WO2021167452A3 - Apparatus, method and system for measuring locations on an object - Google Patents

Apparatus, method and system for measuring locations on an object Download PDF

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Publication number
WO2021167452A3
WO2021167452A3 PCT/NL2021/050104 NL2021050104W WO2021167452A3 WO 2021167452 A3 WO2021167452 A3 WO 2021167452A3 NL 2021050104 W NL2021050104 W NL 2021050104W WO 2021167452 A3 WO2021167452 A3 WO 2021167452A3
Authority
WO
WIPO (PCT)
Prior art keywords
survey
reflectors
locations
image sensor
field
Prior art date
Application number
PCT/NL2021/050104
Other languages
French (fr)
Other versions
WO2021167452A2 (en
Inventor
Arnoud Marc JONGSMA
Dennis VAN WEEREN
Mario Josephus De Bijl
Original Assignee
Fnv Ip B.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fnv Ip B.V. filed Critical Fnv Ip B.V.
Priority to JP2022547727A priority Critical patent/JP2023514141A/en
Priority to US17/800,564 priority patent/US20230088410A1/en
Priority to CN202180015845.6A priority patent/CN115151788A/en
Priority to CA3168220A priority patent/CA3168220A1/en
Priority to KR1020227032581A priority patent/KR20220140849A/en
Priority to EP21707403.8A priority patent/EP4107481A2/en
Priority to AU2021223204A priority patent/AU2021223204A1/en
Publication of WO2021167452A2 publication Critical patent/WO2021167452A2/en
Publication of WO2021167452A3 publication Critical patent/WO2021167452A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/165—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of a grating deformed by the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/02—Picture taking arrangements specially adapted for photogrammetry or photographic surveying, e.g. controlling overlapping of pictures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04—Interpretation of pictures
    • G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/002—Active optical surveying means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/02—Means for marking measuring points
    • G01C15/06—Surveyors' staffs; Movable markers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/10—Measuring distances in line of sight; Optical rangefinders using a parallactic triangle with variable angles and a base of fixed length in the observation station, e.g. in the instrument
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0008—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings of bridges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0091—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by using electromagnetic excitation or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/02—Means for marking measuring points
    • G01C15/04—Permanent marks; Boundary markers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Multimedia (AREA)
  • Electromagnetism (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Optical Distance (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)

Abstract

A system for monitoring survey reflectors arranged at a plurality of locations on an object, having: a camera, including: - one or more light sources arranged to illuminate a field in space corresponding to at least 10% of a field of view of the camera, preferably the whole field of view; - an image sensor receiving light beams from reflections of the beam by the survey reflectors and providing data; - a body with an optical entry system, the image sensor located on a first side and the light source on a second side of the body; and a processing unit processing the data. The processing unit is configured to determine locations of the survey reflectors from the image sensor data and detect movement of the survey reflectors based on a comparison of the determined locations with previously determined locations.
PCT/NL2021/050104 2020-02-21 2021-02-18 Apparatus, method and system for measuring locations on an object WO2021167452A2 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2022547727A JP2023514141A (en) 2020-02-21 2021-02-18 Apparatus, method and system for measuring position on an object
US17/800,564 US20230088410A1 (en) 2020-02-21 2021-02-18 Apparatus, method and system for measuring locations on an object
CN202180015845.6A CN115151788A (en) 2020-02-21 2021-02-18 Apparatus, method and system for measuring orientation on an object
CA3168220A CA3168220A1 (en) 2020-02-21 2021-02-18 Apparatus, method and system for measuring locations on an object
KR1020227032581A KR20220140849A (en) 2020-02-21 2021-02-18 Apparatus, method and system for measuring position on an object
EP21707403.8A EP4107481A2 (en) 2020-02-21 2021-02-18 Apparatus, method and system for measuring locations on an object
AU2021223204A AU2021223204A1 (en) 2020-02-21 2021-02-18 Apparatus, method and system for measuring locations on an object

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL2024966 2020-02-21
NL2024966A NL2024966B1 (en) 2020-02-21 2020-02-21 Apparatus and method for measuring locations on an object

Publications (2)

Publication Number Publication Date
WO2021167452A2 WO2021167452A2 (en) 2021-08-26
WO2021167452A3 true WO2021167452A3 (en) 2021-10-28

Family

ID=70155285

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/NL2021/050104 WO2021167452A2 (en) 2020-02-21 2021-02-18 Apparatus, method and system for measuring locations on an object

Country Status (9)

Country Link
US (1) US20230088410A1 (en)
EP (1) EP4107481A2 (en)
JP (1) JP2023514141A (en)
KR (1) KR20220140849A (en)
CN (1) CN115151788A (en)
AU (1) AU2021223204A1 (en)
CA (1) CA3168220A1 (en)
NL (1) NL2024966B1 (en)
WO (1) WO2021167452A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL2032374B1 (en) 2022-07-05 2024-01-19 Fnv Ip Bv Calibration method for survey instrument and system for calibrating a survey instrument
CN116734744B (en) * 2023-06-21 2024-04-05 南京细柳智能科技有限公司 Online camera displacement light measurement method and system based on infrared target
CN116953680B (en) * 2023-09-15 2023-11-24 成都中轨轨道设备有限公司 Image-based real-time ranging method and system for target object

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5541726A (en) * 1993-04-19 1996-07-30 Nec Corporation Relative azimuth measuring method and apparatus
US20080100821A1 (en) * 2006-09-29 2008-05-01 Kabushiki Kaisha Topcon Electro-optical distance measuring method, distance measuring program and distance measuring system
US20120008136A1 (en) * 2009-03-06 2012-01-12 Leica Geosystems Ag Geodesic measurement system and method for identifying a target unit having a geodesic measurement device
US20120327271A1 (en) * 2010-02-11 2012-12-27 Trimble Ab Dual transmitter tracker
US20160091639A1 (en) * 2014-09-29 2016-03-31 Trimble Jena Gmbh Reflective target for surveying instruments
US20190146089A1 (en) * 2017-11-15 2019-05-16 Faro Technologies, Inc. Retroreflector acquisition in a coordinate measuring device
WO2019143250A1 (en) * 2018-01-22 2019-07-25 Fugro N.V. Surveying instrument for and surveying method of surveying reference points
WO2019143249A1 (en) * 2018-01-22 2019-07-25 Fugro N.V. Method of and apparatus for monitoring positions on an object

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3339803B1 (en) 2016-12-22 2021-05-12 Leica Geosystems AG Coordinate measuring device with automated target detection
NL2021416B1 (en) 2018-08-01 2020-02-12 Fnv Ip Bv Receiver for Providing an Activation Signal to a Device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5541726A (en) * 1993-04-19 1996-07-30 Nec Corporation Relative azimuth measuring method and apparatus
US20080100821A1 (en) * 2006-09-29 2008-05-01 Kabushiki Kaisha Topcon Electro-optical distance measuring method, distance measuring program and distance measuring system
US20120008136A1 (en) * 2009-03-06 2012-01-12 Leica Geosystems Ag Geodesic measurement system and method for identifying a target unit having a geodesic measurement device
US20120327271A1 (en) * 2010-02-11 2012-12-27 Trimble Ab Dual transmitter tracker
US20160091639A1 (en) * 2014-09-29 2016-03-31 Trimble Jena Gmbh Reflective target for surveying instruments
US20190146089A1 (en) * 2017-11-15 2019-05-16 Faro Technologies, Inc. Retroreflector acquisition in a coordinate measuring device
WO2019143250A1 (en) * 2018-01-22 2019-07-25 Fugro N.V. Surveying instrument for and surveying method of surveying reference points
WO2019143249A1 (en) * 2018-01-22 2019-07-25 Fugro N.V. Method of and apparatus for monitoring positions on an object

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
TURYSHEV SLAVA G. ET AL: "Corner-cube retro-reflector instrument for advanced lunar laser ranging", EXPERIMENTAL ASTRONOMY, vol. 36, no. 1-2, 14 December 2012 (2012-12-14), NL, pages 105 - 135, XP055831893, ISSN: 0922-6435, Retrieved from the Internet <URL:https://link.springer.com/content/pdf/10.1007/s10686-012-9324-z.pdf> [retrieved on 20210813], DOI: 10.1007/s10686-012-9324-z *

Also Published As

Publication number Publication date
KR20220140849A (en) 2022-10-18
EP4107481A2 (en) 2022-12-28
JP2023514141A (en) 2023-04-05
CN115151788A (en) 2022-10-04
US20230088410A1 (en) 2023-03-23
AU2021223204A1 (en) 2022-09-01
WO2021167452A2 (en) 2021-08-26
NL2024966B1 (en) 2021-10-06
CA3168220A1 (en) 2021-08-26

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