WO2020105175A1

WO2020105175A1 - Microsampling tip inspection device

Info

Publication number: WO2020105175A1
Application number: PCT/JP2018/043213
Authority: WO
Inventors: 佳則山口; 将司小山; 弘之高田
Original assignee: テクノグローバル株式会社
Priority date: 2018-11-22
Filing date: 2018-11-22
Publication date: 2020-05-28

Abstract

This examination device utilizes a microsampling tip to examine a sample. The microsampling tip has a suction port for drawing in a sample at the distal end thereof, has in the inside thereof a sample accommodating space for accommodating a sample drawn in from the suction port, and a pump part for drawing the sample into the sample accommodating space via the suction port, and has a measurement terminal for coming in contact with the sample accommodated in the sample accommodating space and performing measurement of the sample, and the sample accommodating space is in fluid communication with the outside solely via the suction port, the proximal-end surface of the sample accommodating space being sealed. A tip retaining part for retaining the proximal-end part of the microsampling tip is provided to the distal-end part of the examination device, and the examination device is provided with a measurement part for utilizing the measurement terminal of the microsampling tip retained in the tip retaining part to perform measurement of the sample accommodated in the sample accommodating space of the microsampling tip.

Description

Micro sampling chip inspection device

The present invention is for performing tests such as environmental tests typified by heavy metal measurements, biochemical tests typified by using urine test strips, clinical tests, and food tests typified by detecting residual pesticides. The present invention relates to a microsampling chip inspection device (hereinafter, also simply referred to as an inspection device).

Heavy metals such as cadmium, cobalt, mercury, copper, zinc, lead, arsenic, and magnesium are harmful to the human body when ingested in large quantities, and ingest the amount of heavy metals contained in water, soil, food, vegetables, rice, and drinking water into the body. It is very important to know before. Various methods have been proposed and implemented as methods for measuring heavy metals (see Patent Documents 1 and 2). In addition, the problem of residual pesticides caused by spraying pesticides on foods such as grains, vegetables and fruits is serious. In 2013, 23 children died because monocrotophos remained on vegetables in India. Such a serious incident is happening.

Also, being able to perform exactly the necessary tests on-site at medical and food inspection sites is important for ensuring subsequent diagnosis and treatment policies, prevention, and security. By being able to detect the test on the spot within a few minutes and measuring the disease, food safety, and the presence or absence of residual pesticides, patients can be diagnosed and administered as quickly as possible. Can guarantee the safety of.

ㆍ Generally, test papers such as filter paper with color developing agent fixed on them are used to test for specific substances in human urine and blood, immunoassays, pesticide residue tests, and soil contamination tests. However, no technique has been established that allows simple and quick inspections on site using test paper.

JP-A-11-174054 JP, 2009-034041, A

Electrochemical measurements and tests performed using test strips are performed by bringing the sample into contact with the sensor part such as the measuring electrode or test strip. This is an important factor for reproducibility. Therefore, it is common to use a pipette to collect a certain amount of sample for testing. That is, an accurate concentration can be determined by guaranteeing a fixed amount of sample. Further, it is required to dispose an inspection portion (chip) including electrodes in order to prevent infection of a measurement person such as an inspection technician at the time of measurement and to prevent contamination between samples.

Here, it is possible to give the pipette itself a sample measurement function so that the sample inspection can be performed easily and quickly. Such a pipette type inspection device is configured to directly measure a sample taken in a tip of a pipette. However, in such a pipette type inspection device, from the viewpoint of preventing contamination, it is necessary to handle the pipette with care so that the sample does not adhere to the pipette. For example, when the pipette is turned sideways with the sample collected in the tip, the sample in the tip adheres to the tip of the pipette, so the tip of the tip faces downward after collecting the sample in the tip. It is not easy to handle because it needs to be maintained.

Therefore, an object of the present invention is to facilitate the handling of an inspection device that inspects a sample using a microsampling chip.

The microsampling chip inspection device according to the present invention inspects a sample using a microsampling chip. The micro-sampling chip has a suction port at the tip for sucking a sample, and a sample storage space for storing the sample sucked from the suction port and a sample storage space for storing the sample into the sample storage space via the suction port. It has a pump part for inhaling and has a measuring terminal body for contacting the sample contained in the sample accommodating space to measure the sample, and the sample accommodating space has the suction port. It is in fluid communication with the outside only through the base end face. The microsampling chip inspection device has a tip holding portion for holding the base end portion of the microsampling chip at the tip portion, and the measurement terminal body of the microsampling chip held by the tip holding portion is provided. A measurement unit is provided for utilizing the sample stored in the sample storage space of the micro-sampling chip.

As described above, the micro-sampling chip inspection apparatus of the present invention has a base end of the micro-sampling chip in which the sample storage space inside is in fluid communication with the outside only through the suction port at the tip and the base end face is sealed. The sample is measured by using the measurement terminal body provided on the micro sampling chip while holding the portion. Since the base end face of the microsampling chip is sealed, the inspection device body holding the base end of the microsampling chip and the sample storage space in the microsampling chip are completely isolated. As a result, the sample stored in the sample storage space in the chip micro-sampling chip does not adhere to the inspection device body without maintaining the posture of the inspection device body so that the microsampling suction port faces downward. Therefore, the handling of the inspection device after taking the sample becomes easy.

Here, in the present invention, the "measurement terminal body" means a color of a test strip or the like that exhibits a color reaction by contact with a measurement electrode for performing an electrochemical measurement of a sample, a specific component, or a specific biochemical molecule. It includes the body. When the measuring terminal body is the “measuring electrode”, the “measuring unit” may be an electric circuit that is in electrical contact with the measuring electrode and performs electrochemical measurement of the sample via the measuring electrode. When the measuring terminal body is a "coloring body", the "measuring unit" includes an optical element and an electric circuit for detecting the degree of color development of the coloring body. In this case, an optical element as a measuring unit may be provided at the tip of the inspection device to directly detect the color development of the color-developing device, but the optical element is provided inside the housing and an optical fiber is used. Alternatively, the color of the color-developing body may be detected by an optical element inside the housing by guiding the light.

In the micro-sampling chip inspection apparatus of the present invention, the chip holding unit holds the micro-sampling chip by utilizing a frictional force between an outer peripheral surface or an inner peripheral surface of the base end portion of the micro sampling chip. May be

In the above case, the microsampling chip may have a recess on the base end face, and the chip holding portion may be realized as a protrusion that fits into the recess on the base end face of the microsampling chip.

In a preferred embodiment of the micro-sampling chip inspection device of the present invention, the micro-sampling chip inspection device operates at the tip end of the micro-sampling chip inspection device in the attaching / detaching direction of the micro-sampling chip inspection device and protrudes from the tip end surface of the micro-sampling chip inspection device. And a chip detaching mechanism for automatically detaching the microsampling chip from the chip holding part by pressing the microsampling chip held by the chip holding part toward the tip side thereof. As a result, the microsampling chip can be removed from the inspection apparatus body without touching the microsampling chip with the user's finger.

In the micro-sampling chip inspection device of the present invention, a display unit for displaying the measurement result by the measurement unit can be provided on the outer surface of the housing. In this case, it is conceivable that the inspection apparatus main body is placed on a substantially horizontal floor so that the display unit faces upward. At that time, if the micro-sampling chip attached to the tip of the inspection device contacts the floor surface, the micro-sampling chip may come off the inspection device, or the sample collected in the micro-sampling chip may adhere to the floor surface There can be problems such as being polluted. Therefore, when the inspection device is placed on a substantially horizontal floor so that the display unit faces upward, the tip of the microsampling chip held by the chip holding unit does not contact the floor surface. It is preferable to include a support portion that supports the housing of the inspection device so as to be maintained. Then, after the sample is collected in the micro sampling chip, the inspection device can be placed on a substantially horizontal floor surface, and the inspection device can be easily handled.

In the microsampling chip inspection apparatus of the present invention, by using the microsampling chip whose base end face is sealed, the inspection apparatus is completely isolated from the sample storage space in the microsampling chip. Even after inhaling the sample into the chip, the inspection device is not contaminated by the sample even if the inlet of the microsampling chip is not kept downward. Therefore, the handling of the inspection device after inhaling the sample into the microsampling chip becomes easy.

It is a figure which shows one Example of a micro sampling chip inspection apparatus, (A) is a top view, (B) is a side view, (C) is a rear view. It is a figure which shows the structure of the front-end | tip part and the micro sampling chip of the inspection apparatus of the same Example. It is a perspective view which shows the front-end | tip part and the structure of the micro sampling chip of the inspection apparatus of the same Example, (A) the state which removed the micro sampling chip from the inspection apparatus, (B) attached the micro sampling chip to the inspection apparatus. State. It is a figure which shows the other Example of the micro sampling chip inspection apparatus.

An embodiment of the microsampling chip inspection device according to the present invention will be described below with reference to the drawings.

As shown in FIG. 1, a microsampling chip inspection device 2 (hereinafter, inspection device 2) is equipped with a microsampling chip 100 at its tip and measures a sample collected in the microsampling chip 100. is there. A display unit 4 for displaying measurement results and the like and an operation button 6 are provided on the outer surface of the base end portion of the housing of the inspection device 2.

Here, the structure of the tip portion of the inspection device 2 and the structure of the micro-sampling chip 100 mounted on the tip of the inspection device 2 will be described with reference to FIGS. 2 and 3.

A tip holding section 12 for holding the micro sampling chip 100 is provided at the tip of the inspection device 2. In this embodiment, a recess 118 is provided on the base end surface of the microsampling chip 100, and the chip holding portion 12 is provided as a protrusion that fits into the recess 118 of the microsampling chip 100. By fitting the chip holding part 12 into the recess 118 of the microsampling chip 100, the microsampling chip 100 is attached to the tip of the inspection device 12 by the frictional force between the outer peripheral surface of the chip holding part 12 and the inner peripheral surface of the recess 118. Retained. Note that the present invention is not limited to this, and the chip holding portion 12 can be provided as a recess into which the protrusion provided on the microsampling chip 100 is fitted.

At the tip of the micro-sampling chip 100, a suction port 102 for sucking a sample is provided. A sample storage space 106 and a pump space 108 for storing the sample sucked from the suction port 102 are provided in the base end portion of the microsampling chip 100. The sample storage space 106 is in fluid communication with the suction port 102 via the flow path 104. The sample storage space 106 and the pump space 108 are in fluid communication with each other via a channel 110.

The sample accommodation space 106 has its base end surface (upper surface in FIG. 2) sealed by a wall surface 112. The pump space 108, which is in fluid communication with the sample storage space 106 via the channel 110, is also sealed by the resin sheet 114. That is, the sample storage space 106 is in fluid communication with the outside only through the suction port 102.

A measurement electrode 116, which is a measurement terminal body for directly contacting the sample sucked into the sample storage space 106 and performing the measurement of the sample, is provided in the sample storage space 106. The measurement electrode 116 is for contacting the sample stored in the sample storage space 106 and performing electrochemical measurement of the sample. The measurement electrode 116 penetrates the wall surface 112 and is drawn out as a connection terminal 117 into the recess 118 of the microsampling chip 100. The connection terminal 117 is used by the inspection device 2 to make electrical contact with the measurement electrode 116.

The tip surface of the inspection device 2 is provided with a terminal port 14 for making electrical contact with the connection terminal 117 when the chip holding portion 12 is fitted into the recess 118 of the microsampling chip 100.

Note that the sample storage space 106 of the micro-sampling chip 100 may be provided with a chromophore that reacts with a specific component (biochemical substance, chemical substance) in the sample and exhibits a chromogenic reaction instead of the measurement electrode 116.

FIG. 4 shows an embodiment in which the color developing body 120 is provided in the sample storage space 106. In the embodiment of FIG. 4, a plurality of spherical color-developing bodies 120 impregnated with different types of test reagents are arranged in the same plane in the sample storage space 106. The inspection device 2 is provided with an optical element including a light source and an optical sensor for optically detecting the chromaticity of the chromophore 120 arranged in the sample storage space 106. In the embodiment shown in FIG. 4, the optical element is provided inside the housing of the inspection device 2, and the light from the light source is guided to the coloring body 120 through the optical fiber 20 so as to be irradiated and emitted from the coloring body. The light is guided to the optical sensor.

The optical fiber is not an indispensable component, and an optical element is provided at the tip of the inspection device 2 to directly irradiate the color-developing body 120 with light and directly detect the light from the color-developing body 120. It may be configured as follows. Further, the color developing body 120 does not necessarily need to be the one in which the test reagent is soaked in the solid, and the test reagent itself is applied to the wall surface in the sample storage space 106, and the sample is sucked into the sample storage space 106. Sometimes, the wall surface itself in the sample storage space 106 may be colored.

Return to FIGS. 2 and 3 to continue the explanation. The resin sheet 114 that seals the base end surface of the pump space 108 has elasticity. The resin sheet 114 changes the capacity in the pump space 108 by elastically deforming, and the pump space 108 and the resin sheet 114 form a pump portion that functions as a diaphragm pump. By driving the pump portion including the pump space 108 and the resin sheet 114, the sample can be sucked from the suction port 102 into the sample storage space 106. Specifically, when the resin sheet 114 is pushed, the air inside the micro sampling chip 100 is released to the outside, and when the resin sheet 114 returns to its original state, the space inside the micro sampling chip 100 is decompressed. .. At this time, the sample is sucked into the sample storage space 106 from the suction port 102 by immersing the suction port 102 at the tip of the microsampling chip 100 in the sample.

The inspection device 2 includes a pump drive unit 16 that operates in the axial direction of the microsampling chip 100 to press and release the resin sheet 114 of the microsampling chip 100. The pump drive unit 16 can be operated by an operation button provided on the outer surface of the housing of the inspection device 2. That is, the inspection device 2 can drive the diaphragm pump mounted on the microsampling chip 100 by button operation.

A projecting portion 18 is provided on the tip surface of the inspection device 2 to project from the tip surface and press the base end surface of the microsampling chip 100 toward the tip side. The protruding portion 18 is normally stored in the tip portion of the inspection device 2, but protrudes toward the tip side when the user presses a predetermined button. When the projecting portion 18 is projected while the microsampling chip 100 is held by the chip holding portion 12, the microsampling chip 100 is pressed toward the tip side by the projecting portion 18 and separated from the chip holding portion 12. That is, the projecting portion 18 constitutes a chip detaching function for automatically detaching the micro sampling chip 100 from the inspection device 2.

Although not shown in the drawing, inside the housing of the inspection device 2, the sample is electrically connected to the terminal in the terminal port 14, and the electrochemical measurement of the sample is performed via the measurement electrode 116, and further the measurement is performed. An electronic circuit (measuring unit) is provided that implements various calculations based on the signal values obtained in step (1) and displays on the display unit 4. Further, when it has a function of optically detecting the color development of the color-developing body 120 arranged in the sample storage space 106, a light source and an optical sensor (preferably CCD) are provided at the tip of the inspection device 2 or inside the housing. A two-dimensional photodetector such as a camera) and an arithmetic circuit that analyzes the detection signal from the photosensor. In particular, as shown as an example in FIG. 4, when the color formers 120 having different color development characteristics are provided in the same plane in the sample storage space 106, the respective color formers 120 are colored. The optical sensor is a two-dimensional photodetector such as a CCD camera so that the degree can be measured simultaneously, and the arithmetic circuit analyzes the image data obtained by the two-dimensional detector to develop the color of each color former 120. It is preferable that the degree can be obtained simultaneously and individually.

As described above, the micro sampling chip 100 has a pump function, and the base end face is completely sealed. Therefore, the sample in the micro-sampling chip 100 does not come into contact with the inspection device 2 regardless of the posture of the inspection device 2 after inhaling the sample into the micro-sampling chip 100. Therefore, even after inhaling the sample into the micro sampling chip 100, it is not necessary to maintain the posture of the inspection device 2 so that the tip of the micro sampling chip 100 faces downward, and the inspection device 2 is placed on a substantially horizontal floor surface. It is also possible to place it. In particular, in the conventional pipette device, when the tip 102 portion is directed upward, the sample solution sucked inside flows back into the inspection device, and the inside is often contaminated.

Returning to FIG. 1 and continuing the description of the inspection apparatus 2, the support section 10 is provided on the surface opposite to the surface on which the display unit 4 and the operation buttons 6 of the inspection apparatus 2 are provided. When the inspection device 2 is placed on a substantially horizontal floor surface so that the surface on which the display unit 4 and the operation buttons 6 are provided faces upward, the support unit 10 causes the microsampling chip 100 to contact the floor surface. This is for supporting the inspection device 2 together with the lower surface 8 of the base end portion so as not to do so. The base end portion of the inspection device 2 is heavier than the front end portion. When the inspection device 2 is placed on the floor so that the support portion 10 is located below, the bottom surface 8 of the base end portion contacts the floor surface. Then, the tip is lifted. As a result, the inspection device 2 can be placed on the floor even after the sample is collected in the micro sampling chip 100, and the inspection device 2 can be handled easily. In addition to displaying the concentration of the measured heavy metal on the display unit 4, when the concentration exceeds the reference value, the entire display unit can blink in red to give a warning.

In the above-mentioned embodiment, the inspection device 2 is described as performing the electrochemical measurement of the sample collected in the micro sampling chip 100, but the present invention is not limited to this. As the micro-sampling chip 100, it is possible to use a micro-sampling space 106 in which a color-developing body such as a test paper that exhibits a color-developing reaction upon contact with a specific component is stored. The inspection device 2 in this case is provided with a measuring unit including an optical element for optically detecting the chromaticity of the chromophore in the micro sampling chip 100.

2 inspection device 4 display part 6 operation button 8 bottom surface of base end part of inspection device 10 support part 12 chip holding part 14 terminal port 16 pump drive part 18 protrusion part (chip detachment mechanism)
100 Micro Sampling Chip 102

Suction Ports

104, 110 Flow Path 106 Sample Storage Space 108 Pump Space 112 Wall Surface 114 Resin Sheet 116 Measurement Terminal 117 Connection Terminal 118 Cavity

Claims

A microsampling chip inspection device for inspecting a sample using a microsampling chip,
The micro-sampling chip has a suction port at the tip for sucking a sample, and a sample storage space for storing the sample sucked from the suction port and a sample storage space for storing the sample into the sample storage space via the suction port. It has a pump part for inhaling and has a measuring terminal body for contacting the sample contained in the sample accommodating space to measure the sample, and the sample accommodating space has the suction port. It is in fluid communication with the outside only through, and the base end face is sealed,
The microsampling chip inspection device includes a tip holding portion for holding a base end portion of the microsampling chip at a tip portion thereof, and the measurement terminal body of the microsampling chip held by the tip holding portion. A microsampling chip inspecting apparatus, comprising: a measuring unit for measuring a sample stored in the sample storing space of the microsampling chip by utilizing the above.
The microsampling according to claim 1, wherein the chip holding portion holds the microsampling chip by utilizing a frictional force between the microsampling chip and an outer peripheral surface or an inner peripheral surface of the base end portion. Chip inspection device.
The micro-sampling chip has a recess on the base end surface,
The microsampling chip inspection apparatus according to claim 2, wherein the chip holding portion is a protrusion that fits into the recess of the base end surface of the microsampling chip.
At the tip of the micro sampling chip inspection device, the micro sampling chip is operated in the attaching / detaching direction with respect to the chip holding part, and the micro sampling chip held by the chip holding part is projected from the tip end surface of the micro sampling chip inspection device. The microsampling chip inspection apparatus according to claim 2, further comprising a chip detaching mechanism for automatically detaching the microsampling chip from the chip holding portion by pressing the tip end side.
A display unit for displaying the measurement result by the measurement unit is provided on the outer surface of the housing,
When the microsampling chip inspection device is placed on a substantially horizontal floor so that the display unit faces upward, the tip of the microsampling chip held by the chip holding unit does not contact the floor surface. The microsampling chip inspection apparatus according to claim 1, further comprising a support portion that supports the housing so as to be maintained in a state.
The measurement terminal body is disposed inside the sample housing space, and is a color developing body having a property of exhibiting a color developing reaction in response to a specific component in the sample when contacting the sample,
An optical sensor for detecting the light emitted from the color-developing body is provided inside the housing of the inspection device, and the light emitted from the color-developing body is guided to the optical sensor by an optical fiber. The micro-sampling chip inspection apparatus according to claim 1, wherein the micro-sampling chip inspection apparatus is configured according to claim 1.