WO2018161210A1

WO2018161210A1 - Device and method for testing fingerprint chip

Info

Publication number: WO2018161210A1
Application number: PCT/CN2017/075744
Authority: WO
Inventors: 李亮; 江建威; 肖裕权
Original assignee: 深圳市汇顶科技股份有限公司
Priority date: 2017-03-06
Filing date: 2017-03-06
Publication date: 2018-09-13
Also published as: CN107000920A

Abstract

Disclosed are a device (100) for testing a fingerprint chip and a method for testing a fingerprint chip, allowing testing of an entire substrate of fingerprint chips. The device (100) for testing a fingerprint chip comprises: a cover plate (110), an outer ring of the cover plate (110) being a first trapezoidal structure (111), and a main part of the cover plate (110) being provided with a recessed structure (112) being a grid of M rows and N columns, wherein M and N are positive integers; a tray (120), an inner ring of the tray (120) being a second trapezoidal structure (121), a main part of the tray (120) being provided with a recessed structure (122) being a grid of A rows and B columns, wherein A and B are positive integers. When the cover plate (110) is closed, there is an anti-cracking space (20) between the first trapezoidal structure (111) and the second trapezoidal structure (121), the height of the anti-cracking space (20) being greater than the thickness of the entire substrate of fingerprint chips. The cover plate (110) and the tray (120) are used to fix the entire substrate of fingerprint chips in the anti-cracking space (20) when the cover plate (110) is closed.

Description

Apparatus and method for testing a fingerprint chip

Technical field

The present application relates to the field of terminal devices and, more particularly, to an apparatus and method for testing a fingerprint chip.

Background technique

With the increase in the demand for fingerprint identification chips by mobile devices, the demand for the production and test capacity of fingerprint identification chips has also increased significantly. Therefore, the test for the fingerprint identification chip has changed from the original single chip test to the entire substrate. In the test, a substrate can be packaged in different numbers according to the size of the chip. Therefore, there is a need for a technology that enables testing of such chips.

Summary of the invention

The embodiment of the present application provides an apparatus and method for testing a fingerprint chip, which can implement testing of a whole board fingerprint chip.

In a first aspect, an apparatus for testing a fingerprint chip is provided, comprising:

a cover plate, the outer ring of the cover plate is a trapezoidal structure, and the main body portion of the cover plate is provided with a hollow structure of M rows and N columns of meshes, and the M and the N are positive integers;

a tray, the inner ring of the tray is a trapezoidal structure, the main body portion of the tray is provided with a hollow structure of a row A and a column B grid, and the A and the B are positive integers;

In the case that the cover plate is closed, the trapezoidal structure and the trapezoidal structure have an anti-fracture space, and the height of the anti-fracture space is greater than the thickness of the whole plate fingerprint chip;

The cover plate and the tray are configured to fix the whole board fingerprint chip to the anti-fracture space when the cover plate is closed.

Therefore, the trapezoidal structure of the cover plate of the device for testing and the trapezoidal structure of the tray have an anti-fracture space when the cover plate is closed, and the height of the anti-fracture space is greater than the thickness of the entire plate fingerprint chip to be tested, thereby The entire panel fingerprint chip can be fixed to the anti-fracture space by the cover plate and the tray, and the chip is not fractured due to excessive pressure.

Optionally, the difference between the height of the anti-fracture space and the thickness of the whole board fingerprint chip is less than a height threshold.

Therefore, the height of the anti-fracture space is set to be slightly larger than the thickness of the entire fingerprint chip, thereby enabling It is enough to ensure that the whole board fingerprint chip can be flattened, but not to be fractured.

Optionally, the smallest inner ring of the trapezoidal structure has the same size as the full-board fingerprint chip.

Therefore, it can be ensured that when the whole board fingerprint chip is placed in the tray, the pad of each chip in the whole board fingerprint chip and the test probe of the testing machine can be connected to the needle more quickly.

Optionally, the A and the B are determined according to an arrangement of the fingerprint chips in the whole board fingerprint chip.

Therefore, it can be ensured that each of the entire board fingerprint chips can be exposed from the A row and B column grids in the tray.

Optionally, the means for testing the fingerprint chip further comprises a linker for linking the cover plate and the tray.

Optionally, the device for testing a fingerprint chip further comprises a locking structure for fixing the cover plate and the tray when the cover plate is closed.

Optionally, the locking structure is a locking buckle.

Optionally, the device for testing a fingerprint chip further comprises at least one positioning pin, wherein when the at least one positioning pin is used to place the device in the testing machine, the positioning device configuration in the testing machine is The device is fixed in the test machine.

In a second aspect, a method for testing a fingerprint chip is provided, the method being applied to a device for testing a fingerprint chip, the device for testing a fingerprint chip comprising: a cover plate, an outer ring of the cover plate In the trapezoidal structure, the main body portion of the cover plate is provided with a hollow structure of M rows and N columns of meshes, the M and the N are positive integers, the tray, the inner ring of the tray is a trapezoidal structure, and the tray is The main body portion is provided with a hollow structure of an A-row B-column grid, and the A and the B are positive integers, and in the case where the cover plate is closed, the trapezoidal structure and the trapezoidal structure are provided with anti-fracture The height of the anti-fracture space is greater than the thickness of the whole board fingerprint chip to be tested, and the method includes:

Placing the whole board fingerprint chip on a main body portion of the tray;

Closing the cover plate, pressing a warpage position of the whole board fingerprint chip through a physical portion between two adjacent grids in the M rows and N columns of grids;

The pressed whole plate fingerprint chip is fixed to the anti-fracture space by the cover plate and the tray.

Therefore, the method for testing a fingerprint chip in the embodiment of the present application can pass through a net on a cover plate. The lattice hollow structure realizes the test of the surface of the chip by the fake finger, and the grid type hollow structure on the tray realizes the needle connection of the test pad of the test chip of each chip in the whole fingerprint chip, so The method for testing a fingerprint chip in the embodiment of the present application can implement testing of a whole board fingerprint chip.

Further, the method for testing a fingerprint chip in the embodiment of the present application presses a warpage position of the whole fingerprint chip by a physical portion between two adjacent grids in the M-row N-column grid, because The trapezoidal structure of the cover plate of the device for testing and the trapezoidal structure of the tray have an anti-fracture space when the cover plate is closed, and the height of the anti-fracture space is greater than the thickness of the entire plate fingerprint chip to be tested, and therefore, through the cover The board and the tray are capable of fixing the entire board fingerprint chip in the anti-fracture space without causing the fingerprint chip to be fractured due to excessive pressure.

Therefore, the height of the anti-fracture space is set to be slightly larger than the thickness of the whole board fingerprint chip, so that the whole board fingerprint chip can be flattened without being fractured.

Optionally, the device for testing a fingerprint chip further includes a linker, the method further comprising:

The cover and the tray are linked by the linker.

Optionally, the device for testing a fingerprint chip further includes a locking structure, the method further comprising:

The cover and the tray are secured by the locking structure when the cover is closed.

Optionally, the locking structure is a locking buckle.

The device also includes at least one locating peg for securing the device to the test in cooperation with the locating device under test when the device is placed in the testing machine.

Based on the above technical solution, the device for testing a fingerprint chip according to an embodiment of the present application includes a cover plate and a tray, and the main body of the cover plate and the tray are provided with a mesh type hollow structure, and a grid on the cover plate The type hollow structure can be used for the test of the surface of the chip by the dummy finger, and the grid type hollow structure on the tray can be used for the pad of each chip in the whole board fingerprint chip to be tested to leak out from the grid, so as to facilitate The test probe of the test machine is connected to the needle. Therefore, the device for testing the fingerprint chip of the embodiment of the present application can implement the test of the whole board fingerprint chip.

DRAWINGS

1 is a schematic diagram of an apparatus for testing a fingerprint chip in accordance with an embodiment of the present application.

Figure 2 is a cross-sectional view of the apparatus for testing a fingerprint chip in a closed state of the cover.

Fig. 3 is a view showing a state in which the whole board fingerprint chip is in the tray in a state where the cover is opened.

4 is a schematic view showing the state of the whole board fingerprint chip in the tray in a closed state of the cover plate;

FIG. 5 is a schematic flow chart of a method for testing a fingerprint chip according to the present application.

Figure 6 is a flow chart showing the operation of the apparatus for testing a fingerprint chip.

Figure 7 is a flow chart showing the operation of the apparatus for testing a fingerprint chip.

detailed description

The technical solutions in the embodiments of the present application are described below in conjunction with the accompanying drawings in the embodiments of the present application.

1 shows a schematic diagram of an apparatus for testing a fingerprint chip according to an embodiment of the present application. As shown in FIG. 1, the apparatus 100 for testing a fingerprint chip includes:

a cover plate 110, the outer ring of the cover plate 110 is a trapezoidal structure 111, the main body portion of the cover plate 110 is provided with a hollow structure 112 of M rows and N columns of meshes, and M and N are positive integers;

The inner circumference of the tray 120 is a trapezoidal structure 121, and the main body portion of the tray 120 is provided with a hollow structure 122 of a row A and a column B grid, and the A and the B are positive integers;

In the case that the cover plate 110 is closed, the trapezoidal structure 111 and the trapezoidal structure 121 have an anti-fracture space 20, and the height of the anti-fracturing space 20 is greater than the thickness of the whole board fingerprint chip;

The cover plate 110 and the tray 120 are used to fix the whole board fingerprint chip to the anti-fracture space 20 when the cover plate 110 is closed.

Specifically, the inner ring of the tray 120 has a trapezoidal structure, that is, the tray 120 is a trapezoidal groove as a whole, and the main body portion of the tray 120 is provided with a hollow structure 122 of A rows and B columns of grids, and the tray 120 can be used. For placing the whole board fingerprint chip to be tested, the hollow structure 122 of the A row and B column grid can be used for the pad of each chip in the whole board fingerprint chip to pass the A line B. The column grid leaks from the bottom surface of the tray so that the test probe of the test machine can be connected to the pad of each chip through the bottom surface of the tray. The hollow structure 112 of the M rows and N columns of grids on the cover plate 110 enables the fake finger for testing the fingerprint chip to still touch each of the fingerprint chips in the whole fingerprint chip when the cover 110 is closed. The surface is thus capable of testing the fingerprint recognition function of the fingerprint chip. Therefore, the apparatus for testing a fingerprint chip of the embodiment of the present application can implement testing of the whole board fingerprint chip.

When the cover plate 110 is closed, the solid portions of the adjacent two grids in the M rows and N columns of grids can be used to press the warped portion of the whole board fingerprint chip to be tested, thereby causing the fake finger to press the surface of the fingerprint chip When the test item on the surface of the fingerprint chip can be better fitted with the fake finger.

Figure 2 shows a front cross-sectional view of the apparatus for testing a fingerprint chip when the cover is closed, as shown in Figure 2, the trapezoidal structure 111 of the cover 110 and the trapezoid of the tray 120 when the cover 110 is closed The structure 121 has a fracturing prevention space 20, the height of the anti-fracturing space 20 is greater than the thickness of the whole board fingerprint chip to be tested, and therefore, when the cover plate 110 is closed, the trapezoidal structure 111 of the cover plate 110 and the tray 120 are The trapezoidal structure 121 cooperates with each other, so that the whole-plate fingerprint chip to be tested can be fixed to the anti-fracture space 20, and the height of the anti-fracture space 20 is greater than the thickness of the whole-plate fingerprint chip. Therefore, the embodiment of the present application The device for testing the fingerprint chip can ensure that the entire fingerprint chip to be tested is not crushed due to excessive pressure while flattening the entire fingerprint chip.

Optionally, the smallest inner ring of the trapezoidal structure 121 (that is, the inner ring where the anti-fracturing space 20 is located) has the same size as the entire fingerprint chip.

In practical applications, the size of the smallest inner ring of the trapezoidal structure 121 can be set to be the same as the size of the whole board fingerprint chip, so that the displacement of the whole board fingerprint chip in the tray can be prevented. The tray 120 is provided with an A-row B-column grid, and the A-row B-column grid may be disposed to exactly correspond to each chip in the whole-plate fingerprint chip, so that when the whole-board fingerprint chip is placed in the tray 120, The pads of each chip can leak out just from the A-row B-column grid, so that the pads of each chip in the whole-plate fingerprint chip and the test probe of the test machine can be connected to the needle faster.

It should be understood that the size of the minimum inner ring of the tray 120 may also be larger than the size of the whole board fingerprint chip to be tested. In this case, it is only necessary to manually adjust the grid of each chip pad of the whole board fingerprint chip from the tray. The entire fingerprint chip is fixed in the anti-fracture space by leaking out and then closing the cover, so that the displacement of the whole fingerprint chip in the tray can be prevented.

Figure 3 is a schematic view showing the state of the whole board fingerprint chip in the tray when the cover is opened. As can be seen from FIG. 3, when the cover is opened, the whole fingerprint chip is in a warped state, and FIG. 4 is a schematic view showing the state of the whole fingerprint chip in the tray after the cover is closed, as can be seen from FIG. After the cover is closed, the warped whole-plate fingerprint chip can be flattened, and the whole-board fingerprint chip can be fixed in the anti-fracture space 20 by the cooperation of the cover plate and the trapezoidal structure of the tray, The height of the anti-fracturing space 20 is greater than the thickness of the whole board fingerprint chip, so that the whole board fingerprint chip can be prevented from being fractured.

Optionally, the difference between the height of the anti-fracturing space 20 and the thickness of the whole board fingerprint chip is less than a height threshold.

In a specific implementation, the height of the anti-fracture space may be set to be slightly larger than the thickness of the whole board fingerprint chip, so that the whole board fingerprint chip can be flattened without being fractured.

Therefore, the apparatus for testing a fingerprint chip of the embodiment of the present application can flatten the whole fingerprint chip by the physical part of two adjacent grids in the cover plate before testing the whole board fingerprint chip to be tested. And fixing the whole board fingerprint chip to the anti-fracture space through the trapezoidal structure of the cover plate and the tray. Since the height of the anti-fracture space is greater than the thickness of the whole board fingerprint chip, the whole can be guaranteed The board fingerprint chip is flat and does not cause the chip to be fractured due to excessive pressure.

Optionally, the A and the B are determined according to the arrangement of the fingerprint chips in the whole board fingerprint chip.

Specifically, in order to realize that each chip in the whole board fingerprint chip can be exposed from the A row and B column grids in the tray, the tray 120 can be determined according to the arrangement of the fingerprint chips in the whole board fingerprint chip. The number of rows A and the number of columns B of the grid. For example, the whole board fingerprint chip includes 4 rows and 12 columns of fingerprint chips, and the number of grids in the tray 120 can also be set to 4 rows and 12 columns, that is, A=4, B. =12, the size of each grid can be determined according to the size of the pad of the fingerprint chip. Optionally, the size of each grid can be slightly larger than the size of the pad of the fingerprint chip, and the spacing between adjacent grids can also be The arrangement of the fingerprint chips in the whole board fingerprint chip is determined.

Optionally, the apparatus 100 for testing a fingerprint chip further includes a linker 130 for linking the cover plate 110 and the tray 120.

Specifically, as shown in FIG. 1, the apparatus 100 for testing a fingerprint chip may further include a linker 130, which may be active, and the trapezoidal structure of the cover plate 110 may be implemented by adjusting the linker 130. Alignment of the trapezoidal structure of the tray 120.

Optionally, the device 100 for testing a fingerprint chip further includes a locking structure 140, the locking The structure 140 is used to secure the cover plate 110 and the tray 120 when the cover is closed.

As shown in FIG. 1, the apparatus 100 for testing a fingerprint chip further includes a locking structure 140 that can be used to secure the cover 110 and the tray 120 when the cover is closed. Alternatively, the locking structure may be a locking buckle. Therefore, after the whole board fingerprint chip to be tested is placed in the tray 120, the cover plate 110 is closed, and the locking structure 140 is locked, and the device 100 for testing the fingerprint chip can be placed in the testing machine for testing. Since the whole board fingerprint chip is placed in the device 100 for testing the fingerprint chip for moving and testing, the fingerprint chip is prevented from being scratched by the fingerprint chip by directly clamping the chip, or the fingerprint chip is affected by the collision. The appearance even affects the problem of use. At the same time, the problem that the fingerprint chip is moved by the adsorption method is easy to leave a fingerprint on the surface of the fingerprint chip or the fingerprint chip is deformed due to excessive suction.

Optionally, the apparatus 100 for testing a fingerprint chip may further include at least one positioning pin for cooperating with a positioning device in the testing machine when the device 100 is placed in the testing machine, The device 100 is fixed in the test machine. FIG. 1 exemplarily shows four positioning pins 150. Optionally, the device 100 may include fewer than four positioning pins, for example, two, or more than four, for example, six, The number of the positioning pins is not limited in the application embodiment. In addition, the position of the positioning pin in the device 100 is not limited in the embodiment of the present application.

The device embodiment of the present application is described in detail above with reference to FIG. 1 to FIG. 4 . The method embodiment of the present application is described in detail below with reference to FIG. 5 to FIG. 7 . It should be understood that the method embodiment and the device embodiment correspond to each other. The description can be made with reference to the device embodiment.

FIG. 5 shows a schematic flow chart of a method for testing a fingerprint chip according to an embodiment of the present application, the method being applied to a device for testing a fingerprint chip, the device for testing a fingerprint chip comprising: a cover plate, The outer ring of the cover plate has a trapezoidal structure, and the main body portion of the cover plate is provided with a hollow structure of M rows and N columns of meshes, the M and the N are positive integers, the tray, the inner ring of the tray is a trapezoidal structure, and the tray is The main body portion is provided with a hollow structure of a row A and a column B grid, and the A and the B are positive integers. When the cover plate is closed, the trapezoidal structure and the trapezoidal structure have an anti-fracture space, and the pressure is prevented. The height of the crack space is greater than the thickness of the whole board fingerprint chip to be tested. As shown in FIG. 5, the method 500 includes:

501, the whole board fingerprint chip is placed on the main body portion of the tray;

502, closing the cover plate, pressing a warpage position of the whole board fingerprint chip through a physical portion between two adjacent grids in the M-row N-column grid, and pressing the cover plate and the tray after pressing The whole board fingerprint chip is fixed in the anti-fracture space.

Therefore, in the method for testing a fingerprint chip in the embodiment of the present application, the fake finger can perform the test of the fingerprint recognition function on the surface of the chip through the mesh type hollow structure on the cover plate, and the test probe of the test machine can pass through the tray. The mesh type hollow structure is connected to the pad of each chip in the whole board fingerprint chip. Therefore, the method for testing the fingerprint chip in the embodiment of the present application can implement the test of the whole board fingerprint chip.

Further, the method for testing a fingerprint chip in the embodiment of the present application presses a warpage position of the whole fingerprint chip by a physical portion between two adjacent grids in the M-row N-column grid, because The trapezoidal structure of the cover plate of the device for testing and the trapezoidal structure of the tray have an anti-fracture space when the cover plate is closed, so that the entire plate can be passed through the trapezoidal structure of the cover plate and the tray in the case where the cover plate is closed The fingerprint chip is fixed in the anti-fracture space, and since the height of the anti-fracture space is larger than the thickness of the whole-plate fingerprint chip to be tested, the fingerprint chip is not fractured due to excessive pressure.

Optionally, the A and the B are determined according to the number of fingerprint chips included in the whole board fingerprint chip.

Optionally, the device for testing the fingerprint chip further includes a linker, the method further comprising:

The cover and the tray are linked by the linker.

Optionally, the device for testing the fingerprint chip further includes a locking structure, the method further comprising:

Optionally, the locking structure is a locking buckle.

Optionally, the device for testing the fingerprint chip may further comprise at least one positioning pin, wherein the at least one positioning pin is used to cooperate with the positioning device in the testing machine when the device is placed in the testing machine, and fix the device In the test machine.

Referring to FIG. 6, the following describes how to use the device for testing the fingerprint chip to test the whole board fingerprint chip. As shown in FIG. 6, the operation flow may include the following steps:

In S1, the device for testing the fingerprint chip is opened, and the whole board fingerprint chip is placed in the tray of the device for testing the fingerprint chip;

In S2, closing the cover plate and locking the locking structure, the warpage position of the whole fingerprint chip is pressed by the physical portion between two adjacent grids in the M-row N-column grid, and Through the cover The plate and the tray fix the pressed whole plate fingerprint chip to the anti-fracture space.

After the above steps are completed, a device for testing the fingerprint chip with the entire fingerprint chip can be obtained. At this time, as shown in FIG. 7, the device for testing the fingerprint chip equipped with the whole board fingerprint chip can be placed in the testing machine by the robot, so that the whole board fingerprint chip can be tested by the testing machine, because The whole board fingerprint chip is placed in the device for testing the fingerprint chip for movement, so the robot grips the device for testing the fingerprint chip, so that the fingerprint chip is not scratched or bumped.

It should be understood that the term "and/or" herein is merely an association relationship describing an associated object, indicating that there may be three relationships, for example, A and/or B, which may indicate that A exists separately, and A and B exist simultaneously. There are three cases of B alone. In addition, the character "/" in this article generally indicates that the contextual object is an "or" relationship.

It should be understood that, in the various embodiments of the present application, the size of the sequence numbers of the foregoing processes does not mean the order of execution sequence, and the order of execution of each process should be determined by its function and internal logic, and should not be applied to the embodiment of the present application. The implementation process constitutes any limitation.

Those of ordinary skill in the art will appreciate that the elements and algorithm steps of the various examples described in connection with the embodiments disclosed herein can be implemented in electronic hardware or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the solution. A person skilled in the art can use different methods to implement the described functions for each particular application, but such implementation should not be considered to be beyond the scope of the present application.

A person skilled in the art can clearly understand that for the convenience and brevity of the description, the specific working process of the system, the device and the unit described above can refer to the corresponding process in the foregoing method embodiment, and details are not described herein again.

In the several embodiments provided by the present application, it should be understood that the disclosed systems, devices, and methods may be implemented in other manners. For example, the device embodiments described above are merely illustrative. For example, the division of the unit is only a logical function division. In actual implementation, there may be another division manner, for example, multiple units or components may be combined or may be Integrate into another system, or some features can be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interface, device or unit, and may be in an electrical, mechanical or other form.

The unit described as a separate component may or may not be physically separated, and the component displayed as a unit may or may not be a physical unit, that is, may be located in one place, or It can also be distributed to multiple network elements. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

The functions may be stored in a computer readable storage medium if implemented in the form of a software functional unit and sold or used as a standalone product. Based on such understanding, the technical solution of the present application, which is essential or contributes to the prior art, or a part of the technical solution, may be embodied in the form of a software product, which is stored in a storage medium, including The instructions are used to cause a computer device (which may be a personal computer, server, or network device, etc.) to perform all or part of the steps of the methods described in various embodiments of the present application. The foregoing storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, and the like. .

The foregoing is only a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto, and any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the present application. It should be covered by the scope of protection of this application. Therefore, the scope of protection of the present application should be determined by the scope of the claims.

Claims

An apparatus for testing a fingerprint chip, comprising:

a cover plate, the outer ring of the cover plate is a trapezoidal structure, and the main body portion of the cover plate is provided with a hollow structure of M rows and N columns of meshes, and the M and the N are positive integers;

a tray, the inner ring of the tray is a trapezoidal structure, the main body portion of the tray is provided with a hollow structure of a row A and a column B grid, and the A and the B are positive integers;

In the case that the cover plate is closed, the trapezoidal structure of the cover plate and the trapezoidal structure of the tray have an anti-fracture space, and the height of the anti-fracture space is greater than the thickness of the whole plate fingerprint chip;

The cover plate and the tray are configured to fix the whole board fingerprint chip to the anti-fracture space when the cover plate is closed.
The device according to claim 1, wherein a difference between a height of the anti-fracture space and a thickness of the entire plate fingerprint chip is less than a height threshold.
A device according to claim 1 or 2, wherein the smallest inner ring of the trapezoidal structure of the tray has the same size as the entire fingerprint chip.
The apparatus according to any one of claims 1 to 3, wherein the A and the B are determined according to an arrangement of fingerprint chips in the whole board fingerprint chip.
The apparatus according to any one of claims 1 to 4, wherein the means for testing the fingerprint chip further comprises a linker for linking the cover and the tray.
The apparatus according to any one of claims 1 to 5, wherein the means for testing the fingerprint chip further comprises a locking structure for fixing the cover when the cover is closed The cover plate and the tray.
The device of claim 6 wherein said locking structure is a locking buckle.
Apparatus according to any one of claims 1 to 7 wherein said apparatus further comprises at least one locating peg for placing said device in a test machine, The positioning device in the test machine cooperates to secure the device in the test machine.
A method for testing a fingerprint chip, wherein the method is applied to a device for testing a fingerprint chip, the device for testing a fingerprint chip comprises: a cover plate, and an outer ring of the cover plate is trapezoidal a structure, the main body portion of the cover plate is provided with a hollow structure of M rows and N columns of meshes, the M and the N are positive integers; the tray, the inner ring of the tray is a trapezoidal structure, and the main part of the tray a hollow structure having an A-row B-column grid, wherein the A and the B are positive integers; In the case that the cover plate is closed, an anti-fracture space is provided between the trapezoidal structure of the cover plate and the trapezoidal structure of the tray, and the height of the anti-fracture space is greater than the thickness of the whole-plate fingerprint chip to be tested. , the method includes:

Placing the whole board fingerprint chip on a main body portion of the tray;

Closing the cover plate, pressing a warp position of the whole board fingerprint chip through a solid portion between two adjacent grids in the M rows and N columns of grids, and passing the cover plate and the tray The pressed whole plate fingerprint chip is fixed to the anti-fracture space.
The method of claim 9 wherein the difference between the height of the anti-fracture space and the thickness of the full-board fingerprint chip is less than a height threshold.
The method according to claim 9 or 10, wherein the smallest inner ring of the trapezoidal structure of the tray has the same size as the whole plate fingerprint chip.
The method according to any one of claims 9 to 11, wherein the A and the B are determined according to an arrangement of fingerprint chips in the whole board fingerprint chip.
The method according to any one of claims 9 to 12, wherein the means for testing the fingerprint chip further comprises a linker, the method further comprising:

The cover and the tray are linked by the linker.
The method according to any one of claims 9 to 13, wherein the means for testing the fingerprint chip further comprises a locking structure, the method further comprising:

The cover and the tray are secured by the locking structure when the cover is closed.
The method of claim 14 wherein said locking structure is a locking buckle.
The method according to any one of claims 9 to 15, wherein the apparatus further comprises at least one positioning pin for placing the device in the testing machine, The positioning device in the test cooperates to secure the device in the test.