WO2020186762A1

WO2020186762A1 - Overall current test method for wearable device

Info

Publication number: WO2020186762A1
Application number: PCT/CN2019/113640
Authority: WO
Inventors: 林远棠
Original assignee: 广东乐芯智能科技有限公司
Priority date: 2019-03-19
Filing date: 2019-10-28
Publication date: 2020-09-24
Also published as: CN109900990A; CN109900990B

Abstract

An overall current test method for a wearable device. First, a user can test, without dismantling, a current of wearable device by excluding influence on battery recharging and lithium batteries. Second, unlike previous methods for independently testing a given load, the present application creatively considers mutual influence among a plurality of loads, and tests the current in the presence of mutual interference among the plurality of loads. Such a mode is not used, or even not mentioned in the field of wearable devices.

Description

Method for testing current of wearable device

Technical field

The present invention relates to a test method of a wearable device, in particular, to a test method of a wearable device that can perform a whole machine current test.

Background technique

At present, smart wearable devices such as smart watch bracelets have higher and higher requirements for waterproofing, which leads to product disassembly and the whole machine is scrapped. The PCBA current is tested during factory production to ensure that the board has no function and electricity after the SMT patch is completed. Performance failure, to ensure that the function and performance of the whole machine is normal after the assembly is completed, and the damage caused by the PCBA at the back end of the production and assembly can be detected, but the current power consumption of the whole machine cannot be tested after assembly, such as the product is bad. Waste materials will be reported, or mass shipments will cause mass losses.

technical problem

This method of testing the function and performance of PCBA can find functional and electrical performance failures at the front end of the assembly line. However, it is often difficult to avoid personnel and equipment damage to the circuit board and components during the production process, such as foreign objects falling in the production process and splashing tin Slag, device falling off, PCB deformation and damage to capacitors, leakage, etc. After assembly, the whole machine can only be tested for abnormal functions, and the mechanical and electrical performance of the whole machine cannot be tested. For example, the whole machine cannot be detected due to PCB or device damage and leakage, especially wearable Devices such as smart bracelets and watches have very high requirements for standby battery life. Once defects caused by production cannot be found in time, mass customer complaints will be lost, and the production line cannot identify risks in time, and mass losses due to continuous production.

Technical solutions

Wearable devices such as watches or bracelets need to be equipped with various chips. Generally, they have Bluetooth chips and WIFI chips. Of course, there may also be NB-IOT chips and traditional GSM chips. These are malicious data transmission. Chip. The current smart watch calculates the theoretical standby and use time after the current detection is always longer than the actual time. After the disassembly detection, the current of each load is also detected to determine whether the device is normal. For the overall current of the system and each load The differences shown are more difficult to explain.

Based on the above-mentioned defects, the present invention provides a wearable device such as a smart watch bracelet and other equipment to realize the whole machine test current method, solves the defect that the product whole machine cannot test the electrical performance, and effectively detects the production failure in batches, and feedbacks the problem to improve in time The production process, and creatively put forward the concept of cross-detection, so that the watch can minimize the interference between each other in the layout of various chips. Further improve the reliability of mass production of products, and avoid bad batch losses caused by incomplete production process and design considerations.

The specific technical solutions of the present invention are as follows:

A method for testing the current of the entire wearable device, the method including:

S1, cutting off the battery power supply circuit and charging circuit of the wearable device itself without disassembling the device;

S2, external power supply circuit with current test unit;

S3, check the first current of the wearable device in standby;

S4, the first chip is connected to the mobile terminal or the server, the screen is kept off, and the second current value is tested; according to the first current value and the second current value, a third current value at which the first chip remains connected is calculated;

S5. Synchronize the data of the wearable device to the mobile terminal or server, test the fourth current value when the data is transmitted and the screen is off, and calculate the value of the data transmitted by the first chip according to the fourth current value and the third current value The fifth current value;

S6: Turn off the first chip, turn on the second chip of the wearable device, turn off the screen, and test the sixth current; calculate the seventh current value of the second chip that remains connected according to the first current value and the sixth current value Current value

S7. Use the second chip to synchronize data to the mobile terminal or server, test the eighth current when the data is transmitted and the screen is off, and obtain the ninth data transmission of the second chip according to the eighth current value and the seventh current value. Current value

S9. Turn on the first chip and the second chip at the same time, turn off the screen, and test the tenth current at this time. If the difference between the tenth current and the sum of the third and seventh currents is less than the first current threshold ( Each current threshold should be added to the first current value in step S3), then it is judged that the connection current between the first chip and the second chip is qualified; if not, it is judged that there is interference in the simultaneous connection of the first chip and the second chip;

S10, on the basis of the "current qualified" of S9, turn on the data transmission of the first chip, turn off the screen, and test the eleventh current at this time. If the eleventh current is the same as the fifth current value and the first If the difference of the sum of the seven current values is less than the second current threshold, it is determined that the data transmission of the first chip does not interfere with the connection of the second chip; if not, it is determined that the data of the first chip will affect the connection of the second chip;

S11. Perform on the basis of the "current qualified" of S9, turn on the second chip data transmission, turn off the screen, and test the twelfth current at this time. If the twelfth current is the same as the third current value and the third current value If the difference of the sum of the nine current values is less than the third current threshold, it is determined that the data transmission of the second chip does not interfere with the connection of the first chip; if not, it is determined that the data transmission of the second chip will affect the connection of the first chip;

S12, on the basis of the "no interference" of S10 and the "no interference" of S11, the first chip data transmission and the second chip transmission are simultaneously played, and the thirteenth current at this time is tested. If the thirteenth If the difference between the current and the sum of the fifth current value and the ninth current value is less than the fourth current threshold, it is determined that there is no interference between the first chip transmission and the second chip data transmission; if not, then the first chip transmission is determined Interference with the data transmission of the second chip.

Further, in the S1 step, the wearable device power supply circuit includes a lithium battery B1, a charging interface, a charging chip U5, and a step-down LDO chip U6. The lithium battery B1 is connected to the charging chip U5, and the charging The chip U5 is connected to the charging interface;

The lithium battery B1 is connected to the step-down LDO chip U6, and the step-down LDO chip U6 is connected to the charging interface;

A first P-MOS switch is further provided between the lithium battery B1 and the charging chip U5;

A second P-MOS switch is also arranged between the lithium battery B1 and the step-down LDO chip U6;

The gate of the first P-MOS switch is connected to the high-level input unit.

Further, the source of the first P-MOS switch is connected to the lithium battery B1, and the drain is connected to the charging chip; the gate of the first P-MOS switch is connected to the first resistor R19 and then grounded.

Further, the drain of the second P-MOS switch is connected to the lithium battery B1, the gate is connected to the high-level input unit, and the source is connected to the step-down LDO chip U6; the second P-MOS switch The gate of the switch is connected to the second resistor R22 and then grounded.

Further, the high-level input unit is a single-chip microcomputer U7.

Further, the Bluetooth chip of the single-chip U7 is connected and/or the key switch and/or touch switch of the single-chip U7 are connected.

Further, in the step S2, the power circuit with the current test unit is connected to the circuit of the wearable device with a resistor that can be connected in series.

Further, the first chip may be any one of a Bluetooth chip, a WIFI chip, an NB-IOT chip, and a GSM chip; the second chip may be a Bluetooth chip, a WIFI chip, or a NB chip that is different from the first chip. -Either IOT chip or GSM chip.

Further, in S9, open multiple chips with more than 2 numbers at the same time, repeat steps S9 to S12, and determine whether the data transmission of a certain chip or the data transmission of multiple chips will affect the connection or data of other chips among the multiple chips. Transmission produces interference.

Further, the first current threshold, the second current threshold, the third current threshold, and the fourth current threshold are all greater than or equal to the first current value.

Beneficial effect

Through the above test circuit, one is that the user can test the current of the wearable device by eliminating the influence of battery charging and lithium battery without disassembling the machine; the second is that this application is different from the previous test of a load separately The method creatively considers the mutual influence between multiple loads, and tests the current under the premise of mutual interference between multiple loads. This method has not been used or even mentioned in the wearable field. .

Description of the drawings

Fig. 1 is a structural diagram of the test circuit of the present invention.

Fig. 2 is a schematic diagram of a resistor that can be connected to an external circuit of the present invention.

Embodiments of the invention

In order to make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described clearly and completely below. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them.的实施例。 Example. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

The terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The singular forms of "a", "said" and "the" used in the embodiments of the present invention and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings, "multiple" Generally, at least two are included, but the inclusion of at least one is not excluded.

It should be understood that the term "and/or" used in this article is only an association relationship describing associated objects, which means that there can be three relationships. For example, A and/or B can mean that there is A alone, and both A and B, there are three cases of B alone. In addition, the character "/" in this text generally indicates that the associated objects before and after are in an "or" relationship.

It should be understood that although the terms first, second, third, etc. may be used to describe... in the embodiments of the present invention, these... should not be limited to these terms. These terms are only used to distinguish... For example, without departing from the scope of the embodiments of the present invention, the first...may also be called the second..., and similarly, the second...may also be called the first...

Depending on the context, the words "if" and "if" as used herein can be interpreted as "when" or "when" or "in response to determination" or "in response to detection". Similarly, depending on the context, the phrase "if determined" or "if detected (statement or event)" can be interpreted as "when determined" or "in response to determination" or "when detected (statement or event) )" or "response to detection (statement or event)".

It should also be noted that the terms "include", "include" or any other variants thereof are intended to cover non-exclusive inclusion, so that a commodity or system that includes a series of elements not only includes those elements, but also includes those elements that are not explicitly listed. Other elements of, or also include elements inherent to this commodity or system. If there are no more restrictions, the element defined by the sentence "includes a..." does not exclude the existence of other identical elements in the commodity or system that includes the element.

In addition, the sequence of steps in the following method embodiments is only an example, and is not strictly limited.

Example one

A method for testing the current of the whole wearable device, which can detect the current of a watch or a bracelet (or similar wearable device).

By integrating a power-off circuit in the wearable device, it is possible to cut off the battery power supply circuit and the charging circuit of the wearable device without disassembling the device. The specific implementation method will be mentioned below.

Connect an external power circuit with a current detection device. The power circuit is directly connected to the charging connector of the wearable device, and a voltage is applied to test the current.

After connecting, check the standby current of the wearable device, which can be recorded as the first current. The following is a specific method to determine whether there is interference between various loads (the chip mentioned below, in fact, the chip can be set to various loads).

Connect the first chip to the mobile terminal or server, and keep the screen off (all kinds of tests need to keep the screen off. The screen is a big power user. When the screen is turned on, most of the current is on the screen, which may cause the other load measurements to fail. Accuracy), testing the second current value; subtracting and calculating the third current value for the first chip to keep connected according to the first current value and the second current value;

Synchronize the data of the wearable device to the mobile terminal or server, test the fourth current value when the data is transmitted and the screen is off, and calculate the first chip transmission data based on the fourth current value and the third current value subtraction Five current values;

Turn off the first chip, turn on the second chip of the wearable device, turn off the screen, and test the sixth current; subtract and calculate the seventh current that the second chip keeps connected according to the first current value and the sixth current value value;

Use the second chip to synchronize data to the mobile terminal or server, test the eighth current when the data is transmitted and the screen is off, and subtract and calculate the ninth of the second chip data transmission based on the eighth current value and the seventh current value. Current value

Turn on the first chip and the second chip at the same time, turn off the screen, and test the tenth current at this time. If the difference between the tenth current and the sum of the third and seventh currents is less than the first current threshold (first If the current threshold is at least greater than the first current value), it is judged that the connection current between the first chip and the second chip is qualified; if not, it is judged that there is interference in the simultaneous connection of the first chip and the second chip;

On the basis of "current qualified", open the first chip data transmission, close the screen, test the eleventh current at this time, if the eleventh current and the sum of the fifth and seventh current values If the difference is less than the second current threshold, it is determined that the data transmission of the first chip does not interfere with the connection of the second chip; if not, it is determined that the data of the first chip will affect the connection of the second chip;

On the basis of "current qualified", open the second chip data transmission, close the screen, test the twelfth current at this time, if the twelfth current and the sum of the third and ninth current values If the difference is less than the third current threshold, it is determined that the data transmission of the second chip does not interfere with the connection of the first chip; if not, it is determined that the data transmission of the second chip will affect the connection of the first chip;

On the basis of "no interference", the first chip data transmission and the second chip transmission are played at the same time, and the thirteenth current is tested at this time. If the thirteenth current is the same as the fifth current value and the ninth current value If the difference of the sum is less than the fourth current threshold, it is determined that there is no interference between the first chip transmission and the second chip data transmission; if not, it is determined that the first chip transmission and the second chip data transmission interfere with each other.

The first chip mentioned above can be any one of a Bluetooth chip, a WIFI chip, an NB-IOT chip and a GSM chip; the second chip can be a Bluetooth chip, a WIFI chip, or a NB-IOT chip that is different from the first chip. Either IOT chip or GSM chip.

Moreover, due to the existence of multiple chips, the interference between the two chips is explained in detail above. In fact, it is easier to produce interference between multiple chips that is not easy to find. Therefore, in the above method, the number of tested chips can be reduced. Increase, determine whether the data transmission of a certain chip or the data transmission of multiple chips among multiple chips will interfere with the connection or data transmission of other chips.

Example two

In order to cut off the battery power supply circuit and charging circuit of the wearable device without disassembling the machine, the present invention designs the following circuit.

As shown in Figure 1, the wearable device is generally a non-detachable structure. The battery is a rechargeable battery. When charging, the lithium battery B1 is charged through the charging chip U5. When in use, the lithium battery B1 passes through the step-down circuit U6. Supply power to the load.

Between the lithium battery B1 and the charging chip U5, a first P-MOS switch Q4 is provided to cut off the charging circuit when appropriate. After the external power source passes through the charging interface and the unidirectional diode D5, it is connected to the VIN pin of the charging chip U5. The charging chip U5 can be SGM40561. The source 2 of the first P-MOS switch Q4 is connected to the lithium battery B1, and the drain 3 is connected to the BAT pin of the charging chip U5. The gate 1 is used to introduce a high-level trigger unit.

Between the lithium battery and the step-down LDO chip U6, a second P-MOS switch Q3 is provided to cut off the battery power supply when appropriate. After the external power source passes through the charging interface and the unidirectional diode D5, it is connected to the step-down LDO chip U6. The buck LDO chip U6 can be CE6230B33F. The drain 3 of the second P-MOS switch Q3 is connected to the lithium battery B1, the source 2 is connected to the buck LDO chip U6, and the gate 1 is used to introduce a high-level trigger unit.

In order to monitor batches and save labor, the applicant uses Bluetooth input signals in the high-level trigger short setting, that is, uses Bluetooth chips and single-chip microcomputers for pulse input.

The high-level input unit is the unit machine U7, and the single-chip microcomputer U7 can be an Apollo3 programmable control single-chip.

The Bluetooth chip E2 is connected to the RF pin of the microcontroller U7.

Or, when manual operation is required, two other signal input methods are set, one is input through switch SW1, and the other is input through touch. These two input units are connected to the GPIO1 pin of the microcontroller.

When the product is assembled into the whole machine, it is necessary to test whether the power consumption of the whole machine is normal. When the power consumption of the whole machine needs to be tested, the current must be measured to ensure that the current is normal under normal standby and various functional states. First, fix the device on the charging dock. Or a dedicated charging fixture, and then trigger the current test mode through Bluetooth or the device's own touch or button, U7 MCU receives the whole machine current test signal through Bluetooth, or SW1 button switch signal, TOUCH1 touch signal, through U7 RF or GPIO1 pin Received wireless command, external touch or button signal, it is recognized as the current signal of the test machine. At this time, the U7 MCU GPIO3 pin outputs a high-level signal. At this time, the gate of Q4 is in a high-level state, and the Q4 switch is turned off, charging The chip and the lithium-ion battery are disconnected, and the whole machine is not charging at this time. Because the USB charging interface is connected to the 5V voltage at this time, after UCB 5V is divided by the voltage divider resistor of the Q3 grid, the grid level of Q3 is high , Q3 switch tube is turned off, and the lithium ion battery is disconnected from U6. At this time, the lithium ion battery cannot supply power to the system, which is equivalent to cutting off the internal lithium ion battery power supply. The USB 5V power supply is supplied by the U6 step-down system after the D5 anti-reverse diode Connected, at this time, the system is powered by the external USB 5V directly after U6 step-down, and the internal lithium-ion battery power supply is successfully cut off. The external USB 5V power supply can be The 5V input terminal is connected with an ammeter to test the working, standby and shutdown current of the whole machine, and the whole system circuit USB 5V and the lithium-ion battery power supply switch between the power supply is uninterrupted, which can ensure the continuous power shutdown of the whole machine, which is helpful for analyzing defective devices and Production failure judgment.

When the current test of the whole machine is completed, the USB 5V power supply is directly stopped, and the machine can automatically switch to lithium-ion battery power supply. The implementation steps are as follows:

When the current test of the whole machine is completed, directly cut off the USB 5V power supply. 5V cannot provide power for the U6 step-down system. At this time, the resistor R22 of the Q3 grid is connected to the power ground, the Q3 grid level is low, the Q3 switch tube is turned on, and the lithium ion battery is connected to the U6 step-down system power input terminal At this time, the lithium-ion battery is switched to the system power supply. At this time, the USB_IN input terminal of U7 is pulled down to the power ground and R22 is low, U7 recognizes that the external USB 5V power supply is disconnected, and the GPIO3 output pin of U7 is set to input pull down. At this time, the gate of Q4 is at low level, Q4 is turned on, the lithium-ion battery is connected to the charging chip, and the D4 diode prevents the battery voltage from flowing back to the charging chip to affect the charging circuit. At this time, the product returns to normal state, and the external USB 5V power supply is connected It can be charged normally. It can be charged normally without the trigger signal of the current test of the whole machine in the factory, and has no influence on the user's use.

Example three

Wearable devices such as watches and bracelets belong to low-current products. When a small voltage is applied, often due to voltage problems, the measured value is not so accurate.

In the present invention, a switchable resistance access is set in the external power supply circuit, as shown in FIG. 2.

One way is to connect the external power supply circuit directly to the charging interface of the wearable device. Another way is to cut into the route with resistance when applying a large voltage, so that when a large voltage is applied, a part of the voltage can be divided into the wearable circuit. This method is more accurate than directly inputting a small voltage. At present, this technology has not been used in the current detection power supply circuit of an external wearable device.

Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: The technical solutions recorded in the foregoing embodiments are modified, or some of the technical features are equivalently replaced; these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

A method for testing the current of the entire wearable device, the method including:

S1, cutting off the battery power supply circuit and charging circuit of the wearable device itself without disassembling the device;

S2, external power supply circuit with current test unit;

S3, check the first current of the wearable device in standby;

S4, the first chip is connected to the mobile terminal or the server, the screen is kept off, and the second current value is tested; according to the first current value and the second current value, a third current value at which the first chip remains connected is calculated;

S5. Synchronize the data of the wearable device to the mobile terminal or server, test the fourth current value when the data is transmitted and the screen is off, and calculate the value of the data transmitted by the first chip according to the fourth current value and the third current value The fifth current value;

S6: Turn off the first chip, turn on the second chip of the wearable device, turn off the screen, and test the sixth current; calculate the seventh current value of the second chip that remains connected according to the first current value and the sixth current value Current value

S7. Use the second chip to synchronize data to the mobile terminal or server, test the eighth current when the data is transmitted and the screen is off, and obtain the ninth data transmission of the second chip according to the eighth current value and the seventh current value. Current value

S9. Turn on the first chip and the second chip at the same time, turn off the screen, and test the tenth current at this time. If the difference between the tenth current and the sum of the third and seventh currents is less than the first current threshold, It is judged that the connection current between the first chip and the second chip is qualified; if not, it is judged that there is interference in the simultaneous connection of the first chip and the second chip;

S10, on the basis of the "current qualified" of S9, turn on the data transmission of the first chip, turn off the screen, and test the eleventh current at this time. If the eleventh current is the same as the fifth current value and the first If the difference of the sum of the seven current values is less than the second current threshold, it is determined that the data transmission of the first chip does not interfere with the connection of the second chip; if not, it is determined that the data of the first chip will affect the connection of the second chip;

S11. Perform on the basis of the "current qualified" of S9, turn on the second chip data transmission, turn off the screen, and test the twelfth current at this time. If the twelfth current is the same as the third current value and the third current value If the difference of the sum of the nine current values is less than the third current threshold, it is determined that the data transmission of the second chip does not interfere with the connection of the first chip; if not, it is determined that the data transmission of the second chip will affect the connection of the first chip;

S12, on the basis of the "no interference" of S10 and the "no interference" of S11, the first chip data transmission and the second chip transmission are simultaneously used, and the thirteenth current at this time is tested. If the thirteenth If the difference between the current and the sum of the fifth current value and the ninth current value is less than the fourth current threshold, it is determined that there is no interference between the first chip transmission and the second chip data transmission; if not, then the first chip transmission is determined Interference with the data transmission of the second chip.
The method for testing the current of the whole wearable device according to claim 1, wherein in the step S1, the power circuit of the wearable device includes a lithium battery B1, a charging interface, a charging chip U5, and a step-down LDO chip U6, the lithium battery B1 is connected to the charging chip U5, and the charging chip U5 is connected to the charging interface;

The lithium battery B1 is connected to the step-down LDO chip U6, and the step-down LDO chip U6 is connected to the charging interface;

A first P-MOS switch is further provided between the lithium battery B1 and the charging chip U5;

A second P-MOS switch is also arranged between the lithium battery B1 and the step-down LDO chip U6;

The gate of the first P-MOS switch is connected to the high-level input unit.
The current testing method for the entire wearable device according to claim 2, wherein the source of the first P-MOS switch is connected to the lithium battery B1, and the drain is connected to the charging chip; The gate of the first P-MOS switch is connected to the first resistor R19 and then grounded.
The current testing method for the whole wearable device according to claim 2, wherein the drain of the second P-MOS switch is connected to the lithium battery B1, and the gate is connected to the high-level input unit , The source is connected to the step-down LDO chip U6; the gate of the second P-MOS switch is connected to the second resistor R22 and then grounded.
The current testing method for the entire wearable device according to claim 2, wherein the high-level input unit is a single-chip microcomputer U7.
The current testing method of the whole wearable device according to claim 5, wherein the Bluetooth chip of the single-chip microcomputer U7 and/or the key switch and/or touch switch of the single-chip U7 are connected.
The method for testing the current of the whole wearable device according to claim 1, wherein, in the step S2, the power supply circuit with the current test unit is connected to the circuit of the wearable device. Resistors that can be connected in series.
The method for testing the current of the entire wearable device according to claim 1, wherein the first chip can be any one of a Bluetooth chip, a WIFI chip, an NB-IOT chip, and a GSM chip; The second chip may be any one of a Bluetooth chip, a WIFI chip, an NB-IOT chip and a GSM chip that are different from the first chip.
The method for testing the current of the whole wearable device according to claim 1 or 8, characterized in that, in S9, a plurality of chips greater than 2 are opened at the same time, and steps S9 to S12 are repeated to determine that one of the multiple chips Whether the data transmission of one chip or the data transmission of multiple chips will interfere with the connection or data transmission of other chips.
The method for testing the current of the entire wearable device according to claim 1, wherein the first current threshold, the second current threshold, the third current threshold, and the fourth current threshold are all greater than or equal to the first current threshold. Current value.