WO2019037219A1 - Cf基板及其制作方法与配向膜配向角度量测方法 - Google Patents

Cf基板及其制作方法与配向膜配向角度量测方法 Download PDF

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WO2019037219A1
WO2019037219A1 PCT/CN2017/106822 CN2017106822W WO2019037219A1 WO 2019037219 A1 WO2019037219 A1 WO 2019037219A1 CN 2017106822 W CN2017106822 W CN 2017106822W WO 2019037219 A1 WO2019037219 A1 WO 2019037219A1
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Prior art keywords
substrate
alignment film
layer
alignment
structural
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PCT/CN2017/106822
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English (en)
French (fr)
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侯崴栋
罗凯铭
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武汉华星光电技术有限公司
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Priority to US15/570,995 priority Critical patent/US20190384103A1/en
Publication of WO2019037219A1 publication Critical patent/WO2019037219A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133509—Filters, e.g. light shielding masks
    • G02F1/133514—Colour filters
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133509—Filters, e.g. light shielding masks
    • G02F1/133514—Colour filters
    • G02F1/133516—Methods for their manufacture, e.g. printing, electro-deposition or photolithography
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133509—Filters, e.g. light shielding masks
    • G02F1/133512—Light shielding layers, e.g. black matrix
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/133388—Constructional arrangements; Manufacturing methods with constructional differences between the display region and the peripheral region

Definitions

  • the present invention relates to the field of display technologies, and in particular, to a CF substrate, a method for fabricating the same, and a method for measuring an alignment angle of an alignment film.
  • LCDs liquid crystal displays
  • Various consumer electronic products such as digital assistants, digital cameras, notebook computers, and desktop computers have become mainstream in display devices.
  • liquid crystal display devices which include a liquid crystal display panel and a backlight module.
  • the working principle of the liquid crystal display panel is to place liquid crystal molecules in two parallel glass substrates. There are many vertical and horizontal small wires between the two glass substrates, and the liquid crystal molecules are controlled to change direction by energizing or not, and the light of the backlight module is changed. Refracted to produce a picture.
  • a liquid crystal display panel comprises a CF (Color Filter) substrate, a thin film transistor (TFT) substrate, a liquid crystal (LC) sandwiched between the color filter substrate and the thin film transistor substrate, and a sealant frame ( Sealant),
  • the molding process generally includes: front array (Array) process (film, yellow, etching and stripping), middle cell (Cell) process (TFT substrate and CF substrate bonding) and rear module assembly Process (drive IC and printed circuit board is pressed).
  • the front Array process mainly forms a TFT substrate to control the movement of liquid crystal molecules;
  • the middle Cell process mainly adds liquid crystal between the TFT substrate and the CF substrate;
  • the rear module assembly process is mainly to drive the IC to press and print the circuit.
  • the integration of the plates drives the liquid crystal molecules to rotate and display images.
  • the CF substrate plays a key role in the display of color images.
  • the CF substrate usually includes a base substrate, a black matrix, and a color photoresist layer which are sequentially disposed from bottom to top. In the liquid crystal forming process, it is usually required.
  • the alignment film is formed on the CF substrate. Since the alignment angle of the alignment film has a significant influence on the optical performance of the liquid crystal display panel, it is usually necessary to measure the alignment angle to confirm whether it is in an appropriate range, and the alignment angle of the alignment film.
  • the measurement method usually uses the principle of light reflection.
  • the existing alignment film alignment angle measurement method is generally: on the white glass substrate 100 According to the manufacturing method of the alignment film on the CF substrate, a plurality of alignment films 200 are formed at intervals, and a plurality of measurement sites 300 are selected on one or several alignment films 200, and alignment is performed at the plurality of measurement sites 300. The alignment angle of the film 200 is measured, and the measured alignment angle is the alignment angle of the alignment film on the CF substrate.
  • the method is indirect measurement, the measurement result is not accurate enough, and real-time monitoring of the product in the production process cannot be realized. It is prone to bad batch products.
  • An object of the present invention is to provide a method for fabricating a CF substrate, which can simplify the measurement method of the alignment angle of the alignment film and improve the measurement accuracy.
  • Another object of the present invention is to provide a CF substrate, which can simplify the measurement method of the alignment angle of the alignment film and improve the measurement accuracy.
  • the object of the present invention is to provide a method for measuring the alignment angle of an alignment film, which does not need to separately prepare a measuring substrate, has a simple measuring method and high measuring precision, and is beneficial for real-time monitoring of the alignment angle of the alignment film in the production process. Avoid bulk product defects.
  • the present invention first provides a method for fabricating a CF substrate, comprising the following steps:
  • Step 1 providing a substrate, the substrate comprising a display area and a non-display area disposed around the display area;
  • Step 2 forming a flat layer on the plurality of stacked structural layers and the base substrate, the flat layer covering the plurality of through holes, and the flat layer surface is formed corresponding to the plurality of through holes Several grooves.
  • the plurality of stacked structural layers include at least a first structural layer disposed on the base substrate and a second structural layer disposed on the first structural layer, the first structural layer and the second structure
  • the layers are any combination of a black matrix and a colored photoresist layer.
  • the plurality of through holes are formed in the process of fabricating the plurality of stacked structural layers, and each of the structural layers is formed with corresponding via holes, and the plurality of through holes are formed.
  • a plurality of via holes of the laminated structural layers penetrate each other to form a through hole.
  • the opening shape of the groove is a rectangle, and the side length of the rectangle is 5 mm to 10 mm.
  • the depth of the groove is the
  • the present invention also provides a CF substrate, comprising a substrate substrate, a plurality of laminated structural layers disposed on the substrate, and a planar layer disposed on the plurality of stacked structural layers;
  • the base substrate includes a display area and a non-display area disposed around the display area, the number a plurality of through holes are formed in the layer of the structural layer corresponding to the non-display area, the flat layer covers the plurality of through holes, and the surface of the flat layer is formed corresponding to the plurality of through holes Several grooves.
  • the plurality of stacked structural layers include at least a first structural layer disposed on the base substrate and a second structural layer disposed on the first structural layer, the first structural layer and the second structure
  • the layer is any combination of black matrix and color photoresist layer
  • Each of the plurality of structural layers disposed in a plurality of layers is provided with a corresponding via hole, and the plurality of via holes on the plurality of stacked structural layers penetrate each other to form a through hole.
  • the opening shape of the groove is a rectangle, and the side length of the rectangle is 5 mm to 10 mm.
  • the depth of the groove is the
  • the present invention also provides a method for measuring an alignment angle of an alignment film, comprising: providing a CF substrate as described above, forming an alignment film on a flat layer of the CF substrate, the alignment film covering the plurality of grooves, Measuring, by an alignment film measuring instrument, an alignment angle of the alignment film, the alignment film measuring device emitting light to the portion of the alignment film located in the groove and receiving the reflected light, using the principle of light reflection The alignment angle of the alignment film is measured.
  • the method for fabricating the CF substrate of the present invention can form a plurality of grooves in the non-display area of the CF substrate, so that after applying the alignment film on the plurality of grooves, the plurality of grooves can be directly applied to the grooves.
  • the alignment angle of the alignment film is measured.
  • the CF substrate of the present invention is prepared by the above method, and is advantageous for simplifying the measurement method of the alignment angle of the alignment film.
  • the alignment film alignment angle measuring method of the present invention comprises: forming an alignment film on the CF substrate, and directly measuring the alignment angle of the alignment film at the plurality of grooves, because in the plurality of grooves Only the flat layer is disposed under the alignment film, which avoids the influence of the coloring resist layer and the structural layer such as the black matrix on the alignment angle measurement of the alignment film, the flat layer is transparent and the surface is smooth, and the alignment film is aligned.
  • the angle measurement result has minimal influence.
  • the invention does not need to re-measure the measuring substrate, simplifies the alignment angle measurement method of the alignment film, improves the measurement precision, and realizes the alignment angle of the alignment film in the production process. Real-time monitoring to avoid bad batch products.
  • 1 is a schematic view showing a conventional method for measuring an alignment angle of an alignment film
  • FIG. 2 is a flow chart showing a method of fabricating a CF substrate of the present invention
  • FIG. 3 is a schematic view showing the first step of the method for fabricating the CF substrate of the present invention
  • FIG. 4 is a schematic view showing a step 2 of a method for fabricating a CF substrate of the present invention, and a schematic cross-sectional view showing a CF substrate of the present invention
  • FIG. 5 is a schematic plan view of a CF substrate of the present invention.
  • Fig. 6 is a schematic view showing the method for measuring the alignment angle of the alignment film of the present invention.
  • the present invention first provides a method for fabricating a CF substrate, including the following steps:
  • Step 1 as shown in FIG. 3, providing a base substrate 10, the base substrate 10 including a display area and a non-display area disposed around the display area;
  • a plurality of laminated structural layers 20 are formed on the base substrate 10, and a plurality of through holes 30 are formed in the plurality of laminated structural layers 20 corresponding to the non-displayed regions.
  • the plurality of through holes 30 are formed in the process of fabricating the plurality of stacked structural layers 20, and each of the structural layers 20 is formed corresponding to each other.
  • a plurality of via holes 25 of the plurality of laminated structural layers 20 are penetrated each other to form a through hole 30.
  • the base substrate 10 is a glass substrate.
  • the plurality of stacked structural layers 20 include at least a first structural layer 21 disposed on the base substrate 10 and a second structural layer 22 disposed on the first structural layer 21,
  • the first structural layer 21 and the second structural layer 22 are any combination of a black matrix and a color photoresist layer.
  • Step 2 as shown in FIG. 4 and FIG. 5, a flat layer 40 is formed on the plurality of stacked structural layers 20 and the substrate 10, and the flat layer 40 covers the plurality of through holes 30.
  • the surface of the flat layer 40 is formed with a plurality of grooves 60 corresponding to the plurality of through holes 30.
  • the flat layer 40 is a transparent organic material.
  • the number of the plurality of grooves 60 varies according to the product size, and the number of designs is different.
  • the opening shape of the groove 60 is a rectangle, and the side length of the rectangle is 5 mm to 10 mm.
  • the opening of the groove 60 is a square of 5 mm ⁇ 5 mm.
  • the depth of the groove 60 is Preferred
  • the method for fabricating the CF substrate of the present invention comprises forming a plurality of grooves in the non-display area of the CF substrate 60, after the alignment film 50 is coated on the plurality of grooves 60, the alignment angle measurement of the alignment film 50 can be directly performed at the plurality of grooves 60, which is advantageous for simplifying the alignment angle measurement method of the alignment film.
  • the present invention further provides a CF substrate, including a substrate substrate 10 , and a plurality of stacked structural layers 20 disposed on the substrate 10 , And a flat layer 40 disposed on the plurality of stacked structural layers 20;
  • the substrate substrate 10 includes a display area and a non-display area disposed around the display area, and a plurality of through holes 30 are disposed in the plurality of structural layers 20 of the plurality of stacked structural layers 20 corresponding to the non-display area.
  • the flat layer 40 covers the plurality of through holes 30 , and the surface of the flat layer 40 forms a plurality of grooves 60 corresponding to the plurality of through holes 30 .
  • the base substrate 10 is a glass substrate.
  • the plurality of stacked structural layers 20 include at least a first structural layer 21 disposed on the base substrate 10 and a second structural layer 22 disposed on the first structural layer 21,
  • the first structural layer 21 and the second structural layer 22 are any combination of a black matrix and a color photoresist layer.
  • Each of the plurality of structural layers 20 is provided with a corresponding via hole 25, and a plurality of via holes 25 on the plurality of stacked structural layers 20 are connected to each other to form a through hole. Hole 30.
  • the flat layer 40 is a transparent organic material.
  • the number of the plurality of grooves 60 varies according to the product size, and the number of designs is different.
  • the opening shape of the groove 60 is a rectangle, and the side length of the rectangle is 5 mm to 10 mm.
  • the opening of the groove 60 is a square of 5 mm ⁇ 5 mm.
  • the depth of the groove 60 is Preferred
  • the CF substrate of the present invention can directly align the alignment film 50 at the plurality of grooves 60 by arranging a plurality of grooves 60 in the non-display area so that the alignment film 50 is subsequently coated on the plurality of grooves 60.
  • the measurement is beneficial to simplify the measurement method of the alignment angle of the alignment film.
  • the present invention further provides a method for measuring an alignment angle of an alignment film, comprising: providing a CF substrate as described above, forming an alignment film 50 on the flat layer 40 of the CF substrate, the alignment film 50 Covering the plurality of grooves 60, the alignment angle of the alignment film 50 is measured by an alignment film measuring instrument, and the alignment film measuring device emits a portion of the alignment film 50 located in the groove 60.
  • the light rays receive the reflected light, and the alignment angle of the alignment film 50 is measured by the principle of light reflection.
  • the flat layer 40 Since only the flat layer 40 is disposed under the alignment film 50 at the plurality of grooves 60, the light reflection process during the alignment measurement of the alignment film of the color photoresist layer and the black matrix or the like is avoided. In effect, the flat layer 40 is transparent and has a smooth surface, for the alignment film 50 The alignment angle measurement results have minimal impact.
  • the alignment film 50 is a photo alignment film.
  • the alignment film alignment angle measuring method of the present invention comprises: forming an alignment film 50 on the CF substrate, and directly measuring the alignment angle of the alignment film 50 at the plurality of grooves 60 due to the plurality of concaves in the plurality of grooves 60 Only the flat layer 40 is disposed under the alignment film 50 at the groove 60, which avoids the influence of the coloring resist layer and the structural layer such as the black matrix on the alignment angle measurement of the alignment film 50, and the flat layer 40 is transparent and The surface is smooth, and the influence on the alignment angle measurement result of the alignment film 50 is extremely small. Compared with the prior art, the present invention does not need to re-measure the measurement substrate, simplifies the alignment angle measurement method of the alignment film, and improves the measurement accuracy. The real-time monitoring of the alignment angle of the alignment film in the production process is realized, and the defect of the batch product is avoided.
  • the present invention provides a CF substrate, a method for fabricating the same, and a method for measuring an alignment angle of an alignment film.
  • the method for fabricating the CF substrate of the present invention can form the alignment film directly at the plurality of grooves by forming a plurality of grooves in the non-display area of the CF substrate, so that the alignment film can be directly aligned on the plurality of grooves.
  • Angle measurement The CF substrate of the present invention is prepared by the above method, and is advantageous for simplifying the measurement method of the alignment angle of the alignment film.
  • the alignment film alignment angle measuring method of the present invention comprises: forming an alignment film on the CF substrate, and directly measuring the alignment angle of the alignment film at the plurality of grooves, because in the plurality of grooves Only the flat layer is disposed under the alignment film, which avoids the influence of the coloring resist layer and the structural layer such as the black matrix on the alignment angle measurement of the alignment film, the flat layer is transparent and the surface is smooth, and the alignment film is aligned.
  • the angle measurement result has minimal influence.
  • the invention does not need to re-measure the measuring substrate, simplifies the alignment angle measurement method of the alignment film, improves the measurement precision, and realizes the alignment angle of the alignment film in the production process. Real-time monitoring to avoid bad batch products.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
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Abstract

一种CF基板及其制作方法与配向膜（50）配向角度量测方法，CF基板的制作方法通过在CF基板的非显示区形成数个凹槽（60），使得后续在数个凹槽（60）上涂布配向膜（50）后，可以直接在数个凹槽（60）处对配向膜（50）进行配向角度量测，是一种有利于简化配向膜（50）配向角度的量测方法。配向膜（50）配向角度量测方法包括：在CF基板上形成配向膜（50），在数个凹槽（60）处直接对配向膜（50）进行配向角度的量测，与现有技术相比，不需要重新制作量测基板，简化了配向膜（50）配向角度量测方法，提高量测精度，同时实现了生产过程中配向膜（50）配向角度的实时监控，避免出现批量产品不良。

Description

CF基板及其制作方法与配向膜配向角度量测方法 技术领域
本发明涉及显示技术领域，尤其涉及一种CF基板及其制作方法与配向膜配向角度量测方法。
背景技术
随着显示技术的发展，液晶显示器(Liquid Crystal Display，LCD)等平面显示装置因具有高画质、省电、机身薄及应用范围广等优点，而被广泛地应用于手机、电视、个人数字助理、数字相机、笔记本电脑、台式计算机等各种消费性电子产品，成为显示装置中的主流。
现有市场上的液晶显示装置大部分为背光型液晶显示器，其包括液晶显示面板及背光模组(backlight module)。液晶显示面板的工作原理是在两片平行的玻璃基板当中放置液晶分子，两片玻璃基板中间有许多垂直和水平的细小电线，通过通电与否来控制液晶分子改变方向，将背光模组的光线折射出来产生画面。
通常液晶显示面板由彩膜(CF，Color Filter)基板、薄膜晶体管(TFT，Thin Film Transistor)基板、夹于彩膜基板与薄膜晶体管基板之间的液晶(LC，Liquid Crystal)及密封胶框(Sealant)组成，其成型工艺一般包括：前段阵列(Array)制程(薄膜、黄光、蚀刻及剥膜)、中段成盒(Cell)制程(TFT基板与CF基板贴合)及后段模组组装制程(驱动IC与印刷电路板压合)。其中，前段Array制程主要是形成TFT基板，以便于控制液晶分子的运动；中段Cell制程主要是在TFT基板与CF基板之间添加液晶；后段模组组装制程主要是驱动IC压合与印刷电路板的整合，进而驱动液晶分子转动，显示图像。
液晶显示面板中，CF基板对于彩色图像的显示起着关键的作用，CF基板通常包括从下到上依次设置的衬底基板、黑色矩阵、彩色光阻层，在液晶成盒制程中，通常需要在CF基板上制作配向膜，由于配向膜的配向角度对液晶显示面板的光学性能有着显著影响，因此通常需要对其配向角度进行量测，以确认是否在合适范围，所述配向膜的配向角度量测方法通常利用光反射原理，由于CF基板上设有黑色矩阵与彩色光阻层等具有色彩的结构层，容易对光反射造成影响，因此不能直接在CF基板上进行量测，如图1所示，现有的配向膜配向角度量测方法通常为：在白玻璃基板100上 按照CF基板上配向膜的制作方法形成数个间隔设置的配向膜200，在其中一个或数个配向膜200上选取数个量测位点300，在该数个量测位点300处对配向膜200的配向角度进行量测，测得的配向角度即为CF基板上配向膜的配向角度，然而，由于该方法属于间接测量，因此测量结果不够准确，并且无法实现生产过程中产品的实时监控，容易出现批量产品不良。
发明内容
本发明的目的在于提供一种CF基板的制作方法，能够简化配向膜的配向角度量测方法，提高量测精度。
本发明的目的还在于提供一种CF基板，能够简化配向膜的配向角度量测方法，提高量测精度。
本发明的目的还在于提供一种配向膜配向角度量测方法，不需要单独制作量测基板，量测方法简单，且量测精度高，有利于实现生产过程中配向膜配向角度的实时监控，避免出现批量产品不良。
为实现上述目的，本发明首先提供一种CF基板的制作方法，包括如下步骤：
步骤1、提供衬底基板，所述衬底基板包括显示区与设于所述显示区周围的非显示区；
在所述衬底基板上形成数个层叠设置的结构层，所述数个层叠设置的结构层上对应于所述非显示区的区域设有数个通孔；
步骤2、在所述数个层叠设置的结构层及衬底基板上形成平坦层，所述平坦层包覆所述数个通孔，所述平坦层表面对应于所述数个通孔处形成数个凹槽。
所述数个层叠设置的结构层至少包括设于所述衬底基板上的第一结构层与设于所述第一结构层上的第二结构层，所述第一结构层与第二结构层为黑色矩阵与彩色光阻层的任意排列组合。
所述步骤1中，所述数个通孔的制作方法为：在所述数个层叠设置的结构层的制作过程中，每一结构层上均制作有相互对应的过孔，所述数个层叠设置的结构层的数个过孔相互贯通，形成通孔。
所述凹槽的开口形状为长方形，所述长方形的边长为5mm～10mm。
所述凹槽的深度为
Figure PCTCN2017106822-appb-000001
本发明还提供一种CF基板，包括衬底基板、设于所述衬底基板上的数个层叠设置的结构层、及设于所述数个层叠设置的结构层上的平坦层；
所述衬底基板包括显示区与设于所述显示区周围的非显示区，所述数 个层叠设置的结构层上对应于所述非显示区的区域设有数个通孔，所述平坦层包覆所述数个通孔，所述平坦层表面对应于所述数个通孔处形成数个凹槽。
所述数个层叠设置的结构层至少包括设于所述衬底基板上的第一结构层与设于所述第一结构层上的第二结构层，所述第一结构层与第二结构层为黑色矩阵与彩色光阻层的任意排列组合；
所述数个层叠设置的结构层中，每一结构层上均设有相互对应的过孔，所述数个层叠设置的结构层上的数个过孔相互贯通，形成通孔。
所述凹槽的开口形状为长方形，所述长方形的边长为5mm～10mm。
所述凹槽的深度为
Figure PCTCN2017106822-appb-000002
本发明还提供一种配向膜配向角度量测方法，包括：提供如上文所述的CF基板，在所述CF基板的平坦层上形成配向膜，所述配向膜覆盖所述数个凹槽，采用配向膜量测仪对配向膜的配向角度进行量测，所述配向膜量测仪向所述配向膜上位于所述凹槽内的部分发射光线并接收反射光线，利用光反射的原理对配向膜的配向角度进行量测。
本发明的有益效果：本发明的CF基板的制作方法通过在CF基板的非显示区形成数个凹槽，使得后续在数个凹槽上涂布配向膜后，可以直接在该数个凹槽处对配向膜进行配向角度量测。本发明的CF基板采用上述方法制得，有利于简化配向膜配向角度的量测方法。本发明的配向膜配向角度量测方法包括：在上述CF基板上形成配向膜，在所述数个凹槽处直接对配向膜进行配向角度的量测，由于在所述数个凹槽处所述配向膜的下方仅设有平坦层，避免了彩色光阻层与黑色矩阵等结构层对配向膜的配向角度量测造成影响，所述平坦层呈透明状且表面平滑，对配向膜的配向角度量测结果影响极小，与现有技术相比，本发明不需要重新制作量测基板，简化了配向膜配向角度量测方法，提高量测精度，同时实现了生产过程中配向膜配向角度的实时监控，避免出现批量产品不良。
为了能更进一步了解本发明的特征以及技术内容，请参阅以下有关本发明的详细说明与附图，然而附图仅提供参考与说明用，并非用来对本发明加以限制。
附图说明
下面结合附图，通过对本发明的具体实施方式详细描述，将使本发明的技术方案及其它有益效果显而易见。
附图中，
图1为现有的配向膜配向角度量测方法的示意图；
图2为本发明的CF基板的制作方法的流程图；
图3为本发明的CF基板的制作方法的步骤1的示意图；
图4为本发明的CF基板的制作方法的步骤2的示意图及本发明的CF基板的剖视示意图；
图5为本发明的CF基板的俯视示意图；
图6为本发明的配向膜配向角度量测方法的示意图。
具体实施方式
为更进一步阐述本发明所采取的技术手段及其效果，以下结合本发明的优选实施例及其附图进行详细描述。
请参阅图2，本发明首先提供一种CF基板的制作方法，包括如下步骤：
步骤1、如图3所示，提供衬底基板10，所述衬底基板10包括显示区与设于所述显示区周围的非显示区；
在所述衬底基板10上形成数个层叠设置的结构层20，所述数个层叠设置的结构层20上对应于所述非显示区的区域设有数个通孔30。
具体的，所述步骤1中，所述数个通孔30的制作方法为：在所述数个层叠设置的结构层20的制作过程中，每一结构层20上均制作有相互对应的过孔25，所述数个层叠设置的结构层20的数个过孔25相互贯通，形成通孔30。
具体的，所述衬底基板10为玻璃基板。
具体的，所述数个层叠设置的结构层20至少包括设于所述衬底基板10上的第一结构层21与设于所述第一结构层21上的第二结构层22，所述第一结构层21与第二结构层22为黑色矩阵与彩色光阻层的任意排列组合。
步骤2、如图4与图5所示，在所述数个层叠设置的结构层20及衬底基板10上形成平坦层40，所述平坦层40包覆所述数个通孔30，所述平坦层40表面对应于所述数个通孔30处形成数个凹槽60。
具体的，所述平坦层40为透明有机材料。
具体的，所述数个凹槽60的个数，依照产品尺寸不同，设计个数也不同。
优选的，所述凹槽60的开口形状为长方形，所述长方形的边长为5mm～10mm，优选的，所述凹槽60的开口为5mm×5mm的正方形。
具体的，所述凹槽60的深度为
Figure PCTCN2017106822-appb-000003
优选为
Figure PCTCN2017106822-appb-000004
本发明的CF基板的制作方法通过在CF基板的非显示区形成数个凹槽 60，使得后续在数个凹槽60上涂布配向膜50后，可以直接在该数个凹槽60处对配向膜50进行配向角度量测，有利于简化配向膜配向角度量测方法。
请参阅图4与图5，基于上述CF基板的制作方法，本发明还提供一种CF基板，包括衬底基板10、设于所述衬底基板10上的数个层叠设置的结构层20、及设于所述数个层叠设置的结构层20上的平坦层40；
所述衬底基板10包括显示区与设于所述显示区周围的非显示区，所述数个层叠设置的结构层20上对应于所述非显示区的区域设有数个通孔30，所述平坦层40包覆所述数个通孔30，所述平坦层40表面对应于所述数个通孔30处形成数个凹槽60。
具体的，所述衬底基板10为玻璃基板。
具体的，所述数个层叠设置的结构层20至少包括设于所述衬底基板10上的第一结构层21与设于所述第一结构层21上的第二结构层22，所述第一结构层21与第二结构层22为黑色矩阵与彩色光阻层的任意排列组合。
所述数个层叠设置的结构层20中，每一结构层20上均设有相互对应的过孔25，所述数个层叠设置的结构层20上的数个过孔25相互贯通，形成通孔30。
具体的，所述平坦层40为透明有机材料。
具体的，所述数个凹槽60的个数，依照产品尺寸不同，设计个数也不同。
优选的，所述凹槽60的开口形状为长方形，所述长方形的边长为5mm～10mm，优选的，所述凹槽60的开口为5mm×5mm的正方形。
具体的，所述凹槽60的深度为
Figure PCTCN2017106822-appb-000005
优选为
Figure PCTCN2017106822-appb-000006
本发明的CF基板通过在非显示区设置数个凹槽60，使得后续在数个凹槽60上涂布配向膜50后，可以直接在该数个凹槽60处对配向膜50进行配向角度量测，有利于简化配向膜配向角度量测方法。
请参阅图6，本发明还提供一种配向膜配向角度量测方法，包括：提供如上文所述的CF基板，在所述CF基板的平坦层40上形成配向膜50，所述配向膜50覆盖所述数个凹槽60，采用配向膜量测仪对配向膜50的配向角度进行量测，所述配向膜量测仪向所述配向膜50上位于所述凹槽60内的部分发射光线并接收反射光线，利用光反射的原理对配向膜50的配向角度进行量测。
由于在所述数个凹槽60处所述配向膜50的下方仅设有平坦层40，避免了彩色光阻层与黑色矩阵等结构层20对配向膜配向角度量测过程中的光反射进程造成影响，所述平坦层40呈透明状且表面平滑，对配向膜50的 配向角度量测结果影响极小。
具体的，所述配向膜50为光配向膜。
本发明的配向膜配向角度量测方法包括：在上述CF基板上形成配向膜50，在所述数个凹槽60处直接对配向膜50进行配向角度的量测，由于在所述数个凹槽60处所述配向膜50的下方仅设有平坦层40，避免了彩色光阻层与黑色矩阵等结构层对配向膜50的配向角度量测造成影响，所述平坦层40呈透明状且表面平滑，对配向膜50的配向角度量测结果影响极小，与现有技术相比，本发明不需要重新制作量测基板，简化了配向膜配向角度量测方法，提高量测精度，同时实现了生产过程中配向膜配向角度的实时监控，避免出现批量产品不良。
综上所述，本发明提供一种CF基板及其制作方法与配向膜配向角度量测方法。本发明的CF基板的制作方法通过在CF基板的非显示区形成数个凹槽，使得后续在数个凹槽上涂布配向膜后，可以直接在该数个凹槽处对配向膜进行配向角度量测。本发明的CF基板采用上述方法制得，有利于简化配向膜配向角度的量测方法。本发明的配向膜配向角度量测方法包括：在上述CF基板上形成配向膜，在所述数个凹槽处直接对配向膜进行配向角度的量测，由于在所述数个凹槽处所述配向膜的下方仅设有平坦层，避免了彩色光阻层与黑色矩阵等结构层对配向膜的配向角度量测造成影响，所述平坦层呈透明状且表面平滑，对配向膜的配向角度量测结果影响极小，与现有技术相比，本发明不需要重新制作量测基板，简化了配向膜配向角度量测方法，提高量测精度，同时实现了生产过程中配向膜配向角度的实时监控，避免出现批量产品不良。
以上所述，对于本领域的普通技术人员来说，可以根据本发明的技术方案和技术构思作出其他各种相应的改变和变形，而所有这些改变和变形都应属于本发明权利要求的保护范围。

Claims (10)

  1. 一种CF基板的制作方法，包括如下步骤：
    步骤1、提供衬底基板，所述衬底基板包括显示区与设于所述显示区周围的非显示区；
    在所述衬底基板上形成数个层叠设置的结构层，所述数个层叠设置的结构层上对应于所述非显示区的区域设有数个通孔；
    步骤2、在所述数个层叠设置的结构层及衬底基板上形成平坦层，所述平坦层包覆所述数个通孔，所述平坦层表面对应于所述数个通孔处形成数个凹槽。
  2. 如权利要求1所述的CF基板的制作方法，其中，所述数个层叠设置的结构层至少包括设于所述衬底基板上的第一结构层与设于所述第一结构层上的第二结构层，所述第一结构层与第二结构层为黑色矩阵与彩色光阻层的任意排列组合。
  3. 如权利要求1所述的CF基板的制作方法，其中，所述步骤1中，所述数个通孔的制作方法为：在所述数个层叠设置的结构层的制作过程中，每一结构层上均制作有相互对应的过孔，所述数个层叠设置的结构层的数个过孔相互贯通，形成通孔。
  4. 如权利要求1所述的CF基板的制作方法，其中，所述凹槽的开口形状为长方形，所述长方形的边长为5mm～10mm。
  5. 如权利要求1所述的CF基板的制作方法，其中，所述凹槽的深度为
    Figure PCTCN2017106822-appb-100001
  6. 一种CF基板，包括衬底基板、设于所述衬底基板上的数个层叠设置的结构层、及设于所述数个层叠设置的结构层上的平坦层；
    所述衬底基板包括显示区与设于所述显示区周围的非显示区，所述数个层叠设置的结构层上对应于所述非显示区的区域设有数个通孔，所述平坦层包覆所述数个通孔，所述平坦层表面对应于所述数个通孔处形成数个凹槽。
  7. 如权利要求6所述的CF基板，其中，所述数个层叠设置的结构层至少包括设于所述衬底基板上的第一结构层与设于所述第一结构层上的第二结构层，所述第一结构层与第二结构层为黑色矩阵与彩色光阻层的任意排列组合；
    所述数个层叠设置的结构层中，每一结构层上均设有相互对应的过孔， 所述数个层叠设置的结构层上的数个过孔相互贯通，形成通孔。
  8. 如权利要求6所述的CF基板，其中，所述凹槽的开口形状为长方形，所述长方形的边长为5mm～10mm。
  9. 如权利要求6所述的CF基板，其中，所述凹槽的深度为
    Figure PCTCN2017106822-appb-100002
  10. 一种配向膜配向角度量测方法，包括：提供如权利要求6所述的CF基板，在所述CF基板的平坦层上形成配向膜，所述配向膜覆盖所述数个凹槽，采用配向膜量测仪对配向膜的配向角度进行量测，所述配向膜量测仪向所述配向膜上位于所述凹槽内的部分发射光线并接收反射光线，利用光反射的原理对配向膜的配向角度进行量测。
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