WO2020198956A1 - 一种天线测试系统以及阵列天线测试方法 - Google Patents

一种天线测试系统以及阵列天线测试方法 Download PDF

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Publication number
WO2020198956A1
WO2020198956A1 PCT/CN2019/080469 CN2019080469W WO2020198956A1 WO 2020198956 A1 WO2020198956 A1 WO 2020198956A1 CN 2019080469 W CN2019080469 W CN 2019080469W WO 2020198956 A1 WO2020198956 A1 WO 2020198956A1
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WIPO (PCT)
Prior art keywords
test
radio frequency
antenna
array antenna
frequency index
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PCT/CN2019/080469
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English (en)
French (fr)
Inventor
郭海
莫祚建
刘剑刚
左腾
邢明芮
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华为技术有限公司
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Priority to PCT/CN2019/080469 priority Critical patent/WO2020198956A1/zh
Publication of WO2020198956A1 publication Critical patent/WO2020198956A1/zh

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H04B17/12—Monitoring; Testing of transmitters for calibration of transmit antennas, e.g. of the amplitude or phase
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/29—Performance testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/30—Monitoring; Testing of propagation channels
    • H04B17/309—Measuring or estimating channel quality parameters
    • H04B17/354—Adjacent channel leakage power

Definitions

  • the embodiments of the present application relate to the field of antenna testing, in particular to an antenna testing system and an array antenna testing method.
  • the antenna is a kind of converter, through which the guided wave propagating on the transmission line can be transformed into an electromagnetic wave propagating in an unbounded medium, or vice versa.
  • the antenna is often used in the fields of radio communication, broadcasting, radar, navigation, and radio astronomy.
  • the directivity of a single antenna is limited.
  • two or more single antennas working at the same frequency are fed and spaced according to certain requirements to form an antenna array.
  • the antenna radiating unit that constitutes the array antenna is called an array element, also called an array element. At this time, in order to ensure the performance of the array antenna, the operation and maintenance personnel need to detect the relevant performance parameters of the array antenna.
  • the traditional array antenna test method is mainly over the air (OTA), that is, the air interface performance index test is realized through the far-field test method of electromagnetic wave space transmission.
  • OTA over the air
  • all elements in the array antenna to be tested are controlled to send test signals together, and then the test signal is received by the signal receiving device, and the test signal is analyzed to determine the performance of the array antenna.
  • the test since the distance between the array antenna to be tested and the signal receiving device is far apart, in order to avoid the leakage of the test signal, the test needs to be performed in a larger microwave anechoic chamber. Since the cost of building a microwave anechoic chamber is high and it is easily affected by the test site, the flexibility of the array antenna test is reduced.
  • the embodiments of the application provide an antenna test system and an array antenna test method, which are used to test the array antenna without a microwave anechoic chamber, thereby reducing the impact of the test site on the array antenna test, and thereby improving the flexibility of the array antenna test Sex.
  • an embodiment of the present application provides an antenna test system, including: a test array antenna, a tested array antenna, and an analysis processing module; the tested array antenna includes N first elements, and the test array antenna includes N For the second element, the N first elements have a one-to-one correspondence with the N second elements, and the N is an integer greater than 1; the tested array antenna is used to send the first element to the second element through the first element Test signal; the test array antenna is used to receive the first test signal sent by the first element through the second element; the analysis processing module is used to determine the uplink radio frequency index of the first element according to the first test signal; The analysis and processing module is also used to determine the uplink synthesized radio frequency index of the tested array antenna according to the uplink radio frequency index of each element in the tested array antenna.
  • the antenna test system first tests the uplink radio frequency index of each element in the tested array antenna, and then determines the uplink synthetic radio frequency index according to the uplink radio frequency index of each element. Because, when testing the uplink radio frequency index of a single element, the installation distance between the test array antenna and the tested array antenna is relatively short. Therefore, when the element in the test array antenna sends a test signal to the element in the tested array antenna, the test signal is not easy to leak from the distance gap between the test array antenna and the tested array antenna, and no additional configuration is required.
  • a microwave anechoic chamber used to prevent leakage of test signals. Since the entire test process does not need to be carried out in a microwave anechoic chamber, the impact of the test site on the array antenna test is reduced, thereby increasing the flexibility of the array antenna test.
  • the analysis processing module includes: a digital signal processing module, a control device, and a mixing unit; the control device is used to control the tested array antenna The first element in the test array antenna sends the first test signal to the second element in the test array antenna; the mixing unit is used to perform frequency down processing on the first test signal received by the second element in the test array antenna, Obtain a second test signal, and transmit the second test signal to the digital signal processing module; the digital signal processing module is used to determine the first uplink radio frequency index of the first period according to the second test signal, the first An uplink radio frequency index includes first phase information.
  • the analysis processing module includes a digital signal processing module, a control device, and a mixing unit.
  • the mixing unit can perform frequency down processing on the first test signal to obtain the second test signal.
  • the digital signal processing module determines the first uplink radio frequency index and the first phase information according to the second test signal. In order to subsequently determine the uplink synthesized radio frequency index according to the first phase information and other information. Therefore, the feasibility of the program is enhanced.
  • the analysis processing module further includes a spectrum analyzer; the spectrum analyzer is used to obtain the second test from the mixing unit Signal, and, according to the second test signal, the second uplink radio frequency index of the first period is determined, the second uplink radio frequency index includes first amplitude information; the digital signal processing module is also used to determine the second uplink radio frequency index according to the tested array antenna The first amplitude information and the first phase information of each period in the frame determine the uplink synthesis radio frequency index.
  • the spectrum analyzer in the antenna test system can also determine the second uplink radio frequency index and the first amplitude information according to the second test signal. Since the amplitude information determined by the spectrum analyzer is accurate, the phase information determined by the digital signal processing module is also accurate. After the antenna test system determines the first amplitude information and the first phase information of each element in the tested array antenna, the antenna test system determines that the uplink synthesized radio frequency index is also accurate. Therefore, the accuracy of the antenna test system can be improved.
  • the antenna test system further includes an upper tooling board, The lower tooling plate and rotating tooling; the upper tooling plate for installing the test array antenna; the lower tooling plate for installing the tested array antenna and digital signal processing module; the rotating tooling for adjusting the test array antenna and The angle between the tested array antennas is used to adjust a first phase difference, and the first phase difference is the phase difference between each element in the tested array antenna.
  • the distribution positions of the tested array antenna and the test array antenna are clarified.
  • the tested array antenna is located on the lower tooling board
  • the test array antenna is located on the upper tooling board.
  • the two tooling plates can be rotated relative to each other to adjust the phase difference. Therefore, the antenna test system can adjust the phase difference even when measuring the radio frequency index of a single element, so that elements of different phases can be tested. Therefore, this solution can expand the detection range of the antenna test system while ensuring that a single element can be tested.
  • an embodiment of the present application provides an antenna test system, including: a test array antenna, a tested array antenna, and an analysis processing module; the tested array antenna includes N first elements, and the test array antenna includes N In the second period, the N first elements correspond to the N second elements one-to-one, and the N is an integer greater than 1; the test array antenna is used to send a third test to the first element through the second element Signal; the tested array antenna for receiving the third test signal sent by the second element through the first element; the analysis and processing module is used to determine the downlink radio frequency index of the first element according to the third test signal; The analysis and processing module is also used to determine the downlink synthesized radio frequency index of the tested array antenna according to the downlink radio frequency index of each element in the tested array antenna.
  • the antenna test system first tests the downlink radio frequency index of each element in the tested array antenna separately, and then determines the downlink synthesized radio frequency index according to the downlink radio frequency index of each element. Because, when testing the downlink radio frequency index of a single element, the installation distance between the test array antenna and the tested array antenna is relatively short. Therefore, when the element in the test array antenna sends a test signal to the element in the tested array antenna, the test signal is not easy to leak from the distance gap between the test array antenna and the tested array antenna, and no additional configuration is required.
  • a microwave anechoic chamber used to prevent leakage of test signals. Since the entire test process does not need to be carried out in a microwave anechoic chamber, the impact of the test site on the array antenna test is reduced, thereby increasing the flexibility of the array antenna test.
  • the analysis processing module includes: a digital signal processing module, a control device, a mixing unit, and a signal source; the control device is used to control the signal The source generates a fourth test signal; the mixing unit is used to perform up-conversion processing on the fourth test signal in the signal source to obtain the third test signal, and transmit the third test signal to the test array
  • the second element of the antenna the digital signal processing module is used to determine the first downlink radio frequency index of the first element according to the third test signal sent by the second element of the test antenna, the first downlink radio frequency index
  • the digital signal processing module includes second amplitude information; the digital signal processing module is also used to determine that the first period is a failed period when the first downlink radio frequency index is greater than a first preset error value, and to report to the control device Feedback test results.
  • the internal structure of the antenna test system when testing the downlink radio frequency index is clarified.
  • the analysis and processing module includes: a digital signal processing module, a control device, a mixing unit, and a signal source.
  • the first downlink radio frequency index for the first period of time can be determined, and the first downlink radio frequency index includes second amplitude information. Since the second amplitude information obtained by detecting the test signal generated by the signal source is accurate, the accuracy of the subsequent determination of the downlink synthesized radio frequency index can be improved.
  • the digital signal processing module is further configured to: when the first downlink radio frequency index is less than or equal to the first preset When the error value is set, a fifth test signal is generated, and the fifth test signal is transmitted to the mixing unit.
  • the antenna testing system will also compare the first downlink radio frequency index with a first preset error, and when the first downlink radio frequency index is less than or equal to the first preset error value, determine The first downlink radio frequency index is accurate. Then, it is determined that the tested element and the tested path are qualified. Therefore, the accuracy of subsequent detection can be guaranteed.
  • the mixing unit is further configured to perform up-conversion processing on the fifth test signal to obtain a sixth test signal , And transmit the sixth test signal to the second element of the test array antenna;
  • the antenna test system further includes a service channel; the service channel is used to receive the first element of the tested array antenna
  • the sixth test signal from the second period is subjected to frequency reduction processing to obtain a seventh test signal;
  • the digital signal processing module is further configured to determine the second downlink radio frequency index of the first period according to the seventh test signal, and the first The second downlink radio frequency index includes second phase information; the digital signal processing module is also used to determine the downlink synthesized radio frequency index according to the second amplitude information and second phase information of each element in the tested array antenna.
  • the antenna test system in addition to determining the first downlink radio frequency index and the second amplitude information, can also determine a second downlink radio frequency index, and the second downlink radio frequency index includes second phase information. Therefore, the antenna test system can determine the downlink synthesized radio frequency index through the second amplitude information and the second phase information of each element. In other words, the antenna test system can not only determine the downlink synthesized radio frequency index but also the uplink synthesized radio index. Therefore, the implementation flexibility of the scheme is enhanced.
  • an embodiment of the present application provides an array antenna test method, including: an antenna test system separately tests the radio frequency index of each element in the tested array antenna; the antenna test system determines the radio frequency index of each element The synthesized radio frequency index of the tested array antenna.
  • the antenna test system first tests the radio frequency index of each element in the tested array antenna separately, and then determines the synthesized radio frequency index according to the radio frequency index of each element. Because, when testing the radio frequency index of a single element, the installation distance between the test array antenna and the tested array antenna is relatively short. Therefore, when the element in the test array antenna sends a test signal to the element in the tested array antenna, the test signal is not easy to leak from the distance gap between the test array antenna and the tested array antenna, and no additional configuration is required.
  • a microwave anechoic chamber used to prevent leakage of test signals. Since the entire test process does not need to be carried out in a microwave anechoic chamber, the impact of the test site on the array antenna test is reduced, thereby increasing the flexibility of the array antenna test.
  • the radio frequency index includes an uplink radio frequency index
  • the antenna test system separately testing the radio frequency index of each element of the tested array antenna includes: antenna test The system controls the first element in the tested array antenna to send a first test signal to the second element in the test array antenna, and the first element corresponds to the second element; the antenna testing system determines the second element according to the first test signal Uplink RF indicators for a while.
  • the steps of the antenna test system when testing the uplink radio frequency index are further clarified.
  • the antenna test system can determine the uplink radio frequency index of the first element through the first test signal between the first element and the second element.
  • the antenna test system determining the uplink radio frequency index of the first period according to the first test signal includes: the antenna test The spectrum analyzer in the system determines the first uplink radio frequency index of the first period according to the first test signal, and the first uplink radio frequency index includes first amplitude information; the digital signal processing module in the antenna test system is based on the first The test signal determines the second uplink radio frequency index for the first period, and the second uplink radio frequency index includes the first phase information.
  • the antenna test system can determine a first uplink radio frequency index and a second uplink radio frequency index respectively, where the first uplink radio frequency index includes first amplitude information, and the second uplink radio frequency index includes first phase information.
  • the antenna test system determines the synthesized radio frequency index of the tested array antenna according to the radio frequency index of each element includes: the antenna test system according to each element The first amplitude information and the first phase information of an element determine the uplink synthetic radio frequency index of the tested array antenna.
  • the method for determining the uplink synthetic radio frequency index is clarified.
  • the first amplitude information and first phase information obtained above can be used to determine the uplink synthetic radio frequency index of the tested array antenna according to a certain formula. Therefore, the feasibility of the scheme can be improved.
  • the radio frequency index includes a downlink radio frequency index
  • the antenna test system separately testing the radio frequency index of each element of the tested array antenna includes: the antenna The test system controls the second element in the test array antenna to send a third test signal to the first element in the tested array antenna, and the first element corresponds to the second element; the antenna test system determines the third test signal according to the third test signal.
  • the first downlink radio frequency index includes: the antenna The test system controls the second element in the test array antenna to send a third test signal to the first element in the tested array antenna, and the first element corresponds to the second element; the antenna test system determines the third test signal according to the third test signal.
  • the first downlink radio frequency index includes a downlink radio frequency index
  • the antenna test system separately testing the radio frequency index of each element of the tested array antenna includes: the antenna The test system controls the second element in the test array antenna to send a third test signal to the first element in the tested array antenna, and the first element corresponds to the second element; the antenna test system determines the third test signal
  • the antenna test system can determine the downlink radio frequency index of the first period through the third test signal between the first period and the second period.
  • the antenna test system determining the downlink radio frequency index of the first period according to the third test signal includes: the antenna test The system uses the fourth test signal generated by the signal source for testing, and obtains the first downlink radio frequency index for the first period.
  • the first downlink radio frequency index includes second amplitude information;
  • the antenna test system uses a digital information processing module to generate The fifth test signal is tested to obtain the second downlink radio frequency index for the first period, and the second downlink radio frequency index includes second phase information.
  • the manner of determining downlink radio frequency indicators such as the second amplitude information and the second phase information is further clarified.
  • the antenna test system can respectively determine a first downlink radio frequency index and a second downlink radio frequency index, where the first downlink radio frequency index includes second amplitude information, and the second downlink radio frequency index includes second phase information. Therefore, the feasibility of the scheme can be increased.
  • the antenna testing system determines the synthesized radio frequency index of the tested array antenna according to the radio frequency index of each element includes: The antenna testing system determines the downlink synthesized radio frequency index of the tested array antenna according to the second amplitude information and the second phase information of each element.
  • the method for determining the downlink synthetic radio frequency index is clarified, and the downlink synthetic radio frequency index of the tested array antenna can be determined according to a certain formula based on the second amplitude information and second phase information obtained above. Therefore, the feasibility of the scheme can be improved.
  • the antenna testing system tests the tested array antennas respectively Before the radio frequency index of each element in the array
  • the method further includes: the antenna test system respectively calibrates the test components related to each element in the tested array antenna, and the test components include a tooling board, a mixing unit or Reference channel.
  • the antenna testing system will be calibrated before testing, for example, the tooling board, mixing unit or reference channel will be calibrated. Therefore, the accuracy of antenna testing can be improved.
  • the antenna testing system tests the tested array antennas respectively Before the radio frequency index of each element in the array, the method further includes: the antenna testing system adjusts the phase difference between each element in the tested array antenna.
  • the antenna test system can adjust the phase difference between the elements in the tested array antenna before the test. Therefore, this embodiment ensures that the test can be performed on a single element, and at the same time, the radio frequency index of each element under different phase differences can be detected. Therefore, the flexibility of the scheme is increased.
  • the antenna test system adjusting the phase difference between the first element and the second element includes: the antenna test The system adjusts the angle between the lower tooling plate where the first element is located and the upper tooling plate where the second element is located to adjust the phase difference between each element in the tested array antenna.
  • the method of adjusting the phase difference is further clarified. Specifically, by adjusting the angle between the lower tooling plate and the upper tooling plate, the phase difference between each element in the tested array antenna can be adjusted. In such an embodiment, the phase difference can also be adjusted when testing a single element. Therefore, the test range can be appropriately expanded and the flexibility of the array antenna test can be increased.
  • the antenna test system first tests the radio frequency index of each element in the tested array antenna separately, and then determines the synthesized radio frequency index according to the radio frequency index of each element. Because, when testing the radio frequency index of a single element, the installation distance between the test array antenna and the tested array antenna is relatively short. Therefore, when the element in the test array antenna sends a test signal to the element in the tested array antenna, the test signal is not easy to leak from the distance gap between the test array antenna and the tested array antenna, and no additional configuration is required.
  • a microwave anechoic chamber used to prevent leakage of test signals. Since the entire test process does not need to be carried out in a microwave anechoic chamber, the impact of the test site on the array antenna test is reduced, thereby increasing the flexibility of the array antenna test.
  • FIG. 1 is a schematic diagram of an embodiment of an antenna test system in an embodiment of the application
  • FIG. 2A is a schematic diagram of another embodiment of the antenna test system in the embodiment of the application.
  • 2B is a schematic diagram of another embodiment of the antenna test system in the embodiment of the application.
  • 3A is a schematic diagram of another embodiment of the antenna test system in the embodiment of the application.
  • 3B is a schematic diagram of another embodiment of the antenna test system in the embodiment of the application.
  • 3C is a schematic diagram of another embodiment of the antenna test system in the embodiment of the application.
  • FIG. 4 is a schematic diagram of an embodiment of an array antenna testing method in an embodiment of the application.
  • the embodiments of the application provide an antenna test system and an array antenna test method, which are used to test the array antenna without a microwave anechoic chamber, thereby reducing the impact of the test site on the array antenna test, and thereby improving the flexibility of the array antenna test Sex.
  • Antenna Refers to a device that converts high-frequency current or energy in the form of waveguides into electromagnetic waves and emits them in a specified direction or restores electromagnetic waves from a certain direction into high-frequency currents.
  • antennas There are many forms of antennas.
  • an array antenna is mainly introduced, and the array antenna includes multiple elements.
  • Array antenna Two or more single antennas working at the same frequency are fed and arranged in space according to certain requirements to form an antenna array, also called antenna array or antenna array.
  • the antenna radiating unit that constitutes the array antenna is called an array element, also called an array element.
  • Uplink radio frequency index In this embodiment of the application, a certain element of the tested array antenna transmits a signal to the corresponding element of the test array antenna.
  • transmit power tx power
  • adjacent channel leakage ratio ACLR/ACPR
  • modulation error vector error vector magnitude, EVM
  • Downlink radio frequency index In this embodiment of the application, a certain element of the test array antenna transmits a signal to the corresponding element of the tested array antenna.
  • the receiving sensitivity rx sensitivity
  • the receiving sensitivity is not specifically limited here.
  • Adjacent channel leakage ratio (ACLR): It is used to measure the transmission of RF energy in addition to the specified transmission channel. An indicator of the transmission of RF energy is generated by the output power amplifier. Because interference will occur and the specified requirements will be destroyed, it must be accurately measured measuring. ACLR is called ACPR in the application of second-generation mobile phones.
  • EMM Error vector magnitude
  • modulation error vector Also called modulation error vector, it is the vector difference between the ideal error-free reference signal and the actual transmitted signal at a given moment, which can fully measure the amplitude error and phase error of the modulation signal.
  • the modulation error vector includes a vector of amplitude and a vector of phase.
  • the array antenna test system and antenna test method proposed in the embodiments of the present application can be applied to this scenario. Specifically, the array antenna testing system and antenna testing method proposed in the embodiments of the present application can perform far-field testing without a darkroom, thereby obtaining relevant indicators of the array antenna.
  • array antenna test system and antenna test method proposed in the embodiments of the present application can be applied to the test of other array antennas in addition to the 5G array antenna test and test, which is not specifically limited here.
  • the column antenna test system includes a tested array antenna 101, a test array antenna 102, and an analysis and processing module 20.
  • the tested array antenna 101 includes N first elements 1011
  • the test array antenna 102 includes N second periods 1021, the N first periods 1011 correspond to the N second periods 1021 one-to-one.
  • N is an integer greater than 1.
  • the analysis and processing module 20 is connected to the tested array antenna 101, and the analysis and processing module 20 is also connected to the test array antenna 102.
  • the array antenna test system in this embodiment can measure the uplink radio frequency index of a single element, and can also measure the downlink radio frequency index of a single element.
  • the two test situations are introduced below:
  • the tested array antenna 101 is used to send a first test signal to the second element 1021 through the first element 1011; the test array antenna 102 is used to The first test signal sent by the first period 1011 is received through the second period 1021.
  • the analysis and processing module 20 is configured to determine the uplink radio frequency index of the first period 1011 according to the first test signal.
  • the antenna test system will test another pair of elements, for example, the third element 1012 of the tested array antenna 101 and the fourth element 1022 of the test array antenna 102, or other pairs of elements, specifically There is no limitation here.
  • the analysis and processing module 20 is also used to determine the uplink radio frequency indicators of each element in the tested array antenna 101. Measure the uplink synthetic radio frequency index of the array antenna 101.
  • the test array antenna 102 is used to send a third test signal to the first element 1011 through the second element 1021; the tested array antenna 101 is used The third test signal sent by the second period 1021 is received through the first period 1011.
  • the analysis and processing module 20 is configured to determine the downlink radio frequency index of the first period 1011 according to the third test signal.
  • the antenna test system will also test the downlink radio frequency indicators for another pair of periods. After the antenna test system has tested the downlink radio frequency indexes of all the elements in the tested array antenna 101, the analysis and processing module 20 is also used to determine the radio frequency index of each element in the tested array antenna 101. Measure the downlink synthesized radio frequency index of the array antenna 101.
  • the antenna test system first tests the radio frequency index of each element in the tested array antenna separately, and then determines the synthesized radio frequency index according to the radio frequency index of each element. Because, when testing the radio frequency index of a single element, the installation distance between the test array antenna and the tested array antenna is relatively short. Therefore, when the element in the test array antenna sends a test signal to the element in the tested array antenna, the test signal is not easy to leak from the distance gap between the test array antenna and the tested array antenna, and no additional configuration is required.
  • a microwave anechoic chamber used to prevent leakage of test signals. Since the entire test process does not need to be carried out in a microwave anechoic chamber, the impact of the test site on the array antenna test is reduced, thereby increasing the flexibility of the array antenna test.
  • FIG. 2A it is a structural diagram of the antenna test system in testing the uplink radio frequency index. Among them, in addition to the tested array antenna 101, the test array antenna 102, and the analysis processing module 20 described above, the internal structure of the analysis processing module 20 is also shown.
  • the analysis and processing module 20 includes a mixing unit 201, a digital signal processing module 202, a control device 203, and a spectrum analyzer 204.
  • the control device 203 is used to control the first element 1011 of the tested array antenna 101 to send the first test signal to the second element 1021 of the test array antenna 102;
  • the mixing unit 201 is used to control the The first test signal received by the second element 1021 in the test array antenna 102 is subjected to frequency reduction processing to obtain a second test signal, and the second test signal is transmitted to the digital signal processing module 202.
  • the digital signal processing module 202 is configured to determine the first uplink radio frequency index of the first period 1011 according to the second test signal.
  • the first uplink radio frequency indicator includes first phase information.
  • the spectrum analyzer 204 in the analysis and processing module 20 will also analyze and process the second test signal.
  • the spectrum analyzer 204 is used to obtain the second test signal from the mixing unit 201, and determine the second uplink radio frequency index of the first array 1011 according to the second test signal.
  • the second uplink radio frequency indicator includes first amplitude information.
  • both the first phase information in the first uplink radio frequency index and the first amplitude information in the second uplink radio frequency index described above can be transmitted to the control device 203 and saved and backed up.
  • the first amplitude information and the first phase information will also be transmitted to the digital signal processing module 202 for storage, for later use when determining the uplink synthetic radio frequency index.
  • the antenna test system will also test the uplink radio frequency indicators for another pair of periods. After the antenna test system has tested the uplink radio frequency indicators of all elements in the tested array antenna 101, the digital signal processing module 202 can determine the first amplitude information and the first amplitude information of each element in the tested array antenna 101. Phase information. At this time, the digital signal processing module 202 is also used to determine the uplink synthesis radio frequency index according to the first amplitude information and the first phase information of each element in the tested array antenna 101.
  • c n is the index of a single RF time around; C for the synthesis of radio frequency index throughout the test array antenna; A n represents a first time around the respective amplitude information; ⁇ n represents the feed between the measured time around each array antenna Electrical phase difference, that is, the phase difference between the two elements in the tested array antenna; ⁇ n represents the direction vector, that is, the rotation tool 303 adjusts the direction when the angle between the tested array antenna 101 and the test array antenna 102 is ⁇ n Vector.
  • the test array antenna 102 can be kept stationary, and the tested array antenna 101 can be rotated clockwise around point A by ⁇ n ; or, as shown in Fig. 3C, the tested array antenna 101 can be kept stationary And, rotating the test array antenna 102 counterclockwise around point B by ⁇ n , which is not specifically limited here.
  • the antenna test system first separately tests the uplink radio frequency index of each element in the tested array antenna, and then determines the uplink synthesized radio frequency index according to the uplink radio frequency index of each element. Because, when testing the uplink radio frequency index of a single element, the installation distance between the test array antenna and the tested array antenna is relatively short. Therefore, when the element in the test array antenna sends a test signal to the element in the tested array antenna, the test signal is not easy to leak from the distance gap between the test array antenna and the tested array antenna, and no additional configuration is required.
  • a microwave anechoic chamber used to prevent leakage of test signals. Since the entire test process does not need to be carried out in a microwave anechoic chamber, the impact of the test site on the array antenna test is reduced, thereby increasing the flexibility of the array antenna test.
  • Fig. 2B it is a structure diagram of the antenna test system for testing the downlink radio frequency index.
  • the tested array antenna 101, the test array antenna 102, and the analysis and processing module 20 are similar to those described above, and the details are not repeated here. However, there are some differences in the internal structure of the analysis and processing module 20.
  • the analysis and processing module 20 includes a mixing unit 201, a digital signal processing module 202, a control device 203, and a signal source 205.
  • control device 203 is used to control the signal source 205 to generate a fourth test signal; the signal source 205 is used to generate the fourth test signal and transmit the fourth test signal to the mixing unit 201. Then, the mixing unit 201 performs up-frequency processing on the fourth test signal to obtain the third test signal, and transmits the third test signal to the second element 1021 of the test array antenna 102. At this time, the test array antenna 102 can send a third test signal to the first element 1011 through the second element 1021. Therefore, the tested array antenna 101 can receive the third test signal sent by the second element 1021 through the first element 1011. Then, the digital signal processing module 202 is configured to determine the first downlink radio frequency index of the first element 1011 according to the third test signal sent by the second element 1021 in the test antenna 102, and the first downlink radio frequency index includes The second amplitude information.
  • the digital signal processing module 202 may check the first downlink radio frequency index, and when the first downlink radio frequency index is greater than a first preset error value, determine that the first period 1011 is unqualified. And, the detection result is fed back to the control device 203. At this time, the operation and maintenance personnel can replace the entire array antenna 101 under test.
  • the operation and maintenance personnel can also replace the entire tested module.
  • the details depend on the application scenarios and test requirements, and the details are not limited here.
  • the digital signal processing module 202 is also used to determine that the first element 1011 is a qualified element when the first downlink radio frequency index is less than or equal to the first preset error value, and the entire downlink test path Is qualified. Because the first downlink radio frequency index obtained by using the fourth test signal generated by the signal source 205 for testing does not contain information related to phase difference. Therefore, the digital signal processing module 202 is also used to generate a fifth test signal, the fifth test signal containing information related to the phase difference, and to transmit the fifth test signal to the mixing unit 201. At this time, the mixing unit 201 is also used to up-convert the fifth test signal to obtain a sixth test signal, and transmit the sixth test signal to the second element 1021 of the test array antenna 102 . Therefore, the test array antenna 102 is also used to send a sixth test signal to the first element 1011 through the second element 1021. The tested array antenna 101 is also used to receive the sixth test signal sent by the second element 1021 through the first element 1011.
  • the antenna test system also includes service channels.
  • the service channel is used to perform frequency reduction processing on the sixth test signal received by the first element 101 in the tested array antenna 101 to obtain the seventh test signal, and transmit the seventh test signal to the digital signal Processing module 202. Then, the digital signal processing module 202 determines the second downlink radio frequency index of the first period 101 according to the seventh test signal, and the second downlink radio frequency index includes second phase information.
  • the antenna test system will also test the downlink radio frequency indicators for another pair of periods.
  • the digital signal processing module 202 is also used to calculate the second amplitude of each element in the tested array antenna 101
  • the information and the second phase information determine the downlink synthesized radio frequency index.
  • the manner of determining the downlink synthetic radio frequency index by the multiple downlink radio frequency indexes is similar to the manner of the uplink synthetic radio frequency index determined above, and the details are not repeated here.
  • the first preset error value in this embodiment may be calculated by the antenna test system according to historical test rules, or may be set by operation and maintenance personnel based on test experience, and the specifics are not limited here.
  • the antenna test system first separately tests the downlink radio frequency index of each element in the tested array antenna, and then determines the downlink synthesized radio frequency index according to the downlink radio frequency index of each element. Because, when testing the downlink radio frequency index of a single element, the installation distance between the test array antenna and the tested array antenna is relatively short. Therefore, when the element in the test array antenna sends a test signal to the element in the tested array antenna, the test signal is not easy to leak from the distance gap between the test array antenna and the tested array antenna, and no additional configuration is required.
  • a microwave anechoic chamber used to prevent leakage of test signals. Since the entire test process does not need to be carried out in a microwave anechoic chamber, the impact of the test site on the array antenna test is reduced, thereby increasing the flexibility of the array antenna test.
  • the antenna test system does not only measure the uplink radio frequency index or the downlink radio frequency index. In most cases, it is necessary to test the two radio frequency indexes of the tested array antenna. Therefore, the structure shown in FIG. 2A and the structure shown in FIG. 2B can be combined into one body. Please refer to FIG. 3A for details.
  • FIG. 3A it is a more detailed structural diagram of the antenna test system, which includes: the mixer unit 201, the digital signal processing module 202, the control device 203, the spectrum analyzer 204, the signal source 205, etc., which have been introduced above , As the previous article has been introduced in detail, the specific details will not be repeated here.
  • the antenna test system also includes a first array control switch 311 and a second array control switch 312, wherein the first array control switch 311 is used to control the opening or closing of each element in the tested array antenna 101,
  • the second array control switch 312 is used to control the opening or closing of each element in the test array antenna 102.
  • the first array control switch 311 can control the first element 1011 to be in an on state. Since the antenna test system proposed in the embodiment of the present application tests paired elements, at this time, the second array control switch 312 also needs to control the second element 1021 to be in an on state.
  • the first array control switch 311 controls the first element 1011 to be in an on state
  • the second array control switch 312 controls the second array antenna. For a while 1021 was in the on state.
  • the antenna testing system has detected that one of the array antennas under test is unqualified, only one element of the pair of elements may be in the closed state or both elements are in the closed state.
  • the first array control switch 311 controls the third element 1012 to be in the off state
  • the second array control switch 312 can also be controlled to correspond to the third element 1012 1022 is closed for the fourth time.
  • the opening or closing of the elements in the tested array antenna 101 and the test array antenna 102 may be determined according to specific application scenarios, which is not specifically limited here.
  • first array control switch 311 and the second array control switch 312 in this embodiment can both be controlled by the control device 203.
  • the control device 203 sends instructions to the first array control switch 311 or the second array control switch 312 to control the opening and closing of each element in the tested array antenna 101 or the test array antenna 102.
  • the first array control switch 311 and the second array control switch 312 may also be operated only by operation and maintenance personnel, which can reduce the workload of the control device 203. In actual applications, there may be differences due to specific application conditions, which are not limited here.
  • the antenna test system further includes a first external interface 321 and a second external interface 322.
  • the second external interface 322 is connected to the test array antenna 102, and the second external interface 322 is also connected to the control device 203 and
  • the mixing unit 201 is connected to realize the data or signal exchange between the control device 203 and the test array antenna 102 and the data or signal exchange between the mixing unit 201 and the test array antenna 102.
  • the first external interface 321 is respectively connected to the digital signal processing module 202, the tested array antenna 101, the control device 203, and the mixing unit 201 to realize the data or signal exchange between the control device 203 and the digital signal processing module 202 , And the data or signal exchange between the mixing unit 201 and the digital signal processing module 202.
  • the service channel is used to implement data transmission between the digital signal processing module 202 and the tested array antenna 101.
  • the service channel can be used for frequency reduction processing. For example, when the first element 101 of the tested array antenna 101 receives the test signal sent by the test array antenna 102, since the test signal is a high-frequency signal, It is necessary to perform frequency reduction processing on the high-frequency signal, so that the digital signal processing module 202 performs analysis and other processing on the signal after the frequency reduction processing.
  • the antenna test system in this embodiment further includes: a lower tooling board 301, an upper tooling board 302 And rotating tooling 303.
  • the upper tooling board 302 is used to install the test array antenna 102;
  • the lower tooling board 301 is used to install the tested array antenna 101 and the digital signal processing module 202.
  • the lower tooling plate 301 and the upper tooling plate 302 are respectively equipped with a horizontal axis and a vertical axis.
  • the lower tooling plate 301 and the upper tooling plate 302 can be rotated around the horizontal axis and the vertical axis to adjust the test array.
  • the rotating tooling 303 is used to adjust the first phase difference by adjusting the angle between the test array antenna 102 and the tested array antenna 101, and the first phase difference is between each element in the tested array antenna The phase difference.
  • the rotating tooling 303 is also used to adjust the distance between the lower tooling plate 301 and the upper tooling plate 302, and the distance between the tested array antenna 101 and the test array antenna 102 has been adjusted.
  • the distance includes vertical distance or Horizontal distance.
  • the vertical distance refers to the transmission distance of the test signal between the element in the tested array antenna 101 and the element in the test array antenna 102.
  • the adjustment of the horizontal distance can ensure that the elements in the tested array antenna 101 and the elements in the test array antenna 102 can correspond one-to-one.
  • the antenna test system first separately tests the downlink radio frequency index of each element in the tested array antenna, and then determines the downlink synthesized radio frequency index according to the downlink radio frequency index of each element. Because, when testing the downlink radio frequency index of a single element, the installation distance between the test array antenna and the tested array antenna is relatively short. Therefore, when the element in the test array antenna sends a test signal to the element in the tested array antenna, the test signal is not easy to leak from the distance gap between the test array antenna and the tested array antenna, and no additional configuration is required.
  • a microwave anechoic chamber used to prevent leakage of test signals. Since the entire test process does not need to be carried out in a microwave anechoic chamber, the impact of the test site on the array antenna test is reduced, thereby increasing the flexibility of the array antenna test.
  • the steps performed by the antenna test system include:
  • the antenna test system respectively calibrates the test components related to each element in the tested array antenna
  • the antenna test system when the antenna test system is ready to test the array antenna under test, in order to ensure the accuracy of the test result, the antenna test system will separately perform a test on the test components associated with each element of the tested array antenna. Perform calibration.
  • the test component includes a tooling board, a mixing unit or a reference channel.
  • the tooling board refers to the upper tooling board 302 or the lower tooling board 301 described above.
  • the calibration of the tooling board is to ensure that each element in the tested array antenna 101 can correspond to each element in the test array antenna 102 one-to-one, for example, adjusting the first element 1011 to correspond to the second element 1021.
  • the amplitude and phase response of each element of the test array antenna 102 at the test frequency point are examples of the calibration of the tooling board.
  • a vector network analyzer can be used to test the path with other devices.
  • the reference path will be calibrated, where the reference path includes a transmitting reference path and a receiving reference path.
  • the two reference paths need to be calibrated separately: when the transmit reference path is calibrated, the digital signal processing module 202 sends a test signal, which is output to the mixing unit 201 via the first external interface 321 Then, the mixing unit 201 transmits the test signal to the spectrum analyzer 204 for testing, and then obtains the calibration data of the emission reference channel.
  • the signal source 205 will send a test signal and transmit it to the mixing unit 201, and then enter the digital signal processing module 202 through the first external interface 321 to obtain the calibration data of the receiving reference channel.
  • the antenna testing system adjusts the phase difference between the elements in the tested array antenna and the elements in the test array antenna;
  • the phase difference between each element in the tested array antenna can also be adjusted.
  • the phase difference between the first element 1011 of the tested array antenna 101 and the third element 1012 of the tested array antenna 101 is 0, that is, the tested array antenna 101 and the test array antenna 102 presents a 0 degree positive relationship. Therefore, the radio frequency index when the directivity angle of the tested array antenna 101 is 0 degrees can be tested.
  • the antenna test system can also test the array antenna 101 under test under other directivity angles. At this time, the antenna testing system can adjust the angle between the lower tooling plate 301 and the upper tooling plate 302 to adjust the phase difference between the various elements in the tested array antenna. The specifics have been introduced in detail in the previous article, and the details are not repeated here.
  • the antenna test system separately tests the radio frequency index of each element in the tested array antenna
  • the radio frequency index for this period is divided into an uplink radio frequency index and a downlink radio frequency index, the following two situations will be introduced separately.
  • the antenna test system when detecting the uplink radio frequency index, can determine the first phase information in the first uplink radio frequency index through the digital signal processing module 202, and determine the first phase information in the second uplink radio frequency index through the spectrum analyzer 204 The first amplitude information. Then, the first amplitude information in the first uplink radio frequency index and the first phase information in the second uplink radio frequency index are saved and backed up for later use when determining the uplink synthetic radio frequency index. Specifically, since the foregoing has been introduced in detail, the details are not repeated here.
  • the uplink radio frequency index may be transmit power (tx power), adjacent channel leakage ratio (ACLR/ACPR), modulation error vector EVM, etc., which are not specifically limited here.
  • the adjacent channel leakage ratio can measure the out-of-band radiation characteristics of the transmitter, and specifically refers to the ratio of adjacent channel power to main channel power.
  • the antenna test system will also test the uplink radio frequency indicators for another pair of periods.
  • the antenna test system and the antenna test system may use the fourth test signal generated by the signal source 205 for testing to obtain the first downlink radio frequency index of the first element 1011.
  • a downlink radio frequency index includes second amplitude information.
  • the antenna test system will also use the fifth test signal generated by the digital information processing module 202 for testing to obtain the second downlink radio frequency index of the first array 1011, and the second downlink radio frequency index includes second phase information. Then, the antenna test system saves and backs up the second amplitude information in the first downlink radio frequency index and the second phase information in the second downlink radio frequency index for later use when determining the downlink synthesized radio frequency index.
  • the downlink radio frequency index may receive sensitivity (rx sensitivity), which is not specifically limited here.
  • the antenna test system will also test the downlink radio frequency indicators for another pair of periods.
  • the antenna testing system determines the synthesized radio frequency index of the tested array antenna according to the radio frequency index of each element.
  • the antenna test system can perform the test according to the uplink radio frequency index of each element in the tested array antenna 101.
  • the first amplitude information and the first phase information in determine the uplink synthesized radio frequency index.
  • the antenna test system can be based on the downlink radio frequency index of each element in the tested array antenna 101.
  • the second amplitude information and the second phase information determine the downlink synthesized radio frequency index.
  • the manner of determining the downlink synthesized radio frequency index by the multiple downlink radio frequency indexes is similar to the foregoing, and the details are not repeated here.
  • the antenna test system first separately tests the downlink radio frequency index of each element in the tested array antenna, and then determines the downlink synthesized radio frequency index according to the downlink radio frequency index of each element. Because, when testing the downlink radio frequency index of a single element, the installation distance between the test array antenna and the tested array antenna is relatively short. Therefore, when the element in the test array antenna sends a test signal to the element in the tested array antenna, the test signal is not easy to leak from the distance gap between the test array antenna and the tested array antenna, and no additional configuration is required.
  • a microwave anechoic chamber used to prevent leakage of test signals. Since the entire test process does not need to be carried out in a microwave anechoic chamber, the impact of the test site on the array antenna test is reduced, thereby increasing the flexibility of the array antenna test.

Abstract

本申请实施例公开了一种天线测试系统以及阵列天线测试方法，用于提升阵列天线测试的灵活性。本申请实施例中的天线测试系统包括：测试阵列天线、被测阵列天线以及分析处理模块；被测阵列天线包括N个第一阵子，测试阵列天线包括N个第二阵子，N个第一阵子与N个第二阵子一一对应，N为大于1的整数；被测阵列天线，用于通过第一阵子向第二阵子发送第一测试信号；测试阵列天线，用于通过第二阵子接收第一阵子发送的第一测试信号；分析处理模块，用于根据第一测试信号确定第一阵子的上行射频指标；分析处理模块，还用于根据被测阵列天线中的每一个阵子的上行射频指标确定被测阵列天线的上行合成射频指标。

Description

一种天线测试系统以及阵列天线测试方法 技术领域
本申请实施例涉及天线测试领域，尤其涉及一种天线测试系统以及阵列天线测试方法。
背景技术
天线是一种变换器，通过天线可以把传输线上传播的导行波变换成在无界媒介中传播的电磁波，或者进行相反的变换。该天线常应用于无线电通信、广播、雷达、导航以及射电天文等领域。但是，单一天线的方向性是有限的，为适合各种场合的应用，将工作在同一频率的两个或两个以上的单个天线，按照一定的要求进行馈电和空间排列构成天线阵列，也叫天线阵或阵列天线。构成阵列天线的天线辐射单元称为阵元，也称阵子。此时，为了保证阵列天线的性能，运维人员需要对该阵列天线的相关性能参数进行检测。
传统的阵列天线测试方法主要为空间测试技术(over the air，OTA)，即通过电磁波空间传输的远场测试方法实现空口性能指标测试。具体地，在特定的微波暗室中，控制待测阵列天线中所有的阵子一起发送测试信号，然后，由信号接收装置接收该测试信号，并对该测试信号进行分析以确定该阵列天线的性能。
在这样的方案中，由于待测阵列天线和信号接收装置之间的距离相隔较远，为了避免测试信号泄露，需要在一个较大的微波暗室中进行测试。由于，搭建微波暗室的成本较高，并且易受测试场地的影响，因此，降低了阵列天线测试的灵活性。
发明内容
本申请实施例提供了一种天线测试系统以及阵列天线测试方法，用于在无需微波暗室的情况下对阵列天线进行测试，从而降低测试场地对阵列天线测试的影响，进而提升阵列天线测试的灵活性。
第一方面，本申请实施例提供了一种天线测试系统，包括：测试阵列天线、被测阵列天线以及分析处理模块；该被测阵列天线包括N个第一阵子，该测试阵列天线包括N个第二阵子，该N个第一阵子与该N个第二阵子一一对应，该N为大于1的整数；该被测阵列天线，用于通过该第一阵子向该第二阵子发送第一测试信号；该测试阵列天线，用于通过该第二阵子接收该第一阵子发送的第一测试信号；该分析处理模块，用于根据该第一测试信号确定该第一阵子的上行射频指标；该分析处理模块，还用于根据该被测阵列天线中的每一个阵子的上行射频指标确定被测阵列天线的上行合成射频指标。
本申请实施例中，天线测试系统先分别测试被测阵列天线中的每一个阵子的上行射频指标，然后，再根据每一个阵子的上行射频指标确定上行合成射频指标。由于，对单个阵子的上行射频指标进行测试时，测试阵列天线和被测阵列天线之间的安装距离较短。因此，当测试阵列天线中的阵子在向被测阵列天线中的阵子发送测试信号时，该测试信号不容易从测试阵列天线和被测阵列天线中的距离空隙中泄露，进而不需要额外地配置用于防止测试信号泄露的微波暗室。由于，整个测试过程不需要在微波暗室中进行，因此，降低了测 试场地对阵列天线测试的影响，进而提升了阵列天线测试的灵活性。
根据第一方面，本申请实施例第一方面的第一种实施方式中，该分析处理模块包括：数字信号处理模块、控制装置和混频单元；该控制装置，用于控制该被测阵列天线中的第一阵子向该测试阵列天线中的第二阵子发送第一测试信号；该混频单元，用于将该测试阵列天线中的第二阵子接收到的第一测试信号进行降频处理，得到第二测试信号，并且，将该第二测试信号传输至该数字信号处理模块；该数字信号处理模块，用于根据该第二测试信号确定该第一阵子的第一上行射频指标，该第一上行射频指标包括第一相位信息。
本实施方式中，明确了该天线测试系统中的分析处理模块的内部结构，该分析处理模块包括数字信号处理模块、控制装置和混频单元。其中，该混频单元可以将第一测试信号进行降频处理得到第二测试信号。然后，由该数字信号处理模块根据该第二测试信号确定第一上行射频指标以及第一相位信息。以便于后续根据第一相位信息以及其他信息确定上行合成射频指标。因此，增强了方案的可行性。
根据第一方面的第一种实施方式，本申请实施例第一方面的第二种实施方式中，该分析处理模块还包括频谱仪；该频谱仪，用于从混频单元获取该第二测试信号，并且，根据该第二测试信号确定该第一阵子的第二上行射频指标，该第二上行射频指标包括第一幅值信息；该数字信号处理模块，还用于根据该被测阵列天线中的每一个阵子的第一幅值信息和第一相位信息确定上行合成射频指标。
本实施方式中，由于该天线测试系统中的频谱仪还可以根据该第二测试信号确定第二上行射频指标以及第一幅值信息。由于，由频谱仪确定的幅值信息是准确的，由数字信号处理模块确定的相位信息也是准确的。当该天线测试系统确定该被测阵列天线中的每一个阵子的第一幅值信息和第一相位信息之后，该天线测试系统确定上行合成射频指标也是准确的。因此，可以提高天线测试系统的准确性。
根据第一方面、第一方面的第一种实施方式或第一方面的第二种实施方式，本申请实施例第一方面的第三种实施方式中，该天线测试系统还包括上工装板、下工装板和旋转工装；该上工装板，用于安装测试阵列天线；该下工装板，用于安装被测阵列天线和数字信号处理模块；该旋转工装，用于通过调整该测试阵列天线与该被测阵列天线之间的角度以调整第一相位差，该第一相位差为该被测阵列天线中的各个阵子之间的相位差。
本实施例中，明确了被测阵列天线和测试阵列天线的分布位置。其中，该被测阵列天线位于下工装板上，该测试阵列天线位于上工装板上。并且，两个工装板可以相对转动以调整相位差。于是该天线测试系统即使在测单个阵子的射频指标时，也可以对相位差进行调整，于是可以对不同相位的阵子进行测试。因此，该方案在保证可以对单个阵子进行测试的同时又扩大该天线测试系统的检测范围。
第二方面，本申请实施例提供了一种天线测试系统，包括：测试阵列天线、被测阵列天线以及分析处理模块；该被测阵列天线包括N个第一阵子，该测试阵列天线包括N个第二阵子，该N个第一阵子与该N个第二阵子一一对应，该N为大于1的整数；该测试阵列天线，用于通过该第二阵子向该第一阵子发送第三测试信号；该被测阵列天线，用于通过该第一阵子接收该第二阵子发送的第三测试信号；该分析处理模块，用于根据该第三测试 信号确定该第一阵子的下行射频指标；该分析处理模块，还用于根据该被测阵列天线中的每一个阵子的下行射频指标确定被测阵列天线的下行合成射频指标。
本申请实施例中，天线测试系统先分别测试被测阵列天线中的每一个阵子的下行射频指标，然后，再根据每一个阵子的下行射频指标确定下行合成射频指标。由于，对单个阵子的下行射频指标进行测试时，测试阵列天线和被测阵列天线之间的安装距离较短。因此，当测试阵列天线中的阵子在向被测阵列天线中的阵子发送测试信号时，该测试信号不容易从测试阵列天线和被测阵列天线中的距离空隙中泄露，进而不需要额外地配置用于防止测试信号泄露的微波暗室。由于，整个测试过程不需要在微波暗室中进行，因此，降低了测试场地对阵列天线测试的影响，进而提升了阵列天线测试的灵活性。
根据第二方面，本申请实施例第二方面的第一种实施方式中，该分析处理模块包括：数字信号处理模块、控制装置、混频单元和信号源；该控制装置，用于控制该信号源产生第四测试信号；该混频单元，用于对该信号源中的该第四测试信号进行升频处理，得到该第三测试信号，并且，将该第三测试信号传送至该测试阵列天线中的第二阵子；该数字信号处理模块，用于根据该测试天线中的第二阵子发送的第三测试信号确定该第一阵子的第一下行射频指标，该第一下行射频指标包括第二幅值信息；该数字信号处理模块，还用于当该第一下行射频指标大于第一预设误差值时，确定该第一阵子为不合格的阵子，并且，向该控制装置反馈检测结果。
本实施方中，明确了天线测试系统在对下行射频指标进行测试时的内部结构，此时，该分析处理模块包括：数字信号处理模块、控制装置、混频单元和信号源。此时，可以确定该第一阵子的第一下行射频指标，该第一下行射频指标包括第二幅值信息。由于，由信号源产生的测试信号进行检测所得的第二幅值信息是准确的，于是，可以提高后续确定下行合成射频指标的准确性。
根据第二方面的第一种实施方式，本申请实施例第二方面的第二种实施方式中，该数字信号处理模块，还用于当该第一下行射频指标小于或等于该第一预设误差值时，生成第五测试信号，并且，将该第五测试信号传输至该混频单元。
本实施例中，该天线测试系统还将对该第一下行射频指标与第一预设误差进行比对，当该第一下行射频指标小于或等于该第一预设误差值时，确定该第一下行射频指标是准确的。于是，确定该被测阵子和该被测通路是合格的。因此，可以保证后续检测的准确性。
根据第二方面的第二种实施方式，本申请实施例第一方面的第三种实施方式中，该混频单元，还用于对该第五测试信号进行升频处理，得到第六测试信号，并且，将该第六测试信号传送至该测试阵列天线中的第二阵子；该天线测试系统还包括业务通道；该业务通道，用于将该被测阵列天线中的第一阵子接收到的来自第二阵子的该第六测试信号进行降频处理，得到第七测试信号；该数字信号处理模块，还用于根据该第七测试信号确定该第一阵子的第二下行射频指标，该第二下行射频指标包括第二相位信息；该数字信号处理模块，还用于根据该被测阵列天线中的每一个阵子的第二幅值信息和第二相位信息确定下行合成射频指标。
本实施方式中，该天线测试系统除了确定第一下行射频指标和第二幅值信息之外，还 可以确定第二下行射频指标，该第二下行射频指标包括第二相位信息。于是，该天线测试系统可以通过各个阵子的第二幅值信息和第二相位信息确定下行合成射频指标。也就是说，该天线测试系统不仅可以确定下行合成射频指标还可以确定上行合成射频指标。因此，增强了方案的实现灵活性。
第三方面，本申请实施例提供了一种阵列天线测试方法，包括：天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标；该天线测试系统根据该每一个阵子的射频指标确定该被测阵列天线的合成射频指标。
本申请实施例中，天线测试系统先分别测试被测阵列天线中的每一个阵子的射频指标，然后，再根据每一个阵子的射频指标确定合成射频指标。由于，对单个阵子的射频指标进行测试时，测试阵列天线和被测阵列天线之间的安装距离较短。因此，当测试阵列天线中的阵子在向被测阵列天线中的阵子发送测试信号时，该测试信号不容易从测试阵列天线和被测阵列天线中的距离空隙中泄露，进而不需要额外地配置用于防止测试信号泄露的微波暗室。由于，整个测试过程不需要在微波暗室中进行，因此，降低了测试场地对阵列天线测试的影响，进而提升了阵列天线测试的灵活性。
根据第三方面，本申请实施例第三方面的第一种实施方式中，该射频指标包括上行射频指标；该天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标包括：天线测试系统控制被测阵列天线中的第一阵子向测试阵列天线中的第二阵子发送第一测试信号，该第一阵子与该第二阵子对应；该天线测试系统根据该第一测试信号确定该第一阵子的上行射频指标。
本实施方式中，进一步明确了该天线测试系统在测试上行射频指标时的步骤。该天线测试系统可以通过第一阵子与第二阵子之间的第一测试信号确定该第一阵子的上行射频指标。
根据第三方面的第一种实施方式，本申请实施例第三方面的第二种实施方式中，该天线测试系统根据该第一测试信号确定该第一阵子的上行射频指标包括：该天线测试系统中的频谱仪根据该第一测试信号确定该第一阵子的第一上行射频指标，该第一上行射频指标包括第一幅值信息；该天线测试系统中的数字信号处理模块根据该第一测试信号确定该第一阵子的第二上行射频指标，该第二上行射频指标包括第一相位信息。
本实施方式中，进一步明确了确定第一幅值信息和第一相位信息等上行射频指标的方式。该天线测试系统可以分别确定第一上行射频指标和第二上行射频指标，其中，该第一上行射频指标包括第一幅值信息，该第二上行射频指标包括第一相位信息。
根据第三方面，本申请实施例第三方面的第三种实施方式中，该天线测试系统根据该每一个阵子的射频指标确定该被测阵列天线的合成射频指标包括：该天线测试系统根据每一个阵子的第一幅值信息和第一相位信息确定该被测阵列天线的上行合成射频指标。
本实施方式中，明确了确定上行合成射频指标的方式，可以前述获得的第一幅值信息和第一相位信息根据一定的公式确定该被测阵列天线的上行合成射频指标。因此，可以提高方案的可行性。
根据第三方面，本申请实施例第三方面的第四种实施方式中，该射频指标包括下行射 频指标；该天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标包括：该天线测试系统控制测试阵列天线中的第二阵子向被测阵列天线中的第一阵子发送第三测试信号，该第一阵子与该第二阵子对应；该天线测试系统根据该第三测试信号确定该第一阵子的下行射频指标。
本实施方式中，进一步明确了该天线测试系统在测试下行射频指标时的步骤。该天线测试系统可以通过第一阵子与第二阵子之间的第三测试信号确定该第一阵子的下行射频指标。
根据第三方面的第四种实施方式，本申请实施例第三方面的第五种实施方式中，该天线测试系统根据该第三测试信号确定该第一阵子的下行射频指标包括：该天线测试系统采用信号源产生的第四测试信号进行测试，得到该第一阵子的第一下行射频指标，该第一下行射频指标包括第二幅值信息；该天线测试系统采用数字信息处理模块产生的第五测试信号进行测试，得到该第一阵子的第二下行射频指标，该第二下行射频指标包括第二相位信息。
本实施方式中，进一步明确了确定第二幅值信息和第二相位信息等下行射频指标的方式。该天线测试系统可以分别确定第一下行射频指标和第二下行射频指标，其中，该第一下行射频指标包括第二幅值信息，该第二下行射频指标包括第二相位信息。因此，可以增加方案的可行性。
根据第三方面的第五种实施方式，本申请实施例第三方面的第六种实施方式中，该天线测试系统根据该每一个阵子的射频指标确定该被测阵列天线的合成射频指标包括：该天线测试系统根据每一个阵子的第二幅值信息和第二相位信息确定该被测阵列天线的下行合成射频指标。
本实施方式中，明确了确定下行合成射频指标的方式，可以前述获得的第二幅值信息和第二相位信息根据一定的公式确定该被测阵列天线的下行合成射频指标。因此，可以提高方案的可行性。
根据第三方面、第三方面的第一种实施方式至第三方面的第六种实施方式，本申请实施例第三方面的第七种实施方式中，该天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标之前，该方法还包括：该天线测试系统分别对与被测阵列天线中的每一个阵子相关的测试部件的进行校准，该测试部件包括工装板、混频单元或参考通道。
本实施方式中，该天线测试系统在进行测试之前还将进行校准，例如，对工装板、混频单元或参考通道进行校准。因此，可以提高天线测试的准确性。
根据第三方面、第三方面的第一种实施方式至第三方面的第六种实施方式，本申请实施例第三方面的第八种实施方式中，该天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标之前，该方法还包括：该天线测试系统调整该被测阵列天线中的各个阵子之间的相位差。
本实施方式中，若需要测试不同指向角下的射频指标，该该天线测试系统可以在测试之前调整被测阵列天线中的各个阵子之间的相位差。因此，本实施方式在保证可以对单个阵子进行测试的同时又可以在检测不同相位差下的各个阵子的射频指标。因此，增加了方 案的灵活性。
根据第三方面的第八种实施方式，本申请实施例第三方面的第九种实施方式中，该天线测试系统调整该第一阵子与该第二阵子之间的相位差包括：该天线测试系统通过调整该第一阵子所在的下工装板与该第二阵子所在的上工装板之间的角度，调整该被测阵列天线中的各个阵子之间的相位差。
本实施方式中，进一步明确了调整相位差的方式。具体地，可以通过调整下工装板与该上工装板之间的角度，调整该被测阵列天线中的各个阵子之间的相位差。在这样的实施方式中，可以在对单个阵子进行测试时也能调整出相位差。因此，可以适当扩大测试范围，增加阵列天线测试的灵活性。
从以上技术方案可以看出，本申请实施例具有以下优点：
本申请实施例中，天线测试系统先分别测试被测阵列天线中的每一个阵子的射频指标，然后，再根据每一个阵子的射频指标确定合成射频指标。由于，对单个阵子的射频指标进行测试时，测试阵列天线和被测阵列天线之间的安装距离较短。因此，当测试阵列天线中的阵子在向被测阵列天线中的阵子发送测试信号时，该测试信号不容易从测试阵列天线和被测阵列天线中的距离空隙中泄露，进而不需要额外地配置用于防止测试信号泄露的微波暗室。由于，整个测试过程不需要在微波暗室中进行，因此，降低了测试场地对阵列天线测试的影响，进而提升了阵列天线测试的灵活性。
附图说明
为了更清楚地说明本申请实施例的技术方案，下面将对实施例描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施例。
图1为本申请实施例中天线测试系统的一个实施例示意图；
图2A为本申请实施例中天线测试系统的另一个实施例示意图；
图2B为本申请实施例中天线测试系统的另一个实施例示意图；
图3A为本申请实施例中天线测试系统的另一个实施例示意图；
图3B为本申请实施例中天线测试系统的另一个实施例示意图；
图3C为本申请实施例中天线测试系统的另一个实施例示意图；
图4为本申请实施例中阵列天线测试方法的一个实施例示意图。
具体实施方式
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。
本申请的说明书和权利要求书及上述附图中的术语“第一”、“第二”、“第三”、“第四”等(如果存在)是用于区别类似的对象，而不必用于描述特定的顺序或先后次序。应该理解这样使用的数据在适当情况下可以互换，以便这里描述的实施例能够以除了在这里图示或描述的内容以外的顺序实施。此外，术语“包括”和“具有”以及他们的任何变形，意图在于覆盖不排他的包含，例如，包含了一系列步骤或单元的过程、方法、系统、产品或 设备不必限于清楚地列出的那些步骤或单元，而是可包括没有清楚地列出的或对于这些过程、方法、产品或设备固有的其它步骤或单元。
本申请实施例提供了一种天线测试系统以及阵列天线测试方法，用于在无需微波暗室的情况下对阵列天线进行测试，从而降低测试场地对阵列天线测试的影响，进而提升阵列天线测试的灵活性。
为便于理解，下面先对本申请实施例涉及的一些术语进行介绍：
天线：指将高频电流或波导形式的能量变换成电磁波并向规定方向发射出去或把来自一定方向的电磁波还原为高频电流的装置。天线有多种形式，本申请实施例中，主要介绍的是阵列天线，该阵列天线中包括多个阵子。
阵列天线：将工作在同一频率的两个或两个以上的单个天线，按照一定的要求进行馈电和空间排列构成天线阵列，也叫天线阵或天线阵列。构成阵列天线的天线辐射单元称为阵元，也称阵子。
上行射频指标：本申请实施例中，被测阵列天线中的某一个阵子向测试阵列天线中对应的阵子发射信号的射频指标。例如，发射功率(tx power)、临道泄露比(ACLR/ACPR)以及调制误差矢量(error vector magnitude，EVM)等，具体此处不做限定。
下行射频指标：本申请实施例中，测试阵列天线中的某一个阵子向被测阵列天线中对应的阵子发射信号的射频指标。例如，接收灵敏度(rx sensitivity)，具体此处不做限定。
相邻频道泄漏比(adjacent channel leakage ratio，ACLR)：是用来衡量规定使用传输频道以外，传输RF能量的一个指标由输出功率放大器产生，由于会发生干扰并且破坏规定的需求，因此必须准确加以测量。ACLR在第二代移动电话的应用中称为ACPR。
误差向量幅度(error vector magnitude，EVM)：也称调制误差矢量，是在一个给定时刻理想无误差基准信号与实际发射信号的向量差，能全面衡量调制信号的幅度误差和相位误差。一般，该调制误差矢量包括幅值的矢量和相位的矢量。
下面对本申请实施例所适应的应用场景进行介绍：
5G通信技术的发展需要超高的数据传输速率以及大量多入多出技术(massive multiple-input multiple-output，MIMO)等关键技术的高效利用，此时，要求5G通信技术中所涉及的通信设备收发信息的性能更加高效可靠。于是，需要对天线进行精准高效的测试。对此，本申请实施例所提出的阵列天线测试系统以及天线测试方法便可以应用于此场景。具体地，本申请实施例所提出的阵列天线测试系统以及天线测试方法可以在无需暗室的情况下进行远场测试，进而获得阵列天线的相关指标。
应当理解的是，本申请实施例所提出的阵列天线测试系统以及天线测试方法除了可以应用于5G阵列天线测测试以外，还可以应用于其他阵列天线的测试，具体此处不做限定。
为便于更好地理解本申请实施例所提出的方案，下面对本实施例中阵列天线测试系统的结构进行详细的介绍。如图1所示，该列天线测试系统包括被测阵列天线101、测试阵列天线102以及分析处理模块20，其中，该被测阵列天线101包括N个第一阵子1011，该 测试阵列天线102包括N个第二阵子1021，该N个第一阵子1011与该N个第二阵子1021一一对应。其中，N为大于1的整数。此外，该分析处理模块20与被测阵列天线101相连，该分析处理模块20也与测试阵列天线102相连。
应当注意的是，本实施例中的阵列天线测试系统可以测单个阵子的上行射频指标，也可以测单个阵子的下行射频指标。下面分别对这两种测试情况进行介绍：
首先，当该天线测试系统用于测试上行射频指标时，该被测阵列天线101，用于通过该第一阵子1011向该第二阵子1021发送第一测试信号；该测试阵列天线102，用于通过该第二阵子1021接收该第一阵子1011发送的第一测试信号。此时，该分析处理模块20，用于根据该第一测试信号确定该第一阵子1011的上行射频指标。然后，该天线测试系统将对另外一对阵子进行测试，例如，被测阵列天线101中的第三阵子1012和测试阵列天线102中的第四阵子1022，还可以是其他成对的阵子，具体此处不做限定。当该天线测试系统将被测阵列天线101中所有阵子的上行射频指标都测试完之后，该分析处理模块20，还用于根据该被测阵列天线101中的每一个阵子的上行射频指标确定被测阵列天线101的上行合成射频指标。
此外，当该天线测试系统用于测试下行射频指标时，该测试阵列天线102，用于通过该第二阵子1021向该第一阵子1011发送第三测试信号；该被测阵列天线101，用于通过该第一阵子1011接收该第二阵子1021发送的第三测试信号。此时，该分析处理模块20，用于根据该第三测试信号确定该第一阵子1011的下行射频指标。类似的，该天线测试系统也将对另外一对阵子进行下行射频指标的测试。当该天线测试系统将被测阵列天线101中所有阵子的下行射频指标都测试完之后，该分析处理模块20，还用于根据该被测阵列天线101中的每一个阵子的下行射频指标确定被测阵列天线101的下行合成射频指标。
本实施例中，天线测试系统先分别测试被测阵列天线中的每一个阵子的射频指标，然后，再根据每一个阵子的射频指标确定合成射频指标。由于，对单个阵子的射频指标进行测试时，测试阵列天线和被测阵列天线之间的安装距离较短。因此，当测试阵列天线中的阵子在向被测阵列天线中的阵子发送测试信号时，该测试信号不容易从测试阵列天线和被测阵列天线中的距离空隙中泄露，进而不需要额外地配置用于防止测试信号泄露的微波暗室。由于，整个测试过程不需要在微波暗室中进行，因此，降低了测试场地对阵列天线测试的影响，进而提升了阵列天线测试的灵活性。
上面对该天线测试系统的大致结构进行了介绍，由于，在测上行射频指标和下行射频指标时，该分析处理模块20的内部结构将存在些许差异，于是，下面将分情况进行介绍。如图2A所示，为该天线测试系统在测试上行射频指标的结构图。其中，除了前文已介绍的被测阵列天线101、测试阵列天线102以及分析处理模块20之外，还展示了该分析处理模块20的内部结构。
具体地，该分析处理模块20包括混频单元201、数字信号处理模块202、控制装置203以及频谱仪204。其中，该控制装置203，用于控制该被测阵列天线101中的第一阵子1011向该测试阵列天线102中的第二阵子1021发送第一测试信号；该混频单元201，用于将该测试阵列天线102中的第二阵子1021接收到的第一测试信号进行降频处理，得到第二测试 信号，并且，将该第二测试信号传输至该数字信号处理模块202。此时，该数字信号处理模块202，用于根据该第二测试信号确定该第一阵子1011的第一上行射频指标。具体地，该第一上行射频指标包括第一相位信息。本实施例中，该分析处理模块20中的频谱仪204也将对该第二测试信号进行分析处理。具体地，该频谱仪204用于从混频单元201获取该第二测试信号，并且，根据该第二测试信号确定该第一阵子1011的第二上行射频指标。具体地，该第二上行射频指标包括第一幅值信息。
此时，前文所述的第一上行射频指标中的第一相位信息和该第二上行射频指标中的第一幅值信息均可以传输至该控制装置203，并进行保存备份。此外，该第一幅值信息和该第一相位信息也将传送至数字信号处理模块202进行保存，以备后续确定上行合成射频指标时使用。
类似的，该天线测试系统也将对另外一对阵子进行上行射频指标的测试。当该天线测试系统将被测阵列天线101中所有阵子的上行射频指标都测试完之后，该数字信号处理模块202可以确定被测阵列天线101中的每一个阵子的第一幅值信息和第一相位信息。此时，该数字信号处理模块202还用于根据该被测阵列天线101中的每一个阵子的第一幅值信息和第一相位信息确定上行合成射频指标。
具体地，在采用上行射频指标中的第一幅值信息和上行射频指标中的第一相位信息确定上行合成指标时，可以采用如下公式1：
Figure PCTCN2019080469-appb-000001
其中，c n为单个阵子的射频指标；C为整个被测阵列天线的合成射频指标；A n表示各个阵子的第一幅值信息；φ n表示被测阵列天线中的各个阵子之间的馈电相位差，即被测阵列天线中的两个阵子之间的相位差；θ n表示方向矢量，即旋转工装303调整被测阵列天线101和测试阵列天线102之间角度为θ n时的方向矢量。具体地，如图3B所示，可以保持测试阵列天线102静止，并且，将被测阵列天线101绕A点顺时针旋转θ n；或者，如图3C所示，可以保被测试阵列天线101静止，并且，将测试阵列天线102绕B点逆时针旋转θ n，具体此处不做限定。
本实施例中，天线测试系统先分别测试被测阵列天线中的每一个阵子的上行射频指标，然后，再根据每一个阵子的上行射频指标确定上行合成射频指标。由于，对单个阵子的上行射频指标进行测试时，测试阵列天线和被测阵列天线之间的安装距离较短。因此，当测试阵列天线中的阵子在向被测阵列天线中的阵子发送测试信号时，该测试信号不容易从测试阵列天线和被测阵列天线中的距离空隙中泄露，进而不需要额外地配置用于防止测试信号泄露的微波暗室。由于，整个测试过程不需要在微波暗室中进行，因此，降低了测试场地对阵列天线测试的影响，进而提升了阵列天线测试的灵活性。
上面对上行射频指标的测试进行了详细的介绍，下面将对下行射频指标的测试进行介绍，具体如图2B所示，为该天线测试系统在测试下行射频指标的结构图。其中，被测阵列天线101、测试阵列天线102以及分析处理模块20与前文所介绍的情况类似，具体此处不再赘述。但是，该分析处理模块20的内部结构存在些许差异，具体地，该分析处理模块20包 括混频单元201、数字信号处理模块202、控制装置203以及信号源205。
其中，该控制装置203，用于控制该信号源205产生第四测试信号；该信号源205，用于产生该第四测试信号，并将该第四测试信号传送至该混频单元201。然后，该混频单元201对该第四测试信号进行升频处理，得到该第三测试信号，并且，将该第三测试信号传送至该测试阵列天线102中的第二阵子1021。此时，该测试阵列天线102可以通过该第二阵子1021向该第一阵子1011发送第三测试信号。于是，该被测阵列天线101可以通过该第一阵子1011接收该第二阵子1021发送的第三测试信号。然后，该数字信号处理模块202，用于根据该测试天线102中的第二阵子1021发送的第三测试信号确定该第一阵子1011的第一下行射频指标，该第一下行射频指标包括第二幅值信息。
具体地，该数字信号处理模块202可以对该第一下行射频指标进行检验，当该第一下行射频指标大于第一预设误差值时，确定该第一阵子1011为不合格的阵子，并且，向该控制装置203反馈检测结果。此时，运维人员可以跟换整个被测阵列天线101。
在一些可行的实施例中，如图3A所示，若该数字信号处理模块202、被测阵列天线101、第一对外接口321以第一及阵列控制开关311均集成在一个被测模块上，此时，运维人员也可以将整个被测模块进行更换。具体视应用场景和测试需求而定，具体此处不做限定。
此外，该数字信号处理模块202，还用于当该第一下行射频指标小于或等于该第一预设误差值时，则确定该第一阵子1011为合格的阵子，并且，整个下行测试通路为合格的。由于，采用信号源205所产生的第四测试信号进行测试所得的第一下行射频指标中不含相位差的相关信息。于是，该数字信号处理模块202，还用于生成第五测试信号，该第五测试信号包含相位差的相关信息，并且，将该第五测试信号传输至该混频单元201。此时，该混频单元201，还用于对该第五测试信号进行升频处理，得到第六测试信号，并且，将该第六测试信号传送至该测试阵列天线102中的第二阵子1021。于是，该测试阵列天线102，还用于通过该第二阵子1021向该第一阵子1011发送第六测试信号。该被测阵列天线101，还用于通过该第一阵子1011接收该第二阵子1021发送的第六测试信号。
此外，该天线测试系统还包括业务通道。该业务通道，用于将该被测阵列天线101中的第一阵子101接收到的第六测试信号进行降频处理，得到第七测试信号，并且，将该第七测试信号传输至该数字信号处理模块202。然后，由该数字信号处理模块202根据该第七测试信号确定该第一阵子101的第二下行射频指标，该第二下行射频指标包括第二相位信息。
类似的，该天线测试系统也将对另外一对阵子进行下行射频指标的测试。当该天线测试系统将被测阵列天线101中所有阵子的下行射频指标都测试完之后，该数字信号处理模块202，还用于根据该被测阵列天线101中的每一个阵子的第二幅值信息和第二相位信息确定下行合成射频指标。其中，该多个下行射频指标确定的下行合成射频指标的方式与前文确定的上行合成射频指标的方式类似，具体此处不再赘述。
本实施例中第一预设误差值可以为天线测试系统按照历史测试规律计算所得到的，也可以由运维人员根据测试经验进行设置的，具体此处不做限定。
本实施例中，天线测试系统先分别测试被测阵列天线中的每一个阵子的下行射频指标， 然后，再根据每一个阵子的下行射频指标确定下行合成射频指标。由于，对单个阵子的下行射频指标进行测试时，测试阵列天线和被测阵列天线之间的安装距离较短。因此，当测试阵列天线中的阵子在向被测阵列天线中的阵子发送测试信号时，该测试信号不容易从测试阵列天线和被测阵列天线中的距离空隙中泄露，进而不需要额外地配置用于防止测试信号泄露的微波暗室。由于，整个测试过程不需要在微波暗室中进行，因此，降低了测试场地对阵列天线测试的影响，进而提升了阵列天线测试的灵活性。
此外，应当理解的是，在实际应用中，该天线测试系统并不仅仅只测上行射频指标或者下行射频指标，大多数情况是需要对被测阵列天线的两种射频指标进行测试。于是，前述图2A所示的结构与图2B所示的结构可以结合为一体，具体请参阅图3A。
如图3A所示，为该天线测试系统的一个较为详细的结构示意图，其中，包括：前文已介绍的混频单元201、数字信号处理模块202、控制装置203、频谱仪204以及信号源205等，由于前文已做详细介绍，具体此处不再赘述。
除此之外，该天线测试系统还包括第一阵列控制开关311和第二阵列控制开关312，其中该第一阵列控制开关311用于控制被测阵列天线101中的各个阵子的开启或关闭，该第二阵列控制开关312用于控制测试阵列天线102中的各个阵子的开启或关闭。例如，当该天线测试系统需要对第一阵子1011进行测试时，该第一阵列控制开关311可以控制该第一阵子1011处于开启状态。由于，本申请实施例所提出的天线测试系统是对成对的阵子进行测试，于是，此时，该第二阵列控制开关312也需要控制该第二阵子1021处于开启状态。
应当注意的是，在该天线测试系统对该被测阵列天线进行测试时，该第一阵列控制开关311控制该第一阵子1011处于开启状态，并且，该第二阵列控制开关312控制该第二阵子1021处于开启状态。但是，当该天线测试系统已经检测出该被测阵列天线中的某一个阵列天线不合格时，成对的阵子中可以只有一个阵子处于关闭状态或者两个阵子都处于关闭状态。此外，为了节约电源或者保证天线测试系统的电路安全，在该第一阵列控制开关311控制该第三阵子1012处于关闭状态时，该第二阵列控制开关312也可以控制与该第三阵子1012对应的第四阵子1022处于关闭状态。本实施例中，被测阵列天线101和测试阵列天线102中的阵子的开启或关闭可以根据具体应用场景而定，具体此处不做限定。
此外，还应注意的是，本实施例中的第一阵列控制开关311和第二阵列控制开关312可以均由该控制装置203进行控制。也就是说，由该控制装置203向该第一阵列控制开关311或第二阵列控制开关312发送指令，以控制被测阵列天线101或测试阵列天线102中的各个阵子的开启与关闭。应当理解的是，该第一阵列控制开关311和第二阵列控制开关312也可以只有由运维人员进行操作，这样可以减轻控制装置203的工作负荷。在实际应用中，可能因具体的应用情况而有所差异，具体此处不做限定。
本实施例中，该天线测试系统还包括第一对外接口321和第二对外接口322，其中，该第二对外接口322与测试阵列天线102相连，该第二对外接口322还与控制装置203和混频单元201相连，以实现控制装置203与测试阵列天线102之间的数据或信号交换，以及混频单元201与测试阵列天线102之间的数据或信号交换。此外，该第一对外接口321分别与数字信号处理模块202、被测阵列天线101、控制装置203和混频单元201相连，以实现控制装置203 与数字信号处理模块202之间的数据或信号交换，以及混频单元201与数字信号处理模块202之间的数据或信号交换。
在一些可行的实施例中，该数字信号处理模块202与被测阵列天线101之间存在业务通道，该业务通道用于实现数字信号处理模块202与被测阵列天线101之间的数据传输。具体地，该业务通道可以用于降频处理，例如，当被测阵列天线101中的第一阵子101接收到测试阵列天线102发送的测试信号时，由于该测试信号为高频信号，于是，需要对该高频信号进行降频处理，以使得该数字信号处理模块202对该降频处理后的信号进行分析等处理。
此外，在实际应用中，为了保证被测阵列天线101中的阵子与测试阵列天线102中的阵子能够一一对应，本实施例中的天线测试系统还包括：下工装板301、上工装板302和旋转工装303。其中，该上工装板302，用于安装测试阵列天线102；该下工装板301，用于安装被测阵列天线101和数字信号处理模块202。并且，下工装板301和上工装板302中都分别装有水平转轴和垂直转轴，因此，该下工装板301和上工装板302都分别可以绕水平转轴和垂直转轴进行旋转以调整该测试阵列天线102与该被测阵列天线101之间的角度。此外，该旋转工装303，用于通过调整该测试阵列天线102与该被测阵列天线101之间的角度以调整第一相位差，该第一相位差为被测阵列天线中的各个阵子之间的相位差。
此外，该旋转工装303，还用于调整下工装板301与上工装板302之间的距离，已达到调整该被测阵列天线101与测试阵列天线102之间的距离，该距离包括垂直距离或水平距离。该垂直距离指被测阵列天线101中的阵子与测试阵列天线102中的阵子之间的测试信号的传输距离。该水平距离的调节可以保证该被测阵列天线101中的阵子与测试阵列天线102中的阵子能够一一对应。
本实施例中，天线测试系统先分别测试被测阵列天线中的每一个阵子的下行射频指标，然后，再根据每一个阵子的下行射频指标确定下行合成射频指标。由于，对单个阵子的下行射频指标进行测试时，测试阵列天线和被测阵列天线之间的安装距离较短。因此，当测试阵列天线中的阵子在向被测阵列天线中的阵子发送测试信号时，该测试信号不容易从测试阵列天线和被测阵列天线中的距离空隙中泄露，进而不需要额外地配置用于防止测试信号泄露的微波暗室。由于，整个测试过程不需要在微波暗室中进行，因此，降低了测试场地对阵列天线测试的影响，进而提升了阵列天线测试的灵活性。
上面对本申请实施例所述涉及的天线测试系统进行了介绍，下面对该天线测试方法进行介绍。如图4所示，该天线测试系统所执行的步骤包括：
401、该天线测试系统分别对与被测阵列天线中的每一个阵子相关的测试部件的进行校准；
本实施例中，当该天线测试系统准备对被测阵列天线进行测试时，为保证测试结果的准确性，该天线测试系统将分别对与被测阵列天线中的每一个阵子相关的测试部件的进行校准。其中，该测试部件包括工装板、混频单元或参考通道。
该工装板指前文所介绍的上工装板302或下工装板301。对该工装板的校准是为了保证被测阵列天线101中的各个阵子能够与测试阵列天线102中的各个阵子一一对应，例如，调整该第一阵子1011与该第二阵子1021对应。此外，对该工装板的校准该测试阵列天线 102的各个阵子在测试频点的幅相响应。
当校准该混频单元201时，可以采用矢量网络分析仪测试与其他器件的通路。例如，混频单元201与第一对外接口321之间的通路、混频单元201与第二对外接口322之间的通路、混频单元201与频谱仪204之间的通路、混频单元201与控制装置203之间的通路以及混频单元201与信号源205之间的通路。具体此处不做限定。
此外，还将对参考通路进行校准，其中，该参考通路包括发射参考通路和接收参考通路。在对各个阵子进行检测前，需要分别对这两条参考通路进行校准：当对发射参考通路进行校准时，该数字信号处理模块202发出测试信号，经第一对外接口321输出到混频单元201，然后，该混频单元201再将该测试信号传输到频谱仪204进行测试，进而得到该发射参考通路的校准数据。当对接收参考通路进行校准时，信号源205将发出测试信号并传输至混频单元201，然后，经第一对外接口321进入数字信号处理模块202，进而得到接收参考通路的校准数据。
402、该天线测试系统调整被测阵列天线中的阵子与测试阵列天线中的阵子之间的相位差；
本实施例中，当对各个部件进行校准之后，还可以调整被测阵列天线中的各个阵子之间的相位差。此时，该被测阵列天线101中的第一阵子1011与该被测阵列天线101中的第三阵子1012之间的相位差为0，也就是说，该被测阵列天线101与测试阵列天线102呈0度正对关系。于是，可以测试被测阵列天线101的指向角为0度时的射频指标。当然，该天线测试系统也可以在其他指向角的情况下对被测阵列天线101进行测试。此时，该天线测试系统可以通过调整下工装板301与上工装板302之间的角度，进而达到调整被测阵列天线中的各个阵子之间的相位差。具体前文已做详细介绍，具体此处不再赘述。
403、天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标；
本实施例中，由于该阵子的射频指标分为上行射频指标和下行射频指标，于是，下面将对这两种情况分别进行介绍。
一、当检测上行射频指标时：
本实施例中，在检测上行射频指标时，该天线测试系统可以通过数字信号处理模块202确定第一上行射频指标中的第一相位信息，并且，通过频谱仪204确定第二上行射频指标中的第一幅值信息。然后，将该第一上行射频指标中的第一幅值信息和该第二上行射频指标中的第一相位信息进行保存备份，以备后续确定上行合成射频指标时使用。具体地，由于前文已作详细介绍，具体此处不再赘述。
本实施例中，该上行射频指标可以是发射功率(tx power)、临道泄露比(ACLR/ACPR)以及调制误差矢量EVM等，具体此处不做限定。其中该临道泄露比可以衡量发射机的带外辐射特性，具体指临道功率与主信道功率之比。
类似的，该天线测试系统也将对另外一对阵子进行上行射频指标的测试。
二、当检测下行射频指标时：
本实施例中，在检测下行射频指标时，该天线测试系统该天线测试系统可以采用信号源205产生的第四测试信号进行测试，得到该第一阵子1011的第一下行射频指标，该第一 下行射频指标包括第二幅值信息。并且，该天线测试系统还将采用数字信息处理模块202产生的第五测试信号进行测试，得到该第一阵子1011的第二下行射频指标，该第二下行射频指标包括第二相位信息。然后，该天线测试系统将该第一下行射频指标中的第二幅值信息和该第二下行射频指标中的第二相位信息进行保存备份，以备后续确定下行合成射频指标时使用。
本实施例中，该下行射频指标可以接收灵敏度(rx sensitivity)，具体此处不做限定。
类似的，该天线测试系统也将对另外一对阵子进行下行射频指标的测试。
应当理解的是，本实施例中，确定上行射频指标与确定下行射频指标之间无先后顺序限定。在实际应用中，可以根据具体的检测需求，仅对上行射频指标进行检测或者仅对下行射频指标进行检测，具体此处不做限定。
404、该天线测试系统根据该每一个阵子的射频指标确定该被测阵列天线的合成射频指标。
本实施例中，当该天线测试系统将被测阵列天线101中所有阵子的上行射频指标都测试完之后，该天线测试系统可以根据该被测阵列天线101中的每一个阵子的该上行射频指标中的第一幅值信息和第一相位信息确定上行合成射频指标。关于具体合成方法，前文已做详细介绍，具体此处不做限定。
类似的，当该天线测试系统将被测阵列天线101中所有阵子的下行射频指标都测试完之后，该天线测试系统可以根据该被测阵列天线101中的每一个阵子的该下行射频指标中的第二幅值信息和第二相位信息确定下行合成射频指标。该多个下行射频指标确定的下行合成射频指标的方式与前文类似，具体此处不再赘述。
本实施例中，天线测试系统先分别测试被测阵列天线中的每一个阵子的下行射频指标，然后，再根据每一个阵子的下行射频指标确定下行合成射频指标。由于，对单个阵子的下行射频指标进行测试时，测试阵列天线和被测阵列天线之间的安装距离较短。因此，当测试阵列天线中的阵子在向被测阵列天线中的阵子发送测试信号时，该测试信号不容易从测试阵列天线和被测阵列天线中的距离空隙中泄露，进而不需要额外地配置用于防止测试信号泄露的微波暗室。由于，整个测试过程不需要在微波暗室中进行，因此，降低了测试场地对阵列天线测试的影响，进而提升了阵列天线测试的灵活性。
所属领域的技术人员可以清楚地了解到，为描述的方便和简洁，上述描述的系统，装置和单元的具体工作过程，可以参考前述方法实施例中的对应过程，在此不再赘述。
以上实施例仅用以说明本申请的技术方案，而非对其限制；尽管参照前述实施例对本申请进行了详细的说明，本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本申请各实施例技术方案的精神和范围。

Claims (18)

  1. 一种天线测试系统，其特征在于，包括：
    测试阵列天线、被测阵列天线以及分析处理模块；
    所述被测阵列天线包括N个第一阵子，所述测试阵列天线包括N个第二阵子，所述N个第一阵子与所述N个第二阵子一一对应，所述N为大于1的整数；
    所述被测阵列天线，用于通过所述第一阵子向所述第二阵子发送第一测试信号；
    所述测试阵列天线，用于通过所述第二阵子接收所述第一阵子发送的第一测试信号；
    所述分析处理模块，用于根据所述第一测试信号确定所述第一阵子的上行射频指标；
    所述分析处理模块，还用于根据所述被测阵列天线中的每一个阵子的上行射频指标确定被测阵列天线的上行合成射频指标。
  2. 根据权利要求1所述的天线测试系统，其特征在于，所述分析处理模块包括：数字信号处理模块、控制装置和混频单元；
    所述控制装置，用于控制所述被测阵列天线中的第一阵子向所述测试阵列天线中的第二阵子发送第一测试信号；
    所述混频单元，用于将所述测试阵列天线中的第二阵子接收到的第一测试信号进行降频处理，得到第二测试信号，并且，将所述第二测试信号传输至所述数字信号处理模块；
    所述数字信号处理模块，用于根据所述第二测试信号确定所述第一阵子的第一上行射频指标，所述第一上行射频指标包括第一相位信息。
  3. 根据权利要求2所述的天线测试系统，其特征在于，所述分析处理模块还包括频谱仪；
    所述频谱仪，用于从混频单元获取所述第二测试信号，并且，根据所述第二测试信号确定所述第一阵子的第二上行射频指标，所述第二上行射频指标包括第一幅值信息；
    所述数字信号处理模块，还用于根据所述被测阵列天线中的每一个阵子的第一幅值信息和第一相位信息确定上行合成射频指标。
  4. 根据权利要求1至3中任意一项所述的天线测试系统，其特征在于，所述天线测试系统还包括上工装板、下工装板和旋转工装；
    所述上工装板，用于安装测试阵列天线；
    所述下工装板，用于安装被测阵列天线和数字信号处理模块；
    所述旋转工装，用于通过调整所述测试阵列天线与所述被测阵列天线之间的角度以调整第一相位差，所述第一相位差为所述被测阵列天线中的各个阵子之间的相位差。
  5. 一种天线测试系统，其特征在于，包括：
    测试阵列天线、被测阵列天线以及分析处理模块；
    所述被测阵列天线包括N个第一阵子，所述测试阵列天线包括N个第二阵子，所述N个第一阵子与所述N个第二阵子一一对应，所述N为大于1的整数；
    所述测试阵列天线，用于通过所述第二阵子向所述第一阵子发送第三测试信号；
    所述被测阵列天线，用于通过所述第一阵子接收所述第二阵子发送的第三测试信号；
    所述分析处理模块，用于根据所述第三测试信号确定所述第一阵子的下行射频指标；
    所述分析处理模块，还用于根据所述被测阵列天线中的每一个阵子的下行射频指标确定被测阵列天线的下行合成射频指标。
  6. 根据权利要求5所述的天线测试系统，其特征在于，
    所述分析处理模块包括：数字信号处理模块、控制装置、混频单元和信号源；
    所述控制装置，用于控制所述信号源产生第四测试信号；
    所述混频单元，用于对所述信号源中的所述第四测试信号进行升频处理，得到所述第三测试信号，并且，将所述第三测试信号传送至所述测试阵列天线中的第二阵子；
    所述数字信号处理模块，用于根据所述测试天线中的第二阵子发送的第三测试信号确定所述第一阵子的第一下行射频指标，所述第一下行射频指标包括第二幅值信息；
    所述数字信号处理模块，还用于当所述第一下行射频指标大于第一预设误差值时，确定所述第一阵子为不合格的阵子，并且，向所述控制装置反馈检测结果。
  7. 根据权利要求6所述的天线测试系统，其特征在于，所述数字信号处理模块，还用于当所述第一下行射频指标小于或等于所述第一预设误差值时，生成第五测试信号，并且，将所述第五测试信号传输至所述混频单元。
  8. 根据权利要求7所述的天线测试系统，其特征在于，
    所述混频单元，还用于对所述第五测试信号进行升频处理，得到第六测试信号，并且，将所述第六测试信号传送至所述测试阵列天线中的第二阵子；
    所述天线测试系统还包括业务通道；
    所述业务通道，用于将所述被测阵列天线中的第一阵子接收到的来自第二阵子的所述第六测试信号进行降频处理，得到第七测试信号；
    所述数字信号处理模块，还用于根据所述第七测试信号确定所述第一阵子的第二下行射频指标，所述第二下行射频指标包括第二相位信息；
    所述数字信号处理模块，还用于根据所述被测阵列天线中的每一个阵子的第二幅值信息和第二相位信息确定下行合成射频指标。
  9. 一种阵列天线测试方法，其特征在于，包括：
    天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标；
    所述天线测试系统根据所述每一个阵子的射频指标确定所述被测阵列天线的合成射频指标。
  10. 根据权利要求9所述的方法，其特征在于，所述射频指标包括上行射频指标；
    所述天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标包括：
    天线测试系统控制被测阵列天线中的第一阵子向测试阵列天线中的第二阵子发送第一测试信号，所述第一阵子与所述第二阵子对应；
    所述天线测试系统根据所述第一测试信号确定所述第一阵子的上行射频指标。
  11. 根据权利要求10所述的方法，其特征在于，所述天线测试系统根据所述第一测试信号确定所述第一阵子的上行射频指标包括：
    所述天线测试系统中的频谱仪根据所述第一测试信号确定所述第一阵子的第一上行射频指标，所述第一上行射频指标包括第一幅值信息；
    所述天线测试系统中的数字信号处理模块根据所述第一测试信号确定所述第一阵子的第二上行射频指标，所述第二上行射频指标包括第一相位信息。
  12. 根据权利要求9所述的方法，其特征在于，所述天线测试系统根据所述每一个阵子的射频指标确定所述被测阵列天线的合成射频指标包括：
    所述天线测试系统根据每一个阵子的第一幅值信息和第一相位信息确定所述被测阵列天线的上行合成射频指标。
  13. 根据权利要求9所述的方法，其特征在于，所述射频指标包括下行射频指标；
    所述天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标包括：
    所述天线测试系统控制测试阵列天线中的第二阵子向被测阵列天线中的第一阵子发送第三测试信号，所述第一阵子与所述第二阵子对应；
    所述天线测试系统根据所述第三测试信号确定所述第一阵子的下行射频指标。
  14. 根据权利要求13所述的方法，其特征在于，所述天线测试系统根据所述第三测试信号确定所述第一阵子的下行射频指标包括：
    所述天线测试系统采用信号源产生的第四测试信号进行测试，得到所述第一阵子的第一下行射频指标，所述第一下行射频指标包括第二幅值信息；
    所述天线测试系统采用数字信息处理模块产生的第五测试信号进行测试，得到所述第一阵子的第二下行射频指标，所述第二下行射频指标包括第二相位信息。
  15. 根据权利要求14所述的方法，其特征在于，所述天线测试系统根据所述每一个阵子的射频指标确定所述被测阵列天线的合成射频指标包括：
    所述天线测试系统根据每一个阵子的第二幅值信息和第二相位信息确定所述被测阵列天线的下行合成射频指标。
  16. 根据权利要求9至15中任意一项所述的方法，其特征在于，所述天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标之前，所述方法还包括：
    所述天线测试系统分别对与被测阵列天线中的每一个阵子相关的测试部件的进行校准，所述测试部件包括工装板、混频单元或参考通道。
  17. 根据权利要求9至15中任意一项所述的方法，其特征在于，所述天线测试系统分别测试被测阵列天线中的每一个阵子的射频指标之前，所述方法还包括：
    所述天线测试系统调整所述被测阵列天线中的各个阵子之间的相位差。
  18. 根据权利要求17所述的方法，其特征在于，所述天线测试系统调整所述第一阵子与所述第二阵子之间的相位差包括：
    所述天线测试系统通过调整所述第一阵子所在的下工装板与所述第二阵子所在的上工装板之间的角度，调整所述被测阵列天线中的各个阵子之间的相位差。
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