WO2018060234A1 - Self referencing quantitative phase microscope using lateral shearing geometry - Google Patents
Self referencing quantitative phase microscope using lateral shearing geometry Download PDFInfo
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- WO2018060234A1 WO2018060234A1 PCT/EP2017/074474 EP2017074474W WO2018060234A1 WO 2018060234 A1 WO2018060234 A1 WO 2018060234A1 EP 2017074474 W EP2017074474 W EP 2017074474W WO 2018060234 A1 WO2018060234 A1 WO 2018060234A1
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- 238000010008 shearing Methods 0.000 title description 5
- 238000002135 phase contrast microscopy Methods 0.000 claims abstract description 64
- 238000000034 method Methods 0.000 claims abstract description 31
- 239000011521 glass Substances 0.000 claims abstract description 18
- 230000001131 transforming effect Effects 0.000 claims abstract description 5
- 230000002452 interceptive effect Effects 0.000 claims abstract 2
- 238000003384 imaging method Methods 0.000 claims description 12
- 238000001914 filtration Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 description 61
- 238000000399 optical microscopy Methods 0.000 description 7
- 230000003287 optical effect Effects 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 4
- 230000009466 transformation Effects 0.000 description 4
- 238000000339 bright-field microscopy Methods 0.000 description 3
- 238000000386 microscopy Methods 0.000 description 3
- 230000002123 temporal effect Effects 0.000 description 3
- 239000013043 chemical agent Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000002835 absorbance Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000004630 atomic force microscopy Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- -1 imperfections Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000004626 scanning electron microscopy Methods 0.000 description 1
- 238000004574 scanning tunneling microscopy Methods 0.000 description 1
- 238000003963 x-ray microscopy Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
- G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
- G03H1/04—Processes or apparatus for producing holograms
- G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/14—Condensers affording illumination for phase-contrast observation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
- G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
- G03H1/04—Processes or apparatus for producing holograms
- G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
- G03H2001/0445—Off-axis recording arrangement
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
- G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
- G03H1/04—Processes or apparatus for producing holograms
- G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
- G03H2001/045—Fourier or lensless Fourier arrangement
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
- G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
- G03H1/04—Processes or apparatus for producing holograms
- G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
- G03H2001/0454—Arrangement for recovering hologram complex amplitude
- G03H2001/0456—Spatial heterodyne, i.e. filtering a Fourier transform of the off-axis record
Abstract
A method and setup for phase contrast microscopy is disclosed in the present invention. The improved phase contrast microscopy setup comprises a glass plate (110) for generating two reflected beams (114A,114B,116A,116B) from one sample beam, lenses (202,204) for producing two transformed beams (214A,214B) from the two reflected beams, a spatial filter (206) for producing a clean reference beam (216) from one of the transformed beams whilst the other transformed beam is left unmodified as the final sample beam (220), and a lens (208) for inverse Fourier transforming the reference and final sample beams and at least one sensor (112) for obtaining at least one fringe pattern distribution of the sample from the interfering beams.
Description
Description
SELF REFERENCING QUANTITATIVE PHASE MICROSCOPE USING LATERAL
SHEARING GEOMETRY
The present invention relates to a system and method for improved phase contrast microscopy and more particularly, to a system and method for full-field single beam phase contrast microscopy for complete cell analysis.
A detailed examination of minute objects by means of an instrument, known as microscope, which provides an enlarged image of the minute objects for analysis is known as
microscopy. Various techniques of microscopy are known in the state of the art includes, but not limited to, optical microscopy, X-ray microscopy, scanning electron microscopy, scanning tunnelling microscopy and atomic force microscopy. Optical microscopy is one of the oldest and simplest of all the microscopy techniques. An optical microscope, also known as light microscope, is used for optical microscopy. The optical microscope uses visible light and an arrangement of lenses to magnify images of small objects and/or samples. The optical microscopy technique is extensively used in the fields of microelectronics, nanophysics, biotechnology, pharmaceutics research, mineralogy and microbiology.
Bright-field microscopy is a well known and most commonly used optical microscopy technique. In the bright-field microscopy, a sample is illuminated, by using a broadband light source. The sample transmits white light and contrast of the sample is caused by absorbance of some of the light in dense areas of the sample. But the bright-field microscopy provides only low contrast intensity images, due to low absorption cross section for visible radiation by samples, specifically when the samples are living cells. The contrast may be improved by using chemical agents, however, it may terminate the life cycle of the cells. Also bright field
microscopes do not provide any information on the thickness profile of the cells.
To improve the contrast of the sample images, without using chemical agents in case of the living cells, another optical microscopy technique is used which is commonly known as phase contrast technique. The phase contrast microscopy is an optical microscopy technique in which the differences in phase of the light transmitted through or reflected by the samples are translated into differences of intensity of the sample images. From the phase of the light transmitted through or reflected by the samples, the thickness profile of the samples can also be extracted and the technique is categorized under quantitative phase contrast microscopy (QPM) . The phase of the light transmitted through or
reflected by a sample gets modified because of the spatially varying optical thickness of the sample which leads to the reconstruction of the thickness profile of the sample from the phase information.
Interference techniques are commonly used for quantitative phase contrast microscopy. In interference techniques, a probe beam, interacting with a sample, is superposed with a reference wavefront to produce a spatially varying intensity profile of the sample. The intensity profile, i.e. an
interference fringe pattern, contains the phase information of the probe wavefront. The interference fringes can be recorded on pixilated semiconductor arrays such as, but not limited to, charged coupled devices (CCD) and complementary metal oxide semiconductor (CMOS) which in turn leads to a digital version of quantitative phase contrast microscopy. The interference fringes are then analyzed numerically for extracting the quantitative information about the sample under investigation.
Usually for quantitative phase contrast microscopy two-beam geometry is employed in which a probe beam interferes with a separate reference beam, as explained above. The two beams
i.e. the probe beam and the reference beam, travel along different paths and due to uncorrelated path length changes, the setup leads to lower temporal stability. In addition to it, the two-beam setup requires use of many optical
components for beam manipulation. To overcome the problems associated with the two-beam setup a self-referencing
geometry can be employed for the quantitative phase contrast microscopy . In self-referencing quantitative phase contrast microscopy, a portion of the sample beam i.e. the probe beam after
interacting with the sample, acts as reference beam. Hence the sample beam and the reference have a common path of propagation which leads to a higher temporal stability in comparison to the two-beam quantitative phase contrast microscopy. Also, the number of optical components used in self-referencing quantitative phase contrast microscopy setup is less in comparison to the two-beam quantitative phase contrast microscopy setup.
FIG 1 illustrates a self-referencing quantitative phase contrast microscopy setup 100 in accordance with the state of the art. The self-referencing quantitative phase contrast microscopy setup 100 comprises a light module 102, an object platform 104, an imaging lens 108, a glass plate 110 and a sensor 112. A sample 106, for the analysis, is placed on the object platform 104 of the self-referencing setup 100 as shown in FIG 1. A light source, not shown in FIG 1, of the light module 102 illuminates the sample 106 placed on the object platform 104. The beam that is originated from the light source of the light module 102 and is transmitted through the sample 106 is subsequently magnified by the imaging lens 108, as illustrated in FIG 1. The magnified beam reflects from the glass plate 110. The self-referencing quantitative phase contrast microscopy setup 100, illustrated in FIG 1, employs a lateral shearing configuration and the glass plate 110 of the self-referencing setup 100 is a shear plate for the lateral shearing configuration. The glass plate
110 has two planes i.e. a back surface 110A and a front surface HOB, as shown in FIG 1. Both the surfaces 110A, HOB of the class plate 110 reflect the magnified beam as
demonstrated FIG 1. The back surface 110A of the glass plate 110 reflects the magnified beam received from the imaging lens 108, a back surface reflected light section is covered between back surface reflected beams 114A and 114B as
illustrated in FIG 1. Similarly, the front surface HOB of the glass plate 110 reflects the magnified beam received from the imaging lens 108, a front surface reflected light section is covered between front surface reflected beams 116A and 116B also as illustrated in FIG 1. Interference occurs between a portion of the beam that is reflected from the back surface 110A and the front surface HOB of the glass plate 110. Interference fringes 118 arises because of the
superposition of back surface reflected beam 114A and the front surface reflected beam 116B as illustrated in FIG 1. The interference fringes 118 are captured by the sensor 112 for digitalization and further quantitative analysis. A major drawback of using this self-referencing quantitative phase contrast microscopy setup 100 illustrated in FIG 1 is that some background information about the sample is carried by the reference beam reducing the SNR. Also only half of the field view contains useful information.
From the above mentioned drawbacks associated with the lateral shearing self-referencing quantitative phase contrast microscopy setup in accordance to the state of the art, it is clearly evident that there is a strong need of an improved system and method for self-referencing quantitative phase contrast microscopy which is capable of providing a full field of view for a sample, while improving the SNR.
It is therefore an object of the present invention to provide an improved system and method for self-referencing
quantitative phase contrast microscopy.
The object is achieved by providing an improved method for phase contrast microscopy according to claim 1 and an
improved phase contrast microscopy setup according to claim 9. Further embodiments of the present invention are addressed in the dependent claims.
In a first aspect of the present invention, an improved method for phase contrast microscopy is disclosed. The improved method for phase contrast microscopy comprises a step of generating two reflected or transmitted beams from one sample beam. The sample beam is originated from a light source of the light module and is transmitted through the sample or reflected from the sample to produce sample beam. At next step two collimated beams are produced from the reflected or transmitted sample beam by a glass plate. In a next step of the method disclosed in the first aspect of the present invention, the two collimated sample beams are
Fourier transformed and one of the transformed beams of the two is filtered to produce at the reference beam. In addition to it, one final sample beam is produced from one of the two transformed beams. That is followed by interference of the reference beam and the sample beam (220) for producing one or more interference fringes. Finally thickness distribution of the sample is obtained from the interference fringes.
In accordance with the first aspect of the present invention the improved method further comprises a step of magnifying one sample beam before generating the two reflected or transmitted beams wherein the one sample beam is produced by illuminating the sample, as explained above.
Further in accordance with the first aspect of the present invention, the two transmitted or reflected beams contain the sheared versions of the one sample beam.
Furthermore in accordance with the first aspect of the present invention, the transforming of the two collimated
beams comprises a step of conducting Fourier transform of the two collimated beams.
Also in accordance with the first aspect of the present invention, obtaining thickness distribution of the sample comprises of filtering of one of the transformed beams and inverse Fourier transforming of both the transformed beams and their interference. Furthermore in accordance with the first aspect of the present invention, the imaging of the samples includes at obtaining the intensity distribution and phase distribution.
In a second aspect of the present invention, an improved phase contrast microscopy setup is disclosed. The improved phase contrast microscopy setup comprises at least one glass plate for generating two reflected beams from one sample beam, one lens for collimating one of the reflected beams, one lens for producing two transformed beams from the two or more reflected beams, one spatial filter for producing one reference beam from one of the two transformed beams, at least one lens for inverse transformation and interference of the filtered reference beam and the one final sample beam and at least one sensor for recording the interference fringes because of the superposition of the one filtered reference beam and one final sample beam.
In accordance with the second aspect of the present invention the improved phase contrast microscopy setup further
comprises at least one light source in at least one light module for generating the sample beams by illuminating the sample and also at least one imaging lens for magnifying the sample . Further in accordance with the second aspect of the present invention the glass plate comprises a plurality of reflecting surfaces .
Furthermore in accordance with the second aspect of the present invention, the one or more lens comprises at least one first lens for producing two collimated beams from the two reflected beams from the glass plate and at least one second lens for producing two transformed beams from the two collimated beams.
Also in accordance with the second aspect of the present invention, the lenses for collimation, Fourier transformation and inverse Fourier transformation are positive achromatic lenses .
Accordingly, the present invention provides an improved method and setup for self-referencing quantitative phase contrast microscopy.
The present invention is further described hereinafter with reference to illustrated embodiments shown in the
accompanying drawings, in which:
FIG 1 illustrates a self-referencing quantitative
phase contrast microscopy setup in accordance with the state of the art, and FIG 2 illustrates an improved self-referencing
quantitative phase contrast microscopy setup in accordance with an embodiment of the present invention . Various embodiments are described with reference to the drawings, wherein like reference numerals are used to refer to like elements throughout. In the following description, for purpose of explanation, numerous specific details are set forth in order to provide a thorough understanding of one or more embodiments. It may be evident that such embodiments may be practiced without these specific details.
FIG 2 illustrates an improved self-referencing quantitative phase contrast microscopy setup 200 in accordance with an embodiment of the present invention. The improved self- referencing quantitative phase contrast microscopy setup 200 comprises the light module 102, the object platform 104, the imaging lens 108 and the glass plate 110, similar to the self-referencing quantitative phase contrast microscopy setup 100, illustrated in FIG 1. In a preferred embodiment of the present invention the light module 102 of the improved self- referencing quantitative phase contrast microscopy setup 200 is a coherent light source like, but not limited to, a laser diode module. In another embodiment of the present invention, the light module 102 can be driven using power drawn from one or more ports like, but not limited to, USB port, of a computer.
A sample 210, for the analysis, is placed on the object platform 104 of the improved phase contrast microscopy setup 200 as illustrated in FIG 2. The light module 102 illuminates the sample 210 placed on the object platform 104. The beam that is originated from the light module 102 and is either transmitted through or reflected from the sample 210 is subsequently magnified by the imaging lens 108, as
illustrated in FIG 2. In an embodiment of the present
invention the imaging lens 108 is a ball lens. In another embodiment of the present invention the imaging lens 108 can be any type of lens known in the state of the art. A
magnified beam, received from the imaging lens 108, is reflected by the glass plate 110. The two surfaces i.e. the back surface 110A and the front surface HOB of the glass plate 110 reflect the magnified beam, as illustrated in FIG 2. The two surfaces of the glass plate 110, i.e. the back surface 110A and the front surface HOB, splits the magnified beam in two reflected beams that are a first part of
reflected beam covered between the first reflected beams 114A, 114B and a second part of reflected beam covered between the second reflected beams 116A, 116B, as shown in FIG 2. The two reflected beam sections i.e. the first and
second parts of the reflected beams, contains two laterally sheared versions of the sample beam.
The improved self-referencing quantitative phase contrast microscopy setup 200 also comprises a set of achromatic lens 202, 204 and 208. A first achromatic lens 202 receives the first and second parts of the reflected beams and collimates the reflected beams. The first achromatic lens 202 produces a first set of collimated beams 212, as illustrated in FIG 2. A second achromatic lens 204 receives the collimated beams 212 and produces transformed beams 214A, 214B as shown in FIG 2. In an embodiment of the present invention, the second
achromatic lens 204 conducts Fourier transform of the
collimated beams 212 and produces the transformed beams 214A, 214B at the filter plane
A first transformed beam 214A from the transformed beams 214A, 214B coming from the second achromatic lens 204, passes through a spatial filter 206. The spatial filter 206
comprises a pinhole 206B. The pinhole 206B, on the spatial filter 206 is created based on the properties of the sample beam and the second transformed beam 214B. The second
transformed beam 214B passes through a pinhole 206B, as illustrated in FIG 2 and act as a reference beam 216. A first transformed beam 214A passes without filtering and act as a final sample beam 220. In other words the second achromatic lens 204 focuses the second transformed beam 214B, at the pinhole 206B of the spatial filter 206. In various
embodiments of the present invention the diameter of the pinhole 206B, in the spatial filter 206 may vary and is depending upon the properties of the sample beam, the
transformed beams 214B, and other components of the improved self-referencing quantitative phase contrast microscopy setup 200 illustrated in FIG 2. In other embodiments of the present invention, the first transformed beam 214A does not pass through the pinhole 206B and pass through other beam refining arrangements for producing the final sample beam 220.
The spatial filter 206 produces the reference beam 216 from the received first transformed beam 214B, by allowing only the zero order of the Fourier transformed beam and removing aberrations in the beam due to sample, imperfections, dust, or damaged optics, as known in the state of the art. The reference beam 216, and the final sample beam 220 received from the spatial filter 206, are passed through a third achromatic lens 208. The third achromatic lens 208 receives the reference beam 216 from the spatial filter 206 alone with the final sample beam 220 and inverse Fourier transforms the reference beam 216 and the final sample beam 220. These two beams then superpose resulting in the interference fringes 218, as illustrated in FIG 2. The interference fringes 218 are captured at the sensor 112, of the improved self- referencing quantitative phase contrast microscopy setup 200. The lens 208, shown in FIG 2, performs a reverse Fourier transformation of an interference pattern, received from the interfered beams 218, to get an amplitude distribution and/or phase distribution of the sample 210. The sensor 112 is further connected to a processing device like, but not limited to, a personal computer or laptop, not shown in FIG 2. In a preferred embodiment of the present invention, the set of achromatic lens i.e. the first achromatic lens 202, the second achromatic lens 204 and the third achromatic lens 208 are positive achromatic lenses.
From the foregoing description it is evident that the present invention provides an improved setup and method for self- referencing quantitative phase contrast microscopy.
The improved quantitative phase contrast microscopy setup, disclosed in the present invention, is a self-referencing based phase contrast microscopy hence lesser number of optical components is used in the improved setup in
comparison to the two-beam quantitative phase contrast microscopy known in the state of the art. Also due to self- referencing technique used in the disclosed improved phase contrast microscopy setup, the disclosed improved setup
provides a common path of propagation for sample beam and reference beam which leads to a higher temporal stability in comparison to the two-beam quantitative phase contrast microscopy .
The improved self-referencing quantitative phase contrast microscopy setup, disclosed in the present invention, also is capable of providing a full field of view for a sample which makes the disclosed improved phase contrast microscopy setup advantageous and efficient over the self-referencing
quantitative phase contrast microscopy setup known in the state of the art.
While the present invention has been described in detail with reference to certain embodiments, it should be appreciated that the present invention is not limited to those
embodiments. In view of the present disclosure, many
modifications and variations would present themselves, to those of skill in the art without departing from the scope of various embodiments of the present invention, as described herein. The scope of the present invention is, therefore, indicated by the following claims rather than by the
foregoing description. All changes, modifications, and variations coming within the meaning and range of equivalency of the claims are to be considered within their scope.
Claims
An improved method for phase contrast microscopy
comprises :
-generating two reflected beams (114A, 114B, 116A, 116B) from one sample beams
-producing two collimated beams (212) from the two
reflected beams (114A, 114B, 116A, 116B);
-transforming the two collimated beams (212) to create two transformed beams (214A, 214B) ;
-filtering one transformed beams (214B) of the two
transformed beams (214A, 214B) to produce one
reference beam (216);
-producing at least one final sample beam (220) from at least one transformed beams (214A) of the two
transformed beams (214A, 214B) ;
-superposition of the beams 216 and 220 leading to
interference between the beams (218) from one
reference beam (216) and one final sample beam (220); and
-obtaining at interference fringe distribution (218) of the sample (210) .
The improved method for phase contrast microscopy
according to claim 1 further comprises a step of
magnifying the one or more sample beams before generating the two or more reflected beams (114A, 114B, 116A, 116B) .
The improved method for phase contrast microscopy
according to all preceding claims further comprises illuminating the one or more samples (210) to produce the one or more sample beams.
The improved method for phase contrast microscopy
according to all preceding claims wherein the two
reflected beams (114A, 114B, 116A, 116B) contain two sheared versions of the one sample beam.
The improved method for phase contrast microscopy according to claim 1 wherein transforming the two collimated beams (212) comprises a step of conducting Fourier transform of the two collimated beams (212) .
The improved method for phase contrast microscopy according to claim 1 wherein obtaining thickness
distribution of sample (210) comprises filtering of the one Fourier transformed beams that are superposed with the unfiltered beam to create the interference fringes. (218) .
The improved method for phase contrast microscopy according to claim 1 wherein obtaining the at least one distribution of one or more samples (210) comprises inverse Fourier transforming of the one or more
interfered beams (218) .
The improved method for phase contrast microscopy according to claim 1 wherein the at least one
distribution of one or more samples (210) includes at least one distribution of intensity distribution and phase distribution.
An improved phase contrast microscopy setup (200) comprises :
-at least one glass plate (110) for generating two or more reflected beams (114A, 114B, 116A, 116B) from one or more sample beams;
-one or more lens (202, 204) for producing two
transformed beams (214A, 214B) from two reflected beams (114A, 114B, 116A, 116B);
-at least one spatial filter (206) for producing at
least one reference beam (216) from at least one transformed beams (214B) of the two transformed beams
(214A, 214B);
-at least one lens (208) for producing superposition
leading to interference (218) between the one
reference beam (216) and at one final sample beam (220); and
-at least one sensor (112) for obtaining at least one interference fringe pattern (218) of the sample (210) from the two interfering beams (216, 220) .
10. The improved phase contrast microscopy setup (200)
according to claim 9 further comprises at least one light module (102) for generating the one or more sample beams by illuminating the one or more samples (210) .
11. The improved phase contrast microscopy setup (200)
according to claim 9 further comprises at least one imaging lens (108) for magnifying the one or more sample beams.
12. The improved phase contrast microscopy setup (200)
according to claim 9 wherein the glass plate (110) comprises a plurality of reflecting surfaces (110A, HOB) .
13. The improved phase contrast microscopy setup (200)
according to claim 9 wherein the one or more lens (202, 204) comprises at least one first lens (202) for
producing two collimated beams (212) from the two reflected beams (114A, 114B, 116A, 116B) .
14. The improved phase contrast microscopy setup (200)
according to claim 13 wherein the one or more lens (202, 204) comprises at least one second lens (204) for producing the two transformed beams from the two
collimated beams (212) .
15. The improved phase contrast microscopy setup (200)
according to claim 9 wherein at least one lens from the one or more lens (202, 204) is a positive achromatic lens .
16. The improved phase contrast microscopy setup (200) according to claim 9 wherein the third lens (208) is a positive achromatic lens.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IN201631033100 | 2016-09-28 | ||
| IN201631033100 | 2016-09-28 |
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| WO2018060234A1 true WO2018060234A1 (en) | 2018-04-05 |
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| PCT/EP2017/074474 WO2018060234A1 (en) | 2016-09-28 | 2017-09-27 | Self referencing quantitative phase microscope using lateral shearing geometry |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020053873A1 (en) * | 2018-09-13 | 2020-03-19 | Indian Institute Of Technology Delhi | Digital holographic microscopy |
-
2017
- 2017-09-27 WO PCT/EP2017/074474 patent/WO2018060234A1/en not_active Application Discontinuation
Non-Patent Citations (5)
| Title |
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| "PROGRESS IN OPTICS.", vol. 57, 1 January 2012, ELSEVIER SCIENCE PUBLISHERS B.V., ISSN: 0079-6638, article MUSTAFA MIR ET AL: "Quantitative Phase Imaging", pages: 133 - 217, XP055361704, DOI: 10.1016/B978-0-44-459422-8.00003-5 * |
| AMARDEEP S.G. SINGH ET AL: "Lateral shearing digital holographic imaging of small biological specimens", OPTICS EXPRESS, vol. 20, no. 21, 8 October 2012 (2012-10-08), pages 23617, XP055194975, ISSN: 1094-4087, DOI: 10.1364/OE.20.023617 * |
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| KWANG-BEOM SEO ET AL: "Digital holographic microscopy based on a modified lateral shearing interferometer for three-dimensional visual inspection of nanoscale defects on transparent objects", NANOSCALE RESEARCH LETTERS, 1 December 2014 (2014-12-01), Boston, pages 1 - 14, XP055234812, Retrieved from the Internet <URL:http://www.nanoscalereslett.com/content/pdf/1556-276X-9-471.pdf> [retrieved on 20151209], DOI: 10.1186/1556-276X-9-471 * |
| POPESCU G ET AL: "DIFFRACTION PHASE MICROSCOPY FOR QUANTIFYING CELL STRUCTURE AND DYNAMICS", OPTICS LETTERS, OPTICAL SOCIETY OF AMERICA, vol. 31, no. 6, 15 March 2006 (2006-03-15), pages 775 - 777, XP001241133, ISSN: 0146-9592 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020053873A1 (en) * | 2018-09-13 | 2020-03-19 | Indian Institute Of Technology Delhi | Digital holographic microscopy |
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