WO2022056743A1 - Method for measuring distance using time-of-flight method and system for measuring distance - Google Patents

Method for measuring distance using time-of-flight method and system for measuring distance Download PDF

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Publication number
WO2022056743A1
WO2022056743A1 PCT/CN2020/115685 CN2020115685W WO2022056743A1 WO 2022056743 A1 WO2022056743 A1 WO 2022056743A1 CN 2020115685 W CN2020115685 W CN 2020115685W WO 2022056743 A1 WO2022056743 A1 WO 2022056743A1
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WIPO (PCT)
Prior art keywords
photodetector
taps
differential signal
light
shift time
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PCT/CN2020/115685
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French (fr)
Inventor
Kudoh YOSHIHARU
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Huawei Technologies Co., Ltd.
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Application filed by Huawei Technologies Co., Ltd. filed Critical Huawei Technologies Co., Ltd.
Priority to CN202080103819.4A priority Critical patent/CN116097127A/en
Priority to PCT/CN2020/115685 priority patent/WO2022056743A1/en
Publication of WO2022056743A1 publication Critical patent/WO2022056743A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G01S17/894—3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/4865—Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak

Definitions

  • the present invention relates to a method for measuring a distance using time-of-flight method and to a system for measuring distance.
  • a multi-camera parallax system is known as a method of implementing three-dimensional sensing and depth imaging.
  • a multi-camera parallax system is generally large and involves a complicated operation. The accuracy of depth measurement by such a system is not sufficient.
  • depth sensors using infrared light are recently being used.
  • a ToF (Time-of-Flight) system is known as a depth sensor which uses infrared light.
  • ToF systems are generally divided into two categories: a dToF (direct ToF) system and an iToF (indirect ToF) system. Both systems detect flight time between light emission and return of light reflected on an object.
  • a conventional dToF system directly detects flight time of light using a time counter 108 as shown in Figure 10.
  • a dToF system generally comprises at least one dToF sensor 102.
  • the dToF sensor 102 comprises a photodetector, an amplifier for amplifying signals output from the photodetector in response to light impingement, and a time counter 108.
  • the time counter 108 starts counting time simultaneously with emission of pulsed light 114 by a light source of the dToF system.
  • the light 114 is reflected on an object 112 to return to the photodetector as reflected light 116 and the photodetector outputs a signal.
  • the time counter 108 stops counting time in response to the signal from the photodetector.
  • the dToF system comprises a plurality of dToF sensors 102 arranged in an array
  • each dToF sensor 102 comprises the photodetector, the amplifier, and the time counter. Therefore, since each dToF sensor 102 can measure the flight time of light, i.e., distance to the object, a two-dimensional depth image can be obtained by mapping measured distances.
  • the reflected light has a longer flight path than the case of light directly returning to the dToF sensor, and therefore such light may return to the photodetector later than light directly returning to the photodetector. Therefore, a multi-path reflection problem may occur where reflected light impinges a plurality of times in one measurement.
  • the time counter of the dToF sensor stops counting time in response to the output and amplification of the first signal from the photodetector. Signals generated by light impinging the photodetector after stopping counting time may be ignored. Therefore, the dToF sensor can detect the shortest flight time of light.
  • signals output from the dToF sensor may include false detection caused by dark current and environmental light, and variations of detected time caused by jitter, etc.
  • the dToF system generally obtains data of a plurality of frames and statistically processes the data to derive a depth image.
  • a conventional iToF system comprises at least one iToF sensor 202.
  • the iToF sensor 22 comprises a photodetector having a plurality of taps 224, 226 as shown in Figure 11 and measures flight time of light based on a ratio between signals stored in and output from the taps 224, 226.
  • each iToF sensor can measure the flight time of light, i.e., distance to an object, and can obtain a two-dimensional depth image by mapping the measured distances.
  • the conventional iToF sensor 202 shown in Figure 11 comprises, for example, two taps 224, 226.
  • a tap may generally comprise: a storage capacitor for storing a signal charge output from the photodetector in response to light impingement; and at least one gate for controlling activation of the tap, storage of the signal light in the storage capacitor, and output of the stored signal charge.
  • the tap 224 is activated in synchronization with the light emission, and stores a signal charge due to light impinging the photodetector.
  • the tap 226 is activated after finishing the activation of the tap 224, and stores a signal charge due to light impinging the photodetector.
  • the signal charges stored in the taps 224, 226 are output.
  • the reflected light impinges the photodetector during both of the period of activating the tap 224 and the period of activating the tap 226.
  • Figure 11 shows that 80%of the reflected light 216 impinges the photodetector during the period of activating the tap 224, and 20%of the reflected light 216 impinges the photodetector during the period of activating the tap 226.
  • the flight time of light i.e., the distance to the object can be measured based on the ratio between the signal output from the tap 224 and the signal output from the tap 226.
  • the iToF system may not need a statistical process of a plurality of frames which is necessary for the dToF system. Furthermore, since the iToF system may not need a time counter for each iToF sensor, the iToF sensor may be miniaturized compared to the dToF sensor.
  • a conventional iToF system cannot avoid the influence of multi-path reflection discussed above. Since the light reflected on another object returns to the photodetector later than the reflected light directly returning from the object, the amount of the reflected light impinging the photodetector during the period of activating the tap 226 shown in Figure 11 may be increased. Therefore, the ratio between the outputs from the taps 224, 226 may deviate from the distance to the object, and the distance to the object may be determined as being further than the actual distance.
  • the time counter of the dToF system may prevent the miniaturization of the dToF sensor, the resolution of the depth image may be decreased. Furthermore, since there may be false detections caused by dark current and environmental light, and variations of detected time caused by jitter, the dToF system generally needs a statistical process using a lot of frames. In other words, since a huge amount of data is output and processed, the system may require a large memory and a high performance processing circuit.
  • the iToF system has the multi-path reflection problem.
  • the accuracy of distance measurement may be degraded.
  • a first aspect according to the present invention provides a method for measuring a distance from a photodetector to an object, the method carrying out a measurement cycle, the measurement cycle comprising:
  • a second sub-step for sequentially activating each tap of the photodetector comprising a plurality of taps during a predetermined period to store signals due to reception of light by the photodetector, wherein the plurality of taps are sequentially activated such that the completion of the activation of the last tap among the plurality of taps is shifted by a predetermined shift time longer than or equal to zero from the initiation of emission of the pulsed light, and
  • the pulsed light is reflected on the object and returns to the photodetector as reflected light
  • the measurement cycle is repeated with an increase of the shift time until the reflected light returns to the photodetector during the activation period of any one of the plurality of taps and the differential signal becomes a predetermine value larger than zero, and
  • the distance from the photodetector to the object is measured based on the shift time of the measurement cycle in which the reflected light returns to the photodetector during the activation period of any one of the plurality of taps.
  • the first step may be carried out a plurality of times.
  • the differential signal may be a digital signal represented as Hi/Low, and the differential signal may be Hi when the signal output from the last activated tap among the plurality of taps is larger than signals output from the other taps.
  • the distance from the photodetector to the object may be measured based on the shift time when the differential signal exceeds a predetermined threshold.
  • the differential signal may be stored in a resistor in each measurement cycle, and the signal may be output when the differential signal in one measurement cycle is larger than the differential signal stored in the resistor in a measurement cycle prior to the one measurement cycle by a predetermined threshold.
  • the method may further comprise, when the differential signal output from each photodetector included in a pixel array is Hi or exceeds a predetermined threshold, forming a two-dimensional depth image by writing the shift time in an address of the frame memory, the address of the frame memory corresponding to the photodetector and not comprising data regarding a shift time.
  • the method may further comprise forming a sub-frame of a two-dimensional depth image based on the differential signal output from each photodetector included in a pixel array, and only data of the address in the sub-frame corresponding to the photodetector outputting the signal may be updated.
  • a second aspect according to the present invention provides a Time-of-Flight (ToF) measurement system comprising:
  • At least one ToF sensor At least one ToF sensor
  • At least one light source for emitting pulsed light
  • ToF sensor comprises:
  • a photodetector comprising a plurality of taps, the photodetector for outputting signals due to reception of the light reflected on an object and returned as reflected light;
  • a comparator to which outputs from the plurality of taps are coupled, the comparator for outputting a differential signal of outputs from the plurality of taps,
  • the plurality of taps are sequentially activated to store signals due to reception of light by the photodetector
  • the plurality of taps are sequentially activated such that the completion of the activation of the last tap among the plurality of taps is shifted by a shift time longer than or equal to zero from the initiation of emitting the pulsed light
  • the plurality of taps may output signals of light received by the photodetector after the taps are activated a plurality of times and store the signals of light received by the photodetector.
  • the comparator outputs digital signals represented as Hi/Low.
  • the distance from the photodetector to the object may be measured based on the shift time when the differential signal exceeds a predetermined threshold.
  • the ToF sensor may further comprise:
  • a comparing circuit for comparing the differential signal in one measurement cycle with the differential signal stored in the resistor in a measurement cycle prior to the one measurement cycle, and for outputting a signal when the differential signal in the one measurement cycle is larger than the differential signal stored in the resistor at a predetermined threshold.
  • the photodetectors may be arranged in an array to form a pixel array, and the ToF measurement system may further comprise a logic circuit for forming a sub-frame of a two-dimensional depth image based on the differential signals output from the photodetectors.
  • the photodetectors may be arranged in an array to from a pixel array, and the ToF measurement system may further comprise a logic circuit for forming a two-dimensional depth image by writing the shift time in an address of the frame memory corresponding to the photodetector if data regarding the shift time is not written in the address, for when the differential signal output from each photodetector is Hi or exceeds a predetermined threshold.
  • a third aspect according to the present invention provides a stacked sensor chip comprising the system according to any one of the first and second aspects, the stacked sensor chip comprising:
  • a pixel array chip comprising at least the photodetectors
  • an electronic circuit chip comprising at least one of the comparator, the time counter, the logic circuit, the resistor, and the comparing circuit
  • the pixel array chip may further comprise an electronic circuit for implementing an indirect ToF measurement method.
  • a high resolution ToF sensor addressing the multi-path reflection problem is provided.
  • Figure 1a schematically shows a ToF system according to the first embodiment of the present invention.
  • Figure 1b shows a signal output by a comparator of the ToF system according to the first embodiment of the present invention.
  • Figure 2a shows a first measurement cycle of a method for measuring a distance to an object by the ToF system according to the first embodiment of the present invention.
  • Figure 2b shows a second measurement cycle of the method for measuring the distance to the object by the ToF system according to the first embodiment of the present invention.
  • Figure 2c shows a third measurement cycle of the method for measuring the distance to the object by the ToF system according to the first embodiment of the present invention.
  • Figure 2d shows a fourth measurement cycle of the method for measuring the distance to the object by the ToF system according to the first embodiment of the present invention.
  • Figure 3a shows a signal output from the ToF system according to the first embodiment of the present invention with respect to a shift time t.
  • Figure 3b shows a signal output from the ToF system according to the first embodiment of the present invention with respect to a shift time t.
  • Figure 4 schematically shows a method for generating a depth image by the ToF system according to the first embodiment of the present invention.
  • Figure 5 shows a flow chart showing a method for obtaining sub-frames by the ToF system shown in Figure 4.
  • Figure 6 shows a schematic circuit diagram of a ToF sensor according to the second embodiment of the present invention.
  • Figure 7 schematically shows a sub-frame in a pixel array comprising the ToF sensor according to the second embodiment of the present invention.
  • Figure 8 shows a cross-sectional view showing a stacked sensor chip according to the third embodiment of the present invention.
  • Figure 9 shows a perspective view showing a stacked sensor chip according to the fourth embodiment of the present invention.
  • Figure 10 shows a conventional dToF system.
  • Figure 11 shows a conventional iToF system.
  • FIG 1 (a) schematically shows a Time-of Flight measurement system (ToF system) 1 according to the first embodiment of the present invention.
  • the ToF system 1 shown in Figure 1 comprises one Time-of Flight measurement sensor (ToF sensor) 2.
  • the ToF system 1 may comprise a plurality of ToF sensors 2.
  • the ToF system 1 further comprises at least one light source 4, a comparator 6, a time counter 8, and a logic circuit 10.
  • the ToF sensor 2 may comprise a photodetector 22 and a plurality of taps. Although the ToF sensor 2 of the example shown in Figure 1 (a) comprises two taps 24, 26, it should be understood that the ToF sensor 2 may comprise three or more taps. Each tap may comprise: a storage capacitor for storing a signal charge generated by light impinging the photodetector 22; an output port for outputting the stored signal charge; and gates for controlling storing of the signal charge in the storage capacitor and outputting the signal charge from the output port.
  • the at least one light source 4 may comprise, for example, a single light source 4.
  • the light source 4 emits pulsed light at a predetermined interval.
  • the light source 4 may emit light having any wavelength, infrared light may be preferable because infrared light is invisible to humans.
  • Outputs from the plurality of taps of the ToF sensor 2 are input into the comparator 6.
  • the signals output from the two taps 24, 26 are input into the comparator 6 to generate a differential signal.
  • the differential signal may be an analog signal derived by substituting the signal output from the tap 24 from the signal output from the tap 26. Otherwise, the differential signal may be a one bit digital signal represented by Hi when the signal output from the tap 26 is larger than the signal output from the tap 26 by a predetermined threshold or larger, and otherwise Low, or represented by 1/0 as shown in Figure 1 (b) .
  • the time counter 8 starts counting time in response to an input of a starting signal, stops counting time after a predetermined period has elapsed, and outputs the elapsed time.
  • the operation of the time counter 8 in the ToF system 1 will be discussed below.
  • the logic circuit 10 controls the components of the ToF system 1 and measures a distance D to an object 12 based on the differential signal output from the comparator 6 and the elapsed time output from the time counter 8. If the comparator 6 outputs digital signals, the signal output from the tap 26 can be more clearly detected and the accuracy of measuring time ts can be improved. Furthermore, it is preferable if the digital signals output from the comparator 6 in order for the logic circuit 10 to process the differential signals. Hereinafter, embodiments may be explained based on examples in which the comparator 6 outputs digital signals. The method for measuring the distance D will be discussed below.
  • Figure 2 schematically shows a method for measuring a distance D to an object 12 by the ToF system 1 according to the first embodiment of the present invention.
  • Figure 2a shows that the ToF system 1 carries out a first sub-step of emitting pulsed light 14 by the light source 4.
  • the light 14 is reflected on the object 12 to return to the ToF sensor 2 as reflected light 16 and impinge the photodetector 22 after a time ts.
  • the ToF system 1 further carries out a second sub-step of sequentially activating the plurality of taps, or the taps 24, 26 in the example shown in Figure 2a such that the timing of completion of the activation of the last tap among the plurality of taps, the tap 26 in the example shown in Figure 2a, matches the initiation of the emission of the pulsed light 14 in the first sub-step.
  • a shift time t from the initiation of the emission of the pulsed light 14 by the light source 4 to the completion of activating the tap 26 is zero.
  • the activation of the taps 24, 26 is carried out prior to the emission of the light 14 at a time equal to the sum of the activation durations of the taps. Therefore, in Figure 2a, the second sub-step may be carried out before the first sub-step.
  • the tap 24 is activated for a predetermined period and stores a signal charge due to light received by the photodetector 22 during this period.
  • the tap 26 is subsequently activated and stores a signal charge due to light received by the photodetector 22 during this period.
  • the duration of the period of the activation of the tap 26 is preferably identical to the duration of the period of the activation of the tap 24.
  • the first step comprising the first and second sub-steps may be carried out one time or a plurality of times. Preferably, carrying out the first step a plurality of times may result in averaging noise such as a variation of dark current, jitter of the timing circuit, and a variation of the return time of the reflected light 16 and improving the measurement accuracy.
  • the first step completes before the reflected light 16 returns to the ToF sensor 2. Therefore, signal charges due to light impinging the photodetector 22 are not stored in the taps 24, 26, and only charges due to noise such as the dark current and the environmental light may be stored.
  • the ToF system 1 carries out a second step in which the stored signals are output from the taps 24, 26 and are input to the comparator 6 to output the differential signal. Since signal charges due to light impinging the photodetector 22 are not stored as described above, the differential signal is small, for example, represented as a value of Low. The noise such as dark current and environmental light may be removed by subtracting the signal output from the tap 24 from the signal output from the tap 26.
  • a measurement cycle of the ToF system 1 includes the first and second steps.
  • FIG. 2b shows that the activation of the taps 24, 26 is carried out such that the timing of completion of the activation of the tap 26 is shifted from the start of the emission of the light 14 by a shift time t. Therefore, Figure 2b shows that the second sub-step is carried out after the first sub-step. The shift time t is managed by the time counter 8. Figure 2b also shows that the first step is completed before the reflected light 16 returns to the ToF sensor 2. Therefore, signal charges due to the light impinging the photodetector 22 are not stored in the taps 24, 26, and therefore, the differential signal output from the comparator 6 in the second step is small, for example, represented as a value of Low.
  • Figures 3a and 3b show plots of the differential signal output from the comparator 6, i.e., values where the output of the tap 24 is subtracted from the output of the tap 26 with respect to the shift time t when the comparator 6 outputs analog signals.
  • Figure 3a shows a differential signal obtained by subtracting the signal output from the tap 24 from the signal output from the tap 26 as an analog signal.
  • Figure 3b shows a one bit digital signal represented as Hi when the signal output from the tap 26 is larger than the signal output from the tap 24 by a predetermined threshold or larger, and otherwise Low, or represented by 1/0.
  • the solid line shown in Figure 3 (a) indicates the differential signal when multi-path reflection is absent, and the dotted line indicates the differential signal when there is multi-path reflection in which the light reflected on the object 12 is further reflected on another object before impinging the photodetector 22.
  • the shape of the curve has a lower peak having a long tail toward the time elapsing direction.
  • the comparator 6 starts outputting a positive signal, and the signal grows with the increase of the shift time t.
  • the shift time t is further increased and the reflected light 16 starts impinging the photodetector during the activation of the tap 24, the differential signal output from the comparator 6 starts decreasing.
  • the differential signal becomes negative.
  • the multi-path problem in which light reflected on the object 12 is reflected on another object before impinging the photodetector 22, occurs, the multi-path reflected light 18 impinges the photodetector 22 later than the reflected light 16 directly returning from the object 12 to the photodetector 22. Therefore, the pulse of the reflected light becomes longer than the pulse of the emitted light 14. This results in lower peak and a longer tail of the differential signal from the comparator 6 as the shift time t is increased as shown in Figure 3.
  • the shift time ts which raises the differential signal indicates the shortest time of the reflected light 16 returning to the photodetector 22, i.e., the flight time of the reflected light 16 directly returning from the object regardless of the multi-path reflected light 18. Therefore, the distance D to the object 12 can be measured based on the shift time ts which raises the differential signal without being affected by multi-path reflection.
  • Figure 4 schematically shows a method for generating a depth image two-dimensionally mapping the distance D to the object 12 by the ToF system 1 according to the first embodiment.
  • the ToF system 1 may comprise a pixel array 30 having a plurality of ToF sensors 2 arranged in an array.
  • the ToF system 1 may comprise, for example, one comparator 6 and a latch circuit 32 for each column of the pixel array 30.
  • the outputs from the ToF sensors 2 may be, for example, gathered for each column to be input to the comparator 6.
  • Only the ToF sensor 2 in a specific row of the pixel array 30 outputs signals from the taps to the comparator 6 and the differential signal may be sequentially output to the logic circuit 10 by the latch circuit 32 of each column.
  • the time counter 8 manages the shift time t of the ToF sensors 2.
  • the signals output from the all the rows may be stored in the frame memory 34 as a sub-frame.
  • the distance D from each ToF sensor 2 to the object 12 is measured by obtaining the sub-frame while increasing the shift time t.
  • a final two-dimensional depth image may be generated by integrating the obtained sub-frames.
  • FIG. 5 shows a flow diagram indicating a method for obtaining the sub-frame by the ToF system 1 shown in Figure 4.
  • the logic circuit 10 carries out a measurement cycle for each ToF sensor 2 of the pixel array 30 in step 101.
  • step 102 the ToF sensor 2 in each column and in a certain row outputs a light-receiving signal.
  • step 103 each differential signal output from the comparator 6 in each column based on the light-receiving signal from the ToF sensor 2 in each row is determined. If the differential signal from the comparator 6 is Low, the cycle skips steps 104 to 106 and proceeds to step 107. If the differential signal is Hi, the cycle proceeds to step 104.
  • step 104 sub-frame data of an address corresponding to the ToF sensor 2 is loaded from the frame memory 34 to the logic circuit 10.
  • step 105 it is determined whether or not data regarding the shift time t is written in the sub-frame data of the loaded address. If data exists, the cycle skips the step 106 and proceeds to step 107. It the data is empty, data regarding the shift time t is written in that address in step 106.
  • step 107 if obtaining of the differential signals is not completed for all of the ToF sensors 2 in all rows and all columns in the sub-frame, the cycle returns to step 102 and a light receiving signal is output from the ToF sensor 2 in the next row or column.
  • step 101 If the differential signals of the ToF sensors 2 in all rows and all columns are completely obtained and the sub-frame is completed, the cycle returns to step 101 with an increase in the shift time t to carry out a measurement cycle of the next sub-frame.
  • the logic operations from steps 103 to 106 for each ToF sensor 2 in each column in a certain row may be performed in parallel by providing a plurality of circuit sets. These steps are repeated a predetermined number of times or until the shift time t reaches a predetermined time in order to generate a two-dimensional depth image in which the shift time t of the return of the reflected light 16 is written for each address of the ToF sensors 2, i.e., in which the distance to the object is mapped for each address of the ToF sensors 2.
  • Figure 6 shows a schematic circuit diagram of a ToF sensor 2 according to the second embodiment of the invention which implements the event-driven type system.
  • Figure 7 shows a schematic diagram of a sub-frame of a pixel array 30 comprising the ToF sensors 2 according to the second embodiment when one pixel is fired.
  • Figure 6 shows the ToF sensor 2 comprising a photodetector 22, and the photodetector 22 comprises a plurality of taps.
  • the photodetector 22 shown in Figure 6 comprises, for example, two taps 24, 26, the photodetector 22 may comprise three or more taps.
  • Outputs from the taps 24, 26 are coupled to, for example, a comparator 6.
  • the ToF sensor 2 repeatedly carries out the emission of light 14 and the activation of the first tap 24 and the second tap 26 with an increase in the shift time t from the start of the emission of light 14 from a light source not shown in Figure 6 to the completion of the activation of the second tap 26.
  • the signal output from the first tap 24 and the signal output from the second tap 26 are input to the comparator 6.
  • the shift time t is equal to a time ts from the emission of light 14 to the return of the reflected light 16 reflected on an object 12
  • the reflected light 16 impinges the photodetector 22 during the activation of the second tap 26 and the signal output from the comparator 6 becomes Hi. Therefore, the time ts from the emission of light 14 to the return of the reflected light 16 to the photodetector 22, i.e., the distance to the object 12 is measured.
  • the output from the comparator 6 shown in Figure 6 is coupled to a resistor 36 and a comparing circuit 38.
  • the resistor 36 stores output from the comparator 6 in the prior sub-frame as a data value of Hi or Low.
  • the comparing circuit 38 compares the output from the comparator 6 and the data stored in the resistor 36. If the output from the comparator 6 is Low, the comparing circuit 38 does not output Hi, and a data value of Low is stored in the resistor 36 before the next sub-frame. If the output from the comparator 6 is Hi when the resistor 36 is in the Low state, the comparing circuit 38 outputs Hi and the resistor 36 stores Hi.
  • the state in which the comparator circuit 38 outputs Hi is referred to as “astate in which a pixel comprising the ToF sensor 2 is fired” . If the pixel is fired and the resistor 36 stores Hi, the comparing circuit 38 no longer outputs Hi and the pixel is no longer fired until completing all of the sub-frames after the next sub-frame and resetting the entire pixel array.
  • Figure 7 shows a sub-frame in which only a pixel 22-1 in the pixel array 30 is fired.
  • a column corresponding to the fired pixel 22-1 is detected. Therefore, the data of the row and the column of the pixel 22-1 is output as an address.
  • the shift time t of this sub-frame i.e., the shift time t, when the pixel 22-1 is fired, is written in an address in the frame memory 34 corresponding to the address of the pixel 22-1. Therefore, the distance from the pixel 22-1 to the object 12 is written in the frame memory 34.
  • a two-dimensional depth image can be obtained by repeating this operation a predetermined number of times.
  • FIG. 8 shows a cross sectional view of a stacked sensor chip 40 according to the third embodiment of the present invention.
  • the stacked sensor chip 40 comprises a stacked structure comprising a pixel array chip 42 and an electronic circuit chip 44.
  • the pixel array chip 42 may include photodetectors 22 disposed in array, and a plurality of taps coupled to each photodetector 22, for example, taps 24, 26.
  • the electronic circuit chip 44 may comprise a control circuit for controlling the light source 4 and the taps 24, 26 included in the pixel array chip 42, comparators 6 to which outputs from the taps 24, 26 are coupled via coupling portions 46, a time counter 8, logic circuit 10, resistors 36, and comparing circuit 38, and may comprise other additional circuits.
  • the photodetector 22 and the taps 24, 26 included in the pixel array chip 42 and the comparator 6 included in the electronic circuit chip 44 may constitute the ToF sensor 2.
  • the ToF system 1 may comprise various periphery circuits such as the control circuit, compactors, time counter, logic circuit, resistors, and comparing circuits as discussed above. Therefore, if all of the components of the ToF system 1 are integrated in one chip, it may prevent the miniaturization of the each pixel. However, each pixel, and therefore, the whole ToF system 1 can be miniaturized by dividing the ToF system 1 into the pixel array chip 42 and the electronic circuit chip 44 and stacking them. The operation of the ToF system 1 may be also accelerated by parallelizing the circuits. The delay of the operation may be also suppressed by reducing the distance between the photodetector 22 and the electronic circuit.
  • various periphery circuits such as the control circuit, compactors, time counter, logic circuit, resistors, and comparing circuits as discussed above. Therefore, if all of the components of the ToF system 1 are integrated in one chip, it may prevent the miniaturization of the each pixel. However, each pixel, and therefore, the whole To
  • the fabrication process may be simplified. Since a wafer comprising a plurality of pixel array chips 42 and a wafer comprising a plurality of electronic circuit chips 44 are wafer-bonded and divided into the chips, the fabrication process can be further simplified.
  • FIG. 9 shows a perspective view of a stacked sensor chip 50 according to the fourth embodiment of the present invention.
  • the stacked sensor chip 50 according to the fourth embodiment comprises a stacked structure in which a pixel array chip 52 comprising a plurality of ToF sensors 2 arranged in an array and an electronic circuit chip 54 are stacked via coupling portions 56.
  • the electronic circuit chip 54 may comprise circuit blocks 58 and 59 as shown in Figure 9.
  • the circuit block 58 may include: a control circuit for controlling the light source 4 and the taps of the pixel array chip 52 for implementing the operation of the ToF sensor 2 described with reference to the first and second embodiments; comparators 6; resistors 36; and comparing circuit 38.
  • the circuit block 60 may include time counter 8; and logic circuit 10, and optionally other additional circuits.
  • the pixel array chip 52 may comprise an indirect TOF system logic circuit 62 for implementing a conventional indirect time-of-flight measurement method.
  • the ToF sensor 2 included in the stacked sensor chip 50 according to the present embodiment comprises a plurality of taps, the ToF sensor 2 may function as, for example, a conventional indirect ToF sensor as described with reference to Figure 11.
  • Such a stacked sensor chip 50 may select an appropriate operation mode among a conventional direct ToF sensor mode, a conventional indirect ToF sensor mode, and the ToF sensor mode according to the embodiments of the present invention if necessary.

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Abstract

Method for measuring distance using time-of-flight, carrying out a measurement cycle comprising: a first step carried out one or more times, the first step comprising: a first sub-step for emitting pulsed light from at least one light source; and a second sub-step for sequentially activating each tap of the photodetector comprising a plurality of taps a predetermined period to store signals due to light received by the photodetector, wherein the plurality of taps are sequentially activated such that the completion of the activation of the last tap is shifted by a predetermined shift time longer than or equal to zero from the initiation of emitting the pulsed light, and a second step for outputting the stored signals from the taps and outputting a differential signal of the output signals, wherein the measurement cycle is repeated with an increase in the shift time until the reflected light returns to the photodetector during the activation period of any one of the plurality of taps and the differential signal becomes a predetermined value larger than zero, and wherein the distance from the photodetector to the object is measured based on the shift time of the measurement cycle.

Description

Method for Measuring Distance Using Time-of-Flight Method and System for Measuring Distance Technical Field
The present invention relates to a method for measuring a distance using time-of-flight method and to a system for measuring distance.
Background
Recently, the demand for three-dimensional sensing has been increasing. Mobile devices comprising a depth imaging camera are also proposed. Conventionally a multi-camera parallax system is known as a method of implementing three-dimensional sensing and depth imaging. However, a multi-camera parallax system is generally large and involves a complicated operation. The accuracy of depth measurement by such a system is not sufficient. Thus, instead of the multi-camera parallax system, depth sensors using infrared light are recently being used.
A ToF (Time-of-Flight) system is known as a depth sensor which uses infrared light. ToF systems are generally divided into two categories: a dToF (direct ToF) system and an iToF (indirect ToF) system. Both systems detect flight time between light emission and return of light reflected on an object.
A conventional dToF system directly detects flight time of light using a time counter 108 as shown in Figure 10. A dToF system generally comprises at least one dToF sensor 102. The dToF sensor 102 comprises a photodetector, an amplifier for amplifying signals output from the photodetector in response to light impingement, and a time counter 108.
The time counter 108 starts counting time simultaneously with emission of pulsed light 114 by a light source of the dToF system. The light 114 is reflected on an object 112 to return to the photodetector as reflected light 116 and the photodetector outputs a signal. The time counter 108 stops counting time in response to the signal from the photodetector. When the dToF system comprises a plurality of dToF sensors 102 arranged in an array, each dToF sensor 102 comprises  the photodetector, the amplifier, and the time counter. Therefore, since each dToF sensor 102 can measure the flight time of light, i.e., distance to the object, a two-dimensional depth image can be obtained by mapping measured distances.
Incidentally, if a portion of the light reflected on the object to be measured is further reflected on another object, the reflected light has a longer flight path than the case of light directly returning to the dToF sensor, and therefore such light may return to the photodetector later than light directly returning to the photodetector. Therefore, a multi-path reflection problem may occur where reflected light impinges a plurality of times in one measurement. To address such a multi-path reflection problem, the time counter of the dToF sensor stops counting time in response to the output and amplification of the first signal from the photodetector. Signals generated by light impinging the photodetector after stopping counting time may be ignored. Therefore, the dToF sensor can detect the shortest flight time of light.
However, since signals output from the dToF sensor may include false detection caused by dark current and environmental light, and variations of detected time caused by jitter, etc., the dToF system generally obtains data of a plurality of frames and statistically processes the data to derive a depth image.
On the other hand, a conventional iToF system comprises at least one iToF sensor 202. The iToF sensor 22 comprises a photodetector having a plurality of  taps  224, 226 as shown in Figure 11 and measures flight time of light based on a ratio between signals stored in and output from the  taps  224, 226. When the iToF system comprises a plurality of iToF sensors, each iToF sensor can measure the flight time of light, i.e., distance to an object, and can obtain a two-dimensional depth image by mapping the measured distances.
The conventional iToF sensor 202 shown in Figure 11 comprises, for example, two  taps  224, 226. A tap may generally comprise: a storage capacitor for storing a signal charge output from the photodetector in response to light impingement; and at least one gate for controlling activation of the tap, storage of the signal light in the storage capacitor, and output of the stored signal charge. When the light source of the iToF sensor 202 emits pulsed light 214, the tap 224 is activated in synchronization with the light emission, and stores a signal charge due to light impinging the photodetector. The tap 226 is activated after finishing the activation  of the tap 224, and stores a signal charge due to light impinging the photodetector. After the measurement cycle is repeated at least one time, preferably a plurality of times, the signal charges stored in the  taps  224, 226 are output. In such an iToF sensor 202, when the light 214 reflected on the object 212 returns to the photodetector, the reflected light impinges the photodetector during both of the period of activating the tap 224 and the period of activating the tap 226. For example, Figure 11 shows that 80%of the reflected light 216 impinges the photodetector during the period of activating the tap 224, and 20%of the reflected light 216 impinges the photodetector during the period of activating the tap 226. If the object 212 is far from the iToF sensor 202 and the flight time of the light becomes longer, the amount of the reflected light 216 impinging the photodetector during the period of activating the tap 224 is reduced, and the amount of the reflected light 216 impinging the photodetector during the period of activating the tap 226 is increased. Therefore, the flight time of light, i.e., the distance to the object can be measured based on the ratio between the signal output from the tap 224 and the signal output from the tap 226.
By repeating the above measurement cycle a plurality of times and storing the charges in the taps, the results of the measurement cycles can be averaged. Therefore, the iToF system may not need a statistical process of a plurality of frames which is necessary for the dToF system. Furthermore, since the iToF system may not need a time counter for each iToF sensor, the iToF sensor may be miniaturized compared to the dToF sensor.
However, a conventional iToF system cannot avoid the influence of multi-path reflection discussed above. Since the light reflected on another object returns to the photodetector later than the reflected light directly returning from the object, the amount of the reflected light impinging the photodetector during the period of activating the tap 226 shown in Figure 11 may be increased. Therefore, the ratio between the outputs from the  taps  224, 226 may deviate from the distance to the object, and the distance to the object may be determined as being further than the actual distance.
As discussed above, since the time counter of the dToF system may prevent the miniaturization of the dToF sensor, the resolution of the depth image may be decreased. Furthermore, since there may be false detections caused by dark current and environmental light, and variations of detected time caused by jitter, the  dToF system generally needs a statistical process using a lot of frames. In other words, since a huge amount of data is output and processed, the system may require a large memory and a high performance processing circuit.
On the other hand, the iToF system has the multi-path reflection problem. When multi-path reflection occurs, the accuracy of distance measurement may be degraded.
Summary of the Invention
Therefore, a high resolution ToF sensor addressing the multi-path reflection problem is required. The concept of the dToF system detection is necessary for addressing the multi-path reflection problem, while the pixels have to be miniaturized for the high resolution and the amount of output data has to be reduced.
A first aspect according to the present invention provides a method for measuring a distance from a photodetector to an object, the method carrying out a measurement cycle, the measurement cycle comprising:
a first step carried out one or more times, the first step comprising:
a first sub-step for emitting pulsed light from at least one light source;
and
a second sub-step for sequentially activating each tap of the photodetector comprising a plurality of taps during a predetermined period to store signals due to reception of light by the photodetector, wherein the plurality of taps are sequentially activated such that the completion of the activation of the last tap among the plurality of taps is shifted by a predetermined shift time longer than or equal to zero from the initiation of emission of the pulsed light, and
a second step for outputting the stored signals from the taps and outputting a differential signal of the output signals,
wherein the pulsed light is reflected on the object and returns to the photodetector as reflected light,
wherein the measurement cycle is repeated with an increase of the shift time until the reflected light returns to the photodetector during the activation period of any one of the plurality of taps and the differential signal becomes a predetermine value larger than zero, and
wherein the distance from the photodetector to the object is measured based on the shift time of the measurement cycle in which the reflected light returns to the photodetector during the activation period of any one of the plurality of taps.
In the first aspect according to the present invention, the first step may be carried out a plurality of times.
In the first aspect according to the present invention, the differential signal may be a digital signal represented as Hi/Low, and the differential signal may be Hi when the signal output from the last activated tap among the plurality of taps is larger than signals output from the other taps.
In the first aspect according to the present invention, the distance from the photodetector to the object may be measured based on the shift time when the differential signal exceeds a predetermined threshold.
In the first aspect according to the present invention, the differential signal may be stored in a resistor in each measurement cycle, and the signal may be output when the differential signal in one measurement cycle is larger than the differential signal stored in the resistor in a measurement cycle prior to the one measurement cycle by a predetermined threshold.
In the first aspect according to the present invention, the method may further comprise, when the differential signal output from each photodetector included in a pixel array is Hi or exceeds a predetermined threshold, forming a two-dimensional depth image by writing the shift time in an address of the frame memory, the address of the frame memory corresponding to the photodetector and not comprising data regarding a shift time.
In the first aspect according to the present invention, the method may further comprise forming a sub-frame of a two-dimensional depth image based on the differential signal output from each photodetector included in a pixel array, and only data of the address in the sub-frame corresponding to the photodetector outputting the signal may be updated.
A second aspect according to the present invention provides a Time-of-Flight (ToF) measurement system comprising:
at least one ToF sensor;
a time counter; and
at least one light source for emitting pulsed light,
wherein the ToF sensor comprises:
a photodetector comprising a plurality of taps, the photodetector for outputting signals due to reception of the light reflected on an object and returned as reflected light; and
a comparator to which outputs from the plurality of taps are coupled, the comparator for outputting a differential signal of outputs from the plurality of taps,
wherein the plurality of taps are sequentially activated to store signals due to reception of light by the photodetector,
wherein the plurality of taps are sequentially activated such that the completion of the activation of the last tap among the plurality of taps is shifted by a shift time longer than or equal to zero from the initiation of emitting the pulsed light,
wherein the emission of light and the activation of the plurality of taps are carried out with an increase of the shift time until the differential signal exceeds a predetermined value larger than zero,
wherein the shift time is managed by the time counter, and
wherein the distance from the photodetector to the object is measured based on the shift time.
In the second aspect according to the present invention, the plurality of taps may output signals of light received by the photodetector after the taps are activated a plurality of times and store the signals of light received by the photodetector.
In the second aspect according to the present invention, the comparator outputs digital signals represented as Hi/Low.
In the second aspect according to the present invention, the distance from the photodetector to the object may be measured based on the shift time when the differential signal exceeds a predetermined threshold.
In the second aspect according to the present invention, the ToF sensor may further comprise:
a resistor for storing the differential signal of each measurement cycle; and
a comparing circuit for comparing the differential signal in one measurement cycle with the differential signal stored in the resistor in a measurement cycle prior to the one measurement cycle, and for outputting a signal when the differential signal in the one measurement cycle is larger than the differential signal stored in the resistor  at a predetermined threshold.
In the second aspect according to the present invention, the photodetectors may be arranged in an array to form a pixel array, and the ToF measurement system may further comprise a logic circuit for forming a sub-frame of a two-dimensional depth image based on the differential signals output from the photodetectors.
In the second aspect according to the present invention, the photodetectors may be arranged in an array to from a pixel array, and the ToF measurement system may further comprise a logic circuit for forming a two-dimensional depth image by writing the shift time in an address of the frame memory corresponding to the photodetector if data regarding the shift time is not written in the address, for when the differential signal output from each photodetector is Hi or exceeds a predetermined threshold.
A third aspect according to the present invention provides a stacked sensor chip comprising the system according to any one of the first and second aspects, the stacked sensor chip comprising:
a pixel array chip comprising at least the photodetectors; and
an electronic circuit chip comprising at least one of the comparator, the time counter, the logic circuit, the resistor, and the comparing circuit,
wherein the pixel array chip and the electronic circuit chip are stacked and electrically coupled to each other.
In the third aspect according to the present invention, the pixel array chip may further comprise an electronic circuit for implementing an indirect ToF measurement method.
Effect of the Invention
According to the aspects of the present invention, a high resolution ToF sensor addressing the multi-path reflection problem is provided.
Brief Explanation of the Figures
Figure 1a schematically shows a ToF system according to the first embodiment of the present invention.
Figure 1b shows a signal output by a comparator of the ToF system  according to the first embodiment of the present invention.
Figure 2a shows a first measurement cycle of a method for measuring a distance to an object by the ToF system according to the first embodiment of the present invention.
Figure 2b shows a second measurement cycle of the method for measuring the distance to the object by the ToF system according to the first embodiment of the present invention.
Figure 2c shows a third measurement cycle of the method for measuring the distance to the object by the ToF system according to the first embodiment of the present invention.
Figure 2d shows a fourth measurement cycle of the method for measuring the distance to the object by the ToF system according to the first embodiment of the present invention.
Figure 3a shows a signal output from the ToF system according to the first embodiment of the present invention with respect to a shift time t.
Figure 3b shows a signal output from the ToF system according to the first embodiment of the present invention with respect to a shift time t.
Figure 4 schematically shows a method for generating a depth image by the ToF system according to the first embodiment of the present invention.
Figure 5 shows a flow chart showing a method for obtaining sub-frames by the ToF system shown in Figure 4.
Figure 6 shows a schematic circuit diagram of a ToF sensor according to the second embodiment of the present invention.
Figure 7 schematically shows a sub-frame in a pixel array comprising the ToF sensor according to the second embodiment of the present invention.
Figure 8 shows a cross-sectional view showing a stacked sensor chip according to the third embodiment of the present invention.
Figure 9 shows a perspective view showing a stacked sensor chip according to the fourth embodiment of the present invention.
Figure 10 shows a conventional dToF system.
Figure 11 shows a conventional iToF system.
Embodiments
Figure 1 (a) schematically shows a Time-of Flight measurement system (ToF system) 1 according to the first embodiment of the present invention. For the sake of simplification, the ToF system 1 shown in Figure 1 comprises one Time-of Flight measurement sensor (ToF sensor) 2. However, it should be noted that the ToF system 1 may comprise a plurality of ToF sensors 2. The ToF system 1 further comprises at least one light source 4, a comparator 6, a time counter 8, and a logic circuit 10.
The ToF sensor 2 may comprise a photodetector 22 and a plurality of taps. Although the ToF sensor 2 of the example shown in Figure 1 (a) comprises two  taps  24, 26, it should be understood that the ToF sensor 2 may comprise three or more taps. Each tap may comprise: a storage capacitor for storing a signal charge generated by light impinging the photodetector 22; an output port for outputting the stored signal charge; and gates for controlling storing of the signal charge in the storage capacitor and outputting the signal charge from the output port.
In the example shown in Figure 1 (a) , the at least one light source 4 may comprise, for example, a single light source 4. The light source 4 emits pulsed light at a predetermined interval. Although the light source 4 may emit light having any wavelength, infrared light may be preferable because infrared light is invisible to humans.
Outputs from the plurality of taps of the ToF sensor 2 are input into the comparator 6. In the example shown in Figure 1 (a) , the signals output from the two taps 24, 26 are input into the comparator 6 to generate a differential signal. The differential signal may be an analog signal derived by substituting the signal output from the tap 24 from the signal output from the tap 26. Otherwise, the differential signal may be a one bit digital signal represented by Hi when the signal output from the tap 26 is larger than the signal output from the tap 26 by a predetermined threshold or larger, and otherwise Low, or represented by 1/0 as shown in Figure 1 (b) .
The time counter 8 starts counting time in response to an input of a starting signal, stops counting time after a predetermined period has elapsed, and outputs the elapsed time. The operation of the time counter 8 in the ToF system 1 will be discussed below.
The logic circuit 10 controls the components of the ToF system 1 and measures a distance D to an object 12 based on the differential signal output from the  comparator 6 and the elapsed time output from the time counter 8. If the comparator 6 outputs digital signals, the signal output from the tap 26 can be more clearly detected and the accuracy of measuring time ts can be improved. Furthermore, it is preferable if the digital signals output from the comparator 6 in order for the logic circuit 10 to process the differential signals. Hereinafter, embodiments may be explained based on examples in which the comparator 6 outputs digital signals. The method for measuring the distance D will be discussed below.
Figure 2 schematically shows a method for measuring a distance D to an object 12 by the ToF system 1 according to the first embodiment of the present invention.
Figure 2a shows that the ToF system 1 carries out a first sub-step of emitting pulsed light 14 by the light source 4. The light 14 is reflected on the object 12 to return to the ToF sensor 2 as reflected light 16 and impinge the photodetector 22 after a time ts.
The ToF system 1 further carries out a second sub-step of sequentially activating the plurality of taps, or the  taps  24, 26 in the example shown in Figure 2a such that the timing of completion of the activation of the last tap among the plurality of taps, the tap 26 in the example shown in Figure 2a, matches the initiation of the emission of the pulsed light 14 in the first sub-step. In other words, a shift time t from the initiation of the emission of the pulsed light 14 by the light source 4 to the completion of activating the tap 26 is zero. In Figure 2a, the activation of the  taps  24, 26 is carried out prior to the emission of the light 14 at a time equal to the sum of the activation durations of the taps. Therefore, in Figure 2a, the second sub-step may be carried out before the first sub-step.
In the second sub-step, the tap 24 is activated for a predetermined period and stores a signal charge due to light received by the photodetector 22 during this period. After the activation of the tap 24, the tap 26 is subsequently activated and stores a signal charge due to light received by the photodetector 22 during this period. The duration of the period of the activation of the tap 26 is preferably identical to the duration of the period of the activation of the tap 24. The first step comprising the first and second sub-steps may be carried out one time or a plurality of times. Preferably, carrying out the first step a plurality of times may result in averaging noise such as a variation of dark current, jitter of the timing circuit, and a  variation of the return time of the reflected light 16 and improving the measurement accuracy.
In the example shown in Figure 2a, the first step completes before the reflected light 16 returns to the ToF sensor 2. Therefore, signal charges due to light impinging the photodetector 22 are not stored in the  taps  24, 26, and only charges due to noise such as the dark current and the environmental light may be stored.
Thereafter, the ToF system 1 carries out a second step in which the stored signals are output from the  taps  24, 26 and are input to the comparator 6 to output the differential signal. Since signal charges due to light impinging the photodetector 22 are not stored as described above, the differential signal is small, for example, represented as a value of Low. The noise such as dark current and environmental light may be removed by subtracting the signal output from the tap 24 from the signal output from the tap 26.
A measurement cycle of the ToF system 1 includes the first and second steps.
After the measurement cycle is completed , another measurement cycle is carried out again as shown in Figure 2b. Different from the case shown in Figure 2a, the activation of the  taps  24, 26 is carried out such that the timing of completion of the activation of the tap 26 is shifted from the start of the emission of the light 14 by a shift time t. Therefore, Figure 2b shows that the second sub-step is carried out after the first sub-step. The shift time t is managed by the time counter 8. Figure 2b also shows that the first step is completed before the reflected light 16 returns to the ToF sensor 2. Therefore, signal charges due to the light impinging the photodetector 22 are not stored in the  taps  24, 26, and therefore, the differential signal output from the comparator 6 in the second step is small, for example, represented as a value of Low.
After the measurement cycle is completed, another measurement cycle is carried out again as shown in Figure 2c. Since the shift time t from the start of the emission of the light 14 to the completion of the activation of the tap 26 is increased compared to the case of Figure 2b, the reflected light 16 returns to the ToF sensor 2 during the activation of the tap 26. Therefore, a signal charge due to the light impinging the photodetector 22 is stored in the tap 26. The differential signal output from the comparator 6 is, for example, represented as a value of Hi.
After the measurement cycle shown in Figure 2c is completed, another measurement cycle is carried out again as shown in Figure 2d. Since the shift time t is further increased, the reflected light 16 returns to the ToF sensor 2 during the activation of the tap 24. Therefore, a signal charge due to the light impinging the photodetector 22 is stored in the tap 24. The differential signal output from the comparator 6 is, for example, represented as a value of Low.
Figures 3a and 3b show plots of the differential signal output from the comparator 6, i.e., values where the output of the tap 24 is subtracted from the output of the tap 26 with respect to the shift time t when the comparator 6 outputs analog signals. Figure 3a shows a differential signal obtained by subtracting the signal output from the tap 24 from the signal output from the tap 26 as an analog signal. Figure 3b shows a one bit digital signal represented as Hi when the signal output from the tap 26 is larger than the signal output from the tap 24 by a predetermined threshold or larger, and otherwise Low, or represented by 1/0. The solid line shown in Figure 3 (a) indicates the differential signal when multi-path reflection is absent, and the dotted line indicates the differential signal when there is multi-path reflection in which the light reflected on the object 12 is further reflected on another object before impinging the photodetector 22. When multi-path reflection occurs, a part of the reflected light returns to the photodetector later than the reflected light directly returning to the photodetector. Therefore, the shape of the curve has a lower peak having a long tail toward the time elapsing direction. When the shift time t is identical to the time ts of the return of the reflected light 16, in other words, when the completion of the activation of the tap 26 is identical to the time of the return of the reflected light 16, the comparator 6 starts outputting a positive signal, and the signal grows with the increase of the shift time t. When the shift time t is further increased and the reflected light 16 starts impinging the photodetector during the activation of the tap 24, the differential signal output from the comparator 6 starts decreasing. When the amount of the reflected light 16 impinging the photodetector during the activation of the tap 24 is larger than the amount of the reflected light 16 impinging the photodetector during the activation of the tap 26, the differential signal becomes negative. When the shift time t is further increased, the differential signal goes back to zero. In the case of Figure 3b, even if the intensity of the reflected light 16 impinging the photodetector 22 during the activation of the tap 26 is reduced and the  duration of the reflected light 16 becomes longer due to multi-path reflection, the intensity of the reflected light 16 impinging during the activation of the tap 26 is still larger than the intensity of the reflected light 16 impinging during the activation of the tap 24, and therefore the comparator 6 continues outputting the value of Low. Therefore, even if multi-path reflection occurs, the output signal with respect to the shift time t does not change.
If the multi-path problem, in which light reflected on the object 12 is reflected on another object before impinging the photodetector 22, occurs, the multi-path reflected light 18 impinges the photodetector 22 later than the reflected light 16 directly returning from the object 12 to the photodetector 22. Therefore, the pulse of the reflected light becomes longer than the pulse of the emitted light 14. This results in lower peak and a longer tail of the differential signal from the comparator 6 as the shift time t is increased as shown in Figure 3. However, the shift time ts which raises the differential signal indicates the shortest time of the reflected light 16 returning to the photodetector 22, i.e., the flight time of the reflected light 16 directly returning from the object regardless of the multi-path reflected light 18. Therefore, the distance D to the object 12 can be measured based on the shift time ts which raises the differential signal without being affected by multi-path reflection.
Since the distance D to the object 12 can be measured by measuring the time ts, it is not necessary to carry out the measurement cycles after the shift time t exceeds the time ts as shown in Figures 2c and 2d.
Figure 4 schematically shows a method for generating a depth image two-dimensionally mapping the distance D to the object 12 by the ToF system 1 according to the first embodiment.
Figure 4 shows that the ToF system 1 may comprise a pixel array 30 having a plurality of ToF sensors 2 arranged in an array. The ToF system 1 may comprise, for example, one comparator 6 and a latch circuit 32 for each column of the pixel array 30. The outputs from the ToF sensors 2 may be, for example, gathered for each column to be input to the comparator 6. Only the ToF sensor 2 in a specific row of the pixel array 30 outputs signals from the taps to the comparator 6 and the differential signal may be sequentially output to the logic circuit 10 by the latch circuit 32 of each column. The time counter 8 manages the shift time t of the ToF sensors 2. The signals output from the all the rows may be stored in the frame  memory 34 as a sub-frame. The distance D from each ToF sensor 2 to the object 12 is measured by obtaining the sub-frame while increasing the shift time t. A final two-dimensional depth image may be generated by integrating the obtained sub-frames.
Figure 5 shows a flow diagram indicating a method for obtaining the sub-frame by the ToF system 1 shown in Figure 4. The logic circuit 10 carries out a measurement cycle for each ToF sensor 2 of the pixel array 30 in step 101. In step 102, the ToF sensor 2 in each column and in a certain row outputs a light-receiving signal. In step 103, each differential signal output from the comparator 6 in each column based on the light-receiving signal from the ToF sensor 2 in each row is determined. If the differential signal from the comparator 6 is Low, the cycle skips steps 104 to 106 and proceeds to step 107. If the differential signal is Hi, the cycle proceeds to step 104. In step 104, sub-frame data of an address corresponding to the ToF sensor 2 is loaded from the frame memory 34 to the logic circuit 10. In step 105, it is determined whether or not data regarding the shift time t is written in the sub-frame data of the loaded address. If data exists, the cycle skips the step 106 and proceeds to step 107. It the data is empty, data regarding the shift time t is written in that address in step 106. In step 107, if obtaining of the differential signals is not completed for all of the ToF sensors 2 in all rows and all columns in the sub-frame, the cycle returns to step 102 and a light receiving signal is output from the ToF sensor 2 in the next row or column. If the differential signals of the ToF sensors 2 in all rows and all columns are completely obtained and the sub-frame is completed, the cycle returns to step 101 with an increase in the shift time t to carry out a measurement cycle of the next sub-frame. The logic operations from steps 103 to 106 for each ToF sensor 2 in each column in a certain row may be performed in parallel by providing a plurality of circuit sets. These steps are repeated a predetermined number of times or until the shift time t reaches a predetermined time in order to generate a two-dimensional depth image in which the shift time t of the return of the reflected light 16 is written for each address of the ToF sensors 2, i.e., in which the distance to the object is mapped for each address of the ToF sensors 2.
However, the method shown in Figures 4 and 5 significantly increases a total amount of data of all sub-frames output from the pixel array 30 to the logic circuit 10 controlling writing data into the frame memory 34 in order to generate one  two-dimensional depth image because data from all the ToF sensors 2 is transferred to the logic circuit 10 even if the data output from each ToF sensor 2 is one bit. An event-driven type system in order to reduce the amount of data is known. Data output from each ToF sensor of the event-driven type system is monitored by each ToF sensor itself. Only if the output exceeds a threshold level is a pixel fired and the address of the pixel output. Since each sub-frame comprises addresses of only pixels of which output has exceeded the threshold level, this reduces the total amount of data output from the pixel array 30 to the logic circuit 10 controlling writing data into the frame memory 34.
Figure 6 shows a schematic circuit diagram of a ToF sensor 2 according to the second embodiment of the invention which implements the event-driven type system. Figure 7 shows a schematic diagram of a sub-frame of a pixel array 30 comprising the ToF sensors 2 according to the second embodiment when one pixel is fired.
Figure 6 shows the ToF sensor 2 comprising a photodetector 22, and the photodetector 22 comprises a plurality of taps. Although the photodetector 22 shown in Figure 6 comprises, for example, two taps 24, 26, the photodetector 22 may comprise three or more taps. Outputs from the  taps  24, 26 are coupled to, for example, a comparator 6.
Since a method for operating the ToF sensor 2 having such a configuration is similar to the method described for the first embodiment with reference to Figure 2, the details will not be described. Schematically, the ToF sensor 2 repeatedly carries out the emission of light 14 and the activation of the first tap 24 and the second tap 26 with an increase in the shift time t from the start of the emission of light 14 from a light source not shown in Figure 6 to the completion of the activation of the second tap 26. The signal output from the first tap 24 and the signal output from the second tap 26 are input to the comparator 6. If the shift time t is equal to a time ts from the emission of light 14 to the return of the reflected light 16 reflected on an object 12, the reflected light 16 impinges the photodetector 22 during the activation of the second tap 26 and the signal output from the comparator 6 becomes Hi. Therefore, the time ts from the emission of light 14 to the return of the reflected light 16 to the photodetector 22, i.e., the distance to the object 12 is measured.
The output from the comparator 6 shown in Figure 6 is coupled to a resistor 36 and a comparing circuit 38. The resistor 36 stores output from the comparator 6 in the prior sub-frame as a data value of Hi or Low. The comparing circuit 38 compares the output from the comparator 6 and the data stored in the resistor 36. If the output from the comparator 6 is Low, the comparing circuit 38 does not output Hi, and a data value of Low is stored in the resistor 36 before the next sub-frame. If the output from the comparator 6 is Hi when the resistor 36 is in the Low state, the comparing circuit 38 outputs Hi and the resistor 36 stores Hi. The state in which the comparator circuit 38 outputs Hi is referred to as “astate in which a pixel comprising the ToF sensor 2 is fired” . If the pixel is fired and the resistor 36 stores Hi, the comparing circuit 38 no longer outputs Hi and the pixel is no longer fired until completing all of the sub-frames after the next sub-frame and resetting the entire pixel array.
Figure 7 shows a sub-frame in which only a pixel 22-1 in the pixel array 30 is fired. When the row scan reaches a row comprising the fired pixel 22-1 in this sub-frame, a column corresponding to the fired pixel 22-1 is detected. Therefore, the data of the row and the column of the pixel 22-1 is output as an address. The shift time t of this sub-frame, i.e., the shift time t, when the pixel 22-1 is fired, is written in an address in the frame memory 34 corresponding to the address of the pixel 22-1. Therefore, the distance from the pixel 22-1 to the object 12 is written in the frame memory 34.
A two-dimensional depth image can be obtained by repeating this operation a predetermined number of times.
Figure 8 shows a cross sectional view of a stacked sensor chip 40 according to the third embodiment of the present invention. The stacked sensor chip 40 comprises a stacked structure comprising a pixel array chip 42 and an electronic circuit chip 44. The pixel array chip 42 may include photodetectors 22 disposed in array, and a plurality of taps coupled to each photodetector 22, for example, taps 24, 26. The electronic circuit chip 44 may comprise a control circuit for controlling the light source 4 and the  taps  24, 26 included in the pixel array chip 42, comparators 6 to which outputs from the  taps  24, 26 are coupled via coupling portions 46, a time counter 8, logic circuit 10, resistors 36, and comparing circuit 38, and may comprise other additional circuits. The photodetector 22 and the  taps  24, 26 included in the  pixel array chip 42 and the comparator 6 included in the electronic circuit chip 44 may constitute the ToF sensor 2.
The ToF system 1 according to the embodiments of the present invention may comprise various periphery circuits such as the control circuit, compactors, time counter, logic circuit, resistors, and comparing circuits as discussed above. Therefore, if all of the components of the ToF system 1 are integrated in one chip, it may prevent the miniaturization of the each pixel. However, each pixel, and therefore, the whole ToF system 1 can be miniaturized by dividing the ToF system 1 into the pixel array chip 42 and the electronic circuit chip 44 and stacking them. The operation of the ToF system 1 may be also accelerated by parallelizing the circuits. The delay of the operation may be also suppressed by reducing the distance between the photodetector 22 and the electronic circuit. Furthermore, since the pixel array chip 42 and the electronic circuit chip 44 are fabricated in separate processes and are coupled to each other in the final step, the fabrication process may be simplified. Since a wafer comprising a plurality of pixel array chips 42 and a wafer comprising a plurality of electronic circuit chips 44 are wafer-bonded and divided into the chips, the fabrication process can be further simplified.
Figure 9 shows a perspective view of a stacked sensor chip 50 according to the fourth embodiment of the present invention. The stacked sensor chip 50 according to the fourth embodiment comprises a stacked structure in which a pixel array chip 52 comprising a plurality of ToF sensors 2 arranged in an array and an electronic circuit chip 54 are stacked via coupling portions 56.
Similar to the electronic circuit chip 44 of the stacked sensor chip 40 of the third embodiment, the electronic circuit chip 54 may comprise circuit blocks 58 and 59 as shown in Figure 9. The circuit block 58 may include: a control circuit for controlling the light source 4 and the taps of the pixel array chip 52 for implementing the operation of the ToF sensor 2 described with reference to the first and second embodiments; comparators 6; resistors 36; and comparing circuit 38. The circuit block 60 may include time counter 8; and logic circuit 10, and optionally other additional circuits.
On the other hand, the pixel array chip 52 may comprise an indirect TOF system logic circuit 62 for implementing a conventional indirect time-of-flight measurement method. Since the ToF sensor 2 included in the stacked sensor chip 50  according to the present embodiment comprises a plurality of taps, the ToF sensor 2 may function as, for example, a conventional indirect ToF sensor as described with reference to Figure 11. Such a stacked sensor chip 50 may select an appropriate operation mode among a conventional direct ToF sensor mode, a conventional indirect ToF sensor mode, and the ToF sensor mode according to the embodiments of the present invention if necessary.
Although the embodiments of the present invention have been illustrated as examples, those skilled in the art will readily understand that various modifications and variations may be embodied without deviating from the spirit and the scope of the present invention.
Designations
1: ToF system
2: ToF sensor
22: Photodetector
22-1: Fired pixel
24, 26: Taps
4: Light source
6: Comparator
8: Time counter
10: Logic circuit
12: Object
14: Light
16: Reflected light
18: Multi-path reflection
30: Pixel array
32: Latch circuit
34: Frame memory
36: Resistor
38: Comparing circuit
40: Stacked sensor chip
42: Pixel array chip
44: Electronic circuit chip
46: Coupling portion
50: Stacked sensor chip
52: Pixel array chip
54: Electronic circuit chip
56: Coupling portion
58, 60: Circuit block
62: Logic circuit of indirect ToF system
102: Conventional dToF sensor
108: Time counter
112: Object
114: Light
116: Reflected light
202: Conventional iToF sensor
212: Object
214: Light
216: Reflected light
224, 226: Taps

Claims (16)

  1. A method for measuring a distance from a photodetector to an object, the method carrying out a measurement cycle, the measurement cycle comprising:
    a first step carried out one or more times, the first step comprising:
    a first sub-step for emitting pulsed light from at least one light source; and
    a second sub-step for sequentially activating each tap of the photodetector comprising a plurality of taps during a predetermined period to store signals due to light received by the photodetector, wherein the plurality of taps are sequentially activated such that the completion of the activation of the last tap among the plurality of taps is shifted by a predetermined shift time longer than or equal to zero from the initiation of the emission of the pulsed light, and
    a second step for outputting the stored signals from the taps and outputting a differential signal of the output signals,
    wherein the pulsed light is reflected on the object and returns to the photodetector as reflected light,
    wherein the measurement cycle is repeated with an increase in the shift time until the reflected light returns to the photodetector during the activation period of any one of the plurality of taps and the differential signal becomes a predetermined value larger than zero, and
    wherein the distance from the photodetector to the object is measured based on the shift time of the measurement cycle in which the reflected light returns to the photodetector during the activation period of any one of the plurality of taps.
  2. The method according to Claim 1, wherein the first step is carried out a plurality of times.
  3. The method according to Claim 1, wherein the differential signal is a digital signal represented as Hi/Low, and
    wherein the differential signal is Hi when the signal output from the last activated tap among the plurality of taps is larger than signals output from the other taps.
  4. The method according to Claim 1, wherein the distance from the photodetector to the object is measured based on the shift time when the differential signal exceeds a predetermined threshold.
  5. The method according to Claim 1, wherein the differential signal is stored in a resistor in each measurement cycle, and
    wherein the signal is output when the differential signal in one measurement cycle is larger than the differential signal stored in the resistor in a measurement cycle prior to the one measurement cycle by a predetermined threshold.
  6. The method according to any one of Claims 1 to 5, further comprising, when the differential signal output from each photodetector included in a pixel array is Hi or exceeds a predetermined threshold, forming a two-dimensional depth image by writing the shift time in an address of the frame memory, the address of the frame memory corresponding to the photodetector and not comprising data regarding a shift time.
  7. The method according to Claim 5, further comprising forming a sub-frame of a two-dimensional depth image based on the differential signal output from each photodetector included in a pixel array,
    wherein only data of the address in the sub-frame corresponding to the photodetector outputting the signal is updated.
  8. A Time-of-Flight (ToF) measurement system comprising:
    at least one ToF sensor;
    a time counter; and
    at least one light source for emitting pulsed light,
    wherein the ToF sensor comprises:
    a photodetector comprising a plurality of taps, the photodetector for outputting signals due to reception of the light reflected on an object and returned as reflected light; and
    a comparator to which outputs from the plurality of taps are coupled, the  comparator for outputting a differential signal of outputs from the plurality of taps,
    wherein the plurality of taps are sequentially activated to store signals due to light received by the photodetector,
    wherein the plurality of taps are sequentially activated such that the completion of the activation of the last tap among the plurality of taps is shifted at a shift time longer than or equal to zero from the initiation of the emission of the pulsed light,
    wherein the emission of light and the activation of the plurality of taps are carried out with an increase in the shift time until the differential signal exceeds a predetermined value larger than zero,
    wherein the shift time is managed by the time counter, and
    wherein the distance from the photodetector to the object is measured based on the shift time.
  9. The system according to Claim 8, wherein the plurality of taps output signals of light received by the photodetector after the taps are activated a plurality of times and store the signal of light received by the photodetector.
  10. The system according to Claim 8, wherein the comparator outputs digital signals represented as Hi/Low.
  11. The system according to Claim 8, wherein the distance from the photodetector to the object is measured based on the shift time when the differential signal exceeds a predetermined threshold.
  12. The system according to Claim 8, wherein the ToF sensor further comprises:
    a resistor for storing the differential signal of each measurement cycle; and
    a comparing circuit for comparing the differential signal in one measurement cycle with the differential signal stored in the resistor during a measurement cycle prior to the one measurement cycle, and for outputting a signal when the differential signal in the one measurement cycle is larger than the differential signal stored in the resistor at a predetermined threshold.
  13. The system according to Claim 8, wherein the photodetectors are arranged in an array to form a pixel array, and
    wherein the ToF measurement system further comprises a logic circuit for forming a sub-frame of a two-dimensional depth image based on the differential signals output from the photodetectors.
  14. The system according to Claim 12, wherein the photodetectors are arranged in an array to from a pixel array, and
    wherein when the differential signal output from each photodetector is Hi or exceeds a predetermined threshold, the ToF measurement system further comprises a logic circuit for forming a two-dimensional depth image by writing the shift time in an address of the frame memory corresponding to the photodetector if data regarding the shift time is not written in the address.
  15. A stacked sensor chip comprising the system according to any one of Claims 8 to 14, the stacked sensor chip comprising:
    a pixel array chip comprising at least the photodetectors; and
    an electronic circuit chip comprising at least one of the comparator, the time counter, the logic circuit, the resistor, and the comparing circuit,
    wherein the pixel array chip and the electronic circuit chip are stacked and electrically coupled to each other.
  16. The stacked sensor chip according to Claim 15, wherein the pixel array chip further comprises an electronic circuit for implementing an indirect ToF measurement method.
PCT/CN2020/115685 2020-09-16 2020-09-16 Method for measuring distance using time-of-flight method and system for measuring distance WO2022056743A1 (en)

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130162973A1 (en) * 2011-12-27 2013-06-27 Honda Motor Co., Ltd. Distance measuring system and distance measuring method
CN103344962A (en) * 2013-07-12 2013-10-09 北京理工大学 Laser pulse distance measurement method based on light path differences
CN110133675A (en) * 2019-06-10 2019-08-16 炬佑智能科技(苏州)有限公司 Data processing method, device, electronic equipment and the optical processing circuit of luminous ranging
CN209356671U (en) * 2018-02-07 2019-09-06 苏州镭图光电科技有限公司 A kind of laser radar background dark noise response cancellation element
CN110291414A (en) * 2017-02-21 2019-09-27 索尼半导体解决方案公司 Distance-measuring device and distance measurement method
CN110603458A (en) * 2017-05-11 2019-12-20 索尼公司 Optical sensor and electronic device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6535275B2 (en) * 2000-08-09 2003-03-18 Dialog Semiconductor Gmbh High resolution 3-D imaging range finder
TWI765977B (en) * 2017-03-01 2022-06-01 美商奧斯特公司 Optical measurement system, method of using the same and light ranging system
JP7120756B2 (en) * 2017-12-05 2022-08-17 シャープ株式会社 Photodetector, time-of-flight measuring device and optical radar device
CN113272684A (en) * 2019-01-04 2021-08-17 感觉光子公司 High dynamic range direct time-of-flight sensor with signal dependent effective readout rate
CN110221274B (en) * 2019-05-09 2021-04-30 奥比中光科技集团股份有限公司 Time flight depth camera and multi-frequency modulation and demodulation distance measuring method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130162973A1 (en) * 2011-12-27 2013-06-27 Honda Motor Co., Ltd. Distance measuring system and distance measuring method
CN103344962A (en) * 2013-07-12 2013-10-09 北京理工大学 Laser pulse distance measurement method based on light path differences
CN110291414A (en) * 2017-02-21 2019-09-27 索尼半导体解决方案公司 Distance-measuring device and distance measurement method
CN110603458A (en) * 2017-05-11 2019-12-20 索尼公司 Optical sensor and electronic device
CN209356671U (en) * 2018-02-07 2019-09-06 苏州镭图光电科技有限公司 A kind of laser radar background dark noise response cancellation element
CN110133675A (en) * 2019-06-10 2019-08-16 炬佑智能科技(苏州)有限公司 Data processing method, device, electronic equipment and the optical processing circuit of luminous ranging

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