WO2018094673A1 - 按键基准的更新方法、模块及终端设备 - Google Patents

按键基准的更新方法、模块及终端设备 Download PDF

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Publication number
WO2018094673A1
WO2018094673A1 PCT/CN2016/107167 CN2016107167W WO2018094673A1 WO 2018094673 A1 WO2018094673 A1 WO 2018094673A1 CN 2016107167 W CN2016107167 W CN 2016107167W WO 2018094673 A1 WO2018094673 A1 WO 2018094673A1
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WO
WIPO (PCT)
Prior art keywords
button
chip
pressing
release
capacitance value
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PCT/CN2016/107167
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English (en)
French (fr)
Inventor
林金辉
武丹
龙云芳
Original Assignee
深圳市汇顶科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 深圳市汇顶科技股份有限公司 filed Critical 深圳市汇顶科技股份有限公司
Priority to EP16922211.4A priority Critical patent/EP3432126A4/en
Priority to PCT/CN2016/107167 priority patent/WO2018094673A1/zh
Priority to CN201680001624.2A priority patent/CN106605237A/zh
Publication of WO2018094673A1 publication Critical patent/WO2018094673A1/zh
Priority to US16/159,172 priority patent/US11054947B2/en

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/30—Authentication, i.e. establishing the identity or authorisation of security principals
    • G06F21/31—User authentication
    • G06F21/32—User authentication using biometric data, e.g. fingerprints, iris scans or voiceprints
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/02—Input arrangements using manually operated switches, e.g. using keyboards or dials
    • G06F3/023—Arrangements for converting discrete items of information into a coded form, e.g. arrangements for interpreting keyboard generated codes as alphanumeric codes, operand codes or instruction codes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V40/00—Recognition of biometric, human-related or animal-related patterns in image or video data
    • G06V40/10—Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
    • G06V40/12—Fingerprints or palmprints
    • G06V40/13—Sensors therefor
    • G06V40/1306—Sensors therefor non-optical, e.g. ultrasonic or capacitive sensing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/96—Touch switches
    • H03K17/962—Capacitive touch switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/9401—Calibration techniques
    • H03K2217/94026—Automatic threshold calibration; e.g. threshold automatically adapts to ambient conditions or follows variation of input

Definitions

  • Embodiments of the present invention relate to the field of key recognition technologies, and in particular, to a method, a module, and a terminal device for updating a button reference.
  • Fingerprint recognition technology is already the standard configuration of current smart phones, and many manufacturers give additional functions to the fingerprint module, such as clicking back, double-clicking on the background application, switching tasks left and right, calling up and down the taskbar, and so on.
  • MCU Micro Controller Unit
  • the current fingerprint button generally determines whether the button is pressed or released according to an absolute threshold; as shown in FIG. 1, the fingerprint button generally uses an absolute reference value 101 and a threshold value 102 to determine the button state, wherein the threshold 102 is a Difference.
  • the value of the button capacitance changes with the finger pressing. If the difference between the reference value 101 and the current button capacitance value is greater than the threshold value 102, it is determined that the button state 105 is at this time; the finger is released upward.
  • the difference between the reference value 101 and the current key capacitance value is less than the threshold 102, then the loose key state 106 is present.
  • An object of the present invention is to provide a method, a module, and a terminal device for updating a button reference, which improve the versatility and anti-interference ability of the button chip without increasing the burden on the master chip.
  • an embodiment of the present invention provides a method for updating a button reference, including the steps of: receiving a press interruption reported by a button chip; acquiring a plurality of pressing capacitance values from the button chip; wherein, a plurality of pressing capacitance values The capacitance value of the button chip at the time when the pressing interruption occurs and the capacitance value of the button chip at the next scanning time when the pressing interruption occurs, and the release reference of the button chip is set according to the plurality of pressing capacitance values.
  • the embodiment of the present invention further provides an update module for a button reference, comprising: a main control chip and a button device including a button chip; when the finger presses the button device, the button chip is used to generate a press break and report the press break to the main a control chip; the main control chip is configured to receive a compression interrupt, and obtain a plurality of pressing capacitance values from the button chip; wherein, the plurality of pressing capacitance values include a capacitance value of the button chip at the time when the pressing interruption occurs, and a time when the button chip is interrupted at the time of pressing The capacitance value of the next scanning time; the main control chip is further configured to set the release reference of the button chip according to the plurality of pressing capacitance values.
  • An embodiment of the present invention further provides a terminal device, including: an update module including a key reference of a master chip and a button device including a button chip.
  • the embodiment of the present invention acquires a plurality of subsequent pressing capacitance values after receiving the pressing interruption, and sets a new button chip release reference according to one of the plurality of pressing capacitance values, different button chips.
  • the release reference in the next stage can be set, which is suitable for different button chips, and the height of various parameters of the button chip is not required, and the versatility is high.
  • the release reference is dynamically updated, and the release reference is set according to the current state, so that the reference time is consistent with the external environment, and therefore, it is not interfered by the external environment, and the anti-interference ability is strong.
  • the benchmark will be updated and the terminal gap will be used. Update to avoid waste of master resources.
  • the pressing reference of the button chip is set according to the plurality of release capacitance values.
  • the pressing reference and the release reference are respectively set for the button chip, that is, the button chip has different judgment criteria for pressing and releasing, and the judgment is more accurate; and the pressing reference and the release reference are updated.
  • the anti-interference ability of the button is further improved, and the button is prevented from receiving the influence of the external environment.
  • the method further includes: setting a pressing capacitance value that meets the first preset condition among the plurality of pressing capacitance values as a release reference of the button chip;
  • the capacitor value setting release reference of the button chip specifically includes: setting a release capacitor value that meets a second preset condition among the plurality of release capacitor values as a pressing reference of the button chip.
  • the first preset condition is the smallest one of the plurality of pressed capacitance values
  • the second preset condition is the largest one of the plurality of released capacitance values.
  • the first preset condition is the largest one of the plurality of pressed capacitance values
  • the second preset condition is the smallest one of the plurality of released capacitance values.
  • the method for updating the button reference further includes: receiving a compression reference error interrupt reported by the button chip; acquiring a normal capacitance value from the button chip; the normal capacitance value is a capacitance value when the button chip is not pressed; and setting the pressing reference according to the normal capacitance value.
  • the button chip can be automatically reported.
  • FIG. 1 is a schematic diagram of a button state determination process based on an absolute threshold according to the prior art of the present invention
  • FIG. 2 is a flow chart of a method for updating a button reference according to a first embodiment of the present invention
  • FIG. 3 is a schematic view showing a process of pressing a button according to a first embodiment of the present invention
  • FIG. 4 is a flowchart of a method for updating a button reference according to a second embodiment of the present invention.
  • FIG. 5 is a schematic diagram of a process of pressing and releasing a button in a case where a capacitance value becomes smaller as a button is pressed according to a second embodiment of the present invention
  • FIG. 6 is a schematic diagram showing a process of pressing and releasing a button when an external environment changes in a case where a capacitance value becomes larger as a button is pressed according to a second embodiment of the present invention
  • FIG. 7 is a schematic diagram of a process of pressing and releasing a button in a case where a capacitance value becomes larger as a button is pressed according to a second embodiment of the present invention
  • FIG. 8 is a schematic diagram of a process of pressing and releasing a button when an external environment changes in a case where a capacitance value becomes larger as a button is pressed according to a second embodiment of the present invention
  • FIG. 9 is a schematic diagram of an update module of a button reference according to a fourth embodiment of the present invention.
  • FIG. 10 is a schematic structural diagram of a terminal device according to a seventh embodiment of the present invention.
  • a first embodiment of the present invention relates to a method of updating a key reference.
  • the specific process is shown in Figure 2. Shown, including:
  • Step 201 Receive a press break reported by the button chip.
  • the button chip when the button is pressed to a certain extent, the button chip generates a press break and reports the generated press break to the master chip.
  • the button may be a fingerprint button, wherein the press interruption is generated by the button chip according to the pressing reference and the pressing threshold.
  • the pressing reference is a capacitance value of the key chip itself when the button is in an unpressed state, which indicates a capacitance characteristic value of the different key chip itself.
  • the pressing reference is known before the pressing of the button operation, and in addition, the corresponding pressing reference may be different each time the pressing operation is performed, so the pressing reference is updateable.
  • the value of the pressed capacitor refers to the capacitance value of the button chip itself during finger pressing. When no finger or other debris is pressed on the button, the pressing capacitance value gradually decreases as the button is pressed. At this time, the pressing reference is the maximum capacitance value of the button chip itself.
  • the pressing threshold can be understood as: a threshold value set for the difference between the pressing capacitance value and the pressing reference, and the pressing threshold can be set in advance, which can be the capacitance value of the button chip after the finger is stably pressed. 1/3 of the amount of change; due to the different capacitance characteristics of different button chips, the pressing threshold can also take 1/2 of the amount of change in the capacitance value of the button chip after the finger is stably pressed.
  • the pressing reference before the pressing and the set pressing threshold are known, during the pressing of the button, the obtained pressing capacitance value is gradually decreased; if the difference between the current pressing capacitance value and the pressing reference reaches the pressing At the threshold value, a press interruption is generated, and the button chip reports a press interruption.
  • the button is not triggered for a period of time, the master chip is in a sleep state before receiving the interrupt, and after being received by the button chip, the button is awakened to the working state, and then proceeds to step 202.
  • the master chip is already in the working state before the interrupt is received, it proceeds directly to step 202.
  • Step 202 Acquire a plurality of pressing capacitance values from the button chip.
  • the plurality of pressing capacitance values include a capacitance value of the button chip at the time when the pressing interruption is generated and a capacitance value of the next scanning time of the button chip at the time when the pressing interruption occurs, wherein the obtained capacitance value is obtained.
  • the capacitance value at the next scanning time is smaller than the capacitance value obtained at the time of the pressing interruption generation.
  • the button chip can also scan itself for a period of time to obtain the capacitance value of the plurality of button chips, that is, the plurality of capacitance values of the button chip can be obtained at multiple time points (scanning time). And saved in the button chip.
  • the main control chip communicates with the button chip to obtain the capacitance values of the plurality of scanning moments saved by the button chip, and the main control chip can obtain the pressing capacitance values of the plurality of scanning moments by accessing the button chip multiple times; in addition, the main control chip can also Through one access, the pressing capacitance values of the plurality of scanning moments saved by the button chip are simultaneously acquired.
  • Step 203 Set a release reference of the button chip according to the plurality of pressing capacitance values.
  • a smaller pressing capacitance value is selected, and is set as a release reference of the button chip, and is used as a basis for determining the state of the button when the finger is raised.
  • the pressing reference is at a maximum value of 300, and when the amount of change of the finger press exceeds the preset pressing threshold 301, the button chip reports a press interruption (ie, at the symbol "1" in the figure);
  • a press interruption ie, at the symbol "1” in the figure
  • the finger continues to press ie, between “1” and “2” in the figure
  • multiple capacitance values can be acquired through multiple scanning moments, and the smaller pressing capacitance value can be selected (ie, the figure is marked) "2" is used as the release reference 302 of the button chip.
  • the main improvement point and effect of the embodiment of the present invention are: after receiving the interruption of the pressing, acquiring a plurality of pressing capacity values thereafter, setting a new release reference of the button chip according to one of the plurality of pressing capacitance values, different button chips According to the capacitance value obtained by the current pressing, the release reference in the next stage can be set, which is applicable to different button chips, and does not need the height of various parameters of the button chip.
  • the release reference is dynamically updated, and the release reference is set according to the current state, so that the reference time is consistent with the external environment, and therefore, it is not interfered by the external environment, and the anti-interference ability is strong.
  • the update of the button reference is realized by fully utilizing the data margin of the master chip after the master chip is woken up by the press interrupt (the existing interrupt function), and thus does not increase the additional burden of the master chip.
  • a second embodiment of the present invention relates to a method of updating a key reference. The specific process is shown in Figure 4.
  • Step 401 Receive a press interruption reported by the button chip.
  • Step 402 Acquire a plurality of pressing capacitance values from the button chip.
  • the steps 401 and 402 are completely consistent with the steps 201 and 202. For details, refer to the description of the above embodiment.
  • Step 403 Set a pressing capacitance value of the plurality of pressing capacitance values that meets the first preset condition as a release reference of the button chip.
  • the first preset condition is the smaller one of the plurality of capacitance values.
  • the plurality of pressing capacitance values obtained in step 402 are sequentially compared and determined.
  • the capacitance value acquired at the time of the interruption generation may be used as an initial capacitance value, and the pressing capacitance value acquired at the next time is compared with the initial
  • the capacitance values are compared, and a smaller capacitance value is recorded; and before the comparison is performed, an initial zero count value is preset, and the number of comparisons is recorded, and after each comparison is completed, the count value is automatically incremented by one until The count value is equal to the number of pressed capacitor values minus one.
  • the value of the capacitor obtained at this time is the value of the pressing capacitor that meets the first preset condition among the plurality of pressing capacitor values, that is, the smaller one of the plurality of pressing capacitor values, and the pressing capacitor that meets the first preset condition is used.
  • the value is set to the release reference of the button chip.
  • the first preset condition may also be the larger of the plurality of capacitance values, and the determination method thereof is consistent with the foregoing description.
  • Step 404 Receive a release interrupt reported by the button chip.
  • the button when the finger completes the button press, the button needs to be released, and when the button is released to a certain position, the button chip will generate a release interrupt, and report the release interrupt generated to the master chip.
  • the release interrupt is generated by the button chip according to the release reference and the release threshold. That is, when the finger releases the button to a certain position, the release capacitor value of the button chip is obtained; if the difference between the release capacitor value and the release reference exceeds the release threshold, the release interrupt is triggered.
  • the release capacitor value refers to the capacitance value of the button chip itself during the release of the finger.
  • Step 405 Acquire a plurality of release capacitor values from the button chip.
  • the plurality of release capacitor values include a capacitance value of the button chip at the time when the release interrupt is generated and a capacitance value of the next scan timing of the button chip at the time when the release interrupt is generated. As the finger continues to be released, the acquired capacitance value of the next scan time is greater than the capacitance value acquired at the time of the release interrupt generation.
  • the button chip may be scanned once every time interval to obtain the capacitance values of the plurality of button chips, that is, the plurality of button chip capacitance values may be acquired at multiple time points (scanning time).
  • the main control chip acquires the capacitance values of the plurality of scanning moments, and can obtain the capacitance values of the plurality of scanning moments by accessing the button chip multiple times; in addition, the main control chip can also obtain the pressing capacitance values of the plurality of scanning moments by one access. .
  • Step 406 Set a release capacitance value that meets a second preset condition among the plurality of release capacitance values as a pressing reference of the button chip.
  • the second preset condition is the larger one of the plurality of capacitance values in this step.
  • the comparison method is similar to the comparison method in step 403. In this step, the two capacitance values are compared, and a larger capacitance value is recorded, which is set as the pressing reference of the button chip.
  • the second preset condition in the step is the larger one of the plurality of capacitance values.
  • steps 401 to 403 may be performed first, or step 404 may be performed first.
  • steps 406 the sequence of steps performed, have no effect on the results.
  • the pressing reference is at the maximum value of 500
  • the pressing threshold 501 and the releasing threshold 503 are preset, and when the finger presses, the difference between the pressing reference and the pressing capacitance exceeds the pressing threshold 501, and the button is pressed.
  • the chip reports a press break (ie, at the "1" in the figure).
  • the finger continues to press, when the finger is fully pressed down (ie, at the symbol "2" in the figure); at this time, the minimum pressing capacitance value acquired during this pressing is taken as the release reference 502.
  • the capacitance value of the button chip itself gradually increases.
  • the release release is interrupted (ie, In the figure marked “3")
  • the button chip reports a release interrupt to the master chip.
  • the finger continues to release the button (ie, releases the button), and when the near button normal state is reached (ie, at the symbol "4" in the figure), the maximum release capacitance value of the button chip obtained during the release process is used as the pressing reference 504.
  • the reference value of the button returns to the highest point. Among them, the highest point 504 and the pressing reference maximum value 500 may not be the same.
  • the reference value obtained by the release reference 502 is substantially the same as the reference value obtained when the finger is completely pressed. Since the acquired multiple compression capacitance values are acquired at different scanning times, there is a certain value between each scanning time. The time interval, therefore, the possible scanning time is not at the actual lowest moment when the pressing capacitance value is obtained. Therefore, it is only necessary to obtain the smaller one of the plurality of capacitance values, and the capacitance value is the closest to the button chip when the finger is completely pressed down.
  • the capacitance value can be considered to be basically the same as the two capacitor values.
  • the method of the dynamic reference provided by the embodiment provides a release reference different from the pressing reference, and the user presses the pressing threshold 501 exceeding the button chip, and the button pressing interruption can also be triggered (ie, the symbol "5" in the figure), and then repeats The same process is performed before the button is pressed; when the finger is away from the button, the capacitance value of the button chip gradually increases from the bottom 605 until the increase of the capacitance value reaches the release threshold 503, and the release interrupt can be triggered (ie, at the mark "7" in the figure) .
  • the present embodiment is also applicable to a case where a finger presses a button and a pressing capacity is gradually increased.
  • a process of pressing and releasing the button in the above case will be specifically described, and a schematic view thereof is shown in FIG. 7.
  • the pressing reference is at the minimum value 701
  • the pressing threshold 702 and the release threshold 704 are set in advance, and when the finger is pressed, the difference between the pressing reference and the pressing capacitance value exceeds the pressing threshold 702 of the button chip.
  • the button chip triggers the pressing interrupt and reports it to the main control chip (ie, the symbol "1" in the figure).
  • the finger continues to press, when the finger is fully pressed down (ie, at the symbol "2" in the figure); at this time, the maximum pressing capacitance acquired during this pressing is taken as the release reference 703.
  • the capacitance value of the button chip gradually decreases.
  • the trigger release interrupt (ie, the label "3" in the figure) is pressed.
  • the chip reports a release interrupt to the master chip.
  • the finger continues to release the button until it reaches the normal state of the button (ie, at the symbol "4" in the figure), and the minimum release capacitance value acquired in the process is used as the pressing reference 705.
  • the reference value of the button returns to the lowest point 705. Among them, the lowest point 705 and the pressing reference maximum value 701 may not be the same.
  • FIG. 8 a schematic diagram of the process of pressing and releasing the button:
  • the button itself has a certain amount of offset, and the method proposed in the embodiment can well adapt to the influence of the ambient temperature.
  • the pressing reference rises from the lowest point 701 to the higher point 705, at which time the user is in the process of pressing.
  • the main technical effect of the embodiment of the present invention is that after receiving the interruption of the pressing, the plurality of pressing capacitance values are obtained, and the new release reference of the button chip is set according to one of the plurality of pressing capacitance values, and different button chips can be used.
  • the release reference in the next stage is set, which is suitable for different button chips, and the height of various parameters of the button chip is not required, and the versatility is high.
  • the release reference is dynamically updated, and the release reference is set according to the current state, so that the reference time is consistent with the external environment, and therefore, it is not interfered by the external environment, and the anti-interference ability is strong.
  • the reference is updated and the terminal gap is used for updating to avoid waste of the main control resources.
  • a third embodiment of the present invention relates to a method of updating a key reference.
  • the third embodiment is substantially identical to the first embodiment.
  • the button chip can automatically report an error, reset the pressing reference according to the normal capacitance value, and reset the pressing reference. In order to avoid the occurrence of a button status judgment error due to a reference setting error.
  • the pressing reference value is determined.
  • the setting error occurs; when the button chip detects an error in the pressing reference value, the pressing reference error interrupt is automatically reported.
  • the master chip acquires the normal capacitance value from the button chip and sets the normal capacitance value to the pressing reference value.
  • the press reference error interrupt can occur at any time.
  • the pressing reference error interrupt has the highest priority, and when receiving the pressing reference error interrupt, the master chip preferentially handles the problem of pressing the reference error interrupt.
  • the main effect of the embodiment of the present invention is that when the reference error reported by the button chip is interrupted, the button chip can automatically report an error, and reset the pressing reference according to the normal capacitance value.
  • the reset of the pressure reference can avoid the occurrence of a button state judgment error due to the reference error.
  • a fourth embodiment of the present invention relates to an update module for a button reference.
  • the present invention includes a master chip 91 and a button device 92 including a button chip 921.
  • the button chip 921 is used to generate a press break and report the press break to the master chip 91.
  • the main control chip 91 is configured to receive a compression interrupt and acquire a plurality of pressing capacitance values from the button chip 921.
  • the plurality of pressing capacitance values include a capacitance value of the button chip 921 at the time of the pressing interruption generation and a timing of the pressing of the button chip 921 at the pressing interruption. The capacitance value of the next scan time.
  • the main control chip 91 is further configured to set a release reference of the button chip 921 according to the plurality of pressing capacitance values.
  • the main improvement point and effect of the embodiment of the present invention are: after receiving the interruption of the pressing, acquiring a plurality of pressing capacity values thereafter, setting a new release reference of the button chip according to one of the plurality of pressing capacitance values, different button chips According to the capacitance value obtained by the current pressing, the release reference in the next stage can be set, which is suitable for different button chips, and the height of various parameters of the button chip is not required, and the versatility is high.
  • the release reference is dynamically updated, and the release reference is set according to the current state, so that the reference time is consistent with the external environment, and therefore, it is not interfered by the external environment, and the anti-interference ability is strong.
  • the reference is updated and the terminal gap is used for updating to avoid waste of the main control resources.
  • the present embodiment is a system embodiment corresponding to the first embodiment, and the present embodiment can be implemented in cooperation with the first embodiment.
  • Related technical details mentioned in the first embodiment In the present embodiment, it is still effective, and in order to reduce repetition, it will not be described again here. Accordingly, the related art details mentioned in the present embodiment can also be applied to the first embodiment.
  • the fifth embodiment of the present invention relates to an update module of a button reference, and the fifth embodiment is a further optimization of the fourth embodiment.
  • the main optimization is that in the fifth embodiment, for the pressing process and the releasing process,
  • the button chip respectively sets the pressing reference and the release reference, so that the button chip has different judgment criteria for pressing and releasing, and the judgment is more accurate; and the pressing reference and the release reference are updated in a similar manner, further improving the anti-interference ability of the button and avoiding the button. Received the influence of the external environment.
  • the main control chip 91 performs the function, the reference, and the threshold setting on the button chip 921 through the communication line 901. Conversely, when the button chip 921 detects that the condition set by the main control chip 91 is satisfied, it will pass the interrupt. Line 902 notifies master chip 91. In addition, the main control chip 91 can also supply power to the button device 92 through the power line 903.
  • the button chip 921 is used to generate a press interruption, and the press interrupt line 902 is reported to the main control chip 91; the main control chip 91 is configured to receive the press interrupt, and from the button The chip 921 obtains a plurality of pressing capacitance values; wherein the plurality of pressing capacitance values include a capacitance value of the button chip 921 at the time when the pressing interruption is generated and a capacitance value of the next scanning time of the button chip 921 at the time of the pressing interruption generation; the main control chip 91 It is also used to set the release reference of the button chip 921 based on a plurality of pressing capacitance values.
  • the button chip 921 is further configured to generate a release interrupt and report the release interrupt to the master chip 91; the master chip 91 is further configured to receive a release interrupt and acquire multiple from the button chip 921. And releasing the capacitance value; wherein, the plurality of release capacitor values include a capacitance value of the button chip 921 at the time when the release interrupt is generated and a capacitance value of the next scan timing of the button chip 921 at the time of releasing the release; the main control chip 91 is further configured to The release capacitor value sets the pressing reference of the button chip 91.
  • the release interrupt is generated by the button chip 921 according to the release reference and the release threshold, and is pressed.
  • the break is generated by the button chip 921 based on the pressing reference and the pressing threshold.
  • the main control chip 91 is configured to set a release reference value of the button chip 921 of the plurality of pressing capacitance values that meet the first preset condition, and select a plurality of release capacitance values that meet the second preset condition.
  • the pressing capacity value is set to the pressing reference of the button chip 921.
  • the first preset condition is a smaller one of the plurality of capacitance values
  • the second preset condition is a larger one of the plurality of capacitance values
  • the first preset condition is a comparison of the plurality of capacitance values
  • the larger, and the second preset condition is the smaller of the plurality of capacitance values. In both cases, the final result is the same.
  • the master chip 91 enters the active state from the sleep state after receiving the press interruption and before acquiring the plurality of pressing capacitance values from the button chip 921. If the master chip 91 is already in the working state before receiving the press break, the next operation is directly performed.
  • the button device 92 can be a fingerprint recognition device, and the button chip 921 can be a fingerprint chip.
  • the fingerprint chip can recognize the user information while detecting the button pressing state.
  • the main improvement point and effect of the embodiment of the present invention are: after receiving the interruption of the pressing, acquiring a plurality of pressing capacity values thereafter, setting a new release reference of the button chip according to one of the plurality of pressing capacitance values, different button chips According to the capacitance value obtained by the current pressing, the release reference in the next stage can be set, which is suitable for different button chips, and the height of various parameters of the button chip is not required, and the versatility is high.
  • the release reference is dynamically updated, and the release reference is set according to the current state, so that the reference time is consistent with the external environment, and therefore, it is not interfered by the external environment, and the anti-interference ability is strong.
  • the reference is updated and the terminal gap is used for updating to avoid waste of the main control resources.
  • the present embodiment is a system embodiment corresponding to the second embodiment, and the present embodiment can be implemented in cooperation with the second embodiment.
  • the related technical details mentioned in the second embodiment are still effective in the present embodiment, and are not described herein again in order to reduce repetition. Accordingly, the related art details mentioned in the present embodiment can also be applied to the second embodiment.
  • a sixth embodiment of the present invention relates to an update module for a key reference.
  • the fifth embodiment is substantially the same as the fourth embodiment.
  • the main difference is that, in the fifth embodiment of the present invention, when the reference error reported by the button chip is interrupted, the pressing reference can be reset according to the normal capacitance value, and the pressing is performed.
  • the reset of the reference can avoid the occurrence of a button state judgment error due to the reference error.
  • the button chip 921 is also used to generate a press reference error interrupt and report the press reference error interrupt to the master chip 91.
  • the main control chip 91 is configured to receive a press reference error interrupt and acquire a normal capacitance value from the button chip 921; wherein the normal capacitance value is a capacitance value of the button chip 921 when it is not pressed.
  • the main control chip 91 is also used to set the pressing reference according to the normal capacitance value.
  • the main improvement and effect of the embodiment of the present invention is that when the reference error reported by the button chip is interrupted, the pressing reference can be reset according to the normal capacitance value, and the reset of the pressing reference can be avoided due to the reference error.
  • the button status judges the occurrence of an error.
  • the present embodiment can be implemented in cooperation with the third embodiment.
  • the technical details mentioned in the third embodiment are still effective in the present embodiment, and the technical effects that can be achieved in the third embodiment are also implemented in the present embodiment. To reduce the repetition, details are not described herein again. Accordingly, the related art details mentioned in the present embodiment can also be applied to the third embodiment.
  • a seventh embodiment of the present invention relates to a terminal device including the update module of the key reference in the fourth embodiment or the fifth embodiment.
  • the terminal device may be an electronic device such as a smart phone, a tablet computer, or a smart watch.
  • FIG. 10 which is a schematic diagram of the whole environment of the terminal device mobile phone 1001, the finger 1002 presses the button 1003, and when the mobile phone 1001 detects that the button 1003 is pressed, the current corresponding operation is performed. And at 1003, an update module of the button reference is integrated, so that the button reference is updated during the interruption, so that the judgment of the button state is not affected by the external environment.
  • the main improvement point and effect of the embodiment of the present invention is that, on the terminal device, an update module of the button reference is integrated, and after receiving the press interruption, the button chip acquires a plurality of pressing capacitance values thereafter, according to the plurality of pressing capacitance values.
  • a release benchmark for setting a new button chip different button chips can set the release reference in the next stage according to the capacitance value obtained by the current pressing, and is suitable for different button chips, without the need for the height of various parameters of the button chip.
  • High versatility Each time after a press interruption occurs, the release reference is dynamically updated, and the release reference is set according to the current state, so that the reference time is consistent with the external environment, and therefore, it is not interfered by the external environment, and the anti-interference ability is strong. After the interruption occurs, the reference is updated and the terminal gap is used for updating to avoid waste of the main control resources.

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Abstract

一种按键基准的更新方法、模块及终端设备。所述按键基准的更新方法包括：接收按键芯片上报的按压中断（201）；从按键芯片获取多个按压电容值（202）；其中，多个按压电容值包括按键芯片在按压中断产生时刻的电容值与按键芯片在按压中断产生时刻的下一扫描时刻的电容值；根据多个按压电容值设置按键芯片的释放基准（203）。在不增加主控芯片负担的情况下，提高了按键芯片的通用性和抗干扰能力。

Description

按键基准的更新方法、模块及终端设备 技术领域
本发明实施例涉及按键识别技术领域，特别涉及一种按键基准的更新方法、模块及终端设备。
背景技术
指纹识别技术已经是当前智能手机的标准配置，并且很多厂商给指纹模组赋予了额外的功能，如单击返回，双击呼出后台应用，左右切换任务，上下呼出任务栏等等。随着指纹芯片的发展，不带微控制单元(Micro controller Unit，简称“MCU”)的指纹芯片成为主流，原先带MCU的实时更新基准的方法无法在不带MCU的指纹芯片上得到实现。
目前的指纹按键一般是根据绝对阈值来判断按键是否被按压或者松开；如图1所示，指纹按键通常采用一个绝对的基准值101与一个阈值102来判定按键状态，其中，阈值102是一个差值。在手指按压指纹按键的过程中，随着手指按压情况按键电容值将发生变化，如果基准值101与当前的按键电容值之差大于阈值102，则判断此时为按键状态105；手指向上松开过程中，如果基准值101与当前的按键电容值之差小于阈值102，则为松键状态106。
但是，上述根据绝对阈值判断指纹按键的按压状态的方式，至少存在如下问题：
(1)通用性差，不同模组的基准值不同；
(2)受温度以及外界环境影响较大；
(3)抗干扰能力较弱。
发明内容
本发明实施方式的目的在于提供一种按键基准的更新方法、模块及终端设备，在不增加主控芯片负担的情况下，提高了按键芯片的通用性和抗干扰能力。
为解决上述技术问题，本发明的实施方式提供了一种按键基准的更新方法，包括以下步骤：接收按键芯片上报的按压中断；从按键芯片获取多个按压电容值；其中，多个按压电容值包括按键芯片在按压中断产生时刻的电容值与按键芯片在按压中断产生时刻的下一扫描时刻的电容值；根据多个按压电容值设置按键芯片的释放基准。
本发明的实施方式还提供了一种按键基准的更新模块，包括：主控芯片与包括按键芯片的按键装置；当手指按压按键装置时，按键芯片用于产生按压中断并将按压中断上报至主控芯片；主控芯片用于接收按压中断，并从按键芯片获取多个按压电容值；其中，多个按压电容值包括按键芯片在按压中断产生时刻的电容值与按键芯片在按压中断产生时刻的下一扫描时刻的电容值；主控芯片还用于根据多个按压电容值设置按键芯片的释放基准。
本发明的实施方式还提供了一种终端设备，包括：包含有主控芯片与包括按键芯片的按键装置的按键基准的更新模块。
本发明实施方式相对于现有技术而言，在接收按压中断后，获取其后的多个按压电容值，根据多个按压电容值中的一个设置新的按键芯片的释放基准，不同的按键芯片，可以根据自身当前按压获取的电容值，设置下一阶段中的释放基准，适用于不同按键芯片，无需按键芯片各种参数的高度一致，通用性高。每次在发生按压中断后，动态更新释放基准，释放基准根据当前状态设定，使其基准时刻与外界环境保持一致，因此，不会受到外界环境的干扰，抗干扰能力强。且在发生中断后，才会更新基准，利用终端间隙进行 更新，避免主控资源的浪费。
另外，接收按键芯片上报的释放中断；从按键芯片获取多个释放电容值；其中，多个释放电容值包括按键芯片在释放中断产生时刻的电容值与按键芯片在释放中断产生时刻的下一扫描时刻的电容值；根据多个释放电容值设置按键芯片的按压基准。本实施例中，针对按压过程和释放过程，对按键芯片分别设置按压基准和释放基准，即使得按键芯片对按压和释放具有不同的判断基准，判断更加准确；且按压基准和释放基准的更新方式类似，进一步的提高按键的抗干扰能力，避免按键收到外界环境的影响。
另外，在根据多个按压电容值设置按键芯片的释放基准中，具体包括：将多个按压电容值中符合第一预设条件的按压电容值设置为按键芯片的释放基准；在根据多个释放电容值设置按键芯片的释放基准中，具体包括：将多个释放电容值中符合第二预设条件的释放电容值设置为按键芯片的按压基准。本实施方式提供了释放基准和按压基准的一种实现方式。
另外，第一预设条件为多个按压电容值中的最小者，而第二预设条件为多个释放电容值中的最大者。或者，第一预设条件为多个按压电容值中的最大者，而第二预设条件为多个释放电容值中的最小者。本实施方式提供了第一预设条件与第二预设条件的两种不同的设定方式。
另外，按键基准的更新方法还包括：接收按键芯片上报的按压基准错误中断；从按键芯片获取常态电容值；常态电容值为按键芯片未被按压时的电容值；根据常态电容值设置按压基准。当按压基准错误时，按键芯片可以自动上报。
附图说明
一个或多个实施例通过与之对应的附图中的图片进行示例性说明，这些示例性说明并不构成对实施例的限定，附图中具有相同参考数字标号的元件 表示为类似的元件，除非有特别申明，附图中的图不构成比例限制。
图1是根据本发明现有技术基于绝对阈值的按键状态判断过程示意图；
图2是根据本发明第一实施方式的一种按键基准的更新方法的流程图；
图3是根据本发明第一实施方式的一种按压按键的过程示意图；
图4是根据本发明第二实施方式的一种按键基准的更新方法的流程图；
图5是根据本发明第二实施方式的电容值随按键被按压而变小的情况下按压及松开按键的过程的示意图；
图6是根据本发明第二实施方式的电容值随按键被按压而变大的情况下外界环境变化时按压及松开按键的过程的示意图；
图7是根据本发明第二实施方式的电容值随按键被按压而变大的情况下按压及松开按键的过程的示意图；
图8是根据本发明第二实施方式的电容值随按键被按压而变大的情况下外界环境变化时按压及松开按键的过程的示意图；
图9是根据本发明第四实施方式的一种按键基准的更新模块示意图；
图10是根据本发明第七实施方式的一种终端设备的结构示意图。
具体实施方式
为使本发明实施例的目的、技术方案和优点更加清楚，下面将结合附图对本发明的各实施方式进行详细的阐述。然而，本领域的普通技术人员可以理解，在本发明各实施方式中，为了使读者更好地理解本申请而提出了许多技术细节。但是，即使没有这些技术细节和基于以下各实施方式的种种变化和修改，也可以实现本申请所要求保护的技术方案。
本发明的第一实施方式涉及一种按键基准的更新方法。具体流程如图2 所示，包括：
步骤201：接收按键芯片上报的按压中断。
具体的说，在按键被按压到一定程度时，按键芯片就会产生按压中断，并向主控芯片上报产生的按压中断。按键可以是指纹按键，其中，按压中断由按键芯片根据按压基准与按压阈值产生。按压基准为按键处于未被按压状态时的按键芯片自身的电容值，其表示不同按键芯片自身的电容特性值。
进一步的说，按压基准在当次按压按键操作前是已知的，此外，每次按压按键操作过程中，对应的按压基准可以是不同的，因此按压基准是可以更新的。按压电容值是指：在手指按压过程中，按键芯片自身的电容值。在没有手指或其他杂物按压在按键上时，对于随着按键被按压，按压电容值逐渐减小的情况而言，此时，按压基准为按键芯片自身的最大的电容值。
本实施例中，按压阈值可以理解为：为按压电容值与按压基准的差值设定的一个门限值，按压阈值可以提前进行设定，其可以为手指稳定按压后，按键芯片的电容值的变化量的1/3；由于不同按键芯片的电容特性值不同，按压阈值也可以取手指稳定按压后，按键芯片的电容值的变化量的1/2。在已知当次按压前的按压基准和设定的按压阈值后，在按压按键过程中，获取到的按压电容值逐渐减小；若当前的按压电容值与按压基准之间的差值达到按压阈值时，则产生按压中断，由按键芯片上报按压中断。
在实际应用中，如果按键一段时间内均未被触发，主控芯片在未接收中断前处于睡眠状态，则在接收到按键芯片上报的按键中断后，会被唤醒至工作状态，然后进入步骤202；反之，如果主控芯片在未接收中断前已经处于工作状态，则直接进入步骤202中。
步骤202：从按键芯片获取多个按压电容值。
具体的说，多个按压电容值包括按键芯片在按压中断产生时刻的电容值与按键芯片在按压中断产生时刻的下一扫描时刻的电容值，其中，获取到的 下一扫描时刻的电容值小于按压中断产生时刻获取的电容值。在触发按压中断后，手指还未完全按压下去，随着手指的继续按压，按键的电容值可能还会逐渐的减小，这就需要获取发生中断后下一刻的电容值，通过对两个电容值的比较，得到较小的按压电容值。
需要说明的是，按键芯片也可以每间隔一段时间，对自身进行一次扫描，获取到多个按键芯片的电容值，即可以在多个时间点(扫描时刻)，获取按键芯片的多个电容值，并保存在按键芯片内。主控芯片通过与按键芯片通信，获取按键芯片保存的多个扫描时刻的电容值，主控芯片可以通过多次访问按键芯片分别获取多个扫描时刻的按压电容值；此外，主控芯片也可以通过一次访问，同时获取按键芯片保存的多个扫描时刻的按压电容值。
步骤203：根据多个按压电容值设置按键芯片的释放基准。
具体的说，根据步骤202中获取的多个按压电容值，从中选取一个较小的按压电容值，将其设置为按键芯片的释放基准，用于手指抬起时，按键状态判断的一个依据。
下面以手指对按键逐渐进行按压的过程，进行具体说明，其示意图，如图3所示。
在没有手指按下的情况下，按压基准处于最大值300，当手指按下的变化量超过预设的按压阈值301时，按键芯片上报按压中断(即图中标“1”处)；随后，手指继续按压，在手指继续按压过程中(即图中标“1”至“2”之间)，可以通过多个扫描时刻，获取多个电容值，选出其中较小的按压电容值(即图中标“2”处)作为按键芯片的释放基准302。
本发明实施方式的主要改进点及效果在于：在接收按压中断后，获取其后的多个按压电容值，根据多个按压电容值中的一个设置按键芯片的新的释放基准，不同的按键芯片，可以根据自身当前按压获取的电容值，设置下一阶段中的释放基准，适用于不同按键芯片，无需按键芯片各种参数的高度一 致，通用性高。每次在发生按压中断后，动态更新释放基准，释放基准根据当前状态设定，使其基准时刻与外界环境保持一致，因此，不会受到外界环境的干扰，抗干扰能力强。且本实施方式中按键基准的更新在主控芯片由于按压中断(现有的中断功能)被唤醒后，充分利用主控芯片的数据余量实现的，因此并不增加主控芯片的额外负担。
本发明的第二实施方式涉及一种按键基准的更新方法。具体流程如图4所示。
步骤401：接收按键芯片上报的按压中断。步骤402：从按键芯片获取多个按压电容值。
其中，步骤401、402与步骤201、202完全一致，具体可以参照上面实施例的描述。
步骤403：将多个按压电容值中符合第一预设条件的按压电容值设置为按键芯片的释放基准。
具体的说，本实施例中，第一预设条件为多个电容值中较小者。对步骤402中获取到的多个按压电容值依次进行比较判断，比如可以将在中断产生时刻获取到的电容值作为一个初始的电容值，并将下一时刻获取的按压电容值与该初始的电容值进行比较，记录下较小的一个电容值；并且在进行比较前，预设一个初始为零的计数值，记录比较次数，在每次比较完成后，自动将该计数值加一，直至该计数值大小等于按压电容值个数减一。此时获取到的电容值便为多个按压电容值中符合第一预设条件的按压电容值，即是多个按压电容值中较小的一个，将该符合第一预设条件的按压电容值设置为按键芯片的释放基准。
需要说明的是，第一预设条件也可以为多个电容值中较大者，其判断方法，与上述描述一致。
步骤404：接收按键芯片上报的释放中断。
具体的说，当手指完成按键按压之后需要对按键进行释放，释放按键到一定位置，按键芯片就会产生释放中断，并向主控芯片上报产生的释放中断。其中，释放中断由按键芯片根据释放基准与释放阈值产生。即，手指释放按键到一定位置时，获取按键芯片的释放电容值；若释放电容值与释放基准之间的差值超过释放阈值，就触发释放中断。其中，释放电容值是指：在手指释放过程中，按键芯片自身的电容值。
步骤405：从按键芯片获取多个释放电容值。
具体的说，多个释放电容值包括按键芯片在释放中断产生时刻的电容值与按键芯片在释放中断产生时刻的下一扫描时刻的电容值。随着手指的继续释放，获取到的下一扫描时刻的电容值大于释放中断产生时刻获取的电容值。
需要说明的是，也可以每间隔一段时间，对按键芯片进行一次扫描，获取到多个按键芯片的电容值，即可以在多个时间点(扫描时刻)分别获取多个按键芯片电容值。主控芯片获取多个扫描时刻的电容值，可以通过多次访问按键芯片分别获取多个扫描时刻的电容值；此外，主控芯片也可以通过一次访问，同时获取多个扫描时刻的按压电容值。
步骤406：将多个释放电容值中符合第二预设条件的释放电容值设置为按键芯片的按压基准。
具体的说，如果步骤403中，第一预设条件为多个电容值中较小者，则本步骤中，第二预设条件则为多个电容值中较大者。其比较方法与步骤403中的比较方法类似；本步骤中，对两个电容值进行比较，记录下较大的一个电容值，将其设置为按键芯片的按压基准。
需要说明的是，如果步骤403中的第一预设条件为多个电容值中较小者，则对应的，本步骤中的第二预设条件为多个电容值中较大者。
需要说明的是，步骤401至403与步骤404至406之间，没有严格的逻辑先后关系，可以先执行步骤401至403中的操作，也可以先执行步骤404 至406中的操作，执行步骤的先后顺序，对结果没有任何影响。
下面以无外界因素干扰下，按压及松开按键的过程，进行具体说明，其示意图，如图5所示。
在没有手指按下的情况下，按压基准处于最大值500，并预设按压阈值501和释放阈值503，当手指按下后，按压基准与按压电容值的差值超过按压阈值501的时，按键芯片上报按压中断(即图中标“1”处)。随后，手指继续按压，当手指完全按压下去时(即图中标“2”处)；此时将在此按压过程中获取的最小的按压电容值作为释放基准502。待手指逐渐离开按键芯片时，按键芯片自身的电容值逐渐增大，在手指释放过程中，当检测到的释放电容值与释放基准502之差等于或大于释放阈值503时，触发释放中断(即图中标“3”处)，按键芯片向主控芯片上报释放中断。手指继续松开按键(即释放按键)，到达接近按键正常状态时(即图中标“4”处)，此时将在此释放过程中获取的按键芯片的最大的释放电容值作为按压基准504。当手指完全离开按键后，按键的基准值重新回到最高点。其中，最高点504与按压基准最大值500可能不相同。
此外，需要说明的是，释放基准502与手指完全按压下去时得到的基准值基本一致，由于获取的多个按压电容值是在不同扫描时刻获取到的，每个扫描时刻之间，存在一定的时间间隔，因此，可能扫描时刻没有在按压电容值处于实际的最低时刻，因此，只需得到多个电容值中较小的一个，则该电容值是最接近手指完全按压下去时的按键芯片的电容值，可以认为两个电容值的大小基本一致。
当外界环境发生变化时，如图6所示，为按压及松开按键的过程的示意图：
在外界环境发生变化的时候(即图中标“4”处)，如残留水或者汗液在按键上，按键的按压基准无法回到最高点，如果采用现有的绝对基准的方 法，可能出现判断出无法松键的情况。本实施方式提供的动态基准的方法设置了与按压基准不同的释放基准，用户按压超过按键芯片得的按压阈值501，同样可以触发按键按压中断(即图中标“5”处)，之后，重复与之前按键相同的过程；在手指远离按键时，按键芯片的电容值从底部605逐渐增大，直至电容值的增大量达到释放阈值503时，就可以触发释放中断(即图中标“7”处)。
此外，本实施方式，同样适用于手指按压按键，按压电容逐渐增大的情况，下面对该种情况下的按压及松开按键的过程，进行具体说明，其示意图，如图7所示。
在没有手指按下的情况下，按压基准处于最小值701，并且预先设置按压阈值702和释放阈值704，当手指按下后，按压基准与按压电容值的差值超过按键芯片的按压阈值702时，按键芯片触发按压中断并上报给主控芯片(即图中标“1”处)。随后，手指继续按压，当手指完全按压下去时(即图中标“2”处)；此时将在此按压过程中获取的最大的按压电容作为释放基准703。待手指逐渐离开按键芯片时，按键芯片的电容值逐渐减小，在当前的释放电容值与释放基准之和等于或小于释放阈值704时，触发释放中断(即图中标“3”处)，按键芯片向主控芯片上报释放中断。手指继续松开按键，到达接近按键正常状态时(即图中标“4”处)，此时将在此过程中获取的最小释放电容值作为按压基准705。待手指完全离开按键后，按键的基准值重新回到最低点705。其中，最低点705与按压基准最大值701可能不相同。
当手指按压按键，按压电容值逐渐增大的情况下，外界环境发生变化时，如图8所示，为按压及松开按键的过程的示意图：
在外界环境温度发生变化时，按键的本身存在一定的偏移量，本实施方式中所提出的方法可以很好的适应环境温度的影响。如温度升高(或者降低)时，按压基准从最低点701升高到较高点705，此时用户在按压过程中，可 以更新到正确的按压基准705，并检测变化按压阈值702来触发按键的按压中断(即图中标“5”处)及其后的释放中断(即图中标“7”处)。
本发明实施方式的主要技术效果在于：在接收按压中断后，获取其后的多个按压电容值，根据多个按压电容值中的一个设置按键芯片的新的释放基准，不同的按键芯片，可以根据按键被按压后获取的按压电容值，设置下一阶段中的释放基准，适用于不同按键芯片，无需按键芯片各种参数的高度一致，通用性高。每次在发生按压中断后，动态更新释放基准，释放基准根据当前状态设定，使其基准时刻与外界环境保持一致，因此，不会受到外界环境的干扰，抗干扰能力强。且在发生中断后，才会更新基准，利用终端间隙进行更新，避免主控资源的浪费。
本发明的第三实施方式涉及一种按键基准的更新方法。第三实施方式与第一实施方式大体一致，主要区别之处在于：在本发明第三实施方式中，按键芯片可以自动上报错误，根据常态电容值重新设置按压基准，对按压基准进行的重置，可以避免由于基准设置错误，而导致的按键状态判断错误的发生。
本实施方式中，在已经设置新的按压基准后，若在手指未按压的情况下，相同情况下，再次检测到的常态电容值按压基准值与设置的按压基准值不同，则判定按压基准值设置出现错误；在按键芯片检测到按压基准值出现错误的时候，自动上报按压基准错误中断。主控芯片会从按键芯片获取常态电容值，并将该常态电容值设置为按压基准值。
其中，按压基准错误中断可以发生在任意时刻。该按压基准错误中断的优先级最高，在接收到按压基准错误中断时，主控芯片优先处理按压基准错误中断的问题。
本发明实施方式的主要效果在于：收到按键芯片上报的基准错误中断时，按键芯片可以自动上报错误，根据常态电容值重新设置按压基准，对按 压基准进行的重置，可以避免由于基准错误，而导致的按键状态判断错误的发生。
上面各种方法的步骤划分，只是为了描述清楚，实现时可以合并为一个步骤或者对某些步骤进行拆分，分解为多个步骤，只要包括相同的逻辑关系，都在本专利的保护范围内；对算法中或者流程中添加无关紧要的修改或者引入无关紧要的设计，但不改变其算法和流程的核心设计都在该专利的保护范围内。
本发明第四实施方式涉及一种按键基准的更新模块，如图9所示，包括：主控芯片91与包括按键芯片921的按键装置92。
当手指按压按键装置92时，按键芯片921用于产生按压中断并将按压中断上报至主控芯片91。
主控芯片91用于接收按压中断，并从按键芯片921获取多个按压电容值；其中，多个按压电容值包括按键芯片921在按压中断产生时刻的电容值与按键芯片921在按压中断产生时刻的下一扫描时刻的电容值。
主控芯片91还用于根据多个按压电容值设置按键芯片921的释放基准。
本发明实施方式的主要改进点及效果在于：在接收按压中断后，获取其后的多个按压电容值，根据多个按压电容值中的一个设置按键芯片的新的释放基准，不同的按键芯片，可以根据自身当前按压获取的电容值，设置下一阶段中的释放基准，适用于不同按键芯片，无需按键芯片各种参数的高度一致，通用性高。每次在发生按压中断后，动态更新释放基准，释放基准根据当前状态设定，使其基准时刻与外界环境保持一致，因此，不会受到外界环境的干扰，抗干扰能力强。且在发生中断后，才会更新基准，利用终端间隙进行更新，避免主控资源的浪费。
不难发现，本实施方式为与第一实施方式相对应的系统实施例，本实施方式可与第一实施方式互相配合实施。第一实施方式中提到的相关技术细节 在本实施方式中依然有效，为了减少重复，这里不再赘述。相应地，本实施方式中提到的相关技术细节也可应用在第一实施方式中。
本发明第五实施方式涉及一种按键基准的更新模块，第五实施方式是第四实施方式的进一步优化，主要优化之处在于：在本第五实施方式中，针对按压过程和释放过程，对按键芯片分别设置按压基准和释放基准，即使得按键芯片对按压和释放具有不同的判断基准，判断更加准确；且按压基准和释放基准的更新方式类似，进一步的提高按键的抗干扰能力，避免按键收到外界环境的影响。
具体的说，主控芯片91通过通信线901来对按键芯片921进行功能和基准、阈值的设置，反过来，按键芯片921检测到主控芯片91设定的条件满足时，便会通过中断线902通知主控芯片91。此外，主控芯片91还可以通过电源线903，为按键装置92提供能源。
更具体地说，当手指按压按键装置92时，按键芯片921用于产生按压中断，并将按压中断线902通过上报至主控芯片91；主控芯片91用于接收按压中断，并从按键芯片921获取多个按压电容值；其中，多个按压电容值包括按键芯片921在按压中断产生时刻的电容值与按键芯片921在按压中断产生时刻的下一扫描时刻的电容值；主控芯片91还用于根据多个按压电容值设置按键芯片921的释放基准。
此外，当手指从按键装置92释放时，按键芯片921还用于产生释放中断并将释放中断上报至主控芯片91；主控芯片91还用于接收释放中断，并从按键芯片921获取多个释放电容值；其中，多个释放电容值包括按键芯片921在释放中断产生时刻的电容值与按键芯片921在释放中断产生时刻的下一扫描时刻的电容值；主控芯片91还用于根据多个释放电容值设置按键芯片91的按压基准。
其中，释放中断由按键芯片921根据释放基准与释放阈值产生，按压中 断由按键芯片921根据按压基准与按压阈值产生。
进一步的说，主控芯片91用于将多个按压电容值中符合第一预设条件的按压电容值设置按键芯片921的释放基准，且将多个释放电容值中符合第二预设条件的按压电容值设置按键芯片921的按压基准。
其中，第一预设条件为多个电容值中的较小者，而第二预设条件为多个电容值中的较大者；或者，第一预设条件为多个电容值中的较大者，而第二预设条件为多个电容值中的较小者。以上两种情况，且达到的最终效果是一样的。
此外，主控芯片91在接收按压中断之后，且在从按键芯片921获取多个按压电容值之前，还从睡眠状态进入工作状态。如果主控芯片91在接收按压中断之前，已经处于工作状态，则直接进行接下来的操作。
在实际应用中，按键装置92可以为指纹识别装置，按键芯片921可以为指纹芯片。指纹芯片可以在检测按键按压状态同时，识别用户信息。
本发明实施方式的主要改进点及效果在于：在接收按压中断后，获取其后的多个按压电容值，根据多个按压电容值中的一个设置按键芯片的新的释放基准，不同的按键芯片，可以根据自身当前按压获取的电容值，设置下一阶段中的释放基准，适用于不同按键芯片，无需按键芯片各种参数的高度一致，通用性高。每次在发生按压中断后，动态更新释放基准，释放基准根据当前状态设定，使其基准时刻与外界环境保持一致，因此，不会受到外界环境的干扰，抗干扰能力强。且在发生中断后，才会更新基准，利用终端间隙进行更新，避免主控资源的浪费。
不难发现，本实施方式为与第二实施方式相对应的系统实施例，本实施方式可与第二实施方式互相配合实施。第二实施方式中提到的相关技术细节在本实施方式中依然有效，为了减少重复，这里不再赘述。相应地，本实施方式中提到的相关技术细节也可应用在第二实施方式中。
本发明第六实施方式涉及一种按键基准的更新模块。第五实施方式与第四实施方式大致相同，主要区别之处在于：在本发明第五实施方式中，收到按键芯片上报的基准错误中断时，可以根据常态电容值重新设置按压基准，对按压基准进行的重置，可以避免由于基准错误，而导致的按键状态判断错误的发生。
按键芯片921还用于产生按压基准错误中断并将按压基准错误中断上报至主控芯片91。
主控芯片91用于接收按压基准错误中断，并从按键芯片921获取常态电容值；其中，常态电容值为按键芯片921在未按压状态时的电容值。
主控芯片91还用于根据常态电容值设置按压基准。
本发明实施方式的主要改进点及效果在于：收到按键芯片上报的基准错误中断时，可以根据常态电容值重新设置按压基准，对按压基准进行的重置，可以避免由于基准错误，而导致的按键状态判断错误的发生。
由于第三实施方式与本实施方式相互对应，因此本实施方式可与第三实施方式互相配合实施。第三实施方式中提到的相关技术细节在本实施方式中依然有效，在第三实施方式中所能达到的技术效果在本实施方式中也同样可以实现，为了减少重复，这里不再赘述。相应地，本实施方式中提到的相关技术细节也可应用在第三实施方式中。
本发明第七实施方式涉及一种终端设备，包括：第四实施方式或第五实施方式中的按键基准的更新模块。
其中，终端设备可以为智能手机、平板电脑、智能手表等电子设备。如图10所示，为终端设备手机1001的整机环境示意图，手指1002通过对按键1003进行按压，在手机1001检测到按键1003被按压时，执行当前相应的操作。且在1003上，集成了按键基准的更新模块，使得在中断间歇对按键基准进行更新，从而，按键状态的判断不会受到外界环境的影响。
本发明实施方式的主要改进点及效果在于：在终端设备上，集成按键基准的更新模块，按键芯片在接收按压中断后，获取其后的多个按压电容值，根据多个按压电容值中的一个设置新的按键芯片的释放基准，不同的按键芯片，可以根据自身当前按压获取的电容值，设置下一阶段中的释放基准，适用于不同按键芯片，无需按键芯片各种参数的高度一致，通用性高。每次在发生按压中断后，动态更新释放基准，释放基准根据当前状态设定，使其基准时刻与外界环境保持一致，因此，不会受到外界环境的干扰，抗干扰能力强。且在发生中断后，才会更新基准，利用终端间隙进行更新，避免主控资源的浪费。
本领域的普通技术人员可以理解，上述各实施方式是实现本发明的具体实施例，而在实际应用中，可以在形式上和细节上对其作各种改变，而不偏离本发明的精神和范围。

Claims (17)

  1. 一种按键基准的更新方法，其特征在于，包括：
    接收按键芯片上报的按压中断；
    从所述按键芯片获取多个按压电容值；其中，所述多个按压电容值包括所述按键芯片在所述按压中断产生时刻的电容值与所述按键芯片在所述按压中断产生时刻的下一扫描时刻的电容值；
    根据所述多个按压电容值设置所述按键芯片的释放基准。
  2. 根据权利要求1所述的按键基准的更新方法，其特征在于，还包括：
    接收所述按键芯片上报的释放中断；
    从所述按键芯片获取多个释放电容值；其中，所述多个释放电容值包括所述按键芯片在所述释放中断产生时刻的电容值与所述按键芯片在所述释放中断产生时刻的下一扫描时刻的电容值；
    根据所述多个释放电容值设置所述按键芯片的按压基准。
  3. 根据权利要求2所述的按键基准的更新方法，其特征在于，
    所述根据多个按压电容值设置所述按键芯片的释放基准包括：将所述多个按压电容值中符合第一预设条件的按压电容值设置为所述按键芯片的释放基准；
    所述根据多个释放电容值设置所述按键芯片的按压基准包括：将所述多个释放电容值中符合第二预设条件的释放电容值设置为所述按键芯片的按压基准。
  4. 根据权利要求3所述的按键基准的更新方法，其特征在于，
    所述第一预设条件为所述多个按压电容值中的最小者，而所述第二预设条件为所述多个释放电容值中的最大者。
  5. 根据权利要求3所述的按键基准的更新方法，其特征在于，
    所述第一预设条件为所述多个按压电容值中的最大者，而所述第二预设条件为所述多个释放电容值中的最小者。
  6. 根据权利要求2所述的按键基准的更新方法，其特征在于，所述释放中断由所述按键芯片根据所述释放基准与释放阈值产生，所述按压中断由所述按键芯片根据所述按压基准与按压阈值产生。
  7. 根据权利要求1所述的按键基准的更新方法，其特征在于，所述按键基准的更新方法还包括：
    接收按键芯片上报的按压基准错误中断；
    从所述按键芯片获取常态电容值，所述常态电容值为所述按键芯片未被按压时的电容值；
    根据所述常态电容值设置所述按压基准。
  8. 一种按键基准的更新模块，其特征在于，包括：主控芯片与包括按键芯片的按键装置；
    当手指按压所述按键装置时，所述按键芯片用于产生按压中断并将所述按压中断上报至所述主控芯片；
    所述主控芯片用于接收所述按压中断，并从所述按键芯片获取多个按压电容值；其中，所述多个按压电容值包括所述按键芯片在所述按压中断产生时刻的电容值与所述按键芯片在所述按压中断产生时刻的下一扫描时刻的电容值；
    所述主控芯片还用于根据所述多个按压电容值设置所述按键芯片的释放基准。
  9. 根据权利要求8所述的按键基准的更新模块，其特征在于，
    当手指从所述按键装置释放时，所述按键芯片还用于产生释放中断并将 所述释放中断上报至所述主控芯片；
    所述主控芯片还用于接收所述释放中断，并从所述按键芯片获取多个释放电容值；其中，所述多个释放电容值包括所述按键芯片在所述释放中断产生时刻的电容值与所述按键芯片在所述释放中断产生时刻的下一扫描时刻的电容值；
    所述主控芯片还用于根据所述多个释放电容值设置所述按键芯片的按压基准。
  10. 根据权利要求9所述的按键基准的更新模块，其特征在于，所述主控芯片用于将所述多个按压电容值中符合第一预设条件的按压电容值设置所述按键芯片的释放基准，且将所述多个释放电容值中符合第二预设条件的按压电容值设置所述按键芯片的按压基准。
  11. 根据权利要求10所述的按键基准的更新模块，其特征在于，
    所述第一预设条件为所述多个按压电容值中的最小者，而所述第二预设条件为所述多个释放电容值中的最大者。
  12. 根据权利要求10所述的按键基准的更新模块，其特征在于，
    所述第一预设条件为所述多个按压电容值中的最大者，而所述第二预设条件为所述多个释放电容值中的最小者。
  13. 根据权利要求9所述的按键基准的更新模块，其特征在于，所述释放中断由所述按键芯片根据所述释放基准与释放阈值产生，所述按压中断由所述按键芯片根据所述按压基准与按压阈值产生。
  14. 根据权利要求8所述的按键基准的更新模块，其特征在于，所述主控芯片在接收所述按压中断之后，且在从所述按键芯片获取多个按压电容值之前，还从睡眠状态进入工作状态。
  15. 根据权利要求6所述的按键基准的更新模块，其特征在于，
    所述按键芯片还用于产生按压基准错误中断并将所述按压基准错误中断上报至所述主控芯片；
    所述主控芯片用于接收所述按压基准错误中断，并从所述按键芯片获取常态电容值；其中，所述常态电容值为所述按键芯片在未按压状态时的电容值；
    所述主控芯片还用于根据所述常态电容值设置所述按压基准。
  16. 根据权利要求8所述的按键基准的更新模块，其特征在于，所述按键装置为指纹识别装置，所述按键芯片为指纹芯片。
  17. 一种终端设备，其特征在于，包括：权利要求8至16中任一项所述的按键基准的更新模块。
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