WO2018110954A3 - 테라헤르츠파 대역에서 동작하는 단위셀 메타 구조 소자 및 이를 포함하는 편광 장치 - Google Patents

테라헤르츠파 대역에서 동작하는 단위셀 메타 구조 소자 및 이를 포함하는 편광 장치 Download PDF

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Publication number
WO2018110954A3
WO2018110954A3 PCT/KR2017/014586 KR2017014586W WO2018110954A3 WO 2018110954 A3 WO2018110954 A3 WO 2018110954A3 KR 2017014586 W KR2017014586 W KR 2017014586W WO 2018110954 A3 WO2018110954 A3 WO 2018110954A3
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axis direction
unit cell
cell structure
operating
same
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PCT/KR2017/014586
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English (en)
French (fr)
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WO2018110954A2 (ko
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장재형
누만 무하마드타얍
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광주과학기술원
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Publication of WO2018110954A2 publication Critical patent/WO2018110954A2/ko
Publication of WO2018110954A3 publication Critical patent/WO2018110954A3/ko

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • G01N21/553Attenuated total reflection and using surface plasmons
    • G01N21/554Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/002Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of materials engineered to provide properties not available in nature, e.g. metamaterials

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Aerials With Secondary Devices (AREA)

Abstract

본 발명의 하나의 실시 예에 따른 테라헤르츠 대역에서 동작하는 단위셀 메타 구조 소자는 유전체 기판 및 상기 유전체 기판 상에서, 제1 패턴부 및 제2 패턴부를 포함하는 메타물질부를 포함하고, 상기 제1 패턴부는 X축 방향을 따라 제1 길이만큼 신장되고, Y축 방향을 따라 제2 길이만큼 신장되고, 상기 X축 방향을 따라 제1 간격만큼 이격되고, 상기 Y축 방향을 따라 제2 간격만큼 이격된 제1 패턴들을 포함하고, 상기 제2 패턴부는 상기 X축 방향을 따라 제3 길이만큼 신장되고, 상기 Y축 방향을 따라 제3 간격만큼 이격된 제2 패턴들을 포함한다.
PCT/KR2017/014586 2016-12-12 2017-12-12 테라헤르츠파 대역에서 동작하는 단위셀 메타 구조 소자 및 이를 포함하는 편광 장치 WO2018110954A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20160168840 2016-12-12
KR10-2016-0168840 2016-12-12

Publications (2)

Publication Number Publication Date
WO2018110954A2 WO2018110954A2 (ko) 2018-06-21
WO2018110954A3 true WO2018110954A3 (ko) 2018-12-13

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PCT/KR2017/014586 WO2018110954A2 (ko) 2016-12-12 2017-12-12 테라헤르츠파 대역에서 동작하는 단위셀 메타 구조 소자 및 이를 포함하는 편광 장치

Country Status (2)

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KR (1) KR102061114B1 (ko)
WO (1) WO2018110954A2 (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102266009B1 (ko) 2018-12-19 2021-06-17 서울대학교산학협력단 사인파 형상의 도파관을 이용한 전자기파 상호작용 회로
CN112490682A (zh) * 2020-11-24 2021-03-12 深圳市上诺微电子有限公司 一种光学超材料单元及选择设计方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090262766A1 (en) * 2006-10-19 2009-10-22 Houtong Chen Active terahertz metamaterial devices
KR20140100135A (ko) * 2013-02-05 2014-08-14 아주대학교산학협력단 테라헤르츠 메타 물질을 이용한 이물질 검출 장치
US20150301254A1 (en) * 2011-08-03 2015-10-22 U.S. Government As Represented By The Secretary Of The Army Electromagnetic composite-based reflecting terahertz waveplate
US9219314B2 (en) * 2011-06-29 2015-12-22 Kuang-Chi Innovative Technology Ltd. Artificial electromagnetic material

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090262766A1 (en) * 2006-10-19 2009-10-22 Houtong Chen Active terahertz metamaterial devices
US9219314B2 (en) * 2011-06-29 2015-12-22 Kuang-Chi Innovative Technology Ltd. Artificial electromagnetic material
US20150301254A1 (en) * 2011-08-03 2015-10-22 U.S. Government As Represented By The Secretary Of The Army Electromagnetic composite-based reflecting terahertz waveplate
KR20140100135A (ko) * 2013-02-05 2014-08-14 아주대학교산학협력단 테라헤르츠 메타 물질을 이용한 이물질 검출 장치

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
STRIKWERDA ET AL.: "Comparison of Birefringent Electric Split-Ring Resonator and Meanderline Structures as Quarter-Wave Plates at Terahertz Frequencies", OPTICS EXPRESS, vol. 17, no. 1, 23 December 2008 (2008-12-23), pages 136 - 149, XP055551519 *

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Publication number Publication date
WO2018110954A2 (ko) 2018-06-21
KR20180067456A (ko) 2018-06-20
KR102061114B1 (ko) 2019-12-31

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