WO2018200139A1 - Improved laser light energy and dose control using repetition rate based gain estimators - Google Patents
Improved laser light energy and dose control using repetition rate based gain estimators Download PDFInfo
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- WO2018200139A1 WO2018200139A1 PCT/US2018/025921 US2018025921W WO2018200139A1 WO 2018200139 A1 WO2018200139 A1 WO 2018200139A1 US 2018025921 W US2018025921 W US 2018025921W WO 2018200139 A1 WO2018200139 A1 WO 2018200139A1
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- laser
- repetition rate
- voltage
- gain estimator
- gain
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/10069—Memorized or pre-programmed characteristics, e.g. look-up table [LUT]
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70025—Production of exposure light, i.e. light sources by lasers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70558—Dose control, i.e. achievement of a desired dose
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/10038—Amplitude control
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/131—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the active medium, e.g. by controlling the processes or apparatus for excitation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/10038—Amplitude control
- H01S3/10046—Pulse repetition rate control
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/102—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the active medium, e.g. by controlling the processes or apparatus for excitation
- H01S3/104—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the active medium, e.g. by controlling the processes or apparatus for excitation in gas lasers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/1306—Stabilisation of the amplitude
Definitions
- the disclosed subject matter is in the field of laser light control and more specifically in the field of controlling the energy of a laser generated by a laser light source as may be used in semiconductor photolithography processes.
- Photolithography is a commonly used process in the semiconductor industry.
- Modem photolithography typically uses a laser light source, also known as a laser system, to provide very narrow band light pulses that illuminate a mask thus exposing photo-resistive material on silicon wafers, also known as substrates, in stepper-scanner devices, also known as scanners.
- a laser light source also known as a laser system
- stepper-scanner devices also known as scanners.
- Advances in semiconductor device parameters have put increasing demands on the performance characteristics of the laser light sources and stepper-scanners used. Improvements in precision and speed of operation of these devices are increasingly needed.
- the laser light source communicates desired laser light parameters to the laser light source to achieve a desired dosage of laser light energy for use in the photolithographic process.
- the laser light source generates the laser light and outputs it to the stepper-scanner.
- challenges in performing these operations For example, it can take some time for the generated laser light to stabilize on the desired parameters. Further, because of noise and other disturbances in the laser light source, it can be difficult to accurately generate the laser light at the desired energy level. What is needed are further improvements in how the laser tight source quickly and accurately generates the laser light to meet the desired parameters.
- a system and method for laser light energy control and resulting dose control creates and uses a set of gain estimators, one for each of a range of laser light pulse repetition rates. When a new repetition rate is specified, its corresponding gain estimator is retrieved and used to adjust and fire the laser source. The resulting generated laser light thereby reduces convergence delay and, further, can repeatedly do so with subsequently specified repetition rates.
- a method of laser light energy control comprising: receiving, in a laser system controller, a first laser trigger command and a voltage command; converting, by the laser system controller, the voltage command to a first energy target; determining, by the laser system controller, a first laser repetition rate based on a difference between the first laser trigger command and a previous laser trigger command; retrieving, by the laser system controller, a first repetition rate gain estimator corresponding to the first laser repetition rate; determining, by the laser system controller, a first laser voltage using the first energy target and the first repetition rate gain estimator; directing, by the laser system controller, a laser source to fire using the first laser voltage; receiving, in the laser system controller, a subsequent laser trigger command and a subsequent voltage command; converting, by the laser system controller, the subsequent voltage command to a second energy target; determining, by the laser system controller, a second laser repetition rate based on a difference between the subsequent laser trigger command and the first laser trigger command, wherein the second laser repetition rate is different than the
- a laser system for laser light energy control comprising: a laser system controller configured to: receive a first laser trigger command and a voltage command; convert the voltage command to a first energy target; determine a first laser repetition rate based on a difference between the first iaser trigger command and a previous laser trigger command; retrieve a first repetition rate gain estimator corresponding to the first iaser repetition rate; determine a first iaser voltage using the first energy target and the first repetition rate gain estimator; direct a iaser source to fire using the first iaser voltage; receive a subsequent Iaser trigger command and a subsequent voltage command; convert the subsequent voltage command to a second energy target; determine a second Iaser repetition rate based on a difference between the subsequent Iaser trigger command and the first Iaser trigger command, wherein the second iaser repetition rate is different than the first Iaser repetition rate; retrieve a second repetition rate gain estimator corresponding to the second laser repetition rate;
- FIG. 1 is a block diagram of an exemplary Iaser system and scanner as may be used in one embodiment.
- FIG. 2 is a graph showing characteristics of a generated iaser light as may be used in one embodiment.
- FIG. 3 is a block diagram of a laser system controller as may be used in one embodiment.
- FIG.4 is a flowchart of various embodiments of the present method of setting, updating, and using a set of gain estimators.
- Described herein is a system and method for controlling the energy of a laser light source generated laser.
- the desired energy of the Iaser light is achieved more rapidly and more accurately than with known approaches thus improving dose control in the photolithography process.
- the operations and elements of this system and method will now be described.
- FIG. 1 a block diagram 100 of a laser system 110 and scanner 140 as may be used in a modem deep ultraviolet ("DUV, e.g., having wavelengths in the range of 5 - 250 nanometers (nm) photolithography process and with the present approach can be seen.
- DUV modem deep ultraviolet
- the source of the laser light in laser system 110 is a laser source 120, which can be a single or dual chamber system, controlled by a controller 130 via communication 125.
- laser source 120 fires the resulting laser light 115 travels to scanner 140, which is responsible for exposing the semiconductor wafer.
- scanner 140 sends to laser system 110 via communication 135 desired parameters for the laser light to be generated by laser system 110.
- photolithography process typically include such things as laser light wavelength, energy level and a timing trigger for when the laser system is to fire the laser.
- the laser system generates the laser light 115 based on those parameters.
- scanner 140 communicates additional desired parameters for further laser light to be generated by laser system 110.
- FIG. 2 characteristics of the generated laser light can be seen in a graph form.
- scanner 140 has communicated a series of differing timing triggers which resulted in laser system 110 generating laser light at a RepRate of 2000, then 6000, then 5990 and then 4000 laser pulses per second.
- the actual de/dv (the inverse of the above-described dv/de), in degrees represented by a series of x's in the figure, is different at each of the differing RepRates.
- the resulting estimated de/dv in degrees represented by a series of o's in the figure, converges to within a small deviation from the actual de/dv within approximately 100,000 (100k) laser pulses.
- the present approach overcomes this problem by creating and storing a set of gain estimators each operable for a differing RepRate. Then, whenever the laser system is asked to fire the laser with a differing timing trigger interval, i.e., at a differing RepRate, a gain estimator to be operable at that RepRate can be used without waiting for convergence to the new de/dv. Hie benefit of this approach is then furthered when there are frequent changes in the RepRate because the convergence lag is avoided with each change.
- controller 130 of FIG. 1 is shown having a stored RepRate Gain Estimator ("RRGE") table 301.
- RRGE RepRate Gain Estimator
- each row is a range of RepRates (e.g., 450 - 549, 550 - 649, etc.) with a corresponding RepRate Gain Estimator (e.g., RRGE 1, RRGE 2, RRGE 3, etc.) to be used with a RepRate in that range.
- a gain estimator is a collection of data and a series of steps (i.e., logic and operations) that act on that data and the inputs to output the result.
- steps i.e., logic and operations
- One example of such a gain estimator is:
- each stored gain estimator i.e., each RRGE in the table
- values Xi and X2 which are the state of the estimator that get updated each time the estimator executes
- k refers to 'Value before the update' while k+1 refers to "value after the update”
- a, b, and c are constants determined by the system creator.
- FIG. 4 a flowchart of a process 400 of setting, updating, and using a set of gain estimators according to various embodiments will now be described.
- step 401 the gain estimators are set to default values. In one
- the gain estimators i.e., the RepRate Gain Estimators
- the RepRate Gain Estimators in the RepRate Gain Estimator Table 301 of laser controller 130 are set to default values by initially setting the data "X" state values, as discussed above with respect to FIG. 3.
- the default values are set so that the RepRate Gain Estimators will output an average of typical dv/de values, which typically range from 0.02 to 0.2, and therefore the default values are set so tile RRGEs will output an average value of 0.11. It is to be understood that other default values can likewise be used and, further, that each gain estimator need not be set to the same default value.
- step 403 a laser trigger (also known as a laser firing trigger) and a voltage command are received from the scanner by the laser system.
- a laser trigger also known as a laser firing trigger
- a voltage command are received from the scanner by the laser system.
- this laser trigger and voltage command are received from scanner 140 by laser system 110 via communication 135 and the voltage command is determined by scanner 140 based on a desired laser energy level and its knowledge of the dv/de relationship, as described above. It is to be understood that the laser trigger and the voltage command can be sent as a single communication from the scanner to the laser source or can be sent as separate communications from the scanner to the laser source in any sequence or order. In various embodiments, other command signals (e.g., digitally encoded signals) may be used in place of a voltage command.
- other command signals e.g., digitally encoded signals
- step 405 the laser system converts the voltage command to an energy target. In one embodiment, this conversion is performed by laser system 110, and more particularly by laser system controller 130, based on its greater knowledge of the dv/de relationship within operations of the laser system and as is understood by one of skill in the art.
- step 407 the laser system determines the RepRate of the laser. In one embodiment, this determination is performed by laser system 110, and more particularly by laser system controller 130, based on a difference between the received laser trigger command received from scanner 140 and a previously received laser trigger command from scanner 140.
- step 409 the gain estimator for the determined RepRate is retrieved. In one embodiment, this is performed by retrieving a RRGE n in RRGE Table 301 corresponding to the determined RepRate.
- step 411 the voltage with which to fire the laser, referred to herein as the laser voltage, is determined using the energy target and the retrieved gain estimator, in one embodiment, this is performed by laser system controller 130 in laser system 110 and, according to various embodiments, is performed according to the following formula:
- the laser is fired.
- the laser is fired by controller 130 directing laser source 120 to fire at the laser voltage, that is, the voltage computed by the RRGE corresponding to the trigger received from scanner 140.
- the gain estimator is updated.
- the gain estimator is updated by controller 130 calculating a new gain estimator tor the current laser pulse, based on a measured resulting energy from tie current laser pulse and using gain estimator calculation techniques known in the art, and the calculated new gain estimator is then stored in RRGE Table 301 corresponding to the RepRate determined in step 407.
- all gain estimators are updated on each laser pulse by storing the calculated new gain estimator as new gain estimator values in RRGE Table 301 corresponding to all RepRates in the table. Updating all gain estimators on each laser pulse may provide a more accurate gain estimator for each RepRate than using any previously stored gain estimator (including the default gain estimator).
- step 401 The process then returns to step 401 to receive a new laser trigger and voltage command.
- the set of gain estimators is instead created without receiving commands from a scanner, in this embodiment, the voltage command and laser trigger is either generated internally within the laser system or by laser system operator input. Regardless of whether this embodiment or the one described with reference to FIG. 4 is used, the process of creating and updating the set of gain estimators can be considered a training mode for the laser system and, as such, need not actually involve any exposure of the generated laser light to a wafer in a scanner.
- a static set of stored gain estimators corresponding to various RepRates, previously set and updated as described above with reference to FIG.4, are then used to fire the laser without continuing to update the gain estimators as described above with reference to step 415 of FIG. 4.
- step 413 of firing the laser then returns to step 403 of receiving a laser trigger and voltage command without performing step 415 of updating gain estimators.
- laser system controller 130 can be any computing system comprising a processor and memory, including a personal computer, server, or other processing system, that runs software instructions for performing the described operations which instructions may themselves have come from or reside on a computer readable storage medium.
- laser system controller 130 can be any dedicated hardware such as an application specific integrated circuit (ASIC) or other hardwired device, with or without firmware, that is specifically configured to perform the described operations.
- ASIC application specific integrated circuit
- a method of laser light energy control comprising:
- a laser system for laser light energy control comprising:
- a laser system controller configured to:
- [00077] determine a second laser repetition rate based on a difference between the subsequent laser trigger command and the first laser trigger command, wherein the second laser repetition rate is different than the first laser repetition rate;
- [00080] direct the laser source to fire using the second laser voltage.
- a method of laser light energy control comprising:
- each gain estimator in said set of gain estimators corresponding to a range of laser repetition rates
- activating said laser source to generate laser light said activating being responsive to a laser voltage determined using said first gain estimator.
- each gain estimator pertains to the relationship between an amount of voltage applied to said laser source and an amount of energy in laser light generated by said laser source.
- a method of laser light energy control for a laser light source comprising:
- each of said training-mode laser activation signal including at least a training-mode laser trigger command and training-mode voltage command
- each gain estimator pertains to the relationship between an amount of voltage applied to said laser source and an amount of energy in laser light generated by said laser source.
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Abstract
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Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201880026865.1A CN110546579B (en) | 2017-04-24 | 2018-04-03 | Improved laser energy and dose control using repetition rate-based gain estimator |
| KR1020197031397A KR102274904B1 (en) | 2017-04-24 | 2018-04-03 | Improved laser light energy and dose control method using repetition rate-based gain estimator |
| JP2019550185A JP6948403B2 (en) | 2017-04-24 | 2018-04-03 | Improved laser light energy and dose control with repeat rate based gain estimator |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/495,245 US11081852B2 (en) | 2017-04-24 | 2017-04-24 | Laser light energy and dose control using repetition rate based gain estimators |
| US15/495,245 | 2017-04-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2018200139A1 true WO2018200139A1 (en) | 2018-11-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| PCT/US2018/025921 Ceased WO2018200139A1 (en) | 2017-04-24 | 2018-04-03 | Improved laser light energy and dose control using repetition rate based gain estimators |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US11081852B2 (en) |
| JP (1) | JP6948403B2 (en) |
| KR (1) | KR102274904B1 (en) |
| CN (1) | CN110546579B (en) |
| WO (1) | WO2018200139A1 (en) |
Families Citing this family (3)
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| WO2021048947A1 (en) | 2019-09-11 | 2021-03-18 | ギガフォトン株式会社 | Laser device, and manufacturing method for electronic device |
| CN115210970B (en) * | 2020-03-03 | 2025-09-12 | 西默有限公司 | Control systems for light sources |
| JP7675183B2 (en) | 2021-06-17 | 2025-05-12 | ギガフォトン株式会社 | Laser apparatus, laser control method, and electronic device manufacturing method |
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| US20070195836A1 (en) * | 2006-02-17 | 2007-08-23 | Cymer, Inc. | Active spectral control of DUV light source |
| US20090067457A1 (en) * | 2007-09-11 | 2009-03-12 | Cymer, Inc. | Ultraviolet laser light source pulse energy control system |
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| US5097291A (en) * | 1991-04-22 | 1992-03-17 | Nikon Corporation | Energy amount control device |
| JP3413510B2 (en) * | 1995-09-27 | 2003-06-03 | 株式会社小松製作所 | Laser equipment |
| US6331994B1 (en) * | 1996-07-19 | 2001-12-18 | Canon Kabushiki Kaisha | Excimer laser oscillation apparatus and method, excimer laser exposure apparatus, and laser tube |
| JP3830591B2 (en) * | 1996-11-05 | 2006-10-04 | 株式会社小松製作所 | Laser equipment |
| US6532247B2 (en) * | 2000-02-09 | 2003-03-11 | Cymer, Inc. | Laser wavelength control unit with piezoelectric driver |
| US7830934B2 (en) * | 2001-08-29 | 2010-11-09 | Cymer, Inc. | Multi-chamber gas discharge laser bandwidth control through discharge timing |
| US7205826B2 (en) | 2004-05-27 | 2007-04-17 | Broadcom Corporation | Precharged power-down biasing circuit |
| US7363180B2 (en) * | 2005-02-15 | 2008-04-22 | Electro Scientific Industries, Inc. | Method for correcting systematic errors in a laser processing system |
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| US7751453B2 (en) * | 2008-10-21 | 2010-07-06 | Cymer, Inc. | Method and apparatus for laser control in a two chamber gas discharge laser |
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| TWI389409B (en) * | 2008-10-21 | 2013-03-11 | Cymer Inc | Method and apparatus for laser control in a two chamber gas discharge laser |
| JP5879747B2 (en) * | 2011-05-26 | 2016-03-08 | オムロン株式会社 | Optical amplification apparatus and laser processing apparatus |
| WO2013023053A1 (en) * | 2011-08-09 | 2013-02-14 | Cornell University | Compact undulator system and methods |
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| US9261794B1 (en) * | 2014-12-09 | 2016-02-16 | Cymer, Llc | Compensation for a disturbance in an optical source |
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| JP6845255B2 (en) * | 2016-12-05 | 2021-03-17 | ギガフォトン株式会社 | Laser device |
-
2017
- 2017-04-24 US US15/495,245 patent/US11081852B2/en active Active
-
2018
- 2018-04-03 KR KR1020197031397A patent/KR102274904B1/en active Active
- 2018-04-03 JP JP2019550185A patent/JP6948403B2/en active Active
- 2018-04-03 WO PCT/US2018/025921 patent/WO2018200139A1/en not_active Ceased
- 2018-04-03 CN CN201880026865.1A patent/CN110546579B/en active Active
-
2021
- 2021-06-29 US US17/362,053 patent/US12401169B2/en active Active
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| US20070195836A1 (en) * | 2006-02-17 | 2007-08-23 | Cymer, Inc. | Active spectral control of DUV light source |
| US20090067457A1 (en) * | 2007-09-11 | 2009-03-12 | Cymer, Inc. | Ultraviolet laser light source pulse energy control system |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20190129997A (en) | 2019-11-20 |
| JP6948403B2 (en) | 2021-10-13 |
| US20180309259A1 (en) | 2018-10-25 |
| CN110546579B (en) | 2021-07-06 |
| US11081852B2 (en) | 2021-08-03 |
| KR102274904B1 (en) | 2021-07-07 |
| JP2020518126A (en) | 2020-06-18 |
| US20210328401A1 (en) | 2021-10-21 |
| CN110546579A (en) | 2019-12-06 |
| US12401169B2 (en) | 2025-08-26 |
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