WO2020006696A1 - Adc-based detection circuit, and microprocessor-based detection circuit - Google Patents

Adc-based detection circuit, and microprocessor-based detection circuit Download PDF

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Publication number
WO2020006696A1
WO2020006696A1 PCT/CN2018/094439 CN2018094439W WO2020006696A1 WO 2020006696 A1 WO2020006696 A1 WO 2020006696A1 CN 2018094439 W CN2018094439 W CN 2018094439W WO 2020006696 A1 WO2020006696 A1 WO 2020006696A1
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Prior art keywords
adc
detection
switch
detection circuit
input port
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PCT/CN2018/094439
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French (fr)
Chinese (zh)
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韩旺
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深圳市锐明技术股份有限公司
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Priority to CN201890000087.4U priority Critical patent/CN211377086U/en
Priority to PCT/CN2018/094439 priority patent/WO2020006696A1/en
Publication of WO2020006696A1 publication Critical patent/WO2020006696A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/66Structural association with built-in electrical component

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  • the present application belongs to the technical field of electronic circuits, and particularly relates to an ADC (Analog-to-Digital Converter, digital-to-analog converter or analog-to-digital converter) detection circuit and microprocessor-based detection circuit.
  • ADC Analog-to-Digital Converter, digital-to-analog converter or analog-to-digital converter
  • the conventional electronic system has a problem that detecting multiple electrical signals requires multiple I / O ports, which occupies a large amount of microprocessor I / O resources.
  • the traditional electronic system has a problem that using a processor to detect multiple electrical signals requires multiple I / O ports.
  • a detection circuit based on an ADC has an input port and an output port, and includes: two or more detection branches connected in parallel between an input port of the ADC and a ground, and an input port of the ADC passes A first resistor is connected to the power source, and each of the detection branches includes a switch tube and a second resistor. The control end of the switch tube is used as the detection end of the detection branch to connect to the detection node, and the low-potential end of the switch tube. The high potential end of the switch is connected to the input port of the ADC through the resistor.
  • the ADC determines the normal or abnormal state of the corresponding detection node according to the voltage value of the input port and outputs a corresponding digital signal at the output port. .
  • each detection branch further includes a current limiting resistor, and the current limiting resistor is connected between the detection node and a control terminal of the switch.
  • the switch is a transistor, an IGBT or a MOSFET.
  • the switching transistor is an NPN-type transistor, an N-type IGBT, or an N-type MOSFET;
  • the base of the NPN transistor, the gate of the N-type IGBT, the gate of the N-type MOSFET, the control terminal of the switching transistor, the collector of the NPN-type transistor, the collector of the N-type IGBT, and the drain of the N-type MOSFET are described.
  • the high-potential end of the switch, the emitter of the NPN triode, the emitter of the N-IGBT, and the source of the N-MOSFET are the low-potential ends of the switch.
  • the resistance values of the second resistors on each detection branch are not equal.
  • a microprocessor-based detection circuit which includes the above-mentioned ADC-based detection circuit, and the ADC is internally or externally disposed to the microprocessor.
  • the above microprocessor-based detection circuit sets multiple detection branches and is connected in parallel to an input port of an ADC.
  • the ADC sets a detection voltage and abnormal relationship table, and determines whether the corresponding detection node is normal or abnormal according to the voltage value of the input port. Status and output corresponding digital signals at the output port. In this way, one port can be used to detect multiple circuit nodes and determine abnormal conditions. Whether the ADC is built in or external to the microprocessor, it only takes up microprocessing. An ADC pin of the processor releases the pressure of the microprocessor I / O port resources.
  • FIG. 1 is a schematic circuit diagram of an example of a microprocessor-based detection circuit according to an embodiment of the present invention
  • FIG. 2 is a schematic circuit diagram of an example of a microprocessor-based detection circuit according to another embodiment of the present invention.
  • the ADC 11 has an input port and an output port.
  • the ADC-based detection circuit can be applied to a microprocessor-based (MCU) detection.
  • MCU microprocessor-based
  • ADC is applied 11 is internally or externally placed in the microprocessor 10.
  • ADC When 11 is built in, the input port of ADC 11 is used as the ADC (I / O) pin of microprocessor 10.
  • ADC 11 When ADC 11 is externally connected, the output port of ADC 11 Feet connected.
  • the microprocessor 10 may be a microcontroller, an ARM (Advanced RISC Machine, advanced reduced instruction set computer) controller, etc.
  • the detection circuit based on the ADC 11 includes: two or more channels connected in parallel to the ADC Detection branch 20 between the input port of 11 and ground, the ADC The input port of 11 is connected to the power source Vc through a first resistor R1.
  • Each of the detection branches 20 includes a switch Q1 and a second resistor R2.
  • the control terminal of the switch Q1 is used as the detection terminal of the detection branch 20.
  • An external detection node is connected, and the low-potential end of the switch Q1 is grounded.
  • the switch Q1 must be operated in the off or saturated state (switching state).
  • the resistance values of the second resistor R2 on each detection branch 20 are not equal.
  • the switching transistor Q1 is a transistor, an IGBT or a MOSFET.
  • the switching transistor Q1 is an NPN-type transistor, an N-type IGBT, or an N-type MOSFET; the base of the NPN-type transistor, the gate of the N-type IGBT, and the gate of the N-type MOSFET; the control end of the switching transistor Q1, NPN
  • the collector of the triode, the collector of the N-type IGBT, and the drain of the N-type MOSFET are described in the high-potential terminal of the switch Q1, the emitter of the NPN-type transistor, the emitter of the N-type IGBT, and the source of the N-type MOSFET. Low potential terminal of the switch Q1.
  • each detection branch 20 further includes a current limiting resistor R3, and the current limiting resistor R3 is connected between the detection node and the control terminal of the switch Q1.
  • the first resistor R1 and the second resistor R2 are voltage-dividing resistors.
  • the first resistor R1, the second resistor R2, and the current-limiting resistor R3 can all be implemented by using one resistor or multiple resistors in series and parallel.
  • test node test point 1 When two circuit nodes (such as power supply, voltage, or current) that need to be detected are connected to the detection nodes in the schematic diagram, respectively, point 1, test node test point 1, test node test point is normally 3.3 V and abnormal is 0 V.
  • circuit nodes such as power supply, voltage, or current
  • the switch Q1 When the input voltage is normal, the switch Q1 is turned on. When the input voltage is abnormal, the switch Q1 is turned off.
  • the transistor here is equivalent to a switch.
  • testing point 1 is abnormal
  • test point 2 is normal
  • test point 1 is normal
  • test point 2 is abnormal
  • Each case corresponds to a unique voltage value Vo of the input port of the ADC 11 (where R2 ⁇ R3).
  • the voltage value Vo and the abnormal condition of the detection node are as follows:
  • the above-mentioned microprocessor-based detection circuit is provided with a plurality of detection branches 20 and connected in parallel to an ADC.
  • the ADC 11 sets the detection voltage and abnormal relationship table. According to the voltage value of the input port, determine the normal or abnormal state of the corresponding detection node and output the corresponding digital signal at the output port. Circuit nodes to detect and be able to determine abnormal conditions, whether the ADC 11 When built-in or external to the microprocessor 10, it also occupies only one ADC pin of the microprocessor 10, releasing the pressure of the I / O port resources of the microprocessor 10.

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  • Measurement Of Current Or Voltage (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

An ADC-based detection circuit comprises: two or more detection sub-circuits (20) connected in series between an input port of an ADC (11) and the ground. The input port of the ADC (11) is connected to a power supply (Vc) via a first resistor (R1). Each of the detection sub-circuits (20) comprises a switch transistor (Q1) and a second resistor (R2), a control terminal of the switch transistors (Q1) serves as an external detection node of a detection terminal of the detection sub-circuit (20), a low voltage terminal of the switch transistor (Q1) is grounded, and a high voltage terminal of the switch transisitor (Q1) is connected to the input port of the ADC (11) via the resistor. The ADC (11) determines, according to a voltage level of the input port, whether a corresponding detection node is in a normal or abnormal state, and outputs a corresponding digital signal at an output port. One port is used to perform detection on multiple circuit nodes and to determine an abnormal condition. No matter if the ADC (11) is built in or provided outside of a microprocessor, only one pin of the ADC (11) is occupied, thereby releasing resources of I/O ports.

Description

基于的ADC的检测电路和基于微处理器的检测电路Detection circuit based on ADC and detection circuit based on microprocessor 技术领域Technical field
本申请属于电子电路技术领域,尤其涉及一种基于的ADC(Analog-to-Digital Converter,数模转换器或者模数转换器)的检测电路和基于微处理器的检测电路。The present application belongs to the technical field of electronic circuits, and particularly relates to an ADC (Analog-to-Digital Converter, digital-to-analog converter or analog-to-digital converter) detection circuit and microprocessor-based detection circuit.
背景技术Background technique
目前,传统的包含处理器的电子系统中经常有检测各级电源输出电压异常(短路、开路或低于特定值)的需求。一般都是直接利用电阻分压然后送给单片机的I/O口做判断,检测一路电压需要一个I/O口,显然这样的设计需要单片机要有更多的I/O口。At present, traditional electronic systems that include a processor often require the detection of abnormal output voltages (short circuit, open circuit, or lower than a specific value) at all levels of the power supply. Generally, the resistance is used to directly divide the voltage and then sent to the I / O port of the microcontroller to make a judgment. It needs an I / O port to detect a voltage. Obviously, this design requires that the microcontroller has more I / O ports.
因此,传统的电子系统中存在检测多路电信号需要多个I/O口,占用微处理器I/O资源大的问题。Therefore, the conventional electronic system has a problem that detecting multiple electrical signals requires multiple I / O ports, which occupies a large amount of microprocessor I / O resources.
技术问题technical problem
传统的电子系统中存在利用处理器检测多路电信号需要多个I/O口的问题。The traditional electronic system has a problem that using a processor to detect multiple electrical signals requires multiple I / O ports.
技术解决方案Technical solutions
一种基于的ADC的检测电路,所述ADC具有一个输入端口和一个输出端口,包括:两路以上并联连接在所述ADC的输入端口和地之间检测支路,所述ADC的输入端口通过一第一电阻接电源,每路所述检测支路包括一开关管和一第二电阻,所述开关管的控制端作为检测支路的检测端外接检测节点,所述开关管的低电位端接地,所述开关管的高电位端通过所述电阻接所述ADC的输入端口,所述ADC根据输入端口的电压值确定相应的检测节点的正常或异常状态并在输出端口输出相应的数字信号。A detection circuit based on an ADC. The ADC has an input port and an output port, and includes: two or more detection branches connected in parallel between an input port of the ADC and a ground, and an input port of the ADC passes A first resistor is connected to the power source, and each of the detection branches includes a switch tube and a second resistor. The control end of the switch tube is used as the detection end of the detection branch to connect to the detection node, and the low-potential end of the switch tube. The high potential end of the switch is connected to the input port of the ADC through the resistor. The ADC determines the normal or abnormal state of the corresponding detection node according to the voltage value of the input port and outputs a corresponding digital signal at the output port. .
在其中一个实施例中,每条检测支路还包括一限流电阻,所述限流电阻连接在所述检测节点和所述开关管的控制端之间。In one embodiment, each detection branch further includes a current limiting resistor, and the current limiting resistor is connected between the detection node and a control terminal of the switch.
在其中一个实施例中,所述开关管为三极管、IGBT或MOSFET。In one embodiment, the switch is a transistor, an IGBT or a MOSFET.
在其中一个实施例中,所述开关管为NPN型三极管、N型IGBT或N型MOSFET;In one embodiment, the switching transistor is an NPN-type transistor, an N-type IGBT, or an N-type MOSFET;
NPN型三极管的基极、N型IGBT的门极、N型MOSFET的栅极所述开关管的控制端,NPN型三极管的集电极、N型IGBT的集电极、N型MOSFET的漏极所述开关管的高电位端,NPN型三极管的发射极、N型IGBT的发射极、N型MOSFET的源极所述开关管的低电位端。The base of the NPN transistor, the gate of the N-type IGBT, the gate of the N-type MOSFET, the control terminal of the switching transistor, the collector of the NPN-type transistor, the collector of the N-type IGBT, and the drain of the N-type MOSFET are described The high-potential end of the switch, the emitter of the NPN triode, the emitter of the N-IGBT, and the source of the N-MOSFET are the low-potential ends of the switch.
在其中一个实施例中,每条检测支路上的所述第二电阻阻值不相等。In one embodiment, the resistance values of the second resistors on each detection branch are not equal.
此外,还提供了一种基于微处理器的检测电路,包括上述述基于的ADC的检测电路,所述ADC内设或外置于所述微处理器。In addition, a microprocessor-based detection circuit is provided, which includes the above-mentioned ADC-based detection circuit, and the ADC is internally or externally disposed to the microprocessor.
有益效果Beneficial effect
上述的基于微处理器的检测电路通过设置多个检测支路并并联在一个ADC的输入端口上,ADC设置检测电压和异常关系表格,根据输入端口的电压值确定相应的检测节点的正常或异常状态并在输出端口输出相应的数字信号,如此,可以使用一个端口对多个电路节点进行检测并能判断出异常情况,无论是将ADC内置或外置于微处理器时,也仅占用微处理器的一个ADC管脚,释放了微处理器I/O口资源的压力。The above microprocessor-based detection circuit sets multiple detection branches and is connected in parallel to an input port of an ADC. The ADC sets a detection voltage and abnormal relationship table, and determines whether the corresponding detection node is normal or abnormal according to the voltage value of the input port. Status and output corresponding digital signals at the output port. In this way, one port can be used to detect multiple circuit nodes and determine abnormal conditions. Whether the ADC is built in or external to the microprocessor, it only takes up microprocessing. An ADC pin of the processor releases the pressure of the microprocessor I / O port resources.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1为本发明一实施例提供的基于微处理器的检测电路的示例电路原理图;1 is a schematic circuit diagram of an example of a microprocessor-based detection circuit according to an embodiment of the present invention;
图2为本发明另一实施例提供的基于微处理器的检测电路的示例电路原理图。FIG. 2 is a schematic circuit diagram of an example of a microprocessor-based detection circuit according to another embodiment of the present invention.
本发明的实施方式Embodiments of the invention
为了使本发明的目的、技术方案及优点更加清楚明白,以下结合附图及实施例,对本发明进行进一步详细说明。应当理解,此处所描述的具体实施例仅仅用以解释本发明,并不用于限定本发明。In order to make the objectives, technical solutions, and advantages of the present invention clearer, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.
请参阅图1,本发明实施例提供的一种基于的ADC的检测电路,ADC 11具有一个输入端口和一个输出端口,该基于的ADC的检测电路可应用在基于微处理器(MCU)的检测电路中,应用时ADC 11内设或外置于微处理器10中。ADC 11内设时, ADC 11的输入端口作为微处理器10的ADC(I/O)管脚,ADC 11外置时,ADC 11的输出端口与为微处理器10的ADC(I/O)管脚连接。微处理器10可以为单片机、ARM(Advanced RISC Machine,高级精简指令集计算机)控制器等。Please refer to FIG. 1, an ADC-based detection circuit according to an embodiment of the present invention. The ADC 11 has an input port and an output port. The ADC-based detection circuit can be applied to a microprocessor-based (MCU) detection. In the circuit, ADC is applied 11 is internally or externally placed in the microprocessor 10. ADC When 11 is built in, the input port of ADC 11 is used as the ADC (I / O) pin of microprocessor 10. When ADC 11 is externally connected, the output port of ADC 11 Feet connected. The microprocessor 10 may be a microcontroller, an ARM (Advanced RISC Machine, advanced reduced instruction set computer) controller, etc.
具体地,基于的ADC 11的检测电路包括:两路以上并联连接在所述ADC 11的输入端口和地之间检测支路20,所述ADC 11的输入端口通过一第一电阻R1接电源Vc,每路所述检测支路20包括一开关管Q1和一第二电阻R2,所述开关管Q1的控制端作为检测支路20的检测端外接检测节点,所述开关管Q1的低电位端接地,所述开关管Q1的高电位端通过所述电阻接所述ADC 11的输入端口,所述ADC 11根据输入端口的电压值确定相应的检测节点的正常或异常状态并在输出端口输出相应的数字信号。Specifically, the detection circuit based on the ADC 11 includes: two or more channels connected in parallel to the ADC Detection branch 20 between the input port of 11 and ground, the ADC The input port of 11 is connected to the power source Vc through a first resistor R1. Each of the detection branches 20 includes a switch Q1 and a second resistor R2. The control terminal of the switch Q1 is used as the detection terminal of the detection branch 20. An external detection node is connected, and the low-potential end of the switch Q1 is grounded. The high-potential end of the switch Q1 is connected to the input port of the ADC 11 through the resistor. 11 Determine the normal or abnormal state of the corresponding detection node according to the voltage value of the input port and output the corresponding digital signal at the output port.
设置合理的第一、二电阻参数,必须使得开关管Q1工作在截止或饱和状态(开关状态)。本实施例中,每条检测支路20上的所述第二电阻R2阻值不相等。To set reasonable parameters of the first and second resistors, the switch Q1 must be operated in the off or saturated state (switching state). In this embodiment, the resistance values of the second resistor R2 on each detection branch 20 are not equal.
所述开关管Q1为三极管、IGBT或MOSFET。具体地,开关管Q1为NPN型三极管、N型IGBT或N型MOSFET;NPN型三极管的基极、N型IGBT的门极、N型MOSFET的栅极所述开关管Q1的控制端,NPN型三极管的集电极、N型IGBT的集电极、N型MOSFET的漏极所述开关管Q1的高电位端,NPN型三极管的发射极、N型IGBT的发射极、N型MOSFET的源极所述开关管Q1的低电位端。The switching transistor Q1 is a transistor, an IGBT or a MOSFET. Specifically, the switching transistor Q1 is an NPN-type transistor, an N-type IGBT, or an N-type MOSFET; the base of the NPN-type transistor, the gate of the N-type IGBT, and the gate of the N-type MOSFET; the control end of the switching transistor Q1, NPN The collector of the triode, the collector of the N-type IGBT, and the drain of the N-type MOSFET are described in the high-potential terminal of the switch Q1, the emitter of the NPN-type transistor, the emitter of the N-type IGBT, and the source of the N-type MOSFET. Low potential terminal of the switch Q1.
在其中一个实施例中,每条检测支路20还包括一限流电阻R3,所述限流电阻R3连接在所述检测节点和所述开关管Q1的控制端之间。上述的第一电阻R1和第二电阻R2为分压电阻。第一电阻R1、第二电阻R2及限流电阻R3均可以用一个电阻器或多个电阻器串并联实施。In one embodiment, each detection branch 20 further includes a current limiting resistor R3, and the current limiting resistor R3 is connected between the detection node and the control terminal of the switch Q1. The first resistor R1 and the second resistor R2 are voltage-dividing resistors. The first resistor R1, the second resistor R2, and the current-limiting resistor R3 can all be implemented by using one resistor or multiple resistors in series and parallel.
请参阅图2,以一个实施例说明检测电路的工作原理,需要检测的两电路节点时(如电源、电压或电流)路分别接入示意图中的检测节点testing point 1、检测节点testing point 1,检测节点testing point正常为3.3 V,异常为0V。Please refer to FIG. 2 to explain the working principle of the detection circuit according to an embodiment. When two circuit nodes (such as power supply, voltage, or current) that need to be detected are connected to the detection nodes in the schematic diagram, respectively, point 1, test node test point 1, test node test point is normally 3.3 V and abnormal is 0 V.
设定:当输入电压正常时,开关管Q1极管打开,当输入电压异常时,开关管Q1断开,这里的三极管就相当于一个开关。Setting: When the input voltage is normal, the switch Q1 is turned on. When the input voltage is abnormal, the switch Q1 is turned off. The transistor here is equivalent to a switch.
在检测两路电压时,有4中情况产生,分别是两路都异常,两路都正常:testing point 1异常、testing point 2正常,testing point 1正常、testing point 2异常。每一种情况都对应一种唯一的ADC 11的输入端口的电压值Vo(其中R2≠R3),通过ADC 11的采样和比较就可以知道这两路电压的异常情况。电压值Vo和检测节点异常情况如下表格:When detecting the two voltages, there are 4 cases, which are both abnormal, and both are normal: testing point 1 is abnormal, test point 2 is normal, test point 1 is normal, test point 2 is abnormal. Each case corresponds to a unique voltage value Vo of the input port of the ADC 11 (where R2 ≠ R3). Through the sampling and comparison of the ADC 11, we can know the abnormality of these two voltages. The voltage value Vo and the abnormal condition of the detection node are as follows:
检测支路20情况描述 Detect branch 20 condition description 两路都正常 Both are normal 1异常、2正常 1 abnormal, 2 normal 1正常、2异常 1 normal, 2 abnormal 两路都异常 Both paths are abnormal
Vo设置计算值 Vo set the calculated value 2.03V 2.03V 3.4V 3.4V 2.5V 2.5V 5.0V 5.0V
Vo实际测量值 Vo actual measured value 2.04V 2.04V 3.44V 3.44V 2.52V 2.52V 4.97V 4.97V
Vo设置范围 Vo setting range [1.70V,2.30V] [1.70V, 2.30V] [3.00V,4.00V] [3.00V, 4.00V] [2.30V,3.00V] [2.30V, 3.00V] [4.50V,5.20V] [4.50V, 5.20V]
上述的基于微处理器的检测电路通过设置多个检测支路20并并联在一个ADC 11的输入端口上,ADC 11设置检测电压和异常关系表格,根据输入端口的电压值确定相应的检测节点的正常或异常状态并在输出端口输出相应的数字信号,如此,可以使用一个端口对多个电路节点进行检测并能判断出异常情况,无论是将ADC 11内置或外置于微处理器10时,也仅占用微处理器10的一个ADC管脚,释放了微处理器10的I/O口资源的压力。The above-mentioned microprocessor-based detection circuit is provided with a plurality of detection branches 20 and connected in parallel to an ADC. On the 11 input port, the ADC 11 sets the detection voltage and abnormal relationship table. According to the voltage value of the input port, determine the normal or abnormal state of the corresponding detection node and output the corresponding digital signal at the output port. Circuit nodes to detect and be able to determine abnormal conditions, whether the ADC 11 When built-in or external to the microprocessor 10, it also occupies only one ADC pin of the microprocessor 10, releasing the pressure of the I / O port resources of the microprocessor 10.
以上所述仅为本发明的较佳实施例而已,并不用以限制本发明,凡在本发明的精神和原则之内所作的任何修改、等同替换和改进等,均应包含在本发明的保护范围之内。The above description is only the preferred embodiments of the present invention and is not intended to limit the present invention. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention shall be included in the protection of the present invention. Within range.

Claims (6)

  1. 一种基于的ADC的检测电路,所述ADC具有一个输入端口和一个输出端口,其特征在于,包括:两路以上并联连接在所述ADC的输入端口和地之间检测支路,所述ADC的输入端口通过一第一电阻接电源,每路所述检测支路包括一开关管和一第二电阻,所述开关管的控制端作为检测支路的检测端外接检测节点,所述开关管的低电位端接地,所述开关管的高电位端通过所述电阻接所述ADC的输入端口,所述ADC根据输入端口的电压值确定相应的检测节点的正常或异常状态并在输出端口输出相应的数字信号。A detection circuit based on an ADC. The ADC has one input port and one output port, and is characterized in that it includes two or more detection branches connected in parallel between an input port of the ADC and a ground, and the ADC. The input port is connected to the power supply through a first resistor. Each of the detection branches includes a switch tube and a second resistor. The control end of the switch tube is connected to the detection node as the detection end of the detection branch. The switch tube The low-potential terminal of the switch is connected to the ground. The high-potential terminal of the switch is connected to the input port of the ADC through the resistor. The ADC determines the normal or abnormal state of the corresponding detection node according to the voltage value of the input port and outputs it at the output port. Corresponding digital signal.
  2. 如权利要求1所述的基于的ADC的检测电路,其特征在于,每条检测支路还包括一限流电阻,所述限流电阻连接在所述检测节点和所述开关管的控制端之间。The detection circuit based on the ADC according to claim 1, wherein each detection branch further comprises a current limiting resistor, and the current limiting resistor is connected between the detection node and a control terminal of the switch. between.
  3. 如权利要求1所述的基于的ADC的检测电路,其特征在于,所述开关管为三极管、IGBT或MOSFET。The detection circuit based on the ADC according to claim 1, wherein the switching transistor is a triode, an IGBT, or a MOSFET.
  4. 如权利要求3所述的基于的ADC的检测电路,其特征在于,所述开关管为NPN型三极管、N型IGBT或N型MOSFET;The detection circuit based on the ADC according to claim 3, wherein the switch is an NPN-type transistor, an N-type IGBT, or an N-type MOSFET;
    NPN型三极管的基极、N型IGBT的门极、N型MOSFET的栅极所述开关管的控制端,NPN型三极管的集电极、N型IGBT的集电极、N型MOSFET的漏极所述开关管的高电位端,NPN型三极管的发射极、N型IGBT的发射极、N型MOSFET的源极所述开关管的低电位端。The base of the NPN transistor, the gate of the N-type IGBT, the gate of the N-type MOSFET, the control terminal of the switching transistor, the collector of the NPN-type transistor, the collector of the N-type IGBT, and the drain of the N-type MOSFET are described The high-potential end of the switch, the emitter of the NPN triode, the emitter of the N-IGBT, and the source of the N-MOSFET are the low-potential ends of the switch.
  5. 如权利要求1所述的基于的ADC的检测电路,其特征在于,每条检测支路上的所述第二电阻阻值不相等。The detection circuit based on the ADC according to claim 1, wherein the resistance values of the second resistors on each detection branch are not equal.
  6. 一种基于微处理器的检测电路,其特征在于,包括权利要求1至5任一项所述基于的ADC的检测电路,所述ADC内设或外置于所述微处理器。A microprocessor-based detection circuit, comprising the detection circuit based on the ADC according to any one of claims 1 to 5, wherein the ADC is internally or externally provided to the microprocessor.
PCT/CN2018/094439 2018-07-04 2018-07-04 Adc-based detection circuit, and microprocessor-based detection circuit WO2020006696A1 (en)

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PCT/CN2018/094439 WO2020006696A1 (en) 2018-07-04 2018-07-04 Adc-based detection circuit, and microprocessor-based detection circuit

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CN103515802A (en) * 2013-09-09 2014-01-15 深圳市智远能科技有限公司 Intelligentized switch socket and intelligent switch power strip
CN104037926A (en) * 2014-05-30 2014-09-10 南京邮电大学 Multi-power supply device of embedded equipment, and intelligent switching method of multi-power supply device
CN204631213U (en) * 2015-03-12 2015-09-09 法雷奥汽车内部控制(深圳)有限公司 The testing circuit of steering column for vehicles combined switch
CN105277840A (en) * 2015-11-18 2016-01-27 国网山东省电力公司莱芜供电公司 Multi-line electric leakage synchronous detection device of 220V alternating current lines

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103515802A (en) * 2013-09-09 2014-01-15 深圳市智远能科技有限公司 Intelligentized switch socket and intelligent switch power strip
CN104037926A (en) * 2014-05-30 2014-09-10 南京邮电大学 Multi-power supply device of embedded equipment, and intelligent switching method of multi-power supply device
CN204631213U (en) * 2015-03-12 2015-09-09 法雷奥汽车内部控制(深圳)有限公司 The testing circuit of steering column for vehicles combined switch
CN105277840A (en) * 2015-11-18 2016-01-27 国网山东省电力公司莱芜供电公司 Multi-line electric leakage synchronous detection device of 220V alternating current lines

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