WO2021212916A1

WO2021212916A1 - Tof depth measurement apparatus and method, and electronic device

Info

Publication number: WO2021212916A1
Application number: PCT/CN2020/141870
Authority: WO
Inventors: 王兆民; 许星
Original assignee: 奥比中光科技集团股份有限公司
Priority date: 2020-04-20
Filing date: 2020-12-30
Publication date: 2021-10-28
Also published as: CN111458717A

Abstract

A TOF depth measurement apparatus (10) and method, and an electronic device. The apparatus (10) comprises: an emitting module (11), an acquisition module (12), and a control and processor (13). The emitting module (11) is used for emitting a beam, and comprises a light source (101) and a beam scanner (102). A beam emitted by the light source (101) is deflected by the beam scanner (102) to irradiate a given region of a target object (20). The acquisition module (12) is used for acquiring a beam reflected back by the target object (20), and comprises an image sensor (121) composed of a pixel array. The control and processor (13) is used for controlling the beam scanner (102) to deflect the beam to irradiate the given region of the target object (20), activating a pixel in a corresponding region of the image sensor (121) according to the beam formed after deflection so as to respond to a phtocharge accumulated by the beam reflected back by the given region, and calculating a phase difference on the basis of the photocharge to obtain the distance of the target object (20) and output a depth image of the target object (20). The TOF depth measurement apparatus can increase the image resolution and reduce the power consumption while increasing the signal-to-noise ratio of the image.

Description

A TOF depth measuring device, method and electronic equipment

This application claims the priority of a Chinese patent application filed with the Chinese Patent Office on April 20, 2020, the application number is 202010311680.4, and the invention title is "a TOF depth measuring device, method and electronic equipment", the entire content of which is incorporated by reference In this application.

Technical field

This application relates to the field of three-dimensional imaging technology, and in particular to a TOF depth measurement device, method, and electronic equipment.

Background technique

The full name of TOF is Time-of-Flight, that is, time of flight. TOF ranging technology is a technology that achieves precise ranging by measuring the round-trip flight time of light pulses between the transmitting/receiving device and the target object. In TOF technology, the technology that directly measures the optical time of flight is called D-TOF (direct-TOF), also known as direct TOF ranging; while the emitted light signal is periodically modulated, and the reflected light signal is compared with The measurement technique in which the phase delay of the emitted light signal is measured, and the flight time is calculated by the phase delay is called I-TOF (Indirect-TOF) technology, which is also called indirect TOF ranging or phase TOF ranging.

Existing TOF measurement devices based on I-TOF technology usually include a launching module and a collection module. The launching module provides flood lighting/lattice illumination to the target space, and the collection module images the reflected light beam. The depth measuring device calculates the phase difference based on the reflected light signal to obtain the distance of the object.

The solution disclosed in Chinese Patent Application No. 201911032055.X proposes that the emission module provides floodlighting to the target space. Since floodlighting can illuminate the field of view to the greatest extent, every pixel in the acquisition module can be obtained. Relatively effective light signal and can calculate the depth information of the response. However, the TOF measurement device using floodlight is susceptible to the interference of ambient light and the influence of multipath, resulting in low measurement accuracy.

The Chinese patent application No. 201811393403.1 proposes that the launch module provides lattice illumination to the target space. The lattice illumination can be more concentrated through a single point, and the distribution between points is sparse, which can effectively improve the image The signal-to-noise ratio also reduces the impact of multipath. However, the TOF depth measurement device using dot matrix illumination cannot cover all pixels, so that only some pixels can measure effective depth data, thereby reducing the resolution of the image.

Summary of the invention

The purpose of the present application is to provide a TOF depth measurement device, method and electronic equipment to solve at least one of the above-mentioned background technical problems.

The embodiment of the present application provides a TOF depth measuring device, including: a transmitting module for emitting a light beam toward a given area of a target object; wherein the transmitting module includes a light source and a beam scanner, which is scanned by the light beam The device deflects the light beam emitted by the light source to illuminate a given area of the target object; a collection module is used to collect the light beam reflected by the target object; wherein, the collection module includes a pixel array composed of Image sensor; control and processor, respectively connected with the transmitting module and the acquisition module, for controlling the beam scanner to deflect the beam to illuminate a given area of the target object, and according to the deflection The resulting light beam activates the pixels in the corresponding area of the image sensor to respond to the photocharge accumulated by the light beam reflected by the given area, and calculate the phase difference based on the photocharge to obtain the distance of the target object and output The depth image of the target object.

In some embodiments, the emission module further includes a lens, the light source generates a line beam through the lens, and the line beam is line scanned by the beam scanner to illuminate the target object.

In some embodiments, the lens is a cylindrical lens, the light beam emitted by the light source passes through the cylindrical lens to form a first line beam, and the first line beam is deflected by the beam scanner for multiple times. A projection pattern composed of a second line of light beams.

In some embodiments, the transmitting module further includes a collimating lens and a diffractive optical element; wherein the light beam emitted by the light source is collimated by the collimating lens and then emits a collimated light beam, and the collimated light beam passes through The diffractive optical element is diffracted to form a first line string beam or a first lattice beam, and the first line string beam or the first lattice beam is deflected by the beam scanner multiple times to obtain a plurality of second line strings A projection pattern composed of a light beam or a second lattice beam.

In some embodiments, the second lattice beams are regularly arranged.

The example of this application also provides a TOF depth measurement method, which includes the following steps:

The emission module emits a light beam toward a given area of the target object; wherein the emission module includes a light source and a beam scanner, and the light beam emitted by the light source is deflected by the beam scanner to illuminate the target object. Fixed area

Collecting the light beam reflected by the target object through a collection module; wherein, the collection module includes an image sensor composed of a pixel array;

The control and processor activates the pixels in the corresponding area of the image sensor according to the deflected beam to respond to the photocharge accumulated by the reflected beam, and calculates the phase difference based on the photocharge to obtain the The distance of the target object.

In some embodiments, the emission module further includes a cylindrical lens, the light beam emitted by the light source passes through the cylindrical lens to form a first line beam, and the first line beam is obtained after being deflected by the beam scanner multiple times A projection pattern composed of multiple second line beams.

In some embodiments, the transmitting module further includes a collimating lens and a diffractive optical element. The light beam emitted by the light source is collimated by the collimating lens and then emits a collimated light beam, and the collimated light beam passes through the collimated light beam. The diffractive optical element diffracts to form a first line string beam or a first lattice beam. The first line string beam or the first lattice beam is deflected by the beam scanner multiple times to obtain a plurality of second line beams or multiple The projection pattern composed of the second lattice beam.

In some embodiments, the control and processor controls the number of deflection, the deflection angle, and the deflection sequence of the beam scanner in each direction to obtain projection patterns with different densities and different field angles.

An embodiment of the present application further provides an electronic device, including: a housing, a screen, and a TOF depth measuring device; wherein the TOF depth measuring device includes: a transmitting module for transmitting a light beam toward a given area of a target object; wherein , The transmitting module includes a light source and a beam scanner, and the light beam emitted by the light source is deflected by the beam scanner to illuminate a given area of the target object; The reflected light beam; wherein, the collection module includes an image sensor composed of a pixel array; a control and processor, respectively connected with the emission module and the collection module, for controlling the beam scanning The device deflects the light beam to illuminate a given area of the target object, and activates the pixels in the corresponding area of the image sensor according to the light beam formed after the deflection, in response to the light accumulated by the light beam reflected back by the given area Charge, calculate the phase difference based on the photocharge to obtain the distance of the target object and output the depth image of the target object; It is used to emit light beams to the target object and receive the light beam reflected by the target object and form an electrical signal.

The embodiment of the application provides a TOF depth measurement device, including: a transmitting module, a collection module, and a control and processor; wherein the transmitting module is used to emit a light beam, which includes a light source and a beam scanner, and is deflected by the beam scanner The light beam emitted by the light source illuminates a given area of the target object; the acquisition module is used to collect the light beam reflected by the target object, and it includes an image sensor composed of a pixel array; the control and processor is used to control the deflection of the beam scanner The light beam illuminates a given area of the target object, and activates the pixels in the corresponding area of the image sensor according to the light beam formed after the deflection, in response to the accumulated photocharges of the light beam reflected by the given area, The phase difference is calculated based on the photocharge to obtain the distance of the target object and output a depth image of the target object. The TOF depth measurement device of the present application can improve the image signal-to-noise ratio while increasing the resolution of the image and reducing power consumption.

Description of the drawings

In order to more clearly describe the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only These are some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative labor.

Fig. 1 is a schematic structural diagram of a TOF depth measuring device according to an embodiment of the present application.

FIG. 2 is a schematic diagram of the transmitting module of the TOF depth measuring device in the embodiment of FIG. 1.

3a-3c are schematic diagrams of projection patterns according to an embodiment of the present application.

Fig. 4 is a schematic diagram of an image sensor pixel array according to an embodiment of the present application.

Fig. 5 is a flowchart of a TOF depth measurement method according to another embodiment of the present application.

Fig. 6 is a diagram of an electronic device using the TOF depth measuring device of the embodiment of Fig. 1.

Detailed ways

In order to make the technical problems, technical solutions, and beneficial effects to be solved by the embodiments of the present application clearer, the following further describes the present application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not used to limit the present application.

It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element. In addition, the connection can be used for fixing or circuit connection.

It should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top" The orientation or positional relationship indicated by "bottom", "inner", "outer", etc. are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the embodiments of the application and simplifying the description, rather than indicating or implying what is meant. The device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present application.

In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features defined with "first" and "second" may explicitly or implicitly include one or more of these features. In the description of the embodiments of the present application, "plurality" means two or more, unless otherwise specifically defined.

Referring to FIGS. 1 and 2, FIG. 1 is a schematic structural diagram of a TOF depth measuring device according to an embodiment of the application, and FIG. 2 is a schematic diagram of a transmitting module of the TOF depth measuring device. The TOF depth measurement device 10 includes a transmitting module 11, an acquisition module 12, and a control and processor 13 connected to the transmitting module 11 and the acquisition module 12, respectively. As shown in FIG. 2, the transmitting module 11 is used to emit a light beam toward a given area of the target object, and it includes a light source 101 and a beam scanner 102; wherein the light source 101 is used to emit a light beam, and the beam scanner 102 is used to receive the light emitted from the light source. The light beam is deflected and projected to the target object 20; the acquisition module includes an image sensor 121 composed of a pixel array for collecting the light beam 40 reflected by the target object 20; the control and processor 13 controls the light beam The scanner 102 deflects the light beam to illuminate a given area of the target object 20, and activates the pixels in the corresponding area of the image sensor 121 according to the deflected light beam to respond to the accumulated photocharges of the light beam reflected by the given area. The photocharge calculates the phase difference to obtain the distance of the target object 20 and output the depth image of the target object 20.

The emission module 11 also includes a light source driver (not shown in the figure), which drives the light source to emit a light beam; wherein the light source can be a light emitting diode (LED), an edge emitting laser (EEL), or a vertical cavity surface emitting laser (VCSEL) The light source can also be a light source array composed of multiple light sources, and the light beam emitted by the light source can be visible light, infrared light, ultraviolet light, etc.

The light source 101 emits a light beam, and the beam scanner 102 receives the light beam and emits the light beam to the target object 20 by rotating along a single axis or multiple axes. In some embodiments, the beam scanner 102 may be a Liquid Crystal Polarization Grating (LCPG), a Micro-Electro Mechanical System (MEMS) scanner, or the like. Optionally, the beam scanner 102 adopts a MEMS scanner. Since MEMS has a very high scanning frequency and a small volume, the transmitting module 11 can have a small volume and high performance. In some embodiments, the MEMS scanner can scan at a frequency of 1 MHz to 20 MHz, so it can provide sufficient spatial and temporal resolution. Through the configuration of the light source driver and the beam scanner 102, the light beam emitted by the light source 101 can be spatially and temporally modulated to generate a variety of patterned beams, such as regular spot patterns, line beam patterns, and line string beam patterns.

The acquisition module 12 includes a TOF image sensor 121, a lens unit, and a filter (not shown in the figure); wherein the lens unit receives and images at least part of the light beam reflected by the target object 20 on at least part of the TOF image sensor, The filter is a narrow-band filter that matches the wavelength of the light source and is used to suppress background light noise in the remaining wavelength bands. TOF image sensor can be an image sensor composed of charge coupled device (CCD), complementary metal oxide semiconductor (CMOS), avalanche diode (AD), single photon avalanche diode (SPAD), etc. The size of the array represents the resolution of the depth camera , Such as 320x240, etc. Generally, connected to the image sensor 121 also includes a readout circuit composed of one or more of a signal amplifier, a time-to-digital converter (TDC), an analog-to-digital converter (ADC) and other devices (not shown in the figure). ).

In some embodiments, the TOF image sensor includes at least one pixel, and each pixel includes two or more taps for storing and reading or discharging charge signals generated by incident photons under the control of a corresponding electrode, For example, including 2 taps, the taps are sequentially switched in a certain order within a single frame period (or within a single exposure time) to collect corresponding photons for receiving optical signals and converting them into electrical signals.

The control and processor 13 can be an independent dedicated circuit, such as a dedicated SOC chip, FPGA chip, ASIC chip, etc. composed of CPU, memory, bus, etc., or a general processing circuit, such as when the depth camera is integrated into When in a smart terminal such as a mobile phone, a TV, a computer, etc., the processing circuit in the terminal can be used as at least a part of the control and processor 13.

The control and processor 13 is used to provide the emission signal required when the light source emits laser light, and the light source emits a light beam to the target object 20 under the control of the emission signal.

In some embodiments, the control and processor 13 provides the demodulated signal (collection signal) of each tap in each pixel of the TOF image sensor, and the tap collects the reflected light beam reflected by the target object 20 under the control of the demodulated signal. electric signal. The electrical signal is related to the intensity of the reflected light beam, and the control and processor 13 processes the electrical signal and calculates the phase difference to obtain the distance of the target object 20.

In some embodiments, the transmitting module 11 includes a lens (not shown), the light source 101 generates a line beam through the lens, and the line beam is line scanned by the beam scanner 102 to illuminate the target object 20. As shown in FIG. 3a, in the embodiment of the present application, the lens is a cylindrical lens, the light source 101 generates a first line beam through the cylindrical lens, and the beam scanner 102 receives the first line beam and deflects the first line beam to form The second line beam 301, assuming that the angle at which the first line beam is deflected by the beam scanner 102 for the first time is 0 degrees, the second line beam 301 is represented by the solid line in Figure 3a; then the beam scanner 102 performs the first line beam deflection It is deflected again and has a certain deflection angle to form yet another second line beam 301 as indicated by the dashed line in FIG. 3a. It is understandable that all the second line beams are indistinguishable, and they are all the second line beams formed by the deflection of the beam scanner 102. Therefore, the projection pattern 30 composed of multiple second line beams formed after multiple deflection has a larger field of view than the first line beam without the beam scanner 102, so that a high signal-to-noise ratio and high resolution can be obtained. Image. Of course, it can be understood that the lens may also be another combined lens that can generate a line beam.

In some embodiments, the transmitting module 11 includes a lens and diffractive optical elements (DOE) (not shown). The light source 101 is collimated by the lens to emit a collimated beam, and the collimated beam is diffracted by the DOE to form a collimated beam including A string of light beams formed by a plurality of spots are connected to illuminate the target object 20. Specifically, as shown in FIG. 3b, the light source 101 is collimated by a lens to emit a collimated light beam, and the collimated light beam is then diffracted by DOE to form a first line string beam composed of multiple spots. The beam scanner 102 receives the first beam. A line string beam and the first line string beam are deflected to form a second line string beam. Assuming that the first deflection angle is 0 degrees, the formed second line string beam is the line string beam 302 represented by the solid line in FIG. 3b; Subsequently, the beam scanner 102 deflects the first line string beam again, and has a certain deflection angle, and the second line string beam is formed, that is, the line string beam 302 represented by the dashed line in FIG. 3b. It can be understood that all the line-string beams are the same, and they are all the second line-string beams formed by the deflection of the beam scanner 102. The dashed and solid lines are used to separate the beams in the figure for the convenience of description. Therefore, the projection pattern 30 composed of multiple second line string beams formed after multiple deflections has a larger field of view than the first line string beam without the beam scanner 102, thereby obtaining high signal-to-noise ratio and resolution. High image.

In some embodiments, the light source 101 is collimated by a lens to emit a collimated light beam, and the collimated light beam is then diffracted by DOE to form a lattice pattern composed of multiple spots to illuminate the target object 20. As shown in Fig. 3c, the light source 101 is collimated by the lens to emit a collimated beam, and the collimated beam is diffracted by the DOE to form a first lattice beam. The beam scanner 102 receives the first lattice beam and the first lattice beam. Perform deflection to form a second lattice beam. Assuming that the first deflection angle is 0 degrees, the formed lattice beam is the second lattice beam formed by the solid circle 303 in Figure 3c; then the beam scanner 102 targets the first point The array beam is deflected again, and has a certain deflection angle, and the formed lattice beam is the second lattice beam formed by the dashed circle 303 in FIG. 3c. It can be understood that all the lattice beams are indistinguishable, and they are all the second lattice beams formed by the deflection of the beam scanner 102. Therefore, the projection pattern 30 composed of multiple second lattice beams formed after multiple deflection has a higher density and a larger field of view than the first lattice beam without the beam scanner 102, thereby obtaining information. An image with a high noise ratio and high resolution. It can be understood that the second lattice beams can be arranged in one dimension or two dimensions, and can be regular or irregular. Optionally, regular arrangements are used to make the depth value distribution more regular.

As shown in Figures 3a-3c, the above-mentioned light source can be a single light source or multiple light sources. If it is a multiple light source, multiple first beams can be formed at one time, and the multiple first beams are deflected by the beam scanner 102 to form multiple light sources. A second light beam, so that the scanning angle is small, and the scanning speed is fast, so that the measurement accuracy can be improved. It is understandable that, according to the needs of the actual use scene, the number of deflection, deflection angle, and deflection sequence of each direction of the beam scanner 102 can be controlled to achieve projections with different densities and different angles of view to obtain high signal-to-noise ratio and resolution. High rate images.

According to the projection pattern 30 projected by the emission module 11 to the target object 20 according to the above-mentioned schemes in Figs. 3a-3c, the second line beam 301 formed by the first line beam in Fig. 3a deflected by the beam scanner 102 is controlled and processed below. , The pixels in the corresponding area of the image sensor 121 are activated in a time-sharing manner for specific description.

The light source 101 generates a first line beam through a cylindrical lens, and the beam scanner 102 receives the first line beam and deflects the first line beam to form a plurality of second line beams 302. The control and processor 13 controls the second line beam 301 to irradiate a given area of the target object 20, and activates the pixels in the corresponding area of the image sensor 121 based on the second line beam 301, as shown in FIG. 4. Assuming that when the beam scanner 102 undergoes a deflection to form a deflected beam 301 to irradiate a given area of the target object 20, the control and processor 13 activates the pixels in the corresponding area 401 of the image sensor 121 based on the deflected beam 301 to respond to the given area The accumulated photocharges of the beam reflected by the area. It is shown in FIG. 4 that each second line beam roughly occupies 13×2=26 pixels, which can actually be of other sizes, which is not particularly limited in the embodiment of the present application.

Similarly, when the next second line beam 301 is deflected by the beam scanner 102 to irradiate another area of the target object 20, the control and processor 13 activates the pixels in another corresponding area of the image sensor 121 based on the next second line beam 301 , In order to respond to the light beam reflected by another area of the target object 20 and accumulate the photoelectric charge.

It can be understood that by activating the pixels in the corresponding area of the image sensor 121 in time sharing, the power consumption can be greatly reduced, and multiple deflection of the beam scanner 102 can illuminate multiple areas of the target object 20, so that multiple first The projection pattern formed by the two-line beam completely covers the target object. The pixels in each corresponding area of the image sensor 121 can sequentially collect the photocharges accumulated by the light beam reflected back by the target object 20, and control the processor 13 to calculate the phase difference based on the photocharges to obtain the distance of the target object 20, so as to output signal noise Depth image with high ratio and high resolution.

Based on the TOF depth measurement device in the foregoing embodiments, another embodiment of the present application also provides a TOF depth measurement method. Refer to Figure 5, which shows the flow of a TOF depth measurement method. The measurement method includes the following steps:

S501: Transmit a light beam toward a given area of the target object through a transmitting module; wherein the transmitting module includes a light source and a beam scanner, and the light beam emitted by the light source is deflected by the beam scanner to illuminate the given area of the target object;

Specifically, the transmitting module further includes a lens. In the embodiment of the present application, the lens is a cylindrical lens. The light beam emitted by the light source passes through the cylindrical lens to form a first line beam, and the first line beam is formed after multiple deflection by the beam scanner. A projection pattern composed of multiple second-line light speeds, and the projection pattern has a larger field of view than the first-line beam.

In some embodiments, the transmitting module further includes a collimating lens and a diffractive optical element. The light beam emitted by the light source is collimated by the lens and then emits a collimated beam. The collimated beam is diffracted by the DOE to form a first string beam or a first point. The first linear beam or the first lattice beam is deflected by the beam scanner for multiple times to form a projection pattern composed of multiple second linear beams or multiple second lattice beams, and the projection pattern is larger than the first The line string beams or the first lattice beams have higher density and/or larger field of view, and the second lattice beams are arranged regularly.

S502. Collect the light beam reflected by the target object through the collection module; wherein the collection module includes an image sensor composed of a pixel array;

In some embodiments, the pixels in each corresponding area of the image sensor can sequentially collect the light charges accumulated by the light beam reflected by the target object.

S503. The control and processor activates the pixels in the corresponding area of the image sensor according to the light beam formed after the deflection to respond to the photocharge accumulated by the reflected light beam, and calculates the phase difference based on the photocharge to obtain the distance of the target object.

Specifically, the control and processor activates the image sensor composed of the pixel array by time sharing to collect the photocharges accumulated by the light beam reflected back by the given area, and calculates the phase difference based on the photocharges collected by the pixels to obtain the target object Distance, and output the depth image of the target object. In the embodiment of the present application, since the projection pattern formed by multiple deflected beams completely covers the target object, a depth image with high signal-to-noise ratio and high resolution can be output.

As another embodiment of the present application, an electronic device is also provided. The electronic device may be a desktop, a desktop-mounted device, a portable device, a wearable device or a vehicle-mounted device, a robot, and the like. Specifically, the device may be a notebook computer or an electronic device to allow gesture recognition or biometric recognition. In other examples, the device may be a head-mounted device to identify objects or hazards in the user's surrounding environment to ensure safety. For example, a virtual reality system that obstructs the user's vision of the environment can detect objects or hazards in the surrounding environment. To provide users with warnings about nearby objects or obstacles. In other examples, it may be a mixed reality system that mixes virtual information and images with the user's surrounding environment, and can detect objects or people in the user's environment to integrate the virtual information with the physical environment and objects. In other examples, it may also be a device used in fields such as unmanned driving. Referring to FIG. 6, taking a mobile phone as an example for description, the electronic device 600 includes a housing 61, a screen 62, and the TOF depth measuring device described in the foregoing embodiment; wherein, the transmitting module of the TOF depth measuring device 11 and the collection module 12 are arranged on the same surface of the electronic device 600, and are used to emit a light beam to the target object and receive the light beam reflected by the target object and form an electrical signal.

The embodiments of the present application also provide a storage medium for storing a computer program, which at least executes the method described in any of the foregoing embodiments when the computer program is executed.

The storage medium may be implemented by any type of volatile or non-volatile storage device, or a combination thereof. Among them, the non-volatile memory can be read-only memory (ROM, Read Only Memory), programmable read-only memory (PROM, Programmable Read-Only Memory), and erasable programmable read-only memory (EPROM, Erasable Programmable Read-Only). Memory), Electrically Erasable Programmable Read-Only Memory (EEPROM, Electrically Erasable Programmable Read-Only Memory), Magnetic Random Access Memory (FRAM, Ferromagnetic Random Access Memory), Flash Memory (Flash Memory), Magnetic Surface Memory, Optical Disks, Or CD-ROM (Compact Disc Read-Only Memory); magnetic surface memory can be disk storage or tape storage. The volatile memory may be a random access memory (RAM, Random Access Memory), which is used as an external cache. By way of exemplary but not restrictive description, many forms of RAM are available, such as static random access memory (SRAM, Static Random Access Memory), synchronous static random access memory (SSRAM, Synchronous Static Random Access Memory), and dynamic random access memory. (DRAM, Dynamic Random Access Memory), Synchronous Dynamic Random Access Memory (SDRAM, Synchronous Dynamic Random Access Memory), Double Data Rate Synchronous Dynamic Random Access Memory (DDRSDRAM, Double Data Rate Synchronous Dynamic Access Memory), Enhanced Synchronous Dynamic Random Access Memory Access memory (ESDRAM, Enhanced Synchronous Dynamic Random Access Memory), synchronous connection dynamic random access memory (SLDRAM, SyncLink Dynamic Random Access Memory), direct memory bus random access memory (DRRAM, Direct Rambus Random Access Memory). The storage media described in the embodiments of the present application are intended to include, but are not limited to, these and any other suitable types of memory.

It is understandable that the above content is a further detailed description of the application in combination with specific/preferred implementations, and it cannot be considered that the specific implementation of the application is limited to these descriptions. For those of ordinary skill in the technical field to which this application belongs, without departing from the concept of this application, they can also make several substitutions or modifications to the described implementations, and these substitutions or modifications should be regarded as It belongs to the protection scope of this application. In the description of this specification, reference to the description of the terms "one embodiment", "some embodiments", "preferred embodiment", "examples", "specific examples", or "some examples" etc. means to incorporate the implementation The specific features, structures, materials or characteristics described by the examples or examples are included in at least one embodiment or example of the present application.

In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the described specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine the different embodiments or examples and the features of the different embodiments or examples described in this specification without mutual contradiction. Although the embodiments of the present application and its advantages have been described in detail, it should be understood that various changes, substitutions and alterations can be made herein without departing from the scope defined by the appended claims.

In addition, the scope of the present application is not intended to be limited to the specific embodiments of the processes, machines, manufacturing, material composition, means, methods, and steps described in the specification. A person of ordinary skill in the art will easily understand that the above-mentioned disclosures, processes, machines, processes, machines, processes that currently exist or will be developed later that perform substantially the same functions as the corresponding embodiments described herein or obtain substantially the same results as the embodiments described herein can be used. Manufacturing, material composition, means, method, or step. Therefore, the appended claims intend to include these processes, machines, manufacturing, material compositions, means, methods, or steps within their scope.

Claims

A TOF depth measuring device, which is characterized in that it comprises:

A transmitting module for emitting a light beam toward a given area of a target object; wherein the transmitting module includes a light source and a beam scanner, and the light beam emitted by the light source is deflected by the beam scanner to illuminate the target object Of a given area;

The collection module is used to collect the light beam reflected by the target object; wherein, the collection module includes an image sensor composed of a pixel array;

The control and processor are respectively connected with the transmitting module and the collecting module to control the beam scanner to deflect the beam to irradiate a given area of the target object, and the result is formed according to the deflection The light beam activates the pixels in the corresponding area of the image sensor to respond to the light charge accumulated by the light beam reflected by the given area, and calculate the phase difference based on the light charge to obtain the distance of the target object and output the target Depth image of the object.
The TOF depth measuring device according to claim 1, wherein the transmitting module further comprises a lens, the light source generates a line beam through the lens, and the line beam is scanned by the beam scanner To illuminate the target object.
The TOF depth measuring device according to claim 2, wherein the lens is a cylindrical lens, the light beam emitted by the light source passes through the cylindrical lens to form a first line beam, and the first line beam passes through the The beam scanner is deflected multiple times to obtain a projection pattern composed of a plurality of second line beams.
The TOF depth measuring device according to claim 2, wherein the transmitting module further comprises a collimating lens and a diffractive optical element; wherein the light beam emitted by the light source is collimated by the collimating lens and then emitted A collimated light beam, the collimated light beam is diffracted by the diffractive optical element to form a first line string beam or a first lattice beam, and the first line string beam or the first lattice beam passes through the beam scanner. After the second deflection, a projection pattern composed of multiple second line string beams or second lattice beams is obtained.
The TOF depth measuring device according to claim 4, wherein the second lattice beams are arranged regularly.
A TOF depth measurement method is characterized in that it comprises the following steps:

The emission module emits a light beam toward a given area of the target object; wherein the emission module includes a light source and a beam scanner, and the light beam emitted by the light source is deflected by the beam scanner to illuminate the target object. Fixed area

Collecting the light beam reflected by the target object through a collection module; wherein, the collection module includes an image sensor composed of a pixel array;

The control and processor activates the pixels in the corresponding area of the image sensor according to the deflected light beam to respond to the photocharge accumulated by the reflected light beam, and calculates the phase difference based on the photocharge to obtain the The distance of the target object.
The TOF depth measurement method according to claim 6, wherein the transmitting module further comprises a cylindrical lens, the light beam emitted by the light source passes through the cylindrical lens to form a first line beam, and the first line beam passes through The beam scanner is deflected multiple times to obtain a projection pattern composed of a plurality of second line beams.
7. The TOF depth measurement method according to claim 6, wherein the transmitting module further comprises a collimating lens and a diffractive optical element, and the light beam emitted by the light source is collimated by the collimating lens and then emitted. The collimated beam is diffracted by the diffractive optical element to form a first line string beam or a first lattice beam, and the first line string beam or the first lattice beam is deflected multiple times by the beam scanner A projection pattern composed of multiple second line beams or multiple second lattice beams is obtained.
The TOF depth measurement method according to claim 6, wherein the control and processor controls the number of deflection, deflection angle, and deflection sequence of the beam scanner in each direction to obtain different density and different field of view angles. Projection pattern.
An electronic device, characterized by comprising: a housing, a screen, and a TOF depth measuring device; wherein the TOF depth measuring device comprises: a transmitting module for transmitting a light beam toward a given area of a target object; wherein The emission module includes a light source and a beam scanner, and the light beam emitted by the light source is deflected by the beam scanner to illuminate a given area of the target object; The beam; wherein the acquisition module includes an image sensor composed of a pixel array; a control and processor, respectively connected with the emission module and the acquisition module, for controlling the deflection of the beam scanner The light beam illuminates a given area of the target object, and activates the pixels in the corresponding area of the image sensor according to the light beam formed after the deflection, in response to the accumulated photocharges of the light beam reflected by the given area, Calculate the phase difference based on the photoelectric charge to obtain the distance of the target object and output the depth image of the target object; the transmitting module and the collecting module are arranged on the same surface of the electronic device for emitting light beams to the target object And to receive the light beam reflected by the target object and form an electrical signal.