WO2021160433A1 - Procédé de calibration d'un dispositif optoélectronique - Google Patents
Procédé de calibration d'un dispositif optoélectronique Download PDFInfo
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- WO2021160433A1 WO2021160433A1 PCT/EP2021/051865 EP2021051865W WO2021160433A1 WO 2021160433 A1 WO2021160433 A1 WO 2021160433A1 EP 2021051865 W EP2021051865 W EP 2021051865W WO 2021160433 A1 WO2021160433 A1 WO 2021160433A1
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- temperature
- bolometers
- dynamic range
- optoelectronic device
- bolometer
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- 230000005693 optoelectronics Effects 0.000 title claims abstract description 62
- 238000000034 method Methods 0.000 title claims abstract description 52
- 239000011159 matrix material Substances 0.000 claims abstract description 31
- 238000012795 verification Methods 0.000 claims abstract description 21
- 230000003287 optical effect Effects 0.000 claims abstract description 10
- 238000012937 correction Methods 0.000 claims description 21
- 238000011156 evaluation Methods 0.000 claims description 9
- 238000005259 measurement Methods 0.000 claims description 9
- 230000006641 stabilisation Effects 0.000 claims description 8
- 238000011105 stabilization Methods 0.000 claims description 8
- 238000012935 Averaging Methods 0.000 claims description 4
- 238000004590 computer program Methods 0.000 claims description 3
- 230000001747 exhibiting effect Effects 0.000 claims description 3
- 238000012986 modification Methods 0.000 claims description 2
- 230000004048 modification Effects 0.000 claims description 2
- 230000007613 environmental effect Effects 0.000 claims 1
- 230000008569 process Effects 0.000 description 8
- 230000006870 function Effects 0.000 description 7
- 230000005855 radiation Effects 0.000 description 5
- 230000004044 response Effects 0.000 description 5
- 238000012360 testing method Methods 0.000 description 4
- 230000006399 behavior Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
- 238000003331 infrared imaging Methods 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
- 238000010200 validation analysis Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
Definitions
- the present invention relates to the field of optical sensors, in particular optoelectronic sensors in the field of thermal infrared imaging. It finds a particularly advantageous application in the field of calibration of this type of optoelectronic devices.
- Infrared imaging is experiencing significant growth thanks to advances in microelectronics. The ability to make more sensitive and smaller sensors has enabled this boom.
- thermal infrared imaging it is crucial to have a calibrated correspondence table between the intensity of the radiation perceived by the sensor and the temperature of the imaged body.
- One of the main problems with these devices consists of a thermal drift of optoelectronic sensors of the bolometer type for example, mainly with sensors designed based on amorphous silicon. This drift implies that the sensors be calibrated regularly.
- This calibration is therefore generally done cyclically with what is called a reference element.
- a temperature cover known under the name of “shutter” for alternator in English
- An object of the present invention is therefore to propose a solution at least to some of these problems.
- the present invention relates to a method for calibrating an optoelectronic device comprising an optical input and being placed in a climatic chamber at an ambient temperature T0, the optoelectronic device comprising at least one matrix of bolometers, preferably microbolometers, configured to measure at at least one temperature and at least one read circuit comprising an analog output capable of providing a plurality of raw analog signals intended to form a thermal image, each raw analog signal corresponding to a bolometer and each raw analog signal being a function of an observed scene by said optoelectronic device, the analog output of the read circuit being connected to an analog signal to digital signal converter having a predetermined dynamic range, said method comprising at least the following two successive phases: a.
- a calibration phase comprising at least the following successive steps: i. Modify the temperature inside the climatic chamber to reach a first temperature T1 different from T0, preferably less than T0; ii. Wait for a stabilization time Tps_stab until the temperature of the bolometer matrix is constant, preferably equal to T1; iii. Adjust the bias voltage of each bolometer so that the value of each raw analog signal is within a preselected range of the dynamic range, preferably the selected range corresponds to the middle range of the dynamic range; iv. Record the adjusted bias voltage of each bolometer; v.
- the present invention makes it possible to calibrate, preferably once, and advantageously in the factory, an optoelectronic device. It relates to a calibration method that it is not necessary to reproduce in the field during use of the optoelectronic device.
- the present invention makes it possible to determine the operating parameters and to test them in the same method comprising a stepped rise in temperature and a linear fall in temperature.
- the staircase climb provides the time necessary to make the necessary adjustments and data recordings for several temperatures, then the linear descent allows the calibration of the optoelectronic device to be tested in a dynamic thermal environment.
- the method comprises a calibration phase by temperature steps, therefore a so-called static calibration phase, and a so-called dynamic verification phase by a change in temperature.
- the method comprises a discrete calibration phase and a continuous verification phase.
- the present invention makes it possible to calibrate the optoelectronic device according to its future use by positioning the range relative to the dynamic range of the converter so as to prefer either applications in cold, hot or ambient temperatures.
- the present invention makes it possible to create tables of operating and behavior parameters for each bolometer.
- the present invention eliminates the need for a cover or shutter and a calibration process that needs to be repeated regularly.
- the optoelectronic device can therefore be used continuously in the field without interrupting recalibration, and without the optoelectronic device having to be maintained at a determined temperature.
- the present invention also relates to a computer program product comprising instructions, which when they are carried out by at least one processor, executes at least the method according to the present invention.
- said processor is configured to control a climatic chamber in which an optoelectronic device is arranged and to control said optoelectronic device.
- FIG. 1 schematically represents certain steps of the method according to an embodiment of the present invention.
- FIG. 2 schematically represents an array of bolometers according to an embodiment of the present invention.
- FIG. 3 schematically an optoelectronic device arranged in a climatic chamber according to an embodiment of the present invention.
- FIG. 4 represents the change in the temperature of the bolometer matrix during the method according to one embodiment of the present invention.
- Figure 5 illustrates the schematic positioning of an optoelectronic device in front of a black body.
- the preselected range includes the middle of the dynamic range, preferably is centered on the middle of the dynamic range, advantageously has an extension of less than 20% on either side of the center of the dynamic range.
- the preselected range comprises the level of 25% of the dynamic range, preferably is centered on the level of 25% of the dynamic range, advantageously presents an extension of less than 20% on either side of the level of 25% of dynamic range.
- the preselected range comprises the level of 75% of the dynamic range, preferably is centered on the level of 75% of the dynamic range, advantageously presents an extension of less than 20% on either side of the level of 75% of dynamic range.
- the step of recording the correction electric voltage values is performed after a step of averaging a predetermined number of thermal images at the same temperature.
- the evaluation of the operating criterion of the optoelectronic device comprises the evaluation of the fixed spatial noise and / or the average thermal value of at least one image.
- the matrix of bolometers has an arrangement of bolometers in rows and columns, and the acquisition by the read circuit of the raw analog signals is carried out row by row.
- the ratio between the stabilization time Tps_stab and the temperature modification time is greater than 1, preferably than 5 and advantageously over 10.
- the step of linear temperature drop from Tf to T0 has a director coefficient less than or equal to 2 ° C / minute, preferably at 1 ° C / minute and advantageously at 0.5 ° C / minute.
- the method comprises an additional phase in which the optoelectronic device is arranged so that the optical input faces a black body, the additional phase comprising at least the following successive steps: a. Acquisition of a first plurality of images when the black body has a temperature T3 lower than T0; b. Acquisition of a second plurality of images when the black body has a temperature T4 greater than T0. vs. Determination of bolometers with measurement error.
- temperature of an element is understood to mean the temperature that the element gives off in radiative form, that is to say in the form of an electromagnetic flux whose wavelength or wavelengths lie within the range. infrared range.
- a stabilized temperature is meant a temperature whose fluctuations are less than 1 ° C, preferably 0.01 ° C, and advantageously 0.001 ° C.
- a dynamic range of a converter of analog signals to digital signals extends over several values, for example from 0 to 100.
- middle, center, point of the 50% of the dynamic range is then understood, the value 50 for example.
- the 75% of the dynamic range will be interpreted as the value 75, finally it is the same with the point of the 25% of the dynamic range which therefore corresponds to the value 25. All this in the case where the dynamic range extends for example from 0 to 100.
- the present invention relates to a method for calibrating an optoelectronic device.
- This optoelectronic device comprises an optical input intended to receive an electromagnetic flux, preferably in the field of thermal infrared.
- the present invention relates to a method for calibrating an optoelectronic thermal vision device intended to visualize the infrared radiation of a scene, and preferably to be able to evaluate the temperature of the elements present in said scene.
- the optoelectronic device comprises at least one matrix of infrared detectors, preferably bolometers and advantageously microbolometers.
- bolometer denotes both bolometers and microbolometers.
- the bolometers of the bolometer array are based on amorphous silicon. This allows the relative gain between each bolometer to remain the same, regardless of the temperature of the bolometer matrix as long as the parameters relating to the gain remain constant, that is to say as long as, for example, the integration time, or the electronic gain, etc ... remain constant. This also allows the behavior of bolometers as a function of temperature to be perfectly reproducible under identical measurement conditions.
- these bolometers are arranged in rows and columns thus forming a matrix of bolometers.
- This bolometer matrix is electrically connected to a read circuit.
- This read circuit is configured to collect the raw analog signals from each bolometer. This is because each bolometer is configured to generate a raw analog signal based on the thermal radiation it receives.
- the read circuit collects the analog signals from the array of bolometers row by row, preferably from one end of the array to its opposite end.
- the read circuit comprises an analog output capable of supplying a plurality of raw analog signals, that is to say the raw analog signals collected line by line.
- this analog output is electrically connected to an analog signal to digital signal converter.
- This converter includes at least one dynamic range, generally expressed in bits. This converter also allows the generation of a thermal image of the scene observed by the optoelectronic device.
- the prior art suffers from thermal drifts requiring a regular calibration phase to recalibrate the operating parameters of each bolometer, this can also include the bias voltages applied to each bolometer of the matrix, the electrical correction voltages to be considered, etc. Indeed, depending on the more or less significant thermal drift, it is important to be able to adjusting various operating parameters of the bolometers to maintain a raw analog signal consistent with the intensity of the thermal radiation flux received.
- the prior art thus proposes to use a cache whose temperature is known in order to expose the bolometer matrix to this cache, then to adjust the operating parameters until a thermal image is obtained that is consistent with the temperature of the cache placed. in front of the matrix. This causes the stop of the use of the device in its basic function, that is to say the observation of a scene.
- the present invention provides an innovative solution that does not require the use of a cache and therefore the end of the use of the optoelectronic device. This shutdown can be disastrous in the case of the use of this technology in a military field, for example.
- the present invention proposes a method for calibrating, preferably in the factory, the optoelectronic device. With this calibration, the use of a cache, also called shutter or shutter, is no longer useful.
- FIG. 1 illustrates, according to one embodiment, the various steps of this method.
- This method advantageously comprises at least two phases, a so-called calibration phase 100 and a so-called verification phase 200.
- the objective of the calibration phase 100 is to adjust and determine operating parameters so that the temperature estimated by a bolometer 12 is consistent with the temperature of the observed scene.
- this calibration phase 100 allows the adjustment and recording of the bias voltage values to be applied to each bolometer 12 so that each raw analog signal is in the middle range of the dynamic range of the converter.
- the term “median range” is understood here to mean a range comprising the middle of the dynamic range over an extent of plus or minus 20%, and preferably being centered on the middle of the dynamic range.
- this calibration phase 100 makes it possible to determine and record the correction electrical voltage of each bolometer 12; this correction electrical voltage is a DC voltage, depending on the temperature of the observed scene; this correction electric voltage, also called “Offset” in English, is distributed randomly over the matrix 11 of bolometers 12 and is found to be superimposed on each raw analog signal of each bolometer 12. This correction electric voltage therefore applies an offset in voltage to the raw analog signal which should be evaluated in order to take it into account to correct the raw analog signal. This correction is intended to consider this offset in the processing of raw analog signals.
- the verification phase 200 is carried out.
- the objective of this verification phase 200 is to check, to verify that the temperature evaluated by each bolometer 12 is in agreement with the temperature of the climatic chamber 20, and therefore with the temperature of the observed scene.
- This method is advantageously carried out once the optoelectronic device 10 is placed facing a black body 40 in a climatic chamber 20 at a temperature T0, preferably corresponding to the ambient temperature, for example 20 ° C.
- This climatic chamber 20 is configured so that the temperature in the climatic chamber 20 is uniform, stable and controllable. The principle is based on the principle of varying the temperature in the climatic chamber 20 and adjusting and then recording the behavior of the bolometers 12 so as to be able to correlate their optoelectronic response to the temperature of the observed scene generated by the black body 40.
- Tps_stab Wait 102 for a stabilization time Tps_stab until the temperature of the array 11 of bolometers 12 is constant, preferably, but not limited to, or equal to T1; it will be noted that, according to one embodiment, the reading of the matrix 11 of bolometer 12 can generate heat; the temperature of the matrix 11 then equilibrates at a temperature substantially higher than T1; advantageously, but not limited to, Tps_stab is less than 2 hours, preferably 1 hour and advantageously 30 minutes; it will be noted that Tps_stab is dependent on the size of the optoelectronic device and its mechanical construction. vs.
- the range is a mid range, including the midpoint of the dynamic range, preferably centered on the middle of the dynamic range, advantageously with an extension of less than 20% on either side of the center of the dynamic range; This makes it possible to keep the full dynamic of each bolometer 12 in order to reduce, or even not suffer from saturation, and this for both low and high temperatures;
- the range is a range comprising 25% of the dynamic range, preferably centered on the 25% of the range dynamic, advantageously with an extension of less than 20% on either side of the 25% of the dynamic range; This makes it possible to maintain the full dynamic of each bolometer 12 in the direction of the highs temperatures for applications in which the observed temperatures are relatively high;
- the range is a range comprising 75% of the dynamic range, preferably centered on the 75% of the dynamic range, advantageously with an extension less than 20% on either side of
- Record 104 the adjusted bias voltage of each bolometer 12; this keeps in memory the bias voltage necessary for the raw analog signals to be within the selected range of the dynamic range; e. Preferably, acquire a plurality of thermal images so as to be able to carry out an averaging of these thermal images; f. Preferably, determine, for each bolometer 12, the so-called correction electric voltage value; g. Record 105, for each bolometer, of the corresponding correction electric voltage value; according to one embodiment, at least one of steps f and g can be carried out before or at the same time as at least one of steps c and dh Modifying the temperature inside the climatic chamber to reach a second temperature T2 different from T0 and from T1, preferably higher than T1; i. Repeat steps b to h of the calibration phase until a final temperature Tf greater than the initial temperature T0.
- the climatic chamber 20 is at a temperature Tf, for example at 50 ° C.
- Tf temperature
- the polarization voltages and the correction electric voltage values for each temperature having had a thermal plateau and for each bolometer were recorded.
- This verification phase 200 consists in lowering the temperature from Tf to T1 and in measuring, preferably continuously, one or more operating parameters of the optoelectronic device 10.
- the verification phase comprises at least the following successive steps: a. Linearly lower the temperature inside the climatic chamber 20 from Tf until the temperature of the bolometer array is equal to T1; b. Measure 202 at least one operating criterion of the optoelectronic device 10, during the step 201 of linear descent of the temperature from Tf to T1, using the bias voltage values and the offset values recorded as a function of the temperature of the array 11 of bolometers; vs. If the verification phase meets the evaluation criteria, then the calibration process ends 203, otherwise the calibration phase 100 resumes 204.
- This verification phase 200 thus makes it possible to check that the parameters recorded during the calibration phase 100 are correct and allow the correct operation of the optoelectronic device 10, that is to say the correct evaluation of the temperature of the observed scene. .
- an evaluation of the fixed spatial noise is performed.
- this step seeks to detect the presence or absence of fixed spatial noise.
- a minimum, or even nonexistent, fixed spatial noise is desired.
- the fixed spatial noise or FPN in English for Fixed Pattern Noise implies the fact that all the components of the matrix are not exactly the same. Consequently there may be differences between the bolometers 12, and therefore between the pixels, each bolometer 12 representing a pixel.
- This step is therefore intended to evaluate the level of this fixed spatial noise in order to estimate whether the adjustments and corrections made lead to a reduction, or even a cancellation, of the fixed spatial noise.
- an evaluation of the average value of the image is carried out.
- This step comprises the acquisition of a plurality of images, preferably of a predetermined number of images, then an averaging of these images is carried out then the average temperature estimated by the optoelectronic device 10 is compared with the temperature of the climatic chamber 20. If there is a match, or if there is a deviation below a threshold value, the test is considered a success, otherwise it may be necessary to carry out a new calibration phase 100.
- the calibration process continues by recommencing the calibration phase 100 followed by another verification phase 200, and this until a calibration estimated to be correct.
- this calibration method can also comprise an additional phase comprising a series of successive steps in which the optoelectronic device 10 is no longer in the climatic chamber 20, but is placed on a test bench opposite to a black body 40 the temperature of which is controlled.
- This series of successive steps includes: a. Acquisition of a first image when a black body 40 has a temperature T3 lower than T0; b. Acquisition of a second image when a black body 40 has a temperature T4 greater than T0. vs. Detection of bolometers 12 exhibiting a measurement error.
- the raw analog signals from these bolometers 12 will be corrected in real time when using the optoelectronic device 10 as a function of the surrounding bolometers 12.
- the acquisition of the first image and the acquisition of the second image make it possible to calculate a relative gain between each bolometer 12 so that all, preferably almost all, the bolometers 12 give the same response whatever the temperature. of the observed scene.
- a detection of the bolometers 12, the response of which is erroneous or unsatisfactory, is carried out on all of the stored tables in order to then be used in real time in order to be able to replace them with values from the surrounding bolometers 12 that are not erroneous.
- the signals acquired during the acquisition of the first image and of the second image are used to calculate a relative gain between pixels, that is to say bolometers, so that they all give the same response whatever the temperature of the observed scene.
- FIG. 2 represents a matrix 11 of bolometers 12 comprising a plurality of bolometers 12 arranged in rows 15 and in columns 14.
- the matrix 11 of bolometer 12 can be carried by or can support the reading circuit 13.
- FIG. 3 represents a diagram of an installation configured to implement the method according to an embodiment of the present invention.
- an optoelectronic device 10 arranged in a climatic chamber 20.
- the electronic device 10 comprises an optical input 16.
- This optical input 16 is configured so that the thermal radiations of the scene generated by the black body 40 can penetrate into it.
- the optoelectronic device 10 and be picked up by the array 11 of bolometers 12 arranged in the optoelectronic device 10.
- the climatic chamber 20 is temperature controlled so as to impose a temperature on the whole of the climatic chamber 20 and everything that is there.
- the temperature inside the climatic chamber 20 can vary, for example, from -20 ° C to 60 ° C.
- the method according to the present invention is intended to be implemented by a computer system comprising at least one processor and / or a computer, and furthermore a non-transient memory comprising a computer program product comprising instructions, which when they are carried out by at least the processor and / or the computer, executes at least the method according to the present invention.
- FIG. 4 represents a temperature curve 300 of the optoelectronic device 10 during the implementation of the method according to an embodiment of the present invention.
- the starting temperature T0 corresponds to the ambient temperature.
- the first step consists in reducing the temperature from T0 to T1 which, for example, can be equal to -10 ° C.
- the directing coefficient of the temperature drop curve 310 from T0 to T1 is less than 10 ° C / minute, preferably at 5 ° C / minute and advantageously at 2.5 ° C / minute.
- the directing coefficient of the temperature drop curve 310 from T0 to T1 is configured to avoid a thermal shock which could cause either breakage or condensation.
- Tps_stab is between 10 minutes and 180 minutes and advantageously between 30 minutes and 120 minutes.
- this stabilization time is dependent on the camera 10.
- the computer system 30 performs a temperature level 320 and the method continues the following various steps: i. Adjust 103 the bias voltage of each bolometer 12; ii. Record 104 the adjusted bias voltage of each bolometer 12; iii. Preferably, acquire a plurality of thermal images; iv. Preferably, determine, for each bolometer 12, a correction electric voltage value: v. Record 105, for each bolometer 12, of the corresponding correction electric voltage value.
- the temperature of the climatic chamber 20 changes.
- the temperature of the climatic chamber changes from T1 to T2.
- the temperature T2 is preferably higher than T1.
- the directing coefficient of the temperature rise 330 from T1 to T2 is greater than 2.5 ° C./minute, preferably at 5 ° C./minute and advantageously at 10 ° C./minute.
- the different temperature levels are not large in temperature difference from each other, preferably around 5 ° C; thus, the director coefficient of the temperature rise 330 from T1 to T2 is configured so that the temperature rise 330 from T1 to T2 is as fast as possible in order to leave the maximum time for the optoelectronic device 10 to bring itself up to temperature chosen, that is to say to stabilize its temperature.
- the computer system 30 waits for the temperature of the matrix 11 of bolometers 12 to be stabilized and substantially equal to that of the climatic chamber 20, that is to say at T2, T2 therefore being the temperature of the scene. observed.
- the calibration phase 100 comprises at least 15, preferably at least 20, and advantageously at least 25 temperature stages, that is to say measurement points of the calibration elements.
- FIG. 4 also illustrates the verification phase 200 with the linear temperature drop 340 from Tf to T1.
- the director coefficient of this linear drop in temperature 340 is less than 2 ° C / min, preferably at 1 ° C / min and advantageously at 0.5 ° C / min.
- FIG. 5 illustrates the positioning of the optoelectronic device 10, for example on a test bench, facing a black body 40.
- the observed scene comprises said black body 40.
- the present invention provides an innovative and efficient solution to the thermal drift problems of optoelectronic devices intended to evaluate the temperature of an observed scene. Instead of having recourse to regular and very frequent calibration, or else to having recourse to a control of the temperature of the matrix of bolometers for example, the present invention proposes a method of calibration, preferably in the factory, and advantageously which no longer needs to be implemented outside the factory.
- This process makes it possible to quantify, record and adjust the operating parameters of each bolometer of the bolometer matrix by subjecting them to a plurality of temperatures, then to carry out a control of this calibration by a linear evaluation and not static.
- the present invention thus makes it possible to obtain an optoelectronic device calibrated for the rest of its use and thus being able to continuously observe a scene if necessary without having to stop to be recalibrated.
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Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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AU2021219267A AU2021219267A1 (en) | 2020-02-10 | 2021-01-27 | Method for calibrating an optoelectronic device |
EP21701534.6A EP4103921A1 (fr) | 2020-02-10 | 2021-01-27 | Procédé de calibration d'un dispositif optoélectronique |
CA3165712A CA3165712A1 (fr) | 2020-02-10 | 2021-01-27 | Procede de calibration d'un dispositif optoelectronique |
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FR2001265A FR3107116B1 (fr) | 2020-02-10 | 2020-02-10 | Procédé de calibration d’un dispositif optoélectronique |
FRFR2001265 | 2020-02-10 |
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WO2021160433A1 true WO2021160433A1 (fr) | 2021-08-19 |
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PCT/EP2021/051865 WO2021160433A1 (fr) | 2020-02-10 | 2021-01-27 | Procédé de calibration d'un dispositif optoélectronique |
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EP (1) | EP4103921A1 (fr) |
AU (1) | AU2021219267A1 (fr) |
CA (1) | CA3165712A1 (fr) |
FR (1) | FR3107116B1 (fr) |
WO (1) | WO2021160433A1 (fr) |
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FR3137241B1 (fr) | 2022-06-23 | 2024-06-21 | Bertin Technologies Sa | Procédés de détermination d’informations de calibration et d’élaboration d’images pour un capteur d’images, et capteur d’images |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070029484A1 (en) * | 1999-10-07 | 2007-02-08 | Infrared Solutions, Inc. | Microbolometer focal plane array with temperature compensated bias |
US8378290B1 (en) | 2008-09-02 | 2013-02-19 | Flir Systems, Inc. | Sensor calibration systems and methods for infrared cameras |
-
2020
- 2020-02-10 FR FR2001265A patent/FR3107116B1/fr active Active
-
2021
- 2021-01-27 EP EP21701534.6A patent/EP4103921A1/fr active Pending
- 2021-01-27 AU AU2021219267A patent/AU2021219267A1/en active Pending
- 2021-01-27 WO PCT/EP2021/051865 patent/WO2021160433A1/fr unknown
- 2021-01-27 CA CA3165712A patent/CA3165712A1/fr active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070029484A1 (en) * | 1999-10-07 | 2007-02-08 | Infrared Solutions, Inc. | Microbolometer focal plane array with temperature compensated bias |
US8378290B1 (en) | 2008-09-02 | 2013-02-19 | Flir Systems, Inc. | Sensor calibration systems and methods for infrared cameras |
Non-Patent Citations (2)
Title |
---|
BRADLEY M. RATLIFF ET AL: "Radiometrically accurate scene-based nonuniformity correction for array sensors", JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A, vol. 20, no. 10, 1 October 2003 (2003-10-01), pages 1890 - 4280, XP055742548, ISSN: 1084-7529, DOI: 10.1364/JOSAA.20.001890 * |
CHENGWEI LIU ET AL: "Shutterless non-uniformity correction for the long-term stability of an uncooled long-wave infrared camera", MEASUREMENT SCIENCE AND TECHNOLOGY, IOP, BRISTOL, GB, vol. 29, no. 2, 17 January 2018 (2018-01-17), pages 25402, XP020323870, ISSN: 0957-0233, [retrieved on 20180117], DOI: 10.1088/1361-6501/AA9871 * |
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Publication number | Publication date |
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CA3165712A1 (fr) | 2021-08-19 |
FR3107116A1 (fr) | 2021-08-13 |
FR3107116B1 (fr) | 2022-04-01 |
EP4103921A1 (fr) | 2022-12-21 |
AU2021219267A1 (en) | 2022-08-25 |
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