WO2019207718A1

WO2019207718A1 - State monitoring device and adjustment method for asynchronous data

Info

Publication number: WO2019207718A1
Application number: PCT/JP2018/017026
Authority: WO
Inventors: 正敬桐原; 直聡坂本; 佐々木　和也
Original assignee: 三菱電機株式会社
Priority date: 2018-04-26
Filing date: 2018-04-26
Publication date: 2019-10-31
Also published as: CN112005180A; JP6861893B2; CN112005180B; JPWO2019207718A1

Abstract

A state monitoring device (1) which monitors, by waveband monitoring, a state of a production facility (2) expected to be operated in a certain operation in each cycle on the basis of a measurement value from a measurement apparatus (3) which does not give a response of time information. The state monitoring device (1) is configured to have a measurement point count adjustment unit (13) for adjusting raw wave data (Wr) in such a manner that, in a case where a measurement point count (N) of the raw wave data (Wr) does not coincide with a reference measurement point count (X), out of measurement points (Mi) or measurement point intervals of the raw wave data (Wr), by deleting measurement points (Mi) set by a predetermined standard or adding the measurement points into the measurement point intervals, the measurement point count (N) coincides with the reference measurement point count (X).

Description

Status monitoring apparatus and asynchronous data adjustment method

The present invention relates to a state monitoring device that monitors the state of a device using data (asynchronous data) that does not have time information from a measuring device, and a method for adjusting asynchronous data to be applicable to state monitoring.

In state monitoring to monitor the presence or absence of equipment abnormalities, the current waveform during production equipment operation is acquired a predetermined number of times in advance, and the upper and lower thresholds are set for each measurement point that makes up the waveform using statistical methods. A method for detecting an abnormality in a production facility is known (see, for example, Patent Document 1).

Japanese Patent Laid-Open No. 2002-341909 (paragraphs 0024 to 0031, FIGS. 1, 5, and 6)

However, the above method requires time information for each measurement point when generating waveform data. However, many general-purpose measuring devices do not respond to time information. Further, general-purpose measuring devices do not perform data measurement in synchronization with a data collection device that performs state monitoring, and a host device that performs data collection does not necessarily collect data at a fixed period. *

Therefore, for example, even when targeting devices that are expected to operate at a certain cycle and operation, such as MC processing machines and press machines, there may be variations in the number of data points that can be acquired from the start to the stop. It was. In other words, when data is collected from a general-purpose measuring device, there is a possibility that measurement points for performing upper and lower limit comparisons are misaligned, making accurate abnormality detection difficult.

The present invention has been made to solve the above-described problems, and is collected from a state monitoring device that can accurately detect an abnormality even with a general-purpose measurement device or a general-purpose measurement device. An object of the present invention is to obtain an asynchronous data adjustment method for adjusting asynchronous data so that state monitoring is possible.

The state monitoring device of the present invention is a state monitoring device that monitors the state of a device that is assumed to operate with a constant operation for each cycle by threshold judgment for each measurement value constituting waveform data for one cycle. Then, from a measuring device that does not respond to time information, a measurement value collection unit that collects measurement values indicating the state of the device, and the measurement values collected by the measurement value collection unit are arranged in chronological order, and one cycle of the device A waveform processing unit for generating the waveform data, a reference waveform that is waveform data for one cycle when the apparatus is normal, a threshold for each measurement value of the reference waveform, and the number of measurement points of the reference waveform A reference waveform data storage unit that stores reference waveform data including the number of reference measurement points, and a raw waveform data generated by the waveform processing unit is adjusted and output for comparison with the reference waveform data A waveform data adjustment unit that compares the waveform data output from the waveform data adjustment unit with the reference waveform data and determines whether or not there is an abnormality in the device. When the number of measurement points of the raw waveform data does not match the reference number of measurement points, the adjustment unit deletes the measurement points set according to a predetermined reference among the measurement points or measurement points of the raw waveform data, or between the measurement points. The raw waveform data is adjusted so as to coincide with the reference number of measurement points by adding measurement points to.

The asynchronous data adjustment method of the present invention is assumed to operate with a constant operation for each cycle using waveform data in which asynchronous measurement values output from a measuring device that does not respond to time information are arranged in time series. A method of adjusting waveform data for use in monitoring the status of a device, a measurement value collecting step for collecting a measurement value indicating the state of the device from the measurement device, and a measurement collected in the measurement value collection step A waveform forming step for arranging values in chronological order to generate waveform data for one cycle of the apparatus, a reference waveform that is waveform data for one cycle when the apparatus is normal, and a measured value of the reference waveform A reference waveform data storage step for storing reference waveform data including a threshold value of the reference waveform and a reference measurement point number determined as the number of measurement points of the reference waveform; and A waveform data adjustment step for adjusting and outputting the generated raw waveform data for comparison with the reference waveform data, and comparing the waveform data output in the waveform data adjustment step with the reference waveform data, causing an error in the device. An abnormality presence / absence determination step for determining whether or not there is a measurement point, and in the waveform data adjustment step, if the number of measurement points of the raw waveform data does not match the reference number of measurement points, the measurement point of the raw waveform data or The raw waveform data is adjusted so as to coincide with the reference number of measurement points by deleting measurement points set according to a predetermined reference or adding measurement points between the measurement points. .

According to the state monitoring apparatus or the asynchronous data adjustment method of the present invention, even if the number of data points varies, the number of data can be adjusted appropriately, so that it is accurate using a general-purpose measuring instrument that does not respond to time information. State monitoring can be performed.

It is a functional block diagram which shows the structure of the state monitoring apparatus concerning Embodiment 1 of this invention. It is a timing chart for demonstrating the gap between the acquisition time of the data which a measuring device which does not have a synchronous function transmits, and the request time of the data which a state monitoring device will collect. It is a timing chart for explaining the gap between the time when the production facility outputs facility operation information and the time when the state monitoring device confirms the facility operation status. It is a waveform diagram for explaining a method of setting reference waveform data including upper and lower limit values for each measurement point from a plurality of collected waveform data. 4 is a flowchart for explaining operations of collecting measurement data and generating raw waveform data in the state monitoring apparatus and the asynchronous data adjustment method according to the first exemplary embodiment of the present invention; 5 is a flowchart for explaining an operation of processing raw waveform data and generating reference waveform data serving as a criterion for determining whether there is an abnormality in the state monitoring apparatus and the asynchronous data adjustment method according to the first exemplary embodiment of the present invention. is there. Example of waveform data acquired when there is an excess or deficiency in the number of measurement points of data transmitted from a measuring device that does not have a synchronization function with respect to the number of measurement points of data to be collected by the state monitoring device FIG. In the state monitoring apparatus and asynchronous data adjustment method according to the first exemplary embodiment of the present invention, it is a waveform diagram for explaining processing of measurement points with respect to waveform data with one or more measurement points. It is a figure for demonstrating the process which adds and inserts a measurement point in the state monitoring apparatus and the adjustment method of asynchronous data concerning Embodiment 1 of this invention. It is a figure for demonstrating the process which deletes a measurement point in the state monitoring apparatus and asynchronous data adjustment method concerning Embodiment 1 of this invention. Example of waveform data acquired when there are two excess or deficiency in the number of measurement points of data that can be collected from a measurement device that does not have a synchronization function with respect to the number of measurement points of data that the state monitoring device is to collect. FIG. In the state monitoring apparatus and asynchronous data adjustment method according to the first exemplary embodiment of the present invention, it is a waveform diagram for explaining processing of measurement points with respect to waveform data having two measurement points in excess or deficiency. 4 is a flowchart for explaining an operation of processing raw waveform data to determine whether there is an abnormality in the state monitoring apparatus and the asynchronous data adjustment method according to the first exemplary embodiment of the present invention. FIG. 6 is a flowchart for explaining an operation of specifying a data deletion part or an addition part for waveform data having excessive or insufficient measurement points in the state monitoring apparatus and the asynchronous data adjustment method according to the second exemplary embodiment of the present invention. is there. In the state monitoring apparatus and asynchronous data adjustment method according to the second exemplary embodiment of the present invention, it is a waveform diagram for explaining the processing of measurement points for waveform data with excessive or insufficient measurement points.

Embodiment 1 FIG.
FIGS. 1 to 12 are diagrams for explaining the configuration and operation of the state monitoring apparatus according to the first embodiment of the present invention, or a method for adjusting asynchronous data. FIG. 1 is a functional block showing the structure of the state monitoring apparatus. FIG. 2 and FIG. 2 show, as an explanation of problems to be solved in each embodiment of the present invention, the acquisition time point of data transmitted by a measuring device not having a synchronization function and the request for data to be collected by the state monitoring device FIG. 3 is a timing chart for explaining the deviation from the time point, and FIG. 3 explains the deviation between the time point when the production facility outputs the facility operation information indicating its own operation state and the time point when the state monitoring device confirms the facility operation state. It is a timing chart for. 4 (a) to 4 (e) show a method for setting a reference waveform and upper and lower limit values for each measurement point from a plurality of collected waveform data as an explanation of reference waveform data for waveform band monitoring. It is a wave form diagram for demonstrating.

FIG. 5 is a flowchart for explaining the operation of collecting measurement data and generating raw waveform data in the state monitoring apparatus and the asynchronous data adjustment method, and FIG. 6 is a process for determining whether there is an abnormality by processing the raw waveform data. FIGS. 7A to 7C are flowcharts for explaining an operation for generating reference waveform data as a reference, and FIGS. 7A to 7C are measurements that do not have a synchronization function for the number of measurement points of data to be collected by the state monitoring device. FIGS. 8A and 8B are diagrams showing examples of waveform data acquired when there is an excess or deficiency in the number of measurement points of data transmitted from the device. FIGS. FIG. 9A and FIG. 9B are diagrams for explaining backward shift processing of measurement points when additional measurement points are inserted, and FIG. 9A and FIG. 9B are waveform diagrams for explaining measurement point addition and deletion processing with respect to certain waveform data; 10 (a) and 10 (b) It is a diagram for explaining a forward shift processing of the measurement point for deleting the measurement points.

FIGS. 11A and 11B are diagrams showing examples of waveform data acquired when there are two or more measurement points of data collected from a measurement device that does not have a synchronization function. 12 (a) and 12 (b) are waveform diagrams for explaining measurement point addition and deletion processing with respect to waveform data having two excesses or shortages in the number of measurement points. FIG. 13 is a flowchart for explaining the operation of processing raw waveform data to determine the presence or absence of an abnormality.

As shown in FIG. 1, the state monitoring apparatus 1 according to the first embodiment of the present invention is an apparatus (production facility 2) that is assumed to operate at a constant cycle / operation, such as an MC processing machine or a press machine, for example. It is for monitoring the state of Based on data from the measuring device 3 that communicates and outputs measurement values for detecting the equipment state such as current, pressure, and temperature supplied to the production equipment 2 without time information, the state of the production equipment 2 is determined. It is something to monitor. Specifically, the monitoring waveform data measured for each operation cycle of the production facility 2 is compared with the reference waveform data set in advance for each measurement point, and whether or not the upper and lower limit values are deviated for each measurement point. Thus, the state of the production facility 2 is monitored by determining the presence or absence of abnormality.

Note that the reference waveform data refers to a combination of data of each measurement point forming a reference waveform (reference waveform Wa) and an upper limit value Thu and a lower limit value Thl provided for each measurement point. Further, a range in which the reference waveform Wa is given a width by the upper limit value Thu and the lower limit value Thl is referred to as a waveform band T (see FIG. 4), and whether the acquired monitoring waveform data deviates from the waveform band T. Determining whether or not there is an abnormality based on whether or not monitoring is referred to as waveform band monitoring.

Therefore, the state monitoring apparatus 1 for waveform band monitoring includes a transmission / reception unit 16 that transmits and receives data such as measurement values for generating reference waveform data and monitoring waveform data, and a reference waveform by communication with the measurement device 3. A reference waveform data generation unit 10 that generates data, a reference waveform data storage unit 11 that stores the generated reference waveform data, and a waveform data (raw waveform data Wr) for each cycle by sequentially arranging the acquired data in time series. The waveform processing unit 14 to be generated, the reference waveform data stored in the reference waveform data storage unit, and the waveform data for monitoring are compared to determine whether there is an abnormality in the production equipment 2 to be monitored. 15, an operation unit 17 that performs input / output operations, a display unit 18 that outputs the operating status of the production facility 2 and the occurrence of an abnormality, and a signal from the production facility 2, With determining the second operational state, and a state monitoring control unit 12 for integrated control of the units described above.

The feature of the state monitoring apparatus 1 according to each embodiment of the present invention is that it is suitable for reference waveform data and monitoring waveform data by adjusting the number of measurement points of waveform data with excess or deficiency in measurement points described later. The measurement point adjustment unit 13 for correcting the shape is provided. Here, before the description of each part including the measurement point number adjustment unit 13 which is a characteristic part, in the waveform data of the apparatus which is assumed to operate at a fixed period / operation, the cause of excess or deficiency of measurement points explain.

As explained in the background art, general-purpose measuring devices output only measured values without time information. Therefore, the state monitoring device arranges the data acquired from the measuring device in time series, and generates waveform data that plots the measured values on the XY plane, such as measured value (Y axis) and measured point order (X axis). To do. If one cycle of waveform data is acquired from the start to the stop for a production facility that operates at a fixed period and operation, there is no change in the operating time, so ideally the waveform with the same number of measurement points can be acquired. Here, the measurement device updates the measurement value at a device-specific cycle, and the state monitoring device similarly requests data from the measurement device at the device-specific cycle. However, when a general-purpose measuring device is used, there is no means for synchronizing the measurement value update of the measuring device and the timing at which the state monitoring device requests data, and the acquired data is asynchronous data.

Therefore, the waveform data generated by the state monitoring device acquiring the measurement values in chronological order does not coincide with the measurement sampling period. For example, as shown in FIG. As will occur, a deviation occurs between the actual measurement points and the collected measurement points. In other words, as long as general-purpose measuring equipment that cannot associate time information with measured values is used, even if a production facility operates at a fixed period and operation, the waveform data for one cycle from the start to the stop of each operation In addition, there may be a slight excess or deficiency (variation) in the number of measurement points.

Also, the ON / OFF switching timing of the actual operating state in the production facility and the delay time required for the state monitoring device to detect the ON / OFF state of the production facility are also considered as factors of variation in the number of measurement points. For example, as shown in FIG. 3, the time until the state monitoring device requests a signal indicating the operating state from the production facility and detects the ON / OFF at the timing when the production facility is actually turned on / off. It is estimated that a delay time (ΔTi, ΔTe) occurs in In this case, there is a deviation of ΔTe−ΔTi from the one cycle operating time TcD detected (recognized) by the state monitoring device with respect to the actual one cycle operating time TcR, and the number of measurement points varies. .

On the other hand, as shown in FIGS. 4A to 4C, the waveform band T used for waveform band monitoring is a plurality of waveform data W1, W2,... Wn for each cycle when the production facility is normal. (In the figure, n = 3 is shown for simplification). The values (measurement values) for the measurement points of the plurality of acquired waveform data W1 to W3 usually vary as shown in FIG. Therefore, statistical processing is performed for each measurement point, and for example, an average value for each measurement point can be calculated as the reference waveform Wa. Similarly, if the upper limit value Thu and the lower limit value Thl are calculated by adding and subtracting the standard deviation at each measurement point to the average value, the reference waveform data that can define the waveform band T described above can be generated.

However, if there are variations in the number of measurement points for each cycle, the target of statistical processing shifts and accurate reference waveform data cannot be calculated. Even if the reference waveform data is calculated using only the data of the cycle having the same number of measurement points, accurate waveform band monitoring cannot be performed if the number of measurement points of the monitoring waveform data is deviated. That is, the waveform band cannot be monitored if the number of measurement points remains varied.

However, since the state monitoring apparatus 1 according to each embodiment of the present invention includes the measurement point adjustment unit 13 that appropriately adjusts the number of measurement points of the waveform data for each cycle, the general-purpose measurement apparatus 3 sequentially. Accurate waveform band monitoring can be performed based on the collected data. Details will be described below.

<Reference waveform data generator>
The reference waveform data generation unit 10 includes a reference waveform data storage unit 10a for storing a plurality of raw waveform data Wr generated by the waveform processing unit 14 for generating reference waveform data, and a waveform acquired a predetermined number of times. A reference measurement point number deriving unit 10b for deriving a reference number of measurement points (reference measurement point number X) from the data, and adjusted waveform data W obtained by adjusting the number of measurement points of the raw waveform data Wr by a measurement point number adjusting unit 13 described later. An adjusted waveform data storage unit 10c to be stored, and a statistical value calculation unit for deriving statistical values such as an average value and a standard deviation for each measurement point from the adjusted waveform data W stored in the adjusted waveform data storage unit 10c 10d and the average value for each measurement point calculated by the statistical value calculation unit 10d, the reference waveform Wa is calculated, and based on the standard deviation, the upper limit value Thu and the lower limit value for each measurement point of the reference waveform Wa Set hl, comprises a waveform band generator 10e for generating a waveform band T, a.

In each embodiment, an example is shown in which an average value is used to generate the reference waveform Wa, an upper limit value Thu for generating the waveform band T, and a standard deviation is used to generate the lower limit value Thl. There is no. Depending on the characteristics of the monitoring target, for example, the mode value or the median value may be used for the reference waveform, or the upper limit value Thu and the lower limit value Thl may be generated using other statistical values. Or you may make it add the smoothing process using the value of the nearby measurement point. Furthermore, adjustments such as excluding data with a large deviation from other data may be added.

<Measurement point adjustment unit>
The measurement point adjustment unit 13 determines whether or not the measurement point number of the raw waveform data Wr output from the state monitoring control unit 12 matches the reference measurement point number X stored in the reference waveform data storage unit 11. When there is an excess or deficiency in the number of measurement points of the shortage determination unit 13a and the raw waveform data Wr, the adjustment target of the raw waveform data Wr (position between measurement points where measurement points should be inserted or position of measurement points to be deleted) And a waveform data adjustment unit 13c that adjusts the raw waveform data Wr and generates adjusted waveform data W based on the adjustment target determined by the adjustment point determination unit 13b.

The measurement point adjustment unit 13 outputs the generated adjusted waveform data W to the reference waveform data generation unit 10 or the state monitoring control unit 12 under the control of the state monitoring control unit 12.

As described above, the state monitoring control unit 12 controls the overall operation of the state monitoring device 1 and requests a signal indicating the operating state of the production facility 2 by the method described in FIG. It has a function to determine the operating state. In each embodiment, an example in which the operation status of the production facility 2 is determined by an output signal from the operation state output unit 20 of the production facility 2 is shown, but the present invention is not limited to this. For example, the determination may be made in conjunction with a start switch or a stop switch provided in the production facility 2, or the operating status of the production facility 2 may be determined based on a signal from the measuring device 3.

In addition, in each embodiment, although each part of the state monitoring apparatus 1 is described as if there was individual hardware, it does not necessarily need to be comprised by the physically separated member. For example, it may be realized by operating a computer or the like by a program configured with modules corresponding to each step in the method of adjusting asynchronous data described in the following operations or each part of the state monitoring device 1. Further, it may be realized by causing a computer to read a storage medium storing the above-described program.

Next, the operation will be described.
When the state monitoring control unit 12 determines that the production facility 2 is in the ON state, the waveform processing unit 14 uses the measurement values collected via the transmission / reception unit 16 until it is determined to be in the OFF state. The raw waveform data Wr for one cycle is generated. Specifically, as shown in the flowchart of FIG. 5, the state monitoring control unit 12 acquires a signal indicating the operation state from the operation state output unit 20 (step S100), which is the ON state or the OFF state? Is determined (step S110). In addition, the ON state here does not mean that the power source is ON, but means a state in which it is operating as a production facility.

If it is determined that the state is the ON state (“Y” in step S110), the state monitoring control unit 12 sends the measurement device 3 to the transmission / reception unit 16 from the sensor unit 30 and the measurement calculation unit 31 as described in FIG. The measurement value of the obtained production facility 2 is requested, and the measurement value Mi is acquired by the response of the measurement value from the communication unit 32 (step S120). This operation is continued until the state monitoring control unit 12 obtains an operating state signal (step S130) and determines that the signal is OFF.

If it is determined that the signal has been switched from ON to OFF, the waveform processing unit 14 generates a raw waveform data Wr by arranging a series of measurement values Mi received by the transmission / reception unit 16 in time series, and outputs the raw waveform data Wr to the state monitoring control unit 12 ( Step S140).

When the condition of the monitoring target such as the initial state of the state monitoring device 1 or the switching of the production facility 2 changes and the reference waveform data needs to be generated, the raw waveform data Wr generated and output by the waveform processing unit 14 is Is output to the reference waveform data generation unit 10. Then, reference waveform data is formed as shown in the flowchart of FIG.

The reference waveform data generation unit 10 determines whether or not a predetermined number (n) of waveform data that is the basis of the reference waveform data has been acquired (stored in the reference waveform data storage unit 10a). (Step S200). When it is determined that the predetermined number (n) has been acquired (“Y” in step S200), the reference measurement point number deriving unit 10b obtains each raw waveform data from the raw waveform data Wr stored in the reference waveform data storage unit 10a. Based on the average number of measurement points to be configured, a reference measurement number X of an integer value is derived (step S210). In the derivation of the reference number of measurement points X, as described in the generation of the waveform band T, it goes without saying that not only the average value but also other statistical values may be used. However, in waveform band monitoring, each measurement point is compared and it is necessary to adjust to an integer.

When the reference measurement point X is determined, the raw waveform data Wr is output to the measurement point adjustment unit 13, and the waveform data W after adjustment of the measurement point is stored in the adjusted waveform data storage unit 10c (steps S220 to S230: measurement point adjustment). This will be described in detail in the operation of the unit 13). When a predetermined number (n) of waveform data W is stored in the adjusted waveform data storage unit 10c, the statistical value calculation unit 10d calculates an average value Ma and a standard for each measurement point arranged in time series of each waveform data W. Deviation Mu is derived (steps S240 to S250).

When the calculation of the statistical values is completed, the waveform band generation unit 10e has a waveform having upper and lower thresholds (upper limit value Thu, lower limit value Thl) for each measurement point arranged in time series based on the calculated statistical values. A band T is generated (step S260). When the waveform band T is generated, the reference measurement point number X calculated by each part of the reference waveform data generation unit 10, the average value of each measurement point representing the reference waveform Wa, the standard deviation, and the waveform band T are used as reference waveform data. It is stored in the reference waveform data storage unit 11. As a result, data serving as a reference for the subsequent state monitoring is prepared.

Here, the operation of the measurement point adjusting unit 13 including steps S220 to S230 (the same applies to steps S320 to S330 in the state monitoring flow (FIG. 13) described later) will be described. The excess / deficiency determination unit 13a counts the number of measurement points of the raw waveform data Wr output from the reference waveform data generation unit 10 or the state monitoring control unit 12, and whether or not the counted number of measurement points matches the reference measurement point number X. Determine whether. For example, as shown in FIG. 7C, when the number of measurement points N of the raw waveform data Wr ₃ matches the reference number of measurement points X, the adjustment of the coefficient points of the raw waveform data Wr ₃ is not performed. as already waveform data W _3, as it is returned to the output source.

On the other hand, when the measurement point number N does not match the reference measurement point number X, the raw waveform data Wr is output to the adjustment point determination unit 13b to determine the adjustment point. When the number of measurement points N of the raw waveform data Wr is smaller than the reference number of measurement points X, a point (a portion between the most recent measurement points) obtained by equally dividing the number N of measurement points by a value obtained by adding 1 to the shortage number Decide as an additional target. On the other hand, when the number N of measurement points of the raw waveform data Wr is larger than the reference measurement point X, a point (the most recent measurement point) obtained by equally dividing the measurement point N by the value obtained by adding 1 to the excess number is the measurement point. Decide to delete.

Specifically, the i-th measurement point in one waveform data will be described as Mi. As shown in FIG. 7A, when the number N of measurement points of the raw waveform data Wr ₁ is one less than the reference measurement point number X (N = X−1), measurement is performed as shown in FIG. The portion between the measurement points nearest to the point _{MN / 2} is determined as an addition target of the measurement points. Alternatively, as shown in FIG. 7B, when the number N of measurement points of the raw waveform data Wr ₂ is one more than the reference measurement point number X (N = X + 1), measurement is performed as shown in FIG. The measurement point nearest to the point _{MN / 2} is determined as a deletion target.

Thus, the addition target or deleted, is determined, the waveform data adjustment unit 13c, for the waveform data Wr1, as explained in FIG. 8 (a), the one between the measuring points, the measurement points M _{N A} new measurement point is added to the portion between the _two most recent measurement points. As the value of the measurement point to be added, for example, the average value of the measurement points on both sides is used. The order of the measurement points after the measurement point _{MN / 2} is lowered one by one (backward shift). Similarly, for the waveform data Wr2, as described with reference to FIG. 8B, the measurement point closest to the measurement point _{MN / 2} is deleted among the measurement points. Thereby, the order of the measurement points after the measurement point _{MN / 2} is increased by one (forward shift).

More specifically, for example, as shown in FIGS. 9A and 9B, when M ₃ is added between Mr ₂ and Mr ₃ , the order before Mr ₂ does not change, and Mr ₃ is When M _{4 is set} to M ₄ and Mr ₄ is set to M ₅ , the order of the measurement points inserted after M ₃ is shifted backward. Similarly, as shown in FIGS. 10 (a) and 10 (b), when Mr ₃ is deleted, the order before Mr ₂ is not changed, and Mr ₄ is inserted into M ₃ and Mr ₅ is inserted into M _4. The order of the measured points after Mr ₃ is shifted forward.

Alternatively, as shown in FIG. 11A, when the number N of measurement points of the raw waveform data Wr ₁ is two smaller than the reference number of measurement points X (N = X−2), it is shown in FIG. In this way, the nearest portion between the measurement points M _{N / 3} and M _{2N / 3} is determined as the measurement point addition target. Similarly, as shown in FIG. 11B, when the number N of measurement points of the raw waveform data Wr ₂ is two more than the reference measurement number X (N = X + 2), as shown in FIG. The measurement point of the measurement point nearest to each of the measurement point M _{N / 3} and the measurement point M _{2N / 3} is determined as a deletion target.

Also in that case, the waveform data adjustment unit 13c, with respect to the raw waveform data Wr1, as described with reference to FIG. 12A, among the measurement points, the measurement point M _{N / 3} and the measurement point M _{2N / 3.} A new measurement point is added to the portion between the most recent measurement points. Thereby, the order of the measurement points after the measurement point M _{N / 3} is shifted backward by one, and the measurement points after the measurement point M _{2N / 3} are further shifted backward by one (two in total). Similarly, for the raw waveform data Wr2, as described with reference to FIG. 12B, the nearest measurement points of the measurement point _{MN / 3} and the measurement point _{M2N / 3} are deleted among the measurement points. To do. As a result, one measurement point after the measurement point M _{N / 3} is shifted forward by one, and one measurement point after the measurement point M _{2N / 3} is further shifted backward (two in total).

In this way, the raw waveform data Wr with excess or deficiency is returned to the output source as adjusted waveform data W after adjusting the number of measurement points by the waveform data adjustment unit 13c. The same applies when the excess / deficiency number is 3 or more.

Thereby, the reference waveform data generation unit 10 can generate the reference waveform data using the waveform data having the same number of measurement points. Similarly, the abnormality presence / absence determination unit 15 can also perform upper / lower limit comparison for each measurement point by using waveform data in which the number N of measurement points matches the reference number X of the reference waveform Wa, thereby enabling equipment abnormality monitoring. Hereinafter, a description will be given using the flowchart of FIG.

When the state monitoring control unit 12 obtains the raw waveform data Wr (FIG. 5: Steps S100 to S140), it checks whether or not the reference waveform data is stored in the reference waveform data storage unit 11 (Step S300). If not stored (“N” in step S300), the raw waveform data Wr is output to the reference waveform data generation unit 10 to execute the reference waveform data generation step (S200˜). On the other hand, if it is stored (“Y” in step S300), the acquired raw waveform data Wr is output to the measurement point adjustment unit 13 in order to use it for state monitoring.

In the measurement point adjustment unit 13, as described above, the excess / deficiency determination unit 13a first determines whether or not the measurement point number N matches the reference measurement point number X (step S310). When the number of measurement points N of the raw waveform data Wr does not match the reference number of measurement points X (“N” in step S310), the number of measurement points is adjusted by the adjustment location determination unit 13b and the waveform data adjustment unit 13c to monitor the waveform. Data W is generated and returned to the state monitoring control unit 12 (steps S320 to S330). When the number of measurement points N of the raw waveform data Wr matches the reference number of measurement points X (“Y” in step S310), the state monitoring control unit 12 uses the output raw waveform data Wr as it is as the waveform data W for monitoring. Reply to

The state monitoring control unit 12 outputs the returned monitoring waveform data W to the abnormality presence / absence determination unit 15 to determine whether there is an abnormality. The abnormality presence / absence determination unit 15 compares the output waveform data W with the reference waveform data, and determines whether there is an abnormality depending on whether each measurement point of the waveform data W is within the waveform band T. (Step S340). If it falls within the waveform band T (“Y” in step S350), it is determined that there is an abnormality. For example, the deterioration information is obtained based on the degree of deviation or the past history (continuous or sudden). Display or output.

Thus, by providing the measurement point adjustment unit 13 or the process of adjusting the measurement points (for example, steps S310 to S330), it becomes possible to detect an abnormality by combining asynchronous embedded devices. In particular, since the addition or deletion of measurement points is equally divided according to the number of excesses and deficiencies, the positions of measurement points are not shifted locally. In other words, even if there is a misalignment between the location where the defect actually occurred or the location that was acquired excessively and the target to be added or deleted, the effect can be minimized. Addition or deletion can be appropriately performed with a simple calculation.

In the present embodiment and the next embodiment, an example of monitoring one monitoring target will be described, but the present invention is not limited to this. For example, multiple abnormality detections may be performed using a plurality of state monitoring devices in which different types of measuring devices with communication functions are connected to one monitoring target.

Embodiment 2. FIG.
In the configuration and operation of the state monitoring apparatus according to the second embodiment of the present invention, or the method for adjusting asynchronous data, a method for deleting or setting additional points when the number of measurement points is excessive or insufficient compared to the first embodiment. Are different. Since it is the same as that of Embodiment 1 about other than that, the figure and description in Embodiment 1 are used about the same part. FIGS. 14 and 15 are diagrams for explaining the operation of the state monitoring apparatus according to the second embodiment of the present invention or the asynchronous data adjustment method. FIG. 14 shows a raw waveform when determining the presence or absence of an abnormality. 15A and 15B are flowcharts including an operation for setting an addition or deletion point when adjusting the number of measurement points of data using a correlation with a reference waveform, and FIGS. 15A and 15B show that the number of measurement points is one or more. It is a wave form diagram for demonstrating the setting process of the addition location or deletion location of a measurement point with respect to waveform data.

In the first embodiment, by setting the addition / deletion position by simple equal allocation according to the excess / deficiency number, the influence of misalignment can be minimized without increasing the processing load. An example of adjusting the number of measurement points was shown. In the second embodiment, the burden of the arithmetic processing is increased as compared with the first embodiment, but the deviation itself from the location where the actual defect has occurred or the location that has been acquired excessively is minimized, and it is accurate. This makes it possible to add or delete various measurement points.

In the state monitoring apparatus or the asynchronous data adjustment method according to the second embodiment, as shown in FIG. 14, the state monitoring control unit 12 acquires the raw waveform data Wr (FIG. 5: Steps S100 to S140). It is confirmed whether or not the reference waveform data is stored in the reference waveform data storage unit 11 (step S400). If not stored (“N” in step S400), the raw waveform data Wr is output to the reference waveform data generation unit 10 to execute the reference waveform data generation step (S200˜). On the other hand, if it is stored (“Y” in step S400), the acquired raw waveform data Wr is output to the measurement point adjustment unit 13 in order to use it for state monitoring.

In the measurement point adjustment unit 13, as described above, the excess / deficiency determination unit 13a first determines whether or not the measurement point number N matches the reference measurement point number X (step S410). When the measurement point number N of the raw waveform data Wr matches the reference measurement point number X (“Y” in step S410), the output raw waveform data is directly used as the monitoring waveform data W to the state monitoring control unit 12. Send back. On the other hand, when the measurement point N of the raw waveform data Wr does not match the reference measurement point X (“N” in step S410), the adjustment location determination unit 13b sets an addition / deletion target (step S420). The waveform data adjustment unit 13c adjusts the number of measurement points of the raw waveform data Wr according to the set addition / deletion target, generates the waveform data W for monitoring, and returns it to the state monitoring control unit 12 (step S420). To S430).

Here, a method for determining an adjustment point when the number of measurement points N is one excess or deficiency with respect to the reference measurement number X will be described with reference to FIG. When the shortage number is 1, as shown in FIG. 15A, the adjustment location determination unit 13b sequentially inserts measurement points between all measurement points and outside positions, and the provisional waveform obtained by the insertion. And the correlation with the reference waveform Wa is calculated and stored. Then, the insertion location where the provisional waveform having the highest correlation can be formed is set as the insertion location for the point adjustment (step S420). The operation of the waveform data adjustment unit 13c after setting is the same as that in the first embodiment. The average value between the measurement points may be the same as in the first embodiment, but in the case of the outer position, it may be extrapolated from the inclination of the nearby measurement point. For example, when adding a measurement point in front of Mr ₁ may be the difference between the Mr ₂ and Mr ₁ to the value obtained by dividing the value of Mr _1. Similarly, if you add a measurement point behind Mr _N may be the difference between the Mr _N and _{Mr N-1} to a value obtained by adding the Mr _N.

Or when the excess number is 1, as shown in FIG.15 (b), the adjustment location determination part 13b deletes all the measurement points sequentially, and correlates with the temporary waveform obtained by deleting, and the reference | standard waveform Wa. Is calculated and stored. Then, the deletion location where the provisional waveform having the highest correlation can be formed is set as a deletion location for score adjustment (step S420).

The operation after step S440 is the same as that after step S340 in FIG. 13 described in the first embodiment. As a result, the number of measurement points can be adjusted by adding or deleting measurement points at an accurate position in which a deviation from a location where an actual defect has occurred or an excessively acquired location is minimized.

The number of provisional waveform data created by multiplying the number of objects to be deleted or added by the number of excess / deficiency is required, but even if the number of excess / deficiency is two or more, this deletion or addition target setting method Is valid.

As described above, according to the state monitoring apparatus 1 according to the first or second embodiment of the present invention, the state of the apparatus (production facility 2) that is assumed to operate with a constant operation for each cycle is changed to one cycle. The state monitoring device 1 that monitors by the upper and lower limit judgment (or threshold judgment) for each measurement value constituting the minute waveform data from the measurement device 3 that does not respond to the time information, the measurement value indicating the state of the production facility 2 A measurement value collection unit (transmission / reception unit 16) to collect, a waveform processing unit 14 that arranges the measurement values collected by the transmission / reception unit 16 in time series, and generates waveform data for one cycle of the production facility 2, and the production facility 2 Reference waveform Wa, which is waveform data for one cycle when is normal, upper limit value Thu and lower limit value Thl (or any threshold value) for each measurement value of reference waveform Wa, and the number of measurement points of reference waveform Wa A reference waveform data storage unit 11 for storing reference waveform data including a predetermined reference measurement point X, and raw waveform data Wr generated by the waveform processing unit 14 are adjusted and output for comparison with the reference waveform data. The waveform data adjustment unit (measurement point adjustment unit 13) and the waveform data W output from the measurement point adjustment unit 13 are compared with the reference waveform data to determine whether or not the production facility 2 has an abnormality. The measurement point adjustment unit 13 sets the measurement point Mi of the raw waveform data Wr according to a predetermined reference among the measurement points Mi or the measurement points of the raw waveform data Wr when the measurement point number N of the raw waveform data Wr does not match the reference measurement point number X. The raw waveform data Wr is adjusted to coincide with the reference measurement point number X by deleting the measurement points Mi or adding measurement points between the measurement points. As a result, even when a general-purpose measuring device that does not respond to time information is used, state monitoring using the waveform band T can be accurately executed.

Further, like the state monitoring apparatus 1 according to the first embodiment, the waveform data adjustment unit (measurement point adjustment unit 13) corresponds to the number of measurement points N of the raw waveform data Wr from the reference measurement point X, which is excessive or insufficient. Since the position obtained by equally dividing the number N of measurement points of the raw waveform data Wr is set as the target for deletion or addition of the measurement points, the location where the defect is actually generated or the excess is not increased without increasing the processing load. Even if there is a positional deviation between the location acquired in the previous step and the object to be added or deleted, it is possible to perform accurate state monitoring with minimal influence.

Alternatively, as in the state monitoring apparatus 1 according to the second embodiment, the waveform data adjustment unit (measurement point adjustment unit 13) is the number of excess and deficiency from the reference measurement point number X with respect to all measurement points of the raw waveform data Wr. The provisional waveform data generated each time the measurement points are sequentially deleted or added are compared with the reference waveform Wa, and the provisional waveform data having the highest correlation with the reference waveform Wa is output as the adjusted waveform data W. It is possible to adjust the number of measurement points by adding or deleting measurement points at an accurate position with a minimum deviation from a location where an actual defect has occurred or an excessively acquired location.

Further, a reference measurement point X is calculated from a plurality of waveform data collected when the apparatus (production facility 2) is normal, and the waveform data adjustment unit (measurement point adjustment unit 13) is based on the calculated reference measurement point X. If the waveform data W obtained by adjusting the waveform data (raw waveform data Wr) for a plurality of times is used to provide the reference waveform data generation unit 10 that generates the reference waveform data Wa, The number of measurement points can be adjusted by adding or deleting measurement points at an accurate position with a minimum deviation from the excessively acquired location.

It has an operation state determination unit (a part of the function of the state monitoring control unit 12) for determining whether the device (production facility 2) is in an ON state or an OFF state based on a signal received from the outside, and a measurement value collection unit ( If the transmission / reception unit 16) starts or stops collection of measurement values from the measurement device 3 based on the determination result of the operating state determination unit, the waveform data for one cycle is obtained without human intervention. Acquire and monitor the status.

As described above, according to the asynchronous data adjustment method according to the first or second embodiment of the present invention, the waveform data in which the asynchronous measurement values output from the measurement device 3 that does not respond to time information are arranged in time-series order. A method for adjusting waveform data for use in monitoring the state of a device (production facility 2) that is supposed to operate with a constant operation for each cycle, from the measuring device 3 to the state of the production facility 2 A measurement value collection step (steps S120 to S130) for collecting measurement values indicative of the waveform, and a waveform generation step for generating waveform data for one cycle of the production facility 2 by arranging the measurement values collected in the measurement value collection step in time series (Step S140), a reference waveform Wa that is waveform data for one cycle when the production facility 2 is normal, and an upper limit value Thu and a lower limit value T for each measured value of the reference waveform Wa. Reference waveform data storage step for storing reference waveform data including 1 (or any threshold value) and a reference measurement point number X determined as the number of measurement points of the reference waveform Wa, and raw waveform data generated in the waveform forming step A waveform data adjustment step (step S330 or S430) for adjusting and outputting Wr for comparison with the reference waveform data Wa, and comparing the waveform data W output in the waveform data adjustment step with the reference waveform data for production. An abnormality presence / absence determination step (steps S340 to S360 or S440 to S460) for determining whether or not the facility 2 has an abnormality. In the waveform data adjustment step, the number N of measurement points of the raw waveform data is the reference number of measurement points. When X does not match (step S310 or S410), measurement point Mi or measurement of raw waveform data Wr The raw waveform data is adjusted so as to coincide with the number of reference measurement points by deleting measurement points set according to a predetermined reference or adding measurement points between measurement points (steps S320 to S330, or S420 to S430), the asynchronous data collected from the general-purpose measuring device can be adjusted so that the status can be easily monitored.

In addition, as in the asynchronous data adjustment method according to the first embodiment, in the waveform data adjustment step, the raw waveform data Wr is changed according to the number of measurement points N of the raw waveform data Wr from the reference measurement point X. By configuring the positions obtained by equally dividing the number of measurement points as deletion points or addition targets for measurement points (steps S320 to S330), the location where an actual defect has occurred or excessively increased without increasing the burden of calculation processing. Even if there is a positional deviation between the acquired location and the addition or deletion target, the data can be adjusted with the effect minimized.

Alternatively, as in the asynchronous data adjustment method according to the second embodiment, in the waveform data adjustment step, the measurement points for the excess and deficiency from the reference measurement points X are sequentially deleted from all the measurement points of the raw waveform data Wr. Alternatively, the provisional waveform data generated each time it is added is compared with the reference waveform Wa, and temporary waveform data having the highest correlation with the reference waveform Wa is output as adjusted waveform data (steps S420 to S430). Data can be adjusted by adding or deleting measurement points at an accurate position with minimal deviation from a location where a defect has actually occurred or a location that has been acquired excessively.

In each of the above-described embodiments, an example of upper / lower limit determination in which the presence / absence of abnormality is determined by both the upper limit value Thu and the lower limit value Thl has been described, but the present invention is not limited to this. The same effect can be obtained even by threshold determination based on at least one threshold.

1: Status monitoring device, 2: Production equipment (device), 3: Measuring equipment,
10: Reference waveform data generation unit, 11: Reference waveform data storage unit, 12: State monitoring control unit, 13: Measurement point adjustment unit (waveform data adjustment unit), 14: Waveform processing unit, 15: Abnormality determination unit, 16: Transmission / reception unit (measurement value collection unit),
Mi: measurement value, N: number of measurement points, T: waveform band, Thl: lower limit value (threshold), Thu: upper limit value (threshold), W: waveform data, Wa: reference waveform, Wr: raw waveform data, X: reference Number of measurement points.

Claims

A state monitoring device that monitors a state of a device that is assumed to operate with a constant operation for each cycle by threshold determination for each measurement value that constitutes waveform data for one cycle,
A measurement value collection unit that collects measurement values indicating the state of the device from a measurement device that does not respond to time information;
Arranging the measurement values collected by the measurement value collection unit in chronological order, and generating a waveform data for one cycle of the apparatus;
Reference waveform data including a reference waveform that is waveform data for one cycle when the apparatus is normal, a threshold for each measurement value of the reference waveform, and a reference measurement point number determined as the number of measurement points of the reference waveform A reference waveform data storage unit for storing;
A waveform data adjusting unit for adjusting and outputting the raw waveform data generated by the waveform processing unit for comparison with the reference waveform data;
Comparing the waveform data output by the waveform data adjustment unit with the reference waveform data, and including an abnormality presence / absence determination unit that determines whether or not there is an abnormality in the device,
The waveform data adjustment unit, when the number of measurement points of the raw waveform data does not match the number of reference measurement points, deletes the measurement points set by a predetermined reference among the measurement points of the raw waveform data or between measurement points, or A state monitoring apparatus that adjusts the raw waveform data so as to coincide with the reference number of measurement points by adding measurement points between measurement points.
The waveform data adjusting unit is configured to delete or add the measurement points to the positions obtained by equally dividing the measurement points of the raw waveform data according to the excess or deficiency of the measurement points of the raw waveform data from the reference measurement points. The state monitoring device according to claim 1, wherein the state monitoring device is set.
The waveform data adjustment unit compares the temporary waveform data generated each time the measurement points corresponding to the excess or deficiency from the reference measurement points are sequentially deleted or added to all the measurement points of the raw waveform data with the reference waveform. The condition monitoring apparatus according to claim 1, wherein provisional waveform data having the highest correlation with the reference waveform is output as adjusted waveform data.
The reference measurement points are calculated from a plurality of waveform data collected when the apparatus is normal, and the waveform data adjustment unit uses the waveform data obtained by adjusting the waveform data for the plurality of times based on the calculated reference measurement points. The state monitoring device according to any one of claims 1 to 3, further comprising a reference waveform data generation unit that generates the reference waveform data.
An operating state determination unit that determines whether the device is in an ON state or an OFF state based on a signal received from the outside;
5. The measurement value collection unit according to claim 1, wherein the measurement value collection unit starts or stops collecting measurement values from the measurement device based on a determination result of the operating state determination unit. The state monitoring device described.
Waveforms for use in monitoring the status of devices that are expected to operate with a constant operation for each cycle, using waveform data in which asynchronous measurement values output from measuring equipment that does not respond to time information are arranged in time series A method of adjusting data,
A measurement value collection step for collecting measurement values indicating the state of the device from the measurement device;
Arranging the measurement values collected in the measurement value collection step in chronological order, and generating waveform data for one cycle of the apparatus;
Reference waveform data including a reference waveform that is waveform data for one cycle when the apparatus is normal, a threshold for each measurement value of the reference waveform, and a reference measurement point number determined as the number of measurement points of the reference waveform A reference waveform data storage step for storing;
A waveform data adjustment step for adjusting and outputting the raw waveform data generated in the waveform forming step for comparison with the reference waveform data;
Comparing the waveform data output in the waveform data adjustment step with the reference waveform data, and determining whether or not there is an abnormality in the apparatus,
In the waveform data adjustment step, when the number of measurement points of the raw waveform data does not match the reference measurement point number, the measurement points set according to a predetermined reference among the measurement points of the raw waveform data or between measurement points, or A method of adjusting asynchronous data, wherein the raw waveform data is adjusted so as to coincide with the reference number of measurement points by adding measurement points between measurement points.
In the waveform data adjustment step, a position obtained by equally dividing the number of measurement points of the raw waveform data according to the excess or deficiency of the number of measurement points of the raw waveform data from the reference measurement number is set as a target for deletion or addition of the measurement points. The method for adjusting asynchronous data according to claim 6, wherein the setting is performed.
In the waveform data adjustment step, the temporary waveform data generated every time the measurement points corresponding to the excess or deficiency from the reference measurement points are sequentially deleted or added to all the measurement points of the raw waveform data are compared with the reference waveform. 7. The method of adjusting asynchronous data according to claim 6, wherein provisional waveform data having the highest correlation with the reference waveform is output as adjusted waveform data.