜がその周波数での電磁波シールド性能に優れることを示す。
 A:電磁波シールド効果が40dB以上である。
 B:電磁波シールド効果が30dB以上40dB未満である。
 C:電磁波シールド効果が20dB以上30dB未満である。
 D:電磁波シールド効果が20dB未満である。
<Electromagnetic wave shielding performance>
For the carbon film, the reflectance coefficient S11 and the transmission coefficient S21 were measured by the ASTM method (coaxial structure), and the electromagnetic wave shielding effect [dB] was calculated.
Then, the electromagnetic wave shielding effect [dB] at the measurement frequencies of 0.1 MHz, 1 MHz, and 10 MHz was evaluated according to the following criteria. The larger the value of the electromagnetic wave shielding effect [dB] at a certain frequency, the better the electromagnetic wave shielding performance of the carbon film at that frequency.
A: The electromagnetic wave shielding effect is 40 dB or more.
B: The electromagnetic wave shielding effect is 30 dB or more and less than 40 dB.
C: The electromagnetic wave shielding effect is 20 dB or more and less than 30 dB.
D: The electromagnetic wave shielding effect is less than 20 dB.
<CNT集合体の準備>
 実施例1~3及び比較例1にて使用したCNTは以下のようにして合成した。合成時に用いたCNT製造装置の概略構成を図10に示す。図10に示すCNT製造装置100はヒーター101、反応管102、分散板103、還元ガス/原料ガス導入口104、排気口105、ガス加熱促進部106から構成される。反応管102及び分散板103の材質は合成石英を使用した。
<<触媒担持体形成工程>>
 触媒担持体形成工程を以下に説明する。担体としてのジルコニア(二酸化ジルコニウム)ビーズ(ZrO、体積平均粒子径D50:350μm)を、回転ドラム式塗工装置に投入し、ジルコニアビーズを撹拌(20rpm)させながら、アルミニウム含有溶液をスプレーガンによりスプレー噴霧(噴霧量3g/分間、噴霧時間940秒間、スプレー空気圧10MPa)しつつ、圧縮空気(300L/分)を回転ドラム内に供給しながら乾燥させ、アルミニウム含有塗膜をジルコニアビーズ上に形成した。次に、480℃で45分間焼成処理を行い、酸化アルミニウム層が形成された一次触媒粒子を作製した。さらに、その一次触媒粒子を別の回転ドラム式塗工装置に投入し撹拌(20rpm)させながら、鉄触媒溶液をスプレーガンによりスプレー噴霧し(噴霧量2g/分間、噴霧時間480秒間、スプレー空気圧5MPa)しつつ、圧縮空気(300L/分)を回転ドラム内に供給しながら乾燥させ、鉄含有塗膜を一次触媒粒子上に形成した。次に、220℃で20分間焼成処理を行って、酸化鉄層がさらに形成された触媒担持体を作製した。
<<CNT合成工程>>
 このようにして作製した触媒担持体300gをCNT製造装置100の反応管102内に投入し、ガスを流通させることで触媒担持体107を流動化させながら、フォーメーション工程、成長工程、冷却工程の順に処理を行い、CNT集合体を製造した。なお、CNT合成工程に含まれる各工程の条件は以下のように設定した。
[フォーメーション工程]
 ・設定温度:800℃
 ・還元ガス:窒素3sLm、水素22sLm
 ・処理時間:25分
[成長工程]
 ・設定温度:800℃
 ・原料ガス:窒素15sLm、エチレン5sLm、二酸化炭素2sLm、水素3sLm
 ・処理時間:10分
 ・原料ガス熱分解時間:0.65秒
[冷却工程]
 ・冷却温度:室温
 ・パージガス:窒素25sLm
<Preparation of CNT aggregate>
The CNTs used in Examples 1 to 3 and Comparative Example 1 were synthesized as follows. FIG. 10 shows a schematic configuration of the CNT manufacturing apparatus used at the time of synthesis. The CNT manufacturing apparatus 100 shown in FIG. 10 is composed of a heater 101, a reaction tube 102, a dispersion plate 103, a reducing gas / raw material gas introduction port 104, an exhaust port 105, and a gas heating promotion unit 106. Synthetic quartz was used as the material of the reaction tube 102 and the dispersion plate 103.
<< Catalyst carrier forming step >>
The catalyst carrier forming step will be described below. Zirconia (zirconium dioxide) beads (ZrO 2 , volume average particle diameter D50: 350 μm) as a carrier are put into a rotary drum type coating device, and the aluminum-containing solution is sprayed with a spray gun while stirring the zirconia beads (20 rpm). While spray spraying (spray amount 3 g / min, spray time 940 seconds, spray air pressure 10 MPa), compressed air (300 L / min) was supplied into the rotating drum and dried to form an aluminum-containing coating film on the zirconia beads. .. Next, firing treatment was performed at 480 ° C. for 45 minutes to prepare primary catalyst particles on which an aluminum oxide layer was formed. Further, while the primary catalyst particles are put into another rotary drum type coating device and stirred (20 rpm), the iron catalyst solution is spray-sprayed with a spray gun (spray amount 2 g / min, spray time 480 seconds, spray air pressure 5 MPa). ), While supplying compressed air (300 L / min) into the rotating drum, the mixture was dried to form an iron-containing coating film on the primary catalyst particles. Next, a firing treatment was carried out at 220 ° C. for 20 minutes to prepare a catalyst carrier on which an iron oxide layer was further formed.
<< CNT synthesis process >>
300 g of the catalyst carrier thus produced is put into the reaction tube 102 of the CNT manufacturing apparatus 100, and the catalyst carrier 107 is fluidized by circulating gas, and the formation step, the growth step, and the cooling step are performed in this order. The treatment was performed to produce a CNT aggregate. The conditions of each step included in the CNT synthesis step were set as follows.
[Formation process]
・ Set temperature: 800 ℃
-Reducing gas: Nitrogen 3sLm, Hydrogen 22sLm
-Processing time: 25 minutes [Growth process]
・ Set temperature: 800 ℃
-Raw material gas: Nitrogen 15sLm, Ethylene 5sLm, Carbon dioxide 2sLm, Hydrogen 3sLm
・ Processing time: 10 minutes ・ Raw material gas pyrolysis time: 0.65 seconds [Cooling process]
・ Cooling temperature: Room temperature ・ Purge gas: Nitrogen 25sLm
 触媒担持体上に合成されたCNT集合体は強制渦式分級装置(回転数3500rpm、空気風量3.5Nm/分)を用いて分離回収を行った。CNT集合体の回収率は99%であった。
 本実施例によって製造される、CNT集合体の特性は、タップかさ密度:0.01g/cm、CNT平均高さ:200μm、BET比表面積:800m/g、平均外径:4.0nm、炭素純度99%であった。
The CNT aggregate synthesized on the catalyst carrier was separated and recovered using a forced vortex classification device (rotation speed 3500 rpm, air air volume 3.5 Nm 3 / min). The recovery rate of the CNT aggregate was 99%.
The characteristics of the CNT aggregate produced by this example are tap bulk density: 0.01 g / cm 3 , CNT average height: 200 μm, BET specific surface area: 800 m 2 / g, average outer diameter: 4.0 nm, The carbon purity was 99%.
(実施例1)
 上記のようにして得られたCNT集合体1gに水1000gを加え、超高速乳化分散装置(製品名「ラボ・リューション(登録商標)」、シンキー社製)で回転速度:3000rpmで10分間撹拌して、CNT分散液を得た。
 得られたCNT分散液を基材上に塗布した。基材上の塗膜を温度80℃で24時間にわたり真空乾燥し、基材上に炭素膜を形成した。その後、炭素膜を基材から剥離して、厚み100μmの炭素膜(自立膜)を得た。得られた炭素膜について、電磁波シールド性能を評価した。結果を表1に示す。
(Example 1)
Add 1000 g of water to 1 g of the CNT aggregate obtained as described above, and stir with an ultra-high-speed emulsification / dispersion device (product name "Lab Solution (registered trademark)", manufactured by Shinky Co., Ltd.) at a rotation speed of 3000 rpm for 10 minutes. Then, a CNT dispersion liquid was obtained.
The obtained CNT dispersion liquid was applied onto the substrate. The coating film on the substrate was vacuum dried at a temperature of 80 ° C. for 24 hours to form a carbon film on the substrate. Then, the carbon film was peeled off from the substrate to obtain a carbon film (self-supporting film) having a thickness of 100 μm. The electromagnetic wave shielding performance of the obtained carbon film was evaluated. The results are shown in Table 1.
(実施例2)
 CNT分散液の調製にあたり、超音波分散機(ブランソニック社製、卓上型超音波洗浄器)を用いて、10分間分散処理した。かかる点以外は実施例1と同様にして厚み100μmの炭素膜(自立膜)を得た。得られた炭素膜について、電磁波シールド性能を評価した。結果を表1に示す。
(Example 2)
In preparing the CNT dispersion liquid, a dispersion treatment was carried out for 10 minutes using an ultrasonic disperser (a desktop ultrasonic cleaner manufactured by Bransonic Co., Ltd.). A carbon film (self-supporting film) having a thickness of 100 μm was obtained in the same manner as in Example 1 except for these points. The electromagnetic wave shielding performance of the obtained carbon film was evaluated. The results are shown in Table 1.
(実施例3)
 CNT分散液の調製にあたり、ジェットミル(吉田機械興業社製、ナノヴェイタ)を用いて、条件100MPaで15分間分散処理した。かかる点以外は実施例1と同様にして厚み100μmの炭素膜(自立膜)を得た。得られた炭素膜について、電磁波シールド性能を評価した。結果を表1に示す。
(Example 3)
In preparing the CNT dispersion liquid, a jet mill (manufactured by Yoshida Kikai Kogyo Co., Ltd., NanoVeta) was used to carry out dispersion treatment under the condition of 100 MPa for 15 minutes. A carbon film (self-supporting film) having a thickness of 100 μm was obtained in the same manner as in Example 1 except for these points. The electromagnetic wave shielding performance of the obtained carbon film was evaluated. The results are shown in Table 1.
(実施例4)
<CNT集合体の準備>
 実施例4で使用したCNT集合体は、CNT合成工程において、粒子状の触媒担持体をスクリュー回転によって連続的に搬送しながら原料ガスを供給する方法にて作製したものである。
 用いたCNT集合体製造装置200の概略構成を図11に示す。図11に示すCNT集合体製造装置200は、フォーメーションユニット202、成長ユニット204、フォーメーションユニット202から成長ユニット204を通過するまでの間に基材を搬送する搬送ユニット207と、フォーメーションユニット202と成長ユニット204とを相互に空間的に接続する接続部208と、フォーメーションユニット202と成長ユニット204との間でガスが相互に混入することを防止するガス混入防止装置203とを備える。さらに、CNT集合体製造装置200は、フォーメーションユニット202の前段に配置された入口パージ装置201、成長ユニット204の後段に配置された出口パージ装置205、さらには、出口パージ装置205の後段に配置された冷却ユニット206等の構成部を備える。フォーメーションユニット202は、還元ガスを保持するためのフォーメーション炉202a、還元ガスを噴射するための還元ガス噴射装置202b、触媒と還元ガスの少なくとも一方を加熱するための加熱装置202c、炉内のガスを系外へと排出する排気装置202d等により構成されている。ガス混入防止装置203は、排気装置203a、パージガス(シールガス)を噴射するパージガス噴射装置203bを備える。成長ユニット204は、原料ガス環境を保持するための成長炉204a、原料ガスを噴射するための原料ガス噴射装置204b、触媒及び原料ガスのうち少なくとも一方を加熱するための加熱装置204c、炉内のガスを系外へと排出する排気装置204d等を備える。入口パージ装置201が、ホッパー212を介して系内に基材211を導入する構成部である前室213とフォーメーション炉202aとを接続する接続部209に対して取り付けられている。冷却ユニット206は、不活性ガスを保持するための冷却容器206a、及び冷却容器206a内空間を囲むように配置した水冷冷却装置206bを備える。搬送ユニット207は、基材211をスクリュー回転によって連続的に搬送するユニットである。スクリュー羽根207a、および、かかるスクリュー羽根を回転させて基材搬送能を発揮せしめる状態としうる駆動装置207bにより実装される。加熱装置214は、フォーメーションユニットにおける加温温度よりも低温で系内を加熱可能に構成され、駆動装置207b付近を加熱する。
(Example 4)
<Preparation of CNT aggregate>
The CNT aggregate used in Example 4 was produced by a method of supplying a raw material gas while continuously transporting a particulate catalyst carrier by screw rotation in the CNT synthesis step.
FIG. 11 shows a schematic configuration of the CNT aggregate manufacturing apparatus 200 used. The CNT aggregate manufacturing apparatus 200 shown in FIG. 11 includes a formation unit 202, a growth unit 204, a transfer unit 207 that conveys a base material between the formation unit 202 and the growth unit 204, and the formation unit 202 and the growth unit. A connection unit 208 for spatially connecting the 204 to each other and a gas mixing prevention device 203 for preventing gas from being mixed with each other between the formation unit 202 and the growth unit 204 are provided. Further, the CNT aggregate manufacturing apparatus 200 is arranged in the inlet purge device 201 arranged in the front stage of the formation unit 202, the outlet purge device 205 arranged in the rear stage of the growth unit 204, and further in the rear stage of the outlet purge device 205. It is provided with a component such as a cooling unit 206. The formation unit 202 includes a formation furnace 202a for holding the reducing gas, a reducing gas injection device 202b for injecting the reducing gas, a heating device 202c for heating at least one of the catalyst and the reducing gas, and a gas in the furnace. It is composed of an exhaust device 202d or the like that discharges to the outside of the system. The gas mixing prevention device 203 includes an exhaust device 203a and a purge gas injection device 203b for injecting a purge gas (seal gas). The growth unit 204 includes a growth furnace 204a for maintaining the raw material gas environment, a raw material gas injection device 204b for injecting the raw material gas, a heating device 204c for heating at least one of the catalyst and the raw material gas, and the inside of the furnace. It is equipped with an exhaust device 204d or the like that discharges gas to the outside of the system. The inlet purging device 201 is attached to a connecting portion 209 connecting the front chamber 213, which is a component for introducing the base material 211 into the system via the hopper 212, and the formation furnace 202a. The cooling unit 206 includes a cooling container 206a for holding the inert gas, and a water-cooled cooling device 206b arranged so as to surround the inner space of the cooling container 206a. The transport unit 207 is a unit that continuously transports the base material 211 by screw rotation. It is mounted by a screw blade 207a and a drive device 207b that can rotate the screw blade to exert a substrate transporting ability. The heating device 214 is configured to be able to heat the inside of the system at a temperature lower than the heating temperature in the formation unit, and heats the vicinity of the drive device 207b.
<触媒層形成工程>
 基材としてのジルコニア(二酸化ジルコニウム)ビーズ(ZrO、体積平均粒子径D50:650μm)を、回転ドラム式塗工装置に投入し、ジルコニアビーズを攪拌(20rpm)させながら、アルミニウム含有溶液をスプレーガンによりスプレー噴霧(噴霧量3g/分間、噴霧時間940秒間、スプレー空気圧10MPa)しつつ、圧縮空気(300L/分)を回転ドラム内に供給しながら乾燥させ、アルミニウム含有塗膜をジルコニアビーズ上に形成した。次に、480℃で45分間焼成処理を行い、酸化アルミニウム層が形成された一次触媒粒子を作製した。さらに、その一次触媒粒子を別の回転ドラム式塗工装置に投入し攪拌(20rpm)させながら、鉄触媒溶液をスプレーガンによりスプレー噴霧し(噴霧量2g/分間、噴霧時間480秒間、スプレー空気圧5MPa)しつつ、圧縮空気(300L/分)を回転ドラム内に供給しながら乾燥させ、鉄含有塗膜を一次触媒粒子上に形成した。次に、220℃で20分間焼成処理を行って、酸化鉄層がさらに形成された基材を作製した。
<<CNT合成工程>>
 このようにして作製した表面に触媒を有する基材を製造装置のフィーダーホッパーに投入し、スクリューコンベアで搬送しながら、フォーメーション工程、成長工程、冷却工程の順に処理を行い、CNT集合体を製造した。
<Catalyst layer formation process>
Zirconia (zirconium dioxide) beads (ZrO 2 , volume average particle diameter D50: 650 μm) as a base material are put into a rotary drum type coating device, and the aluminum-containing solution is sprayed while stirring the zirconia beads (20 rpm). While spraying (spray amount 3 g / min, spray time 940 seconds, spray air pressure 10 MPa) and drying while supplying compressed air (300 L / min) into the rotating drum, an aluminum-containing coating film is formed on the zirconia beads. did. Next, firing treatment was performed at 480 ° C. for 45 minutes to prepare primary catalyst particles on which an aluminum oxide layer was formed. Further, while the primary catalyst particles are put into another rotary drum type coating device and stirred (20 rpm), the iron catalyst solution is spray-sprayed with a spray gun (spray amount 2 g / min, spray time 480 seconds, spray air pressure 5 MPa). ), While supplying compressed air (300 L / min) into the rotating drum, the mixture was dried to form an iron-containing coating film on the primary catalyst particles. Next, a calcination treatment was carried out at 220 ° C. for 20 minutes to prepare a base material on which an iron oxide layer was further formed.
<< CNT synthesis process >>
The substrate having a catalyst on the surface thus produced was put into the feeder hopper of the manufacturing apparatus, and while being conveyed by a screw conveyor, the formation step, the growth step, and the cooling step were processed in this order to manufacture a CNT aggregate. ..
<フォーメーション工程~冷却工程>
 CNT集合体製造装置の入口パージ装置、フォーメーションユニット、ガス混入防止装置、成長ユニット、出口パージ装置、冷却ユニットの各条件は以下のように設定した。
<Formation process-cooling process>
The conditions for the inlet purging device, formation unit, gas mixing prevention device, growth unit, outlet purging device, and cooling unit of the CNT aggregate manufacturing device were set as follows.
フィーダーホッパー
 ・フィード速度:1.25kg/h
 ・排気量:10sLm(隙間から自然排気)
入口パージ装置
 ・パージガス: 窒素40sLm
フォーメーションユニット
 ・炉内温度:800℃
 ・還元ガス:窒素6sLm、水素54sLm
 ・排気量:60sLm
 ・処理時間:20分
ガス混入防止装置
 ・パージガス:20sLm
 ・排気装置の排気量:62sLm
成長ユニット
 ・炉内温度:830℃
 ・原料ガス:窒素15sLm、エチレン5sLm、二酸化炭素1sLm、水素3sLm
 ・排気量:47sLm
 ・処理時間:10分
出口パージ装置
 ・パージガス:窒素45sLm
冷却ユニット
 ・冷却温度:室温
 ・排気量:10sLm(隙間から自然排気)
以上の条件で連続製造を行った。
Feeder hopper ・ Feed speed: 1.25kg / h
・ Displacement: 10sLm (natural exhaust from the gap)
Inlet purge device ・ Purge gas: Nitrogen 40sLm
Formation unit ・ Temperature in the furnace: 800 ℃
-Reducing gas: nitrogen 6sLm, hydrogen 54sLm
・ Displacement: 60sLm
・ Processing time: 20 minutes Gas contamination prevention device ・ Purge gas: 20sLm
・ Displacement of the exhaust device: 62sLm
Growth unit ・ Temperature in the furnace: 830 ℃
-Raw material gas: Nitrogen 15sLm, Ethylene 5sLm, Carbon dioxide 1sLm, Hydrogen 3sLm
・ Displacement: 47sLm
・ Processing time: 10 minutes Outlet purge device ・ Purge gas: Nitrogen 45sLm
Cooling unit ・ Cooling temperature: Room temperature ・ Displacement: 10sLm (natural exhaust from gaps)
Continuous production was performed under the above conditions.
<分離回収工程>
 基材上に合成されたCNT集合体は強制渦式分級装置(回転数2300rpm、空気風量3.5Nm/分)を用いて分離回収を行った。CNT集合体の回収率は96%であった。
<Separation and recovery process>
The CNT aggregate synthesized on the substrate was separated and recovered using a forced vortex classifier (rotation speed 2300 rpm, air air volume 3.5 Nm 3 / min). The recovery rate of the CNT aggregate was 96%.
 本実施例によって製造されたCNT集合体の特性は、典型値として、タップかさ密度:0.02g/cm、CNT平均長さ:150μm、BET-比表面積:900m/g、平均外径:4.0nm、炭素純度99%であった。 The characteristics of the CNT aggregate produced by this example are typically tap bulk density: 0.02 g / cm 3 , CNT average length: 150 μm, BET-specific surface area: 900 m 2 / g, average outer diameter: It was 4.0 nm and had a carbon purity of 99%.
 上記のようにして得られたCNT集合体1gに水1000gを加え、超高速乳化分散装置(製品名「ラボ・リューション(登録商標)」、シンキー社製)で回転速度:3000rpmで10分間撹拌して、CNT分散液を得た。
 得られたCNT分散液を基材上に塗布した。基材上の塗膜を温度80℃で24時間にわたり真空乾燥し、基材上に炭素膜を形成した。その後、炭素膜を基材から剥離して、厚み100μmの炭素膜(自立膜)を得た。得られた炭素膜について、また電磁波シールド性能を評価した。結果を表1に示す。
Add 1000 g of water to 1 g of the CNT aggregate obtained as described above, and stir with an ultra-high-speed emulsification / dispersion device (product name "Lab Solution (registered trademark)", manufactured by Shinky Co., Ltd.) at a rotation speed of 3000 rpm for 10 minutes. Then, a CNT dispersion liquid was obtained.
The obtained CNT dispersion liquid was applied onto the substrate. The coating film on the substrate was vacuum dried at a temperature of 80 ° C. for 24 hours to form a carbon film on the substrate. Then, the carbon film was peeled off from the substrate to obtain a carbon film (self-supporting film) having a thickness of 100 μm. The obtained carbon film was evaluated and the electromagnetic wave shielding performance was evaluated. The results are shown in Table 1.
(比較例1)
 CNT分散液の調製にあたり、分散剤としてのドデシル硫酸ナトリウムを1g添加して、ジェットミル(吉田機械興業社製、ナノヴェイタ)を用いて、条件100MPaで15分間分散処理した。かかる点以外は実施例1と同様にして厚み100μmの炭素膜(自立膜)を得た。得られた炭素膜について、電磁波シールド性能を評価した。結果を表1に示す。
(Comparative Example 1)
In preparing the CNT dispersion liquid, 1 g of sodium dodecyl sulfate as a dispersant was added, and the dispersion treatment was carried out for 15 minutes under the condition of 100 MPa using a jet mill (NanoVeta manufactured by Yoshida Kikai Kogyo Co., Ltd.). A carbon film (self-supporting film) having a thickness of 100 μm was obtained in the same manner as in Example 1 except for these points. The electromagnetic wave shielding performance of the obtained carbon film was evaluated. The results are shown in Table 1.
Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001
 表1より、表面粗さの平均値が4.0μm以上である炭素膜は、広い周波数領域で優れた電磁波シールド性能を発揮し得ることが分かる。 From Table 1, it can be seen that a carbon film having an average surface roughness of 4.0 μm or more can exhibit excellent electromagnetic wave shielding performance in a wide frequency range.
 本発明によれば、電磁波シールド性能に優れる炭素膜を提供することができる。 According to the present invention, it is possible to provide a carbon film having excellent electromagnetic wave shielding performance.
100 CNT製造装置
101 ヒーター
102 反応管
103 分散板
104 還元ガス/原料ガス導入口
105 排気口
106 ガス加熱促進部
107 触媒担持体
200 CNT集合体製造装置
201 入口パージ装置
202 フォーメーションユニット
202a フォーメーション炉
202b 還元ガス噴射装置
202c 加熱装置
202d 排気装置
203 ガス混入防止装置
203a 排気装置
203b パージガス噴射装置
204 成長ユニット
204a 成長炉
204b 原料ガス噴射装置
204c 加熱装置
204d 排気装置
205 出口パージ装置
206 冷却ユニット
206a 冷却容器
206b 水冷冷却装置
207 搬送ユニット
207a スクリュー羽根
207b 駆動装置
208~210 接続部
211 基材
212 ホッパー
214 加熱装置
100 CNT manufacturing equipment 101 Heater 102 Reaction tube 103 Dispersion plate 104 Reducing gas / raw material gas inlet 105 Exhaust port 106 Gas heating promotion unit 107 Catalyst carrier 200 CNT aggregate manufacturing equipment 201 Inlet purge device 202 Formation unit 202a Formation furnace 202b Reduction Gas injection device 202c Heating device 202d Exhaust device 203 Gas mixing prevention device 203a Exhaust device 203b Purge gas injection device 204 Growth unit 204a Growth furnace 204b Raw material gas injection device 204c Heating device 204d Exhaust device 205 Outlet purge device 206 Cooling unit 206a Cooling container 206b Water cooling Cooling device 207 Conveying unit 207a Screw blade 207b Drive device 208-210 Connection part 211 Base material 212 Hopper 214 Heating device

Claims (4)

  1.  カーボンナノチューブ集合体よりなる、炭素膜であって、
     表面粗さの平均値が4.0μm以上である、
     炭素膜。
    A carbon film composed of carbon nanotube aggregates,
    The average value of the surface roughness is 4.0 μm or more.
    Carbon film.
  2.  前記表面粗さの平均値が、5.0μm以上である、請求項1に記載の炭素膜。 The carbon film according to claim 1, wherein the average value of the surface roughness is 5.0 μm or more.
  3.  自立膜である、請求項1又は2に記載の炭素膜。 The carbon film according to claim 1 or 2, which is a self-supporting film.
  4.  前記カーボンナノチューブ集合体が、下記(1)~(3)の条件のうち少なくとも1つを満たす、請求項1~3の何れかに記載の炭素膜。
     (1)前記カーボンナノチューブ集合体を、バンドル長が10μm以上になるように分散させて得たカーボンナノチューブ分散体について、フーリエ変換赤外分光分析して得たスペクトルにおいて、前記カーボンナノチューブ分散体のプラズモン共鳴に基づくピークが、波数300cm-1超2000cm-1以下の範囲に、少なくとも1つ存在する。
     (2)前記カーボンナノチューブ集合体について、液体窒素の77Kでの吸着等温線から、Barrett-Joyner-Halenda法に基づいて得られる、細孔径とLog微分細孔容積との関係を示す細孔分布曲線における最大のピークが、細孔径100nm超400nm未満の範囲にある。
     (3)前記カーボンナノチューブ集合体の電子顕微鏡画像の二次元空間周波数スペクトルのピークが、1μm-1以上100μm-1以下の範囲に少なくとも1つ存在する。
    The carbon film according to any one of claims 1 to 3, wherein the carbon nanotube aggregate satisfies at least one of the following conditions (1) to (3).
    (1) The plasmon of the carbon nanotube dispersion in the spectrum obtained by Fourier transform infrared spectroscopic analysis of the carbon nanotube dispersion obtained by dispersing the carbon nanotube aggregate so that the bundle length is 10 μm or more. There is at least one resonance-based peak in the range of wavenumbers above 300 cm -1 and above 2000 cm -1 .
    (2) For the carbon nanotube aggregate, a pore distribution curve showing the relationship between the pore diameter and the Log differential pore volume obtained from the adsorption isotherm of liquid nitrogen at 77K based on the Barrett-Joiner-Halenda method. The largest peak in is in the range of pore diameters greater than 100 nm and less than 400 nm.
    (3) At least one peak of the two-dimensional spatial frequency spectrum of the electron microscope image of the carbon nanotube aggregate exists in the range of 1 μm -1 or more and 100 μm -1 or less.
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Citations (7)

* Cited by examiner, † Cited by third party
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JP2002232185A (en) * 2001-02-07 2002-08-16 Nisshin Steel Co Ltd Electromagnetic wave shielding material
JP2002232184A (en) * 2001-02-07 2002-08-16 Nisshin Steel Co Ltd Electromagnetic wave shielding material
JP2016108175A (en) * 2014-12-04 2016-06-20 日立化成株式会社 Production method of carbon nanotube
WO2018066574A1 (en) * 2016-10-04 2018-04-12 日本ゼオン株式会社 Electromagnetic shielding structure and method for producing same
WO2018159638A1 (en) * 2017-02-28 2018-09-07 国立大学法人東京工業大学 Carbon film suitable for light receiving elements and power feed elements, which utilize terahertz waves, and terahertz wave detection device
JP2018145027A (en) * 2017-03-02 2018-09-20 国立研究開発法人産業技術総合研究所 Carbon nanotube aggregate and carbon nanotube film
WO2020067203A1 (en) * 2018-09-28 2020-04-02 日本ゼオン株式会社 Electromagnetic wave absorbing sheet and method for manufacturing same

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002232185A (en) * 2001-02-07 2002-08-16 Nisshin Steel Co Ltd Electromagnetic wave shielding material
JP2002232184A (en) * 2001-02-07 2002-08-16 Nisshin Steel Co Ltd Electromagnetic wave shielding material
JP2016108175A (en) * 2014-12-04 2016-06-20 日立化成株式会社 Production method of carbon nanotube
WO2018066574A1 (en) * 2016-10-04 2018-04-12 日本ゼオン株式会社 Electromagnetic shielding structure and method for producing same
WO2018159638A1 (en) * 2017-02-28 2018-09-07 国立大学法人東京工業大学 Carbon film suitable for light receiving elements and power feed elements, which utilize terahertz waves, and terahertz wave detection device
JP2018145027A (en) * 2017-03-02 2018-09-20 国立研究開発法人産業技術総合研究所 Carbon nanotube aggregate and carbon nanotube film
WO2020067203A1 (en) * 2018-09-28 2020-04-02 日本ゼオン株式会社 Electromagnetic wave absorbing sheet and method for manufacturing same

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