WO2020232741A1 - Device capable of testing fluorescence spectrum, afterglow and fluorescence lifetime of material - Google Patents

Device capable of testing fluorescence spectrum, afterglow and fluorescence lifetime of material Download PDF

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WO2020232741A1
WO2020232741A1 PCT/CN2019/089406 CN2019089406W WO2020232741A1 WO 2020232741 A1 WO2020232741 A1 WO 2020232741A1 CN 2019089406 W CN2019089406 W CN 2019089406W WO 2020232741 A1 WO2020232741 A1 WO 2020232741A1
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sample
light source
afterglow
testing
ray light
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PCT/CN2019/089406
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French (fr)
Chinese (zh)
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王殳凹
陈兰花
王亚星
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苏州大学
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray

Definitions

  • the invention relates to a device capable of testing the fluorescence spectrum, afterglow and fluorescence lifetime of materials.
  • X-ray scintillator is a process that absorbs energy and converts the energy into low-energy scintillation light after X-ray irradiation. Such materials are X-ray scintillators. Because of its characteristics, it is used as a radiation-sensitive medium and is often used in nuclear physics experiments, environmental monitoring, nuclear industry monitoring, and medical imaging. Scintillator materials are generally divided into guest ion-activated scintillators and self-activated scintillators. The self-activating scintillator has intrinsic scintillation ability, as a ray scintillator, it can improve the performance of the scintillator.
  • afterglow refers to the duration of light emission after the excitation stops.
  • the first is Suppression of afterglow in Cs(Tl) by cooping with Eu2+-I: Experimental.
  • This patent only records Parts of the instrument, and the test sensitivity to long-wave scintillation materials is low; the second is a GY-I crystal afterglow tester from the First Research Institute of the Ministry of Public Security of Beijing, but the instrument controls the light source exposure device using shutter shutoff Formula, there is a lot of human error; the third is mainly for testing medium-short afterglow materials, which is a device for testing the afterglow of scintillating materials reported by the Shanghai Institute of Ceramics, Chinese Academy of Sciences. However, this device cannot adjust the power of the continuous X-ray light source, and the recording time cannot be synchronized with the start or turn off of the light source.
  • the so-called fluorescence lifetime refers to the time required for the fluorescence intensity to decay to 1/e of the initial intensity after the excitation stops.
  • X-ray source as an excitation light source to test the fluorescence lifetime of materials in the patent.
  • the purpose of the present invention is to provide a device with a reasonable structure and capable of simultaneously testing the fluorescence spectrum, afterglow and fluorescence lifetime of materials. It adopts the following technical solutions:
  • a device that can test the fluorescence spectrum, afterglow and fluorescence lifetime of materials which includes a sample stage, an X-ray light source, a first filter, a photon counter, a timer, a spectrometer, and a computer.
  • the sample stage and X-ray light source And the first filter is arranged in the dark box, the sample stage is used to place the sample to be tested, and the X-ray light source is arranged above the sample stage;
  • the sample When testing the fluorescence spectrum intensity of the sample, the sample is connected to the spectrometer through an optical fiber, and both the spectrometer and the X-ray light source are electrically connected to the computer;
  • the sample When testing the afterglow of the sample, the sample is connected to the photon counter through an optical fiber, the photon counter and the X-ray light source are both electrically connected to a timer, and the timer is electrically connected to a computer;
  • the first filter When testing the fluorescence lifetime of the sample, the first filter is arranged between the sample and the photon counter, the first filter is connected to the photon counter through an optical fiber, and the photon counter and the X-ray light source are both connected to The timer is electrically connected, and the timer is electrically connected with the computer.
  • the present invention also includes a second filter, the second filter is arranged in the dark box, when testing the fluorescence lifetime of the sample, the second filter is arranged in the X-ray light source and Between sample stages.
  • bracket is arranged in the dark box, and the sample stage is arranged on the bracket.
  • the height of the bracket can be adjusted.
  • the X-ray light source is arranged directly above the sample stage.
  • the X-ray light source is a continuous X-ray light source or a pulsed X-ray light source.
  • the optical fiber is bonded to the sample through conductive glue.
  • the timer is a HUB-A timer.
  • the device of the present invention can test the fluorescence spectrum, afterglow and fluorescence lifetime of the material has simple structure, convenient operation, and has the functions of the fluorescence spectrum, afterglow and fluorescence lifetime of the test material, and greatly reduces the test cost.
  • FIG. 1 is a structural schematic diagram 1 of a device that can test the fluorescence spectrum, afterglow, and fluorescence lifetime of a material in an embodiment of the present invention
  • FIG. 2 is a schematic diagram of the second structure of a device that can test the fluorescence spectrum, afterglow and fluorescence lifetime of a material in an embodiment of the present invention
  • FIG. 3 is the third structural diagram of the device for testing the fluorescence spectrum, afterglow and fluorescence lifetime of materials in an embodiment of the present invention.
  • Marking instructions 1. Dark box; 2. X-ray light source; 3. Support; 4. First filter; 5. Sample stage; 6. Sample; 7. Optical fiber; 8. Second filter; 9. Photon counter ; 10. Timer; 11. Computer; 12. Spectrometer.
  • the device includes a sample stage 5, an X-ray light source 2, a first filter 4, and a photon counter 9. , Timer 10, computer 11, spectrometer 12, sample stage 5, X-ray light source 2 and first filter 4 are set in dark box 1, sample stage 5 is used to place the sample 6 to be tested, X-ray light source 2 is set in Above the sample stage 5.
  • the sample 6 When testing the fluorescence spectrum intensity of the sample, as shown in FIG. 1, the sample 6 is connected to the spectrometer 12 through the optical fiber 7, and both the spectrometer 12 and the X-ray light source 2 are electrically connected to the computer 11.
  • the computer 11 is used to control the X-ray light source 2 to turn on and off, to adjust the power of the X-ray light source 2, and to record the fluorescence spectra under the X-ray light source 2 of different powers.
  • the optical fiber 7 collects the number of fluorescent photons emitted by the sample 6, and the spectrometer 12 converts the collected photon numbers into spectrum analysis, and generates a wavelength and fluorescence spectrum intensity map through the computer 11.
  • the sample 6 is connected to the photon counter 9 through the optical fiber 7, the photon counter 9 and the X-ray light source 2 are both electrically connected to the timer 10, and the timer 10 is electrically connected to the computer 11.
  • the computer 11 is used to control the X-ray light source 2, the timer 10 and the photon counter 9.
  • the photon counter 9 is used to identify and measure the number of photons per unit time, thereby detecting the power of the discrete weak light pulse signal.
  • the timer 10 is used to record the time when the X-ray light source 2 is turned on and off, and the optical fiber 7 starts to receive photons and stops receiving photons, by measuring the time from when the X-ray light source 2 is turned off to when the sample 6 stops emitting light. The afterglow of sample 6 is measured.
  • the first filter 4 When testing the fluorescence lifetime of the sample, as shown in Figure 3, the first filter 4 is set between the sample 6 and the photon counter 9. The first filter 4 is connected to the photon counter 9 through the optical fiber 7. The photon counter 9 and The X-ray light source 2 is electrically connected to the timer 10, and the timer 10 is electrically connected to the computer 11. The first filter 4 is used to select the fluorescence range and exclude scattered light in the emitted light of the sample 6.
  • the optical fiber 7 and the photon counter 9 record the number of photons from when the X-ray light source 2 is turned off to the sample 6 stops emitting light.
  • the timer 10 is used to record the time when the X-ray light source 2 is turned on and off, and the optical fiber 7 starts to receive photons and stops receiving photons. Thus, the fluorescence lifetime of sample 6 can be measured.
  • the device when testing the fluorescence lifetime of the sample, the device further includes a second filter 8, the second filter 8 is arranged in the dark box 1, and the second filter is arranged on the X-ray Between the light source 2 and the sample stage 5.
  • the second filter 8 is used to limit the intensity of the emitted light of the X-ray light source 2.
  • the device further includes a bracket 3, which is arranged in the dark box 1, and the height of the bracket 3 is adjustable.
  • the sample stage 5 and the first filter 4 are both set on the support 3.
  • the X-ray light source 2 is arranged directly above the sample stage 5 to ensure that the sample 6 can be irradiated to the maximum.
  • the X-ray light source 2 is a continuous X-ray light source or a pulsed X-ray light source.
  • the optical fiber 7 is bonded to the sample 6 through conductive glue.
  • the timer 10 is a HUB-A timer.
  • the device of the present invention can test the fluorescence spectrum, afterglow and fluorescence lifetime of the material has simple structure, convenient operation, and has the functions of the fluorescence spectrum, afterglow and fluorescence lifetime of the test material, and greatly reduces the test cost.

Abstract

Disclosed is a device capable of testing the fluorescence spectrum, afterglow and fluorescence lifetime of a material, the device having the functions of testing the fluorescence spectrum, the afterglow and the fluorescence lifetime of the material. The device comprises a sample stage (5), an X-ray light source (2), a first light filter (4), a photon counter (9), a timer (10), a spectrometer (12), and a computer (11), wherein the sample stage (5), the X-ray light source (2) and the first light filter (4) are arranged inside a dark box (1); when the intensity of the fluorescence spectrum of a sample (6) is tested, the sample (6) is connected to the spectrometer (12) via an optical fiber (7), and the spectrometer (12) and the X-ray light source (2) are both electrically connected to the computer (11); when the afterglow of the sample (6) is tested, the sample (6) is connected to the photon counter (9) via the optical fiber (7), the photon counter (9) and the X-ray light source (2) are both electrically connected to the timer (10), and the timer (10) is electrically connected to the computer (11); and when the fluorescence lifetime of the sample (6) is tested, the first light filter (4) is arranged between the sample (6) and the photon counter (9), the first light filter (4) is connected to the photon counter (9) via the optical fiber (7), the photon counter (9) and the X-ray light source (2) are both electrically connected to the timer (10), and the timer (10) is electrically connected to the computer (11).

Description

一种可测试材料的荧光光谱、余辉及荧光寿命的装置Device capable of testing fluorescence spectrum, afterglow and fluorescence lifetime of materials 技术领域Technical field
本发明涉及一种可测试材料的荧光光谱、余辉及荧光寿命的装置。The invention relates to a device capable of testing the fluorescence spectrum, afterglow and fluorescence lifetime of materials.
背景技术Background technique
X射线闪烁体是一种经X射线照射后吸收能量并将能量转化为低能闪烁光的过程，这样的材料便是X射线闪烁体。因其此特性而作为辐射灵敏介质，常用于核物理实验、环境监测、核工业监测及医学影像等领域中。闪烁体材料一般分为客体离子激活闪烁体和自活化闪烁体。自活化闪烁体具有本征闪烁能力，作为射线闪烁体，能够提高闪烁体的性能。要分清是否是自活化X射线闪烁体，可通过比较不同射线下激发的荧光光谱是否相同。要评估材料的X射线闪烁性能，须表征材料在不同功率的X射线的激发下的荧光光谱强度、余辉强度及材料的荧光寿命。X-ray scintillator is a process that absorbs energy and converts the energy into low-energy scintillation light after X-ray irradiation. Such materials are X-ray scintillators. Because of its characteristics, it is used as a radiation-sensitive medium and is often used in nuclear physics experiments, environmental monitoring, nuclear industry monitoring, and medical imaging. Scintillator materials are generally divided into guest ion-activated scintillators and self-activated scintillators. The self-activating scintillator has intrinsic scintillation ability, as a ray scintillator, it can improve the performance of the scintillator. To distinguish whether it is a self-activating X-ray scintillator, you can compare whether the fluorescence spectra excited by different rays are the same. To evaluate the X-ray scintillation performance of a material, it is necessary to characterize the fluorescence spectrum intensity, afterglow intensity and the fluorescence lifetime of the material under the excitation of X-rays of different powers.
所谓余辉是指激发停止后，材料发光的持续时间。目前市场上用X-射线作光源的仪器测材料的余辉有三种，第一种是美国辐射检测设备公司的Suppression of afterglow in Cs(Tl)by cooping with Eu2+-I:Experimental,此专利只记载了仪器的部件，且对长波闪烁材料测试灵敏度偏低；第二种是北京公安部第一研究所的一种GY-I型晶体余辉测试仪，但该仪器控制光源曝光装置采用的是快门关断式，存在很大的人为误差；第三种是主要是测试中-短余辉的材料，是中国科学院上海硅酸盐研究所报道的测试闪烁材料余辉的装置。但此装置无法调节连续X射线光源的功率，且记录的时间无法与光源开始或关闭保持同步。The so-called afterglow refers to the duration of light emission after the excitation stops. At present, there are three types of afterglow for measuring materials that use X-rays as the light source on the market. The first is Suppression of afterglow in Cs(Tl) by cooping with Eu2+-I: Experimental. This patent only records Parts of the instrument, and the test sensitivity to long-wave scintillation materials is low; the second is a GY-I crystal afterglow tester from the First Research Institute of the Ministry of Public Security of Beijing, but the instrument controls the light source exposure device using shutter shutoff Formula, there is a lot of human error; the third is mainly for testing medium-short afterglow materials, which is a device for testing the afterglow of scintillating materials reported by the Shanghai Institute of Ceramics, Chinese Academy of Sciences. However, this device cannot adjust the power of the continuous X-ray light source, and the recording time cannot be synchronized with the start or turn off of the light source.
所谓荧光寿命是指当激发停止后，荧光强度衰减到初始强度的1/e时所需要的时间。目前专利上暂无用X射线源做激发光源来测试材料的荧光寿命。The so-called fluorescence lifetime refers to the time required for the fluorescence intensity to decay to 1/e of the initial intensity after the excitation stops. Currently, there is no X-ray source as an excitation light source to test the fluorescence lifetime of materials in the patent.
因此需要开发出一种可同时测试材料的荧光光谱、余辉及荧光寿命的装置。Therefore, it is necessary to develop a device that can simultaneously test the fluorescence spectrum, afterglow and fluorescence lifetime of materials.
发明内容Summary of the invention
针对现有技术的不足，本发明目的在于提供一种结构合理，可同时测试材料的荧光光谱、余辉及荧光寿命的装置。其采用如下技术方案：In view of the shortcomings of the prior art, the purpose of the present invention is to provide a device with a reasonable structure and capable of simultaneously testing the fluorescence spectrum, afterglow and fluorescence lifetime of materials. It adopts the following technical solutions:
一种可测试材料的荧光光谱、余辉及荧光寿命的装置，其包括样品台、X射线光源、第一滤光片、光子计数器、计时器、分光仪、计算机，所述样品台、X射线光源和第一滤光片设于暗箱内，所述样品台用于放置待测样品，所述X射线光源设于样品台上方；A device that can test the fluorescence spectrum, afterglow and fluorescence lifetime of materials, which includes a sample stage, an X-ray light source, a first filter, a photon counter, a timer, a spectrometer, and a computer. The sample stage and X-ray light source And the first filter is arranged in the dark box, the sample stage is used to place the sample to be tested, and the X-ray light source is arranged above the sample stage;
当测试样品的荧光光谱强度时，样品通过光纤与所述分光仪连接，所述分光仪和X射线光源均与计算机电连接；When testing the fluorescence spectrum intensity of the sample, the sample is connected to the spectrometer through an optical fiber, and both the spectrometer and the X-ray light source are electrically connected to the computer;
当测试样品的余辉时，样品通过光纤与所述光子计数器连接，所述光子计数器和X射线光源均与计时器电连接，所述计时器与计算机电连接；When testing the afterglow of the sample, the sample is connected to the photon counter through an optical fiber, the photon counter and the X-ray light source are both electrically connected to a timer, and the timer is electrically connected to a computer;
当测试样品的荧光寿命时，所述第一滤光片设于样品和光子计数器之间，所述第一滤光片通过光纤与所述光子计数器连接，所述光子计数器和X射线光源均与计时器电连接，所述计时器与计算机电连接。When testing the fluorescence lifetime of the sample, the first filter is arranged between the sample and the photon counter, the first filter is connected to the photon counter through an optical fiber, and the photon counter and the X-ray light source are both connected to The timer is electrically connected, and the timer is electrically connected with the computer.
作为本发明的进一步改进，还包括第二滤光片，所述第二滤光片设于所述暗箱内，当测试样品的荧光寿命时，所述第二滤光片设于X射线光源与样品台之间。As a further improvement of the present invention, it also includes a second filter, the second filter is arranged in the dark box, when testing the fluorescence lifetime of the sample, the second filter is arranged in the X-ray light source and Between sample stages.
作为本发明的进一步改进，还包括支架，所述支架设于所述暗箱内，所述样品台设于所述支架上。As a further improvement of the present invention, it also includes a bracket, the bracket is arranged in the dark box, and the sample stage is arranged on the bracket.
作为本发明的进一步改进，所述支架的高度可调节。As a further improvement of the present invention, the height of the bracket can be adjusted.
作为本发明的进一步改进，所述X射线光源设于样品台的正上方。As a further improvement of the present invention, the X-ray light source is arranged directly above the sample stage.
作为本发明的进一步改进，所述X射线光源为连续X射线光源或脉冲X射线光源。As a further improvement of the present invention, the X-ray light source is a continuous X-ray light source or a pulsed X-ray light source.
作为本发明的进一步改进，当测试样品的荧光光谱强度或余辉时，光纤通过导电胶与样品粘合。As a further improvement of the present invention, when testing the fluorescence spectrum intensity or afterglow of the sample, the optical fiber is bonded to the sample through conductive glue.
作为本发明的进一步改进，所述计时器为HUB-A计时器。As a further improvement of the present invention, the timer is a HUB-A timer.
本发明的有益效果：The beneficial effects of the present invention:
本发明的可测试材料的荧光光谱、余辉及荧光寿命的装置结构简单，操作方便，兼具测试材料的荧光光谱、余辉及荧光寿命的功能，大大降低了测试成本。The device of the present invention can test the fluorescence spectrum, afterglow and fluorescence lifetime of the material has simple structure, convenient operation, and has the functions of the fluorescence spectrum, afterglow and fluorescence lifetime of the test material, and greatly reduces the test cost.
上述说明仅是本发明技术方案的概述，为了能够更清楚了解本发明的技术手段，而可依照说明书的内容予以实施，并且为了让本发明的上述和其他目的、特征和优点能够更明显易懂，以下特举较佳实施例，并配合附图，详细说明如下。The above description is only an overview of the technical solution of the present invention. In order to understand the technical means of the present invention more clearly, it can be implemented in accordance with the content of the specification, and to make the above and other objectives, features and advantages of the present invention more obvious and understandable. In the following, the preferred embodiments are cited in conjunction with the drawings, and the detailed description is as follows.
附图说明Description of the drawings
图1是本发明实施例中可测试材料的荧光光谱、余辉及荧光寿命的装置的结构示意图一；FIG. 1 is a structural schematic diagram 1 of a device that can test the fluorescence spectrum, afterglow, and fluorescence lifetime of a material in an embodiment of the present invention;
图2是本发明实施例中可测试材料的荧光光谱、余辉及荧光寿命的装置的结构示意图二；2 is a schematic diagram of the second structure of a device that can test the fluorescence spectrum, afterglow and fluorescence lifetime of a material in an embodiment of the present invention;
图3是本发明实施例中可测试材料的荧光光谱、余辉及荧光寿命的装置的结构示意图三。FIG. 3 is the third structural diagram of the device for testing the fluorescence spectrum, afterglow and fluorescence lifetime of materials in an embodiment of the present invention.
标记说明：1、暗箱；2、X射线光源；3、支架；4、第一滤光片；5、样品台；6、样品；7、光纤；8、第二滤光片；9、光子计数器；10、计时器；11、计算机；12、分光仪。Marking instructions: 1. Dark box; 2. X-ray light source; 3. Support; 4. First filter; 5. Sample stage; 6. Sample; 7. Optical fiber; 8. Second filter; 9. Photon counter ; 10. Timer; 11. Computer; 12. Spectrometer.
具体实施方式Detailed ways
下面结合附图和具体实施例对本发明作进一步说明，以使本领域的技术人员可以更好地理解本发明并能予以实施，但所举实施例不作为对本发明的限定。The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, so that those skilled in the art can better understand and implement the present invention, but the cited embodiments are not intended to limit the present invention.
如图1-3所示，为本发明实施例中可测试材料的荧光光谱、余辉及荧光寿命的装置，该装置包括样品台5、X射线光源2、第一滤光片4、光子计数器9、计时器10、计算机11、分光仪12，样品台5、X射线光源2和第一滤光片4设于暗箱1内，样品台5用于放置待测样品6，X射线光源2设于样品台5上方。As shown in Figures 1-3, it is a device that can test the fluorescence spectrum, afterglow and fluorescence lifetime of a material in an embodiment of the present invention. The device includes a sample stage 5, an X-ray light source 2, a first filter 4, and a photon counter 9. , Timer 10, computer 11, spectrometer 12, sample stage 5, X-ray light source 2 and first filter 4 are set in dark box 1, sample stage 5 is used to place the sample 6 to be tested, X-ray light source 2 is set in Above the sample stage 5.
当测试样品的荧光光谱强度时，如图1所示，样品6通过光纤7与分光仪12连接，分光仪12和X射线光源2均与计算机11电连接。计算机11用于控制X射线光源2开启和关闭，以及调节X射线光源2的功率，并且记录在不同 功率的X射线光源2下的荧光光谱。光纤7收集样品6发出的荧光的光子数，分光仪12将收集到光子数转换成光谱分析，并通过计算机11生成波长与荧光光谱强度图。When testing the fluorescence spectrum intensity of the sample, as shown in FIG. 1, the sample 6 is connected to the spectrometer 12 through the optical fiber 7, and both the spectrometer 12 and the X-ray light source 2 are electrically connected to the computer 11. The computer 11 is used to control the X-ray light source 2 to turn on and off, to adjust the power of the X-ray light source 2, and to record the fluorescence spectra under the X-ray light source 2 of different powers. The optical fiber 7 collects the number of fluorescent photons emitted by the sample 6, and the spectrometer 12 converts the collected photon numbers into spectrum analysis, and generates a wavelength and fluorescence spectrum intensity map through the computer 11.
当测试样品的余辉时，如图2所示，样品6通过光纤7与光子计数器9连接，光子计数器9和X射线光源2均与计时器10电连接，计时器10与计算机11电连接。计算机11用于控制X射线光源2、计时器10和光子计数器9，光子计数器9用于鉴别并测量单位时间内的光子数，从而检测离散微弱光脉冲信号功率。计时器10用于记录X射线光源2打开、关闭、光纤7开始接收光子及停止接收光子的时间，通过测量从X射线光源2关闭到样品6停止发光的时间。即测得样品6的余辉。When testing the afterglow of the sample, as shown in FIG. 2, the sample 6 is connected to the photon counter 9 through the optical fiber 7, the photon counter 9 and the X-ray light source 2 are both electrically connected to the timer 10, and the timer 10 is electrically connected to the computer 11. The computer 11 is used to control the X-ray light source 2, the timer 10 and the photon counter 9. The photon counter 9 is used to identify and measure the number of photons per unit time, thereby detecting the power of the discrete weak light pulse signal. The timer 10 is used to record the time when the X-ray light source 2 is turned on and off, and the optical fiber 7 starts to receive photons and stops receiving photons, by measuring the time from when the X-ray light source 2 is turned off to when the sample 6 stops emitting light. The afterglow of sample 6 is measured.
当测试样品的荧光寿命时，如图3所示，第一滤光片4设于样品6和光子计数器9之间，第一滤光片4通过光纤7与光子计数器9连接，光子计数器9和X射线光源2均与计时器10电连接，计时器10与计算机11电连接。第一滤光片4用于选择荧光范围并排除样品6发射光中的散射光。光纤7与光子计数器9记录X射线光源2关闭到样品6停止发光这一段过程的光子数，计时器10用于记录X射线光源2打开、关闭、光纤7开始接收光子及停止接收光子的时间。由此可测得样品6的荧光寿命。When testing the fluorescence lifetime of the sample, as shown in Figure 3, the first filter 4 is set between the sample 6 and the photon counter 9. The first filter 4 is connected to the photon counter 9 through the optical fiber 7. The photon counter 9 and The X-ray light source 2 is electrically connected to the timer 10, and the timer 10 is electrically connected to the computer 11. The first filter 4 is used to select the fluorescence range and exclude scattered light in the emitted light of the sample 6. The optical fiber 7 and the photon counter 9 record the number of photons from when the X-ray light source 2 is turned off to the sample 6 stops emitting light. The timer 10 is used to record the time when the X-ray light source 2 is turned on and off, and the optical fiber 7 starts to receive photons and stops receiving photons. Thus, the fluorescence lifetime of sample 6 can be measured.
在本发明的另一实施例中，当测试样品的荧光寿命时，该装置还包括第二滤光片8，第二滤光片8设于暗箱1内，第二滤光片设于X射线光源2与样品台5之间。第二滤光片8用于限制X射线光源2的发射光强度。In another embodiment of the present invention, when testing the fluorescence lifetime of the sample, the device further includes a second filter 8, the second filter 8 is arranged in the dark box 1, and the second filter is arranged on the X-ray Between the light source 2 and the sample stage 5. The second filter 8 is used to limit the intensity of the emitted light of the X-ray light source 2.
在本实施例中，该装置还包括支架3，支架3设于暗箱1内，支架3的高度可调节。样品台5、第一滤光片4均设于支架3上。In this embodiment, the device further includes a bracket 3, which is arranged in the dark box 1, and the height of the bracket 3 is adjustable. The sample stage 5 and the first filter 4 are both set on the support 3.
优选的，X射线光源2设于样品台5的正上方，确保样品6能够得到最大的照射。Preferably, the X-ray light source 2 is arranged directly above the sample stage 5 to ensure that the sample 6 can be irradiated to the maximum.
在本实施例中，X射线光源2为连续X射线光源或脉冲X射线光源。In this embodiment, the X-ray light source 2 is a continuous X-ray light source or a pulsed X-ray light source.
在本实施例中，当测试样品6的荧光光谱强度或余辉时，光纤7通过导电胶与样品6粘合。In this embodiment, when the fluorescence spectrum intensity or afterglow of the sample 6 is tested, the optical fiber 7 is bonded to the sample 6 through conductive glue.
在本实施例中，计时器10为HUB-A计时器。In this embodiment, the timer 10 is a HUB-A timer.
本发明的可测试材料的荧光光谱、余辉及荧光寿命的装置结构简单，操作方便，兼具测试材料的荧光光谱、余辉及荧光寿命的功能，大大降低了测试成本。The device of the present invention can test the fluorescence spectrum, afterglow and fluorescence lifetime of the material has simple structure, convenient operation, and has the functions of the fluorescence spectrum, afterglow and fluorescence lifetime of the test material, and greatly reduces the test cost.
以上实施例仅是为充分说明本发明而所举的较佳的实施例，本发明的保护范围不限于此。本技术领域的技术人员在本发明基础上所作的等同替代或变换，均在本发明的保护范围之内。本发明的保护范围以权利要求书为准。The above embodiments are only preferred embodiments for fully explaining the present invention, and the protection scope of the present invention is not limited thereto. The equivalent substitutions or changes made by those skilled in the art on the basis of the present invention are all within the protection scope of the present invention. The protection scope of the present invention is subject to the claims.

Claims (8)

  1. 一种可测试材料的荧光光谱、余辉及荧光寿命的装置，其特征在于，包括样品台、X射线光源、第一滤光片、光子计数器、计时器、分光仪、计算机，所述样品台、X射线光源和第一滤光片设于暗箱内，所述样品台用于放置待测样品，所述X射线光源设于样品台上方；A device capable of testing the fluorescence spectrum, afterglow and fluorescence lifetime of a material is characterized by comprising a sample stage, an X-ray light source, a first filter, a photon counter, a timer, a spectrometer, and a computer. The sample stage, The X-ray light source and the first filter are arranged in a dark box, the sample stage is used to place the sample to be tested, and the X-ray light source is arranged above the sample stage;
    当测试样品的荧光光谱强度时，样品通过光纤与所述分光仪连接，所述分光仪和X射线光源均与计算机电连接；When testing the fluorescence spectrum intensity of the sample, the sample is connected to the spectrometer through an optical fiber, and both the spectrometer and the X-ray light source are electrically connected to the computer;
    当测试样品的余辉时，样品通过光纤与所述光子计数器连接，所述光子计数器和X射线光源均与计时器电连接，所述计时器与计算机电连接；When testing the afterglow of the sample, the sample is connected to the photon counter through an optical fiber, the photon counter and the X-ray light source are both electrically connected to a timer, and the timer is electrically connected to a computer;
    当测试样品的荧光寿命时，所述第一滤光片设于样品和光子计数器之间，所述第一滤光片通过光纤与所述光子计数器连接，所述光子计数器和X射线光源均与计时器电连接，所述计时器与计算机电连接。When testing the fluorescence lifetime of the sample, the first filter is arranged between the sample and the photon counter, the first filter is connected to the photon counter through an optical fiber, and the photon counter and the X-ray light source are both connected to The timer is electrically connected, and the timer is electrically connected with the computer.
  2. 如权利要求1所述的可测试材料的荧光光谱、余辉及荧光寿命的装置，其特征在于，还包括第二滤光片，所述第二滤光片设于所述暗箱内，当测试样品的荧光寿命时，所述第二滤光片设于X射线光源与样品台之间。The device for testing the fluorescence spectrum, afterglow, and fluorescence lifetime of a material as claimed in claim 1, further comprising a second filter, and the second filter is arranged in the dark box, when the sample is tested When the fluorescence lifetime is longer, the second filter is arranged between the X-ray light source and the sample stage.
  3. 如权利要求1所述的可测试材料的荧光光谱、余辉及荧光寿命的装置，其特征在于，还包括支架，所述支架设于所述暗箱内，所述样品台设于所述支架上。The device for testing the fluorescence spectrum, afterglow, and fluorescence lifetime of a material according to claim 1, further comprising a bracket, the bracket is arranged in the dark box, and the sample stage is arranged on the bracket.
  4. 如权利要求3所述的可测试材料的荧光光谱、余辉及荧光寿命的装置，其特征在于，所述支架的高度可调节。The device for testing the fluorescence spectrum, afterglow, and fluorescence lifetime of a material according to claim 3, wherein the height of the bracket is adjustable.
  5. 如权利要求1所述的可测试材料的荧光光谱、余辉及荧光寿命的装置，其特征在于，所述X射线光源设于样品台的正上方。The device for testing the fluorescence spectrum, afterglow, and fluorescence lifetime of a material as claimed in claim 1, wherein the X-ray light source is arranged directly above the sample stage.
  6. 如权利要求1所述的可测试材料的荧光光谱、余辉及荧光寿命的装置，其特征在于，所述X射线光源为连续X射线光源或脉冲X射线光源。The device for testing the fluorescence spectrum, afterglow and fluorescence lifetime of a material according to claim 1, wherein the X-ray light source is a continuous X-ray light source or a pulsed X-ray light source.
  7. 如权利要求1所述的可测试材料的荧光光谱、余辉及荧光寿命的装置，其特征在于，当测试样品的荧光光谱强度时或余辉时，光纤通过导电胶与样品粘合。The device for testing the fluorescence spectrum, afterglow, and fluorescence lifetime of a material according to claim 1, wherein when the fluorescence spectrum intensity or afterglow of the sample is tested, the optical fiber is bonded to the sample through conductive glue.
  8. 如权利要求1所述的可测试材料的荧光光谱、余辉及荧光寿命的装置， 其特征在于，所述计时器为HUB-A计时器。The device for testing the fluorescence spectrum, afterglow and fluorescence lifetime of a material according to claim 1, wherein the timer is a HUB-A timer.
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