WO2019011080A1 - 一种基于透明转发的晶闸管阀测试系统 - Google Patents

一种基于透明转发的晶闸管阀测试系统 Download PDF

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WO2019011080A1
WO2019011080A1 PCT/CN2018/090096 CN2018090096W WO2019011080A1 WO 2019011080 A1 WO2019011080 A1 WO 2019011080A1 CN 2018090096 W CN2018090096 W CN 2018090096W WO 2019011080 A1 WO2019011080 A1 WO 2019011080A1
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Prior art keywords
test
voltage
tester
unit
thyristor
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PCT/CN2018/090096
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English (en)
French (fr)
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张翔
杨帆
李乐乐
方太勋
陈赤汉
刘磊
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南京南瑞继保电气有限公司
南京南瑞继保工程技术有限公司
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Publication of WO2019011080A1 publication Critical patent/WO2019011080A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/263—Circuits therefor for testing thyristors
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J3/00—Circuit arrangements for ac mains or ac distribution networks
    • H02J3/36—Arrangements for transfer of electric power between ac networks via a high-tension dc link
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/60—Arrangements for transfer of electric power between AC networks or generators via a high voltage DC link [HVCD]

Definitions

  • the invention relates to a test system for functional testing of a thyristor valve at an engineering site, and belongs to the field of power electronics.
  • the trigger system of UHV DC transmission generally includes a control protection system, a valve-based electronic device VBE and a thyristor control unit TCU, wherein the control protection system is responsible for generating a trigger pulse (CP) for transmission to the VBE, and the valve-based electronic device is a control protection system and thyristor control.
  • the bridge between the units is responsible for converting the CP into an ignition pulse (FP) to the TCU under certain conditions.
  • the TCU is a monitoring, control, and protection device on the converter valve tower.
  • the TCU monitoring function mainly includes: when the thyristor stage voltage is greater than a certain threshold value, the TCU sends a pulse width 1 return pulse to the VBE; when the thyristor stage has a protective trigger, the TCU sends a pulse width 2 return pulse to the VBE.
  • the control function mainly means that when the TCU receives the FP, it sends a trigger signal to the thyristor gate level to turn on the thyristor.
  • the protection function mainly includes: when the thyristor stage is in the reverse recovery period and suddenly bears the forward voltage of amplitude 1, the TCU sends a trigger signal to the thyristor gate stage to turn on the thyristor; when the thyristor stage is subjected to the amplitude 2 at any time When the voltage is applied, the TCU sends a trigger signal to the thyristor gate stage to turn on the thyristor.
  • TCU valve control unit
  • the optical path failure was found in the subsequent tests, and all the optical paths were uniformly tested after the fiber installation was completed in the early stage. It is indicated that the optical path failure is caused by repeated insertion and removal during the test of the thyristor valve by the tester. However, due to the huge workload of the optical path test, it is impossible to perform the retest, so the damaged optical fiber is omitted into the subsequent test process. Make an impact.
  • the problem to be solved by the present invention is that, in view of the above-mentioned field test problems, it is proposed that, on the basis of satisfying all test contents and test requirements, neither the optical fiber connected between the field TCU and the VBE nor the TCU can be connected to all the TCUs.
  • the invention provides a thyristor valve test system based on transparent forwarding, the test system includes: a thyristor valve to be tested, a valve control unit and a tester, wherein the thyristor valve and the valve control unit are connected by an optical fiber, An optical fiber connection is adopted between the valve control unit and the tester, and a cable connection is adopted between the measured thyristor valve and the tester.
  • the valve control unit has a dedicated test mode in addition to the normal trigger function. In the test mode, the valve control unit forwards the return light signal received from the measured thyristor valve to the tester, and receives the tester from the tester. The trigger light signal is forwarded to the thyristor valve being tested.
  • testing process of the test system is:
  • the tester generates a corresponding waveform and time voltage excitation in each test item and applies it to both ends of a thyristor stage of the thyristor valve to be tested, and collects the voltage and current of the thyristor stage in real time to determine whether the electrical requirements are met. ;
  • the tester receives the return light signal from the measured thyristor valve through the transparent forwarding function of the valve control unit, and sends a trigger light signal to the measured thyristor valve, and the tester determines whether the optical signal requirement is met by the received return light signal;
  • the tester combines the electrical and optical signals to determine whether the test item is qualified.
  • the thyristor valve to be tested comprises at least one thyristor stage, each thyristor stage comprising at least one thyristor, a triggering unit and a required auxiliary RC circuit.
  • the tester is composed of an optical signal triggering return unit, a microcomputer monitoring unit, a high speed DSP numerical control unit, an impedance testing unit, a low voltage testing unit and special testing software, and can complete an impedance test, a short circuit test, a low voltage trigger test, and a current. Intermittent test, reverse protection period voltage protection test, reverse recovery period end voltage withstand test, forward overvoltage protection test, forward voltage withstand test, reverse voltage withstand test function.
  • the tester can also be composed of an optical signal triggering return unit, a microcomputer monitoring unit, a high speed DSP numerical control unit, an impedance test unit, a low voltage test unit, a high voltage direct current power supply, a surge voltage test unit and special test software, and can complete the impedance. Test, short circuit test, low voltage trigger test, current interrupt test, reverse protection period voltage protection test, reverse recovery period end voltage withstand test, forward over voltage protection test, forward voltage withstand test, reverse voltage Tolerance test function.
  • the tester includes an optical signal triggering return unit, a microcomputer monitoring unit, a high speed DSP numerical control unit, an impedance testing unit and a low voltage testing unit for implementing impedance testing, short circuit testing, low voltage trigger testing, current intermittent testing, Voltage protection test during reverse recovery period, reverse recovery period end voltage withstand test, forward over voltage protection test, forward voltage withstand test or reverse voltage withstand test function.
  • the tester includes an optical signal triggering return unit, a microcomputer monitoring unit, a high speed DSP numerical control unit, an impedance testing unit, a low voltage testing unit, a high voltage direct current power source and a surge voltage testing unit for implementing impedance testing, short circuit testing, Low-voltage trigger test, current interrupt test, voltage protection test during reverse recovery period, reverse recovery period end voltage withstand test, forward over-voltage protection test, forward voltage withstand test or reverse voltage withstand test function.
  • the technology proposed by the present invention only needs to connect the tester and the VBE to the optical fiber in the field test, set the VBE to the test mode, and then connect the tester to the thyristor valve to be tested one by one. It avoids the repeated insertion and removal of the fiber, ensures the test is simple and efficient, and can also detect whether the fiber path between the VBE and the TCU is normal during the test.
  • FIG. 1 is a schematic diagram of a prior art thyristor valve test system.
  • FIG. 2 is a schematic diagram of a thyristor valve test system according to the present invention.
  • FIG. 3 is a schematic diagram showing the spatial arrangement of a thyristor valve test system according to the present invention.
  • the principle of the test system provided in this example is shown in FIG. 2, and is composed of a tester 5, a thyristor valve 4 to be tested, and a valve control unit 3.
  • the thyristor valve and the valve control unit are connected and connected by two optical fibers 1 for receiving and transmitting a trigger report signal;
  • the thyristor valve 4 and the tester 5 are connected and connected by two cables 2,
  • the tester 5 applies a test voltage current to the thyristor valve 4 to be tested; there is a connection between the tester 5 and the valve control unit 3 and two optical fibers 1 for using the valve control unit 3 as a transparent forwarding device to implement the tester 5
  • Tester 5 can choose to use the corresponding test software to achieve interaction and manipulation.
  • the spatial arrangement of the test system provided in this example is shown in FIG. 3.
  • the tester 5 is located in the valve hall 7, and is close to the thyristor valve 4 to be tested, and the valve control unit 3 is located in the control room 6.
  • the test system provided by the present invention is: First, the tester 5 generates 40 cycles of a 380V sinusoidal voltage, which is applied to both ends of a thyristor stage of the thyristor valve 4 to be tested through a cable, and is collected in real time.
  • the voltage and current of the thyristor stage determine whether the thyristor successfully triggers conduction in the test item; secondly, the tester 5 receives the return light signal from the measured thyristor valve 4 through the transparent forwarding function of the valve control unit 3, and is measured The thyristor valve sends a trigger light signal, and the tester judges whether the pulse width and the like are satisfied by the received return light signal. Finally, the tester 5 combines the electrical and optical signals to determine whether the low-voltage trigger test is qualified.
  • the invention is characterized in that the connected fiber is not plugged and unplugged, and all test items and test requirements can be met.
  • a person skilled in the art can make variations and modifications within the scope of the invention as long as it does not exceed the scope of the claims.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Power Conversion In General (AREA)

Abstract

一种基于透明转发的晶闸管阀测试系统，测试系统包括被测晶闸管阀(4)、阀控单元(3)和测试仪(5)，被测晶闸管阀(4)和阀控单元(3)之间采用光纤(1)连接，阀控单元(3)和测试仪(5)之间采用光纤(1)连接，被测晶闸管阀(4)和测试仪(5)之间采用电缆(2)连接。测试时，阀控单元(3)作为中间光信号转接装置，实现测试仪(5)和被测晶闸管阀(4)之间的光信号传输，测试仪(5)向被测晶闸管阀(4)施加测试激励，并根据采集的光信号和电信号判断测试结果。

Description

一种基于透明转发的晶闸管阀测试系统 技术领域
本发明涉及一种用于在工程现场给晶闸管阀进行功能测试的测试系统，属于电力电子领域。
背景技术
特高压直流输电的触发系统一般包括控制保护系统、阀基电子设备VBE和晶闸管控制单元TCU，其中控制保护系统负责产生触发脉冲(CP)发送给VBE，阀基电子设备是控制保护系统和晶闸管控制单元之间的桥梁，负责将CP在一定条件下转换成点火脉冲(FP)发送给TCU，TCU是换流阀塔上的监测、控制、保护设备。TCU监测功能主要包括：当晶闸管级电压大于一定门槛值时，TCU向VBE发送脉宽1的回报脉冲；当晶闸管级发生保护性触发时，TCU向VBE发送脉宽2的回报脉冲。控制功能主要指当TCU接收到FP时，向晶闸管门级发送触发信号使晶闸管导通。保护功能主要包括：当晶闸管级处于反向恢复期时突然承受幅值1的正向电压时，TCU向晶闸管门级发送触发信号使晶闸管导通；当晶闸管级在任何时候承受幅值2的正向电压时，TCU向晶闸管门级发送触发信号使晶闸管导通。
基于TCU以上这些监测、控制和保护功能对换流阀运行影响重大，在有晶闸管阀应用的工程现场，一般在投运前、年检或者设备发生故障更换后，需要对晶闸管阀进行专门的功能测试，TCU的控制、保护功能可以通过晶闸管级的电气信号进行验证，TCU的监测功能需要通过对其回报的光信号进行验证。在工程现场进行测试时，一般所有的TCU和阀控单元(VBE)之间的光纤铺设和连接已经完成，所以以往测试时需要将TCU上和VBE连接的光纤拔出，然后再用另外的光纤将TCU和测试仪连接，如图1所示，这样TCU和测试仪之间可以直接进行光信号 的传输，以满足试验的需要。但这种做法存在一个较大的隐患，即每对一个晶闸管级进行试验时，都至少需要在TCU上进行两次光纤插拔，若该晶闸管级试验并不顺利，则在检查过程中可能多次插拔光纤，而每次插拔光纤都可能对光纤以及TCU的光接口处造成污秽和磨损，影响光信号的传输。在以往的工程现场曾经出现过在完成测试仪对晶闸管阀的功能测试，将原来光纤恢复后，在后续的试验中发现光路故障的情况，而所有光路在前期完成光纤敷设后会统一进行测试，说明该光路故障是由于后续用测试仪对晶闸管阀的测试过程中的反复插拔导致，而由于光路测试的工作量巨大，不可能进行复测，所以受损光纤便遗漏到后续试验过程中，造成影响。
发明内容
本发明所要解决的问题是，针对上述现场测试的问题，提出一种在满足所有测试内容和测试要求的基础上，既不用插拔现场TCU和VBE之间已连接的光纤，又能对所有TCU和VCU之间的光纤进行复测的测试系统。
本发明提供一种基于透明转发的晶闸管阀测试系统，所述测试系统包括：被测晶闸管阀、阀控单元和测试仪，所述被测晶闸管阀和所述阀控单元之间采用光纤连接，所述阀控单元和所述测试仪之间采用光纤连接，所述被测晶闸管阀和所述测试仪之间采用电缆连接。
其中，所述阀控单元除正常触发功能外，具有专用的测试模式，在测试模式下，阀控单元将从被测晶闸管阀接收到的回报光信号转发给测试仪，将从测试仪接收到的触发光信号转发给被测晶闸管阀。
其中，所述测试系统的测试过程为：
a.测试仪在每个测试项目中产生相应波形和时间的电压激励通过电缆施加到被测晶闸管阀的某个晶闸管级两端，并实时采集该晶闸管级的电压和电流，判断是否满足电气要求；
b.测试仪通过阀控单元的透明转发功能，从被测晶闸管阀接收回报光信号，并向被测晶闸管阀发送触发光信号，测试仪通过接收到的回报光信号判断是否满足光信号要求；
c.测试仪综合电气和光信号两方面的响应，判断该测试项目是否合格。
其中，所述的被测晶闸管阀包含至少一个晶闸管级，每个晶闸管级至少包含一个晶闸管、一个触发单元和所需辅助阻容回路。
其中，所述的测试仪由光信号触发回报单元、微机监控单元、高速DSP数控单元、阻抗测试单元、低电压测试单元和专用测试软件组成，可以完成阻抗测试、短路测试、低压触发测试、电流断续测试、反向恢复期内电压保护测试、反向恢复期结束电压耐受测试、正向过电压保护测试、正向电压耐受测试、反向电压耐受测试功能。
其中，所述的测试仪也可由光信号触发回报单元、微机监控单元、高速DSP数控单元、阻抗测试单元、低电压测试单元、高压直流电源、冲击电压测试单元和专用测试软件组成，可以完成阻抗测试、短路测试、低压触发测试、电流断续测试、反向恢复期内电压保护测试、反向恢复期结束电压耐受测试、正向过电压保护测试、正向电压耐受测试、反向电压耐受测试功能。
其中，所述的测试仪包括光信号触发回报单元、微机监控单元、高速DSP数控单元、阻抗测试单元和低电压测试单元，用以实现阻抗测试、短路测试、低压触发测试、电流断续测试、反向恢复期内电压保护测试、反向恢复期结束电压耐受测试、正向过电压保护测试、正向电压耐受测试或者反向电压耐受测试功能。
其中，所述的测试仪包括光信号触发回报单元、微机监控单元、高速DSP数控单元、阻抗测试单元、低电压测试单元、高压直流电源和冲击电压测试单元，用以实现阻抗测试、短路测试、低压触发测试、电流断续测试、反向恢复期内电压保护测试、反向恢复期结束电压耐受测试、正向过电压保护测试、正向电压耐 受测试或者反向电压耐受测试功能。
与现有测试系统相比，本发明所提出的技术在现场测试时仅需将测试仪和VBE用光纤相连，将VBE设置为测试模式，然后测试仪逐个和被测晶闸管阀连接，进行测试，避免了光纤的重复插拔，保证了测试的简洁高效，且在测试过程中还可以顺带检测VBE和TCU之间的光纤通路是否正常。
附图说明
图1为现有技术的一种晶闸管阀测试系统示意图。
图2为本发明提出的一种晶闸管阀测试系统原理图。
图3为本发明提出的一种晶闸管阀测试系统空间布置示意图。
具体实施方式
下面结合一种实施例，对本发明进行进一步的介绍和描述，但本发明的保护范围不局限于此。
本实例提供的测试系统原理如图2所示，由测试仪5、被测晶闸管阀4和阀控单元3组成。其中，被测晶闸管阀和阀控单元有且采用两根光纤1连接，一收一发，用于传输触发回报信号；被测晶闸管阀4和测试仪5有且采用两根电缆2连接，用于测试仪5向被测晶闸管阀4施加测试电压电流；测试仪5和阀控单元3之间有且采用两根光纤1连接，用于将阀控单元3作为透明转发装置，实现测试仪5和被测晶闸管阀4之间的光信号传输。
测试仪5可以选择配合使用相应的测试软件，实现交互和操控。
本实例提供的测试系统的空间布置如图3所示，测试仪5位于阀厅7，并靠近被测晶闸管阀4，阀控单元3位于控制室6。以低压触发测试为例，本发明提供的测试系统为：首先，测试仪5产生40个周波的380V正弦电压，通过电缆施加到被测晶闸管阀4的某个晶闸管级两端，并实时采集该晶闸管级的电压和电流，判断在该测试项目中晶闸管是否成功触发导通；其次，测试仪5通过阀控单 元3的透明转发功能，从被测晶闸管阀4接收回报光信号，并向被测晶闸管阀发送触发光信号，测试仪通过接收到的回报光信号判断是否满足脉冲宽度等方面的要求；最后，测试仪5综合电气和光信号两方面的响应，判断低压触发测试是否合格。
本发明的特点是，不用插拔现场已连接光纤，并能满足所有测试项目和测试要求。本领域的技术人员可以在本发明的权利要求范围内作出变形和修改，只要没有超过所述权利要求的范围，都在本发明的保护范围之内。

Claims (7)

  1. 一种基于透明转发的晶闸管阀测试系统，其特征在于,所述测试系统包括：被测晶闸管阀、阀控单元和测试仪，所述被测晶闸管阀和所述阀控单元之间采用光纤连接，所述阀控单元和所述测试仪之间采用光纤连接，所述被测晶闸管阀和所述测试仪之间采用电缆连接；
    所述阀控单元用以实现正常触发功能，还设置测试模式，在所述测试模式下，阀控单元将从被测晶闸管阀接收到的回报光信号转发给测试仪，将从测试仪接收到的触发光信号转发给被测晶闸管阀。
  2. 如权利要求1所述的一种基于透明转发的晶闸管阀测试系统，其特征在于：所述测试系统的测试过程为：
    a.测试仪在每个测试项目中产生相应波形和时间的电压激励通过电缆施加到被测晶闸管阀的某个晶闸管级两端，并实时采集该晶闸管级的电压和电流，判断是否满足电气要求；
    b.测试仪通过阀控单元的透明转发功能，从被测晶闸管阀接收回报光信号，并向被测晶闸管阀发送触发光信号，测试仪通过接收到的回报光信号判断是否满足光信号要求；
    c.测试仪综合电气和光信号两方面的响应，判断该测试项目是否合格。
  3. 如权利要求1所述的一种基于透明转发的晶闸管阀测试系统，其特征在于：所述的被测晶闸管阀包含至少一个晶闸管级，每个晶闸管级至少包含一个晶闸管、一个触发单元和所需辅助阻容回路。
  4. 如权利要求1所述的一种基于透明转发的晶闸管阀测试系统，其特征在于：所述的测试仪由光信号触发回报单元、微机监控单元、高速DSP数控单元、阻抗测试单元、低电压测试单元和专用测试软件组成，用以实现阻抗测试、短路测试、低压触发测试、电流断续测试、反向恢复期内电压保护测试、反向恢复期 结束电压耐受测试、正向过电压保护测试、正向电压耐受测试或者反向电压耐受测试功能。
  5. 如权利要求1所述的一种基于透明转发的晶闸管阀测试系统，其特征在于：所述的测试仪也可由光信号触发回报单元、微机监控单元、高速DSP数控单元、阻抗测试单元、低电压测试单元、高压直流电源、冲击电压测试单元和专用测试软件组成，用以实现阻抗测试、短路测试、低压触发测试、电流断续测试、反向恢复期内电压保护测试、反向恢复期结束电压耐受测试、正向过电压保护测试、正向电压耐受测试或者反向电压耐受测试功能。
  6. 如权利要求1所述的一种基于透明转发的晶闸管阀测试系统，其特征在于：所述的测试仪包括光信号触发回报单元、微机监控单元、高速DSP数控单元、阻抗测试单元和低电压测试单元，用以实现阻抗测试、短路测试、低压触发测试、电流断续测试、反向恢复期内电压保护测试、反向恢复期结束电压耐受测试、正向过电压保护测试、正向电压耐受测试或者反向电压耐受测试功能。
  7. 如权利要求1所述的一种基于透明转发的晶闸管阀测试系统，其特征在于：所述的测试仪包括光信号触发回报单元、微机监控单元、高速DSP数控单元、阻抗测试单元、低电压测试单元、高压直流电源和冲击电压测试单元，用以实现阻抗测试、短路测试、低压触发测试、电流断续测试、反向恢复期内电压保护测试、反向恢复期结束电压耐受测试、正向过电压保护测试、正向电压耐受测试或者反向电压耐受测试功能。
PCT/CN2018/090096 2017-07-10 2018-06-06 一种基于透明转发的晶闸管阀测试系统 WO2019011080A1 (zh)

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