WO2021108965A1 - Encapsulation substrate integrated with inductor, and electronic device - Google Patents

Encapsulation substrate integrated with inductor, and electronic device Download PDF

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Publication number
WO2021108965A1
WO2021108965A1 PCT/CN2019/122479 CN2019122479W WO2021108965A1 WO 2021108965 A1 WO2021108965 A1 WO 2021108965A1 CN 2019122479 W CN2019122479 W CN 2019122479W WO 2021108965 A1 WO2021108965 A1 WO 2021108965A1
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WO
WIPO (PCT)
Prior art keywords
core layer
inductor
coupled
wire segment
package substrate
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Application number
PCT/CN2019/122479
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French (fr)
Chinese (zh)
Inventor
刘宁
刘铁军
路鹏
朱靖华
Original Assignee
华为技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 华为技术有限公司 filed Critical 华为技术有限公司
Priority to CN201980102514.9A priority Critical patent/CN114730740A/en
Priority to PCT/CN2019/122479 priority patent/WO2021108965A1/en
Publication of WO2021108965A1 publication Critical patent/WO2021108965A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F27/00Details of transformers or inductances, in general
    • H01F27/24Magnetic cores
    • H01F27/255Magnetic cores made from particles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices

Definitions

  • This application relates to the field of electronic technology, and in particular to a package substrate and electronic equipment integrated with an inductor.
  • the electronic product is provided with a power conversion module (voltage regulator module, VRM) for supplying power to the chip in the electronic device.
  • VRM includes a direct current (DC) to direct current circuit, that is, a DC-DC step-down circuit.
  • the DC-DC step-down circuit includes a switch tube and an inductor. By controlling the on and off states of the switch tube, the inductor can be charged and discharged, so that the voltage provided by the battery can be converted into the power supply voltage of the chip.
  • the inductor when the switching frequency of the switch tube is low, for example, tens of KHz to hundreds of KHz, the inductor needs to have a very large inductance, such as tens of ⁇ H to hundreds of nH, to reduce The ripple of the output current of the small step-down circuit.
  • the current required by the chip is gradually increasing, for example, it can be as high as 600-1000A. Due to the limited flow capacity of the power supply pins of the chip, the number of power supply pins required by the chip will increase sharply, resulting in a further increase in the area of the chip, which is not conducive to the miniaturization of electronic products.
  • the embodiments of the present application provide a package substrate and electronic device integrated with an inductor, which are used to reduce the number of chip power pins.
  • the first aspect of the present application provides a package substrate integrated with inductors.
  • the package substrate includes a core layer and an inductor.
  • the core layer has a cavity. The cavity penetrates the upper surface and the lower surface of the core layer.
  • the inductor is located in the cavity.
  • the inductor includes a magnetic core and a coil.
  • the magnetic core is filled in the cavity.
  • the coil includes at least one wire segment.
  • the at least one wire segment includes a first metal trace, and a first via hole and a second via hole penetrating the magnetic core.
  • the first metal trace is arranged on the lower surface of the core layer.
  • the first end of the first metal trace is coupled to an end of the first through hole located on the lower surface of the core layer.
  • the second end of the first metal trace is coupled to an end of the second through hole located on the lower surface of the core layer.
  • the magnetic material constituting the magnetic core of the inductor is filled in the cavity.
  • a first through hole and a second through hole are provided in the magnetic core.
  • the coil in the inductor includes a first via hole, a second via hole, and a first metal wire for coupling the first via hole and the second via hole. So as to achieve the purpose of integrating the inductor into the package substrate. In this case, when the fully integrated voltage regulation technology is used to integrate electronic components in the voltage conversion circuit other than inductors, such as switch tubes, diodes, etc., on the chip, the higher power supply voltage provided by the power supply can be directly transmitted to the chip.
  • the supply voltage is generated by stepping down the power supply voltage through the above-mentioned voltage conversion circuit. Therefore, the voltage received by the chip is relatively large and the current is relatively small.
  • the pin flow capacity of the chip is constant, the number of pins used for coupling with the package substrate in the chip can be reduced.
  • the inductor when the inductor is integrated into the package substrate, the inductor can be placed close to the power supply pin of the chip. Therefore, the power supply path through which the battery provides the power supply voltage to the chip can be reduced, the influence of parasitic resistance on the power supply path can be reduced, the current loss on the above-mentioned power supply path can be reduced, and the power supply efficiency can be improved.
  • the coil includes a first wire segment, a second wire segment, and a second metal trace. Any one of the first wire segment and the second wire segment is the same as described above, including the first via hole and the second via hole penetrating the magnetic core, and is used to connect the first via hole and the second via hole.
  • the first metal trace for coupling.
  • the second metal trace is arranged on the upper surface of the core layer. The first end of the second metal trace is coupled to an end of the second via hole of the first wire segment located on the upper surface of the core layer. The second end of the second metal trace is coupled to an end of the first via hole of the second wire segment located on the upper surface of the core layer.
  • the magnetic core has at least one side surface perpendicular to the upper surface or the lower surface of the core layer.
  • the magnetic core includes a recessed portion recessed toward the inside of the magnetic core provided on at least one side surface of the magnetic core.
  • the recess is located between two adjacent via holes. Because, relative to the magnetic field around each via hole, the magnetic field between two adjacent via holes is relatively small. Therefore, the above-mentioned recess can be made on the side surface of the magnetic core and between any two adjacent through holes, so as to reduce the magnetic material constituting the magnetic core and achieve the purpose of reducing the manufacturing cost.
  • the magnetic core has a first side surface and a second side surface.
  • the first side surface is parallel to a plane where the axes of the first and second conductive holes of the first wire segment are located.
  • the second side surface is parallel to the plane where the first via hole of the first wire segment and the first via hole of the second wire segment are located.
  • a first recessed portion is provided on the first side surface, and a second recessed portion is provided on the second side surface.
  • the area of the cross section of the first depressed portion is smaller than the area of the cross section of the second depressed portion.
  • the cross section is parallel to the upper or lower surface of the core layer.
  • the vertical projection of the first metal trace on the core layer is located within the range where the magnetic core is located. In this way, the length of the first metal trace is reduced to achieve the purpose of reducing the DC resistance of the inductor.
  • the vertical projection of the second metal trace on the core layer is located within the range where the magnetic core is located. In this way, the length of the second metal trace is reduced to achieve the purpose of reducing the DC resistance of the inductor.
  • the material constituting the magnetic core includes a soft magnetic composite material.
  • the soft magnetic composite material includes magnetic particles and a resin material.
  • the material constituting the magnetic particles includes at least one of iron-silicon-chromium alloy, carbonyl iron, or iron-based amorphous material.
  • the inductor further includes a first terminal electrode and a second terminal electrode.
  • One end of the first via hole located on the upper surface of the core layer is coupled to the first terminal electrode.
  • One end of the second via hole located on the upper surface of the core layer is coupled to the second terminal electrode.
  • the first terminal electrode of the above-mentioned inductor can be coupled with other electronic components in the voltage conversion circuit, such as a switch tube and a diode.
  • the second terminal electrode of the inductor can be used as the output terminal of the voltage conversion circuit.
  • other electronic components in the voltage conversion circuit such as switch tubes and diodes, can be coupled with the inductor integrated in the package substrate.
  • the inductor further includes a first terminal electrode and a second terminal electrode.
  • One end of the first via hole of the first wire segment located on the upper surface of the core layer is coupled to the first terminal electrode.
  • One end of the second via hole of the second wire segment located on the upper surface of the core layer is coupled to the second terminal electrode.
  • the end of the first via hole of the first wire segment located on the upper surface of the core layer is connected to the first terminal electrode.
  • the coupling enables the first end of the coil to be coupled to other electronic components in the voltage conversion circuit, such as switch tubes and diodes, through the first end electrode and the first end electrode of the inductor.
  • the other end of the coil can be used as the output terminal of the voltage conversion circuit through the second terminal electrode.
  • the packaging substrate further includes a first build-up layer.
  • the first build-up layer is located on the upper surface of the core layer; the first build-up layer includes a first interconnection structure, a second interconnection structure, a first pad and a second pad.
  • the end of the first interconnect structure close to the core layer is coupled to the end of the first via hole located on the upper surface of the core layer, and the end of the first interconnect structure away from the core layer is coupled to the first pad.
  • the disc serves as the first terminal electrode of the inductor.
  • the end of the second interconnect structure close to the core layer is coupled to the end of the second via hole located on the upper surface of the core layer, and the end of the second interconnect structure far away from the core layer is coupled to the second pad.
  • the disk serves as the second terminal electrode of the inductor.
  • the first terminal electrode of the inductor can be coupled to one end of the coil through the first interconnect structure in the first build-up layer, and the second end of the inductor can be connected through the second interconnect structure in the first build-up layer.
  • the electrode is coupled to the other end of the coil.
  • the packaging substrate further includes a second build-up layer and a third interconnection structure.
  • the second build-up layer is located on the lower surface of the core layer.
  • the second build-up layer includes a third pad on the side away from the core layer.
  • the third interconnection structure penetrates the core layer, the first build-up layer and the second build-up layer.
  • the first build-up layer further includes a fourth pad on a side away from the core layer, the first end of the third interconnect structure is coupled to the third pad, and the second end is coupled to the fourth pad.
  • the third pad serves as a power input terminal of the package substrate
  • the fourth pad serves as a power output terminal of the package substrate. In this way, the power supply voltage provided by the battery can be transmitted to the chip through the fourth pad, the third interconnection structure, and the third pad.
  • an electronic device including a chip, and at least one of the above-mentioned package substrates integrated with inductors.
  • the chip is on the package substrate.
  • the chip includes a voltage regulation module and a processing module.
  • the package substrate has power output terminals.
  • the package substrate includes an inductor.
  • the power output terminal of the package substrate is coupled with the voltage adjustment module, the voltage adjustment module is also coupled with the first terminal electrode of the inductor, and the second terminal electrode of the inductor is also coupled with the processing module.
  • the voltage regulation module and the inductor form a voltage conversion circuit, which is used to provide a supply voltage to the processing module.
  • the above-mentioned electronic device has the same technical effect as the packaging substrate provided in the foregoing embodiment, and will not be repeated here.
  • FIG. 1 is a schematic structural diagram of an electronic device provided by an embodiment of this application.
  • FIG. 2 is a schematic diagram of the structure of a package substrate and a chip coupled to the PCB shown in FIG. 1;
  • FIG. 3 is a schematic structural diagram of a voltage conversion circuit provided by an embodiment of the application.
  • FIG. 4a is a schematic structural diagram of coupling a package substrate and a chip according to an embodiment of the application
  • 4b is a schematic diagram of the connection structure of some components in the electronic equipment provided by the embodiments of the application;
  • FIG. 5 is a schematic structural diagram of a package substrate provided by an embodiment of the application.
  • FIG. 6a is a schematic diagram of a part of the structure of a core layer in a package substrate provided by an embodiment of the application;
  • FIG. 6b is a schematic diagram of the structure of the integrated inductor part in the cavity of the core layer shown in FIG. 6a;
  • FIG. 7a is a schematic structural diagram of an inductor provided by an embodiment of this application.
  • FIG. 7b is a schematic diagram of the structure of integrating the inductor shown in FIG. 7a with the package substrate;
  • Figure 7c is a cross-sectional view taken along the dashed line O-O in Figure 7a;
  • FIG. 8 is a schematic diagram of another structure of coupling a package substrate and a chip according to an embodiment of the application.
  • FIG. 9a is a schematic structural diagram of another inductor provided by an embodiment of the application.
  • FIG. 9b is a schematic structural diagram of another inductor provided by an embodiment of the application.
  • Figure 10 is a plan view taken along the direction C shown in Figure 9a;
  • FIG. 11 is an electric field distribution diagram of an inductor provided by an embodiment of the application.
  • FIG. 12 is a schematic structural diagram of an inductive magnetic core provided by an embodiment of the application.
  • FIG. 13 is a schematic structural diagram of another inductive magnetic core provided by an embodiment of the application.
  • FIG. 14 is a schematic structural diagram of another inductor provided by an embodiment of the application.
  • first”, “second”, etc. are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Thus, the features defined with “first”, “second”, etc. may explicitly or implicitly include one or more of these features.
  • connection should be understood in a broad sense.
  • “connected” can be a fixed connection, a detachable connection, or a whole; it can be a direct connection, or Can be indirectly connected through an intermediary.
  • the term “coupling” can be a way of electrical connection for signal transmission, and “coupling” can be a direct electrical connection or an indirect electrical connection through an intermediate medium.
  • the embodiments of the present application provide an electronic device.
  • the electronic device includes, for example, a mobile phone, a tablet computer, a vehicle-mounted computer, and a smart wearable product.
  • the embodiments of the present application do not impose special restrictions on the specific form of the above-mentioned electronic device.
  • the following description takes the electronic device as a mobile phone as an example.
  • the electronic device 01 includes a display module 10, a middle frame 11 and a casing 12.
  • the display module 10 is used for displaying images.
  • the display module 10 includes a liquid crystal display (LCD) module and a backlight unit (BLU).
  • the display module 10 may be an organic light emitting diode (OLED) display screen.
  • LCD liquid crystal display
  • BLU backlight unit
  • OLED organic light emitting diode
  • the middle frame 11 is located between the display module 10 and the casing 12, and the side of the middle frame 11 facing the display module 10 is used to carry the display module 10.
  • the aforementioned electronic device 01 also includes a printed circuit board (PCB).
  • the side surface of the middle frame 11 facing the housing 12 is used to carry electronic devices such as PCB, camera, and battery. Among them, the camera and battery are not shown in the figure.
  • the housing 12 is connected with the middle frame 11 to form a accommodating cavity for accommodating the above-mentioned PCB, camera, battery and other electronic devices. Therefore, it is possible to prevent external water vapor and dust from intruding into the accommodating cavity and affecting the performance of the above-mentioned electronic device.
  • the above-mentioned electronic device 01 further includes a packaging substrate 100 and a chip 101 as shown in FIG. 2.
  • the chip 101 is flip-chip mounted on the package substrate 100 through a plurality of pins 111, such as micro bumps or Cu-pillars.
  • the bottom of the package substrate 100 may be coupled to the aforementioned PCB through a ball grid array (BGA). In this way, the chip 101 can realize signal transmission through the packaging substrate 100 and the PCB.
  • BGA ball grid array
  • the above is an example of flip-chip mounting the chip 101 above the packaging substrate 100 to illustrate the manner in which the chip 101 and the packaging substrate 100 are coupled.
  • the aforementioned chip 101 may also be coupled to the package substrate 100 through a wire bonding process.
  • the aforementioned chip 101 may be a system-on-chip (SoC), a central processing unit (CPU), a graphics processing unit (GPU), or a power supply.
  • SoC system-on-chip
  • CPU central processing unit
  • GPU graphics processing unit
  • PMIC power management integrated circuits
  • the electronic device 01 may include a voltage conversion circuit 102 as shown in FIG. 3.
  • the voltage conversion circuit 102 includes an inductor 20, a switch Q, a diode D, and a capacitor Co.
  • the inductor 20 has the functions of energy storage and filtering.
  • the switch Q can be a transistor.
  • the first pole of the switch Q such as the source (source, s) is coupled to the input terminal Ui of the voltage conversion circuit 102, and the input terminal Ui of the voltage conversion circuit 102 may be coupled to a power source, such as the positive electrode of a battery, Used to receive power, such as a power supply voltage (for example, 1.8V) provided by a battery.
  • the second electrode of the switch Q such as the drain (drain, d) is coupled to the first end of the inductor 20 (ie, the first end electrode 15 as shown in FIG. 4a).
  • the second terminal of the inductor 20 ie, the second terminal electrode 16 as shown in FIG. 4a
  • the gate (gate, g) of the switching tube Q is used to receive a control signal, which can control the switching tube Q to be turned on and off.
  • the cathode (cathode, c) of the diode D is coupled to the first end of the inductor 20, and the anode (anode, a) is coupled to the power source, such as the negative electrode of the aforementioned battery.
  • the first terminal of the capacitor Co is coupled to the output terminal Uo of the voltage conversion circuit 102, and the second terminal is coupled to the power source, such as the negative electrode of the aforementioned battery.
  • FIG. 3 is an example in which the voltage conversion circuit 102 includes an inductor 20.
  • the aforementioned voltage conversion circuit 102 may include at least two inductors 20.
  • the switching frequency of the switch tube Q can be increased, for example, to about 100 MHz, so as to reduce the size of the inductor 20.
  • the switching frequency of the switch tube Q can be increased, for example, to about 100 MHz, so as to reduce the size of the inductor 20.
  • only a few nH of the inductor 20 in the voltage conversion circuit 102 can output a current with a small ripple.
  • the size of the inductor 20 can be reduced to less than 1 square millimeter.
  • the inductor 20 may be integrated in a packaging substrate 100, which is a packaging substrate integrated with the inductor 20.
  • a fully integrated voltage regulator (FIVR) technology can be used, and a voltage regulator module 120 as shown in FIG. 4a is provided inside the chip 101.
  • the switch tube Q and the diode D in the voltage conversion circuit 102 can be integrated in the voltage adjustment module 120.
  • the aforementioned chip 101 also includes a processing module 121 for realizing the main functions of the chip 101.
  • the package substrate 100 has a power input terminal 13 and a power output terminal 14.
  • the power input terminal 13 can be coupled to the PCB shown in FIG. 2 through the pin VDD formed by using solder balls, so that the power supply voltage (for example, 1.8V) provided by the battery can be received through the PCB.
  • the above-mentioned power supply voltage (for example, 1.8V) is transmitted to the voltage regulation module 120 after passing through the power input terminal 13 of the package substrate 100 and the pin Vdd (which can be formed by using solder pads or copper pillars) coupled with the power output terminal 14 Inside.
  • the voltage conversion circuit 102 composed of the voltage adjustment module 120 and the inductor 20 can perform voltage conversion on the above-mentioned power supply voltage (for example, 1.8V) , For example, a step-down process to reduce the power supply voltage (for example, 1.8V) to the power supply voltage of the chip 101 (for example, 0.9V).
  • the second terminal electrode 16 of the inductor 20 is coupled to the processing module 121 in the chip 101 through the power pin Ot (the pins 111 of the chip 101 used to provide the power supply voltage to the chip 101) Therefore, when the processing module 121 receives the power supply voltage (for example, 0.9V) provided by the power pin Ot, the processing module 121 of the chip 101 can start to work and perform the main functions of the chip 101.
  • the power supply voltage for example, 0.9V
  • the processing module 121 of the chip 101 when the above-mentioned chip 101 is the above-mentioned SoC, CPU or CPU, as shown in FIG. 4b, when the processing module 121 of the chip 101 starts to work, the processing module 121 can pass data
  • the data bus provides information to the remaining components in the electronic device 01, such as radio frequency module, memory, hard disk, camera and imaging processing module, input/output (I/O) interface, human-computer interaction device (human interactive device), etc. provide data.
  • the processing module 121 of the chip 101 when the above-mentioned chip 101 is the above-mentioned PMIC, as shown in FIG. 4b, when the processing module 121 of the chip 101 starts to work, the processing module 121 can pass through the power bus ( The power supply bus) or power supply network provides power supply voltage to the remaining components in the electronic device 01, such as the above-mentioned radio frequency transceiver, memory, hard disk, camera and image processor, input/output interface, and human-computer interaction equipment.
  • the power supply bus The power supply bus
  • power supply network provides power supply voltage to the remaining components in the electronic device 01, such as the above-mentioned radio frequency transceiver, memory, hard disk, camera and image processor, input/output interface, and human-computer interaction equipment.
  • the voltage provided by the package substrate 100 to the voltage regulation module 120 of the chip 101 through the pin Vdd is the power supply voltage (for example, 1.8V).
  • the power supply voltage for example, 1.8V.
  • the power supply voltage (for example, 1.8V) needs to be stepped down by the external voltage conversion circuit before the generated power supply voltage (for example, 0.9V) is provided to the chip 101 through the pin Vdd.
  • the voltage received by the chip 101 is reduced by half compared with the present application, so the current is doubled (for example, 100A), and the number of pins Vdd is also doubled (for example, 100).
  • the chip 101 has fewer pins Vdd (for example, 50), so the area of the chip 101 can be effectively reduced, which is beneficial to reducing the size of the electronic device 01.
  • the inductor 20 when the inductor 20 is integrated in the package substrate 100, the inductor 20 can be disposed at a position close to the power pin Ot of the chip 101. Therefore, after the voltage conversion circuit 102 steps down the power supply voltage (for example, 1.8V) to the power supply voltage (for example, 0.9V), the second terminal electrode 16 of the inductor 20 can transmit the power supply voltage (for example, 0.9V) to the above-mentioned inductor. 20 is a very close power pin Ot, so as to supply power to the processing module 121 of the chip 101.
  • the power supply path of the power supply voltage (for example, 0.9V) provided by the battery to the chip 101 can be reduced, thereby reducing the influence of the parasitic resistance on the power supply path, the current loss on the power supply path, and the power supply efficiency.
  • the power supply voltage for example, 0.9V
  • the structure of the package substrate 100 integrated with the inductor 20 will be described in detail below.
  • the aforementioned packaging substrate 100 may include a core 30, a first build-up 31, and a second build-up 32 as shown in FIG. 5.
  • the material constituting the core layer 30 may be a resin material.
  • the thickness of the core layer 30 is relatively large, so as to provide sufficient strength for the package substrate 100.
  • the above-mentioned core layer 30 has an upper surface A and a lower surface B. The upper surface A is close to the chip 101 shown in FIG. 2, and the lower surface B is close to the PCB shown in FIG. 2.
  • first build-up layer 31 is located on the upper surface A of the core layer 30, and the second build-up layer 32 is located on the lower surface B of the core layer 30.
  • first build-up layer 31 and the second build-up layer 32 may include a multilayer metal wiring 301 and an insulating layer 302 located between two adjacent layers of the metal wiring 301.
  • a plating through hole (PTH) can be provided on the insulating layer 302, so that metal traces 301 of different layers can be electrically connected to form an interconnection structure for signal transmission.
  • the core layer 30 is provided with a cavity 303 penetrating the upper surface A and the lower surface B of the core layer 30.
  • the inductor 20 integrated in the package substrate 100 may be disposed in the cavity 303.
  • the inductor 20 includes a magnetic core 230 and a coil 231.
  • the magnetic core 230 is filled in the cavity 303 described above.
  • the material constituting the magnetic core 230 may include a soft magnetic composite (SMC) material.
  • the SMC material includes magnetic particles and resin materials.
  • the SMC material can be formed by combining the above-mentioned magnetic particles and the resin material.
  • the above-mentioned magnetic particles may be iron-silicon-chromium alloy particles, carbonyl iron particles, or iron-based amorphous particles.
  • the relative permeability of the aforementioned SMC material can usually be 5-10.
  • the aforementioned coil 231 includes at least one wire segment.
  • the aforementioned at least one wire segment includes a first metal trace 41, and a first through hole 51 and a second through hole 52 penetrating the magnetic core 230.
  • the first metal trace 41 is disposed on the lower surface B of the core layer 30.
  • FIG. 7c The longitudinal cross-sectional view of the core layer 30 is shown in FIG. 7c (a cross-sectional view cut along the dashed line OO in FIG. 7a), and any one of the first via 51 and the second via 52 is vias.
  • the upper surface A and the lower surface B of the core layer 30 may be penetrated.
  • the walls of the first via 51 and the second via 52 are covered with a conductive layer 40 made of metal.
  • the first via 51 and the second via 52 covered with a conductive layer on the wall of the hole may also be filled with resin material.
  • first end of the first metal trace 41 is coupled to the end of the first via 51 located on the lower surface B of the core layer 30.
  • the second end of the first metal trace 41 is coupled to the end of the second via 52 located on the lower surface B of the core layer 30 to form the aforementioned coil 231.
  • the core layer 30 of the package substrate 100 can be fabricated as shown in FIG. 6a, which penetrates the upper surface A and the lower surface B of the core layer 30. Cavity 303.
  • a magnetic core material is embedded in the cavity 303 to form a magnetic core 230 filled in the cavity 303 (as shown in FIG. 6b).
  • a hole through the magnetic core 230 is formed on the magnetic core 230 by a drilling process, and the inner wall of the hole is metalized by an electroplating process to form a conductive layer 40 as shown in FIG. 7c, thereby completing the first conductive layer.
  • Preparation of the through hole 51 and the second via hole 52 is made to couple the first via 51 and the second via 52.
  • the inductor 20 may include the first terminal electrode 15 as shown in FIG. 4a. And the second terminal electrode 16.
  • the first build-up layer 31 on the upper surface A of the core layer 30 includes a first interconnect structure 311 and a second interconnect structure 312. , The first pad 313 and the second pad 314. Either the first interconnection structure 311 or the second interconnection structure 312 is mainly composed of the PTH in the first build-up layer 31 and the multilayer metal wiring 301 (as shown in FIG. 5).
  • the first interconnect structure 311 is close to an end of the core layer 30 and is coupled to an end of the first via 51 located on the upper surface A of the core layer 30.
  • An end of the first interconnect structure 311 away from the core layer 30 is coupled to the first pad 313.
  • the above-mentioned first pad 313 can be used as the first terminal electrode 15 of the inductor 20 (as shown in FIG. 4a).
  • the first terminal electrode 15 can be coupled to the voltage adjustment module 120 in the chip 101 through the pin Lx.
  • the voltage regulation module 120 integrates other elements (for example, the light emitting diode D shown in FIG. 3) in the voltage conversion circuit 102 except for the inductor 20.
  • the second interconnect structure 312 is close to an end of the core layer 30 and is coupled to an end of the second via 52 located on the upper surface A of the core layer 30.
  • An end of the second interconnect structure 312 away from the core layer 30 is coupled to the second pad 314.
  • the above-mentioned second pad 314 can be used as the second terminal electrode 16 of the inductor 20 (as shown in FIG. 4a).
  • the second terminal electrode 16 can be coupled to the processing module 121 in the chip 101 through the power pin Ot.
  • the above-mentioned second terminal electrode 16 may be the output terminal Uo of the voltage conversion circuit 102 in FIG. 3 or FIG. 6b.
  • the power supply voltage for example, 1.8V
  • the battery in the electronic device 01 can pass through the power input terminal 13 of the package substrate 100 (as shown in FIG. 4a) and be coupled to the power output terminal 14. After the connected pin Vdd, it is transmitted to the voltage regulation module 120.
  • the second build-up layer 32 on the lower surface B of the core layer 30 includes a third pad 315 away from the core layer 30.
  • the first build-up layer 31 on the upper surface A of the core layer 30 further includes a fourth pad 316 on the side away from the core layer 30.
  • the above-mentioned package substrate 100 further includes a third interconnect structure 317 penetrating through the core layer 30, the first build-up layer 31 and the second build-up layer 32.
  • the first end of the third interconnect structure 317 is coupled to the third pad 315, and the second end is coupled to the fourth pad 316.
  • the third pad 315 can be used as the power input terminal 13 of the packaging substrate 100 (as shown in FIG. 4a), and the third pad 315 is coupled to the pin VDD under the packaging substrate 100.
  • the fourth pad 316 can be used as the power output terminal 14 of the package substrate 100 (as shown in FIG. 4a). The fourth pad 316 is coupled to the pin Vdd under the chip 101.
  • the PCB can transmit the power supply voltage (for example, 1.8V) provided by the battery to the third interconnection structure 317 through the pin VDD and the power input terminal 13 under the packaging substrate 100.
  • the third interconnect structure 317 transmits the above-mentioned power supply voltage (for example, 1.8V) to the voltage regulation module 120 in the chip 101 through the power output terminal 14 and the pin Vdd.
  • the voltage conversion circuit 102 composed of the voltage regulation module 120 and the inductor 20 can perform the above-mentioned power supply voltage (for example, 1.8V)
  • a voltage conversion such as a step-down process, is performed to reduce the power supply voltage (for example, 1.8V) to the power supply voltage of the chip 101 (for example, 0.9V).
  • the second terminal electrode 16 of the inductor 20 is used as the output terminal Uo of the voltage conversion circuit 102 to provide a supply voltage to the processing module 121 in the chip 101, and the processing module 121 starts to work.
  • the cavity 303 formed in the core layer 30 of the packaging substrate 100 is filled with a magnetic core 230 made of a magnetic material, and the magnetic core 230 is provided with a first conduction Hole 51 and second via hole 52.
  • the coil 231 in the inductor 20 includes a first via 51, a second via 52, and a first metal wire 41 for coupling the first via 51 and the second via 52. Therefore, most of the coil 231 is wrapped by the magnetic core 230. In this way, when the coil 231 in the inductor 20 passes current, the magnetic material around the first through hole 51 and the second through hole 52 can strengthen the magnetic material around the first through hole 51 and the second through hole 52.
  • the magnetic field can increase the inductance of the inductor 20.
  • the number of turns of the coil 231 can be increased.
  • the above-mentioned coil 231 includes a first wire segment 300a and a second wire segment 300b as shown in FIG. 9a.
  • the structure of any one of the first wire segment 300a and the second wire segment 300b is the same as that described above, and may include a first via 51, a second via 52, and for connecting the first via 51 and the second via 51.
  • the first metal trace 41 coupled to the two vias 52.
  • the first metal trace of any one of the first wire segment 300a and the second wire segment 300b is The vertical projection of the line 41 on the core layer 30 is located within the range where the magnetic core 230 is located. Thus, the length of the first metal wiring 41 can be reduced.
  • the aforementioned coil 231 further includes a second metal trace 42.
  • the second metal trace 42 is disposed on the upper surface A of the core layer 30.
  • the first end of the second metal trace 42 is coupled to the end A of the second via 52 of the first wire segment 300 a located on the upper surface of the core layer 30.
  • the second end of the second metal trace 42 is coupled to an end of the first through hole 51 of the second wire segment 300 b located on the upper surface A of the core layer 30.
  • the vertical projection of the second metal trace 42 on the core layer 30 may be located where the magnetic core 230 is located. In the range. Therefore, the length of the second metal trace 42 can be reduced.
  • the first in the first build-up layer 31 in FIG. 9b may be coupled with the first via 51 of the first wire segment 300a shown in FIG. 9b.
  • the electrical signal (such as voltage and current) output by the voltage regulation module 120 can be transmitted to the first conductor of the first wire segment 300a through the first terminal electrode 15.
  • the through hole 51 faces one end of the upper surface A (not shown in FIG. 10) of the core layer 30.
  • the inductor 20 can store energy and filter.
  • the above-mentioned current flows from the first through hole 51 of the first wire segment 300a toward the lower surface of the core layer 30
  • One end of B flows out, passes through the first metal trace 41 of the first wire segment 300a (located on the lower surface B of the core layer 30), flows into the second via hole 52 of the first wire segment 300a, and faces the lower surface of the core layer 30 One end of B.
  • the second conductive hole 52 of the first wire segment 300a flows toward the end of the upper surface A of the core layer 30 to the second metal trace 42 located on the upper surface A of the core layer 30.
  • the above-mentioned current flows into the first via hole 51 of the second wire segment 300 b through the second metal trace 42, and faces one end of the upper surface A of the core layer 30.
  • the first via 51 of the second wire segment 300b flows out toward one end of the lower surface B of the core layer 30, and flows into the first metal trace 41 of the second wire segment 300b (located on the lower surface B of the core layer 30) ,
  • the first metal trace 41 flowing from the second wire segment 300b to the second via hole 52 of the second wire segment 300b faces one end of the lower surface B of the core layer 30.
  • the above-mentioned current passes through the second via hole 52 of the second wire segment 300 b, flows to the second via hole 52 of the second wire segment 300 b, and faces one end of the upper surface A of the core layer 30.
  • the second pad 314 in the first build-up layer 31 in FIG. 8 may be coupled to the end of the second via hole 52 of the second wire segment 300b shown in FIG. 9b facing the upper surface A of the core layer 30.
  • the electrical signal filtered by the inductor 20 can be transmitted to the processing module 121 in the chip 101 through the second terminal electrode 16 for processing
  • the module 121 provides the above-mentioned power supply voltage.
  • the coil 231 in the inductor 20 includes a first wire segment 300a and a second wire segment 300b that are coupled by the second metal trace 42. Therefore, by increasing the number of wire segments of the coil 231, the purpose of increasing the inductance of the inductor 20 can be achieved.
  • the inductor 20 when the electronic device 01 provided in the embodiment of the present application uses the inductor 20 as shown in FIG. 9b, when the voltage conversion circuit 102 of the electronic device 01, the switching frequency of the switch Q (as shown in FIG. 3) is When it reaches 100MHz, the inductance of the inductor 20 can reach about 7.58nH.
  • the inductor 20 Compared with the existing integrated and substrate air inductance (inductance 2.1nH), and the inductance (inductance 5.69nH) formed by embedding magnetic materials in the through holes of the substrate, the inductor 20 provided by the embodiment of the present application The inductance has been greatly improved.
  • the cross section of the above-mentioned magnetic core 230 may be rectangular or approximately rectangular.
  • the cross section of the cavity 303 made in the core layer 30 may be rectangular or a regular shape approximately rectangular. In this way, the process of making the cavity 303 can be simplified.
  • the cross section of the magnetic core 230 may be parallel to the upper surface A or the lower surface B of the core layer 30.
  • the magnetic field strength in the range of the dashed circle 2 is greater than the magnetic field strength in the range of the dashed circle 3.
  • the directions of current transmission on the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a are opposite.
  • the magnetic induction line around the first via hole 51 of the first wire segment 300a is counterclockwise, and the magnetic induction line around the second via hole 52 of the first wire segment 300a is clockwise.
  • the portion between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a is formed by the first via 51 and the second via 52.
  • the directions of the generated magnetic induction lines are the same.
  • the intensity of the magnetic field between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a is smaller than that of the peripheral portion of the first via 51 or the second via 52. magnetic field.
  • the magnetic field strength between the first via 51 of the second wire segment 300b and the second via 52 of the second wire segment 300b is smaller than the peripheral portion of the first via 51 or the second via 52 Magnetic field.
  • first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b have the same direction of current transmission. According to the right-hand rule, the magnetic induction lines around the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b are all counterclockwise. Therefore, the portion between the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b is defined by the first via 51 of the first wire segment 300a and the second wire segment. The direction of the magnetic induction line generated by the first via hole 51 of 300b is opposite.
  • the intensity of the magnetic field between the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b is smaller than that of the first via 51 and the first wire of the first wire segment 300a.
  • the intensity of the magnetic field between the second via holes 52 of the segment 300a As shown in FIG. 11, the dashed circle 2 and the dashed circle 3 are recessed inwardly at a position between the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b, which is larger than the circle 2 and the dotted circle 3 are inwardly recessed at the position between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a.
  • the magnetic field strength between the second via 52 of the first wire segment 300a and the second via 52 of the second wire segment 300b is also smaller than that of the first via 51 and the second via 51 of the first wire segment 300a.
  • the intensity of the magnetic field between the second via holes 52 of a wire segment 300a As shown in FIG. 11, the dashed circle 2 and the dashed circle 3 are recessed inwardly in the position between the second via 52 of the first wire segment 300a and the second via 52 of the second wire segment 300b, which is larger than the circle 2 and the dotted circle 3 are inwardly recessed at the position between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a.
  • no magnetic material is provided at a position where the magnetic field intensity is less than the magnetic field around any one of the above-mentioned via holes.
  • the portion between the first via 51 of the second wire segment 300b and the second via 52 of the second wire segment 300b is no longer provided with magnetic material.
  • the structure of the magnetic core 230 is as shown in FIG. 12, and the magnetic core 230 has at least one side surface S perpendicular to the upper surface A or the lower surface B of the core layer 30.
  • the above-mentioned magnetic core 230 includes a recess 400 that is provided on at least one side surface S of the magnetic core 230 and recessed toward the inside of the magnetic core 230.
  • the recess 400 is located between any two adjacent via holes. In this way, by providing the above-mentioned recess 400 on the magnetic core 230, it is possible to reduce the material used to make the magnetic core 230 while ensuring that the inductance of the inductor 20 will not be greatly reduced, so as to achieve the purpose of reducing the manufacturing cost.
  • the magnetic core 230 may have a first side surface S1 and a second side surface S2.
  • the first side surface S1 is parallel to the plane where the axes of the first through hole 51 and the second through hole 52 of the first wire segment 300a are located (that is, the plane where the connection line of E1-E2 is located).
  • the second side surface S2 is parallel to the plane where the axes of the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b are located (that is, the plane where the connection line of E1-E3 is located).
  • the first side surface S1 is provided with a first recessed portion 400 a
  • the second side surface S2 is provided with a second recessed portion 400 b.
  • the dashed circle 2 and the dashed circle 3 are located inwardly between the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b.
  • the degree of depression is greater than the degree of inward depression of the circle 2 and the dotted circle 3 between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a.
  • the cross-sectional area of the second recessed portion 400b provided on the second side surface S2 may be larger than the cross-sectional area of the first recessed portion 400a provided on the first side surface. Therefore, on the basis of ensuring that the inductance of the inductor 20 will not be greatly reduced, the magnetic material at the positions of the first recessed portion 400a and the second recessed portion 400b can be removed as needed.
  • the cross-sections of the first recessed portion 400a and the second recessed portion 400b may be parallel to the upper surface A or the lower surface B of the core layer 30.
  • the coil 231 may include the first wire segment 300a and the second wire segment 300b as shown in FIG. 9a, and the number of turns of the coil 231 is increased.
  • the coil 231 may include a first wire segment 300a, a second wire segment 300b, and a third wire segment 300c.
  • first wire segment 300a The structure of any one of the first wire segment 300a, the second wire segment 300b, and the third wire segment 300c is the same as that described above, and may include a first via 51, a second via 52, and for connecting the first via
  • the first metal trace 41 is coupled to the through hole 51 and the second via hole 52.
  • the aforementioned coil 231 further includes a second metal wire 42 and a third metal wire 43.
  • the arrangement of the second metal wiring 42 is the same as that described above, and will not be repeated here.
  • the third metal wiring 43 and the second metal wiring 42 are both disposed on the upper surface A of the core layer 30.
  • the first end of the third metal trace 43 is coupled to the end A of the second via hole 52 of the second wire segment 300 b located on the upper surface of the core layer 30.
  • the second end of the third metal trace 43 is coupled to an end of the first through hole 51 of the third wire segment 300 c located on the upper surface A of the core layer 30.

Abstract

Provided are an encapsulation substrate integrated with an inductor, and an electronic device, wherein same relate to the technical field of electronics and are used to reduce the number of chip power pins. The encapsulation substrate comprises a core layer and an inductor. The core layer has a cavity. The cavity passes through the upper surface and the lower surface of the core layer. The inductor is located in the cavity. The inductor comprises a magnetic core and a coil. The magnetic core is filled in the cavity. In addition, the coil comprises at least one conductor segment. The at least one conductor segment comprises a first metal trace, and a first via hole and a second via hole which pass through the magnetic core. The first metal trace is arranged on the lower surface of the core layer. A first end of the first metal trace is coupled to the end of the first via hole located on the lower surface of the core layer. A second end of the first metal trace is coupled to the end of the second via hole located on the lower surface of the core layer.

Description

一种集成有电感的封装基板及电子设备Package substrate and electronic equipment integrated with inductance 技术领域Technical field
本申请涉及电子技术领域,尤其涉及一种集成有电感的封装基板及电子设备。This application relates to the field of electronic technology, and in particular to a package substrate and electronic equipment integrated with an inductor.
背景技术Background technique
电子产品内设置有用于向该电子设备中的芯片进行供电的电源转换模块(voltage regulator module,VRM)。VRM包括直流(direct current,DC)转直流电路,即DC-DC降压电路。DC-DC降压电路包括开关管和电感。通过控制开关管的导通、关断状态,可以对电感进行充电和放电,从而可以将电池提供的电压转换成芯片的供电电压。The electronic product is provided with a power conversion module (voltage regulator module, VRM) for supplying power to the chip in the electronic device. VRM includes a direct current (DC) to direct current circuit, that is, a DC-DC step-down circuit. The DC-DC step-down circuit includes a switch tube and an inductor. By controlling the on and off states of the switch tube, the inductor can be charged and discharged, so that the voltage provided by the battery can be converted into the power supply voltage of the chip.
在上述DC-DC降压电路中,当开关管的开关频率较低,例如为几十KHz~几百KHz时,电感需要具有非常大的电感量,例如几十μH~几百nH,来减小降压电路输出电流的纹波。这样一来,由于上述芯片的功耗越来越高,芯片所需要的电流也逐渐增大,例如可以高达600~1000A。由于芯片的电源管脚的通流能力有限,因此芯片需要的电源管脚的数量会急剧增加,从而导致芯片的面积进一步增大,不利于电子产品的小型化。In the above-mentioned DC-DC step-down circuit, when the switching frequency of the switch tube is low, for example, tens of KHz to hundreds of KHz, the inductor needs to have a very large inductance, such as tens of μH to hundreds of nH, to reduce The ripple of the output current of the small step-down circuit. In this way, as the power consumption of the above-mentioned chip is getting higher and higher, the current required by the chip is gradually increasing, for example, it can be as high as 600-1000A. Due to the limited flow capacity of the power supply pins of the chip, the number of power supply pins required by the chip will increase sharply, resulting in a further increase in the area of the chip, which is not conducive to the miniaturization of electronic products.
发明内容Summary of the invention
本申请实施例提供一种集成有电感的封装基板及电子设备,用于减小芯片电源管脚的数量。The embodiments of the present application provide a package substrate and electronic device integrated with an inductor, which are used to reduce the number of chip power pins.
为达到上述目的,本申请采用如下技术方案:In order to achieve the above objectives, this application adopts the following technical solutions:
本申请的第一方面,提供一种集成有电感的封装基板。该封装基板包括芯层以及电感。其中,芯层具有空腔。该空腔贯穿芯层的上表面和下表面。电感位于空腔内。电感包括磁芯以及线圈。磁芯填充于空腔内。此外,线圈包括至少一个导线段。至少一个导线段包括第一金属走线,以及贯穿磁芯的第一导通孔和第二导通孔。第一金属走线设置于芯层的下表面。第一金属走线的第一端与第一导通孔位于芯层下表面的一端相耦接。第一金属走线的第二端与第二导通孔位于芯层下表面的一端相耦接。The first aspect of the present application provides a package substrate integrated with inductors. The package substrate includes a core layer and an inductor. Among them, the core layer has a cavity. The cavity penetrates the upper surface and the lower surface of the core layer. The inductor is located in the cavity. The inductor includes a magnetic core and a coil. The magnetic core is filled in the cavity. In addition, the coil includes at least one wire segment. The at least one wire segment includes a first metal trace, and a first via hole and a second via hole penetrating the magnetic core. The first metal trace is arranged on the lower surface of the core layer. The first end of the first metal trace is coupled to an end of the first through hole located on the lower surface of the core layer. The second end of the first metal trace is coupled to an end of the second through hole located on the lower surface of the core layer.
这样一来,一方面,通过在封装基板的芯层中形成的空腔。上述构成电感的磁芯的磁性材料填充于上述空腔内。此外,在该磁芯内设置有第一导通孔和第二导通孔。该电感中的线圈包括第一导通孔、第二导通孔以及用于将第一导通孔、第二导通孔耦接的第一金属走线。从而达到将电感集成于封装基板中的目的。在此情况下,当采用全集成式电压调节技术,将电压转换电路中除了电感以外电子元件,例如开关管、二极管等集成于芯片时,电源提供的较高的电源电压可以直接传输至芯片,以通过上述电压转换电路将该电源电压进行降压处理生成供电电压。因此,芯片接收到的电压较大,电流较小,在芯片的管脚流通能力恒定的情况下,可以减小芯片中用于与封装基板耦接的管脚的数量。In this way, on the one hand, through the cavity formed in the core layer of the package substrate. The magnetic material constituting the magnetic core of the inductor is filled in the cavity. In addition, a first through hole and a second through hole are provided in the magnetic core. The coil in the inductor includes a first via hole, a second via hole, and a first metal wire for coupling the first via hole and the second via hole. So as to achieve the purpose of integrating the inductor into the package substrate. In this case, when the fully integrated voltage regulation technology is used to integrate electronic components in the voltage conversion circuit other than inductors, such as switch tubes, diodes, etc., on the chip, the higher power supply voltage provided by the power supply can be directly transmitted to the chip. The supply voltage is generated by stepping down the power supply voltage through the above-mentioned voltage conversion circuit. Therefore, the voltage received by the chip is relatively large and the current is relatively small. When the pin flow capacity of the chip is constant, the number of pins used for coupling with the package substrate in the chip can be reduced.
另一方面,在将电感集成于封装基板中时,可以将电感设置于靠近芯片的电源管脚的位置。从而能够减小电池向芯片提供供电电压的供电路径,减小该供电路径上的 寄生电阻的影响,降低上述供电路径上的电流损耗,提高供电效率。On the other hand, when the inductor is integrated into the package substrate, the inductor can be placed close to the power supply pin of the chip. Therefore, the power supply path through which the battery provides the power supply voltage to the chip can be reduced, the influence of parasitic resistance on the power supply path can be reduced, the current loss on the above-mentioned power supply path can be reduced, and the power supply efficiency can be improved.
可选的,线圈包括第一导线段、第二导线段,以及第二金属走线。第一导线段、第二导线段的任意一个导线段同上所述,包括贯穿磁芯的第一导通孔和第二导通孔,以及用于将第一导通孔和第二导通孔耦接的第一金属走线。此外,第二金属走线设置于芯层的上表面。第二金属走线的第一端与第一导线段的第二导通孔位于芯层上表面的一端相耦。第二金属走线的第二端与第二导线段的第一导通孔位于芯层上表面的一端相耦接。这样一来,可以通过增加线圈中导线段的数量,达到增加线圈圈数的目的。从而提高电感的电感量。Optionally, the coil includes a first wire segment, a second wire segment, and a second metal trace. Any one of the first wire segment and the second wire segment is the same as described above, including the first via hole and the second via hole penetrating the magnetic core, and is used to connect the first via hole and the second via hole. The first metal trace for coupling. In addition, the second metal trace is arranged on the upper surface of the core layer. The first end of the second metal trace is coupled to an end of the second via hole of the first wire segment located on the upper surface of the core layer. The second end of the second metal trace is coupled to an end of the first via hole of the second wire segment located on the upper surface of the core layer. In this way, the number of coil turns can be increased by increasing the number of wire segments in the coil. Thereby increasing the inductance of the inductor.
可选的,磁芯具有与芯层的上表面或下表面垂直的至少一个侧面。磁芯包括在磁芯的至少一个侧面上,设置的向磁芯内部凹陷的凹陷部。凹陷部位于相邻两个导通孔之间。由于,相对于每个导通孔周边的磁场而言,相邻两个导通孔之间的磁场较小。所以可以通过在磁芯的侧面,且位于任意相邻两个导通孔之间的部分制作上述凹陷部,以减小构成磁芯的磁性材料,达到降低制作成本的目的。Optionally, the magnetic core has at least one side surface perpendicular to the upper surface or the lower surface of the core layer. The magnetic core includes a recessed portion recessed toward the inside of the magnetic core provided on at least one side surface of the magnetic core. The recess is located between two adjacent via holes. Because, relative to the magnetic field around each via hole, the magnetic field between two adjacent via holes is relatively small. Therefore, the above-mentioned recess can be made on the side surface of the magnetic core and between any two adjacent through holes, so as to reduce the magnetic material constituting the magnetic core and achieve the purpose of reducing the manufacturing cost.
可选的,磁芯具有第一侧面和第二侧面。第一侧面与第一导线段的第一导通孔和第二导通孔的轴线所在的平面平行。第二侧面与第一导线段的第一导通孔和第二导线段的第一导通孔所在的平面平行。第一侧面上设置有第一凹陷部,第二侧面上设置有第二凹陷部。第一凹陷部的横截面的面积小于第二凹陷部的横截面的面积。横截面与芯层的上表面或下表面平行。在此情况下,由于第一导线段的第一导通孔和第二导线段的第一导通孔之间的磁场强度,小于第一导线段的第一导通孔和第一导线段的第二导通孔之间的磁场强度,因此在磁场强度较小的位置,可以设置横截面较大的第二凹陷部。在磁场强度较大的位置,可以设置横截面较小的第一凹陷部。从而可以在保证电感的电感量不会大幅下降的基础上,可以根据需要分别去除第一凹陷部和第二凹陷部位置处的磁性材料。Optionally, the magnetic core has a first side surface and a second side surface. The first side surface is parallel to a plane where the axes of the first and second conductive holes of the first wire segment are located. The second side surface is parallel to the plane where the first via hole of the first wire segment and the first via hole of the second wire segment are located. A first recessed portion is provided on the first side surface, and a second recessed portion is provided on the second side surface. The area of the cross section of the first depressed portion is smaller than the area of the cross section of the second depressed portion. The cross section is parallel to the upper or lower surface of the core layer. In this case, since the magnetic field strength between the first via hole of the first wire segment and the first via hole of the second wire segment is smaller than that between the first via hole of the first wire segment and the first wire segment The intensity of the magnetic field between the second via holes, therefore, a second recess with a larger cross-section can be provided at a position where the intensity of the magnetic field is relatively small. At locations where the magnetic field strength is greater, a first recess with a smaller cross-section may be provided. Therefore, on the basis of ensuring that the inductance of the inductor will not be greatly reduced, the magnetic material at the positions of the first recessed portion and the second recessed portion can be removed as required.
可选的,第一金属走线在芯层上的垂直投影位于磁芯所在的范围内。这样一来,减小第一金属走线的长度,达到减小电感直流电阻的目的。Optionally, the vertical projection of the first metal trace on the core layer is located within the range where the magnetic core is located. In this way, the length of the first metal trace is reduced to achieve the purpose of reducing the DC resistance of the inductor.
可选的,第二金属走线在芯层上的垂直投影位于磁芯所在的范围内。这样一来,减小第二金属走线的长度,达到减小电感直流电阻的目的。Optionally, the vertical projection of the second metal trace on the core layer is located within the range where the magnetic core is located. In this way, the length of the second metal trace is reduced to achieve the purpose of reducing the DC resistance of the inductor.
可选的,构成磁芯的材料包括软磁复合材料。该软磁复合材料包括磁性颗粒和树脂材料。构成磁性颗粒的材料包括铁硅铬合金、羰基铁、或者铁基非晶材料中的至少一种。Optionally, the material constituting the magnetic core includes a soft magnetic composite material. The soft magnetic composite material includes magnetic particles and a resin material. The material constituting the magnetic particles includes at least one of iron-silicon-chromium alloy, carbonyl iron, or iron-based amorphous material.
可选的,电感还包括第一端电极和第二端电极。第一导通孔位于芯层上表面的一端与第一端电极相耦接。第二导通孔位于芯层上表面的一端与第二端电极相耦接。上述电感的第一端电极可以与电压转换电路中的其余电子元件,例如开关管、二极管相耦接。电感的第二端电极可以作为电压转换电路的输出端。从而使得电压转换电路中的其余电子元件,例如开关管、二极管能够与集成于封装基板内的电感相耦接。Optionally, the inductor further includes a first terminal electrode and a second terminal electrode. One end of the first via hole located on the upper surface of the core layer is coupled to the first terminal electrode. One end of the second via hole located on the upper surface of the core layer is coupled to the second terminal electrode. The first terminal electrode of the above-mentioned inductor can be coupled with other electronic components in the voltage conversion circuit, such as a switch tube and a diode. The second terminal electrode of the inductor can be used as the output terminal of the voltage conversion circuit. As a result, other electronic components in the voltage conversion circuit, such as switch tubes and diodes, can be coupled with the inductor integrated in the package substrate.
可选的,电感还包括第一端电极和第二端电极。第一导线段的第一导通孔位于芯层上表面的一端与第一端电极相耦接。第二导线段的第二导通孔位于芯层上表面的一端与第二端电极相耦接。当电感中线圈的圈数增加后,即该线圈包括第一导线段和第二导线段时,通过将第一导线段的第一导通孔位于芯层上表面的一端与第一端电极相 耦接,可以使得该线圈的第一端能够通过上述第一端电极与上述电感的第一端电极可以与电压转换电路中的其余电子元件,例如开关管、二极管相耦接。此外,通过将第二导线段的第二导通孔位于芯层上表面的一端与第二端电极相耦接,可以使得线圈的另一端通过第二端电极可以作为电压转换电路的输出端。Optionally, the inductor further includes a first terminal electrode and a second terminal electrode. One end of the first via hole of the first wire segment located on the upper surface of the core layer is coupled to the first terminal electrode. One end of the second via hole of the second wire segment located on the upper surface of the core layer is coupled to the second terminal electrode. When the number of turns of the coil in the inductor is increased, that is, when the coil includes a first wire segment and a second wire segment, the end of the first via hole of the first wire segment located on the upper surface of the core layer is connected to the first terminal electrode. The coupling enables the first end of the coil to be coupled to other electronic components in the voltage conversion circuit, such as switch tubes and diodes, through the first end electrode and the first end electrode of the inductor. In addition, by coupling one end of the second via hole of the second wire segment located on the upper surface of the core layer to the second terminal electrode, the other end of the coil can be used as the output terminal of the voltage conversion circuit through the second terminal electrode.
可选的,封装基板还包括第一积层。该第一积层位于芯层上表面;第一积层包括第一互连结构、第二互连结构、第一焊盘以及第二焊盘。第一互连结构靠近芯层的一端与第一导通孔位于芯层上表面的一端相耦接,第一互连结构远离芯层的一端与第一焊盘相耦接,上述第一焊盘作为电感的第一端电极。第二互连结构靠近芯层的一端与第二导通孔位于芯层上表面的一端相耦接,第二互连结构远离芯层的一端与第二焊盘相耦接,上述第二焊盘作为电感的第二端电极。这样一来,可以通过第一积层中的第一互连结构将电感的第一端电极与线圈的一端相耦接,并通过第一积层中第二互连结构将电感的第二端电极与线圈的另一端相耦接。Optionally, the packaging substrate further includes a first build-up layer. The first build-up layer is located on the upper surface of the core layer; the first build-up layer includes a first interconnection structure, a second interconnection structure, a first pad and a second pad. The end of the first interconnect structure close to the core layer is coupled to the end of the first via hole located on the upper surface of the core layer, and the end of the first interconnect structure away from the core layer is coupled to the first pad. The disc serves as the first terminal electrode of the inductor. The end of the second interconnect structure close to the core layer is coupled to the end of the second via hole located on the upper surface of the core layer, and the end of the second interconnect structure far away from the core layer is coupled to the second pad. The disk serves as the second terminal electrode of the inductor. In this way, the first terminal electrode of the inductor can be coupled to one end of the coil through the first interconnect structure in the first build-up layer, and the second end of the inductor can be connected through the second interconnect structure in the first build-up layer. The electrode is coupled to the other end of the coil.
可选的,封装基板还包括第二积层和第三互连结构。该第二积层位于芯层下表面。第二积层包括远离芯层一侧的第三焊盘。其中,第三互连结构,贯穿芯层、第一积层以及第二积层。第一积层还包括远离芯层一侧的第四焊盘,第三互连结构的第一端与第三焊盘耦接,第二端与第四焊盘耦接。第三焊盘作为封装基板的电源输入端子,第四焊盘作为封装基板的电源输出端子。这样一来,电池提供的电源电压可以通过第四焊盘、第三互连结构以及第三焊盘传输至芯片中。Optionally, the packaging substrate further includes a second build-up layer and a third interconnection structure. The second build-up layer is located on the lower surface of the core layer. The second build-up layer includes a third pad on the side away from the core layer. Wherein, the third interconnection structure penetrates the core layer, the first build-up layer and the second build-up layer. The first build-up layer further includes a fourth pad on a side away from the core layer, the first end of the third interconnect structure is coupled to the third pad, and the second end is coupled to the fourth pad. The third pad serves as a power input terminal of the package substrate, and the fourth pad serves as a power output terminal of the package substrate. In this way, the power supply voltage provided by the battery can be transmitted to the chip through the fourth pad, the third interconnection structure, and the third pad.
本申请的第二方面,提供一种电子设备,包括芯片,以及至少一个上所述的任意一种集成有电感的封装基板。芯片于封装基板上。芯片包括电压调节模块和处理模块。封装基板具有电源输出端子。其中,封装基板包括电感。封装基板的电源输出端子与电压调节模块耦接,电压调节模块还与电感的第一端电极相耦接,电感的第二端电极还与处理模块耦接。电压调节模块和电感构成电压转换电路,用于向处理模块提供供电电压。上述电子设备具有与前述实施例提供的封装基板相同的技术效果,此处不再赘述。In a second aspect of the present application, there is provided an electronic device, including a chip, and at least one of the above-mentioned package substrates integrated with inductors. The chip is on the package substrate. The chip includes a voltage regulation module and a processing module. The package substrate has power output terminals. Among them, the package substrate includes an inductor. The power output terminal of the package substrate is coupled with the voltage adjustment module, the voltage adjustment module is also coupled with the first terminal electrode of the inductor, and the second terminal electrode of the inductor is also coupled with the processing module. The voltage regulation module and the inductor form a voltage conversion circuit, which is used to provide a supply voltage to the processing module. The above-mentioned electronic device has the same technical effect as the packaging substrate provided in the foregoing embodiment, and will not be repeated here.
附图说明Description of the drawings
图1为本申请实施例提供的一种电子设备的结构示意图;FIG. 1 is a schematic structural diagram of an electronic device provided by an embodiment of this application;
图2为与图1所示的PCB耦接的封装基板和芯片的结构示意图;2 is a schematic diagram of the structure of a package substrate and a chip coupled to the PCB shown in FIG. 1;
图3为本申请实施例提供的一种电压转换电路的结构示意图;3 is a schematic structural diagram of a voltage conversion circuit provided by an embodiment of the application;
图4a为本申请实施例提供的一种封装基板和芯片耦接的结构示意图;FIG. 4a is a schematic structural diagram of coupling a package substrate and a chip according to an embodiment of the application;
图4b为本申请实施例提供的电子设备中部分元器件的连接结构示意图;4b is a schematic diagram of the connection structure of some components in the electronic equipment provided by the embodiments of the application;
图5为本申请实施例提供的一种封装基板的结构示意图;FIG. 5 is a schematic structural diagram of a package substrate provided by an embodiment of the application;
图6a为本申请实施例提供的封装基板中芯层的部分结构示意图;FIG. 6a is a schematic diagram of a part of the structure of a core layer in a package substrate provided by an embodiment of the application; FIG.
图6b为在图6a所示的芯层的空腔内集成电感部分结构的结构示意图;FIG. 6b is a schematic diagram of the structure of the integrated inductor part in the cavity of the core layer shown in FIG. 6a;
图7a为本申请实施例提供的一种电感的结构示意图;FIG. 7a is a schematic structural diagram of an inductor provided by an embodiment of this application;
图7b将图7a所示的电感集成与封装基板中的结构示意图;FIG. 7b is a schematic diagram of the structure of integrating the inductor shown in FIG. 7a with the package substrate;
图7c为沿图7a中的虚线O-O进行剖切得到的剖视图;Figure 7c is a cross-sectional view taken along the dashed line O-O in Figure 7a;
图8为本申请实施例提供的另一种封装基板和芯片耦接的结构示意图;FIG. 8 is a schematic diagram of another structure of coupling a package substrate and a chip according to an embodiment of the application;
图9a为本申请实施例提供的另一种电感的结构示意图;FIG. 9a is a schematic structural diagram of another inductor provided by an embodiment of the application;
图9b为本申请实施例提供的另一种电感的结构示意图;FIG. 9b is a schematic structural diagram of another inductor provided by an embodiment of the application;
图10为沿图9a所示的C向得到的俯视图;Figure 10 is a plan view taken along the direction C shown in Figure 9a;
图11为本申请实施例提供的一种电感的电场分布图;FIG. 11 is an electric field distribution diagram of an inductor provided by an embodiment of the application;
图12为本申请实施例提供的一种电感磁芯的结构示意图;FIG. 12 is a schematic structural diagram of an inductive magnetic core provided by an embodiment of the application;
图13为本申请实施例提供的另一种电感磁芯的结构示意图;FIG. 13 is a schematic structural diagram of another inductive magnetic core provided by an embodiment of the application;
图14为本申请实施例提供的另一种电感的结构示意图。FIG. 14 is a schematic structural diagram of another inductor provided by an embodiment of the application.
附图标记:Reference signs:
01-电子设备;10-显示模组;11-中框;12-壳体;100-封装基板;101-芯片;111-管脚;102-电压转换电路;20-电感;120-电压调节模块;121-处理模块;13-电源输入端子;14-电源输出端子;15-第一端电极;16-第二端电极;30-芯层;31-第一积层;32-第二积层;301-金属走线;302-绝缘层;303-空腔;230-磁芯;231-线圈;41-第一金属走线;51-第一导通孔;52-第二导通孔;40-导电层;311-第一互连结构;312-第二互连结构;313-第一焊盘;314-第二焊盘;315-第三焊盘;316-第四焊盘;317-第三互连结构;300a-第一导线段;300b-第二导线段;42-第二金属走线;400-凹陷部;400a-第一凹陷部;400b-第二凹陷部;300c-第三导线段;43-第三金属走线。01-Electronic equipment; 10-display module; 11-middle frame; 12-shell; 100-package substrate; 101-chip; 111-pin; 102-voltage conversion circuit; 20-inductance; 120-voltage adjustment module 121-processing module; 13-power input terminal; 14-power output terminal; 15-first terminal electrode; 16-second terminal electrode; 30-core layer; 31-first build-up layer; 32-second build-up layer 301-metal trace; 302-insulating layer; 303-cavity; 230-magnetic core; 231-coil; 41-first metal trace; 51-first via hole; 52-second via hole; 40-conductive layer; 311-first interconnection structure; 312-second interconnection structure; 313-first pad; 314-second pad; 315-third pad; 316-fourth pad; 317 -The third interconnection structure; 300a- the first wire segment; 300b- the second wire segment; 42- the second metal trace; 400- the recessed portion; 400a- the first recessed portion; 400b- the second recessed portion; 300c- The third wire segment; 43-the third metal trace.
具体实施方式Detailed ways
下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行描述,显然,所描述的实施例仅仅是本申请一部分实施例,而不是全部的实施例。The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments.
以下,术语“第一”、“第二”等仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”等的特征可以明示或者隐含地包括一个或者更多个该特征。Hereinafter, the terms "first", "second", etc. are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Thus, the features defined with "first", "second", etc. may explicitly or implicitly include one or more of these features.
此外,本申请中,“上”、“下”等方位术语是相对于附图中的部件示意置放的方位来定义的,应当理解到,这些方向性术语是相对的概念,它们用于相对于的描述和澄清,其可以根据附图中部件所放置的方位的变化而相应地发生变化。In addition, in this application, the azimuthal terms such as "upper" and "lower" are defined relative to the schematic placement of the components in the drawings. It should be understood that these directional terms are relative concepts, and they are used for relative For the description and clarification, it can be changed correspondingly according to the changes in the orientation of the components in the drawings.
在本申请中,除非另有明确的规定和限定,术语“连接”应做广义理解,例如,“连接”可以是固定连接,也可以是可拆卸连接,或成一体;可以是直接相连,也可以通过中间媒介间接相连。此外,术语“耦接”可以是实现信号传输的电性连接的方式,“耦接”可以是直接的电性连接,也可以通过中间媒介间接的电性连接。In this application, unless expressly stipulated and limited otherwise, the term "connected" should be understood in a broad sense. For example, "connected" can be a fixed connection, a detachable connection, or a whole; it can be a direct connection, or Can be indirectly connected through an intermediary. In addition, the term "coupling" can be a way of electrical connection for signal transmission, and "coupling" can be a direct electrical connection or an indirect electrical connection through an intermediate medium.
本申请实施例提供一种电子设备,该电子设备包括例如手机、平板电脑、车载电脑、智能穿戴产品等。本申请实施例对上述电子设备的具体形式不做特殊限制。以下为了方便说明,是以电子设备为手机为例进行的说明。如图1所示,电子设备01包括显示模组10、中框11以及壳体12。The embodiments of the present application provide an electronic device. The electronic device includes, for example, a mobile phone, a tablet computer, a vehicle-mounted computer, and a smart wearable product. The embodiments of the present application do not impose special restrictions on the specific form of the above-mentioned electronic device. For the convenience of description, the following description takes the electronic device as a mobile phone as an example. As shown in FIG. 1, the electronic device 01 includes a display module 10, a middle frame 11 and a casing 12.
显示模组10用于显示图像。在本申请的一些实施例中,显示模组10包括液晶显示(liquid crystal display,LCD)模组和背光模组(back light unit,BLU)。或者,在本申请的另一些实施例中,显示模组10可以为有机发光二极管(organiclight emitting diode,OLED)显示屏。The display module 10 is used for displaying images. In some embodiments of the present application, the display module 10 includes a liquid crystal display (LCD) module and a backlight unit (BLU). Alternatively, in other embodiments of the present application, the display module 10 may be an organic light emitting diode (OLED) display screen.
中框11位于显示模组10和壳体12之间,中框11朝向显示模组10的一侧用于承载显示模组10。此外,上述电子设备01还包括印刷电路板(printed circuit board,PCB)。中框11朝向壳体12的一侧表面用于承载PCB、摄像头、电池等电子器件。其中,摄 像头和电池图中未示出。壳体12与中框11相连接形成用于容纳上述PCB、摄像头以及电池等电子器件的容纳腔。从而可以防止外界的水汽和尘土侵入该容纳腔内,对上述电子器件的性能造成影响。The middle frame 11 is located between the display module 10 and the casing 12, and the side of the middle frame 11 facing the display module 10 is used to carry the display module 10. In addition, the aforementioned electronic device 01 also includes a printed circuit board (PCB). The side surface of the middle frame 11 facing the housing 12 is used to carry electronic devices such as PCB, camera, and battery. Among them, the camera and battery are not shown in the figure. The housing 12 is connected with the middle frame 11 to form a accommodating cavity for accommodating the above-mentioned PCB, camera, battery and other electronic devices. Therefore, it is possible to prevent external water vapor and dust from intruding into the accommodating cavity and affecting the performance of the above-mentioned electronic device.
此外,上述电子设备01还包括如图2所示的封装基板100以及芯片101。芯片101通过多个管脚111,例如微型焊垫(micro bump)或者铜柱(Cu-pillars),倒装于封装基板100的上方。封装基板100的下方可以通过焊球阵列(ball grid array,BGA)与上述PCB耦接。这样一来,芯片101可以通过封装基板100与PCB实现信号传输。In addition, the above-mentioned electronic device 01 further includes a packaging substrate 100 and a chip 101 as shown in FIG. 2. The chip 101 is flip-chip mounted on the package substrate 100 through a plurality of pins 111, such as micro bumps or Cu-pillars. The bottom of the package substrate 100 may be coupled to the aforementioned PCB through a ball grid array (BGA). In this way, the chip 101 can realize signal transmission through the packaging substrate 100 and the PCB.
需要说明的是,上述是以将芯片101倒装于封装基板100的上方为例,对芯片101与封装基板100相耦接的方式进行的举例说明。在本申请的另一些实施例中,上述芯片101还可以通过引线键合的工艺与封装基板100相耦接。It should be noted that the above is an example of flip-chip mounting the chip 101 above the packaging substrate 100 to illustrate the manner in which the chip 101 and the packaging substrate 100 are coupled. In other embodiments of the present application, the aforementioned chip 101 may also be coupled to the package substrate 100 through a wire bonding process.
在本申请的一些实施例中,上述芯片101可以为系统级芯片(system on chip,SoC)、中央处理器(central processing unit,CPU)、图形处理器(graphics processing unit,GPU),或者是电源管理芯片(power management integrated circuits,PMIC)等。In some embodiments of the present application, the aforementioned chip 101 may be a system-on-chip (SoC), a central processing unit (CPU), a graphics processing unit (GPU), or a power supply. Management chip (power management integrated circuits, PMIC), etc.
为了向上述芯片101进行供电,电子设备01可以包括如图3所示的电压转换电路102。该电压转换电路102包括电感20、开关管Q、二极管D以及电容Co。电感20具有储能、滤波的作用。开关管Q可以为晶体管。In order to supply power to the aforementioned chip 101, the electronic device 01 may include a voltage conversion circuit 102 as shown in FIG. 3. The voltage conversion circuit 102 includes an inductor 20, a switch Q, a diode D, and a capacitor Co. The inductor 20 has the functions of energy storage and filtering. The switch Q can be a transistor.
该开关管Q的第一极,例如源极(source,s)与电压转换电路102的输入端Ui耦接,该电压转换电路102的输入端Ui可以与电源,例如电池的正极相耦接,用于接收电源,例如电池提供的电源电压(例如1.8V)。开关管Q的第二极,例如漏极(drain,d)与电感20的第一端(即如图4a所示的第一端电极15)相耦接。电感20的第二端(即如图4a所述的第二端电极16)与电压转换电路102的输出端Uo相耦接。开关管Q的栅极(gate,g)用于接收控制信号,该控制信号可以控制开关管Q的导通和截止。The first pole of the switch Q, such as the source (source, s), is coupled to the input terminal Ui of the voltage conversion circuit 102, and the input terminal Ui of the voltage conversion circuit 102 may be coupled to a power source, such as the positive electrode of a battery, Used to receive power, such as a power supply voltage (for example, 1.8V) provided by a battery. The second electrode of the switch Q, such as the drain (drain, d), is coupled to the first end of the inductor 20 (ie, the first end electrode 15 as shown in FIG. 4a). The second terminal of the inductor 20 (ie, the second terminal electrode 16 as shown in FIG. 4a) is coupled to the output terminal Uo of the voltage conversion circuit 102. The gate (gate, g) of the switching tube Q is used to receive a control signal, which can control the switching tube Q to be turned on and off.
此外,二极管D的阴极(cathode,c)与电感20的第一端相耦接,阳极(anode,a)与电源,例如上述电池的负极相耦接。电容Co的第一端与电压转换电路102的输出端Uo相耦接,第二端与电源,例如上述电池的负极相耦接。当开关管Q导通时,电感20充电。当开关管Q截止时,电感20放电,并通过电容Co持续向各个芯片提供稳定的供电电压。In addition, the cathode (cathode, c) of the diode D is coupled to the first end of the inductor 20, and the anode (anode, a) is coupled to the power source, such as the negative electrode of the aforementioned battery. The first terminal of the capacitor Co is coupled to the output terminal Uo of the voltage conversion circuit 102, and the second terminal is coupled to the power source, such as the negative electrode of the aforementioned battery. When the switch Q is turned on, the inductor 20 is charged. When the switch Q is turned off, the inductor 20 discharges and continuously provides a stable power supply voltage to each chip through the capacitor Co.
需要说明的是,图3是以电压转换电路102包括一个电感20为例进行的说明。在本申请的另一些实施例中,上述电压转换电路102可以包括至少两个电感20。It should be noted that FIG. 3 is an example in which the voltage conversion circuit 102 includes an inductor 20. In some other embodiments of the present application, the aforementioned voltage conversion circuit 102 may include at least two inductors 20.
基于此,可以提高上述开关管Q的开关频率,例如提高到100MHz左右,以减小电感20的尺寸。此时,上述电压转换电路102中只需要几nH的电感20即可输出纹波很小的电流。这样一来,电感20的尺寸可以减小至1平方毫米以下。Based on this, the switching frequency of the switch tube Q can be increased, for example, to about 100 MHz, so as to reduce the size of the inductor 20. At this time, only a few nH of the inductor 20 in the voltage conversion circuit 102 can output a current with a small ripple. In this way, the size of the inductor 20 can be reduced to less than 1 square millimeter.
在此情况下,可以如图4a所示,将电感20集成于封装基板100中,该封装基板100为集成有电感20的封装基板。此时,可以采用全集成式电压调节(fully integrated voltage regulator,FIVR)技术,在芯片101内部设置如图4a所示的电压调节模块120。其中,上述该电压转换电路102中的开关管Q、二极管D可以集成于电压调节模块120中。此外,上述芯片101还包括用于实现该芯片101主要功能的处理模块121。In this case, as shown in FIG. 4a, the inductor 20 may be integrated in a packaging substrate 100, which is a packaging substrate integrated with the inductor 20. At this time, a fully integrated voltage regulator (FIVR) technology can be used, and a voltage regulator module 120 as shown in FIG. 4a is provided inside the chip 101. Wherein, the switch tube Q and the diode D in the voltage conversion circuit 102 can be integrated in the voltage adjustment module 120. In addition, the aforementioned chip 101 also includes a processing module 121 for realizing the main functions of the chip 101.
这样一来,如图4a所示,封装基板100具有电源输入端子13和电源输出端子14。该电源输入端子13可以通过采用焊球形成的管脚VDD与图2所示的PCB相耦接,从 而可以通过PCB接收电池提供的电源电压(例如1.8V)。上述电源电压(例如1.8V)经过该封装基板100的电源输入端子13,以及与该电源输出端子14耦接的管脚Vdd(可以采用焊垫或铜柱形成)后,传输至电压调节模块120内。In this way, as shown in FIG. 4 a, the package substrate 100 has a power input terminal 13 and a power output terminal 14. The power input terminal 13 can be coupled to the PCB shown in FIG. 2 through the pin VDD formed by using solder balls, so that the power supply voltage (for example, 1.8V) provided by the battery can be received through the PCB. The above-mentioned power supply voltage (for example, 1.8V) is transmitted to the voltage regulation module 120 after passing through the power input terminal 13 of the package substrate 100 and the pin Vdd (which can be formed by using solder pads or copper pillars) coupled with the power output terminal 14 Inside.
由于电压调节模块120通过管脚Lx与电感20的第一端电极15相耦接,因此由电压调节模块120和电感20构成的电压转换电路102可以对上述电源电压(例如1.8V)进行电压转换,例如降压处理,以将电源电压(例如1.8V)降低至芯片101的供电电压(例如0.9V)。此外,由于电感20的第二端电极16通过电源管脚Ot(为芯片101的多个管脚111中用于向该芯片101提供供电电压的管脚)与芯片101中的处理模块121耦接,因此当处理模块121接收到电源管脚Ot提供的供电电压(例如0.9V)后,可以使得芯片101的处理模块121开始工作,执行该芯片101的主要功能。Since the voltage adjustment module 120 is coupled to the first terminal electrode 15 of the inductor 20 through the pin Lx, the voltage conversion circuit 102 composed of the voltage adjustment module 120 and the inductor 20 can perform voltage conversion on the above-mentioned power supply voltage (for example, 1.8V) , For example, a step-down process to reduce the power supply voltage (for example, 1.8V) to the power supply voltage of the chip 101 (for example, 0.9V). In addition, since the second terminal electrode 16 of the inductor 20 is coupled to the processing module 121 in the chip 101 through the power pin Ot (the pins 111 of the chip 101 used to provide the power supply voltage to the chip 101) Therefore, when the processing module 121 receives the power supply voltage (for example, 0.9V) provided by the power pin Ot, the processing module 121 of the chip 101 can start to work and perform the main functions of the chip 101.
例如,在本申请的一些实施例中,在上述芯片101为上述SoC、CPU或者CPU的情况下,如图4b所示,芯片101的处理模块121的开始工作时,该处理模块121可以通过数据总线(Data bus)向该电子设备01中的其余部件,例如,射频收发器(radio frequency module)、内存(memory)、硬盘、相机(Camera)与图像处理器(imaging processing module)、输入/输出(I/O)接口、人机交互设备(human interactive device)等提供数据。For example, in some embodiments of the present application, when the above-mentioned chip 101 is the above-mentioned SoC, CPU or CPU, as shown in FIG. 4b, when the processing module 121 of the chip 101 starts to work, the processing module 121 can pass data The data bus provides information to the remaining components in the electronic device 01, such as radio frequency module, memory, hard disk, camera and imaging processing module, input/output (I/O) interface, human-computer interaction device (human interactive device), etc. provide data.
又例如,在本申请的另一些实施例中,在上述芯片101为上述PMIC的情况下,如图4b所示,芯片101的处理模块121的开始工作时,该处理模块121可以通过电源总线(power supply bus)或电源供电网络向电子设备01中的其余部件,例如,上述射频收发器、内存、硬盘、相机与图像处理器、输入/输出接口、人机交互设备等提供供电电压。For another example, in some other embodiments of the present application, when the above-mentioned chip 101 is the above-mentioned PMIC, as shown in FIG. 4b, when the processing module 121 of the chip 101 starts to work, the processing module 121 can pass through the power bus ( The power supply bus) or power supply network provides power supply voltage to the remaining components in the electronic device 01, such as the above-mentioned radio frequency transceiver, memory, hard disk, camera and image processor, input/output interface, and human-computer interaction equipment.
这样一来,一方面,由上述可知,封装基板100通过管脚Vdd向芯片101的电压调节模块120提供的电压为电源电压(例如1.8V)。此时,以芯片101所需的电流为50A,每个管脚Vdd的流通能力为1A为例,芯片101与封装基板100之间需要50个管脚Vdd。接下来,在电压转换电路102(包括电压调节模块120和集成于封装基板100内部的电感20)的降压作用后,生成用于向芯片101的处理模块121提供的供电电压(例如0.9V)。In this way, on the one hand, it can be known from the above that the voltage provided by the package substrate 100 to the voltage regulation module 120 of the chip 101 through the pin Vdd is the power supply voltage (for example, 1.8V). At this time, assuming that the current required by the chip 101 is 50A, and the flow capacity of each pin Vdd is 1A, for example, 50 pins Vdd are required between the chip 101 and the packaging substrate 100. Next, after the step-down effect of the voltage conversion circuit 102 (including the voltage adjustment module 120 and the inductor 20 integrated in the package substrate 100), a power supply voltage (for example, 0.9V) for providing to the processing module 121 of the chip 101 is generated .
相对于本申请实施例提供该的电子设备01而言,如果将电压转换电路设置于外部,那么电源电压(例如1.8V)需要先经过外部的电压转换电路降压后,将生成的供电电压(例如0.9V)通过管脚Vdd提供至芯片101。此时,芯片101接收到的电压相比于本申请而言降低一半,因此电流提升一倍(例如为100A),管脚Vdd的数量也会提升一倍(例如为100个)。而本申请实施例提供的电子设备中,芯片101的管脚Vdd较少(例如50个),所以能够有效减小芯片101的面积,有利于减小电子设备01的尺寸。Compared with the electronic device 01 provided in the embodiment of the present application, if the voltage conversion circuit is provided externally, the power supply voltage (for example, 1.8V) needs to be stepped down by the external voltage conversion circuit before the generated power supply voltage ( For example, 0.9V) is provided to the chip 101 through the pin Vdd. At this time, the voltage received by the chip 101 is reduced by half compared with the present application, so the current is doubled (for example, 100A), and the number of pins Vdd is also doubled (for example, 100). In the electronic device provided by the embodiment of the present application, the chip 101 has fewer pins Vdd (for example, 50), so the area of the chip 101 can be effectively reduced, which is beneficial to reducing the size of the electronic device 01.
另一方面,如图4a所示,在将电感20集成于封装基板100中时,可以将电感20设置于靠近芯片101的电源管脚Ot的位置。从而当电压转换电路102将电源电压(例如1.8V)降压至供电电压(例如0.9V)后,电感20的第二端电极16可以将供电电压(例如0.9V)传输至与上述与该电感20距离很近的电源管脚Ot,从而向芯片101的处理模块121进行供电。这样一来,能够减小电池向芯片101提供的供电电压(例如 0.9V)的供电路径,进而减小该供电路径上的寄生电阻的影响降低,上述供电路径上的电流损耗,提高供电效率。On the other hand, as shown in FIG. 4a, when the inductor 20 is integrated in the package substrate 100, the inductor 20 can be disposed at a position close to the power pin Ot of the chip 101. Therefore, after the voltage conversion circuit 102 steps down the power supply voltage (for example, 1.8V) to the power supply voltage (for example, 0.9V), the second terminal electrode 16 of the inductor 20 can transmit the power supply voltage (for example, 0.9V) to the above-mentioned inductor. 20 is a very close power pin Ot, so as to supply power to the processing module 121 of the chip 101. In this way, the power supply path of the power supply voltage (for example, 0.9V) provided by the battery to the chip 101 can be reduced, thereby reducing the influence of the parasitic resistance on the power supply path, the current loss on the power supply path, and the power supply efficiency.
以下对集成有电感20的封装基板100的结构进行详细的举例说明。The structure of the package substrate 100 integrated with the inductor 20 will be described in detail below.
在本申请的一些实施例中,上述封装基板100可以包括如图5所示的芯层(core)30、第一积层(build-up)31以及第二积层32。其中,构成该芯层30的材料可以为树脂材料。该芯层30的厚度较大,从而能够为封装基板100提供足够的强度。其中,上述芯层30具有上表面A和下表面B。上表面A靠近如图2所示的芯片101,下表面B靠近如图2所示的PCB。In some embodiments of the present application, the aforementioned packaging substrate 100 may include a core 30, a first build-up 31, and a second build-up 32 as shown in FIG. 5. Wherein, the material constituting the core layer 30 may be a resin material. The thickness of the core layer 30 is relatively large, so as to provide sufficient strength for the package substrate 100. Wherein, the above-mentioned core layer 30 has an upper surface A and a lower surface B. The upper surface A is close to the chip 101 shown in FIG. 2, and the lower surface B is close to the PCB shown in FIG. 2.
此外,第一积层31位于芯层30的上表面A,第二积层32位于芯层30的下表面B。第一积层31、第二积层32中的任意一个积层可以包括多层金属走线301,以及位于相邻两层金属走线301之间的绝缘层302。该绝缘层302上可以设置导通孔(plating through hole,PTH),从而可以将不同层的金属走线301电连接,形成用于传输信号的互连结构。In addition, the first build-up layer 31 is located on the upper surface A of the core layer 30, and the second build-up layer 32 is located on the lower surface B of the core layer 30. Any one of the first build-up layer 31 and the second build-up layer 32 may include a multilayer metal wiring 301 and an insulating layer 302 located between two adjacent layers of the metal wiring 301. A plating through hole (PTH) can be provided on the insulating layer 302, so that metal traces 301 of different layers can be electrically connected to form an interconnection structure for signal transmission.
在此基础上,如图6a所示,上述芯层30上设置有贯穿芯层30的上表面A和下表面B的空腔303。如图6b所示,集成于封装基板100中的电感20,可以设置于空腔303内。该电感20包括磁芯230和线圈231。磁芯230填充于上述空腔303内。On this basis, as shown in FIG. 6 a, the core layer 30 is provided with a cavity 303 penetrating the upper surface A and the lower surface B of the core layer 30. As shown in FIG. 6b, the inductor 20 integrated in the package substrate 100 may be disposed in the cavity 303. The inductor 20 includes a magnetic core 230 and a coil 231. The magnetic core 230 is filled in the cavity 303 described above.
在本申请的一些实施例中,构成磁芯230的材料可以包括软磁复合(Soft Magnetic Composite,SMC)材料。该SMC材料包括磁性颗粒和树脂材料。通过将上述磁性颗粒和树脂材料复合在一起可以形成SMC材料。其中,上述磁性颗粒可以为铁硅铬合金颗粒、羰基铁颗粒、或者铁基非晶颗粒。上述SMC材料的相对磁导率通常可以为5~10。In some embodiments of the present application, the material constituting the magnetic core 230 may include a soft magnetic composite (SMC) material. The SMC material includes magnetic particles and resin materials. The SMC material can be formed by combining the above-mentioned magnetic particles and the resin material. Wherein, the above-mentioned magnetic particles may be iron-silicon-chromium alloy particles, carbonyl iron particles, or iron-based amorphous particles. The relative permeability of the aforementioned SMC material can usually be 5-10.
此外,如图7a所示,上述线圈231包括至少一个导线段。上述至少一个导线段包括第一金属走线41,以及贯穿磁芯230的第一导通孔51和第二导通孔52。如图7b所示,第一金属走线41设置于芯层30的下表面B。In addition, as shown in FIG. 7a, the aforementioned coil 231 includes at least one wire segment. The aforementioned at least one wire segment includes a first metal trace 41, and a first through hole 51 and a second through hole 52 penetrating the magnetic core 230. As shown in FIG. 7b, the first metal trace 41 is disposed on the lower surface B of the core layer 30.
芯层30的纵向截面图如图7c(沿图7a中的虚线O-O进行剖切得到的剖视图)所示,第一导通孔51和第二导通孔52中任意一个导通孔(vias)可以贯穿芯层30的上表面A和下表面B。该第一导通孔51和第二导通孔52的孔壁上覆盖有金属材质的导电层40。在本申请的一些实施例中,还可以在孔壁上覆盖有导电层的第一导通孔51和第二导通孔52内填充树脂材料。The longitudinal cross-sectional view of the core layer 30 is shown in FIG. 7c (a cross-sectional view cut along the dashed line OO in FIG. 7a), and any one of the first via 51 and the second via 52 is vias. The upper surface A and the lower surface B of the core layer 30 may be penetrated. The walls of the first via 51 and the second via 52 are covered with a conductive layer 40 made of metal. In some embodiments of the present application, the first via 51 and the second via 52 covered with a conductive layer on the wall of the hole may also be filled with resin material.
此外,第一金属走线41的第一端与第一导通孔51位于芯层30下表面B的一端相耦接。第一金属走线41的第二端与第二导通孔52位于芯层30下表面B的一端相耦接,从而构成上述线圈231。In addition, the first end of the first metal trace 41 is coupled to the end of the first via 51 located on the lower surface B of the core layer 30. The second end of the first metal trace 41 is coupled to the end of the second via 52 located on the lower surface B of the core layer 30 to form the aforementioned coil 231.
综上所述,为了将电感20集成于封装基板100中,可以在该封装基板100的芯层30内先制作如图6a所示的,贯穿该芯层30的上表面A和下表面B的空腔303。接下来,在该空腔303内埋入磁芯材料,以形成填充于该空腔303中的磁芯230(如图6b所示)。然后,在该磁芯230上通过钻孔工艺形成贯穿磁芯230的孔,并采用电镀工艺在对孔的内壁进行金属化处理,形成如图7c所示的导电层40,从而完成第一导通孔51和第二导通孔52的制备。接下来,在芯层30的下表面B,制作第一金属走线41,以将第一导通孔51和第二导通孔52相耦接。To sum up, in order to integrate the inductor 20 into the package substrate 100, the core layer 30 of the package substrate 100 can be fabricated as shown in FIG. 6a, which penetrates the upper surface A and the lower surface B of the core layer 30. Cavity 303. Next, a magnetic core material is embedded in the cavity 303 to form a magnetic core 230 filled in the cavity 303 (as shown in FIG. 6b). Then, a hole through the magnetic core 230 is formed on the magnetic core 230 by a drilling process, and the inner wall of the hole is metalized by an electroplating process to form a conductive layer 40 as shown in FIG. 7c, thereby completing the first conductive layer. Preparation of the through hole 51 and the second via hole 52. Next, on the lower surface B of the core layer 30, a first metal wiring 41 is made to couple the first via 51 and the second via 52.
在此情况下,由上述可知,为了使得电感20与芯片101中的电压调节模块120 以及芯片101中的处理模块121相耦接,该电感20可以包括如图4a所示的第一端电极15和第二端电极16。In this case, it can be seen from the above that in order to couple the inductor 20 with the voltage regulating module 120 in the chip 101 and the processing module 121 in the chip 101, the inductor 20 may include the first terminal electrode 15 as shown in FIG. 4a. And the second terminal electrode 16.
为了形成上述电感20的第一端电极15和第二端电极16,如图8所示,芯层30上表面A的第一积层31包括第一互连结构311、第二互连结构312、第一焊盘313以及第二焊盘314。上述第一互连结构311或第二互连结构312中的任意一种互连结构,主要由该第一积层31中的PTH以及多层金属走线301(如图5所示)构成。In order to form the first terminal electrode 15 and the second terminal electrode 16 of the above-mentioned inductor 20, as shown in FIG. 8, the first build-up layer 31 on the upper surface A of the core layer 30 includes a first interconnect structure 311 and a second interconnect structure 312. , The first pad 313 and the second pad 314. Either the first interconnection structure 311 or the second interconnection structure 312 is mainly composed of the PTH in the first build-up layer 31 and the multilayer metal wiring 301 (as shown in FIG. 5).
基于此,第一互连结构311靠近芯层30的一端,与第一导通孔51位于芯层30上表面A的一端相耦接。第一互连结构311远离芯层30的一端与第一焊盘313相耦接。在此情况下,上述第一焊盘313可以作为电感20的第一端电极15(如图4a所示)。该第一端电极15可以通过管脚Lx与芯片101中的电压调节模块120相耦接。该电压调节模块120中集成有电压转换电路102中除了电感20以外的其他元件(例如,如图3所示的发光二极管D)。Based on this, the first interconnect structure 311 is close to an end of the core layer 30 and is coupled to an end of the first via 51 located on the upper surface A of the core layer 30. An end of the first interconnect structure 311 away from the core layer 30 is coupled to the first pad 313. In this case, the above-mentioned first pad 313 can be used as the first terminal electrode 15 of the inductor 20 (as shown in FIG. 4a). The first terminal electrode 15 can be coupled to the voltage adjustment module 120 in the chip 101 through the pin Lx. The voltage regulation module 120 integrates other elements (for example, the light emitting diode D shown in FIG. 3) in the voltage conversion circuit 102 except for the inductor 20.
此外,第二互连结构312靠近芯层30的一端,与第二导通孔52位于芯层30上表面A的一端相耦接。第二互连结构312远离芯层30的一端与第二焊盘314相耦接。在此情况下,上述第二焊盘314可以作为电感20的第二端电极16(如图4a所示)。该第二端电极16可以通过电源管脚Ot与芯片101中的处理模块121相耦接。在此情况下,上述第二端电极16可以为图3或图6b中电压转换电路102的输出端Uo。In addition, the second interconnect structure 312 is close to an end of the core layer 30 and is coupled to an end of the second via 52 located on the upper surface A of the core layer 30. An end of the second interconnect structure 312 away from the core layer 30 is coupled to the second pad 314. In this case, the above-mentioned second pad 314 can be used as the second terminal electrode 16 of the inductor 20 (as shown in FIG. 4a). The second terminal electrode 16 can be coupled to the processing module 121 in the chip 101 through the power pin Ot. In this case, the above-mentioned second terminal electrode 16 may be the output terminal Uo of the voltage conversion circuit 102 in FIG. 3 or FIG. 6b.
在此基础上,由上述可知,电子设备01中的电池提供的电源电压(例如1.8V),可以经过该封装基板100的电源输入端子13(如图4a),以及与该电源输出端子14耦接的管脚Vdd后,传输至电压调节模块120内。On this basis, it can be seen from the above that the power supply voltage (for example, 1.8V) provided by the battery in the electronic device 01 can pass through the power input terminal 13 of the package substrate 100 (as shown in FIG. 4a) and be coupled to the power output terminal 14. After the connected pin Vdd, it is transmitted to the voltage regulation module 120.
为了形成上述电源输入端子13和电源输出端子14,如图8所示,芯层30下表面B的第二积层32包括远离芯层30第三焊盘315。芯层30上表面A的第一积层31还包括远离芯层30一侧的第四焊盘316。此外,上述封装基板100还包括贯穿芯层30、第一积层31以及第二积层32内的第三互连结构317。In order to form the power input terminal 13 and the power output terminal 14 described above, as shown in FIG. 8, the second build-up layer 32 on the lower surface B of the core layer 30 includes a third pad 315 away from the core layer 30. The first build-up layer 31 on the upper surface A of the core layer 30 further includes a fourth pad 316 on the side away from the core layer 30. In addition, the above-mentioned package substrate 100 further includes a third interconnect structure 317 penetrating through the core layer 30, the first build-up layer 31 and the second build-up layer 32.
基于此,第三互连结构317的第一端与第三焊盘315耦接,第二端与第四焊盘316耦接。在此情况下,第三焊盘315可以作为封装基板100的电源输入端子13(如图4a所示),第三焊盘315与封装基板100下方的管脚VDD相耦接。此外,上述第四焊盘316可以作为封装基板100的电源输出端子14(如图4a所示)。该第四焊盘316与芯片101下方的管脚Vdd相耦接。Based on this, the first end of the third interconnect structure 317 is coupled to the third pad 315, and the second end is coupled to the fourth pad 316. In this case, the third pad 315 can be used as the power input terminal 13 of the packaging substrate 100 (as shown in FIG. 4a), and the third pad 315 is coupled to the pin VDD under the packaging substrate 100. In addition, the fourth pad 316 can be used as the power output terminal 14 of the package substrate 100 (as shown in FIG. 4a). The fourth pad 316 is coupled to the pin Vdd under the chip 101.
这样一来,PCB可以将电池提供的电源电压(例如1.8V),通过封装基板100下方的管脚VDD以及电源输入端子13传输至第三互连结构317。该第三互连结构317将上述电源电压(例如1.8V)通过电源输出端子14、管脚Vdd传输至芯片101中的电压调节模块120。接下来,由于电压调节模块120通过管脚Lx与电感20的第一端电极15相耦接,因此由电压调节模块120和电感20构成的电压转换电路102可以对上述电源电压(例如1.8V)进行电压转换,例如降压处理,以将电源电压(例如1.8V)降低至芯片101的供电电压(例如0.9V)。电感20的第二端电极16作为上述电压转换电路102的输出端Uo,向芯片101中的处理模块121提供供电电压,处理模块121开始工作。In this way, the PCB can transmit the power supply voltage (for example, 1.8V) provided by the battery to the third interconnection structure 317 through the pin VDD and the power input terminal 13 under the packaging substrate 100. The third interconnect structure 317 transmits the above-mentioned power supply voltage (for example, 1.8V) to the voltage regulation module 120 in the chip 101 through the power output terminal 14 and the pin Vdd. Next, since the voltage regulation module 120 is coupled to the first terminal electrode 15 of the inductor 20 through the pin Lx, the voltage conversion circuit 102 composed of the voltage regulation module 120 and the inductor 20 can perform the above-mentioned power supply voltage (for example, 1.8V) A voltage conversion, such as a step-down process, is performed to reduce the power supply voltage (for example, 1.8V) to the power supply voltage of the chip 101 (for example, 0.9V). The second terminal electrode 16 of the inductor 20 is used as the output terminal Uo of the voltage conversion circuit 102 to provide a supply voltage to the processing module 121 in the chip 101, and the processing module 121 starts to work.
由上述可知,为了将电感20集成于封装基板100中,封装基板100的芯层30中 形成的空腔303填充有由磁性材料构成的磁芯230,该磁芯230内设置有第一导通孔51和第二导通孔52。该电感20中的线圈231包括第一导通孔51、第二导通孔52以及用于将第一导通孔51、第二导通孔52耦接的第一金属走线41。因此该线圈231的绝大部分均被磁芯230包裹。这样一来,当电感20中的线圈231通过电流时,第一导通孔51、第二导通孔52周围的磁性材料可以增强该第一导通孔51、第二导通孔52周围的磁场,从而可以提升该电感20的电感量。It can be seen from the above that, in order to integrate the inductor 20 into the packaging substrate 100, the cavity 303 formed in the core layer 30 of the packaging substrate 100 is filled with a magnetic core 230 made of a magnetic material, and the magnetic core 230 is provided with a first conduction Hole 51 and second via hole 52. The coil 231 in the inductor 20 includes a first via 51, a second via 52, and a first metal wire 41 for coupling the first via 51 and the second via 52. Therefore, most of the coil 231 is wrapped by the magnetic core 230. In this way, when the coil 231 in the inductor 20 passes current, the magnetic material around the first through hole 51 and the second through hole 52 can strengthen the magnetic material around the first through hole 51 and the second through hole 52. The magnetic field can increase the inductance of the inductor 20.
在此基础上,为了进一步增加上述电感20的电感量,可以增加线圈231的圈数。示例的,上述线圈231包括如图9a所示的第一导线段300a和第二导线段300b。该第一导线段300a和第二导线段300b中任意一个导线段的结构同上所述,可以包括第一导通孔51、第二导通孔52以及用于将第一导通孔51、第二导通孔52耦接的第一金属走线41。On this basis, in order to further increase the inductance of the aforementioned inductor 20, the number of turns of the coil 231 can be increased. For example, the above-mentioned coil 231 includes a first wire segment 300a and a second wire segment 300b as shown in FIG. 9a. The structure of any one of the first wire segment 300a and the second wire segment 300b is the same as that described above, and may include a first via 51, a second via 52, and for connecting the first via 51 and the second via 51. The first metal trace 41 coupled to the two vias 52.
基于此,为了减小电感的直流电阻,如图10(由图9a中的C向得到的视图)所示,第一导线段300a和第二导线段300b中任意一个导线段的第一金属走线41在芯层30上的垂直投影,位于磁芯230所在的范围内。从而可以减小第一金属走线41的长度。Based on this, in order to reduce the DC resistance of the inductor, as shown in FIG. 10 (a view taken from the direction C in FIG. 9a), the first metal trace of any one of the first wire segment 300a and the second wire segment 300b is The vertical projection of the line 41 on the core layer 30 is located within the range where the magnetic core 230 is located. Thus, the length of the first metal wiring 41 can be reduced.
此外,如图9a所示,上述线圈231还包括第二金属走线42。将图9a的结构进行翻转后,如图9b所示,第二金属走线42设置于芯层30的上表面A。第二金属走线42的第一端与第一导线段300a的第二导通孔52位于芯层30上表面的A一端相耦接。第二金属走线42的第二端与第二导线段300b的第一导通孔51位于芯层30上表面A的一端相耦接。In addition, as shown in FIG. 9a, the aforementioned coil 231 further includes a second metal trace 42. After the structure of FIG. 9a is turned over, as shown in FIG. 9b, the second metal trace 42 is disposed on the upper surface A of the core layer 30. The first end of the second metal trace 42 is coupled to the end A of the second via 52 of the first wire segment 300 a located on the upper surface of the core layer 30. The second end of the second metal trace 42 is coupled to an end of the first through hole 51 of the second wire segment 300 b located on the upper surface A of the core layer 30.
同理,为了减小电感的直流电阻,如图10(由图9a中的C向得到的视图)所示,第二金属走线42在芯层30上的垂直投影,可以位于磁芯230所在的范围内。从而可以减小第二金属走线42的长度。In the same way, in order to reduce the DC resistance of the inductor, as shown in FIG. 10 (a view taken from the direction C in FIG. 9a), the vertical projection of the second metal trace 42 on the core layer 30 may be located where the magnetic core 230 is located. In the range. Therefore, the length of the second metal trace 42 can be reduced.
基于此,为了使得图9b所示的电感20与芯片101中的电压调节模块120以及芯片101中的处理模块121相耦接,同理可得,图8中第一积层31中的第一焊盘313可以与图9b所示的第一导线段300a的第一导通孔51相耦接。当第一焊盘313作为电感20的第一端电极15时,可以通过第一端电极15将电压调节模块120输出的电信号(例如电压和电流)传输至第一导线段300a的第一导通孔51,朝向芯层30上表面A(图10中未示出)的一端。从而可以使得电感20进行储能和滤波。Based on this, in order to couple the inductor 20 shown in FIG. 9b with the voltage regulating module 120 in the chip 101 and the processing module 121 in the chip 101, the same principle can be obtained, the first in the first build-up layer 31 in FIG. The pad 313 may be coupled with the first via 51 of the first wire segment 300a shown in FIG. 9b. When the first pad 313 is used as the first terminal electrode 15 of the inductor 20, the electrical signal (such as voltage and current) output by the voltage regulation module 120 can be transmitted to the first conductor of the first wire segment 300a through the first terminal electrode 15. The through hole 51 faces one end of the upper surface A (not shown in FIG. 10) of the core layer 30. Thus, the inductor 20 can store energy and filter.
基于此,当电压调节模块120输出的电流流入如图10(图10中,采用“×”表示电流垂直于纸面向里;“·”表示电流垂直于纸面向外)所示的第一导线段300a的第一导通孔51,朝向芯层30上表面A(图10中未示出)的一端时,上述电流由第一导线段300a的第一导通孔51,朝向芯层30下表面B的一端流出,并通过第一导线段300a的第一金属走线41(位于芯层30的下表面B),流入第一导线段300a的第二导通孔52,朝向芯层30下表面B的一端。接下来,再由第一导线段300a的第二导通孔52,朝向芯层30上表面A的一端流向位于芯层30上表面A的第二金属走线42。Based on this, when the current output by the voltage regulation module 120 flows into the first wire segment shown in FIG. 10 (in FIG. 10, "×" indicates that the current is perpendicular to the paper surface inward; "·" indicates that the current is perpendicular to the paper surface outward). When the first through hole 51 of 300a faces one end of the upper surface A (not shown in FIG. 10) of the core layer 30, the above-mentioned current flows from the first through hole 51 of the first wire segment 300a toward the lower surface of the core layer 30 One end of B flows out, passes through the first metal trace 41 of the first wire segment 300a (located on the lower surface B of the core layer 30), flows into the second via hole 52 of the first wire segment 300a, and faces the lower surface of the core layer 30 One end of B. Next, the second conductive hole 52 of the first wire segment 300a flows toward the end of the upper surface A of the core layer 30 to the second metal trace 42 located on the upper surface A of the core layer 30.
接下来,上述电流通过第二金属走线42流入第二导线段300b的第一导通孔51,朝向芯层30上表面A的一端。然后,第二导线段300b的第一导通孔51,朝向芯层30下表面B的一端流出,并流入第二导线段300b的第一金属走线41(位于芯层30 的下表面B),在由该第二导线段300b的第一金属走线41流向第二导线段300b的第二导通孔52,朝向芯层30下表面B的一端。接下来,上述电流经过第二导线段300b的第二导通孔52,流向该第二导线段300b的第二导通孔52,朝向芯层30上表面A的一端。Next, the above-mentioned current flows into the first via hole 51 of the second wire segment 300 b through the second metal trace 42, and faces one end of the upper surface A of the core layer 30. Then, the first via 51 of the second wire segment 300b flows out toward one end of the lower surface B of the core layer 30, and flows into the first metal trace 41 of the second wire segment 300b (located on the lower surface B of the core layer 30) , The first metal trace 41 flowing from the second wire segment 300b to the second via hole 52 of the second wire segment 300b faces one end of the lower surface B of the core layer 30. Next, the above-mentioned current passes through the second via hole 52 of the second wire segment 300 b, flows to the second via hole 52 of the second wire segment 300 b, and faces one end of the upper surface A of the core layer 30.
此外,图8中第一积层31中的第二焊盘314可以与图9b所示的第二导线段300b的第二导通孔52,朝向芯层30上表面A的一端相耦接。当第二焊盘314作为电感20的第二端电极16时,可以将经过电感20滤波处理后的电信号,通过上述第二端电极16传输至芯片101中的处理模块121,以向该处理模块121提供上述供电电压。In addition, the second pad 314 in the first build-up layer 31 in FIG. 8 may be coupled to the end of the second via hole 52 of the second wire segment 300b shown in FIG. 9b facing the upper surface A of the core layer 30. When the second pad 314 is used as the second terminal electrode 16 of the inductor 20, the electrical signal filtered by the inductor 20 can be transmitted to the processing module 121 in the chip 101 through the second terminal electrode 16 for processing The module 121 provides the above-mentioned power supply voltage.
综上所述,电感20中的线圈231,如图9b所示包括通过第二金属走线42相耦接的第一导线段300a和第二导线段300b。因此通过增加该线圈231的导线段的数量,可以达到增加电感20电感量的目的。To sum up, the coil 231 in the inductor 20, as shown in FIG. 9b, includes a first wire segment 300a and a second wire segment 300b that are coupled by the second metal trace 42. Therefore, by increasing the number of wire segments of the coil 231, the purpose of increasing the inductance of the inductor 20 can be achieved.
示例的,当本申请实施例提供该的电子设备01采用如图9b所示的电感20时,当上述电子设备01的电压转换电路102中,开关管Q(如图3所示)的开关频率达到100MHz时,该电感20的电感量可以达到7.58nH左右。相对于现有的集成与基板中的空气电感(电感量2.1nH),以及在基板的通孔内埋入磁性材料构成的电感(电感量5.69nH)而言,本申请实施例提供的电感20的电感量有较大的提升。For example, when the electronic device 01 provided in the embodiment of the present application uses the inductor 20 as shown in FIG. 9b, when the voltage conversion circuit 102 of the electronic device 01, the switching frequency of the switch Q (as shown in FIG. 3) is When it reaches 100MHz, the inductance of the inductor 20 can reach about 7.58nH. Compared with the existing integrated and substrate air inductance (inductance 2.1nH), and the inductance (inductance 5.69nH) formed by embedding magnetic materials in the through holes of the substrate, the inductor 20 provided by the embodiment of the present application The inductance has been greatly improved.
以下,对上述电感20中的磁芯230的结构进行说明。在本申请的一些实施例中,如图10所示,上述磁芯230的横截面可以矩形或者近似矩形。在此情况下,上述制作于芯层30中的空腔303的横截面可以为矩形或者近似矩形的规则形状。这样一来,可以简化制作空腔303的工艺。其中,磁芯230的横截面可以与芯层30的上表面A或下表面B平行。Hereinafter, the structure of the magnetic core 230 in the above-mentioned inductor 20 will be described. In some embodiments of the present application, as shown in FIG. 10, the cross section of the above-mentioned magnetic core 230 may be rectangular or approximately rectangular. In this case, the cross section of the cavity 303 made in the core layer 30 may be rectangular or a regular shape approximately rectangular. In this way, the process of making the cavity 303 can be simplified. The cross section of the magnetic core 230 may be parallel to the upper surface A or the lower surface B of the core layer 30.
此外,由上述可知,第一导线段300a、第二导线段300b中任意一个导线段中的第一导通孔51和第二导通孔52上均有电流流过,因此,如图11所示,上述任意一个导线段中的第一导通孔51和第二导通孔52周边具有较强的磁场。图11中,该磁场所在的区域采用位于上述任意一个导通孔周边的虚线圈①表示。In addition, it can be seen from the above that current flows through the first via 51 and the second via 52 in any one of the first wire segment 300a and the second wire segment 300b. Therefore, as shown in FIG. 11 It is shown that the periphery of the first through hole 51 and the second through hole 52 in any of the above-mentioned wire segments has a relatively strong magnetic field. In Fig. 11, the area where the magnetic field is located is represented by a dashed circle ① located around any one of the above-mentioned via holes.
在此基础上,磁芯230中距离上述任意一个导通孔越远的区域,该区域的磁场强度越小。例如,图11中虚线圈②所在范围的磁场强度,大于虚线圈③所在范围的磁场强度。On this basis, the farther the area of the magnetic core 230 from any one of the above-mentioned via holes is, the smaller the magnetic field intensity in this area is. For example, in Fig. 11, the magnetic field strength in the range of the dashed circle ② is greater than the magnetic field strength in the range of the dashed circle ③.
此外,如图10所示,第一导线段300a的第一导通孔51和第一导线段300a的第二导通孔52上电流传输的方向相反。根据右手定则,第一导线段300a的第一导通孔51周围的磁感应线呈逆时针,而第一导线段300a的第二导通孔52周围的磁感应线呈顺时针。这样一来,在第一导线段300a的第一导通孔51和第一导线段300a的第二导通孔52之间的部分,由上述第一导通孔51和第二导通孔52产生的磁感应线的方向相同。In addition, as shown in FIG. 10, the directions of current transmission on the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a are opposite. According to the right-hand rule, the magnetic induction line around the first via hole 51 of the first wire segment 300a is counterclockwise, and the magnetic induction line around the second via hole 52 of the first wire segment 300a is clockwise. In this way, the portion between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a is formed by the first via 51 and the second via 52. The directions of the generated magnetic induction lines are the same.
因此,第一导线段300a的第一导通孔51和第一导线段300a的第二导通孔52之间的磁场强度,小于第一导通孔51或第二导通孔52周边部分的磁场。同理,第二导线段300b的第一导通孔51和第二导线段300b的第二导通孔52之间的磁场强度,小于第一导通孔51或第二导通孔52周边部分的磁场。Therefore, the intensity of the magnetic field between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a is smaller than that of the peripheral portion of the first via 51 or the second via 52. magnetic field. In the same way, the magnetic field strength between the first via 51 of the second wire segment 300b and the second via 52 of the second wire segment 300b is smaller than the peripheral portion of the first via 51 or the second via 52 Magnetic field.
另外,由于第一导线段300a的第一导通孔51和第二导线段300b的第一导通孔 51上电流传输的方向相同。根据右手定则,第一导线段300a的第一导通孔51和第二导线段300b的第一导通孔51周围的磁感应线均呈逆时针。因此,第一导线段300a的第一导通孔51和第二导线段300b的第一导通孔51之间的部分,由第一导线段300a的第一导通孔51和第二导线段300b的第一导通孔51产生的磁感应线的方向相反。In addition, since the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b have the same direction of current transmission. According to the right-hand rule, the magnetic induction lines around the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b are all counterclockwise. Therefore, the portion between the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b is defined by the first via 51 of the first wire segment 300a and the second wire segment. The direction of the magnetic induction line generated by the first via hole 51 of 300b is opposite.
因此,第一导线段300a的第一导通孔51和第二导线段300b的第一导通孔51之间的磁场强度,小于第一导线段300a的第一导通孔51和第一导线段300a的第二导通孔52之间的磁场强度。如图11所示,虚线圈②和虚线圈③在第一导线段300a的第一导通孔51和第二导线段300b的第一导通孔51之间的位置向内凹陷程度,大于圈②和虚线圈③在第一导线段300a的第一导通孔51和第一导线段300a的第二导通孔52之间的位置向内凹陷程度。Therefore, the intensity of the magnetic field between the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b is smaller than that of the first via 51 and the first wire of the first wire segment 300a. The intensity of the magnetic field between the second via holes 52 of the segment 300a. As shown in FIG. 11, the dashed circle ② and the dashed circle ③ are recessed inwardly at a position between the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b, which is larger than the circle ② and the dotted circle ③ are inwardly recessed at the position between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a.
同理,第一导线段300a的第二导通孔52和第二导线段300b的第二导通孔52之间的磁场强度,也小于第一导线段300a的第一导通孔51和第一导线段300a的第二导通孔52之间的磁场强度。如图11所示,虚线圈②和虚线圈③在第一导线段300a的第二导通孔52和第二导线段300b的第二导通孔52之间的位置向内凹陷程度,大于圈②和虚线圈③在第一导线段300a的第一导通孔51和第一导线段300a的第二导通孔52之间的位置向内凹陷程度。In the same way, the magnetic field strength between the second via 52 of the first wire segment 300a and the second via 52 of the second wire segment 300b is also smaller than that of the first via 51 and the second via 51 of the first wire segment 300a. The intensity of the magnetic field between the second via holes 52 of a wire segment 300a. As shown in FIG. 11, the dashed circle ② and the dashed circle ③ are recessed inwardly in the position between the second via 52 of the first wire segment 300a and the second via 52 of the second wire segment 300b, which is larger than the circle ② and the dotted circle ③ are inwardly recessed at the position between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a.
基于此,为了节省构成磁芯230的材料,在本申请的另一些实施例中,在磁场强度小于上述任意一个导通孔周边部分磁场的位置,不再设置磁性材料。例如,图11中第一导线段300a的第一导通孔51和第一导线段300a的第二导通孔52之间的部分。又例如,第二导线段300b的第一导通孔51和第二导线段300b的第二导通孔52之间的部分。再例如,第一导线段300a的第一导通孔51和第二导线段300b的第一导通孔51之间的部分。或者,再例如,第一导线段300a的第二导通孔52和第二导线段300b的第二导通孔52之间的部分,不再设置磁性材料。Based on this, in order to save the material constituting the magnetic core 230, in some other embodiments of the present application, no magnetic material is provided at a position where the magnetic field intensity is less than the magnetic field around any one of the above-mentioned via holes. For example, the portion between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a in FIG. 11. For another example, the portion between the first via 51 of the second wire segment 300b and the second via 52 of the second wire segment 300b. For another example, the portion between the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b. Or, for another example, the portion between the second through hole 52 of the first wire segment 300a and the second through hole 52 of the second wire segment 300b is no longer provided with magnetic material.
在此情况下,磁芯230的结构如图12所示,磁芯230具有与芯层30的上表面A或下表面B垂直的至少一个侧面S。上述磁芯230包括在磁芯230的至少一个侧面S上,设置的向磁芯230内部凹陷的凹陷部400。该凹陷部400位于任意相邻两个导通孔之间。这样一来,通过在磁芯230上设置上述凹陷部400,能够在保证电感20的电感量不会大幅下降的基础上,减少制作磁芯230的材料,达到降低制作成本的目的。In this case, the structure of the magnetic core 230 is as shown in FIG. 12, and the magnetic core 230 has at least one side surface S perpendicular to the upper surface A or the lower surface B of the core layer 30. The above-mentioned magnetic core 230 includes a recess 400 that is provided on at least one side surface S of the magnetic core 230 and recessed toward the inside of the magnetic core 230. The recess 400 is located between any two adjacent via holes. In this way, by providing the above-mentioned recess 400 on the magnetic core 230, it is possible to reduce the material used to make the magnetic core 230 while ensuring that the inductance of the inductor 20 will not be greatly reduced, so as to achieve the purpose of reducing the manufacturing cost.
在本申请的另一些实施例中,如图13所示,上述磁芯230可以具有第一侧面S1和第二侧面S2。其中,第一侧面S1与第一导线段300a的第一导通孔51和第二导通孔52的轴线所在的平面(即E1-E2的连线所在的平面)平行。第二侧面S2与第一导线段300a的第一导通孔51和第二导线段300b的第一导通孔51的轴线所在的平面(即E1-E3的连线所在的平面)平行。In other embodiments of the present application, as shown in FIG. 13, the magnetic core 230 may have a first side surface S1 and a second side surface S2. The first side surface S1 is parallel to the plane where the axes of the first through hole 51 and the second through hole 52 of the first wire segment 300a are located (that is, the plane where the connection line of E1-E2 is located). The second side surface S2 is parallel to the plane where the axes of the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b are located (that is, the plane where the connection line of E1-E3 is located).
基于此,如图13所示,上述第一侧面S1上设置有第一凹陷部400a,第二侧面S2上设置有第二凹陷部400b。由上述可知,如图11所示,由于虚线圈②和虚线圈③在第一导线段300a的第一导通孔51和第二导线段300b的第一导通孔51之间的位置向内凹陷程度,大于圈②和虚线圈③在第一导线段300a的第一导通孔51和第一导线段300a的第二导通孔52之间的位置向内凹陷程度。所以设置于第二侧面S2上的第二凹陷部400b的横截面积可以大于设置于第一侧面上的第一凹陷部400a的横截面积。从 而可以在保证电感20的电感量不会大幅下降的基础上,能够根据需要分别去除第一凹陷部400a和第二凹陷部400b位置处的磁性材料。Based on this, as shown in FIG. 13, the first side surface S1 is provided with a first recessed portion 400 a, and the second side surface S2 is provided with a second recessed portion 400 b. It can be seen from the above that, as shown in FIG. 11, the dashed circle ② and the dashed circle ③ are located inwardly between the first via 51 of the first wire segment 300a and the first via 51 of the second wire segment 300b. The degree of depression is greater than the degree of inward depression of the circle ② and the dotted circle ③ between the first via 51 of the first wire segment 300a and the second via 52 of the first wire segment 300a. Therefore, the cross-sectional area of the second recessed portion 400b provided on the second side surface S2 may be larger than the cross-sectional area of the first recessed portion 400a provided on the first side surface. Therefore, on the basis of ensuring that the inductance of the inductor 20 will not be greatly reduced, the magnetic material at the positions of the first recessed portion 400a and the second recessed portion 400b can be removed as needed.
其中,上述第一凹陷部400a和第二凹陷部400b的横截面,可以与芯层30的上表面A或下表面B平行。Wherein, the cross-sections of the first recessed portion 400a and the second recessed portion 400b may be parallel to the upper surface A or the lower surface B of the core layer 30.
需要说明的是,为了进一步增加上述电感20的电感量,上述是以线圈231可以包括如图9a所示的第一导线段300a和第二导线段300b为例,对增加线圈231的圈数进行的举例说明。在本申请的另一些实施例中,如图14所示,为了增加线圈231的圈数,该线圈231可以包括第一导线段300a、第二导线段300b以及第三导线段300c。第一导线段300a、第二导线段300b以及第三导线段300c中任意一个导线段的结构同上所述,可以包括第一导通孔51、第二导通孔52以及用于将第一导通孔51、第二导通孔52耦接的第一金属走线41。It should be noted that, in order to further increase the inductance of the above-mentioned inductor 20, the above is based on the example that the coil 231 may include the first wire segment 300a and the second wire segment 300b as shown in FIG. 9a, and the number of turns of the coil 231 is increased. For example. In other embodiments of the present application, as shown in FIG. 14, in order to increase the number of turns of the coil 231, the coil 231 may include a first wire segment 300a, a second wire segment 300b, and a third wire segment 300c. The structure of any one of the first wire segment 300a, the second wire segment 300b, and the third wire segment 300c is the same as that described above, and may include a first via 51, a second via 52, and for connecting the first via The first metal trace 41 is coupled to the through hole 51 and the second via hole 52.
此外,上述线圈231还包括第二金属走线42和第三金属走线43。第二金属走线42的设置方式同上所述,此处不再赘述。第三金属走线43与第二金属走线42均设置于芯层30的上表面A。第三金属走线43的第一端与第二导线段300b的第二导通孔52位于芯层30上表面的A一端相耦接。第三金属走线43的第二端与第三导线段300c的第一导通孔51位于芯层30上表面A的一端相耦接。当线圈231包括三个以上的导线段时,该线圈231中各个导通孔以及金属走线的设置方式同上所述,此处不再赘述。In addition, the aforementioned coil 231 further includes a second metal wire 42 and a third metal wire 43. The arrangement of the second metal wiring 42 is the same as that described above, and will not be repeated here. The third metal wiring 43 and the second metal wiring 42 are both disposed on the upper surface A of the core layer 30. The first end of the third metal trace 43 is coupled to the end A of the second via hole 52 of the second wire segment 300 b located on the upper surface of the core layer 30. The second end of the third metal trace 43 is coupled to an end of the first through hole 51 of the third wire segment 300 c located on the upper surface A of the core layer 30. When the coil 231 includes more than three wire segments, the arrangement of each via hole and the metal wiring in the coil 231 is the same as described above, and will not be repeated here.
以上所述,仅为本申请的具体实施方式,但本申请的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本申请揭露的技术范围内,可轻易想到变化或替换,都应涵盖在本申请的保护范围之内。因此,本申请的保护范围应以所述权利要求的保护范围为准。The above are only specific implementations of this application, but the protection scope of this application is not limited to this. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed in this application. Should be covered within the scope of protection of this application. Therefore, the protection scope of this application should be subject to the protection scope of the claims.

Claims (12)

  1. 一种集成有电感的封装基板,其特征在于,包括:A package substrate integrated with an inductor, which is characterized in that it comprises:
    芯层,具有空腔;所述空腔贯穿所述芯层的上表面和下表面;The core layer has a cavity; the cavity penetrates the upper surface and the lower surface of the core layer;
    电感,位于所述空腔内;所述电感包括磁芯以及线圈;所述磁芯填充于所述空腔内;The inductor is located in the cavity; the inductor includes a magnetic core and a coil; the magnetic core is filled in the cavity;
    其中,所述线圈包括至少一个导线段;所述至少一个导线段包括第一金属走线,以及贯穿所述磁芯的第一导通孔和第二导通孔;Wherein, the coil includes at least one wire segment; the at least one wire segment includes a first metal trace, and a first via hole and a second via hole penetrating the magnetic core;
    所述第一金属走线设置于所述芯层的下表面;所述第一金属走线的第一端与所述第一导通孔位于所述芯层下表面的一端相耦接;所述第一金属走线的第二端与所述第二导通孔位于所述芯层下表面的一端相耦接。The first metal trace is disposed on the lower surface of the core layer; the first end of the first metal trace is coupled to the end of the first via hole located on the lower surface of the core layer; The second end of the first metal trace is coupled to an end of the second through hole located on the lower surface of the core layer.
  2. 根据权利要求1所述的集成有电感的封装基板,其特征在于,所述线圈包括第一导线段、第二导线段,以及第二金属走线;The package substrate integrated with inductors according to claim 1, wherein the coil includes a first wire segment, a second wire segment, and a second metal trace;
    所述第二金属走线设置于所述芯层的上表面;所述第二金属走线的第一端与所述第一导线段的第二导通孔位于所述芯层上表面的一端相耦接;所述第二金属走线的第二端与所述第二导线段的第一导通孔位于所述芯层上表面的一端相耦接。The second metal trace is disposed on the upper surface of the core layer; the first end of the second metal trace and the second via hole of the first wire segment are located at one end of the upper surface of the core layer Phase coupling; the second end of the second metal trace is coupled to one end of the first via hole of the second wire segment located on the upper surface of the core layer.
  3. 根据权利要求1或2所述的集成有电感的封装基板,其特征在于,所述磁芯具有与所述芯层的上表面或下表面垂直的至少一个侧面;所述磁芯包括在所述磁芯的至少一个侧面上,设置的向所述磁芯内部凹陷的凹陷部;所述凹陷部位于任意相邻两个导通孔之间。The package substrate integrated with inductors according to claim 1 or 2, wherein the magnetic core has at least one side surface perpendicular to the upper surface or the lower surface of the core layer; the magnetic core is included in the At least one side surface of the magnetic core is provided with a recessed portion recessed toward the inside of the magnetic core; the recessed portion is located between any two adjacent conductive holes.
  4. 根据权利要求3所述的集成有电感的封装基板,其特征在于,The package substrate integrated with inductors according to claim 3, characterized in that:
    所述磁芯具有第一侧面和第二侧面;所述第一侧面与第一导线段的第一导通孔和第二导通孔的轴线所在的平面平行;所述第二侧面与所述第一导线段的第一导通孔和第二导线段的第一导通孔所在的平面平行;The magnetic core has a first side surface and a second side surface; the first side surface is parallel to the plane on which the axes of the first conductive hole and the second conductive hole of the first wire segment are located; the second side surface is parallel to the The planes on which the first via hole of the first wire segment and the first via hole of the second wire segment are located are parallel;
    所述第一侧面上设置有第一凹陷部,所述第二侧面上设置有第二凹陷部;所述第一凹陷部的横截面的面积小于所述第二凹陷部的横截面的面积;所述横截面与所述芯层的上表面或下表面平行。The first side surface is provided with a first recessed portion, and the second side surface is provided with a second recessed portion; the cross-sectional area of the first recessed portion is smaller than the cross-sectional area of the second recessed portion; The cross section is parallel to the upper surface or the lower surface of the core layer.
  5. 根据权利要求1-4任一项所述的集成有电感的封装基板,其特征在于,所述第一金属走线在所述芯层上的垂直投影位于所述磁芯所在的范围内。The package substrate integrated with the inductor according to any one of claims 1 to 4, wherein the vertical projection of the first metal trace on the core layer is located within a range where the magnetic core is located.
  6. 根据权利要求2所述的集成有电感的封装基板,其特征在于,所述第二金属走线在所述芯层上的垂直投影位于所述磁芯所在的范围内。The package substrate integrated with inductors according to claim 2, wherein the vertical projection of the second metal trace on the core layer is located within the range where the magnetic core is located.
  7. 根据权利要求1-6任一项所述的集成有电感的封装基板,其特征在于,构成所述磁芯的材料包括软磁复合材料;所述软磁复合材料包括磁性颗粒和树脂材料;构成所述磁性颗粒的材料包括铁硅铬合金、羰基铁、或者铁基非晶材料中的至少一种。The package substrate integrated with inductance according to any one of claims 1 to 6, wherein the material constituting the magnetic core includes a soft magnetic composite material; the soft magnetic composite material includes magnetic particles and a resin material; The material of the magnetic particles includes at least one of iron-silicon-chromium alloy, carbonyl iron, or iron-based amorphous material.
  8. 根据权利要求1所述的集成有电感的封装基板,其特征在于,所述电感还包括第一端电极和第二端电极;The package substrate integrated with an inductor according to claim 1, wherein the inductor further comprises a first terminal electrode and a second terminal electrode;
    所述第一导通孔位于所述芯层上表面的一端与所述第一端电极相耦接;所述第二导通孔位于所述芯层上表面的一端与所述第二端电极相耦接。One end of the first via hole located on the upper surface of the core layer is coupled to the first terminal electrode; one end of the second via hole located on the upper surface of the core layer is coupled to the second terminal electrode Phase coupling.
  9. 根据权利要求2所述的集成有电感的封装基板,其特征在于,所述电感还包括第一端电极和第二端电极;The package substrate integrated with an inductor according to claim 2, wherein the inductor further comprises a first terminal electrode and a second terminal electrode;
    所述第一导线段的第一导通孔位于所述芯层上表面的一端与所述第一端电极相耦接;所述第二导线段的第二导通孔位于所述芯层上表面的一端与所述第二端电极相耦接。One end of the first via hole of the first wire segment located on the upper surface of the core layer is coupled to the first terminal electrode; the second via hole of the second wire segment is located on the core layer One end of the surface is coupled with the second terminal electrode.
  10. 根据权利要求8或9所述的集成有电感的封装基板,其特征在于,所述封装基板还包括:The package substrate integrated with inductors according to claim 8 or 9, wherein the package substrate further comprises:
    第一积层,位于所述芯层上表面;所述第一积层包括第一互连结构、第二互连结构、第一焊盘以及第二焊盘;The first build-up layer is located on the upper surface of the core layer; the first build-up layer includes a first interconnection structure, a second interconnection structure, a first pad, and a second pad;
    所述第一互连结构靠近所述芯层的一端与所述第一导通孔位于所述芯层上表面的一端相耦接,所述第一互连结构远离所述芯层的一端与所述第一焊盘相耦接;所述第一焊盘作为所述电感的第一端电极;An end of the first interconnect structure close to the core layer is coupled to an end of the first via hole located on the upper surface of the core layer, and an end of the first interconnect structure away from the core layer is coupled to The first pad is coupled; the first pad serves as the first terminal electrode of the inductor;
    所述第二互连结构靠近所述芯层的一端与所述第二导通孔位于所述芯层上表面的一端相耦接,所述第二互连结构远离所述芯层的一端与所述第二焊盘相耦接;所述第二焊盘作为所述电感的第二端电极。An end of the second interconnect structure close to the core layer is coupled to an end of the second via hole located on the upper surface of the core layer, and an end of the second interconnect structure away from the core layer is coupled to The second pad is coupled; the second pad serves as a second terminal electrode of the inductor.
  11. 根据权利要求10所述的集成有电感的封装基板,其特征在于,所述封装基板还包括:The package substrate integrated with inductors according to claim 10, wherein the package substrate further comprises:
    第二积层,位于所述芯层下表面;所述第二积层包括远离所述芯层一侧的第三焊盘;The second build-up layer is located on the lower surface of the core layer; the second build-up layer includes a third pad on a side away from the core layer;
    第三互连结构,贯穿所述芯层、所述第一积层以及所述第二积层;A third interconnection structure that penetrates the core layer, the first build-up layer, and the second build-up layer;
    所述第一积层还包括远离所述芯层一侧的第四焊盘,所述第三互连结构的第一端与所述第三焊盘耦接,第二端与所述第四焊盘耦接;所述第三焊盘作为所述封装基板的电源输入端子,所述第四焊盘作为所述封装基板的电源输出端子。The first build-up layer further includes a fourth pad on a side away from the core layer, a first end of the third interconnection structure is coupled to the third pad, and a second end is connected to the fourth pad. The pad is coupled; the third pad is used as a power input terminal of the packaging substrate, and the fourth pad is used as a power output terminal of the packaging substrate.
  12. 一种电子设备,其特征在于,包括芯片,以及至少一个如权利要求1-11任一项所述的集成有电感的封装基板;所述芯片于所述封装基板上;所述芯片包括电压调节模块和处理模块;所述封装基板具有电源输出端子;An electronic device, comprising a chip, and at least one package substrate integrated with an inductor according to any one of claims 1-11; the chip is on the package substrate; the chip includes a voltage regulator A module and a processing module; the package substrate has a power output terminal;
    所述封装基板包括电感;所述封装基板的电源输出端子与所述电压调节模块耦接,所述电压调节模块还与所述电感的第一端电极相耦接;所述电感的第二端电极还与所述处理模块耦接;The package substrate includes an inductor; the power output terminal of the package substrate is coupled to the voltage adjustment module, and the voltage adjustment module is also coupled to the first terminal electrode of the inductor; the second end of the inductor The electrode is also coupled to the processing module;
    所述电压调节模块和所述电感构成电压转换电路,用于向所述处理模块提供供电电压。The voltage regulation module and the inductor form a voltage conversion circuit for providing a supply voltage to the processing module.
PCT/CN2019/122479 2019-12-02 2019-12-02 Encapsulation substrate integrated with inductor, and electronic device WO2021108965A1 (en)

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CN107408513A (en) * 2015-02-05 2017-11-28 高通股份有限公司 Including the integrated device encapsulation for the core inductor with protection ring being embedded in package substrate
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