WO2021258728A1 - Preparation method for pure phase cuprous oxide thin film having high crystalline quality - Google Patents
Preparation method for pure phase cuprous oxide thin film having high crystalline quality Download PDFInfo
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- WO2021258728A1 WO2021258728A1 PCT/CN2021/073525 CN2021073525W WO2021258728A1 WO 2021258728 A1 WO2021258728 A1 WO 2021258728A1 CN 2021073525 W CN2021073525 W CN 2021073525W WO 2021258728 A1 WO2021258728 A1 WO 2021258728A1
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- ceramic sheet
- copper foil
- cuprous oxide
- pure copper
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- BERDEBHAJNAUOM-UHFFFAOYSA-N copper(I) oxide Inorganic materials [Cu]O[Cu] BERDEBHAJNAUOM-UHFFFAOYSA-N 0.000 title claims abstract description 66
- KRFJLUBVMFXRPN-UHFFFAOYSA-N cuprous oxide Chemical compound [O-2].[Cu+].[Cu+] KRFJLUBVMFXRPN-UHFFFAOYSA-N 0.000 title claims abstract description 66
- 229940112669 cuprous oxide Drugs 0.000 title claims abstract description 66
- 238000002360 preparation method Methods 0.000 title claims abstract description 16
- 239000010409 thin film Substances 0.000 title abstract description 7
- 239000000919 ceramic Substances 0.000 claims abstract description 179
- 238000006243 chemical reaction Methods 0.000 claims abstract description 53
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 52
- 239000011889 copper foil Substances 0.000 claims abstract description 48
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 40
- 239000001301 oxygen Substances 0.000 claims abstract description 40
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 40
- 238000000034 method Methods 0.000 claims abstract description 37
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 16
- 239000010949 copper Substances 0.000 claims abstract description 15
- 230000003647 oxidation Effects 0.000 claims abstract description 8
- 229910052802 copper Inorganic materials 0.000 claims abstract description 4
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 90
- 229910052786 argon Inorganic materials 0.000 claims description 45
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 20
- 239000012300 argon atmosphere Substances 0.000 claims description 14
- 239000010431 corundum Substances 0.000 claims description 14
- 229910052593 corundum Inorganic materials 0.000 claims description 14
- 238000010438 heat treatment Methods 0.000 claims description 14
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 claims description 12
- 239000012298 atmosphere Substances 0.000 claims description 12
- 239000000463 material Substances 0.000 claims description 11
- 229910052757 nitrogen Inorganic materials 0.000 claims description 10
- 239000011261 inert gas Substances 0.000 claims description 7
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 2
- 239000007789 gas Substances 0.000 claims description 2
- 239000013078 crystal Substances 0.000 abstract description 12
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 abstract description 2
- 239000005751 Copper oxide Substances 0.000 abstract description 2
- 229910000431 copper oxide Inorganic materials 0.000 abstract description 2
- 230000001699 photocatalysis Effects 0.000 abstract 1
- 238000007146 photocatalysis Methods 0.000 abstract 1
- 239000012495 reaction gas Substances 0.000 abstract 1
- 239000010408 film Substances 0.000 description 17
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 16
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 16
- 230000000052 comparative effect Effects 0.000 description 15
- 239000008367 deionised water Substances 0.000 description 8
- 229910021641 deionized water Inorganic materials 0.000 description 8
- 238000010791 quenching Methods 0.000 description 8
- 230000000171 quenching effect Effects 0.000 description 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 8
- 238000002425 crystallisation Methods 0.000 description 7
- 230000008025 crystallization Effects 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- AFCARXCZXQIEQB-UHFFFAOYSA-N N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(CCNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 AFCARXCZXQIEQB-UHFFFAOYSA-N 0.000 description 4
- 238000004321 preservation Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 238000000862 absorption spectrum Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000004070 electrodeposition Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000007429 general method Methods 0.000 description 2
- 238000001878 scanning electron micrograph Methods 0.000 description 2
- 239000011358 absorbing material Substances 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 231100000252 nontoxic Toxicity 0.000 description 1
- 230000003000 nontoxic effect Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000000879 optical micrograph Methods 0.000 description 1
- 238000000053 physical method Methods 0.000 description 1
- 238000004549 pulsed laser deposition Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G3/00—Compounds of copper
- C01G3/02—Oxides; Hydroxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/70—Crystal-structural characteristics defined by measured X-ray, neutron or electron diffraction data
- C01P2002/72—Crystal-structural characteristics defined by measured X-ray, neutron or electron diffraction data by d-values or two theta-values, e.g. as X-ray diagram
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/80—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/80—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70
- C01P2002/84—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70 by UV- or VIS- data
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/01—Particle morphology depicted by an image
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/01—Particle morphology depicted by an image
- C01P2004/03—Particle morphology depicted by an image obtained by SEM
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/40—Electric properties
Definitions
- the invention belongs to the technical field of semiconductor material preparation, and specifically relates to a method for preparing a pure phase cuprous oxide film with high crystalline quality.
- Cuprous oxide (Cu 2 O) is an excellent P-type semiconductor material with a cubic crystal structure and a direct band gap between 1.9-2.5 eV. It has good hole mobility at room temperature, Cu 2 O has a large light absorption coefficient, a long carrier diffusion length, and has a rich reserve of constituent elements and is non-toxic. Therefore, it is a promising photovoltaic material. Theoretically, a cell with Cu 2 O as the light-absorbing layer can achieve a photoelectric conversion efficiency of 20%. According to estimates, if a cell with a photoelectric conversion efficiency of 5% can be prepared, Cu 2 O will have a very high application in the photovoltaic field. Economic Value.
- the solar cells using Cu 2 O as the light-absorbing material in the laboratory generally have low photoelectric conversion efficiency.
- the most important factor is the poor crystalline quality of the prepared cuprous oxide film. Causes serious non-radiation recombination of the interface and the body.
- the most researched preparation techniques of cuprous oxide films mainly include: electrochemical deposition, thermal oxidation, magnetron sputtering, pulsed laser deposition, etc.
- some physical methods are difficult to produce thin films with high crystalline quality and pure phases, and it is difficult to apply electrochemical deposition on a large scale.
- Professor Minami from Japan can obtain large-grained Cu 2 O by thermal oxidation.
- the purpose of the present invention is to provide a method for preparing a pure phase cuprous oxide film with high crystalline quality.
- This method restricts the reaction, crystallization, and growth of cuprous oxide in a small space by constructing a small reaction space structure, so that the cuprous oxide has a more stable environment during the oxidation and crystallization process, and the growth process is more orderly.
- the obtained cuprous oxide has large crystal grains, excellent electrical properties, small band gap, simple preparation process and good repeatability.
- the present invention adopts the following technical solutions as follows:
- a method for preparing high-quality cuprous oxide thin film A small reaction space is constructed by ceramic sheets, pure copper foil is used as the copper source, and oxygen or air is used as the reactive gas source to prepare high-quality cuprous oxide thin film by thermal oxidation; wherein:
- the method for constructing the small reaction space is: take the upper ceramic sheet and the lower ceramic sheet, and place the two supporting ceramic sheets between the upper ceramic sheet and the lower ceramic sheet, respectively, between the upper ceramic sheet and the lower ceramic sheet.
- the small space between the ceramic pieces is the small reaction space constructed;
- the pure copper foil is placed on the surface of the lower ceramic sheet in the small reaction space obtained by the structure;
- the thickness of the supporting ceramic sheet is 0.1-1 mm, the thickness of the pure copper foil is 0.05-0.2 mm, and the thickness of the supporting ceramic sheet is at least 1.5 times the thickness of the pure copper foil.
- the method for preparing the high-quality cuprous oxide film includes the following steps:
- step 2 Put the small reaction space structure constructed by the ceramic sheet and the pure copper foil inside the tube furnace together in step 1).
- an inert gas atmosphere raise it to 800-850°C, reduce the heating rate and continue to rise to 1010- 1050°C, then replace the inert gas atmosphere with oxygen or air atmosphere, keep it for 60-180min for thermal oxidation reaction, Cu generates Cu 2 O;
- step 2) After the step 2) the thermal oxidation reaction is completed, the oxygen or air atmosphere is replaced with an argon atmosphere, the temperature is kept for a period of time and then cooled to 500-600°C, and naturally cooled to room temperature, to obtain a cuprous oxide film with high crystalline quality.
- the heating rate should be controlled within 6-10°C/min before 800-850°C, and within 6°C/min after 800-850°C.
- the oxygen or air atmosphere is replaced with an argon atmosphere and the temperature is kept for 60-180 minutes, and then the temperature is reduced to 500-600°C at a rate of 3-5°C/min.
- the temperature of the thermal oxidation reaction is continued to rise by 5-10°C, and the oxygen or air atmosphere is replaced with an argon atmosphere during the heating process.
- the volume flow rate of the inert gas is 50 sccm-100 sccm.
- the inert gas is argon or nitrogen.
- the volume flow rate of oxygen is 100-200 sccm.
- the ceramic sheet is corundum, zirconia or aluminum nitride, wherein the material of the upper ceramic sheet and the lower ceramic sheet are the same, and the materials of the upper ceramic sheet, the lower ceramic sheet and the supporting ceramic sheet may be the same or different.
- a small reaction space is constructed by ceramic sheets to support the thickness of the ceramic sheet to adjust the distance between the upper ceramic sheet and the lower ceramic sheet to adjust the size of the small reaction space.
- the flat upper ceramic sheet and the lower ceramic sheet are used as pure.
- the upper and lower surface coverings of the copper foil restrict the reaction, crystallization and growth of cuprous oxide in a small space, so that the cuprous oxide has a more stable environment during the oxidation and crystallization process, so that larger crystals can be grown in a certain orientation.
- the size of the cuprous oxide obtained by this method is large, up to 1.5mm, and the electrochemical performance is excellent.
- the carrier mobility can reach 72cm 2 /V ⁇ s, which is about twice as high as the general method.
- the band gap is 1.91eV, which can be used as a light-absorbing layer material in the field of solar cells.
- the invention uses ordinary ceramic materials as an auxiliary to construct a small reaction space, which is cheap, reusable, simple in process, good in repeatability, simple in equipment requirements, and does not require expensive large-scale vacuum equipment, and does not require expensive raw materials , No complicated etching process, low cost, and potential for large-scale industrial production.
- Fig. 1 is a schematic diagram of a small reaction space constructed in an embodiment of the present invention, in which 1-upper ceramic sheet, 2-supporting ceramic sheet, 3-pure copper foil, 4-lower ceramic sheet.
- Figure 2 is a scanning electron micrograph of cuprous oxide prepared in different processes in Examples 1-2 and 6 and Comparative Example 1-2, in which (a) and (b) Example 1, (c) Example 2 , (D) Example 6, (e) Comparative Example 2, (f) Comparative Example 1.
- Figure 3 is an X-ray diffraction pattern of cuprous oxide prepared when using different ceramic sheets as substrates in Example 1-2, in which (a) Example 1 corundum substrate, (b) Example 2 zirconia lining end.
- Figure 4 is an optical microscope photograph of cuprous oxide prepared with pure copper foil sources of different thicknesses in Examples 1 and 3, where (a) and (b) are the front and cross sections of 100 ⁇ m thick pure copper foil in Example 3, respectively. (c) and (d) are the front and cross section of the 200 ⁇ m thick pure copper foil in Example 1, respectively.
- Fig. 5 is (a) the ultraviolet-visible absorption spectrum and (b) the Taut-Plot diagram of the cuprous oxide prepared by the space structuring method in Example 1.
- the present invention provides a method for preparing a thin film of pure phase cuprous oxide with high crystalline quality.
- the present invention will be further described in detail below in conjunction with specific implementation examples and with reference to the accompanying drawings. .
- a method for preparing high-quality cuprous oxide film is provided. The specific steps are as follows:
- step 2) Put the small reaction space structure constructed by the ceramic sheet and the pure copper foil inside the tube furnace together in step 1), use a mechanical pump to extract the air in the tube furnace, and then open the argon valve, the argon volume flow rate Set to 50sccm, maintain the argon atmosphere in the tube furnace, set the temperature to 800°C for 90 minutes, and then to 1010°C for 60 minutes; after the temperature reaches 1010°C, close the argon valve, open the oxygen valve, and set the oxygen volume flow rate to 100sccm, heat preservation for 120min.
- a method for preparing high-quality cuprous oxide film is provided. The specific steps are as follows:
- step 2) Put the small reaction space structure constructed by the ceramic sheet and the pure copper foil inside the tube furnace together in step 1), use a mechanical pump to extract the air in the tube furnace, and then open the argon valve, the argon volume flow rate Set to 50sccm, maintain the argon atmosphere in the tube furnace, set the temperature to 800°C for 90 minutes, and then to 1010°C for 60 minutes; after the temperature reaches 1010°C, close the argon valve, open the oxygen valve, and set the oxygen volume flow rate to 100sccm, heat preservation for 120min.
- a method for preparing high-quality cuprous oxide film is provided. The specific steps are as follows:
- step 2) Put the small reaction space structure constructed by the ceramic sheet and the pure copper foil inside the tube furnace together in step 1), use a mechanical pump to extract the air in the tube furnace, and then open the argon valve, the argon volume flow rate Set to 50sccm, maintain the argon atmosphere in the tube furnace, set the temperature to 800°C for 90 minutes, and then to 1010°C for 60 minutes; after the temperature reaches 1010°C, close the argon valve, open the oxygen valve, and set the oxygen volume flow rate to 100sccm, heat preservation for 120min.
- a method for preparing high-quality cuprous oxide film is provided. The specific steps are as follows:
- step 2) Put the small reaction space structure constructed by the ceramic sheet and the pure copper foil inside the tube furnace together in step 1), use a mechanical pump to extract the air in the tube furnace, and then open the argon valve, the argon volume flow rate Set to 100sccm, keep the argon atmosphere in the tube furnace, set 90min to 800°C, and then 60min to 1010°C; after the temperature reaches 1010°C, close and open the oxygen valve, set the oxygen volume flow to 100sccm, keep the temperature for 120min .
- a method for preparing high-quality cuprous oxide film is provided. The specific steps are as follows:
- step 2) Put the small reaction space structure constructed by the ceramic sheet and the pure copper foil inside the tube furnace together in step 1), use a mechanical pump to extract the air in the tube furnace, and then open the argon valve, the argon volume flow rate Set to 50sccm, keep the argon atmosphere in the tube furnace, set the temperature to 800°C for 90 minutes, and then to 1050°C for 60 minutes; after the temperature reaches 1050°C, close the argon valve, open the oxygen valve, and set the oxygen volume flow rate to 100sccm, heat preservation for 120min.
- a method for preparing high-quality cuprous oxide film is provided. The specific steps are as follows:
- step 2) Put the small reaction space structure constructed by the ceramic sheet and the pure copper foil inside the tube furnace together in step 1), use a mechanical pump to extract the air in the tube furnace, and then open the argon valve, the argon volume flow rate Set it to 50sccm, keep the argon atmosphere in the tube furnace, set it to rise to 800°C for 90 minutes, and then to 1010°C for 60 minutes; after the temperature reaches 1010°C, close the argon valve, open the vent valve, and breathe in air. Keep for 120min.
- a method for preparing a cuprous oxide film is provided, and the specific steps are as follows:
- a method for preparing a cuprous oxide film is provided, and the specific steps are as follows:
- test results of analysis examples 1-6 and comparative examples 1-2 are as follows:
- Figure 2 is a scanning electron micrograph of cuprous oxide prepared in different processes in Examples 1-2 and 6 and Comparative Example 1-2, in which (a) and (b) Example 1, (c) Example 2 , (D) Example 6, (e) Comparative Example 2, (f) Comparative Example 1.
- the cuprous oxide film prepared by using a corundum ceramic substrate to build a space has large crystal grains and a very flat surface, as can be seen in Figure 2b By the time the grain size has reached 1.5mm, the size of the cuprous oxide can reach the millimeter level.
- Figure c (Example 2) and Figure d (Example 6) respectively show the use of zirconia ceramics to construct the space and the use of air as an oxygen source to prepare cuprous oxide.
- the crystal quality is also relatively high. But when we do not use the space construction method, as shown in Figure e (Comparative Example 2) and Figure f (Comparative Example 1), no matter whether the substrate is a quartz plate or a corundum crucible, the crystal quality is not as good as the previous results.
- Figure 3 is an X-ray diffraction pattern of cuprous oxide prepared when different ceramic sheets are used as substrates in Example 1-2, in which (a) Example 1 corundum substrate, (b) Example 2 zirconia substrate .
- the figure shows that both Example 1 and Example 2 can prepare pure phase cuprous oxide, and it mainly grows along the (110) and (220) crystal plane orientations.
- Figure 4 is an optical micrograph of the cuprous oxide prepared by the space construction method when the thickness of the pure copper foil source is 100 ⁇ m (Example 3) and 200 ⁇ m (Example 1), the magnification is both 10 times, of which (a) 100 ⁇ m front , (B) 100 ⁇ m cross-section, (c) 200 ⁇ m front side, (d) 200 ⁇ m cross-section.
- the figure shows that when the thickness of the pure copper foil is 100 ⁇ m, the prepared cuprous oxide crystal grains are smaller than the thickness of 200 ⁇ m. However, it can be seen from the cross-sectional view that the entire cuprous oxide crystal penetrates the entire thickness. Application is an advantage.
- Fig. 5 shows (a) the ultraviolet-visible absorption spectrum and (b) the Taut-Plot diagram of the cuprous oxide prepared by the space structuring method in Example 1.
- the figure shows that the Cu 2 O prepared in Example 1 has a relatively small band gap of 1.91 eV, and is more suitable for use as a light-absorbing layer material in the field of solar cells.
- Table 1 shows the results of the Hall test of the cuprous oxide prepared in Examples 1 and 3 and Comparative Example 1.
- the table shows that the carrier mobility of the cuprous oxide obtained in Example 1 can reach 72 cm 2 /V ⁇ s. Compared with the cuprous oxide obtained by the general method in Comparative Example 1, it is doubled, and the electrical properties are very excellent.
- the present invention uses flat ceramic sheets as the upper and lower surface coverings of pure copper foil to limit the reaction, crystallization, and growth of cuprous oxide in a small space, so that the cuprous oxide has a better effect in the process of oxidation and crystallization.
- larger crystal grains are grown in a certain orientation.
- the preparation method is simple and controllable, has strong repeatability, and the prepared material has good structural properties and electrical properties, and is suitable for preparing solar cells.
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Abstract
Description
Claims (8)
- 一种高质量氧化亚铜薄膜的制备方法,其特征在于,通过陶瓷片构筑微小反应空间,以纯铜箔为铜源,氧气或者空气作为反应气源采用热氧化法制备得到高质量氧化亚铜薄膜;其中:A method for preparing high-quality cuprous oxide film, which is characterized in that a small reaction space is constructed by ceramic sheets, pure copper foil is used as a copper source, oxygen or air is used as a reactive gas source, and a high-quality cuprous oxide film is prepared by thermal oxidation. ;in:微小反应空间的构筑方法为:取上陶瓷片和下陶瓷片,将两片支撑陶瓷片分别置于所述上陶瓷片和所述下陶瓷片之间,在所述上陶瓷片和所述下陶瓷片之间撑起微小空间,即为构筑的微小反应空间;The method for constructing the small reaction space is: take the upper ceramic sheet and the lower ceramic sheet, and place the two supporting ceramic sheets between the upper ceramic sheet and the lower ceramic sheet, respectively, between the upper ceramic sheet and the lower ceramic sheet. The small space between the ceramic pieces is the small reaction space constructed;所述纯铜箔置于构筑得到的所述微小反应空间内的所述下陶瓷片表面;The pure copper foil is placed on the surface of the lower ceramic sheet in the small reaction space obtained by the structure;所述支撑陶瓷片厚度为0.1-1mm,所述纯铜箔厚度为0.05-0.2mm,所述支撑陶瓷片厚度至少是所述纯铜箔厚度的1.5倍。The thickness of the supporting ceramic sheet is 0.1-1 mm, the thickness of the pure copper foil is 0.05-0.2 mm, and the thickness of the supporting ceramic sheet is at least 1.5 times the thickness of the pure copper foil.
- 根据权利要求1所述的制备方法,其特征在于,包括如下步骤:The preparation method according to claim 1, characterized in that it comprises the following steps:1)通过陶瓷片构筑微小反应空间,取上陶瓷片和下陶瓷片,将两片支撑陶瓷片分别置于上陶瓷片和下陶瓷片之间,在上陶瓷片和下陶瓷片之间撑起微小空间,然后将纯铜箔置于构筑得到的所述微小反应空间内的下陶瓷片表面;1) Construct a small reaction space by ceramic sheets, take the upper ceramic sheet and the lower ceramic sheet, and place the two supporting ceramic sheets between the upper ceramic sheet and the lower ceramic sheet, and prop up between the upper ceramic sheet and the lower ceramic sheet. A small space, and then pure copper foil is placed on the surface of the lower ceramic sheet in the constructed small reaction space;2)将步骤1)通过陶瓷片构筑的微小反应空间及内部的纯铜箔一起置于管式炉中,在惰性气体氛围中,升至800-850℃,降低升温速率继续升至1010-1050℃,然后将惰性气体氛围置换成氧气或空气氛围,保温60-180min进行热氧化反应,Cu生成Cu 2O; 2) Put the small reaction space constructed by the ceramic sheet and the pure copper foil inside the tube furnace together in step 1). In an inert gas atmosphere, raise it to 800-850℃, reduce the heating rate and continue to rise to 1010-1050 ℃, then replace the inert gas atmosphere with oxygen or air atmosphere, keep for 60-180min for thermal oxidation reaction, Cu generates Cu 2 O;3)在步骤2)热氧化反应结束后将氧气或空气氛围置换成氩气氛围,继续保温一段时间后降温至500-600℃,自然冷却至室温,即得高结晶质量的氧化亚铜薄膜。3) After the step 2) the thermal oxidation reaction is completed, the oxygen or air atmosphere is replaced with an argon atmosphere, the temperature is kept for a period of time and then cooled to 500-600°C, and naturally cooled to room temperature, to obtain a cuprous oxide film with high crystalline quality.
- 根据权利要求2所述的制备方法,其特征在于,所述步骤2)中,800-850℃之前升温速率应控制在6-10℃/min,800-850℃之后控制在6℃/min之内。The preparation method according to claim 2, characterized in that, in the step 2), the heating rate before 800-850°C should be controlled at 6-10°C/min, and after 800-850°C, it should be controlled at 6°C/min. Inside.
- 根据权利要求2所述的制备方法,其特征在于,所述步骤2)中,氧气的体积流量为100-200sccm。The preparation method according to claim 2, wherein in the step 2), the volume flow rate of oxygen is 100-200 sccm.
- 根据权利要求2所述的制备方法,其特征在于,所述步骤3)中,将氧气或空气氛围置换成氩气氛围后继续保温60-180min,然后以3-5℃/min的速度降温至500-600℃。The preparation method according to claim 2, characterized in that, in the step 3), the oxygen or air atmosphere is replaced with an argon atmosphere, and then the temperature is kept for 60-180 minutes, and then the temperature is reduced to a temperature of 3-5°C/min. 500-600°C.
- 根据权利要求2所述的制备方法,其特征在于,所述步骤3)中,热氧化反应结束后,在热氧化反应温度基础上继续上升5-10℃,在升温过程中,将氧 气或空气氛围置换成氩气氛围。The preparation method according to claim 2, characterized in that, in the step 3), after the thermal oxidation reaction is completed, the temperature of the thermal oxidation reaction is continued to rise by 5-10°C, and during the heating process, oxygen or air The atmosphere is replaced with an argon atmosphere.
- 根据权利要求2所述的制备方法,其特征在于,所述步骤3)中,所述惰性气体为氩气或氮气,体积流量为50-100sccm。The preparation method according to claim 2, wherein in the step 3), the inert gas is argon or nitrogen, and the volume flow rate is 50-100 sccm.
- 根据权利要求1或2所述的制备方法,其特征在于,所述陶瓷片为刚玉、氧化锆或氮化铝,其中上陶瓷片和下陶瓷片材质相同,上陶瓷片和下陶瓷片与支撑陶瓷片的材质可相同也可不同。The preparation method according to claim 1 or 2, wherein the ceramic sheet is corundum, zirconia or aluminum nitride, wherein the material of the upper ceramic sheet and the lower ceramic sheet are the same, and the upper ceramic sheet and the lower ceramic sheet are compatible with the support The material of the ceramic sheet can be the same or different.
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