WO2019239013A1 - Abrading with an abrading plate - Google Patents
Abrading with an abrading plate Download PDFInfo
- Publication number
- WO2019239013A1 WO2019239013A1 PCT/FI2019/050456 FI2019050456W WO2019239013A1 WO 2019239013 A1 WO2019239013 A1 WO 2019239013A1 FI 2019050456 W FI2019050456 W FI 2019050456W WO 2019239013 A1 WO2019239013 A1 WO 2019239013A1
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- WO
- WIPO (PCT)
- Prior art keywords
- workpiece
- abrading
- abrasive grains
- glass
- plate
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B23/00—Portable grinding machines, e.g. hand-guided; Accessories therefor
- B24B23/02—Portable grinding machines, e.g. hand-guided; Accessories therefor with rotating grinding tools; Accessories therefor
- B24B23/028—Angle tools
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B23/00—Portable grinding machines, e.g. hand-guided; Accessories therefor
- B24B23/02—Portable grinding machines, e.g. hand-guided; Accessories therefor with rotating grinding tools; Accessories therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B29/00—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/24—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass
- B24B7/242—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass for plate glass
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/02—Backings, e.g. foils, webs, mesh fabrics
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D13/00—Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor
- B24D13/14—Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor acting by the front face
- B24D13/147—Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor acting by the front face comprising assemblies of felted or spongy material; comprising pads surrounded by a flexible material
Definitions
- the solution relates to abrading with an abrasive plate, particularly to surface reconditioning and finishing of topcoats such as glass.
- Abrading is typically performed to recondition and finish topcoats such as glass. Therein, the purpose typically is to remove defects such as surface height deviations, scratches and/ or other surface imperfections from the abraded surface.
- the finishing process comprises as major process stages first abrading the surface and thereafter polishing the surface. Such is typically the case to obtain a completely finished glass surface.
- the abrading process is relatively slow, particularly in the case of hardened glass surfaces and especially in the case of chemically treated glass surfaces, as currently employed methods achieve relatively low rates of material removal from the workpiece surface.
- the disclosed solution comprises a method of abrading the surface of a workpiece.
- the method comprises providing a workpiece, an abrading apparatus with a backing pad configured to receive an abrading plate, an abrading plate attachable to the backing pad and slurry comprising abrasive grains; attaching the abrading plate to the backing pad; providing the slurry comprising abrasive grains between the abrading plate and the surface of the workpiece; and operating the abrading apparatus to abrade the surface of the workpiece.
- the abrading plate comprises a workpiece-facing layer, which workpiece- facing layer faces the surface of the workpiece and comprises metal or polymer, and the abrasive grains have a hardness on the Mohs scale of greater than 5.
- the abrading apparatus may be of the rotational type, of the random orbital type, or of the oscillating type.
- the workpiece-facing layer of the abrading plate may comprise soft metal such as copper, zinc, brass or aluminum; or it may comprise a single polymer, a curable resin formulation, a blend of two or more polymers or a composite material.
- the abrasive grains may comprise silicon carbide, aluminum oxide, boron carbide, cubic boron nitride, tungsten carbide, diamond, and zirconia.
- the slurry may comprise water, abrasive grains, emulsifiers, wax, surface tension modifiers, oil, solvents, glycerin (propanel, 2, 3-triol) and/or viscosity modifiers.
- the surface of the workpiece may comprise hardened glass and/ or chemically treated glass such as GorillaTM glass or DragontrailTM glass.
- GorillaTM glass or DragontrailTM glass One of the premises of the disclosed solution is that abrasive grains penetrate into the surface of the abrading plate such that part of the abrasive grains remain exposed, i.e. non-penetrated.
- abrasive grains may slightly budge, bringing about localized chipping of the surface of the workpiece.
- the disclosed solution abrades the surface of the workpiece significantly more during the same abrading time than with conventional method.
- the disclosed solution produces a more uniform surface for the workpiece, devoid of distinctive scratches, than a conventional method. Therefore, the surface of the workpiece after treatment with the disclosed solution is easier to polish than after treatment with a conventional method.
- the disclosed solution is particularly useful and effective for abrading a glass surface, such as a glass panel of an electronic device such as a mobile phone, smartphone or a tablet computer.
- the disclosed solution is useful and effective for reconditioning a glass surface, particularly a hardened glass surface and especially a chemically treated glass surface, comprising scratches and/ or defects. Therefore, the disclosed solution is useful and effective to recondition a glass panel of an electronic device, such as a second-hand mobile device, which glass panel comprises scratches and/ or defects.
- Figure 1 schematically illustrates, according to an example, an abrading apparatus equipped with an abrasive tool comprising an abrading plate according to the disclosed solution, as viewed from a side.
- Figure 2 schematically illustrates, according to an example, an abrasive tool comprising a backing pad and an abrading plate according to the disclosed solution, plus a workpiece and abrasive grains in a slurry, as viewed from a side.
- Figure 3a schematically illustrates, according to an example, a backing pad, as viewed from a side.
- Figure 3b schematically illustrates, according to another example, a backing pad, as viewed from a side.
- Figure 4a schematically illustrates, according to an example, an abrading plate, as viewed from a side.
- Figure 4b schematically illustrates, according to another example, an abrading plate, as viewed from a side.
- Figure 5 schematically illustrates, according to an example, an abrading plate according to the disclosed solution plus abrasive grains in contact with a workpiece surface, as viewed from a side.
- Figure 6a illustrates, with a scanning electron microscope image, an abrading result with a conventional method after 10 seconds of abrading a virgin glass surface as illustrated in Figure 6c, as viewed from diagonally above.
- Figure 6b illustrates, with a scanning electron microscope image, an abrading result with an example of the abrading method according to the disclosed solution after 10 seconds of abrading a virgin glass surface as illustrated in Figure 6c, as viewed from diagonally above.
- Figure 6c illustrates, with a scanning electron microscope image, a virgin glass surface prior to abrading, as viewed from diagonally above.
- Figure 6d illustrates, with a scanning electron microscope image, the abrading result of Figure
- Figure 7a illustrates, with a scanning electron microscope image, the surface of an abrading plate according to an example of the disclosed solution after 10 seconds of abrading a virgin glass surface, as viewed from diagonally above after turning the plate such that the abrading surface faces upwards.
- Figure 7b illustrates, with a scanning electron microscope image and with greater magnification than in Figure 7a, the surface of an abrading plate according to an example of the disclosed solution after 10 seconds of abrading a virgin glass surface, as viewed from diagonally above after turning the plate such that the abrading surface faces upwards.
- the uppermost shown region of the surface of the abrading plate has not been in contact with the surface of the workpiece whereas the lowermost shown region has been in such contact.
- the disclosed solution relates to abrading the surface 3s of a workpiece 3.
- abrading is performed with an abrading apparatus 14, which may be of the rotational type, of the random orbital type or the oscillating type, to which abrading apparatus 14 is attached an abrading plate 2 via a backing pad 10 and also otherwise in accordance with what is described below.
- workpieces 3 which comprise or consist of, or at least whose surface 3s comprises or consists of, hardened glass, and especially so if the workpiece 3 comprises or consists of, or if at least its surface 3s comprises or consists of, chemically treated glass such as GorillaTM glass or DragontrailTM glass.
- Such glass is commonly used in electronic devices such as mobile phones, smartphones, tablet computers, domestic appliances and automotive displays, and in touch screens in various other applications.
- the disclosed solution is particularly useful and effective for abrading a glass surface, such as a glass panel of an electronic device such as a mobile phone, smartphone or a tablet computer.
- the disclosed solution is useful and effective for reconditioning a glass surface, particularly a hardened glass surface and especially a chemically treated glass surface, comprising scratches and/ or defects. Therefore, the disclosed solution is useful and effective to recondition a glass panel of an electronic device, such as a second-hand mobile device, which glass panel comprises scratches and/ or defects.
- the workpiece 3 may further be treated by, for example, polishing the abraded surface 3s of the workpiece 3.
- polishing may be carried out with a polishing device and a polishing slurry.
- the disclosed solution comprises providing a workpiece 3, an abrading apparatus with a backing pad 10 configured to receive an abrading plate 2, an abrading plate 2 attachable to the backing pad 10 and slurry 4 comprising abrasive grains 1.
- the abrading plate 2 is attached to the backing pad 10, the slurry 4 comprising abrasive grains 1 is provided between the abrading plate 2 and the surface 3s of the workpiece 3, whereafter the abrading apparatus 14 is operated to abrade the surface 3s of the workpiece 3.
- the abrading plate 2 comprises a metal or polymer layer and the abrasive grains 1 have a hardness on the Moths scale of greater than 5.
- the abrading plate 2 according to the disclosed solution comprises a workpiece-facing layer 21, which faces the workpiece 3 during abrading, and an attachment layer 22 for attaching the abrading plate 2 to the backing pad 10.
- the attachment layer 22 comprises means of attachment for attaching the abrading plate 2 to the backing pad 10.
- Such attachment elements may enable mechanical or adhesive attachment.
- such attachment enables removal and re- attachment.
- such attachment elements comprise hook-and-loop type of fastening with the capability for convenient re- attachment.
- attachment layer 22 of the abrading plate 2 may comprise hooks and the attachment layer 12 of the backing pad 10 may comprise loops, or vice versa.
- the means of attachment may be premised on pressure sensitive adhesion, i.e. PSA.
- the attachment layer 22 of the abrading plate 2 may comprise pressure sensitive adhesive and the attachment layer 12 of the backing pad 10 may comprise an even surface adapted for pressure sensitive adhesion, or vice versa.
- the workpiece-facing layer 21 of the abrading plate 2 comprises or consists of metal or polymer.
- the workpiece- facing layer 21 may have a height I1 21 of 5 pm to 2 mm, such as 10-100 pm.
- the composition of the workpiece-facing layer 21 is important for obtaining the desired results and technical effects of the disclosed solution because the properties of the workpiece- facing layer 21 significantly influences the dynamic interaction between the abrasive grains 1 and the surface 3s of the workpiece 3, as will be described below more in detail.
- the abrasive grains 1 need to become entrapped within the lower surface 2s of the abrading plate 2 in such a manner that the abrasive grains 1 may still slightly budge while being entrapped within the lower surface 2s of the abrading plate, as will be described below more in detail.
- the workpiece-facing layer 21 comprising or consisting of metal
- such metal may be, for example, copper, zinc, brass or aluminum.
- the workpiece facing layer 21 consists of copper.
- the workpiece- facing layer 21 consists of copper and has a height I1 21 of approximately 0,02-0,05 mm.
- the workpiece-facing layer 21 comprising or consisting of polymer
- such polymer may be, for example, a single polymer, a curable resin formulation, a blend of two or more polymers or a composite material.
- the workpiece-facing layer 21 consists of polyurethane, epoxy, olefinic polymers or acrylate.
- the workpiece-facing layer 21 consists of polyurethane and has a height I121 of approximately 0,25-1,00 mm.
- the abrading plate 2 may optionally comprise a backing layer 23, wherein the notion of “backing” refers to its function for backing and therefore supporting the workpiece- facing layer 21. With such a backing layer 23, the flexibility/ rigidity and other dynamic properties of the abrading plate 2 may be controlled and adjusted along with bringing about a desired total height 13 ⁇ 4 for the abrading plate 2.
- Such a backing layer 23 may comprise or consist of, for example, cloth, foam or film.
- the backing layer 23 comprises polyester film.
- the backing layer 23 comprises polyester film and has a height I of approximately 50-150 pm.
- the abrasive grains 1 have a hardness on the Mohs scale of greater than 5. Such a hardness is conducive to obtaining desired abrading results in accordance with the disclosed solution, particularly in abrading glass, more particularly hardened glass and especially chemically treated glass such as GorillaTM glass or DragontrailTM glass.
- Such abrasive grains 1 may comprise, for example, silicon carbide, aluminum oxide, boron carbide, cubic boron nitride, tungsten carbide, diamond, and/or zirconia. According to a specific example, abrasive grains 1 are silicon carbide grains.
- Such abrasive grains 1 may have an average height hi of approximately 3-50 pm, wherein the height hi refers to the largest diameter of an abrasive grain 1.
- the abrasive grains 1 have a narrow distribution in terms of their heights hi.
- the disclosed solution has the benefit of being rather robust in terms of tolerating differences in the heights hi of the abrading grains 1.
- the abrading grains may penetrate, as effected by the vertical force Fv with which the abrading plate 2 is pressed against the workpiece 3, into differing depths of penetration hp into the workpiece- facing layer 21 of the abrading plate 2. That is, taller abrasive grains 1 - known in the industry as‘carrier’ grains - may penetrate deeper into the workpiece-facing layer 21 of the abrading plate 2 than grains with a smaller height hi. Therefore, such taller‘carrier’ grains do not cut appreciably deeper into the surface 3s of the workpiece 3 during abrading, resulting in more uniform abraded surface 3s of for the workpiece 3.
- the abrasive particles 1 are to be introduced to the abrading process, i.e. between the abrading plate 2 and the surface 3s of the workpiece 3 to be abraded, in slurry 4.
- slurry 4 comprising abrasive grains 1 is provided between the abrading plate 2 and the surface 3s of the workpiece 3.
- Such slurry 4 may comprise, for example, water, abrasive grains 1, emulsifiers, plT modifiers, wax, surface modifiers, oil, solvents, glycerin and/or viscosity modifiers.
- the slurry 4 comprises grains 1, water, emulsifiers, wax, surface modifiers, oil, solvents, glycerin and viscosity modifiers such that the abrasive grains 1 account for 10-40% of the slurry 4 and the other, liquid components account for 90-60% of the slurry 4.
- the backing pad 10 comprises a backing layer 11 and an attachment layer 12.
- the backing layer may additionally comprise a cushioning layer 13.
- the abrading plate 2 is to be attached to such a backing pad 10.
- the backing pad 10 is to be attached to an abrading apparatus 14. It is to be appreciated that attaching a backing pad 10 to an abrading apparatus 14 is well known in the industry, and hence this issue will not be dealt with in detail here.
- the backing layer 11 of the backing pad 10 is to provide structural support for the abrading plate
- the backing pad 10 is preferably substantially flat, at least in terms of its surface facing the abrading plate 2. Furthermore, in the interest of its supporting function, preferably the backing pad 10 is sufficiently hard yet sufficiently flexible to allow application- appropriate conformity of the abrading plate 2 to the contours of the surface 3s of the workpiece
- the backing pad 10 comprises rubber, polyurethane elastomer and latex and has a flexibility of 10-40 on the Shore A hardness scale.
- the optional cushioning layer 13 of the backing pad 10 is to provide cushioning, such as dampening of impacts and vibration, between the abrading plate 2 and the abrading apparatus 14.
- the cushioning layer 13 of the backing pad may comprise a foamed polyurethane elastomer, foamed rubber, latex foam and/ or polyurethane foam.
- the cushioning layer 13 comprises a foamed polyurethane elastomer.
- the cushioning layer 13 comprises foamed rubber.
- the attachment layer 12 of the backing pad enables attaching the abrading plate 2 to the backing pad 10, in accordance with what has been described above.
- the backing pad 10 comprises means of attachment for attaching the abrading plate 2 to the backing pad 10, namely to the attachment layer 12 of the backing pad 10.
- abrading the surface 3s of a workpiece 3 is to be done with an abrading apparatus 14.
- an abrading apparatus may be of the rotational type, of the random orbital type, or of the oscillating type.
- the abrading plate 2 - attached to the abrading apparatus 14 via the backing pad 10 - undergoes circular motion about the vertical dimension, i.e. the Y dimension, around an axis of rotation.
- an abrasive particle 1 will travel, when entrapped within the surface 2s of the abrading plate 2, along a circular path with respect to the surface 3S of the workpiece 3.
- the abrading plate 2 - attached to the abrading apparatus 14 via the backing pad 10 - undergoes oscillating motion on the X-Z plane.
- the direction(s) of oscillation on the X-Z plane depend on the direction(s) of oscillation effected by the abrading apparatus 14, which oscillating may be, for example, linear back-and- forth motion, and/or or orbital motion.
- an abrasive particle 1 will travel, when entrapped within the surface 2s of the abrading plate 2, along an oscillating path with respect to the surface 3s of the workpiece 3, wherein the oscillating path is in accordance with what is described immediately above.
- an oscillating-type abrading apparatus 14 has, as one of its characteristics, an oscillation amplitude or stroke (back-and-forth motion) or an oscillation diameter (orbital motion), plus an oscillation frequency in oscillations per minute.
- oscillation amplitudes or diameters are in the range of 1-10 mm, and oscillation frequencies in the range of 1 000— 18 000 oscillations per minute.
- the abrading plate 2 - As attached to the abrading apparatus 14 via the backing pad 10 undergoes both oscillating orbital motion, as described above, as well as undergoes circular motion about the vertical dimension, i.e. the Y dimension, around an axis of rotation. Furthermore, and as is well known in the industry, typically the speed of rotation of the abrading plate 2 about its axis of rotation is dependent on the force with which the abrading plate 2 - or more generally an abrading article - is pressed against the surface 3s of the workpiece 3. Moreover, this force may be temporally variable, especially in manually performed abrading.
- random orbital abrading apparatuses 14 have oscillation diameters in the range of 1-10 mm, and oscillation frequencies in the range of 1 000— 18 000 oscillations per minute, with abrading article rotation about its axis of rotation depending on abrading force but in a typical usage situation in the range of 0-1000 revolutions per minute.
- Such an abrading apparatus 14 may be, for example, electrically powered, battery-powered or powered by compressed air.
- Such an abrading apparatus 14 may be, for example, manually operated or robotically operated.
- the abrading apparatus 14 is battery-powered and manually operated. Such a configuration is advantageous for convenient abrading of small localized scratches or defects in large and/ or immovably installed surfaces, such as large and/ or immovably installed glass surfaces.
- the abrading apparatus 14 is electrically powered and robotically operated. Such a configuration is advantageous for efficient serialized abrading of small or relatively small glass surfaces such as glass panels of electronic devices.
- An example of such an application is industrial-scale reconditioning of mobile phone screens or other mobile phone glass panels.
- Figure 5 schematically illustrates localized dynamic behavior of abrading grains 1, in slurry 4, with the surface 3s of the workpiece 3 and the abrading plate 2, which behavior is important for bringing about the technical effects and benefits of the disclosed solution.
- abrading of the workpiece 3 begins - and if required during abrading - slurry 4 comprising abrasive grains 1, in accordance with what is described above, is provided between the abrading plate 2 and the surface 3s of the workpiece 3.
- the abrasive grains 1 tend to become entrapped within the workpiece- facing layer 21 of the abrading plate 2, namely within the surface 2s of the abrading plate 2, which surface 2s faces the surface 3s of the workpiece 3. Note that for illustrative clarity, in Fig. 5, only the workpiece-facing layer 21 of the abrading plate 2, and only the surface 3s of the workpiece 3 are illustrated.
- the surface 2s has, in practical terms, one layer of abrasive grains 1 in contact with the surface 3s of the workpiece 3, enabling a high grain-specific abrading pressure against the surface 3s of the workpiece 3.
- the abrasive grains 1 penetrate into the surface 2s of the abrading plate 2 such that part of the abrasive grains 1 remain exposed, i.e. non-penetrated, to the surface 3s of the workpiece,
- taller‘carrier’ abrasive grains 1 - such as the leftmost schematically illustrated abrasive grain 1 in Fig. 5— with greater height hi, in effect in this case greater vertical height hi, penetrate deeper, i.e. have greater depth of penetration hp than smaller abrasive grains 1 because taller abrasive grains 1 experience higher grain- specific pressure until their exposed height is approximately equal to the average exposed height of all the other abrasive grains 1 between the abrading plate 1 and the surface 3s of the workpiece 3,
- entrapped abrasive grains 1 may, while being entrapped, budge - as denoted with arrows in Fig. 5— i.e. move sideways on the X-Z plane and/ or rotate within their general locus of entrapment, and
- some entrapped abrasive grains 1 may become loose from their locus of entrapment, travel for some time in between the surface 2s of the abrading plate and the surface 3s of the workpiece 3 before becoming entrapped again.
- Fig. la presents a scanning electron microscope (SEM) image of the surface 2s of an abrading plate 2 according to the disclosed solution after 10 seconds of abrading a virgin glass surface, as viewed from diagonally above after turning the abrading plate 2 such that the abrading surface 2s faces upwards.
- the workpiece- facing layer 21 of the abrading plate 2 is copper
- the abrading apparatus 14 used for abrading is of the random orbital type
- the glass surface is DragontrailTM glass.
- abrasive grains 1 have penetrate into the surface 2s of the abrading plate 2 such that part of the abrasive grains 1 remain exposed, i.e. non-penetrated.
- Fig. lb presents a more greatly magnified scanning electron microscope (SEM) image of the surface 2s of an abrading plate 2 according to the disclosed solution after 10 seconds of abrading a virgin hardened glass surface, as viewed from diagonally above after turning the abrading plate 2 such that the abrading surface 2s faces upwards.
- the workpiece- facing layer 21 of the abrading plate 2 is copper
- the abrading apparatus 14 used for abrading is of the random orbital type
- the glass surface is DragontrailTM glass.
- Fig lb is shown that portion of the surface 2s of the abrading plate 2 in which the edge of the surface 3s of the workpiece 3 has resided during abrading.
- the uppermost shown region of the abrading surface 2s has not been in contact with the surface 3s of the workpiece 3, whereas the lowermost shown region of the abrading surface 2s has been in contact with the surface 3s of the workpiece 3.
- the shape and contours of pits 6 illustrate the rather plastic residence— relating to the phenomenon of budging as noted above - of the abrasive grains 1 in their general loci of entrapment, i.e. pits 6.
- the entrapped abrasive grains 1 may, while being entrapped, slightly budge as described above, these entrapped abrasive grains 1 bring about localized chipping of the surface 3s of the workpiece 3.
- the abrasive grains 1, compared to abrasive articles in which abrasive grains are substantially rigidly attached to a substrate engage in the disclosed solution substantially less in scratching-like interaction with the surface 3s of the workpiece 3, and instead engage substantially more in pressing- and rolling-like— i.e. chipping— interaction with the surface 3s of the workpiece 3.
- Such pressing- and rolling-like—i.e. chipping— interaction of the abrasive grains 1 with the surface 3s of the workpiece 3 in comparison with a conventional abrasive article with rigidly fixed abrasive particles is illustrated in a comparative manner in Figs. 6 a (conventional abrasive article) and 6 b (disclosed solution), wherein Figs. 6 a and 6 b have the same magnification.
- Fig 6 a presents a scanning electron microscope (SEM) image of an abrading result with a conventional abrading method with rigidly fixed abrasive particles, after 10 seconds of abrading a virgin DragontrailTM glass surface 3s as illustrated in Figure 6c, as viewed from diagonally above.
- the abrading apparatus 14 used for abrading is of the random orbital type, the vertical force Fv is 1,25 N/cm 2 , the abrading is performed in the presence of water, and the abrading article is a conventional abrading disc with rigidly fixed abrasive particles.
- Fig 6b presents a scanning electron microscope (SEM) image of an abrading result with the abrading method according to the disclosed solution after 10 seconds of abrading a virgin DragontrailTM glass surface 3s as illustrated in Figure 6c, as viewed from diagonally above.
- the workpiece- facing layer 21 of the abrading plate 2 is copper
- the abrasive grains 1 are silicon carbide grains with an average height hi of 15 pm
- the abrading apparatus 14 used for abrading is of the random orbital type and is the same abrading apparatus 14 as in the case of Fig. 6 a.
- the vertical force Fv is 1,25 N/cm 2 and the abrading is performed in the presence of slurry 4 comprising water and additives as described above.
- the disclosed solution chips the surface 3s of the workpiece 3 - in the illustrated case DragontrailTM glass - whereas abrading with a conventional abrasive article with rigidly fixed abrasive grains scratches the surface 3s of the workpiece 3.
- Fig. 6 d presents the surface 3s of the workpiece 3 illustrated in Fig. 6b with greater magnification, and wherein the chipped surface 3s of the workpiece 3 is clearly visible.
- the disclosed solution abrades the surface 3s of the workpiece 3 - in the illustrated case DragontrailTM glass - significantly more during the same abrading time than with a conventional abrasive article with rigidly fixed abrasive grains. Therefore, the disclosed solution is, with respect to abrading, i.e. removing material from, the surface 3s of the workpiece 3, significantly faster than the conventional method based on an abrasive article with rigidly fixed abrasive grains.
- the disclosed solution produces a more uniform surface 3s for the workpiece 3 devoid of distinctive scratches— in the illustrated case DragontrailTM glass - than the conventional method based on an abrasive article with rigidly fixed abrasive grains. Therefore, the surface 3s of the workpiece 3 after treatment with the disclosed solution is easier to polish than after treatment with a conventional method based on an abrasive article with rigidly fixed abrasive grains.
- an abrading pad for example an abrading plate or a workpiece-facing layer of it, may comprise different surface patterns. Patterns may include spider web formations, spiral patterns, phyllo tactic and/ or any controlled non-uniform rotational pattern around the center of the pad. This may enable a more dynamic and uniform abrading process.
- the above-described examples are intended to explain the general idea of the disclosed solution. Therefore, such examples are not to be taken as exhausting the ways in which the general idea of the disclosed solution may be implemented.
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Abstract
Description
Claims
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
MX2020013349A MX2020013349A (en) | 2018-06-15 | 2019-06-13 | Abrading with an abrading plate. |
US17/058,672 US20210205958A1 (en) | 2018-06-15 | 2019-06-13 | Abrading with an abrading plate |
BR112020022826-5A BR112020022826A2 (en) | 2018-06-15 | 2019-06-13 | method for covering the surface of a workpiece, applying the method, and, workpiece. |
CA3101919A CA3101919A1 (en) | 2018-06-15 | 2019-06-13 | Abrading with an abrading plate |
EP19819006.8A EP3807049A4 (en) | 2018-06-15 | 2019-06-13 | Abrading with an abrading plate |
ZA2020/06691A ZA202006691B (en) | 2018-06-15 | 2020-10-27 | Abrading with an abrading plate |
DO2020000235A DOP2020000235A (en) | 2018-06-15 | 2020-12-04 | ABRASION WITH AN ABRASIVE PLATE |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20185541 | 2018-06-15 | ||
FI20185541 | 2018-06-15 |
Publications (1)
Publication Number | Publication Date |
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WO2019239013A1 true WO2019239013A1 (en) | 2019-12-19 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/FI2019/050456 WO2019239013A1 (en) | 2018-06-15 | 2019-06-13 | Abrading with an abrading plate |
Country Status (8)
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US (1) | US20210205958A1 (en) |
EP (1) | EP3807049A4 (en) |
BR (1) | BR112020022826A2 (en) |
CA (1) | CA3101919A1 (en) |
DO (1) | DOP2020000235A (en) |
MX (1) | MX2020013349A (en) |
WO (1) | WO2019239013A1 (en) |
ZA (1) | ZA202006691B (en) |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000087011A (en) | 1998-09-09 | 2000-03-28 | Tokyo Magnetic Printing Co Ltd | Free abrasive grain polishing slurry composition |
EP1129821A1 (en) * | 1999-08-31 | 2001-09-05 | Shin-Etsu Handotai Co., Ltd | Method and device for polishing semiconductor wafer |
JP2004001169A (en) * | 2001-12-12 | 2004-01-08 | Toyobo Co Ltd | Abrasive pad for semiconductor wafer polishing |
US20050075052A1 (en) * | 2003-10-06 | 2005-04-07 | Kwang-Bok Kim | Method and system for planarizing integrated circuit material |
KR20070031220A (en) * | 2005-09-14 | 2007-03-19 | 가부시키가이샤 오카모도 코사쿠 기카이 세이사쿠쇼 | Double face plane polishing machine and method for polishing rectangular workpiece |
US20130130595A1 (en) * | 2010-07-09 | 2013-05-23 | Asahi Glass Company, Limited | Polishing agent and polishing method |
KR20130140057A (en) | 2010-12-07 | 2013-12-23 | 아사히 가라스 가부시키가이샤 | Grinder |
US20140273777A1 (en) * | 2013-03-14 | 2014-09-18 | Nexplanar Corporation | Polishing pad having polishing surface with continuous protrusions having tapered sidewalls |
CN104924195A (en) * | 2015-06-12 | 2015-09-23 | 浙江工业大学 | Sapphire wafer efficient ultra-precision machining method |
EP3024015A1 (en) | 2013-07-19 | 2016-05-25 | Nagoya Institute Of Technology | Metallic polishing pad and production method therefor |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5888119A (en) * | 1997-03-07 | 1999-03-30 | Minnesota Mining And Manufacturing Company | Method for providing a clear surface finish on glass |
US20100203809A1 (en) * | 2003-10-28 | 2010-08-12 | Nihon Micro Coating Co., Ltd. | Method of polishing a magnetic hard disc substrate |
JP4792802B2 (en) * | 2005-04-26 | 2011-10-12 | 住友電気工業株式会社 | Surface treatment method of group III nitride crystal |
KR20090010774A (en) * | 2007-07-24 | 2009-01-30 | 에이티티(주) | Manufacturing method of diamond grinder and diamond grinder produced thereby |
JP2010064196A (en) * | 2008-09-11 | 2010-03-25 | Ebara Corp | Substrate polishing device and substrate polishing method |
CN103659576A (en) * | 2012-09-20 | 2014-03-26 | 苏州赫瑞特电子专用设备科技有限公司 | Grinding and polishing plate of single sided grinding and polishing machine |
US9308616B2 (en) * | 2013-01-21 | 2016-04-12 | Innovative Finishes LLC | Refurbished component, electronic device including the same, and method of refurbishing a component of an electronic device |
EP3354406B1 (en) * | 2015-10-27 | 2023-11-22 | Fujibo Holdings, Inc. | Wrapping material and method for manufacturing same, and method for manufacturing abrasive |
MY186275A (en) * | 2016-08-23 | 2021-07-02 | Shinetsu Chemical Co | Method for producing substrate |
-
2019
- 2019-06-13 EP EP19819006.8A patent/EP3807049A4/en active Pending
- 2019-06-13 US US17/058,672 patent/US20210205958A1/en active Pending
- 2019-06-13 MX MX2020013349A patent/MX2020013349A/en unknown
- 2019-06-13 CA CA3101919A patent/CA3101919A1/en active Pending
- 2019-06-13 BR BR112020022826-5A patent/BR112020022826A2/en unknown
- 2019-06-13 WO PCT/FI2019/050456 patent/WO2019239013A1/en active Application Filing
-
2020
- 2020-10-27 ZA ZA2020/06691A patent/ZA202006691B/en unknown
- 2020-12-04 DO DO2020000235A patent/DOP2020000235A/en unknown
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000087011A (en) | 1998-09-09 | 2000-03-28 | Tokyo Magnetic Printing Co Ltd | Free abrasive grain polishing slurry composition |
EP1129821A1 (en) * | 1999-08-31 | 2001-09-05 | Shin-Etsu Handotai Co., Ltd | Method and device for polishing semiconductor wafer |
JP2004001169A (en) * | 2001-12-12 | 2004-01-08 | Toyobo Co Ltd | Abrasive pad for semiconductor wafer polishing |
US20050075052A1 (en) * | 2003-10-06 | 2005-04-07 | Kwang-Bok Kim | Method and system for planarizing integrated circuit material |
KR20070031220A (en) * | 2005-09-14 | 2007-03-19 | 가부시키가이샤 오카모도 코사쿠 기카이 세이사쿠쇼 | Double face plane polishing machine and method for polishing rectangular workpiece |
US20130130595A1 (en) * | 2010-07-09 | 2013-05-23 | Asahi Glass Company, Limited | Polishing agent and polishing method |
KR20130140057A (en) | 2010-12-07 | 2013-12-23 | 아사히 가라스 가부시키가이샤 | Grinder |
US20140273777A1 (en) * | 2013-03-14 | 2014-09-18 | Nexplanar Corporation | Polishing pad having polishing surface with continuous protrusions having tapered sidewalls |
EP3024015A1 (en) | 2013-07-19 | 2016-05-25 | Nagoya Institute Of Technology | Metallic polishing pad and production method therefor |
CN104924195A (en) * | 2015-06-12 | 2015-09-23 | 浙江工业大学 | Sapphire wafer efficient ultra-precision machining method |
Non-Patent Citations (1)
Title |
---|
See also references of EP3807049A4 |
Also Published As
Publication number | Publication date |
---|---|
CA3101919A1 (en) | 2019-12-19 |
BR112020022826A2 (en) | 2021-02-02 |
EP3807049A4 (en) | 2022-03-23 |
MX2020013349A (en) | 2021-03-09 |
EP3807049A1 (en) | 2021-04-21 |
US20210205958A1 (en) | 2021-07-08 |
DOP2020000235A (en) | 2021-03-31 |
ZA202006691B (en) | 2021-08-25 |
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