WO2018190693A3 - Glass processing apparatus and methods - Google Patents

Glass processing apparatus and methods Download PDF

Info

Publication number
WO2018190693A3
WO2018190693A3 PCT/KR2018/004374 KR2018004374W WO2018190693A3 WO 2018190693 A3 WO2018190693 A3 WO 2018190693A3 KR 2018004374 W KR2018004374 W KR 2018004374W WO 2018190693 A3 WO2018190693 A3 WO 2018190693A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical module
cover glass
photographing
plate portion
flat plate
Prior art date
Application number
PCT/KR2018/004374
Other languages
French (fr)
Other versions
WO2018190693A2 (en
Inventor
Taekmin Kwon
Namhui KIM
Yongjin Cho
Original Assignee
Corning Precision Materials Co., Ltd
Corning Incorporated
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020180043160A external-priority patent/KR20180116154A/en
Application filed by Corning Precision Materials Co., Ltd, Corning Incorporated filed Critical Corning Precision Materials Co., Ltd
Priority to US16/604,240 priority Critical patent/US20200378899A1/en
Priority to CN201880040165.8A priority patent/CN110809731A/en
Publication of WO2018190693A2 publication Critical patent/WO2018190693A2/en
Publication of WO2018190693A3 publication Critical patent/WO2018190693A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8841—Illumination and detection on two sides of object
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/133308—Support structures for LCD panels, e.g. frames or bezels
    • G02F1/133331—Cover glasses
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30121—CRT, LCD or plasma display

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nonlinear Science (AREA)
  • Immunology (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Manufacturing & Machinery (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

A cover glass inspecting apparatus may include a transfer module for transferring a cover glass. The cover glass may include a flat plate portion extending in first and second directions crossing with each other and edge portions protruding in a third direction perpendicular to the first and second directions and connected to outer circumference of the flat plate portion, wherein the flat plate portion may include first and second surfaces facing each other. The cover glass inspecting apparatus may further include a first optical module for photographing the first surface, a second optical module for photographing the second surface, and a control module for reading images of the cover glass taken by the first optical module and the second optical module. The first optical module may include a first sub optical module for photographing the first surface and a second sub optical module for photographing the edge portions.
PCT/KR2018/004374 2017-04-14 2018-04-16 Glass processing apparatus and methods WO2018190693A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US16/604,240 US20200378899A1 (en) 2017-04-14 2018-04-16 Glass processing apparatus and methods
CN201880040165.8A CN110809731A (en) 2017-04-14 2018-04-16 Glass processing apparatus and method

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR20170048705 2017-04-14
KR10-2017-0048705 2017-04-14
KR1020180043160A KR20180116154A (en) 2017-04-14 2018-04-13 Inspection apparatus for cover glass
KR10-2018-0043160 2018-04-13

Publications (2)

Publication Number Publication Date
WO2018190693A2 WO2018190693A2 (en) 2018-10-18
WO2018190693A3 true WO2018190693A3 (en) 2018-11-22

Family

ID=63792731

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2018/004374 WO2018190693A2 (en) 2017-04-14 2018-04-16 Glass processing apparatus and methods

Country Status (1)

Country Link
WO (1) WO2018190693A2 (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004054285A (en) * 2002-07-17 2004-02-19 Hoya Corp Glass substrate for mask blanks, method for manufacturing glass substrate for mask blanks, mask blanks, method for manufacturing mask blanks, transfer mask, and method for manufacturing same
KR20040105764A (en) * 2002-04-03 2004-12-16 엔에이치 테크노글라스 가부시키가이샤 Liquid crystal display unit-use glass substrate and method of producing mother glass and mother glass inspection device
KR20060096717A (en) * 2005-03-02 2006-09-13 (주)쎄미시스코 Apparatus for edge defect and discolor testing of glass board
KR100840832B1 (en) * 2007-09-06 2008-06-23 호서대학교 산학협력단 Visual inspection apparatus of lcd panel
KR20110080725A (en) * 2010-01-07 2011-07-13 주식회사 쓰리비 시스템 Apparatus for inspecting defects
KR20140081261A (en) * 2012-12-21 2014-07-01 주식회사 쓰리비 시스템 Apparatus for inspecting panel
US20150204778A1 (en) * 2014-01-20 2015-07-23 Isra Surface Vision Gmbh Device for inspecting a material provided with a coated surface and related method

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040105764A (en) * 2002-04-03 2004-12-16 엔에이치 테크노글라스 가부시키가이샤 Liquid crystal display unit-use glass substrate and method of producing mother glass and mother glass inspection device
JP2004054285A (en) * 2002-07-17 2004-02-19 Hoya Corp Glass substrate for mask blanks, method for manufacturing glass substrate for mask blanks, mask blanks, method for manufacturing mask blanks, transfer mask, and method for manufacturing same
KR20060096717A (en) * 2005-03-02 2006-09-13 (주)쎄미시스코 Apparatus for edge defect and discolor testing of glass board
KR100840832B1 (en) * 2007-09-06 2008-06-23 호서대학교 산학협력단 Visual inspection apparatus of lcd panel
KR20110080725A (en) * 2010-01-07 2011-07-13 주식회사 쓰리비 시스템 Apparatus for inspecting defects
KR20140081261A (en) * 2012-12-21 2014-07-01 주식회사 쓰리비 시스템 Apparatus for inspecting panel
US20150204778A1 (en) * 2014-01-20 2015-07-23 Isra Surface Vision Gmbh Device for inspecting a material provided with a coated surface and related method

Also Published As

Publication number Publication date
WO2018190693A2 (en) 2018-10-18

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