WO2020053784A1

WO2020053784A1 - Probe for tools for carrying out tests on electrical and/or electronic circuits and assembly comprising the probe

Info

Publication number: WO2020053784A1
Application number: PCT/IB2019/057656
Authority: WO
Inventors: Bogdan Jan SKUTKIEWICZ
Original assignee: Magicmotorsport Di Bogdan Jan Skutkiewicz
Priority date: 2018-09-11
Filing date: 2019-09-11
Publication date: 2020-03-19
Also published as: CN113167818A; EP3918349A1

Abstract

A probe for carrying out tests on electrical and/or electronic circuits, adapted to be used in combination with a tester or multitester for measuring and reading one or more electrical and/or electronic parameters of the circuit, comprises a tubular body (13) defining a longitudinal axis of development (L), a tip (9) projecting from an axial end of said tubular body (13) to be in contact with one of the components of the circuit to be tested, means for electrical connection of said tip to the tester, wherein said tubular body (13) comprises means (27) for adjusting the holding force of said tip (9) on the component of the circuit with which it is placed in contact.

Description

PROBE FOR TOOLS FOR CARRYING OUT TESTS ON ELECTRICAL AND/OR ELECTRONIC CIRCUITS AND ASSEMBLY COMPRISING THE PROBE

Description

Technical Field

The present invention finds application in the technical field of systems for the control of electrical and/or electronic devices and relates to a probe for carrying out tests designed to verify the correct operation of electrical and/or electronic circuits.

The invention also relates with an assembly comprising a tool and a plurality of tips adapted to be associated with the tool to carry out one or more circuit operation tests.

State of the art

As known, tests for verifying the correct operation of electrical and/or electronic circuits, such as for example printed circuits present on electronic boards, are generally performed by means of specific tools which make it possible to detect specific parameters.

The most commonly used tools are the so-called testers or multimeters, which allow you to check the electrical continuity between the various contacts of the circuit and measure values such as voltage and current intensity, as well as possibly additional parameters such as frequency, temperature, electrical capacity, depending on of the complexity of the tool and the type of probe used.

Other types of tools, such as voltmeters, ammeters, ohms, allow instead to detect a single parameter.

The above tools, of the analogical or digital type, are all characterized by the presence of tips or probes suitable for being approached to respective contacts of the circuit to check the electrical continuity or to obtain a specific measure of the selected parameters, according to modalities that can vary from tool to tool.

A first drawback of the known solutions is that the above tools require the user to constantly support the tips or probes in order to keep them in contact with the parts of the circuit.

This operating mode, in addition to being particularly inconvenient as it requires the constant presence of the operator, can lead to errors in the reading as the operator may not apply the tip correctly or with the right intensity, despite having the perception of acting properly.

Secondly, the need to manually support the tips also does not allow to apply more than one pair of tips at a time, in order to have more readings on different pairs of contacts. Last but not least, the probes do not allow to adjust and stabilize the contact force on the component of the circuit from which to take the electrical or electronic signal. US4460868 describes one of such probes which comprises a cylindrical support body which can be inserted inside a hole of a support plate so as to remain in a vertical position during use without the need to be supported manually.

The cylindrical body is fixed inside the hole in an adjustable manner along its development axis by screwing, so as to adjust the axial position of the cylindrical body based on the dimensions of the element to be tested.

The tip placed at the lower end of the cylindrical body to come into contact with the element to be tested is also associated with a contrast spring whose purpose is to allow a slight re-entry so as to adapt to the thickness of the underlying element.

However, this probe does not provide the possibility of adjusting the contact force holding force on the component of the circuit from which to take the electrical or electronic signal.

Scope of the invention

The object of the present invention is to overcome the above drawbacks by providing a probe that can be used in association with instruments for carrying out tests on electrical and / or electronic circuits and which enables the sealing force of the contact tip to be adjusted and stabilized on the component of the circuit from which to take the electrical or electronic signal.

Another object is to provide a tool for carrying out tests on electrical and/or electronic circuits that does not require the tips, probes or other means designed to be brought into contact with the parts of the circuit for detecting one or more electrical and/or electronic features must be constantly supported by the operator during the test.

A particular object is to provide a tool for carrying out tests on electrical and/or electronic circuits which allows to apply the tips, probes or equivalent means always properly and with the right intensity to ensure contact with the parts of the circuit to be tested.

Still another object is to provide a tool for carrying out tests on electrical and/or electronic circuits which allows to perform even more tests simultaneously on different elements of the circuit.

Still another object is to provide a tool for carrying out tests on electrical and/or electronic circuits that is characterized by high efficiency and ease of use.

These objects, as well as others which will become more apparent hereinafter, are obtained by a probe adapted to be associated to a tool for carrying out tests on electrical and/or electronic circuits which, according to claim 1, comprises a tubular body defining a longitudinal development axis, a tip projecting from an axial end of said tubular body to be placed in contact with one of the components of the circuit to be tested, means for electrically connecting said tip to the tester, means for adjusting the holding force of said tip on the component of the circuit with which it is placed in contact.

Thanks to this combination of features, the probes may be placed in contact with the respective parts of the electrical circuit and kept in position without the operator having to support them manually.

Advantageous embodiments of the invention are obtained according to the dependent claims.

Brief disclosure of the drawings

Further features and advantages of the invention will become more apparent in the light of the detailed description of a preferred but not exclusive embodiment of a probe and an assembly according to the invention, illustrated as a non-limiting example with the aid of the attached drawing tables, wherein:

FIG. 1 is a perspective view of the assembly of the invention comprising a tool according to the invention and a pair of probes;

FIG. 2 is a top view of the assembly of Fig. 1;

FIG. 3 is an enlarged perspective view of a detail of the tool of Fig. 1; FIG. 4 is a perspective view of a probe adapted to be used with the tool of Fig. 3; FIG. 5 is a front view of the probe of Fig. 4;

FIG. 6 is a sectioned view of the probe of Fig. 4;

FIG. 7 is an enlarged perspective view of a first detail of the probe of Fig. 4;

la FIG. 8 is an enlarged perspective view of a second detail of the probe of Fig. 4.

Best mode of carrying out the invention

Fig· 1 shows a preferred embodiment of an assembly, generally shown with 100, for carrying out tests on electrical and/or electronic circuits.

The assembly 100 is essentially made up of a plurality of probes designed to be connected to a measuring and reading instrument for the detected parameters of a known type, and therefore not shown, and to a tool according to the invention which will have the purpose of holding in position the probes during the measurement.

The type of electrical and/or electronic parameters that can be measured or verified by the assembly will depend on the type of tester or multi-tester used and the relative probes, without particular theoretical limitations.

By way of a non-limiting example, by means of the assembly 100 according to the invention or by means of the combined use of the tool and of known-type probes, it will be possible to check the electrical continuity of one or more portions of the circuit in order to control the circuit integrity, or measure resistance, voltage, capacity or other electrical or physical parameters or verify the correct transmission of data in the tested electronic circuit.

The type of circuit is not limiting of the present invention, although preferably the circuit may be a printed circuit provided with a card or other support, such as a PCB. In its most essential configuration, the tool according to the invention, generally designated by 1, comprises a supporting frame 2 having a supporting plane 3 for positioning at least one electrical and/or electronic circuit on which to perform a test, not shown as known per se.

Preferably, the supporting plane 3 will be provided with an antistatic shelf on which positioning the circuit to be tested and which may be fixed with respect to the frame 2 or separate or adapted to be separated. Alternatively, the support plane 3 may also be absent and in this case the circuit may be arranged on any other horizontal support provided by the operator and above which the probes will operate.

The frame 2 is fastened to a support structure 4 of the tester probes, which support structure 4 may be connected to the frame 2 in a fixed or adjustable way to be arranged above the supporting surface 3, possibly adjusting the height of the probes.

The support structure 4 is provided with means for the connection of one or more probes at a time and their positioning above the supporting plane 3 at such a height as to allow the contact of the tips with the components of the circuit arranged on the supporting plane 3 and in correspondence of which you will want to pick up the electrical and/or electronic signal for carrying out the test.

In the shown configuration, the support structure 4 comprises a template 5 adapted to be placed above the supporting plane 3 at a predetermined height thereform.

Possibly, the template 5 may be hinged to one side to the frame 2 in order to be tilted or raised, for example when not in use.

The template 5 is provided with a plurality of through holes 6 distributed according to a pattern of rows and columns, so as to cover substantially the whole extension of the template 5 which in turn may have a surface extension close to that of the support plane 3.

The number and dimensions of the through holes 6 are not limitative for the present invention and will also depend on the type of probes used or usable, particularly in the case where the template 5 is designed for the use of probes of the known type, in which case the holes 6 may be substantially complementarily shaped with respect to the section of the probe body that will be arranged, in use, within the hole itself.

As known, in fact, the probes of the common testers or multi-testers comprise a cylindrical or tubular body provided at one end with a tip made of conductive material suitable for being placed in contact with a component of the circuit from which the signal is picked up and which is connected to the means for measuring and reading the signal through connection cables that cross the cylindrical body.

In the shown configuration, the tool 1 is designed to be coupled to special probes 7, illustrated more clearly in Figs, from 4 to 8, which will engage the inner edge 8 of the through holes 6 in which they are inserted, so as to stay in position with the respective lower tip 9 in contact with the component of the circuit arranged under the corresponding hole 6 also in absence of the operator.

To this end, each through hole 6 will be provided with first coupling means associated with its inner peripheral edge 8 and adapted to cooperate with second complementary coupling means associated with the probes 7.

As more clearly visible from Fig. 3, the first coupling means of each hole 6 may be defined by a pair of radial projections 10 which will be inserted into corresponding helical grooves 11 present in a disk-shaped coupling element 12 integral with the tubular body 13 of the probe 7 and having an external diameter substantially equal to the diameter of the through hole 6, as more clearly visible in the detail of Fig. 7.

In this way, the locking of the probe 7 in any one of the holes 6 will take place by inserting the disk-shaped coupling element 12 and subsequent rototranslating it inside the selected hole 6.

The latter will also be provided with a further internal annular projection 14 which will define an end-stroke for the axial translation of the probe 7.

Each probe 7 will also be provided with a spherical joint or articulated junction 15 which allows its inclination with a maximum predetermined angle above the support plane 3 with respect to any vertical plane passing through one of the diameters of the corresponding hole 6.

The joint or spherical articulated junction 15 will be arranged at the disk-shaped coupling element 12, which will thus define the point of rotation, and will allow to reach with the tip 9 also components of the circuit which are not perfectly aligned with the central axis of the hole 6 in which the respective probe 7 is inserted, for greater efficiency and flexibility of use of the tool 1 which can then be used with circuits having any configuration.

The probes 7 will also be provided with respective tips 9, which can be designed according to methods known for the sector and which will be connected to the measurement and reading instrumentation of the detected parameters in a known manner, for example by means of connection cables that cross the cylindrical tubular body 13 of the probe 7 and which are not illustrated in the present figures.

According to an alternative embodiment, not shown, the template 5 may be provided, in place of the through holes 6, of different types of seats for hooking corresponding probes, also of a known type, and their positioning in predetermined positions above the support plane 3.

These seats may be designed according to the shape of the selected probes and will have a shape such as to allow the stable coupling of the probes.

From the figures it can be seen that the support structure 4 also comprises an articulated arm 16 having a fixed end 17 connected to the frame 2 and a movable end 18 provided with means for hooking a plurality of further tips suitable to be electrically and/or electronically connected to the tester or multi-tester and to be brought into contact with corresponding components of the electronic board.

In particular, the coupling means comprise a coupling plate 19 having a seat for housing a tip-holder card 20 having a plurality of tips 21 adapted for detecting the electrical and/or electronic signal from the circuit to be tested and which protrude from one of its faces to be placed into contact with the components of the circuit present on the supporting plane 3.

Advantageously, the tips 21 are distributed according to an arrangement that reproduces that of the contacts of the circuit to be tested.

To this end, it will be possible to use for each test a special card made by applying the tips 21 in a fixed manner on the card 20 according to the selected embodiment.

Alternatively, it will always be possible to use the same support board 20 on which the tips 21 will be applied in a removable manner in order to be moved and rearranged according to the needs.

Regardless of the configuration of the tip-carrier board 20, the latter will be provided with a circuit for the electrical and/or electronic connection of the tips to the external tool for measuring and reading the parameters.

This circuit, not visible from the figures, will be provided at the output with contact terminals, also not visible from the figures, which will connect to a contact-board present on the coupling plate 19 and which in turn is connected to the measuring instrument by means of electrical and/or electronic connection means, for example cables or buses 22 for the passage of electrical and/or electronic signals.

The adjustable fixing of the coupling plate 19 to the frame 2 is carried out by means of an articulated arm 16 provided with a three-dimensional junction 23 which allows its displacement in space with respect to the supporting plane 3 according to at least three degrees of freedom as well as the positioning of the coupling plate 19 also in an inclined position with respect to the support surface 2.

The position of the articulated junction 23 will also be adjustable in height to adjust the height of the tip-carrier board 20 with respect to the support plane 3, according to the size of the tips 21 and/or of the circuit components.

In particular, the fixed end 17 of the articulated arm 16 may be fastened to the frame 2 in a height- adjustable manner.

According to a not shown variant, the tool 1 may also be devoid of the articulated arm 16 and of the corresponding coupling plate 19 to be used only by means of the above template 5.

According to a still further not shown variant, the tool 1 may instead be devoid of the template 5 and may be used exclusively by means of the articulated arm 16 and the corresponding coupling plate 19 provided with the tip-holder card 20.

In all cases, the tool and the assembly will allow multiple readings and detections of electrical and/or electronic parameters of the circuit to be carried out, even if they are different, without it being necessary for the operator to manually support the probes and having warranty on the correct contact between the probe tips and the components of the circuit to be tested.

As far as the probes 7 are concerned, according to a particularly advantageous embodiment which can also be used in the absence of the tool 1 according to any of the embodiments described above, they will comprise a tubular body 13 which extends along a longitudinal axis L and which will have the tip 9 at one longitudinal end while at the opposite longitudinal end it will have a plug 24 with a central hole 25, visible in Fig. 5, which will allow the passage of the connection cables to the measuring and reading instrument.

From the same figure it can be observed that the tip 9 is inserted in the tubular body 13 with the possibility of translating axially inside an axial cavity 26, so as to be able to exert a slightly excessing force on the circuit component, sufficient to ensure contact between the tip 9 and the circuit.

Preferably, the axial cavity 26 may also house an elastic return element, not shown, which will favour the return of the tip 9 to the initial position once it is no longer in contact with the circuit.

From the details of Figs.7 and 8, on the other hand, it is possible to observe a particular feature of the probe 7, provided, near the spherical junction 15, with means 27 for adjusting the holding force of the tip 9 on the component of the circuit with which it is placed into contact.

These adjustment means 27 comprise a friction element 28 acting on the tubular body 13 of the probe 7 and adapted to limit or block the axial sliding thereof.

In particular, the friction element 28 will comprise an externally threaded cylindrical jacket 29 placed on the tubular body 13, coaxially therewith, with the interposition of a tubular bearing 30 coaxially connected to the tubular body 13, on which an internally threaded ring nut 31 will be screwed.

The ring 31 will have a conical end 32 or otherwise tapered at which an O-ring 33 of elastomeric material will be arranged.

The O-ring 33 will be placed around the tubular body 13, in contact therewith, so as to generate friction thereon to oppose to the axial sliding thereof.

Furthermore, the O-ring 33 will rest on one of the annular faces of the tubular bearing 30, so as to remain locked between the latter and the tapered bottom wall 34 of the ring 31 and so that through a greater or less screwing of the ring 31, due to the shrinkage present at the tapered end 32, the O-ring 33 undergoes a greater or less axial crushing with consequent radial expansion and variation of the friction force exerted on the tubular body 13.

In this way, by varying the screwing of the ring 31 it is possible to adjust the holding force of the tip 9 on the contact of the circuit.

Claims

1. A probe for carrying out tests on electrical and/or electronic circuits, adapted to be used in combination with a tester or multitester for measuring and reading one or more electrical and/or electronic parameters of the circuit, comprising:

- a tubular body (13) defining a longitudinal axis of development (L);

a tip (9) projecting from an axial end of said tubular body (13) to be in contact with one of the components of the circuit to be tested;

means for electrical connection of said tip to the tester;

characterized in that said tubular body (13) comprises means (27) for adjusting the holding force of said tip (9) on the component of the circuit with which it is placed in contact.

2. Probe as claimed in claim 1, characterized in that said adjusting means (27) comprise a friction element (28) acting on said tubular body (13) and adapted to limit or block its axial sliding.

3. Probe as claimed in claim 2, characterized in that said friction element (28) comprises an externally threaded cylindrical jacket (29) placed on said tubular body (13), coaxially therewith, with the interposition of a tubular bearing (30) placed coaxially with said tubular body (13).

4. Probe as claimed in claim 3, characterized in that said friction element (28) comprises an internally threaded ring nut (31) suitable for screwing onto said cylindrical jacket (29).

5. Probe as claimed in claim 4, characterized in that said ring nut (31) has a conical end (32) or a tapered end at which an O-ring (33) of elastomeric material is arranged.

6. Probe as claimed in claim 5, characterized in that said O-ring (33) is placed around said tubular body (13), in contact therewith, and resting on one of the annular faces of said tubular bearing (30) to be locked between the latter and the tapered bottom wall (34) of said ring nut (31) and to generate on said tubular body (13) a variable friction as a function of its axial crushing produced by the screwing of said ring nut (31) on said cylindrical jacket (29).

7. An assembly for carrying out tests on electrical and/or electronic circuits, characterized by comprising:

a plurality of probes (7) each having a tip (9) adapted to be placed electrically in contact with the electrical and/or electronic components of the circuit to be tested and means for detecting one or more electrical and/or electronic parameters of the circuit, said detecting means being connected to the respective tips (9);

a tool (1) having a supporting frame (2) designed to define a support plane (3) for positioning at least one electrical and/or electronic circuit to be tested and a support structure (4) for said probes (7), said support structure (4) being connected to said frame (2) in a fixed or adjustable manner to be arranged above said support plane (3) and having means for connecting one or more probes (7) at a time and the positioning of said tips (9) on top of said support plane (3) and in contact with the components of the circuit arranged thereon.

8. Assembly as claimed in claim 7, characterized in that said support structure (4) comprises a template (5) adapted to be placed above said support plane (3) at a predetermined height therefrom and having a plurality of seats for anchoring corresponding probes (7) in predetermined positions on said support plane (3).

9. Tool as claimed in claim 8, characterized in that said anchoring seats are defined by through holes (6) formed on said template (5).

10. Tool as claimed in claim 9, characterized in that each of said through holes (6) comprises first coupling means (10) associated with its inner peripheral edge (8) and adapted to cooperate with second coupling means (11) of complementary shape associated with said probes (7).