WO2021051389A1 - Coa type array substrate and manufacturing method for coa type array substrate - Google Patents

Coa type array substrate and manufacturing method for coa type array substrate Download PDF

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Publication number
WO2021051389A1
WO2021051389A1 PCT/CN2019/107002 CN2019107002W WO2021051389A1 WO 2021051389 A1 WO2021051389 A1 WO 2021051389A1 CN 2019107002 W CN2019107002 W CN 2019107002W WO 2021051389 A1 WO2021051389 A1 WO 2021051389A1
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Prior art keywords
layer
pixel electrode
passivation layer
electrode
pixel
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PCT/CN2019/107002
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French (fr)
Chinese (zh)
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秦文鹏
黄小骅
李卓
胡佳乔
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咸阳彩虹光电科技有限公司
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Priority to PCT/CN2019/107002 priority Critical patent/WO2021051389A1/en
Publication of WO2021051389A1 publication Critical patent/WO2021051389A1/en

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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1343Electrodes
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells

Definitions

  • the present invention relates to the field of display technology, in particular to a COA type array substrate and a COA type array substrate manufacturing method.
  • the traditional liquid crystal display device includes a liquid crystal display panel and a backlight module.
  • the liquid crystal display panel mainly includes a thin film transistor array substrate, a color filter, and a liquid crystal composition between the two substrates.
  • the working principle is to apply a driving voltage on the two substrates.
  • the rotation of the liquid crystal molecules is controlled to refract the light from the backlight module to produce a picture.
  • COA Color Filter On Array
  • COA is a technology that integrates color filters on an array substrate, which can improve the transmittance of the display, and can avoid the deviation of the array substrate and the color film substrate when the box is aligned, resulting in a reduction in aperture ratio and light leakage problem.
  • metal shielding lines such as metal shielding lines arranged on the same layer as the pixel electrodes and located between adjacent pixel electrodes, are often used.
  • the layer (or Com electrode) and the metal layer (or Com line) located between the pixel electrode and the data line and below the layer where the data line is used as the electrode plate of the storage capacitor (or Com line) will reduce the pixel aperture ratio and the display’s penetration Poor transmittance increase, which affects the display quality.
  • the COA-type array substrate will reduce the capacitance value of the pixel storage capacitor. The reduction of the storage capacitor will cause the risk of high feedthrough voltage, resulting in unstable pixel voltage. Issues affecting display quality.
  • an embodiment of the present invention provides a COA type array substrate, including: a substrate; a pixel control layer disposed on the substrate and including a data line; a first passivation layer covering and including the data Line of the pixel control layer; a color resist layer, arranged on the side of the first passivation layer away from the pixel control layer; a second passivation layer, arranged on the color resist layer away from the first passivation layer A light-shielding layer is arranged on the side of the second passivation layer away from the color resist layer and covers the data line; a third passivation layer is arranged on the second passivation layer away from One side of the color resist layer and covering the light-shielding layer; and the first pixel electrode and the second pixel electrode are arranged at a distance from each other on the side of the third passivation layer away from the second passivation layer, Wherein the adjacent two ends of the first pixel electrode and the second pixel electrode respectively extend to the light
  • the pixel control layer further includes a gate electrode, a gate insulating layer, a channel layer, an ohmic contact layer, and a gate electrode, a gate insulating layer, a channel layer, and an ohmic contact layer located between the substrate and the first passivation layer and stacked in sequence.
  • a source-drain layer, the source-drain layer includes a source and a drain, the data line is electrically connected to one of the source and the drain, and the first pixel electrode is electrically connected to the source and For the other of the drain electrodes, the light shielding layer is electrically connected to the common electrode.
  • the width of the light shielding layer in the distance direction between the first pixel electrode and the second pixel electrode is greater than or equal to the width of the data line in the distance direction.
  • each of the adjacent ends of the first pixel electrode and the second pixel electrode and the light shielding layer are connected to the first pixel electrode and the second pixel electrode.
  • the value of the overlap length in the distance direction of the electrodes ranges from 1 micrometer to 5 micrometers.
  • the thickness of the second passivation layer is greater than or equal to 500 angstroms, and the thickness of the third passivation layer is greater than or equal to 2500 angstroms.
  • no shielding metal is provided between the first passivation layer and the substrate and in the vertical projection area of the adjacent two ends on the substrate.
  • the light shielding layer is a transparent electrode.
  • the first pixel electrode and the second pixel electrode further include a strip-shaped main electrode, the light shielding layer and the main electrode form a counter-plate capacitance, and the counter-plate capacitance is connected to the main electrode.
  • the storage capacitors form a network distribution.
  • the color resist layer includes a plurality of color resists of different colors.
  • an embodiment of the present invention also provides a COA type array substrate manufacturing method, including: providing a substrate; disposing a pixel control layer on the substrate, wherein the pixel control layer includes a data line; forming a first passivation Layer to cover the pixel control layer including the data line; a color resist layer is provided on a side of the first passivation layer away from the pixel control layer; a color resist layer is provided on a side of the color resist layer away from the first A second passivation layer is provided on one side of the passivation layer; a light shielding layer is provided on the side of the second passivation layer away from the color resist layer, wherein the light shielding layer covers the data line; A third passivation layer is provided on the side of the second passivation layer away from the color resist layer, wherein the third passivation layer covers the light-shielding layer; and the third passivation layer is away from the second passivation layer One side of the passivation layer is provided with a first pixel electrode and a second
  • the disposing of the pixel control layer on the substrate includes: forming a gate electrode of the pixel control layer on the substrate through a first mask process; A mask process forms a gate insulating layer, a channel layer, and an ohmic contact layer sequentially stacked on the gate electrode; and forms a source and drain layer of the pixel control layer on the ohmic contact layer through a third mask process And synchronously form the data line, wherein the source-drain layer includes a source electrode and a drain electrode, one of the source electrode and the drain electrode is electrically connected to the data line, and the source electrode and the drain electrode are The other is electrically connected to the first pixel electrode.
  • said disposing a light-shielding layer on a side of the second passivation layer away from the color resist layer includes: forming the light-shielding layer through a fourth masking process, wherein the The light-shielding layer is electrically connected to the common electrode; the disposing a third passivation layer on a side of the second passivation layer away from the color resist layer includes: sequentially forming the first passivation layer through a fifth mask process The second passivation layer and the third passivation layer, and the yellowing process is only performed when the third passivation layer is formed; and the distance between the third passivation layer and the third passivation layer Disposing the first pixel electrode and the second pixel electrode on one side of the second passivation layer includes: forming the first pixel electrode and the second pixel electrode through a sixth mask process.
  • the width of the light shielding layer in the distance direction between the first pixel electrode and the second pixel electrode is greater than or equal to the width of the data line in the distance direction.
  • each of the adjacent ends of the first pixel electrode and the second pixel electrode and the light shielding layer are connected to the first pixel electrode and the second pixel electrode.
  • the value of the overlap length in the distance direction of the electrodes ranges from 1 micrometer to 5 micrometers.
  • the thickness of the second passivation layer is greater than or equal to 500 angstroms, and the thickness of the third passivation layer is greater than or equal to 2500 angstroms.
  • no shielding metal is provided between the first passivation layer and the substrate and in the vertical projection area of the adjacent two ends on the substrate.
  • the light shielding layer is a transparent electrode.
  • the first pixel electrode and the second pixel electrode further include a strip-shaped main electrode, the light shielding layer and the main electrode form a counter-plate capacitance, and the counter-plate capacitance is connected to the main electrode.
  • the storage capacitors form a network distribution.
  • the color resist layer includes a plurality of color resists of different colors.
  • the embodiment of the present invention extends the first pixel electrode and the second pixel electrode directly above the light-shielding layer to overlap the light-shielding layer, and combines the first pixel electrode and the second pixel electrode
  • the overlapping portion between the pixel electrode and the light shielding layer serves as the storage capacitor of the pixel structure, eliminating the need for traditional shielding metal, thereby effectively reducing the area of the light shielding area, increasing the pixel aperture ratio, and improving the display quality.
  • FIG. 1 is a schematic cross-sectional view of a partial structure of a COA type array substrate provided by the present invention.
  • FIG. 2 is a schematic cross-sectional view of another view of the partial structure of the COA array substrate provided by the present invention.
  • FIG. 3 is a schematic diagram of the mesh distribution of the COA type array substrate provided by the present invention.
  • FIG. 4 is a schematic diagram of the mesh distribution of another light-shielding layer of the COA type array substrate provided by the present invention.
  • FIG. 5 is a schematic diagram of the pixel structure layout of the COA type array substrate in the related art.
  • FIG. 6 is a schematic diagram of the pixel structure layout of the COA type array substrate provided by the present invention.
  • FIG. 7 is a flow chart of the manufacturing method of the COA type array substrate provided by the present invention.
  • FIG. 1 is a schematic cross-sectional view of a partial structure of the COA type array substrate provided by the present invention
  • FIG. 2 is a schematic cross-sectional view of a partial structure of the COA type array substrate provided by the present invention from another perspective.
  • a COA type array substrate provided by an embodiment of the present invention includes: a substrate 10, a pixel control layer 20, a passivation layer 30, a color resist layer 40, a passivation layer 50, a light-shielding layer 60, and a passivation layer 70.
  • the pixel electrode 81 and the pixel electrode 82 are examples of the pixels of the present invention.
  • the pixel control layer 20 is disposed on the substrate 10 and includes a data line DL.
  • the passivation layer 30 covers the pixel control layer 20 including the data line DL.
  • the color resist layer 40 is disposed on the side of the passivation layer 30 away from the pixel control layer 20, wherein the color resist layer 40 includes a plurality of color resists of different colors, such as red color resist (R), green color resist (G) and blue color resist. Color resistance (B).
  • the passivation layer 50 is disposed on a side of the color resist layer 40 away from the passivation layer 30, wherein the thickness D1 of the passivation layer 50 is, for example, greater than or equal to 500 angstroms to protect the color resist layer 40 to the greatest extent.
  • the light-shielding layer 60 is disposed on a side of the passivation layer 50 away from the color resist layer 40 and covers the data line DL, wherein the light-shielding layer 60 may be a transparent electrode.
  • the passivation layer 70 is disposed on the side of the passivation layer 50 away from the color resist layer 40 and covers the light-shielding layer 60.
  • the thickness D2 of the passivation layer 70 is greater than or equal to 2500 angstroms to prevent the pixel electrode 81 and the pixel electrode to the greatest extent.
  • 82 and the light shielding layer 60 are short-circuited.
  • the pixel electrode 81 and the pixel electrode 82 are spaced apart from each other on the side of the passivation layer 70 away from the passivation layer 50.
  • the pixel electrode 81 and the pixel electrode 82 are electrically connected to the pixel control layer 20.
  • the pixel electrode 81 and the pixel electrode 82 are adjacent to each other.
  • the ends respectively extend above the light-shielding layer 60 and overlap the light-shielding layer 60, and the pixel electrode 81 and the pixel electrode 82 and the light-shielding layer 60 form a storage capacitor, thereby eliminating the shielding metal used as the Com line in the traditional technology, so that the embodiment of the present invention can be effective
  • the area of the shading area is reduced, and the aperture ratio of the pixel structure is increased, so that the transmittance is significantly improved.
  • each of the adjacent two ends of the pixel electrode 81 and the pixel electrode 82 and the light shielding layer 60 are in a distance direction between the pixel electrode 81 and the pixel electrode 82 (for example, the horizontal direction in FIG. 1)
  • the value of the overlap length L1 above ranges from 1 ⁇ m to 5 ⁇ m
  • the pixel electrode 81 and the pixel electrode 82 may be ITO (Indium Tin Oxide, indium tin oxide) electrodes or transparent electrodes made of other materials.
  • the pixel electrode 81 and the pixel electrode 82 further include a strip-shaped trunk electrode 83, and the light shielding layer 60 and the trunk electrode 83 form a counter-plate capacitance.
  • the storage capacitors and the counter-board capacitors form a mesh distribution, which can effectively reduce the Feedthrogh voltage, reduce the risk of excessive Feedthrough voltage, and improve the display quality.
  • the mesh distribution is shown at the dotted line in FIG. 4.
  • the pixel control layer 20 further includes a gate electrode 21, a gate insulating layer 22, a channel layer 23, and an ohmic contact located between the substrate 10 and the passivation layer 30 and stacked in sequence.
  • the gate electrode 21, the gate insulating layer 22, the channel layer 23, the ohmic contact layer 24, and the source drain layer together constitute the pixel transistor PT (see FIG. 6) of the embodiment of the present invention, which is electrically connected to the pixel
  • the data line DL and the scan line GL of the control layer 20 are electrically connected to the pixel electrode 81 or the pixel electrode 82.
  • the width L2 of the light shielding layer 60 in the distance direction between the pixel electrode 81 and the pixel electrode 82 is greater than or equal to the width L3 of the data line DL in the distance direction.
  • no shielding metal is provided in the vertical projection area VPA between the passivation layer 30 and the substrate 10 and located at the adjacent ends of the pixel electrode 81 and the pixel electrode 82, that is, no conventional technology is provided.
  • the shielding metal of the Com line As the shielding metal of the Com line.
  • Figure 5 shows the COA type array substrate in the traditional technology (with the shielding of the electrode plate between the pixel electrode and the data line and below the layer where the data line is located, as a storage capacitor).
  • FIG. 6 is a schematic diagram of the pixel structure layout of the COA type array substrate provided by the present invention.
  • the COA type array substrate of the embodiment of the present invention extends the adjacent ends of the pixel electrode 81 and the pixel electrode 82 to the light shielding layer 60 and partially overlaps the light shielding layer 60, while eliminating
  • the shielding metal on both sides of each pixel electrode in the traditional technology can reduce the area of the shielding area, and the width of the opening area is increased by at least 29%.
  • the opening area is significantly increased, and the penetration rate is significantly improved.
  • the embodiment of the present invention also provides a COA type array substrate manufacturing method, which includes the following steps, for example:
  • a pixel control layer 20 is provided on the substrate 10, wherein the pixel control layer 20 includes a data line DL;
  • a color resist layer 40 is provided on the side of the passivation layer 30 away from the pixel control layer 20, wherein the color resist layer 40 includes a plurality of color resists of different colors, such as red color resist (R), green color resist (G), and blue color resist. Resistance (B);
  • a passivation layer 50 is provided on the side of the color resist layer 40 away from the passivation layer 30;
  • a light-shielding layer 60 is provided on the side of the passivation layer 50 away from the color resist layer 40, wherein the light-shielding layer 60 covers the data line DL, and the light-shielding layer 60 may be a transparent electrode;
  • a passivation layer 70 is provided on the side of the passivation layer 50 away from the color resist layer 40, wherein the passivation layer 70 covers the light shielding layer 60;
  • a pixel electrode 81 and a pixel electrode 82 are provided on the side of the passivation layer 70 away from the passivation layer 50, wherein the pixel electrode 81 and the pixel electrode 82 are separated from each other, and adjacent ends of the pixel electrode 81 and the pixel electrode 82 respectively extend to the light shielding layer
  • the upper part of 60 overlaps with the light shielding layer 60, the light shielding layer 60 forms a storage capacitor with the pixel electrode 81 and the pixel electrode 82, and the pixel electrode 81 and the pixel electrode 82 are electrically connected to the pixel control layer 20.
  • the step of disposing a pixel control layer on the substrate includes the following sub-steps:
  • the source and drain layer 25 of the pixel control layer 20 is formed on the ohmic contact layer 24 by the third mask process and the data line DL is simultaneously formed.
  • the source and drain layer 25 includes a source electrode 251 and a drain electrode 252.
  • One of the electrode 251 and the drain electrode 252, such as the source electrode 251 is electrically connected to the data line DL, and the other of the source electrode 251 and the drain electrode 252, such as the drain electrode 252, is electrically connected to the pixel electrode 81 or the pixel electrode 82.
  • the mask process is well-known to those skilled in the art, so it will not be described in detail here.
  • the step of disposing the light-shielding layer 60 on the side of the passivation layer 50 away from the color resist layer 40 includes a sub-step: forming the light-shielding layer 60 through the fourth masking process, wherein the light-shielding layer 60 Electrically connected to the common electrode;
  • the step of disposing the passivation layer 70 on the side of the passivation layer 50 away from the color resist layer 40 includes sub-steps: sequentially forming the passivation layer 30, the passivation layer 50, and the passivation layer 70 through the fifth mask process. , Wherein the fifth mask process only performs the yellow light process when the passivation layer 70 is formed; and
  • the step of disposing the pixel electrode 81 and the pixel electrode 82 on the side of the passivation layer 70 away from the passivation layer 50 includes a sub-step: forming the pixel electrode 81 and the pixel electrode 82 through a sixth mask process.
  • the width L2 of the light shielding layer 60 in the distance direction between the pixel electrode 81 and the pixel electrode 82 is greater than or equal to the width L3 of the data line DL in the distance direction.
  • the value range of the overlap length L1 of each of the adjacent ends of the pixel electrode 81 and the pixel electrode 82 and the light shielding layer 60 in the distance direction between the pixel electrode 81 and the pixel electrode 82 Preferably it is 1 micrometer to 5 micrometers.
  • the thickness D1 of the passivation layer 50 is greater than or equal to 500 angstroms, and the thickness D2 of the passivation layer 70 is greater than or equal to 2500 angstroms to effectively prevent the pixel electrode 81 and the pixel electrode 82 from the light shielding layer 60 A short circuit occurred.
  • no shielding metal is provided in the vertical projection area VPA between the passivation layer 30 and the substrate 10 and located at the adjacent ends of the pixel electrode 81 and the pixel electrode 82, that is, no shielding metal is provided in the conventional technology.
  • the COA type array substrate manufacturing method provided by the embodiment of the present invention is formed through a 6-mask manufacturing process. Compared with the traditional technology (that is, the five-mask manufacturing process), the embodiment of the present invention provides The COA type array substrate manufacturing method takes 70-inch 8K as an example, and its penetration rate is higher than that of the traditional technology. Please refer to Table 2 for its experimental data.
  • the aperture ratio of the COA array substrate formed by the six mask processes provided by the embodiment of the present invention is increased by at least 34% (that is, [63.99%-47.63%]/47.63% ⁇ 34%).
  • the increase in light rate is greater than or equal to 7.88% (that is, 88.84%-82.35%] / 82.35% ⁇ 7.88%), the penetration rate is increased by at least 45%, and the penetration rate is significantly increased.
  • the COA type array substrate provided by the embodiment of the present invention compared with the conventional COA type array substrate, the COA type array substrate provided by the embodiment of the present invention takes ITO as an example, and the pixel storage capacitor Cst has the following advantages:
  • the ratio of Cdc (capacitance between Data and TFT-com) and Cdlc (capacitance between Data and CF-com) of the COA type array substrate structure provided by the embodiment of the present invention to Cdata (sum of capacitances related to DL) The smallest; under the COA type array substrate structure provided by the embodiment of the present invention, the TFT-com voltage and the CF-com voltage are less coupled by the Data voltage, and the TFT-com and CF-com voltages are relatively stable. Because the pixel voltage is coupled to a minimum, the normal display voltage is maintained and the display quality is guaranteed. Please refer to Table 3 for the experimental data;
  • the COA type array substrate structure provided by the embodiment of the present invention has the smallest ratio of Cdlc to Cdata, so that the coupling effect of Data to CF-com is the smallest, and the pixel voltage is the most stable;
  • the capacitance value of the pixel storage capacitor Cst of the COA structure provided by the embodiment of the present invention has increased significantly.
  • the Cst value of the COA type array substrate provided by the embodiment of the present invention is 0.371 pF, which is 3.2 times that of the conventional COA type array substrate. 2.5 times that of the array substrate, it can effectively reduce the Feedthrogh voltage and reduce the risk that the Feedthrough voltage is too large, which will cause the pixel voltage to be unstable and affect the display quality. Please refer to Table 4 for the experimental data.

Abstract

A COA type array substrate, comprising a substrate (10), a pixel control layer (20), a first passivation layer (30), a color resist layer (40), a second passivation layer (50), a light shielding layer (60), a third passivation layer (70), a first pixel electrode (81), and a second pixel electrode (82) which are sequentially stacked. The light shielding layer (60) is provided on one side of the second passivation layer (50) away from the color resist layer (40) and covers a data line (DL); the third passivation layer (70) is provided on one side of the second passivation layer (50) away from the color resist layer (40) and covers the light shielding layer (60). The first pixel electrode (81) and the second pixel electrode (82) are provided at intervals on one side of the third passivation layer (70) away from the second passivation layer (50), and two adjacent ends of the first pixel electrode (81) and the second pixel electrode (82) respectively extend above the light shielding layer (60) and overlap with the light shielding layer (60). The light shielding layer (60), the first pixel electrode (81), and the second pixel electrode (82) form a storage capacitor, so that the conventional shielding metal is eliminated, the area of a light shielding region can be effectively reduced, and the aperture ratio of a pixel is increased.

Description

COA型阵列基板和COA型阵列基板制作方法COA type array substrate and COA type array substrate manufacturing method 技术领域Technical field
本发明涉及显示技术领域,尤其涉及一种COA型阵列基板和一种COA型阵列基板制作方法。The present invention relates to the field of display technology, in particular to a COA type array substrate and a COA type array substrate manufacturing method.
背景技术Background technique
传统的液晶显示装置包括液晶显示面板和背光模组,其中液晶显示面板主要包括薄膜晶体管阵列基板、彩色滤光片以及两基板间的液晶构成,其工作原理是通过在两基板上施加驱动电压来控制液晶分子旋转,将背光模组的光线折射出来产生画面。The traditional liquid crystal display device includes a liquid crystal display panel and a backlight module. The liquid crystal display panel mainly includes a thin film transistor array substrate, a color filter, and a liquid crystal composition between the two substrates. The working principle is to apply a driving voltage on the two substrates. The rotation of the liquid crystal molecules is controlled to refract the light from the backlight module to produce a picture.
COA(Color Filter On Array)是将彩色滤光片集成在阵列基板上的技术,能够提高显示器的穿透率,可以避免阵列基板和彩膜基板对盒时的偏差,导致开口率降低和出现漏光问题。COA (Color Filter On Array) is a technology that integrates color filters on an array substrate, which can improve the transmittance of the display, and can avoid the deviation of the array substrate and the color film substrate when the box is aligned, resulting in a reduction in aperture ratio and light leakage problem.
已知的COA型阵列基板中,为避免相邻像素电极之间以及数据线和像素电极之间的漏光,常采用金属屏蔽线例如与像素电极同层设置且位于相邻像素电极之间的金属层(或称Com电极)以及位于像素电极和数据线之间并位于数据线所在层下方以作为存储电容的电极板之金属层(或称Com线),这样会降低像素开口率,显示器的穿透率提升不佳,从而影响显示品质,除此之外,COA型阵列基板会降低像素存储电容的电容值,存储电容降低会导致Feedthrough电压存在偏大的风险,导致像素电压不稳定而造成的影响显示品质问题。In the known COA type array substrate, in order to avoid light leakage between adjacent pixel electrodes and between data lines and pixel electrodes, metal shielding lines, such as metal shielding lines arranged on the same layer as the pixel electrodes and located between adjacent pixel electrodes, are often used. The layer (or Com electrode) and the metal layer (or Com line) located between the pixel electrode and the data line and below the layer where the data line is used as the electrode plate of the storage capacitor (or Com line) will reduce the pixel aperture ratio and the display’s penetration Poor transmittance increase, which affects the display quality. In addition, the COA-type array substrate will reduce the capacitance value of the pixel storage capacitor. The reduction of the storage capacitor will cause the risk of high feedthrough voltage, resulting in unstable pixel voltage. Issues affecting display quality.
发明内容Summary of the invention
为解决上述问题,本发明实施例提供了一种COA型阵列基板,包括:衬底;像素控制层,设置于所述衬底上且包括数据线;第一钝化层,覆盖包括所述数据线的所述像素控制层;色 阻层,设置于所述第一钝化层远离所述像素控制层的一侧;第二钝化层,设置于所述色阻层远离所述第一钝化层的一侧;遮光层,设置于所述第二钝化层远离所述色阻层的一侧并覆盖所述数据线;第三钝化层,设置于所述第二钝化层远离所述色阻层的一侧并覆盖所述遮光层;以及第一像素电极和第二像素电极,相互间隔设置于所述第三钝化层的远离所述第二钝化层的一侧,其中所述第一像素电极和第二像素电极的相邻两端分别延伸至所述遮光层上与所述遮光层重叠,所述遮光层与所述第一像素电极和第二像素电极形成存储电容,所述第一像素电极和所述第二像素电极电连接所述像素控制层。In order to solve the above-mentioned problems, an embodiment of the present invention provides a COA type array substrate, including: a substrate; a pixel control layer disposed on the substrate and including a data line; a first passivation layer covering and including the data Line of the pixel control layer; a color resist layer, arranged on the side of the first passivation layer away from the pixel control layer; a second passivation layer, arranged on the color resist layer away from the first passivation layer A light-shielding layer is arranged on the side of the second passivation layer away from the color resist layer and covers the data line; a third passivation layer is arranged on the second passivation layer away from One side of the color resist layer and covering the light-shielding layer; and the first pixel electrode and the second pixel electrode are arranged at a distance from each other on the side of the third passivation layer away from the second passivation layer, Wherein the adjacent two ends of the first pixel electrode and the second pixel electrode respectively extend to the light shielding layer and overlap the light shielding layer, and the light shielding layer forms a memory with the first pixel electrode and the second pixel electrode. A capacitor, the first pixel electrode and the second pixel electrode are electrically connected to the pixel control layer.
在本发明的一个实施例中,所述像素控制层还包括位于所述衬底和所述第一钝化层之间且依次堆叠设置的栅电极、栅绝缘层、通道层、欧姆接触层和源漏极层,所述源漏极层包括源极和漏极,所述数据线电连接所述源极和所述漏极之一,且所述第一像素电极电连接所述源极和所述漏极之另一,所述遮光层电连接公共电极。In an embodiment of the present invention, the pixel control layer further includes a gate electrode, a gate insulating layer, a channel layer, an ohmic contact layer, and a gate electrode, a gate insulating layer, a channel layer, and an ohmic contact layer located between the substrate and the first passivation layer and stacked in sequence. A source-drain layer, the source-drain layer includes a source and a drain, the data line is electrically connected to one of the source and the drain, and the first pixel electrode is electrically connected to the source and For the other of the drain electrodes, the light shielding layer is electrically connected to the common electrode.
在本发明的一个实施例中,所述遮光层在所述第一像素电极和所述第二像素电极的距离方向上的宽度大于或等于所述数据线在所述距离方向上的宽度。In an embodiment of the present invention, the width of the light shielding layer in the distance direction between the first pixel electrode and the second pixel electrode is greater than or equal to the width of the data line in the distance direction.
在本发明的一个实施例中,所述第一像素电极和第二像素电极的所述相邻两端中的每一者与所述遮光层在所述第一像素电极和所述第二像素电极的距离方向上的重叠长度的取值范围为1微米至5微米。In an embodiment of the present invention, each of the adjacent ends of the first pixel electrode and the second pixel electrode and the light shielding layer are connected to the first pixel electrode and the second pixel electrode. The value of the overlap length in the distance direction of the electrodes ranges from 1 micrometer to 5 micrometers.
在本发明的一个实施例中,所述第二钝化层的厚度大于或等于500埃米,所述第三钝化层的厚度大于或等于2500埃米。In an embodiment of the present invention, the thickness of the second passivation layer is greater than or equal to 500 angstroms, and the thickness of the third passivation layer is greater than or equal to 2500 angstroms.
在本发明的一个实施例中,在所述第一钝化层和所述衬底之间且位于所述相邻两端在所述衬底上的垂直投影区域内未设置遮蔽金属。In an embodiment of the present invention, no shielding metal is provided between the first passivation layer and the substrate and in the vertical projection area of the adjacent two ends on the substrate.
在本发明的一个实施例中,所述遮光层为透明电极。In an embodiment of the present invention, the light shielding layer is a transparent electrode.
在本发明的一个实施例中,所述第一像素电极和所述第二像素电极还包括条状的主干电极,所述遮光层与所述主干电极形成对板电容,所述对板电容与所述存储电容形成网状分布。In an embodiment of the present invention, the first pixel electrode and the second pixel electrode further include a strip-shaped main electrode, the light shielding layer and the main electrode form a counter-plate capacitance, and the counter-plate capacitance is connected to the main electrode. The storage capacitors form a network distribution.
在本发明的一个实施例中,所述色阻层包括多个不同颜色的色阻。In an embodiment of the present invention, the color resist layer includes a plurality of color resists of different colors.
此外,本发明实施例还提供了一种COA型阵列基板制作方法,包括:提供衬底;于所述衬底上设置像素控制层,其中所述像素控制层包括数据线;形成第一钝化层以覆盖包括所述数据线的所述像素控制层;于所述第一钝化层的远离所述像素控制层的一侧设置色阻层;于所述色阻层的远离所述第一钝化层的一侧设置第二钝化层;于所述第二钝化层的远离所述色阻层的一侧设置遮光层,其中所述遮光层覆盖所述数据线;于所述第二钝化层的远离所述色阻层的一侧设置第三钝化层,其中所述第三钝化层覆盖所述遮光层;以及于所述第三钝化层的远离所述第二钝化层的一侧设置第一像素电极和第二像素电极,其中所述第一像素电极和所述第二像素电极相互间隔,所述第一像素电极和第二像素电极的相邻两端分别延伸至所述遮光层上与所述遮光层重叠,所述遮光层与所述第一像素电极和第二像素电极形成存储电容,所述第一像素电极和所述第二像素电极电连接所述像素控制层。In addition, an embodiment of the present invention also provides a COA type array substrate manufacturing method, including: providing a substrate; disposing a pixel control layer on the substrate, wherein the pixel control layer includes a data line; forming a first passivation Layer to cover the pixel control layer including the data line; a color resist layer is provided on a side of the first passivation layer away from the pixel control layer; a color resist layer is provided on a side of the color resist layer away from the first A second passivation layer is provided on one side of the passivation layer; a light shielding layer is provided on the side of the second passivation layer away from the color resist layer, wherein the light shielding layer covers the data line; A third passivation layer is provided on the side of the second passivation layer away from the color resist layer, wherein the third passivation layer covers the light-shielding layer; and the third passivation layer is away from the second passivation layer One side of the passivation layer is provided with a first pixel electrode and a second pixel electrode, wherein the first pixel electrode and the second pixel electrode are spaced apart from each other, and adjacent ends of the first pixel electrode and the second pixel electrode Respectively extend to the light-shielding layer to overlap with the light-shielding layer, the light-shielding layer forms a storage capacitor with the first pixel electrode and the second pixel electrode, and the first pixel electrode and the second pixel electrode are electrically connected The pixel control layer.
在本发明的一个实施例中,所述于所述衬底上设置像素控制层包括:通过第一次掩膜工艺在所述衬底上形成所述像素控制层的栅电极;通过第二次掩膜工艺在所述栅电极上形成依次堆叠的栅绝缘层、通道层和欧姆接触层;以及通过第三次掩膜工艺在所述欧姆接触层上形成所述像素控制层的源漏极层并同步形成所述数据线,其中所述源漏极层包括源极和漏极,所述源极和所述漏极之一电连接所述数据线,所述源极和所述漏极之另一电连接所述第一像素电极。In an embodiment of the present invention, the disposing of the pixel control layer on the substrate includes: forming a gate electrode of the pixel control layer on the substrate through a first mask process; A mask process forms a gate insulating layer, a channel layer, and an ohmic contact layer sequentially stacked on the gate electrode; and forms a source and drain layer of the pixel control layer on the ohmic contact layer through a third mask process And synchronously form the data line, wherein the source-drain layer includes a source electrode and a drain electrode, one of the source electrode and the drain electrode is electrically connected to the data line, and the source electrode and the drain electrode are The other is electrically connected to the first pixel electrode.
在本发明的一个实施例中,所述于所述第二钝化层的远离所述色阻层的一侧设置遮光层包括:通过第四次掩膜工艺形成所述遮光层,其中所述遮光层电连接公共电极;所述于所述 第二钝化层的远离所述色阻层的一侧设置第三钝化层包括:通过第五次掩膜工艺依序形成所述第一钝化层、所述第二钝化层和所述第三钝化层、且只在形成所述第三钝化层时进行黄光工艺;以及所述于所述第三钝化层的远离所述第二钝化层的一侧设置第一像素电极和第二像素电极包括:通过第六掩膜工艺形成所述第一像素电极和所述第二像素电极。In an embodiment of the present invention, said disposing a light-shielding layer on a side of the second passivation layer away from the color resist layer includes: forming the light-shielding layer through a fourth masking process, wherein the The light-shielding layer is electrically connected to the common electrode; the disposing a third passivation layer on a side of the second passivation layer away from the color resist layer includes: sequentially forming the first passivation layer through a fifth mask process The second passivation layer and the third passivation layer, and the yellowing process is only performed when the third passivation layer is formed; and the distance between the third passivation layer and the third passivation layer Disposing the first pixel electrode and the second pixel electrode on one side of the second passivation layer includes: forming the first pixel electrode and the second pixel electrode through a sixth mask process.
在本发明的一个实施例中,所述遮光层在所述第一像素电极和所述第二像素电极的距离方向上的宽度大于或等于所述数据线在所述距离方向上的宽度。In an embodiment of the present invention, the width of the light shielding layer in the distance direction between the first pixel electrode and the second pixel electrode is greater than or equal to the width of the data line in the distance direction.
在本发明的一个实施例中,所述第一像素电极和第二像素电极的所述相邻两端中的每一者与所述遮光层在所述第一像素电极和所述第二像素电极的距离方向上的重叠长度的取值范围为1微米至5微米。In an embodiment of the present invention, each of the adjacent ends of the first pixel electrode and the second pixel electrode and the light shielding layer are connected to the first pixel electrode and the second pixel electrode. The value of the overlap length in the distance direction of the electrodes ranges from 1 micrometer to 5 micrometers.
在本发明的一个实施例中,所述第二钝化层的厚度大于或等于500埃米,所述第三钝化层的厚度大于或等于2500埃米。In an embodiment of the present invention, the thickness of the second passivation layer is greater than or equal to 500 angstroms, and the thickness of the third passivation layer is greater than or equal to 2500 angstroms.
在本发明的一个实施例中,在所述第一钝化层和所述衬底之间且位于所述相邻两端在所述衬底上的垂直投影区域内未设置遮蔽金属。In an embodiment of the present invention, no shielding metal is provided between the first passivation layer and the substrate and in the vertical projection area of the adjacent two ends on the substrate.
在本发明的一个实施例中,所述遮光层为透明电极。In an embodiment of the present invention, the light shielding layer is a transparent electrode.
在本发明的一个实施例中,所述第一像素电极和所述第二像素电极还包括条状的主干电极,所述遮光层与所述主干电极形成对板电容,所述对板电容与所述存储电容形成网状分布。In an embodiment of the present invention, the first pixel electrode and the second pixel electrode further include a strip-shaped main electrode, the light shielding layer and the main electrode form a counter-plate capacitance, and the counter-plate capacitance is connected to the main electrode. The storage capacitors form a network distribution.
在本发明的一个实施例中,所述色阻层包括多个不同颜色的色阻。In an embodiment of the present invention, the color resist layer includes a plurality of color resists of different colors.
由上可知,本发明实施例将所述第一像素电极和所述第二像素电极直接延伸到所述遮光层上方与所述遮光层重叠,并将所述第一像素电极和所述第二像素电极与所述遮光层之间重叠部分作为像素结构的存储电容,免去传统的遮蔽金属,从而可以有效减少遮光区域的面积,增加像素开口率,提升显示品质。It can be seen from the above that the embodiment of the present invention extends the first pixel electrode and the second pixel electrode directly above the light-shielding layer to overlap the light-shielding layer, and combines the first pixel electrode and the second pixel electrode The overlapping portion between the pixel electrode and the light shielding layer serves as the storage capacitor of the pixel structure, eliminating the need for traditional shielding metal, thereby effectively reducing the area of the light shielding area, increasing the pixel aperture ratio, and improving the display quality.
附图说明Description of the drawings
为了更清楚地说明本发明实施例的技术方案,下面将对实施例描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to explain the technical solutions of the embodiments of the present invention more clearly, the following will briefly introduce the drawings used in the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. A person of ordinary skill in the art can obtain other drawings based on these drawings without creative work.
图1为本发明提供的COA型阵列基板的局部结构剖面示意图。FIG. 1 is a schematic cross-sectional view of a partial structure of a COA type array substrate provided by the present invention.
图2为本发明提供的COA型阵列基板的另一视角局部结构剖面示意图。2 is a schematic cross-sectional view of another view of the partial structure of the COA array substrate provided by the present invention.
图3为本发明提供的COA型阵列基板的网状分布示意图。FIG. 3 is a schematic diagram of the mesh distribution of the COA type array substrate provided by the present invention.
图4为本发明提供的COA型阵列基板的另一遮光层网状分布示意图。4 is a schematic diagram of the mesh distribution of another light-shielding layer of the COA type array substrate provided by the present invention.
图5为相关技术中COA型阵列基板的像素结构布局示意图。FIG. 5 is a schematic diagram of the pixel structure layout of the COA type array substrate in the related art.
图6为本发明提供的COA型阵列基板的像素结构布局示意图。FIG. 6 is a schematic diagram of the pixel structure layout of the COA type array substrate provided by the present invention.
图7为本发明提供的COA型阵列基板的制作方法流程图。FIG. 7 is a flow chart of the manufacturing method of the COA type array substrate provided by the present invention.
【主要元件符号说明】[Description of main component symbols]
10:衬底;20:像素控制层;21:栅电极;22:栅绝缘层;23:通道层;24:欧姆接触层;251:源极;252:漏极;PT:像素晶体管;30:钝化层;40:色阻层;50:钝化层;60:遮光层;70:钝化层;81:像素电极;82:像素电极;83:主干电极;DL:数据线;GL:扫描线;D1:钝化层50的厚度;D2:钝化层70的厚度;L1:重叠长度;L2:宽度;L3:宽度;VPA:垂直投影区域;AR:开口率宽度。10: substrate; 20: pixel control layer; 21: gate electrode; 22: gate insulating layer; 23: channel layer; 24: ohmic contact layer; 251: source; 252: drain; PT: pixel transistor; 30: Passivation layer; 40: color resist layer; 50: passivation layer; 60: light-shielding layer; 70: passivation layer; 81: pixel electrode; 82: pixel electrode; 83: backbone electrode; DL: data line; GL: scan Line; D1: thickness of passivation layer 50; D2: thickness of passivation layer 70; L1: overlapping length; L2: width; L3: width; VPA: vertical projection area; AR: aperture ratio width.
具体实施方式detailed description
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基 于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
请参见图1和图2,图1为本发明提供的COA型阵列基板的局部结构剖面示意图;图2为本发明提供的COA型阵列基板的另一视角局部结构剖面示意图。具体地,本发明的实施例提供的一种COA型阵列基板,包括:衬底10、像素控制层20、钝化层30、色阻层40、钝化层50、遮光层60、钝化层70、像素电极81以及像素电极82。Please refer to FIGS. 1 and 2. FIG. 1 is a schematic cross-sectional view of a partial structure of the COA type array substrate provided by the present invention; FIG. 2 is a schematic cross-sectional view of a partial structure of the COA type array substrate provided by the present invention from another perspective. Specifically, a COA type array substrate provided by an embodiment of the present invention includes: a substrate 10, a pixel control layer 20, a passivation layer 30, a color resist layer 40, a passivation layer 50, a light-shielding layer 60, and a passivation layer 70. The pixel electrode 81 and the pixel electrode 82.
其中,像素控制层20设置于衬底10上且包括数据线DL。钝化层30覆盖包括数据线DL的像素控制层20。色阻层40设置于钝化层30远离像素控制层20的一侧上,其中色阻层40包括多个不同颜色的色阻,例如红色色阻(R)、绿色色阻(G)和蓝色色阻(B)。钝化层50设置于色阻层40远离钝化层30的一侧,其中钝化层50的厚度D1例如大于或等于500埃米用以最大程度地保护色阻层40。遮光层60设置于钝化层50远离色阻层40的一侧并覆盖数据线DL,其中遮光层60可以为透明电极。钝化层70设置于钝化层50远离色阻层40的一侧并覆盖遮光层60,其中钝化层70的厚度D2大于或等于2500埃米用以最大程度地防止像素电极81和像素电极82与遮光层60发生短路。像素电极81和像素电极82相互间隔设置于钝化层70远离钝化层50的一侧,像素电极81和像素电极82电连接像素控制层20,其中像素电极81和像素电极82的相邻两端分别延伸至遮光层60上方与遮光层60重叠,像素电极81和像素电极82与遮光层60形成存储电容,藉此免去传统技术中作为Com线的遮蔽金属,使本发明实施例能够有效减少遮光区域的面积,增加像素结构开口率,使得穿透率显著提高。Wherein, the pixel control layer 20 is disposed on the substrate 10 and includes a data line DL. The passivation layer 30 covers the pixel control layer 20 including the data line DL. The color resist layer 40 is disposed on the side of the passivation layer 30 away from the pixel control layer 20, wherein the color resist layer 40 includes a plurality of color resists of different colors, such as red color resist (R), green color resist (G) and blue color resist. Color resistance (B). The passivation layer 50 is disposed on a side of the color resist layer 40 away from the passivation layer 30, wherein the thickness D1 of the passivation layer 50 is, for example, greater than or equal to 500 angstroms to protect the color resist layer 40 to the greatest extent. The light-shielding layer 60 is disposed on a side of the passivation layer 50 away from the color resist layer 40 and covers the data line DL, wherein the light-shielding layer 60 may be a transparent electrode. The passivation layer 70 is disposed on the side of the passivation layer 50 away from the color resist layer 40 and covers the light-shielding layer 60. The thickness D2 of the passivation layer 70 is greater than or equal to 2500 angstroms to prevent the pixel electrode 81 and the pixel electrode to the greatest extent. 82 and the light shielding layer 60 are short-circuited. The pixel electrode 81 and the pixel electrode 82 are spaced apart from each other on the side of the passivation layer 70 away from the passivation layer 50. The pixel electrode 81 and the pixel electrode 82 are electrically connected to the pixel control layer 20. The pixel electrode 81 and the pixel electrode 82 are adjacent to each other. The ends respectively extend above the light-shielding layer 60 and overlap the light-shielding layer 60, and the pixel electrode 81 and the pixel electrode 82 and the light-shielding layer 60 form a storage capacitor, thereby eliminating the shielding metal used as the Com line in the traditional technology, so that the embodiment of the present invention can be effective The area of the shading area is reduced, and the aperture ratio of the pixel structure is increased, so that the transmittance is significantly improved.
在一个具体实施例中,像素电极81和像素电极82的所述相邻两端中的每一者与遮光层60在像素电极81和像素电极82的距离方向(例如图1中的水平方向)上的重叠长度L1的取值范围为1微米至5微米,像素电极81和像素电极82可以为ITO(Indium Tin Oxide,铟锡氧化 物)电极或其他材料的透明电极。In a specific embodiment, each of the adjacent two ends of the pixel electrode 81 and the pixel electrode 82 and the light shielding layer 60 are in a distance direction between the pixel electrode 81 and the pixel electrode 82 (for example, the horizontal direction in FIG. 1) The value of the overlap length L1 above ranges from 1 μm to 5 μm, and the pixel electrode 81 and the pixel electrode 82 may be ITO (Indium Tin Oxide, indium tin oxide) electrodes or transparent electrodes made of other materials.
在一个具体实施例中,例如图3所示,像素电极81和像素电极82还包括条状的主干电极83,遮光层60与主干电极83形成对板电容。请参见图4,存储电容和对板电容形成网状分布,可有效降低Feedthrogh电压,降低了Feedthrough电压存在偏大的风险,提升显示品质,该网状分布如图4的虚线处所示。In a specific embodiment, for example, as shown in FIG. 3, the pixel electrode 81 and the pixel electrode 82 further include a strip-shaped trunk electrode 83, and the light shielding layer 60 and the trunk electrode 83 form a counter-plate capacitance. Please refer to FIG. 4, the storage capacitors and the counter-board capacitors form a mesh distribution, which can effectively reduce the Feedthrogh voltage, reduce the risk of excessive Feedthrough voltage, and improve the display quality. The mesh distribution is shown at the dotted line in FIG. 4.
在一个具体实施例中,例如图2所示,像素控制层20还包括位于衬底10和钝化层30之间且依次堆叠设置的栅电极21、栅绝缘层22、通道层23、欧姆接触层24和源漏极层,其中源漏极层包括源极251和漏极252,数据线DL电连接源极251和漏极252中之一者例如源极251,且像素电极81或像素电极82连接源极251和漏极252中之另一者例如漏极252,遮光层60电连接公共电极。此处值得一提的是,栅电极21、栅绝缘层22、通道层23、欧姆接触层24和源漏极层共同构成本发明实施例的像素晶体管PT(参见图6),其电连接像素控制层20的数据线DL和扫描线GL,并与像素电极81或像素电极82形成电连接。In a specific embodiment, for example, as shown in FIG. 2, the pixel control layer 20 further includes a gate electrode 21, a gate insulating layer 22, a channel layer 23, and an ohmic contact located between the substrate 10 and the passivation layer 30 and stacked in sequence. The layer 24 and the source-drain layer, wherein the source-drain layer includes a source electrode 251 and a drain electrode 252, the data line DL is electrically connected to one of the source electrode 251 and the drain electrode 252, such as the source electrode 251, and the pixel electrode 81 or the pixel electrode 82 is connected to the other of the source electrode 251 and the drain electrode 252, such as the drain electrode 252, and the light shielding layer 60 is electrically connected to the common electrode. It is worth mentioning here that the gate electrode 21, the gate insulating layer 22, the channel layer 23, the ohmic contact layer 24, and the source drain layer together constitute the pixel transistor PT (see FIG. 6) of the embodiment of the present invention, which is electrically connected to the pixel The data line DL and the scan line GL of the control layer 20 are electrically connected to the pixel electrode 81 or the pixel electrode 82.
在一个具体实施例中,遮光层60在像素电极81和像素电极82的距离方向上的宽度L2大于或等于数据线DL在所述距离方向上的宽度L3。In a specific embodiment, the width L2 of the light shielding layer 60 in the distance direction between the pixel electrode 81 and the pixel electrode 82 is greater than or equal to the width L3 of the data line DL in the distance direction.
在一个具体实施例中,在钝化层30和衬底10之间且位于像素电极81和像素电极82之所述相邻两端的垂直投影区域VPA内未设置遮蔽金属,也即不设置传统技术中作为Com线的遮蔽金属。In a specific embodiment, no shielding metal is provided in the vertical projection area VPA between the passivation layer 30 and the substrate 10 and located at the adjacent ends of the pixel electrode 81 and the pixel electrode 82, that is, no conventional technology is provided. As the shielding metal of the Com line.
为了更具体的说明,请参见图5和图6,图5为传统技术中COA型阵列基板(具有位于像素电极和数据线之间并位于数据线所在层下方以作为存储电容的电极板之遮蔽金属)的像素结构布局(Layout)示意图;图6为本发明提供的COA型阵列基板的像素结构布局示意图。相较于图5,图6所提供的COA型阵列基板具有更高的开口率(即AR=B/A*100%),以70寸8K的 COA型阵列基板为例,该实验数据请参见表1。For a more specific description, please refer to Figures 5 and 6. Figure 5 shows the COA type array substrate in the traditional technology (with the shielding of the electrode plate between the pixel electrode and the data line and below the layer where the data line is located, as a storage capacitor). Schematic diagram of the pixel structure layout of metal); FIG. 6 is a schematic diagram of the pixel structure layout of the COA type array substrate provided by the present invention. Compared with Figure 5, the COA type array substrate provided in Figure 6 has a higher aperture ratio (ie AR=B/A*100%). Take a 70-inch 8K COA type array substrate as an example. Please refer to the experimental data Table 1.
表1本发明实施例COA型阵列基板的开口区比较表Table 1 Comparison table of the opening area of the COA type array substrate of the embodiment of the present invention
Figure PCTCN2019107002-appb-000001
Figure PCTCN2019107002-appb-000001
从表1和图6可看出,本发明实施例的COA型阵列基板将像素电极81和像素电极82相邻的两端延伸至遮光层60上且与遮光层60部份重叠,同时免去传统技术中各个像素电极两侧的遮蔽金属,能够减小遮光区域的面积,开口区宽度增加至少29%,例如图5和图6所示的(58μm-45μm)/45μm≈29%,开口区的面积显著增加,穿透率显著提升。It can be seen from Table 1 and FIG. 6 that the COA type array substrate of the embodiment of the present invention extends the adjacent ends of the pixel electrode 81 and the pixel electrode 82 to the light shielding layer 60 and partially overlaps the light shielding layer 60, while eliminating The shielding metal on both sides of each pixel electrode in the traditional technology can reduce the area of the shielding area, and the width of the opening area is increased by at least 29%. For example, as shown in Figure 5 and Figure 6 (58μm-45μm)/45μm≈29%, the opening area The area is significantly increased, and the penetration rate is significantly improved.
请一并参见图1、图2和图7,本发明实施例还提供一种COA型阵列基板制作方法,例如包括以下步骤:Please refer to FIG. 1, FIG. 2 and FIG. 7 together. The embodiment of the present invention also provides a COA type array substrate manufacturing method, which includes the following steps, for example:
提供衬底10;Provide substrate 10;
于衬底10上设置像素控制层20,其中像素控制层20包括数据线DL;A pixel control layer 20 is provided on the substrate 10, wherein the pixel control layer 20 includes a data line DL;
形成钝化层30以覆盖包括数据线DL的像素控制层20;Forming a passivation layer 30 to cover the pixel control layer 20 including the data line DL;
于钝化层30远离像素控制层20的一侧设置色阻层40,其中色阻层40包括多个不同颜色 的色阻,例如红色色阻(R)、绿色色阻(G)和蓝色色阻(B);A color resist layer 40 is provided on the side of the passivation layer 30 away from the pixel control layer 20, wherein the color resist layer 40 includes a plurality of color resists of different colors, such as red color resist (R), green color resist (G), and blue color resist. Resistance (B);
于色阻层40远离钝化层30的一侧设置钝化层50;A passivation layer 50 is provided on the side of the color resist layer 40 away from the passivation layer 30;
于钝化层50远离色阻层40的一侧设置遮光层60,其中遮光层60覆盖数据线DL,且遮光层60可以为透明电极;A light-shielding layer 60 is provided on the side of the passivation layer 50 away from the color resist layer 40, wherein the light-shielding layer 60 covers the data line DL, and the light-shielding layer 60 may be a transparent electrode;
于钝化层50远离色阻层40的一侧设置钝化层70,其中钝化层70覆盖遮光层60;以及A passivation layer 70 is provided on the side of the passivation layer 50 away from the color resist layer 40, wherein the passivation layer 70 covers the light shielding layer 60; and
于钝化层70远离钝化层50的一侧设置像素电极81和像素电极82,其中像素电极81和像素电极82相互间隔,像素电极81和像素电极82的相邻两端分别延伸至遮光层60上方与遮光层60重叠,遮光层60与像素电极81和像素电极82形成存储电容,像素电极81和像素电极82电连接像素控制层20。A pixel electrode 81 and a pixel electrode 82 are provided on the side of the passivation layer 70 away from the passivation layer 50, wherein the pixel electrode 81 and the pixel electrode 82 are separated from each other, and adjacent ends of the pixel electrode 81 and the pixel electrode 82 respectively extend to the light shielding layer The upper part of 60 overlaps with the light shielding layer 60, the light shielding layer 60 forms a storage capacitor with the pixel electrode 81 and the pixel electrode 82, and the pixel electrode 81 and the pixel electrode 82 are electrically connected to the pixel control layer 20.
在一个具体实施例中,所述于所述衬底上设置像素控制层的步骤包括以下子步骤:In a specific embodiment, the step of disposing a pixel control layer on the substrate includes the following sub-steps:
(i)通过第一次掩膜工艺在衬底10上形成像素控制层20的栅电极21;(i) The gate electrode 21 of the pixel control layer 20 is formed on the substrate 10 through the first mask process;
(ii)通过第二次掩膜工艺在栅电极21上形成依次堆叠的栅绝缘层22、通道层23和欧姆接触层24;以及(ii) The gate insulating layer 22, the channel layer 23, and the ohmic contact layer 24 are sequentially stacked on the gate electrode 21 through the second mask process; and
(iii)通过第三次掩膜工艺在欧姆接触层24上形成像素控制层20的源漏极层25并同步形成数据线DL,其中源漏极层25包括源极251和漏极252,源极251和漏极252中之一者例如源极251电连接数据线DL,源极251和漏极252中之另一者例如漏极252电连接像素电极81或像素电极82。此处值得说明的是,掩膜工艺为本领域技术人员熟知技术,故在此不作详述。(iii) The source and drain layer 25 of the pixel control layer 20 is formed on the ohmic contact layer 24 by the third mask process and the data line DL is simultaneously formed. The source and drain layer 25 includes a source electrode 251 and a drain electrode 252. One of the electrode 251 and the drain electrode 252, such as the source electrode 251, is electrically connected to the data line DL, and the other of the source electrode 251 and the drain electrode 252, such as the drain electrode 252, is electrically connected to the pixel electrode 81 or the pixel electrode 82. It is worth noting here that the mask process is well-known to those skilled in the art, so it will not be described in detail here.
在一个具体实施例中,所述于钝化层50远离色阻层40的一侧设置遮光层60的步骤包括子步骤:通过所述第四次掩膜工艺形成遮光层60,其中遮光层60电连接公共电极;In a specific embodiment, the step of disposing the light-shielding layer 60 on the side of the passivation layer 50 away from the color resist layer 40 includes a sub-step: forming the light-shielding layer 60 through the fourth masking process, wherein the light-shielding layer 60 Electrically connected to the common electrode;
所述于钝化层50远离色阻层40的一侧设置钝化层70的步骤包括子步骤:通过第五次掩膜工艺依序形成钝化层30、钝化层50、钝化层70,其中所述第五次掩膜工艺只在形成钝化层 70时进行黄光工艺;以及The step of disposing the passivation layer 70 on the side of the passivation layer 50 away from the color resist layer 40 includes sub-steps: sequentially forming the passivation layer 30, the passivation layer 50, and the passivation layer 70 through the fifth mask process. , Wherein the fifth mask process only performs the yellow light process when the passivation layer 70 is formed; and
所述于钝化层70远离钝化层50的一侧设置像素电极81和像素电极82的步骤包括子步骤:通过第六掩膜工艺形成像素电极81和像素电极82。The step of disposing the pixel electrode 81 and the pixel electrode 82 on the side of the passivation layer 70 away from the passivation layer 50 includes a sub-step: forming the pixel electrode 81 and the pixel electrode 82 through a sixth mask process.
在一个具体实施例中,遮光层60在像素电极81和像素电极82的距离方向上的宽度L2大于或等于数据线DL在所述距离方向上的宽度L3。In a specific embodiment, the width L2 of the light shielding layer 60 in the distance direction between the pixel electrode 81 and the pixel electrode 82 is greater than or equal to the width L3 of the data line DL in the distance direction.
在一个具体实施例中,像素电极81和像素电极82的所述相邻两端中的每一者与遮光层60在像素电极81和像素电极82的距离方向上的重叠长度L1的取值范围优选为1微米至5微米。In a specific embodiment, the value range of the overlap length L1 of each of the adjacent ends of the pixel electrode 81 and the pixel electrode 82 and the light shielding layer 60 in the distance direction between the pixel electrode 81 and the pixel electrode 82 Preferably it is 1 micrometer to 5 micrometers.
在一个具体实施例中,钝化层50的厚度D1大于或等于500埃米,钝化层70的厚度D2大于或等于2500埃米用以有效地防止像素电极81和像素电极82与遮光层60发生短路。In a specific embodiment, the thickness D1 of the passivation layer 50 is greater than or equal to 500 angstroms, and the thickness D2 of the passivation layer 70 is greater than or equal to 2500 angstroms to effectively prevent the pixel electrode 81 and the pixel electrode 82 from the light shielding layer 60 A short circuit occurred.
在一个具体实施例中,在钝化层30和衬底10之间且位于像素电极81和像素电极82之所述相邻两端的垂直投影区域VPA内未设置遮蔽金属也即不设置传统技术中作为Com线的遮蔽金属。In a specific embodiment, no shielding metal is provided in the vertical projection area VPA between the passivation layer 30 and the substrate 10 and located at the adjacent ends of the pixel electrode 81 and the pixel electrode 82, that is, no shielding metal is provided in the conventional technology. As a shielding metal for Com lines.
本发明实施例提供的COA型阵列基板制作方法透过六次光罩(6-mask)的制造工艺形成,相较于传统技术(即五次光罩的制造工艺),本发明实施例提供的COA型阵列基板制作方法以70寸8K为例,其穿透率高于传统技术,其实验数据请参见表2。The COA type array substrate manufacturing method provided by the embodiment of the present invention is formed through a 6-mask manufacturing process. Compared with the traditional technology (that is, the five-mask manufacturing process), the embodiment of the present invention provides The COA type array substrate manufacturing method takes 70-inch 8K as an example, and its penetration rate is higher than that of the traditional technology. Please refer to Table 2 for its experimental data.
表2本发明COA型阵列基板的穿透率比较表Table 2 Comparison table of transmittance of COA type array substrate of the present invention
Figure PCTCN2019107002-appb-000002
Figure PCTCN2019107002-appb-000002
从表2实验数据可说明本发明实施例提供的六次光罩工艺形成的COA型阵列基板开口率提升至少34%(也即[63.99%-47.63%]/47.63%≈34%),有效透光率提升大于或等于7.88%(也即88.84%-82.35%]/82.35%≈7.88%),穿透率至少提升45%,穿透率显著提升。From the experimental data in Table 2, it can be shown that the aperture ratio of the COA array substrate formed by the six mask processes provided by the embodiment of the present invention is increased by at least 34% (that is, [63.99%-47.63%]/47.63%≈34%). The increase in light rate is greater than or equal to 7.88% (that is, 88.84%-82.35%] / 82.35%≈7.88%), the penetration rate is increased by at least 45%, and the penetration rate is significantly increased.
值得一提的,本发明实施例提供的COA型阵列基板,相较于传统技术的COA型阵列基板,本发明实施例提供的COA型阵列基板以ITO为例,像素存储电容Cst具有以下优点:It is worth mentioning that the COA type array substrate provided by the embodiment of the present invention, compared with the conventional COA type array substrate, the COA type array substrate provided by the embodiment of the present invention takes ITO as an example, and the pixel storage capacitor Cst has the following advantages:
本发明实施例提供的COA型阵列基板结构的Cdc(Data与TFT-com之间的电容)和Cdlc(Data与CF-com之间的电容)占Cdata(与DL相关的电容之和)的比例最小;在本发明实施例提供的COA型阵列基板结构下,TFT-com电压和CF-com电压受到Data电压耦合量少,TFT-com和CF-com电压相对比较稳定。又因为像素电压被耦合最小,从而维持正常的显示电压,保证显示画面品质,该实验数据请参见表3;The ratio of Cdc (capacitance between Data and TFT-com) and Cdlc (capacitance between Data and CF-com) of the COA type array substrate structure provided by the embodiment of the present invention to Cdata (sum of capacitances related to DL) The smallest; under the COA type array substrate structure provided by the embodiment of the present invention, the TFT-com voltage and the CF-com voltage are less coupled by the Data voltage, and the TFT-com and CF-com voltages are relatively stable. Because the pixel voltage is coupled to a minimum, the normal display voltage is maintained and the display quality is guaranteed. Please refer to Table 3 for the experimental data;
请参见表3,本发明实施例提供的COA型阵列基板结构的Cdlc占Cdata比例最小,从而Data对CF-com的耦合效应最小,像素电压最稳定;Referring to Table 3, the COA type array substrate structure provided by the embodiment of the present invention has the smallest ratio of Cdlc to Cdata, so that the coupling effect of Data to CF-com is the smallest, and the pixel voltage is the most stable;
本发明实施例提供的COA结构的像素存储电容Cst电容值增加明显,本发明实施例提供的COA型阵列基板的Cst值是0.371pF,是传统技术的COA型阵列基板的3.2倍,非COA型阵列基板的2.5倍,可有效降低Feedthrogh电压,降低了Feedthrough电压存在偏大的风险, 导致像素电压不稳定而造成的影响显示品质问题,该实验数据请参见表4。The capacitance value of the pixel storage capacitor Cst of the COA structure provided by the embodiment of the present invention has increased significantly. The Cst value of the COA type array substrate provided by the embodiment of the present invention is 0.371 pF, which is 3.2 times that of the conventional COA type array substrate. 2.5 times that of the array substrate, it can effectively reduce the Feedthrogh voltage and reduce the risk that the Feedthrough voltage is too large, which will cause the pixel voltage to be unstable and affect the display quality. Please refer to Table 4 for the experimental data.
表3像素存储电容值比较表Table 3 Comparison table of pixel storage capacitor values
Figure PCTCN2019107002-appb-000003
Figure PCTCN2019107002-appb-000003
表4像素存储电容值比较表Table 4 Comparison table of pixel storage capacitor values
设计方式Design method Cst(pF)Cst(pF)
传统技术(5mask)COA型阵列基板Traditional technology (5mask) COA type array substrate 0.1160.116
非COA型阵列基板Non-COA type array substrate 0.1490.149
本发明实施例(6mask)COA型阵列基板Embodiment of the present invention (6mask) COA type array substrate 0.3710.371
最后应说明的是:以上实施例仅用以说明本发明的技术方案,而非对其限制;尽管参照前述实施例对本发明进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本发明各实施例技术方案的精神和范围。Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: The technical solutions recorded in the foregoing embodiments are modified, or some of the technical features thereof are equivalently replaced; these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims (19)

  1. 一种COA型阵列基板,包括:A COA type array substrate includes:
    衬底;Substrate
    像素控制层,设置于所述衬底上且包括数据线;A pixel control layer, which is disposed on the substrate and includes a data line;
    第一钝化层,覆盖包括所述数据线的所述像素控制层;A first passivation layer covering the pixel control layer including the data line;
    色阻层,设置于所述第一钝化层远离所述像素控制层的一侧;A color resist layer disposed on the side of the first passivation layer away from the pixel control layer;
    第二钝化层,设置于所述色阻层远离所述第一钝化层的一侧;The second passivation layer is disposed on a side of the color resist layer away from the first passivation layer;
    遮光层,设置于所述第二钝化层远离所述色阻层的一侧并覆盖所述数据线;A light-shielding layer disposed on a side of the second passivation layer away from the color resist layer and covering the data line;
    第三钝化层,设置于所述第二钝化层远离所述色阻层的一侧并覆盖所述遮光层;以及The third passivation layer is disposed on a side of the second passivation layer away from the color resist layer and covers the light-shielding layer; and
    第一像素电极和第二像素电极,相互间隔设置于所述第三钝化层的远离所述第二钝化层的一侧,其中所述第一像素电极和第二像素电极的相邻两端分别延伸至所述遮光层上与所述遮光层重叠,所述遮光层与所述第一像素电极和第二像素电极形成存储电容,所述第一像素电极和所述第二像素电极电连接所述像素控制层。The first pixel electrode and the second pixel electrode are arranged at a distance from each other on the side of the third passivation layer away from the second passivation layer, wherein two adjacent ones of the first pixel electrode and the second pixel electrode The ends respectively extend to the light-shielding layer and overlap the light-shielding layer, the light-shielding layer forms a storage capacitor with the first pixel electrode and the second pixel electrode, and the first pixel electrode and the second pixel electrode are electrically connected to each other. Connect the pixel control layer.
  2. 根据权利要求1所述的COA型阵列基板,其中,所述像素控制层还包括位于所述衬底和所述第一钝化层之间且依次堆叠设置的栅电极、栅绝缘层、通道层、欧姆接触层和源漏极层,所述源漏极层包括源极和漏极,所述数据线电连接所述源极和所述漏极之一,且所述第一像素电极电连接所述源极和所述漏极之另一,所述遮光层电连接公共电极。The COA type array substrate according to claim 1, wherein the pixel control layer further comprises a gate electrode, a gate insulating layer, and a channel layer located between the substrate and the first passivation layer and stacked in sequence. , An ohmic contact layer and a source-drain layer, the source-drain layer includes a source and a drain, the data line is electrically connected to one of the source and the drain, and the first pixel electrode is electrically connected The other of the source electrode and the drain electrode, and the light shielding layer is electrically connected to a common electrode.
  3. 根据权利要求1所述的COA型阵列基板,其中,所述遮光层在所述第一像素电极和所述第二像素电极的距离方向上的宽度大于或等于所述数据线在所述距离方向上的宽度。The COA type array substrate according to claim 1, wherein the width of the light shielding layer in the distance direction between the first pixel electrode and the second pixel electrode is greater than or equal to that of the data line in the distance direction. The width on the top.
  4. 根据权利要求1所述的COA型阵列基板,其中,所述第一像素电极和第二像素电极的所述相邻两端中的每一者与所述遮光层在所述第一像素电极和所述第二像素电极的距离方 向上的重叠长度的取值范围为1微米至5微米。The COA type array substrate according to claim 1, wherein each of the adjacent ends of the first pixel electrode and the second pixel electrode and the light-shielding layer are located between the first pixel electrode and the second pixel electrode. The overlap length in the distance direction of the second pixel electrode ranges from 1 micrometer to 5 micrometers.
  5. 根据权利要求1所述的COA型阵列基板,其中,所述第二钝化层的厚度大于或等于500埃米,所述第三钝化层的厚度大于或等于2500埃米。The COA type array substrate according to claim 1, wherein the thickness of the second passivation layer is greater than or equal to 500 angstroms, and the thickness of the third passivation layer is greater than or equal to 2500 angstroms.
  6. 根据权利要求1所述的COA型阵列基板,其中,在所述第一钝化层和所述衬底之间且位于所述相邻两端在所述衬底上的垂直投影区域内未设置遮蔽金属。The COA type array substrate according to claim 1, wherein, between the first passivation layer and the substrate and located at the adjacent two ends, there is no vertical projection area on the substrate. Shade the metal.
  7. 根据权利要求1所述的COA型阵列基板,其中,所述遮光层为透明电极。The COA type array substrate according to claim 1, wherein the light shielding layer is a transparent electrode.
  8. 根据权利要求1所述的COA型阵列基板,其中,所述第一像素电极和所述第二像素电极还包括条状的主干电极,所述遮光层与所述主干电极形成对板电容,所述对板电容与所述存储电容形成网状分布。The COA type array substrate according to claim 1, wherein the first pixel electrode and the second pixel electrode further comprise a strip-shaped main electrode, and the light shielding layer and the main electrode form a counter-plate capacitance, so The pair of plate capacitors and the storage capacitors form a net-like distribution.
  9. 根据权利要求1所述的COA型阵列基板,其中,所述色阻层包括多个不同颜色的色阻。The COA type array substrate according to claim 1, wherein the color resist layer comprises a plurality of color resists of different colors.
  10. 一种COA型阵列基板制作方法,包括:A method for manufacturing a COA type array substrate includes:
    提供衬底;Provide substrate;
    于所述衬底上设置像素控制层,其中所述像素控制层包括数据线;Disposing a pixel control layer on the substrate, wherein the pixel control layer includes a data line;
    形成第一钝化层以覆盖包括所述数据线的所述像素控制层;Forming a first passivation layer to cover the pixel control layer including the data line;
    于所述第一钝化层的远离所述像素控制层的一侧设置色阻层;Disposing a color resist layer on the side of the first passivation layer away from the pixel control layer;
    于所述色阻层的远离所述第一钝化层的一侧设置第二钝化层;Disposing a second passivation layer on a side of the color resist layer away from the first passivation layer;
    于所述第二钝化层的远离所述色阻层的一侧设置遮光层,其中所述遮光层覆盖所述数据线;Disposing a light-shielding layer on a side of the second passivation layer away from the color resist layer, wherein the light-shielding layer covers the data line;
    于所述第二钝化层的远离所述色阻层的一侧设置第三钝化层,其中所述第三钝化层覆盖所述遮光层;以及Disposing a third passivation layer on a side of the second passivation layer away from the color resist layer, wherein the third passivation layer covers the light shielding layer; and
    于所述第三钝化层的远离所述第二钝化层的一侧设置第一像素电极和第二像素电极,其中所述第一像素电极和所述第二像素电极相互间隔,所述第一像素电极和第二像素电极的相邻两端分别延伸至所述遮光层上与所述遮光层重叠,所述遮光层与所述第一像素电极和第二像素电极形成存储电容,所述第一像素电极和所述第二像素电极电连接所述像素控制层。A first pixel electrode and a second pixel electrode are provided on a side of the third passivation layer away from the second passivation layer, wherein the first pixel electrode and the second pixel electrode are spaced apart from each other, and the The adjacent two ends of the first pixel electrode and the second pixel electrode respectively extend to the light shielding layer to overlap with the light shielding layer, and the light shielding layer forms a storage capacitor with the first pixel electrode and the second pixel electrode, so The first pixel electrode and the second pixel electrode are electrically connected to the pixel control layer.
  11. 根据权利要求10所述的COA型阵列基板制作方法,其中,所述于所述衬底上设置像素控制层包括:11. The COA type array substrate manufacturing method according to claim 10, wherein said disposing a pixel control layer on said substrate comprises:
    通过第一次掩膜工艺在所述衬底上形成所述像素控制层的栅电极;Forming the gate electrode of the pixel control layer on the substrate through a first mask process;
    通过第二次掩膜工艺在所述栅电极上形成依次堆叠的栅绝缘层、通道层和欧姆接触层;以及Forming a gate insulating layer, a channel layer, and an ohmic contact layer sequentially stacked on the gate electrode through a second mask process; and
    通过第三次掩膜工艺在所述欧姆接触层上形成所述像素控制层的源漏极层并同步形成所述数据线,其中所述源漏极层包括源极和漏极,所述源极和所述漏极之一电连接所述数据线,所述源极和所述漏极之另一电连接所述第一像素电极。The source and drain layers of the pixel control layer are formed on the ohmic contact layer through a third mask process and the data lines are simultaneously formed, wherein the source and drain layers include a source and a drain, and the source One of the electrode and the drain is electrically connected to the data line, and the other of the source and the drain is electrically connected to the first pixel electrode.
  12. 根据权利要求11所述的COA型阵列基板制作方法,其中,所述于所述第二钝化层的远离所述色阻层的一侧设置遮光层包括:11. The COA type array substrate manufacturing method of claim 11, wherein said disposing a light-shielding layer on a side of the second passivation layer away from the color resist layer comprises:
    通过第四次掩膜工艺形成所述遮光层,其中所述遮光层电连接公共电极;Forming the light-shielding layer through a fourth mask process, wherein the light-shielding layer is electrically connected to a common electrode;
    所述于所述第二钝化层的远离所述色阻层的一侧设置第三钝化层包括:The disposing a third passivation layer on a side of the second passivation layer away from the color resist layer includes:
    通过第五次掩膜工艺依序形成所述第一钝化层、所述第二钝化层和所述第三钝化层、且只在形成所述第三钝化层时进行黄光工艺;以及The first passivation layer, the second passivation layer, and the third passivation layer are sequentially formed through the fifth mask process, and the yellow light process is performed only when the third passivation layer is formed ;as well as
    所述于所述第三钝化层的远离所述第二钝化层的一侧设置第一像素电极和第二像素电极包括:The disposing of the first pixel electrode and the second pixel electrode on a side of the third passivation layer away from the second passivation layer includes:
    通过第六掩膜工艺形成所述第一像素电极和所述第二像素电极。The first pixel electrode and the second pixel electrode are formed through a sixth mask process.
  13. 根据权利要求10所述的COA型阵列基板制作方法,其中,所述遮光层在所述第一像素电极和所述第二像素电极的距离方向上的宽度大于或等于所述数据线在所述距离方向上的宽度。The COA type array substrate manufacturing method according to claim 10, wherein the width of the light-shielding layer in the distance direction between the first pixel electrode and the second pixel electrode is greater than or equal to that of the data line in the The width in the distance direction.
  14. 根据权利要求10所述的COA型阵列基板制作方法,其中,所述第一像素电极和第二像素电极的所述相邻两端中的每一者与所述遮光层在所述第一像素电极和所述第二像素电极的距离方向上的重叠长度的取值范围为1微米至5微米。The COA type array substrate manufacturing method according to claim 10, wherein each of the adjacent ends of the first pixel electrode and the second pixel electrode and the light shielding layer are in the first pixel The value range of the overlap length in the distance direction between the electrode and the second pixel electrode is 1 μm to 5 μm.
  15. 根据权利要求10所述的COA型阵列基板制作方法,其中,所述第二钝化层的厚度大于或等于500埃米,所述第三钝化层的厚度大于或等于2500埃米。10. The manufacturing method of the COA type array substrate according to claim 10, wherein the thickness of the second passivation layer is greater than or equal to 500 angstroms, and the thickness of the third passivation layer is greater than or equal to 2500 angstroms.
  16. 根据权利要求10所述的COA型阵列基板制作方法,其中,在所述第一钝化层和所述衬底之间且位于所述相邻两端在所述衬底上的垂直投影区域内未设置遮蔽金属。The COA type array substrate manufacturing method according to claim 10, wherein, between the first passivation layer and the substrate and located in the vertical projection area of the adjacent two ends on the substrate No shielding metal is provided.
  17. 根据权利要求10所述的COA型阵列基板制作方法,其中,所述遮光层为透明电极。10. The method for manufacturing a COA type array substrate according to claim 10, wherein the light shielding layer is a transparent electrode.
  18. 根据权利要求10所述的COA型阵列基板制作方法,其中,所述第一像素电极和所述第二像素电极还包括条状的主干电极,所述遮光层与所述主干电极形成对板电容,所述对板电容与所述存储电容形成网状分布。The COA type array substrate manufacturing method of claim 10, wherein the first pixel electrode and the second pixel electrode further comprise a strip-shaped main electrode, and the light shielding layer and the main electrode form a counter-plate capacitance , The pair of plate capacitors and the storage capacitors form a net-like distribution.
  19. 根据权利要求10所述的COA型阵列基板制作方法,其中,所述色阻层包括多个不同颜色的色阻。10. The COA type array substrate manufacturing method according to claim 10, wherein the color resist layer comprises a plurality of color resists of different colors.
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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003280032A (en) * 2002-03-20 2003-10-02 Matsushita Electric Ind Co Ltd Liquid crystal display device
US20070195213A1 (en) * 2006-02-17 2007-08-23 Samsung Electronics Co., Ltd. Liquid crystal display
US20080111138A1 (en) * 2006-11-10 2008-05-15 Au Optronics Corp. Pixel structure and method for fabricating the same
US20100144071A1 (en) * 2007-03-27 2010-06-10 Au Optronics Corporation Pixel structure and manufacturing method thereof
US20160202543A1 (en) * 2015-01-14 2016-07-14 Samsung Display Co., Ltd. Liquid crystal display device
US20160274410A1 (en) * 2015-03-17 2016-09-22 Samsung Display Co., Ltd. Display device and method of manufacturing the same
US20160274428A1 (en) * 2015-03-17 2016-09-22 Samsung Display Co., Ltd. Display device and method of manufacturing the same
CN106773392A (en) * 2016-11-28 2017-05-31 深圳市华星光电技术有限公司 A kind of array base palte and preparation method, curved surface liquid crystal display panel

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003280032A (en) * 2002-03-20 2003-10-02 Matsushita Electric Ind Co Ltd Liquid crystal display device
US20070195213A1 (en) * 2006-02-17 2007-08-23 Samsung Electronics Co., Ltd. Liquid crystal display
US20080111138A1 (en) * 2006-11-10 2008-05-15 Au Optronics Corp. Pixel structure and method for fabricating the same
US20100144071A1 (en) * 2007-03-27 2010-06-10 Au Optronics Corporation Pixel structure and manufacturing method thereof
US20160202543A1 (en) * 2015-01-14 2016-07-14 Samsung Display Co., Ltd. Liquid crystal display device
US20160274410A1 (en) * 2015-03-17 2016-09-22 Samsung Display Co., Ltd. Display device and method of manufacturing the same
US20160274428A1 (en) * 2015-03-17 2016-09-22 Samsung Display Co., Ltd. Display device and method of manufacturing the same
CN106773392A (en) * 2016-11-28 2017-05-31 深圳市华星光电技术有限公司 A kind of array base palte and preparation method, curved surface liquid crystal display panel

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