WO2022077694A1 - Differential probe and control method therefor - Google Patents

Abstract

A differential probe and a control method therefor. The differential probe comprises a probe body, a first contact element (200), a second contact element (300) and a driving mechanism (400). The probe body comprises a shell (100), and the shell (100) has a receiving cavity; the first contact element (200) comprises a first contact (221) and a first rotating shaft, the first contact element (200) is rotatably arranged on the probe body around the first rotating shaft, and the first contact (221) is eccentrically distributed with respect to the first rotating shaft and rotates around the first rotating shaft in a first direction; the second contact element (300) comprises a second contact (321) and a second rotating shaft, the second contact element (300) is rotatably arranged on the probe body around the second rotating shaft, and the second contact (321) is eccentrically distributed with respect to the second rotating shaft and rotates around the second rotating shaft in a second direction; and the first direction is opposite to the second direction, and a detection area is formed between the first contact (221) and the second contact (321). The problem that the existing differential probes cannot accurately adjust the probe spacing can be solved.

Description

Differential probe and its control method technical field

The invention relates to the technical field of testing and measuring instruments, in particular to a differential probe and a control method thereof.

Background technique

In the field of test and measurement technology, the circuit under test (such as a circuit board, an electronic device, etc.) is connected with a measuring instrument (such as an oscilloscope, etc.) through a probe, and the probe can collect the signal under test and transmit it to the measuring instrument. Differential probes have two probes, each of which can detect a local signal and send this local signal to the measurement instrument for further signal processing or on-screen display.

Due to different test points, the spacing on the circuit under test is also different. In order to make the two probes on the differential probe match the two test points on the circuit under test, it is necessary to adjust the spacing between the two probes adaptively; At present, the existing differential probes can only be manually adjusted by visual inspection. This adjustment method is difficult to precisely adjust the distance between the probes, so that the probes cannot be accurately matched with the test points; especially in small-sized circuits under test , the above problems will be more prominent.

SUMMARY OF THE INVENTION

The invention discloses a differential probe and a control method thereof, so as to solve the problem that the current differential probe cannot accurately adjust the distance between the probes.

In order to solve the above problems, the present invention adopts the following technical solutions:

In a first aspect, the present invention provides a differential probe comprising:

a probe main body, the probe main body includes a casing, and the casing has a accommodating cavity;

a first contact element, the first contact element includes a first contact and a first rotating shaft, the first contact element is rotatably arranged on the probe body around the first rotating shaft, the first contact element The contacts are eccentrically distributed with the first rotating shaft, and rotate around the first rotating shaft in a first direction;

a second contact element, the second contact element includes a second contact and a second rotation shaft, the second contact element is rotatably disposed on the probe body around the second rotation shaft, the second contact element The contacts are eccentrically distributed with the second rotating shaft, and rotate around the second rotating shaft in the second direction;

Wherein, the first direction is opposite to the second direction, and a detection area is formed between the first contact and the second contact.

In a second aspect, the present invention provides a differential probe control method, comprising:

receive a first input;

In response to the first input, the control driving mechanism drives the first contact element and the second contact element to rotate, so as to change the distance between the first contact and the second contact.

The technical scheme adopted in the present invention can achieve the following beneficial effects:

In the differential probe disclosed in the present invention, the first contacts are eccentrically distributed with the first rotating shaft and rotate around the first rotating shaft in the first direction, and the second contacts are eccentrically distributed with the second rotating shaft and rotate around the second rotating shaft in the second direction The second rotating shaft rotates, and because the first direction is opposite to the second direction, when the differential probe is working, the first contact and the second contact can be gradually approached to reduce the distance between them, or the first contact The point and the second contact can be gradually separated to increase the distance between them, so that the distance adjustment between the first contact element and the second contact element is realized; at the same time, since the first contact element and the second contact element are driven by the driving mechanism The two contact elements are rotated, and manual adjustment by visual inspection is avoided, thereby reducing the adjustment error and accurately adjusting the distance between the first contact element and the second contact element, so that the first contact and the second contact are consistent with the test. Click to fit.

Description of drawings

The accompanying drawings described herein are used to provide further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the attached image:

FIG. 1 is a schematic structural diagram of a differential probe disclosed in an embodiment of the present invention;

2 is a partial cross-sectional view of a differential probe disclosed in an embodiment of the present invention;

3 is an exploded schematic diagram of a differential probe disclosed in an embodiment of the present invention;

FIG. 4 is another exploded schematic diagram of the differential probe disclosed in the embodiment of the present invention;

Fig. 5 is a partial enlarged view with respect to Fig. 4;

6 is a schematic structural diagram of a first contact element and a second contact element disclosed in an embodiment of the present invention;

FIG. 7 is a partial structural schematic diagram of a differential probe disclosed in an embodiment of the present invention;

8 is a schematic structural diagram of a first contact element and a first transmission element disclosed in an embodiment of the present invention;

Description of reference numbers:

100-shell, 110-first sub-shell, 120-second sub-shell, 130-light guide hole,

200-first contact element, 210-first connecting segment, 220-first eccentric segment, 221-first contact,

300-second contact element, 310-second connecting segment, 320-second eccentric segment, 321-second contact,

400-drive mechanism, 500-control module,

600-transmission assembly, 610-first transmission element, 611-first gear, 612-first installation space, 613-first limiter, 620-second transmission element, 621-second gear, 622-second Installation space, 623-the third limiting part, 630-the first fixing part, 631-the second limiting part, 640-the second fixing part, 641-the fourth limiting part,

700-position detection component, 710-light-emitting element, 720-photosensitive element,

800-lighting components, 810-light source modules, 820-light guide elements,

910-adjustment switch, 920-circuit board.

Detailed ways

In order to make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the specific embodiments of the present invention and the corresponding drawings. Obviously, the described embodiments are only some, but not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

The technical solutions disclosed by the various embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

Referring to FIGS. 1 to 8 , an embodiment of the present invention discloses a differential probe. The differential probe includes a probe body, a first contact element 200 , a second contact element 300 and a driving mechanism 400 .

Wherein, the probe body generally includes a housing 100, and the housing 100 is the basic component of the differential probe, which can provide a mounting basis for other components of the differential probe. The housing 100 has a accommodating cavity, and some components of the differential probe can be arranged in the accommodating cavity, and the housing 100 can play a certain protective role for these components. In order to facilitate disassembly and assembly, the housing 100 generally includes a first sub-housing 110 and a second sub-housing 120, and the first sub-housing 110 and the second sub-housing 120 are combined to form a receiving cavity inward.

The first contact element 200 and the second contact element 300 are functional components of the differential probe. During the working process of the differential probe, the differential probe passes through the first contact element 200 and the second contact element 300 and the circuit under test. contact, and the measured signal is collected to transmit to the measuring instrument.

For a common differential probe, it also has two contact elements, usually two probes. In specific use, the operator adjusts the distance between the probes by holding the probes and visually inspects them, and changes the two contacts. The distance between the points is often difficult to match with the two test points of the circuit under test; especially when testing tiny devices, the manual adjustment method usually has too much error and cannot achieve accurate measurement results.

In this embodiment, in order to reduce the error of manual adjustment, a driving mechanism 400 is provided in the differential probe, and the first contact element 200 and the second contact element 300 are driven by the driving mechanism 400 to realize controllable and precise rotation, To precisely adjust the distance between the first contact element 200 and the second contact element 300 .

The first contact element 200 usually has a first contact 221, and the first contact element 200 contacts the circuit under test through the first contact 221; similarly, the second contact element 300 usually has a second contact 321, and the first contact element 200 is in contact with the circuit under test through the first contact 221; The two-contact element 300 is in contact with the circuit under test through the second contact 321 .

In order to realize the adjustment of the distance between the first contact element 200 and the second contact element 300, in this embodiment, the first contact element 200 has a first rotation axis, and the first contact element 200 can rotate around the first rotation axis. The first contact 221 is eccentrically distributed with the first rotating shaft, and rotates around the first rotating shaft in the first direction; the second contact element 300 has a second rotating shaft, and the second contact element 300 surrounds the first rotating shaft. The two rotating shafts are rotatably disposed on the probe body, and the second contact 321 is eccentrically distributed with the second rotating shaft, and rotates around the second rotating shaft in the second direction.

In this way, when the first contact element 200 rotates relative to the probe body, the first contact 221 outside the probe body will be driven by the first contact element 200 to make a circular motion of a preset track; when the second contact When the element 300 rotates relative to the probe body, the second contact 321 located outside the probe body will be driven by the second contact element 300 to perform a circular motion of a preset track. Generally, the circumferential track surfaces of the first contact 221 and the second contact 321 are parallel to the end surfaces of the probe body, so that the first contact element 200 and the second contact element 300 can be prevented from being caused by the probe body during rotation. put one's oar in. Of course, this embodiment does not limit the specific shapes of the first contact element 200 and the second contact element 300 , that is, does not limit the specific movement trajectories of the first contact element 221 and the second contact element 321 .

In this embodiment, the first direction is opposite to the second direction, that is to say, the moving directions of the first contact 221 and the second contact 321 are opposite, for example, the first contact 221 rotates clockwise, while the first contact 221 rotates clockwise. The two contacts 321 rotate counterclockwise.

Usually, the first contact 221 and the second contact 321 are both located outside the probe body, so that the first contact element 200 and the second contact element 300 can be conveniently arranged, which can avoid the interference between the two and the housing 100, and It is beneficial to the structural layout of the differential probe; of course, the first contact 221 and the second contact 321 can also be disposed in the probe body, for example, in the receiving cavity.

In order to make the distance between the first contact 221 and the second contact 321 controllable and facilitate accurate adjustment, the rotation trajectories of the first contact 221 and the second contact 321 in this embodiment can be relatively symmetrical, so that in the first When the contact element 200 and the second contact element 300 rotate, the transmission ratio of the two is 1:1. Since the first contact 221 and the second contact 321 both make circular motions and move in opposite directions, the first contact Both the point 221 and the second contact 321 have a semicircular trajectory that moves toward each other and approach each other, and the other semicircular trajectory that moves away from each other. It should be understood that, when the rotation trajectories of the first contact 221 and the second contact 321 are set symmetrically, the movement trajectories of the two will undoubtedly be more regular when rotating, and the visual experience will be more comfortable, and they can also be used in the differential probe. The front part, ie the area of the first contact element 200 and the second contact element 300, makes the structure thinner and lighter.

Of course, this embodiment does not specifically limit whether the rotational trajectories of the first contact 221 and the second contact 321 are symmetrical, and the two may also be arranged asymmetrically. In this way, one of the contacts may be inclined, but the overall The detection effect has little effect.

When detecting the circuit under test, the circuit under test is located between the first contact 221 and the second contact 321 , that is, a detection area is formed between the first contact 221 and the second contact 321 .

When moving toward each other, the distance between the first contact element 200 and the second contact element 300 is reduced, and the detection area between the first contact 221 and the second contact 321 is reduced; when moving away from each other, the first contact The distance between the contact element 200 and the second contact element 300 increases, and the detection area between the first contact 221 and the second contact 321 increases. As described above, the differential probe of this embodiment can be adaptively adjusted to fit test points with different spacings; as shown in FIG. 1 , FIG. 1 shows the first contact element 200 and the second contact element in two positional relationships. In the point element 300, the distances between the first contact 221 and the second contact 321 are different under different positional relationships.

In order to protect the driving mechanism 400, the driving mechanism 400 is usually disposed in the receiving cavity. In this embodiment, the driving mechanism 400 is drivingly connected to the first contact element 200 and/or the second contact element 300 , and the driving mechanism 400 drives the first contact element 200 and the second contact element 300 to rotate. There are various driving relationships between the driving mechanism 400 and the first contact element 200 and the second contact element 300, and it can drive only one of the first contact element 200 and the second contact element 300, or it can drive simultaneously The first contact element 200 and the second contact element 300 . When the driving mechanism 400 drives one of the first contact element 200 and the second contact element 300 , the first contact element 200 and the second contact element 300 may be linked by a transmission structure.

It can be seen from the above description that in the differential probe disclosed in the embodiment of the present invention, the first contact 221 is eccentrically distributed with the first rotating shaft, and rotates around the first rotating shaft in the first direction, and the second contact 321 is eccentric with the second rotating shaft distribution, and rotates around the second axis of rotation in the second direction, and because the first direction is opposite to the second direction, therefore, when the differential probe works, the first contact 221 and the second contact 321 can be gradually approached to reduce The distance between the two is reduced, or the first contact 221 and the second contact 321 can be gradually separated to increase the distance between the two, thus realizing the adjustment of the distance between the first contact element 200 and the second contact element 300 At the same time, since the first contact element 200 and the second contact element 300 are driven to rotate by the driving mechanism 400, manual adjustment by visual inspection is avoided, thereby reducing the adjustment error and accurately adjusting the first contact element 200 and the second contact element 200. The spacing of the contact elements 300 is such that the first contact 221 and the second contact 321 fit exactly with the test points.

In order to facilitate the operation and improve the convenience of operation, the differential probe of this embodiment may further include a control module 500 . The control module 500 is electrically connected to the driving mechanism 400 and is used to control the driving mechanism 400 to drive the first contact element 200 and the second contact element 300 rotates. When in use, the control module 500 can directly issue on and off commands to the drive mechanism 400, so that the first contact element 200 and the second contact element 300 can be easily controlled to rotate or stop. The control module 500 can be directly disposed on the circuit board 920 to be powered.

Specifically, the probe body may include a first input module, the first input module is electrically connected to the control module 500, and a control command for the driving mechanism 400 can be generated through the first input module. The first input module usually includes an adjustment switch 910 button disposed on the probe body, and the driving mechanism 400 can be turned on and off by pressing the adjustment switch 910 button. The differential probe of this embodiment may also have a reset function, for example, a long press of the adjustment switch 910 button can be set to achieve, in the case of reset, the differential probe can restore the first contact element 200 and the second contact element 300 to the initial state , the initial state can be set to various situations in which the distance between the first contact 221 and the second contact 321 is the smallest, the largest, or the center value. Specifically, the button of the adjustment switch 910 may be directly disposed on the circuit board 920 in the receiving cavity.

Usually, the differential probe needs to perform batch testing on the circuit under test of the same specification. In order to avoid repeatedly adjusting the distance between the first contact 221 and the second contact 321, the differential probe of this embodiment may further include a storage module for storing First position parameters of the first contact element 200 and the second contact element 300 . It should be understood that, the first position parameter stored by the storage module may be a position parameter that is frequently used during operation, that is, the commonly used spacing data between the first contact 221 and the second contact 321 .

At the same time, the control module 500 is also used to call the first position parameter, and control the driving mechanism 400 to drive the first contact element 200 and the second contact element 300 to rotate to a position matching the first position parameter. Specifically, when the differential probe is in the initial state, the control module 500 can control the driving mechanism 400 to drive the first contact element 200 and the second contact element 300 to realize the calling of the first position parameter, so that the The commonly used spacing data of the first contact 221 and the second contact 321 can be called up conveniently and quickly.

In order to facilitate the first contact element 200 and the second contact element 300 to be in contact with the circuit under test and obtain the measured information, the first contact element 200 in this embodiment may be a first probe, and the second contact element 300 Can be the second probe. Specifically, one end of the first probe is connected to the probe body, the other end of the first probe is a free end, and is provided with a first contact 221; the second contact element 300 is a second probe, the second probe One end of the probe is connected to the main body of the probe, and the other end of the second probe is a free end and is provided with a second contact 321 . Since the structure of the probe is relatively slender, and it is convenient to form a contact at the free end of the probe, the first probe and the second probe can be more accurately probed to the test point area of the circuit under test.

The first probe and the second probe may have various structural shapes, for example, both the first probe and the second probe may be configured as linear probe structures.

As shown in FIG. 6 , in order to facilitate the installation of the first probe and the second probe on the probe body, the first probe in this embodiment may include a first connecting section 210 and a first eccentric section 220. The first connecting section 210 is rotatably arranged on the probe body around its axial direction, and the end of the first connecting segment 210 away from the probe body is bent to form a first eccentric segment 220, and the end of the first eccentric segment 220 away from the first connecting segment 210 is provided with a first eccentric segment 220. The first contact 221 . In this way, the first probe can be mounted on the probe body through the first connecting section 210. Since the first eccentric section 220 is bent and formed on the first connecting section 210, the first contact 221 is disposed on the first eccentric section 220 away from the first contact section 220. One end of a connecting section 210, when the first probe rotates, the first connecting section 210 is the first rotating shaft, thereby ensuring the eccentric distribution of the first contacts 221 and the first rotating shaft.

Similarly, the second probe of this embodiment may include a second connecting segment 310 and a second eccentric segment 320, the second connecting segment 310 is rotatably disposed on the probe body around its axial direction, and the second connecting segment 310 is away from Two ends of the probe body are bent to form a second eccentric section 320 , and two ends of the second eccentric section 320 away from the second connecting section 310 are provided with second contacts 321 . In this way, the second probe can be mounted on the probe body through the second connecting section 310. Since the second eccentric section 320 is bent and formed on the second connecting section 310, and the second contact 321 is disposed on the second eccentric section 320 away from the first At one end of the two connecting sections 310, when the second probe rotates, the second connecting section 310 is the second rotating shaft, thereby ensuring the eccentric distribution of the second contacts 321 and the second rotating shaft.

Normally, the driving mechanism 400 is drivingly connected with the first contact element 200 and/or the second contact element 300 through a transmission mechanism. The probe body of this embodiment may further include a transmission assembly 600, the driving mechanism 400 is connected with the transmission assembly 600, and the transmission assembly 600 is further connected with the first contact element 200 and/or the second contact element 300, and the driving mechanism 400 is driven by The transmission assembly 600 drives the first contact element 200 and the second contact element 300 to rotate. In general, by providing the transmission assembly 600, the structural layout of the internal components of the differential probe can be facilitated, for example, the drive mechanism 400 can be easily arranged in the receiving cavity, and the first contact element 200 and the second contact element 300 can be easily arranged on the working side.

In combination with the foregoing, there are various driving relationships between the driving mechanism 400 and the first contact element 200 and the second contact element 300, so there are also various specific types of the transmission assembly 600. For example, the transmission assembly 600 includes two transmission elements, two The transmission elements are respectively connected with the first contact element 200 and the second contact element 300, and the driving mechanism 400 drives the two transmission elements respectively.

As shown in FIG. 7 , in order to simplify the driving mechanism 400, the transmission assembly 600 of this embodiment may include a first transmission element 610 and a second transmission element 620, the first contact element 200 is fixedly connected with the first transmission element 610, and the second transmission element 610 The contact element 300 is fixedly connected with the second transmission element 620; the outer periphery of the first transmission element 610 is provided with a first gear 611, the outer periphery of the second transmission element 620 is provided with a second gear 621, the first gear 611 and the second gear 621 In engagement, the drive mechanism 400 is drivingly connected to one of the first transmission element 610 and the second transmission element 620 .

In this way, the driving mechanism 400 may be connected with either the first transmission element 610 and the second transmission element 620 , as shown in FIGS. 4 and 5 , taking the driving mechanism 400 driving the second transmission element 620 as an example. When the driving mechanism 400 drives the second transmission element 620 to rotate, the second gear 621 rotates accordingly, the second gear 621 can drive the first gear 611 meshed with it to rotate, and the first gear 611 can drive the first transmission element 610 to rotate, Then, the first transmission element 610 and the second transmission element 620 are rotated at the same time, and the first contact element 200 and the second contact element 300 are driven to rotate at the same time; Therefore, it is necessary to set the tooth profiles of the first gear 611 and the second gear 621 to be the same, so that the rotational efficiencies of the first transmission element 610 and the second transmission element 620 are the same.

In order to facilitate the installation and fixing of the first contact element 200 and the second contact element 300, the transmission assembly 600 of this embodiment may further include a first fixing element 630 and a second fixing element 640, and the first contact element 200 is partially embedded in the The first fixing element 630 is fixedly matched with the first transmission element 610 through the first fixing element 630 ; the second contact element 300 is partially embedded in the second fixing element 640 and is connected with the second fixing element 640 The second transmission element 620 is fixedly fitted.

The first contact element 200 and the first fixing element 630 can be used as an integral module structure, and the second contact element 300 and the second fixing element 640 can also be used as an integral module structure. The contact element 200 and the second contact element 300 are realized by disassembling and assembling the first fixing element 630 and the second fixing element 640, so as to avoid damage to the first contact element 200 and the second contact element. Of course, the differential probe of this embodiment may also include a protective member for protecting the first contact element 200 and the second contact element 300; for example, the protective member may be a protective casing detachably connected to the probe body, When the protective casing is connected to the probe body, the protective casing covers the first contact element 200 and the second contact element 300 inside, so as to protect the first contact element 200 and the second contact element 300, and The purpose of preventing the first contact element 200 and the second contact element 300 from stabbing the operator; alternatively, the guard can also be a rubber cover that can be sheathed on the first contact element 200 and the second contact element 300 .

In the above-mentioned embodiment in which the first contact element 200 includes the first connecting segment 210 and the second contact element 300 includes the second connecting segment 310, the first connecting segment 210 can be embedded in the first fixing element 630, and the second The connecting segment 310 can be embedded in the second fixing element 640 .

Further, the first transmission element 610 may be provided with a first installation space 612 , and the first fixing element 630 may be at least partially inserted into the first installation space 612 ; the first transmission element 610 is provided with a first installation space 612 A limiting portion 613, the first fixing element 630 is provided with a second limiting portion 631 on its outer periphery, the first limiting portion 613 can be engaged with the second limiting portion 631; the second transmission element 620 can be provided with a second limiting portion 631 The installation space 622, the second fixing element 640 can be at least partially plug-fitted in the second installation space 622; the second transmission element 620 is provided with a third limiting portion 623 in the second installation space 622, and the second fixing element 640 is located in the second installation space 622. The outer periphery is provided with a fourth limiting portion 641 , and the third limiting portion 623 can be engaged with the fourth limiting portion 641 .

It should be understood that, in the case where the first fixing element 630 and the second fixing element 640 are provided, it is more convenient to provide a position-limiting fixing structure on the two to realize the first contact element 200 and the second contact element 300 Therefore, it is possible to avoid directly constructing a limiting and fixing structure on the first contact element 200 and the second contact element 300, thereby reducing the cost.

Of course, the first transmission element 610 and the first fixing element 630 and the second transmission element 620 and the second fixing element 640 may have various matching relationships. For example, the first fixing element 630 and the second fixing element 640 are provided with The installation space, the first transmission element 610 is inserted into the first fixed element 630 , and the second transmission element 620 is inserted into the second fixed element 640 .

The structures of the first limiting portion 613 , the second limiting portion 631 , the third limiting portion 623 and the fourth limiting portion 641 may have various structures, for example, they may be a concave structure or a convex structure, as long as the The first limiting portion 613 and the second limiting portion 631 can be engaged with each other, and the third limiting portion 623 and the fourth limiting portion 641 can be engaged with each other. Specifically, in this embodiment, the first limiting portion 613 and the third limiting portion 623 may both be limiting grooves, and the second limiting portion 631 and the fourth limiting portion 641 may both be limiting protrusions. In addition, the above-mentioned limit groove can be engaged with the limit protrusion correspondingly to realize the limit.

In order to obtain the rotation angle of the first contact element 200 and the second contact element 300 in real time and realize closed-loop control, the differential probe of this embodiment may further include a position detection component 700, which is used to detect the first transmission The angle of rotation of the element 610 and/or the second transmission element 620 . Since the first transmission element 610 is connected with the first contact element 200, and the second transmission element 620 is connected with the second contact element 300, when the rotation angles of the first transmission element 610 and the second transmission element 620 are obtained, That is, it is equivalent to acquiring the rotation angle information of the first contact element 200 and the second contact element 300 . Meanwhile, in the aforementioned embodiment in which the rotational trajectories of the first contact 221 and the second contact 321 are relatively symmetrical, if the rotational trajectory information of one of the first contact 221 and the second contact 321 is acquired, it is equivalent to The rotation trajectory information of the other is also obtained, so the position detection assembly 700 can be only configured to detect the first transmission element 610 or the second transmission element 620, of course, the position detection assembly 700 can also be configured to detect the first transmission element at the same time. 610 and the second transmission element 620 .

There are various types of position detection components 700 , such as displacement sensors, matching modules of magnets and Hall components, and the like. The position detection assembly 700 of this embodiment may be a photoelectric assembly, which includes a photoelectric switch 710 and a light blocking element 720. Among the photoelectric switch 710 and the light blocking element 720, one of the photoelectric switch 710 and the light blocking element 720 is disposed on the first transmission element 610 or the second transmission element On the element 620 , the other is disposed in the receiving cavity; when the light blocking element 720 blocks the light in the photoelectric switch 710 , the photoelectric switch 710 detects the position information of the first transmission element 610 or the second transmission element 620 .

Specifically, the photoelectric position detection assembly 700 can be arranged in various ways. In this embodiment, the light blocking element 720 is arranged on the first transmission element 610, and the photoelectric switch 710 is arranged in the receiving cavity (usually arranged on the circuit board). 920) as an example. The photoelectric switch 710 usually includes a light-emitting element and a photosensitive element. The light-emitting element can emit light, and the photosensitive element can receive the light emitted by the light-emitting element. When the light-blocking element 720 is close to the photoelectric switch 710, it will affect the transmission of light, which is partially blocked by Until it is completely blocked, based on the strength of the light received by the photosensitive element, the position of the light blocking element 720 can be realized, and then the position information and rotation angle of the first transmission element 610 can be obtained; The rotational frequency of the first transmission element 610 is acquired. In this case, based on the above content and combined with the aforementioned embodiment in which the rotational trajectories of the first contact 221 and the second contact 321 are relatively symmetrical, it is undoubtedly possible to obtain the first contact element 200 through the first transmission element 610 . and the rotation information of the second contact element 300 .

In this embodiment, the light blocking element 720 can also be arranged on the second transmission element 620 , and the rotation information of the first contact element 200 and the second contact element 300 can be acquired through the second transmission element 620 .

Of course, the photoelectric switch 710 can be arranged on the first transmission element 610 or the second transmission element 620, and the light blocking element 720 is arranged in the receiving cavity. When the first transmission element 610 or the second transmission element 620 rotates, it drives the The photoelectric switch 710 is rotated, so that the light blocking element 720 can also block the light in the photoelectric switch 710 , thereby achieving the purpose of obtaining the rotation information of the first contact element 200 and the second contact element 300 .

In combination with the foregoing, since the position change of the first contact 221 is associated with the rotation of the first contact element 200, and the position change of the second contact 321 is associated with the rotation of the second contact element 300, the position-based detection assembly 700 After obtaining the rotational angle information of the first contact element 200 and the second contact element 300, it can be converted by the principle of trigonometric function through the structural relationship between the transmission assembly 600 and the first contact element 200 and the second contact element 300 The exact distance between the first contact point 221 and the second contact point 321 can be determined, which is more favorable for the differential probe of this embodiment to realize closed-loop control.

In order to provide a bright test environment for the detection area, the differential probe of this embodiment may further include an illumination assembly 800 for illuminating the detection area. When the test point is in low light, due to the inconvenience of observation, there will be a problem that the first contact and the second contact cannot be accurately matched with the test point; however, the differential probe of this embodiment can be paired with the lighting assembly 800 The detection area is illuminated to provide operators with a bright test environment.

In this embodiment, there are various types of lighting components 800 , such as LED light sources arranged on the outer surface of the housing 100 . In another specific embodiment, the lighting assembly 800 may include a light source module 810 and a light guide element 820. Both the light source module 810 and the light guide element 820 are disposed in the receiving cavity, and the light emitted by the light source module 810 can be projected to The light guide element 820; the housing 100 is provided with a light guide hole 130, the light guide hole 130 communicates with the receiving cavity and is arranged opposite to the detection area, the light guide element 820 is partially embedded in the light guide hole 130, and the light source module 810 The light is directed to the detection area.

Both the light source module 810 and the light guide element 820 can be protected within the housing 100, and the light guide element 820 can guide the light emitted by the light source module 810 in the receiving cavity out of the receiving cavity and lead to the detection area. When using the differential probe of this embodiment to test the circuit under test, the light source module 810 can be turned on through the lighting assembly 800 . Generally, the lighting assembly 800 further includes a lighting button disposed on the outer surface of the housing 100 , and the light source module 810 can be switched on and off by pressing the lighting button.

Based on the differential probe disclosed in the embodiment of the present invention, the embodiment of the present invention further discloses a differential probe control method, and the disclosed differential probe control method is applied to the above differential probe, which may include:

S100, receiving a first input;

The first input is usually a control command to the driving mechanism 400, which may specifically include an opening command, a closing command, and the like. The probe body may include a first input module, the first input module is electrically connected to the control module 500, and a control command to the driving mechanism 400 can be generated through the first input module. The first input module usually includes an adjustment switch 910 button disposed on the probe body, and the driving mechanism 400 can be turned on and off by pressing the adjustment switch 910 button.

S200. In response to the first input, the driving mechanism 400 is controlled to drive the first contact element 200 and the second contact element 300 to rotate, so as to change the distance between the first contact 221 and the second contact 321.

After the operator inputs the first input, the control module 500 can respond to the first input, and the first contact element 200 and the second contact element 300 can be controlled by the control module 500, and the first contact element 200 and the second contact element 300 can be controlled by the control module 500. When the second contact element 300 is rotated, the distance between the first contact 221 and the second contact 321 can be changed, so that the distance is adapted to the distance between the measured points.

In order to make the differential probe have a memory function, that is, when the differential probe tests the circuit under test of the same specification, the previous contact distance data can be directly recalled to match the distance between the measured points. The control method of this embodiment may further include:

S300, receiving a second input;

When the first contact element 200 and the second contact element 300 are rotated to the first position, the first position can be any rotational position of the first contact element 200 and the second contact element 300 (that is, the driving mechanism 400 . a rotational position), the operator can enter a second input to issue a recording command for the first position parameter.

The probe body may include a second input module, the second input module is electrically connected to the control module 500, and a recording instruction for the first position parameter can be generated through the second input module. The second input module usually includes a first position button disposed on the probe body, and a recording instruction can be issued by pressing the first position button, which is usually implemented by setting a long press.

S400, in response to the second input, record the first position parameters of the first contact element 200 and the second contact element 300;

After the operator inputs the second input, the control module 500 can also be used to respond to the second input, that is, the first position parameter record can be stored in the memory through the control module 500 .

S500, receiving a third input;

The second input module can also be used to receive a third input, and at this time, a call instruction for the first position parameter can be generated by the second input module, and the call instruction can usually be implemented by setting a light touch button on the first position.

S600, in response to the third input, call the first position parameter, and control the driving mechanism 400 to drive the first contact element 200 and the second contact element 300 to rotate to a position matching the first position parameter.

After the operator inputs the third input, the control module 500 can also be used to respond to the third input, that is, the control module 500 can call the first position parameter previously saved in the memory, and control the driving mechanism 400 to drive the first contact element 200 and the second contact element 300 rotate and stop at the first position.

In an optional solution, the probe body may further include a third input module and a fourth input module. As shown in FIG. 2 and FIG. 4 , the third input module may include a second position button, and the fourth input module may include a second position button. Three-position button, based on the aforementioned control scheme, by pressing the second-position button, the second-position parameter can be recorded and called, and by pressing the third-position button, the third-position parameter can be recorded and called. Of course, this embodiment does not limit the specific number of location recording functions.

The above embodiments of the present invention focus on describing the differences between the various embodiments. As long as the different optimization features of the various embodiments are not contradictory, they can be combined to form a better embodiment. No longer.

The above descriptions are merely embodiments of the present invention, and are not intended to limit the present invention. Various modifications and variations of the present invention are possible for those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included within the scope of the claims of the present invention.

Claims (17)

1. A differential probe, characterized by comprising:

   a probe main body, the probe main body includes a casing, and the casing has a accommodating cavity;

   a first contact element, the first contact element includes a first contact and a first rotating shaft, the first contact element is rotatably arranged on the probe body around the first rotating shaft, the first contact element The contacts are eccentrically distributed with the first rotating shaft, and rotate around the first rotating shaft in a first direction;

   a second contact element, the second contact element includes a second contact and a second rotation shaft, the second contact element is rotatably disposed on the probe body around the second rotation shaft, the second contact element The contacts are eccentrically distributed with the second rotating shaft, and rotate around the second rotating shaft in the second direction;

   a driving mechanism, the driving mechanism is arranged in the receiving cavity and is drivingly connected with the first contact element and/or the second contact element, and the driving mechanism drives the first contact element and/or the second contact element the second contact element rotates;

   Wherein, the first direction is opposite to the second direction, and a detection area is formed between the first contact and the second contact.
2. The differential probe according to claim 1, wherein the differential probe further comprises a control module, the control module is electrically connected to the driving mechanism, and is used for controlling the driving mechanism to drive the first A contact element and the second contact element rotate.
3. The differential probe according to claim 2, wherein the differential probe further comprises a storage module for storing the first position parameters of the first contact element and the second contact element; the The control module is further configured to call the first position parameter, and control the driving mechanism to drive the first contact element and the second contact element to rotate to a position matching the first position parameter.
4. The differential probe according to claim 1, wherein the first contact element is a first probe, one end of the first probe is connected to the probe body, and the other end of the first probe is connected to the probe body. One end is a free end and is provided with the first contact; the second contact element is a second probe, one end of the second probe is connected to the probe body, and the second probe is The other end is a free end and is provided with the second contact.
5. The differential probe according to claim 4, wherein the first probe comprises a first connecting section and a first eccentric section, and the first connecting section is rotatably disposed on the probe body around its axial direction , and the first eccentric segment is formed by bending the end of the first connection segment away from the probe body, and the first contact is provided at the end of the first eccentric segment away from the first connection segment ;

   The second probe includes a second connecting section and a second eccentric section, the second connecting section is rotatably arranged on the probe body around its axial direction, and the second connecting section is away from the probe body. The second eccentric segment is formed by bending two ends of the second eccentric segment, and the second contact is provided at the two ends of the second eccentric segment facing away from the second connecting segment.
6. The differential probe according to claim 1, wherein the probe body further comprises a transmission assembly, the drive mechanism is connected with the transmission assembly, and the transmission assembly is further connected with the first contact element and/or the transmission assembly. Or the second contact element is connected, and the driving mechanism drives the first contact element and the second contact element to rotate by driving the transmission assembly.
7. The differential probe according to claim 6, wherein the transmission assembly comprises a first transmission element and a second transmission element, the first contact element is fixedly connected with the first transmission element, and the second transmission element The contact element is fixedly connected with the second transmission element; the outer periphery of the first transmission element is provided with a first gear, the outer periphery of the second transmission element is provided with a second gear, and the first gear is connected with the first gear. Two gears are meshed, and the driving mechanism is drivingly connected with one of the first transmission element and the second transmission element.
8. The differential probe according to claim 7, wherein the transmission assembly further comprises a first fixing element and a second fixing element, the first contact element is partially embedded in the first fixing element, and The first transmission element is fixedly matched with the first transmission element through the first fixing element; the second contact element is partially embedded in the second fixing element, and is connected with the first transmission element through the second fixing element. The two transmission elements are fixedly matched.
9. The differential probe according to claim 8, wherein the first transmission element is provided with a first installation space, and the first fixing element can be inserted into the first installation space at least partially; A transmission element is provided with a first limiting portion in the first installation space, and a second limiting portion is provided on the outer periphery of the first fixing element, and the first limiting portion can be connected with the second limiting portion. Partial engagement;

   The second transmission element is provided with a second installation space, and the second fixing element can be at least partially fitted in the second installation space; the second transmission element is provided with a first installation space in the second installation space. Three limiting parts, the second fixing element is provided with a fourth limiting part on its outer periphery, and the third limiting part can be engaged with the fourth limiting part.
10. The differential probe according to claim 9, wherein the first limiting portion and the third limiting portion are both limiting grooves, and the second limiting portion and the fourth limiting portion are Both are limit protrusions.
11. The differential probe according to claim 7, characterized in that, the differential probe further comprises a position detection assembly for detecting the rotation angle of the first transmission element and/or the second transmission element .
12. The differential probe according to claim 11, wherein the position detection component is a photoelectric switch and a light blocking element, and one of the photoelectric switch and the light blocking element is disposed in the first transmission element or the second transmission element, and the other is arranged in the receiving cavity; when the light blocking element blocks the light in the photoelectric switch, the photoelectric switch detects the first transmission element or the photoelectric switch. position information of the second transmission element.
13. The differential probe of claim 1, wherein the differential probe further comprises an illumination assembly for illuminating the detection area.
14. The differential probe according to claim 13, wherein the lighting assembly comprises a light source module and a light guide element, the light source module and the light guide element are both arranged in the receiving cavity, and the light source module The light emitted by the group can be projected to the light guide element; the casing is provided with a light guide hole, the light guide hole communicates with the receiving cavity and is arranged opposite to the detection area, and the light guide element The part is embedded in the light guide hole, and guides the light of the light source module to the detection area.
15. The differential probe according to claim 1, wherein the differential probe further comprises a guard for protecting the first contact element and the second contact element.
16. A differential probe control method, applied to the differential probe according to any one of claims 1 to 15, wherein the control method comprises:

    receive a first input;

    In response to the first input, the control driving mechanism drives the first contact element and the second contact element to rotate, so as to change the distance between the first contact and the second contact.
17. The control method according to claim 16, wherein the control method further comprises:

    receive a second input;

    in response to the second input, recording a first position parameter of the first contact element and the second contact element;

    receive a third input;

    In response to the third input, the first position parameter is called, and the driving mechanism is controlled to drive the first contact element and the second contact element to rotate to a position matching the first position parameter .

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