WO2020080248A1 - Circuit structure and electrical junction box - Google Patents

Circuit structure and electrical junction box Download PDF

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Publication number
WO2020080248A1
WO2020080248A1 PCT/JP2019/039990 JP2019039990W WO2020080248A1 WO 2020080248 A1 WO2020080248 A1 WO 2020080248A1 JP 2019039990 W JP2019039990 W JP 2019039990W WO 2020080248 A1 WO2020080248 A1 WO 2020080248A1
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WO
WIPO (PCT)
Prior art keywords
terminal
bus bar
heat
circuit structure
recess
Prior art date
Application number
PCT/JP2019/039990
Other languages
French (fr)
Japanese (ja)
Inventor
池田 潤
慶一 佐々木
純也 愛知
Original Assignee
住友電装株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 住友電装株式会社 filed Critical 住友電装株式会社
Priority to DE112019005172.5T priority Critical patent/DE112019005172T5/en
Priority to US17/280,587 priority patent/US20210368618A1/en
Priority to CN201980062976.2A priority patent/CN112889352A/en
Publication of WO2020080248A1 publication Critical patent/WO2020080248A1/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0272Adaptations for fluid transport, e.g. channels, holes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/46Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
    • H01L23/467Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing gases, e.g. air
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/42Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/10Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
    • H01L25/11Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L29/00
    • H01L25/115Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02GINSTALLATION OF ELECTRIC CABLES OR LINES, OR OF COMBINED OPTICAL AND ELECTRIC CABLES OR LINES
    • H02G3/00Installations of electric cables or lines or protective tubing therefor in or on buildings, equivalent structures or vehicles
    • H02G3/02Details
    • H02G3/08Distribution boxes; Connection or junction boxes
    • H02G3/16Distribution boxes; Connection or junction boxes structurally associated with support for line-connecting terminals within the box
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00Constructional details common to different types of electric apparatus
    • H05K7/20Modifications to facilitate cooling, ventilating, or heating
    • H05K7/2039Modifications to facilitate cooling, ventilating, or heating characterised by the heat transfer by conduction from the heat generating element to a dissipating body
    • H05K7/20409Outer radiating structures on heat dissipating housings, e.g. fins integrated with the housing
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00Constructional details common to different types of electric apparatus
    • H05K7/20Modifications to facilitate cooling, ventilating, or heating
    • H05K7/2089Modifications to facilitate cooling, ventilating, or heating for power electronics, e.g. for inverters for controlling motor
    • H05K7/20909Forced ventilation, e.g. on heat dissipaters coupled to components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/367Cooling facilitated by shape of device
    • H01L23/3675Cooling facilitated by shape of device characterised by the shape of the housing
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02GINSTALLATION OF ELECTRIC CABLES OR LINES, OR OF COMBINED OPTICAL AND ELECTRIC CABLES OR LINES
    • H02G3/00Installations of electric cables or lines or protective tubing therefor in or on buildings, equivalent structures or vehicles
    • H02G3/02Details
    • H02G3/08Distribution boxes; Connection or junction boxes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0213Electrical arrangements not otherwise provided for
    • H05K1/0263High current adaptations, e.g. printed high current conductors or using auxiliary non-printed means; Fine and coarse circuit patterns on one circuit board
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/182Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09009Substrate related
    • H05K2201/09063Holes or slots in insulating substrate not used for electrical connections
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09209Shape and layout details of conductors
    • H05K2201/09218Conductive traces
    • H05K2201/09227Layout details of a plurality of traces, e.g. escape layout for Ball Grid Array [BGA] mounting
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007Types of components
    • H05K2201/10166Transistor

Definitions

  • the present invention relates to a circuit structure including a plurality of semiconductor elements and an electric junction box.
  • Patent Document 1 heat generated from an electric component provided in the casing is quickly discharged to the outside of the casing, and outside air is taken into the casing to cool the electric component.
  • Electronic devices having holes are disclosed.
  • a circuit structure is a circuit structure including a plurality of semiconductor elements having a first terminal and a second terminal, and a substrate part to which the first terminal and the second terminal are connected, and a semiconductor element. And a through hole that is formed in the substrate portion for each and penetrates the substrate portion in the thickness direction.
  • An electrical junction box includes the above-described circuit structure, a heat dissipation recess portion that covers the plurality of semiconductor elements, and a heat conductive material that is interposed between each semiconductor element and the heat dissipation recess portion.
  • FIG. 3 is a front view of the electric device according to the first embodiment.
  • FIG. 3 is an exploded view of the electric device according to the first embodiment.
  • FIG. 3 is a schematic view of the circuit structure of the electric device according to the first embodiment as viewed from below.
  • FIG. It is an enlarged view which expands and shows the part enclosed with the broken line in FIG.
  • FIG. 5 is a schematic vertical sectional view taken along line VV of FIG. 4.
  • FIG. 5 is a schematic vertical sectional view taken along line VI-VI of FIG. 4.
  • FIG. 6 is a partial vertical cross-sectional view showing the relationship between the FET and the recess in the electric device according to the second embodiment.
  • a circuit structure is a circuit structure including a plurality of semiconductor elements having a first terminal and a second terminal, and a substrate part to which the first terminal and the second terminal are connected. A through hole formed in the substrate portion for each semiconductor element and penetrating the substrate portion in the thickness direction.
  • a through hole that penetrates the substrate portion in the thickness direction is formed in the substrate portion for each semiconductor element. Therefore, when the semiconductor element emits heat, such heat can be transferred from one surface side of the substrate section to the other surface side of the substrate section through the through hole, and a heat dissipation effect is achieved.
  • a current smaller than the first terminal flows through the second terminal, a conductive plate connected to the first terminals of the plurality of semiconductor elements, and each semiconductor.
  • the plurality of current-carrying members connected to the second terminal of the element are provided, and the through hole is formed in the vicinity of the second terminal.
  • the through hole is formed in the vicinity of the conducting member to which the second terminal through which the current smaller than the first terminal flows is connected.
  • the conductive plate has a recess in which one end of the current-carrying member is arranged, and an edge of the recess and an end of the current-carrying member.
  • a resin portion is formed in between, and the through hole is formed in the resin portion.
  • one end of the current-carrying member is arranged inside the recess of the conductive plate with the resin portion sandwiched therebetween, and the through hole is formed in the resin portion. Since the through hole is formed in the resin portion in this way, it is possible to prevent an increase in resistance due to forming the through hole in the current-carrying member or the conductive plate and to easily form the through hole.
  • An electrical junction box is provided with any one of the above-described circuit structures, a heat dissipation recess portion that covers the plurality of semiconductor elements, and between each semiconductor element and the heat dissipation recess portion. And an intervening heat conductive material.
  • the heat conductive material is interposed between the semiconductor element and the discharge recess.
  • the heat-conducting material is in contact with the inner surfaces of the semiconductor element and the heat dissipation recess, and quickly transfers the heat generated from the semiconductor element to the heat dissipation recess. Therefore, the heat generated by the semiconductor element can be effectively dissipated.
  • the electrical junction box includes a heat dissipation fin that is provided outside the heat dissipation recess and that acquires heat from the heat dissipation recess and dissipates the heat.
  • the heat dissipation fins are provided outside the heat dissipation recess. Therefore, the heat conductive material transfers the heat generated from the semiconductor element to the heat dissipation recess, and the heat transferred to the heat dissipation recess is air-cooled through the heat dissipation fins. Therefore, the heat generated by the semiconductor element can be effectively dissipated.
  • FIG. 1 is a front view of the electric device 1 according to the first embodiment
  • FIG. 2 is an exploded view of the electric device 1 according to the first embodiment.
  • the electric device 1 is an electric connection box that is arranged in a power supply path between a power source such as a battery provided in a vehicle and a load such as a vehicle electric component such as a lamp and a wiper or a motor.
  • the electric device 1 is used as an electronic component such as a DC-DC converter or an inverter.
  • the electric device 1 includes a circuit structure 10, a circuit board 12 having a circuit pattern, and a support member 20 that supports the circuit structure 10.
  • the circuit structure 10 includes a bus bar that constitutes a power circuit, a circuit board, and electronic components mounted on the bus bar.
  • the electronic component is appropriately mounted according to the use of the electric device 1, and includes a switching element such as a FET (Field Effect Transistor), a resistor, a coil, a capacitor, and the like.
  • the support member 20 sandwiches the base portion 21 having a support surface 211 for supporting the circuit structure 10 on the upper surface, the heat dissipation portion 22 provided on the surface (lower surface 212) opposite to the support surface 211, and the heat dissipation portion 22. And a plurality of leg portions 23 provided at both left and right ends of the base portion 21.
  • the base portion 21, the heat radiation portion 22, and the leg portion 23 included in the support member 20 are integrally formed by die casting using a metal material such as aluminum or aluminum alloy.
  • the base 21 is a rectangular flat plate member having an appropriate thickness.
  • the circuit structure 10 is fixed to the support surface 211 of the base portion 21 by a known method such as adhesion, screwing, or soldering.
  • the heat dissipating section 22 includes a plurality of heat dissipating fins 221 projecting downward from the lower surface 212 of the base section 21, and dissipates heat generated from the circuit structure 10 to the outside.
  • the plurality of heat radiation fins 221 extend in the left-right direction and are arranged in parallel in the front-rear direction at intervals. Further, in the heat dissipation portion 22, a recess 222 (heat dissipation recess) that covers the FET 13 described later is formed, and the heat dissipation fin 221 is provided outside the recess 222.
  • Legs 23 are provided on both left and right ends of the base 21.
  • One or a plurality of leg portions 23 are provided on the left and right sides of the base portion 21, respectively.
  • the circuit board 12 has, for example, a substantially rectangular insulating board.
  • a control circuit (not shown) including electronic components such as resistors, coils, capacitors, and diodes is mounted on this insulating substrate, and a circuit pattern for electrically connecting these electronic components is formed.
  • the control circuit of the circuit board 12 gives an ON / OFF signal to the power circuit 30 described later to control the power circuit 30.
  • the circuit board 12 and the power circuit 30 are housed in the housing unit 11.
  • FIG. 3 is a schematic view of the circuit structure 10 of the electric device 1 according to the first embodiment as viewed from below. That is, FIG. 3 is a diagram showing the circuit structure 10 when viewed from the direction of the arrow in FIG.
  • the circuit structure 10 includes a power circuit 30.
  • the power circuit 30 includes at least bus bars 111 to 113, and a semiconductor switching element 13 (semiconductor element) that switches energization / de-energization based on the input control signal when a control signal from the circuit board 12 is input.
  • semiconductor switching element 13 semiconductor element
  • the semiconductor switching element 13 is, for example, an FET (more specifically, a surface mounting type power MOSFET), and is mounted on the lower surface side of the bus bars 111 to 113.
  • FET 13 semiconductor switching element 13
  • electronic components such as a Zener diode may be mounted on the lower surface side of the bus bars 111 to 112.
  • the FET 13 includes, for example, a drain terminal 131 on one main surface of the element body, and the drain terminal 131 protrudes on one side surface side of the element body. Further, the FET 13 includes a source terminal 132 (first terminal) and a gate terminal 133 (second terminal) on the other side surface facing the one side surface.
  • FIG. 3 illustrates the case where the six FETs 13a to 13f are mounted in the power circuit 30, but the present invention is not limited to this.
  • the FETs 13a to 13f are also referred to as the FET 13.
  • the drain terminal 131 of the FET 13 is soldered to the bus bar 111.
  • the bus bar 111 will be referred to as the drain bus bar 111.
  • the source terminal 132 of the FET 13 is soldered to the bus bar 112 (conductive plate).
  • the bus bar 112 will be referred to as the source bus bar 112.
  • the drain bus bar 111 and the source bus bar 112 are conductive plate members formed of a metal material such as copper or copper alloy.
  • the gate terminal 133 of the FET 13 carries a smaller current than the source terminal 132 and the drain terminal 131, and is soldered to the bus bar 113 (current-carrying member).
  • the bus bar 113 will be referred to as the gate bus bar 113.
  • the gate bus bar 113 is a conductive member made of a metal material such as copper or a copper alloy.
  • a resin portion 114 of an insulating resin material is interposed between the drain bus bar 111, the source bus bar 112, and the gate bus bar 113, and the drain bus bar 111, the source bus bar 112, and the gate bus bar 113 are integrated with the resin portion 114.
  • the substrate portion 31 is formed.
  • the board portion 31 has a substantially rectangular shape when viewed from above and below, and has a flat surface on the lower side.
  • the FETs 13a to 13f are mounted on the lower side surface of the board portion 31.
  • the FETs 13a to 13f are arranged in a line along the longitudinal direction (left-right direction) of the substrate portion 31.
  • the resin portion 114 is manufactured by insert molding using an insulating resin material such as phenol resin or glass epoxy resin.
  • an insulating resin material such as phenol resin or glass epoxy resin.
  • the resin part 114 and the housing part 11 are integrally formed in one step.
  • the housing portion 11 supports the peripheral portion of the circuit board 12 from the lower surface side by ribs (not shown) formed on the inner peripheral surface of the peripheral wall.
  • the resin portion 114 integrates the drain bus bar 111, the source bus bar 112, and the gate bus bar 113 by engaging them. Further, a part of the resin portion 114 is arranged between the drain bus bar 111, the source bus bar 112, and the gate bus bar 113 to insulate the bus bars from each other.
  • a cylindrical housing 5 that protects the outer ends of connector terminals (not shown) is attached to the outside of the right side wall of the housing 11.
  • FIG. 4 is an enlarged view showing an enlarged portion surrounded by a broken line in FIG. 3
  • FIG. 5 is a schematic vertical sectional view taken along line VV of FIG. 4
  • FIG. 6 is a schematic vertical sectional view taken along line VI-VI.
  • the drain bus bar 111 is larger than the source bus bar 112 and the gate bus bar 113, and has a rectangular plate shape. That is, the drain bus bar 111 has the largest exposed area in the substrate portion 31, and occupies most of the front side.
  • the FETs 13a to 13f are fixed to the drain bus bar 111 by soldering the drain terminals 131 to the drain bus bar 111, respectively.
  • the resin portion 114b of the resin portion 114 is interposed between the drain bus bar 111 and the source bus bar 112. That is, the drain bus bar 111 and the source bus bar 112 face each other with the resin portion 114b interposed therebetween.
  • FETs 13a to 13f are juxtaposed at the peripheral portion facing the source bus bar 112 so that the source terminal 132 and the gate terminal 133 face the source bus bar 112, respectively.
  • the source bus bar 112 has comb-shaped irregularities at the edge portion facing the edge of the drain bus bar 111 to which the FETs 13a to 13f are fixed. That is, in the source bus bar 112, a plurality of concave portions 115, 115, ... 115 are formed on the peripheral portion. Each recess 115 is formed at a position corresponding to each gate terminal 133 of the FETs 13a to 13f.
  • the source bus bar 112 is smaller than the drain bus bar 111 and has a substantially trapezoidal plate shape.
  • the source terminal 132 of each of the FETs 13a to 13f is soldered to the edge portion except the recess 115.
  • a terminal connecting portion 113a of the gate bus bar 113 is arranged at a distance from the edge of the recess 115. Further, the resin portion 114 a of the resin portion 114 is interposed between the edge of each recess 115 and the terminal connecting portion 113 a of the gate bus bar 113. That is, the terminal connecting portion 113a of the gate bus bar 113 is surrounded by the resin portion 114a, so that the gate bus bar 113 and the source bus bar 112 are insulated.
  • the gate terminal 133 of each of the FETs 13a to 13f is connected to each gate bus bar 113.
  • the gate bus bar 113 is bent into a substantially L shape, has a terminal connecting portion 113a soldered to the gate terminal 133 at one end on the lower side, and has a circuit board 12 at the other end on the upper side. It has a board connecting portion 113b to be connected (see FIG. 5).
  • the substrate connecting portion 113b has a tapered fin shape that is thinner than the terminal connecting portion 113a.
  • the terminal connecting portion 113a is rectangular in plan view and is exposed on the lower side surface of the substrate portion 31.
  • the terminal connecting portion 113a is provided so as to be flush with the source bus bar 112 and the resin portion 114a.
  • the gate terminals 133 of the FETs 13a to 13f are soldered to the terminal connecting portions 113a, and the terminal connecting portions 113a are surrounded by the resin portion 114a.
  • each resin portion 114a through holes 16, 16 are formed near the gate terminal 133 (terminal connecting portion 113a) in the resin portion 114a (substrate portion 31) in the thickness direction, that is, in the vertical direction.
  • the through hole 16 is formed at the boundary between the terminal connecting portion 113a and the resin portion 114a.
  • the through holes 16 are formed on both sides of the terminal connecting portion 113a in the left-right direction. In the present embodiment, the case where the through holes 16 are provided at two positions will be described as an example, but the present invention is not limited to this and may be formed at three or more positions.
  • the FETs 13a to 13f arranged side by side on the lower surface of the substrate portion 31 are covered by the recess 222 of the heat dissipation portion 22.
  • the FETs 13a to 13f When the FETs 13a to 13f generate heat, the heat is conducted to the inside of the recess 222 and is air-cooled via the plurality of heat radiation fins 221.
  • the through hole 16 is formed in the substrate portion 31 for each of the FETs 13a to 13f. This facilitates ventilation between the upper side of the substrate portion 31 and the lower side of the substrate portion 31. That is, in the circuit structure 10 according to the present embodiment, the air below the substrate portion 31 on which the FETs 13a to 13f, which are heating elements, are mounted is freely moved to the upper side of the substrate portion 31 through the through hole 16. Yes (see the arrow in FIG. 6). Therefore, when heat is generated by the FETs 13a to 13f, hot air containing such heat does not stay in the recess 222 and moves to the upper side of the substrate portion 31 through the through hole 16, thereby providing a heat dissipation effect.
  • the through hole 16 is formed near the gate terminal 133 (terminal connecting portion 113a). That is, since the through hole 16 is formed for each of the FETs 13a to 13f and near the heat source FETs 13a to 13f, the heat can be radiated more efficiently.
  • the circuit structure 10 uses the through holes 16 in addition to the heat radiation fins 221 to radiate the heat generated by the FETs 13a to 13f, so that the heat can be radiated more reliably. Therefore, it is possible to prevent the malfunctions and failures of the FETs 13a to 13f from occurring due to the heat generated in the FETs 13a to 13f and the secondary thermal damage to the electronic components and the like around the FETs 13a to 13f.
  • the through hole 16 is formed in the resin portion 114a in the vicinity of the gate terminal 133 (terminal connecting portion 113a). Therefore, the through hole 16 can be formed more easily than the terminal connecting portion 113a.
  • the circuit structure 10 according to this embodiment is not limited to this.
  • the through holes 16 may be formed in any of the drain bus bar 111, the source bus bar 112, and the gate bus bar 113 as long as they are near the FETs 13a to 13f.
  • the through hole 16 When the through hole 16 is formed in any of the drain bus bar 111, the source bus bar 112, and the gate bus bar 113, there is a concern that the current resistance in each bus bar increases. The resistance is proportional to the amount of current flowing. On the other hand, as described above, a current smaller than the drain terminal 131 and the source terminal 132 flows through the gate terminal 133. Therefore, it is desirable that the through hole 16 be formed near the gate terminal 133 or the gate bus bar 113 through which a smaller current than the drain bus bar 111 and the source bus bar 112 flows.
  • the through hole 16 is formed in any of the drain bus bar 111, the source bus bar 112, and the gate bus bar 113, there is a concern that the resistance may increase. It is more desirable that the hole 16 is provided in the resin portion 114.
  • FIG. 7 is a partial vertical cross-sectional view showing the relationship between the FETs 13a to 13f and the recess 222 in the electric device 1 according to the second embodiment.
  • FETs 13 a to 13 f are mounted on the lower side surface of the substrate portion 31, and the FETs 13 a to 13 f are covered by the recess 222 of the heat radiating portion 22.
  • the heat conductive material 40 is interposed between the FETs 13a to 13f and the inner side surface of the recess 222.
  • the heat conductive material 40 is, for example, grease or a heat transfer sheet having excellent heat conductivity.
  • the heat conductive material 40 is in contact with, for example, the lower side surface of the FETs 13a to 13f and the inner side surface of the recess 222, and transfers the heat generated from the FETs 13a to 13f to the recess 222.
  • the FETs 13a to 13f when the FETs 13a to 13f generate heat, such heat is quickly conducted to the recess 222 via the heat conductive material 40.
  • the heat radiation fin 221 acquires heat from the recess 222 and cools it by air. Therefore, the heat generated by the FETs 13a to 13f can be radiated more effectively.

Abstract

A circuit structure which is provided with a plurality of FETs (13), each having a source terminal (132) and a gate terminal (133). This circuit structure is provided with: a substrate part (31) to which the source terminal (132) and the gate terminal (133) are connected; and through holes (16) which are formed in the substrate part (31) in positions corresponding to the FETs (13), and which penetrate through the substrate part (31) in the thickness direction.

Description

回路構造体及び電気接続箱Circuit structure and electrical junction box
 本発明は、複数の半導体素子を備える回路構造体及び電気接続箱に関する。
 本出願は、2018年10月16日出願の日本出願第2018-195245号に基づく優先権を主張し、前記日本出願に記載された全ての記載内容を援用するものである。
The present invention relates to a circuit structure including a plurality of semiconductor elements and an electric junction box.
This application claims priority based on Japanese application No. 2018-195245 filed on October 16, 2018, and incorporates all the contents described in the Japanese application.
 従来、比較的大きな電流を導通させるための回路を構成する導電部材(バスバー等とも称される)が実装された回路構造体が一般的に知られている。 Conventionally, a circuit structure in which a conductive member (also called a bus bar or the like) that constitutes a circuit for conducting a relatively large current is mounted is generally known.
 一方、特許文献1には、筐体内に設けられた電気部品から発生した熱を筐体の外部に速やかに排出させ、筐体内に外気を取り込んで電気部品を冷却するため、斯かる筐体に孔を形成した電子装置が開示されている。 On the other hand, in Patent Document 1, heat generated from an electric component provided in the casing is quickly discharged to the outside of the casing, and outside air is taken into the casing to cool the electric component. Electronic devices having holes are disclosed.
特開2018-063982号公報Japanese Patent Laid-Open No. 2018-063982
 本開示の一態様に係る回路構造体は、第1端子及び第2端子を有する半導体素子を複数備える回路構造体において、前記第1端子及び前記第2端子が接続された基板部と、半導体素子毎に前記基板部に形成され、前記基板部を厚み方向に貫通する貫通孔とを備える。 A circuit structure according to an aspect of the present disclosure is a circuit structure including a plurality of semiconductor elements having a first terminal and a second terminal, and a substrate part to which the first terminal and the second terminal are connected, and a semiconductor element. And a through hole that is formed in the substrate portion for each and penetrates the substrate portion in the thickness direction.
 本開示の一態様に係る電気接続箱は、上述の回路構造体と、前記複数の半導体素子を覆う放熱窪み部と、各半導体素子と前記放熱窪み部との間に介在する熱伝導材とを備える。 An electrical junction box according to an aspect of the present disclosure includes the above-described circuit structure, a heat dissipation recess portion that covers the plurality of semiconductor elements, and a heat conductive material that is interposed between each semiconductor element and the heat dissipation recess portion. Prepare
実施形態1に係る電気装置の正面図である。3 is a front view of the electric device according to the first embodiment. FIG. 実施形態1に係る電気装置の分解図である。3 is an exploded view of the electric device according to the first embodiment. FIG. 実施形態1に係る電気装置の回路構造体を下方から見た概略図である。3 is a schematic view of the circuit structure of the electric device according to the first embodiment as viewed from below. FIG. 図3において破線で囲まれた部分を拡大して示す拡大図である。It is an enlarged view which expands and shows the part enclosed with the broken line in FIG. 図4のV-V線による概略的縦断面図である。FIG. 5 is a schematic vertical sectional view taken along line VV of FIG. 4. 図4のVI-VI線による概略的縦断面図である。FIG. 5 is a schematic vertical sectional view taken along line VI-VI of FIG. 4. 実施形態2に係る電気装置において、FETと窪み部との関係を示す部分的縦断面図である。FIG. 6 is a partial vertical cross-sectional view showing the relationship between the FET and the recess in the electric device according to the second embodiment.
[本開示が解決しようとする課題]
 上述したような回路構造体においては、大きな電流が半導体素子のような電子部品に流れることから、斯かる電子部品に加え、導電部材においても大量の熱が発する。このように発生した熱は前記電子部品の誤動作の原因になるうえに、周囲の電子部品等が二次的に熱的弊害を被る恐れもある。
[Problems to be solved by the present disclosure]
In the circuit structure as described above, a large current flows through an electronic component such as a semiconductor element, so that a large amount of heat is generated not only by the electronic component but also by the conductive member. The heat thus generated may cause malfunction of the electronic components, and may also cause secondary thermal damage to surrounding electronic components and the like.
 特許文献1の電子装置においては、このような問題に対応するため、筐体に孔を形成しているものの、筐体に孔を形成したため、外部から筐体内に埃、水等が入り込む虞がある。特許文献1の電子装置においてはこれを防ぐためにフィルタを別途設けており、その結果、複雑な構成になるうえに、製造コストが高まるという問題がある。 In the electronic device of Patent Document 1, in order to address such a problem, a hole is formed in the housing, but since the hole is formed in the housing, dust, water, etc. may enter the housing from the outside. is there. In the electronic device of Patent Document 1, a filter is separately provided in order to prevent this, and as a result, there is a problem that the structure becomes complicated and the manufacturing cost increases.
 そこで、簡単な構成にて半導体素子が発する熱の放熱性を高めることができる回路構造体及び電気接続箱を提供することを目的とする。 Therefore, it is an object of the present invention to provide a circuit structure and an electrical junction box that can improve the heat dissipation of the heat generated by a semiconductor element with a simple structure.
[本開示の効果]
 本開示の一態様によれば、簡単な構成にて半導体素子が発する熱の放熱性を高めることができる。
[Effect of the present disclosure]
According to one aspect of the present disclosure, it is possible to enhance the heat dissipation of heat generated by a semiconductor element with a simple configuration.
[本発明の実施形態の説明]
 最初に本開示の実施態様を列挙して説明する。また、以下に記載する実施形態の少なくとも一部を任意に組み合わせてもよい。
[Description of Embodiments of the Present Invention]
First, embodiments of the present disclosure will be listed and described. Further, at least a part of the embodiments described below may be arbitrarily combined.
(1)本開示の一態様に係る回路構造体は、第1端子及び第2端子を有する半導体素子を複数備える回路構造体において、前記第1端子及び前記第2端子が接続された基板部と、半導体素子毎に前記基板部に形成され、前記基板部を厚み方向に貫通する貫通孔とを備える。 (1) A circuit structure according to an aspect of the present disclosure is a circuit structure including a plurality of semiconductor elements having a first terminal and a second terminal, and a substrate part to which the first terminal and the second terminal are connected. A through hole formed in the substrate portion for each semiconductor element and penetrating the substrate portion in the thickness direction.
 本態様にあっては、半導体素子毎に、基板部を厚み方向に貫通する貫通孔が斯かる基板部に形成されている。従って、半導体素子が熱を発する場合、斯かる熱が斯かる貫通孔を介して、基板部の一面側から基板部の他面側に移動でき、放熱効果を奏する。 In this aspect, a through hole that penetrates the substrate portion in the thickness direction is formed in the substrate portion for each semiconductor element. Therefore, when the semiconductor element emits heat, such heat can be transferred from one surface side of the substrate section to the other surface side of the substrate section through the through hole, and a heat dissipation effect is achieved.
(2)本開示の一態様に係る回路構造体は、前記第2端子には前記第1端子より小さい電流が流れ、前記複数の半導体素子の前記第1端子と接続する導電板と、各半導体素子の前記第2端子と接続する前記複数の通電部材とを備え、前記貫通孔は前記第2端子の近傍に形成されている。 (2) In the circuit structure according to one aspect of the present disclosure, a current smaller than the first terminal flows through the second terminal, a conductive plate connected to the first terminals of the plurality of semiconductor elements, and each semiconductor. The plurality of current-carrying members connected to the second terminal of the element are provided, and the through hole is formed in the vicinity of the second terminal.
 本態様にあっては、第1端子より小さい電流が流れる第2端子が接続された通電部材の近傍に、貫通孔が形成されている。より小さい電流が流れる第2端子(通電部材)の近傍に貫通孔を形成することで、斯かる貫通孔によって抵抗が増加することを未然に防止できる。 In this aspect, the through hole is formed in the vicinity of the conducting member to which the second terminal through which the current smaller than the first terminal flows is connected. By forming the through hole in the vicinity of the second terminal (current-carrying member) through which a smaller current flows, it is possible to prevent the resistance from increasing due to the through hole.
(3)本開示の一態様に係る回路構造体は、前記導電板は前記通電部材の一端部が内側に配置された凹部を有し、前記凹部に係る縁と前記通電部材の一端部との間には樹脂部が形成され、前記貫通孔は前記樹脂部に形成されている。 (3) In the circuit structure according to an aspect of the present disclosure, the conductive plate has a recess in which one end of the current-carrying member is arranged, and an edge of the recess and an end of the current-carrying member. A resin portion is formed in between, and the through hole is formed in the resin portion.
 本態様にあっては、通電部材の一端部が、導電板の凹部の内側にて、樹脂部を挟んで配置されており、斯かる樹脂部に貫通孔が形成されている。このように、樹脂部に貫通孔が形成されているので、通電部材又は導電板に貫通孔を形成することによる抵抗の増加を防ぎ、かつ貫通孔の形成が容易である。 In this aspect, one end of the current-carrying member is arranged inside the recess of the conductive plate with the resin portion sandwiched therebetween, and the through hole is formed in the resin portion. Since the through hole is formed in the resin portion in this way, it is possible to prevent an increase in resistance due to forming the through hole in the current-carrying member or the conductive plate and to easily form the through hole.
(4)本開示の一態様に係る電気接続箱は、上述した何れか一つの回路構造体と、前記複数の半導体素子を覆う放熱窪み部と、各半導体素子と前記放熱窪み部との間に介在する熱伝導材とを備える。 (4) An electrical junction box according to an aspect of the present disclosure is provided with any one of the above-described circuit structures, a heat dissipation recess portion that covers the plurality of semiconductor elements, and between each semiconductor element and the heat dissipation recess portion. And an intervening heat conductive material.
 本態様にあっては、半導体素子と放電窪み部との間に熱伝導材が介在している。熱伝導材は半導体素子及び放熱窪み部の内側面に接しており、半導体素子から発せられる熱を放熱窪み部に素早く伝達する。従って、半導体素子が発する熱を効果的に放熱することができる。 In this aspect, the heat conductive material is interposed between the semiconductor element and the discharge recess. The heat-conducting material is in contact with the inner surfaces of the semiconductor element and the heat dissipation recess, and quickly transfers the heat generated from the semiconductor element to the heat dissipation recess. Therefore, the heat generated by the semiconductor element can be effectively dissipated.
(5)本開示の一態様に係る電気接続箱は、前記放熱窪み部の外側に設けられ、前記放熱窪み部から熱を取得して放熱する放熱フィンを備える。 (5) The electrical junction box according to an aspect of the present disclosure includes a heat dissipation fin that is provided outside the heat dissipation recess and that acquires heat from the heat dissipation recess and dissipates the heat.
 本態様にあっては、放熱窪み部の外側に放熱フィンが設けられている。従って、半導体素子から発せられる熱を、熱伝導材が放熱窪み部に伝達し、放熱窪み部に伝達された熱は放熱フィンを介して空冷される。従って、半導体素子が発する熱を効果的に放熱することができる。 In this aspect, the heat dissipation fins are provided outside the heat dissipation recess. Therefore, the heat conductive material transfers the heat generated from the semiconductor element to the heat dissipation recess, and the heat transferred to the heat dissipation recess is air-cooled through the heat dissipation fins. Therefore, the heat generated by the semiconductor element can be effectively dissipated.
[本発明の実施形態の詳細]
 本発明をその実施形態を示す図面に基づいて具体的に説明する。本開示の実施形態に係る回路構造体及び電気接続箱を、以下に図面を参照しつつ説明する。なお、本発明はこれらの例示に限定されるものではなく、請求の範囲によって示され、請求の範囲と均等の意味及び範囲内でのすべての変更が含まれることが意図される。
[Details of the embodiment of the present invention]
The present invention will be specifically described based on the drawings showing the embodiments. A circuit structure and an electric junction box according to an embodiment of the present disclosure will be described below with reference to the drawings. It should be noted that the present invention is not limited to these exemplifications, and is shown by the scope of the claims, and is intended to include meanings equivalent to the scope of the claims and all modifications within the scope.
(実施形態1)
 以下においては、実施形態1に係る回路構造体を備えた電気装置(電気接続箱)を例に挙げて説明する。図1は、実施形態1に係る電気装置1の正面図であり、図2は、実施形態1に係る電気装置1の分解図である。
 電気装置1は、車両が備えるバッテリなどの電源と、ランプ、ワイパ等の車載電装品又はモータなどからなる負荷との間の電力供給経路に配される電気接続箱である。電気装置1は、例えばDC-DCコンバータ、インバータなどの電子部品として用いられる。
(Embodiment 1)
In the following, an electric device (electric junction box) including the circuit structure according to the first embodiment will be described as an example. FIG. 1 is a front view of the electric device 1 according to the first embodiment, and FIG. 2 is an exploded view of the electric device 1 according to the first embodiment.
The electric device 1 is an electric connection box that is arranged in a power supply path between a power source such as a battery provided in a vehicle and a load such as a vehicle electric component such as a lamp and a wiper or a motor. The electric device 1 is used as an electronic component such as a DC-DC converter or an inverter.
 実施形態1では、便宜上、図1及び図2に示す前後、左右、上下の各方向により、電気装置1の「前」、「後」、「左」、「右」、「上」、「下」を定義する。以下では、このように定義される前後、左右、上下の各方向を用いて、電気装置1の構成について説明する。 In the first embodiment, for convenience, “front”, “rear”, “left”, “right”, “top”, “bottom” of the electric device 1 are defined by the front, rear, left, right, and upper and lower directions shown in FIGS. 1 and 2. Is defined. Hereinafter, the configuration of the electric device 1 will be described using the front, rear, left, right, and upper and lower directions defined in this way.
 電気装置1は、回路構造体10と、回路パターンを有する回路基板12と、回路構造体10を支持する支持部材20とを備える。
 回路構造体10は、電力回路を構成するバスバー、回路基板及びバスバーに実装される電子部品を備える。電子部品は、電気装置1の用途に応じて適宜実装され、FET(Field Effect Transistor)などのスイッチング素子、抵抗、コイル、コンデンサ等を含む。
The electric device 1 includes a circuit structure 10, a circuit board 12 having a circuit pattern, and a support member 20 that supports the circuit structure 10.
The circuit structure 10 includes a bus bar that constitutes a power circuit, a circuit board, and electronic components mounted on the bus bar. The electronic component is appropriately mounted according to the use of the electric device 1, and includes a switching element such as a FET (Field Effect Transistor), a resistor, a coil, a capacitor, and the like.
 支持部材20は、上面に回路構造体10を支持する支持面211を有する基部21と、支持面211とは反対側の面(下面212)に設けられた放熱部22と、放熱部22を挟んで基部21の左右両端に設けられた複数の脚部23とを備える。支持部材20が備える基部21、放熱部22、及び脚部23は、例えば、アルミニウム、アルミニウム合金等の金属材料を用いたダイキャストにより一体的に成形される。 The support member 20 sandwiches the base portion 21 having a support surface 211 for supporting the circuit structure 10 on the upper surface, the heat dissipation portion 22 provided on the surface (lower surface 212) opposite to the support surface 211, and the heat dissipation portion 22. And a plurality of leg portions 23 provided at both left and right ends of the base portion 21. The base portion 21, the heat radiation portion 22, and the leg portion 23 included in the support member 20 are integrally formed by die casting using a metal material such as aluminum or aluminum alloy.
 基部21は、適宜の厚みを有する矩形状の平板部材である。基部21の支持面211には、接着、ネジ止め、ハンダ付け等の公知の方法にて、回路構造体10が固定される。 The base 21 is a rectangular flat plate member having an appropriate thickness. The circuit structure 10 is fixed to the support surface 211 of the base portion 21 by a known method such as adhesion, screwing, or soldering.
 放熱部22は、基部21の下面212から下方に向けて突出した複数の放熱フィン221を備え、回路構造体10から発せられる熱を外部へ放熱する。複数の放熱フィン221は、左右方向に延びると共に、前後方向に間隔を隔てて並設されている。また、放熱部22では、後述するFET13を覆う窪み部222(放熱窪み部)が形成されており、窪み部222の外側には放熱フィン221が設けられている。 The heat dissipating section 22 includes a plurality of heat dissipating fins 221 projecting downward from the lower surface 212 of the base section 21, and dissipates heat generated from the circuit structure 10 to the outside. The plurality of heat radiation fins 221 extend in the left-right direction and are arranged in parallel in the front-rear direction at intervals. Further, in the heat dissipation portion 22, a recess 222 (heat dissipation recess) that covers the FET 13 described later is formed, and the heat dissipation fin 221 is provided outside the recess 222.
 脚部23は、基部21の左右両端に設けられている。各脚部23は、基部21の左右側に夫々一つ又は複数設けられている。 Legs 23 are provided on both left and right ends of the base 21. One or a plurality of leg portions 23 are provided on the left and right sides of the base portion 21, respectively.
 回路基板12は、例えば略矩形状の絶縁基板を有する。この絶縁基板には、抵抗、コイル、コンデンサ、ダイオード等の電子部品を備えた制御回路(不図示)が実装されると共に、これらの電子部品を電気的に接続する回路パターンが形成されている。回路基板12の制御回路は後述する電力回路30にオン/オフ信号を与え、電力回路30を制御する。なお、回路基板12及び電力回路30は収容部11に収容される。 The circuit board 12 has, for example, a substantially rectangular insulating board. A control circuit (not shown) including electronic components such as resistors, coils, capacitors, and diodes is mounted on this insulating substrate, and a circuit pattern for electrically connecting these electronic components is formed. The control circuit of the circuit board 12 gives an ON / OFF signal to the power circuit 30 described later to control the power circuit 30. The circuit board 12 and the power circuit 30 are housed in the housing unit 11.
 図3は、実施形態1に係る電気装置1の回路構造体10を下方から見た概略図である。即ち、図3は、図2の矢印方向から見た場合の回路構造体10を示す図である。 FIG. 3 is a schematic view of the circuit structure 10 of the electric device 1 according to the first embodiment as viewed from below. That is, FIG. 3 is a diagram showing the circuit structure 10 when viewed from the direction of the arrow in FIG.
 回路構造体10は電力回路30を備える。電力回路30は、バスバー111~113と、回路基板12からの制御信号が入力されると、入力された制御信号に基づき通電/非通電を切り替える半導体スイッチング素子13(半導体素子)とを少なくとも備える。 The circuit structure 10 includes a power circuit 30. The power circuit 30 includes at least bus bars 111 to 113, and a semiconductor switching element 13 (semiconductor element) that switches energization / de-energization based on the input control signal when a control signal from the circuit board 12 is input.
 半導体スイッチング素子13は、例えばFET(より具体的には面実装タイプのパワーMOSFET)であり、バスバー111~113の下面側に実装される。バスバー111~112の下面側には半導体スイッチング素子13(以下、FET13と称する)の他に、ツェナーダイオード等の電子部品が実装されてもよい。 The semiconductor switching element 13 is, for example, an FET (more specifically, a surface mounting type power MOSFET), and is mounted on the lower surface side of the bus bars 111 to 113. In addition to the semiconductor switching element 13 (hereinafter referred to as FET 13), electronic components such as a Zener diode may be mounted on the lower surface side of the bus bars 111 to 112.
 FET13は、例えば、素子本体の一主面にドレイン端子131を備え、ドレイン端子131は素子本体の一側面側にはみ出ている。また、FET13は前記一側面と対向する他側面にソース端子132(第1端子)及びゲート端子133(第2端子)を備える。図3には、6つのFET13a~13fが電力回路30に実装されている場合を例示しているが、これに限るものでない。以下、FET13a~13fをFET13とも言う。 The FET 13 includes, for example, a drain terminal 131 on one main surface of the element body, and the drain terminal 131 protrudes on one side surface side of the element body. Further, the FET 13 includes a source terminal 132 (first terminal) and a gate terminal 133 (second terminal) on the other side surface facing the one side surface. FIG. 3 illustrates the case where the six FETs 13a to 13f are mounted in the power circuit 30, but the present invention is not limited to this. Hereinafter, the FETs 13a to 13f are also referred to as the FET 13.
 FET13のドレイン端子131はバスバー111に半田接続されている。以下、バスバー111をドレインバスバー111と称する。また、FET13のソース端子132はバスバー112(導電板)に半田接続されている。以下、バスバー112をソースバスバー112と称する。
 これらのドレインバスバー111及びソースバスバー112は、銅又は銅合金等の金属材料により形成された導電性板部材である。
The drain terminal 131 of the FET 13 is soldered to the bus bar 111. Hereinafter, the bus bar 111 will be referred to as the drain bus bar 111. The source terminal 132 of the FET 13 is soldered to the bus bar 112 (conductive plate). Hereinafter, the bus bar 112 will be referred to as the source bus bar 112.
The drain bus bar 111 and the source bus bar 112 are conductive plate members formed of a metal material such as copper or copper alloy.
 一方、FET13のゲート端子133は、ソース端子132及びドレイン端子131より小さい電流が流れ、かつバスバー113(通電部材)に半田接続されている。以下、バスバー113をゲートバスバー113と称する。ゲートバスバー113は、銅又は銅合金等の金属材料により形成された導電性部材である。 On the other hand, the gate terminal 133 of the FET 13 carries a smaller current than the source terminal 132 and the drain terminal 131, and is soldered to the bus bar 113 (current-carrying member). Hereinafter, the bus bar 113 will be referred to as the gate bus bar 113. The gate bus bar 113 is a conductive member made of a metal material such as copper or a copper alloy.
 ドレインバスバー111、ソースバスバー112及びゲートバスバー113の夫々の間には絶縁性樹脂材の樹脂部114が介在しており、ドレインバスバー111、ソースバスバー112及びゲートバスバー113は、樹脂部114と共に一体化されて基板部31を構成している。 A resin portion 114 of an insulating resin material is interposed between the drain bus bar 111, the source bus bar 112, and the gate bus bar 113, and the drain bus bar 111, the source bus bar 112, and the gate bus bar 113 are integrated with the resin portion 114. Thus, the substrate portion 31 is formed.
 基板部31は上下方向視で略矩形であり、下側が扁平な面をなしている。基板部31の斯かる下側面にFET13a~13fが実装されている。FET13a~13fは、基板部31の長手方向(左右方向)に沿って一列に並設されている。 The board portion 31 has a substantially rectangular shape when viewed from above and below, and has a flat surface on the lower side. The FETs 13a to 13f are mounted on the lower side surface of the board portion 31. The FETs 13a to 13f are arranged in a line along the longitudinal direction (left-right direction) of the substrate portion 31.
 樹脂部114は、例えばフェノール樹脂、ガラスエポキシ樹脂などの絶縁性樹脂材料を用いたインサート成形により製造される。例えば、樹脂部114及び収容部11は一つの工程にて一体形成される。また、収容部11は、周壁の内周面に形成されたリブ(図示せず)によって回路基板12の周縁部を下面側から支持する。 The resin portion 114 is manufactured by insert molding using an insulating resin material such as phenol resin or glass epoxy resin. For example, the resin part 114 and the housing part 11 are integrally formed in one step. Further, the housing portion 11 supports the peripheral portion of the circuit board 12 from the lower surface side by ribs (not shown) formed on the inner peripheral surface of the peripheral wall.
 樹脂部114は、ドレインバスバー111、ソースバスバー112及びゲートバスバー113と係合することによって、これらを一体化する。また、樹脂部114はその一部がドレインバスバー111、ソースバスバー112及びゲートバスバー113夫々の間に配されることによって、各バスバー間を絶縁する。 The resin portion 114 integrates the drain bus bar 111, the source bus bar 112, and the gate bus bar 113 by engaging them. Further, a part of the resin portion 114 is arranged between the drain bus bar 111, the source bus bar 112, and the gate bus bar 113 to insulate the bus bars from each other.
 収容部11の右側側壁の外側には、コネクタ端子(図示せず)の外側端部を保護する円筒形のハウジング5が取り付けられている。 A cylindrical housing 5 that protects the outer ends of connector terminals (not shown) is attached to the outside of the right side wall of the housing 11.
 図4は、図3において破線で囲まれた部分を拡大して示す拡大図であり、図5は、図4のV-V線による概略的縦断面図であり、図6は、図4のVI-VI線による概略的縦断面図である。 4 is an enlarged view showing an enlarged portion surrounded by a broken line in FIG. 3, FIG. 5 is a schematic vertical sectional view taken along line VV of FIG. 4, and FIG. FIG. 6 is a schematic vertical sectional view taken along line VI-VI.
 ドレインバスバー111は、ソースバスバー112及びゲートバスバー113より大きく、矩形の板状をなしている。即ち、ドレインバスバー111は、基板部31において露出面積が最も広く、前側の大部分を占める。また、FET13a~13fは、夫々ドレイン端子131がドレインバスバー111に半田付けされることによって、ドレインバスバー111に固定されている。 The drain bus bar 111 is larger than the source bus bar 112 and the gate bus bar 113, and has a rectangular plate shape. That is, the drain bus bar 111 has the largest exposed area in the substrate portion 31, and occupies most of the front side. The FETs 13a to 13f are fixed to the drain bus bar 111 by soldering the drain terminals 131 to the drain bus bar 111, respectively.
 ドレインバスバー111及びソースバスバー112の間には、樹脂部114のうち樹脂部114bが介在している。即ち、ドレインバスバー111及びソースバスバー112は樹脂部114bを挟んで対向している。ドレインバスバー111においては、ソースバスバー112と対向する辺縁部に、夫々のソース端子132及びゲート端子133がソースバスバー112に向かうように、FET13a~13fが並設されている。 The resin portion 114b of the resin portion 114 is interposed between the drain bus bar 111 and the source bus bar 112. That is, the drain bus bar 111 and the source bus bar 112 face each other with the resin portion 114b interposed therebetween. In the drain bus bar 111, FETs 13a to 13f are juxtaposed at the peripheral portion facing the source bus bar 112 so that the source terminal 132 and the gate terminal 133 face the source bus bar 112, respectively.
 ソースバスバー112は、ドレインバスバー111においてFET13a~13fが固定された辺縁と対向する辺縁部が櫛状に凹凸している。即ち、ソースバスバー112においては、前記辺縁部に複数の凹部115,115,…115が形成されている。各凹部115は、FET13a~13fの夫々のゲート端子133に対応する位置に形成されている。 The source bus bar 112 has comb-shaped irregularities at the edge portion facing the edge of the drain bus bar 111 to which the FETs 13a to 13f are fixed. That is, in the source bus bar 112, a plurality of concave portions 115, 115, ... 115 are formed on the peripheral portion. Each recess 115 is formed at a position corresponding to each gate terminal 133 of the FETs 13a to 13f.
 ソースバスバー112は、ドレインバスバー111より小さく、略台形の板状をなしている。ソースバスバー112においては、FET13a~13fの夫々のソース端子132が、凹部115を除く前記辺縁部に半田付けされている。 The source bus bar 112 is smaller than the drain bus bar 111 and has a substantially trapezoidal plate shape. In the source bus bar 112, the source terminal 132 of each of the FETs 13a to 13f is soldered to the edge portion except the recess 115.
 各凹部115の内側には、凹部115の縁から間隔を隔てて後述するゲートバスバー113の端子接続部113aが配置されている。また、各凹部115の縁とゲートバスバー113の端子接続部113aとの間には、樹脂部114のうち樹脂部114aが介在している。即ち、ゲートバスバー113の端子接続部113aは樹脂部114aによって取り囲まれており、これによって、ゲートバスバー113及びソースバスバー112が絶縁されている。 Inside each recess 115, a terminal connecting portion 113a of the gate bus bar 113, which will be described later, is arranged at a distance from the edge of the recess 115. Further, the resin portion 114 a of the resin portion 114 is interposed between the edge of each recess 115 and the terminal connecting portion 113 a of the gate bus bar 113. That is, the terminal connecting portion 113a of the gate bus bar 113 is surrounded by the resin portion 114a, so that the gate bus bar 113 and the source bus bar 112 are insulated.
 各ゲートバスバー113には、FET13a~13fの夫々のゲート端子133が接続されている。詳しくは、ゲートバスバー113は、略L字状に屈曲しており、下側の一端に、ゲート端子133と半田付けされた端子接続部113aを有し、上側の他端に、回路基板12と接続する基板接続部113bを有する(図5参照)。ゲートバスバー113は、基板接続部113bが端子接続部113aより細い先細りのフィン形状をなしている。 The gate terminal 133 of each of the FETs 13a to 13f is connected to each gate bus bar 113. Specifically, the gate bus bar 113 is bent into a substantially L shape, has a terminal connecting portion 113a soldered to the gate terminal 133 at one end on the lower side, and has a circuit board 12 at the other end on the upper side. It has a board connecting portion 113b to be connected (see FIG. 5). In the gate bus bar 113, the substrate connecting portion 113b has a tapered fin shape that is thinner than the terminal connecting portion 113a.
 端子接続部113aは、平面視において矩形であり、基板部31の下側面に露出されている。端子接続部113aはソースバスバー112及び樹脂部114aと面一をなすように設けられている。上述したように、各端子接続部113aには、FET13a~13fの夫々のゲート端子133が半田付けされており、端子接続部113aは樹脂部114aによって取り囲まれている。 The terminal connecting portion 113a is rectangular in plan view and is exposed on the lower side surface of the substrate portion 31. The terminal connecting portion 113a is provided so as to be flush with the source bus bar 112 and the resin portion 114a. As described above, the gate terminals 133 of the FETs 13a to 13f are soldered to the terminal connecting portions 113a, and the terminal connecting portions 113a are surrounded by the resin portion 114a.
 各樹脂部114aにおいてはゲート端子133(端子接続部113a)近傍に、樹脂部114a(基板部31)を厚み方向、即ち上下方向に貫通する貫通孔16,16が形成されている。例えば、貫通孔16は、端子接続部113aと樹脂部114aとの境界に形成されている。貫通孔16は左右方向において、端子接続部113aの両側に夫々形成されている。本実施形態においては、貫通孔16が2箇所に設けられた場合を例に説明するが、これに限るものでなく、3箇所以上に形成されても良い。 In each resin portion 114a, through holes 16, 16 are formed near the gate terminal 133 (terminal connecting portion 113a) in the resin portion 114a (substrate portion 31) in the thickness direction, that is, in the vertical direction. For example, the through hole 16 is formed at the boundary between the terminal connecting portion 113a and the resin portion 114a. The through holes 16 are formed on both sides of the terminal connecting portion 113a in the left-right direction. In the present embodiment, the case where the through holes 16 are provided at two positions will be described as an example, but the present invention is not limited to this and may be formed at three or more positions.
 基板部31の下側面に並設されたFET13a~13fは放熱部22の窪み部222によって覆われている。FET13a~13fが発熱した場合は、斯かる熱は窪み部222の内側に伝導され、複数の放熱フィン221を介して空冷される。 The FETs 13a to 13f arranged side by side on the lower surface of the substrate portion 31 are covered by the recess 222 of the heat dissipation portion 22. When the FETs 13a to 13f generate heat, the heat is conducted to the inside of the recess 222 and is air-cooled via the plurality of heat radiation fins 221.
 更に、本実施形態に係る回路構造体10は、上述したように、FET13a~13f毎に、基板部31に貫通孔16が形成されている。これによって、基板部31の上側と、基板部31の下側との間の通気が容易になる。即ち、本実施形態に係る回路構造体10においては、発熱体であるFET13a~13fが実装された基板部31の下側の空気が貫通孔16を介して、基板部31の上側へ自由に移動できる(図6中矢印参照)。従って、FET13a~13fによって熱が発生した場合、斯かる熱を含む熱い空気が窪み部222内にこもらず、貫通孔16を介して基板部31の上側に移動するので、放熱の効果を奏する。 Further, in the circuit structure 10 according to the present embodiment, as described above, the through hole 16 is formed in the substrate portion 31 for each of the FETs 13a to 13f. This facilitates ventilation between the upper side of the substrate portion 31 and the lower side of the substrate portion 31. That is, in the circuit structure 10 according to the present embodiment, the air below the substrate portion 31 on which the FETs 13a to 13f, which are heating elements, are mounted is freely moved to the upper side of the substrate portion 31 through the through hole 16. Yes (see the arrow in FIG. 6). Therefore, when heat is generated by the FETs 13a to 13f, hot air containing such heat does not stay in the recess 222 and moves to the upper side of the substrate portion 31 through the through hole 16, thereby providing a heat dissipation effect.
 また、本実施形態においては、貫通孔16がゲート端子133(端子接続部113a)の近傍に形成されている。即ち、貫通孔16が、FET13a~13f毎に、且つ熱源のFET13a~13fの近くに形成されているので、より効率的に放熱できる。 Further, in the present embodiment, the through hole 16 is formed near the gate terminal 133 (terminal connecting portion 113a). That is, since the through hole 16 is formed for each of the FETs 13a to 13f and near the heat source FETs 13a to 13f, the heat can be radiated more efficiently.
 本実施形態に係る回路構造体10は、放熱フィン221に加え、貫通孔16を用いてFET13a~13fが発する熱を放熱するので、より確実に放熱を行うことができる。よって、FET13a~13fで発生した熱によってFET13a~13fに誤動作・故障等が生じること、FET13a~13f周囲の電子部品等が二次的に熱的弊害を被ること等を未然に防止できる。 The circuit structure 10 according to the present embodiment uses the through holes 16 in addition to the heat radiation fins 221 to radiate the heat generated by the FETs 13a to 13f, so that the heat can be radiated more reliably. Therefore, it is possible to prevent the malfunctions and failures of the FETs 13a to 13f from occurring due to the heat generated in the FETs 13a to 13f and the secondary thermal damage to the electronic components and the like around the FETs 13a to 13f.
 本実施形態においては、貫通孔16がゲート端子133(端子接続部113a)の近傍であって樹脂部114aに形成されている。従って、端子接続部113aに比べて容易に貫通孔16を形成できる。
 しかし、本実施形態に係る回路構造体10はこれに限るものではない。FET13a~13fの近傍であれば、貫通孔16がドレインバスバー111、ソースバスバー112及びゲートバスバー113の何れかに形成されても良い。
In the present embodiment, the through hole 16 is formed in the resin portion 114a in the vicinity of the gate terminal 133 (terminal connecting portion 113a). Therefore, the through hole 16 can be formed more easily than the terminal connecting portion 113a.
However, the circuit structure 10 according to this embodiment is not limited to this. The through holes 16 may be formed in any of the drain bus bar 111, the source bus bar 112, and the gate bus bar 113 as long as they are near the FETs 13a to 13f.
 貫通孔16がドレインバスバー111、ソースバスバー112及びゲートバスバー113の何れかに形成された場合においては、各バスバーにおいて電流抵抗が高まることが懸念される。また、抵抗は流れる電流量に比例する。一方、上述したように、ゲート端子133には、ドレイン端子131及びソース端子132より小さい電流が流れる。従って、ドレインバスバー111及びソースバスバー112に比べて小さい電流が流れるゲート端子133又はゲートバスバー113の近傍に貫通孔16が形成されることが望ましい。 When the through hole 16 is formed in any of the drain bus bar 111, the source bus bar 112, and the gate bus bar 113, there is a concern that the current resistance in each bus bar increases. The resistance is proportional to the amount of current flowing. On the other hand, as described above, a current smaller than the drain terminal 131 and the source terminal 132 flows through the gate terminal 133. Therefore, it is desirable that the through hole 16 be formed near the gate terminal 133 or the gate bus bar 113 through which a smaller current than the drain bus bar 111 and the source bus bar 112 flows.
 更に、上述したように、貫通孔16がドレインバスバー111、ソースバスバー112及びゲートバスバー113の何れかに形成された場合は抵抗が高まることが懸念されることから、本実施形態のように、貫通孔16は樹脂部114に設けられた方が一層望ましい。 Furthermore, as described above, when the through hole 16 is formed in any of the drain bus bar 111, the source bus bar 112, and the gate bus bar 113, there is a concern that the resistance may increase. It is more desirable that the hole 16 is provided in the resin portion 114.
(実施形態2)
 図7は、実施形態2に係る電気装置1において、FET13a~13fと窪み部222との関係を示す部分的縦断面図である。
(Embodiment 2)
FIG. 7 is a partial vertical cross-sectional view showing the relationship between the FETs 13a to 13f and the recess 222 in the electric device 1 according to the second embodiment.
 図7に示すように、基板部31の下側面にはFET13a~13fが実装されており、FET13a~13fは放熱部22の窪み部222によって覆われている。更に、本実施形態においては、FET13a~13fと窪み部222の内側面との間に熱伝導材40が介在している。熱伝導材40は、例えば、熱伝導性の優れたグリース、伝熱シート等である。熱伝導材40は、例えば、FET13a~13fの下側面と、窪み部222の内側面とに接しており、FET13a~13fから発せられる熱を窪み部222に伝達する。 As shown in FIG. 7, FETs 13 a to 13 f are mounted on the lower side surface of the substrate portion 31, and the FETs 13 a to 13 f are covered by the recess 222 of the heat radiating portion 22. Further, in the present embodiment, the heat conductive material 40 is interposed between the FETs 13a to 13f and the inner side surface of the recess 222. The heat conductive material 40 is, for example, grease or a heat transfer sheet having excellent heat conductivity. The heat conductive material 40 is in contact with, for example, the lower side surface of the FETs 13a to 13f and the inner side surface of the recess 222, and transfers the heat generated from the FETs 13a to 13f to the recess 222.
 このように、本実施形態に係る電気装置1においては、FET13a~13fが発熱した場合、斯かる熱が熱伝導材40を介して素早く窪み部222に伝導される。次いで、放熱フィン221は窪み部222から熱を取得して空冷させる。従って、FET13a~13fが発する熱をより効果的に放熱できる。 As described above, in the electric device 1 according to the present embodiment, when the FETs 13a to 13f generate heat, such heat is quickly conducted to the recess 222 via the heat conductive material 40. Next, the heat radiation fin 221 acquires heat from the recess 222 and cools it by air. Therefore, the heat generated by the FETs 13a to 13f can be radiated more effectively.
 実施形態1と同様の部分については、同一の符号を付して詳細な説明を省略する。  The same parts as those of the first embodiment are designated by the same reference numerals, and detailed description thereof will be omitted. ‥
 今回開示された実施形態はすべての点で例示であって、制限的なものではないと考えられるべきである。本発明の範囲は、上記した意味ではなく、請求の範囲によって示され、請求の範囲と均等の意味及び範囲内でのすべての変更が含まれることが意図される。 The embodiments disclosed this time are to be considered as illustrative in all points and not restrictive. The scope of the present invention is shown not by the meanings described above but by the claims, and is intended to include meanings equivalent to the claims and all modifications within the scope.
 1 電気装置
 10 回路構造体
 11 収容部
 13 FET
 16 貫通孔
 22 放熱部
 30 電力回路
 31 基板部
 40 熱伝導材
 111 ドレインバスバー
 112 ソースバスバー
 113 ゲートバスバー
 113a 端子接続部
 113b 基板接続部
 114,114a,114b 樹脂部
 115 凹部
 131 ドレイン端子
 132 ソース端子
 133 ゲート端子
 221 放熱フィン
 222 窪み部
 
1 Electrical Device 10 Circuit Structure 11 Housing 13 FET
16 Through Hole 22 Heat Dissipation Section 30 Power Circuit 31 Board Section 40 Thermal Conductive Material 111 Drain Busbar 112 Source Busbar 113 Gate Busbar 113a Terminal Connection Section 113b Board Connection Section 114, 114a, 114b Resin Section 115 Recessed Section 131 Drain Terminal 132 Source Terminal 133 Gate Terminal 221 Radiating fin 222 Cavity

Claims (5)

  1.  第1端子及び第2端子を有する半導体素子を複数備える回路構造体において、
     前記第1端子及び前記第2端子が接続された基板部と、
     半導体素子毎に前記基板部に形成され、前記基板部を厚み方向に貫通する貫通孔と
     を備える回路構造体。
    In a circuit structure including a plurality of semiconductor elements having a first terminal and a second terminal,
    A substrate portion to which the first terminal and the second terminal are connected,
    A circuit structure including: a through hole formed in the substrate portion for each semiconductor element and penetrating the substrate portion in a thickness direction.
  2.  前記第2端子には前記第1端子より小さい電流が流れ、
     前記複数の半導体素子の前記第1端子と接続する導電板と、
     各半導体素子の前記第2端子と接続する前記複数と同数の通電部材とを備え、
     前記貫通孔は前記第2端子の近傍に形成されている請求項1に記載の回路構造体。
    A current smaller than that of the first terminal flows through the second terminal,
    A conductive plate connected to the first terminals of the plurality of semiconductor elements;
    A plurality of current-carrying members connected to the second terminals of the respective semiconductor elements,
    The circuit structure according to claim 1, wherein the through hole is formed in the vicinity of the second terminal.
  3.  前記導電板は前記通電部材の一端部が内側に配置された凹部を有し、
     前記凹部に係る縁と前記通電部材の一端部との間には樹脂部が形成され、
     前記貫通孔は前記樹脂部に形成されている請求項2に記載の回路構造体。
    The conductive plate has a recess in which one end of the current-carrying member is arranged inside,
    A resin portion is formed between the edge of the recess and one end of the current-carrying member,
    The circuit structure according to claim 2, wherein the through hole is formed in the resin portion.
  4.  請求項1から3の何れか一つに記載の回路構造体と、
     前記複数の半導体素子を覆う放熱窪み部と、
     各半導体素子と前記放熱窪み部との間に介在する熱伝導材とを備える電気接続箱。
    A circuit structure according to any one of claims 1 to 3,
    A heat dissipation recess portion that covers the plurality of semiconductor elements;
    An electrical junction box comprising a heat conductive material interposed between each semiconductor element and the heat dissipation recess.
  5.  前記放熱窪み部の外側に設けられ、前記放熱窪み部から熱を取得して放熱する放熱フィンを備える請求項4に記載の電気接続箱。
     
    The electrical junction box according to claim 4, further comprising a radiation fin that is provided outside the heat radiation recess portion and that receives heat from the heat radiation recess portion to radiate the heat.
PCT/JP2019/039990 2018-10-16 2019-10-10 Circuit structure and electrical junction box WO2020080248A1 (en)

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