WO2018110954A3 - 테라헤르츠파 대역에서 동작하는 단위셀 메타 구조 소자 및 이를 포함하는 편광 장치 - Google Patents
테라헤르츠파 대역에서 동작하는 단위셀 메타 구조 소자 및 이를 포함하는 편광 장치 Download PDFInfo
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- WO2018110954A3 WO2018110954A3 PCT/KR2017/014586 KR2017014586W WO2018110954A3 WO 2018110954 A3 WO2018110954 A3 WO 2018110954A3 KR 2017014586 W KR2017014586 W KR 2017014586W WO 2018110954 A3 WO2018110954 A3 WO 2018110954A3
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- 239000000463 material Substances 0.000 abstract 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
- G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/002—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of materials engineered to provide properties not available in nature, e.g. metamaterials
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- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Aerials With Secondary Devices (AREA)
Abstract
본 발명의 하나의 실시 예에 따른 테라헤르츠 대역에서 동작하는 단위셀 메타 구조 소자는 유전체 기판 및 상기 유전체 기판 상에서, 제1 패턴부 및 제2 패턴부를 포함하는 메타물질부를 포함하고, 상기 제1 패턴부는 X축 방향을 따라 제1 길이만큼 신장되고, Y축 방향을 따라 제2 길이만큼 신장되고, 상기 X축 방향을 따라 제1 간격만큼 이격되고, 상기 Y축 방향을 따라 제2 간격만큼 이격된 제1 패턴들을 포함하고, 상기 제2 패턴부는 상기 X축 방향을 따라 제3 길이만큼 신장되고, 상기 Y축 방향을 따라 제3 간격만큼 이격된 제2 패턴들을 포함한다.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20160168840 | 2016-12-12 | ||
KR10-2016-0168840 | 2016-12-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2018110954A2 WO2018110954A2 (ko) | 2018-06-21 |
WO2018110954A3 true WO2018110954A3 (ko) | 2018-12-13 |
Family
ID=62559351
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2017/014586 WO2018110954A2 (ko) | 2016-12-12 | 2017-12-12 | 테라헤르츠파 대역에서 동작하는 단위셀 메타 구조 소자 및 이를 포함하는 편광 장치 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR102061114B1 (ko) |
WO (1) | WO2018110954A2 (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102266009B1 (ko) | 2018-12-19 | 2021-06-17 | 서울대학교산학협력단 | 사인파 형상의 도파관을 이용한 전자기파 상호작용 회로 |
CN112490682A (zh) * | 2020-11-24 | 2021-03-12 | 深圳市上诺微电子有限公司 | 一种光学超材料单元及选择设计方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090262766A1 (en) * | 2006-10-19 | 2009-10-22 | Houtong Chen | Active terahertz metamaterial devices |
KR20140100135A (ko) * | 2013-02-05 | 2014-08-14 | 아주대학교산학협력단 | 테라헤르츠 메타 물질을 이용한 이물질 검출 장치 |
US20150301254A1 (en) * | 2011-08-03 | 2015-10-22 | U.S. Government As Represented By The Secretary Of The Army | Electromagnetic composite-based reflecting terahertz waveplate |
US9219314B2 (en) * | 2011-06-29 | 2015-12-22 | Kuang-Chi Innovative Technology Ltd. | Artificial electromagnetic material |
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2017
- 2017-12-12 WO PCT/KR2017/014586 patent/WO2018110954A2/ko active Application Filing
- 2017-12-12 KR KR1020170170719A patent/KR102061114B1/ko active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090262766A1 (en) * | 2006-10-19 | 2009-10-22 | Houtong Chen | Active terahertz metamaterial devices |
US9219314B2 (en) * | 2011-06-29 | 2015-12-22 | Kuang-Chi Innovative Technology Ltd. | Artificial electromagnetic material |
US20150301254A1 (en) * | 2011-08-03 | 2015-10-22 | U.S. Government As Represented By The Secretary Of The Army | Electromagnetic composite-based reflecting terahertz waveplate |
KR20140100135A (ko) * | 2013-02-05 | 2014-08-14 | 아주대학교산학협력단 | 테라헤르츠 메타 물질을 이용한 이물질 검출 장치 |
Non-Patent Citations (1)
Title |
---|
STRIKWERDA ET AL.: "Comparison of Birefringent Electric Split-Ring Resonator and Meanderline Structures as Quarter-Wave Plates at Terahertz Frequencies", OPTICS EXPRESS, vol. 17, no. 1, 23 December 2008 (2008-12-23), pages 136 - 149, XP055551519 * |
Also Published As
Publication number | Publication date |
---|---|
WO2018110954A2 (ko) | 2018-06-21 |
KR20180067456A (ko) | 2018-06-20 |
KR102061114B1 (ko) | 2019-12-31 |
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WO2018110954A3 (ko) | 테라헤르츠파 대역에서 동작하는 단위셀 메타 구조 소자 및 이를 포함하는 편광 장치 |
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