WO2021036988A1 - Multi-threading sample testing method for x-ray diffractometer - Google Patents

Multi-threading sample testing method for x-ray diffractometer Download PDF

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WO2021036988A1
WO2021036988A1 PCT/CN2020/110818 CN2020110818W WO2021036988A1 WO 2021036988 A1 WO2021036988 A1 WO 2021036988A1 CN 2020110818 W CN2020110818 W CN 2020110818W WO 2021036988 A1 WO2021036988 A1 WO 2021036988A1
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sample
test
thread
input
information
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宋新月
张吉东
李才华
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中国科学院长春应用化学研究所
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/306—Accessories, mechanical or electrical features computer control

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  • the invention relates to the technical field of X-ray diffractometers, in particular to a multithreaded sample testing method for X-ray diffractometers.
  • X-ray diffractometer is a common instrument used to characterize the crystalline structure of materials.
  • the operating mode of the testing software used in X-ray diffractometers generally has two processes: first enter the test conditions and sample information, then start the test, and then automatically save the results according to the sample information (such as Rigaku’s Smartlab diffractometer, etc.); or After entering the test conditions, start the test, and then enter the sample information to save the results (such as the D8 diffractometer of German Bruker).
  • the sample information such as Rigaku’s Smartlab diffractometer, etc.
  • test speed of a sample is ten to ten minutes, and the time occupied by the information input of a sample of ten to tens of seconds does not have a great impact on the test efficiency.
  • the test speed is getting faster and faster.
  • the time occupied by the two steps of input is greatly Affects the test efficiency of the diffractometer, so a new test method is needed to solve this defect.
  • the present invention adopts the following technical solutions:
  • a multi-threaded sample testing method for X-ray diffractometer including the following steps:
  • a core of the CPU in the X-ray diffractometer starts the input thread.
  • the input thread receives the sample information and test conditions of the first sample input by the user and stores the sample information and test conditions in corresponding arrays. Each array constitutes common data.
  • Test conditions include sample position and exposure time;
  • the other core of the CPU starts the test thread.
  • the test thread controls the movement of multiple sample stages according to the test conditions of the first sample in the common data, moves the first sample to the test position, and according to the sample information of the first sample and
  • the test condition controls the detector to start testing the first sample
  • the test thread saves the test result according to the sample information of the first sample and displays the test result on the display terminal, and the test thread updates the variable of the number of tested samples, and the updated variable of the number of tested samples The value of is increased by 1;
  • the test thread judges whether the value of the updated sample number variable is less than the total number of samples in the public data. If so, the test thread controls the movement of multiple sample stages according to the test conditions of the next sample in the public data, and moves the next sample to the test Position, and control the detector to start testing the next sample according to the sample information and test conditions of the next sample; if not, the CPU closes the test thread;
  • the input thread After the input thread stores the sample information and test conditions of the first sample in the corresponding arrays, while the test thread tests the samples, the input thread judges whether to receive the sample information and test conditions of all samples input by the user. If not, Then the input thread adds and stores the sample information and test conditions of the next sample into the corresponding array in the common data; if so, the CPU closes the input thread.
  • the present invention has the following beneficial effects:
  • the invention adopts multi-threading technology, and the test process of the sample and the input process of sample information and test conditions are respectively controlled by different threads of the computer, so that the background thread uses another CPU core to control the test while the sample information and test conditions are input. , Which saves the time occupied by the input process, and can greatly improve the test efficiency for a high-speed X-ray diffractometer with multiple sample stages.
  • Fig. 1 is a schematic flow chart of a multi-threaded sample testing method for an X-ray diffractometer in one embodiment of the present invention.
  • the invention uses multi-threading technology to separate the test process from the input process of sample information and test conditions, and uses different CPU cores to run, so that the test process is carried out at the same time when the input process is in progress, reducing the impact of input time, and is useful for having multiple sample stations.
  • the test efficiency can be greatly improved.
  • the present invention discloses a multi-threaded sample testing method for X-ray diffractometer, the method includes the following steps:
  • a core of the CPU in the X-ray diffractometer starts the input thread.
  • the input thread receives the sample information and test conditions of the first sample input by the user and stores the sample information and test conditions in the corresponding arrays.
  • Each array constitutes common data;
  • the other core of the CPU starts the test thread.
  • the test thread controls the movement of multiple sample stages according to the test conditions of the first sample in the common data, moves the first sample to the test position, and according to the sample information of the first sample and
  • the test condition controls the detector to start testing the first sample
  • the test thread saves the test result according to the sample information of the first sample and displays the test result on the display terminal, and the test thread updates the variable of the number of tested samples, and the updated variable of the number of tested samples The value of is increased by 1;
  • the test thread judges whether the value of the updated sample number variable is less than the total number of samples in the public data. If so, the test thread controls the movement of multiple sample stages according to the test conditions of the next sample in the public data, and moves the next sample to the test Position, and control the detector to start testing the next sample according to the sample information and test conditions of the next sample; if not, the CPU closes the test thread;
  • the input thread After the input thread stores the sample information and test conditions of the first sample in the corresponding arrays, while the test thread tests the samples, the input thread judges whether to receive the sample information and test conditions of all samples input by the user. If so, then The input thread adds the sample information and test conditions of the next sample to the corresponding array in the common data; if not, the CPU closes the input thread.
  • the diffractometer door is opened, multiple samples are placed on the multiple sample stages, and then the diffractometer door is closed, and the test is started.
  • a core of the CPU in the X-ray diffractometer starts the input thread.
  • the input thread receives the sample information and test conditions of the first sample entered by the user.
  • the sample information includes the sample name and can also include the sample number.
  • the test conditions include the sample location and exposure. Time; the input thread stores the sample information and test conditions into corresponding arrays, and each array composes the common data of different threads.
  • One core of the CPU starts the input thread, and after the input thread receives the sample information and test conditions of the first sample input by the user, another core of the CPU starts the test thread, and the test thread is based on the test conditions of the first sample in the public data.
  • Control the movement of multiple sample stages multiple sample stages include goniometer, electric translation stage, angular motion stage and rotating stage), thereby moving the first sample to the test position, and according to the sample information and testing of the first sample
  • the condition control detector starts testing the first sample.
  • the test thread After the test thread finishes testing the first sample, the test thread saves the test result according to the sample information of the first sample and displays the test result on the display terminal.
  • the test result is a picture in tiff format.
  • the test thread evaluates the number of samples tested. The variable is updated, and the value of the updated sample number variable increases by 1.
  • the test thread judges whether the value of the updated sample number variable is less than the total number of samples in the public data. If so, the test thread controls the movement of multiple sample stages according to the test conditions of the next sample in the public data, and moves the next sample to the test Position, and control the detector to start testing the next sample according to the sample information and test conditions of the next sample, until the value of the updated sample number variable is equal to the total number of samples in the public data, that is, after all samples are tested, the test thread Close to end the test; if not, the CPU closes the test thread and ends the test.
  • the input thread After the input thread stores the sample information and test conditions of the first sample in the corresponding arrays, while the test thread tests the samples, the input thread judges whether to receive the sample information and test conditions of all samples input by the user. If the sample information and test conditions of all samples entered by the user are not received, the input thread does not change the initial value 0 of the tag variable, and the input thread adds the sample information and test conditions of the next sample to the corresponding array in the public data. ; If the input thread has received the sample information and test conditions of all samples input by the user, the input thread assigns the value of the tag variable, and the value of the tag variable after the assignment is 1, and the CPU closes the input thread, ending the input of sample information and test conditions process.
  • the multi-threaded test method for X-ray diffractometer proposed in this embodiment adopts multi-threaded technology, and the test process of the sample and the input process of sample information and test conditions are respectively controlled by different threads of the computer. At the same time of input, the background thread uses another CPU core to control the test, which saves the time occupied by the input process. For high-speed X-ray diffractometers with multiple sample stages, the test efficiency can be greatly improved.
  • test thread controls the movement of multiple sample stages according to the test conditions of the first sample in the public data
  • process of moving the first sample to the test position includes the following steps:
  • the test thread reads the position information of the current multiple sample stages
  • the test thread calculates the moving direction and moving distance of the multiple sample stages according to the sample position in the test condition of the first sample and the position information of the current multiple sample stages;
  • the test thread controls the electric translation stage in the multi-position sample stage to move the first sample to the test position.
  • the test thread is connected to the electric translation stage through the COM port, USB, network cable, GPIB and other interfaces to control the movement of the electric translation stage.
  • test thread forms a communication connection with the controller and the detector of the electric translation stage through the COM port and the Socket port, so as to control the movement of the electric translation stage and the work of the detector.
  • the controller of the electric translation stage is a PNC100 controller.
  • the detector is a two-dimensional X-ray detector, the model being Pilatus 100K.
  • the test thread opens the COM port and Socket port to form a motorized translation stage controller for multiple sample stages (such as the PMC100 controller from Sanying Precision Technology Co., Ltd.) and a two-dimensional X-ray detector (such as the Pilatus100K model from Detrics, Germany) Communication connection to realize the control of the electric translation stage and the detector.
  • a motorized translation stage controller for multiple sample stages (such as the PMC100 controller from Sanying Precision Technology Co., Ltd.) and a two-dimensional X-ray detector (such as the Pilatus100K model from Detrics, Germany) Communication connection to realize the control of the electric translation stage and the detector.
  • a core of the CPU starts the input thread (that is, the current thread).
  • the input thread receives the sample name, sample position, and exposure time of the first sample entered by the user, and stores them in the corresponding filename, position, and exposure time.
  • the test thread uses the Expose function as the calling function, and its input parameters are the sample position, sample name, and exposure time; first, another core of the CPU starts the test thread, and the test thread reads the position information of the current multiple sample stages.
  • test thread calls the Expose function to test the sample according to the sample name, sample position and exposure time, and finally The test result is saved as a picture in tiff format named after the sample name.
  • the input thread continues to receive the sample information and test conditions input by the user, and add them to the corresponding three arrays of filename, position and exposetime. Specifically, after the input thread stores the sample information and test conditions of the first sample in the corresponding arrays, while the test thread tests the samples, the input thread determines whether to receive the sample information and test conditions of all samples input by the user. If the input thread does not receive the sample information and test conditions of all samples entered by the user, the input thread adds the sample information and test conditions of the next sample to the corresponding array in the public data; if the input thread has already received When the sample information and test conditions of all samples input by the user are reached, the CPU closes the input thread and ends the input process.
  • test thread After the test thread completes the test of a sample, it will update the variable of the number of tested samples (that is, the index variable). The value of the updated number of tested samples will increase by 1, and the test thread will update the value of the number of samples after the update ( That is, the index variable value) is compared with the total number of samples in the public data to determine whether the value of the updated sample number variable is less than the total number of samples in the public data.
  • the test thread continues to test the next sample, that is, control the movement of multiple sample stages according to the test conditions of the next sample in the public data, move the next sample to the test position, and control according to the sample information and test conditions of the next sample
  • the detector starts to test the next sample; if the value of the updated sample number variable is equal to the total number of samples in the public data, the CPU closes the test thread and displays the completion of all tests on the display terminal.

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Abstract

A multi-threading sample testing method for an X-ray diffractometer. The method uses multi-threading technology, and comprises: one core of a CPU in an X-ray diffractometer starting an input thread, wherein the input thread is used for receiving sample information and a test condition input by a user and respectively storing the sample information and the test condition in corresponding arrays; another core of the CPU starting a test thread, and the test thread controlling, according to the sample information and the test condition, a detector to test a sample; and the testing thread saving a test result according to the sample information of the sample and displaying the test result on a display terminal. By means of different threads of a computer respectively controlling a sample testing process and a sample information and test condition inputting process, a background thread performs control by using another CPU core to perform testing while the sample information and the test condition are input, the time occupied by the input process is saved on, and the test efficiency of a high-speed X-ray diffractometer with a plurality of sample stages is improved.

Description

X射线衍射仪用多线程样品测试方法Multi-threaded sample test method for X-ray diffractometer 技术领域Technical field
本发明涉及X射线衍射仪技术领域，特别是涉及一种X射线衍射仪用多线程样品测试方法。The invention relates to the technical field of X-ray diffractometers, in particular to a multithreaded sample testing method for X-ray diffractometers.
背景技术Background technique
X射线衍射仪是用来表征材料结晶结构的常用仪器。目前X射线衍射仪用的测试软件的操作模式一般有两种流程：先输入测试条件与样品信息后开始测试，之后自动按照样品信息保存结果(如日本理学公司的Smartlab衍射仪等)；或者先输入测试条件后开始测试，之后输入样品信息保存结果(如德国布鲁克公司的D8衍射仪等)。测试时一般需要先用计算机控制测角仪及相关平台运行到指定位置，再打开快门后开始收集衍射数据，之后关闭快门。为了减少换样的繁琐，近来还出现了多位样品台技术，可以一次性放入多个样品，一个样品测完后由电动平移台或机械手将下一个样品移到测试位置。这种模式下都采用先输入测试条件与样品信息的模式，而且还需要额外输入每个样品的位置信息。X-ray diffractometer is a common instrument used to characterize the crystalline structure of materials. At present, the operating mode of the testing software used in X-ray diffractometers generally has two processes: first enter the test conditions and sample information, then start the test, and then automatically save the results according to the sample information (such as Rigaku’s Smartlab diffractometer, etc.); or After entering the test conditions, start the test, and then enter the sample information to save the results (such as the D8 diffractometer of German Bruker). During the test, it is generally necessary to use a computer to control the goniometer and related platform to run to the specified position, then open the shutter and start collecting diffraction data, and then close the shutter. In order to reduce the cumbersome sample change, there has recently been a multi-sampling stage technology, which can put multiple samples at one time. After one sample is tested, the next sample is moved to the test position by an electric translation stage or a manipulator. In this mode, the test conditions and sample information are input first, and the location information of each sample needs to be input additionally.
但是目前这些方法都是基于单线程方法操作实现的，即计算机要等待测试条件或样品信息输入结束后才开始测试，而输入测试条件或样品信息需要占用一定的时间。对于常规X射线衍射仪一个样品十几到几十分钟的测试速度，一个样品的信息输入占用的十几到几十秒的时间尚不对测试效率有很大影响。但是随着X射线衍射仪光源的改进和阵列探测器的出现，测试速度越来越快，当使用多位样品台的衍射仪测试速度达到百秒以下时，这两步输入占用的时间极大地影响了衍射仪的测试效率，因此需要新的测试方法来解决这个缺陷。However, these methods are currently implemented based on single-threaded operation, that is, the computer waits for the input of test conditions or sample information to start the test, and it takes a certain amount of time to input the test conditions or sample information. For a conventional X-ray diffractometer, the test speed of a sample is ten to ten minutes, and the time occupied by the information input of a sample of ten to tens of seconds does not have a great impact on the test efficiency. However, with the improvement of the X-ray diffractometer light source and the appearance of array detectors, the test speed is getting faster and faster. When the test speed of the diffractometer using multiple sample stages reaches below 100 seconds, the time occupied by the two steps of input is greatly Affects the test efficiency of the diffractometer, so a new test method is needed to solve this defect.
发明内容Summary of the invention
基于此，有必要针对目前X射线衍射仪的样品测试方法存在测试效率低的问题，提供一种X射线衍射仪用多线程样品测试方法。Based on this, it is necessary to provide a multi-threaded sample testing method for X-ray diffractometers in view of the problem of low test efficiency in the current sample testing methods of X-ray diffractometers.
为解决上述问题，本发明采取如下的技术方案：To solve the above problems, the present invention adopts the following technical solutions:
一种X射线衍射仪用多线程样品测试方法，包括以下步骤：A multi-threaded sample testing method for X-ray diffractometer, including the following steps:
X射线衍射仪中CPU的一个内核启动输入线程，输入线程接收用户输入的第一个样品的样品信息和测试条件并将样品信息和测试条件分别存储到对应的数组中，各个数组组成公用数据，测试条件包括样品位置和曝光时间；A core of the CPU in the X-ray diffractometer starts the input thread. The input thread receives the sample information and test conditions of the first sample input by the user and stores the sample information and test conditions in corresponding arrays. Each array constitutes common data. Test conditions include sample position and exposure time;
CPU的另一个内核启动测试线程，测试线程根据公用数据中的第一个样品的测试条件控制多位样品台移动，将第一个样品移动至测试位置，并根据第一个样品的样品信息和测试条件控制探测器开始对第一个样品进行测试；The other core of the CPU starts the test thread. The test thread controls the movement of multiple sample stages according to the test conditions of the first sample in the common data, moves the first sample to the test position, and according to the sample information of the first sample and The test condition controls the detector to start testing the first sample;
第一个样品测试完成后，测试线程根据第一个样品的样品信息保存测试结果并在显示终端上显示测试结果，且测试线程对已测样品数目变量进行更新，更新后的已测样品数目变量的数值增加1；After the test of the first sample is completed, the test thread saves the test result according to the sample information of the first sample and displays the test result on the display terminal, and the test thread updates the variable of the number of tested samples, and the updated variable of the number of tested samples The value of is increased by 1;
测试线程判断更新后的样品数目变量的数值是否小于公用数据中样品的总数，若是，则测试线程根据公用数据中的下一个样品的测试条件控制多位样品台移动，将下一个样品移动至测试位置，并根据下一个样品的样品信息和测试条件控制探测器开始对下一个样品进行测试；若否，则CPU关闭测试线程；The test thread judges whether the value of the updated sample number variable is less than the total number of samples in the public data. If so, the test thread controls the movement of multiple sample stages according to the test conditions of the next sample in the public data, and moves the next sample to the test Position, and control the detector to start testing the next sample according to the sample information and test conditions of the next sample; if not, the CPU closes the test thread;
输入线程将第一个样品的样品信息和测试条件分别存储到对应的数组中之后，在测试线程测试样品的同时，输入线程判断是否接收用户输入的全部样品的样品信息和测试条件，若否，则输入线程将下一个样品的样品信息和测试条件分别添加存储到公用数据中对应的数组中；若是，则CPU关闭输入线程。After the input thread stores the sample information and test conditions of the first sample in the corresponding arrays, while the test thread tests the samples, the input thread judges whether to receive the sample information and test conditions of all samples input by the user. If not, Then the input thread adds and stores the sample information and test conditions of the next sample into the corresponding array in the common data; if so, the CPU closes the input thread.
与现有技术相比，本发明具有以下有益效果：Compared with the prior art, the present invention has the following beneficial effects:
本发明采用多线程技术，将样品的测试过程与样品信息和测试条件输入过程分别用计算机不同的线程来控制，实现了在样品信息和测试条 件输入的同时后台线程利用另外的CPU核控制进行测试，节约了输入过程占用的时间，对于拥有多位样品台的高速X射线衍射仪来讲可以大大提高测试效率。The invention adopts multi-threading technology, and the test process of the sample and the input process of sample information and test conditions are respectively controlled by different threads of the computer, so that the background thread uses another CPU core to control the test while the sample information and test conditions are input. , Which saves the time occupied by the input process, and can greatly improve the test efficiency for a high-speed X-ray diffractometer with multiple sample stages.
附图说明Description of the drawings
图1为本发明其中一个实施例中X射线衍射仪用多线程样品测试方法的流程示意图。Fig. 1 is a schematic flow chart of a multi-threaded sample testing method for an X-ray diffractometer in one embodiment of the present invention.
具体实施方式detailed description
本发明采用多线程技术将测试过程与样品信息和测试条件输入过程分开，采用不同的CPU内核运行，使得在输入过程进行时同时进行测试过程，减少了输入时间的影响，对于拥有多位样品台的高速X射线衍射仪来讲可以大大提高测试效率。下面将结合附图及较佳实施例对本发明的技术方案进行详细描述。The invention uses multi-threading technology to separate the test process from the input process of sample information and test conditions, and uses different CPU cores to run, so that the test process is carried out at the same time when the input process is in progress, reducing the impact of input time, and is useful for having multiple sample stations. In terms of high-speed X-ray diffractometer, the test efficiency can be greatly improved. The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings and preferred embodiments.
在其中一个实施例中，如图1所示，本发明公开一种X射线衍射仪用多线程样品测试方法，该方法包括以下步骤：In one of the embodiments, as shown in Fig. 1, the present invention discloses a multi-threaded sample testing method for X-ray diffractometer, the method includes the following steps:
X射线衍射仪中CPU的一个内核启动输入线程，输入线程接收用户输入的第一个样品的样品信息和测试条件并将样品信息和测试条件分别存储到对应的数组中，各个数组组成公用数据；A core of the CPU in the X-ray diffractometer starts the input thread. The input thread receives the sample information and test conditions of the first sample input by the user and stores the sample information and test conditions in the corresponding arrays. Each array constitutes common data;
CPU的另一个内核启动测试线程，测试线程根据公用数据中的第一个样品的测试条件控制多位样品台移动，将第一个样品移动至测试位置，并根据第一个样品的样品信息和测试条件控制探测器开始对第一个样品进行测试；The other core of the CPU starts the test thread. The test thread controls the movement of multiple sample stages according to the test conditions of the first sample in the common data, moves the first sample to the test position, and according to the sample information of the first sample and The test condition controls the detector to start testing the first sample;
第一个样品测试完成后，测试线程根据第一个样品的样品信息保存测试结果并在显示终端上显示测试结果，且测试线程对已测样品数目变量进行更新，更新后的已测样品数目变量的数值增加1；After the test of the first sample is completed, the test thread saves the test result according to the sample information of the first sample and displays the test result on the display terminal, and the test thread updates the variable of the number of tested samples, and the updated variable of the number of tested samples The value of is increased by 1;
测试线程判断更新后的样品数目变量的数值是否小于公用数据中 样品的总数，若是，则测试线程根据公用数据中的下一个样品的测试条件控制多位样品台移动，将下一个样品移动至测试位置，并根据下一个样品的样品信息和测试条件控制探测器开始对下一个样品进行测试；若否，则CPU关闭测试线程；The test thread judges whether the value of the updated sample number variable is less than the total number of samples in the public data. If so, the test thread controls the movement of multiple sample stages according to the test conditions of the next sample in the public data, and moves the next sample to the test Position, and control the detector to start testing the next sample according to the sample information and test conditions of the next sample; if not, the CPU closes the test thread;
输入线程将第一个样品的样品信息和测试条件分别存储到对应的数组中之后，在测试线程测试样品的同时，输入线程判断是否接收用户输入的全部样品的样品信息和测试条件，若是，则输入线程将下一个样品的样品信息和测试条件分别添加存储到公用数据中对应的数组中；若否，则CPU关闭输入线程。After the input thread stores the sample information and test conditions of the first sample in the corresponding arrays, while the test thread tests the samples, the input thread judges whether to receive the sample information and test conditions of all samples input by the user. If so, then The input thread adds the sample information and test conditions of the next sample to the corresponding array in the common data; if not, the CPU closes the input thread.
具体地，X射线衍射仪开机后，打开衍射仪门，将多个样品放置在多位样品台上后关闭衍射仪门，开始测试。Specifically, after the X-ray diffractometer is turned on, the diffractometer door is opened, multiple samples are placed on the multiple sample stages, and then the diffractometer door is closed, and the test is started.
X射线衍射仪中CPU的一个内核启动输入线程，输入线程接收用户输入的第一个样品的样品信息和测试条件，其中样品信息包括样品名称，还可以包括样品编号，测试条件包括样品位置和曝光时间；输入线程将样品信息和测试条件分别存储到对应的数组中，各个数组组成不同线程的公用数据。A core of the CPU in the X-ray diffractometer starts the input thread. The input thread receives the sample information and test conditions of the first sample entered by the user. The sample information includes the sample name and can also include the sample number. The test conditions include the sample location and exposure. Time; the input thread stores the sample information and test conditions into corresponding arrays, and each array composes the common data of different threads.
CPU的一个内核启动输入线程，并且输入线程接收用户输入的第一个样品的样品信息和测试条件后，CPU的另一个内核启动测试线程，测试线程根据公用数据中的第一个样品的测试条件控制多位样品台(多位样品台包括测角仪、电动平移台、角动台和旋转台)移动，从而将第一个样品移动至测试位置，并根据第一个样品的样品信息和测试条件控制探测器开始对第一个样品进行测试。One core of the CPU starts the input thread, and after the input thread receives the sample information and test conditions of the first sample input by the user, another core of the CPU starts the test thread, and the test thread is based on the test conditions of the first sample in the public data. Control the movement of multiple sample stages (multiple sample stages include goniometer, electric translation stage, angular motion stage and rotating stage), thereby moving the first sample to the test position, and according to the sample information and testing of the first sample The condition control detector starts testing the first sample.
测试线程对第一个样品测试完成后，测试线程根据第一个样品的样品信息保存测试结果并在显示终端上显示测试结果，其中测试结果为tiff格式的图片，同时测试线程对已测样品数目变量进行更新，更新后的已测样品数目变量的数值增加1。After the test thread finishes testing the first sample, the test thread saves the test result according to the sample information of the first sample and displays the test result on the display terminal. The test result is a picture in tiff format. At the same time, the test thread evaluates the number of samples tested. The variable is updated, and the value of the updated sample number variable increases by 1.
测试线程判断更新后的样品数目变量的数值是否小于公用数据中样品的总数，若是，则测试线程根据公用数据中的下一个样品的测试条件控制多位样品台移动，将下一个样品移动至测试位置，并根据下一个 样品的样品信息和测试条件控制探测器开始对下一个样品进行测试，直至更新后的样品数目变量的数值等于公用数据中样品的总数，即全部样品测试完成后，测试线程关闭，结束测试；若否，则CPU关闭测试线程，结束测试。The test thread judges whether the value of the updated sample number variable is less than the total number of samples in the public data. If so, the test thread controls the movement of multiple sample stages according to the test conditions of the next sample in the public data, and moves the next sample to the test Position, and control the detector to start testing the next sample according to the sample information and test conditions of the next sample, until the value of the updated sample number variable is equal to the total number of samples in the public data, that is, after all samples are tested, the test thread Close to end the test; if not, the CPU closes the test thread and ends the test.
输入线程将第一个样品的样品信息和测试条件分别存储到对应的数组中之后，在测试线程测试样品的同时，输入线程判断是否接收用户输入的全部样品的样品信息和测试条件，若输入线程没有接收用户输入的全部样品的样品信息和测试条件，则输入线程不改变标记变量的初始值0，并且输入线程将下一个样品的样品信息和测试条件分别添加存储到公用数据中对应的数组中；若输入线程已经接收用户输入的全部样品的样品信息和测试条件，则输入线程对标记变量进行赋值，赋值后的标记变量的值为1，并且CPU关闭输入线程，结束样品信息和测试条件输入过程。After the input thread stores the sample information and test conditions of the first sample in the corresponding arrays, while the test thread tests the samples, the input thread judges whether to receive the sample information and test conditions of all samples input by the user. If the sample information and test conditions of all samples entered by the user are not received, the input thread does not change the initial value 0 of the tag variable, and the input thread adds the sample information and test conditions of the next sample to the corresponding array in the public data. ; If the input thread has received the sample information and test conditions of all samples input by the user, the input thread assigns the value of the tag variable, and the value of the tag variable after the assignment is 1, and the CPU closes the input thread, ending the input of sample information and test conditions process.
本实施例所提出的X射线衍射仪用多线程测试方法采用多线程技术，将样品的测试过程与样品信息和测试条件输入过程分别用计算机不同的线程来控制，实现了在样品信息和测试条件输入的同时后台线程利用另外的CPU核控制进行测试，节约了输入过程占用的时间，对于拥有多位样品台的高速X射线衍射仪来讲可以大大提高测试效率。The multi-threaded test method for X-ray diffractometer proposed in this embodiment adopts multi-threaded technology, and the test process of the sample and the input process of sample information and test conditions are respectively controlled by different threads of the computer. At the same time of input, the background thread uses another CPU core to control the test, which saves the time occupied by the input process. For high-speed X-ray diffractometers with multiple sample stages, the test efficiency can be greatly improved.
作为一种具体的实施方式，测试线程根据公用数据中的第一个样品的测试条件控制多位样品台移动，将第一个样品移动至测试位置的过程包括以下步骤：As a specific implementation, the test thread controls the movement of multiple sample stages according to the test conditions of the first sample in the public data, and the process of moving the first sample to the test position includes the following steps:
测试线程读入当前多位样品台的位置信息；The test thread reads the position information of the current multiple sample stages;
测试线程根据第一个样品的测试条件中的样品位置和当前多位样品台的位置信息计算多位样品台的移动方向和移动距离；The test thread calculates the moving direction and moving distance of the multiple sample stages according to the sample position in the test condition of the first sample and the position information of the current multiple sample stages;
测试线程控制多位样品台中的电动平移台将第一个样品移动到测试位置，例如，测试线程通过COM口、USB、网线、GPIB等接口与电动平移台连接，从而控制电动平移台移动。The test thread controls the electric translation stage in the multi-position sample stage to move the first sample to the test position. For example, the test thread is connected to the electric translation stage through the COM port, USB, network cable, GPIB and other interfaces to control the movement of the electric translation stage.
进一步地，测试线程通过COM口和Socket口分别与电动平移台的控制器和探测器形成通讯连接，从而控制电动平移台的移动以及探测器 的工作。Further, the test thread forms a communication connection with the controller and the detector of the electric translation stage through the COM port and the Socket port, so as to control the movement of the electric translation stage and the work of the detector.
优选地，电动平移台的控制器为PNC100型控制器。Preferably, the controller of the electric translation stage is a PNC100 controller.
优选地，探测器为二维X射线探测器，型号为Pilatus100K。Preferably, the detector is a two-dimensional X-ray detector, the model being Pilatus 100K.
下面以多线程微焦点二维X射线衍射仪为例，对本发明的样品测试方法进行详细说明：The following takes a multi-threaded micro-focus two-dimensional X-ray diffractometer as an example to illustrate the sample testing method of the present invention in detail:
(1)初始化(1) Initialization
测试线程打开COM口与Socket口，与多位样品台的电动平移台控制器(例如三英精控科技有限公司PMC100型控制器)和二维X射线探测器(例如德国Detrics公司Pilatus100K型)形成通讯连接，以实现对电动平移台和探测器的控制。The test thread opens the COM port and Socket port to form a motorized translation stage controller for multiple sample stages (such as the PMC100 controller from Sanying Precision Technology Co., Ltd.) and a two-dimensional X-ray detector (such as the Pilatus100K model from Detrics, Germany) Communication connection to realize the control of the electric translation stage and the detector.
(2)CPU的一个内核启动输入线程(即当前线程)，输入线程接收用户输入的第一个样品的样品名称、样品位置和曝光时间，并将它们分别存储到对应的filename、position和exposetime三个数组中；测试线程采用Expose函数作为调用的函数，其输入参数为样品位置、样品名称和曝光时间；首先CPU的另一个内核启动测试线程，测试线程读入当前多位样品台的位置信息，根据测试条件中指定的样品位置计算移动方向与距离，通过COM口控制电动平移台将样品移动到测试位置，之后测试线程调用Expose函数按照样品名称、样品位置和曝光时间对样品进行测试，最后将测试结果保存为以样品名称命名的tiff格式的图片。(2) A core of the CPU starts the input thread (that is, the current thread). The input thread receives the sample name, sample position, and exposure time of the first sample entered by the user, and stores them in the corresponding filename, position, and exposure time. The test thread uses the Expose function as the calling function, and its input parameters are the sample position, sample name, and exposure time; first, another core of the CPU starts the test thread, and the test thread reads the position information of the current multiple sample stages. Calculate the moving direction and distance according to the sample position specified in the test conditions, control the electric translation stage to move the sample to the test position through the COM port, and then the test thread calls the Expose function to test the sample according to the sample name, sample position and exposure time, and finally The test result is saved as a picture in tiff format named after the sample name.
(3)在测试线程测试的时候输入线程继续接收用户输入的样品信息和测试条件，并分别添加储存到对应的filename、position和exposetime三个数组中。具体地，当输入线程将第一个样品的样品信息和测试条件分别存储到对应的数组中之后，在测试线程测试样品的同时，输入线程判断是否接收用户输入的全部样品的样品信息和测试条件，若输入线程没有接收到到用户输入的全部样品的样品信息和测试条件，则输入线程将下一个样品的样品信息和测试条件分别添加存储到公用数据中对应的数组中；若输入线程已经接收到用户输入的全部样品的样品信息和测试条件，则CPU关闭输入线程，结束输入过程。测试线程每完成一个样品的测试后，都会对已测样品数目变量(即index变量)进行更新，更新后 的已测样品数目变量的数值增加1，测试线程将更新后的样品数目变量的数值(即index变量数值)和公用数据中样品的总数相比较，判断更新后的样品数目变量的数值是否小于公用数据中样品的总数，若更新后的样品数目变量的数值小于公用数据中样品的总数，则测试线程继续下一个样品的测试，即根据公用数据中的下一个样品的测试条件控制多位样品台移动，将下一个样品移动至测试位置，并根据下一个样品的样品信息和测试条件控制探测器开始对下一个样品进行测试；若更新后的样品数目变量的数值等于公用数据中样品的总数，则CPU关闭测试线程，并在显示终端上显示完成所有测试。(3) When the test thread is testing, the input thread continues to receive the sample information and test conditions input by the user, and add them to the corresponding three arrays of filename, position and exposetime. Specifically, after the input thread stores the sample information and test conditions of the first sample in the corresponding arrays, while the test thread tests the samples, the input thread determines whether to receive the sample information and test conditions of all samples input by the user. If the input thread does not receive the sample information and test conditions of all samples entered by the user, the input thread adds the sample information and test conditions of the next sample to the corresponding array in the public data; if the input thread has already received When the sample information and test conditions of all samples input by the user are reached, the CPU closes the input thread and ends the input process. After the test thread completes the test of a sample, it will update the variable of the number of tested samples (that is, the index variable). The value of the updated number of tested samples will increase by 1, and the test thread will update the value of the number of samples after the update ( That is, the index variable value) is compared with the total number of samples in the public data to determine whether the value of the updated sample number variable is less than the total number of samples in the public data. If the value of the updated sample number variable is less than the total number of samples in the public data, Then the test thread continues to test the next sample, that is, control the movement of multiple sample stages according to the test conditions of the next sample in the public data, move the next sample to the test position, and control according to the sample information and test conditions of the next sample The detector starts to test the next sample; if the value of the updated sample number variable is equal to the total number of samples in the public data, the CPU closes the test thread and displays the completion of all tests on the display terminal.
以上所述实施例的各技术特征可以进行任意的组合，为使描述简洁，未对上述实施例中的各个技术特征所有可能的组合都进行描述，然而，只要这些技术特征的组合不存在矛盾，都应当认为是本说明书记载的范围。The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, all possible combinations of the various technical features in the above-mentioned embodiments are not described. However, as long as there is no contradiction in the combination of these technical features, All should be considered as the scope of this specification.
以上所述实施例仅表达了本发明的几种实施方式，其描述较为具体和详细，但并不能因此而理解为对发明专利范围的限制。应当指出的是，对于本领域的普通技术人员来说，在不脱离本发明构思的前提下，还可以做出若干变形和改进，这些都属于本发明的保护范围。因此，本发明专利的保护范围应以所附权利要求为准。The above-mentioned embodiments only express several embodiments of the present invention, and the descriptions are more specific and detailed, but they should not be understood as limiting the scope of the invention patent. It should be pointed out that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications and improvements can be made, and these all fall within the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention should be subject to the appended claims.

Claims (9)

  1. 一种X射线衍射仪用多线程样品测试方法，其特征在于，包括以下步骤：A multi-threaded sample testing method for X-ray diffractometer, which is characterized in that it comprises the following steps:
    X射线衍射仪中CPU的一个内核启动输入线程，输入线程接收用户输入的第一个样品的样品信息和测试条件并将样品信息和测试条件分别存储到对应的数组中，各个数组组成公用数据，测试条件包括样品位置和曝光时间；A core of the CPU in the X-ray diffractometer starts the input thread. The input thread receives the sample information and test conditions of the first sample input by the user and stores the sample information and test conditions in corresponding arrays. Each array constitutes common data. Test conditions include sample position and exposure time;
    CPU的另一个内核启动测试线程，测试线程根据公用数据中的第一个样品的测试条件控制多位样品台移动，将第一个样品移动至测试位置，并根据第一个样品的样品信息和测试条件控制探测器开始对第一个样品进行测试；The other core of the CPU starts the test thread. The test thread controls the movement of multiple sample stages according to the test conditions of the first sample in the common data, moves the first sample to the test position, and according to the sample information of the first sample and The test condition controls the detector to start testing the first sample;
    第一个样品测试完成后，测试线程根据第一个样品的样品信息保存测试结果并在显示终端上显示测试结果，且测试线程对已测样品数目变量进行更新，更新后的已测样品数目变量的数值增加1；After the test of the first sample is completed, the test thread saves the test result according to the sample information of the first sample and displays the test result on the display terminal, and the test thread updates the variable of the number of tested samples, and the updated variable of the number of tested samples The value of is increased by 1;
    测试线程判断更新后的样品数目变量的数值是否小于公用数据中样品的总数，若是，则测试线程根据公用数据中的下一个样品的测试条件控制多位样品台移动，将下一个样品移动至测试位置，并根据下一个样品的样品信息和测试条件控制探测器开始对下一个样品进行测试；若否，则CPU关闭测试线程；The test thread judges whether the value of the updated sample number variable is less than the total number of samples in the public data. If so, the test thread controls the movement of multiple sample stages according to the test conditions of the next sample in the public data, and moves the next sample to the test Position, and control the detector to start testing the next sample according to the sample information and test conditions of the next sample; if not, the CPU closes the test thread;
    输入线程将第一个样品的样品信息和测试条件分别存储到对应的数组中之后，在测试线程测试样品的同时，输入线程判断是否接收用户输入的全部样品的样品信息和测试条件，若否，则输入线程将下一个样品的样品信息和测试条件分别添加存储到公用数据中对应的数组中；若是，则CPU关闭输入线程。After the input thread stores the sample information and test conditions of the first sample in the corresponding arrays, while the test thread tests the samples, the input thread judges whether to receive the sample information and test conditions of all samples input by the user. If not, Then the input thread adds and stores the sample information and test conditions of the next sample into the corresponding array in the common data; if so, the CPU closes the input thread.
  2. 根据权利要求1所述的X射线衍射仪用多线程样品测试方法，其特征在于，测试线程根据公用数据中的第一个样品的测试条件控制多位样品台移动，将第一个样品移动至测试位置的过程包括以下步骤：The multi-threaded sample test method for X-ray diffractometer according to claim 1, wherein the test thread controls the movement of the multiple sample stages according to the test condition of the first sample in the public data, and moves the first sample to The process of testing the location includes the following steps:
    测试线程读入当前多位样品台的位置信息；The test thread reads the position information of the current multiple sample stages;
    测试线程根据第一个样品的测试条件中的样品位置和当前多位样 品台的位置信息计算多位样品台的移动方向和移动距离；The test thread calculates the moving direction and moving distance of the multiple sample stages according to the sample position in the test condition of the first sample and the position information of the current multiple sample stages;
    测试线程控制多位样品台中的电动平移台将第一个样品移动到测试位置。The test thread controls the electric translation stage in the multiple sample stages to move the first sample to the test position.
  3. 根据权利要求2所述的X射线衍射仪用多线程样品测试方法，其特征在于，The multi-threaded sample testing method for X-ray diffractometer according to claim 2, characterized in that:
    测试线程通过COM口和Socket口分别与电动平移台的控制器和探测器形成通讯连接。The test thread forms a communication connection with the controller and the detector of the electric translation stage through the COM port and the Socket port, respectively.
  4. 根据权利要求3所述的X射线衍射仪用多线程样品测试方法，其特征在于，The multi-threaded sample testing method for X-ray diffractometer according to claim 3, characterized in that:
    电动平移台的控制器为PNC100型控制器。The controller of the electric translation stage is a PNC100 controller.
  5. 根据权利要求3所述的X射线衍射仪用多线程样品测试方法，其特征在于，The multi-threaded sample testing method for X-ray diffractometer according to claim 3, characterized in that:
    探测器为二维X射线探测器，型号为Pilatus100K。The detector is a two-dimensional X-ray detector, the model is Pilatus100K.
  6. 根据权利要求1或2所述的X射线衍射仪用多线程样品测试方法，其特征在于，The multi-threaded sample test method for X-ray diffractometer according to claim 1 or 2, characterized in that:
    样品信息包括样品名称。The sample information includes the sample name.
  7. 根据权利要求6所述的X射线衍射仪用多线程样品测试方法，其特征在于，The multi-threaded sample testing method for X-ray diffractometer according to claim 6, characterized in that:
    样品信息还包括样品编号。The sample information also includes the sample number.
  8. 根据权利要求1或2所述的X射线衍射仪用多线程样品测试方法，其特征在于，The multi-threaded sample test method for X-ray diffractometer according to claim 1 or 2, characterized in that:
    多位样品台还包括测角仪、角动台和旋转台。Multiple sample stages also include goniometers, angular motion stages and rotating stages.
  9. 根据权利要求1或2所述的X射线衍射仪用多线程样品测试方法，其特征在于，The multi-threaded sample test method for X-ray diffractometer according to claim 1 or 2, characterized in that:
    测试结果为tiff格式的图片。The test result is a picture in tiff format.
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