WO2018174905A1 - Annulation séquentielle à grande vitesse pour mode pulsé - Google Patents

Annulation séquentielle à grande vitesse pour mode pulsé Download PDF

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Publication number
WO2018174905A1
WO2018174905A1 PCT/US2017/024167 US2017024167W WO2018174905A1 WO 2018174905 A1 WO2018174905 A1 WO 2018174905A1 US 2017024167 W US2017024167 W US 2017024167W WO 2018174905 A1 WO2018174905 A1 WO 2018174905A1
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WIPO (PCT)
Prior art keywords
magnetic field
field measurement
magneto
optical
center material
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PCT/US2017/024167
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English (en)
Inventor
Gregory Scott Bruce
Peter G. Kaup
Arul Manickam
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Lockheed Martin Corporation
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Priority to PCT/US2017/024167 priority Critical patent/WO2018174905A1/fr
Publication of WO2018174905A1 publication Critical patent/WO2018174905A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02—Elements
    • C30B29/04—Diamond
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
    • G01R33/323—Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
    • G01N24/10—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using electron paramagnetic resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/60—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance

Definitions

  • the subject technology generally relates without limitation to magnetometers, and for example, to a high speed sequential cancellation for pulsed mode.
  • a number of industrial applications, as well as scientific areas such as physics and chemistry can benefit from magnetic detection and imaging with a device that has extraordinary sensitivity, ability to capture signals that fluctuate very rapidly (bandwidth) all with a substantive package that is extraordinarily small in size and efficient in power.
  • Many advanced magnetic imaging systems can operate in restricted conditions, for example, high vacuum and/or cryogenic temperatures, which can make them inapplicable for imaging applications that require ambient or other conditions.
  • SWAP small size, weight and power
  • a reference signal may be utilized prior to acquisition of a measured signal for a magnetometer. This reference signal may provide a full repolarization of a magneto-optical defect center material prior to acquiring the reference signal. The reference signal may then be used to adjust the measured signal to correct for potential fluctuations in optical excitation power levels, which can cause a
  • the reference signal may be omitted such that only a radiofrequency (RF) pulse excitation sequence is included between measurements.
  • RF radiofrequency
  • a fixed "system rail" photo measurement may be obtained initially and used as a fixed reference signal for subsequent measured signals.
  • the fixed, nominal reference signal can substantially compensate for intensity shifts for the magnetometer without decreasing bandwidth or sensitivity.
  • additional signal processing may be utilized to adjust for drift, jitter, or other variations in intensity levels.
  • Some embodiments may include a magnetometer and a controller.
  • the magnetometer may include a magneto-optical defect center material, an optical excitation source, a
  • the controller may be configured to activate a radiofrequency (RF) pulse sequence for the RF excitation source to apply a RF field to the magneto-optical defect center material, acquire a nominal ground reference signal for the magneto-optical defect center material, and acquire a magnetic field measurement from the magneto-optical defect center material using the optical sensor.
  • the magnetic field measurement may be acquired independent of a reference magnetic field measurement.
  • acquiring the repetitive magnetic field measurement can include a polarization pulse length.
  • the controller may processes the repetitive magnetic field measurement directly to obtain magnetometry measurements.
  • the controller may further be configured to determine a vector of the repetitive magnetic field measurement.
  • the controller may use a fixed system rail photo measurement as a nominal reference value.
  • the magneto-optical defect center material may be a diamond having nitrogen vacancies. The controller may be further configured to process the magnetic field measurement.
  • Other implementations may relate to a method for operating a magnetometer having a magneto-optical defect center material.
  • the method may include activating a radiofrequency (RF) pulse sequence to apply an RF field to the magneto-optical defect center material, acquiring a nominal ground reference signal for the magneto-optical defect center material, and acquiring a magnetic field measurement using the magneto-optical defect center material.
  • the magnetic field measurement may be acquired independent of a reference magnetic field measurement.
  • acquiring the magnetic field measurement can include a polarization pulse length.
  • acquiring a magnetic field measurement may include processing the magnetic field measurement directly to obtain magnetometry measurements.
  • the method may further include determining a vector of the repetitive magnetic field measurement.
  • acquiring a magnetic field measurement may include using a fixed system rail photo measurement as a nominal reference value.
  • the magneto-optical defect center material may be a diamond having nitrogen vacancies. The method can further include processing the magnetic field measurement using a controller.
  • a sensor may include a magneto-optical defect center material, a radiofrequency (RF) excitation source, and a controller.
  • the controller may be configured to activate a radiofrequency (RF) pulse sequence for the RF excitation source to apply a RF field to the magneto-optical defect center material, acquire a nominal ground reference signal for the magneto-optical defect center material, and acquire a magnetic field measurement from the magneto-optical defect center material.
  • the magnetic field measurement may be acquired independent of a reference magnetic field measurement.
  • acquiring the magnetic field measurement can include a polarization pulse length.
  • the controller may processes the magnetic field measurement directly to obtain magnetometry measurements.
  • the controller may further be configured to determine a vector of the magnetic field measurement.
  • the controller may use a fixed system rail photo measurement as a nominal reference value.
  • the magneto-optical defect center material may be a diamond having nitrogen vacancies.
  • the controller may be further configured to process the magnetic field measurement.
  • FIG. 1 illustrates an orientation of an NV center in a diamond lattice
  • FIG. 2 illustrates an energy level diagram showing energy levels of spin states for the
  • FIG. 3 illustrates a schematic diagram of a NV center magnetic sensor system
  • FIG. 4 is a graph illustrating the fluorescence as a function of an applied RF frequency of an NV center along a given direction for a zero magnetic field, and also for a non-zero magnetic field having a component along the NV axis;
  • FIG. 5 is a graph illustrating the fluorescence as a function of an applied RF frequency for four different NV center orientations for a non-zero magnetic field
  • FIG. 6 is a graphical diagram depicting a Ramsey pulse sequence
  • FIG. 7 is a graphical diagram of a magnetometer system using a reference signal acquisition prior to RF pulse excitation sequence and measured signal acquisition;
  • FIG. 8 is a graphical diagram of a magnetometer system omitting the reference signal acquisition of FIG. 6 prior to RF pulse excitation sequence and measured signal acquisition;
  • FIG. 9 is a graphical diagram depicting a reference signal intensity relative to detune frequency and a measured signal intensity relative to detune frequency
  • FIG. 10 is a graphical diagram depicting a slope relative to laser pulse width for a system implementing a reference signal and a system omitting the reference signal;
  • FIG. 11 is a graphical diagram depicting a sensitivity relative to polarization pulse length for a system implementing a reference signal and a system omitting the reference signal;
  • FIG. 12 is a process diagram for operating a magnetometer without using a reference signal.
  • FIG. 13 is a block diagram depicting a general architecture for a computer system that may be employed to implement various elements of the systems and methods described and illustrated herein.
  • FIG. 13 is a block diagram depicting a general architecture for a computer system that may be employed to implement various elements of the systems and methods described and illustrated herein.
  • Some embodiments increase bandwidth and sensitivity of the magnetometer by eliminating the need for a reference signal that requires full repolarization of the magneto-optical defect center material prior to acquisition. Eliminating the reference signal eliminates the time needed to repolarize the magneto-optical defect center material and the acquisition time for the reference signal.
  • An optional ground reference, a fixed "system rail" photo measurement, and/or additional signal processing may be utilized to adjust for variations in intensity levels.
  • Atomic-sized magneto-optical defect centers such as nitrogen-vacancy (NV) centers in diamond lattices, have excellent sensitivity for magnetic field measurement and enable fabrication of small magnetic sensors.
  • Magneto-optical defect center materials include but are not be limited to diamonds, Silicon Carbide (SiC), Phosphorous, and other materials with nitrogen, boron, carbon, silicon, or other defect centers.
  • the diamond nitrogen vacancy (DNV) sensors are maintained in room temperature and atmospheric pressure and can be even used in liquid environments.
  • a green optical source e.g., a micro-LED
  • a photo detector can measure the fluorescence (red light) emitted by the optically excited NV centers.
  • Nitrogen-vacancy centers are defects in a diamond's crystal structure, which can purposefully be manufactured in synthetic diamonds as shown in Figure 1. In general, when excited by green light and microwave radiation, the NV centers cause the diamond to generate red light.
  • the NV defect centers When excited with green light, the NV defect centers generate red light fluorescence. After sufficient time (on order of nanoseconds to microseconds) the fluorescence counts stabilize. When microwave radiation is added, the NV electron spin states are changed, and this results in a change in intensity of the red fluorescence. The changes in fluorescence may be recorded as a measure of electron spin resonance. . By measuring the changes, the NV centers may be used to accurately detect the magnetic field strength.
  • the NV center may exist in a neutral charge state or a negative charge state.
  • the neutral charge state uses the nomenclature NV°, while the negative charge state uses the nomenclature NV, which is adopted in this description.
  • the NV center may have a number of electrons, including three unpaired electrons, each one from the vacancy to a respective of the three carbon atoms adjacent to the vacancy, and a pair of electrons between the nitrogen and the vacancy.
  • the NV center which is in the negatively charged state, also includes an extra electron.
  • the optical transitions between the ground state 3 A 2 and the excited triplet 3 E are predominantly spin conserving, meaning that the optical transitions are between initial and final states that have the same spin.
  • a photon of red light is emitted with a photon energy corresponding to the energy difference between the energy levels of the transitions.
  • the system 300 includes an optical excitation source 310, which directs optical excitation to an NV diamond material 320 with NV centers.
  • the system further includes an RF excitation source 330, which provides RF radiation to the NV diamond material 320. Light from the NV diamond may be directed through an optical filter 350 to an optical detector 340.
  • the RF excitation source 330 may be a microwave coil, for example.
  • the optical excitation source 310 may be a laser or a light emitting diode, for example, which emits light in the green (light having a wavelength such that the color is green), for example.
  • the optical excitation source 310 induces fluorescence in the red, which corresponds to an electronic transition from the excited state to the ground state.
  • Light from the NV diamond material 320 is directed through the optical filter 350 to filter out light in the excitation band (in the green, for example), and to pass light in the red fluorescence band, which in turn is detected by the detector 340.
  • the component B z may be determined.
  • Optical excitation schemes other than continuous wave excitation are contemplated, such as excitation schemes involving pulsed optical excitation, and pulsed RF excitation.
  • pulsed excitation schemes include Ramsey pulse sequence (described in more detail below), spin echo pulse sequence, etc.
  • the diamond material 320 will have NV centers aligned along directions of four different orientation classes.
  • FIG. 5 illustrates fluorescence as a function of RF frequency for the case where the diamond material 320 has NV centers aligned along directions of four different orientation classes.
  • the component B z along each of the different orientations may be determined.
  • crystallographic planes of a diamond lattice allow not only the magnitude of the external magnetic field to be determined, but also the direction of the magnetic field.
  • FIG. 3 illustrates an NV center magnetic sensor system 300 with NV diamond material 320 with a plurality of NV centers
  • the magnetic sensor system may instead employ a different magneto-optical defect center material, with a plurality of magneto-optical defect centers.
  • Magneto-optical defect center materials include but are not be limited to diamonds, Silicon Carbide (SiC), Phosphorous, and other materials with nitrogen, boron, carbon, silicon, or other defect centers.
  • the electronic spin state energies of the magneto-optical defect centers shift with magnetic field, and the optical response, such as fluorescence, for the different spin states is not the same for all of the different spin states.
  • the magnetic field may be determined based on optical excitation, and possibly RF excitation, in a corresponding way to that described above with NV diamond material.
  • a Ramsey pulse sequence is a pulsed RF laser scheme that is believed to measure the free precession of the magnetic moment in the diamond material 320 with NV centers, and is a technique that quantum mechanically prepares and samples the electron spin state.
  • a first RF excitation pulse 620 (in the form of, for example, a microwave (MW) ⁇ /2 pulse) during a period 1.
  • the system is allowed to freely precess (and dephase) over a time period referred to as tau ( ⁇ ).
  • tau ( ⁇ ) During this free precession time period, the system measures the local magnetic field and serves as a coherent integration.
  • a second optical pulse 640 is applied to optically sample the system and a measurement basis is obtained by detecting the fluorescence intensity of the system.
  • the RF excitation pulses applied are provided at a given RF frequency in relation to the Lorentzians such as referenced in connection with FIG. 5.
  • FIG. 7 depicts a graph 700 of a magnetometer system using a reference signal 710 acquisition prior to RF pulse excitation sequence 720 and measured signal 730 acquisition.
  • a contrast measurement between the measured signal 730 and the reference signal 710 for a given pulsed sequence is then computed as a difference between a processed read-out fluorescence level from the measured signal acquisition 730 and a processed reference fluorescence measurement from the reference signal 710.
  • the processing of the measured signal 730 and/or the reference signal 710 may involve computation of the mean fluorescence over each of the given intervals.
  • the reference signal 710 is to compensate for potential fluctuations in the optical excitation power level, which can cause a proportional fluctuation in the measurement and readout fluorescence measurements.
  • the magnetometer includes a full repolarization between measurements with a reference fluorescence intensity (e.g., the reference signal 710) captured prior to RF excitation (e.g., RF pulse excitation sequence 720) and the subsequent magnetic b field measurement data 730.
  • a reference fluorescence intensity e.g., the reference signal 710
  • RF excitation e.g., RF pulse excitation sequence 720
  • the subsequent magnetic b field measurement data 730 may reduce sensor bandwidth and increase measurement noise by requiring two intensity estimates per magnetic b field measurement.
  • the bandwidth considerations provide a high laser power density trade space in sensor design, which can impact available integration time and achievable sensitivity.
  • FIG. 8 depicts a graph 800 of a magnetometer system omitting a reference signal acquisition prior to RF pulse excitation sequence 820 and measured signal 830 acquisition.
  • the RF pulse excitation sequence 820 may correspond to periods 1-3 of Figure 6 and the measured signal acquisition 830 may correspond to period 4 of Figure 6.
  • the graph 800 depicts the amplitude of optical light emitted from a magneto-optical defect center material as measured by an optical detector 340, such as a photodiode, over time.
  • the system processes the post RF sequence read-out measurement from the measured signal 830 directly to obtain magnetometry measurements.
  • the processing of the measured signal 830 may involve computation of the mean fluorescence over each of the given intervals.
  • a fixed "system rail" photo measurement is obtained and used as a nominal reference to compensate for any overall system shifts in intensity offset.
  • an optional ground reference signal 810 may be obtained during the RF pulse excitation sequence 820, such as during period 2 of Figure 6, to be used as an offset reference.
  • Figure 9 is a graphical diagram of an intensity of a measured signal 910 from an optical detector 340 relative to an intensity of a reference signal 920 from the optical detector 340 over a range of detune frequencies.
  • the reference signal 920 will contain signal information from a prior RF pulse for a finite period of time. This prior signal information in the reference signal 920 reduces available detune peak to peak intensity range and slope for a detune point for positive slope 930 and a detune point for negative slope 940. That is, as shown in Figure 9, the reference signal 920 is curved in a similar manner to the measured signal 910.
  • the net magnetometry curve peak to peak intensity contrast is reduced.
  • the reason that the reference signal 910 curve contains information from the measured signal 910 curve is due to insufficient (laser only) polarization time for a given sensor configuration.
  • the prior RF pulse defines the state of the measurement and, if not enough time passes between measurements, then the reference signal 920 will contain some of the "hold” data from the prior RF "sample.” This will subtract from the current measured signal 910, thereby resulting in less signal overall as seen in Figure 9.
  • Prior signal information from a prior measured signal 910 is cleared out via excitation from a green laser source and waiting for a period of time. This decay is exponential and tied to the power density applied from laser. However, waiting for a period of time for the prior signal information to be eliminated can decrease available bandwidth.
  • Figure 10 is a diagram depicting slope relative to laser polarization pulse width for a system implementing a reference signal and a system omitting the reference signal.
  • a first slope line 1010 corresponds to a system utilizing a reference signal while a second slope line 1020 corresponds to a system without utilizing a reference signal.
  • the second slope line 1020 has a higher slope at equivalent laser pulse widths (in microseconds) compared to the first slope line 1010 that uses a reference signal.
  • Longer polarization pulse widths can allow for a more complete repolarization of the a magneto-optical defect center material quantum state to reduce the residual impact of previous RF excitations.
  • this more complete polarization can allow "less dimmed” fluorescence levels to be measured more accurately rather than exhibiting residual dimming due to an earlier RF excitation that retains some NV spin +1/-1 excited states.
  • the wider measurement range can increase the peak to peak intensity range and, therefore, optimal slope. While both unreferenced first slope line 1010 and the referenced second slope line 1020 indicate a drop off in slope with shorter polarization pulse widths, the referenced second slope line 1020 decreases more quickly than the unreferenced first slope line 1010 due to the incomplete polarization of the reference, such as the reference signal 920 of Figure 9, that is further subtracted from the measured signa, such as measured signal 910 of Figure 9.
  • the second slope line 1020 has a slower roll-off (e.g., reduction) of slope at shorter laser pulse widths than the first slope line 1010. That is, the lase pulse widths can be reduced without a significant decrease in optimal slope values.
  • the second slope line 1020 can achieve a smaller laser pulse width of approximately 60-70 microseconds with minimal loss in slope compared to the first slope line 1010 that reduces slope by a factor of two when the laser pulse width is reduced by a factor of four.
  • the second slope line 1020 demonstrates that the system can achieve an increase in sample rate by a factor of four with minimal impact on the slope point.
  • Figure 11 depicts a comparison of a sensitivity of a system relative to a laser polarization pulse length for a system implementing a reference signal and a system omitting the reference signal.
  • a first sensitivity line 1110 for the system implementing the reference signal has a lower sensitivity achievable at 10 nanoTeslas per root Hertz for a polarization pulse length of 150 microseconds.
  • the system is limited in sampling rate based on a polarization pulse length of 150 microseconds as lower polarization pulse lengths reduce the sensitivity achievable to higher values.
  • a second sensitivity line 1120 for the system without the reference signal continues to increase the achievable lower sensitivity for lower polarization pulse lengths below 150 microseconds.
  • the sensitivity of the system can be improved for shorter polarization pulse lengths.
  • FIG. 12 depicts some implementations of a process 1200 of operating a magnetometer that utilizes a magneto-optical defect center material, such as a diamond having nitrogen vacancies.
  • the process 1200 includes activating an RF pulse sequence (block 1202).
  • the RF pulse sequence is done without acquiring a reference measurement, thereby reducing
  • a nominal ground reference measurement (block 1204) may be acquired as a simple offset relative to the ground state.
  • the process 1200 further includes acquiring b field measurement data (block 1206).
  • the acquisition of b field measurement data may be acquired at a faster sample rate as full repolarization of the magneto-optical defect center material is eliminated between measurements.
  • the acquired b field measurement data may be processed to determine a vector of a measured b field. By removing the reference signal, a sensor can increase AC sensitivity and bandwidth.
  • FIG. 13 is a diagram illustrating an example of a system 1300 for implementing some aspects such as the controller.
  • the system 1300 includes a processing system 1302, which may include one or more processors or one or more processing systems.
  • a processor may be one or more processors.
  • the processing system 1302 may include a general-purpose processor or a specific-purpose processor for executing instructions and may further include a machine- readable medium 1319, such as a volatile or non-volatile memory, for storing data and/or instructions for software programs.
  • the instructions which may be stored in a machine-readable medium 1310 and/or 1319, may be executed by the processing system 1302 to control and manage access to the various networks, as well as provide other communication and processing functions.
  • the instructions may also include instructions executed by the processing system 1302 for various user interface devices, such as a display 1312 and a keypad 1314.
  • the processing system 1302 may include an input port 1322 and an output port 1324. Each of the input port 1322 and the output port 1324 may include one or more ports.
  • the input port 1322 and the output port 1324 may be the same port (e.g., a bi-directional port) or may be different ports.
  • the processing system 1302 may be implemented using software, hardware, or a combination of both.
  • the processing system 1302 may be implemented with one or more processors.
  • a processor may be a general-purpose microprocessor, a
  • DSP Digital Signal Processor
  • ASIC Application Specific Integrated Circuit
  • FPGA Field Programmable Gate Array
  • PLD Programmable Logic Device
  • controller a state machine, gated logic, discrete hardware components, or any other suitable device that can perform calculations or other manipulations of information.
  • a machine-readable medium may be one or more machine-readable media, including no-transitory or tangible machine-readable media.
  • Software shall be construed broadly to mean instructions, data, or any combination thereof, whether referred to as software, firmware, middleware, microcode, hardware description language, or otherwise. Instructions may include code (e.g., in source code format, binary code format, executable code format, or any other suitable format of code).
  • Machine-readable media may include storage integrated into a processing system such as might be the case with an ASIC.
  • Machine-readable media may also include storage external to a processing system, such as a Random Access Memory (RAM), a flash memory, a Read Only Memory (ROM), a Programmable Read-Only Memory (PROM), an Erasable PROM (EPROM), registers, a hard disk, a removable disk, a CD-ROM, a DVD, or any other suitable storage device.
  • RAM Random Access Memory
  • ROM Read Only Memory
  • PROM Erasable PROM
  • registers a hard disk, a removable disk, a CD-ROM, a DVD, or any other suitable storage device.
  • a machine-readable medium is a computer-readable medium encoded or stored with instructions and is a computing element, which defines structural and functional
  • Instructions may be executable, for example, by the processing system 1302 or one or more processors. Instructions can be, for example, a computer program including code for performing methods of some of the embodiments.
  • a network interface 1316 may be any type of interface to a network (e.g., an Internet network interface), and may reside between any of the components shown in FIG. 13 and coupled to the processor via the bus 1304.
  • a network e.g., an Internet network interface
  • a device interface 1318 may be any type of interface to a device and may reside between any of the components shown in FIG. 13.
  • a device interface 1318 may, for example, be an interface to an external device (e.g., USB device) that plugs into a port (e.g., USB port) of the system 1300.
  • an external device e.g., USB device
  • a port e.g., USB port
  • One or more of the above-described features and applications may be implemented as software processes that are specified as a set of instructions recorded on a computer readable storage medium (alternatively referred to as computer-readable media, machine-readable media, or machine-readable storage media).
  • a computer readable storage medium alternatively referred to as computer-readable media, machine-readable media, or machine-readable storage media.
  • processing unit(s) e.g., one or more processors, cores of processors, or other processing units
  • the computer readable media does not include carrier waves and electronic signals passing wirelessly or over wired connections, or any other ephemeral signals.
  • the computer readable media may be entirely restricted to tangible, physical objects that store information in a form that is readable by a computer.
  • the computer readable media is non-transitory computer readable media, computer readable storage media, or non-transitory computer readable storage media.
  • a computer program product also known as a program, software, software application, script, or code
  • a computer program may, but need not, correspond to a file in a file system.
  • a program may be stored in a portion of a file that holds other programs or data (e.g., one or more scripts stored in a markup language document), in a single file dedicated to the program in question, or in multiple coordinated files (e.g., files that store one or more modules, sub programs, or portions of code).
  • a computer program may be deployed to be executed on one computer or on multiple computers that are located at one site or distributed across multiple sites and interconnected by a communication network.
  • ASICs application specific integrated circuits
  • FPGAs field programmable gate arrays
  • integrated circuits execute instructions that are stored on the circuit itself.
  • some embodiments directed to magnetic band-pass filters for signals in magnetic communications and anomaly detection using diamond nitrogen-vacancy (DNV).
  • DNV diamond nitrogen-vacancy
  • some embodiments may be used in various markets, including for example and without limitation, advanced sensors and magnetic communication systems markets.

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Abstract

L'invention concerne certains procédés et configurations pour l'acquisition à large bande passante de données de magnétomètre avec une sensibilité accrue. Certains modes de réalisation fournissent une bande passante et une sensibilité accrues du magnétomètre en éliminant un signal de référence pour une repolarisation complète du matériau de centre de défaut magnéto-optique avant l'acquisition. L'élimination du signal de référence élimine le temps nécessaire pour repolariser le matériau de centre de défaut magnéto-optique et le temps d'acquisition pour le signal de référence. Certains modes de réalisation peuvent comprendre l'activation d'une séquence d'impulsions en radiofréquence (RF) pour appliquer un champ RF au matériau de centre de défaut magnéto-optique et l'acquisition d'une mesure de champ magnétique à l'aide du matériau de centre de défaut magnéto-optique. La mesure de champ magnétique peut être acquise indépendamment d'une mesure de champ magnétique de référence.
PCT/US2017/024167 2017-03-24 2017-03-24 Annulation séquentielle à grande vitesse pour mode pulsé WO2018174905A1 (fr)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024113001A1 (fr) * 2022-12-02 2024-06-06 The University Of Sydney Capteur de champ magnétique

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