WO2020259625A1

WO2020259625A1 - Three-dimensional scanning method, scanner, three-dimensional scanning system, computer device, and computer-readable storage medium

Info

Publication number: WO2020259625A1
Application number: PCT/CN2020/098253
Authority: WO
Inventors: 赵晓波; 王文斌
Original assignee: 先临三维科技股份有限公司
Priority date: 2019-06-28
Filing date: 2020-06-24
Publication date: 2020-12-30

Abstract

Provided are a three-dimensional scanning method, scanner, three-dimensional scanning system, computer device, and computer-readable storage medium; the three-dimensional scanning method comprises: projecting a reconstructed pattern (210) to a measured object (140) by means of a projection apparatus (110); by means of an external camera module (130), collecting rough image information (220) based on the reconstructed pattern reflected by the measured object (140); by means of an internal camera module (120), collecting fine image information (230) based on the reconstructed pattern and reflected by the measured object (140); obtaining rough image information and fine image information of the measured object (140) by means of a processing apparatus, and processing the rough image information and fine image information to obtain point cloud data (240) of the measured object (140). According to the rough image information collected by the external camera module (130), the three-dimensional scanning method assists in the splicing of the fine image information collected by the internal camera module (120), thereby achieving the acquisition of point cloud data of the measured object (140); the invention can reduce the use of marker points, ensuring the details of the scanned data, and improving the accuracy of scanning.

Description

Three-dimensional scanning method, scanner, three-dimensional scanning system, computer equipment and computer readable storage medium

This disclosure is based on the patent document filed on June 28, 2019 with an application number of 201910577905.8 and titled "Three-dimensional scanning method, device, computer equipment and computer-readable storage medium" and the application number filed on June 28, 2019 The patent document named 201910577941.4 and titled "Scanner and 3D Scanning System" is a priority document, and the entire content of which is incorporated in this disclosure by reference.

Technical field

The present disclosure relates to the technical field of three-dimensional model reconstruction, in particular to a three-dimensional scanning method, a scanner, a three-dimensional scanning system, a computer device, and a computer-readable storage medium.

Background technique

With the development and maturity of digital image processing, digital projection display and computer processing technology, three-dimensional scanning technology has developed rapidly. The three-dimensional scanning system can project light onto the surface of the object, and the imaging device captures the image projected by the light, and uses a three-dimensional reconstruction algorithm to reconstruct the three-dimensional size information of the surface of the object according to the shape of the captured image.

Traditionally, the three-dimensional scanning method uses the same set of cameras to recognize the landmark points and the point cloud data at the same time, and complete the splicing of the point cloud data after the landmark points are used for stitching. However, if the above-mentioned 3D scanning method is to ensure the accuracy of the 3D model, it is necessary to paste enough marker points, which results in many holes in the final data that need to be filled later.

Summary of the invention

The present disclosure provides a three-dimensional scanning method, a scanner, a three-dimensional scanning system, a computer device, and a computer-readable storage medium, which can ensure the details of the scanned data and improve the accuracy of the scan while reducing the usage of marker points.

A three-dimensional scanning method, the method includes:

Project the reconstructed pattern to the measured object;

Collecting rough image information of the surface of the measured object;

Collecting fine image information reflected by the measured object based on the reconstructed pattern;

The coarse image information and the fine image information of the measured object are acquired, and the coarse image information and the fine image information are processed to obtain complete three-dimensional data of the measured object.

In an embodiment, the processing the coarse image information and the fine image information includes:

Obtaining first mark point three-dimensional data based on the rough image information, acquiring second point cloud data based on the fine image information, and stitching the second point cloud data based on the first mark point three-dimensional data.

Acquire 3D data of a first mark point based on the rough image information, acquire 3D data of a second mark point and second point cloud data based on the fine image information, and obtain 3D data of a first mark point and the second mark point The three-dimensional data is spliced with the second point cloud data.

Acquire first point cloud data and first point cloud data based on the rough image information, acquire second point cloud data based on the fine image information, and stitch the first point cloud data based on the first three-dimensional data of the landmark points And the second point cloud data.

Acquire first mark point three-dimensional data and first point cloud data based on the rough image information, acquire second mark point three-dimensional data and second point cloud data based on the fine image information, and stitch based on the first mark point three-dimensional data For the first point cloud data, the second point cloud data is spliced based on the three-dimensional data of the first mark point and the three-dimensional data of the second mark point.

In an embodiment, the processing the coarse image information and the fine image information further includes:

The curvature of the points in the first point cloud data and the second point cloud data is determined, and one of the first point cloud data and the second point cloud data is retained according to the curvature.

In an embodiment, the collecting rough image information of the surface of the measured object and collecting the fine image information reflected by the measured object based on the reconstructed pattern includes:

Projecting the reconstructed pattern of the second waveband to the measured object, and projecting the light of the first waveband to illuminate the mark points on the surface of the measured object, so as to synchronously collect the mark points and the reconstructed pattern of the measured object.

In an embodiment, the collecting rough image information reflected by the measured object and collecting fine image information reflected by the measured object based on the reconstructed pattern includes:

Project the reconstructed pattern of the first waveband and the reconstructed pattern of the second waveband to the measured object, and project the light of the first waveband and the light of the second waveband to illuminate the mark points on the surface of the measured object, so as to collect the The mark point and modulation reconstruction pattern of the first waveband of the measured object, and the mark point and modulation reconstruction pattern of the second waveband of the measured object.

In an embodiment, the collecting rough image information of the surface of the measured object and collecting fine image information reflected by the measured object based on the reconstructed pattern includes:

Projecting the light of the first waveband and the reconstruction pattern of the first waveband to the measured object in the first time period, and collecting the mark points and the modulation reconstruction pattern of the first waveband of the measured object;

Projecting the second waveband light and the reconstruction pattern of the second waveband to the measured object in the second time period, and collecting the mark points and modulation reconstruction pattern of the second waveband of the measured object.

Projecting light to the measured object in the first time period and the second time period respectively to illuminate the mark points on the surface of the measured object; and projecting the reconstructed pattern on the measured object in the second time period; in the first time period Collect the mark points of the measured object; collect the mark points and the modulation reconstruction pattern of the measured object in a second time period.

Projecting the first waveband light to the measured object to illuminate the mark points on the surface of the measured object to collect the mark points of the first waveband of the measured object;

Simultaneously project the second waveband light and the second waveband reconstruction pattern to the measured object to collect the second waveband mark points and modulate the reconstruction pattern of the measured object.

Projecting the first waveband light and the first waveband reconstruction pattern to the measured object to collect the first waveband mark points and the first waveband modulation reconstruction pattern of the measured object;

The second waveband reconstruction pattern is simultaneously projected to the measured object to collect the second waveband modulation reconstruction pattern of the measured object.

A scanner, the scanner body, the scanner body including:

Projection device, used to project the reconstructed pattern to the measured object;

An internal camera module, the internal camera module is configured as a second scanning range for collecting fine image information based on the reconstructed pattern reflected by the measured object;

An external camera module, the external camera module is configured as a first scanning range, and is used to collect rough image information of the surface of the measured object, so as to obtain the measured object according to the rough image information and the fine image information Complete three-dimensional data of the object; the second scanning range is smaller than the first scanning range.

In an embodiment, the scanner body includes a housing, the projection device, the internal camera module, and the external camera module are installed in the housing, and the scanner further includes a holding portion, the holding The part is installed on the scanner body.

In an embodiment, the external camera module further includes a first illuminating element and a first filter in the first wavelength band, and the first illuminating element is annularly arranged around each of the external cameras for projecting the first One waveband of light to illuminate the mark points on the surface of the object to be measured; the first filter is arranged at the front end of the external camera, and is used to retain the incident light of the first waveband and filter out the incident light of other wavebands; the external The camera module is used to collect the landmark points of the first waveband of the measured object;

The internal camera module includes a second filter of a second wavelength band, and the second filter is disposed at the front end of the internal camera for retaining incident light in the second wavelength band and filtering out incident light in other wavelength bands. The first waveband and the second waveband are different wavebands;

The projection device includes a projector for projecting the reconstruction pattern of the second waveband to the measured object, so that the internal camera module synchronously collects the modulation reconstruction pattern of the measured object in the second waveband .

In an embodiment, the projection device includes a first projector and a second projector, the first projector is used to project a reconstruction pattern in the first waveband, and the second projector is used to project a reconstruction pattern in the second waveband , The external camera module further includes a first illuminating element and a first filter in the first wavelength band, the first illuminating element is annularly arranged around each of the external cameras, and is used to project light in the first wavelength band to To illuminate the mark points on the surface of the object to be measured, the first filter is arranged at the front end of the external camera, and is used to retain the incident light of the first waveband and filter out the incident light of other wavebands;

The internal camera module further includes a second illuminating element in a second wavelength band and a second filter, and the second illuminating element is annularly arranged around the internal camera for projecting light in the second wavelength band to illuminate the Measuring the mark points on the surface of the object, the second filter is arranged at the front end of the external camera, and is used to retain the incident light of the second waveband and filter the incident light of other wavebands;

The external camera module is used to collect the marker points and modulation reconstruction patterns of the first waveband of the measured object;

The internal camera module is used to synchronously collect the marker points and the modulation reconstruction pattern of the second waveband of the measured object.

In an embodiment, the projection device includes a dual-frequency projector, the dual-frequency projector is used to project the reconstruction pattern of the first waveband in the first time period, and project the reconstruction pattern of the second waveband in the second time period; so The scanner body further includes a first illuminating member and a second illuminating member, the first illuminating member is annularly arranged around each of the external cameras, and the second illuminating member is annularly arranged around the internal camera for Illuminate the marking points on the surface of the measured object;

The external camera module is used to collect the mark points and the modulation reconstruction pattern of the measured object in a first time period;

The internal camera module is used to collect the mark points and the modulation reconstruction pattern of the measured object in the second time period.

In an embodiment, the projection device includes a first projector and a second projector, and the first projector is used to project a reconstruction pattern of the first waveband on the measured object in a first time period, and the second projector The two projectors project the reconstructed pattern of the second waveband on the measured object in the second time period; the scanner body further includes a first illuminating element and a second illuminating element, the first illuminating element is annularly arranged on each Around the external camera, the second illuminating element is annularly arranged around the internal camera for illuminating the landmark points on the surface of the object to be measured;

In an embodiment, the projection device includes a projector for projecting a reconstructed pattern to the object to be measured; the three-dimensional scanning system further includes a first illuminating element and a second illuminating element, the first illuminating element An annular shape is arranged around each of the external cameras, and the second illuminating element is annularly arranged around the internal camera for illuminating the mark points on the surface of the measured object;

The external camera module is used to collect the mark points of the measured object in a first time period;

In an embodiment, the external camera module includes a first illuminating element and a first filter in a first wavelength band; the first illuminating element is annularly arranged around each of the external cameras for illuminating the Mark points on the surface of the object to be measured; the first filter is arranged at the front end of the external camera, and is used to retain the incident light in the first waveband and filter out the incident light in other wavebands; the internal camera module includes a second waveband A second illuminating element; the projection device includes a second projector, the second projector is used to project the second waveband reconstruction pattern to the measured object;

The external camera module is used to collect the landmark points of the first waveband of the measured object;

In an embodiment, the external camera module includes a first illuminating element and a first filter in a first wavelength band; the first illuminating element is annularly arranged around each of the external cameras for illuminating the Marking points on the surface of the object to be measured; the first filter is arranged at the front end of the external camera, and is used to retain the incident light in the first waveband and filter out incident light in other wavebands; the projection device includes a first projector and a second Two projectors, the first projector is used to project the reconstructed pattern of the first wave band to the measured object; the second projector is used to project the reconstructed pattern of the second wave band to the measured object;

The external camera module is used to collect the mark points of the object under test and the modulation reconstruction pattern of the first waveband;

The internal camera module is used to synchronously collect the mark points of the object under test and the modulation reconstruction pattern of the second waveband.

In an embodiment, the external camera module includes a first camera and a second camera, the internal camera module includes a third camera; the third camera is disposed between the first camera and the second camera ; The projection device is arranged between the third camera and the first camera, or between the third camera and the second camera.

In an embodiment, the external camera module includes a first camera and a second camera, and the internal camera module includes a third camera and a fourth camera; both the third camera and the fourth camera are located in the first camera. Between a camera and a second camera, the projection device is arranged between the third camera and the fourth camera.

A three-dimensional scanning system, the three-dimensional scanning system includes the above-mentioned scanner, the scanner includes a scanner body, and the scanner body includes:

An external camera module configured to have a first scanning range, and the external camera module includes a plurality of external cameras for collecting rough image information reflected by the measured object based on the projection reconstruction pattern ；

An internal camera module, the internal camera module is configured as a second scanning range, the internal camera module includes at least one internal camera for collecting fine image information reflected by the measured object based on the projected reconstruction pattern ; The second scanning range is smaller than the first scanning range;

The processing device is respectively connected with the external camera module and the internal camera module, and is used to obtain the coarse image information and the fine image information of the measured object, and to compare the coarse image information and the fine image information Processing is performed to obtain complete three-dimensional data of the measured object.

A computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the steps of the foregoing method when the computer program is executed.

A computer-readable storage medium has a computer program stored thereon, and when the computer program is executed by a processor, the steps of the above method are realized.

The three-dimensional scanning method, scanner, scanning system, computer equipment, and computer-readable storage medium provided by the embodiments of the present disclosure include: projecting a reconstructed pattern on a measured object; collecting rough image information reflected by the measured object; and collecting the The fine image information reflected by the measured object based on the reconstructed pattern; the coarse image information and the fine image information of the measured object are obtained, and the coarse image information and the fine image information are processed to obtain Complete three-dimensional data of the measured object. The above-mentioned 3D scanning method assists the splicing of the fine image information collected by the internal camera module according to the collected rough image information, thereby realizing the acquisition of complete 3D data of the measured object, which can ensure the scanned data while reducing the usage of marker points Details, improve the accuracy of scanning.

Description of the drawings

In order to explain the embodiments of the present disclosure or the technical solutions in the prior art more clearly, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only These are some embodiments of the present disclosure. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative work.

Figure 1a is a schematic structural diagram of a scanner provided by an embodiment;

Figure 1b is a schematic structural diagram of a scanner provided by an embodiment;

Figure 1c is a schematic structural diagram of a scanner provided by another embodiment;

FIG. 2 is a flowchart of a three-dimensional scanning method provided by an embodiment;

3 is a flowchart of processing steps for rough image information and fine image information according to an embodiment;

FIG. 4 is a flowchart of a three-dimensional scanning method provided by another embodiment;

FIG. 5 is a flowchart of a three-dimensional scanning method provided by still another embodiment;

6 is a flowchart of processing steps for rough image information and fine image information according to another embodiment;

Figure 7 is a structural block diagram of a three-dimensional scanning device in an embodiment;

Figure 8 is an internal structure diagram of a computer device in an embodiment.

Detailed ways

In order to facilitate the understanding of the present disclosure, and to make the above-mentioned objectives, features and advantages of the present disclosure more obvious and understandable, the specific embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings. In the following description, many specific details are explained in order to fully understand the present disclosure, and the preferred embodiments of the present disclosure are given in the accompanying drawings. However, the present disclosure can be implemented in many different forms, and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present disclosure more thorough and comprehensive. The present disclosure can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of the present disclosure. Therefore, the present disclosure is not limited by the specific embodiments disclosed below.

In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features defined with "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present disclosure, "a plurality of" means at least two, such as two, three, etc., unless otherwise specifically defined. In the description of the present disclosure, "several" means at least one, such as one, two, etc., unless specifically defined otherwise.

Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field of the present disclosure. The terminology used herein is only for the purpose of describing specific embodiments, and is not intended to limit the present disclosure. The term "and/or" as used herein includes any and all combinations of one or more related listed items.

The three-dimensional scanning method provided in the present disclosure can be implemented through software control, and can also be applied to a three-dimensional scanning system. The embodiments of the present disclosure are described by taking application in a scanner as an example. As shown in Figure 1a, the scanner includes a scanner body, which includes a projection device 110, an internal camera module 120, and an external camera module 130, wherein,

The projection device 110 is used to project the reconstructed pattern to the measured object;

The internal camera module 120 is configured as a second scanning range for collecting fine image information based on the reconstructed pattern reflected by the measured object;

The external camera module 130 is configured as a first scanning range, and the first scanning range is larger than the second scanning range, and is used to collect rough image information of the surface of the object to be measured.

Obtain complete three-dimensional data of the measured object according to the rough image information and the fine image information. The scanning range of the camera can be configured in four ways. (1) The different scanning ranges of the internal camera module and the external camera module are realized by setting different focal lengths. The larger the focal length, the larger the scanning range. The specific focal length difference between the external camera module 130 and the internal camera module 120 may be determined according to the characteristics of the object 140 to be measured. (2) Different scanning ranges of the internal camera module and the external camera module are realized by setting different CCD sizes. (3) The different scanning ranges of the internal camera module and the external camera module are realized by setting the arrangement positions of the cameras in the internal camera module and the external camera module. (4) When the arrangement of the cameras in the internal camera module and the external camera module is fixed, the internal camera module and the external camera module can be realized by adjusting the setting angle of the camera in the internal camera module and the external camera module Different scan ranges. In actual work, scanners with different scanning ranges can be configured according to different applications, and the scanning ranges of the external camera and the internal camera can be configured in one or more of the four ways. The specific configuration method is not limited in the embodiment of the present disclosure, as long as it is ensured that the second scanning range is smaller than the first scanning range.

It should be noted that the second scanning range and the first scanning range have an overlapping area. Preferably, the first scanning range completely covers the second scanning range.

The scanning range of the external camera module 130 is larger than the scanning range of the internal camera module 120. The rough image information is obtained by the external camera module 130, the rough image information may include the mark point information and/or the modulation reconstruction pattern of the measured object, and the fine image information may include the mark point information and/or the modulation reconstruction pattern of the measured object. The rough image information and the fine image information at least part of the images correspond to the same area of the measured object. Since the first scanning range of the external camera module 130 is larger than the second scanning range of the internal camera module 120 and the first scanning range and the second scanning range have an overlapping area, when the external camera module 130 and the internal camera module 120 are aligned When the same object is scanned, the single scan area of the external camera module 130 on the object needs to be scanned multiple times for the internal camera module 120, according to the multi-frame fine influence information collected by the internal camera module 120 for multiple scans The obtained multiple pieces of point cloud data correspond to the relevant data obtained according to the rough image information collected by the external camera module 130 in a single scan, and the distribution of multiple pieces of point cloud data can be determined based on the relevant data obtained by the external camera module 130 Relationship, that is, based on the relevant data obtained by the external camera module 130, accurate splicing of multiple pieces of point cloud data can be completed. Specifically, the rough image information includes marker points, and the fine image information includes a reconstructed pattern modulated by the surface of the measured object. Obtain the three-dimensional data of the first mark point according to the rough image information, and obtain multiple pieces of second point cloud data according to the fine image information, stitch multiple pieces of second point cloud data according to the three-dimensional data of the first mark point, and complete the alignment of the multiple pieces of point cloud data Accurate splicing of measured objects.

The internal camera module 120 includes at least two cameras, and the external camera module 130 includes at least one camera.

In an embodiment, the external camera module 130 includes a plurality of external cameras, and the internal camera module 120 includes at least one internal camera. The external camera module 130 also includes a first illuminating element 121 in the first wavelength band and a first filter in the first wavelength band. The first illuminating element 121 is annularly arranged around each external camera and used to project light in the first wavelength band. To illuminate the mark points on the surface of the object 140 to be measured, the first filter is arranged at the front end of the external camera to retain the incident light of the first waveband and filter out the incident light of other wavebands. The internal camera module 120 also includes a second illuminating element 131 in the second wavelength band and a second filter 132 in the second wavelength band. The second illuminating element 131 is annularly arranged around each internal camera for projecting the first wavelength The light is used to illuminate the marking points on the surface of the object 140, and the second filter is arranged at the front end of the internal camera to retain the incident light of the second waveband and filter out the incident light of other wavebands. The projection device 110 includes a first projector of the first waveband and a second projector of the second waveband. The first projector projects the reconstructed pattern of the first waveband to the measured object 140, and the second projector is used to project the measured object 140 The reconstructed pattern in the second band, the reconstructed pattern is a normal fringe pattern or a speckle pattern or a sinusoidal fringe pattern. Preferably, the reconstructed pattern in the first band and the reconstructed pattern in the second band are both normal fringe patterns, and the normal fringe in the first band The pattern and the stripe density distribution of the normal stripe pattern in the second waveband can be the same or different. Preferably, the stripe distribution of the normal stripe pattern in the first waveband is sparsely distributed so that an external camera module with a larger scanning range can identify and extract Stripes, the stripes of the common stripe pattern in the second band are more densely distributed so that more point cloud data can be obtained. In this embodiment, the first waveband and the second waveband are different wavebands, which ensures that when there are multiple wavebands of light at the same time, both the external camera module and the internal camera module can simultaneously collect the light of the corresponding waveband, and No interference light of other bands will be collected, for example, when the first illuminator, the first projector, the second illuminator, and the second projector simultaneously project the light to the surface of the object to be measured, and the external camera and the internal camera simultaneously collect , The external camera only collects the light of the first waveband projected by the first illuminating element and the first projector, but not the second illuminator and the second waveband light projected by the second projector. The internal camera only collects the second wave The light of the second waveband projected by the illuminating element and the second projector does not collect the light of the first waveband projected by the first illuminating element and the first projector.

The scanner of this embodiment can be configured with one or more of the following working modes. Select one of the configurations to scan according to the scanning requirements. When scanning, the scanner runs the corresponding working parts or modules according to the working mode:

Working mode 1: The first illuminator irradiates the light of the first waveband to the surface of the measured object, and the first projector projects the reconstructed pattern of the first waveband to the surface of the measured object in synchronization with the first illuminator, and the surface of the measured object is pasted There are marker points, the light of the first band and the reconstructed pattern are collected by the external camera reflected by the surface of the measured object, and the external camera collects rough image information including the marker points and the modulated reconstruction pattern; the second illuminator illuminates the light of the second band To the surface of the measured object, the second projector simultaneously projects the reconstructed pattern of the second wave band to the surface of the measured object relative to the second illuminator. The light and the reconstructed pattern of the second wave band are reflected by the surface of the measured object and collected by the internal camera , The internal camera synchronously collects the fine image information including the mark points and the modulation reconstruction pattern with respect to the external camera; the complete three-dimensional data of the measured object is obtained based on the collected rough image information and fine image information. Specifically, the three-dimensional data of the first mark point is reconstructed based on the mark points of the coarse image information, the first point cloud data is reconstructed based on the modulation reconstruction pattern of the coarse image information, and the three-dimensional data of the second mark point is reconstructed based on the mark points of the fine image information. The second point cloud data is reconstructed by the modulation reconstruction pattern of the image information, the first conversion matrix is determined based on the splicing of the three-dimensional data of the first marker points, and the first point cloud data and the second point cloud data are spliced based on the first conversion matrix to realize the Obtain complete three-dimensional data of the measured object.

Stitching the first point cloud data and the second point cloud data based on the first transformation matrix specifically includes: stitching multiple pieces of first point cloud data based on the first transformation matrix, based on the first transformation matrix and the external camera module 130 and the internal camera module Splicing the first point cloud data and the second point cloud data of the calibration external parameters of the group 120; or splicing multiple pieces of first point cloud data based on the first conversion matrix, based on the three-dimensional data of the first marker point and the three-dimensional data of the second marker point The second conversion matrix is determined by splicing, and the first point cloud data and the second point cloud data are spliced based on the second conversion matrix, so that the external parameters of the external camera and the internal camera may not be calibrated.

In this embodiment, for the first point cloud data and the second point cloud data, whether to retain the first point cloud data or the second point cloud data can be selected according to the curvature, so as to realize the self-adaptive retention of feature details of the data, thereby ensuring the details of the data. On the basis of reducing the volume of data.

Working mode 2: The first illuminator irradiates the light of the first waveband to the surface of the object under test in the first time period, and the first projector projects the reconstructed pattern of the first waveband to the surface of the object under test in the first time period. Marking points are pasted on the surface of the object to be measured, the first waveband light and reconstruction pattern are reflected by the surface of the measured object and collected by an external camera in the first time period, and the external camera collects rough image information including the marking points and the modulation reconstruction pattern; The two illuminators irradiate the light of the second waveband to the surface of the object under test in the second time period, the second projector projects the reconstructed pattern of the second waveband to the surface of the object under test during the second time period, the light of the second waveband and The reconstructed pattern is collected by the internal camera in the second time period after being reflected by the surface of the measured object. The first time period and the second time period are different time periods. The internal camera is time-sharing to the external camera to collect the reconstruction pattern including the mark points and modulation. The fine image information; based on the collected coarse image information and fine image information to obtain complete three-dimensional data of the measured object, specifically, based on the marker points of the coarse image information to reconstruct the first marker point three-dimensional data, based on the modulation reconstruction of the coarse image information Pattern reconstruction of the first point cloud data, reconstruction of the second mark point 3D data based on the mark points of the fine image information, reconstruction of the second point cloud data based on the modulation reconstruction pattern of the fine image information, and determination based on the stitching of multiple first mark point 3D data The first conversion matrix, based on the first conversion matrix to splice multiple pieces of first point cloud data, the second conversion matrix is determined based on the splicing of the first mark point three-dimensional data and the second mark point three-dimensional data, and the first point is spliced based on the second conversion matrix The cloud data and the second point cloud data realize the acquisition of complete three-dimensional data of the measured object.

In this embodiment, for the first point cloud data and the second point cloud data, whether to retain the first point cloud data or the second point cloud data can be selected according to the curvature, so as to realize the self-adaptive retention of feature details of the data, thereby ensuring the details of the data. On the basis of reducing the volume of data. For the part of the measured object that does not require high detail, the first point cloud data can be obtained by scanning the external camera module, and the second point cloud data can be obtained by scanning the internal camera module for the part of the measured object that requires high detail. The first point cloud data and the second point cloud data are spliced to obtain complete three-dimensional data of the measured object. It can be seen that high-fidelity and high-detail data quality can be obtained while ensuring data details, and the data volume is reduced.

Working mode 3: The first illuminator irradiates the light of the first wave band to the surface of the measured object, the surface of the measured object is pasted with marking points, the light of the first wave band is reflected by the surface of the measured object and is collected by the external camera, and the external camera collects To the rough image information including the mark points; the second illuminating element illuminates the second waveband light to the surface of the object to be measured, and the second projector simultaneously projects the reconstructed pattern of the second waveband to the surface of the object under test relative to the second illuminating element, The second-band light and the reconstructed pattern are reflected by the surface of the measured object and collected by the internal camera. The internal camera synchronously collects the fine image information including the marker points and the modulation reconstruction pattern with the external camera; based on the collected rough image information and fine image The information obtains the complete 3D data of the measured object. Specifically, the 3D data of the first marker is reconstructed based on the markers of the coarse image information, the 3D data of the second marker is reconstructed based on the markers of the fine image information, and the modulation reconstruction based on the fine image information The pattern reconstructs the second point cloud data, the first conversion matrix is determined based on the splicing of a plurality of first mark point 3D data, and the plurality of second point cloud data are spliced based on the first conversion matrix to realize the acquisition of the complete 3D data of the measured object. In this way, the use of marker points on the measured object can be reduced, the holes in the second point cloud data can be reduced, and the high detail of the complete three-dimensional data of the measured object can be guaranteed.

Working mode 4: The first illuminator irradiates the light of the first waveband to the surface of the measured object in the first time period, the surface of the measured object is pasted with marking points, and the light of the first waveband is reflected by the surface of the measured object by the external camera Collected in the first time period, the external camera collects the rough image information including the mark points; the second illuminator illuminates the second waveband of light to the surface of the measured object in the second time period, and the second projector is in the second time period Project the reconstructed pattern of the second wave band to the surface of the measured object. The light and the reconstructed pattern of the second wave band are reflected by the surface of the measured object and collected by the internal camera in the second time period. The first time period and the second time period are different In the time period, the internal camera collects the fine image information including the marker points and the modulation reconstruction pattern in time-sharing compared with the external camera; based on the collected rough image information and fine image information, the complete three-dimensional data of the measured object is obtained, specifically, based on the rough The mark points of the image information reconstruct the three-dimensional data of the first mark point, the three-dimensional data of the second mark point is reconstructed based on the mark points of the fine image information, the second point cloud data is reconstructed based on the modulation reconstruction pattern of the fine image information, based on multiple first mark points The splicing of the three-dimensional data determines the first conversion matrix, the second conversion matrix is determined based on the splicing of the first mark point three-dimensional data and the second mark point three-dimensional data, and the multiple pieces of second point cloud data are spliced based on the first conversion matrix and the second conversion matrix , To achieve the acquisition of complete three-dimensional data of the measured object.

Working mode 5: The first illuminating element irradiates the light of the first wave band to the surface of the measured object, and the first projector projects the reconstructed pattern of the first wave band to the surface of the measured object in synchronization with the first illuminating element, and the surface of the measured object is pasted There are marking points, the light of the first band and the reconstructed pattern are reflected by the surface of the measured object and collected by an external camera. The external camera collects rough image information including marking points and modulated reconstruction patterns; the second projector is synchronized with the second illuminator Project the reconstructed pattern of the second wave band to the surface of the measured object. The reconstructed pattern of the second wave band is modulated by the surface of the measured object and collected by the internal camera. The internal camera synchronously collects the fine image information including the modulated reconstruction pattern with the external camera; The collected coarse image information and fine image information obtain complete three-dimensional data of the measured object. Specifically, the first mark point three-dimensional data is reconstructed based on the mark points of the coarse image information, and the first point cloud is reconstructed based on the modulation reconstruction pattern of the coarse image information Data, reconstruct the second point cloud data based on the modulation reconstruction pattern of the fine image information, determine the first conversion matrix based on the splicing of the three-dimensional data of the first mark points, splice the first point cloud data based on the first conversion matrix, and A conversion matrix and calibrated external parameters of the external camera module and the internal camera module splicing the first point cloud data and the second point cloud data to realize the acquisition of complete three-dimensional data of the measured object. In this way, the usage of the mark points on the measured object can be reduced, the holes in the second point cloud data can be reduced, and the high detail of the complete three-dimensional data of the measured object can be guaranteed.

Working mode 6: The first illuminator irradiates the light of the first wave band to the surface of the measured object, and the surface of the measured object is pasted with marking points. The light of the first wave band is reflected by the surface of the measured object and is collected by an external camera. To the rough image information including the marker points; the second projector projects the reconstructed pattern of the second wave band to the surface of the measured object synchronously with respect to the first illuminator, which is collected by the internal camera after the surface modulation of the measured object, and the internal camera is relative to the external camera Synchronously collect fine image information including modulation reconstruction patterns; obtain complete three-dimensional data of the measured object based on the collected coarse image information and fine image information, specifically, reconstruct the three-dimensional data of the first marker point based on the marker points of the coarse image information, The second point cloud data is reconstructed based on the modulation reconstruction pattern of the fine image information, the first conversion matrix is determined based on the splicing of the three-dimensional data of the first marker points, and the second point cloud data is spliced based on the first conversion matrix to realize the measured object Acquisition of complete three-dimensional data. In this way, the usage of the mark points on the measured object can be reduced, the holes in the second point cloud data can be reduced, and the high detail of the complete three-dimensional data of the measured object can be guaranteed.

In an embodiment, the external camera module 130 includes a plurality of external cameras, and the internal camera module 120 includes at least one internal camera. The external camera module 130 also includes a first illuminating element 121 in the first wavelength band and a first filter in the first wavelength band. The first illuminating element 121 is annularly arranged around each external camera and used to project light in the first wavelength band. To illuminate the mark points on the surface of the object 140 to be measured, the first filter is arranged at the front end of the external camera to retain the incident light of the first waveband and filter out the incident light of other wavebands. The projection device 110 includes a projector of the second waveband, which is used to project the reconstructed pattern of the second waveband to the measured object 140. The internal camera module 120 includes a second filter 132 in the second wavelength band, and the second filter is disposed at the front end of the internal camera for retaining incident light in the second wavelength band and filtering out incident light in other wavelength bands. In this embodiment, the first waveband and the second waveband are different wavebands.

The scanner of this embodiment configures the sixth working mode described above. When scanning, the scanner runs the corresponding working parts or modules according to the working mode.

In an embodiment, the external camera module 130 includes a plurality of external cameras, and the internal camera module 120 includes at least one internal camera. The projection device 110 includes a first projector of the first waveband and a second projector of the second waveband. The first projector projects the reconstructed pattern of the first waveband to the measured object 140, and the second projector is used to project the measured object 140 The reconstruction pattern of the second band. The external camera module includes a first illuminating element 121 of the first waveband, the first illuminating element 121 is annularly arranged around each external camera, and is used to project light of the first waveband to illuminate the mark points on the surface of the object 140 under test; The camera module 120 includes a second illuminating element 131 of the second waveband, the second illuminating element 131 is annularly arranged around each internal camera, and is used for projecting light of the second waveband to illuminate the marking points on the surface of the object 140 under test. In this embodiment, the first waveband and the second waveband are the same waveband. The front end of the external camera and the front end of the internal camera may not be provided with a filter, or a filter for the light of the first wave band (ie the second wave band) to pass through, and the filter can filter the light of other wave bands according to requirements Set up. It is understandable that the projection device 110 may be provided with only one projector, which can be used as both the first projector and the second projector.

The scanner of this embodiment is configured with one or more of the above-mentioned working mode two, working mode three, working mode four, and working mode six. Select one of the configurations to scan according to the scanning requirements. During scanning, the scanner runs the corresponding working parts or modules according to the working mode.

In an embodiment, the external camera module 130 includes a plurality of external cameras, and the internal camera module 120 includes at least one internal camera. The projection device 110 includes a first projector of the first waveband and a second projector of the second waveband. The first projector projects the reconstructed pattern of the first waveband to the measured object 140, and the second projector is used to project the measured object 140 The reconstruction pattern of the second band. The external camera module includes a first illuminating element 121 of the first waveband, the first illuminating element 121 is annularly arranged around each external camera, and is used to project light of the first waveband to illuminate the mark points on the surface of the object 140 under test; The camera module 120 includes a second illuminating element 131 of the second waveband, the second illuminating element 131 is annularly arranged around each internal camera, and is used for projecting light of the second waveband to illuminate the marking points on the surface of the object 140 under test. In this embodiment, the first waveband and the second waveband are different wavebands. The front end of the external camera and the front end of the internal camera may not be provided with a filter, or may be provided with a filter for passing light of the first and second wavelength bands, and the filter for filtering other wavelengths of light is set according to requirements. It is understandable that the projection device 110 may also be a dual-frequency projector, which controls the dual-frequency projector to alternately project the reconstructed pattern in the first waveband and the reconstructed pattern in the second waveband.

The scanner of this embodiment is configured with one or both of the above-mentioned working mode two, working mode three, working mode four, and working mode six. Select one of the configurations to scan according to the scanning requirements. During scanning, the scanner runs the corresponding working parts or modules according to the working mode.

In an embodiment, the external camera module 130 includes a plurality of external cameras, and the internal camera module 120 includes at least one internal camera. The external camera module 130 includes a first illuminating element in the first waveband, the first illuminating element is annularly arranged around each of the external cameras, and is used to project light in the first waveband to illuminate the mark on the surface of the object 140 to be measured Point; the internal camera module 120 includes a second illuminating element of the second waveband, the second illuminating element is annularly arranged around the internal camera, and is used to project light of the second waveband to illuminate the mark on the surface of the measured object 140 Point; In this embodiment, the first waveband and the second waveband are different wavebands. The projection device includes a projector, which can be used as a first projector to project a reconstructed pattern of the first wave band to the measured object 140 or a second projector to project a reconstructed pattern of the second wave band to the measured object 140. The front end of the external camera and the front end of the internal camera may not be provided with a filter, or may be provided with a filter for passing light of the first and second wavelength bands, and the filter for filtering other wavelengths of light is set according to requirements.

In an embodiment, the external camera module 130 includes a plurality of external cameras, and the internal camera module 120 includes at least one internal camera. The external camera module 130 includes a first illuminating element of the first waveband and a first filter, and the first illuminating element is annularly arranged around each of the external cameras for illuminating the mark points on the surface of the object to be measured, The first filter is disposed at the front end of the external camera, and is used to retain the incident light in the first waveband and filter out incident light in other wavebands; the internal camera module includes a second illuminator in the second waveband and a second The second illuminating element is annularly arranged around each of the internal cameras to illuminate the mark points on the surface of the object to be measured, and the second filter is arranged on the front end of the internal camera to retain the first The incident light in the second waveband filters out the incident light in other wavebands. The projection device includes a second projector, and the second projector is used to project the reconstructed pattern of the second waveband to the measured object. In this embodiment, the first waveband and the second waveband are different wavebands.

The scanner of this embodiment is configured with one or more of the above-mentioned working mode three, working mode four, and working mode six. Select one of the configurations to scan according to the scanning requirements. During scanning, the scanner runs the corresponding working parts or modules according to the working mode.

In an embodiment, the external camera module 130 includes a plurality of external cameras, and the internal camera module 120 includes at least one internal camera. The external camera module includes a first illuminating element and a first filter in the first waveband; the first illuminating element is annularly arranged around each of the external cameras, and is used to illuminate the mark points on the surface of the object to be measured The first filter is arranged at the front end of the external camera, and is used to retain the incident light of the first waveband and filter out the incident light of other wavebands; the internal camera module includes a second filter, the second The filter is arranged at the front end of the internal camera and is used to retain the incident light of the second waveband and filter out the incident light of other wavebands. The projection device includes a first projector and a second projector. The first projector is used to project the reconstructed pattern of the first wave band to the measured object; the second projector is used to project the second wave band of the measured object to the measured object. Reconstruct the pattern; in this embodiment, the first waveband and the second waveband are different wavebands.

The scanner of this embodiment is configured with one or both of the above-mentioned working mode 5 and working mode 6. Select one of the configurations to scan according to the scanning requirements. During scanning, the scanner runs the corresponding working parts or modules according to the working mode.

A plurality of first lighting parts may be arranged around each external camera. The specific number is not limited in this embodiment. Both the first lighting element 121 and the second lighting element 131 may be LED lights. The illuminating element is arranged in a ring around the camera to scan multiple azimuth landmark points, so as to scan the measured object 140 more comprehensively and improve the accuracy of scanning.

As shown in Figure 1a, the external camera module 130 includes two cameras, a first camera 111 and a second camera 112, respectively. The first camera 111 and the second camera 112 construct a binocular reconstruction system, and the internal camera module 120 includes one The third camera 113 and the third camera 113 construct a monocular reconstruction system. The third camera 113 is arranged between the first camera 111 and the second camera 112; the projection device 110 can be arranged between the third camera 113 and the first camera 111, and the projection device 110 can also be arranged between the third camera 113 and the second camera. Between cameras 112.

In one embodiment, as shown in FIG. 1b, the external camera module 130 includes a first camera 111 and a second camera 112, the first camera 111 and the second camera 112 construct a binocular reconstruction system, and the internal camera module 120 includes a second camera. The third camera 113 and the fourth camera 114, the third camera 113 and the fourth camera 114 construct a binocular reconstruction system; the third camera 113 and the fourth camera 114 are both located between the first camera 111 and the second camera 112, that is, the first The camera 111 and the second camera 112 are located outside the scanner, the third camera 113 and the fourth camera 114 are both located inside the scanner, and the projection device 110 is arranged between the third camera 113 and the fourth camera 114, namely the projection device 110 Located in the middle, so that the projected reconstruction pattern can be distributed more uniformly and the scanning accuracy can be improved.

In an embodiment, as shown in FIG. 1c, the external camera module 130 includes a first camera 111, a second camera 112, and a fifth camera 115, any of the first camera 111, the second camera 112, and the fifth camera 115 Two cameras can construct a binocular reconstruction system. For example, the first camera 111 and the second camera 112 may construct a binocular reconstruction system, or the second camera 112 and the fifth camera 115 may construct a binocular reconstruction system, etc. During the scanning process, the three cameras can be switched to Build a binocular reconstruction system. The internal camera module 120 includes a third camera 113 and a fourth camera 114, and the third camera 113 and the fourth camera 114 construct a binocular reconstruction system.

It can be understood that the projection device 110 may also be arranged in other positions. The arrangement position of the projection device 110 in the above embodiment is only an example, and the specific arrangement position of the projection device 110 is not limited.

The scanner provided by the embodiment of the present disclosure includes a projection device 110, an internal camera module 120, and an external camera module 130. The projection device 110 projects a reconstructed pattern on an object 140; the internal camera module 120 is configured as a second scanning range, Used to collect fine image information based on the reconstructed pattern reflected by the measured object 140; the external camera module 130 is configured as a first scanning range, and the first scanning range is larger than the second scanning range, and is used to collect the surface of the measured object 140 The rough image information is used to obtain complete three-dimensional data of the measured object according to the rough image information and the fine image information. The present disclosure obtains multiple pieces of point cloud data through the fine image information of the measured object 140 collected by the internal camera module 120, and obtains the three-dimensional data of the landmark points through the rough image information collected by the external camera module 130. The range is larger than the scanning range of the internal camera module 120 and overlaps. Therefore, a single piece of landmark 3D data can correspond to multiple pieces of point cloud data, and the positional relationship between the multiple pieces of point cloud data is determined thereby, thereby realizing multiple pieces of point cloud The splicing of data. For the same camera, when an image of a larger scene is to be captured, the details of the captured image are relatively poor. Conversely, when an image with better detail is to be captured, the scene of the captured image is smaller. In the present disclosure, the external camera module is used to collect the landmark points on the surface of the measured object, and the internal camera module is used to collect the reconstructed pattern modulated by the measured object to obtain the point cloud data with better details. The scanning range of the group is large, and the surface of the measured object can be pasted with more scattered marker points, that is, the splicing of point cloud data can be completed under the condition of reducing the use of marker points, and the scanning range of the internal camera module is small However, the details of the data are better. Therefore, the present disclosure can ensure the details of the scanned data and improve the accuracy of the scan while reducing the usage of the marker points. Of course, the external camera module can also be used for other collections, and is not limited to the collection of marker points, and the internal camera module can also be used for other collections, and is not limited to reconstruction patterns.

In an embodiment, the scanner body further includes a housing, the projection device, the internal camera module, and the external camera module are installed in the housing, and the scanner further includes a holding portion, the holding portion Installed on the scanner body.

The present disclosure also provides a three-dimensional scanning system. The three-dimensional scanning system includes a processing device and the scanner described in any one of the above embodiments. The processing device is connected to the external camera module 130 and the internal camera module 120 in the scanner, respectively. To obtain the coarse image information and fine image information of the measured object, and process the coarse image information and fine image information to obtain the complete three-dimensional data of the measured object. Specifically, after the rough influence information and the fine image information are obtained, multiple pieces of point cloud data corresponding to the fine image information are extracted, and the multiple pieces of point cloud data are stitched according to the rough image information, thereby completing the accuracy of the measured object 140 Splicing to obtain complete three-dimensional data of the measured object 140.

Fig. 2 is a flowchart of a three-dimensional scanning method provided by an embodiment. Referring to Figs. 1a, 1b and 2, the three-dimensional scanning method includes steps 210 to 240, wherein:

Step 210, project the reconstructed pattern to the measured object 140.

In this embodiment, the reconstructed pattern can be projected to the measured object 140 through the projection device in the scanning device. Before the scanning device (scanner or three-dimensional scanning system) works, it needs to be calibrated, that is, the cameras in the internal camera module 120 and the external camera module 130 are calibrated to obtain calibration parameters. Specifically, the internal camera in the internal camera module 120 and the external camera in the external camera module 130 are calibrated, so as to obtain the internal and external parameters of the multiple cameras and the rotation and translation matrix corresponding to the relative positions between the multiple cameras. A good scanning device can further obtain complete three-dimensional data of the measured object 140 according to the obtained image information.

It should be noted that when the internal camera module 120 and the external camera module 130 collect the landmark points of the object 140 at the same time, the relative position of the internal camera and the external camera need not be calibrated, only the internal and external parameters of multiple cameras , And calibrate the relative positions of the projection device, the internal camera and the external camera. After the processing module obtains the landmark information and the modulation reconstruction pattern, it only needs to process the internal and external parameters of the camera, the relative position parameters of the projection device and the internal camera, and the external camera, without considering the relative position parameters of the internal and external cameras. , Which can reduce processing complexity and increase the speed of three-dimensional scanning.

Before scanning, marking points need to be pasted on the measured object 140, and the marking points can be used as reference points all over the outer surface of the measured object 140. The number of marking points can be multiple, and the specific number and setting positions are not limited in this embodiment, but it is necessary to ensure that all marking points are not on the same straight line. Preferably, any three marking points are not on the same straight line, so that the splicing of point cloud data can be completed more accurately.

The marking point can be made of a reflective material with high reflective performance, and the marking point may be pasted on the outer surface of the object 140 to be measured. The light of a preset waveband is projected to the measured object 140 through the illuminating element. The above-mentioned first waveband and second waveband are both preset wavebands. The spectrum of the light of the preset waveband is not limited. Preferably, the light of the preset waveband is one of the three monochromatic lights of red, blue, and green.

The reconstruction pattern projected by the projection device 110 is not limited, and may be a normal fringe pattern, a speckle pattern, a sinusoidal fringe pattern, and the like. Preferably, the reconstruction pattern is a normal stripe pattern, and the number of stripes is not limited, but in order to improve scanning efficiency, more than 15 stripes are usually required. It is understandable that when the number of stripes is small, the reconstructed pattern is sparser, and the data obtained in a single scan is less, and more data information of the measured object 140 can be obtained through multiple scans; when the number of stripes is large , The reconstructed pattern is denser, and more data information of the measured object 140 can be obtained in a single scan.

The structure of the projection device 110 is not limited, as long as it can project the reconstructed pattern to the measured object 140. Preferably, the projection device 110 may include a laser and/or a projector.

Step 220: Collect rough image information on the surface of the measured object 140.

In this embodiment, the rough image information of the surface of the object 140 can be collected by the external camera module 130 in the scanning device. The first illuminating element 121 of the external camera module 130 emits light of the first waveband. When the light of the first waveband irradiates the mark point of the object 140 to be measured, the light reflected by the mark point is collected by the external camera module 130. The mark point carries the mark point information of the measured object 140, that is, the three-dimensional data of the mark point can be determined based on the mark point in the rough image information. Since the scanning range of the external camera module 130 is relatively large, the use of marker points on the measured object is reduced, and the marker points on the measured object are more dispersed. The three-dimensional marker points determined by the rough image information collected by the external camera module 130 The data can be spliced, and the data can better reflect the overall information of the measured object 140.

In step 230, fine image information based on the reconstructed pattern reflected by the measured object 140 is collected.

In this embodiment, the internal camera module 120 can collect fine image information based on the reconstructed pattern reflected by the measured object 140. The internal camera module 120 has a relatively small scanning range, and can perform partial scanning of the measured object 140 to obtain detailed information of the measured object 140.

After the projection device 110 projects the reconstructed pattern to the measured object 140, usually the external camera module 130 recognizes a relatively sparse fringe image; while the internal camera module 120 recognizes a relatively dense fringe image. The coarse image information may include marker points and/or modulation reconstruction patterns, and the fine image information may include marker points and/or modulation reconstruction patterns.

The types of the internal camera module 120 and the external camera module 130 are not limited, as long as the image information of the measured object 140 can be collected. It is understandable that the reconstructed pattern projected by the projection device 110 to the side object is deformed by the height modulation of the measured object 140, and the modulated reconstructed pattern is collected by the internal camera module 120 and/or the external camera module 130. .

Step 240: Obtain rough image information and fine image information of the measured object 140 through the processing device, and process the rough image information and the fine image information to obtain complete three-dimensional data of the measured object 140.

In this embodiment, the rough image information and the fine image information of the measured object 140 can be acquired by the processing device, and the rough image information and the fine image information can be processed to obtain complete three-dimensional data of the measured object 140. The processing device can obtain the rough image information collected by the external camera module 130 and the fine image information collected by the internal camera module 120 through the data interface, and then perform processing such as reconstruction, splicing, and fusion on the rough image information and the fine image information to obtain the Measure the complete three-dimensional data of the object 140.

The processing device may be a central processing unit CPU. It can be understood that the processing device is also used to control the working status of the projection device 110, the internal camera module 120, and the external camera module 130. Specifically, the processing device may send control instructions to control the projection device 110 to project the reconstructed patterns, and control the number of reconstructed patterns projected, etc.; the processing device may send control instructions to control the exposure time of the internal camera module 120 and the external camera module 130, To collect rough image information and fine image information. The data interface receives the image information and sends it to the CPU.

The three-dimensional scanning method provided in this embodiment projects the reconstructed pattern to the measured object 140 through the projection device 110; collects the rough image information based on the reconstructed pattern reflected by the measured object 140 through the external camera module 130; The fine image information based on the reconstructed pattern reflected by the measured object 140; the rough image information and the fine image information of the measured object 140 are acquired through the processing device, and the rough image information and the fine image information are processed to obtain the complete image of the measured object 140 Three-dimensional data. The above-mentioned three-dimensional scanning method assists the splicing of the point cloud data of the fine image information collected by the internal camera module 120 according to the rough image information collected by the external camera module 130, thereby achieving the acquisition of complete three-dimensional data of the measured object 140, which can reduce the mark In the case of point usage, ensure the details of scanned data and improve the accuracy of scanning.

In one embodiment, collecting rough image information of the measured object 140 through the external camera module 130 includes: projecting a first waveband of light through the first illuminating element 121 to illuminate the mark points on the surface of the measured object 140, and make the exterior The camera module 130 collects the mark points of the measured object 140.

The projection device 110 includes a projector of the second waveband, and projecting the reconstructed pattern to the measured object 140 through the projection device 110 includes: projecting the reconstructed pattern of the second waveband to the measured object 140 through the projector, so that the internal camera module 120 can collect synchronously The modulation reconstruction pattern of the measured object 140. The projector in this embodiment may be a single-frequency projector, as long as it can project the reconstructed pattern of the second waveband.

Specifically, the calibrated scanner is first turned on, and the first illuminating element 121 in the external camera module 130 is controlled to flicker to project the first wave band of light to the mark point on the surface of the measured object 140, and the first wave band of light is projected After reflecting at the mark point, the external camera module 130 collects the rough image information including the mark point. Since the front end of the external camera is provided with a first waveband filter, and the internal camera is provided with a second waveband second filter outside, the external camera can only collect the landmark points of the measured object 140 in the first waveband. The second waveband projector projects the second waveband reconstruction pattern to the measured object 140 and reflects the second waveband modulation reconstruction pattern. The second waveband modulation reconstruction pattern carries the detailed information of the measured object 140. The internal camera can only collect The modulation reconstruction pattern to the second band.

In one embodiment, obtaining the coarse image information and the fine image information of the measured object 140 through the processing device, and processing the coarse image information and the fine image information to obtain the complete three-dimensional data of the measured object 140 includes

steps

310 and 320, of which:

In step 310, the processing device determines and splices the three-dimensional data of the mark points after acquiring the mark points of the measured object 140 to obtain the first transformation matrix.

Step 320: Obtain the modulation reconstruction pattern of the measured object 140, reconstruct the point cloud data based on the modulation reconstruction pattern, and stitch the point cloud data according to the first conversion matrix to obtain the complete three-dimensional data of the measured object 140.

Specifically, the point cloud data is first reconstructed based on the modulation reconstruction pattern, and the splicing of the point cloud data is a process of aligning any two pieces of point cloud data to a unified coordinate system. The complete process of splicing is generally divided into two steps: three-dimensional data splicing of marker points and point cloud data splicing. Marking 3D data splicing refers to pasting mark points on the surface of the measured object 140, reconstructing mark point three-dimensional data according to the obtained mark points, unifying multiple mark point three-dimensional data into the same coordinate system, and marking point three-dimensional data splicing is stable , The characteristics of fast speed. After completing the splicing of the three-dimensional data of the marker points, the first conversion matrix is obtained. The first conversion matrix can guide the splicing of the point cloud data, that is, the point cloud data can be unified in the same coordinate system through the first conversion matrix to complete the point cloud data To obtain the complete three-dimensional data of the measured object 140.

In an embodiment, the projection device 110 includes a first projector in the first waveband and a second projector in the second waveband, the external camera module 130 includes the first illuminating element 121 in the first waveband, and the internal camera module 120 includes The second illuminator 131 of the second waveband; collecting rough image information of the surface of the measured object 140 through the external camera module 130 and collecting the fine image information based on the reconstructed pattern reflected by the measured object 140 through the internal camera module 120 includes step 410 And step 420, where:

Step 410: Control the first projector to project the reconstructed pattern of the first wave band to the measured object 140, and synchronously control the first illuminator 121 to project the first wave of light to illuminate the mark points on the surface of the measured object 140 so as to make the outside The camera module 130 collects the mark points and the modulation reconstruction pattern of the first waveband of the object 140 under test.

Step 420: Control the second projector to project the reconstructed pattern of the second wave band to the measured object 140, and synchronously control the second illuminator 131 to project the second wave band of light to illuminate the mark points on the surface of the measured object 140, and make the interior The camera module 120 collects the marker points and the modulation reconstruction pattern of the second waveband of the measured object 140.

Specifically, first turn on the already calibrated scanner, control the first projector and the second projector to simultaneously project the reconstructed pattern to the measured object 140, the reconstructed pattern of the first waveband projected by the first projector and the second projector project The density of the reconstructed pattern in the second band is not limited. Generally, the internal camera module 120 recognizes a relatively dense reconstruction pattern, and the external camera module 130 recognizes a relatively sparse reconstruction pattern. The first illuminating part 121 and the second illuminating part 131 are controlled to blink to illuminate the mark points on the surface of the measured object 140. Among them, the first illuminating element 121 projects light of the first waveband to the measured object 140, and the second illuminating element 131 projects light of the second waveband to the measured object 140. Since the front end of the external camera is provided with a first waveband filter, and the front end of the internal camera is provided with a second waveband second filter, the external camera module 130 can collect the marker points including the first waveband and the first waveband For the rough image information of the modulation reconstruction pattern, the internal camera module 120 can collect fine image information including the marker points of the second waveband and the modulation reconstruction pattern of the second waveband. Based on the collected rough image information and fine image information, complete three-dimensional data of the measured object is obtained.

In an embodiment, the projection device 110 includes a first projector in the first waveband and a second projector in the second waveband, the external camera module 130 includes a first lighting element 121, and the internal camera module 120 includes a second lighting element 131 Collecting rough image information on the surface of the measured object 140 through the external camera module 130 and collecting fine image information based on the reconstructed pattern reflected by the measured object 140 through the internal camera module 120 includes

steps

510 and 520, where:

In step 510, the first projector is controlled to project the reconstruction pattern of the first waveband on the measured object 140 in the first time period, and the external camera module 130 is synchronously controlled to collect the mark points and modulation reconstruction pattern of the first waveband of the measured object 140.

In step 520, the second projector is controlled to project the reconstruction pattern of the second waveband to the measured object 140 in the second time period, and the internal camera module 120 is synchronously controlled to collect the landmark points and modulation reconstruction pattern of the second waveband of the measured object 140.

Specifically, after the calibrated three-dimensional scanning system is turned on, the first projector is controlled to project the reconstruction pattern of the first waveband to the measured object 140 in the first time period to form the modulation reconstruction pattern of the first waveband. At this time, the second The projector is not working. Synchronously control the operation of the external camera module 130. On the one hand, the first illuminating element 121 arranged in the ring around the external camera projects light to the measured object 140 to illuminate the mark point, and on the other hand, the external camera module 130 collects the mark point and The modulation reconstruction pattern of the first band. The second projector is controlled to project the reconstruction pattern of the second waveband to the measured object 140 in the second time period to form the modulation reconstruction pattern of the second waveband. At this time, the first projector does not work. Synchronously control the operation of the internal camera module 120. On the one hand, the second illuminating element 131 arranged in the ring around the internal camera projects light to the measured object 140 to illuminate the mark point, and on the other hand, the internal camera module 120 collects the mark point and Modulation reconstruction pattern of the second band.

It is understandable that the projection device 110 may also be a dual-frequency projector, and the dual-frequency projector is controlled by the processing device to alternately project the reconstructed pattern in the first waveband and the reconstructed pattern in the second waveband.

In this embodiment, by controlling the working status of the projection device 110, the internal camera module 120 and the external camera module 130, the first projector and the external camera module 130 are synchronized to work, and the second projector and the internal camera module 120 are synchronized. jobs. There is no need to limit the wavelength bands of the first illuminating element 121 and the second illuminating element 131, that is, the external camera module 130 can collect the landmark points and modulation reconstruction patterns of the first waveband, and the internal camera module 120 can collect the landmark points and the second waveband. Modulate the effect of the reconstruction pattern.

In one embodiment, the processing device is used to obtain the coarse image information and the fine image information of the measured object 140, and the coarse image information and the fine image information are processed to obtain the complete three-dimensional data of the measured object 140, including steps 610 to Step 650, where:

Step 610: Obtain the mark points and modulation reconstruction pattern of the measured object 140 in the first waveband, and the mark points and modulation reconstruction pattern of the measured object 140 in the second waveband, and obtain the first wave based on the mark points and modulation reconstruction pattern of the first waveband. The three-dimensional data of the mark point and the first point cloud data are obtained, and the three-dimensional data of the second mark point and the second point cloud data are obtained based on the mark point and the modulation reconstruction pattern of the second band.

Step 620, splicing the three-dimensional data of the first mark point and the three-dimensional data of the second mark point to obtain a second conversion matrix;

In step 630, the first point cloud data and the second point cloud data are spliced according to the first conversion matrix and the second conversion matrix to obtain a complete first three-dimensional data of the measured object.

Step 640: Calculate the curvatures of the first point cloud data and the second point cloud data, and retain the first point cloud data or the second point cloud data according to the curvature, so as to obtain a complete second three-dimensional data of the measured object.

Specifically, firstly, a plurality of first mark point three-dimensional data is spliced to obtain a first conversion matrix, and the first conversion matrix is used to indicate the splicing of a plurality of first point cloud data. The three-dimensional data of the first mark point and the three-dimensional data of the second mark point are unified in the same coordinate system to obtain the second conversion matrix. The splicing of the first point cloud data and the second point cloud data is completed according to the second conversion matrix to obtain complete three-dimensional data of the measured object. Calculate the curvature value of each point in the point cloud data. If the curvature value of the point is greater than the preset threshold, the area where the point is located is considered as a characteristic area, which contains more detailed information. At this time, the second point cloud data is retained If the curvature value of the point is not greater than the preset threshold, the area where the point is located is considered as a non-characteristic area and contains less detailed information. At this time, the point of the first point cloud data is retained. The value of the preset threshold can be selected according to actual conditions, and this embodiment does not specifically limit it.

In this embodiment, detailed features are adaptively retained according to the magnitude of the curvature, and high-fidelity and high-detail data quality can be obtained while retaining data details.

In an embodiment, the projection device 110 includes a projector for projecting a reconstruction pattern to the measured object 140, and the reconstruction pattern may be a first waveband or a second waveband. The external camera module 130 includes a first lighting element 121, the internal camera module 130 includes a second lighting element 131, the first lighting element 121 is annularly arranged around each external camera, and the second lighting element 131 is annularly arranged around the internal camera, Used to illuminate the mark points on the surface of the measured object; the external camera module 130 is used to collect the mark points of the measured object 140 in the first time period; 120 the internal camera module is used to collect the measured object 140 in the second time period The mark points and modulation reconstruction pattern.

Specifically, the external camera module and the first lighting component are controlled to work in the first time period, so that the external camera module collects the mark points of the measured object in the first time period. In the second time period, the internal camera module, the second lighting element and the projector are controlled to work, so that the internal camera module collects the mark points and modulation reconstruction patterns of the measured object in the second time period.

In an embodiment, the external camera module 130 includes a first illuminating element 121 and a first filter in the first wavelength band; the first illuminating element 121 is annularly arranged around each external camera and used to illuminate the object 140 under test. The marking point on the surface; the first filter is set at the front end of the external camera to retain the incident light in the first waveband and filter out incident light in other wavebands; the internal camera module 120 includes a second illuminating element 131 and a second waveband Two filters, the second illuminating element is annularly arranged around each of the internal cameras for illuminating the mark points on the surface of the object to be measured, and the second filter is arranged on the front end of the internal camera for retaining The incident light in the second waveband filters out incident light in other wavebands. The projection device 110 includes a second projector, which is used to project the reconstructed pattern of the second waveband to the measured object 140; the external camera module 130 is used to collect the landmark points of the first waveband of the measured object; the internal camera module 120 It is used to synchronously collect the marker points and modulation reconstruction patterns of the second waveband of the measured object 140.

In an embodiment, the external camera module 130 includes a first illuminating element 121 and a first filter in the first wavelength band; the first illuminating element 121 is annularly arranged around each external camera and used to illuminate the object 140 under test. The marking point on the surface; the first filter is set at the front end of the external camera, and is used to retain the incident light of the first waveband and filter out the incident light of other wavebands; the projection device 110 includes a first projector and a second projector, the first projection The second projector is used to project the reconstructed pattern of the first wave band to the measured object 140; the second projector is used to project the reconstructed pattern of the second wave band to the measured object 140. The internal camera module 120 includes a second filter, which is disposed at the front end of the internal camera, and is used to retain incident light in the second waveband and filter out incident light in other wavebands. The external camera module 130 is used to collect the mark points of the first waveband of the measured object 140 and the modulation reconstruction pattern of the first waveband; the internal camera module 120 is used to synchronously collect the second waveband modulation and reconstruction pattern of the measured object 140.

It should be noted that the foregoing embodiment only describes two wavebands, that is, two scanning ranges as examples, but does not limit the scanning range. In other embodiments, multiple scanning ranges may be used. That is, the projection device 110 may include multiple projectors of different wavelength bands.

It should be understood that although the various steps in the flowcharts of FIGS. 2 to 6 are displayed in sequence as indicated by the arrows, these steps are not necessarily performed in sequence in the order indicated by the arrows. Unless specifically stated in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least part of the steps in Figures 2 to 6 may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily executed at the same time, but can be executed at different times. These sub-steps or The execution order of the stages is not necessarily carried out sequentially, but may be executed alternately or alternately with at least a part of other steps or sub-steps or stages of other steps.

In one embodiment, as shown in FIG. 7, a three-dimensional scanning device is provided. The three-dimensional scanning device includes a projection module 710, an external camera module 720, an internal camera module 730, and a processing module 740, wherein:

The projection module 710 is used to project the reconstructed pattern to the measured object 140;

An external camera module 720, the external camera module 720 is configured as a first scanning range, and is used to collect rough image information on the surface of the object 140 to be measured;

The internal camera module 730, the internal camera module 730 is configured as a second scanning range for collecting fine image information based on the reconstructed pattern reflected by the measured object 140; the second scanning range is smaller than the first scanning range;

The processing module 740 is configured to process the rough image information and the fine image information to obtain complete three-dimensional data of the measured object.

In an embodiment, the projection device 710 includes a projector of the second waveband, and the projection of the reconstructed pattern to the measured object through the projection device 710 includes:

The second waveband reconstruction pattern is projected to the measured object through the projector, so that the internal camera module 730 synchronously collects the modulation reconstruction pattern of the measured object.

In an embodiment, the external camera module 720 includes a plurality of external cameras, and the internal camera module 730 includes at least one internal camera; the external camera module 720 also includes a first lighting element and a first filter in the first wavelength band, and the first lighting A ring is arranged around each external camera. The first filter is arranged at the front end of the external camera to retain the incident light of the first waveband and filter out the incident light of other wavebands; the internal camera module 730 includes the second illumination of the second waveband The second filter is arranged at the front end of the internal camera and is used to retain the incident light of the second waveband and filter out the incident light of other wavebands. The first waveband and the second waveband are different wavebands. The rough image information of the measured object collected by the external camera module 720 includes:

The first illuminating element projects the first waveband light to illuminate the mark points on the surface of the measured object, so that the external camera module collects the mark points of the measured object.

In one embodiment, obtaining the coarse image information and fine image information of the measured object through the processing module 740, and processing the coarse image information and fine image information to obtain the complete three-dimensional data of the measured object 140 includes:

Acquiring rough image information, determining the first mark point three-dimensional data based on the rough image information, and stitching the first mark point three-dimensional data to obtain a first conversion matrix;

Obtain fine image information, determine the second point cloud data based on the fine image information, and stitch the second point cloud data according to the first conversion matrix to obtain complete three-dimensional data of the measured object.

In an embodiment, the projection module 710 includes a first projector in the first waveband and a second projector in the second waveband, and the three-dimensional scanning device further includes a first illuminator in the first waveband and a second illuminator in the second waveband. ; Collecting rough image information of the measured object through the external camera module 720 and collecting fine image information of the measured object through the internal camera module 730 includes:

Control the first projector to project the reconstructed pattern of the first waveband to the measured object, and synchronously control the first illuminator to project the first waveband of light to illuminate the mark points on the surface of the measured object, so that the external camera module 720 can collect the measured object The mark point and modulation reconstruction pattern of the first band of the object;

Control the second projector to project the reconstructed pattern of the second wave band to the measured object, and synchronously control the second illuminator to project the second wave band of light to illuminate the mark points on the surface of the measured object, so that the internal camera module 730 can collect the measured object. The marker point and modulation reconstruction pattern of the second band of the object.

In an embodiment, the projection module 710 includes a first projector in the first waveband and a second projector in the second waveband, and the three-dimensional scanning device includes a first illuminator and a second illuminator; the external camera module 720 collects the measured The rough image information of the object and the fine image information of the measured object collected by the internal camera module 730 include:

Control the first projector to project the reconstruction pattern of the first waveband to the measured object at the first time, and synchronously control the external camera module 720 to collect the mark points and modulation reconstruction pattern of the first waveband of the measured object;

The second projector is controlled to project the reconstructed pattern of the second waveband to the measured object at the second time, and the internal camera module 730 is synchronously controlled to collect the landmark points and the modulation reconstruction pattern of the second waveband of the measured object.

In one embodiment, obtaining the coarse image information and fine image information of the measured object through the processing module 740, and processing the coarse image information and fine image information to obtain the complete three-dimensional data of the measured object includes:

Obtain the mark points and modulation reconstruction patterns of the measured object in the first waveband, and the mark points and modulation reconstruction patterns of the measured object in the second waveband;

Determine the three-dimensional data of the first mark point and the first point cloud data based on the mark point of the first waveband and the modulation reconstruction pattern, and determine the three-dimensional data of the second mark point and the second point cloud data based on the mark point and the modulation reconstruction pattern of the second waveband;

Splicing the three-dimensional data of the first mark point and the three-dimensional data of the second mark point to obtain a second conversion matrix;

The first point cloud data is spliced according to the first conversion matrix, and the first point cloud data and the second point cloud data are spliced according to the second conversion matrix to obtain the complete first three-dimensional data of the measured object.

Calculate the curvature of the first point cloud data and the second point cloud data, and retain the first point cloud data or the second point cloud data according to the curvature to obtain the complete second three-dimensional data of the measured object.

For the first point cloud data and the second point cloud data, whether to retain the first point cloud data or the second point cloud data can be selected according to the curvature, so as to realize the self-adaptive feature preservation of the data. Specifically, the curvatures of the first point cloud data and the second point cloud data are calculated, and the first point cloud data or the second point cloud data is retained according to the magnitude of the curvature. After triangular meshing, the point cloud data with a large curvature is a triangular patch The point cloud data with more and less curvature has fewer triangles, which can obtain high-fidelity and high-detail data quality while ensuring data details.

For the specific definition of the three-dimensional scanning device, please refer to the above-mentioned definition of the three-dimensional scanning method, which will not be repeated here. Each module in the above-mentioned three-dimensional scanning device may be implemented in whole or in part by software, hardware, and a combination thereof. The foregoing modules may be embedded in the form of hardware or independent of the processor in the computer device, or may be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the foregoing modules.

In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as shown in FIG. 8. The computer equipment includes a processor, a memory, a network interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide calculation and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The network interface of the computer device is used to communicate with an external terminal through a network connection. The computer program is executed by the processor to realize a three-dimensional scanning method. The display screen of the computer device can be a liquid crystal display or an electronic ink display screen, and the input device of the computer device can be a touch layer covered on the display screen, or it can be a button, trackball or touchpad set on the computer device shell , It can also be an external keyboard, touchpad, or mouse.

Those skilled in the art can understand that the structure shown in FIG. 8 is only a block diagram of a part of the structure related to the solution of the present disclosure, and does not constitute a limitation on the computer device to which the solution of the present disclosure is applied. The specific computer device may Including more or fewer parts than shown in the figure, or combining some parts, or having a different arrangement of parts.

In one embodiment, a computer device is provided, including a memory and a processor, and a computer program is stored in the memory, and the processor implements the following steps when executing the computer program:

Project the reconstructed pattern to the measured object 140;

Collect rough image information on the surface of the measured object 140;

Collect fine image information based on the reconstructed pattern reflected by the measured object 140;

The coarse image information and the fine image information of the measured object 140 are acquired, and the coarse image information and the fine image information are processed to obtain complete three-dimensional data of the measured object 140.

In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

Project the reconstructed pattern to the measured object 140;

Collect rough image information on the surface of the measured object 140;

A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be implemented by a computer program instructing relevant hardware, and the computer program can be stored in a non-volatile computer readable storage medium. When the computer program is executed, it may include the processes of the above-mentioned method embodiments. Wherein, any reference to memory, storage, database or other media used in the various embodiments provided in the present disclosure may include non-volatile and/or volatile memory. Non-volatile memory may include read only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not a limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous chain Channel (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

The technical features of the above embodiments can be combined arbitrarily. In order to make the description concise, all possible combinations of the technical features in the above embodiments are not described. However, as long as there is no contradiction between the combinations of these technical features, they should It is considered as the range described in this specification.

The above embodiments only express several implementation manners of the present disclosure, and the description is relatively specific and detailed, but it should not be understood as a limitation on the scope of the invention patent. It should be pointed out that for those of ordinary skill in the art, without departing from the concept of the present disclosure, several modifications and improvements can be made, and these all fall within the protection scope of the present disclosure. Therefore, the protection scope of the patent of the present disclosure should be subject to the appended claims.

Claims

A three-dimensional scanning method, characterized in that the method includes:

Project the reconstructed pattern to the measured object;

Collecting rough image information of the surface of the measured object;

Collecting fine image information reflected by the measured object based on the reconstructed pattern;

The coarse image information and the fine image information of the measured object are acquired, and the coarse image information and the fine image information are processed to obtain complete three-dimensional data of the measured object.
The method according to claim 1, wherein said processing said coarse image information and said fine image information comprises:

Obtaining first mark point three-dimensional data based on the rough image information, acquiring second point cloud data based on the fine image information, and stitching the second point cloud data based on the first mark point three-dimensional data.
The method according to claim 1, wherein said processing said coarse image information and said fine image information comprises:

Acquire 3D data of a first mark point based on the rough image information, acquire 3D data of a second mark point and second point cloud data based on the fine image information, and obtain 3D data of a first mark point and the second mark point The three-dimensional data is spliced with the second point cloud data.
The method according to claim 1, wherein said processing said coarse image information and said fine image information comprises:

Acquire first point cloud data and first point cloud data based on the rough image information, acquire second point cloud data based on the fine image information, and stitch the first point cloud data based on the first three-dimensional data of the landmark points And the second point cloud data.
The method according to claim 1, wherein said processing said coarse image information and said fine image information comprises:

Acquire first mark point three-dimensional data and first point cloud data based on the rough image information, acquire second mark point three-dimensional data and second point cloud data based on the fine image information, and stitch based on the first mark point three-dimensional data For the first point cloud data, the second point cloud data is spliced based on the three-dimensional data of the first mark point and the three-dimensional data of the second mark point.
The method according to claim 4 or 5, wherein the processing the coarse image information and the fine image information further comprises:

The curvature of the points in the first point cloud data and the second point cloud data is determined, and one of the first point cloud data and the second point cloud data is retained according to the curvature.
The method according to claim 1 or 2, wherein the collecting rough image information of the surface of the measured object and collecting the fine image information reflected by the measured object based on the reconstructed pattern comprises:

Projecting the reconstructed pattern of the second waveband to the measured object, and projecting the light of the first waveband to illuminate the mark points on the surface of the measured object, so as to synchronously collect the mark points of the measured object and modulate the reconstructed pattern.
The method according to claim 1 or 5, wherein the collecting rough image information reflected by the measured object and collecting fine image information reflected by the measured object based on the reconstructed pattern comprises:

Project the reconstructed pattern of the first waveband and the reconstructed pattern of the second waveband to the measured object, and project the light of the first waveband and the light of the second waveband to illuminate the mark points on the surface of the measured object, so as to collect the The mark point and modulation reconstruction pattern of the first waveband of the measured object, and the mark point and modulation reconstruction pattern of the second waveband of the measured object.
The method according to claim 1 or 5, wherein the collecting rough image information reflected by the measured object and collecting fine image information reflected by the measured object based on the reconstructed pattern comprises:

Projecting the light of the first waveband and the reconstruction pattern of the first waveband to the measured object in the first time period, and collecting the mark points and the modulation reconstruction pattern of the first waveband of the measured object;

Projecting the second waveband light and the reconstruction pattern of the second waveband to the measured object in the second time period, and collecting the mark points and modulation reconstruction pattern of the second waveband of the measured object.
The method according to claim 1 or 3, wherein the collecting rough image information reflected by the measured object and collecting fine image information reflected by the measured object based on the reconstructed pattern comprises:

Projecting light to the measured object in the first time period and the second time period respectively to illuminate the mark points on the surface of the measured object; and projecting the reconstructed pattern on the measured object in the second time period; in the first time period Collect the mark points of the measured object; collect the mark points and the modulation reconstruction pattern of the measured object in a second time period.
The method according to claim 1 or 3, wherein the collecting rough image information reflected by the measured object and collecting fine image information reflected by the measured object based on the reconstructed pattern comprises:

Projecting the first waveband light to the measured object to illuminate the mark points on the surface of the measured object to collect the mark points of the first waveband of the measured object;

Simultaneously project the second waveband light and the second waveband reconstruction pattern to the measured object to collect the second waveband mark points and modulate the reconstruction pattern of the measured object.
The method according to claim 1 or 4, wherein the collecting rough image information reflected by the measured object and collecting fine image information reflected by the measured object based on the reconstructed pattern comprises:

Projecting the first waveband light and the first waveband reconstruction pattern to the measured object to collect the first waveband mark points and the first waveband modulation reconstruction pattern of the measured object;

The second waveband reconstruction pattern is simultaneously projected to the measured object to collect the second waveband modulation reconstruction pattern of the measured object.
A scanner, characterized in that the scanner includes a scanner body, and the scanner body includes:

Projection device, used to project the reconstructed pattern to the measured object;

An internal camera module, the internal camera module is configured as a second scanning range for collecting fine image information based on the reconstructed pattern reflected by the measured object;

An external camera module, the external camera module is configured as a first scanning range, and is used to collect rough image information of the surface of the measured object, so as to obtain the measured object according to the rough image information and the fine image information Complete three-dimensional data of the object; the second scanning range is smaller than the first scanning range.
The scanner according to claim 13, wherein the scanner body comprises a housing, the projection device, the internal camera module, and the external camera module are installed in the housing, and the scanner further comprises The holding part is installed on the scanner body.
The scanner according to claim 13 or 14, wherein:

The external camera module further includes a first illuminating element in a first wavelength band and a first filter, the first illuminating element is annularly arranged around each of the external cameras, and is used to project light in the first wavelength band to illuminate Brighten the marking points on the surface of the object to be measured; the first filter is arranged at the front end of the external camera, and is used to retain the incident light in the first waveband and filter out incident light in other wavebands; the external camera module is used to collect The mark point of the first waveband of the measured object;

The internal camera module includes a second filter of a second wavelength band, and the second filter is disposed at the front end of the internal camera for retaining incident light in the second wavelength band and filtering out incident light in other wavelength bands. The first waveband and the second waveband are different wavebands;

The projection device includes a projector for projecting the reconstruction pattern of the second waveband to the measured object, so that the internal camera module synchronously collects the modulation reconstruction pattern of the measured object in the second waveband .
The scanner according to claim 13 or 14, wherein the projection device comprises a first projector and a second projector, the first projector is used to project a reconstruction pattern in the first waveband, and the second projector The projector is used to project the reconstructed pattern of the second waveband, the external camera module further includes a first illuminating element and a first filter in the first waveband, and the first illuminating element is annularly arranged around each of the external cameras , Used to project light of the first wavelength band to illuminate the mark points on the surface of the object to be measured, and the first filter is arranged at the front end of the external camera to retain the incident light of the first wavelength band and filter the incident light of other wavelength bands Light;

The internal camera module further includes a second illuminating element in a second wavelength band and a second filter, and the second illuminating element is annularly arranged around the internal camera for projecting light in the second wavelength band to illuminate the Measuring the mark points on the surface of the object, the second filter is arranged at the front end of the external camera, and is used to retain the incident light of the second waveband and filter the incident light of other wavebands;

The external camera module is used to collect the marker points and modulation reconstruction patterns of the first waveband of the measured object;

The internal camera module is used to collect the marker points and modulation reconstruction patterns of the second waveband of the measured object.
The scanner according to claim 13 or 14, wherein the projection device comprises a dual-frequency projector, and the dual-frequency projector is used to project the reconstruction pattern of the first waveband in the first time period, and in the second time period. Periodically project the reconstruction pattern of the second waveband; the scanner body further includes a first illuminating element and a second illuminating element, the first illuminating element is annularly arranged around each of the external cameras, and the second illuminating element is annular Set around the internal camera to illuminate the mark points on the surface of the object to be measured;

The external camera module is used to collect the mark points and the modulation reconstruction pattern of the measured object in a first time period;

The internal camera module is used to collect the mark points and the modulation reconstruction pattern of the measured object in the second time period.
The scanner according to claim 13 or 14, wherein the projection device comprises a first projector and a second projector, and the first projector is used to project the object under test in a first time period The reconstructed pattern of the first waveband, the second projector projects the reconstructed pattern of the second waveband to the measured object in the second time period; the scanner body further includes a first illuminating element and a second illuminating element, so The first illuminating element is annularly arranged around each of the external cameras, and the second illuminating element is annularly arranged around the internal camera for illuminating the mark points on the surface of the object to be measured;

The external camera module is used to collect the mark points and the modulation reconstruction pattern of the measured object in a first time period;

The internal camera module is used to collect the mark points and the modulation reconstruction pattern of the measured object in the second time period.
The scanner according to claim 13 or 14, wherein the projection device comprises a projector, and the projector is used to project the reconstructed pattern on the object under test in the second time period; the three-dimensional scanning system further comprises a An illuminating part and a second illuminating part, the first illuminating part is annularly arranged around each of the external cameras, and is used for projecting light to the measured object in a first time period to illuminate the mark on the surface of the measured object Point; the second illuminating element is annularly arranged around the internal camera, and is used to project light to the measured object in a second time period to illuminate the mark point on the surface of the measured object;

The external camera module is used to collect the mark points of the measured object in a first time period;

The internal camera module is used to collect the mark points and the modulation reconstruction pattern of the measured object in the second time period.
The scanner according to claim 13 or 14, wherein the external camera module includes a first illuminating element and a first filter in the first wavelength band; the first illuminating element is annularly arranged at each The periphery of the external camera is used to illuminate the mark points on the surface of the object to be measured; the first filter is arranged at the front end of the external camera and is used to retain the incident light of the first waveband and filter out the incident light of other wavebands; The internal camera module includes a second illuminator in a second waveband; the projection device includes a second projector, and the second projector is used to project a reconstructed pattern in the second waveband to an object under test;

The external camera module is used to collect the landmark points of the first waveband of the measured object;

The internal camera module is used to synchronously collect the marker points and the modulation reconstruction pattern of the second waveband of the measured object.
The scanner according to claim 13 or 14, wherein the external camera module includes a first illuminating element and a first filter in the first wavelength band; the first illuminating element is annularly arranged at each The periphery of the external camera is used to illuminate the mark points on the surface of the object to be measured; the first filter is arranged at the front end of the external camera, and is used to retain the incident light of the first waveband and filter the incident light of other wavebands; The projection device includes a first projector and a second projector. The first projector is used to project a reconstruction pattern of the first waveband to the measured object; the second projector is used to project a reconstruction of the second waveband to the measured object pattern;

The external camera module is used to collect the marker points of the first waveband and the modulation reconstruction pattern of the first waveband of the measured object;

The internal camera module is used for synchronously acquiring the modulation reconstruction pattern of the second waveband of the measured object.
The scanner according to claim 13 or 14, wherein the external camera module includes a first camera and a second camera, and the internal camera module includes a third camera; the third camera is arranged at the Between the first camera and the second camera; the projection device is arranged between the third camera and the first camera, or between the third camera and the second camera.
The scanner according to claim 13 or 14, wherein the external camera module includes a first camera and a second camera, and the internal camera module includes a third camera and a fourth camera; the third camera The camera and the fourth camera are both located between the first camera and the second camera, and the projection device is disposed between the third camera and the fourth camera.
A three-dimensional scanning system, wherein the three-dimensional scanning system includes the scanner according to any one of claims 13 to 23, the scanner includes a scanner body, and the scanner body includes:

Projection device, used to project the reconstructed pattern to the measured object;

An external camera module, the external camera module is configured as a first scanning range, and the external camera module includes a plurality of external cameras for collecting rough image information reflected by the measured object;

An internal camera module, the internal camera module is configured as a second scanning range, and the internal camera module includes at least one internal camera for collecting fine image information based on the reconstructed pattern reflected by the measured object; The second scanning range is smaller than the first scanning range;

The scanning system also includes a processing device, which is respectively connected to the external camera module and the internal camera module, and is used to obtain the rough image information and the fine image information of the measured object, and to compare the rough image information Processing with the fine image information to obtain complete three-dimensional data of the measured object.
A computer device, comprising a memory and a processor, the memory storing a computer program, wherein the processor implements the steps of any one of claims 1 to 9 when the computer program is executed.
A computer-readable storage medium having a computer program stored thereon, wherein the computer program implements the steps of the method according to any one of claims 1 to 9 when the computer program is executed by a processor.